Information processing system, information processing method, and information processing program

Abstract

To solve the problem in which: a disclosed technique may increase a cost required for a test of a storage battery necessary in generating deterioration rate characteristics.SOLUTION: An information processing system comprises at least one processor that can execute a program for performing the following steps. An acquisition step acquires a test condition for a first deterioration test performed for a secondary battery and a test result of the first deterioration test. A rate calculation step calculates a capacity deterioration rate of the secondary battery in the test condition on the basis of a capacity deterioration amount. An estimation step estimates, on the basis of the calculated capacity deterioration rate, the capacity deterioration rate of the secondary battery in at least one of non-test conditions representing test conditions that are not acquired. A map creation step creates a deterioration rate map indicating a correspondence relationship between the test condition and the capacity deterioration rate on the basis of the calculated capacity deterioration rate and the estimated capacity deterioration rate.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The present invention relates to an information processing system, an information processing method, and an information processing program. [Background technology]

[0002] Patent Document 1 discloses a storage battery diagnostic device that has a simple configuration and aims to notify the deterioration state of a storage battery while performing charging and discharging.

[0003] The battery diagnostic device includes a SOC acquisition unit that acquires the SOC of the battery, a temperature acquisition unit that acquires the temperature of the battery, a memory unit that stores a deterioration rate characteristic that indicates the relationship between the temperature and SOC of the battery and the deterioration rate, a diagnostic unit that determines the deterioration rate of the battery based on the acquired temperature and SOC and the deterioration rate characteristic and calculates the deterioration level of the battery by accumulating the deterioration rate over a specified period of time, and an output unit that outputs information regarding the deterioration state of the battery based on the deterioration level. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] JP 2020-38138 A Summary of the Invention [Problem to be solved by the invention]

[0005] However, the technique disclosed in Patent Document 1 may result in high costs for testing the storage battery, which is necessary when generating the deterioration rate characteristic. [Means for solving the problem]

[0006] According to one aspect of the present invention, an information processing system is provided. The information processing system includes at least one processor capable of executing a program to perform the following steps. In the acquisition step, test conditions of a first deterioration test performed on a secondary battery and test results from the first deterioration test are acquired. The test conditions include a test time for performing the first deterioration test. The test results include a capacity deterioration amount of the secondary battery. In the rate calculation step, a capacity deterioration rate of the secondary battery under the test conditions is calculated based on the capacity deterioration amount. In the estimation step, a capacity deterioration rate of the secondary battery under at least one untested condition representing a test condition that has not been acquired is estimated based on the calculated capacity deterioration rate. In the map generation step, a deterioration rate map showing a correspondence relationship between the test conditions and the capacity deterioration rate is generated based on the calculated capacity deterioration rate and the estimated capacity deterioration rate. In the priority calculation step, a priority of each untested condition under which a second deterioration test is performed is calculated based on the generated deterioration rate map. In the candidate output step, candidates for the second degradation test having at least one of the untested conditions as a test condition are output in a user-selectable manner based on the calculated priority.

[0007] According to this configuration, it is possible to obtain a degradation rate map while reducing the testing cost, as compared with the conventional testing method. [Brief description of the drawings]

[0008] [Figure 1] 1 is a configuration diagram illustrating an information processing system 1. [Diagram 2] 2 is a block diagram showing a hardware configuration of an information processing device 2. FIG. [Diagram 3] FIG. 2 is a block diagram showing a hardware configuration of a user terminal 3. [Figure 4] FIG. 2 is a diagram showing an example of the configuration of a degradation test device 4. [Diagram 5] FIG. 2 is a diagram illustrating an example of a functional unit included in a processor 23. [Figure 6] 2 is a flowchart showing an overview of the flow of information processing executed in the information processing system 1. [Figure 7] 13 is a flowchart showing the flow of a search process. [Figure 8] 13 is a flowchart showing the flow of a correction process. [Figure 9] 11 is a diagram illustrating an example of an estimation result of the time dependency of the amount of capacity deterioration ΔC. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0009] DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, embodiments of the present invention will be described with reference to the drawings. Various characteristic features shown in the following embodiments can be combined with each other.

[0010] Incidentally, the program for realizing the software appearing in this embodiment may be provided as a non-transitory computer-readable recording medium, or may be provided so as to be downloadable from an external server, or may be provided so that the program is started on an external computer and its functions are realized on a client terminal (so-called cloud computing).

[0011] In this embodiment, the term "unit" may include, for example, a combination of hardware resources implemented by a circuit in the broad sense and software information processing that can be specifically realized by these hardware resources. In addition, this embodiment handles various information, which may be represented by, for example, physical values ​​of signal values ​​representing voltage and current, high and low signal values ​​as a binary bit set consisting of 0 or 1, or quantum superposition (so-called quantum bits), and communication and calculation may be performed on a circuit in the broad sense.

[0012] In addition, a circuit in the broad sense is a circuit realized by at least appropriately combining a circuit, circuitry, a processor, and a memory, etc. In other words, it includes an application specific integrated circuit (ASIC), a programmable logic device (e.g., a simple programmable logic device (SPLD), a complex programmable logic device (CPLD), and a field programmable gate array (FPGA)), etc.

[0013] 1. Hardware Configuration This section describes the hardware configuration.

[0014] <Information Processing System 1> FIG. 1 is a configuration diagram showing an information processing system 1. The information processing system 1 includes an information processing device 2, a user terminal 3, and a degradation test device 4. The information processing device 2, the user terminal 3, and the degradation test device 4 are configured to be capable of communicating with each other via a telecommunication line. In one embodiment, the information processing system 1 is made up of one or more devices or components. For example, if the information processing system 1 is made up of only the information processing device 2, the information processing system 1 can be the information processing device 2. These components will be described below.

[0015] <Information processing device 2> 2 is a block diagram showing a hardware configuration of the information processing device 2. The information processing device 2 includes a communication unit 21, a storage unit 22, and a processor 23, and these components are electrically connected via a communication bus 20 inside the information processing device 2. Each component will be further described.

[0016] The communication unit 21 is preferably a wired communication means such as USB, IEEE1394, Thunderbolt (registered trademark), wired LAN network communication, etc., but may also include wireless LAN network communication, mobile communication such as 3G / LTE / 5G, BLUETOOTH (registered trademark) communication, etc. as necessary. In other words, it is more preferable to implement it as a collection of multiple communication means. In other words, the information processing device 2 may communicate various information from the outside via the communication unit 21 and the network.

[0017] The storage unit 22 stores various information defined by the above description. This can be implemented, for example, as a storage device such as a solid state drive (SSD) that stores various programs and the like related to the information processing device 2 executed by the processor 23, or as a memory such as a random access memory (RAM) that stores temporarily required information (arguments, arrays, etc.) related to the program calculations. The storage unit 22 stores various programs, variables, etc. related to the information processing device 2 executed by the processor 23.

[0018] The processor 23 processes and controls the overall operations related to the information processing device 2. The processor 23 is, for example, a central processing unit (CPU) not shown. The processor 23 realizes various functions related to the information processing device 2 by reading out a predetermined program stored in the storage unit 22. That is, information processing by software stored in the storage unit 22 can be specifically realized by the processor 23, which is an example of hardware, and executed as each functional unit included in the processor 23. These will be described in more detail in the next section. The processor 23 is not limited to being single, and may be implemented with multiple processors 23 for each function. Also, a combination of these may be used.

[0019] <User terminal 3> 3 is a block diagram showing a hardware configuration of the user terminal 3. The user terminal 3 includes a communication unit 31, a storage unit 32, a processor 33, a display unit 34, and an HMI device 35, and these components are electrically connected via a communication bus 30 inside the user terminal 3. Descriptions of the communication unit 31, the storage unit 32, and the processor 33 are omitted because they are similar to the descriptions of the respective units in the information processing device 2.

