Two-port acoustic wave sensor device

Abstract

The present invention relates to an acoustic wave sensor device (20, 30, 40, 50, 60, 70, 80, 90) comprising a quartz material layer surface, a first interdigitated transducer (T1) formed on a flat surface of the quartz material layer, a first reflective structure (M1) formed on the flat surface of the quartz material layer, and a second reflective structure (M2) formed on the flat surface of the quartz material layer, arranged along a first axis, and a second interdigitated transducer (T2) formed on the flat surface of the quartz material layer, a third reflective structure (M3) formed on the flat surface of the quartz material layer, and a fourth reflective structure (M4) formed on the flat surface of the quartz material layer, arranged along a second axis, wherein the first axis and the second axis are inclined to each other by a finite angle.

Description

[Technical Field]

[0001] The present invention relates to acoustic wave type sensors, and in particular to a two-port acoustic wave sensor device comprising two transducers with corresponding reflecting structures.

[0002] Sensors are becoming increasingly important and prevalent in everyday life. Microelectromechanical systems (MEMS) are an attractive option for meeting the demand for improved sensor performance, along with miniaturization and cost reduction. Surface acoustic wave (SAW) sensors, and to a lesser extent bulk acoustic wave (BAW) sensors or Lamb or Love wave acoustic sensors, offer a particularly advantageous option due to the wide variety of ambient parameters that can be measured, including, for example, temperature, pressure, strain and torque, as well as the acceleration or frequency vibration of a vibrating part.

[0003] Acoustic wave sensors convert electrical signals into mechanical / acoustic waves using the piezoelectric effect. SAW-based sensors are built on single-crystal piezoelectric materials, such as quartz (SiO2), lithium niobate (LiNbO3), lithium tantalate (LiTaO3), or langasite (LGS), or polycrystalline piezoelectric materials, such as aluminum nitride (AlN) or zinc oxide (ZnO), deposited on silicon, and also on piezo-on-insulator (POI) composites, which optionally include a layer of piezoelectric material, in particular a single-crystal material such as lithium tantalate or lithium niobate, bonded to a supporting substrate, such as silicon, by a bonding layer, such as a silicon oxide layer. (In general, any combination of single-crystal piezoelectric material and a non-piezoelectric substrate can be used in terms of specific properties, such as thermoelastic properties or acoustic quality.)

[0004] In the case of a surface acoustic wave sensor, an interdigitated transducer (IDT) converts the electrical energy of an electrical signal into acoustic wave energy. The acoustic wave propagates across the surface (or bulk) of the device substrate via a so-called delay line to another transducer, specifically an IDT, which reconverts the acoustic wave into a detectable electrical signal. In some devices, mechanical absorbers and / or reflectors are provided to prevent interference patterns and reduce insertion loss. In some devices, the other (output) IDT is replaced by a reflector that reflects the generated acoustic wave back to the (input) IDT, which can be coupled to an antenna for remote interrogation of the sensor device. Advantageously, measurements can be performed completely passively, i.e., the sensor does not need to be powered by a power source.

[0005] A particular class of acoustic wave sensors includes resonators that exhibit a resonant frequency that changes with changing ambient conditions. Figure 1 shows an example of a resonant acoustic wave sensor. The surface acoustic wave resonator includes an electroacoustic interdigitated transducer (IDT), in which interdigitated interdigitated electrodes C and C' are arranged between a Bragg mirror M. The interdigitated electrodes are set to opposite potentials +V and -V, respectively. The electrode geometry is defined by the pitch p, i.e., the spatial repetition frequency of the interleaved electrodes C and C' in the direction of propagation of the excited surface acoustic wave; the length of the gap between electrodes C and C' in a direction perpendicular to the direction of propagation of the excited surface acoustic wave; the length of the acoustic aperture area given by the length of electrodes C and C' between the gap; and the width a of electrodes C and C', which determines the so-called metallization ratio a / p. The IDT can operate, for example, in the Bragg condition, where the wavelength λ of the excited surface acoustic wave is equal to twice the pitch p.

[0006] At the resonant frequency, the condition of synchronization between the reflectors is met, allowing the coherent addition of the various reflections occurring below them. Within the resonant cavity, a maximum of acoustic energy is observed, and from an electrical point of view, the maximum amplitude of the current allowed by the transducer is observed. In principle, a differential acoustic wave sensor can comprise two or more resonators exhibiting different resonant frequencies, or a resonator operating in multimode (several resonant frequencies), where the difference in the measurement frequencies reflects the fluctuations of the ambient parameter (measurand) being measured, for example, temperature, pressure, or strain.

[0007] However, despite recent engineering advances, the entire interrogation process, in which the interrogator transmits a suitable radio frequency (RF) signal, which is received by the acoustic wave sensor via a receiving antenna, converted by the transducer into a surface acoustic wave (or bulk wave, in the case of bulk acoustic wave sensor type devices), and this surface acoustic wave is converted into an RF signal that is retransmitted via a radiating antenna, received and analyzed by the interrogator, still poses severe technical problems.

[0008] To obtain reliable measurement results, true differential measurements based on appropriate differential sensitivity of the resonance of the resonator used to the measurand must be accurately observed. This places stringent demands on the tolerances of the manufacturing process and the reproducibility of physical properties from wafer to wafer. In addition, any relative movement between the sensor device and the interrogator can significantly affect the measurement results due to the RF link formed by the sensor device and the interrogator, either inductively, capacitively, or radiatively. Other environmental effects in the measurement environment, such as temperature changes, also affect the reliability of the measurement results.

