Characteristic measuring device

Abstract

To provide a characteristic measuring device that can selectively contact the measurement terminal with a desired electrode using a simple configuration. [Solution] The characteristic measuring device 1 is capable of moving relative to the measuring probe 81 such that the holder 10 sequentially contacts the first external electrode 123 of the electronic component 110 that is to be contacted by the measuring probe. The contact surface 86 of the measuring probe 81 with respect to the first external electrode 123 is part of a cylindrical surface having a central axis 85 that is perpendicular to the first direction 211 of the cavity 30. When measuring electrical characteristics, the drive unit 12D positions the central axis 85 at a position different from the central position 411 of the cavity 30, and is equipped with a terminal position defining unit that enables the measuring probe 81 to contact and separate from the first external electrode 123 without contacting the second external electrode 124.

Description

Technical Field

[0001] The present invention relates to a characteristic measuring device.

Background Art

[0002] There is a device that measures the electrical characteristics of an electronic component by bringing a measurement terminal into contact with the electrode of the electronic component in a state where the electronic component is housed in a cavity provided in a holder. Patent Document 1 discloses a technique of providing a convex portion on a holder in order to prevent the measurement terminal from simultaneously contacting the electrodes of two adjacent electronic components.

Prior Art Documents

Patent Documents

[0003]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0004] By the way, when an electronic component has three or more electrodes, it is necessary to selectively bring the measurement terminal into contact with a desired electrode. Conventionally, a characteristic measuring device that can selectively bring the measurement terminal into contact with a desired electrode with a simple configuration has not been proposed.

[0005] Therefore, an object of the present invention is to provide a characteristic measuring device that can selectively bring a measurement terminal into contact with a desired electrode with a simple configuration.

Means for Solving the Problems

[0006] The present invention provides a characteristic measuring device for measuring the electrical characteristics of an electronic component having an electronic component body having a first end and a second end facing a first component direction, a first side and a second side facing a second component direction intersecting the first component direction, and a third side and a fourth side facing a third component direction intersecting the first and second component directions; a first reference electrode formed at least on the first end; a second reference electrode formed at least on the second end; a first external electrode formed continuously on the first side, the third side, and the second side; and a second external electrode formed continuously on the first side, the fourth side, and the second side, wherein when the external electrode to be contacted with the measuring probe is the first external electrode, the device has a plurality of cavities for housing one of the electronic components each. The device comprises a holder that holds the electronic component with the first external electrode facing the opening of the cavity, a measuring probe positioned near the opening, and a drive unit that can drive the holder relative to the measuring probe so that the measuring probe sequentially faces the first external electrode of each of the electronic components housed in each of the cavities, wherein the contact surface of the measuring probe with the first external electrode is part of a cylindrical surface having a central axis oriented in a direction perpendicular to the drive direction of the holder, and when measuring the electrical characteristics, the drive unit positions the central axis at a position different from the central position of the cavity in the arrangement direction, and includes a terminal position defining unit that enables the measuring probe to contact and separate from the first external electrode without contacting the second external electrode of the electronic component at that position. [Effects of the Invention]

[0007] According to the present invention, a characteristic measuring device can be provided that allows for selective contact of the measuring terminal with a desired electrode using a simple configuration. [Brief explanation of the drawing]

[0008] [Figure 1A] Figure 1A is a plan view that schematically shows a holder included in a characteristic measuring device according to an embodiment of the present invention. [Figure 1B] Figure 1B is an enlarged view of area A in Figure 1A. [Figure 2] Figure 2 is a perspective view that simulates the holder included in the characteristic measuring device of the present invention. [Figure 3] Figure 3 corresponds to the cross-sectional view of line 201-201 in Figure 1A. [Figure 4] Figure 4 is a perspective view of the cavity and other structures formed in the holder shown in Figure 1B, viewed in the direction of arrow 203. [Figure 5] Figure 5 shows an example of electrode and terminal connections when measuring the electrical characteristics of a three-terminal capacitor in the first configuration. [Figure 6] Figure 6 shows the connections between the electrodes and terminals when measuring the electrical characteristics of a three-terminal capacitor in the second configuration. [Figure 7] Figure 7 shows the changes that occur with rotation of the holder in the second configuration, corresponding to the cross-sectional view of line 201-201 in Figure 1B. [Figure 8] Figure 8 is a diagram corresponding to the 201-201 line cross-section in Figure 1B in the first configuration. [Figure 9] Figure 9 is a perspective view showing a portion of the surface of the holder, illustrating a modified example. [Figure 10] Figure 10 is a cross-sectional view of a modified measurement probe, etc. [Figure 11A] Figure 11A is a top view of the characteristic measurement device. [Figure 11B] Figure 11B is a cross-sectional view of the cavity in Figure 11A, viewed in the direction of line II. [Figure 11C] Figure 11C is a cross-sectional view of the cavity shown in Figure 11A, viewed in the direction of line II-II. [Figure 12A] Figure 12A is a top view of the characteristic measurement device. [Figure 12B] Figure 12B is a cross-sectional view of the cavity in Figure 12A, viewed in the direction of line II. [Figure 12C] Figure 12C is a diagram corresponding to Figure 12B for a characteristic measurement device with a different configuration. [Modes for carrying out the invention]

[0009] (Characteristic measurement device) Embodiments of the present invention will be described with reference to the drawings. Figure 1A is a plan view that simulates the holder 10 included in the characteristic measuring device 1 of the embodiment of the present invention. Figure 1B is a magnified view of box A in Figure 1A. Figure 2 is a perspective view that simulates the holder 10 included in the characteristic measuring device 1 of the embodiment of the present invention. Figure 3 is a diagram corresponding to the cross-sectional view along line 201-201 in Figure 1B. Figure 4 is a perspective view that corresponds to the cavity 30 etc. formed in the holder 10 of Figure 1B, viewed in the direction of arrow 203.

