Inspection method and inspection apparatus

Abstract

The purpose of this disclosure is to provide an inspection method that can easily and accurately inspect damage occurring to an object being measured, as well as the changes in its physical properties leading up to the occurrence of such damage. [Solution] An inspection method according to one aspect of the present disclosure is a method for inspecting damage occurring to a measurement target by applying a load, comprising the steps of: mounting the measurement target to a testing machine; arranging a pair of first wires on the measurement target such that a location where damage is expected to occur is located between them; energizing the measurement target on which the first wires are arranged with a power supply; applying a load to the energized measurement target with the testing machine; and measuring the potential difference of the measurement target on which the load is applied with an inspection device connected to the first wires.

Description

Technical Field

[0001] The present disclosure relates to an inspection method and an inspection apparatus for evaluating the progress of crack generation in a measurement object to which a load is applied by a change in potential difference.

Background Art

[0002] As one method for inspecting damage to a member formed of a metal material, there is a potential difference flaw detection method. There is known a crack growth test apparatus that applies a load to a member under conditions close to those of the actual use environment and causes cracks to occur (Japanese Patent Application Laid-Open No. 2003-315250).

Prior Art Documents

Patent Documents

[0003]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0004] The crack growth test apparatus described in the above publication includes a load applying means for applying a load to a member (test piece), a constant current supply means for flowing a current through the member, and a potential difference measuring means for measuring the potential difference in the member, and it is said that the progress of cracks in the member to which the load is applied can be detected by the potential difference measuring means. Generally, the constant current supply means includes a current source and a current supply wiring connected to this current source, and the potential difference measuring means includes a potential difference measuring device and a measurement wiring connected to this potential difference measuring device. In order to suppress the ends of these wirings from falling off during the test and reducing the measurement accuracy, they are fixed to the member by welding, soldering, or bolts. Further, in the above crack growth test apparatus, a notch for the crack to progress is formed in advance in the member to be tested.

[0005] Processing the above-mentioned components by welding, soldering, forming holes for bolts, or creating notches for connecting the above-mentioned measuring wiring may cause cracks to propagate (expand) from these processed areas, potentially making it impossible to evaluate naturally occurring cracks, i.e., cracks that originate from an undamaged object. Methods for evaluating the start of a crack include, for example, visual inspection of the object under load, but visual inspection does not allow observation of the changes (progress) in the physical properties of the object until the crack begins. It is desirable to be able to easily and accurately inspect the occurrence of cracks in the object and the changes in the physical properties of the object until the crack occurs, and to evaluate the strength, durability, and safety of the components.

[0006] In light of the circumstances described above, this disclosure aims to provide an inspection method that can easily and accurately inspect damage occurring to an object being measured and the changes in its physical properties leading up to the occurrence of such damage. [Means for solving the problem]

[0007] An inspection method, which is one aspect of the present disclosure made to solve the above problems, is a method for inspecting damage occurring to a measurement target by applying a load, comprising the steps of: mounting the measurement target to a testing machine; arranging a pair of first wires on the measurement target such that a location where damage is expected to occur is located between them; energizing the measurement target on which the first wires are arranged with a power supply; applying a load to the energized measurement target with the testing machine; and measuring the potential difference of the measurement target on which the load is applied with an inspection device connected to the first wires. [Effects of the Invention]

[0008] An inspection method, as described in one aspect of this disclosure, allows for easy and accurate inspection of damage occurring to an object being measured and the changes in its physical properties leading up to the occurrence of such damage. [Brief explanation of the drawing]

[0009] [Figure 1]Figure 1 is a schematic side view showing an inspection apparatus according to one embodiment of the present disclosure. [Figure 2] Figure 2 is a schematic side view showing the probe and holder of the inspection device shown in Figure 1. [Figure 3] Figure 3 is a schematic front view showing the holder in Figure 2. [Figure 4] Figure 4 is a schematic side view showing a different holder from that shown in Figure 2. [Figure 5] Figure 5 is a schematic side view showing a different holder from those in Figures 2 and 4. [Figure 6] Figure 6 is a graph showing the results of a fatigue test performed using the inspection method of one embodiment of this disclosure. [Modes for carrying out the invention]

[0010] [Description of Embodiments in this Disclosure] First, the embodiments of this disclosure will be listed and described.