[0009] It is therefore an object of the present invention to provide an acoustic wave sensor that allows for a higher signal-to-noise ratio and more reliable measurement results compared to acoustic wave sensor devices of the state of the art.

[0010] The present invention addresses the above-mentioned objects by providing a (two-port) acoustic wave sensor device (representing a dipole from a purely electrical perspective) comprising: a quartz material layer (made of or including a quartz material) including a flat (top) surface; a first interdigitated transducer formed on (or on) the flat surface of the quartz material layer, a first reflective structure formed on (or on) the flat surface of the quartz material layer, and a second reflective structure formed on (or on) the flat surface of the quartz material layer, all arranged along a first axis; and a second interdigitated transducer formed on (or on) the flat surface of the quartz material layer, a third reflective structure formed on (or on) the flat surface of the quartz material layer, and a fourth reflective structure formed on (or on) the flat surface of the quartz material layer, all arranged along a second axis, wherein the first axis and the second axis are inclined to each other by a finite angle (i.e., both axes are not arranged parallel to each other). The flat surface of the quartz material layer is defined by a crystal cut of the quartz material of the quartz material layer having an angle φ in the range of −14° to −24°, an angle θ in the range of −25° to −45°, and an angle ψ in the range of +8° to +28°, in particular an angle φ in the range of −17° to −22°, an angle θ in the range of −30° to −40°, and an angle ψ in the range of +10° to +25°, more particularly an angle φ in the range of −19° to −21°, an angle θ in the range of −33° to −39°, and an angle ψ in the range of +15° to +25°. In particular, the angles of the crystal cut may be φ=−20°, θ=−36°, and ψ=15° to 25°, in particular 17°.

[0011] Note that the above definition is equivalent to angles φ ranging from +14° to +24°, θ ranging from −25° to −45°, and ψ ranging from −8° to −28°, according to the symmetry conditions for a crystal cut rotated about the Z axis (i.e., the non-zero angles φ and ψ of a given crystal cut). More specifically, according to the symmetry rules, one can state that the (YXwlt) / +φ / +θ / +ψ cut is equivalent to the (YXwlt) / -φ / +θ / -ψ cut.

[0012] The angles defining the crystal cuts, and therefore the flat surfaces, are defined in accordance with IEEE 176 1949 Standards on Piezoelectric Crystals, 1949 from 12-12-1949 (see also the detailed description below). A quartz crystal may have a cut plane (X", Z") defined in a reference system (X", Y", Z") relative to the cut plane (X, Z), where X, Y, Z are the crystal axes of the quartz, the wave propagation direction is defined along axis X''', a first cut plane (X', Z') is defined by a rotation of angle φ about axis Z of plane (X, Z) so as to define a first reference system (X', Y', Z') in which axis Z' is the same as axis Z, and a second cut plane (X", Z") is defined by a rotation of angle φ about axis Z of plane (X, Z) so as to define a first reference system (X', Y', Z') in which axis Z' is the same as axis Z. A second reference system (X'', Y'', Z'') is defined in which the axis X'' is the same as the axis X', defined by a rotation of the axis X'' in the plane (X', Z') by an angle θ about the axis X', and the direction of propagation along the axis X''' is defined by a rotation of the axis X'' in the plane (X'', Z'') about the axis Y'', where φ is in the range of -14° to -24°, θ is in the range of -25° to -45°, and ψ is in the range of +8° to +28°, according to the present disclosure.

[0013] The quartz material layer can be a quartz bulk substrate or a quartz layer formed on a non-piezoelectric bulk substrate. In the latter case, the non-piezoelectric bulk substrate can be a silicon substrate, optionally including a so-called trap-rich layer on its surface (for example, provided by a layer of polycrystalline silicon). The trap-rich layer reduces insertion loss and RF losses due to charge traps induced at the interface with the silicon substrate. A sapphire substrate can also be used, which is very interesting for maximizing the quality factor of the resonance by minimizing the viscoelastic losses of the substrate. Sapphire (along with yttrium-based garnets, more specifically yttrium aluminum garnet - YAG) is known to be one of the most advantageous materials due to its characteristics.

[0014] The first interdigitated transducer is disposed along a first axis at an angle ψ1 and is formed on (or on) the flat surface of the quartz material layer, the angle ψ1 defining a propagation direction of an acoustic wave along an axis X''' defined by rotating the axis X" of the quartz substrate by the angle ψ1. The second interdigitated transducer is disposed along a second axis at an angle ψ2 and is formed on (or on) the flat surface of the quartz material layer, the angle ψ2 defining a propagation direction of an acoustic wave along an axis X''' defined by rotating the axis X" of the quartz substrate by the angle ψ2. The angles ψ1 and ψ2 are in the range of +8° to +28°. The finite angle defined between the first axis and the second axis may be in the range of 1° to 10°, in particular 1° to 6°, and more particularly 2° to 4°. Due to the finite angle between the first and second axes, the propagation directions of the generated (surface) acoustic waves are different, which of course results in different resonant frequencies since the acoustic wave propagation is perpendicular to the electrodes of the first and second interdigitated transducers.