[0010] (Holder) As shown in Figure 1A, the characteristic measuring device 1 comprises a holder 10, measuring terminals, and a base 20. The base 20 is not shown in Figure 1A but is shown in Figure 3. As shown in Figure 4, the measuring terminals include a measuring probe 81 and a measuring electrode 82. As shown in Figures 1A and 2, the main surface 16 of the holder 10 has a circular shape. Multiple cavities 30 are formed in the holder 10. The arrow 211 in Figure 1A indicates a first direction 211, which is the circumferential direction along the main surface 16 of the holder 10. The cavities 30 are arranged to be continuously distributed in the first direction 211. In other words, the first direction 211 is the direction of arrangement of the cavities 30. Also, the first direction 211 is the direction in which the holder 10 moves relative to itself. In Figure 1A, here the direction in which the holder 10 moves relative to itself is the circumferential direction. Furthermore, the first direction 211 coincides with the direction in which the first external electrode 123 and the second external electrode 124 are aligned when both the first external electrode 123 and the second external electrode 124 are facing the opening 31. For example, the main surface 16 of the holder 10 is positioned horizontally. However, the direction in which the main surface 16 is positioned is not limited to the horizontal direction; it can be positioned in any direction, including the vertical direction. In FIG. 1A, the direction parallel to the main surface 16 of the holder 10 is indicated by D16. The main surface 16 of the holder 10 is arranged to be in the horizontal direction. That is, the characteristic measuring device 1 is arranged such that D16 is parallel to the horizontal direction. However, the direction in which the main surface 16 is arranged is not limited to the horizontal direction and can be arranged in any direction including the vertical direction. For example, the characteristic measuring device 1 can be arranged such that D16 is not parallel to the horizontal direction but along the vertical direction. In such a case, a suction mechanism may be provided in the cavity 30 from the viewpoint of securely holding the electronic component 110.

[0011] As shown in FIGS. 1A, 1B, and 3, one electronic component 110 is housed in each cavity 30. The characteristic measuring device 1 is a device that measures the electrical characteristics of the electronic component 110 housed in the cavity 30. As shown in FIGS. 3 and 4, the measurement of the electrical characteristics is performed by bringing the measurement probe 81 and the measurement electrode 82 into contact with the electronic component 110. The measurement probe 81 and the measurement electrode 82 will be described later.

[0012] As shown in FIG. 3, a base 20 is arranged on the back surface 18 of the holder 10. The base 20 is formed of an electrically insulating material. The base 20 is fixedly provided on the characteristic measuring device 1. Being fixedly provided means that the base 20 does not rotate even when the holder 10 rotates. The base 20 has a function of supporting the electronic component 110 so that the electronic component 110 housed in the cavity 30 does not fall off.

[0013] (Outline of Measurement of Electrical Characteristics) The outline of the measurement of electrical characteristics by the characteristic measuring device 1 will be described. As shown in FIG. 1A, the holder 10 rotates around the rotation axis 12 along the first direction 211. When the holder 10 rotates and the cavity 30 comes to a predetermined position, the electronic component 110 is loaded into the cavity 30. The arrow 14 in FIG. 1A shows the state of the electronic component 110 before being loaded. When the electronic component 110 is loaded into the cavity 30, the electronic component 110 is housed in the cavity 30.

[0014] The electronic component 110 housed in the cavity 30 is moved to a position between the measuring probe 81 and the measuring electrode 82 by further rotation of the holder 10. In other words, the holder 10 moves relative to the measuring terminal. The position where the measuring probe 81 and the measuring electrode 82 are located is called the measurement position. Figure 1B shows a magnified view of two electronic components 110 and two measuring probes 81. Similarly, Figure 2 shows a magnified view of two cavities 30 and two measuring probes 81. The measuring electrode 82 is not shown in Figures 1A, 1B, and 2.

[0015] The measuring probe 81 and measuring electrode 82 contact the electrodes of the electronic component 110, thereby measuring the electrical characteristics of the electronic component 110. The electronic component 110 can also be charged.

[0016] After the electrical characteristics are measured, the holder 10 rotates further, moving the electronic component 110 from its position between the measuring probe 81 and the measuring electrode 82, and the electronic component 110 is removed from the cavity 30. During removal, the electronic components 110 are sorted according to the measured electrical characteristics. For example, electronic components 110 with good electrical characteristics and electronic components 110 with poor electrical characteristics are separated and removed.

[0017] (Electronic components) An electronic component 110 whose characteristics can be suitably measured by the characteristic measuring device 1 will be described with reference to Figure 4. An example of the electronic component 110 is a three-terminal capacitor. The electronic component 110 has a chip shape. The external shape of the electronic component 110 is approximately a rectangular parallelepiped. The electronic component 110 includes an electronic component body 112 and electrodes. The electrodes include a first reference electrode 121, a second reference electrode 122, a first external electrode 123, and a second external electrode 124. The length dimension L of a multilayer ceramic capacitor is, for example, 0.1 mm to 7 mm, the width dimension W is, for example, 0.1 mm to 7 mm, and the thickness dimension T is, for example, 0.01 mm to 4 mm.

[0018] Figure 4 shows the first component direction 221, the second component direction 222, and the third component direction 223, which are directions along the outer shape of the electronic component 110. The first component direction 221, the second component direction 222, and the third component direction 223 are approximately orthogonal to each other. The outer surfaces of the electronic component body 112 facing the first component direction 221 are designated as the first end face 131 and the second end face 132. The outer surfaces of the electronic component body 112 facing the second component direction 222 are designated as the first side surface 141 and the second side surface 142. The outer surfaces of the electronic component body 112 facing the third component direction 223 are designated as the third side surface 143 and the fourth side surface 144.

[0019] The first reference electrode 121 is an electrode formed on at least the first end face 131. The second reference electrode 122 is an electrode formed on at least the second end face 132. The first external electrode 123 is an electrode formed continuously on the first side surface 141, the third side surface 143, and the second side surface 142. The second external electrode 124 is an electrode formed continuously on the first side surface 141, the fourth side surface 144, and the second side surface 142.

[0020] The characteristic measuring device 1 measures the capacitance between the first reference electrode 121 and the second reference electrode 122 and the first external electrode 123, or the capacitance between the first reference electrode 121 and the second reference electrode 122 and the second external electrode 124.

[0021] As shown by arrow 231 in Figure 4, the measuring probe 81 is biased toward the main surface 16 of the holder 10 by gravity and at least one of other biasing means, and contacts the first external electrode 123 or the second external electrode 124 at the measurement position 22. Figure 4 shows an example in which the measuring probe 81 contacts the first external electrode 123. Also, as shown by arrows 232 and 233, the measuring probe 81 is biased toward the main surface 16 of the holder 10 by gravity and at least one of other biasing means, and the measuring electrode 82 contacts the first reference electrode 121 and the second reference electrode 122 at the measurement position 22. The biasing means are not particularly limited, and examples include various springs, linear actuators, etc. Specifically, the load of the spring is, for example, 1 gf or more and 100 gf or less. Examples of other biasing means include air cylinders, motors, solenoids, piezoelectric elements, and other actuators.

