Analytical device

Abstract

The present invention provides an analytical apparatus that can suppress the phenomenon of the rear end of an analytical tip lifting off the transport table during the process in which the analytical tip is transported from a waiting area to a target area by the rear end of the analytical tip being pushed by a transport bar. [Solution] The analysis apparatus includes a transport bar that transports a flat analysis chip located in a waiting area on a transport table to a target area by pushing its rear end along the transport table, and a pressing mechanism that presses the analysis chip from the side within the target area.

Description

Technical Field

[0001] This disclosure relates to an analytical apparatus.

Background Art

[0002] Patent Document 1 discloses an image acquisition system having means for holding a specimen on a specimen stage. In Patent Document 1, a form example in which a leaf spring is used as means for holding a specimen on a specimen stage is given. Examples of methods for holding a specimen on a specimen stage using a leaf spring include a method of pressing the non-imaging region of the specimen from the Z direction and a method of pressing the side surface of the specimen from the XY direction.

[0003] Patent Document 2 discloses a biochemical analyzer including an element cartridge. In the biochemical analyzer described in Patent Document 2, a plurality of unused dry analysis elements are stored in a stacked state in the element cartridge. Each dry analysis element is positioned within the element cartridge so that it can be individually taken out. During conveyance, the elements are sequentially taken out one by one from the element cartridge by a conveyance device and sent to the analyzer through a conveyance path. The conveyance is performed using vacuum suction or a mechanical arm and is accurately positioned at a position required for analysis. By this process, the dry analysis elements are automatically and efficiently supplied and the analysis operation proceeds continuously.

[0004] Patent Document 3 discloses a radioactive substance measuring device. The radioactive substance measuring device described in Patent Document 3 includes a positioning mechanism for accurately positioning a cartridge at a predetermined position. At the collection station, the cartridge is fixed by a stopper. This ensures that the cartridge is reliably used for collection and measurement. The radioactive substance measuring device stores the cartridge in a sealed case to protect it from an external environment such as moisture. The cartridges are sequentially taken out, accurately positioned by the positioning mechanism, and recovered after measurement.

Prior Art Documents

Patent Documents

[0005] [Patent Document 1] WO13 / 084345 publication [Patent Document 2] Japanese Patent Publication No. 2013-076683 [Patent Document 3] Japanese Patent Publication No. 2010-156638 [Overview of the project]

[0006] One embodiment of the present disclosure provides an analytical apparatus that can suppress the occurrence of the phenomenon in which the rear end of an analytical chip lifts off the transport table during the process in which the analytical chip is transported from a waiting area to a target area by the rear end of the analytical chip being pushed by a transport bar. [Means for solving the problem]

[0007] A first aspect of the present disclosure is an analytical apparatus comprising a transport bar that transports an analytical chip to a target area by pushing the rear end of a flat analytical chip located in a waiting area on a transport table along the transport table, and a pressing mechanism that presses the analytical chip from the side within the target area.

[0008] A second aspect of the present disclosure is an analytical apparatus according to the first aspect, wherein multiple analytical chips can be stacked in a cartridge provided on a transport table by utilizing their own weight, and the standby area is the area where the bottom layer of analytical chips among the multiple analytical chips stacked in the cartridge is located.

[0009] A third aspect of the present disclosure is an analytical apparatus according to the second aspect, comprising a transport path that serves as a route for transporting an analytical chip from a waiting area to a target area, and a cartridge having an opening at a position corresponding to the transport path.

[0010] A fourth aspect of this disclosure is an analytical apparatus according to the second or third aspect, wherein the cartridge has a through hole positioned facing the target area in the transport direction of the analytical tip, and the transport bar transports the analytical tip to the target area by pushing the rear end of the bottom layer of analytical tip along the transport table through the through hole.

[0011] A fifth aspect of this disclosure is an analytical apparatus according to the fourth aspect, wherein a transport bar reciprocates between a waiting area and a target area through a through-hole, thereby transporting a plurality of analytical chips stacked in a cartridge from the bottom layer analytical chip to the top layer analytical chip in order from the waiting area to the target area.

[0012] A sixth aspect of the present disclosure is an analytical apparatus relating to any one of the second to fifth aspects, wherein the distance between the standby area and the target area is the distance over which the analytical chip straddles the standby area and the target area in the transport direction of the analytical chip.

[0013] A seventh aspect of this disclosure is an analytical apparatus according to any one of the first to sixth aspects, comprising a transport path that serves as a route for transporting an analytical chip from a standby area to a target area, wherein at least a portion of the pressing mechanism protrudes into the transport path when the pressing mechanism and the analytical chip are in a non-contact state.

[0014] The eighth aspect of this disclosure is an analytical apparatus relating to any one of the first to seventh aspects, wherein the analytical tip is pushed into a target area by a transport bar while being subjected to a lateral pressing force from a pressing mechanism.

[0015] The ninth aspect of this disclosure is an analytical apparatus according to any one of the first to eighth aspects, wherein a clearance is provided across the entire upper surface on the upper side of the analytical tip located in the target area.

[0016] A tenth aspect of the present disclosure is an analytical apparatus according to any one of the first to ninth aspects, wherein the target area is provided with a limiting member that restricts upward movement of the analytical tip.

[0017] An eleventh aspect of this disclosure is an analytical apparatus according to the tenth aspect, wherein the height to the limiting member within the target area is greater than the thickness of the analytical tip and less than the sum of the thickness of the analytical tip and the thickness of the transport bar.

[0018] A twelfth aspect of the present disclosure is an analytical apparatus according to the tenth or eleventh aspect, wherein the limiting member is at least one rib protruding from the upper to the lower side of the target area.

[0019] A thirteenth aspect of the present disclosure is an analytical apparatus according to any one of the first to twelfth aspects, wherein the pressing mechanism comprises a wall in which one side of an analytical tip contacts within a target area, and an elastic member that presses the other side of the analytical tip within the target area, and the elastic member presses the other side within the target area, thereby causing one side to be pressed against the wall.

[0020] A fourteenth aspect of this disclosure is an analytical apparatus according to the thirteenth aspect, wherein the elastic member is installed in a position where it presses against the other side in a state in which elastic force has accumulated.

[0021] A 15th aspect of this disclosure is an analytical apparatus according to the 13th or 14th aspect, wherein the elastic member is a spring.

[0022] A sixteenth aspect of this disclosure is an analytical apparatus according to the fifteenth aspect, wherein the spring is a leaf spring.

[0023] A 17th aspect of this disclosure is an analytical apparatus according to the 13th or 14th aspect, wherein the elastic member is a member having a spring and a transmission member attached to the spring and transmitting the elastic force of the spring to the other side by contacting the other side.

[0024] The 18th aspect according to the present disclosure is an analytical apparatus according to any one of the 1st to 12th aspects, having a first elastic member that presses one side surface of an analysis chip within a target region, and a second elastic member that presses the other side surface of the analysis chip within the target region.

[0025] The 19th aspect according to the present disclosure is an analytical apparatus according to the 18th aspect, wherein the first elastic member is installed at a position where it presses one side surface in a state deformed in a form in which elastic force is accumulated, and the second elastic member is installed at a position where it presses the other side surface in a state deformed in a form in which elastic force is accumulated.

[0026] The 20th aspect according to the present disclosure is an analytical apparatus according to the 18th or 19th aspect, wherein the first elastic member and / or the second elastic member is a spring.

[0027] The 21st aspect according to the present disclosure is an analytical apparatus according to the 20th aspect, wherein the spring is a leaf spring.

