Portable X-ray Backscatter System

Abstract

To provide an X-ray backscatter detection device including a housing.SOLUTION: An X-ray backscatter detection device comprises a housing 12 configured to accommodate components comprising at least a plurality of electronic circuits 14 and an integrated high voltage power supply 16. The X-ray backscatter detection device 10 further includes at least one photomultiplier tube 18. The photomultiplier tube is configured to generate an electro-magnetic field and is oriented externally from the housing. The at least one photomultiplier tube is further oriented proximate to the housing.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The present disclosure relates generally to the field of non-destructive testing and inspection of sub-surface regions of target structures and substrates. In particular, the present disclosure relates to the field of using small angle X-ray backscattering techniques to non-destructively inspect interlayers for properties including, for example, bond strength of composite layers. [Background technology]

[0002] Currently, regulatory guidelines for the inspection of bonded composite materials in certain industries require the use of testing techniques that are destructive to the materials being tested, which requires significant expense and that large structures containing composite parts, such as aircraft and other vehicles, be taken out of service, destructively tested, and then reworked before the aircraft can return to service.

[0003] Non-destructive testing systems for evaluating substrates have proven useful in certain industries, such as those where access to various components and substrate materials requiring routine maintenance and inspection is difficult without significant effort or without partially or completely destroying the components or substrate materials. In order for a non-destructive testing method or system to replace the mandatory destructive methods currently in use, the non-destructive testing method must ensure a consistent, reliable and reproducible analysis of the surface or subsurface of the object being inspected that at least equals or exceeds the physical characterization performed during destructive testing.

[0004] X-rays typically range from 30 petahertz to 30 exahertz (3×10 16 Hz to 3×10 19X-ray backscatter is a form of electromagnetic radiation having a wavelength in the range of 0.01 to 10 nanometers, corresponding to a frequency in the range of 100 Hz and an energy in the range of 100 eV to 100 keV. An X-ray backscatter system is a type of X-ray imaging system that uses indirect detection of X-rays to inspect a target object. An X-ray backscatter system typically includes an X-ray tube, a collimator, and a detector. The X-ray tube generates and emits X-rays. The collimator filters the X-rays and uses a portion of the X-rays that travel substantially parallel to a particular direction to generate an X-ray beam.

[0005] When an X-ray beam strikes a target object, some or all of the X-rays in the X-ray beam are scattered in various directions by the target object. In particular, the X-rays may be scattered from the surface of the target object and / or from beneath the surface of the target object. The scattered X-rays are referred to as backscatter. When the backscatter strikes a detector, the detected X-ray backscatter can be used to generate image data about the target object being investigated. For example, backscatter detected when an X-ray beam is directed at a particular location on or within a particular target object can be used to generate intensity values ​​for pixels in an image that correspond to a particular location on or within a particular object. The use of X-rays for non-destructive material evaluation allows for inspection without destroying the parts, components, boards, etc. being inspected.

[0006] Due at least to the weight and configuration of the various components, typical X-ray backscatter systems are typically large and cumbersome and use a stationary detector with a fixed focal spot, typically having a planar geometry, to collect the X-ray backscatter from the object. Summary of the Invention

[0007] According to this aspect, an X-ray backscatter detection device is disclosed that includes a housing configured to contain components including at least a plurality of electronic circuits and an integrated high voltage power supply, the device further including at least one photomultiplier tube configured to generate an electromagnetic field, the photomultiplier tube positioned outwardly from the housing, and the at least one photomultiplier tube further positioned proximate the housing.

[0008] The apparatus further includes at least one deflection yoke. The deflection yoke is positioned proximate to the photomultiplier tube.

[0009] According to a further aspect, the deflection yoke is configured to generate a predetermined opposing electromagnetic field, the opposing electromagnetic field configured to at least partially oppose the electromagnetic field generated by the photomultiplier tube.

[0010] In another aspect, the photomultiplier tube is integrated into the deflection yoke.

[0011] In another aspect, a photomultiplier tube includes a plurality of polarizing yokes connected to the photomultiplier tube.

[0012] In a further aspect, the presence of the polarizing yoke eliminates the need for multiple components, including two or more of a cooling device, a high voltage cable, a communication cable, a control unit, a cable management device, or a combination thereof.

[0013] In another aspect, a polarizing yoke is configured to generate opposing electromagnetic fields having predetermined strengths and values.

[0014] In another aspect, the X-ray backscatter detection device has a footprint sufficient to provide the footprint of a portable X-ray backscatter detection device for the X-ray backscatter detection devices of the present disclosure.

[0015] In another aspect, a method of making an X-ray backscatter detection device is disclosed. The method includes integrating a plurality of X-ray backscatter detection components into a housing, which may be a single housing. The housing includes a housing exterior. The plurality of X-ray backscatter detection components include a high voltage power supply, a plurality of electronic circuits, and an X-ray generating source. The method further includes positioning at least one scintillator detector proximate the housing exterior, positioning at least one photomultiplier tube proximate the scintillator detector, and positioning at least one deflection yoke proximate the photomultiplier tube. The terms "scintillator" and "scintillator detector" are used equivalently and interchangeably herein, both generally and when specifically referring to the enumerated portion 26.

