Methods for calibrating peripheral circuits, memory devices, and resistance offsets

Abstract

According to one aspect of the present disclosure, A synchronous dynamic random access memory (SDRAM) is provided that includes peripheral circuitry, the peripheral circuitry including a DQ circuit that includes a plurality of decision feedback equalization (DFE) components. can The peripheral circuitry is , resistance Resistor Offset Calibration (RXOC) Circuit Including nothing can The RXOC circuit is , an oscillator. The oscillator can generate an internal clock source. The RXOC circuit can include a DQ selection component. The DQ selection component can include: Selecting a DFE component among a plurality of DFE components for calibration can The DQ selection component can output a slicer result signal that indicates the value of the offset received from the DFE component. , and control logic. The control logic may include Transmitting a calibration signal associated with the DFE component to the DQ circuit based on the slicer result signal. can .

Description

Background Art

[0001] The present disclosure relates to a memory device and an operation method thereof.

[0002] DQ Resistance offset Offset calibration training for adjusting calibration (RXOC) training can be performed during the power-on and initialization training sequence to handle state changes of a static dynamic random access memory (SDRAM).

Summary of the Invention

[0003] According to one aspect of the present disclosure, a peripheral circuit is provided. The peripheral circuit may include a DQ circuit including a plurality of decision feedback equalization (DFE) components. The peripheral circuit Resistance offset may include a calibration (RXOC) circuit. The RXOC circuit may include an oscillator. The oscillator may be configured to generate an internal clock source. The RXOC circuit may include a DQ selection component. The DQ selection component may be configured to select a DFE component among the plurality of DFE components for calibration. The DQ selection component may be configured to output a slicer result signal indicating a value of an offset received from the DFE component. The RXOC circuit may include control logic. The control logic may be configured to transmit a calibration signal associated with the DFE component to the DQ circuit based on the slicer result signal.

[0004] In some embodiments, the DQ selection component may include a first multiplexer (MUX) and a second MUX. In some embodiments, the first MUX is configured to select a DQ circuit. In some embodiments, the second MUX is configured to select a DFE component of the DQ circuit.

[0005] In some embodiments, the control logic may be further configured to receive the slicer result signal at a first edge of a clock cycle associated with the internal clock source.

[0006] In some embodiments, the control logic may be further configured to perform a binary search based on the slicer result signal to identify the pull-up or pull-down code of the DFE component.

[0007] In some embodiments, the control logic may be further configured to send a calibration signal to the DQ circuit on a second edge of a clock cycle associated with an internal clock source. In some embodiments, the first edge may be either a rising edge or a falling edge. In some embodiments, the second edge may be the other of either a rising edge or a falling edge. In some embodiments, the calibration signal may include a pull-up code or a pull-down code.

[0008] In some embodiments, the DQ circuit may be further configured to calibrate the DFE components based on pull-up or pull-down codes included in a calibration signal received from the control logic at the second edge of the clock cycle.

[0009] In some embodiments, the oscillator may be further configured to receive the RXOC engagement signal. In some embodiments, an internal clock source may be generated in response to receiving the RXOC engagement command.

[0010] In some embodiments, the oscillator can be made to generate an internal clock source without column-addressed strobe (CAS) commands.

[0011] A memory device is provided according to another aspect of the present disclosure. The memory device may include a memory array and peripheral circuits coupled to the memory array. The peripheral circuits may include a DQ circuit comprising a plurality of DFE components. The peripheral circuits may include an RXOC circuit. The RXOC circuit may include an oscillator. The oscillator may be configured to generate an internal clock source. The RXOC circuit may include a DQ selection component. The DQ selection component may be configured to select a DFE component from a plurality of DFE components for calibration. The DQ selection component may be configured to output a slicer result signal indicating the offset value received from the DFE components. The RXOC circuit may include control logic. The control logic may be configured to transmit a calibration signal associated with the DFE components to the DQ circuit based on the slicer result signal.

[0012] In some embodiments, the DQ selection component may include a first MUX and a second MUX. In some embodiments, the first MUX is configured to select a DQ circuit. In some embodiments, the second MUX is configured to select a DFE component of the DQ circuit.

[0013] In some embodiments, the control logic may be further configured to receive the slicer result signal at the first edge of a clock cycle associated with an internal clock source.

[0014] In some embodiments, the control logic may be further configured to perform a binary search based on the slicer result signal to identify the pull-up or pull-down code of the DFE component.

[0015] In some embodiments, the control logic may be further configured to send a calibration signal to the DQ circuit on a second edge of a clock cycle associated with an internal clock source. In some embodiments, the first edge may be either a rising edge or a falling edge. In some embodiments, the second edge may be the other of either a rising edge or a falling edge. In some embodiments, the calibration signal may include a pull-up code or a pull-down code.

[0016] In some embodiments, the DQ circuit may be further configured to calibrate the DFE components based on pull-up or pull-down codes included in a calibration signal received from the control logic at the second edge of the clock cycle.

[0017] In some embodiments, the oscillator may be further configured to receive the RXOC engagement signal. In some embodiments, an internal clock source may be generated in response to receiving the RXOC engagement command.

[0018] In some embodiments, the oscillator can be made to generate an internal clock source without a CAS command.

[0019] A further aspect of this disclosure provides a method for RXOC using peripheral circuits. The method may include generating an internal clock source by an oscillator in the RXOC circuit. The method may include selecting a DFE component from a plurality of DFE components of the DQ circuit for calibration by a DQ selection component of the RXOC circuit. The method may include outputting a slicer result signal by the DQ selection component of the RXOC circuit indicating the offset value received from the DFE component. The method may include transmitting a calibration signal associated with the DFE component to the DQ circuit based on the slicer result signal by the control logic of the RXOC circuit.

[0020] In some embodiments, the DQ selection component may include a first MUX and a second MUX. In some embodiments, the first MUX may be configured to select a DQ circuit. In some embodiments, the second MUX may be configured to select a DFE component of a DQ circuit.

[0021] In some embodiments, the method may include receiving the slicer result signal at the first edge of a clock cycle associated with an internal clock source by the control logic of the RXOC circuit.