[0028] The 22nd aspect according to the present disclosure is an analytical apparatus according to the 18th or 19th aspect, wherein the first elastic member is a member having a first spring and a first transmission member attached to the first spring and transmitting the elastic force of the first spring to one side surface by contacting the one side surface, and the second elastic member is a member having a second spring and a second transmission member attached to the second spring and transmitting the elastic force of the second spring to the one side surface by contacting the other side surface.

[0029] The 23rd aspect according to the present disclosure is an analytical apparatus according to any one of the 1st to 22nd aspects, wherein the target region is provided in a processing unit that performs processing on the analysis chip.

[0030] The 24th aspect according to the present disclosure is an analytical apparatus according to the 23rd aspect, wherein the processing includes spotting of a sample.

Brief Description of Drawings

[0031] [Figure 1]This diagram shows a schematic longitudinal cross-sectional view illustrating an example of a partial configuration of the transport system included in the analytical apparatus according to the embodiment, and a conceptual diagram illustrating an example of the main components surrounding the transport system. [Figure 2] This diagram shows a schematic longitudinal cross-sectional view illustrating an example of a partial configuration of the transport system when the analysis chip enters the target area in the analytical apparatus according to the embodiment, and a schematic plan view illustrating an example of the main configuration around the transport system. [Figure 3] This diagram shows a schematic longitudinal cross-sectional view illustrating an example of a partial configuration of the transport system when the analysis chip is located in the target area in the analytical apparatus according to the embodiment, and a schematic plan view illustrating an example of the main components around the transport system. [Figure 4] This diagram shows a schematic longitudinal cross-sectional view illustrating an example of a partial configuration of the transport system when an analysis chip is loaded into an incubator in the analytical apparatus according to the embodiment, and a schematic plan view illustrating an example of a key component configuration around the transport system. [Figure 5] This diagram shows a schematic longitudinal cross-sectional view illustrating an example of a partial configuration of the transport system in an analytical apparatus according to an embodiment, where the transport bar is returning to its original position, and a schematic plan view illustrating an example of a key component configuration around the transport system. [Figure 6] This diagram shows a schematic longitudinal cross-sectional view illustrating an example of a partial configuration of the transport system when the transport bar returns to its original position in the analytical apparatus according to the embodiment, and a schematic plan view illustrating an example of the main components surrounding the transport system. [Figure 7] This is a schematic longitudinal cross-sectional view showing a first modified example of a part of the transport system included in the analytical apparatus according to the embodiment, and a conceptual diagram showing an example of the main components around the transport system. [Figure 8] This is a schematic longitudinal cross-sectional view showing a second modified example of a part of the transport system included in the analytical apparatus according to the embodiment, and a conceptual diagram showing an example of the main components around the transport system. [Figure 9] This is a schematic longitudinal cross-sectional view showing a third modified example of a part of the transport system included in the analytical apparatus according to the embodiment, and a conceptual diagram showing an example of the main components around the transport system. [Figure 10] This diagram shows a schematic longitudinal cross-sectional view illustrating an example of a partial configuration of a transport system included in a conventionally known analytical instrument, and a conceptual diagram illustrating an example of a key component configuration around the transport system. [Figure 11]This diagram shows a schematic longitudinal cross-sectional view illustrating an example of a partial configuration of the transport system when the tip of the analytical tip comes into contact with a weight inside the cover in a conventionally known analytical instrument, and a schematic plan view illustrating an example of the main components surrounding the transport system. [Figure 12] This is a schematic longitudinal cross-sectional view showing an example of a partial configuration of the transport system when the analytical tip is located in the target area in a conventionally known analytical instrument. [Figure 13] This is a schematic longitudinal cross-sectional view showing an example of a partial configuration of the transport system when an analytical chip is loaded into an incubator in a conventionally known analytical instrument. [Figure 14] This is a schematic longitudinal cross-sectional view showing an example of a partial configuration of the transport system in a conventional analytical instrument where the transport bar is returning to its original position. [Figure 15] This is a schematic longitudinal cross-sectional view showing an example of a partial configuration of the transport system when the transport bar returns to its original position in a conventionally known analytical instrument. [Modes for carrying out the invention]

[0032] An example of an embodiment of the analytical apparatus relating to this disclosure will be described below with reference to the attached drawings.

[0033] First, let's explain the terminology used in the following explanation.

[0034] In this specification, “orthogonal” means not only perfect orthogonality but also orthogonality that includes errors generally accepted in the art to which the disclosed art belongs. In this specification, “perpendicular” means not only perfect perpendicularity but also perpendicularity that includes errors generally accepted in the art to which the disclosed art belongs. In this specification, “parallel” means not only perfect parallelism but also parallelism that includes errors generally accepted in the art to which the disclosed art belongs. In this specification, “horizontal” means not only perfect horizontality but also horizontality that includes errors generally accepted in the art to which the disclosed art belongs.

[0035] In this specification, "A and / or B" is synonymous with "at least one of A and B." That is, "A and / or B" means that it may be A alone, or B alone, or a combination of A and B. Furthermore, in this specification, the same concept as "A and / or B" applies when expressing three or more things linked by "and / or."

[0036] First, before describing this embodiment, a comparative example will be explained with reference to Figures 10 to 15.

[0037] [Comparative Example] Figures 10 to 15 show a schematic longitudinal cross-sectional view of an example of a partial configuration of the transport system included in a conventionally known analytical instrument 200.

[0038] As an example, as shown in Figure 10, the analyzer 200 is a device for analyzing a sample. The analyzer 200 uses a dry analysis tip 12, and measures the concentration of the substance to be tested contained in the sample applied to the analysis tip 12.

[0039] For example, the analyzer 200 uses blood as a sample and optically measures the concentration of the substance to be tested contained in the blood. One example of optical measurement of the concentration of the substance to be tested is measurement of the concentration of the substance to be tested by colorimetric measurement.

[0040] The shape of the analysis tip 12 is flat. Generally, when the analysis tip 12 has a flat shape, it is also called a slide.

[0041] The analysis tip 12 has a reaction region 14 on which a reagent is fixed. The reagent reacts with the substance to be tested to produce a substance that develops a specific color. Hereinafter, the substance that develops color upon reaction with the substance to be tested will be referred to as the "reactant." An example of a reagent is a solid-phase dry reagent that is in a dry state at least at the time of shipment. The sample is applied to the reaction region 14.

[0042] The analysis tip 12 has a carrier 16 on which the sample is applied. The carrier 16 is housed in a case 18. The case 18 has a first case 18A and a second case 18B. The carrier 16 is sandwiched between the first case 18A and the second case 18B. The first case 18A has an opening 18A1 that communicates with the surface side of the carrier 16.

[0043] In the second case 18B, an opening 18B1 is formed on the side opposite to the side where the opening 18A1 is formed in case 18. The opening 18B1 communicates with the back surface of the carrier 16 from the second case 18B side. The reaction region 14 is the region exposed by the openings 18A1 and 18B1. A sample is spot-applied to the reaction region 14 through the opening 18A1, and light is irradiated onto the reaction region 14 through the opening 18B1.

[0044] The analytical apparatus 200 includes a transport table 20, a transport bar 22, a cartridge 24, a sample application device 26, and an incubator 28.

[0045] The transport platform 20 is a platform used to transport the analysis chip 12. The analysis chip 12 is transported linearly on the transport platform 20 toward the incubator 28. The surface 20A of the transport platform 20 is a surface parallel to the horizontal plane. The analysis chip 12 is placed on the surface 20A with the surface of the second case 18B in which the opening 18B1 is formed in contact with it. The analysis chip 12 slides along the surface 20A toward the incubator 28.

