Disparity information generating device and disparity information generating method

Abstract

A parallax information generation device (1) comprises: a phase image generation unit (41) that generates a relative phase image (Q1) from a phase shift image based on projection of phase shift pattern light (Q0); a code image segmentation processing unit (42) that performs region segmentation for each cycle of the phase shift pattern light (Q0) on the basis of a progression generated from code values imparted to each pixel of a binary pattern image based on projection of binary pattern light; and a parallax information generation unit (43) that generates parallax information on the basis of the relative phase image and a result of the region segmentation. The binary pattern light is formed from a progression in which 2n types of code values different from each other are allocated according to the combination of n rays of binary pattern light, and is allocated with code values different from each other at each of cycle boundaries of the phase shift pattern light.

Description

[Technical field]

[0001] The present disclosure relates to a disparity information generating device and a disparity information generating method. [Background technology]

[0002] A known three-dimensional measurement technique is the phase shift method, in which a spatially intensity-modulated sinusoidal pattern is projected and the spatial domain phase value is calculated for each pixel.

[0003] For example, Patent Document 1 discloses an appearance inspection device that processes a phase shift image projected by a light projection control means based on a phase shift method and captured by an imaging means, and processes a spatial code image projected by a light projection control means based on a spatial coding method and captured by an imaging means, and combines the processing results of the phase shift image and the spatial code image to generate a distance image.

[0004] In addition, a spatial code pattern (Gray code) is additionally projected to resolve the ambiguity of the phase value in the phase shift method.

[0005] For example, Patent Document 2 discloses a three-dimensional measurement system in which a projection unit projects a gray code pattern image and a phase shift pattern image onto the measurement object, an imaging unit captures images of the measurement object onto which the gray code pattern image is projected and the measurement object onto which the phase shift pattern image is projected, and disparity image data and point cloud data representing a three-dimensional shape are generated based on the captured image data. [Prior art documents] [Patent documents]

[0006] [Patent Document 1] Patent No. 6334861 [Patent Document 2] JP 2020-41822 A Summary of the Invention [Problem to be solved by the invention]

[0007] In the phase shift method, in order to improve the measurement accuracy, it is necessary to perform the measurement using a sine wave pattern with a high spatial frequency.

[0008] However, in the case of the method using a time-series code as shown in Patent Document 2, there is a problem in that the number of spatial code patterns to be additionally projected increases as the spatial frequency increases, which lengthens the calculation time for one frame.

[0009] The technology of the present disclosure has been made in consideration of the above points, and has an object to provide a disparity information generating device in which the calculation time for one frame is shorter than that of a conventional method using a time-series code. [Means for solving the problem]

[0010] In order to solve the above problem, a parallax information generating device according to an embodiment of the present disclosure includes a projection unit that projects a plurality of phase-shift pattern lights having periodicity and n pieces of binary pattern lights (n is an integer equal to or greater than 2) onto a measurement object, an imaging unit that images the measurement object, a phase image generating unit that generates a phase image from a phase shift image obtained by imaging the measurement object onto which the plurality of phase-shift pattern lights are projected, a code image division processing unit that assigns a code value to each pixel of the binary pattern image obtained by imaging the measurement object onto which the plurality of binary pattern lights are projected, and performs area division based on a number sequence generated from the code values, and a parallax information generating unit that generates parallax information based on the phase image and a result of the area division, wherein the binary pattern light projected from the projection unit is configured to form a number sequence in which 2n types of mutually different code values ​​are assigned to each period of the phase-shift pattern light by combining n pieces of binary patterns, and different code values ​​are assigned at boundaries of periods of the phase-shift pattern light. Effect of the Invention

[0011] According to the present disclosure, the periodicity of a sine wave pattern can be estimated with a smaller number of projections than conventional methods using time-series codes, thereby reducing the calculation time for one frame and enabling faster processing. [Brief description of the drawings]

