Processing equipment and method for manufacturing electrodes for battery cells

Abstract

To provide a processing apparatus and method for manufacturing electrodes for battery cells that allow for quality inspection of electrodes with less lost material compared to conventional techniques.SOLUTION: The invention relates to a processing arrangement for producing electrodes for battery cells, in which a conductor foil 1 can be continuously guided as an endless strip through processing stations, in particular to produce electrode strips E which are separated and / or cut into electrodes in a final cutting station. According to the invention, this processing device has a measuring station M with at least one measuring device 4, in which the resistivity ρ of an active material layer 3 and / or the contact resistance Ω of the active material layer 3 to the conductor foil 1 or values related thereto can be measured.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to a processing device for manufacturing electrodes for battery cells according to the preamble of claim 1 and to a method for manufacturing such electrodes according to claim 9. [Background technology]

[0002] Lithium-ion battery cell electrodes can be mass-produced in a continuous process in which a conductive foil is continuously fed as an endless strip through a coating station, where the conductive foil is coated on one or both sides with active material. The electrode strip then passes through a drying station, where the active material coated on the conductive foil is dried. This is followed by a calendering station, where the active material coated on the conductive foil is compressed to a predefined layer thickness. The continuous process ends at a cutting station, where the electrode strip is separated and / or cut into electrodes. The electrodes thus produced are then combined into electrode / separator stacks, which can be assembled into battery cells.

[0003] The magnitude of the internal resistance of such a battery cell is important for its performance. The internal resistance of a battery cell is affected, inter alia, by the specific resistance of the active material of the electrode and the contact resistance of the active material layer with the conductive foil. For measuring the specific resistance and contact resistance of the active material layer, a HIOKI analyzer is known (see the pamphlet "HIOKI Electrode Resistance Measurement System RM2610"), which can be used to measure the specific resistance and contact resistance of already manufactured electrodes in a random sampling manner. If the analyzer detects excessively high measured values ​​for the specific resistance or contact resistance, all of the already manufactured electrodes for the entire coating process group in one production section must be sent to a material disposal department and therefore can no longer be used for further battery production.

[0004] From US Pat. No. 5,629,599 a method and device for measuring the thickness of a coating on a substrate are known, which method can also be used in particular to measure the layer thickness of an active material layer on a conductor foil for the production of electrodes. [Prior art documents] [Patent documents]

[0005] [Patent Document 1] German Patent Publication No. 102014006870 Summary of the Invention [Problem to be solved by the invention]

[0006] It is an object of the present invention to provide a processing apparatus and method for manufacturing electrodes for battery cells, which allows quality inspection of the electrodes to be carried out with less lost material compared to the prior art. [Means for solving the problem]

[0007] This problem is solved by the features of claim 1 or claim 10. Advantageous refinements of the invention are disclosed in the dependent claims.

[0008] The present invention takes as its starting point a processing device for producing electrodes for battery cells. In this manufacturing process, a conductive foil is continuously guided as an endless strip through processing stations, in particular so as to produce electrode strips. These electrode strips are separated and / or cut into electrodes in a final cutting station. According to the characterizing part of claim 1, the processing device has an integrated measuring station with a measuring device, in which the resistivity of the active material layer and / or the contact resistance of the active material layer to the conductive foil or related values ​​are measured.

[0009] Unlike the prior art, the measurement process according to the present invention is not performed on the manufactured electrodes until later. Rather, it is performed directly on the electrode strip before it is fed to the cutting station, i.e., before the electrode is even completed. In this way, an "in-line" quality inspection of the resistivity or contact resistance between the foil and the coating is provided. If the measurement station detects a quality problem in one electrode strip section, that electrode strip section is sent to a material disposal unit, while the other electrode strip sections (inspected as normal) from the same coating processing group proceed with the standard process for manufacturing electrodes. In this way, material loss during electrode manufacturing can be significantly reduced compared to the prior art.