[0046] The X, Y, and Z directions are defined for the analyzer 200. The X direction is the direction in which the analyzer tip 12 is transported and is aligned horizontally. The Y direction is perpendicular to the X direction within the same horizontal plane. The Z direction is perpendicular to both the X and Y directions.

[0047] The transport bar 22 is formed in a flat plate shape. The thickness of the transport bar 22 is less than or equal to the thickness of the analysis tip 12.

[0048] The cartridge 24 is provided on the surface 20A. The lower end of the cartridge 24 is fixed to the surface 20A. The cartridge 24 houses the analysis chips 12. Multiple analysis chips 12 can be stacked inside the cartridge 24 by utilizing their own weight. In the example shown in Figure 10, 18 analysis chips 12 are housed inside the cartridge 24 in a stacked state along the Z direction, and a weight 29 is placed on the top layer of analysis chips 12. The number of analysis chips 12 housed inside the cartridge 24 can be any number as long as the cartridge 24 can accommodate them.

[0049] The analysis chip 12 is located in a standby area 30 on the surface 20A. In the example shown in Figure 10, the standby area 30 is the area on the surface 20A where the bottommost analysis chip 12 among the multiple analysis chips 12 stacked in the cartridge 24 is located.

[0050] The analyzer 200 is equipped with a transport path 32. The transport path 32 is provided on the surface 20A. The transport path 32 is the path through which the analysis chip 12 is transported from the waiting area 30 to the target area 34. The target area 34 is an area that exists as one of the destinations for the analysis chip 12. An example of the target area 34 is an area in which a sample can be applied to the reaction area 14.

[0051] The cartridge 24 has a through-hole 24A positioned opposite the target area 34 in the transport direction of the analysis chip 12. The through-hole 24A is located on the transport path 32. That is, the through-hole 24A is located at a position corresponding to the bottom layer of the multiple analysis chips 12 stacked on the cartridge 24 and penetrates the cartridge 24 along the X direction. The through-hole 24A has openings 24A1 and 24A2 at positions corresponding to the transport path 32.

[0052] The transport bar 22 reciprocates linearly along the transport path 32 by receiving power generated by a drive source (e.g., a motor or solenoid). The tip 22A of the transport bar 22 presses the rear end 12A of the analysis tip 12 located in the waiting area 30 (i.e., the bottommost analysis tip 12 in the cartridge 24) through the opening 24A1. As a result, the analysis tip 12 located in the waiting area 30 is transported along the transport path 32 toward the target area 34 (see Figure 11).

[0053] The sample application device 26 is located between the cartridge 24 and the incubator 28. The target area 34 is located in the sample application device 26. The sample application device 26 performs processing on the analysis tip 12 located in the target area 34. "Processing" here includes the application of the sample. That is, the sample application device 26 applies the sample to the reaction area 14 of the analysis tip 12 that has been transported to the target area 34.

[0054] The sample application device 26 comprises a dispensing device 36, a translucent or transparent cover 38, and a weight 40. The dispensing device 36 dispenses the sample from a nozzle. The cover 38 is a container-shaped cover with an internal space. The upper wall 38A of the cover 38 has a track-shaped opening 38A1 in plan view, whose longitudinal direction is aligned with the X direction.

[0055] A target area 34 is provided inside the cover 38. The target area 34 is located directly below the nozzle of the applicator 36 so that when the analysis tip 12 is positioned within the target area 34, the sample is dropped from the nozzle of the applicator 36 onto the reaction area 14 of the analysis tip 12 through the opening 38A1. The cover 38 has a through hole 38B formed in the same manner as the through hole 24A formed in the cartridge 24. The through hole 38B has an opening 38B1 opposite to the opening 24A2, and an opening 38B2 on the opposite side of the opening 38B1 in the X direction.

[0056] A weight 40 is provided inside the cover 38 so as to be slidable along the Z direction. Inside the cover 38, the weight 40 is positioned on the side of the opening 38B1 so as to obstruct the transport path 32 by its own weight. The weight 40 has a taper 40A formed on it, which gradually increases in thickness from the side of the opening 38B1 to the back side of the through hole 38B (i.e., the side of the opening 38B2).

[0057] The analysis tip 12, transported from the waiting area 30 along the transport path 32 by the transport bar 22, is inserted into the through hole 38B through the opening 38B1 from the tip 12B side of the analysis tip 12. The tip 12B of the analysis tip 12 inserted into the through hole 38B contacts the taper 40A of the weight 40 (see Figure 11). Then, when the rear end 12A of the analysis tip 12 is further pressed by the tip 22A of the transport bar 22, the analysis tip 12 lifts the weight 40 against the weight of the weight 40 and reaches the target area 34 while passing under the weight 40 (see Figure 12). When the analysis tip 12 is located in the target area 34, the weight 40 presses down on the analysis tip 12 from above, thereby holding the analysis tip 12 within the target area 34. In this state, the dispensing device 36 drops the sample toward the reaction area 14 of the analysis tip 12, and the sample is dispensed onto the reaction area 14 (see Figure 12).

[0058] Once the sample has been applied to the reaction area 14, the rear end 12A of the analysis tip 12 is further pressed by the tip 22A of the transport bar 22, and the analysis tip 12 is loaded into the incubator 28 (see Figure 13).

[0059] The incubator 28 has a rotary table (not shown) that can rotate in a plane parallel to the surface 20A. The rotary table holds a plurality of analysis chips 12 along the circumferential direction. The incubator 28 heats the analysis chips on the rotary table to a target temperature (e.g., 37°C), and sequentially transports each of the plurality of analysis chips 12 held on the rotary table to a measurement position by the rotation of the rotary table, and performs optical measurements.

[0060] One example of optical measurement performed in Incubator 28 is colorimetric measurement (i.e., quantitative measurement of the substance to be tested using the colorimetric method). In colorimetric measurement, light is irradiated onto the reaction region 14, and the intensity of the reflected light obtained from the reaction region 14 is measured. The intensity of the reflected light indicates the concentration of the substance to be tested based on the degree of color development of the reactant. In colorimetric measurement, light of multiple different wavelengths is used, and the optimal wavelength for the substance to be tested is selected. In addition, black and white density plates are used as reference standards, which correct the optical measurement and ensure the accuracy of the measured value. In colorimetric measurement, by referring to the black and white density plates, it is determined what concentration the intensity of the reflected light represents, and the accurate concentration of the substance to be tested is derived.

[0061] After the analysis chip 12 is loaded into the incubator 28, the transport bar 22 moves in the opposite direction to the transport direction of the analysis chip 12, as shown in Figure 14 as an example. Then, as shown in Figure 15 as an example, the transport bar 22 is returned to its original position.

[0062] As the transport bar 22 is returned to its original position from the target area 34, the tip 22A of the transport bar 22 passes through the openings 24A2 and 24A1 of the through-hole 24A of the cartridge 24 in sequence. As shown in Figure 15 as an example, one analysis chip 12 falls into the waiting area 30 due to the weight of each analysis chip 12 in the cartridge 24 plus the weight of the counterweight 29. The analysis chips 12 placed in the waiting area 30 in this manner are then transported to the target area 34 by the transport bar 22.