[0020] The display unit 34 may be included in the housing of the user terminal 3 or may be externally attached. The display unit 34 displays a screen of a graphical user interface (GUI) that can be operated by the user. This is preferably implemented by using display devices such as a CRT display, a liquid crystal display, an organic EL display, and a plasma display according to the type of the user terminal 3.

[0021] The HMI device 35 is a human-machine interface device. The HMI device 35 may be included in the housing of the user terminal 3, or may be externally attached. For example, the HMI device 35 may be implemented as a touch panel integrated with the display unit 34. If it is a touch panel, the user can input a tap operation, a swipe operation, or the like. Of course, instead of the touch panel, a switch button, a mouse, a QWERTY keyboard, a voice recognition device, a gesture detection device, a gaze detection device, a biosignal detection device, an imaging device, or the like may be adopted. That is, the HMI device 35 accepts an operation input made by a user. In response, the HMI device 35 transfers a signal corresponding to the operation input to the processor 33 via the communication bus 30. The processor 33 can execute a predetermined control or calculation as necessary. It can be said that the HMI device 35 includes an input unit configured to be able to accept an input from a user.

[0022] <Deterioration test equipment 4> 4 is a diagram showing an example of the configuration of the degradation test apparatus 4. The degradation test apparatus 4 includes at least one thermostatic chamber 41, one reference thermostatic chamber 42, a charge / discharge device 43, and an impedance measuring device 44, and these components are configured to be able to communicate with each other.

[0023] Each thermostatic chamber 41 and the reference thermostatic chamber 42 are configured to be able to house a secondary battery B. The thermostatic chamber 41 is configured to be able to perform a deterioration test on the secondary battery B. The reference thermostatic chamber 42 is configured to be able to perform, for example, a deterioration test on the secondary battery B, similar to the thermostatic chamber 41. The reference thermostatic chamber 42 is configured to perform a deterioration test on the secondary battery B based on initial test conditions, which will be described later. The secondary battery B may be any battery that is capable of being charged and discharged, such as a lead storage battery, a nickel-cadmium storage battery, a lithium-ion storage battery, or an air battery.

[0024] The charging / discharging device 43 is configured to execute a deterioration test on the secondary battery B by controlling the operations of the thermostatic chamber 41, the reference thermostatic chamber 42, and the secondary battery B. The charging / discharging device 43 is configured to be capable of controlling the temperatures of the thermostatic chamber 41 and the reference thermostatic chamber 42, for example, according to the test conditions of the deterioration test. The charging / discharging device 43 is also configured to be capable of controlling the charging / discharging of the secondary battery B, for example, the charging / discharging rate of the secondary battery B, and the voltage and current during charging / discharging, according to the test conditions.

[0025] The impedance measuring device 44 is configured to be able to measure the impedance and open circuit voltage (OCV) of the secondary battery B in accordance with the control of the secondary battery B by the charge / discharge device 43.

[0026] The test conditions in this embodiment include the test time for performing the first deterioration test, the temperature of the thermostatic chamber 41 (in other words, the temperature of the secondary battery B), the current rate of the secondary battery B, the average SOC (State of Charge), and the SOC range. These elements that define the test conditions are used as elements of a state space that represents the test conditions when generating a deterioration rate map, which will be described later. Note that the test conditions may include elements other than the elements described above as elements of such a state space. For example, the test conditions may include the temperature adjustment speed and temperature adjustment time of the thermostatic chamber 41, etc., and the waiting time when the target SOC is reached.

[0027] The test conditions are set within a predetermined test range, such as the temperature range of the thermostatic chamber 41, the range of the current rate of the secondary battery B, the range of the average SOC, the value of the SOC range, etc.

[0028] 2. Functional configuration of information processing device 2 Fig. 5 is a diagram showing an example of functional units included in the processor 23. As shown in Fig. 5, the processor 23 includes an acquisition unit 231, a speed calculation unit 232, an estimation unit 233, a priority setting unit 234, a priority calculation unit 235, a candidate output unit 236, an exchange determination unit 237, a correction unit 238, and a map generation unit 239. In this section, an overview of these functional units will be described. Details of each functional unit will be described together with information processing described later.

[0029] The acquiring unit 231 is configured to be able to acquire information from the user terminal 3, the degradation test device 4, or other devices. The acquiring unit 231 is configured to be able to acquire various pieces of information by reading out various pieces of information stored in a storage area that is at least a part of the memory unit 22, and writing the read out information in a working area that is at least a part of the memory unit 22. The storage area is, for example, an area of ​​the memory unit 22 that is implemented as a storage device such as an SSD. The working area is, for example, an area that is implemented as a memory such as a RAM. Note that the acquisition by the acquiring unit 231 includes acquiring the output results of each functional unit included in the processor 23.

[0030] The rate calculation unit 232 is configured to be able to calculate various information such as the capacity degradation rate V based on the results acquired by the acquisition unit 231. The capacity degradation rate V represents the amount of degradation per unit time of the battery capacity C of the secondary battery B in a certain environment.

[0031] The estimation unit 233 is configured to be able to estimate various pieces of information, such as the capacity degradation rate V under certain test conditions, based on various pieces of information, such as the results acquired by the acquisition unit 231 and the results calculated by the rate calculation unit 232.

[0032] The priority setting section 234 is configured to be able to set priorities of test conditions for a degradation test to be performed on the secondary battery B, based on various information and a user operation.

[0033] The priority calculation section 235 is configured to be able to calculate a priority corresponding to each of the test conditions based on various information such as the priority set by the priority setting section 234. The details of the priority will be described later.

[0034] The candidate output unit 236 is configured to be capable of outputting various information such as candidates for test conditions for a degradation test performed on each of the secondary batteries B. The information can be presented to the user via the display unit 34 of the user terminal 3 or another device. In such a case, for example, the candidate output unit 236 controls the display unit 34 of the user terminal 3 to display visual information such as a screen, an image including a still image or a video, an icon, a message, etc. The candidate output unit 236 may generate only rendering information for displaying the visual information on the user terminal 3. Note that the candidate output unit 236 may present the output information to the user without going through the user terminal 3 or another device user.

[0035] The replacement determination unit 237 is configured to be able to execute a determination as to whether or not replacement of the secondary battery B undergoing a deterioration test is necessary, based on various information.

[0036] The correction unit 238 is configured to be able to correct the estimation result by the estimation unit 233 on the basis of various information.

[0037] The map generation unit 239 is configured to be capable of generating a deterioration rate map that indicates the correspondence relationship between the deterioration rate of the secondary battery B and the test conditions, based on the calculation result of the rate calculation unit 232, the estimation result of the estimation unit 233, the correction result of the correction unit 238, etc. Updating the deterioration rate map is one aspect of generating the deterioration rate map.

[0038] The classification unit 240 is configured to classify the test conditions based on various information.

[0039] 3. Information processing In this section, the information processing executed in the above-mentioned information processing system 1 will be described.

[0040] 3.1. Information processing flow 6 is a flowchart showing an outline of the flow of information processing executed in the information processing system 1. The information processing may include any exception processing not shown. Exception processing includes interruption of the information processing and omission of each process. Selection or input performed in the information processing may be based on a user operation or may be performed automatically without relying on a user operation.