[0022] In some embodiments, the method may include using the control logic of the RXOC circuit to perform a binary search based on the slicer result signal to identify the pull-up or pull-down code of the DFE component.

[0023] In some embodiments, the method may include the control logic of the RXOC circuit sending a calibration signal to the DQ circuit on the second edge of a clock cycle associated with the internal clock source. In some embodiments, the first edge may be either a rising edge or a falling edge. In some embodiments, the second edge may be the other of either a rising edge or a falling edge. In some embodiments, the calibration signal may include a pull-up code or a pull-down code.

[0024] In some embodiments, the method may include calibrating the DFE components based on pull-up or pull-down codes included in a calibration signal received from the control logic at the second edge of a clock cycle by the DQ circuit of the RXOC circuit.

[0025] In some embodiments, the method may include receiving an RXOC engagement signal by an oscillator in the RXOC circuit. In some embodiments, an internal clock source may be generated in response to receiving an RXOC engage command.

[0026] In some embodiments, the oscillator can generate an internal clock source without a CAS command.

[0027] According to yet another aspect of the present disclosure, a memory system is provided. The memory system may include a memory array and peripheral circuitry. The peripheral circuitry may include a DQ circuit having a plurality of DFE components. The peripheral circuitry may include an RXOC circuit. The RXOC circuit may include an oscillator. The oscillator may be configured to generate an internal clock source. The RXOC circuit may include a DQ selection component. The DQ selection component may be configured to select a DFE component among the plurality of DFE components for calibration. The DQ selection component may be configured to identify a value of an offset associated with the DFE component. The DQ selection component may be configured to output a slicer result signal received from the DFE component based on the value of the offset. The RXOC circuit may include control logic. The control logic may be configured to transmit a calibration signal associated with the DFE component to the DQ circuit based on the slicer result signal.

[0028] In some embodiments, the DQ selection component may include a first MUX and a second MUX. In some embodiments, the first MUX is configured to select a DQ circuit. In some embodiments, the second MUX is configured to select a DFE component of the DQ circuit.

[0029] In some embodiments, the control logic may be further configured to receive the slicer result signal at a first edge of a clock cycle associated with the internal clock source.

[0030] In some embodiments, the control logic may be further configured to perform a binary search based on the slicer result signal to identify a pull-up code or a pull-down code of the DFE component.

[0031] In some embodiments, the control logic may be further configured to send a calibration signal to the DQ circuit on a second edge of a clock cycle associated with an internal clock source. In some embodiments, the first edge may be either a rising edge or a falling edge. In some embodiments, the second edge may be the other of either a rising edge or a falling edge. In some embodiments, the calibration signal may include a pull-up code or a pull-down code.

[0032] In some embodiments, the DQ circuit may be further configured to calibrate the DFE components based on pull-up or pull-down codes included in a calibration signal received from the control logic at the second edge of the clock cycle.

[0033] In some embodiments, the oscillator may be further configured to receive the RXOC engagement signal. In some embodiments, an internal clock source may be generated in response to receiving the RXOC engagement command.

[0034] In some embodiments, the oscillator can be made to generate an internal clock source without a CAS command. [Brief explanation of the drawing]

[0035] The accompanying drawings incorporated herein and forming part thereof illustrate aspects of the disclosure and, together with the description, further illustrate the principles of the disclosure and enable those skilled in the art to create and use the disclosure. [Figure 1] A schematic circuit diagram of a memory device including peripheral circuits and arrays of memory cells, according to several aspects of this disclosure, is shown. [Figure 2] The following are block diagrams of a memory system, including a memory array coupled with typical resistance offset calibration (RXOC) components and control logic, according to several aspects of this disclosure. [Figure 3] A signal timing diagram for a typical RXOC procedure is shown. [Figure 4] Detailed block diagrams of typical peripheral circuits, including RXOC circuits and multiple DQ circuits, according to several aspects of this disclosure are shown. [Figure 5] A typical DQ circuit block diagram is shown according to several aspects of this disclosure. [Figure 6] Figure 5 shows a diagram of the DFE components of a typical DQ circuit according to several aspects of this disclosure. [Figure 7] A first typical signal timing diagram for a typical RXOC procedure is shown according to several aspects of this disclosure. [Figure 8] A flowchart of a first method of the RXOC procedure according to several aspects of this disclosure is shown. [Figure 9] A diagram of second typical signal timings for a typical RXOC procedure is shown according to several aspects of this disclosure. [Figure 10] A flowchart of a second method of the RXOC procedure, according to some aspects of this disclosure, is shown. [Figure 11] A block diagram of a system including a memory system, according to several aspects of this disclosure, is shown.

[0036] This disclosure will be explained with reference to the attached drawings. [Modes for carrying out the invention]

[0037] In general, terms can be understood, at least partially, from their use in context. For example, the term “one or more” as used herein may, at least partially, be used to describe any feature, structure, or characteristic in a singular sense, or to describe a combination of features, structures, or characteristics in a plural sense, depending at least partially on the context. Similarly, terms such as “a,” “an,” or “the” can also be understood, at least partially on the context, to convey either a singular or plural usage. Furthermore, the term “based on” is not necessarily intended to convey an exclusive set of factors, but rather, likewise, can be understood, at least partially on the context, to allow for the presence of additional factors that are not necessarily explicitly described.

[0038] Figure 1 shows a schematic diagram of a memory device 100 including peripheral circuits 102 and a memory cell array 101 according to some embodiments of the present disclosure. In some embodiments shown in Figure 1, each memory cell 103 may include a transistor 105 and a capacitor 107. The gate of transistor 105 may be coupled to a word line 104, one of the source and drain of transistor 105 may be coupled to a bit line 106, the other of the source and drain of transistor 105 may be coupled to one electrode of capacitor 107, and the other electrode of capacitor 107 may be coupled to ground. Further details of the memory device are presented below in relation to Figure 11.

[0039] Referring to Figure 2, schematic circuit diagrams of typical memory devices 200 including peripheral circuits are shown according to several aspects of the present disclosure. As described above, peripheral circuits can be coupled to at least two memory cell arrays and may include any suitable circuits to facilitate the operation of at least two memory cell arrays by applying and sensing voltage and / or current signals to each target memory cell of the at least two memory cell arrays. Peripheral circuits may include various types of peripheral circuits formed using CMOS technology, such as RXOC circuits.