[0012] [Figure 1] A schematic diagram showing how pattern light is projected onto a measurement target and how it is captured. [Diagram 2] FIG. 1 is a block diagram showing a configuration example of a disparity information generating device. [Diagram 3] FIG. 1 is a diagram showing an example of a flow of binary pattern light and area division processing. [Figure 4] A diagram showing the number of binary pattern lights when the periodic number is 24 or less. [Diagram 5] Flowchart showing an example of operation of the disparity information generating device [Figure 6] Illustration of conversion from a captured image to a binary image [Figure 7] FIG. 1 is an explanatory diagram of a modified example of the present embodiment. [Figure 8] FIG. 13 is an explanatory diagram of another modified example of the present embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0013] Hereinafter, the embodiments of the present disclosure will be described in detail with reference to the drawings. The following description of the embodiments is essentially merely illustrative and is not intended to limit the present invention, its application, or its uses. In other words, the numerical values, shapes, components, arrangement positions and connection forms of the components shown in the following embodiments are merely examples and are not intended to limit the present disclosure. Therefore, among the components in the following embodiments, components that are not described in the independent claims showing the highest concept of the present disclosure will be described as optional components.

[0014] The disparity information generating device according to the present disclosure uses a phase shift method, in which a sinusoidal light pattern that is spatially intensity modulated is projected and a phase value in the spatial domain is calculated for each pixel, as described above.

[0015] The parallax information generating device of the present disclosure is characterized in that the number of spatial code patterns (gray codes) projected to resolve ambiguity in phase values ​​in the phase shift method can be reduced compared to the conventional technology. As a result, as described above, the calculation time for one frame can be shortened, and processing speed can be increased.

[0016] In the following, in order to facilitate understanding of the contents, an overview of the phase shift method will be described, and then the configuration and operation of the disparity information generating device 1 will be specifically described.

[0017] <About the phase shift method> The phase shift method is a three-dimensional measurement technique in which multiple phase-shifted pattern lights that are spatially intensity-modulated and have periodicity are projected onto the object to be measured, and the spatial domain phase value is calculated for each pixel.

[0018] As the periodic phase-shifted pattern light Q0, for example, a sinusoidal pattern is projected with the phase shifted by π / 2. Specifically, in the following equation (1), a total of four measurements (l=1, 2, 3, 4) are performed.

[0019]

number

[0020] In equation (1), A(x) is the amplitude of the sine wave pattern, Φs(x) is the phase value of the sine wave pattern, and O(x) is the amount of ambient light.

[0021] Then, Φs(x) is calculated from the measured values ​​I0-I3 using the following equation (2).

[0022]

number

[0023] Furthermore, using the following equation (3), the distance d(x) can be calculated by triangulation from the phase value Φs(x) calculated by the above equation (2).

[0024]

number

[0025] In equation (3), b is the baseline length between the projection unit 2 and the imaging unit 3, f is the focal length, and ωs is the spatial frequency. In equation (3), the denominator on the right side indicates the parallax value.

[0026] As described above, in the phase shift method, the phase difference (relative value) is repeated in a cycle of 2π. Therefore, by finding the number of periods (region number) k of the phase value, the ambiguity of the phase value can be resolved, and the disparity D can be found from the absolute phase φ' shown in the following formula (4) using formula (5). In other words, the value of each pixel is expressed as a relative value indicating how much it is shifted, and the region number k is By using this, the absolute phase value can be obtained.

[0027]

number

[0028]

number

[0029] As a method for identifying the region number k, there is a method of additionally projecting a Gray code pattern. In the conventionally known Gray code method, as shown in, for example, Patent Document 2, a process is executed in which a time-series black and white pattern is projected onto a measurement target and a camera pixel is associated with the region number k. As described above, in the conventional technology, when the number of periods of a sine wave pattern to be projected is K, it is necessary to project "log2K" Gray code patterns. Therefore, there is a problem that the number of projections increases with an increase in the number of periods K (see the comparative example in FIG. 4). In contrast, the disparity information generating device 1 of the present disclosure is characterized in that it is possible to estimate the number of periods of a sine wave pattern with a smaller number of projections than the conventional method using a time-series code.