[0016] In another aspect, a method of making an X-ray backscatter detection device is disclosed. The method includes integrating a plurality of X-ray backscatter detection components into a housing that includes a housing exterior. The plurality of X-ray backscatter detection components include a high voltage power supply, a plurality of electronic circuits, and an X-ray generating source. The method further includes positioning at least one scintillator detector proximate the housing exterior, positioning at least one photomultiplier tube (18) proximate the scintillator detector, and positioning at least one deflection yoke (20) proximate the photomultiplier tube.

[0017] In another aspect, the method further includes connecting at least one deflection yoke to the photomultiplier tube, the deflection yoke configured to generate a predetermined opposing electromagnetic field, the opposing electromagnetic field configured to at least partially oppose the electromagnetic field generated by the photomultiplier tube. The method further includes generating a predetermined opposing electromagnetic field, the predetermined opposing electromagnetic field configured to at least partially oppose the electromagnetic field generated by the photomultiplier tube.

[0018] In another aspect, the method further includes connecting the plurality of deflection yokes to a photomultiplier tube.

[0019] In another aspect, the method further includes connecting the multiple deflection yokes to the multiple photomultiplier tubes.

[0020] In another aspect, a method for non-destructively inspecting a substrate is disclosed. The method includes positioning an X-ray backscatter detector proximate the substrate. The integrated X-ray backscatter detector includes an integrated X-ray source, an integrated collimator, an integrated high voltage power supply, at least one scintillator detector, at least one photomultiplier tube configured to generate an electromagnetic field, and at least one deflection yoke positioned proximate the photomultiplier tube configured to generate a predetermined opposing electromagnetic field. The method further includes providing an X-ray beam to the substrate. The method further includes collecting an amount of X-ray backscatter in the scintillator detector, generating an image signal, and sending the image signal to a readout.

[0021] The above-described features, functions, and advantages can be realized alone in various aspects or combined in yet other aspects, details of which can be seen by reference to the following description and the accompanying drawings.

[0022] Having generally described the present disclosure in terms of variants, reference is now made to the accompanying drawings, which are not necessarily drawn to scale. [Brief description of the drawings]

[0023] [Figure 1] FIG. 2 is a non-limiting diagram of a portable X-ray backscatter detection device according to the present embodiment. [Diagram 2] FIG. 2 is a non-limiting diagram of a portable X-ray backscatter detection device according to the present embodiment. [Diagram 3] 1 is a non-limiting diagram of a vehicle in the form of an aircraft, according to present embodiments. [Figure 4] 2 is a non-limiting view of an interior portion of a vehicle in the form of a fuselage interior, according to the present embodiment; FIG. [Diagram 5]1 is a non-limiting flow chart outlining a method according to the present embodiment. [Figure 6] 1 is a non-limiting flow chart outlining a method according to the present embodiment. [Figure 7] 1 is a non-limiting flow chart outlining a method according to the present embodiment; and [Figure 8] 1 is a non-limiting flow chart outlining a method according to the present embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0024] X-ray backscatter analysis is a type of x-ray imaging that allows an evaluator to use x-rays to indirectly inspect an object by directing an x-ray beam at the object and indirectly collecting the x-ray backscatter as a reading on a detection device as the x-rays scatter as "backscatter" from the target object. When signals generated from the collected x-ray backscatter are interpreted via appropriate software, the x-ray backscatter technique can produce a viewable image of the target object for the purpose of detecting defects or otherwise characterizing regions of the target object, such as, for example, the surface of the target object and / or below the surface of the target object.

[0025] Depending on the shape of the target object, the X-ray backscatter system may not have adequate resolution to identify features of the target object. For example, the image generated from the signal generated by the X-ray detector and transmitted to the X-ray imaging system may not provide the desired contrast (e.g., the image may not be sharp enough or clear enough) to enable reliable detection of anomalies of a certain size that may cause the target object to be missed. Furthermore, typical X-ray backscatter systems are typically large and cumbersome, and use stationary detectors with fixed focal spots that typically have a planar shape to collect the X-ray backscatter from the object.

[0026] In a typical X-ray backscatter protocol and system, an X-ray beam may be moved relative to a target object in a selected pattern, such as a raster pattern, such that image data may be generated for various locations on or within the target object. The image data may then generate one or more images that may be interpreted using computational software and hardware to determine whether defects, anomalies, flaws, etc. are present within the location of the target object inspected by the X-ray backscatter system.

[0027] The typical size or "footprint" of an X-ray backscatter detector can limit the practical usefulness of an X-ray backscatter inspection regime. In some cases, a typical X-ray backscatter detection system can weigh more than 1000 pounds and typically require on-site stationary testing of the equipment. That is, in-situ nondestructive testing for large structures is typically complicated by the footprint (equivalently referred to herein as the "physical footprint") and size of the inspection equipment (e.g., apparatus), methods, and systems. Furthermore, if the surface of the target object has a complex geometry or is in a location that is difficult to access, an X-ray backscatter detector can be difficult to employ.

