Detection based on automated inspection plans

Abstract

The test-plan-based inspection method includes receiving data characterizing an inspection plan associated with inspection of one or more nodes within an inspection site by an inspection device. A first step of the inspection plan includes a first set of inspection device operating parameters associated with inspection of a first node of the one or more nodes and a first set of constraints associated with one or more inspection criteria at the first node by the inspection device. The method also includes generating a first control signal configured to instruct the inspection device to inspect the first node of the one or more nodes. The first control signal is based on one or more of the first set of operating parameters and user input. The method further includes receiving data characterizing an inspection measurement of the first node by the inspection device.

Description

[Background technology]

[0001] A video inspection device, such as a video endoscope or borescope, can be used to make depth measurements of an object (e.g., measuring the lowest point of an anomaly such as a pit or dent, the height of a weld, the offset or gap between surfaces, etc.). Additionally, a video inspection device can be used to observe defects (e.g., fissures, cracks, scratches, etc.) on the surface of an object (e.g., industrial machinery). Often the surface of an object is inaccessible and cannot be seen without the use of a video inspection device. For example, a video inspection device can be used to inspect the surface of an aircraft turbine engine blade or a power generation unit blade to identify any anomalies and determine whether any repairs or further maintenance are required. Summary of the Invention

[0002] Various aspects of the disclosed subject matter can provide one or more of the following features.

[0003] In one implementation, a test plan-based inspection method includes receiving data characterizing a test plan associated with an inspection of one or more nodes at an inspection site by an inspection device. A first step of the inspection plan includes a first set of operational parameters of the inspection device associated with an inspection of a first node of the one or more nodes and a first set of constraints associated with one or more inspection criteria at the first node by the inspection device. The method also includes generating a first control signal configured to instruct the inspection device to inspect the first node of the one or more nodes. The first control signal is based on one or more of the first set of operational parameters and a user input. The method further includes receiving data characterizing an inspection measurement of the first node by the inspection device and determining, by a first analytical model, one or more characteristics of the received data characterizing the inspection measurement of the first node. A subsequent operation of the inspection device is based on a correlation between the determined one or more characteristics of the received data and the first set of constraints.

[0004] One or more of the following features may be included in any viable combination.

[0005] In one implementation, determining the one or more characteristics includes identifying one or more of a feature of the site in the first node, a surrounding area associated with the first node, a mechanical portion of the inspection site in which the first node is located, and an image acquisition parameter associated with an inspection measurement of the first node. In another implementation, the method further includes determining a defect type associated with the identified feature of the site, comparing the determined defect type to a defect type of a constraint in the first set of constraints, and determining a next operation of the inspection apparatus based on the comparison. In yet another implementation, the method further includes generating a notification including the determined next operation. The notification includes one or more of an indication that the inspection of the first node is successfully completed or to repeat the inspection of the first node, and an inspection summary. The inspection summary includes one or more of the determined one or more characteristics, the first set of operational parameters, and the first set of constraints.

[0006] In one implementation, the method further includes determining an updated set of operational parameters for the inspection equipment associated with the inspection of the first node. The determining is based on a comparison between the determined defect type and the defect type of the constraint. In another implementation, the method further includes generating a second control signal based on the updated set of operational parameters. A subsequent operation of the inspection equipment is based on the second control signal. In yet another implementation, the method includes presenting a notification to a user, receiving an input from the user in response to the presented notification, and generating a second control signal based on the received input. A subsequent operation of the inspection equipment is based on the second control signal.

[0007] In one implementation, the next operation of the inspection apparatus includes performing a second step of the inspection plan including a second set of inspection apparatus operating parameters associated with an inspection of a second node of the one or more nodes and a second set of constraints associated with an inspection measurement at the second node by the inspection apparatus. In another implementation, the method includes receiving data characterizing an inspection measurement of the second node by the inspection apparatus and determining one or more properties of the received data characterizing the inspection measurement of the second node by one of the first analytical model and the second analytical model. The next operation of the inspection apparatus is based on a correlation between the determined one or more properties of the received data and the second set of constraints. In yet another implementation, the first analytical model and the second analytical model are included in the inspection plan.

[0008] In one implementation, the first analytical model is trained prior to determining the correlation between the determined one or more characteristics of the received data and the second set of constraints. The training includes receiving training data associated with the first analytical model. The training data includes past inputs and outputs of the first analytical model. The method further includes training, by the training model, the first analytical model based on one or more of the received training data, the received data characterizing the inspection measurements, and the inspection plan.

[0009] In one implementation, the method includes generating a data file including one or more of information associated with a feature of the site in the first node, a first analytical model, data characterizing an inspection of the first node, and a first set of operational parameters. In another implementation, the method includes presenting a first step of an inspection plan to a user and receiving user input from the user. The first control signal is generated based on the user input.

[0010] In one implementation, the first control signal is generated based on a first set of operational parameters at a first step of the inspection plan. In another implementation, the determined one or more characteristics include a perimeter associated with the first node. In yet another implementation, the first analytical model can be based on a first set of constraints.