[0041] [Step S1] First, the process proceeds to step S1, where the processor 23 measures the initial capacity C_ini of the secondary battery B accommodated in each of the thermostatic chamber 41 and the reference thermostatic chamber 42 in advance. These secondary batteries B have not been subjected to a deterioration test in the past. For example, the processor 23 first controls the thermostatic chamber 41 and the reference thermostatic chamber 42 to make the temperature of the secondary battery B reach a predetermined set temperature. Next, the processor 23 sets a current value used for charging and discharging the secondary battery B based on the nominal capacity C_noninal of the secondary battery B. Next, the processor 23 performs constant-current and constant-voltage charging up to SOC 100% and constant-current and constant-voltage discharging up to SOC 0% at the set current value, and sets the discharge capacity at this time as the initial capacity C_ini.

[0042] [Step S2] Next, the process proceeds to step S2, where the processor 23, functioning as the acquisition unit 231, acquires preset initial test conditions. The initial test conditions are test conditions for the degradation test to be performed first. For ease of explanation, the degradation test performed up to the last time will be referred to as the first degradation test, and the degradation test to be performed next will be referred to as the second degradation test. The above-described initial test is an example of the first degradation test. The first degradation test can also be referred to as a degradation test performed in the past.

[0043] [Step S3] Next, the process proceeds to step S3, where the processor 23 executes a degradation test based on the acquired initial test conditions. The test results of the executed degradation test and the test conditions are stored in the storage unit 22, for example.

[0044] [Step S4] Next, the process proceeds to step S4, where the processor 23 measures the amount of capacity deterioration ΔC of each secondary battery B due to the deterioration test in step S3. Any measurement method may be used, but for example, the processor 23 measures the battery capacity C after the deterioration test using a method similar to that for the initial capacity C_ini, and measures the amount of capacity deterioration ΔC by subtracting the battery capacity C from the initial capacity C_ini. Note that the measurement of the battery capacity C and the amount of capacity deterioration ΔC of the secondary battery B is not limited to being performed directly by the processor 23. For example, the processor 23 may control the deterioration test device 4 so that the charging / discharging device 43 and the impedance measuring device 44 measure the battery capacity C, etc., and obtain the measurement results output from the deterioration test device 4.

[0045] [Step S5] Next, the process proceeds to step S5, where the processor 23, functioning as the rate calculation unit 232, calculates the capacity degradation rate V of each secondary battery B based on the initial test conditions and the amount of capacity degradation ΔC.

[0046] [Step S6] Next, the process proceeds to step S6, and the processor 23, as the estimation unit 233, estimates the capacity degradation rate V under untested conditions based on the calculated capacity degradation rate V. The untested conditions represent test conditions that have not been previously acquired in this information processing, and are, for example, test conditions for which test results are not stored in the storage unit 22 or the like. The method of estimating the capacity degradation rate V under untested conditions is arbitrary, but for example, the processor 23 generates and updates a trained model representing a predetermined physical model of the secondary battery B by performing machine learning using the calculated capacity degradation rate V as learning data. The trained model is configured to output parameters related to the secondary battery B, such as the capacity degradation rate V, by inputting the test conditions. The processor 23 estimates the capacity degradation rate V under untested conditions by inputting the untested conditions to such a trained model. The specific manner of generating and updating the trained model is arbitrary, and examples thereof include linear regression, ridge regression, Gaussian process regression, neural network, and support vector machine. For example, a method of estimating the capacity degradation rate V by Gaussian process regression may be disclosed in the non-patent document "J. Wang, D. Fleet, and A. Hertzmann, "Gaussian Process Dynamical Models", NIPS2005" etc. The processor 23 may estimate the capacity degradation rate V under untested conditions based on the calculated capacity degradation rate V by using a statistical method based on the regression analysis described above, instead of machine learning etc.

[0047] [Step S7] Next, the process proceeds to step S7, where the processor 23, as the map generating unit 239, generates a degradation rate map M based on the test conditions and the capacity degradation rate V corresponding to the test conditions. The degradation rate map M indicates the correspondence between the test conditions and the capacity degradation rate V. The expression format of the degradation rate map M is arbitrary, such as a function, a lookup table, or a learned model. Note that, when an existing degradation rate map M exists, the processor 23 may update the existing degradation rate map M to the generated degradation rate map M.

[0048] [Step S8] Next, the process proceeds to step S8, and the processor 23, as the acquisition unit 231, acquires information on the first deterioration test by referring to the storage unit 22, etc. For example, the processor 23, as the acquisition unit 231, acquires the test conditions of the first deterioration test performed on the secondary battery B and the test results of the first deterioration test. In detail, the processor 23 acquires the test conditions of the multiple first deterioration tests performed on each of the multiple secondary batteries B, and the capacity deterioration amount ΔC of each secondary battery obtained from each of the multiple first deterioration tests. In this embodiment, in addition to the test conditions and test results of the most recent first deterioration test, the processor 23 further acquires the history of the first deterioration test performed on the secondary battery B. The history of the first deterioration test includes the test conditions and test results of multiple first deterioration tests performed in the past.

[0049] [Step S9] Next, the process proceeds to step S9, where processor 23 determines whether or not a predetermined number of pieces of information related to the first deterioration test have been accumulated based on the acquired test conditions and test results of the first deterioration test. For example, processor 23 determines that a predetermined number of pieces of past test results have been accumulated when any process included in this information processing has been performed a predetermined number of times on one secondary battery B. The predetermined number can be set arbitrarily depending on the accuracy of the information related to the measurement error, and is 2 or more, more preferably 3 or more.

[0050] [Step S10] If it is determined that a predetermined number or more of past test results have been accumulated, the process proceeds to step S10, and the processor 23, as the classification unit 240, classifies candidates for test conditions for the second degradation test according to the measurement error of the amount of capacity degradation ΔC.

[0051] Here, an example of the process of step S10 will be described. First, the processor 23 performs a determination regarding the measurement error of the capacity degradation amount ΔC for each test condition. As a result, the processor 23 classifies the test conditions into a first category representing a relatively large measurement error among the test conditions in the search range, and a second category representing a relatively small measurement error among the test conditions in the search range. For example, the processor 23 performs this determination based on (1) whether or not the estimated result of the current capacity degradation rate V is equal to or less than the average value of the estimated results of the capacity degradation rate V under all test conditions, and (2) whether or not the absolute value of the difference between the estimated result of the current capacity degradation rate V and the estimated result of the previous capacity degradation rate V under the target test condition is equal to or less than a predetermined multiple (0 or more and less than 1) of the estimated result of the current capacity degradation rate V. The processor 23 determines and classifies a test condition that satisfies both conditions (1) and (2) as a test condition that belongs to the first category. On the other hand, the processor 23 determines and classifies test conditions that do not satisfy at least one of the conditions (1) and (2) as test conditions belonging to the second category. (1) is a condition that indicates whether the test conditions have a large relative measurement error of the capacity degradation amount ΔC. This condition is based on the idea that a certain level of measurement error occurs in the battery capacity regardless of the amount of degradation. (2) is a condition that indicates whether the estimated result of the capacity degradation rate V under the test conditions has a small fluctuation from the past estimated results, and indicates the stability of the estimated result.

[0052] The processor 23 may also extract test conditions that have a common temperature, average SOC, and SOC range, and classify the extracted test conditions based on a specific test condition that is one of the extracted test conditions. For example, the processor 23 treats a test condition with a relatively high current rate (specifically, the highest one) as a specific test condition among the extracted test conditions. Then, when the processor 23 classifies the specific test condition into the first classification as the classification unit 240, the processor 23 classifies the extracted test conditions with a lower current rate than the specific test condition (in this case, all of the extracted test conditions) into the first classification like the specific test condition. At this time, even if the extracted test conditions include those that are not classified into the first classification, the processor 23 classifies the extracted test conditions that satisfy the above conditions into the first classification. This is because the capacity degradation rate V increases monotonically with respect to the current rate regardless of the type of secondary battery B, in other words, the capacity degradation rate V tends to be smaller as the current rate is smaller. This can reduce the load of the classification process.