[0028] Furthermore, a typical design for an X-ray backscatter system requires multiple components used in generating the emitted electromagnetic radiation (EMR) in the form of X-rays in the required quantity and intensity. For example, the large power supply required to operate the 160,000 volt X-ray tube typically required for an X-ray backscatter detector is typically integrated into the instrument. Additionally, components such as cooling devices, high voltage cables, communication cables, control units, cable management devices, etc. are typically further integrated into the X-ray backscatter detector, further increasing the complexity, weight, overall size, or "footprint" of the system. Furthermore, when such components are powered for operation, such components generate electronic signatures that can contribute to the "noise" of the system that can interfere with the recordings and readings of the scintillator detector(s) that detect the backscatter.

[0029] According to the present aspect, an improved X-ray backscatter detection device is disclosed that houses certain components within a housing and relegates additional components to locations outside the housing. Additionally, the present aspect provides noise cancellation of certain integrated components by providing and positioning a polarizing yoke in proximity to a photomultiplier tube associated with a scintillator detector(s). The polarizing yoke is adapted to provide a desired and predetermined cancellation effect to the EMR signal, resulting in improved scintillator readings resulting in improved readout image resolution, e.g., by improving image contrast, etc. The predetermined electromagnetic cancellation effect, which may be at least a predetermined partial electromagnetic cancellation effect, may be achieved by manufacturing, adapting, modifying, etc. the deflection yoke, for example, by providing a predetermined amount of wire wrapped around the deflection yoke (or providing a predetermined amount of other material to the deflection yoke, the material provided to the yoke being configured to generate a predetermined electromagnetic field, which may be an adjustable electromagnetic field) or other material, for the purpose of generating a desired and predetermined electromagnetic cancellation or counteracting effect(s) for one or more electromagnetic fields generated by powered components of the X-ray backscatter detection device during operation of the X-ray backscatter detection device. For present purposes, the terms "predetermined electromagnetic cancellation effect," "electromagnetic cancellation effect," and "electromagnetic counteraction effect" are equivalent terms. They are intended to be used interchangeably when describing a predetermined electromagnetic field and a predetermined opposing electromagnetic field. As presently contemplated herein, an electromagnetic field and a countering electromagnetic field have an electromagnetic field value and a countering electromagnetic field value, either of which may be a predetermined value.

[0030] Additionally, the orientation of components within and outside the housing eliminates the need for multiple components, including at least the elimination of previously required cooling devices, high voltage cables, communication cables, control units, cable management devices, etc. By removing such components from the X-ray backscatter detector system, the overall complexity of the system is reduced, the system is significantly simplified, and the overall weight and footprint of the system is significantly reduced to an overall weight in the range of about 200 to about 300 pounds. This weight reduction allows the X-ray backscatter system of the present disclosure to be operated, for example, by a weight-bearing robot or other operated mechanical positioning device, such that the X-ray backscatter system of the present disclosure is classified as a "portable" system. That is, according to this aspect, the term "portable" as used in this application refers to a weight of a non-destructive X-ray backscatter system and / or apparatus (including, for example, a system and / or apparatus used in the method of the present disclosure) in the range of about 200 to about 300 pounds.

[0031] Additionally, significantly improved x-ray backscatter imaging is achieved by removing several electronic and other powered components from the x-ray backscatter system. Furthermore, as the number of powered components is reduced, EMR that may interfere with the scintillation detector is identified, accounted for, and eliminated by placement of a deflection yoke adjacent to or in combination with the photomultiplier tube.

[0032] The scintillator detectors disclosed herein, which may be used in conjunction with the disclosed X-ray backscatter methods, systems, and devices, include a luminescent layer containing a luminescent material disposed on or otherwise incorporated into the X-ray backscatter detector. The luminescent material absorbs the backscattered X-rays and converts the X-ray radiation into visible light. A photodetector present within the detector sensitive to visible light converts the light from the scintillator into an electrical signal that is interpreted into a visual image. For example, the luminescent coating may be at least one thin continuous layer of luminescent material or a layer of luminescent material.

[0033] The substrate of the present X-ray backscatter detector may be made of a material and sized to the extent that it includes a luminescent material that may be positioned and otherwise shaped into a desired non-planar geometry, e.g., that complements, closely approximates, and / or substantially matches the geometry of a target substrate (equivalently referred to herein as a "target object"), including, but not limited to, the geometry of a surface of the target substrate, such that the X-ray backscatter detector may be highly flexible. The geometry of the target substrate may include a planar geometry, or the geometry of the target substrate may include a non-planar geometry, including, for example, a concave shape, a convex shape, one or more irregular shapes, a complex non-planar shape, and combinations thereof.

[0034] In accordance with this aspect, where reduced weight of the overall X-ray backscatter system is desired, the X-ray backscatter detection devices, systems, and methods of the present disclosure may further benefit from the use of a very thin detector substrate, including a continuous thin layer of luminescent material that substantially covers at least one surface of the flexible detector substrate. The X-ray backscatter detection devices of the present disclosure, including the detector substrate and luminescent material layer, may be selected and manufactured to an overall flexible detector thickness preferably within the range of about 50 μm to about 100 μm, although thinner luminescent material layers may be used if desired.