[0011] Also described are non-transitory computer program products (i.e., physically embodied computer program products) that store instructions that, when executed by one or more data processors of one or more computing systems, cause at least one data processor to perform the operations described herein. Similarly, computer systems are described that may include one or more data processors and a memory coupled to the one or more data processors. The memory may store, either temporarily or permanently, instructions that cause at least one processor to perform one or more of the operations described herein. In addition, the methods may be implemented by one or more data processors, either within a single computing system or distributed among two or more computing systems. Such computing systems may be connected, but may also exchange data and / or commands or other instructions, etc., via one or more connections, including connections via a network (e.g., the Internet, a wireless wide area network, a local area network, a wide area network, a wired network, etc.), a direct connection between one or more of the computing systems, etc.

[0012] These and other capabilities of the disclosed subject matter will be more fully understood after review of the following figures, detailed description, and claims. [Brief description of the drawings]

[0013] These and other features will be more readily understood from the following detailed description taken in conjunction with the accompanying drawings.

[0014] [Figure 1] 1 illustrates a flowchart of an exemplary method for automated inspection of an inspection site (e.g., industrial machinery). [Diagram 2] FIG. 1 illustrates an exemplary inspection device configured to inspect an inspection site. [Diagram 3] FIG. 1 illustrates an exemplary embodiment of a nondestructive testing (NDT) device. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0015] Inspection devices (e.g., borescopes) are commonly used to inspect industrial equipment (e.g., power generation equipment, oil and gas equipment, aircraft equipment, manufacturing equipment, etc.). Borescope inspections can be performed based on an inspection plan (menu-driven inspection) that can be presented to a user via a graphical user interface (GUI) display space. The inspection plan can provide a user with a list of inspection locations (or nodes) on an inspection site (e.g., industrial equipment) and enable the user to browse the inspection locations and acquire inspection data (e.g., images, videos, etc.). Menu-driven inspections do not analyze the inspection data and do not provide the user with feedback regarding the execution of the inspection and / or feedback regarding the quality of the data acquired during the inspection. Relying on humans to ensure that the acquired inspection data is of a desired quality can be inefficient and error-prone, especially when multiple (e.g., tens, hundreds, etc.) nodes need to be inspected. The present application provides improved methods and systems that can monitor the execution of an inspection plan and ensure that inspection measurements are desirable (e.g., based on predetermined criteria). In some implementations, a notification can be generated that informs the user of characteristics associated with the inspection data and enables the user to make changes to the inspection plan (e.g., via a GUI). In some implementations, recommended changes to the inspection plan can be provided to the user.

[0016] An inspection device may include one or more cameras that can be guided to an inspection area within an industrial device and acquire inspection data (e.g., visible light images, IR images, video, temperature, etc.). The acquired image data may be communicated to a computing device (e.g., a controller) that can store / process the data and present the data to a human operator or the like. The inspection area images are typically viewed and analyzed by a human operator who relies on their experience to identify site features (e.g., defects) and / or determine site feature characteristics (e.g., defect severity). This process is slow, expensive, and prone to error. Furthermore, site feature identification / analysis is typically performed after inspection data is acquired. For example, if the inspection area images are undesirable (e.g., site features or their characteristics cannot be identified / analyzed), new inspection data may not be readily obtained. Thus, it may be desirable to configure the inspection device to analyze the inspection data during inspection and acquire new inspection data as needed.

[0017] FIG. 1 illustrates a flow chart of an exemplary method for inspecting an inspection site (e.g., industrial machinery). In step 102, data characterizing an inspection plan associated with the inspection of one or more nodes of the inspection site is received (e.g., by a controller of the inspection device). The inspection plan can include a number of steps that can describe the inspection of various nodes in the inspection site. In one embodiment, each step of the number of steps can be associated with the inspection of a particular node (e.g., a machine part or portion thereof) in the inspection site. For example, a first step of the inspection plan can include a first set of operating parameters of the inspection device for inspecting a first node in the inspection site. The operating parameters can include, for example, a location of the node to be inspected, a position and joint angle of a camera in the inspection device relative to the various nodes, a placement of a lighting device during capture of images by the camera, a type of data to be captured (e.g., 2D images, 3D images, uncompressed or compressed video, geometrically accurate images for dimensioning of feature parts), and the like. The inspection device can operate based on the first set of operating parameters during the inspection of the first node.

[0018] A first step of the inspection plan may include a first set of constraints associated with one or more inspection measurements at the first node. For example, the first set of constraints may include expected characteristics of the inspection data. For example, the constraints may include a type of defect (e.g., cracks, fissures, etc.) to be checked in the machine part on which the first node is located. Additionally or alternatively, the constraints may include an environment / surroundings associated with the first node (e.g., the machine part on which the first node is located, machine parts adjacent to the first node, etc.). Additionally or alternatively, the constraints may be associated with a quality of the inspection measurements (e.g., quality of an image of the first node, image size of a feature in the site in the first node relative to the image of the first node, lighting of the first node, etc.).