[0010] In one technical embodiment, the processing device can comprise as processing stations a coating station capable of applying active material to one or both sides of the conductor foil in the form of an endless strip, a drying station for drying the layer of active material applied to the conductor foil, and a calendering station for compressing the active material applied to the conductor foil to a predefined layer thickness, which is connected indirectly or directly after a cutting station for separating the electrode strips into electrodes.

[0011] This measuring station for measuring the resistivity and / or contact resistance can advantageously be arranged just before or just after the calendering station, so that, if necessary, the resistivity and contact resistance can be detected early in the process, particularly advantageously as early as before the electrode strip passes through the calendering station.

[0012] The measuring station integrated into the processing device can have an evaluation unit in which the resistance measurement value detected by the measuring device is compared with a target value stored in the evaluation unit. If the deviation of the actually detected resistance measurement value is significant, the actually measured electrode strip portion can be removed from the normal electrode production section and sent to a material disposal section, while the other electrode strip portions with normal resistance measurements can be used for further battery cell production.

[0013] This measuring device can be implemented in the form of a HIOKI analyzer (see the HIOKI Electrode Resistance Measurement System RM2610 brochure). In this case, the measuring device can include at least one microelectrode array, the electrodes of which are brought into non-destructive contact with the surface of the active material layer of the electrode strip during the measurement. This microelectrode array can be divided into a voltage measurement array and a current measurement array. Thus, voltage and current measurements can be performed independently. This microelectrode array can thus be used to apply a predefined current to multiple points on the electrode strip. The resulting potential distribution can be detected at multiple measurement points on the surface of the active material layer using the electrodes of the voltage measurement array. In this measurement process, the current flows not only through the conductive foil but also through the active material layer, making it possible to measure both the contact resistance and the specific resistance.

[0014] The microelectrode array can be assigned a calculation unit, which receives data on the measured current, the measured potential distribution, the active material layer thickness, and the resistivity of the conductive foil, performs an FEM simulation based on this data, and calculates the actual measured resistivity and contact resistance of the electrode strips based on this simulation.

[0015] In one particular variant, the measuring station can comprise a roller device consisting of at least one measuring roller, over which the electrode strip runs. In this case, the measuring device can be arranged directly on the circumference of the measuring roller, which allows for process-technologically simple "in-line" quality inspection.

[0016] For process-reliable quality inspection, the measuring device can be arranged not directly on the rigid base of the measuring roller, but rather on the base of the measuring roller via a resilient buffer. This buffer acts in the form of an overload protection spring, so that the measuring device is always pressed against the active material layer of the endless strip with a predefined pressing force determined by the spring constant of the resilient buffer. In this case, the measuring process can be carried out operationally reliably, regardless of the tolerances for the layer thickness of the active material layer.

[0017] The outer circumference of the measuring roller other than the measuring device can be covered with an abrasion-resistant coating, thus preventing wear of the roller material which could cause contamination of the active material layer.

[0018] To improve the measurement accuracy, it is advantageous if the roller device comprises two measuring rollers over which both sides of the electrode strip run, in which case one side of the electrode strip can be brought into contact for measurement with the first measuring roller, while the other side of the electrode strip can be brought into contact for measurement with the second measuring roller.

[0019] Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings. [Brief explanation of the drawings]

[0020] [Figure 1] 1 is a schematic diagram illustrating a measurement station of a processing device according to the present invention; [Figure 2] 1 is a schematic diagram illustrating a measurement station of a processing device according to the present invention; [Figure 3] 1 is a schematic diagram illustrating a measurement station of a processing device according to the present invention; [Figure 4] 1 is a schematic diagram illustrating a measurement station of a processing device according to the present invention; [Figure 5] 1 is a schematic diagram illustrating a measurement station of a processing device according to the present invention; DETAILED DESCRIPTION OF THE INVENTION

