Appropriateness determination device and appropriateness determination method

Abstract

To provide an appropriateness determination apparatus capable of easily determining whether or not abnormality detection of a substrate processor by an information analyzer is appropriate, and an appropriateness determination method.SOLUTION: An appropriateness determination apparatus includes: a dummy information generation part which generates dummy information by replacing at least a part of a plurality of processing information collected from the substrate processor with dummy data, and gives the dummy information to the information analyzer; and a determination part which determines whether or not detection operation of the information analyzer is appropriate by determining whether or not an invariant relationship in the information analyzer is adapted to the substrate processor on the basis of whether or not abnormality of the substrate processor is detected by the information analyzer when the dummy information is given to the information analyzer by the dummy information generation part.SELECTED DRAWING: Figure 4

Description

Technical Field

[0005] , ,

[0001] The present invention relates to an appropriateness determination device and an appropriateness determination method for determining whether the abnormality detection of a substrate processing apparatus by an information analysis apparatus is appropriate.

Background Art

[0002] In order to perform various processes on various substrates such as semiconductor substrates, a substrate processing apparatus is used. In the substrate processing apparatus, for example, a series of processes are performed on the substrate according to a predetermined processing procedure (processing recipe). In order to prevent the occurrence of processing defects of the substrate due to abnormalities in the substrate processing apparatus, a data processing system for determining abnormalities in the substrate processing apparatus has been proposed (for example, see Patent Document 1).

[0003] In that data processing system, a plurality of physical quantities related to the substrate processing apparatus are measured during the processing of the substrate, and a plurality of time-series data are generated by arranging the measurement results in time series. The plurality of time-series data includes data of physical quantities such as, for example, the flow rate of the processing liquid discharged from the nozzle and the pressure in the chamber. An evaluation value is calculated by comparing each time-series data with predetermined reference data. Based on the calculated evaluation value, it is determined whether there is an abnormality in the time-series data.

Prior Art Documents

Patent Documents

[0004]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0005] When determining abnormalities in a substrate processing device, it is necessary to adjust the reference data of the data processing system if there are changes to the processing recipe of the substrate processing device or updates to various components of the substrate processing device. If the reference data of the data processing system is not appropriate, the determination of abnormalities in the substrate processing device will not be performed correctly. To confirm whether the determination of abnormalities in the substrate processing device is correct, it is necessary to check the status of the substrate processing device and the settings of the data processing system. These verification procedures are cumbersome.

[0006] The object of the present invention is to provide an appropriateness determination device and an appropriateness determination method that can easily determine whether or not the abnormality detection of a substrate processing device by an information analysis device is appropriate. [Means for solving the problem]

[0007] (1) A suitability determination device according to one aspect of the present invention is a suitability determination device that determines whether the detection operation of an information analysis device configured to detect abnormalities in a substrate processing device based on invariant relationships between a plurality of processing information indicating operations or states related to the processing of a substrate of a substrate processing device and a plurality of processing information actually collected from the substrate processing device is suitability, comprising: a dummy information generation unit that generates dummy information by replacing at least a portion of the plurality of processing information collected from the substrate processing device with dummy data and provides the dummy information to the information analysis device; and a determination unit that determines whether the detection operation of the information analysis device is suitability by determining whether the invariant relationships in the information analysis device are suitable for the substrate processing device based on whether or not an abnormality in the substrate processing device was detected by the information analysis device when the dummy information generation unit provided the dummy information to the information analysis device, The information analysis device calculates the degree of discrepancy between a predetermined set of invariant relationships for multiple processing information and the relationships between multiple combinations of the actually collected processing information, as multiple discrepancies, and calculates the degree of abnormality of the substrate processing device as an abnormality score based on these multiple discrepancies. Dummy data is generated when dummy information is provided to the information analysis device, provided that the invariant relationships in the information analysis device are compatible with the substrate processing device. If the calculated anomaly score exceeds a predetermined anomaly detection threshold This is data configured to detect abnormalities in the circuit board processing equipment.

[0008] According to this suitability determination device, dummy information, including dummy data for the substrate processing device, is generated by the dummy information generation unit. The dummy information is then provided to the information analysis device by the dummy information generation unit. Here, the dummy data is set so that when the dummy information is provided to the information analysis device, and the invariant relationship in the information analysis device is suitable for the substrate processing device, the information analysis device will detect an abnormality in the substrate processing device. That is, if the invariant relationship in the information analysis device is suitable for the substrate processing device, the information analysis device will detect an abnormality in the substrate processing device when the dummy information is provided to the information analysis device. On the other hand, if the invariant relationship in the information analysis device is not suitable for the substrate processing device, the information analysis device may not detect an abnormality in the substrate processing device when the dummy information is provided to the information analysis device. Therefore, it is possible to determine whether the invariant relationship in the information analysis device is suitable for the substrate processing device based on whether or not the information analysis device detects an abnormality in the substrate processing device when the dummy information is provided to the information analysis device. This makes it possible to easily determine whether or not the detection operation of the information analysis device is appropriate.

[0009] (2) The determination unit may determine that the detection operation of the information analyzer is not proper when the information analyzer does not detect an abnormality in the substrate processing device when dummy information is provided to the information analyzer by the dummy information generation unit.