[0040] For example, Figure 2 shows a memory device 200 that includes a memory cell array 201 having one or more memory banks, and various typical peripheral circuits including control logic 202, command (CMD) decoder 204, RXOC control logic 206, register 208, RXOC circuit 210, address (ADD) register 212, WL driver 214 (also called row decoder), memory bank control logic 216, BL driver 218 (also called row decoder), column decoder 220, data I / O buffer 222, DQ circuit 224, and interface 226. It is understood that in some examples, additional peripheral circuits may also be included.

[0041] The WL driver 214 is controlled by control logic 202 and can be configured to select banks of the memory cell array 201 and word lines of selected banks. The WL driver 214 can be further configured to drive the memory cell array 201. For example, the WL driver 214 can use word line voltages generated from a voltage generator (not shown) to drive NAND memory cells and / or DFM cells of the memory cell array 201 coupled to the selected word lines.

[0042] The BL driver 218 is controlled by control logic 202 and can be configured to select one or more 3D NAND memory strings and / or one or more 3D DFM cells of the memory cell array 201 by applying bit line voltages generated from a voltage generator (not shown). For example, the BL driver 218 can apply a column signal to select a set of N bits of data from a page buffer (not shown) to be output in a read operation.

[0043] The control logic 202 can be coupled to each of multiple peripheral circuits and can be configured to control the operation of multiple peripheral circuits. The register 208 can be coupled to the control logic 202 and may include a status register, a command register, and an address register for storing status information, command operation codes (OP codes), and command addresses for controlling the operation of each peripheral circuit.

[0044] The command decoder 204 can decode incoming command signals to identify the corresponding command action. Instructions for a command action can be sent to a register 208, which can identify the associated OP code and / or command address. The OP code and / or command address can be identified by comparing the identified command action with an OP code and / or command address lookup table.

[0045] Interface 226 can be coupled to control logic 202 and configured to interface the memory cell array 201 with one or more memory controllers (not shown). In some embodiments, interface 226 functions as a control buffer for buffering and relaying control commands received from one or more memory controllers and / or a host (not shown) to control logic 202, and for relaying status information received from control logic 202 to the memory controllers and / or a host. Interface 226 can also be coupled to a page buffer (not shown) and a BL driver 218 via a data bus (not shown) and function as an I / O interface and data buffer for buffering and relaying program data received from one or more memory controllers and / or a host to the page buffer, and for relaying read data from the page buffer to one or more memory controllers and / or a host. In some embodiments, interface 226 and the data bus (not shown) are part of the peripheral circuitry's I / O circuitry.

[0046] A voltage generator (not shown) controlled by control logic 202 can be configured to generate word line voltages (e.g., read voltage, program voltage, path voltage, local voltage, and verification voltage) and bit line voltages supplied to the memory cell array 201. In some embodiments, the voltage generator is part of a voltage source that supplies voltage at various levels to different peripheral circuits, as will be described in detail below. Consistent with the scope of this disclosure, in some embodiments, the voltage supplied by the voltage generator to, for example, the WL driver 214 and BL driver 218 is above a certain level sufficient to perform memory operations. For example, the voltage supplied to the logic circuits of control logic 202 may be between 1.3V and 5V, such as 3.3V, and the voltage supplied to the drive circuits of the WL driver 214 and BL driver 218 may be between 5V and 30V.

[0047] The RXOC circuit 210 can be coupled to the control logic 202 and may include an oscillator (see Figure 4), a DQ selection component (see Figure 4), and the RXOC control logic 206. In some embodiments, the RXOC control logic 206 may be part of the control logic 202. In some other embodiments, the RXOC control logic 206 may be separate from the control logic 202. The oscillator may be configured to generate an internal clock source for the RXOC control logic 206, the DQ selection component (see Figure 4), and the DQ circuit 224 (see Figure 5), to name just a few examples. By setting an internal clock source for the RXOC control logic 206, the DQ selection component, and the DQ circuit 224, synchronous calibration of the peripheral circuits can be achieved.

[0048] RXOC training involves calculating the resistance of the DQ circuit, for example, determining how many transistors are switched on or off. For example, a clock source is used to time the operations performed by the RXOC control logic and DQ selection components. Conventional RXOC uses a full-rate write clock (WCK) as the clock source. To run RXOC using a full-rate write clock, an additional column-addressed strobe (CAS) command (CMD) (CAS CMD) is required before training can begin. Alternatively, a WCK-to-clock (WCK2CK) synchronization state from the previous operation is required. However, the frequency range of the WCK (e.g., 3200MHz to 20MHz) is undesirably large, leading to various challenges in designing RXOC circuits. These shortcomings of existing RXOC procedures are shown in signal timing diagram 300 in Figure 3.

[0049] Referring to Figure 3, a CAS command is issued at time T0, WCK2CK synchronization is performed between times T0 and Tc1, while WCK is toggled at full rate. Then, at time Tc1, an offset Cal_Start CMD is issued. This initiates the RXOC training, which is performed between times Tc2 and Td1. After time Td1, the existing offset calibration signal is transmitted. The RXOC procedure is completed after tOSCAL, for example, in 3μs. The device then exits the RXOC procedure. As mentioned above, the existing RXOC procedure requires additional circuitry for WCK at different frequencies. For example, if the WCK frequency is high, underclocking is required. On the other hand, if the WCK frequency is low, each DQ uses a separate RXOC circuit to meet timing requirements and / or to reduce calibration accuracy.

