Analysis device, analysis method, and analysis program

Abstract

To provide an analysis device with which it is possible to easily refer to data with which the manufacturing history data of a plurality of processes is associated in each point of a sheet.SOLUTION: The analysis device is constituted to comprise a data acquisition unit 101, a position identification unit 102, and a map display unit 103. The data acquisition unit 101 acquires the manufacturing history data of a plurality of processes when manufacturing a sheet. The position identification unit 102 associates manufacturing history data the positions of which in the long-side direction on the sheet are the same in the plurality of processes. The map display unit 103 displays, at the corresponding position on a map that indicates the sheet, manufacturing history data the positions of which in the long-side direction are the same, in association with each other.SELECTED DRAWING: Figure 14

Description

[Technical Field]

[0001] The present invention relates to visualization of a manufacturing history, and more particularly to visualization of a manufacturing history of a sheet product. [Background technology]

[0002] Sheet products are manufactured by repeatedly unrolling the sheet, subjecting it to surface treatment and heat treatment in each device through which it passes, and then storing it as a roll. When a sheet product is manufactured in this manner through multiple manufacturing processes, it is often difficult to determine the manufacturing condition history of the location where the abnormality occurred. Therefore, technologies for comparing data acquired in multiple processes have been investigated. Patent Documents 1 and 2, for example, disclose such technologies for comparing data acquired in multiple processes.

[0003] The foreign matter inspection method of Patent Document 1 relates to a method for determining whether foreign matters detected in multiple inspection processes in a sheet product are the same. In the foreign matter inspection method of Patent Document 1, foreign matters detected in each inspection process are displayed on a map based on the coordinates in the long side direction of the sheet, and whether the areas where the foreign matters exist overlap is used to determine whether they are the same foreign matter. In addition, the quality monitoring system for sheet products of Patent Document 2 manages the position of defects calculated from the unwinding length by associating it with data on the operating status of the manufacturing equipment. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Publication No. 2019-191127 [Patent Document 2] Japanese Patent Application Laid-Open No. 2010-70386 Summary of the Invention [Problem to be solved by the invention]

[0005] However, the technology of Patent Document 1 is insufficient in the following respects. While the technology of Patent Document 1 determines whether foreign objects detected in each inspection process are the same, workers must search and compare historical data on manufacturing conditions at the location where the foreign object was detected for each process, which can require complex and extensive work. Furthermore, the technology of Patent Document 2 also associates data on the operating status of the equipment with inspection data, but is unable to associate how the historical data on the operating status of the equipment changed at the time the foreign object was detected. Therefore, the technologies of Patent Documents 1 and 2 are insufficient as technologies for examining historical data on manufacturing conditions for each process at the location where an abnormality was detected when an abnormality occurred.

[0006] In order to solve the above-mentioned problems, the present invention aims to provide an analysis device etc. that can easily refer to data that associates manufacturing history data of multiple processes at each location on a sheet. [Means for solving the problem]

[0007] In order to solve the above problems, the analysis device of the present invention includes a data acquisition unit, a position identification unit, and a display unit. The data acquisition unit acquires manufacturing history data for a plurality of processes when manufacturing a sheet. The position identification unit associates manufacturing history data that are located at the same position in the long side direction of the sheet between the plurality of processes. The display unit displays the manufacturing history data that are located at the same position in the long side direction in association with each other at corresponding positions on a map showing the sheet.

[0008] The solution of the present invention acquires manufacturing history data for a plurality of processes when manufacturing a sheet. The solution of the present invention associates manufacturing history data for the same positions in the long side direction of the sheet between the plurality of processes. The solution of the present invention displays the manufacturing history data for the same positions in the long side direction in association with each other at corresponding positions on a map showing the sheet.