[0035] In accordance with this aspect, the resolution and contrast of X-ray backscatter imaging possible through the use of X-ray backscatter techniques and the X-ray backscatter methods, apparatus, and systems of the present disclosure is significantly improved through the use of a deflection yoke configured to effectively counter or "cancel" a predetermined amount of EMR emitted from various sources in the system.

[0036] Thus, the non-destructive x-ray backscatter detection devices, systems, and methods of the present disclosure provide improved inspection imaging signal transmission and resultant images by measuring or otherwise identifying and accounting for the existing electromagnetic radiation introduced into the device and system by various components of the device. Once the level or amount of potentially interfering electromagnetic radiation is identified, the polarizing yoke is adjusted to produce an opposing level of electromagnetic radiation in order to "cancel" or otherwise neutralize the "noise" of such system caused by the presence of external systems and interfering electromagnetic radiation introduced into the device.

[0037] According to a further aspect of the present invention, the adjusted polarizing yoke is constructed with and in an orientation that provides the requisite opposing electromagnetic radiation force, such as by providing a certain amount or degree of "windings" of metal or other material. This further aspect further serves to ameliorate the presence of interfering electromagnetic radiation by locating various system components (which may emit certain levels of electromagnetic radiation) inside the housing. The housing of the device may include one or more layers of shielding or other materials for the purpose of reducing external electromagnetic radiation that could otherwise interfere with the scintillator or interfere with the signal transmitted by the scintillator that would otherwise be interpreted by the computing function of the device, and that would otherwise contribute to "noise" that reduces contrast or that would otherwise adversely affect the resolution of the imaging signal that would otherwise be seen in the system or device that views the output.

[0038] Additionally, the orientation of certain system and apparatus components within or outside the housing, coupled with the counteracting influence of a deflection yoke positioned adjacent the photomultiplier tube outside the housing, eliminates the need for various system and apparatus components including, for example, cooling devices, high voltage cables, communication cables, control units, cable management devices, etc., or combinations thereof. By eliminating the presence of at least one of the aforementioned components, the production of interfering electromagnetic radiation that would otherwise be present when such components reduces the amount of counteracting EMR that must be produced, further improving the resolution and contrast of the imaging signal and viewable image produced by the system.

[0039] The methods, systems, and apparatus disclosed herein significantly improve non-destructive X-ray inspection techniques, including indirect non-destructive X-ray backscatter techniques, for evaluating and inspecting target surfaces, including target surfaces that are non-planar or include non-planar target geometries. As used herein, the term "non-planar" in the context of a "non-planar" surface is defined as a surface having at least one area that does not lie completely within or cannot be confined to a single plane. According to the present aspect, such non-planar targets and target surfaces further include geometric shapes, including, in a non-limiting manner, concave shapes, convex shapes, irregular shapes, shapes including complex undulations, other complex shapes, and combinations thereof.

[0040] According to this embodiment, the substrate of the X-ray backscatter detector may be made from materials such as organic carbon-containing materials including, for example, polyethylene naphthalate, poly-4-vinylphenol, and combinations thereof.

[0041] According to this embodiment, the luminescent material can be disposed on the substrate of the X-ray backscatter detector, which may be a flexible substrate, to achieve a luminescent material layer having an average thickness in the range of about 200 nm to about 50 μm on the scintillator. Furthermore, the luminescent material layer can be deposited on the thin flexible X-ray backscatter detector substrate, for example, via additive manufacturing methods for depositing thin films, including, for example, inkjet printing methods. When the luminescent material is deposited on the flexible substrate using inkjet printing techniques, the luminescent material is provided to the inkjet printer in the form of a luminescent inkjet printing ink. Any luminescent material that can take the form of an inkjet printing ink can be used to make the luminescent layer. For example, a particularly suitable luminescent material layer is gadolinium oxide doped with europium (Gd2O3:Eu3 + ), gadolinium oxysulfate (GdOS), cesium iodide (Csl), and calcium tungstate (CaWO4), which are deposited or "printed" with an inkjet printer.

[0042] A non-limiting embodiment of this is shown in FIG. 1. As shown in FIG. 1, a portable non-destructive X-ray backscatter inspection system 10 comprises a housing 12 having a housing exterior 12a configured to contain system components including electronic circuitry 14, a high voltage power supply 16, an X-ray radiation source 22, and a filament 23 (the filament 23 and the X-ray radiation source 22 together comprise an X-ray radiation source). Although not shown, it is understood that the X-ray radiation source further comprises an X-ray radiation tube disposed within a collimator having an aperture. In operation, X-rays 24 are emitted from the X-ray radiation source 22 (which may be, for example, an X-ray tube or a portion of an X-ray tube), and the collimator may rotate such that the aperture changes position and directs the emitted X-rays 24 to various positions on a target substrate 28. As shown in FIG. 1, the target substrate comprises a target substrate surface 28a and a target substrate subsurface 28b. The terms "X-ray source" and "X-ray emitting source" and "X-ray generating source" are generally used equivalently herein and are used equivalently when referring to the "part" listed as "22".