[0010] In this case, a simple assessment can determine that the detection operation of the information analysis device is not functioning correctly.

[0011] (3) The suitability determination device may further include a notification unit that notifies the information analysis device of the fact that the detection operation of the information analysis device is not proper when dummy information is provided to the information analysis device and the determination unit determines that the detection operation of the information analysis device is not proper.

[0012] In this case, it is possible to easily and quickly identify that the detection operation of the information analysis device is not functioning correctly.

[0013] (4) The suitability determination device further comprises a dummy information transmission command unit that gives a command to the dummy information generation unit to transmit dummy information to the information analysis device, and the dummy information generation unit may transmit a plurality of processing information collected from the substrate processing device to the information analysis device if the dummy information transmission command unit has not commanded the dummy information to transmit dummy information, and transmit the dummy information generated by the dummy information generation unit to the information analysis device if the dummy information transmission command unit has commanded the dummy information to transmit dummy information.

[0014] In this case, the detection operation of abnormalities in the substrate processing device by the information analysis device and the determination of whether the detection operation of the information analysis device is appropriate by the appropriateness determination device can be appropriately switched by a command from the dummy information transmission command unit.

[0015] (5) The suitability determination device further includes an output switching unit that receives the result of the detection operation by the information analysis device and transmits the received result of the detection operation to the substrate processing device or the determination unit. The output switching unit does not need to transmit the results of the received detection operation to the substrate processing device when dummy information is provided to the information analysis device.

[0016] In this case, when determining whether the detection operation of the information analysis device is correct, it is prevented that the board processing device will be given a detection result for an abnormality in the board processing device based on dummy information. This prevents the user from mistakenly perceiving whether or not the board processing device is abnormal.

[0017] (6) The dummy information generation unit replaces processing information related to a continuously operating component among the multiple components constituting the substrate processing apparatus with dummy data, and the dummy data may be set to a value that deviates from the processing information related to the component.

[0018] In this case, when dummy information is provided to the information analysis device, if the invariant relationships in the information analysis device are compatible with those of the substrate processing device, the likelihood of the information analysis device detecting an anomaly in the substrate processing device increases. This makes it possible to more accurately determine whether the detection operation of the information analysis device is appropriate or not.

[0019] (7) A method for determining appropriateness according to another aspect of the present invention is a method for determining whether the detection operation of an information analyzer configured to detect abnormalities in a substrate processing apparatus based on invariant relationships between a plurality of processing information indicating operations or states related to the processing of a substrate of a substrate processing apparatus and a plurality of processing information actually collected from the substrate processing apparatus is appropriate, comprising the steps of: generating dummy information by replacing at least a portion of the plurality of processing information collected from the substrate processing apparatus with dummy data and providing the dummy information to the information analyzer; and determining whether the detection operation of the information analyzer is appropriate by determining whether the invariant relationships in the information analyzer are appropriate for the substrate processing apparatus based on whether or not an abnormality in the substrate processing apparatus was detected by the information analyzer when the dummy information was provided to the information analyzer, The information analysis device calculates the degree of deviation between the relationships between multiple combinations of actually collected processing information and multiple predetermined invariant relationships for the processing information, and calculates the degree of abnormality of the substrate processing device as an abnormality score based on the multiple deviation degrees. Dummy data is generated when dummy information is provided to the information analysis device, provided that the invariant relationships in the information analysis device are compatible with the substrate processing device. If the calculated anomaly score exceeds a predetermined anomaly detection threshold This is data configured to detect abnormalities in the circuit board processing equipment.

[0020] According to this appropriateness determination method, when the invariant relationship in the information analysis device is compatible with the substrate processing device, if dummy information is given to the information analysis device, an abnormality of the substrate processing device is detected by the information analysis device. On the other hand, when the invariant relationship in the information analysis device is not compatible with the substrate processing device, an abnormality of the substrate processing device is not detected by the information analysis device when dummy information is given to the information analysis device. Therefore, based on whether an abnormality of the substrate processing device is detected by the information analysis device when dummy information is given to the information analysis device, it is possible to determine whether the invariant relationship in the information analysis device is compatible with the substrate processing device. Thereby, it becomes possible to easily determine whether the detection operation of the information analysis device is appropriate.

Advantages of the Invention

[0021] It becomes possible to easily determine whether the abnormality detection of the substrate processing device by the information analysis device is appropriate.

Brief Description of the Drawings

[0022] [Figure 1] It is a diagram for explaining the configuration of the appropriateness determination device according to an embodiment. [Figure 2] It is a diagram for explaining a specific calculation example of the divergence degree. [Figure 3] It is a diagram for explaining a specific calculation example of the anomaly score. [Figure 4] It is mainly a block diagram for explaining the functional configuration of the appropriateness determination device according to the present embodiment. [Figure 5] It is a flowchart showing an example of the process executed in the control device of the substrate processing device. [Figure 6] It is a flowchart showing an example of the determination operation of the abnormality for the substrate processing device executed in the information analysis device. [Figure 7] It is a flowchart showing an example of the appropriateness determination operation executed in the appropriateness determination device.