[0009] The analysis program of the present invention causes a computer to execute a process of acquiring manufacturing history data for a plurality of processes when manufacturing a sheet. The analysis program of the present invention causes a computer to execute a process of associating manufacturing history data that are located at the same position in the long side direction of a sheet between a plurality of processes. The analysis program of the present invention causes a computer to execute a process of associating and displaying manufacturing history data that are located at the same position in the long side direction of the sheet at corresponding positions on a map showing the sheet. [Effects of the Invention]

[0010] According to the present invention, it is possible to easily refer to data that associates manufacturing history data for a plurality of processes at each location on the sheet. [Brief explanation of the drawings]

[0011] [Figure 1] 1 is a diagram illustrating an outline of the configuration of a first exemplary embodiment of the present invention. [Figure 2] 1 is a diagram illustrating a configuration of an analysis device according to a first embodiment of the present invention. [Figure 3] FIG. 3 is a diagram showing an operation flow of the analysis device according to the first embodiment of the present invention. [Figure 4] FIG. 2 is a diagram illustrating an example of data processing in the first embodiment of the present invention. [Figure 5] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 6] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 7] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 8] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 9] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 10] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 11] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 12] FIG. 2 is a diagram showing an example of a display screen according to the first embodiment of the present invention. [Figure 13] 1A to 1C are diagrams schematically illustrating an example of a manufacturing process according to the first embodiment of the present invention. [Figure 14] FIG. 10 is a diagram illustrating a configuration of an analysis device according to a second embodiment of the present invention. [Figure 15] FIG. 10 is a diagram showing an operation flow of an analysis device according to a second embodiment of the present invention. [Figure 16] FIG. 10 is a diagram illustrating another example of the configuration of the present invention. DETAILED DESCRIPTION OF THE INVENTION

[0012] (First embodiment) A first embodiment of the present invention will be described in detail with reference to the drawings. FIG. 1 is a diagram showing an outline of the configuration of a quality control system of this embodiment. The quality control system of this embodiment includes an analysis device 10 and a management device 20. The quality control system of this embodiment has a function in which the management device 20 collects each piece of historical data in the sheet manufacturing process, and the analysis device 10 displays the historical data of each manufacturing process superimposed on each position in the long side direction on a map corresponding to the sheet.

[0013] The management device 20 is connected to each device in the sheet manufacturing process and an inspection device via a network. FIG. 1 shows an example in which the management device 20 is connected to a coating device, a drying device, and an inspection device. FIG. 1 shows an example in which two coating devices, two drying devices, and two inspection devices are installed, but the types and number of devices are not limited to those shown in FIG. 1. Furthermore, FIG. 1 shows an example in which processing and inspection are performed in each process while the sheet is unwound from the roll and wound onto the roll, but unwounding and winding from the roll may be performed multiple times in the product manufacturing process.

[0014] The following describes the configuration of the analysis device 10. Fig. 2 is a block diagram showing the configuration of the analysis device 10. The analysis device 10 includes a data acquisition unit 11, a position identification unit 12, an input reception unit 13, and a map display unit 14.

[0015] The data acquisition unit 11 acquires historical data on manufacturing conditions and inspection data for each device during sheet manufacturing from the management device 20. A sheet is a product whose long side is longer than its short side and whose thickness is thin. A sheet is also called a film.

[0016] The data acquisition unit 11 acquires data related to the manufacture of the seat as historical data of the manufacturing conditions. Hereinafter, the historical data of the manufacturing conditions will also be referred to as manufacturing history data. The data acquisition unit 11 acquires data related to the manufacture of the seat, including data on materials, workers, measurements and inspections, equipment, work methods, and the environment.

[0017] The material data may include, for example, the material's part number, lot number, amount used, secondary material part number, secondary material lot number, and amount used. The material data may also include information on the start and end times of supply of each lot to the manufacturing process. The material data may also include quality data on the finished product and intermediate product. The quality data may include, for example, length, foreign matter occurrence status, wrinkle occurrence status, scratch occurrence status, film thickness, and storage period. The occurrence status may refer to, for example, shape, position, and number.

[0018] The worker data includes the ID of the worker who performed the work, the work content, the start time of the work, and the completion time of the work. The worker data may also include inspection records, repair content, and setup records. Setup records include, for example, records of jig replacement, equipment test runs, and cleaning work.