[0011] (1) An inspection method in one aspect of the present disclosure is a method for inspecting damage occurring to an object to be measured by applying a load, comprising the steps of: mounting the object to be measured on a testing machine; arranging a pair of first wires on the object to be measured such that a location where damage is expected to occur is located between them; energizing the object to be measured on which the first wires are arranged with a power supply; applying a load to the energized object to be measured with the testing machine; and measuring the potential difference of the object to be measured on which the load is applied with an inspection device connected to the first wires.

[0012] This inspection method applies a load to the object being measured while measuring the potential difference using a pair of first wires placed on the object. Therefore, it is possible to easily and accurately detect the change in potential difference until the object is damaged, and the potential difference when the object is damaged. As a result, it is possible to easily evaluate the process leading up to the occurrence of the damage and the resulting damage.

[0013] (2) In (1) above, at least one of the pair of first wirings may have a probe, and in the placement step, the tip of the probe may be brought into contact with the object to be measured. By bringing the tip of the probe into contact with the object to be measured, processing for connecting the wiring to the object to be measured becomes unnecessary, thereby improving the ease of the inspection method and improving the accuracy of the measurement of the potential difference.

[0014] (3) In the above (1) or (2), a second pair of wires may be placed on the object to be measured during the placement step. By placing a second pair of wires, the application of current to the object to be measured and the measurement of the potential difference can be performed by different pairs of wires, and the potential difference can be measured more accurately.

[0015] (4) In (3) above, at least one of the pair of first wirings and the pair of second wirings may have a probe, and the tip of the probe may be brought into contact with the object to be measured during the placement step. By having at least one of the pair of first wirings and the pair of second wirings have a probe and bringing the tip of the probe into contact with the object to be measured, processing for connecting the wiring to the object to be measured becomes unnecessary, thereby improving the ease of the inspection method and improving the accuracy of the measurement of the potential difference.

[0016] (5) In (2) or (4) above, the probe may extend and retract in the axial direction. The object to be measured may deform when a load is applied. By extending and retracting the probe in the axial direction, contact with the deformed object to be measured can be maintained, improving the ease and accuracy of the inspection.

[0017] (6) In any one of the above (1) to (5), the inspection method may further include a step of storing the process of change in the potential difference measured in the above measurement step, and a step of evaluating the occurrence of damage in the above measurement object from the change in the stored potential difference. By including the above storing step in the inspection method, the ease of observing the process of change in the potential difference can be improved. By including the above evaluating step in the inspection method, the strength, durability, etc. of the above measurement object can be considered.

[0018] (7) In any one of the above (1) to (6), an alternating current may be passed in the above energizing step. By applying an alternating current to the above measurement object, the accuracy of measuring the above potential difference can be improved.

[0019] (8) In any one of the above (1) to (7), the inspection method may further include a step of stopping the above testing machine when the potential difference being measured reaches a preset value. By including the above stopping step, the ease of performing the inspection method can be improved.

[0020] (9) In the above (8), at least one of the energization by the above power supply and the start and stop in the operation of the above testing machine may be controlled by the above detector. By the above detector controlling the above power supply and the above testing machine, the inspection method can be semi-automated.

[0021] (10) In the above (8) or (9), the inspection method may further include a step of observing the surface of the above measurement object after the above stopping step. By including the above observing step in the inspection method, the generated damage can be evaluated.

[0022] (11) In any one of the above (1) to (10), the above measurement object may be a real member. That is, the inspection method may be an inspection using a test piece formed for testing, but is also suitable for inspecting real members such as products and parts having a predetermined shape.

[0023] (12) Another aspect of the present disclosure is an inspection apparatus comprising: a pair of wires energized with an object to be measured; a probe positioned on at least one of the pair of wires; a holder for holding the probe; an arm for holding the holder and for adjusting the position and inclination of the holder with respect to the object to be measured; and an inspection device for measuring the potential difference between the wires and the object to be measured which is energized.