[0030] A specific description will be given below while showing a configuration example of the disparity information generating device 1.

[0031] <Parallax information generation device> Fig. 1 is a schematic diagram showing an example of the arrangement of a projection unit 2 that projects pattern light onto a measurement target G and an imaging unit 3 that captures the measurement target G. Fig. 2 is a block diagram showing an example of the configuration of the parallax information generating device 1.

[0032] 2, the disparity information generating device 1 includes a projection unit 2, an imaging unit 3, and a calculation unit 4. The calculation unit 4 includes a phase image generation unit 41, a code image division processing unit 42, and a disparity information generation unit 43.

[0033] -Projection section- The projection unit 2 projects a plurality of periodic phase shift pattern lights Q0 and n (n is an integer equal to or greater than 2) binary pattern lights PT onto the measurement target G. The projection unit 2 can be realized, for example, by a projection method of a general projector, and a DMD (Digital Micromirror Device), LCD (Liquid Crystal Display), LCOS (Liquid Crystal on Silicon), etc. can be used.

[0034] For example, when the periodic number K is 24, the projection unit 2 projects four phase shift pattern lights, two binary pattern lights PT, and one full-light pattern light as the projection patterns onto the measurement target G. The imaging unit 3 also acquires four phase shift pattern images, two binary pattern images, one full-light pattern image, and one ambient light image during exposure. The projection unit 2 projects the above images while sequentially switching between the pattern lights during projection and exposure. Here, the full-light pattern light is an image in which the projection unit 2 is turned on and the same amount of light is irradiated onto the entire measurement target G. The ambient light is a pattern in which the projection unit 2 is turned off. In other words, the ambient light image is an image exposed when the projection unit 2 is turned off.

[0035] As described above, the phase-shifted pattern light is projected by shifting the phase of the sine wave pattern by π / 2 and switching it sequentially.

[0036] The binary pattern light is a pattern light for phase unwrapping, and is configured to form a sequence in which 2n different code values ​​are assigned to each period T of the phase shift pattern light by combining n (n is an integer of 2 or more) binary patterns. For ease of explanation, the period T is divided into regions, and each region is assigned a number kx (x=0, 1, 2, ...) for explanation.

[0037] For example, the binary light pattern is configured so that, when n binary patterns are aligned and superimposed on each other, a sequence is formed in which 2n different code values ​​are assigned to each period T of the phase shift light pattern.

[0038] FIG. 3 shows an example in which the binary pattern light PT is composed of two sheets of a first pattern PT1 and a second pattern PT2. For example, a code value of "0" is assigned to a position where PT1=black and PT2=black, a code value of "1" is assigned to a position where PT1=black and PT2=white, a code value of "2" is assigned to a position where PT1=white and PT2=white, and a code value of "3" is assigned to a position where PT1=white and PT2=black. Then, in the example of FIG. 3, four different code values ​​of "0123" are assigned to the area k0. Similarly, four different code values ​​are assigned to each area k, such as "2031" to the area k1, "3012" to the area k2, and "1203" to the area k3. In the following description, a code block composed of four different code values ​​may be referred to as a "code string". Note that multiple pixels may be included in one digit of the code (see Q2 in FIG. 3).

[0039] The binary pattern light is configured such that different code values ​​are assigned to the boundaries of the phase shift pattern light Q0 (relative phase image Q1), i.e., the boundaries of each region k (between code strings). For example, in the example of Fig. 3, a different code value of "3-2" is assigned to the boundary between region k0 and region k1. Similarly, different code values ​​are assigned, such as "1-3" to the boundary between region k1 and region k2, "2-1" to the boundary between region k2 and region k3, and "3-0" to the boundary between region k3 and region k4.