[0019] The measurement and inspection data includes, for example, product part numbers, lot numbers, measuring instrument identification numbers, and inspection machine identification numbers. The measurement and inspection data includes product quality data. The product quality data includes, for example, product film thickness, surface temperature, defects, MI (Melt Index) value, and EW (Equivalent Weight) value. The defects include, for example, data related to foreign matter, wrinkles, and scratches on the product.

[0020] The equipment data includes, for example, the equipment name, machine number, operation start time, operation stop time, equipment stop duration, and stop reason of the equipment used in the production. The equipment data also includes equipment setting parameter data. The equipment parameters include, for example, heating temperature, heating time, temperature rise rate, feed speed, winding speed, pressure, tension, coating amount, ion concentration, rotation speed, and extrusion amount.

[0021] As data on work methods, for example, data such as items in the basic QC (Quality Control) process chart, process number, process name, procedure number, procedure name, processing conditions, construction method, equipment setting values, measuring instrument setting values, inspection device setting values, equipment management method, standard work method, and standard work time are acquired.

[0022] The environmental data includes, for example, the temperature, humidity, atmospheric pressure, and particle amount data inside the building. The above-listed sheet manufacturing data is merely an example, and it is not necessary to acquire data for all items, and data for items other than those listed above may also be acquired.

[0023] The position identification unit 12 associates the manufacturing process history data with corresponding positions in the long side direction of the sheet. The position identification unit 12 also converts the time-series history data into position data corresponding to positions in the long side direction of the sheet, and associates the history data with the corresponding positions on the sheet. By associating the time-series history data with position data corresponding to positions on the long side direction of the sheet, it is possible to visualize which position on the sheet in the manufacturing history the time-series history data corresponds to. The position data is expressed as the distance from the leading edge of the sheet in the long side direction. The leading edge of the sheet refers to the edge that first enters the device after being pulled from the roll. The long side direction of the sheet corresponds to the sheet conveyance direction. The position identification unit 12 converts the time of the time-series data into a position in the long side direction of the sheet based on the sheet conveyance start time and conveyance speed.

[0024] The input accepting unit 13 accepts input of the selection result of a data item by a worker. The input accepting unit 13 acquires the selection result from an input device when the worker selects a data item to be displayed. The selection result is input, for example, by clicking with a mouse on a data item displayed on the screen to select it. The selection result may also be input by the worker touching a data item displayed on a display device equipped with a touch panel. The input accepting unit 13 may also accept input of the selection result of a data item by recognizing the worker's voice. When accepting input through voice recognition, the input accepting unit 13 is connected to a microphone that acquires the worker's voice.

[0025] The map display unit 14 generates data by superimposing each history data of the manufacturing process during sheet manufacturing and the inspection data. The map display unit 14 generates data that associates each data with the position in the long side direction of the sheet, thereby generating map data. The map display unit 14 also outputs a map based on the generated map data to the display device. The map display unit 14 outputs display data used when selecting data items to display, together with the map, to the display device.

[0026] The management device 20 acquires data from each device and inspection device in the sheet manufacturing process and stores the acquired data. The management device 20 sends data used for analysis by the analysis device 10 to the analysis device 10. The management device 20 may acquire inspection data from multiple inspection devices in intermediate and final processes when manufacturing the sheet. The management device 20 may acquire inspection data from inspection devices in multiple inspection processes in intermediate processes. Furthermore, the management device 20 may acquire inspection data from an inspection device that performs inspection only in either the intermediate process or the final process. Furthermore, the management device 20 may be provided as part of a production management system that instructs each device to start processing and set manufacturing conditions.

[0027] The operation of the quality control system of this embodiment will be described. FIG. 3 is a diagram showing the operational flow of the analysis device 10. During sheet manufacturing, each device and inspection device in the manufacturing process stores history data and inspection data. The management device 20 acquires history data from each device and inspection device at predetermined intervals. The predetermined intervals are set in hours or days. The management device 20 may also acquire history data from each device and inspection device at predetermined lot intervals or when the type of product being manufactured is changed. The management device 20 stores the history data acquired from each device and inspection device in a storage device inside the device or connected to the management device 20.

[0028] 3, the data acquisition unit 11 of the analysis device 10 acquires history data of a lot to be analyzed from the management device 20 (step S11). The items of the history data to be acquired are set in advance for each type of sheet, for example. The lot to be analyzed and the items of the history data to be acquired may be selected by the operator.