[0024] Since the position and tilt of the holder that holds the probe can be adjusted in this inspection device, the probe can be easily brought into contact with the object to be measured regardless of its shape, and the potential difference of the object to be measured can be easily and accurately measured.

[0025] (13) In (12) above, each of the pair of wires may have the probe, and the holder may be configured to adjust the relative angle of the probes. By adjusting the relative angle of the probes of each pair of wires, the tips of the pair of probes can be easily brought into contact with the object to be measured, even if the object to be measured is a physical member having a predetermined shape. [Details of the form for implementing this disclosure] The details of this disclosure will be explained below with reference to the drawings.

[0026] <Testing Method> The inspection method inspects damage that occurs to an object under test by applying a load. The nature of the damage is not particularly limited and may include, for example, a crack that occurs on the surface of the object under test. The inspection method comprises the steps of: mounting the object under test on a testing machine; arranging a first wiring harness on the object under test so that a location where damage is expected to occur is located between the harness and the wiring harness; energizing the object under test with a power supply; applying a load to the energized object under test using the testing machine; and measuring the potential difference of the loaded object under test using an inspection device connected to the first wiring harness.

[0027] [Object to be measured] The objects to be measured are not particularly limited as long as they are made of conductive materials such as metal, and may include test pieces molded for testing, actual components having a predetermined shape such as products or parts, and their shape and size (dimensions) are not particularly limited. The actual components may include finished products such as molds, products, and parts, or intermediate products (unfinished products) that are not yet completed. In other words, this inspection method does not only target test pieces, but can also target products, parts (components) or intermediate products thereof that are actually used. Furthermore, the objects to be measured may have a space (cavity) inside, or they may have a space inside with a component made of another material in this space, or the space may be filled with another material.

[0028] If the object to be measured is the actual component described above, it is advisable to create a holder for mounting it to the testing machine. That is, it is advisable to create a dedicated chuck member for the testing machine to hold the actual component having a predetermined shape, and to chuck the actual component into the testing machine via this chuck member. The holder (chuck member) is preferably made of a non-conductive material.

[0029] In this inspection method, it is preferable to place a second pair of wires on the object to be measured. Specifically, the first pair of wires can be used for measuring the potential difference, and the second pair of wires can be used for supplying current, and these can be placed on the object to be measured for inspection. By measuring the potential difference using the four-terminal method in this way, the measurement accuracy can be improved.

[0030] At least one of the pair of first wires has a probe, and it is preferable to bring the tip of the probe into contact with the object to be measured during the placement process. That is, it is preferable not to directly connect the first wire to the object to be measured, but to indirectly connect the first wire to the object to be measured via the probe. When placing the pair of second wires, it is preferable that at least one of the pair of first wires and the pair of second wires has a probe. It is preferable that all of the pair of first wires and the pair of second wires have probes. By bringing the tip of the probe into contact with the object to be measured, processing to connect the wires (wires without probes) to the object to be measured becomes unnecessary, and the ease of the inspection method can be improved. Furthermore, processing the object to be measured for connection of the wires may change the physical properties of the object to be measured. Also, damage may spread starting from the processed area, which may reduce the accuracy of inspecting damage that occurs naturally on the object to be measured. By making contact with the above probe, the above processing becomes unnecessary, thereby improving the accuracy of measuring the above potential difference and improving the accuracy of inspecting damage that occurs naturally in the object being measured.

[0031] [Inspection equipment] The inspection method may be carried out using an inspection device 1 as shown in Figure 1. The inspection device 1 mainly comprises a pair of wires (not shown) that conduct electricity to the object to be measured T, probes (first probes) 11, 12 placed on at least one of the pair of wires, a holder 30 that holds the probes 11, 12, an arm 40 that holds the holder 30 and can adjust the position and inclination of the holder 30 with respect to the object to be measured T, and an inspection device (not shown) that measures the potential difference between the wires and the object to be measured T which is energized. The inspection device is not particularly limited, and a known voltmeter may be used. In Figure 1, a cylindrical member (test piece) is shown as an example of the object to be measured T.