[0043] 1 further illustrates several system components positioned outwardly from the housing 12 and proximate the housing exterior 12a. Such components positioned outwardly from the housing 12 and proximate the housing exterior 12a include a plurality of photomultiplier tubes 18 having a plurality of deflection yokes 20, which are shown positioned proximate the photomultiplier tubes 18, which are positioned proximate the scintillator 26.

[0044] FIG. 2 further illustrates, in a non-limiting manner, an X-ray backscatter system 30 according to further present embodiments. As shown in FIG. 2, the X-ray backscatter system 30, which may be a portable X-ray backscatter system 30, includes a portable X-ray backscatter detector 32, which may be configured to direct X-ray radiation in the form of an X-ray beam 33 from an X-ray source 22 (such as that shown in FIG. 1, but not explicitly shown in FIG. 2) towards a target substrate 34. As further shown in FIG. 2, a reflected X-ray beam 36 is directed as backscatter from the target substrate 34 to a scintillator 35. A signal is generated in and / or by the scintillator and then transmitted from the portable X-ray backscatter detector 32 to a computer 38. The computer 38 interprets the signal thus received and converts the signal received from the scintillator into an imaging signal 39. The imaging signal 39 is then directed to a visual readout 40. The visual readout 40 may take the form of, for example, a computer monitor or a handheld device from which visual images may be viewed and recorded. The visual readout may be located in the vicinity of the system 30 or may be located at a remote distance from the system and communicate with the system via wireless technologies, for example Wi-Fi or BlueTooth.

[0045] Using the disclosed system and apparatus, the target substrate to be non-destructively inspected according to the disclosed method can be made of any material. For example, the portable X-ray backscattering system can non-destructively inspect metallic materials, non-metallic materials, and combinations thereof. For example, non-limiting examples of non-metallic materials include composite materials and materials and material layers present between metallic and / or non-metallic materials. They include, for example, adhesive layers (e.g., adhesive materials that can be cured, and adhesive materials that can take the form of, for example, material bond lines) present in or near composite materials, including composite laminate materials. That is, according to this aspect, the portable X-ray backscattering method, system, and apparatus can be configured to non-destructively inspect bond lines in materials of the target substrate, including bond lines in composite materials or bond lines between composite materials (or other non-metallic materials) and metallic materials, in situ and in real time.

[0046] Target substrates may include discrete components (equivalently referred to herein as "parts"), as well as components incorporated within larger assemblies, subassemblies, and the like, that may be non-destructively inspected in situ and in real time according to the present aspects. A non-exhaustive list of objects that may benefit from the non-destructive inspection methods, systems, and apparatus of the present disclosure includes metallic and non-metallic parts used in the manufacture of stationary structures, including, for example, buildings, bridges, trusses, piping, piping, and pipelines, ducts, and the like, including pipes, piping, and pipelines used in connection with the pipeline of petroleum products and other chemical products (including, for example, water). And the list includes vehicles, including, for example, manned and unmanned aerial vehicles, manned and unmanned spacecraft, manned and unmanned rotorcraft, manned and unmanned ground vehicles, manned and unmanned surface vehicles, manned and unmanned subsurface vehicles, satellites, and the like.

[0047] FIG. 3 is a non-limiting diagram of a vehicle 50 in the form of an aircraft. The vehicle / aircraft comprises a fuselage 52. FIG. 4 illustrates a non-limiting diagram of an interior fuselage 92a of the fuselage 52, showing a frame 94 and stringers 96, according to the present embodiment. According to the present embodiment, the surface and sub-surface regions of the frame and stringers, as well as the fuselage itself, may be non-destructively inspected as target surfaces. The target surfaces illustrated in FIG. 3 and / or FIG. 4 may be non-destructively inspected using a portable X-ray backscatter system as shown in either FIG. 1 or FIG. 2.

[0048] Figure 5 is a flow chart that generally illustrates a non-limiting method according to the present embodiment for non-destructively inspecting a target surface using the portable X-ray backscatter system shown in any of Figures 1, 2, 3, and 4. As shown in Figure 5, a method 100 is generally illustrated according to the present embodiment as including integrating (102) a plurality of X-ray backscatter detector components into a housing 12, the housing comprising a housing exterior 12a, the plurality of X-ray backscatter detector components including a high voltage power supply 16, a plurality of electronic circuits 14, and an X-ray generating source 22. The method further includes positioning (104) at least one scintillator 26 proximate the housing exterior 12a, positioning (106) at least one photomultiplier tube 18 proximate the scintillator 26, and positioning (108) at least one deflection yoke 20 proximate the photomultiplier tube 18.