[0040] Also, it is preferable that different code strings are assigned to all the regions. For example, when the periodic number K of the phase shift pattern light Q0 (hereinafter simply referred to as the periodic number K) is 24, it is preferable to assign different code strings to the 24 regions k.

[0041] Fig. 4 shows the number of binary light pattern PT when the period number K is 24 or less. In Fig. 4, an example of this embodiment is shown by a solid line, and a comparative example using a time series code is shown by a dashed line. As shown in Fig. 4, in the comparative example, the number of binary light pattern PT projections increases with an increase in the period number K. On the other hand, in this embodiment, the number of binary light pattern PT projections may be two when the period number K is in the range of K≦24.

[0042] Specifically, the number of periods K of the phase shift light pattern Q0 and the number n of the binary light patterns PT satisfy the relationship of the following formula (6).

[0043]

number

[0044] - Imaging section - The imaging unit 3 captures an image of the measurement target G, and is, for example, a camera.

[0045] During imaging and exposure, when a plurality of phase shift pattern light Q0 are sequentially switched and projected from the projection unit 2 onto the measurement target G, the imaging unit 3 captures the measurement target G onto which each phase shift pattern light Q0 is projected, and outputs the captured images as phase shift images to the phase image generating unit 41. For example, when four phase shift pattern light Q0 are projected from the projection unit 2 with the phase shifted by π / 2 each, the imaging unit 3 outputs four phase shift images corresponding to the respective phase shift pattern light Q0 to the phase image generating unit 41.

[0046] Furthermore, the imaging unit 3 captures an image of the measurement target G onto which the binary pattern light PT is projected, and outputs the image as a binary pattern image to the code image segmentation processing unit 42. Specifically, when n sheets of binary pattern light PT are projected from the projection unit 2 onto the measurement target G by sequential switching, the imaging unit 3 captures an image of the measurement target G onto which each binary pattern light PT is projected, and outputs the image as a binary pattern image to the code image segmentation processing unit 42. For example, when two sheets of binary pattern light PT1, PT2 are projected from the projection unit 2, the imaging unit 3 outputs two binary pattern images corresponding to the respective binary pattern light PT1, PT2 to the code image segmentation processing unit 42.

[0047] - Imaging section - The calculation unit 4 is configured with, for example, a CPU (processor) and a memory that stores a program for operating the CPU and processing results of the CPU. That is, the calculation unit 4 includes a program that realizes the functions of the phase image generation unit 41, the code image division processing unit 42, and the disparity information generation unit 43. Note that some or all of the functions of the phase image generation unit 41, the code image division processing unit 42, and the disparity information generation unit 43 may be realized by a hardware circuit or the like.

[0048] [Phase image generation unit] The phase image generating unit 41 generates a phase image based on a plurality of phase shift images captured by the imaging unit 3. For example, as described above, when four phase shift images are output from the imaging unit 3, a relative phase image Q1 (see FIG. 5) is generated based on the four phase shift images.

[0049] [Code image division processing section] The code image division processing unit 42 assigns a code value to each pixel of n binary pattern images captured by the imaging unit 3. Specifically, as shown in FIG. 6, an ambient light image captured under ambient light is subtracted from the binary pattern image, and the subtraction result is converted into a binary image. Then, a binary image PR1 of the binary pattern image captured when the first pattern PT1 is projected and a binary image PR2 of the binary pattern image captured when the second pattern PT2 is projected are combined to assign a code value. The code value assignment rule is the same as that of the projection pattern of the projection unit 2 described above. For example, a code value of "0" is assigned to pixels where PR1=black and PR2=black, a code value of "1" is assigned to pixels where PR1=black and PR2=white, a code value of "2" is assigned to pixels where PR1=white and PR2=white, and a code value of "3" is assigned to positions where PR1=white and PR2=black. Then, an image (code image) of a sequence as shown in FIG. 3 and FIG. 5 is obtained. In other words, a unique sequence of numbers composed of code values ​​is obtained. Although not specifically shown, the code image is also deformed into an arc shape in the region in which the measurement target G is imaged, as in the relative phase image Q1.