[0019] FIG. 2 illustrates an exemplary inspection site 200 that can be inspected by an inspection device 202 (e.g., a borescope). The inspection device 202 can be communicatively coupled to a controller 204 that can control the operation of the inspection device 202. The controller can receive an inspection plan (e.g., as described in step 102 above). In one implementation, the controller 204 can receive the inspection plan from a computing device 206 and generate control signals that drive the operation of the inspection device 202. Based on the control signals, the inspection device can inspect the inspection site 200. For example, the inspection device can move relative to the inspection site 200 to inspect nodes 212, 214, and 216 (e.g., along a predetermined path based on the inspection plan). The controller 204 can also receive inspection data from the inspection device 202. The inspection data can be presented on a display screen on the controller 204 or can be transmitted to the computing device 206 (where the inspection data can be delayed and / or analyzed).

[0020] Returning to FIG. 1 , in step 104, a first control signal may be generated (e.g., by controller 204) configured to instruct an inspection device (e.g., inspection device 202) to inspect a first node (e.g., nodes 212, 214, 216, etc.) of the one or more nodes. In one implementation, the first control signal may be generated based on user input (e.g., provided via computing device 206, via a GUI in controller 204, or otherwise). For example, a first step of the inspection plan may be presented to a user, and the user may review and input the first step. Input from the user may include approval for execution of the first step (e.g., based on the first set of operating parameters and / or the first set of constraints). Alternatively, the user may modify one or more of the first set of operating parameters / first set of constraints in the first step (e.g., via a GUI of controller 204, computing device 206, etc.). The user input can be received (e.g., by the controller 204), and the first control signal can be generated based on the user input (e.g., based on a first set of operating parameters, based on modified operating parameters provided by a user, etc.).

[0021] The inspection device can receive a first control signal and perform an inspection of the first node based on the first control signal. The first control signal can include a position of the first node. One or more motors in the inspection device can change the position / orientation of the inspection device (or a portion thereof) to enable inspection of the first node. For example, a head section of the inspection device can be positioned adjacent to the first node (e.g., by translation / rotation of the head section). The head section can include one or more sensors (e.g., IR camera, visible light camera, vibration detector, temperature sensor, etc.) and a light source that can enable inspection of the first node. Details of an exemplary inspection device (borescope) are provided below along with the description of FIG. 3.

[0022] In step 106, data may be received (e.g., by controller 204) characterizing an inspection measurement of the first node by the inspection device. This may include inspection data generated by various sensors in the inspection device (e.g., inspection device 202, the head section of borescope 300 shown in FIG. 3, etc.). For example, the inspection device may capture visible light images, IR images, 3D images, video images, or thermal information, A visible / IR camera may be included that can capture environmental information such as linear or rotational movement of the first node, magnetic field information of the first node, etc. Data characterizing the captured images may be transmitted by the inspection device 202 and received by the controller 204.

[0023] In step 108, one or more characteristics of the received data characterizing the inspection measurement of the first node may be determined (e.g., by the first analytical model). In some implementations, the determined characteristics may include one or more features (e.g., defects) of the site in the first node that may be identified from the received data characterizing the inspection measurement. For example, the inspection device may take an image of the first node and transmit the image data (e.g., to the controller 204). The controller may execute an analytical model (e.g., an image recognition algorithm) that may determine the presence of a feature of the node site (e.g., an anomaly of a defect in the first node) from the image of the first node. The analytical model may also identify the feature of the site (e.g., a "defect type"). For example, the defect may be identified as one of a crack, a tear, a rub, a dent, a coating loss, missing material, erosion, excess material, a crack, or a combination thereof.

[0024] In some implementations, the analytical model can be based on a first set of constraints. For example, the analytical model may be pre-trained by a machine learning process using existing training images that include defects defined by the predefined constraints (e.g., the first set of constraints). In some implementations, the determined characteristics can include the surroundings (or environment) of the first node. For example, the first node can be located on or adjacent to a machine part (e.g., a turbine). The determined characteristics can be the identity of the machine part(s) that can be determined by the analytical model. In some implementations, the determined characteristics can include image acquisition parameters (e.g., lighting, sharpness, brightness, dirty lens, excessively oblique angle, vibration / motion, etc.) associated with the inspection measurement of the first node.

[0025] The determined characteristics (e.g., defect type, perimeter, etc.) may be compared to one or more of a first set of constraints included in the first step of the received inspection plan. For example, the identified defect type may be compared to the defect type of a constraint in the first set of constraints. Additionally or alternatively, the identified perimeter (or environment) may be compared to the perimeter of a constraint in the first set of constraints. The first set of constraints may be indicative of expected characteristics of the first node. For example, if the first node is located on a blade of a turbine, the defect type of the constraint may be indicative of defects (e.g., cracks) commonly (or historically) found on the blade. If the first node is expected to be located on a portion of a machine, the perimeter of the constraint may be indicative of one or more machine components located on that portion of the machine. For example, a white thermal barrier coating may be expected to be present on a blade in a high pressure turbine section of a turbine engine.