Embodiments for Carrying Out the Invention

[0023] Hereinafter, an appropriate determination device and an appropriate determination method according to one embodiment of the present invention will be described with reference to the drawings. In the following description, "substrate" refers to semiconductor substrates, substrates for FPDs (Flat Panel Displays) such as liquid crystal display devices or organic EL (Electro Luminescence) display devices, substrates for optical discs, substrates for magnetic discs, substrates for magneto-optical discs, substrates for photomasks, ceramic substrates, or substrates for solar cells.

[0024] (1) Overall structure Figure 1 is a diagram illustrating the configuration of a suitability determination device according to one embodiment. As shown in Figure 1, the suitability determination device 4 is connected to the substrate processing device 1 and the information analysis device 3. The suitability determination device 4 is connected to each of the substrate processing device 1 and the information analysis device 3 by wired or wireless communication lines or a communication network. For example, the suitability determination device 4 is connected to each of the substrate processing device 1 and the information analysis device 3 via a communication network such as the Internet. In this embodiment, the suitability determination device 4 is connected to the substrate processing device 1 and the information analysis device 3 by wired or wireless LAN.

[0025] (2) Example of the configuration of the substrate processing apparatus 1 In the example shown in Figure 1, the substrate processing apparatus 1 is a batch-type substrate cleaning apparatus and includes a processing tank 11, a substrate holding unit 12, a lifting device 13, a cleaning solution generating device 14, a concentration meter 20, a transport robot 30, and a control device 40. In addition to the above-mentioned components, the substrate processing apparatus 1 is also provided with a display device, an audio output device, and an operating unit (not shown).

[0026] The substrate holding section 12 is configured to hold multiple substrates W. The processing tank 11 is configured to accommodate the multiple substrates W held by the substrate holding section 12. A cleaning solution for cleaning the substrates W is stored in the processing tank 11.

[0027] The lifting device 13 supports the substrate holder 12 so that it can move vertically, and moves the substrate holder 12 vertically under the control of the control device 40. This allows the lifting device 13 to immerse the multiple substrates W held by the substrate holder 12 in the cleaning solution stored in the processing tank 11, and to lift the multiple substrates W immersed in the cleaning solution from the processing tank 11. The multiple substrates W are cleaned by being immersed in the cleaning solution. The lifting device 13 is also equipped with a motor (not shown) as a power source for moving the substrate holder 12 vertically.

[0028] The cleaning solution generating device 14 includes a storage tank 14a and an agitator (such as a bubbling device) not shown. A chemical supply pipe 91, a pure water supply pipe 92, an additional chemical supply pipe 93, and a drain pipe 94 are connected to the storage tank 14a. Valves V1 to V4 are provided on each of the multiple pipes (91 to 94). Each of the valves V1 to V4 is a control valve whose opening degree can be adjusted by the control device 40.

[0029] The chemical supply pipe 91 guides the chemical supplied from a chemical supply system (not shown) to the storage tank 14a when valve V1 is opened. The flow rate (amount supplied per unit time) of the chemical supplied to the storage tank 14a through the chemical supply pipe 91 changes according to the degree to which valve V1 is opened.

[0030] The pure water supply pipe 92 guides pure water supplied from a pure water supply system (not shown) to the storage tank 14a when valve V2 is opened. The flow rate (amount supplied per unit time) of pure water supplied to the storage tank 14a through the pure water supply pipe 92 changes according to the degree to which valve V2 is opened.

[0031] In this way, a predetermined amount of chemical solution and pure water is stored in the storage tank 14a of the cleaning solution generation device 14. Furthermore, within the storage tank 14a, the stored chemical solution and pure water are mixed by a stirring mechanism (not shown) to produce the cleaning solution to be stored in the treatment tank 11. As the chemical solution, BHF (buffered hydrofluoric acid), DHF (dilute hydrofluoric acid), hydrofluoric acid, hydrochloric acid, sulfuric acid, nitric acid, phosphoric acid, acetic acid, oxalic acid, or ammonia can be used.

[0032] The additional chemical supply pipe 93, when valve V3 is opened, guides the chemical supplied from a chemical supply system (not shown) to the storage tank 14a. The supply of chemical to the storage tank 14a through the additional chemical supply pipe 93 will be described later. The drain pipe 94, when valve V4 is opened, discharges some or all of the cleaning solution stored in the cleaning solution generator 14 to the outside of the substrate processing device 1.

[0033] A liquid supply pipe 15 is further connected to the storage tank 14a. The liquid supply pipe 15 is provided to connect the processing tank 11 and the cleaning liquid generator 14. A pump 16 and a valve 17 are also provided in the liquid supply pipe 15. The valve 17 is a control valve whose opening degree can be adjusted by the control device 40. When the valve 17 is opened while the pump 16 is operating, the cleaning liquid stored in the storage tank 14a is supplied to the processing tank 11. The flow rate of the cleaning liquid supplied from the storage tank 14a to the processing tank 11 changes according to the opening degree of the valve 17. A heater 21 and a temperature sensor 22 are provided in the storage tank 14a of the cleaning liquid generator 14. The control device 40 controls the power supplied to the heater 21. This adjusts the temperature of the cleaning liquid. The temperature of the cleaning liquid is detected by the temperature sensor 22.