[0050] Then, the code image division processing unit 42 executes an area division process for dividing the area based on the sequence generated from the assigned code value. Specifically, as shown in Q2 of Fig. 3, the area division process searches for the boundary of area k from the sequence constituting each row. Then, for example, the boundary between area k1 and area k2 is recognized at the position shown by the dashed line in Q2 of Fig. 3.

[0051] [Disparity information generation unit] The parallax information generating unit 43 generates parallax information based on the phase image generated by the phase image generating unit 41 and the result of the region division obtained by the code image division processing unit 42 (hereinafter, referred to as region division information Q3). Fig. 3 shows an example of the region division information Q3.

[0052] The parallax information generated by the parallax information generating unit 43 is used to calculate distance by triangulation. An example of a formula for calculating parallax is given in the above-mentioned "Phase shift method".

[0053] <Operation of the disparity information generating device> Here, the operation of the disparity information generating device 1 will be described with reference to the flowchart in FIG.

[0054] -Step S1- In step S1, a full-light pattern light is projected from the projection unit 2 onto the measurement target G, and in this state, the measurement target G is photographed using the imaging unit 3 to obtain a full-light image. Also, the measurement target G is photographed under ambient light using the imaging unit 3 to obtain an ambient light image. The full-light image and the ambient light image are output to the code image division processing unit 42 for use in binarization processing and the like.

[0055] -Step S2- In step S2, the projection unit 2 projects a plurality of phase-shifted pattern lights having periodicity onto the measurement target G, and the imaging unit 3 captures the state to obtain the above-mentioned phase shift image. For example, the projection unit 2 sequentially switches and projects four phase-shifted pattern lights Q0, each having a phase shift of π / 2, onto the measurement target G, and the imaging unit 3 captures four phase-shifted images corresponding to the respective phase-shifted pattern lights Q0 and outputs them to the phase image generating unit 41.

[0056] -Step S3- In step S2, n pieces of binary light patterns are projected from the projection unit 2 onto the measurement target G, and the state is photographed by the imaging unit 3 to obtain the above-mentioned binary pattern image. For example, the projection unit 2 sequentially switches between projecting two pieces of binary light patterns PT (a first pattern PT1 and a second pattern PT2) onto the measurement target G, and the imaging unit 3 photographs two binary pattern images corresponding to the respective binary light patterns PT, and outputs them to the code image division processing unit 42.

[0057] -Step S4- In step S4, the phase image generating unit 41 performs a relative phase calculation based on a plurality of phase shift images captured by the imaging unit 3. Specifically, for example, a relative phase image Q1 is generated based on four phase shift images. In other words, the phase image generating unit 41 executes a process of generating a relative phase image Q1 based on a plurality of phase shift images that are images captured by the imaging unit 3 when the projection unit 2 sequentially switches between a plurality of phase shift pattern lights Q0.

[0058] -Step S5- In step S5, the code image division processing unit 42 executes binarization processing and coding processing. Specifically, the above-mentioned ambient light image is subtracted from the binary pattern image, the subtraction result is converted into a binary image, and a code value is assigned to each pixel to generate a code image. The method of assigning the code value is as described above.

[0059] The specific method of the binarization process is not particularly limited. For example, the threshold value may be set to the average value of two images, the full light image and the ambient light image.

[0060] -Step S6- In step S6, the code image division processing unit 42 executes an area division process for dividing an area based on a sequence generated from the assigned code value. By executing the area division process, area division information Q3 is generated. Specifically, the above-mentioned area division process is executed. Here, the code image division processing unit 42 may extract edge information from the ambient light image to be used for correction during area division.

[0061] In other words, in steps S5 and S6, the code image division processing unit 42 executes a process of assigning a code value to each pixel of n binary pattern images, which are images of the measurement target G onto which n binary pattern light PT are projected by the projection unit, captured by the imaging unit 3, and dividing the area for each period of the phase shift pattern light Q0 based on a sequence generated from the code values. The processes of steps S5 and S6 correspond to the code image division process.