[0026] Subsequent operations of the inspection apparatus may be based on a correlation between the determined one or more characteristics and the first set of constraints. The correlation may be indicative of how similar the determined characteristics are to the first set of constraints. For example, the first set of constraints may include image acquisition parameters (e.g., brightness, size of a feature / defect at the site in an image at the first node, etc.) associated with an inspection measurement of the first node. A characteristic of the received measurement data may be considered to correlate with the first set of constraints if a corresponding characteristic obtained from the inspection measurement data is within a predetermined range from the image acquisition parameters. In some implementations, the first set of constraints may be indicative of a type of defect. The analytical model may determine that the feature at the site is a defect and may assign a characteristic identifier that may be indicative of the defect type. The received measurement data may be considered to correlate with the first set of constraints if the characteristic identifier is similar to a characteristic identifier of a constraint in the first set of constraints.

[0027] The next action may include performing a new inspection of the first node (e.g., when the determined characteristics do not comply with the first set of constraints). For example, it may be desirable to perform a new measurement (e.g., repeat the first step of the inspection plan) when the detected defect type does not match the defect type of the constraint (or one of the defect types of the constraints) in the first set of constraints. In another example, it may be desirable to perform a new inspection of the first node when the detected perimeter does not match the perimeter of the constraint in the first set of constraints. The new inspection may be based on an updated set of operational parameters, which may be provided by a user or determined by an analytical model.

[0028] Alternatively, the next operation of the inspection apparatus may include executing a second step of the inspection plan. This may occur, for example, when the determined characteristic(s) comply with the first set of constraints. This may indicate that the inspection of the first node was performed as desired (e.g., performed with a predetermined accuracy), and inspection of the inspection site may proceed based on the inspection plan. Alternatively, a user may provide an input (e.g., via a GUI of the controller 204, computing device 206, etc.) that commands execution of the second step of the inspection plan (e.g., even if the determined characteristic does not comply with the first set of constraints).

[0029] In some implementations, a notification may be generated that includes the determined next operation of the inspection device. The notification may include an indication (e.g., a message) that the inspection of the first node has been successfully completed (e.g., when the determined characteristics of the inspection measurements comply with the first set of constraints). In some implementations, the notification may include an inspection summary, which may include the characteristics determined in step 108, the operating parameters and / or operating constraints included in the inspection plan (e.g., the first set of operating parameters / constraints). The notification may be provided to the operator / user. This may be done, for example, via a GUI display space in a computing device (e.g., a laptop, a tablet, the computing device 206, the controller 204, etc.). The notification may provide the user with an option to save one or more of the inspection data of the first node, the operating parameters / constraints of the inspection device associated with the inspection of the first node, and additional notes. Upon receiving an instruction from the user, a data file may be generated and stored (e.g., in a database such as the controller 204, the computing device 206, a cloud database, etc.) that includes the aforementioned data. The generated data file can be linked to the first node (e.g., as an icon having an indicator pointing to the first node) and provided to the user during inspection. For example, the data file can be presented as an icon in a GUI display space. The user can access the data file by clicking on the icon.

[0030] The notification may indicate that the inspection of the first node was not completed successfully (e.g., if the determined characteristics of the inspection measurement do not comply with the first set of constraints). The notification may identify the characteristics that did not meet the constraints (e.g., an unexpected defect type was detected, unexpected surroundings were detected, etc.). Additionally or alternatively, the notification may include recommendations for successfully completing the inspection of the first node (e.g., recommendations on the operating parameters of the inspection device for a new inspection of the first node). If the image of the first node is undesirable, the notification may include recommendations regarding the settings of the camera(s) / lighting device. For example, the recommendations may include moving the camera toward the first node (or zooming in the camera) and / or taking an image of the first node from a different location / orientation relative to the first node. The notification may be generated when an image recognition algorithm in the first analytical model determines that the image does not have sufficient resolution, when a larger image of the first node is desirable, when aspects of the defect in the first node are not clearly visible, etc. The notification may include moving the camera away from the first node (or zooming the camera out). The notification may be generated, for example, when an image recognition algorithm determines that an entire image of a defect in the first node has not been captured. The notification may include a recommendation to change the position / orientation of a lighting device in the inspection apparatus (e.g., when the defect is not sufficiently illuminated).

[0031] The notification may be presented via an interactive GUI display space in a user device (e.g., controller 204, computing device 206), which may enable both presentation of notifications to a user and receipt of user input. For example, a notification message may be displayed indicating that a first step of the test plan was completed successfully or unsuccessfully. Additionally or alternatively, test measurement characteristics that did not meet a first set of constraints and / or recommendations regarding operating parameters of the test device (e.g., for performing a new test of the first node) may be presented. The GUI display space may enable a user to provide one or more inputs. For example, a user may approve (e.g., after a notification indicating successful completion of the first step is presented in the GUI) to proceed to a second step of the test plan to test a second node in the test site. A user may provide operating parameter values ​​for operation of the test device (e.g., for performing a new test of the first node).

[0032] In some implementations, an updated set of operational parameters for the inspection apparatus may be determined (e.g., by the controller 204). The updated set of operational parameters may be associated with a new inspection of the first node. The updated set of operational parameters may be determined based on a comparison between determined characteristics of the received data (e.g., determined defect type) and the first set of constraints. The updated set of operational parameters may include updated position / orientation / focus parameters of a camera, updated position / orientation of a lighting device, etc. In one implementation, the updated set of operational parameters may be determined as part of the notification generation process described above (e.g., a notification including recommendations for operational parameters of a new inspection).