[0034] A liquid discharge pipe 18 is connected to the bottom of the processing tank 11. A valve 19 is provided on the liquid discharge pipe 18. The valve 19 is a control valve whose opening degree can be adjusted by the control device 40. When the valve 19 is opened, a portion of the cleaning liquid stored in the processing tank 11 is discharged from the substrate processing device 1 through the liquid discharge pipe 18. The flow rate of the cleaning liquid discharged from the processing tank 11 changes according to the opening degree of the valve 19. When cleaning multiple substrates W, cleaning liquid is supplied to the processing tank 11 from the cleaning liquid generation device 14, and the cleaning liquid inside the processing tank 11 is discharged through the liquid discharge pipe 18.

[0035] The concentration meter 20 detects the concentration of the cleaning solution in the storage tank 14a in response to a command from the control device 40 and provides the detection result to the control device 40. The transport robot 30 transports multiple substrates W held by the substrate holding unit 12 at a position above the processing tank 11. The control device 40 consists of, for example, a CPU (central processing unit) and memory, and controls the operation of the lifting device 13, the operation of the transport robot 30, the opening and closing of valves V1 to V4, and the opening degree of valves 17 and 19. The memory of the control device 40 stores a substrate processing program for executing the substrate processing of the substrate processing apparatus 1 described above.

[0036] Furthermore, the control device 40 provides feedback control to the amount of chemical solution supplied to the storage tank 14a based on the detection result of the chemical solution concentration provided by the concentration meter 20, so that the chemical solution concentration of the cleaning solution stored in the storage tank 14a is within a predetermined range. For example, if the chemical solution concentration of the cleaning solution detected by the concentration meter 20 is lower than a predetermined range, the control device 40 supplies additional chemical solution to the cleaning solution generator 14 through an additional chemical solution supply pipe 93 from a chemical solution supply system (not shown).

[0037] Furthermore, the control device 40 is a substrate processing device. 1 The substrate processing device has an emergency stop function that stops the operation of the substrate processing device 1 if a person enters a predetermined space inside or if a predetermined detector (for example, a concentration meter 20) installed inside the substrate processing device 1 is not functioning.

[0038] (3) Processing information The substrate processing apparatus 1 is configured with a plurality of processing information items that indicate operations or states related to the processing of the substrate W in the substrate processing apparatus 1, as information for managing abnormalities in the substrate processing apparatus 1. In this embodiment, these processing information items are transmitted from the control device 40 of the substrate processing apparatus 1 to the information analysis device 3 via the appropriateness determination device 4 at predetermined intervals, as shown by the thick solid arrows in Figure 1. Alternatively, these processing information items may be transmitted directly from the control device 40 of the substrate processing apparatus 1 to the information analysis device 3 at predetermined intervals.

[0039] As shown in the outlet in Figure 1, the processing information transmitted from the substrate processing apparatus 1 to the information analysis apparatus 3 via the suitability determination apparatus 4 includes: a. chemical solution concentration, b. chemical solution supply amount, c. pump I / O signal, d. processing liquid supply amount, e. motor rotation speed, f. power supplied to the motor, g. additional chemical solution amount, h. chemical solution supply valve opening, and i. cleaning liquid discharge valve opening.

[0040] "a. Chemical concentration" indicates the chemical concentration of the cleaning solution in the storage tank 14a as detected by the concentration meter 20. "b. Chemical supply amount" indicates the flow rate of the cleaning solution supplied from the chemical supply pipe 91 to the storage tank of the cleaning solution generator 14. "b. Chemical supply amount" can be detected, for example, by installing a flow meter in the chemical supply pipe 91.

[0041] In the substrate processing apparatus 1, when the pump 16 is activated and the valve 17 is opened, the processing liquid stored in the storage tank 14a is supplied to the processing tank 11. "c. Pump I / O signal" is a signal given from the control device 40 to the pump 16 to instruct the pump 16 to operate or to instruct the pump 16 to stop operating. "d. Processing liquid supply amount" indicates the flow rate of the processing liquid supplied from the storage tank 14a to the processing tank 11. "d. Processing liquid supply amount" can be detected, for example, by installing a flow meter on the liquid supply pipe 15.

[0042] "e. Motor rotation speed" is the rotation speed of the motor provided in the lifting device 13, and can be calculated, for example, by detecting the rotation speed of the motor using a rotation speed sensor. "f. Power supplied to the motor" is the amount of power supplied to the motor provided in the lifting device 13, and can be detected, for example, using a power meter.

[0043] "g. Amount of additional chemical solution" indicates the flow rate of additional chemical solution supplied to the storage tank 14a from the additional chemical solution supply pipe 93 so that the chemical solution concentration of the cleaning solution stored in the storage tank 14a falls within a predetermined range. "g. Amount of additional chemical solution" can be detected, for example, by installing a flow meter in the additional chemical solution supply pipe 93. "h. Opening of chemical solution supply valve" indicates the opening degree of the valve installed in the chemical solution supply pipe 91. "i. Opening of cleaning solution discharge valve" indicates the opening degree of the valve installed in the drain pipe 94.

[0044] "j. Heater power" indicates the power supplied to heater 21. "k. Cleaning solution temperature" is 、 This shows the temperature of the cleaning solution generated by the cleaning solution generating device 14.