[0062] The process of step S4 and the process of step S5 and / or step S6 can be executed in parallel. By executing such multi-processing, the process speed can be increased. It can be realized.

[0063] -Step S7- In step S7, disparity information is generated based on the relative phase image Q1 generated in step S4 and the result of the area division in step S6 (area division information Q3). The process in step S7 corresponds to disparity information generation processing.

[0064] As described above, in this embodiment, the binary pattern light projected from the projection unit 2 is configured to form a sequence in which 2n different code values ​​are assigned to each period of the phase shift pattern light Q0 by combining n binary patterns, and different code values ​​are assigned at the boundaries of the periods of the phase shift pattern light Q0.

[0065] This makes it possible to estimate the periodicity of a sine wave pattern with a smaller number of projections than with conventional methods that use time-series codes, thereby shortening the calculation time for one frame and enabling faster processing.

[0066] <Other embodiments> The present disclosure is not limited to the above-described embodiment, and various modifications are possible without departing from the spirit of the present disclosure.

[0067] For example, the code image division processing unit 42 may estimate, as a shadow region, an area where the difference between the luminance value of the aforementioned binary pattern image and the luminance value of the aforementioned ambient light image is equal to or less than a predetermined value, and exclude pixels contained in the shadow region from the boundary search targets in the region division processing.

[0068] FIG. 7 is an explanatory diagram of a modified example of this embodiment. In the example of FIG. 7, an area (hereinafter, referred to as a shadow area) where the pattern light output from the projection unit 2 is not projected is formed on the side of the measurement target G (see the diagonal lines in FIG. 7). It is assumed that the binary pattern light PT output from the projection unit 2 cannot be observed in the shadow area. Also, the shadow area is an area where the projected light does not hit when the pattern light is projected from the projection unit 2, so the observed luminance value does not change. Therefore, the code image division processing unit 42 may estimate an area where the difference between the luminance value of the binary pattern image and the luminance value of the ambient light image is equal to or less than a predetermined threshold value as a shadow area, and may skip the shadow area when searching for the area division processing.

[0069] In the example of Figure 7, the column marked "Code" shows how the binary pattern light PT is hitting the object with a code, and the column marked "Observation" shows a code value based on the binary pattern image. Additionally, the area marked with an "x" is estimated to be a shadow area. In this example, the area marked with an "x" is excluded from the search target in the area division process. This can speed up the process.

[0070] For example, in the above-mentioned region division process, the code image division processing unit 42 may (1) estimate a blocked region of the binary pattern image based on the sequence data of the binary pattern light PT, and (2) determine a boundary of region division in the blocked region based on edge information of the measurement target G in the binary pattern image. The blocked region is an imaging range blocked by the measurement target G.

[0071] For example, in the example of Fig. 8, as in Fig. 7, the column marked "Code" shows a code indicating how the binary pattern light PT is shining, and the column marked "Observation" shows a code value based on the binary pattern image. The underlined portion of the column marked "Observation" is the occluded area. As shown in Fig. 8, in this example, there is a risk that the observed boundary position recognized in the area division process will be a position that is shifted from the true boundary position (marked "Boundary before occluded area estimation" in Fig. 8).

[0072] Therefore, the code image division processing unit 42 estimates the occlusion area by the measurement target G in the binary pattern image based on the sequence data of the binary pattern used in the binary pattern light PT. Specifically, in the example of FIG. 8, the sequence of the binary pattern projected from the projection unit 2 is "2130103201", so it is understood that there is no "1" between the "0" of the fourth code from the left and the "0" of the sixth code. In this way, the code image division processing unit 42 estimates that there is an occlusion area between the "0" of the fourth code from the left and the "0" of the sixth code in the observation code. Then, if a sequence different from the appropriate sequence is found, the boundary is determined based on the edge information, and the search for the region division processing is continued again. In FIG. 8, the boundary after the estimation of the occlusion area is described as "boundary after estimating the occlusion area".