[0022] (Cavity) As shown in Figure 2, the cavity 30 is a cavity extending from the main surface 16 of the holder 10 in a second direction 213. The second direction 213 is perpendicular to the main surface 16 of the holder 10. The cavity 30 is approximately rectangular in shape. The size of the cavity 30 is such that it can accommodate one electronic component 110. As shown in Figure 3, the cavity 30 has an opening 31 and an electrode exposure opening 32. The electronic component 110 is exposed through the opening 31 and the electrode exposure opening 32. The cavity 30 holds the electronic component 110 with the electronic component 110 exposed through the opening 31 and the electrode exposure opening 32. The measuring probe 81 contacts the electronic component 110 through the opening 31. The measuring electrode 82 contacts the electronic component 110 through the electrode exposure opening 32. The shape of the cavity 30 when viewed in a direction perpendicular to the main surface 16 of the holder 10 is, for example, rectangular. In this case, the cavity 30 is sized such that a gap of, for example, 0.05 mm or more is created between the electronic component 110 to be housed and the side walls constituting the cavity 30, and is greater than √2 times the dimension in the thickness direction T. However, the shape of the cavity 30 when viewed in a direction perpendicular to the main surface 16 of the holder 10 is not limited to rectangular; it may also be circular or elliptical. If the shape of the cavity 30 is circular, the diameter of the cavity 30 is greater than √2 times the dimension in the width direction W of the electronic component 110. The driving method of the holder 10 may be continuous driving or intermittent driving. The rotational speed when driving the holder 10 in the rotational direction is, for example, 1 rpm or more and 100 rpm or less.

[0023] As described above, the direction in which the holder 10 moves relative to the holder is the first direction 211. As shown in Figure 3, a plurality of cavities 30 are formed in the holder 10 along the first direction 211. Then, as the holder 10 moves relative to the first direction 211, the openings 31 of the multiple cavities 30 sequentially face the measuring probe 81. In other words, the direction in which the multiple cavities 30 that sequentially face the measuring probe 81 as the holder 10 moves relative to it are arranged is the cavity arrangement direction. In addition to the cavity arrangement direction, there are cases in which multiple rows of cavities 30 are arranged in directions perpendicular to the first direction 211 and the second direction 213.

[0024] The holder 10 may include a plurality of separating members 45 as shown in Figure 3. The separating members 45 are arranged on the base surface 24 of the base 20. Multiple separating members 45 can be arranged consecutively in a first direction 211 (shown in Figure 1A). When the holder 10 includes separating members 45, for example, the area between adjacent separating members 45 can be made into a cavity 30. Alternatively, a cavity 30 can be formed inside the separating members 45. This allows multiple cavities 30 to be formed in the holder 10 consecutively in the first direction 211. Other reference numerals shown in Figure 3 will be explained later.

[0025] (electrode) The characteristic measuring device 1 includes a measuring probe 81 and a measuring electrode 82, as shown in Figure 4. The measuring probe 81 is positioned to contact the first external electrode 123 or the second external electrode of the electronic component 110 near the opening 31 of the cavity 30. The measuring electrode 82 is positioned to contact the first reference electrode 121 and the second reference electrode 122 of the electronic component 110 near the electrode exposure opening 32 of the cavity 30. The measuring electrode 82 can be mounted on the base 20, as shown in Figure 3.

[0026] The measuring probe 81 has a roller shape. In other words, the measuring probe 81 has a cylindrical shape. The measuring probe 81 can rotate. The axis of rotation of the measuring probe 81 is denoted as the rotation axis 84. The measuring probe 81 is held by a bearing (not shown). The bearing holds the rotation axis 84. The measuring probe 81 can move in a second direction 213. The measuring probe 81 may elastically contact the first external electrode 123 or the second external electrode 124 of the electronic component 110. In the measuring probe 81, the surface that contacts the first external electrode 123 or the second external electrode 124 is called the contact surface 86. In the cylindrical measuring probe 81, the cylindrical surface becomes the contact surface 86. The central axis of this cylinder, i.e., the central axis of the cylindrical surface (the axis of symmetry with respect to the side surface of the cylinder), is oriented in a direction perpendicular to the driving direction of the holder 10. More specifically, the central axis is perpendicular to the driving direction of the holder 10 and faces a direction D16 parallel to the main surface 16 of the holder 10. In the measurement probe described herein, the portion that contacts the external electrodes 123 and 124 of the electronic component 110 is made of a conductive material such as a metal like iron, copper, or silver, or an alloy containing iron, copper, or silver. Alternatively, it may be surface-treated with another conductive material.

[0027] The measurement of the electrical characteristics of electronic component 110 will now be described. In the following description, electronic component 110 is assumed to be a three-terminal capacitor as described with reference to Figure 4. When measuring the electrical characteristics of electronic component 110, which is a three-terminal capacitor, the capacitance between the first reference electrode 121 and the second reference electrode 122 and the first external electrode 123, or the capacitance between the first reference electrode 121 and the second reference electrode 122 and the second external electrode 124 is measured.

[0028] When the electronic component 110 is placed in the cavity 30, there are two ways in which the surface of the electronic component 110 is exposed from the opening 31 of the cavity 30. One is when the third side surface 143 or the fourth side surface 144 of the electronic component 110 is exposed. The other is when the first side surface 141 or the second side surface 142 of the electronic component 110 is exposed. This will be explained with reference to Figure 1. Arrow 241 in Figure 1B indicates the case when the third side surface 143 of the electronic component 110 is exposed from the opening 31. Arrow 242 in Figure 1B indicates the case when the first side surface 141 of the electronic component 110 is exposed from the opening 31.

[0029] When the third side surface 143 of the electronic component 110 is exposed through the opening 31, only the first external electrode 123 is exposed through the opening 31 in addition to the first reference electrode 121 and the second reference electrode 122. The second external electrode 124 is not exposed.

[0030] The same applies when the fourth side surface 144 of the electronic component 110 is exposed through the opening 31. When the fourth side surface 144 of the electronic component 110 is exposed through the opening 31, only the second external electrode 124 is exposed from the opening 31 in addition to the first reference electrode 121 and the second reference electrode 122. The first external electrode 123 is not exposed.

[0031] When the third side surface 143 or the fourth side surface 144 of the electronic component 110 is exposed through the opening 31, the arrangement of the electronic component 110 in the cavity 30 is called the first arrangement 241.

[0032] On the other hand, when the first side surface 141 of the electronic component 110 is exposed through the opening 31, two external electrodes, the first external electrode 123 and the second external electrode 124, are exposed through the opening 31 in addition to the first reference electrode 121 and the second reference electrode 122. The same applies when the second side surface 142 of the electronic component 110 is exposed through the opening 31.