[0053] [Step S11] After step S10, the process proceeds to step S11. On the other hand, if it is determined that the past test results are not accumulated in a predetermined number or more, the process of step S10 is omitted, and the process proceeds to step S11. In step S11, the processor 23 sets a priority as the priority setting unit 234. The priority functions as an index when searching for candidates for test conditions of the second deterioration test described later. The priority is defined by at least one parameter representing the merit or demerit of the second deterioration test, such as the reliability of the deterioration rate map M by performing the second deterioration test on the secondary battery B and the cost of performing the second deterioration test. The priority in this embodiment is defined by at least the standard deviation of the capacity deterioration rate V estimated by the estimation unit 233, the slope of the capacity deterioration rate V in the deterioration rate map M, and the reciprocal of the capacity deterioration rate V. For example, the priority is defined by a weighted linear sum of these parameters. The processor 23 standardizes the parameters so that these parameters can be compared with each other, and performs processing so that each of these parameters takes a value from 0 to 1, for example. Hereinafter, for convenience of explanation, the "slope of the capacity degradation rate V in the degradation rate map M" will be simply referred to as the "slope of the capacity degradation rate V." In the limit, the slope of the capacity degradation rate V can also be said to be the differential value (or gradient) of the capacity degradation rate V with respect to a parameter representing a certain test condition. The slope of the capacity degradation rate V may be expressed by a scalar quantity, a vector quantity such as a gradient vector, or a higher-order tensor quantity.

[0054] The standard deviation of the capacity degradation rate V represents the reliability of the estimated result of the capacity degradation rate V under the test conditions. As this value increases, it is suggested that the reliability of the estimated result of the capacity degradation rate V under the test conditions decreases. Therefore, it is preferable to calculate the capacity degradation rate V by a degradation test under a test condition with a lower reliability of the estimated result of the capacity degradation rate V. Therefore, the priority is set to be higher as the standard deviation of the capacity degradation rate V increases. In other words, the standard deviation of the capacity degradation rate V is one of the statistics of the capacity degradation rate V, and is one of the parameters representing the reliability of the degradation rate map M obtained by performing the second degradation test on the secondary battery B.

[0055] The slope of the capacity degradation rate V represents the degree of change in the degradation rate around the test condition. As this value increases, the accuracy of the estimated result of the capacity degradation rate V around the test condition tends to decrease. Therefore, the slope of the capacity degradation rate V is one of the parameters representing the reliability of the degradation rate map M obtained by performing the second degradation test on the secondary battery B. Under test conditions in which the slope of the capacity degradation rate V is large, the calculation results of the capacity degradation rate V can be enriched by performing the degradation test, and the estimation accuracy of the degradation rate map M can be efficiently improved. Therefore, the priority is set to increase as the slope of the capacity degradation rate V increases. Calculating the standard deviation and slope of the capacity degradation rate V based on the capacity degradation amount ΔC of the first degradation test is one aspect of obtaining the reliability of the generated degradation rate map M. Therefore, the reliability of the degradation rate map M is calculated based on at least one of the statistics of the calculated capacity degradation rate V and the slope of the calculated capacity degradation rate V for the parameters related to the test conditions of the degradation rate map M.

[0056] The reciprocal of the capacity degradation rate V represents the smallness of the load on the secondary battery B due to the degradation test, and is one of the indices representing the cost of performing the second degradation test. The larger the value of the reciprocal of the capacity degradation rate V, the smaller the amount of capacity degradation ΔC during a certain test time in the degradation test. Therefore, the larger the value, the smaller the load on the secondary battery B due to the corresponding degradation test, making it easier to perform more degradation tests on one secondary battery B.

[0057] The correspondence between the priority and these parameters is defined by a priority correspondence relationship. The priority correspondence relationship of this embodiment indicates the correspondence relationship between the priority and the reliability of the deterioration rate map M obtained by performing a second deterioration test on the secondary battery B and the cost of performing the second deterioration test, and is defined by, for example, the weight (in other words, the coefficient) of each parameter in the linear sum included in the priority.

[0058] In this embodiment, the processor 23, as the priority setting unit 234, sets the priority correspondence relationship based on a user's specification. For example, the user specifies the weight of each parameter included in the priority through an input to the HMI device 35. The processor 23 updates the weight of each parameter included in the priority correspondence relationship to the specified weight, and sets the priority based on the updated parameters. The processor 23, as the priority calculation unit 235, calculates the priority based on the set priority correspondence relationship.

[0059] [Step S12] Next, the process proceeds to step S12, where the processor 23 calculates priorities corresponding to test conditions only within the search range based on the set priorities, and searches for candidates for test conditions for the second deterioration test to be performed next on each secondary battery B based on the priorities. Hereinafter, for convenience of explanation, the process of searching for the candidates is simply referred to as a search process. In other words, the processor 23, as the priority calculation unit 235, calculates the priorities of each of the untested conditions for performing the second deterioration test based on the generated deterioration rate map M. In this embodiment, the processor 23 calculates the priorities of each of the untested conditions for performing the second deterioration test based on at least one of the reliability of the deterioration rate map M by further performing the second deterioration test on the secondary battery B under at least one untested condition, and the cost of performing the second deterioration test. Note that, if the test conditions for the second deterioration test are classified in step S10, the search range is limited to the test conditions belonging to one of the classifications. In this embodiment, the test conditions classified as having a relatively small measurement error are set as the search range.

[0060] [Step S13] Next, the process proceeds to step S13, where the processor 23 outputs the search result from step S10 as the candidate output unit 236. As a result, the processor 23 outputs candidates for the second degradation test, which have at least one of the untested conditions as a test condition, in a manner that allows the user to select them based on the calculated priority. In this embodiment, the output candidates for the second degradation test are presented to the user via the display unit 34. The user can select the candidates for the second degradation test displayed on the display unit 34 through an operation on the HMI device 35. For example, the processor 23 outputs candidates whose calculated priority is higher than a specified threshold and which are in the top nth place (n is any natural number) in a manner that allows the user to grasp them preferentially.

[0061] [Step S14] Next, the process proceeds to step S14, where the acquisition unit 231 acquires the test conditions selected by the user in step S13.

[0062] [Step S15] Next, the process proceeds to step S15, where the processor 23 sets test conditions for each thermostatic chamber 41 and the reference thermostatic chamber 42 based on the acquired selection of test conditions. The processor 23 of this embodiment sets reference test conditions for the reference thermostatic chamber 42. The reference test conditions are common to the first deterioration test and the second deterioration test, and are set so that a deterioration test is performed under the same test conditions on the secondary battery B accommodated in the reference thermostatic chamber 42. The reference test conditions of this embodiment are consistent with the initial test conditions performed on the secondary battery B accommodated in the reference thermostatic chamber 42 in step S3. In other words, at least one of the test conditions is a reference test condition that is set regardless of the candidate test conditions selected by the user.

[0063] [Step S16] Next, the process proceeds to step S16, where the processor 23, as the replacement determination unit 237, determines whether or not the secondary battery B accommodated in the thermostatic chamber 41 or the reference thermostatic chamber 42 needs to be replaced. For example, the processor 23 determines that the secondary battery B needs to be replaced when the ratio (C_deg_total / C_ini) of the total C_deg_total (so-called total amount of deterioration) of the capacity deterioration amounts ΔC due to past deterioration tests to the initial capacity C_ini is equal to or greater than a preset value. On the other hand, the processor 23 determines that the secondary battery B does not need to be replaced when C_deg_total / C_ini is less than the preset value. The preset value can be set arbitrarily. In this way, the processor 23, as the replacement determination unit 237, determines whether or not to replace the secondary battery B to be subjected to the deterioration test based on the acquired capacity deterioration amount ΔC.