[0033] A second control signal may be generated (e.g., by the controller 204) that may instruct the inspection equipment to perform a next operation. The second control signal may instruct the inspection equipment to perform a second step of the inspection plan for inspection of the second node (e.g., upon determining that the first step is successfully completed). Alternatively, the second control signal may instruct the inspection equipment to perform a new inspection of the first node (e.g., based on inputs provided by a user, updated operating parameters, etc.).

[0034] Steps 102-108 may be repeated for various nodes of the inspection site. In some implementations, different analytical models may be used to analyze the inspection data associated with the various nodes. In some implementations, a given analytical model may be used to analyze the inspection data associated with multiple nodes. For example, a first analytical model may be associated with a first node, and a second analytical model may be associated with a second node. One or more analytical models (e.g., first / second analytical models) may be included in the inspection plan. The analytical models may be trained prior to deployment of the inspection plan by a training model. The training may be based on training data that may include historical data associated with the various nodes. The first analytical model may be trained (e.g., machine training) on ​​historical data (e.g., historical inspection measurements, operating parameters, constraints, etc.) associated with the first node (or a node similar to the first node). For example, if the first node is located on a motor in a given turbine, the training data may include historical data related to motors of the same or similar turbines. Additionally or alternatively, the analytical model may be trained during execution of the inspection plan (e.g., in real time). For example, the analytical model may be trained based on inspection data acquired during execution of the inspection plan, operating parameters / constraints in the inspection plan, etc.

[0035] 3 illustrates an exemplary embodiment of an inspection device (e.g., a non-destructive device) in the form of a borescope 300. The borescope 300 includes a control unit 302 (or controller 204), a conduit section 304, a bendable articulation section 306, and a head section 308. In one embodiment, the sections 304, 306, and 308 can have different lengths, be integral with one another, or be detachable with respect to one another. As illustrated, the conduit section 304 is suitable for insertion into a variety of targets, such as inside turbomachinery, equipment, pipes, conduits, underwater locations, curves, bends, inside and outside aircraft systems, etc.

[0036] The borescope 300 may include a probe driver 309 coupled to the conduit section 304. The probe driver 309 may include motors (not shown) configured to translate and / or rotate one or more of the sections 304, 306, 308 (e.g., to facilitate the probe head 308 being inserted into a target). Additionally or alternatively, an orientation / position of a portion of the head section 308 (e.g., camera, light source, etc.) may be changed to obtain an inspection area image (e.g., RGB image, IR image, etc.). The control unit 302 may include a control unit housing 310, a controller 312, a directional input 314, and a screen 316. The controller 312 may include a processor 318 and a readable memory 320 including computer readable instructions that may be executed by the processor 318 to operate the borescope 300. The computer readable instructions can include an inspection plan based on which the borescope 300 or portions thereof (e.g., the conduit section 304, the bendable articulation section 306, and the head section 308) can be translated / rotated (e.g., by the probe driver 309). In some implementations, the operation of the probe driver 309 can be based on control signals (e.g., signals generated by the controller 204 based on the inspection plan or based on user input, such as via a GUI display space on the screen 316 or a computing device).

[0037] The controller 312 may be communicatively coupled to the control unit 302 via one or more signals 321. The controller 312 may be disposed within the control unit housing 310 or may be disposed outside the control unit housing 310. The directional input 314 may be configured to receive user input (e.g., directional control) to the control unit 302 and operate the borescope 300. The screen 316 may display visual information being received by a camera (including a light sensor) disposed in the head section 308, such that a user may utilize the directional input 314 to better guide the borescope 300. The directional input 314 and the screen 316 may be communicatively coupled to the controller 312 via one or more signals 321, which may be wired or wireless signals (e.g., Wi-Fi or Bluetooth, etc.). In one implementation, inspection data and / or notifications (e.g., notifications based on the inspection data as described above) may be provided on the screen 316.

[0038] The conduit section 304 may include a tubular housing 322 that includes a proximal end 324 and a distal end 326. The tubular housing 322 may be a flexible member along its entire length or may be stiff at the proximal end 324 and more flexible moving along the length of the conduit section 304 toward the distal end 326. In certain embodiments, the tubular housing 322 may be formed from a non-porous material to prevent contaminants from entering the borescope 300 through the conduit section 304.

[0039] The control unit 302 may be disposed at a proximal end 324 of the tubular housing 322, while the bendable articulation section 306 may be disposed at a distal end of the tubular housing 322. The bendable articulation section 306 may include a bendable neck 328 and a washer 330. The bendable neck 328 may be disposed at the distal end 326 of the tubular housing 322, but may actuate 360° in the YZ plane. The bendable neck 328 may be encased in a non-porous material to prevent contaminants from entering the borescope 300 through the bendable articulation section 306.