[0049] FIG 6 is a flow chart that generally illustrates a non-limiting method according to the present embodiment for non-destructively inspecting a target surface using the portable X-ray backscatter system shown in any of FIGS. 1, 2, 3, and 4, and incorporating the method generally illustrated in FIG 5. As shown in FIG 6, a method 200 is generally illustrated according to the present embodiment to include integrating (102) a plurality of X-ray backscatter detector components into a housing 12. The housing comprises a housing exterior 12a, and the plurality of X-ray backscatter detector components include a high voltage power supply 16, a plurality of electronic circuits 14, and an X-ray generating source 22. The method further includes positioning (104) at least one scintillator 26 proximate the housing exterior, positioning (106) at least one photomultiplier tube 18 proximate the scintillator 26, and positioning (108) at least one deflection yoke 20 proximate the photomultiplier tube 18. As shown in FIG. 6, the method 200 further includes connecting (210) at least one deflection yoke to the photomultiplier tube. The deflection yoke is configured to generate a predetermined opposing electromagnetic field, the opposing electromagnetic field configured to at least partially oppose the electromagnetic field generated by the photomultiplier tube. The method further includes generating (212) the predetermined opposing electromagnetic field. The predetermined opposing electromagnetic field is configured to at least partially oppose the electromagnetic field generated by the photomultiplier tube. The method further includes at least partially oppose (214) the electromagnetic field generated by the photomultiplier tube.

[0050] FIG 7 is a flow chart that generally illustrates a non-limiting method according to the present embodiment for non-destructively inspecting a target surface using the portable X-ray backscatter system illustrated in any of FIGs 1, 2, 3, and 4, and incorporating the method generally illustrated in any of FIGs 5 and 6. As illustrated in FIG 7, a method 300 is generally illustrated according to the present embodiment to include integrating (102) a plurality of X-ray backscatter detector components into a housing 12. The housing comprises a housing exterior 12a, and the plurality of X-ray backscatter detector components include a high voltage power supply 16, a plurality of electronic circuits 14, and an X-ray generating source 22. The method further includes positioning (104) at least one scintillator 26 proximate the housing exterior, positioning (106) at least one photomultiplier tube 18 proximate the scintillator, and positioning (108) at least one deflection yoke 20 proximate the photomultiplier tube. As shown in FIG. 7, the method 300 further includes connecting (210) at least one deflection yoke to the photomultiplier tube, the deflection yoke configured to generate a predetermined opposing electromagnetic field. The opposing electromagnetic field is configured to at least partially oppose an electromagnetic field generated by the photomultiplier tube. The method 300 further includes generating (212) a predetermined opposing electromagnetic field. The predetermined opposing electromagnetic field is configured to at least partially oppose an electromagnetic field generated by the photomultiplier tube. The method 300 further includes at least partially oppose (214) an electromagnetic field generated by the photomultiplier tube. As shown in FIG. 7, the method generally illustrated optionally further includes connecting (312) a plurality of deflection yokes to the photomultiplier tube. When the method, system, and apparatus employ a plurality of photomultiplier tubes, the method generally illustrated in FIG. 7 may optionally further include connecting (314) a plurality of deflection yokes to a plurality of photomultiplier tubes.

[0051] Figure 8 is a flow chart that generally illustrates a non-limiting method according to the present embodiment for non-destructive inspection of a target surface using the portable X-ray backscatter detection system shown in any of Figures 1, 2, 3, and 4, and incorporating the methods generally illustrated in any of Figures 5, 6, and 7. As shown in Figure 8, a method 400 is generally illustrated according to the present embodiment to include positioning (402) an X-ray backscatter detection device proximate to a substrate. The X-ray backscatter detection device includes a housing, which includes a housing exterior, and the X-ray backscatter detection device includes various components within the housing, including an integrated X-ray source, an integrated collimator, and an integrated high voltage power supply. The method 400 further includes positioning (404) outside the housing exterior at least one photomultiplier tube configured to generate an electromagnetic field, at least one deflection yoke positioned proximate the photomultiplier tube configured to generate a predetermined opposing electromagnetic field having a predetermined value, and at least one scintillator detector. According to this embodiment, as shown in FIG. 8, the method 400 further includes generating (406) a predetermined opposing electromagnetic field, which may be an at least partially opposing electromagnetic field (408), providing (410) an x-ray beam to the substrate, collecting (412) an amount of x-ray backscatter in a scintillator detector, generating (414) an image signal, and transmitting (416) the image signal for readout.

[0052] In accordance with further aspects of the present invention, a detector collects and records photon energy and generates image data in the form of image data signals, and the portable X-ray backscatter detection system and portable X-ray backscatter detection device of the present disclosure generate and transmit image data signals to a computer imaging system, such as one that is commercially available or that may be further modified.

[0053] According to a further non-limiting embodiment, depositing the luminescent material layer on the scintillator(s) can be accomplished by any method capable of depositing a substantially uniform luminescent material layer having an average thickness in the range of about 200 nm to about 50 μm. According to one present embodiment, inkjet printing the luminescent material can be accomplished using, for example, a Dimitrix Materials Printer DMP 2831 (Fujifilm Dimatrix, Inc.). In a preferred embodiment, the inkjet printer can have a 16-nozzle piezoelectric printhead with a drop volume of about 10 pL and a spacing between nozzles of about 250 μm. Printing can be performed at a maximum jet frequency of about 5 kHz.

[0054] According to a further non-limiting aspect of this invention, a useful polymer-based luminescent ink comprises gadolinium oxide doped with europium (Gd2O3:Eu3 + ). The luminescent material may be combined with a thermoplastic elastomer copolymer as a polymer matrix to produce a flexible luminescent ink with the necessary adhesive properties to adhere to a flexible detector substrate. One useful thermoplastic elastomer copolymer, for example, includes styrene-ethylene / butylene-styrene (SEBS) Calprene CH-6120 (Dynasol, Houston, Texas), having an average molecular weight of 245.33 g / mol and a ratio of ethylene-butylene to styrene of 68:32.