[0032] The inspection device of this embodiment further comprises a pair of second wirings (not shown), and these second wirings also have probes (second probes) 21, 22. That is, all (a total of 4) of the above wirings have probes 11, 12, 21, 22. The first wirings are connected to measure the potential difference, and the second wirings are connected to supply current to the object T to be measured.

[0033] (probe) The probes 11, 12, 21, and 22 are not particularly limited as long as they are made of a conductive material, and may be known probes. The probes 11, 12, 21, and 22 whose tips contact the object to be measured T are preferably able to extend and retract in the axial direction. Specifically, the probes 11, 12, 21, and 22 are preferably able to have base ends 11b, 12b, 21b, and 22b, and tip ends 11a, 12a, 21a, and 22a that are able to extend and retract in the axial direction relative to these base ends 11b, 12b, 21b, and 22b. By bringing the tips of the extendable probes 11, 12, 21, and 22 into contact with the object to be measured T in a press-fitting manner, the tips of the probes 11, 12, 21, and 22 can follow the deformation of the object to be measured T under load, maintaining contact with the surface of the object to be measured T, thereby improving the reliability of the current supply and the potential difference measurement.

[0034] (Holder) The holder 30 is made of an insulating material and holds the probes 11, 12, 21, and 22 as shown in Figures 2 to 5. The holder 30 in this embodiment is formed in a substantially rectangular parallelepiped shape (see Figure 2), but is not limited to this, and may be spherical, for example. The means by which the holder 30 holds the probes 11, 12, 21, and 22 are not particularly limited, and for example, insertion holes may be formed at predetermined intervals into which the base ends (ends that do not contact the object to be measured T) of the probes 11, 12, 21, and 22 are inserted.

[0035] The holder 30 in this embodiment is formed of a pair of plate materials 32, 33 having a plurality of grooves 31 formed at predetermined intervals, and the probes 11, 12, 21, 22 are placed in the grooves 31 so that the pair of plate materials 32, 33 clamp the probes 11, 12, 21, 22 (see Figures 2 and 3). In this case, it is preferable to provide four or more (ten in Figure 3) grooves 31 in the plate materials 32, 33 so that the distance between the axes of the probes 11, 12, 21, 22 can be adjusted by arbitrarily selecting these grooves 31. The axial directions of each probe 11, 12, 21, 22 may be arranged in parallel and in a line with each other in the insertion holes or grooves 31 (see Figure 2), or they may be non-parallel or non-parallel. In addition, the position of the tip of each probe 11, 12, 21, 22 relative to the holder 30 (the distance between each tip and the holder 30) may be the same (equal distance) or different. Note that probes 11, 12, 21, and 22 are not shown in Figure 3.

[0036] As shown in Figures 4 and 5, the holders 300 and 310 are preferably configured to allow adjustment of the relative angles of the probes (first probes 11 and 12 and second probes 21 and 22). In other words, the holders 300 and 310 are preferably configured to allow arbitrary adjustment of the relative angles of multiple probes.

[0037] For example, a holder 300 that is roughly rectangular in side view has probes 11, 12, 21, and 22 on one longitudinal side and a first support member 303 on the other side. The holder 300 is composed of a first part 301 having one first probe 11 and one second probe 21, and a second part 302 having the other first probe 12 and the other second probe 22, and the first support member 303 holds the first part 301 and the second part 302 so that they can rotate in the circumferential direction, with the short side of the holder 300 being the radial direction (see Figure 4). The holder and the first support member may be configured so that each of the probes 11, 12, 21, and 22 can rotate.