[0029] When the data acquisition unit 11 acquires the history data, the position identification unit 12 associates the history data with a position on the long side of the sheet (step S12). For example, when the history data is data recording temperature data within the device at each time, i.e., time-series temperature data, the position identification unit 12 converts the time into a corresponding position on the long side of the sheet. The position identification unit 12 converts the time data into position data on the sheet based on the time when the leading edge of the sheet entered the area where temperature data is acquired and the sheet conveyance speed.

[0030] For example, when the sheet conveying speed is A (m / sec) and the leading edge of the sheet enters the area where temperature data is acquired at time t0, the position identifying unit 12 calculates the position of the sheet in the long side direction at time t using the distance D (m) from the leading edge of the sheet as D = (t - t0) × A. When the conveying speed is measured in seconds, the position identifying unit 12 calculates (t - t0) as the time difference measured in seconds.

[0031] If the acquired data is the length from the midpoint in the long side direction of the sheet, the position specifying unit 12 converts the acquired data into data on the distance from the edge in the long side direction of the sheet. If the acquired data is data on the distance from the edge of the sheet, the acquired data is used as is.

[0032] When the position identification unit 12 converts each piece of data into data associated with a position in the long side direction of the sheet, the map display unit 14 generates map data that displays each piece of data associated with a position in the long side direction of the sheet on a map (step S13). After generating the map data, the map display unit 14 displays the generated map data on a display device (step S14).

[0033] FIG. 4 shows examples of history data and map data. The upper left section of FIG. 4 shows an example of history data of temperatures in a manufacturing device. The history data in the upper left section of FIG. 4 is time and temperature data, so the position identification unit 12 converts the time and temperature data into position and temperature data. The data in the lower left section of FIG. 4 shows an example of inspection data, showing an example in which wrinkles have occurred in part of a sheet. The numbers below the sheet in the lower left section of FIG. 4 indicate the distance from the edge of the sheet. The lower left section of FIG. 4 is an enlarged view of the range from 300 mm to 500 mm from the leading edge of the sheet.

[0034] The map display unit 14 generates data correlating temperature and wrinkles with the position in the long side direction, generating map data such as that shown on the right side of FIG. 4. The map data on the right side of FIG. 4 is generated as a map in which temperature changes and wrinkles in the long side direction of the sheet are superimposed. The numbers below the sheet on the right side of FIG. 4 indicate the distance from the leading edge of the sheet. The right side of FIG. 4 shows the area from the leading edge of the sheet to approximately 600 mm. The diagram on the right side of FIG. 4 also shows the temperature fluctuations when processed using the heater shown in the upper right part of FIG. 4 using point density. For example, the area around 400 mm, where the point density is high, indicates that the temperature is higher than other areas when processed using the heater. By referring to a map such as the one on the right side of FIG. 4, the worker can recognize that wrinkles have occurred and that the temperature is higher than other areas around 400 mm from the leading edge of the sheet. By referring to a map showing high temperatures near the area where wrinkles have occurred, the worker can infer that temperature changes are the cause of the wrinkles.

[0035] Figure 5 shows an example of a display screen in which the inspection results, displayed as a map, are correlated with the temperature data's position along the long side, and displayed as a graph. The numbers below the map in Figure 5 indicate the distance from the leading edge of the sheet. The graph at the bottom of Figure 5 also correlates the temperature data for process A with each position on the map, with the vertical axis indicating high and low temperatures. In the example of Figure 5, based on the same data as in Figure 4, the temperature data is displayed in correlation with the inspection results and the position along the long side, allowing workers to more easily recognize temperature changes at the location where wrinkles have occurred by looking at the changes in the graph.