[0045] (4) Detection of abnormalities in the substrate processing device 1 by the information analysis device 3 The information analysis device 3 is, for example, a server and includes a CPU and memory. The information analysis device 3 collects multiple processing information transmitted from the substrate processing device 1. In the information analysis device 3, multiple combinations of two different processing information are predetermined for the multiple processing information transmitted from the substrate processing device 1 to the information analysis device 3.

[0046] At this time, a predetermined invariant relationship (hereinafter referred to as the invariant relationship) is maintained between the two processing information components that make up each combination. The invariant relationship is set for each predetermined processing procedure (processing recipe) of the substrate processing device 1.

[0047] Here, we assume a scenario where inappropriate substrate processing is performed due to a malfunction in the substrate processing device 1. In this case, the relationship between two processing information components that constitute at least one of the multiple combinations deviates from an invariant relationship.

[0048] Therefore, the information analysis device 3 calculates multiple deviation degrees, which represent the degree of discrepancy between the relationships between multiple combinations of the multiple processing information actually collected and the multiple invariant relationships predetermined for those multiple processing information. Furthermore, based on the calculated multiple deviation degrees, the information analysis device 3 calculates the degree of abnormality of the substrate processing device 1 as an abnormality score. A specific example of the method for calculating the abnormality score will be described later.

[0049] Furthermore, the information analysis device 3 transmits the calculated abnormality score to the substrate processing device 1, as shown by the thick dashed arrow in Figure 1. The transmission of the abnormality score is performed each time the information analysis device 3 calculates an abnormality score. At this time, each substrate processing device 1 stores the abnormality score transmitted from the information analysis device 3.

[0050] Furthermore, the information analysis device 3 determines whether the abnormality score of the substrate processing device 1 exceeds a predetermined abnormality threshold. If the abnormality score exceeds the abnormality threshold, the information analysis device 3 sends an alarm to the substrate processing device 1 via the appropriateness determination device 4, as shown by the thick dashed arrow in Figure 1. Hereinafter, these operations will be referred to as abnormality detection operations for the substrate processing device 1.

[0051] In this embodiment, the abnormality score (degree of abnormality) is lower for abnormalities that do not require a prompt response by the person performing maintenance and inspection of the substrate processing apparatus 1 (hereinafter referred to as the maintenance worker), and higher for abnormalities that require a prompt response by the maintenance worker.

[0052] A state with a low anomaly score is one in which all of the processing information falls within the range predicted to be normal based on the invariant relationships corresponding to each of the above combinations.

[0053] On the other hand, a high abnormality score includes, for example, a state in which the actual temporal change in "a. chemical concentration" is significantly larger than the temporal change predicted based on the temporal change in "b. chemical supply amount". If this state persists, it will cause processing failures of the substrate W due to the inability to adjust the chemical concentration of the cleaning solution, generation of harmful gases, and damage to the components of the substrate processing apparatus 1.

[0054] Furthermore, a high abnormality score includes, for example, a state where the actual value of "f. Power supplied to the motor" is significantly larger than the predicted value. In this state, there is a high probability that an unexpected load is acting on the motor. Therefore, if this state persists, it may cause failure of the operating parts including the motor, failure of the substrate W to be transported, and damage to the components of the substrate processing device 1.

[0055] Furthermore, a high abnormality score includes, for example, a state where the actual value of "g. Amount of additional chemical solution" fluctuates beyond the predicted range. In this state, it is difficult to maintain a constant concentration of the cleaning solution. Therefore, the continuation of this state will cause processing defects in the substrate W.

[0056] Furthermore, a high abnormality score includes, for example, a state in which the actual temporal changes of "h. Chemical supply valve opening" and "i. Cleaning solution discharge valve opening" differ significantly from the temporal changes predicted from "a. Chemical concentration" and "b. Chemical supply amount". When the substrate processing apparatus 1 is in this state, it is considered that the substrate processing apparatus 1 is either stopped by the emergency stop function or should be stopped by its own mechanism.

[0057] (5) Example of calculating anomaly score in information analysis device 3 As described above, the information analysis device 3 has defined multiple combinations of two different pieces of processed information. To calculate the anomaly score, a deviation is calculated for each combination. Figure 2 is a diagram illustrating a specific example of deviation calculation. Here, we will explain an example of deviation calculation corresponding to the combination of "e. motor rotation speed" and "f. power supplied to the motor" in Figure 1. In the following explanation, the data for "e. motor rotation speed" will be referred to as "e" data as appropriate, and the data for "f. power supplied to the motor" will be referred to as "f" data as appropriate.

[0058] To calculate the degree of deviation, reference data based on the invariant relationship between "e. motor rotation speed" and "f. power supplied to the motor" is required. Therefore, the information analysis device 3 stores "e" data and "f" data when the substrate processing device 1 is operating ideally according to a predetermined processing recipe before the actual processing of the substrate W in the substrate processing device 1.

[0059] These ideal "e" and "f" data are obtained, for example, based on multiple processing information transmitted from the substrate processing device 1 when it is actually operating normally. Alternatively, the ideal "e" and "f" data may be generated through simulation or the like.