[0015] Here, the first transducer, the first reflecting structure, and the second reflecting structure are considered a first resonator, and the second transducer, the third reflecting structure, and the fourth reflecting structure are considered a second resonator. Experiments have demonstrated that the combination of a quartz material layer, described as a piezoelectric layer, and a tilted configuration of a two-port (resonator) acoustic wave sensor device can provide particularly accurate measurement results (see also the detailed description below). In particular, the first and second resonators may be formed very similar to each other in terms of design and physical characteristics. They may exhibit very similar thermal sensitivities but have first-order temperature coefficients of frequency (TCFs) that are sufficiently different to provide linear differential temperature sensitivity. Thus, according to one embodiment, the first and second interdigitated transducers have the same number of electrodes and / or the same metallization ratio and / or the same openings and / or the same tapering and / or electrode length. It may be advantageous to have different periods (separation distances between the individual electrodes) of the first and second transducers to obtain a significant difference in the resonant frequencies of the first and second resonators (enhancing the difference caused by the finite angle between the first and second axes). In principle, the use of two resonators connected in series or parallel to each other can improve the differential sensitivity of the measurement compared to using a single one-port acoustic wave sensor device.

[0016] At least one of the first, second, third, and fourth reflecting structures of the acoustic wave sensor device of the present invention includes or is composed of a Bragg mirror. Such reflecting structures can be easily formed and can provide high reflectivity. For example, the first, second, third, and fourth reflecting structures of the acoustic wave sensor device of the present invention all include or are composed of respective Bragg mirrors. In this case, all Bragg mirrors can have the same number and / or length of electrodes. Furthermore, in this case, the electrodes of each Bragg mirror can be connected to each other, grounded (connected to ground), or neither connected to each other nor grounded. The choice of configuration may be motivated by the ability to slightly adjust the actual value of the reflection coefficient to optimize the quality factor, insulation, and even thermal parameters of the resonator. The structure may include one or more gaps to maximize the quality factor of the resonator or to optimize the operation of the device at a given operating point, for example, to force the resonator to operate in the center of the stop band of the Bragg mirror, to correct for directional effects (resonance split between the start and end of the stop band which is not the preferred operating point), or to reduce the IDT dimensions below those required for a gap-less resonator to promote anti-resonant operation instead of resonant.

[0017] According to another embodiment, at least one of the first, second, third and fourth reflecting structures comprises a groove or edge reflecting structure or a short reflector comprising three or less electrodes. A person skilled in the art will know how to adjust the groove depth of the Bragg mirror or the thickness of the electrodes to provide a reflection coefficient of, for example, more than 20%, which is achievable for a given crystal orientation, wave polarization and electrode properties.

[0018] According to one embodiment, the first and second reflective structures are disposed adjacent to the first interdigitated transducer, and the third and fourth reflective structures are disposed adjacent to the second interdigitated transducer (i.e., the reflective structures define a resonant region). Alternatively, a) a first resonant cavity is formed between the first interdigitated transducer and the first reflective structure, and a second resonant cavity is formed between the first interdigitated transducer and the second reflective structure, and b) a third resonant cavity is formed between the second interdigitated transducer and the third reflective structure, and a fourth resonant cavity is formed between the second interdigitated transducer and the fourth reflective structure. The resonant cavities comprise a portion of the top planar surface of the quartz material layer.

[0019] The top surface of the second resonant cavity may include a physical and / or chemical modification compared to the top surface of the first resonant cavity. The top surface of the fourth resonant cavity may include a physical and / or chemical modification compared to the top surface of the third resonant cavity. For example, the physical and / or chemical modification may include a metallization layer or a passivation layer formed on the top surface of the second resonant cavity.

[0020] The metallization layer may include or consist of at least one of AlCu and Ti, and the passivation layer may include or consist of at least one of Si3N4, Al2O3, AlN, Ta2O5, and SiO2, but is not limited to these. The metallization layer may be made of the same material as the electrodes of the first transducer (and therefore may be formed in the same processing steps used to form the electrodes). If a Bragg mirror is used as the reflective structure, the Bragg mirror may be made of the same metallic material used to form the metallization layer and / or the electrodes of the first transducer.

[0021] Another option for physically modifying the top surfaces of the second and fourth resonant cavities includes recessing the surface of the second resonant cavity relative to the top surface of the first resonant cavity and recessing the surface of the fourth resonant cavity relative to the top surface of the third resonant cavity.

[0022] The top surface of the first (third) resonant cavity may also be subjected to physical and / or treatments as described above, but in a different manner compared to the surface of the second (fourth) resonant cavity.

[0023] By modifying one of the first (third) and second (fourth) top surfaces of the resonant cavity with a metallization or passivation layer, the propagation characteristics of the acoustic waves generated by the interdigitated transducer may be different in the second (fourth) resonant cavity from those in the first (third) resonant cavity. This can provide a highly reliable and sensitive differential sensor device. The unmodified first and second top surfaces are free (exposed) surfaces, in particular, the free surfaces of the quartz material layer or piezoelectric layer.

[0024] In all of the above examples, the first and second resonant cavities may have different extension lengths, and the third and fourth resonant cavities may have different extension lengths, in order to more clearly separate the spectral responses of the resonances of the first and second resonant cavities and thereby isolate the first and second resonators from each other.

[0025] According to certain embodiments, in all of the above examples, the first and second interdigitated transducers may each be divided into two parts, with an additional reflecting structure disposed between the two parts of each transducer. Such a configuration may be advantageous in operating situations where the reflection coefficients of the first and second transducers are not strong enough to provide a sufficiently clear separation between the resonances of the first and second resonators. The first part of the first (second) interdigitated transducer may include a first number of electrodes, and the second part of the first (second) interdigitated transducer may include a second number of electrodes, with the first number of electrodes being different from the second number. Additionally or alternatively, the length of at least some of the first number of electrodes may be different from the length of at least some of the second number of electrodes (i.e., the length of the two transducers in a direction perpendicular to the propagation direction of the surface acoustic waves). Furthermore, the openings of the first and second parts of the first (second) transducer may be different from each other. Such an approach allows for fine tuning to compensate for inherent losses caused by metallization or passivation layers due to scattering, changes in wave velocity, changes in optimal resonance conditions, etc.