[0055] According to this aspect, the disclosed method and system positions a portable X-ray backscatter detector of the present disclosure in proximity to a target. The target may have a target surface shape, and the portable X-ray backscatter detector may include an X-ray radiation source configured to emit X-rays and a collimator in communication with the X-ray radiation source. The collimator is configured to generate an X-ray beam using at least a portion of the X-ray radiation emitted from the X-ray radiation source. The portable X-ray backscatter detector is configured to detect backscatter generated in response to the X-ray beam striking the target substrate. The portable X-ray backscatter detector includes an X-ray scintillator substrate, which is preferably a continuous X-ray scintillator substrate, and at least one layer of an X-ray luminescent material configured to substantially cover the X-ray scintillator substrate (which may be, for example, a flexible X-ray scintillator substrate).

[0056] The disclosed methods, systems, and apparatus provide advanced non-destructive inspection techniques for targets such as components and parts that are difficult to inspect or otherwise difficult to access. Such objects may include components and parts within vehicles, as well as components and parts within stationary objects and systems, including, for example, but not limited to, pipes used in pipelines, storage tanks, buildings, bridges, railroads, structural supports within trusses, etc. Non-destructive inspection of vehicles and components within vehicles includes, for example, but not limited to, components and assemblies incorporated within manned and unmanned aerial vehicles, manned and unmanned spacecraft, manned and unmanned rotorcraft, manned and unmanned ground vehicles, manned and unmanned surface vehicles, manned and unmanned subsurface vehicles, and combinations thereof.

[0057] Additionally, the present disclosure includes embodiments according to the following clauses: Article 1. 1. An X-ray backscatter detection device (10), comprising: a housing (12) having a housing exterior (12a), the housing (12) configured to contain components including at least a plurality of electronic circuits (14), an x-ray source (22), and an integrated high voltage power supply (16); photomultiplier tubes (18) configured to generate an electromagnetic field, at least one of the photomultiplier tubes being positioned outside the housing (12) and at least one of the photomultiplier tubes being positioned proximate the housing exterior (12a); a scintillator detector (26) positioned adjacent the housing exterior; and An X-ray backscatter detection device comprising at least one deflection yoke (20) positioned adjacent to the photomultiplier tube (18), the deflection yoke (20) being positioned adjacent to the housing exterior (12a). Article 2. 2. The X-ray backscatter detection device of claim 1, wherein the deflection yoke is configured to generate a predetermined opposing electromagnetic field, the predetermined opposing electromagnetic field being configured to at least partially oppose the electromagnetic field generated by the photomultiplier tube. Article 3. 2. The X-ray backscatter detection apparatus of claim 1, wherein the photomultiplier tube is integral with the deflection yoke. Article 4. 2. The X-ray backscatter detection apparatus of claim 1, wherein the photomultiplier tube comprises a plurality of deflection yokes connected to the photomultiplier tube. Article 5. 13. The X-ray backscatter detection device of claim 1, wherein the deflection yoke eliminates the need for a number of components including two or more of a cooling device, a high voltage cable, a communication cable, a control unit, a cable management device, or a combination thereof. Article 6. 13. The X-ray backscatter detection device of claim 1, wherein the X-ray backscatter detection device has a physical footprint, the physical footprint further comprising a portable footprint, and the X-ray backscatter detection device is portable. Article 7. 2. The X-ray backscatter detection device of claim 1, wherein the deflection yoke comprises a predetermined amount of wire wrapped around the deflection yoke. Article 8. 2. The X-ray backscatter detection apparatus of claim 1, wherein the deflection yoke is configured to generate a predetermined opposing electromagnetic field, the opposing electromagnetic field having a predetermined opposing electromagnetic field value. Article 9. 2. The X-ray backscatter detection device of claim 1, wherein the integrated X-ray source and the integrated high voltage power supply are integrated within the housing having a housing exterior. Article 10. A method (100)(200)(300) for making an X-ray backscatter detection device, comprising: Integrating (102) a plurality of X-ray backscatter detection components into a housing (12), the housing having a housing exterior (12a), the plurality of X-ray backscatter detection components including a high voltage power supply (16), a plurality of electronic circuits (14), and an X-ray generating source (22); Positioning (104) a scintillator (26) adjacent the housing exterior; positioning (106) a photomultiplier tube (18) adjacent to the scintillator; and The method includes positioning (108) at least one deflection yoke (20) proximate to the photomultiplier tube. Article 11. Connecting at least one deflection yoke to a photomultiplier tube (210), the deflection yoke being configured to generate a predetermined opposing electromagnetic field, the opposing electromagnetic field being configured to at least partially oppose an electromagnetic field generated by the photomultiplier tube; generating (212) a predetermined opposing electromagnetic field, the predetermined opposing electromagnetic field being configured to at least partially oppose an electromagnetic field generated by the photomultiplier tube; and 11. The method of claim 10, further comprising at least partially opposing (214) the electromagnetic field generated by the photomultiplier tube. Article 12. 11. The method of claim 10, further comprising connecting (312) a plurality of deflection yokes to the photomultiplier tubes. Article 13. 11. The method of claim 10, further comprising connecting (314) the plurality of deflection yokes to the plurality of photomultiplier tubes. Article 14. A method (400) for non-destructively inspecting a substrate, comprising: Positioning (402) an X-ray backscatter detection device proximate to a substrate, the X-ray backscatter detection device comprising a housing having a housing exterior, the X-ray backscatter detection device further comprising within the housing: An X-ray source; positioning (402) an X-ray backscatter detection device adjacent to the substrate, the X-ray backscatter detection device comprising a high voltage power supply; On the outside of the housing exterior, a photomultiplier tube configured to generate an electromagnetic field; a deflection yoke positioned proximate the photomultiplier tube, the deflection yoke configured to generate a predetermined opposing electromagnetic field; positioning (404) a scintillator detector; generating a predetermined electromagnetic field (406); generating (408) predetermined at least partially opposing electromagnetic fields; providing an X-ray beam to the substrate (410); collecting (412) an amount of x-ray backscatter in the scintillator detector; generating an image signal (414); and transmitting (416) the image signal to a readout. Article 15. 15. The method of claim 14, wherein the X-ray source and the high voltage power supply are positioned within the housing having a housing exterior. Article 16. 15. The method of claim 14, wherein the scintillator detector, the photomultiplier tube, and the deflection yoke are positioned adjacent to the housing exterior and further outside the housing. Article 17. 15. The method of claim 14, further comprising connecting (418) at least one deflection yoke to the photomultiplier tube. Article 18. 15. The method of claim 14, further comprising connecting (420) a plurality of deflection yokes to the photomultiplier tubes. Article 19. 15. The method of claim 14, further comprising connecting (422) the plurality of deflection yokes to the plurality of photomultiplier tubes. Clause 20 15. The method of claim 14, wherein the X-ray backscatter detection device is a portable X-ray backscatter detection device.