[0060] At the top of Figure 2, a graph shows an example of the temporal changes in ideal "e" and "f" data. In the "e" data graph, the horizontal axis represents time, and the vertical axis represents the motor's rotational speed. In the "f" data graph, the horizontal axis represents time, and the vertical axis represents the amount of electricity supplied to the motor installed in the lifting device 13 in Figure 1 (supplied power). The horizontal axis (time axis) is common to both the "e" data graph and the "f" data graph.

[0061] As can be seen from the two graphs at the top of Figure 2, as the motor speed increases, the power supplied to the motor also increases at a nearly constant rate. In other words, there is an invariant relationship between the motor speed and the power supplied to the motor. When the substrate processing device 1 operates ideally, the relationship between each combination of multiple processing information is equal to the invariant relationship. Therefore, the information analysis device 3 stores the invariant relationships for each combination of multiple processing information in advance. As a result, the information analysis device 3 is set to have an invariant relationship that is suitable for the substrate processing device 1.

[0062] In this state, the substrate W is processed in the substrate processing apparatus 1, and the actual "e" data and "f" data are collected by the information analysis apparatus 3. In the center of Figure 2, an example of the temporal changes in the actually collected "e" data and "f" data is shown in a graph.

[0063] When actual "e" data is collected, "f" data is predicted based on pre-stored invariant relationships. Conversely, when actual "f" data is collected, "e" data is predicted based on pre-stored invariant relationships. The lower part of Figure 2 shows a graph illustrating an example of the temporal changes in the predicted "e" and "f" data based on invariant relationships. In the graph at the bottom of Figure 2, the predicted "e" and "f" data are shown as solid lines, while the actually collected "e" and "f" data are shown as dotted lines.

[0064] When the substrate processing device 1 is operating ideally, the actual "e" data and the predicted "e" data will match or nearly match. Similarly, the actual "f" data and the predicted "f" data will match or nearly match. However, if an abnormality occurs in the substrate processing device 1, there is a high probability that the actual "e" data and the predicted "e" data will diverge. Similarly, there is a high probability that the actual "f" data and the predicted "f" data will diverge. The degree of this divergence is considered to be greater the greater the degree of abnormality in the substrate processing device 1, and smaller the less severe the abnormality in the substrate processing device 1.

[0065] Therefore, in this embodiment, the difference between the data that is actually collected as processing information and the data that is predicted as processing information is calculated as the degree of deviation. In the example in Figure 2, the information analysis device 3 calculates the degree of deviation as the difference between the actual "e" data and the predicted "e" data when calculating the degree of deviation at a certain point in time. The information analysis device 3 also calculates the degree of deviation as the difference between the actual "f" data and the predicted "f" data.

[0066] Figure 3 is a diagram illustrating a specific example of calculating an anomaly score. The information analysis device 3 calculates the above deviation for all combinations of multiple processing information. The multiple values ​​in the rows to the right of each of the processing information "a" to "k" in the left vertical column of Figure 3 represent the deviation between the processing information predicted from each of the processing information "a" to "k" in the upper horizontal column and the processing information actually obtained. The multiple values ​​in the columns below each of the processing information "a" to "k" in the upper horizontal column of Figure 3 represent the deviation between the processing information predicted from each of the "a" to "k" in the left vertical column and the processing information actually obtained.

[0067] For example, the value in the column at the intersection of the row to the right of the processing information "e" in the left vertical column and the lower column of the processing information "f" in the upper horizontal column is " 28 This represents the degree of discrepancy between the processing information "e" predicted from the processing information "f" and the processing information "e" actually obtained. Also, the lower column and left of the processing information "e" in the upper horizontal column verticalThe value in the column at the intersection with the row to the right of the processing information "f" in the column is 26 This represents the degree of discrepancy between the processing information "f" predicted from the processing information "e" and the processing information "f" actually obtained.

[0068] Figure 3 shows the multiple deviations calculated for all combinations of multiple processing information. Once all deviations have been calculated, the information analysis device 3 calculates the sum of the calculated deviations as the anomaly score. In the example in Figure 3, the anomaly score is 264.

[0069] As described above, the invariant relationships within the information analysis device 3 are set for each processing recipe of the substrate processing device 1. Therefore, if the processing recipe of the substrate processing device 1 is changed to another processing recipe, the invariant relationships set in the information analysis device 3 must be updated to conform to the changed other processing recipe. Also, if any of the various devices constituting the substrate processing device 1 are changed or updated, the invariant relationships within the information analysis device 3 must be updated to conform to the changed or updated devices. Hereinafter, any change in the operation or state related to substrate processing in the substrate processing device 1, such as when the processing recipe of the substrate processing device 1 is changed or any of the devices constituting the substrate processing device 1 are changed or updated, will be collectively referred to as a change in the operating state of the substrate processing device 1.

[0070] When the operating state of the substrate processing device 1 is changed, the invariant relationships set in the information analysis device 3 need to be updated to match the changed operating state of the substrate processing device 1. If the invariant relationships in the information analysis device 3 are not updated to match the changed operating state of the substrate processing device 1 after the operating state of the substrate processing device 1 has been changed, the information analysis device 3 will not be able to accurately detect abnormalities in the substrate processing device 1. In this case, the detection operation of the information analysis device 3 will become incorrect. Therefore, an appropriateness determination device 4 is used to determine whether or not the detection operation of the information analysis device 3 is correct.