[0050] To address one or more of the aforementioned problems, this disclosure provides a typical fully synchronous RXOC training strategy. For example, a typical internal clock source is provided in the RXOC circuit to synchronize the timing of the DFE selection component and the RXOC control logic. In other words, a typical RXOC circuit described herein includes an oscillator (e.g., an internal clock source), RXOC control logic, and a DFE selection component (e.g., one or more multiplexers (MUX)). The DFE selection component selects a DFE component from a plurality of DFE components (e.g., DQ circuits) of the RXOC circuit. The DFE selection component then selects a slicer offset result from a plurality of slicer offset results of the selected DFE component. The RXOC control logic performs a binary search for RXOC calibration. By including a local oscillator in the RXOC circuit, the use of CAS commands and / or synchronization states from previous operations is eliminated. Furthermore, by using a local oscillator to synchronize the operation of the DFE selection component and the RXOC control logic, the silicon footprint of the RXOC circuit is reduced, calibration stability is improved, and the operation of the RXOC control logic is simplified. Further details of a typical RXOC circuit are presented below in relation to Figures 4-11.

[0051] Figure 4 illustrates a detailed block diagram 400 of a typical peripheral circuit including an RXOC circuit and multiple DQ circuits, according to several embodiments of this disclosure. Figure 5 shows a block diagram 500 of a typical DQ circuit 502, according to several embodiments of this disclosure. Figure 6 shows a DFE component 504 of the typical DQ circuit 502 shown in Figure 5, according to several embodiments of this disclosure. Figure 7 illustrates a first typical signal timing 700 for a typical RXOC procedure to calibrate a DQ circuit, according to several embodiments of this disclosure. Figure 8 illustrates a flowchart of a first method 800 of the RXOC procedure, according to several embodiments of this disclosure. Figure 9 illustrates a second typical signal timing 900 for a typical RXOC procedure, according to several embodiments of this disclosure. Figures 4, 5, and 8 are described together.

[0052] Referring to Figure 4, the RXOC circuit may include, for example, an RXOC oscillator 404 (hereinafter referred to as "oscillator 404") and an RXOC control logic 408. Multiple DQ circuits may be included in the DFE block 406. As an example, but not an limitation, the DFE block 406 (for example, the DQ circuit 224 in Figure 2 may correspond to the DFE block 406 in Figure 4) is shown with four DQ circuits (e.g., DQ0, DQ1, DQ2, DQ3) and one RDQS circuit. However, the DFE block 406 may include more or fewer than four DQ circuits and more or fewer than one RDQS circuit without departing from the scope of this disclosure. The DFE selection component 410 may include a first MUX (e.g., the leftmost MUX) configured to select the DQ circuits of the DFE block 406 for calibration. Furthermore, the DFE selection component 410 may include a second MUX (e.g., the rightmost MUX) configured to select the DFE of the DQ circuit selected by the first MUX for calibration. In Figure 4, the DQ signal input to the DFE block 406 may be I / O data via the DQ pin of a memory device. For example, the DQ signal may be sent from the memory controller to the memory device via an I / O buffer. During RXOC calibration, the DQ signal and Vref DQ ports shown on the left side of Figure 4 may be short-circuited.

[0053] Referring to Figures 4 and 8, the RXOC operation can be initiated when the RXOC engage (RXOX_en) signal is received (802). Upon receiving the RXOC_en signal, the oscillator 404 can generate an internal clock source (osc_ck) having a predetermined frequency (804), which is sent to the DFE block 406 and the RXOC control logic 408 to synchronize their respective operations. In the following example, the RXOC procedure is performed in the order of DQ0, DQ1, DQ2, DQ3, and RDQS, with each of these DQ circuits containing four DFE components.

[0054] For example, referring to Figures 4, 5, and 8, the RXOC control logic 408 can perform an RXOC procedure to calibrate the first DFE component 504a of the (806)DQ circuit 502 (e.g., DQ0). Further details of the DQ circuit 502 are shown in Figure 5, while further details of the first DFE component 504a (which may have the same or similar structure as the other DFE components) are shown in Figure 6.

[0055] Referring to Figures 4 and 5, to perform the RXOC procedure, the first MUX can select DQ0, and the second MUX can select the first DFE component 504a of DQ0 for calibration. In some embodiments, the RXOC control logic 408 can send a DQ selection (dq_sel) signal to the first MUX and a slicer selection (slicer_sel) signal to the second MUX. The dq_sel signal can indicate which DQ circuit (e.g., DQ0, DQ1, DQ2, DQ3, RDQS, etc.) of the DFE block 406 is selected for calibration. The slicer_sel signal can indicate which DFE component (e.g., the first DFE component 504a, the second DFE component 504b, the third DFE component 504c, or the fourth DFE component 504d) of the selected DQ circuit is selected for calibration. Each DFE component can identify the slicer result signal to be sent to the first MUX. The first MUX can output the slicer result signal from the DFE component of the selected DQ circuit. In this example, the first MUX may output the slicer result signal from the DFE component of DQ0. The second MUX can output a slicer result signal indicating the offset value associated with the selected DFE component of DQ0 (e.g., resistance offset value, voltage offset value, current offset value, etc.). The RXOC control logic 408 can receive the slicer result signal on the rising or falling edge of the first clock cycle.

[0056] The RXOC control logic 408 can perform a binary search based on the slicer result (e.g., the offset value) to identify the pull-up or pull-down code of the selected DFE component. The pull-up or pull-down code can be used to calibrate the selected DFE component, for example, the number of open or closed MOSFETs (see Figure 6). For example, referring to Figure 6, by calibrating the selected DFE component using the pull-up or pull-down code, the difference in current between the dashed box on the left and the dashed box on the right can be minimized. To perform a binary search, the RXOC control logic 408 can identify a target code, for example, 0101. Using the non-restrictive typical target code 0101, the RXOC control logic can determine a negative value by comparing 0101 with 1000. Then, the RXOC control logic 408 can determine a positive value by comparing 0101 with 0100. Then, the RXOC control logic 408 can determine a negative value by comparing 0101 with 0110. Finally, the RXOC control logic can determine that the binary search is complete by comparing 0101 with 0101. Further details of the binary search performed by the RXOC control logic 408 are described below in relation to Figures 4 and 9.