[0058] The present disclosure may, of course, be practiced otherwise than as specifically set forth herein without departing from the essential characteristics of the disclosed aspects. The examples herein are to be considered in all respects as illustrative and non-limiting, and all changes which come within the meaning and range of equivalency of the claims are intended to be embraced therein.

Claims

1. An X-ray backscatter detection device (10), comprising: a housing (12) having a housing exterior (12a), the housing (12) configured to contain components including at least a plurality of electronic circuits (14), an x-ray source (22), and an integrated high voltage power supply (16); photomultiplier tubes (18) configured to generate an electromagnetic field, at least one of the photomultiplier tubes being positioned outside the housing (12) and at least one of the photomultiplier tubes being positioned proximate the housing exterior (12a); a scintillator detector (26) positioned adjacent the housing exterior; and at least one deflection yoke (20) positioned adjacent to the photomultiplier tube (18), the deflection yoke (20) being positioned adjacent to the housing exterior (12a); An X-ray backscatter detection device, wherein the deflection yoke is integral with the photomultiplier tube.

2. 2. The x-ray backscatter detection device of claim 1, wherein the deflection yoke is configured to generate a predetermined opposing electromagnetic field, the predetermined opposing electromagnetic field configured to at least partially oppose the electromagnetic field generated by the photomultiplier tube.

3. 3. The X-ray backscatter detection device of claim 1, wherein the photomultiplier tube comprises a plurality of deflection yokes connected to the photomultiplier tube.

4. 4. The X-ray backscatter detection device of claim 1, wherein the deflection yoke eliminates the need for a number of components including two or more of a cooling device, a high voltage cable, a communication cable, a control unit, a cable management device, or a combination thereof.

5. 5. The X-ray backscatter detection device of claim 1 , wherein the X-ray backscatter detection device has a physical footprint, the physical footprint further comprising a portable footprint, and the X-ray backscatter detection device is portable.

6. 6. An X-ray backscatter detection device according to claim 1, wherein the deflection yoke comprises a quantity of wire wrapped around the deflection yoke.

7. 7. An X-ray backscatter detection device according to claim 1, wherein the deflection yoke is configured to generate a predetermined opposing electromagnetic field, the opposing electromagnetic field having a predetermined opposing field value.

8. 8. An X-ray backscatter detection device according to claim 1, wherein the integrated X-ray source and the integrated high voltage power supply are integrated within the housing with a housing exterior.

9. A method (100)(200)(300) for making an X-ray backscatter detection device, comprising: Integrating (102) a plurality of X-ray backscatter detection components into a housing (12), the housing comprising a housing exterior (12a), the plurality of X-ray backscatter detection components including a high voltage power supply (16), a plurality of electronic circuits (14), and an X-ray generating source (22); Positioning (104) a scintillator (26) adjacent the housing exterior; Positioning a photomultiplier tube (18) adjacent to the scintillator (106); and positioning (108) at least one deflection yoke (20) adjacent the photomultiplier tube; The method, wherein the deflection yoke is integral to the photomultiplier tube.

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