[0064] [Step S17] If it is determined that at least one secondary battery B needs to be replaced, the process proceeds to step S17, and the replacement determination unit 237 presents the secondary battery B that needs to be replaced to the user via the display unit 34, and requests replacement of the secondary battery B. Thereafter, if the user replaces the secondary battery B, the process proceeds to step S18.

[0065] [Step S18] In step S18, the processor 23 measures the initial capacity C_ini of the replaced secondary battery B. The method of measuring the initial capacity C_ini is arbitrary, but is, for example, the same as the method described in step S1. Then, the process proceeds to step S19. If it is determined that replacement of any of the secondary batteries B is unnecessary, the processes of steps S17 and S18 are omitted, and the process proceeds to step S19.

[0066] [Step S19] In step S19, the processor 23 executes a second deterioration test on each of the secondary batteries B based on the test conditions set in step S15.

[0067] [Step S20] Next, the process proceeds to step S20, where processor 23 measures the amount of capacity degradation ΔC of each secondary battery B in the second degradation test. The test results including the measurement results are stored in memory unit 22 or the like together with the corresponding second test conditions. Processor 23, as acquisition unit 231, acquires the test conditions of the first degradation test performed on secondary battery B and the test results of the first degradation test by referring to memory unit 22 or the like. The test results include the amount of capacity degradation ΔC of secondary battery B.

[0068] [Step S21] Next, the process proceeds to step S21, where the processor 23, as the rate calculation unit 232, calculates the capacity degradation rate V of the secondary battery B under the test conditions based on the capacity degradation amount ΔC. For example, the processor 23 calculates the capacity degradation rate V based on the test time ΔT of the second degradation test performed immediately before, the capacity degradation amount ΔC due to the second degradation test, and the cumulative capacity degradation amount ΔC_T which is the cumulative total of the capacity degradation amounts ΔC up to the time immediately before the second degradation test is performed. In this embodiment, the processor 23 further calculates the cumulative test time T_s which is the cumulative total of the test times of the first degradation test performed in the past on the secondary battery B. The cumulative test time T_s is defined as, for example, the time until the capacity degradation amount ΔC of a new secondary battery B that has not been subjected to a degradation test reaches the cumulative capacity degradation amount ΔC_T. The cumulative capacity degradation amount ΔC_T and the cumulative test time T_s are one aspect of the history of the first degradation test. Therefore, it can be said that the rate calculation unit 232 of the processor 23 further calculates the capacity degradation rate V based on the history. For example, the processor 23 calculates the capacity degradation rate V and the cumulative test time T_s based on the time dependency of the battery capacity C and its first-order variation as follows:

number

number

[0069] The a is the order of time dependency of the cumulative capacity degradation amount ΔC_T on the capacity degradation rate V. From these conditional expressions, the capacity degradation rate V and the cumulative test time T_s can be found as follows.

number

number

[0070] In this embodiment, the initial value of α is set to 0.5.

[0071] [Step S22] Next, the process proceeds to step S22, where the processor 23, as the estimation unit 233, estimates the capacity degradation rate V of the secondary battery B under the test conditions of the second degradation test based on the calculated capacity degradation rate V. As described above, the set test conditions are untested conditions. Therefore, the processor 23, as the estimation unit 233, estimates the capacity degradation rate V of the secondary battery B under at least one untested condition representing a test condition that has not been acquired based on the calculated capacity degradation rate V. The measured capacity degradation amount ΔC, the calculated capacity degradation rate V, and the estimated capacity degradation rate V are stored in the storage unit 22 or the like as test results in a state in which they are associated with the respective test conditions.

[0072] [Step S23] Next, the process proceeds to step S23, where processor 23 determines whether or not there is a test result of a first degradation test other than the degradation test performed in step S3 as a past test result by referring to storage unit 22, etc. In other words, processor 23 determines whether or not the process of step S19 was performed in the past in a series of information processing.

[0073] [Step S24] If it is determined that there is a test result of the first deterioration test other than the deterioration test performed in step S3, the process proceeds to step S24, and the processor 23, as the correction unit 238, performs a correction process on the estimated result of the capacity deterioration rate V in step S22. As a result, the processor 23, as the correction unit 238, corrects the calculated capacity deterioration rate V of the secondary battery B based on the capacity deterioration amount ΔC of the secondary battery B due to the first deterioration test under the reference test conditions, and outputs the corrected capacity deterioration rate V. The processor 23 updates the order a by the correction process, for example, and corrects the calculated or estimated capacity deterioration rate V so as to show the time dependency represented by the updated order a. The details of the correction process will be described later. Thereafter, the process proceeds to step S25. Note that, if it is determined that there is no test result of the first deterioration test other than the deterioration test performed in step S3, the process of step S24 is omitted, and the process proceeds to step S25.

[0074] [Step S25] Next, the process proceeds to step S25, where the processor 23, functioning as the map generating unit 239, generates a degradation rate map M based on the calculated capacity degradation rate V and the estimated capacity degradation rate V. In this embodiment, since the degradation rate map M has already been generated in step S7, the processor 23 updates the existing degradation rate map M to the newly generated degradation rate map M.

[0075] [Step S26] Next, the process proceeds to step S26, where the processor 23 determines whether or not a predetermined number of past test results have been accumulated. The past test results and the predetermined number are the same as those used in the determination of step S9.

[0076] [Step S27] If it is determined that the past test results are accumulated in a predetermined number or more, the process proceeds to step S27, where the measurement error of the amount of capacity deterioration ΔC under untested conditions is determined, and untested conditions with relatively large measurement errors are extracted. The specific form of the process is arbitrary, but for example, the processor 23 estimates the measurement error of the amount of capacity deterioration ΔC under untested conditions based on the deterioration rate map by a method similar to that of step S10, and classifies the untested conditions into a first classification and a second classification according to the estimation result as the classification unit 240, and extracts the untested conditions classified into the first classification as untested conditions with relatively large measurement errors. When performing such classification, the processor 23 performs the classification based at least on the above-mentioned condition (2). Therefore, the classification reflects the reliability of the deterioration rate map.

[0077] [Step S28] Next, the process proceeds to step S28, where the processor 23 estimates the capacity degradation rate V under untested conditions belonging to the first classification based on the reliability of the degradation rate map M and the measurement error, and updates the degradation rate map M based on the estimation result. For example, the processor 23 adds the capacity degradation rate V estimated based on the existing degradation rate map M as learning data of the degradation rate map M. As a result, the processor 23 updates the learned model representing the physical model of the secondary battery B. Then, the processor 23 generates the degradation rate map M again based on the updated learned model, and updates the existing degradation rate map M. In this way, the accuracy of the degradation rate map M can be further improved by adding the estimated value of the capacity degradation rate V with a certain level of accuracy as learning data. In other words, the processor 23, as the estimation unit 233, estimates the capacity degradation rate V of the secondary battery B under untested conditions based on the degradation rate map M, and as the classification unit 240, classifies the untested conditions into the first classification and the second classification based on the estimated capacity degradation rate V of the secondary battery B. Here, the first category is a category indicating untested conditions having a larger error in the capacity degradation rate V than the untested conditions belonging to the second category. Then, the processor 23, as the map generating unit 239, updates the degradation rate map M based on the reliability of the degradation rate map M and the capacity degradation rate V estimated for at least the untested conditions belonging to the first category.

[0078] According to such a configuration, for untested conditions in which the error of the capacity degradation rate V is relatively large, the degradation rate map M can be updated using the estimated result of the capacity degradation rate V, thereby further improving the accuracy of the degradation rate map M. In this embodiment, the processor 23 actually performs a degradation test within a region of test conditions in which the measurement error of the capacity degradation rate V is relatively small, and for test conditions in which the measurement error is relatively large, adds learning data corresponding to the test conditions using an estimated result of the capacity degradation rate V that is more reliable than when an actual test is performed. The processor 23 updates the degradation rate map M using the newly added learning data based on such test results and estimated results. This makes it possible to further improve the accuracy of the degradation rate map.