[0040] The head section 308 may include a head assembly 332. The head assembly 332 may include one or more light sources 334 (e.g., LEDs or fiber optic bundles with lights at the proximal end), a camera 336 (or multiple cameras, such as a visible light camera, an infrared (IR) camera, etc.), and one or more sensors 338 that may be configured to collect data about the surrounding environment. The camera 336 of the borescope 300 may provide images and videos suitable for inspection to the screen 316 of the control unit 302. The light source 334 may be used to provide illumination when the head section 308 is disposed in a location having low or no light. The sensor 338 may record data such as temperature data, distance data, separation data (e.g., distance between rotating and stationary elements), flow rate data, etc.

[0041] In certain embodiments, the borescope 300 includes multiple interchangeable head assemblies 332. The head assemblies 332 can include tips having different optical properties, such as focal length, stereoscopic vision, three-dimensional (3D) phase view, shadow view, etc. Additionally or alternatively, the head section 308 can include removable and interchangeable portions of the head section 308. As such, the multiple head sections 308, bendable neck 328, and conduit section 304 can be provided in a variety of diameters, ranging from about 1 millimeter to 10 millimeters or more.

[0042] In use, the bendable articulation section 306 and the probe driver 309 may be controlled, for example, by control inputs (e.g., relative control gestures, physical manipulation devices) from the directional input 314 and / or by control signals generated by the controller 312. The directional input may be a joystick, D-pad, touchpad, trackball, optical sensor, or a touch screen on the screen 316. The directional input 314 may also be a similar device located outside the control unit housing 310 and connected by wired or wireless means. In particular, a set of control inputs may be used to control the bendable articulation section 306 and / or the probe driver 309. The bendable articulation section 306 may be steered, or "bent," in various dimensions, while the conduit section 304 may be translated and / or rotated using any combination of actuators and wires located within the control unit 302 to adjust the orientation (e.g., positioning) of the head section 308. In some implementations, the control / direction inputs 314 may be generated by a controller based on a test plan.

[0043] The actuators may be electrically, pneumatically, or ultrasonically operated motors or solenoids, shaped alloys, electroactive polymers, dielectric elastomers, polymer muscle materials, or other materials. For example, the bendable articulation section 306 and the probe driver 309 may enable movement of the head section 308 in the XY, XZ, and / or YZ planes. Indeed, the directional input 314 may be used to perform control operations suitable for disposing the head section 308 at various angles, such as the angle a shown. In this manner, the head section 308 may be positioned to visually inspect a desired position.

[0044] Once the head section 308 is in a desired position, the camera 336 may be operable, for example, to capture still or continuous visual images which may be displayed on a screen 316 of the control unit 302 and recorded by the borescope 300. In an embodiment, the screen 316 may be a multi-touch touch screen using capacitive, resistive, infrared grid, or the like technology to detect the touch of a stylus and / or one or more human fingers. Additionally or alternatively, the captured visual images may be transmitted to a separate storage device for later reference.

[0045] Certain exemplary embodiments are described herein to provide a general understanding of the principles of the structure, function, manufacture, and use of the systems, devices, and methods disclosed herein. One or more examples of these embodiments are shown in the accompanying drawings. Those skilled in the art will appreciate that the systems, devices, and methods explicitly described herein and illustrated in the accompanying drawings are non-limiting exemplary embodiments, and that the scope of the present invention is defined only by the claims. Features shown or described in connection with one exemplary embodiment may be combined with features of other embodiments. Such modifications and variations are intended to be included within the scope of the present invention. Furthermore, in this disclosure, similarly named components of the embodiments generally have similar characteristics, and therefore, each feature of each similarly named component within a particular embodiment is not necessarily described in full detail.

[0046] The subject matter described herein may be implemented in digital electronic circuitry, including the structural means disclosed herein and their structural equivalents, or in computer software, firmware, or hardware, or in a combination thereof. The subject matter described herein may be implemented as one or more computer program products, such as one or more computer programs tangibly embodied in an information carrier (e.g., in a machine-readable storage device) or embodied in a propagated signal for execution by or to control the operation of a data processing apparatus (e.g., a programmable processor, a computer, or multiple computers). Computer programs (also known as programs, software, software applications, or code) can be written in any form of programming language, including compiled or interpreted languages, and can be deployed in any form, such as as a stand-alone program or as a module, component, subroutine, or other unit suitable for use in a computing environment. A computer program does not necessarily correspond to a file. A program can be stored in a portion of a file that holds other programs or data, in a single file dedicated to the program, or in multiple coordinated files (e.g., files that store one or more modules, subprograms, or portions of code). A computer program can be deployed to be executed on one computer or on multiple computers at one site, or distributed across multiple sites and interconnected by a communications network.

[0047] The processes and logic flows described herein, including the method steps of the subject matter described herein, may be performed by one or more programmable processors executing one or more computer programs to perform functions of the subject matter described herein by operating on input data and generating output. The processes and logic flows may also be performed by special purpose logic circuitry, such as a field programmable gate array (FPGA) or an application-specific integrated circuit (ASIC), and apparatus of the subject matter described herein may be implemented as such special purpose logic circuitry.