[0063] In the analysis apparatus 200 configured as described above, as the analysis tip 12 is transported from the waiting area 30 to the target area 34 by being pushed by the transport bar 22, the tip 12B of the analysis tip 12 comes into contact with the taper 40A of the weight 40 provided inside the cover 38. At this time, a vertical rotational torque is applied to the analysis tip 12 (i.e., a torque in the direction that presses the tip 12B of the analysis tip 12 against the surface 20A and moves the rear end 12A of the analysis tip 12 away from the surface 20A). When a vertical rotational torque is applied to the analysis tip 12 in this way, there is a risk that the rear end 12A of the analysis tip 12 may lift off the surface 20A.

[0064] If the rear end 12A of the analysis tip 12 lifts off the surface 20A, there is a risk that the tip 22A of the transport bar 22 may get stuck underneath the analysis tip 12. In this case, there is a concern that the transport bar 22 may get caught between the analysis tip 12 and the surface 20A. If the transport bar 22 gets caught between the analysis tip 12 and the surface 20A, there is a risk that the transport of the analysis tip 12 may be impaired, or that the tip 22A of the transport bar 22 may become difficult to remove from underneath the analysis tip 12 when returning the transport bar 22 to its original position. Also, if the transport bar 22 gets caught between the analysis tip 12 and the surface 20A, there is a risk that the transport bar 22 and / or the analysis tip 12 may rub against each other and be damaged. Furthermore, even if the analysis tip 12 can be positioned in the target area 34, if the transport bar 22 remains stuck underneath the analysis tip 12, there is a risk that the sample will not be properly applied to the reaction area 14.

[0065] Furthermore, in the analysis device 200, the distance between the standby area 30 and the target area 34 is the distance over which the analysis tip 12 straddles the standby area 30 and the target area 34 in the transport direction of the analysis tip 12. Therefore, as the analysis tip 12 is transported from the standby area 30 to the target area 34 by being pushed by the transport bar 22, the rear end 12A of the analysis tip 12 remains in the standby area 30. As the rear end 12A of the analysis tip 12 lifts off the surface 20A, other analysis tips 12 remaining in the cartridge 24 are pushed up from below, and there is a risk that the weight 29 or the uppermost analysis tip 12 may fly out of the upper opening of the cartridge 24.

[0066] Hereinafter, an example of an embodiment relating to this disclosure, in view of the above circumstances, will be described with reference to Figures 1 to 6. In the embodiments shown below, the differences from the comparative example above will be mainly described, and the same components will be denoted by the same reference numerals and their descriptions will be omitted.

[0067] [Embodiment] Figures 1 to 6 show a schematic longitudinal cross-sectional view of an example of a partial configuration of the transport system included in the analytical apparatus 10 according to this embodiment.

[0068] As an example, as shown in Figure 1, the analyzer 10 differs from the analyzer 200 in that it has a sample application device 42 instead of a sample application device 26, and a target area 44 instead of a target area 34. The sample application device 42 differs from the sample application device 26 in that it has a cover 46 instead of a cover 38, and a pressing mechanism 48 instead of a weight 40. In this embodiment, the analyzer 10 is an example of the "analytical apparatus" according to the disclosure. Also, in this embodiment, the pressing mechanism 48 is an example of the "pressing mechanism" according to the disclosure.

[0069] The cover 46 is a translucent or transparent cover. The cover 46 is also a container-shaped cover with an internal space. The upper wall 46A of the cover 46 has a track-shaped opening 46A1 in plan view, whose longitudinal direction is aligned with the X direction (i.e., the opening corresponding to the opening 38A1 shown in Figure 10).

[0070] The cover 46 has a through hole 46B corresponding to the through hole 38B shown in Figure 10, an opening 46B1 corresponding to the opening 38B1 shown in Figure 10, and an opening 46B2 corresponding to the opening 38B2 shown in Figure 10.

[0071] As shown in Figure 10, the cover 38 has a weight 40 inside, whereas the cover 46 does not have a weight 40. Therefore, the space inside the cover 46 can be made wider than the space inside the cover 38 shown in Figure 10 because of the absence of the weight 40. Also, because the cover 46 does not have a weight 40, the tip 12B of the analysis tip 12 can be inserted into the cover 38 more smoothly than when the cover 38 is used.

[0072] Inside the cover 46, a target area 44 corresponding to the target area 34 shown in Figure 10 is provided. The distance between the standby area 30 and the target area 44 is the distance that the analysis chip 12 crosses between the standby area 30 and the target area 44 in the transport direction of the analysis chip 12.

[0073] Similar to the comparative example above, the analysis tip 12 is transported to the target region 44 (see Figure 3). The sample dropped from the nozzle of the applicator 36 is then applied to the reaction region 14 of the analysis tip 12 located in the target region 44 (see Figure 3).

[0074] A pair of ribs 46C are provided on the lower surface 46A2 of the upper wall 46A of the cover 46, positioned to straddle the opening 46A1 in the Y direction. The pair of ribs 46C are a pair of rectangular parallelepiped ribs perpendicular to the lower surface 46A2. The longitudinal direction of the ribs 46C is the X direction. The ribs 44C protrude from the upper side to the lower side of the target region 44. That is, the ribs 46C protrude downward (i.e., downward in the Z direction) from the lower surface 46A2 which is located above the target region 44. The pair of ribs 46C restrict the upward (i.e., upward in the Z direction) movement of the analysis tip 12 transported into the cover 46. In this embodiment, the pair of ribs 46C is an example of a “restricting member” according to the present disclosure.

[0075] Here, a pair of ribs 46C (i.e., two ribs) is shown as an example, but this is merely one example, and three or more ribs may be used instead of a pair of ribs 46C, or even just one rib may be used. Also, although ribs 46C are shown as an example here, this is merely one example, and any member may be used as long as it restricts the upward movement of the analysis tip 12 transported inside the cover 46 and does not obstruct the transport of the analysis tip 12 or the movement of the transport bar 22.

[0076] The height H to the pair of ribs 46C within the target region 44 (i.e., the distance from the surface 20A of the conveyor table 20 to the lower surface 46C1 of the ribs 46C) is greater than the thickness of the analysis tip 12 and less than the sum of the thickness of the analysis tip 12 and the thickness of the conveyor bar 22.

[0077] The pressing mechanism 48 includes a leaf spring 50 and a wall 52. The pressing mechanism 48 presses the analysis tip 12 from the side within the target region 44. To achieve lateral pressing of the analysis tip 12 within the target region 44, at least a portion of the pressing mechanism 48 protrudes into the transport path 32 while in a non-contact state with the analysis tip 12. As shown in Figure 1, a portion of the leaf spring 50 protrudes into the transport path 32. In this embodiment, the leaf spring 50 is an example of the "elastic member," "spring," and "leaf spring" according to the disclosure. Also, in this embodiment, the wall 52 is an example of the "wall" according to the disclosure.

[0078] Inside the cover 46, walls 52 and 54 are erected facing each other in the Y direction. Walls 52 and 54 are integrated with the surface 20A and are erected perpendicular to the surface 20A. Inside the cover 46, the analysis tip 12 is transported to the area sandwiched between walls 52 and 54 (see Figures 2 and 3). Inside the cover 46, one side 12C of the analysis tip 12 (i.e., one side and the other side in the Y direction) is in contact with wall 52, and the other side 12D of the analysis tip 12 is in contact with wall 54.