[0057] For example, referring to Figures 4 and 9, the RXOC control logic 408 sets all RXOC codes to 0. Then, the RXOC control logic 408 sets all pull-up codes and sets pull-down codes to 0. Based on the slicer result signal received from the DQ selection component, the RXOC control logic 408 can determine how to change the pull-up codes. Then, on the rising edge of the clock cycle, the RXOC control logic 408 may set the pull-up codes to 1000. On the falling edge of the clock cycle, the RXOC control logic can perform the slicer operation. Then, the RXOC control logic 408 can perform a code determination to determine whether to leave the code as 1 or set it to 0. This can be done for each bit of the code (e.g., 2 bits, 3 bits, 4 bits, etc.). This loop is performed until all 4 bits of the slicer result signal have been determined. Then, the calibration code (e.g., pull-up code or pull-down code) can be sent to the selected DFE component / DQ circuit. Further details of the calibration procedure are described below in relation to Figure 7.

[0058] Referring to Figure 7, the five clock pulses generated by oscillator 404 are associated with the calibration of one DFE component. The first clock pulse can be used to indicate whether the transistor in the dashed box on the left or the dashed box on the right shown in Figure 6 is calibrated. Each of the subsequent clock pulses may then be associated with the calibration of one bit of a pull-up or pull-down code. For example, referring to Figures 4, 6, and 7, in the first clock pulse, the RXOC control logic 408 may indicate whether the transistor in the dashed box on the left or the dashed box on the right in Figure 6 is calibrated. In the second clock pulse, the RXOC control logic 408 may calibrate the first bit of a pull-up or pull-down code (for example, corresponding to the dashed box shown in the first pulse). In the third clock pulse, the RXOC control logic 408 may calibrate the second bit of a pull-up or pull-down code. In the fourth clock pulse, the RXOC control logic 408 may calibrate the third bit of the pull-up or pull-down code. Finally, in the fifth clock pulse, the RXOC control logic 408 may calibrate the fourth bit of the pull-up or pull-down code.

[0059] Referring again to Figure 4, the RXOC control logic 408 can generate a calibration signal that includes a pull-up or pull-down code to DQ0. The calibration signal can be transmitted to DQ0 on the rising or falling edge of the first clock cycle, or the other. For example, if the slicer result signal is received on the rising edge of the first clock cycle, the calibration signal can be transmitted on the falling edge of the first clock cycle. Otherwise, if the slicer result signal is received on the falling edge of the first clock cycle, the calibration signal can be transmitted on the rising edge of the first clock cycle. Each DFE component can calibrate multiple bits, for example, four bits, and one bit can be calibrated using each pulse of the clock cycle.

[0060] Referring again to Figures 4, 5, and 8, the RXOC control logic 408 can determine (808) whether the fourth DFE component 504d of DQ0 was calibrated in the previous operation (e.g., 806). If the answer to 808 is "no", the operation returns to 806, and the RXOC control logic 408 performs the procedure described above to calibrate, for example, the second DFE component 504b of DQ0. If, instead, the answer to 808 is "yes", the operation proceeds to 810, and the RXOC control logic 408 can perform the RXOC procedure for DQ1 (810). That is, operation 810 may include calibrating each of the four DFE components of DQ1. Once DQ1 is calibrated, the RXOC control logic 408 can determine (812) whether all five DQ circuits (e.g., DQ0, DQ1, DQ2, DQ3, and RDQS) have been calibrated. If the answer to 812 is "no", the operation returns to 806, and the RXOC procedure described above is performed for the next DQ circuit and / or the next DFE component of the same or different DQ circuit. Otherwise, if the answer to 812 is "yes", the RXOC procedure for DFE block 406 can be terminated (814). Further details of the operation in Figure 8 are presented below in relation to Figures 4, 5, and 9.

[0061] Referring to Figures 4, 5, and 9, in a non-restrictive example, a DQ circuit can contain five DQs, each DQ containing four slicers (e.g., DFE components). As mentioned above, the timing diagrams shown in Figures 5 and 9 relate to the 4-bit calibration of pull-up or pull-down codes. Referring to Figure 9, at the rising edge of the stm_ck cycle (e.g., generated by oscillator 404), the RXOC control logic 406 outputs a calibration code according to the slicer_result of the 4-bit calibration. In the DFE loop, there are five clock pulses (e.g., the dotted lines in Figure 9 represent the positions of the rising edges), and the first clock pulse selects os, e.g., the dashed box on the left or the dashed box on the right in Figure 6. At the first rising edge of the first clock pulse, os_sel_out outputs a high-level signal (set to 1). Continuing to refer to Figure 9, rxoc_out[0]-rxoc_out[3] represent the calibration results output by performing the binary search described above according to the slicer_result of each bit. In the non-restrictive example shown in Figure 9, rxoc_out[3] rises to a high level (set to 1) on the rising edge of the first clock pulse and remains high (keeps at 1) on the rising edge of the second clock pulse. On the rising edge of the second clock pulse, rxoc_out[2] rises to a high level (set to 1) and falls to a low level (set to 0) on the rising edge of the third clock pulse. On the rising edge of the third clock pulse, rxoc_out[1] rises to a high level (set to 1) and remains high (keeps at 1) on the rising edge of the fourth clock pulse. On the rising edge of the fourth clock pulse, rxoc_out[0] rises to a high level (set to 1) and falls to a low level (set to 0) on the rising edge of the fifth pulse. Typical target code 0101 and calibrated target code 1010 are presented herein as examples, not as limitations. Other target codes and calibrated target codes may be used and / or achieved without departing from the scope of this disclosure.

[0062] Figure 10 shows a flowchart of Method 1000 for operating a memory device including peripheral circuitry, according to several aspects of the present disclosure. The memory device may be any suitable memory device disclosed herein, such as memory device 100. Method 1000 can be implemented by peripheral circuitry including RXOC and DQ circuits. The internal circuitry of the peripheral circuitry may include, for example, one or more of the oscillator 404, DFE block 406, DQ circuits of DFE block 406, one or more DFE components of the DQ circuitry, RXOC control logic 408, and / or one or more of the DQ selection components 410. It will be understood that the operations shown in Method 1000 may not be exhaustive, and that other operations may be performed before, after, or between any of the illustrated operations. Furthermore, some operations may be performed simultaneously or in an order different from the order shown in Figure 10.