[0036] Next, we will explain how to change the displayed history data items. FIG. 6 is a diagram schematically illustrating an example of a display screen in which an operator selects a data item to be displayed. In the example of the display screen in FIG. 6, buttons for inspection and history data items, such as "Inspection," "Temperature (Process A)," "Pressure (Process B)," and "Discharge Rate (Process B)," are displayed on the left side. When the operator clicks on an item to be displayed using the mouse, the selection results for the items to be displayed on the map display unit 14 are sent via the input receiving unit 13. In the example of FIG. 6, "Inspection," "Temperature (Process A)," and "Discharge Rate (Process B)" are selected, and the map display unit 14 generates data combining the inspection results displayed on the map with the graph data for the temperature of process A and the discharge rate of process B corresponding to the position along the long side of the map. Data selection may be performed by the operator touching a button on a touch-panel display device. Alternatively, the selection may be canceled by clicking or touching the selected area again with the mouse.

[0037] Next, we will explain the case where display data candidates are displayed by clicking on the map or touching the screen. FIG. 7 shows an example in which only the sheet inspection results are displayed. In FIG. 7, when the worker clicks on the wrinkled area with the mouse or touches the screen, the map display unit 14 displays candidate items of history data for the related process, as shown in FIG. 8. When the worker selects an item to display from the candidate history data, the map display unit 14 displays the data for the selected item on a map and graph, as shown in FIG. 9. The example in FIG. 9 shows the case where "Process A Temperature," "Process B Pressure," and "Process B Discharge Volume" are selected. Based on the display screen shown in FIG. 9, the worker can infer that the temperature of Process A has changed while the other items have not.

[0038] Next, we will explain an example of displaying information about lots related to the lot whose inspection results are displayed. Figure 10 shows an example in which related lot numbers are displayed when a wrinkled area or map is clicked on a screen like the one in Figure 5. Related lots are pre-defined, such as several lots before and after the displayed lot. Also, lots that were processed under the same conditions or using the same material rod as the displayed lot may be defined as related lots. Also, lots that were processed between pre-processing and post-processing maintenance on the equipment that processed the displayed lot may be defined as related lots. Clicking on the number of a related lot may also display the inspection results and history data for the clicked lot. By displaying related lot information in this way, when an abnormality occurs, it is easy to check whether other lots contain abnormalities.

[0039] Next, an example of displaying data from multiple sheets will be described. FIG. 11 shows an example of displaying two sheets of maps. By displaying multiple sheets in this way, it is possible to determine whether the change occurred only in the lot in which the abnormality occurred or whether the abnormality is common to multiple lots, making it easier to estimate the cause of the abnormality. Furthermore, by displaying multiple sheets, it is possible to determine whether an abnormality occurred over a period longer than the manufacturing time of one sheet. Furthermore, although FIG. 11 shows an example of two sheets, three or more sheets may also be displayed. When displaying three or more sheets, for example, by displaying sheets for lots before and after the lot in which the abnormality occurred, it is possible to more easily determine whether an abnormality occurred in other lots.

[0040] In the above explanation, an example of displaying one or more sheets has been shown, but it is also possible to enlarge and display only a portion of a sheet. Also, it is possible to display the entire sheet and the enlarged portion at the same time. By making it possible to change the display range in response to the operator's operation, it becomes easier to analyze the cause of an abnormality.

[0041] While the above explanation shows an example of displaying temperature changes along the long side, temperature changes along the short side can also be displayed. In Figure 12, film thickness data along the short side is displayed around 200 mm, where the defect indicated by a square on the map occurred. Temperature data is also displayed around 600 mm. In the case shown in Figure 12, temperature and film thickness data are measured by sensors at several locations along the film thickness direction and recorded as two-dimensional data. Assuming that the film thickness and temperature values ​​are higher on the right side of the figure, it can be seen that the defects between 200 mm and 400 mm from the leading edge of the sheet are caused by thin film thickness. It can also be seen that the defects between 600 mm and 800 mm from the leading edge of the sheet are caused by high temperature. Displaying the temperature and film thickness distributions along the short side in relation to the position along the long side in this way allows for more detailed analysis of the causes of anomalies.