[0048] Processors suitable for executing computer programs include, for example, both general purpose and special purpose microprocessors, as well as any one or more processors of any kind of digital computer. Typically, a processor will receive instructions and data from a read-only memory or a random access memory, or both. The essential elements of a computer are a processor for executing instructions and one or more memory devices for storing instructions and data. Typically, a computer also includes one or more mass storage devices for storing data, such as magnetic disks, magneto-optical disks, or optical disks, or is operatively coupled to receive data therefrom, transfer data thereto, or both. Information carriers suitable for embodying computer program instructions and data include all forms of non-volatile memory, including, by way of example, semiconductor memory devices (e.g., EPROM, EEPROM, and flash memory devices), magnetic disks (e.g., internal hard disks or removable disks), magneto-optical disks, and optical disks (e.g., CD and DVD disks). The processor and memory may be supplemented by, or incorporated in, special purpose logic circuitry.

[0049] To provide for interaction with a user, the subject matter described herein may be implemented on a computer having a display device, such as a CRT (cathode ray tube) or LCD (liquid crystal display) monitor, for displaying information to the user, as well as a keyboard and pointing device (e.g., a mouse or trackball) that the user may use to provide input to the computer. Other types of devices may also be used to provide interaction with a user. For example, feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback), while input from the user may be received in any form, including acoustic, speech, or tactile input.

[0050] The techniques described herein may be implemented using one or more modules. As used herein, the term "module" refers to computing software, firmware, hardware, and / or various combinations thereof. At a minimum, however, a module should not be interpreted as software that is not implemented on hardware, firmware, or on a non-transitory storage medium that is readable and recordable by a processor (i.e., a module is not software itself). In fact, a "module" should always be interpreted to include at least some physical non-transitory hardware, such as a processor or part of a computer. Two different modules may share the same physical hardware (e.g., two different modules may use the same processor and network interface). The modules described herein can be combined, integrated, separated, and / or replicated to support various applications. Also, functions described herein as being performed in a particular module may be performed in one or more other modules and / or by one or more other devices instead of or in addition to the functions performed in the particular module. Furthermore, modules may be implemented across multiple devices and / or other components, local or remote from each other. Additionally, modules may be moved from one device and added to another device and / or may be incorporated into both devices.

[0051] The subject matter described herein may be implemented in a computing system that includes back-end components (e.g., data servers), middleware components (e.g., application servers), or front-end components (e.g., client computers having a graphical user interface or web interface through which a user may interact with an implementation of the subject matter described herein), or any combination of such back-end, middleware, and front-end components. The components of the system may be interconnected by any form or medium of digital data communication, e.g., a communication network. Examples of communication networks include a local area network ("local area network, LAN") and a wide area network ("wide area network, WAN"), e.g., the Internet.

[0052] As used herein throughout the specification and claims, approximation language may be applied to modify any quantitative expression that may be permissibly varied without resulting in a change in the basic function to which it relates. Thus, values ​​modified by terms such as "about" and "substantially" are not limited to the exact value specified. In at least some instances, approximation language may correspond to the precision of the instrument for measuring the value. Combinations and / or interchanges of range limitations may be made herein throughout the specification and claims, but such ranges are identified and include all subranges contained therein unless the context or language dictates otherwise.

Claims

1. 1. A method executed by a programmable processor, comprising: receiving data characterizing a test plan associated with inspection of one or more nodes at an inspection site with an inspection device, the inspection site including an industrial device, a first step of the test plan using a first set of operating parameters of the inspection device associated with inspection of a first node of the one or more nodes and a first set of constraints associated with one or more inspection criteria at the first node with the inspection device; generating a first control signal configured to instruct the testing device to test the first node of the one or more nodes, the first control signal being based on one or more of the first set of operational parameters defining a position of the testing device relative to the first node of the industrial device during testing of the first node; receiving data collected during testing of the first node characterizing test measurements of the first node by the test device; determining one or more properties of the data characterizing the inspection measurement of the first node with a first analytical model, the first analytical model including an image recognition algorithm to extract the one or more properties from an image included in the data; comparing the one or more characteristics extracted from the image included in the data with the first set of constraints to determine a correlation between the one or more characteristics of the data and the first set of constraints, the correlation between the one or more characteristics of the data and the first set of constraints indicating how similar the one or more characteristics of the data are to the first set of constraints; generating a next operation of the inspection equipment based on the correlation between the one or more characteristics of the data and the first set of constraints to analyze defects of the first node of the industrial equipment.

2. 2. The method of claim 1, wherein determining the one or more characteristics comprises identifying one or more of a feature of a portion within the first node, a peripheral area associated with the first node, a mechanical portion of the inspection portion in which the first node is located, and an image acquisition parameter associated with the inspection measurement of the first node.

3. determining a defect type associated with a feature of the portion; comparing the defect types with defect types of constraints in the first set of constraints to generate a comparison result; determining the next operation of the inspection apparatus based on the comparison result; The method of claim 2 further comprising:

4. generating a notification including the next action; the notification includes one or more of: a test summary; and an indication that the results of the test of the first node comply with the first set of constraints or that the test of the first node should be repeated; the inspection summary includes one or more of the one or more characteristics, the first set of operational parameters, and the first set of constraints. The method according to claim 3.

5. determining an updated set of operational parameters for the inspection equipment associated with the inspection of the first node, the determination being based on the comparison between the defect types and defect types of the constraints. The method according to claim 4.