[0063] Referring to Figure 10, in 1002, the oscillator of the RXOC circuit can generate an internal clock source. For example, referring to Figure 4, when the RXOC_en signal is received from outside the RXOC circuit, the oscillator 404 can generate an internal clock source (osc_ck) having a predetermined frequency (804), which is sent to the DFE block 406 and the RXOC control logic 408 to synchronize their respective operations.

[0064] In 1004, the DQ selection component of the RXOC circuit can select a DFE component from among multiple DFE components of the DQ circuit for calibration. Referring to Figure 4, to perform the RXOC procedure, the first MUX can select DQ0, and the second MUX can select the first DFE component 504a of DQ0 for calibration. In some embodiments, the RXOC control logic 408 can send a DQ selection (dq_sel) signal to the first MUX and a slicer selection (slicer_sel) signal to the second MUX.

[0065] In 1006, the DQ selection component of the RXOC circuit can output a slicer result signal indicating the offset value received from the DFE component. For example, referring to Figure 4, in the above example, the first MUX may output a slicer result signal from the DFE component of DQ0. The second MUX may output a slicer result signal indicating the offset value associated with the selected DFE component of DQ0 (e.g., resistance offset value, voltage offset value, current offset value, etc.).

[0066] In 1008, the control logic of the RXOC circuit can perform a binary search based on the slicer result signal to identify the pull-up or pull-down code of the DFE component. For example, referring to Figure 4, the RXOC control logic 408 can perform a binary search based on the slicer result signal to identify the pull-up or pull-down code of the selected DFE component. To perform the binary search, the RXOC control logic 408 can identify a target code, for example, 0101. Using the non-restrictive typical target code 0101, the RXOC control logic can determine that 0101 is negative by comparing it to 1000. Next, the RXOC control logic 408 can determine that 0101 is positive by comparing it to 0100. Then, the RXOC control logic 408 can determine that 0101 is negative by comparing it to 0110. Finally, the RXOC control logic can determine that the binary search is complete by comparing 0101 to 0101.

[0067] In 1010, the control logic of the RXOC circuit can transmit a calibration signal to the DQ circuit, which is associated with a pull-up or pull-down code. For example, referring to Figure 4, the RXOC control logic 408 can generate a calibration signal that includes a pull-up or pull-down code to DQ0. The calibration signal can be transmitted to DQ0 on the rising edge or falling edge of the first clock cycle, or the other. For example, if the slicer result signal is received on the rising edge of the first clock cycle, the calibration signal can be transmitted on the falling edge of the first clock cycle. Otherwise, if the slicer result signal is received on the falling edge of the first clock cycle, the calibration signal can be transmitted on the rising edge of the first clock cycle.

[0068] In 1012, the DQ circuit can calibrate the DFE components based on pull-up or pull-down codes included in the calibration signal. For example, referring to Figure 4, DQ0 can calibrate the first DFE component 504a based on pull-up or pull-down codes included in the calibration signal. For example, pull-up or pull-down codes can be used to calibrate selected DFE components (e.g., the first DFE component 504a), i.e., the number of open or closed MOSFETs (see Figure 6). For example, referring to Figure 6, by calibrating the selected DFE components using pull-up or pull-down codes, the difference in current between the dashed box on the left and the dashed box on the right can be minimized. For example, referring to Figures 4 and 9, the RXOC control logic 408 sets all RXOC codes to 0. Then, the RXOC control logic 408 sets all pull-up codes and sets the pull-down codes to 0. Based on the slicer result signal received from the DQ selection component, the RXOC control logic 408 can determine how to change the pull-up code. Then, on the rising edge of the clock cycle, the RXOC control logic 408 may set the pull-up code to 1000. On the falling edge of the clock cycle, the RXOC control logic can perform the slicer operation. Next, the RXOC control logic 408 can perform a code determination to determine whether to leave the code as 1 or set it to 0. This can be done for each bit of the code (e.g., 2 bits, 3 bits, 4 bits, etc.). This loop is performed until all 4 bits of the slicer result signal have been determined. Then, the calibration code (e.g., a pull-up code or a pull-down code) can be sent to the selected DFE component / DQ circuit. Further details of the calibration procedure are described below in relation to Figure 7. Referring to Figure 7, five pulses generated by the oscillator 404 are associated with the calibration of one DFE component.The first pulse can be used to indicate whether the transistor in the dashed box on the left or the dashed box on the right shown in Figure 6 is calibrated. Each subsequent pulse may be associated with the calibration of one bit of the pull-up or pull-down code. For example, referring to Figures 4, 6, and 7, in the first pulse, the RXOC control logic 408 can indicate whether the transistor in the dashed box on the left or the dashed box on the right in Figure 6 is calibrated. In the second pulse, the RXOC control logic 408 may calibrate the first bit of the pull-up or pull-down code (for example, corresponding to the dashed box shown in the first pulse). In the third pulse, the RXOC control logic 408 may calibrate the second bit of the pull-up or pull-down code. In the fourth pulse, the RXOC control logic 408 may calibrate the third bit of the pull-up or pull-down code. Finally, in the fifth pulse, the RXOC control logic 408 may calibrate the fourth bit of the pull-up or pull-down code.

[0069] Figure 11 illustrates a block diagram of a system 1100 including a memory system 1102 according to several aspects of the present disclosure. System 1100 can be a mobile phone, desktop computer, laptop computer, tablet, vehicle computer, game console, printer, positioning device, wearable electronic device, smart sensor, virtual reality (VR) device, augmented reality (AR) device, or any other suitable electronic device having internal storage. As shown in Figure 11, system 1100 may include a host 1108 and a memory system 1102 having one or more memory devices 1104 and a memory controller 1106. The host 1108 can be a processor of an electronic device such as a central processing unit (CPU), or a system-on-a-chip (SoC) such as an application processor (AP). The host 1108 can be configured to send and receive data (also known as user data or host data) to and from the memory system 1102. The memory system 1102 can be a storage product that integrates a memory controller 1106 with one or more memory devices 1104, including, to give a few examples, volatile memory devices such as dynamic random access memory (DRAM) or synchronous dynamic random access memory (SDRAM).