[0042] While the above description focuses on an example of a sheet drawn from a single roll, the above example may also apply to a sheet formed by laminating sheets drawn from multiple rolls. The lamination of multiple sheets is also called lamination. Figure 13 is a schematic diagram illustrating the state in which sheets drawn from three rolls are laminated together, processed and inspected in each device, and then wound into a single roll. In the system shown in Figure 13, the historical data and inspection data from the manufacturing of each roll and the historical data and inspection data from each process after the sheets are laminated are displayed as a map by correlating their positions along the long side. This configuration makes it easy to identify whether an abnormality occurred in a process before or after lamination, even for sheets manufactured by laminating multiple sheets. When laminating multiple sheets, data is associated based on the long side position of each sheet from its leading edge when laminating.

[0043] In the quality control system of this embodiment, the management device 20 collects device history data and inspection data, and the analysis device 10 associates data that are located at the same position on the sheet. Furthermore, the analysis device 10 associates and displays data that are located at the same position on the sheet. Therefore, by using the quality control system of this embodiment, it is possible to easily refer to data that associates history data from multiple processes at each location on the sheet. As a result, in the quality control system of this embodiment, by associating and displaying history data and inspection data that are located at the same position, it becomes easy to identify the cause when an abnormality occurs in a manufactured sheet.

[0044] (Second embodiment) A second embodiment of the present invention will be described in detail with reference to the drawings. FIG. 14 is a diagram showing an outline of the configuration of an analysis device of this embodiment. The analysis device of this embodiment includes a data acquisition unit 101, a position identification unit 102, and a map display unit 103. The data acquisition unit 101 acquires manufacturing history data for multiple processes when manufacturing a sheet. Specifically, the data acquisition unit 101 acquires, for example, manufacturing history data and inspection data for each device when manufacturing the sheet. The position identification unit 102 associates history data that are located at the same position in the long-side direction of the sheet across multiple processes. The map display unit 103 associates and displays manufacturing history data that are located at the same position in the long-side direction of the sheet at corresponding positions on a map showing the sheet. Specifically, the position identification unit 102 associates manufacturing history data and inspection data that are located at the same position in the long-side direction of the sheet, and the map display unit 103 displays the associated data on a map.

[0045] Here, the data acquisition unit 11 of the first embodiment is an example of the data acquisition unit 101. The data acquisition unit 101 is also an aspect of data acquisition means. The position identification unit 12 of the first embodiment is an example of the position identification unit 102. The position identification unit 102 is also an aspect of position identification means. The map display unit 103 is an example of the map display unit 14 of the first embodiment. The map display unit 14 is also an aspect of map display means.

[0046] The operation of the analysis device of this embodiment will be described. Fig. 15 is a diagram showing the operation flow of the analysis device of this embodiment. The data acquisition unit 101 of the analysis device acquires manufacturing history data of a plurality of processes when manufacturing a sheet (step S21). When the manufacturing history data is acquired, the position identification unit 102 associates manufacturing history data that are located at the same position in the long side direction on the sheet between the plurality of processes (step S22). When the manufacturing history data that are located at the same position are associated, the map display unit 103 displays the manufacturing history data that are located at the same position in the long side direction in association with each other at corresponding positions on the map showing the sheet (step S23).

[0047] The analysis device of this embodiment associates the manufacturing history data of multiple processes that are located at the same position in the long side direction of the sheet with each other, and displays the associated data at corresponding positions on a map showing the sheet. Therefore, by using the analysis device of this embodiment, it is possible to refer to data that associates the manufacturing history data of multiple processes at each location on the sheet on a map, and therefore it is possible to compare the manufacturing histories between multiple processes in the sheet manufacturing process in a visualized state.

[0048] Each process in the analysis device 10 of the first embodiment and the analysis device of the second embodiment can be performed by executing a computer program on a computer. Fig. 16 shows an example of the configuration of a computer 200 that executes a computer program that performs each process in the analysis device 10 of the first embodiment and the analysis device of the second embodiment. The computer 200 includes a CPU (Central Processing Unit) 201, a memory 202, a storage device 203, an input / output I / F (Interface) 204, and a communication I / F 205. The management device 20 of the first embodiment can also have a similar configuration.