[0038] Alternatively, a holder 310, which is roughly rectangular in side view, has probes 11, 12, 21, and 22 on one longitudinal side and a flexible second support member 315 on the other side. The holder 310 is composed of a third part 311, a fourth part 312, a fifth part 313, and a sixth part 314, each having a probe 11, 12, 21, and 22. The second support member 315 holds the third part 311, the fourth part 312, the fifth part 313, and the sixth part 314, and by bending in the longitudinal direction and in a direction perpendicular to the longitudinal direction and the axial direction of the probes 11, 12, 21, and 22 (the normal direction of the paper in Figure 5), the axial directions of each probe 11, 12, 21, and 22 of the third part 311, the fourth part 312, the fifth part 313, and the sixth part 314 can be directed in any direction (see Figure 5). The second support member 315 may further hold the third part 311, the fourth part 312, the fifth part 313, and the sixth part 314 so as to be rotatable in the circumferential direction.

[0039] (arm) The arm 40 has multiple arm sections and multiple joint sections that connect these arm sections. The joint sections allow for arbitrary adjustment of the relative orientation (angle) of two connected arm sections. The arm 40 in this embodiment has a first arm section 41, a second arm section 42, a third arm section 43, a first joint section 44 connecting the first arm section 41 and the second arm section 42, and a second joint section 45 connecting the second arm section 42 and the third arm section 43. A holder 46 for holding the holder 30 is attached to the tip of the first arm section 41. The holder 46 allows for arbitrary adjustment of the relative orientation between the holder 30 and the first arm section 41. The base end of the third arm section 43 is supported by a support 47 on the stand 50. The support 47 allows for arbitrary adjustment of the relative orientation between the stand 50 and the third arm section 43. The base end of the third arm portion 43 may be fixed to a test bench, floor, wall, or the like.

[0040] [Installation process] The object to be measured T is preferably mounted on a testing machine (not shown) via a holder (chuck member) that is suitable for its shape. The holder is preferably made of an insulating material, or it is preferable to insulate the holder or the object to be measured T from the testing machine before mounting the object to be measured T to the testing machine. It is also preferable to mount the object to be measured T to the testing machine in a way that does not impede any restraining force (pressure due to chucking) on ​​the object to be measured T. If this inspection method cannot be performed with a conventional testing machine, a testing machine may be prepared by preparing a holding jig for holding the object to be measured T and a device for applying a load to the object to be measured T.

[0041] [Placement process] The arrangement process of this embodiment includes a first arrangement procedure for arranging a pair of first wires on the object to be measured T, and a second arrangement procedure for arranging a pair of second wires. In the first arrangement procedure, the pair of first wires are connected to the object to be measured T such that the location where damage is expected to occur is located between them. The location where damage is expected to occur may be estimated based on the experience of the worker, or it may be predicted by analysis using the finite element method or the like.

[0042] In the second arrangement procedure described above, it is preferable to connect the pair of second wires to the object to be measured T such that the pair of first wires are positioned between them. In other words, it is preferable to connect the second wires so that they are not located on a straight line connecting the points (contacts) where the pair of first wires are connected. The first and second wires have probes 11, 12, 21, and 22, and it is preferable that the object to be measured T and the first and second wires be electrically connected by bringing the tips of these probes 11, 12, 21, and 22 into contact with the surface of the object to be measured T.

[0043] [The process of applying electricity] In the process of energizing as described above, power is supplied (not shown) to the object T to be measured, on which the first wiring is located. The energizing is performed by the second wiring, and the first wiring is used to measure the potential difference. That is, the second wiring is connected to the power supply, and the first wiring is connected to the tester. If the second wiring is not installed, the energizing and potential difference measurement may be performed using the first wiring.

[0044] It is preferable to apply alternating current during the above-mentioned energization process. In other words, it is preferable to apply alternating current to the object T being measured. If direct current is applied, the object T being measured may heat up, potentially changing its resistance. By applying alternating current to the object T being measured, the above-mentioned heat generation can be suppressed, and the accuracy of measuring the potential difference can be improved.

[0045] [Process of applying load] In the loading process, a load is applied to the object T being measured using the testing machine described above. The load to be applied is not particularly limited as long as it causes damage such as cracks in the object T being measured. For example, it may be a tensile test, fatigue test, vibration test, hardness test, creep test, etc., or a load such as tension, pressure, bending, torsion, vibration, impact (impact), or heat may be applied to part or all of the object T being measured.