[0070] The memory device 1104 can communicate with the memory controller 1106 via the system bus 1101. Data, command / address (CMD / ADD), and clock signals CLK can be sent and received between the memory device 1104 and the memory controller 1106 via the system bus 1101. As described above, the memory controller 1106 can send the RXOC_en signal to the RXOC circuit to initiate operation in the RXOC circuit used for RXOC calibration.

[0071] According to some embodiments, the memory controller 1106 is coupled to the memory device 1104 and the host 1108 and configured to control the memory device 1104.1106The memory controller 1106 manages the data stored in the memory device 1104 and can communicate with the host 1108. In some embodiments, the memory controller 1106 is designed to operate in high-duty-cycle environments with solid-state disks (SSDs) or embedded multimedia cards (eMMCs) used as data storage for mobile devices such as smartphones, tablets, and laptop computers, and for enterprise storage arrays. The memory controller 1106 can be configured to control the operation of the memory device 1104, such as read, program / write, and / or erase operations. The memory controller 1106 can also be configured to manage various functions related to the data stored in or to be stored in the memory device 1104, including but not limited to bad block management, garbage collection, logical-physical (L2P) address translation, and wear leveling. In some embodiments, the memory controller 1106 is further configured to process error correction codes (ECC) with respect to data read from or written to the memory device 1104. Any other appropriate function, such as formatting the memory device 1104, can also be performed by the memory controller 1106. The memory controller 1106 can communicate with an external device (e.g., host 1108) according to a specific communication protocol.For example, the memory controller 1106 can communicate with external devices via at least one of various interface protocols, such as the Non-Volatile Memory Express (NVMe) protocol, NVMe Overfabric (NVMe-oF) protocol, PCI Express (PCI-E) protocol, Universal Serial Bus (USB) protocol, Multimedia Card (MMC) protocol, Peripheral Component Interconnect (PCI) protocol, Advanced Technology Attachment (ATA) protocol, Serial-ATA protocol, Parallel-ATA protocol, Small Computer Small Interface (SCSI) protocol, Enhanced Small Disk Interface (ESDI) protocol, Integrated Drive Electronics (IDE) protocol, and Firewire protocol.

[0072] In various aspects of this disclosure, the functions described herein may be implemented in hardware, software, firmware, or any combination thereof. When implemented in software, the functions may be stored as instructions on a non-temporary computer-readable medium. The computer-readable medium includes computer storage media. The storage medium may be any available medium that can be accessed by a memory controller, such as the memory controller 1106 in Figure 11. Such computer-readable media may include, but are not limited to, any other medium that can be used to carry or store desired program code in the form of instructions or data structures and can be accessed by a processing system such as a mobile device or computer. As used herein, the terms "disk" and "disc" include CDs, laserdiscs, optical discs, digital video discs (DVDs), and floppy disks, where a disk typically reproduces data magnetically, while a disc reproduces data optically using a laser. Any combination of these should also be included within the scope of computer-readable media.

[0073] The foregoing description of specific embodiments can be readily modified and / or adapted for various uses. Therefore, such adaptations and modifications are intended to be within the meaning and scope of equivalents of the taught embodiments, based on the teachings and guidance presented herein.

[0074] The scope and width of this disclosure should not be limited by any of the typical embodiments described above, but should be determined solely by the following claims and their equivalents.

[0075] While specific configurations and arrangements are described, it should be understood that these are for illustrative purposes only. Therefore, other configurations and arrangements may be used without departing from the scope of this disclosure. Furthermore, the subject matter described in this disclosure may be used in a variety of other applications. The functional and structural features described in this disclosure may be combined, adjusted, modified, and rearranged in a manner consistent with the scope of this disclosure.

Claims

1. Peripheral circuitry, A DQ circuit comprising multiple decision feedback equalization (DFE) components, A resistive offset calibration (RXOC) circuit, DQ selection component, For calibration, select a DFE component from the plurality of DFE components, A DQ selection component configured to output a slicer result signal indicating the offset value received from the DFE component, A control logic configured to transmit a calibration signal associated with the DFE component to the DQ circuit based on the slicer result signal, An oscillator configured to generate an internal clock source and transmit the internal clock source to the DQ circuit and the control logic, Includes a resistance offset calibration (RXOC) circuit and Peripheral circuits, including those mentioned above.

2. A peripheral circuit, A DQ circuit comprising multiple decision feedback equalization (DFE) components, A resistive offset calibration (RXOC) circuit, An oscillator configured to generate an internal clock source, DQ selection component, For calibration, select a DFE component from the plurality of DFE components, A DQ selection component configured to output a slicer result signal indicating the offset value received from the DFE component, A resistive offset calibration (RXOC) circuit including control logic configured to transmit a calibration signal associated with the DFE component to the DQ circuit based on the slicer result signal; Includes, The aforementioned DQ selection component includes a first multiplexer (MUX) and a second MUX. The first MUX is configured to select the DQ circuit, The second MUX is a peripheral circuit configured to select the DFE component of the DQ circuit.

3. The control logic is The peripheral circuit according to claim 1, further configured to receive the slicer result signal at a first edge of a clock cycle associated with the internal clock source.

4. A peripheral circuit, A DQ circuit comprising multiple decision feedback equalization (DFE) components, A resistive offset calibration (RXOC) circuit, An oscillator configured to generate an internal clock source, DQ selection component, For calibration, select a DFE component from the plurality of DFE components, A DQ selection component configured to output a slicer result signal indicating the offset value received from the DFE component, A resistive offset calibration (RXOC) circuit including control logic configured to transmit a calibration signal associated with the DFE component to the DQ circuit based on the slicer result signal; Includes, The control logic is The slicer result signal is further configured to be received at the first edge of a clock cycle associated with the internal clock source. A peripheral circuit further configured to perform a binary search based on the slicer result signal to identify the pull-up or pull-down code of the DFE component.

5. The control logic is It is further configured to transmit the calibration signal to the DQ circuit at the second edge of the clock cycle associated with the internal clock source, The first edge is either a rising edge or a falling edge. The second edge is the other of the rising edge or the falling edge. The peripheral circuit according to claim 4, wherein the calibration signal includes the pull-up cord or the pull-down cord.