[0021] FIG. 1 shows a measuring station M for quality control, which is a component of a processing apparatus (not shown in detail) for producing electrodes for battery cells in a continuous process. In addition to the measuring station M, the processing apparatus also includes further processing stations (not shown), namely a coating station, a drying station, a calendering station, and a cutting station. In the coating station, an endless strip of conductor foil 1 is coated on one or both sides with an active material layer 3, specifically to form an electrode strip E. In a further process flow, the electrode strip E is guided through a drying station, where the active material layer 3 applied to the conductor foil 1 is dried. The electrode strip E is then guided through a calendering station, where the active material layer 3 applied to the conductor foil 1 is compressed to a predefined layer thickness. This is followed by a cutting station, where the electrode strip E is separated or cut into electrodes.

[0022] The measuring device 4 of this measuring station M can be used to measure the resistivity ρ of the active material layer 3 and the contact resistance Ω of the active material layer 3 to the conductor foil 1. The essence of the invention is that the measuring station M is integrated into a processing device for continuous production of electrodes, which allows the measuring process to be carried out "in-line", i.e. directly on the electrode strip E during the continuous production process, i.e. as early as at a process point before the electrode is completed.

[0023] As can be further seen from FIG. 1, the measuring station M comprises a roller arrangement consisting of two measuring rollers 5, 7, over which both sides of the electrode strip E run. That is, according to FIG. 1, one side of the electrode strip E can be brought into contact with the first measuring roller 5 for measurement, while the other side of the electrode strip E can be brought into contact with the second measuring roller 7 for measurement. These measuring rollers 5, 7 are equipped with measuring devices 4 distributed around the circumference of each measuring roller 5, 7. The current-carrying contacts of these measuring devices 4 can be integrated into each measuring roller 5, 7, for example, by cable connection or via battery solution. Furthermore, after the two measuring rollers 5, 7 in FIG. 1, a precision thickness gauge 17 is connected, by means of which the local thickness of the electrode strip E is determined.

[0024] One of these measuring devices 4 is illustrated in detail in FIGS. 2 to 5. It is realized as a chip with an electrode array 11, which is shown only in FIGS. 2 to 4 as a schematic representation necessary for understanding the present invention. The overall width of the chip 4 is defined as being of the same order of magnitude as the thickness of the coating. Furthermore, in FIG. 2, the chip 4 is a component of a flexible printed circuit (FPC) design, which consists of a thin, flexible plastic substrate 9 on which electrical conductor tracks and the chip 4 are attached. The chip 4 has a microelectrode array 11, which is divided into a current measuring array 13 and a voltage measuring array 15. The current measuring array 13 consists of outer current measuring electrodes on the periphery, while the voltage measuring array 15 consists of inner voltage measuring electrodes surrounded by outer current measuring electrodes. Thus, current and voltage measurements are performed independently using the current measuring array 13 and the voltage measuring array 15. During the measurement process (FIG. 5), the electrodes of the microelectrode array 11 are brought into non-destructive contact with the surface of the active material layer 3 of the electrode strip E. Using this microelectrode array 11, a predefined current I is applied to multiple points on the electrode strip portion to be actually measured. The resulting potential distribution is detected by the electrodes of the voltage measurement array 15 at multiple measurement points on the surface of the active material layer 3.

[0025] The electrodes of the outer current measuring array 13 can be selectively used as a current source or sink during the measurement process, while the electrodes of the inner voltage measuring array 15 can be used for voltage measurement. In this case, each electrode can have an individually drivable or readable channel (which can also be coded). The signal connection between the electrodes of the chip 4 and the evaluation unit 19 can be realized based on digital signal coding via inductive contacts connected wirelessly (5G, Wifi) or by wire.