[0046] [Measurement process] In the measurement process, the potential difference of the object to be measured, to which a load is applied, is measured using a tester connected to the first wiring. By observing the change in the potential difference, it is possible to observe the process until damage occurs to the object T being measured.

[0047] [Process to be stopped] The inspection method may further include a step of stopping the testing machine when the measured potential difference reaches a preset value. When the potential difference reaches the preset value (set value), the step of applying the load may be terminated, and the steps of energizing and measuring may also be terminated. The set value may be set, for example, so that the measured value of the potential difference that fluctuates in the load application step does not exceed it, but the measured value of the potential difference when damage occurs exceeds it.

[0048] The inspection device may control at least one of the following: the energization by the power supply and the starting and stopping of the operation of the test machine. In other words, the start of the energization process and the start of the load application process may be performed automatically by the inspection device. Furthermore, the end of the energization process and the end of the load application process may also be performed automatically by the inspection device. The inspection device may control either the start or the stop of the two processes, or it may control both. In other words, the inspection device may include a control unit that controls the power supply and the test machine. The control unit may be prepared separately from the inspection device.

[0049] For example, the process of mounting, arranging, starting the inspection device, starting the energization in the energization process, and starting the test machine in the load application process may be performed by an operator, and when the measured value of the potential difference exceeds the set value, the stopping of the energization and the stopping of the test machine may be controlled by the control unit. By having the inspection device (control unit) control a part of the inspection method, the inspection method can be partially automated, improving the ease and efficiency of the inspection, and allowing the operator to leave the site after the inspection method has started. It may be further controlled by the control unit to start the energization in the energization process and to start the test machine in the load application process. Further control of the start of the energization and the starting of the test machine by the control unit can further improve the ease and efficiency of the inspection method.

[0050] The inspection method may further include a step of observing the surface of the object to be measured after the stopping step described above. That is, it is preferable to observe any damage that has occurred on the surface of the object to be measured. The method of observation is not particularly limited and may include visual inspection or observation using images taken of the damage.

[0051] The inspection method may further include a step of saving the process over which the potential difference being measured in the above measurement step changes, and a step of evaluating the occurrence of damage in the object being measured from the saved change in the potential difference.

[0052] In other words, a known data logger or the like is connected to the inspection device, and the data logger stores the measured values ​​taken by the inspection device as data. Based on the stored data, the worker evaluates the damage. Because the inspection method includes the steps of storing the data and evaluating it, even if the worker leaves the site during the inspection, the process by which the damage occurred can be easily evaluated.

[0053] This inspection method allows for easy evaluation of the process by which damage such as cracks or defects occur in a measurement target T that does not have any defects such as marks from the above processing, by measuring the potential difference. In turn, it allows for easy evaluation of the strength, durability, weak points, and safety of the measurement target T.

[0054] <Other Embodiments> The embodiments disclosed herein should be considered in all respects to be illustrative and not restrictive. The scope of the present invention is not limited to the configurations of the embodiments described above, but is indicated by the claims, and all modifications within the meaning and scope equivalent to the claims are intended to be included.

[0055] The inspection method may begin with pre-forming notches, defects, or other damage in the object to be measured to cause cracks or other damage. Furthermore, the probe is not a mandatory component; the wiring may be directly connected to the object by welding, soldering, bolting, etc. In other words, the inspection method may be used to examine how defects or damage, such as those resulting from processing, progress (expand) in the object. [Examples]

[0056] The present disclosure will be described in more detail below with reference to examples, but the present disclosure is not limited to these examples.

[0057] A test specimen formed from SS400 stainless steel in the shape of a round bar was used as the object to be measured. Using the above measuring device, a pair of voltage measuring probes and a pair of current supply probes were brought into contact with this object, and current was applied. A fatigue test was performed under the conditions of a load amplitude of 8.0 kN, a stress ratio R = -1, and a frequency of 20 Hz, and the potential difference during this time was measured. The results are shown in Figure 6. In Figure 6, "measured voltage" refers to the peak value extracted from the measurements taken by the pair of voltage measuring probes when the load was applied, and "number of repetitions" refers to the number of times the load was applied to the object to be measured.