[0026] Furthermore, in an acoustic wave sensor device according to one of the above-described embodiments, cascaded resonant cavities can be formed to reduce the number of resonances and obtain unique measurements. Thus, an acoustic wave sensor device according to one of the above-described examples may be configured such that the first and third resonant cavities comprise first subcavities separated from each other by reflective substructures of the first and third reflective structures, respectively, and the second and fourth resonant cavities comprise resonant subcavities separated from each other by reflective substructures of the second and fourth reflective structures, respectively. Each of the reflective substructures may be comprised of elongated electrodes arranged parallel to each other.

[0027] In general, an acoustic wave sensor device according to one of the above examples may be a passive surface acoustic wave sensor device configured to sense an ambient parameter, for example, one of temperature, chemical species, strain, pressure, or torque of a rotating shaft.

[0028] Further, a system for monitoring / measuring ambient parameters, such as temperature, strain levels, pressure or torque levels of a rotating shaft, chemical species, etc., is provided, the system comprising an interrogation device and an acoustic wave sensor device and / or acoustic wave sensor assembly according to one of the above-described embodiments communicatively coupled to the interrogation device.

[0029] An interrogation device for interrogating an acoustic wave sensor may comprise a transmitting antenna configured to transmit an RF interrogation signal to the acoustic wave sensor device, a receiving antenna configured to receive an RF response signal from the acoustic wave sensor device, which may also include a transmitting and receiving antenna, and processing means for processing / analyzing the RF response signal to determine the ambient parameter to be sensed.

[0030] Further features and advantages of the present invention will be described with reference to the drawings. In the description, reference is made to the accompanying drawings which are intended to illustrate preferred embodiments of the invention. It will be understood that such embodiments do not represent the full scope of the invention. [Brief explanation of the drawings]

[0031] [Figure 1] 1 is an example of a surface acoustic wave sensor device according to the prior art. [Figure 2] 1 is a principle diagram illustrating a two-port acoustic wave sensor device according to an embodiment of the present invention. [Figure 3] 1 is a principle diagram illustrating a two-port acoustic wave sensor device according to an embodiment of the present invention. [Figure 4] 1 is a principle diagram illustrating a two-port acoustic wave sensor device according to an embodiment of the present invention. [Figure 5]1 is a principle diagram illustrating a two-port acoustic wave sensor device according to an embodiment of the present invention. [Figure 6] FIG. 1 is a principle diagram illustrating a two-port acoustic wave sensor device with a resonant cavity formed between a transducer and a mirror according to one embodiment of the present invention. [Figure 7] FIG. 1 is a principle diagram illustrating a two-port acoustic wave sensor device with a resonant cavity formed between a transducer and a mirror according to one embodiment of the present invention. [Figure 8] FIG. 1 is a principle diagram illustrating a two-port acoustic wave sensor device with a resonant cavity formed between a transducer and a mirror according to one embodiment of the present invention. [Figure 9] FIG. 1 is a principle diagram illustrating a two-port acoustic wave sensor device with a resonant cavity formed between a transducer and a mirror according to one embodiment of the present invention. [Figure 10] FIG. 10 is a diagram showing the coordinates and angles of a piezoelectric plate. [Figure 11] FIG. 1 shows the coordinates and angles of a three-rotation crystal cut.

[0032] The present invention provides an acoustic wave sensor, in particular a passive SAW sensor, characterized by a high signal-to-noise ratio, sensitivity and reliability, in particular robustness against environmental influences and residual stresses not due to fluctuations in the measurand, as well as high accuracy of the differential measurement. These advantages are achieved in particular by using a piezoelectric quartz material layer that provides a resonant cavity characterized by flat surfaces resulting from crystal cuts defined by an angle φ in the range of −14° to −24°, an angle θ in the range of −25° to −45°, and an angle ψ in the range of +8° to +28°, in particular an angle φ in the range of −17° to −22°, an angle θ in the range of −30° to −40°, and an angle ψ in the range of +10° to +25°, more particularly an angle φ in the range of −19° to −21°, an angle θ in the range of −33° to −39°, and an angle ψ in the range of +15° to +25°, in accordance with IEEE 176 1949 Standards on Piezoelectric Crystals, 1949 from 12-12-1949.

[0033] For temperature measurements, for example, the resulting resonant frequency sensitivity allows differential measurement sensitivities of over 1 ppm per Kelvin, up to 10 ppb·K. -2 Less than or even 5 ppb·K -2 This allows for a second-order TCF sensitivity (absolute value) of less than 1 / 2, thus ensuring quasi-linear frequency-temperature variation over a wide temperature range (typically in the range of 100 K). The acoustic wave sensor can be interrogated by any interrogator configured to determine a response spectrum from the interrogated acoustic wave sensor. The interrogated acoustic wave sensor can be, for example, a resonator device, such as a differential SAW sensor. Of course, the present invention can be implemented with any device using acoustic wave sensors or dielectric resonators, RLC circuits, etc.

[0034] An interrogation device (also called a unit) for interrogating one of the acoustic wave sensor devices of the present invention may include a transmitting antenna for transmitting an RF interrogation signal to the sensor device and a receiving antenna for receiving an RF response signal from the sensor device. The RF interrogation signal transmitted by the transmitting antenna may be generated by a signal generator, which may include an RF synthesizer or a controlled oscillator, and optionally, some kind of signal shaping module that provides appropriate frequency conversion and / or amplification of the signal transmitted by the transmitting antenna. The RF interrogation signal generated by the signal generator may be a pulsed or burst signal whose frequency is selected according to the resonant frequency of the acoustic wave sensor device. It should be noted that the emitting antenna and the receiving antenna may be the same antenna. In this case, the emitting and receiving processes should be synchronized with each other, for example, by a suitably controlled switch.