[0049] The CPU 201 reads out and executes computer programs for performing each process from the storage device 203. The memory 202 is configured with a DRAM (Dynamic Random Access Memory) or the like, and temporarily stores the computer programs executed by the CPU 201 and data being processed. The storage device 203 stores the computer programs executed by the CPU 201. The storage device 203 is configured with, for example, a non-volatile semiconductor storage device. Other storage devices such as a hard disk drive may also be used for the storage device 203. The input / output I / F 204 is an interface that receives input from a worker and outputs display data, etc. The communication I / F 205 is an interface that transmits and receives data between each device and the worker's terminal, etc.

[0050] The computer program used to execute each process can also be stored on a recording medium and distributed. Examples of recording media that can be used include magnetic disks such as data recording magnetic tapes and hard disks. Optical disks such as CD-ROMs (Compact Disc Read Only Memory) can also be used as recording media. Nonvolatile semiconductor storage devices can also be used as recording media. [Explanation of symbols]

[0051] 10 Analysis device 11 Data Acquisition Section 12 Location identification part 13 Input reception section 14 Map display section 20 Management device 101 Data Acquisition Unit 102 Location identification part 103 Map display section 200 computers 201 CPU 202 memory 203 Storage device 204 Input / Output Interface 205 Communication I / F

Claims

1. a data acquisition means for acquiring manufacturing history data of a plurality of processes in manufacturing a sheet and inspection results of the sheet; a position specifying means for associating the manufacturing history data and the inspection results with positions on the sheet in the long side direction; an input receiving means for acquiring a process and a data item selected on a selection screen for selecting a process and a data item for displaying a manufacturing history; a map display means for displaying the manufacturing history data of the selected process and data item from the manufacturing history data of the plurality of processes and the inspection results in association with the corresponding positions in the long side direction of a map showing the sheet; An analysis device comprising:

2. The analysis device described in Claim 1, wherein the map display means displays buttons on the selection screen for selecting the process and data item for which the manufacturing history is to be displayed, and displays the manufacturing history data for the process and data item corresponding to the selected button in association with the corresponding position along the long side of the map showing the sheet.

3. An analysis device as described in claim 1 or 2, wherein the map display means displays the distribution of selected data items in the short side direction of the sheet by superimposing it on the map showing the sheet at a position corresponding to the long side direction of the map.

4. An analysis device described in any one of claims 1 to 3, wherein the map display means displays at least one of historical data related to equipment and historical data related to work performed by workers in relation to the position of the long side of the sheet.

5. An analytical device described in any one of claims 1 to 4, wherein the data acquisition means acquires manufacturing history data and inspection results for multiple processes after the sheets are bonded together when manufacturing a sheet made by bonding multiple sheets together.

6. The data acquisition means further acquires manufacturing history data and inspection results of a plurality of processes in manufacturing each of the sheets before lamination, The analysis device according to claim 5, wherein the map display means displays at least one of the manufacturing history data and the inspection results selected for the sheets before bonding, in association with a corresponding position in the long side direction of the map showing the inspection results for the sheets after bonding.

7. The analysis device according to claim 4 , wherein the historical data relating to the facility includes at least one of an operating state of the facility and a facility parameter.

8. An analysis device described in any one of claims 1 to 7, wherein the map display means displays information about a lot related to a defect when a defect is selected on the map.

9. Acquire manufacturing history data of a plurality of processes in manufacturing the sheet and inspection results of the sheet; The manufacturing history data and the inspection results are associated with positions on the sheet in a long side direction; Acquire the process and data item selected on a selection screen for selecting the process and data item for which the manufacturing history is to be displayed; An analysis method for displaying the manufacturing history data of a selected process and data item from the manufacturing history data of the plurality of processes and the inspection results in association with corresponding positions in the long side direction of a map showing the sheet.

10. A process of acquiring manufacturing history data of a plurality of processes in manufacturing a sheet and inspection results of the sheet; a process of associating the manufacturing history data and the inspection results with positions on the sheet in the long side direction; A process of acquiring the process and data item selected on a selection screen for selecting the process and data item for displaying the manufacturing history; a process of displaying the manufacturing history data of the selected process and data item from the manufacturing history data of the plurality of processes and the inspection results in association with the corresponding positions in the long side direction of the map showing the sheet; An analysis program that causes a computer to execute the above.

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