[0033] As shown by arrow 242 in Figure 1A, the arrangement of the electronic component 110 when the first side surface 141 of the electronic component 110 is exposed through the opening 31, or when the second side surface 142 is exposed, is called the second arrangement 242.

[0034] Referring to Figures 5 and 6, the methods of connecting the electrodes and terminals in the first arrangement 241 and the second arrangement 242 will be explained. Figure 5 shows the method of connecting the electrodes and terminals in the first arrangement 241. Figure 6 shows the method of connecting the electrodes and terminals in the second arrangement 242.

[0035] As shown in Figure 5, in the first configuration 241, the measuring probe 81 is connected to the electrode of the first external electrode 123 and the second external electrode 124 that is exposed from the opening 31. The measuring electrode 82 is connected to the first reference electrode 121 and / or the second reference electrode 122. Figure 5 shows an example where the first external electrode 123 is exposed from the opening 31, the measuring probe 81 is connected to the first external electrode 123, and the measuring electrode 82 is connected to the first reference electrode 121.

[0036] On the other hand, as shown in Figure 6, in the second configuration 242, the measuring probe 81 is connected to the first external electrode 123 or the second external electrode 124. The measuring electrode 82 is connected to the first reference electrode 121 and / or the second reference electrode 122. Figure 6 shows an example where the measuring probe 81 is connected to the second external electrode 124 and the measuring electrode 82 is connected to the first reference electrode 121.

[0037] As shown in Figure 5, in the first configuration 241, the electrode to which the measuring probe 81 can be connected is a single electrode exposed from the opening 31. In contrast, as shown in Figure 6, in the second configuration 242, there are two electrodes to which the measuring probe 81 can be connected: the first external electrode 123 and the second external electrode 124.

[0038] In the second configuration 242 shown in Figure 6, the measuring probe 81 must be connected to only one of the first external electrode 123 and the second external electrode 124. If the measuring probe 81 is connected to both the first external electrode 123 and the second external electrode 124, the electrical characteristics cannot be accurately measured.

[0039] In the second arrangement 242, the first or second side surface 141 of the electronic component body 112 is exposed between the first external electrode 123 and the second external electrode 124, which are exposed through the opening 31. In other words, the first external electrode 123, the electronic component body 112, and the second external electrode 124 are all exposed in the first direction 211 from the opening 31. If the measuring probe 81 contacts the electronic component body 112 instead of the electrodes, the electrical characteristics cannot be accurately measured.

[0040] (Measurement in the second configuration) In the characteristic measuring device 1 of this embodiment, the measuring probe 81 can be selectively brought into contact only with the desired electrode. This will be explained with reference to Figure 7. Figure 7 is a diagram showing the changes accompanying the rotation of the holder 10 in the cross-sectional view corresponding to line 201-201 in Figure 1B. Figure 7 shows the change in the positional relationship between the measuring probe 81 and the electronic component 110 as the holder 10 rotates. Figure 7 also shows the case where the arrangement of the electronic component 110 inside the cavity 30 is the second arrangement 242. Cross-sectional views 251, 252, and 253 show the changes over time due to the rotation of the holder 10 in this order. That is, the appearance of the cross-section changes in the order of arrows 261 and 262.

[0041] Cross section 252 shows the state in which the electrical characteristics of the electronic component 110 are being measured. In other words, cross section 252 shows the state in which the electronic component 110 is located at the measurement position. Cross section 251 shows the state in which the electronic component 110 is in the process of being moved to the measurement position. Cross section 251 shows the state in which the electronic component 110 is in the process of being moved away from the measurement position.

[0042] In the characteristic measuring device 1 of this embodiment, as shown in the cross-section 251, the measuring probe 81 does not simultaneously contact two electronic components 110 housed in adjacent cavities 30 while the electronic component 110 is being moved to the measurement position. This is because the position of the measuring probe 81 is defined by contact with the convex portion 47 or the non-convex portion, i.e., the non-convex portion, which will be described later, and the probe is separated from the electronic component 110.

[0043] The state in which the electrical characteristics of the electronic component 110 are being measured will be described. As shown in the cross-section 252, the measuring probe 81 is in contact only with the second external electrode 124 without contacting the first external electrode 123 or the electronic component body 112. In the second arrangement 242, the first external electrode 123, the second external electrode 124 and the electronic component body 112 are exposed through the opening 31. Therefore, the measuring probe 81 may come into contact with the first external electrode 123, the second external electrode 124 and the electronic component body 112. In the characteristic measuring device 1 of this embodiment, the measuring probe 81 selectively contacts only the second external electrode 124. This is due to the fact that a recess 44 is formed in the separating member 45 included in the holder 10. The separating member 45 and the recess 44 will be described later.

[0044] In the above explanation, the first external electrode 123 and the second external electrode 124 may be swapped. In other words, it is important that for each electronic component 110 being measured, the measurement probe 81 contacts only one of the first external electrode 123 and the second external electrode 124. For example, the external electrode that contacts the measurement probe 81 for each electronic component 110 may be called the first external electrode 123.

[0045] After the electrical characteristics are measured, the electronic component 110 is moved from the measurement position as shown in cross-section 253. Even while the electronic component 110 is being moved from the measurement position, the measurement probe 81 does not simultaneously contact the two electronic components 110 housed in adjacent cavities 30, just as it does when the electronic component 110 is being moved to the measurement position. In other words, as the holder 10 moves relative to itself, the multiple cavities 30 of the holder 10 sequentially face the measuring probe 81. The terminal position defining parts such as the convex portion 47 and the concave portion 44 define the position where the measuring probe 81 contacts the electronic component 110 and the position where it is separated from it. By making contact at a position different from the center of the cavity 30, it is possible to selectively make contact only with the second external electrode 124 and prevent contact with the first external electrode 123, the electronic component body 112, and the electronic component 110 housed in the adjacent cavity 30. The second configuration 242 has now been explained.

[0046] (Measurement in the first configuration) Next, the first configuration 241 will be described with reference to Figure 8. Figure 8 is a diagram showing the positional relationship between the measurement probe 81 and the electronic component 110 at the measurement position in the first configuration 241. Figure 8 is a diagram corresponding to the cross-section 252 in Figure 6, which shows the second configuration 242. In the second configuration 242, only one of the first external electrode 123 and the second external electrode 124 is exposed at the position where the measurement probe 81 can make contact. Figure 8 illustrates the case where the first external electrode 123 is exposed. Furthermore, the electronic component body 112 is not exposed at the position where the measurement probe 81 can make contact. Therefore, the measurement probe 81 can make contact with only one of the first external electrode 123 and the second external electrode 124 without making contact with the electronic component body 112.