[0071] (6) Appropriateness determination device 4 As shown in Figure 1, the suitability determination device 4 is, for example, a personal computer and includes a CPU and memory. This suitability determination device 4 is equipped with a display unit 4a and an operation unit 4b and is used, for example, by an administrator who manages the substrate processing device 1 or the information analysis device 3.

[0072] In this embodiment, the suitability determination device 4 replaces at least a portion of the multiple processing information (in this example, "a" to "j" shown in Figure 1) transmitted from the substrate processing device 1 with predetermined values ​​(hereinafter referred to as dummy data). As a result, the suitability determination device 4 generates dummy information that includes the processing information and dummy data transmitted from the substrate processing device 1. Alternatively, the suitability determination device 4 may generate dummy information by replacing all of the multiple processing information transmitted from the substrate processing device 1 with dummy data.

[0073] Here, dummy data is set so that when dummy data is provided to the information analysis device 3 when the invariant relationship in the information analysis device 3 is compatible with the substrate processing device 1, the abnormality score calculated by the information analysis device 3 reliably exceeds a predetermined abnormality detection threshold. In this case, regardless of whether the substrate processing device 1 is normal or abnormal, if the invariant relationship in the information analysis device 3 is compatible with the substrate processing device 1, the information analysis device 3 detects an abnormality in the substrate processing device 1 when dummy data is provided. If the information analysis device 3 does not detect an abnormality when dummy data is provided to the information analysis device 3, it can be determined that the invariant relationship in the information analysis device 3 is not compatible with the substrate processing device 1. In this case, it is determined that the detection operation of the information analysis device 3 is not proper.

[0074] As indicated by the thick dotted arrow, the suitability determination device 4 transmits dummy information to the information analysis device 3 at a predetermined interval (for example, a longer interval than the predetermined interval at which multiple processing information is transmitted to the information analysis device 3). The information analysis device 3 then performs the aforementioned anomaly detection operation on the dummy information transmitted by the suitability determination device 4.

[0075] As processing information to be replaced with dummy data, for example, processing information related to equipment that is continuously operating while the substrate processing device 1 is running can be used. In addition, the dummy data is set to a value that deviates from the processing information related to the component. Processing information related to equipment that is continuously operating while the substrate processing device 1 is running will, for example, show a value other than 0. In this case, for example, "c. Pump I / O signal" and "d. Processing liquid supply amount" can be used as processing information to be replaced with dummy data. In this case, in the substrate processing device 1 of Figure 1, the flow rate of the processing liquid supplied into the processing tank 11 when the operation of the pump 16 is instructed from the control device 40 is replaced with 0 as dummy data. In addition, "k. Chemical solution temperature" can be used as processing information to be replaced with dummy data. In this case, in the substrate processing device 1 of Figure 1, the chemical solution temperature detected by the temperature sensor 22 when the power supplied from the control device 40 to the heater 21 is controlled is replaced with 0 as dummy data.

[0076] If the detection operation of the information analysis device 3 is correct, the relationship between processing information, including "c. Pump I / O signal" and "d. Processing liquid supply amount," deviates from an invariant relationship in the information analysis device 3, and the abnormality score calculated by the information analysis device 3 exceeds a predetermined abnormality judgment threshold. As a result, the information analysis device 3 sends an alarm to the appropriateness judgment device 4.

[0077] On the other hand, if the detection operation of the information analysis device 3 is not proper, the relationship between processing information, including "c. Pump I / O signal" and "d. Processing liquid supply amount," in the information analysis device 3 does not necessarily deviate from an invariant relationship. Therefore, there may be cases where the abnormality score calculated by the information analysis device 3 does not exceed the predetermined abnormality judgment threshold. In this case, the information analysis device 3 does not send an alarm to the appropriateness judgment device 4.

[0078] As a result, when the dummy information is transmitted, the suitability determination device 4 can determine whether or not the invariant relationship in the information analysis device 3 is suitable for the substrate processing device 1, based on whether or not it received an alarm from the information analysis device 3. In this case, it becomes possible to determine whether or not the detection operation of the information analysis device 3 is appropriate.

[0079] In this embodiment, when the suitability determination device 4 receives an alarm from the information analysis device 3, it determines that the invariant relationship in the information analysis device 3 is compatible with the substrate processing device 1, and also determines that the detection operation of the information analysis device 3 is appropriate. Furthermore, when the suitability determination device 4 does not receive an alarm from the information analysis device 3, it determines that the invariant relationship in the information analysis device 3 is not compatible with the substrate processing device 1, and also determines that the detection operation of the information analysis device 3 is not appropriate.

[0080] In this embodiment, the appropriateness determination device 4 does not transmit alarms received from the information analysis device 3 to the substrate processing device 1 when it transmits dummy information to the information analysis device 3. This prevents the transmission of false alarms to the substrate processing device 1.

[0081] If the detection operation of the information analysis device 3 is not proper, the suitability determination device 4 will display a warning on the display unit 4a indicating that the detection operation of the information analysis device 3 is not proper. Hereinafter, this series of operations of the suitability determination device 4 will be referred to as the suitability determination operation.