[0026] 1, this measuring device 4 is assigned a calculation unit 16, which can read the data detected by the current measuring array 13 and the voltage measuring array 15, as well as the data detected by the thickness measuring device 17 of the electrode strip E (i.e., the measured thickness s of the electrode strip). Based on these data and the resistivity of the conductor foil 1, this calculation unit 16 calculates the actually measured resistivity ρ of the active material layer 3 of the electrode strip part and the contact resistance Ω of the active material layer 3 to the conductor foil. This calculation unit 16 works using a local FEM simulation. Thus, in this calculation unit 16, a simulation of the active material layer 3 underlying the chip 4 is performed using a simulation model and layer thickness measurements.

[0027] These calculated resistance values ​​ρ,Ω are sent to an evaluation unit 19, which converts the resistance values ​​ρ,Ω into their corresponding target values ​​ρ soll ,Ω soll If the deviation of the resistance measurement detected in practice is significant, this actually measured electrode strip portion is not used for further electrode production, but rather is sent to a material disposal unit. If the actual resistance measurement ρ,Ω does not deviate significantly from the target value ρ,Ω, soll ,Ω soll If the actual measured electrode strip portion is within the range of 0.1 mm, this actual measured electrode strip portion is used for further battery cell manufacturing.

[0028] 5, the current I between the current measurement electrodes of the current measurement array 13 is indicated by a dashed line, which shows that the current I does not flow only through the conductor foil 1 but also through the active material layer 3, so that both the resistivity ρ of the active material layer 3 and the contact resistance Ω of the active material layer 3 to the conductor foil 1 can be measured with high precision.

[0029] FIG. 2 shows the material structure of the measuring rollers 5, 7 in a roughly schematic manner. Each measuring roller 5, 7 has a rigid substrate 21. The flexible printed circuit (FPC) design is not directly attached to the rigid substrate 21 of the measuring roller 5, but rather via an elastically flexible buffer 23. This buffer 23 acts as an overload protection spring, ensuring that the measuring device 4 (i.e., the chip) is always pressed against the active material layer 3 of the endless strip E with a predefined pressure, regardless of, for example, the tolerances of the layer thickness s of the electrode strip E. Furthermore, the measuring roller 5 is covered on its outer periphery, excluding the measuring device 4, with a wear-resistant coating 25 (e.g., made of PTFE), which prevents wear of the roller material during operation, which could lead to contamination of the active material layer 3.