[0035] Furthermore, the interrogation device may comprise processing means connected to the receiving antenna. The processing means may comprise filtering means and / or amplifying means and may be configured to analyze the RF response signal received by the receiving antenna. For example, the sensor device operates at a resonant frequency of 434 MHz, 866 MHz, 915 MHz or 2.45 GHz (the ISM band).

[0036] The interrogation device can transmit a long RF pulse, and after transmission stops, the resonant cavity of the sensor device will f discharge at their resonant natural frequency with a time constant τ equal to πF / πF, where F is the center frequency and Q f is the quality factor of the resonance, and Q f corresponds to the ratio between the resonance center frequency and the half-width of the bandpass used in the interrogation process. For example, Q f corresponds to a resonance quality factor, which is estimated based on the real part of the resonator's admittance (the conductance) if the resonator is designed to operate at said resonance. A spectral analysis performed by the processing means of the interrogation device allows one or more resonator frequencies to be calculated, thereby sensing ambient parameters. The received RF response signal can be mixed by the processing means with the RF interrogation signal according to the so-called IQ protocol, as known in the art, to extract the real and imaginary parts (the in-phase component I=Ycosφ and the quadrature component Q=Ysinφ, with signal amplitude Y and signal phase φ), from which the modulus and phase can then be derived.

[0037] 2 to 5 show exemplary embodiments of the surface acoustic wave (SAW) sensor device of the present invention. The sensor devices 20, 30, 40, and 50 shown in FIGS. 2 to 5 are formed using a quartz material layer Q as a piezoelectric layer. The quartz material layer Q may be a quartz bulk substrate or a quartz layer formed on some non-piezoelectric bulk substrate, such as a Si substrate. The quartz material layer Q may also be part of a piezo-on-insulator (POI) substrate. The quartz layer may be bonded to the non-piezoelectric bulk substrate by a (dielectric) bonding layer, such as a silicon oxide layer. A so-called trap-rich layer (e.g., polycrystalline silicon) may be present at the interface with the non-piezoelectric bulk substrate.

[0038] The layer of quartz material Q includes an upper operative flat surface, the flat surface of the layer of quartz material Q being defined by a crystal cut of the quartz material of the layer of quartz material having an angle φ in the range of −14° to −24°, an angle θ in the range of −25° to −45°, and an angle ψ in the range of +8° to +28°, the angles being defined in accordance with IEEE 176 1949 Standards on Piezoelectric Crystals, 1949 from 12-12-1949. It is this particular family of cuts that provides, at least in part, the advantages described above.

[0039] 2-5, each of the SAW sensor devices includes a first resonator R1 having a first interdigitated (comb) transducer T1, a first Bragg mirror M1, and a second Bragg mirror M2, and a second resonator R2 having a second interdigitated (comb) transducer T2, a third Bragg mirror M3, and a fourth Bragg mirror M4. The transducers T1 and T2 may be connected to an antenna (not shown in FIG. 2) for receiving electromagnetic waves and converting them into surface acoustic waves, which are sensed again after reflection by the mirrors, converted back into RF signals, and transmitted by the antenna (or another antenna) to a reader as an RF response signal.

[0040] The first and second resonators R1 and R2 can be similar to each other. In particular, the first and second transducers T1, T2 can have the same number of electrodes and / or the same metallization ratio and / or the same openings and / or the same taper and / or electrode length. The first and second transducers T1, T2 can have different periods (separation distances between the individual electrodes) to obtain significant differences in the resonant frequencies of the first and second resonators R1, R2.

[0041] According to the present invention, the first and second resonators R1, R2 are inclined relative to each other, i.e., the first interdigitated transducer T1 formed on the flat surface of the quartz material layer Q, the first Bragg mirror M1 formed on the flat surface of the quartz material layer Q, and the second Bragg mirror M2 formed on the flat surface of the quartz material layer Q are arranged along a first axis, and the second interdigitated transducer T2 formed on the flat surface of the quartz material layer Q, the third Bragg mirror M3 formed on the flat surface of the quartz material layer Q, and the fourth Bragg mirror M4 formed on the flat surface of the quartz material layer Q are arranged along a second axis, and the first axis and the second axis are inclined relative to each other by a finite angle. The first axis corresponds to the axis at an angle ψ1, which defines the propagation direction of the acoustic waves along the axis X''', defined by rotating the axis X" of the quartz substrate by the angle ψ1. The second axis corresponds to the axis at an angle ψ2, which defines the propagation direction of the acoustic waves along the axis X''', defined by rotating the axis X" of the quartz substrate by the angle ψ2. The angles ψ1 and ψ2 are in the range of +8° to +28° of the angle ψ defined relative to the quartz substrate. The finite angle between the first and second axes may be in the range of 1° to 10°, in particular 1° to 6°, more particularly 2° to 4°, which will result in different propagation directions of the generated (surface) acoustic waves and, of course, different resonant frequencies of the first resonator R1 and the second resonator R2.