6. The aforementioned DQ circuit is The peripheral circuit according to claim 5, further configured to calibrate the DFE components based on a pull-up code or pull-down code included in the calibration signal received from the control logic at the second edge of the clock cycle.

7. The oscillator is, Further configured to receive the RXOC engagement signal, The peripheral circuit according to any one of claims 1 to 6, wherein the internal clock source is generated in response to receiving the RXOC engagement signal.

8. The peripheral circuit according to claim 7, wherein the oscillator generates the internal clock source without a column address strobe (CAS) command.

9. A memory device, Memory array and, Peripheral circuits coupled to the memory array, A DQ circuit comprising multiple decision feedback equalization (DFE) components, A resistive offset calibration (RXOC) circuit, DQ selection component, For calibration, select a DFE component from the plurality of DFE components, A DQ selection component configured to output a slicer result signal indicating the offset value received from the DFE component, A control logic configured to transmit a calibration signal associated with the DFE component to the DQ circuit based on the slicer result signal, An oscillator configured to generate an internal clock source and transmit the internal clock source to the DQ circuit and the control logic, Includes a resistance offset calibration (RXOC) circuit and Includes peripheral circuits and A memory device that includes this.

10. A memory device, Memory array and, Peripheral circuits coupled to the memory array, A DQ circuit comprising multiple decision feedback equalization (DFE) components, A resistive offset calibration (RXOC) circuit, An oscillator configured to generate an internal clock source, DQ selection component, For calibration, select a DFE component from the plurality of DFE components, A DQ selection component configured to output a slicer result signal indicating the offset value received from the DFE component, A resistive offset calibration (RXOC) circuit including control logic configured to transmit a calibration signal associated with the DFE component to the DQ circuit based on the slicer result signal; Includes peripheral circuits and Includes, The aforementioned DQ selection component includes a first multiplexer (MUX) and a second MUX. The first MUX is configured to select the DQ circuit, The second MUX is a memory device configured to select the DFE component of the DQ circuit.

11. The control logic is The memory device according to claim 9, further configured to receive the slicer result signal at a first edge of a clock cycle associated with the internal clock source.

12. A memory device, Memory array and, Peripheral circuits coupled to the memory array, A DQ circuit comprising multiple decision feedback equalization (DFE) components, A resistive offset calibration (RXOC) circuit, An oscillator configured to generate an internal clock source, DQ selection component, For calibration, select a DFE component from the plurality of DFE components, A DQ selection component configured to output a slicer result signal indicating the offset value received from the DFE component, A resistive offset calibration (RXOC) circuit including control logic configured to transmit a calibration signal associated with the DFE component to the DQ circuit based on the slicer result signal; Includes peripheral circuits and Includes, The control logic is The slicer result signal is further configured to be received at the first edge of a clock cycle associated with the internal clock source. A memory device further configured to perform a binary search based on the slicer result signal to identify the pull-up or pull-down code of the DFE component.

13. The control logic is It is further configured to transmit the calibration signal to the DQ circuit at the second edge of the clock cycle associated with the internal clock source, The first edge is either a rising edge or a falling edge. The second edge is the other of the rising edge or the falling edge. The memory device according to claim 12, wherein the calibration signal includes the pull-up code or the pull-down code.

14. The aforementioned DQ circuit is The memory device according to claim 13, further configured to calibrate the DFE components based on a pull-up code or pull-down code included in the calibration signal received from the control logic at the second edge of the clock cycle.

15. The oscillator is, Further configured to receive the RXOC engagement signal, The memory device according to any one of claims 9 to 14, wherein the internal clock source is generated in response to the reception of the RXOC engagement signal.

16. The memory device according to claim 15, wherein the oscillator generates the internal clock source without a column address strobe (CAS) command.

17. A method for resistance offset calibration (RXOC) using peripheral circuits, The DQ selection component of the RXOC circuit allows for the selection of a DFE component from multiple decision feedback equalization (DFE) components of the calibration DQ circuit, The DQ selection component of the RXOC circuit identifies the offset value associated with the DFE component, The DQ selection component of the RXOC circuit outputs a slicer result signal received from the DFE component based on the offset value, The control logic of the RXOC circuit transmits a calibration signal associated with the DFE component based on the slicer result signal to the DQ circuit. A method comprising generating an internal clock source using the oscillator of the RXOC circuit and transmitting the internal clock source to the DQ circuit and the control logic.

18. A method for resistance offset calibration (RXOC) using peripheral circuits, The RXOC circuit oscillator generates the internal clock source, The DQ selection component of the RXOC circuit selects a DFE component from a plurality of decision feedback equalization (DFE) components of the calibration DQ circuit, The DQ selection component of the RXOC circuit identifies the offset value associated with the DFE component, The DQ selection component of the RXOC circuit outputs a slicer result signal received from the DFE component based on the offset value, The control logic of the RXOC circuit transmits a calibration signal associated with the DFE component to the DQ circuit based on the slicer result signal, The aforementioned DQ selection component includes a first multiplexer (MUX) and a second MUX. The first MUX is configured to select the DQ circuit, A method wherein the second MUX is configured to select the DFE component of the DQ circuit.

19. The method according to claim 17 or 18, further comprising receiving the slicer result signal at the first edge of a clock cycle associated with the internal clock source by the control logic of the RXOC circuit.

20. A method for resistance offset calibration (RXOC) using peripheral circuits, The RXOC circuit oscillator generates the internal clock source, The DQ selection component of the RXOC circuit selects a DFE component from a plurality of decision feedback equalization (DFE) components of the calibration DQ circuit, The DQ selection component of the RXOC circuit identifies the offset value associated with the DFE component, The DQ selection component of the RXOC circuit outputs a slicer result signal received from the DFE component based on the offset value, The control logic of the RXOC circuit transmits a calibration signal associated with the DFE component based on the slicer result signal to the DQ circuit. The control logic of the RXOC circuit receives the slicer result signal at the first edge of the clock cycle associated with the internal clock source. A method comprising: using the control logic of the RXOC circuit to perform a binary search based on the slicer result signal to identify a pull-up code or pull-down code of the DFE component.

Images