[0058] In Figure 6, the dotted line represents the measured voltage value, and the solid line represents the measured value after smoothing (processing using a rust-preventive filter). The points where the measured voltage value rises sharply from a steady state (within the dashed line in Figure 6) indicate that a crack has occurred in the object being measured. By measuring the potential difference using this inspection method and confirming the change (elapsed) of this measured value, it is possible to estimate the occurrence of cracks in components formed of the same material and shape as the object being measured, and to evaluate the durability of the object being measured. [Industrial applicability]

[0059] The inspection method described herein allows for easy and accurate inspection of the process leading up to damage occurring in an object being measured, and is therefore suitable for inspection or evaluation of the strength, durability, and weak points of such objects. [Explanation of symbols]

[0060] 1. Inspection device 11,12 Probe (for voltage measurement) 11a,12a Tip 11b,12b Base end 21, 22 Probes (for current supply) 21a,22a Tip 21b,22b Base end 30,300,310 holder 31 Groove 32,33 Board material 301 Part 1 302 Part 2 303 First support member 311 Part 3 312 Part 4 313 Part 5 314 Part 6 315 Second support member 40 Arms 41 First Arm Section 42 Second Arm Section 43 Third Arm Section 44. First joint 45. Second joint 46 Holder 47 Support part 50 Stands T Object to be measured

Claims

1. A method for inspecting damage that occurs to an object being measured by applying a load, The process of mounting the object to be measured onto the testing machine, The process involves arranging a pair of first wires on the object to be measured such that the area where damage is expected to occur is located between them, The process involves supplying power to the object to be measured, on which the above-mentioned first wiring is arranged, The process involves applying a load to the object to be measured, which is energized, using the testing machine described above. The process involves measuring the potential difference of the object to be measured, to which a load is applied, using a test device connected to the first wiring. An inspection method that includes the following features.

2. At least one of the pair of first wires described above has a probe, The inspection method according to claim 1, wherein in the above-mentioned placement step, the tip of the probe is brought into contact with the object to be measured.

3. The inspection method according to claim 1, wherein in the above-mentioned arrangement step, a pair of second wirings are further arranged on the object to be measured.

4. At least one of the pair of first wires and the pair of second wires has a probe. The inspection method according to claim 3, wherein in the above-mentioned placement step, the tip of the probe is brought into contact with the object to be measured.

5. The inspection method according to claim 2 or claim 4, wherein the probe extends and retracts in the axial direction.

6. A step of saving the process over which the above potential difference being measured changes during the above measurement process, A step of evaluating the occurrence of damage in the object being measured based on the changes in the stored potential difference. The inspection method according to claim 1, further comprising:

7. The inspection method according to claim 1, wherein alternating current is applied in the above-mentioned process of applying power.

8. The inspection method according to claim 1, further comprising the step of stopping the testing machine when the measured potential difference reaches a preset value.

9. The inspection method according to claim 8, wherein the inspection device controls at least one of the energization by the above-mentioned power supply and the starting and stopping of the operation of the above-mentioned test machine.

10. The inspection method according to claim 8, further comprising the step of observing the surface of the object to be measured after the above-mentioned stopping step.

11. The inspection method according to any one of claims 1 to 4 and 6 to 10, wherein the object to be measured is an actual component.

12. A pair of wires that conduct electricity to the object being measured, A probe is placed on at least one of the pair of wires described above, A holder for holding the above probe, An arm that holds the above holder and can adjust the position and tilt of the holder relative to the object to be measured, A tester that measures the potential difference between the above wiring and the object being measured which is energized, An inspection device equipped with the following features.

13. Each of the above pair of wires has the above probe, The inspection apparatus according to claim 12, wherein the holder is configured to allow adjustment of the relative angle of the probe.

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