[0042] The surface acoustic wave sensors 20, 30, 40, and 50 shown in Figures 2-5 can operate in the Bragg condition, where the wavelength of the excited surface acoustic wave is several times the pitch of the interdigital electrodes of the interdigital transducers T1 and T2. When operation is performed in the Bragg condition, the interdigital transducers themselves essentially function as mirrors. However, in operating situations where the reflection coefficients of the transducers T1 and T2 are not strong enough to provide sufficient separation between the individual resonances, it is advantageous to split each of the transducers T1 and T2 into two parts and place an additional mirror between them. The improved cavity resonance separation provided by the split transducers and additional mirror is particularly useful for operation with Rayleigh waves or, more generally, elliptically polarized waves.

[0043] It should be noted that the electrodes of the first and second transducers T1 and T2 may be made of or include AlCu. For example, using a material with a relatively high atomic number, such as molybdenum, gold, platinum, or tungsten, may enable a larger reflection coefficient. Furthermore, it should be noted that the configurations of the acoustic wave sensor devices 20, 30, 40, and 50 shown in FIGS. 2-5 may include tapered transducers T1 and T2, in which the lateral extent of the electrodes varies along the length of the transducers T1 and T2 to suppress shear wave modes. Furthermore, additional mass loading may be provided at the edges of the electrodes to suppress shear wave modes.

[0044] According to different embodiments, the resonators R1 and R2 (transducers T1 and T2) can be connected in series or in parallel to each other. In the embodiment shown in FIG. 2, the resonators R1 and R2 of the acoustic wave sensor device 20 are connected in parallel to each other, and the respective electrodes of the mirrors M1, M2, M3, and M4 are connected to each other (short-circuited). In the embodiment shown in FIG. 3, the resonators R1 and R2 of the acoustic wave sensor device 30 are connected in parallel to each other, and the respective electrodes of the mirrors M1, M2, M3, and M4 are connected to ground. In the embodiment shown in FIG. 4, the resonators R1 and R2 of the acoustic wave sensor device 40 are connected in parallel to each other, and the respective electrodes of the mirrors M1, M2, M3, and M4 are not connected to each other. In the embodiment shown in FIG. 5, the resonators R1 and R2 of the acoustic wave sensor device 50 are connected in series to each other, and the respective electrodes of the mirrors M1, M2, M3, and M4 are connected to each other. In Figures 2 to 5, the electromagnetic waves received by transducers T1 and T2 for generating elastic waves (i.e., interrogation signals) are denoted by E1, and the inverse transformed elastic wave signals (i.e., response signals) are denoted by S1.

[0045] The configuration shown in Figures 2 to 5 allows accurate temperature sensing, for example, based on the variation of the resonant frequencies of resonators R1 and R2, and therefore the difference in resonant frequencies depending on the actual temperature.

[0046] 2 to 5, the mirrors M1, M2, M3, and M4 are arranged adjacent to the transducers T1 and T2. According to other embodiments, a resonant cavity is formed between the first transducer T1 and the first and second mirrors M1, M2, respectively, and / or a resonant cavity is formed between the second transducer T2 and the third and fourth mirrors M3, M4, respectively.

[0047] Figure 6 illustrates an exemplary embodiment similar to that illustrated in Figure 2. Unlike the configuration illustrated in Figure 2, in the embodiment illustrated in Figure 6, the acoustic wave sensor device 60 includes a first resonant cavity of length g1 formed between the first transducer T1 and the first mirror M1, and a second resonant cavity of length g2 formed between the first transducer T1 and the second mirror M2. Similarly, a third resonant cavity of length g3 is formed between the second transducer T2 and the third mirror M3, and a fourth resonant cavity of length g4 is formed between the second transducer T2 and the fourth mirror M4. Alternatively, the first resonator R1 or the second resonator R2 may only have resonant cavities of lengths g1 and g2, or resonant cavities of lengths g3 and g4, respectively.

[0048] In principle, the upper surface of the resonant cavity between the first transducer T1 and the first mirror M1 can include physical and / or chemical modifications compared to the upper surface of the resonant cavity between the first transducer T1 and the second mirror, or vice versa. Similarly, the upper surface of the resonant cavity between the second transducer T2 and the third mirror M3 can include physical and / or chemical modifications compared to the upper surface of the resonant cavity between the second transducer T2 and the fourth mirror M4, or vice versa. All or some of the cavities with lengths g1, g2, g3 and g4 may differ from one another with respect to physical and / or chemical modifications and / or extension lengths g1, g2, g3 and g4.

[0049] To achieve a propagating wave mode exhibiting differential parametric sensitivity, various means are available for physical and / or chemical modification. These means include, for example, forming a metallization layer and / or a passivation layer and / or achieving physical and / or chemical modification by local doping. For example, a metallization layer approximately 100 nm thick may be formed in the region of the resonant cavity with length g1, while no metallization layer may be formed in the resonant cavity with length g2. The metallization layer may be formed of the same material as the electrodes of the transducers T1 and T2 and / or the Bragg mirrors M1, M2, M3, and M4.

[0050] If the same materials are used for electrode formation and metallization of the comb transducers T1 and T2 and the Bragg mirror structures M1, M2, M3, and M4, these elements can all be deposited in the same deposition process. In other embodiments, different materials are used for the metallization. For example, one metallization or passivation layer of one material is formed on the first resonant cavity, and another metallization or passivation layer of another material is formed on the second resonant cavity of one or each of the resonators R1 and R2. According to another example, a positive temperature shift material, such as SiO2 or Ta2O5, is formed on one of the resonant cavities of one or each of the resonators R1 and R2, and a negative temperature shift material, such as Si3N4 or AlN, or no additional material is formed on the other resonant cavity.