[0047] (Position of the measuring probe) In the characteristic measuring device 1 of this embodiment, the measuring probe 81 can contact only one electrode in the second arrangement 242. An example of a means to achieve this will be described with reference to Figure 3. In the characteristic measuring device 1 of this embodiment, when measuring the electrical characteristics of the electronic component 110, the central axis 85 of the rotation axis 84 of the measuring probe 81 is located at a position different from the center position of the cavity 30 in the first direction 211 of the holder 10. Line 401 in Figure 3 indicates the position of the central axis 85 in the first direction 211. Line 411 indicates the center position of the cavity 30 in the first direction 211. Line 401 and line 411 are at different positions in the first direction 211. As a result, the measuring probe 81 can contact only one of the first external electrode 123 and the second external electrode 124 exposed from the opening 31.

[0048] (Terminal position specification part) In the characteristic measuring device 1 of this embodiment, when measuring electrical characteristics, the part that guides the central axis 85 to be located at a position different from the central position 411 of the cavity 30 in the first direction 211 is called the terminal position defining part. Specific examples of the terminal position defining part are described below. Specific examples of the terminal position defining part include a protrusion 47 provided on the holder 10 and a recess 44 formed on the holder 10. The terminal position defining part may also include a combination of multiple elements such as the protrusion 47 and the recess 44 formed on the holder 10.

[0049] (Convex part) In the characteristic measuring device 1 of this embodiment, when measuring electrical characteristics, the holder 10 is provided with a protrusion 47 that contacts the measuring probe 81 so that the central axis 85 is positioned in a different location from the central position 411 of the cavity 30 in the first direction 211. This will be explained with reference to Figure 3. The distance in the second direction 213 from the back surface 18 of the holder 10 is called the height. In Figure 3, the height of the protrusion 47 is shown as height 301. The height of the electronic component 110 when housed in the cavity 30 is shown as height 311. The protrusion 47 is the part of the electronic component 110 that is higher than the height 311. By bringing the measuring probe 81 into contact with the protrusion 47, the central axis 85 can be positioned in a different location from the central position 411 of the cavity 30 in the first direction 211. As shown in Figure 3, even when the measuring probe 81 is in contact with the protrusion 47, it is still in contact with either the first external electrode 123 or the second external electrode 124. The measuring probe 81 is located inside the cavity 30. Therefore, the characteristic measuring device 1 can measure the electrical characteristics of the electronic component 110.

[0050] It is preferable that the protrusion 47 is provided within a predetermined distance range from the central position 411 of the cavity 30 in one direction in the first direction 211. When the measuring probe 81 contacts the protrusion 47, it becomes easier to prevent the measuring probe 81 from contacting electrodes that are exposed from the opening 31 and that the measuring probe 81 should not contact. Also, when the measuring probe 81 contacts the protrusion 47, it is possible to prevent the measuring probe 81 from contacting the electronic component body 112.

[0051] As shown in Figure 3, when multiple cavities 30 are provided at equal intervals in the first direction 211, the protrusions 47 are also provided at equal intervals in the first direction 211. The line 413 in Figure 3 indicates the position of the apex of the protrusion 47 in the first direction 211. The apex of the protrusion 47 is the central position in the first direction 211 of the highest part of the protrusion 47. The arrow 423 in Figure 3 indicates the pitch of the protrusions 47 in the first direction 211.

[0052] Here, it is preferable that the measuring probe 81 contacts only one protrusion 47 when measuring the electrical characteristics. This makes it easy to position the measuring probe 81 at a desired position in the first direction 211.

[0053] One example of a means to ensure that the measuring probe 81 contacts only one protrusion 47 is to position the measuring probe 81 in the first direction 211 during measurement, that is, to position the line 401 at a position other than the midpoint 424 of the pitch 423. This allows the measuring probe 81 to contact only one protrusion 47 when measuring electrical characteristics. An example of the dimensional relationship of each component when the measuring probe 81 can be in contact with only one external electrode is shown below. Diameter of measuring probe: 3mm to 5mm Height of electronic components: 0.55mm to 0.95mm Top surface length of electronic component: 0.55mm to 0.95mm Length of electrodes on the top surface of electronic components: 0.05 mm or more and 0.2 mm or less Cavity height: 0.5mm or less For example, the relationship between the pitch 423 and the measuring probe 81 can be such that the measuring probe is 0.1 mm or more smaller, and the difference between the heights 301 and 311 can be between 0.1 mm and 0.5 mm. The difference between the electronic component 110 and the length 321 will be described later.

[0054] (recess) It is preferable that the holder 10 has a recess 44. The recess 44 is a portion of the holder 10 cut out from the main surface 16 of the holder 10 in a second direction 213. The recess 44 is connected to the cavity 30. If the holder 10 includes a separating member 45, the recess 44 may be formed in the separating member 45. It is preferable that the recess 44 has an arc shape in a cross section parallel to the first direction 211 and the second direction 213. It is preferable that the arc shape is in line with the shape of the cross section of the measuring probe 81 parallel to the first direction 211 and the second direction 213.

[0055] Line 412 in Figure 3 indicates the position of the center of the circle containing the arc in the arc shape of the recess 44 in the first direction 211. Line 412 and line 411 are in different positions in the first direction 211. In other words, the center of the circle containing the arc of the recess 44 is in a different position in the first direction 211 from the center of the cavity 30. This makes it easy to bring the measuring probe 81 into contact with only one of the first external electrode 123 and the second external electrode 124 that are exposed from the opening 31. Note that the above statement, "only one of the first external electrode 123 and the second external electrode 124 that are exposed from the opening 31," means that this is also the case when both the first external electrode 123 and the second external electrode 124 are facing the opening 31.

[0056] In the first direction 211, it is preferable that the height 302 of the recess 44 on the inner surface 42 of the cavity 30 is lower than the height 311 of the electronic component 110. This makes it easier to selectively contact the measuring probe 81 with one of the electrodes exposed from the opening 31. The length 321 in Figure 3 is the difference between the height 311 of the electronic component 110 and the height 302 of the recess 44. The length 321 can be, for example, 0.05 mm or more and 0.3 mm or less. The inner surface 42 of the cavity 30 includes not only the sides of the cavity 30 but also the bottom surface. Furthermore, the inner surface 42 is not limited to being smooth; grooves such as steps and recesses may be provided on the inner surface 42.