[0079] When the transport of the analysis tip 12 continues with side surface 12C of the analysis tip 12 in contact with wall 52 and side surface 12D of the analysis tip 12 in contact with wall 54, side surface 12C of the analysis tip 12 slides on wall 52 and side surface 12D of the analysis tip 12 slides on wall 54. In this way, walls 52 and 54 restrict the movement of the analysis tip 12 in the Y direction within the cover 46 after it has been transported into the cover 46. In this embodiment, side surface 12C is an example of "one side surface of the analysis tip" according to the disclosure, and side surface 12D is an example of "the other side surface of the analysis tip" according to the disclosure.

[0080] An opening 54A is formed in the wall 54 at a position corresponding to the target area 44. The tip of the leaf spring 50 has a bent portion 50A. The bent portion 50A is bent at an obtuse angle. The bent portion 50A extends into the target area 44 through the opening 54A.

[0081] The pressing mechanism 48 has a recess 56. The recess 56 is a surface continuous with the surface 20A. The recess 56 is formed across the opening 54A, from the target area 44 side to the outside of the wall 54 (i.e., on the opposite side of the wall 54 from the target area 44). The recess 56 has a step that drops perpendicularly to the Z-direction side of the surface 20A, and the height of the step (i.e., the depth of the recess 56) is about half the width of the leaf spring 50 compared to the surface 20A. The leaf spring 50 is fitted into the recess 56 with its width direction coinciding with the Z-direction, and with the bent portion 50A entering the target area 44 from the opening 54A.

[0082] A clamping member 58 and a stopper 60 are provided at the bottom of the recess 56. The other end of the leaf spring 50 is inserted between the clamping member 58 and the inner wall surface 56A of the recess 56, thereby clamping it between the clamping member 58 and the inner wall surface 56A of the recess 56. This fixes the other end of the leaf spring 50 in the recess 56.

[0083] Furthermore, the leaf spring 50 is positioned to press against the side of the analysis tip 12 (i.e., the side facing the opening 54A) in a state where it has deformed to accumulate elastic force. In other words, the clamp member 58 and the inner wall surface 56A of the recess 56 clamp the leaf spring 50 in a state where it has deformed to accumulate elastic force (i.e., the leaf spring 50 is bent).

[0084] A disc-shaped stopper 60 is provided within the recess 56, adjacent to the clamp member 58. The stopper 60 restricts the movement of one end of the leaf spring 50 by contacting it when the bent portion 50A is pressed from the target region 44 side by the analysis tip 12.

[0085] As an example, as shown in Figure 2, the rear end 12A of the analysis tip 12 located in the lowest layer of the cartridge 24 is pressed along the surface 20A by the tip 22A of the transport bar 22 through the through hole 24A of the cartridge 24, thereby transporting the analysis tip 12 from the waiting area 30 toward the target area 44. As a result, the tip 22A of the analysis tip 12 is inserted into the through hole 46B through the opening 46B1 of the cover 46. The side surface 12C of the analysis tip 12 slides on the wall 52, and the side surface 12D of the analysis tip 12 slides on the wall 54. If the pressure on the rear end 12A of the analysis tip 12 by the tip 22A of the transport bar 22 continues, eventually the corner on the side surface 12D of the tip 12B of the analysis tip 12 will come into contact with the leaf spring 50 protruding from the opening 54A toward the transport path 32.

[0086] If the pressure applied by the tip 22A of the transport bar 22 against the rear end 12A of the analysis tip 12 continues, as shown in Figure 3 as an example, the analysis tip 12 is pushed into the target area 44 by the transport bar 22 while receiving lateral pressure from the pressing mechanism 48. In this case, within the target area 44, the bent portion 50A of the leaf spring 50 contacts the side surface 12D of the analysis tip 12 and presses against the side surface 12D. As the bent portion 50A presses against the side surface 12D of the analysis tip 12 in this way, the side surface 12C of the analysis tip 12 is pressed against the wall 52.

[0087] As an example, as shown in Figure 3, the cover 46 has a clearance 46D. The clearance 46D is provided across the entire upper surface 12E of the analysis tip 12 when the analysis tip 12 is located in the target area 44. The minimum height of the clearance 46D is the distance from the upper surface 12E of the analysis tip 12 located in the target area 44 to the lower surface 46C1 of the rib 46C. The distance from the upper surface 12E of the analysis tip 12 located in the target area 44 to the lower surface 46C1 of the rib 46C is shorter than the thickness of the conveyor bar 22.

[0088] When the analysis tip 12 is positioned in the target area 44, the pressure applied to the analysis tip 12 by the transport bar 22 is temporarily suspended. In this state, the side surface 12D of the analysis tip 12 is pressed by the leaf spring 50, and the side surface 12C of the analysis tip 12 is pressed against the wall 52, so that the analysis tip 12 is held within the target area 44. Once the analysis tip 12 is positioned in the target area 44, the dispensing device 36 dispenses the sample, and the sample is dispensed onto the reaction area 14.

[0089] Once the sample has been applied to the reaction area 14, the pressure applied to the analysis tip 12 by the transport bar 22 is resumed. That is, the rear end 12A of the analysis tip 12 is again pressed by the front end 22A of the transport bar 22, and the analysis tip 12 is loaded into the incubator 28, as shown in Figure 4 as an example.

[0090] After the analysis chip 12 is loaded into the incubator 28, the transport bar 22 moves in the opposite direction to the transport direction of the analysis chip 12, as shown in Figure 5 as an example. Then, as shown in Figure 6 as an example, the transport bar 22 is returned to its original position.

[0091] As the transport bar 22 is returned to its original position from the target area 44, the tip 22A of the transport bar 22 passes through the openings 24A2 and 24A1 of the through-hole 24A of the cartridge 24 in sequence. As shown in Figure 6 as an example, one analysis chip 12 falls into the waiting area 30 due to the weight of each analysis chip 12 inside the cartridge 24. The analysis chips 12 placed in the waiting area 30 in this manner are then transported to the target area 44 by the transport bar 22.

[0092] As described above, the movement of the transport bar 22 along the X direction (i.e., the movement of transporting the analysis chips 12 from the waiting area 30 to the target area 44 and the movement of dropping the analysis chips 12 in the cartridge 24 back into the waiting area 30) is repeated, and the analysis chips 12 in the cartridge 24 are transported one by one from the waiting area 30 to the target area 44. In other words, as the transport bar 22 moves back and forth between the waiting area 30 and the target area 44 through the through-hole 24A of the cartridge 24, the multiple analysis chips 12 stacked in the cartridge 24 are transported sequentially to the target area 44, from the bottom layer analysis chip 12 to the top layer analysis chip 12.

[0093] Next, the operation and effects of the part of the analytical device 10 related to this disclosure will be described.

[0094] Multiple analysis tips 12 are stacked along the Z direction within a cartridge 24 provided on the surface 20A of the transport table 20, utilizing the weight of each analysis tip 12 (see Figures 1 to 6). The rear end 12A of the analysis tip 12 located in the bottom layer of the cartridge 24 (i.e., the analysis tip 12 located in the waiting area 30) is pressed by the tip 22A of the transport bar 22 through the opening 24A1 of the cartridge 24, causing the analysis tip 12 to be pushed out of the opening 24A2 of the cartridge 24 toward the target area 44 (see Figures 2 and 3). The analysis tip 12 moves toward the target area 44 along the transport path 32 (see Figures 2 and 3).