6. 6. The method of claim 5, further comprising the step of generating a second control signal based on the updated set of operating parameters, wherein the subsequent operation of the inspection apparatus is based on the second control signal.

7. presenting said notification to a user; receiving an input from the user in response to the notification; and generating a second control signal based on the input, wherein the next operation of the inspection apparatus is based on the second control signal; The method of claim 4 further comprising:

8. 8. The method of claim 7, wherein the next operation of the inspection equipment includes executing a second step of the inspection plan using a second set of operating parameters of the inspection equipment associated with inspection of a second node of the one or more nodes and a second set of constraints associated with inspection measurements at the second node by the inspection equipment.

9. receiving data characterizing the test measurement of the second node by the test device; determining, by one of the first analytical model and a second analytical model, one or more properties of the data characterizing the inspection measurement of the second node, wherein the subsequent operation of the inspection apparatus is based on a correlation between the one or more properties of the data and the second set of constraints; The method of claim 8 further comprising:

10. The method of claim 9 , wherein the first analytical model and the second analytical model are included in the inspection plan.

11. the first analytical model is trained during a training period that occurs prior to the inspection, the training period including receiving training data associated with the first analytical model, the training data including past inputs and outputs of the first analytical model; training the first analytical model based on one or more of the training data, the data characterizing the inspection measurements, and the inspection plan with a training model.

12. generating a data file including one or more of information associated with a feature of the portion within the first node, the first analytical model, data characterizing the inspection of the first node, and the first set of operational parameters; The method of any one of claims 2 to 11, further comprising:

13. presenting the first step of the inspection plan to a user; receiving a user input from a user, the first control signal being generated based on the user input; The method of claim 1 , further comprising:

14. 14. The method of claim 1, wherein the first control signal is generated based on the first set of operating parameters at the first step of the test plan.

15. The method of claim 1 , wherein the determined one or more characteristics include a surrounding area associated with the first node.

16. The method of claim 1 , wherein the first analytical model is based on the first set of constraints.

17. at least one data processor; a memory coupled to the at least one data processor, the memory providing to the at least one data processor: receiving data characterizing a test plan associated with inspection of one or more nodes at an inspection site with an inspection device, the inspection site including an industrial device, a first step of the test plan using a first set of operating parameters of the inspection device associated with inspection of a first node of the one or more nodes and a first set of constraints associated with one or more inspection criteria at the first node with the inspection device; generating a first control signal configured to instruct the testing device to test the first node of the one or more nodes, the first control signal being based on one or more of the first set of operational parameters defining a position of the testing device relative to the first node of the industrial device during testing of the first node; receiving data collected during testing of the first node characterizing test measurements of the first node by the test device; determining one or more properties of the data characterizing the inspection measurement of the first node with a first analytical model, the first analytical model including an image recognition algorithm to extract the one or more properties from an image included in the data; comparing the one or more characteristics extracted from the image included in the data with the first set of constraints to determine a correlation between the one or more characteristics of the data and the first set of constraints, the correlation between the one or more characteristics of the data and the first set of constraints indicating how similar the one or more characteristics of the data are to the first set of constraints; generating a next operation of the inspection apparatus based on the correlation between the one or more characteristics of the data and the first set of constraints to analyze the first node of the industrial equipment for defects; A system comprising:

18. 20. The system of claim 17, wherein determining the one or more characteristics comprises identifying one or more of a feature of a site within the first node, a peripheral area associated with the first node, a mechanical portion of the inspection site in which the first node is located, and an image acquisition parameter associated with the inspection measurement of the first node.

19. The operation includes: determining a defect type associated with a feature of the portion; comparing the defect types with defect types of constraints in the first set of constraints to generate a comparison result; 20. The system of claim 18, further comprising: determining the next operation of the inspection device based on the comparison.

20. 1. A computer program product stored on a non-transitory machine-readable medium, the computer program product comprising instructions, when executed by at least one programmable processor having at least one physical core and a plurality of logical cores, causing the at least one programmable processor to: receiving data characterizing a test plan associated with inspection of one or more nodes at an inspection site with an inspection device, the inspection site including an industrial device, a first step of the test plan using a first set of operating parameters of the inspection device associated with inspection of a first node of the one or more nodes and a first set of constraints associated with one or more inspection criteria at the first node with the inspection device; generating a first control signal configured to instruct the testing device to test the first node of the one or more nodes, the first control signal being based on one or more of the first set of operational parameters defining a position of the testing device relative to the first node of the industrial device during testing of the first node; receiving data collected during testing of the first node characterizing test measurements of the first node by the test device; determining one or more properties of the data characterizing the inspection measurement of the first node with a first analytical model, the first analytical model including an image recognition algorithm to extract the one or more properties from an image included in the data; comparing the one or more characteristics extracted from the image included in the data with the first set of constraints to determine a correlation between the one or more characteristics of the data and the first set of constraints, the correlation between the one or more characteristics of the data and the first set of constraints indicating how similar the one or more characteristics of the data are to the first set of constraints; generating a next operation of the inspection equipment based on the correlation between the one or more characteristics of the data and the first set of constraints to analyze the first node of the industrial equipment for defects.

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