[0057] (modified version) Figure 9 is a perspective view showing a part of the main surface 16 of the holder 10. Figure 9 shows a configuration in which main surface protrusions 45 or main surface recesses 46 are provided on the main surface 16 of the holder 10. The main surface protrusions 45 are protrusions present on the main surface 16, and the main surface recesses 46 are recesses present on the main surface 16. In the example shown in Figure 9, the main surface protrusions 45 are protrusions formed on the main surface 16, and the main surface recesses 46 are the parts between the main surface protrusions 45. In the modified example shown in Figure 9, the main surface protrusions 45 or main surface recesses 46 are arranged in two rows, one on each side of the electronic component 110. The cam follower 50 is positioned to trace the shape of the main surface protrusions 45 or main surface recesses 46 in each row. A measuring probe 81 is rotatably connected to the cam follower 50. This allows the shape of the main surface protrusions 45 or main surface recesses 46 to be transmitted to the measuring probe 81.

[0058] Furthermore, it is preferable that the main surface protrusion 45 or main surface recess 46 can be removed, repositioned, or replaced, regardless of how they are arranged, such as whether they are provided on the surface of the base 20 or on the main surface 16 of the holder 10. This allows the characteristic measuring device 1 to be easily adapted to the modified electronic component 110 if the size, external shape, electrode position, etc., of the electronic component 110 are changed.

[0059] The characteristic measuring device 1 of the present invention can also be described as follows: The characteristic measuring device 1 comprises a holder 10 on which a plurality of cavities 30 are provided on the main surface 16, each cavity 30 housing an electronic component 110 including a first external electrode 123 and a second external electrode 124.

[0060] The characteristic measuring device 1 further includes a measuring probe 81 that faces the main surface 16 of the holder 10 and is provided so that its relative position can be displaced in a first direction 211 along the main surface 16 of the holder 10, and a measuring electrode 82 provided on the inner surface 42 of the cavity 30.

[0061] The characteristic measuring device 1 further includes a first drive mechanism that displaces the relative position between the holder 10 and the measuring probe 81 in a second direction 213 perpendicular to the main surface 16 of the holder 10. The first drive mechanism is an example of a displacement mechanism in the cam follower 50 in the second direction 213.

[0062] The characteristic measuring device 1 further includes a second drive mechanism that displaces the measuring probe 81 to a position facing each of the multiple cavities 30. The second drive mechanism is a displacement mechanism in the cam follower 50 in the first direction 211.

[0063] The second drive mechanism can further displace the relative position between the measuring probe 81 and the holder 10 so that the measuring probe 81 makes electrical contact with the first external electrode 123 or the second external electrode 124 exposed in the opening 31, when the measuring probe 81 is facing the inner region of the opening 31 of the cavity 30 in the second direction 213 described above. The inner region refers to the area inside the opening 31 of the cavity 30 when the cavity 30 is viewed from above in a plan view. In other words, the inner region is the position where the cavity 30 and the measuring probe 81 overlap when the cavity 30 is viewed from above in a plan view.

[0064] Furthermore, the holder 10 of the characteristic measuring device 1 is provided with main surface protrusions 45 or main surface recesses 46 on the main surface 16 of the holder 10, according to the pitch in the first direction 211 between adjacent cavities 30.

[0065] The aforementioned second drive mechanism then moves the measuring probe 81 in conjunction with the change in the relative position of the main surface convex portion 45 or the main surface concave portion 46 in the second direction 213, so that one of the first external electrode 123 and the second external electrode 124 makes electrical contact with the measuring probe 81.

[0066] (Cavity relief groove) The relief groove will be explained with reference to Figures 11A to 11C. Figure 11A is a top view of the characteristic measuring device 1, Figure 11B is a cross-sectional view of the cavity 20 viewed in the direction of line II of the cavity 30 in Figure 11A, and Figure 11C is a cross-sectional view of the cavity 20 viewed in the direction of line II-II of the cavity 30 in Figure 11A. The relief groove 28 shown in Figures 11B and 11C is a space that extends from the cavity 30 formed in the base 20. As shown in Figure 11A, the direction perpendicular to the first direction 211 in the direction parallel to the main surface 16 is defined as the third direction 216. As shown in Figure 11C, the relief groove 28 is provided at the center position of the cavity 30 in the base 20 in the third direction 216. With the relief groove 28 provided, the first external electrode 123 and the second external electrode 124 of the electronic component 110 do not come into contact with the inner surface 42 of the cavity 30. The measuring electrode 82 is provided on the inner surface 42 of the cavity 30, excluding the relief groove 28. Therefore, the first external electrode 123 and the second external electrode 124 do not come into contact with the measuring electrode 82. In the characteristic measuring device 1 shown in Figures 11A to 11C, it is easy to bring the first reference electrode 121 and the second reference electrode 122 into contact with the measuring electrode 82 without bringing the first external electrode 123 and the second external electrode 124 into contact with the measuring electrode 82.

[0067] The measurement of the characteristics of electronic component 1101 with different electrode arrangements will be explained with reference to Figures 12A to 12C. Figure 12A is a top view of the characteristic measuring device 101, Figure 12B is a cross-sectional view of the cavity in Figure 12A viewed in the direction of line II, and Figure 12C is a diagram corresponding to Figure 12B for a characteristic measuring device with a different configuration. Unlike the electronic component 110 shown in Figure 11A, etc., the electronic component 1101 shown in Figures 12A to 12C does not have a first external electrode 123 and a second external electrode 124. The characteristics of the electronic component 1101 are measured by contacting the measuring probe 81 with either the first reference electrode 121 or the second reference electrode 122 and the measuring electrode 82 with the other. Therefore, as shown in Figure 12B, the measuring electrode 82 is provided only on one inner surface 42 in the first direction 211 of the cavity 30. In the example shown in Figure 12B, the characteristics of the electronic component 1101 are measured by bringing the measuring probe 81 into contact with the first reference electrode 121 and the measuring electrode 82 into contact with the second reference electrode 122. Alternatively, as shown in Figure 12C, a relief groove 28 may be provided in the base 20 on the side of the cavity 30 where the measuring electrode 82 is not provided in the first direction 211.

[0068] Embodiments of the present invention have been described above. The present invention is not limited to the embodiments described above, and various modifications, variations, and combinations are possible.

[0069] For example, the shape of the measuring probe 81 is not limited to a cylindrical shape. Figure 10 is a cross-sectional view of the measuring probe 81, showing a modified example of the measuring probe 81. As shown in Figure 10, the measuring probe 81 can also be a plate-shaped member that includes an arc-shaped portion.