[0095] As the tip 22A of the transport bar 22 continues to press against the rear end 12A of the analysis tip 12, the tip 12B of the analysis tip 12 eventually comes into contact with the leaf spring 50 protruding into the transport path 32 inside the cover 46 (see Figure 2). As the tip 22A of the transport bar 22 presses further against the rear end 12A of the analysis tip 12, the analysis tip 12 continues to move toward the target area 44 against the elastic force of the leaf spring 50. As a result, the tip 12B of the analysis tip 12 overcomes the bend 50A of the leaf spring 50, and the side surface 12D of the analysis tip 12 receives the elastic force of the leaf spring 50 (see Figure 3). As the side surface 12D of the analysis tip 12 receives the elastic force of the leaf spring 50, the side surface 12C of the analysis tip 12 is pressed against the wall 52 (see Figure 3). In this way, the analysis tip 12 can be held in place by the pressing force applied to it from both sides, and pushed into the target area 44.

[0096] As the analysis tip 12 continues to move toward the target area 44, the side surface 12D of the analysis tip 12 presses against the bent portion 50A of the leaf spring 50. As a result, the bent portion 50A of the leaf spring 50 is pushed into the recess 56 by the side surface 12D of the analysis tip 12. Consequently, the tip of the leaf spring 50 is pressed against the stopper 60, thereby restricting the movement of the tip of the leaf spring 50.

[0097] In this state, if the tip 22A of the transport bar 22 continues to press against the rear end 12A of the analysis tip 12, the analysis tip 12 will eventually reach the target area 44 (see Figure 3). When the analysis tip 12 reaches the target area 44, the pressure applied to the analysis tip 12 by the transport bar 22 is temporarily interrupted. At this time, the side surface 12D of the analysis tip 12 is in contact with the bent portion 50A of the leaf spring 50 and receives the elastic force of the leaf spring 50 from the bent portion 50A. As the side surface 12D of the analysis tip 12 receives the elastic force of the leaf spring 50, the side surface 12C of the analysis tip 12 is pressed against the wall 52 (see Figure 3). As a result, the analysis tip 12 is pressed from both sides within the target area 44, and the analysis tip 12 is held within the target area 44 (see Figure 3).

[0098] As described above, the analysis tip 12 is pressed from both sides by the pressing mechanism 48, so that, as explained in the comparative example, it becomes difficult to apply vertical torque to the analysis tip 12. Therefore, the phenomenon of the rear end 12A of the analysis tip 12 lifting off the surface 20A of the transport table 20 can be suppressed during the process in which the analysis tip 12 is transported from the waiting area 30 to the target area 44 by the pressing of the tip 22A of the transport bar 22 against the rear end 12A of the analysis tip 12.

[0099] Furthermore, the distance between the standby area 30 and the target area 44 is the distance over which the analysis tip 12 straddles the standby area 30 and the target area 44 in the transport direction of the analysis tip 12. In this case, the rear end 12A of the analysis tip 12 remains in the standby area 30 within the cartridge 24 during the transport process from the standby area 30 to the target area 44. However, since the analysis tip 12 is pressed from both sides by the pressing mechanism 48, it becomes difficult for vertical torque to be applied to the analysis tip 12 by the rear end 12A of the analysis tip 12 receiving some kind of physical external force within the target area 44 while the analysis tip 12 has not left the standby area 30. When vertical torque is difficult to apply to the analysis tip 12, the phenomenon of the rear end 12A of the analysis tip 12 floating away from the surface 20A of the transport table 20 can be suppressed. As a result, it is possible to suppress the phenomenon in which other analysis chips 12 stacked in the cartridge 24 are pushed up from below by the rear end 12A of the analysis chip 12 lifting off the surface 20A of the transport table 20 while the analysis chip 12 has not left the waiting area 30.

[0100] Furthermore, since the analysis chips 12 stacked above the bottom analysis chip 12 in the cartridge 24 act as weights for the bottom analysis chip 12, the bottom analysis chip 12 in the cartridge 24 (for example, an analysis chip 12 that has not yet left the waiting area 30) is less likely to lift off the surface 20A of the transport table 20.

[0101] Furthermore, since the analysis tip 12 is held within the target area 44 by the pressing force from both sides on the analysis tip 12, compared to the case where the analysis tip 12 is held by pressing down on the tip of the analysis tip 12 from above, it is possible to reduce the torque (i.e., vertical torque) that acts in a direction that lifts the rear end 12A of the analysis tip 12 by pressing the rear end 12A of the analysis tip 12 with the tip 22A of the transport bar 22. In addition, the pressing force from both sides on the analysis tip 12 is realized by the pressing force of the leaf spring 50 against the side 12D of the analysis tip 12 and the reaction force from the wall 52 to the side 12C of the analysis tip 12. Thus, the pressing force from both sides on the analysis tip 12 can be realized with a simple configuration.

[0102] Furthermore, a clearance 46D is provided across the entire upper surface 12E of the analysis tip 12 located in the target area 44, allowing vertical movement of the analysis tip 12 in the target area 44. Additionally, a pair of ribs 46C are provided on the cover 46, which can limit the amount of vertical movement of the analysis tip 12 in the target area 44. Moreover, the height to the pair of ribs 46C within the target area 44 is greater than the thickness of the analysis tip 12, and less than the sum of the thickness of the analysis tip 12 and the thickness of the transport bar 22, so that the analysis tip 12 and the transport bar 22 do not overlap vertically within the target area 44.

[0103] While the pressure applied to the analysis tip 12 by the transport bar 22 is interrupted, the analysis tip 12 is held within the target area 44 by the pressure applied to it from both sides. In this state, the dispensing device 36 drops the sample onto the reaction area 14 of the analysis tip 12. This causes the sample to be applied to the reaction area 14.

[0104] Once the sample has been placed in the reaction area 14, the tip 22A of the transport bar 22 resumes pressing against the rear end 12A of the analysis tip 12, and the analysis tip 12 is loaded into the incubator 28. When the analysis tip 12 is loaded into the incubator 28, if excessive pressure is applied to the side of the rear end 12A of the analysis tip 12 within the target area 44, there is a risk that the analysis tip 12 may fly out forcefully towards the incubator 28. Therefore, in order to suppress the occurrence of such a situation, the leaf spring 50 is set to a position where it presses against the side surface 12D of the analysis tip 12 in a deformed state where elastic force has accumulated. This prevents excessive pressure from being applied to the side of the rear end 12A of the analysis tip 12 within the target area 44, and as a result, the occurrence of the analysis tip 12 flying out forcefully towards the incubator 28 can be suppressed.

[0105] After the analysis chips 12 are loaded into the incubator 28, the transport bar 22 is pulled back to its original position. This refreshes the analysis chip 12 located at the bottom of the cartridge 24, and allows the transport bar 22 to press against the analysis chip 12 at the bottom of the cartridge 24 again (i.e., transport the analysis chip 12 using the transport bar 22). In other words, as the transport bar 22 moves back and forth between the waiting area 30 and the target area 44, the multiple analysis chips 12 stacked in the cartridge 24 are transported sequentially from the bottom analysis chip 12 to the top analysis chip 12 from the waiting area 30 to the target area 44. This enables efficient transport of the multiple analysis chips 12 stacked in the cartridge 24 from the waiting area 30 to the target area 44 within each cartridge 24.

[0106] In the above embodiment, a leaf spring 50 was used as an example, but this is merely one example. A compression coil spring may be used instead of the leaf spring 50, or an elastic polymer material member (for example, a member formed from elastomer or silicone rubber) may be used instead of the leaf spring 50. This disclosure is valid as long as the elastic member has enough elasticity to press the side of the analysis tip 12 within the target area 44 and hold the analysis tip 12 within the target area 44.

[0107] In the above embodiment, a pressing mechanism 48 was illustrated, but this is merely one example. As an example, as shown in Figure 7, it is also possible to apply a pressing mechanism 62 instead of a pressing mechanism 48.