[0030] Alternatively to the illustrated embodiment, the tip 4 can be attached directly to the measuring rollers 5, 7 or embedded in a solid layer. This roller structure can also be realized without the wear-resistant layer 25. Furthermore, instead of PTFE, the wear-resistant layer 25 can also be realized by a metal, for example, chromium, nickel, or by a ceramic coating. Another embodiment is a tip with spring-loaded individual contacts. This can be ensured by any type of spring. It is important that no electrical contact occurs between the different electrodes during operation. The present application relates to the invention described in the claims, but may also include the following configurations as other aspects. 1. 1. A processing apparatus for producing electrodes for battery cells, in which a conductive foil (1) can be continuously guided as an endless strip through processing stations, in particular to produce electrode strips (E) that are separated and / or cut into electrodes in a final cutting station, the processing device has a measuring station (M) equipped with at least one measuring device (4), and the measuring station is capable of measuring the specific resistance (ρ) of the active material layer (3) and / or the contact resistance (Ω) of the active material layer (3) to the conductive foil (1), or values ​​related thereto; In particular, this processing device allows this measurement process to be carried out directly (in-line) on the electrode strip (E), i.e. before the electrode is completed. 2. In the processing device described in 1 above, This processing device serves as a processing station. a coating station capable of applying an active material layer (3) to one or both sides of the conductive foil (1); a drying station for drying the active material layer (3) coated on the conductive foil (1); a calendering station capable of compressing the active material layer (3) applied on the conductive foil (1) to a predefined layer thickness; and The processing device, in which the cutting station is connected after the calendering station in terms of process technology. 3. In the processing device according to 1 or 2 above, The processing device, wherein the measuring station (M) is connected immediately before and / or after the calendering station in terms of process technology, so that the resistivity (ρ) or contact resistance (Ω) can be measured before and / or after calendering. 4. In the processing device according to 1, 2 or 3 above, The measuring station (M) converts the resistance measurement value (ρ, Ω) detected by the measuring instrument (4) into a target value (ρ soll, Ω soll ) and an evaluation unit (19) for comparing the In particular, when the deviation of the actually detected resistance measurement value (ρ, Ω) is significant, the actually measured electrode strip portion is sent to a material disposal section instead of being used for manufacturing electrodes. 5. In the processing apparatus according to any one of 1 to 4 above, The measuring device (4) comprises at least one microelectrode array (11), and the electrodes of the microelectrode array (11) are in non-destructive contact with the surface of the active material layer (3) during measurement. 6. 6. In the processing device according to item 5 above, Using the microelectrode array (11), a predefined current (I) can be applied to a plurality of points on the electrode strip portion, and the resulting potential distribution can be detected at a plurality of measurement points on the surface of the active material layer (3); The microelectrode array (11) is divided into a current measurement array (13) in which electrodes act as a current source and a current sink for generating a current (I), and a voltage measurement array (15) in which electrodes measure the potential distribution resulting from the current (I); and a calculation unit (16) assigned to the microelectrode array (11) for calculating the resistivity (ρ) and contact resistance (Ω) of the active material layer (3) based on the current (I), the detected potential distribution, the layer thickness (s) of the active material layer (3) and the resistivity of the conductive foil (1), in particular using FEM simulation. 7. In the processing apparatus according to any one of 1 to 6 above, the measuring station (M) comprises a roller device with at least one measuring roller (5, 7), on which the electrode strip (E) runs, In particular, the measuring device (4) is arranged on the outer periphery of the measuring rollers (5, 7) or the measuring station (M) is provided with a slider that can be linearly shifted in conjunction with the movement of the electrode strip (E), by means of which slider the measuring device (4) can contact the electrode strip (E) for measurement over a linear measurement section. 8. 8. In the processing device according to item 7 above, the measuring device (4) is not arranged directly on the rigid substrate (21) of the measuring roller (5, 7), but is arranged on the substrate (21) of the measuring roller (5, 7) via an elastically flexible buffer material (23), so that the measuring device (4) is pressed against the active material layer (3) of the electrode strip (E) with a predefined pressing force, in particular, advantageously regardless of the tolerances for the thickness of the active material layer (3); and the outer periphery of the measuring roller (5, 7), in particular, is covered with an abrasion-resistant coating (25) in areas other than the measuring device (4) to prevent contamination of the active material layer (3) due to wear of the roller material; the roller device comprises two measuring rollers (5, 7), and both sides of the electrode strip (E) run on these measuring rollers, so that one side of the electrode strip (E) can come into contact with the first measuring roller (5) for measurement, and the other side of the electrode strip (E) can come into contact with the second measuring roller (7) for measurement. 9. A method for manufacturing an electrode using the processing apparatus according to any one of 1 to 8 above. [Explanation of symbols]

[0031] 1 Conductive foil 3 Active material layer 4 Measuring instrument 5,7 Measuring roller 9 Plastic substrate 11 Microelectrode Array 13 Current Measurement Array 15 Voltage Measurement Array 16 computing units 17 Thickness measurement section 19 Evaluation Units 21 Roller base material 23 Cushioning material 25 Wear-resistant coating E Electrode Strips M Measuring Station FPC Flexible Printed Circuit Board Design Department ρ specific resistance Ω Contact resistance s layer thickness of electrode strip E I current