[0079] Here, an example of a process for extracting a test condition for estimating a capacity degradation rate V from among the test conditions belonging to the first classification will be described. First, the processor 23 first sets the number of test conditions to be extracted. The number of extractions is arbitrary as long as it is less than the total number of test conditions of the degradation tests that have been executed so far. Next, a test condition in which one of the parameters that define the priority (in this embodiment, the standard deviation of the capacity degradation rate V) is maximized is selected. Next, the processor 23 acquires the capacity degradation rate V under the selected test condition as a virtual capacity degradation rate V_m based on the latest degradation rate map M. Next, the processor 23 adds the acquired virtual capacity degradation rate V_m to the learning data and updates the standard deviation of the capacity degradation rate V. This may reduce the standard deviation of the capacity degradation rate V around the selected test condition. Thereafter, the processor 23 again selects a test condition in which the standard deviation of the capacity degradation rate V is maximized in the updated state, and repeats the above process until the number of the selected test conditions reaches the extraction number. In this way, by reflecting test conditions under which no degradation test is actually performed in the degradation rate map M, the accuracy of the degradation rate map M can be improved while reducing the cost of the degradation test.

[0080] [Step S29] Next, the process proceeds to step S29, where the processor 23 determines whether or not the termination condition has been met. The termination condition is arbitrary, but for example, the processor 23 determines that the termination condition has been met when the average value of the standard deviations of the capacity degradation rates V under all test conditions within the search range based on the latest degradation rate map M becomes equal to or less than a predetermined ratio of the average value of the standard deviations of the capacity degradation rates V in the initial degradation rate map M. The predetermined ratio can be set arbitrarily, for example, 1%, 5%, 10%, etc.

[0081] If it is determined that the termination condition is satisfied, the information processing system 1 outputs the latest deterioration rate map M as the final result, and ends this information processing.

[0082] On the other hand, if it is determined that the termination condition is not satisfied, the process returns to step S8, and the above-mentioned process is repeated to further perform a second deterioration test and update the deterioration rate map M. In this cycle, the processor 23 treats the second deterioration test performed in the most recent step S19 as the first deterioration test. By repeating such information processing, the test results of the first deterioration test, etc. are accumulated in the memory unit 22, etc.

[0083] 3.2. Details of the search process In this chapter, the details of the search process in step S12 will be explained. Fig. 7 is a flowchart showing the flow of the search process.

[0084] [Step S101] First, in step S101, the processor 23 determines whether or not the search target for candidates for test conditions is the first secondary battery B. If the search target is the first secondary battery B, a virtual capacity deterioration rate V_m, which will be described later, has not been generated. Therefore, the processor 23 may determine whether or not a virtual capacity deterioration rate V_m has been generated. If it is determined that the search target for candidates for test conditions is the first secondary battery B, the process proceeds to step S102. On the other hand, if it is determined that the search target for candidates for test conditions is not the first secondary battery B, in other words, that the search target is the second or subsequent secondary battery B, the process proceeds to step S110.

[0085] [Step S102] Here, a case will be described in which it is determined that the search target for test condition candidates along the time series is the first secondary battery B, and the process proceeds to step S102. In step S102, processor 23 calculates and standardizes the standard deviation, slope, and reciprocal of the capacity degradation rate V for each test condition based on the existing estimation result of the capacity degradation rate V. Note that the specific aspects of these processes are as described above.

[0086] [Step S103] Next, the process proceeds to step S103, where the processor 23 calculates the priority for each test condition based on the standardized value. The priority is set in step S11.

[0087] [Step S104] Next, the process proceeds to step S104, where processor 23 assigns the test condition with the highest priority to search target secondary battery B. Note that the number of candidates for the test condition to be assigned is not limited to one, and there may be multiple candidates.

[0088] [Step S105] Next, the process proceeds to step S105, where the processor 23 determines whether or not test conditions have been assigned to all of the secondary batteries B.

[0089] [Step S106] If it is determined that test conditions have not been assigned to all of the secondary batteries B, the process proceeds to step S106, where the capacity deterioration rate V under the assigned test conditions is estimated based on the latest deterioration rate map M.

[0090] [Step S107] Next, the process proceeds to step S107, where the processor 23 adds the newly estimated capacity deterioration rate V to the capacity deterioration rate V used in generating the deterioration rate map M as learning data.

[0091] [Step S108] Next, the process proceeds to step S108, where the processor 23 generates a virtual deterioration rate map M based on the added capacity deterioration rate V. This makes it possible to assign optimal test conditions when the assigned deterioration test is performed to another secondary battery B. Note that the processor 23 may update the virtual deterioration rate map M as the latest deterioration rate map M. Thereafter, the process returns to step S101, and it is determined whether or not this is the first secondary battery B.

[0092] [Step S110] When the process of step S101 is performed via step S108, the determination result is negative, and the process proceeds to step S110 as described above. In step S110, the processor 23 calculates and standardizes the standard deviation, slope, and reciprocal of the capacity degradation rate V based on the virtual degradation rate map M generated in step S108. These processes are similar to those in step S102. Thereafter, the processes of steps S103 to S105 are performed. If it is determined in step S105 that test conditions have been assigned to all secondary batteries B, the process of step S12 is terminated, the assigned test conditions are output as search results, and the process proceeds to step S13.

[0093] 3.3. Details of correction process In this chapter, the correction process performed in step S24 will be described in detail. Fig. 8 is a flowchart showing the flow of the correction process.

[0094] [Step S201] First, in step S201, the processor 23 estimates the time dependency of the capacity degradation amount ΔC based on the test results of the degradation test under the reference test conditions up to now. The estimation of the time dependency is performed, for example, by optimizing the order a based on the least squares method or the like for a data set represented by the capacity degradation amount ΔC and the cumulative test time T_s. FIG. 9 is a diagram showing an example of the estimation result of the time dependency of the capacity degradation amount ΔC. As shown in FIG. 9, the test result of the degradation test under the reference test conditions is represented as a point P1. For such a plurality of points P1, the time dependency of the capacity degradation amount ΔC when the order a of the test time is changed from 0.5 by a predetermined step width is represented as a function L1. The processor 23 estimates that the order a at which the error between the function L1 and the point P1 is the smallest is the order representing the latest time dependency.

[0095] [Step S202] 8, the process then proceeds to step S202, where the processor 23 compares the order a estimated in step S201 with the most recent order a (initial setting is 0.5) to determine whether or not there is a change in the time dependency. For example, if the absolute value of the difference between the order a estimated in step S201 and the most recent order a is within a permissible value, the processor 23 determines that there is no change in the time dependency, and the process proceeds to step S203.

[0096] [Step S203] In step S203, the processor 23 generates correction information indicating a change in the time dependency. The correction information can be said to be an instruction to change the order a and correct the capacity deterioration rate V associated with the change in step S204 described later. Note that the processor 23 may not constantly update the order a from the initial value (0.5 in this embodiment), but may temporarily change the order a when it is determined in step S202 that there is a change in the time dependency.

[0097] [Step S204] Thereafter, the process proceeds to step S204, where processor 23 corrects capacity deterioration rate V under the previously performed test conditions based on the generated correction information, and makes it consistent with the time dependency defined by the order a estimated in step S201. This allows the time dependency due to the type of secondary battery B to be reflected in deterioration rate map M. Thereafter, the correction process of step S24 ends.