[0108] The pressing mechanism 62 differs from the pressing mechanism 48 in that it further has a leaf spring 64, a wall 66 instead of a wall 52, a recess 68, a clamp member 70, and a stopper 72. The leaf spring 64 has a bent portion 64A corresponding to the bent portion 50A. The wall 66 has an opening 66A corresponding to the opening 54A. The recess 68 has an inner wall surface 68A corresponding to the inner wall surface 56A.

[0109] The leaf spring 64, wall 66, opening 66A, recess 68, clamp member 70, and stopper 72 are located on the opposite side of the leaf spring 50, wall 54, opening 54A, clamp member 58, and stopper 60, straddling the opening 46A1 in the Y direction. In other words, the leaf spring 64, wall 66, opening 66A, recess 68, clamp member 70, and stopper 72 are located symmetrically in line with respect to the leaf spring 50, wall 54, opening 54A, recess 56, clamp member 58, and stopper 60, with the center line CL as the axis of symmetry. The center line CL refers to a hypothetical line that passes through the center of the width of the opening 46A1 (in other words, the center of the opening 46A1 in the Y direction) and crosses the opening 46A1 in the X direction.

[0110] Just as the bent portion 50A protrudes from the opening 54A into the transport path 32 when the leaf spring 50 and the analysis tip 12 are not in contact, the bent portion 64A of the leaf spring 64 protrudes from the opening 66A into the transport path 32 when the leaf spring 64 and the analysis tip 12 are not in contact. Also, just as the leaf spring 50 is fitted into the recess 56, the leaf spring 64 is fitted into the recess 68. Furthermore, similar to the leaf spring 50, the leaf spring 64 is positioned to press against the side surface 12C (see Figures 2 and 3) of the analysis tip 12 when deformed in a way that accumulates elastic force.

[0111] With this configuration, the side surface 12D of the analysis tip 12 (see Figures 2 and 3) is pressed by the bent portion 50A of the leaf spring 50 within the target region 44, and the side surface 12C of the analysis tip 12 (see Figures 2 and 3) is pressed by the bent portion 64A of the leaf spring 64 within the target region 44. This provides the same effects as in the above embodiment.

[0112] In the example shown in Figure 7, leaf spring 50 is an example of the "first elastic member," "spring," and "leaf spring" according to this disclosure, and leaf spring 64 is an example of the "second elastic member," "spring," and "leaf spring" according to this disclosure.

[0113] In the example shown in Figure 7, leaf springs 50 and 64 are exemplified, but this is merely an example. A pair of compression coil springs may be used instead of leaf springs 50 and 64, or a pair of elastic polymer material members (for example, members formed from elastomer or silicone rubber) may be used instead of leaf springs 50 and 64. This disclosure is valid as long as a pair of elastic members have enough elasticity to press both sides of the analysis tip 12 within the target region 44 and hold the analysis tip 12 within the target region 44.

[0114] In the above embodiment, an example was given in which the side surface 12D of the analysis tip 12 is pressed by a leaf spring 50. However, this is merely one example, and for example, as shown in Figure 8, the side surface 12D of the analysis tip 12 may be pressed by an elastic member 74 instead of a leaf spring 50.

[0115] The elastic member 74 includes a pair of compression coil springs 74A and a transmission member 74B attached to the pair of compression coil springs 74A. The transmission member 74B is made of resin, wood, or metal. The tip portion 74B1 of the transmission member 74B protrudes from the opening 54A into the transport path 32. Tapered ends 74B1a and 74B1b are formed at both ends of the tip portion 74B1 in the X direction.

[0116] A pair of compression coil springs 74A are provided at the base end 74B2 of the transmission member 74B. One end of the pair of compression coil springs 74A is fixed to a frame 76 which is fixed to the transport table 20, and the other end of the pair of compression coil springs 74A is fixed to the base end 74B2 of the transmission member 74B.

[0117] The transmission member 74B transmits the elastic force of the compression coil spring 74A to the side surface 12D of the analysis tip 12 by contacting the side surface 12D of the analysis tip 12 within the target region 44.

[0118] Similar to the leaf springs 50 and 64, the pair of compression coil springs 74A are also positioned to press against the side surface 12D (see Figures 2 and 3) of the analysis tip 12 in a deformed state where elastic force has been accumulated. In the example shown in Figure 8, the elastic member 74 is fitted between the edge 54A1 forming the opening 54A and the frame 76 in a compressed state, and the elastic member 74 is compressed between the edge 54A1 and the frame 76. The edge 54A1 is in contact with the base end of the tapers 74B1a and 74B1b, and the tip ends of the tapers 74B1a and 74B1b protrude into the transport path 32. Therefore, the tip 12B of the analysis tip 12, which is being pressed by the transport bar 22, contacts the tip end of the taper 74B1a and moves over the taper 74B1a, and the elastic force of the pair of compression coil springs 74A is transmitted to the side surface 12D of the analysis tip 12 by the transmission member 74B. As a result, similar to the above embodiment, the side surface 12D of the analysis tip 12 within the target area 44 is pressed by the elastic member 74, and the side surface 12C of the analysis tip 12 is pressed against the wall 52. In this way, the same effects as in the above embodiment can be obtained.

[0119] In the example shown in Figure 8, the elastic member 74 is an example of an "elastic member" according to the present disclosure, the pair of compression coil springs 74A is an example of a "spring" according to the present disclosure, and the transmission member 74B is an example of a "transmission member" according to the present disclosure.

[0120] In the example shown in Figure 8, the side surface 12D of the analysis tip 12 within the target region 44 (see Figures 2 and 3) is pressed by the elastic member 74. However, this is merely one example, and as shown in Figure 9, the analysis tip 12 within the target region 44 (see Figures 2 and 3) may be pressed from both sides by a pair of elastic members (elastic members 74 and 78 in the example shown in Figure 9).

[0121] In the example shown in Figure 9, a wall 66 (see Figure 7) is used. The elastic member 78 has a pair of compression coil springs 78A corresponding to a pair of compression coil springs 74A, and a transmission member 78B corresponding to a transmission member 74B. Also, just as the elastic member 74 is fixed to the frame 76, the elastic member 78 is also fixed to the frame 80 corresponding to the frame 76. Just as the tip 74B1 of the transmission member 74B protrudes from the opening 54A into the transport path 32, the tip of the transmission member 78B also protrudes from the opening 66A into the transport path 32. That is, the wall 66 and the elastic member 78 are provided on the opposite side of the wall 54 and the elastic member 74, straddling the opening 46A1 in the Y direction. In other words, the wall 66 and the elastic member 78 are provided in a plane line-of-sight symmetric with respect to the wall 54 and the elastic member 74, with the center line CL as the axis of symmetry.

[0122] With this configuration, the side surface 12D (see Figures 2 and 3) of the analysis tip 12 within the target region 44 is pressed by the elastic member 74, and the side surface 12C (see Figures 2 and 3) of the analysis tip 12 within the target region 44 is pressed by the elastic member 78, thus achieving the same effects as in the above embodiment.

[0123] In the example shown in Figure 9, elastic member 74 is an example of the "first elastic member" according to this disclosure, and elastic member 78 is an example of the "second elastic member" according to this disclosure. Also, in the example shown in Figure 9, a pair of compression coil springs 74A is an example of the "first spring" according to this disclosure, and a pair of compression coil springs 78A is an example of the "second spring" according to this disclosure. Also, in the example shown in Figure 9, transmission member 74B is an example of the "first transmission member" according to this disclosure, and transmission member 78B is an example of the "second transmission member" according to this disclosure.