[0070] Furthermore, the movement of the holder is not limited to rotational movement; for example, it may be linear movement. The characteristic measuring device may be equipped with a drive unit capable of driving the holder relative to the measuring probe. The drive unit can be, for example, a motor. The drive unit may also be connected to a rotating shaft attached to the center of the holder (shown as drive unit 12D in Figure 1A). The drive unit can drive the holder such that the cavity faces the measuring probe and the direction of drive of the holder is always constant. In this case, the direction of drive of the holder may coincide with one of the arrangement directions of the cavities.

[0071] <1> An electronic component body having a first end and a second end facing a first component direction, a first side and a second side facing a second component direction intersecting the first component direction, and a third side and a fourth side facing a third component direction intersecting the first component direction and the second component direction, A first reference electrode formed at least at the first end, A second reference electrode formed at least at the second end, A first external electrode formed continuously on the first side, the third side, and the second side, An apparatus for measuring the electrical characteristics of an electronic component having a second external electrode formed continuously on the first side, fourth side, and second side, When the external electrode that comes into contact with the measuring probe is designated as the first external electrode, A holder having a plurality of cavities for housing one of the aforementioned electronic components, and holding the electronic components with the first external electrode facing the opening of the cavity, A measuring probe positioned near the aforementioned opening is provided, The holder can be moved relative to the measuring probe so that the measuring probe sequentially contacts the first external electrode of each of the electronic components housed in each of the cavities. The contact surface of the measuring probe with the first external electrode is part of a cylindrical surface having a central axis oriented perpendicular to the arrangement direction of the cavities. When measuring the electrical characteristics, the central axis is positioned at a location different from the central position of the cavity in the arrangement direction, and the measuring probe is provided with a terminal position defining section that brings the measuring probe into contact with the first external electrode of the electronic component. Characteristic measurement device.

[0072] <2> The terminal position defining portion is a protrusion provided on the holder, When measuring the electrical characteristics, the measuring probe contacts the convex or non-convex portion, thereby bringing the measuring probe into contact with the first external electrode of the electronic component, and the central axis is positioned at a location different from the central position of the cavity in the arrangement direction. <1> The characteristic measuring device described above.

[0073] <3> Multiple protrusions are provided along the direction of arrangement. When measuring the aforementioned electrical characteristics, the measuring probe contacts only one of the aforementioned protrusions. <2> The characteristic measuring device described above.

[0074] <4> The terminal position defining portion is a recess provided in the holder, The recess has an arc shape in a cross-section parallel to the arrangement direction and the second direction. The position of the center of the circle containing the arc in the aforementioned arc shape in the aforementioned alignment direction is different from the position of the center of the cavity in the aforementioned alignment direction. <1> from <3> A characteristic measuring device described in any one of the following.

[0075] <5> The measuring electrode is positioned opposite the opening of the cavity when measuring the aforementioned electrical characteristics. The cavity has an electrode exposure opening at a position opposite to the opening, When measuring the aforementioned electrical characteristics, the measuring electrode is exposed from the electrode exposure opening toward the interior of the cavity. When measuring the electrical characteristics, the measuring electrode is exposed from the electrode exposure opening toward the interior of the cavity and makes electrical contact with at least one of the first reference electrode and the second reference electrode. <1> from <4> A characteristic measuring device described in any one of the following.

[0076] <6> The cam follower to which the measurement probe is connected further comprises The terminal position defining portion is at least one of the convex and concave portions present on the surface of the holder. The cam follower is positioned to trace the shapes of the convex and concave portions. <1> from <5> A characteristic measuring device described in any one of the following.

[0077] <7> An apparatus for measuring the electrical characteristics of an electronic component having an electronic component body and electrodes, A holder having multiple cavities for housing one of the aforementioned electronic components, and holding the electronic component with its electrodes facing the openings of the cavities, The system includes a measuring probe positioned near the opening so as to contact the electrode, The holder can be moved relative to the measuring probe so that the measuring probe sequentially contacts the electrodes of each of the electronic components housed in each of the cavities. The contact surface of the measuring probe with the electrode is a part of a cylindrical surface having a central axis oriented perpendicular to the arrangement direction of the cavities. When measuring the aforementioned electrical characteristics, the terminal position defining section is provided to position the central axis at a position different from the central position of the cavity in the arrangement direction, and to position at least a portion of the measuring probe inside the cavity. Characteristic measuring device.

[0078] <8> A holder having a main surface provided with a plurality of cavities that house electronic components including a first external electrode and a second external electrode, A measuring probe is provided that is facing the main surface of the holder and is capable of displacing its relative position in a first direction along the main surface of the holder, A measuring electrode provided on the inner surface of the cavity, A first drive mechanism that displaces the relative position between the holder and the measuring probe in a second direction perpendicular to the main surface of the holder, A measuring device comprising: a second drive mechanism for displacing the measuring probe to a position facing each of the plurality of cavities, the second drive mechanism for displacing the relative position between the measuring probe and the holder such that, in the second direction, the measuring probe is facing the inner region of the opening of the cavity, and the measuring probe is in electrical contact with the first or second external electrode exposed in the opening; The holder is provided with recesses or protrusions on the main surface of the holder, according to the pitch in a first direction between adjacent cavities. When the external electrode that comes into contact with the measuring probe is designated as the first external electrode, The second drive mechanism displaces the measuring probe in conjunction with the change in the relative position of the recess or protrusion in the second direction, such that only the first external electrode makes electrical contact. Characteristic measurement device.

[0079] <9> The second drive mechanism displaces the measuring probe to a position different from the central position of the opening of the cavity in the cavity arrangement direction such that only the first external electrode makes electrical contact. <8> The characteristic measuring device described above.

[0080] <10> The contact surface of the measuring probe with the first external electrode is part of a cylindrical surface having a central axis oriented perpendicular to the arrangement direction of the cavities. <8> from <9> A characteristic measuring device described in any one of the following.

[0081] <11> The electronic component comprises a first reference electrode and a second reference electrode, the first and second of which are positioned on a surface different from the surface on which the first external electrode or the second external electrode is positioned, with at least a portion of each electrode positioned on the surface. The measuring electrode is in electrical contact with at least one of the first reference electrode and the second reference electrode. <8> from <10> A characteristic measuring device described in any one of the following.

[0082] <12> Multiple protrusions are provided along the direction of arrangement of the cavities. The measuring probe contacts only the first external electrode by contacting only one of the protrusions. <8> from <11> A characteristic measuring device described in any one of the following.