[0098] In addition, in step S202, if the absolute value of the difference between the order a estimated in step S201 and the most recent order a is within the allowable value, the processes of steps S203 and S204 are omitted, and the processor 23 terminates the correction process of step S24 without performing any correction.

[0099] 4.Other The above information processing mode is merely an example and is not limited to this.

[0100] The processor 23 may calculate the capacity deterioration amount ΔC based on the impedance and open circuit voltage of the secondary battery B. These values ​​are measured by the charge / discharge device 43 or the impedance measurement device 44. For example, the processor 23 calculates the capacity deterioration amount ΔC from the impedance and the open circuit voltage by referring to a correspondence relationship between the impedance and the open circuit voltage of the secondary battery B and the battery capacity C that has been constructed in advance. The correspondence relationship is represented by, for example, a trained model that has been constructed in advance according to an arbitrary learning algorithm such as Random Forest or a support vector machine, or a data table that has been measured in advance.

[0101] In step S13, the processor 23, as the candidate output unit 236, further outputs a candidate for the second degradation test based on the transition time t12. The transition time t12 is the time required to transition from the first degradation test to the second degradation test, and is one of the indices representing the cost of performing the second degradation test. In this case, the transition time t12 is one of the parameters that define the priority. In this case, the priority is defined by, for example, the standard deviation of the capacity degradation rate V, the slope of the capacity degradation rate V, and the reciprocal of the capacity degradation rate V, as well as a weighted linear sum of the reciprocal of the transition time t12, as described above. The reciprocal of the transition time t12 becomes larger as the time from the first degradation test to the second degradation test becomes shorter. Therefore, the priority becomes higher for a test condition with a shorter transition time t12.

[0102] In this case, the processor 23, for example, as the priority calculation unit 235 in step S11, further calculates the transition time t12 based on the test conditions of the first deterioration test and the test conditions of the second deterioration test. For example, the processor 23 calculates the transition time t12 by dividing the difference between the temperature of the test conditions of the first deterioration test and the temperature of the test conditions of the second deterioration test by the upper limit value of the temperature rise rate by the thermostatic chamber 41. The processor 23 may also calculate the transition time t12 based on the average SOC or SOC range included in the test conditions. For example, the processor 23 compares the SOC of the secondary battery B after the end of the first deterioration test with the SOC at the start of the second deterioration test, and calculates the transition time t12 based on the current rate at which the secondary battery B is charged. The processor 23 may adopt the maximum value of these respective transition times t12 or the sum of these transition times t12 as the transition time t12 used as a priority parameter.

[0103] The processor 23 further calculates a priority corresponding to the test conditions of the second degradation test based on the transition time t12 calculated in this manner, and in step S12, searches for candidates for the test conditions of the second degradation test based on the calculated priority.

[0104] The priority may not be defined by a linear sum of the above-mentioned parameters, but may be defined by any function or table, such as a non-linear combination of each of the above-mentioned parameters, etc. For example, the priority may be defined by a linear sum of the squares of the above-mentioned parameters.

[0105] The method of determining whether or not the secondary battery B needs to be replaced is not limited to the above-mentioned one, and may be any method. For example, the processor 23 may calculate the state of health (SOH) of the secondary battery B based on the total C_deg_total of the capacity deterioration amounts ΔC and the internal resistance of the secondary battery B, and perform the determination based on whether or not the SOH is equal to or greater than a preset value. The internal resistance of the secondary battery B can be calculated, for example, by comparing the closed circuit voltage and the open circuit voltage measured by the charging / discharging device 43 or the impedance measuring device 44 when a constant current is passed through the secondary battery B. The processor 23 may determine whether or not to replace the secondary battery B based on the test conditions of the selected second deterioration test in addition to the acquired capacity deterioration amount ΔC. For example, the processor 23 may change the preset value to be compared with C_deg_total / C_ini according to the load of the predetermined test conditions.

[0106] The configuration of the degradation test device 4 is arbitrary as long as it can measure the amount of capacity degradation ΔC, and the charging / discharging device 43 and the impedance measuring device 44 may be integrated. Moreover, the degradation test device 4 does not have to include the impedance measuring device 44. Moreover, the function of measuring the amount of capacity degradation ΔC included in the degradation test device 4 may be realized by another device such as the information processing device 2. In other words, the distinction between the information processing device 2, the user terminal 3, and the degradation test device 4 is merely for the convenience of explanation, and is not limited thereto.

[0107] The information processing device 2 may be an on-premise type or a cloud type. As the information processing device 2 in the cloud type, the above-mentioned functions and processes may be provided in the form of, for example, SaaS (Software as a Service) or cloud computing.

[0108] In the above embodiment, the information processing device 2 performs various storage and control, but multiple external devices may be used instead of the information processing device 2. That is, various information and programs may be distributed and stored in multiple external devices using block chain technology or the like.

[0109] The above embodiment is not limited to the information processing system 1, and may be an information processing method or an information processing program. The information processing method includes each step of the information processing system 1. The information processing program causes at least one computer to execute each step of the information processing system 1.

[0110] The information processing system 1 and the like may be provided in the following aspects.

[0111] (1) An information processing system, comprising at least one processor capable of executing a program to perform each of the following steps: in an acquisition step, test conditions of a first deterioration test performed on a secondary battery and test results from the first deterioration test are acquired, wherein the test conditions include a test time for performing the first deterioration test, and the test results include an amount of capacity deterioration of the secondary battery; in a rate calculation step, a capacity deterioration rate of the secondary battery under the test conditions is calculated based on the amount of capacity deterioration; in an estimation step, a capacity deterioration rate under test conditions that has not been acquired is calculated based on the calculated capacity deterioration rate; a map generating step of estimating a capacity degradation rate of the secondary battery under at least one untested condition representing a certain condition, a map generating step of generating a degradation rate map showing a correspondence between the test conditions and the capacity degradation rate based on the calculated capacity degradation rate and the estimated capacity degradation rate, a priority calculating step of calculating a priority of each of the untested conditions under which a second degradation test is performed based on the generated degradation rate map, and a candidate output step of outputting candidates for the second degradation test having at least one of the untested conditions as a test condition in a user-selectable manner based on the calculated priority.

[0112] According to this configuration, the conditions for the next degradation test can be more efficiently selected from the untested conditions, and the accuracy of the degradation rate map can be more efficiently improved.

[0113] (2) In the information processing system described in (1) above, in the priority calculation step, the priority is calculated based on at least one of the reliability of the deterioration rate map obtained by further conducting a second deterioration test on the secondary battery under at least one of the untested conditions and the cost of conducting the second deterioration test.

[0114] According to such a configuration, it is possible to improve the interpretability of the meaning of the conditions for the next degradation test to be performed.

[0115] (3) In the information processing system described in (1) or (2) above, the acquisition step further acquires a history of the first degradation test performed on the secondary battery, and the rate calculation step further calculates the capacity degradation rate based on the history.

[0116] According to such a configuration, a deterioration rate map can be generated using secondary batteries that have been previously subjected to deterioration tests and have deteriorated, thereby reducing the cost of conducting deterioration tests.

[0117] (4) In the information processing system described in any one of (1) to (3) above, the acquisition step acquires test conditions for a plurality of first deterioration tests performed on a plurality of secondary batteries, and the amount of capacity deterioration of each of the secondary batteries obtained from each of the plurality of first deterioration tests, wherein at least one of the test conditions is a reference test condition that is set regardless of a candidate test condition selected by a user, and further, the correction step corrects the calculated rate of capacity deterioration of the secondary battery based on the amount of capacity deterioration of the secondary battery due to the first deterioration test under the reference test conditions.

[0118] With this configuration, the accuracy of the deterioration rate map can be further improved by correcting the deterioration rate calculation results obtained from a short-term deterioration test based on information obtained from a long-term deterioration test under the same test conditions.