[0124] In the above embodiment, an example was given in which the cartridge 24 is placed on the surface 20A, but the disclosure is not limited thereto. For example, a rectangular cylindrical cartridge with openings at the top and bottom may be used in a suspended state. In this case, multiple analysis chips 12 are stacked in the Z direction inside the cartridge, but only the bottom layer of analysis chips 12 is placed on the surface 20A, and the cartridge is suspended with the remaining analysis chips 12 housed inside the cartridge. The transport bar 22 pushes the bottom layer of analysis chips 12, transporting them along the transport path 32 from the waiting area 30 to the target area 44.

[0125] In the above embodiment, an example was given in which no weight is placed on the uppermost analysis tip 12 of the cartridge 24. However, this is merely one example, and a weight may be placed on the uppermost analysis tip 12 of the cartridge 24. In this case, a transport mechanism capable of transporting the weight may be used. The transport mechanism transports and places the weight on the uppermost analysis tip 12 of the cartridge 24 when the weight is in use, in response to power supplied from an external source, and transports the weight to a storage section and stores it in the storage section when the weight is not in use. The transport mechanism is shiftable in the height direction, and by changing its height when not in use, the transport mechanism may be positioned to obstruct the transport path 32 between the cartridge 24 and the cover 46.

[0126] The descriptions and illustrations presented above are detailed explanations of the parts related to this disclosure and are merely examples of this disclosure. For example, the above explanation of the structure, function, operation, and effect is an example of the structure, function, operation, and effect of the parts related to this disclosure. Therefore, it goes without saying that you may delete unnecessary parts, add new elements, or replace parts of the descriptions and illustrations presented above, as long as you do not deviate from the spirit of this disclosure. Furthermore, in order to avoid confusion and facilitate understanding of the parts related to this disclosure, explanations of common technical knowledge, etc., that do not require special explanation to enable the implementation of this disclosure have been omitted from the descriptions and illustrations presented above.

[0127] All documents, patent applications, and technical standards described herein are incorporated by reference to the same extent as if each individual document, patent application, and technical standard were specifically and individually noted as being incorporated by reference. [Explanation of Symbols]

[0128] 10,200 Analyzers 12 analysis chips 12A rear end 12B, 22A, 46C1 tip 12C,12D side 12E Top 14 Reaction Zone 16 Carriers 18 cases 18A Case 1 18A1,18B1,24A1,24A2,38A1,38B1,38B2,46A1,46B1,46B2,54A,66A opening 18B Case 2 20 transport platforms 20A surface 22 Conveyor bars 24 cartridges 24A,38B,46B through hole 26,42 Sample application device 28 Incubators 29,40 weight 30 Standby area 32 Conveyor paths 34,44 Target area 36 Spotter 38,46 cover 38A,46A Upper wall 40A, 78B1a, 78B1b Taper 46A2 Bottom side 46C Rib 46D Clearance 48,62 Pressing mechanism 50, 64 leaf springs 50A Bent section 52, 54, 66 Wall 54A1 Edge 56,68 recess 56A, 68A Inner wall surface 58,70 Clamp members 60,72 Stopper 74,78 Elastic members 74A, 78A Compression coil springs 74B, 78B Transmission members 74B1 Tip 74B2 Proximal end 76,80 frames CL center line

Claims

1. A transport bar that transports a flat, plate-shaped analysis chip to a target area by pushing the rear end of the analysis chip, which is located in a waiting area on the transport table, along the transport table, The system includes a pressing mechanism that presses the analysis tip from the side within the target area. Analyzer.

2. Multiple analysis chips can be stacked within a cartridge provided on the transport platform by utilizing their own weight. The standby area is the area where the lowest layer of the multiple analysis chips stacked within the cartridge is located. The analytical apparatus according to claim 1.

3. The system includes a transport path that serves as a route for transporting the analysis chip from the waiting area to the target area. The cartridge has an opening at a position corresponding to the transport path. The analytical apparatus according to claim 2.

4. The cartridge has a through hole at a position facing the target area in the transport direction of the analysis tip, The transport bar transports the analysis chip to the target area by pushing the rear end of the bottommost analysis chip along the transport table through the through hole. The analytical apparatus according to claim 2.

5. The transport bar moves back and forth between the waiting area and the target area through the through-hole, thereby transporting the multiple analysis chips stacked in the cartridge sequentially from the bottom layer analysis chip to the top layer analysis chip from the waiting area to the target area. The analytical apparatus according to claim 4.

6. The distance between the waiting area and the target area is the distance over which the analysis chip straddles the waiting area and the target area in the transport direction of the analysis chip. The analytical apparatus according to claim 2.

7. The system includes a transport path that serves as a route for transporting the analysis chip from the waiting area to the target area. When the pressing mechanism and the analysis tip are in a non-contact state, at least a part of the pressing mechanism protrudes into the transport path. The analytical apparatus according to claim 1.

8. The analysis chip is pushed into the target area by the transport bar while receiving the lateral pressing force from the pressing mechanism. The analytical apparatus according to claim 1.

9. A clearance is provided across the entire upper surface of the analysis chip located in the target area. The analytical apparatus according to claim 1.

10. The target region is provided with a limiting member that restricts the upward movement of the analysis tip. The analytical apparatus according to claim 1.

11. The height to the limiting member within the target region is greater than the thickness of the analysis tip and less than the sum of the thickness of the analysis tip and the thickness of the transport bar. The analytical apparatus according to claim 10.

12. The limiting member is at least one rib that protrudes from the upper side to the lower side of the target region. The analytical apparatus according to claim 10.

13. The pressing mechanism comprises a wall that contacts one side of the analysis tip within the target area, and an elastic member that presses the other side of the analysis tip within the target area. The elastic member presses the other side surface within the target area, thereby causing one side surface to come into contact with the wall. The analytical apparatus according to claim 1.

14. The elastic member is positioned to press against the other side surface in a state where it has deformed to accumulate elastic force. The analytical apparatus according to claim 13.

15. The elastic member is a spring. The analytical apparatus according to claim 13.

16. The aforementioned spring is a leaf spring. The analytical apparatus according to claim 15.

17. The elastic member comprises a spring and a transmission member attached to the spring, which transmits the elastic force of the spring to the other side by contacting the other side. The analytical apparatus according to claim 13.

18. The pressing mechanism includes a first elastic member that presses one side of the analysis tip within the target area, and a second elastic member that presses the other side of the analysis tip within the target area. The analytical apparatus according to claim 1.

19. The first elastic member is positioned to press against one of the sides in a state in which elastic force has been accumulated. The second elastic member is positioned to press against the other side surface in a state where it has deformed to accumulate elastic force. The analytical apparatus according to claim 18.

20. The first elastic member and / or the second elastic member is a spring. The analytical apparatus according to claim 18.

21. The aforementioned spring is a leaf spring. The analytical apparatus according to claim 20.

22. The first elastic member is a member having a first spring and a first transmission member attached to the first spring that transmits the elastic force of the first spring to the one side surface by contacting the one side surface, The second elastic member is a member having a second spring and a second transmission member attached to the second spring, which transmits the elastic force of the second spring to the one side by contacting the other side. The analytical apparatus according to claim 18.

23. The aforementioned target region is provided in the processing unit that performs processing on the analysis chip. The analytical apparatus according to claim 1.

24. The aforementioned process includes spot application of the sample. The analytical apparatus according to claim 23.

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