[0073] Thereafter, the code image division processing unit 42 may determine the boundary of the division of the region in the occluded region based on the edge information of the measurement target G and the entire scene acquired from the ambient light image. The method of detecting the edge information of the measurement target G is not particularly limited, and any conventionally known method can be used. This makes it possible to execute the division (search) process while minimizing the positional deviation caused by the formation of the occluded region. [Industrial Applicability]

[0074] The disparity information generating device of the present disclosure is extremely useful since it can reduce the calculation time for one frame and achieve high-speed processing. [Explanation of symbols]

[0075] 1 Parallax information generation device 2 Projection section 3. Imaging unit 4 Arithmetic section 41 Phase image generator 42 Code image division processing unit 43 Parallax information generation unit G Measurement target Q0 Phase shift pattern light Q1 Relative phase image

Claims

1. a projection unit that projects a plurality of periodic phase shift pattern light beams and n (n is an integer of 2 or more) binary pattern light beams onto a measurement target; an imaging unit that captures an image of the measurement target; a phase image generating unit that generates a relative phase image from a plurality of phase shift images, which are images of the measurement target onto which the plurality of phase shift pattern light beams are projected, captured by the imaging unit; a code image division processing unit that assigns a code value to each pixel of n binary pattern images, which are images of the measurement target onto which the n binary pattern light is projected, captured by the imaging unit, and divides an area into each period of the phase shift pattern light based on a sequence of numbers generated from the code values; a parallax information generating unit that generates parallax information based on the relative phase image and a result of the region division, the binary pattern light projected from the projection unit is configured to form a sequence in which 2n kinds of different code values ​​are assigned to each period of the phase shift pattern light by combining the n binary pattern light, and different code values ​​are assigned at boundaries of periods of the phase shift pattern light. Parallax information generation device.

2. The parallax information generating device according to claim 1 , wherein a periodicity K of the phase shift pattern light and a number n of the binary pattern light satisfy the following relational expression: K=n (n+k) / n=1 (n+n) / n. [0010]

3. 2. The disparity information generating device according to claim 1, wherein the code image segmentation processing unit estimates, as a shadow region, a region in which a difference between a luminance value of the binary pattern image and a luminance value of an ambient light image captured by the imaging unit under ambient light is equal to or less than a predetermined threshold, and excludes pixels included in the shadow region from targets for searching for boundaries in the region segmentation.

4. 4. The parallax information generating device according to claim 1, wherein, in the region division, the code image division processing unit estimates a blocked region, which is an imaging range blocked by the measurement object in the binary pattern image, based on the binary pattern light, and determines a boundary of the region division in the blocked region based on edge information of the measurement object in the binary pattern image.

5. a first step of capturing images of the measurement target onto which a plurality of phase-shift pattern light beams are projected by a projection unit, using an imaging unit, and generating a relative phase image from the captured images, which are the plurality of phase-shift images, in a calculation unit; a second step of photographing the measurement target onto which n (n is an integer equal to or greater than 2) binary pattern light has been projected by the projection unit, using the imaging unit, and in a calculation unit, assigning a code value to each pixel of the n binary pattern images, which are the photographed images, and performing area division based on a sequence of numbers generated from the code values; a third step of generating, in a calculation unit, disparity information based on the relative phase image and a result of the region division; the binary pattern light projected from the projection unit is configured to form a sequence in which 2n different code values ​​are assigned to each period of the phase shift pattern light by combining n binary patterns, and different code values ​​are assigned at boundaries of periods of the phase shift pattern light.

6. 6. The parallax information generating method according to claim 5, wherein the first step of generating the relative phase image from the plurality of phase shift images and the second step of assigning the code value to each pixel of the n binary pattern images and performing area division based on a sequence generated from the code value are performed in parallel.

Images