Claims

1. 1. A processing device for manufacturing electrodes for battery cells, in which a conductive foil (1) can be guided as an endless strip continuously through processing stations to produce electrode strips (E) that are separated and / or cut into electrodes at a final cutting station, comprising: the processing device has a measuring station (M) equipped with at least one measuring device (4), in which the resistivity (ρ) of the active material layer (3) and / or the contact resistance (Ω) of the active material layer (3) to the conductive foil (1), or values ​​related thereto, can be measured; The measurement process can be carried out directly on the electrode strip (E) in-line before the electrode is completed, the measuring station (M) comprises a roller device with at least one measuring roller (5, 7), on which the electrode strip (E) runs, and the measuring device (4) is arranged on the outer periphery of the measuring roller (5, 7), The measuring device (4) is not placed directly on the rigid substrate (21) of the measuring roller (5, 7), but is placed on the substrate (21) of the measuring roller (5, 7) with an elastically flexible buffer material (23) in between, so that the measuring device (4) is pressed against the active material layer (3) of the electrode strip (E) with a predefined pressing force.

2. A processing device as described in claim 1, wherein the measuring device (4) is pressed against the active material layer (3) of the electrode strip (E) with a predefined pressing force regardless of the allowable deviation in the layer thickness of the active material layer (3).

3. This processing device serves as a processing station. a coating station capable of applying an active material layer (3) to one or both sides of the conductive foil (1); a drying station for drying the active material layer (3) coated on the conductive foil (1); a calendering station capable of compressing the active material layer (3) applied on the conductive foil (1) to a predefined layer thickness; and 2. The processing device according to claim 1, wherein the cutting station is connected process-technically after a calendering station.

4. A processing device as described in Claim 3, characterized in that the measuring station (M) is connected immediately before and / or immediately after the calendar treatment station in terms of process technology, so that the resistivity (ρ) or contact resistance (Ω) can be measured before and / or after the calendar treatment.

5. The measuring station (M) converts the resistance measurement value (ρ, Ω) detected by the measuring instrument (4) into a target value (ρ ｓｏｌｌ , Ω ｓｏｌｌ 5. The processing device according to claim 1, further comprising an evaluation unit (19) for comparing the signal with the signal.

6. A processing device as described in Claim 5, characterized in that if the deviation of the actually detected resistance measurement value (ρ, Ω) is significant, the actually measured electrode strip portion is sent to a material disposal section rather than being used for manufacturing electrodes.

7. A processing device described in any one of claims 1 to 4, characterized in that the measuring device (4) has at least one microelectrode array (11), and the electrodes of the microelectrode array (11) come into non-destructive contact with the surface of the active material layer (3) during measurement.

8. Using the microelectrode array (11), it is possible to apply a predefined current (I) to multiple points on the electrode strip portion, and the resulting potential distribution can be detected at multiple measurement points on the surface of the active material layer (3); The microelectrode array (11) is divided into a current measurement array (13) in which electrodes act as a current source and a current sink for generating a current (I), and a voltage measurement array (15) in which electrodes measure the potential distribution resulting from the current (I); and a calculation unit (16) assigned to the microelectrode array (11) for calculating the resistivity (ρ) and contact resistance (Ω) of the active material layer (3) based on the current (I), the detected potential distribution, the layer thickness (s) of the active material layer (3) and the resistivity of the conductor foil (1).

9. A processing device as described in claim 8, characterized in that the calculation unit (16) calculates the specific resistance (ρ) and contact resistance (Ω) of the active material layer (3) using FEM simulation.

10. The outer periphery of the measuring roller (5, 7) is covered with an abrasion-resistant coating (25) in areas other than the measuring device (4) to prevent contamination of the active material layer (3) due to wear of the roller material; 5. The processing device according to claim 1, wherein the roller device comprises two measuring rollers (5, 7), on both sides of the electrode strip (E) running on these measuring rollers, so that one side of the electrode strip (E) can come into contact with the first measuring roller (5) for measurement and the other side of the electrode strip (E) can come into contact with the second measuring roller (7) for measurement.

11. A method for manufacturing an electrode in a processing apparatus according to any one of claims 1 to 4.

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