[0119] (5) In the information processing system described in any one of (1) to (4) above, the replacement determination step further comprises determining whether or not to replace the secondary battery for which the second deterioration test is being performed, based on the acquired amount of capacity deterioration.

[0120] With this configuration, it becomes easier to carry out a deterioration test under an appropriate load on the secondary battery.

[0121] (6) In the information processing system according to any one of (1) to (5) above, the reliability of the degradation rate map is calculated based on at least one of statistics of the estimated capacity degradation rate and a slope of the calculated capacity degradation rate versus a parameter related to the test condition of the degradation rate map.

[0122] With this configuration, a more accurate deterioration rate map can be obtained.

[0123] (7) In the information processing system described in any one of (1) to (6) above, the priority calculation step further calculates a transition time required to transition from the first degradation test to the second degradation test based on test conditions of the first degradation test and test conditions of the second degradation test, and the candidate output step further outputs candidates for the second degradation test based on the transition time.

[0124] According to this configuration, the degradation test can be performed efficiently while taking into consideration the time required for the entire degradation test.

[0125] (8) In the information processing system described in any one of (1) to (7) above, the obtaining step further includes obtaining reliability of the generated deterioration rate map, the estimation step further includes estimating a capacity deterioration rate of the secondary battery under the untested conditions based on the deterioration rate map, and the classification step further includes classifying the untested conditions into a first category and a second category based on the estimated capacity deterioration rate of the secondary battery, wherein the first category is a category indicating untested conditions having a larger error in capacity deterioration rate compared to untested conditions belonging to the second category, and the map generating step further includes updating the deterioration rate map based on reliability of the deterioration rate map and the capacity deterioration rate estimated for at least the untested conditions belonging to the first category.

[0126] According to this configuration, for untested conditions in which the error in the capacity degradation rate is relatively large, the degradation rate map can be updated using the estimated capacity degradation rate, thereby further improving the accuracy of the degradation rate map.

[0127] (9) In the information processing system described in any one of (1) to (8) above, further, in the priority setting step, a priority correspondence relationship is set based on a user's designation, wherein the priority correspondence relationship indicates at least a correspondence relationship of the priority with respect to the reliability of the deterioration rate map by further conducting the second deterioration test on the secondary battery and a cost of conducting the second deterioration test, and in the priority calculation step, the priority is calculated based on the set priority correspondence relationship.

[0128] According to this configuration, it is possible to output suitable candidates for the second degradation test in accordance with factors that the user places importance on.

[0129] (10) An information processing method, comprising each step of the information processing system according to any one of (1) to (9) above.

[0130] (11) An information processing program that causes at least one computer to execute each step of the information processing system described in any one of (1) to (9) above. Of course, this is not the case.

[0131] Finally, although various embodiments according to the present disclosure have been described, these are presented as examples and are not intended to limit the scope of the invention. The novel embodiment can be implemented in various other forms, and various omissions, substitutions, and modifications can be made without departing from the spirit of the invention. The embodiments and their modifications are included within the scope and spirit of the invention, and are included in the scope of the invention and its equivalents described in the claims. [Explanation of symbols]

[0132] 1: Information processing system 2: Information processing equipment 20: Communication bus 21: Communications Department 22: Storage section 23: Processor 231: Acquisition Department 232: Speed ​​calculation section 233: Estimation section 234:Priority setting section 235:Priority calculation unit 236: Candidate output section 237: Replacement judgment section 238: Correction section 239: Map Generation Unit 3: User terminal 30: Communication bus 31: Communications Department 32: Storage section 33: Processor 34:Display section 35: HMI device 4: Deterioration test equipment 41: Constant temperature bath 42: Standard constant temperature bath 43: Charge / discharge device 44: Impedance measuring device B: Secondary battery L1 : Function P1: point

Claims

1. An information processing system, At least one processor capable of executing a program to perform the following steps: In the acquiring step, test conditions of a first deterioration test performed on the secondary battery and test results of the first deterioration test are acquired, where: the test conditions include a test time for performing the first deterioration test, the test result includes an amount of capacity deterioration of the secondary battery, In the rate calculation step, a capacity degradation rate of the secondary battery under the test conditions is calculated based on the amount of capacity degradation; In the estimation step, a capacity degradation rate of the secondary battery under at least one untested condition that represents a test condition that has not been acquired is estimated based on the calculated capacity degradation rate; In the map generation step, a degradation rate map is generated based on the calculated capacity degradation rate and the estimated capacity degradation rate, the degradation rate map indicating a correspondence relationship between the test conditions and the capacity degradation rate; In the priority calculation step, a priority of each of the untested conditions for performing the second deterioration test is calculated based on the generated deterioration rate map; In the candidate output step, candidates for the second degradation test having at least one of the non-test conditions as a test condition are output in a user-selectable manner based on the calculated priority.

2. 2. The information processing system according to claim 1, In the priority calculation step, the priority is calculated based on at least one of the reliability of the deterioration rate map obtained by further conducting a second deterioration test on the secondary battery under at least one of the untested conditions and the cost of conducting the second deterioration test.

3. 2. The information processing system according to claim 1, The acquiring step further includes acquiring a history of the first deterioration test performed on the secondary battery, The rate calculation step further includes calculating the rate of capacity deterioration based on the history.

4. 2. The information processing system according to claim 1, the acquiring step acquires test conditions for a plurality of first deterioration tests performed on a plurality of secondary batteries, and an amount of capacity deterioration of each of the secondary batteries obtained from each of the plurality of first deterioration tests, wherein at least one of the test conditions is a reference test condition that is set regardless of a candidate test condition selected by a user; Furthermore, in the correcting step, the calculated rate of capacity deterioration of the secondary battery is corrected based on the amount of capacity deterioration of the secondary battery in the first deterioration test under the reference test conditions.

5. 2. The information processing system according to claim 1, Furthermore, in the replacement determination step, it is determined whether or not to replace the secondary battery for which the second deterioration test is performed, based on the acquired amount of capacity deterioration.

6. 2. The information processing system according to claim 1, The reliability of the degradation rate map is calculated based on at least one of statistics of the estimated capacity degradation rate and a slope of the calculated capacity degradation rate versus a parameter related to the test condition of the degradation rate map.

7. 2. The information processing system according to claim 1, the priority calculation step further includes calculating a transition time required for transitioning from the first degradation test to the second degradation test based on test conditions of the first degradation test and test conditions of the second degradation test; The candidate output step further comprises outputting candidates for the second degradation test based on the transition time.

8. 2. The information processing system according to claim 1, The obtaining step further obtains the reliability of the generated deterioration rate map, In the estimating step, a capacity degradation rate of the secondary battery under the untested condition is estimated based on the degradation rate map; Furthermore, in the classification step, the untested conditions are classified into a first category and a second category based on the estimated capacity degradation rate of the secondary battery, and the first category is a category indicating an untested condition having a larger error in capacity degradation rate compared to an untested condition belonging to the second category; In the map generating step, the degradation rate map is updated based on the reliability of the degradation rate map and the capacity degradation rate estimated for at least an untested condition belonging to the first category.

9. 2. The information processing system according to claim 1, Furthermore, in the priority setting step, a priority correspondence relationship is set based on a user's designation, and the priority correspondence relationship indicates at least a correspondence relationship of the priority with respect to reliability of the deterioration rate map obtained by further conducting the second deterioration test on the secondary battery and a cost of conducting the second deterioration test; In the priority calculation step, the priority is calculated based on the set priority correspondence relationship.

10. 1. An information processing method, comprising: A method comprising the steps of the information processing system according to any one of claims 1 to 9.

11. An information processing program, A method for causing at least one computer to execute each step of the information processing system according to any one of claims 1 to 9.

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