[0051] Passivation may be achieved by forming a passivation layer made of or including Si3N4, Al2O3, or AlN. According to other embodiments, a material layer may be formed on both resonant cavities. Furthermore, the material layer formed on one or more resonant cavities may have a non-uniform thickness along the propagation direction of the acoustic wave. Furthermore, multiple layers may be formed on one or more resonant cavities. In this regard, it should be noted that, in general, providing a material layer on a resonant cavity can reduce the phase velocity of the acoustic wave due to mass loading effects, especially when using layers of materials with high atomic numbers such as Pt, Au, or W. This effect can be compensated for by adding a layer exhibiting a relatively high acoustic velocity, such as AlN, Si3N4, or Al2O3 adjacent to a quartz material layer. Different surface treatments result in different resonance characteristics, which can result in different sensitivities to the measurand, thus enabling differential measurements.

[0052] Alternatively, or in addition, the physical and / or chemical modification may include recessing one surface of the resonant cavity of the or each of the resonators R1 and R2 relative to the other surface of the resonant cavity.

[0053] The configurations shown in Figures 3-5 may also include first and / or second resonator resonant cavities as described above, according to alternative embodiments. For example, Figure 7 illustrates an acoustic wave sensor device 70 similar to the acoustic wave sensor device 30 shown in Figure 3, except that the first and second resonators R1, R2 include resonant cavities. Figure 8 illustrates an acoustic wave sensor device 80 similar to the acoustic wave sensor device 40 shown in Figure 4, except that the first and second resonators R1, R2 include resonant cavities. Figure 9 illustrates an acoustic wave sensor device 90 similar to the acoustic wave sensor device 50 shown in Figure 5, except that the first and second resonators R1, R2 include resonant cavities.

[0054] In the above-described embodiment shown in Figures 2-5, the Bragg mirrors M1, M2, M3, and M4 are provided as reflective structures. However, according to an alternative embodiment, one or more of the Bragg mirrors may be replaced with side / edge reflective structures for guiding pure shear modes. This allows for a very compact configuration in that Bragg reflection is replaced by planar reflection without energy loss or mode conversion. Configurations with side / edge reflective structures for guiding pure shear modes are particularly useful for sensing ambient parameters in liquids. Shear waves are well suited for probing in liquids. In particular, high-k materials (e.g., dielectric constant k greater than 30) and high coupling modes (>5%) are attractive for applications in liquids. According to another embodiment, one or more reflective structures are realized in the form of a short reflector including three or fewer electrodes.

[0055] Furthermore, it should be noted that a simple resonant cavity can be replaced by a cascaded resonant cavity containing multiple mirror electrode structures. The spectral distance between two resonances as well as the coupling coefficient of the resonances can be controlled by the mirror electrode structures and the number of resonant sub-cavities.

[0056] All the above-described embodiments are not intended to be limiting, but serve as examples illustrating the features and advantages of the present invention. It is understood that some or all of the above-described features can also be combined in different ways.

[0057] In this disclosure, crystal cuts are defined in accordance with the IEEE 176 1949 Standards on Piezoelectric Crystals, 1949 from 12-12-1949. In this standard, a crystal cut for SAW applications is uniquely defined by three angles: φ and θ, which define the rotation of the crystal according to the reference configuration of the crystal, and the propagation direction ψ, which is defined within the plane (φ, θ) indicating the direction in which the wave propagates and therefore the location of the transducer that can transmit the wave. Y and X denote the crystal axes that are considered as references for defining the initial state of the crystal plate. The first axis is perpendicular to the plate, and the second axis is along the length of the plate. The plate is assumed to be rectangular and is characterized by its length l, its width w, and its thickness t (see FIG. 10). Considering a given (YX) axis system, the length l is along the crystal axis X, the width w is along the Z axis, and the thickness t is along the Y axis. Note that the (YXwlt) / 0° / 0° / 0° case actually matches the configuration shown in FIG.

[0058] Now consider the general case of a triple turn or triple cut, assuming that no angle is zero. In this situation, the quartz crystal has a cutting plane (X", Z") defined in a reference system (X", Y", Z") relative to the cutting plane (X, Z), where X, Y, Z are the crystal axes of quartz, and the wave propagation direction is defined along the axis X"'", as shown in Figure 11, where a first cutting plane (X", Z") is defined by rotating the plane (X, Z) around the axis Z by an angle φ to define a first reference system (X', Y', Z') in which the axis Z' is the same as the axis Z, a second cutting plane (X", Z") is defined by rotating the plane (X', Z') around the axis X' by an angle θ to define a second reference system (X", Y", Z") in which the axis X" is the same as the axis X', and the propagation direction along the axis X"' is defined by rotating the plane (X", Z") around the axis Y" by an angle ψ of the axis X".

[0059] Below we review some symmetry rules for quartz. Quartz is a trigonal crystal of class 32. It is therefore characterized by a ternary axis, the Z axis, around which the following relationships can be established: (YXw) / φ=(YXw) / φ+120° The other two axes are dual, and therefore the following symmetry relations hold: (YXl) / θ=(YXl) / θ+180°, (YXt) / ψ=(YXt) / ψ+180° For simple geometric reasons, it is easy to show that the following sets of axes are equivalent: (YXwlt) / +φ / < +θ / +ψ=(YXwlt) / -φ / < +θ / -ψ In fact, if we assume that the top face is identified by the positive sign of φ (the plane along which the surface waves are assumed to propagate), the bottom face of the plate is obtained by changing the sign to negative. Considering that the sign of ψ remains unchanged by the symmetry operation, the sign ψ is in fact rotated by 180°, although it is assumed that the direction of Z''' on the bottom side remains unchanged. Therefore, to recover the situation on the top face, it is necessary to apply a 180° rotation to ψ, which is in fact equivalent to a change of sign. Note that for crystal cuts without rotation around Z (φ=0°), the following symmetry is valid:

[0060] (YXlt) / +θ / +ψ=(YXlt) / +θ / -ψ.