[0083] <13> The recess is connected to the cavity. <8> from <12> A characteristic measuring device described in any one of the following. [Explanation of Symbols]

[0084] 1. Characteristic Measurement Device 2 Cavities 10 holders 12 rotation axes 16 Main surface 18 Back side 20 base 24 Base surface 28 Relief groove 30 Cavity 31 Opening 32 Electrode exposure port 42 Inner self 44 recess 45 Main surface convex part 46 Main surface recess 47 Convex part 50 Cam Followers 81 Measuring probe 82 Measuring electrode 84 Rotation axis 85 Center axis 86 Contact surface 110 Electronic Components 121 First reference electrode 122 Second reference electrode 123 First external electrode 124 Second external electrode 131 First end face 132 Second end face 141 First Aspect 142 Second Aspect 143 The Third Aspect 144 The Fourth Aspect 241 First arrangement 242 Second arrangement 411 Center position

Claims

1. An electronic component body having a first end and a second end facing the first component direction, a first side and a second side facing the second component direction intersecting the first component direction, and a third side and a fourth side facing the third component direction intersecting the first and second component directions, A first reference electrode formed at least at the first end, A second reference electrode formed at least at the second end, A first external electrode formed continuously on the first side, third side, and second side, An apparatus for measuring the electrical characteristics of an electronic component having a second external electrode formed continuously on the first side, fourth side, and second side, When the external electrode that comes into contact with the measuring probe is designated as the first external electrode, A holder having a plurality of cavities for housing one of the aforementioned electronic components, and holding the electronic component with the first external electrode facing the opening of the cavity, A measuring probe positioned near the aforementioned opening, The holder is driven relative to the measuring probe so that the measuring probe sequentially faces the first external electrode of each of the electronic components housed in each of the cavities, The contact surface of the measuring probe with the first external electrode is a part of a cylindrical surface having a central axis oriented perpendicular to the driving direction of the holder. When measuring the aforementioned electrical characteristics, the drive unit positions the central axis at a position different from the central position of the cavity in the arrangement direction. The device includes a terminal position defining section that allows the measuring probe to be brought into contact with and separated from the first external electrode of the electronic component while not in contact with the second external electrode at that position. Characteristic measurement device.

2. The aforementioned drive unit is a motor, The rotating shaft attached to the central part of the holder is connected to the following The characteristic measuring apparatus according to claim 1.

3. The terminal position defining portion is a protrusion provided on the holder, When measuring the electrical characteristics, the measuring probe contacts the convex or non-convex portion, thereby enabling the measuring probe to contact the first external electrode without contacting the second external electrode of the electronic component, and the central axis is positioned at a location different from the center of the cavity in the driving direction. The characteristic measuring device according to claim 1 or 2.

4. Multiple protrusions are provided along the driving direction, When measuring the aforementioned electrical characteristics, the measuring probe contacts only one of the aforementioned protrusions. The characteristic measuring apparatus according to claim 3.

5. The terminal position defining portion is a recess provided in the holder, The recess has an arc shape in a cross-section parallel to the driving direction and the second direction. The position of the center of the circle containing the arc in the aforementioned arc shape in the driving direction is different from the position of the center of the cavity in the arrangement direction. A characteristic measuring device according to any one of claims 1 to 4.

6. The measuring electrode is positioned opposite the opening of the cavity when measuring the aforementioned electrical characteristics. The cavity has an electrode exposure opening at a position opposite to the opening, When measuring the aforementioned electrical characteristics, the measuring electrode is exposed from the electrode exposure opening toward the interior of the cavity. When measuring the electrical characteristics, the measuring electrode is exposed from the electrode exposure opening toward the interior of the cavity and makes electrical contact with at least one of the first reference electrode and the second reference electrode. The characteristic measuring apparatus according to any one of claims 1 to 5.

7. The cam follower to which the measurement probe is connected further comprises The terminal position defining portion is at least one of the convex and concave portions present on the surface of the holder. The cam follower is positioned to trace the shapes of the convex and concave portions. A characteristic measuring device according to any one of claims 1 to 6.

8. An apparatus for measuring the electrical characteristics of an electronic component having an electronic component body and electrodes, A holder having a plurality of cavities for housing one of the aforementioned electronic components, and holding the electronic component with its electrodes facing the openings of the cavities, The system includes a measuring probe positioned near the opening so as to contact the electrode, The holder can be moved relative to the measuring probe so that the measuring probe sequentially contacts the electrodes of each of the electronic components housed in each of the cavities. The contact surface of the measuring probe with the electrode is part of a cylindrical surface having a central axis oriented perpendicular to the direction of movement of the holder. When measuring the aforementioned electrical characteristics, the terminal position defining section is provided to position the central axis at a position different from the central position of the cavity in the direction of movement, and to position at least a portion of the measuring probe inside the cavity. Characteristic measurement device.

9. A holder having a plurality of cavities on its main surface that house electronic components including a first external electrode and a second external electrode, A measuring probe is provided that is facing the main surface of the holder and is capable of displacing its relative position in a first direction along the main surface of the holder, A measuring electrode provided on the inner surface of the cavity, A first drive mechanism that displaces the relative position between the holder and the measuring probe in a second direction perpendicular to the main surface of the holder, A measuring device comprising: a second drive mechanism for displacing the measuring probe to a position facing each of the plurality of cavities, the second drive mechanism for displacing the relative position between the measuring probe and the holder such that, in the second direction, the measuring probe is facing the inner region of the opening of the cavity, and the measuring probe is in electrical contact with the first or second external electrode exposed in the opening; The holder is provided with recesses or protrusions on the main surface of the holder according to the pitch in a first direction between adjacent cavities, When the external electrode that comes into contact with the measuring probe is designated as the first external electrode, The second drive mechanism displaces the measuring probe in conjunction with the change in the relative position of the recess or protrusion in the second direction, such that only the first external electrode makes electrical contact. Characteristic measurement device.

10. The second drive mechanism displaces the measuring probe to a position different from the central position of the opening of the cavity in the direction of displacement, such that only the first external electrode makes electrical contact. The characteristic measuring apparatus according to claim 9.

11. The contact surface of the measuring probe with the first external electrode is a part of a cylindrical surface having a central axis oriented perpendicular to the direction of the displacement. The characteristic measuring device according to claim 9 or 10.

12. The electronic component comprises a first reference electrode and a second reference electrode, the first and second of which are positioned on a surface different from the surface on which the first external electrode or the second external electrode is positioned, with at least a portion of each electrode positioned on the surface. The measuring electrode is in electrical contact with at least one of the first reference electrode and the second reference electrode. A characteristic measuring device according to any one of claims 9 to 11.

13. Multiple protrusions are provided along the direction of the displacement. The measuring probe contacts only the first external electrode by contacting only one of the protrusions. A characteristic measuring device according to any one of claims 9 to 12.

14. The recess is connected to the cavity. A characteristic measuring device according to any one of claims 9 to 13.

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