Claims

1. a layer of quartz material including a flat surface; a first interdigitated transducer (T1) formed on the planar surface of the quartz material layer, a first reflective structure (M1) formed on the planar surface of the quartz material layer, and a second reflective structure (M2) formed on the planar surface of the quartz material layer, arranged along a first axis; a second interdigitated transducer (T2) formed on the planar surface of the quartz material layer, arranged along a second axis; a third reflective structure (M3) formed on the planar surface of the quartz material layer; and a fourth reflective structure (M4) formed on the planar surface of the quartz material layer; Equipped with the first axis and the second axis are inclined at a finite angle to each other; the flat surface of the quartz material layer is defined by a crystal cut of the quartz material of the quartz material layer having an angle φ in the range of −14° to −24°, an angle θ in the range of −25° to −45°, and an angle ψ in the range of +8° to +28°; An acoustic wave sensor device (20, 30, 40, 50, 60, 70, 80, 90).

2. The acoustic wave sensor device (20, 30, 40, 50, 60, 70, 80, 90) of claim 1, wherein the layer of quartz material is a bulk substrate.

3. The acoustic wave sensor device (20, 30, 40, 50, 60, 70, 80, 90) of claim 2, further comprising a bulk substrate, the quartz material layer being formed on the bulk substrate.

4. 4. The acoustic wave sensor device (20, 30, 40, 50, 60, 70, 80, 90) according to any one of claims 1 to 3, wherein the first (T1) and second (T2) interdigitated transducers have the same number of electrodes and / or the same metallization ratio and / or the same openings and / or the same taper and / or electrode length.

5. The acoustic wave sensor device (20, 30, 40, 50, 60, 70, 80, 90) according to any one of claims 1 to 4, wherein at least one of the first reflecting structure (M1), the second reflecting structure (M2), the third reflecting structure (M3), and the fourth reflecting structure (M4) includes or is composed of a Bragg mirror.

6. 6. The acoustic wave sensor device of claim 5, wherein the first reflecting structure (M1) is comprised of a first Bragg mirror, the second reflecting structure (M2) is comprised of a second Bragg mirror, the third reflecting structure (M3) is comprised of a third Bragg mirror, and the fourth reflecting structure (M4) is comprised of a fourth Bragg mirror, and all of the first, second, third, and fourth Bragg mirrors have the same number and / or length of electrodes.

7. The first reflective structure (M1) is composed of a first Bragg mirror, the second reflective structure (M2) is composed of a second Bragg mirror, the third reflective structure (M3) is composed of a third Bragg mirror, and the fourth reflective structure (M4) is composed of a fourth Bragg mirror, and the electrodes of the first, second, third, and fourth Bragg mirrors are each a) connected to each other, or b) grounded, or c) are not connected to each other or grounded; 7. An acoustic wave sensor device (20, 30, 40, 50, 60, 70, 80, 90) according to claim 6.

8. The acoustic wave sensor device (20, 30, 40, 50, 60, 70, 80, 90) according to any one of claims 1 to 7, wherein the first reflective structure (M1) and the second reflective structure (M2) are formed adjacent to the first interdigitated transducer (T1), and the third reflective structure (M3) and the fourth reflective structure (M4) are arranged adjacent to the second interdigitated transducer (T2).

9. a first resonant cavity (g1) is formed between the first interdigitated transducer (T1) and the first reflecting structure (M1), and a second resonant cavity (g2) is formed between the first interdigitated transducer (T1) and the second reflecting structure (M2); a third resonant cavity (g3) is formed between the second interdigitated transducer (T2) and the third reflecting structure (M3), and a fourth resonant cavity (g4) is formed between the second interdigitated transducer (T2) and the fourth reflecting structure (M4); An acoustic wave sensor device (60, 70, 80, 90) according to any one of claims 1 to 7.

10. the upper surface of the second resonant cavity (g2) comprises physical and / or chemical modifications compared to the upper surface of the first resonant cavity (g1); and / or the top surface of the fourth resonant cavity (g4) comprises physical and / or chemical modifications compared to the top surface of the third resonant cavity (g3); 10. An acoustic wave sensor device (60, 70, 80, 90) according to claim 9.

11. 11. The acoustic wave sensor device (60, 70, 80, 90) of claim 10, wherein the physical and / or chemical modification comprises a metallization or passivation layer formed on the top surface of the second resonant cavity (g2) and / or the fourth resonant cavity (g4).

12. The acoustic wave sensor device (60, 70, 80, 90) according to any one of claims 9 to 11, wherein the first resonant cavity (g1) and the second resonant cavity (g2) have different extension lengths.

13. The acoustic wave sensor device (20, 30, 40, 50, 60, 70, 80, 90) according to any one of claims 1 to 12, wherein the first transducer (T1) and the second transducer (T2) are connected to each other in series or in parallel.

14. 14. The acoustic wave sensor device (20, 30, 40, 50, 60, 70, 80, 90) according to any one of claims 1 to 13, wherein the acoustic wave sensor device (20, 30, 40, 50, 60, 70, 80, 90) is a passive surface acoustic wave sensor device configured to sense an ambient parameter selected from one of temperature, chemical species, strain, pressure, torque of a rotating shaft, and acceleration or frequency vibration of a vibrating part.

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