[0082] (7) Functional configuration and example of suitability determination operation of suitability determination device 4 Figure 4 is a block diagram primarily illustrating the functional configuration of the suitability determination device 4 according to this embodiment. Figure 4 also shows block diagrams illustrating the functional configurations of the substrate processing device 1 and the information analysis device 3. Figure 5 is a flowchart illustrating an example of processing performed by the control device 40 (see Figure 1) of the substrate processing device 1. Figure 6 is a flowchart illustrating an example of abnormality determination operation for the substrate processing device 1 performed by the information analysis device 3. Figure 7 is a flowchart illustrating an example of suitability determination operation performed by the suitability determination device 4.

[0083] As explained in Figure 1, the substrate processing apparatus 1 includes a control device 40. The control device 40 transmits a plurality of processing information acquired within the substrate processing apparatus 1 to the information analysis device 3 via the appropriateness determination device 4 at predetermined intervals (step S10 in Figure 5). The control device 40 may store the plurality of processing information in association with the transmission time when the plurality of processing information is transmitted.

[0084] Next, the control device 40 determines whether or not it has received an abnormal score from the information analysis device 3 (step S11). If no abnormal score is received, the control device 40 repeats the determination in step S11. If an abnormal score is received, the control device 40 stores the received abnormal score in association with its reception time (step S12).

[0085] Furthermore, the control device 40 determines whether or not it has received an alarm from the information analysis device 3 (step S13). If no alarm is received, the control device 40 terminates processing. If an alarm is received, the control device 40 outputs the alarm in the form of video or sound via the display device or audio output device of the substrate processing device 1 (step S14).

[0086] In Figure 4, the information analysis device 3 includes an information collection unit 31, a score calculation unit 32, a score transmission unit 33, and an alarm transmission unit 34. The memory of the information analysis device 3 stores a detection operation execution program for performing the abnormality detection operation on the substrate processing device 1 described above. The CPU of the information analysis device 3 executes the detection operation execution program, thereby realizing the functions of the components (31-34) of the information analysis device 3. Some or all of the components (31-34) of the information analysis device 3 in Figure 4 may be realized by hardware such as electronic circuits.

[0087] The information collection unit 31 collects multiple processing information or dummy information transmitted from the substrate processing device 1 via the appropriateness determination device 4 and provides it to the score calculation unit 32 (step S20 in Figure 6). The score calculation unit 32 calculates multiple deviation degrees based on the multiple processing information or dummy information, calculates an abnormality score for the substrate processing device 1, and provides the calculated abnormality score to the score transmission unit 33 and the alarm transmission unit 34 (step S21).

[0088] The score transmission unit 33 transmits the abnormal score calculated by the score calculation unit 32 to the substrate processing device 1 (step S22). In the substrate processing device 1, the abnormal score transmitted from the score transmission unit 33 is stored in association with a time such as the calculation time, transmission time, or reception time of the abnormal score.

[0089] The alarm transmission unit 34 determines whether the calculated abnormality score exceeds the abnormality detection threshold (step S23). If the abnormality score does not exceed the abnormality detection threshold, the alarm transmission unit 34 returns to step S21. If the abnormality score exceeds the abnormality detection threshold, the alarm transmission unit 34 sends an alarm to the substrate processing device 1 (step S24).

[0090] In Figure 4, the suitability determination device 4 includes a dummy data storage unit 41, a dummy information generation unit 42, a dummy information transmission command unit 43, an alarm reception unit 44, an output switching unit 45, a determination unit 46, and a display unit 4a. The memory of the suitability determination device 4 stores a suitability determination program for performing suitability determination operations. The CPU of the suitability determination device 4 executes the suitability determination program, thereby realizing the functions of the components (41-46) of the suitability determination device 4. Some or all of the components (41-46) of the suitability determination device 4 in Figure 4 may be realized by hardware such as electronic circuits.

[0091] Dummy data is pre-stored in the dummy data storage unit 41. The dummy information generation unit 42 determines whether or not it has received multiple processing information from the substrate processing device 1 (step S30 in Figure 7). If the dummy information generation unit 42 has not received multiple processing information from the substrate processing device 1, it repeats the determination in step S30. If the dummy information generation unit 42 has received multiple processing information from the substrate processing device 1, the dummy information transmission command unit 43 determines whether or not the current time is the start time for the appropriate determination operation (step S31).

[0092] In step S31, if the current time is not the start of the appropriateness determination operation, the dummy information generation unit 42 transmits multiple processing information received from the substrate processing device 1 to the information analysis device 3 (step S32). At this point, an abnormality detection operation (steps S20 to S24 in Figure 6 described above) is performed within the information analysis device 3. The alarm receiving unit 44 determines whether the output switching unit 45 has received an alarm from the information analysis device 3 (step S33). If the output switching unit 45 has not received an alarm from the information analysis device 3, the operation in step S30 is performed. If the output switching unit 45 has received an alarm from the information analysis device 3, the output switching unit 45 transmits an alarm to the substrate processing device 1 (step S34). After that, the operation in step S30 is performed.

[0093] In step S31, if the current time is the start of the appropriateness determination operation, the dummy information generation unit 42 generates dummy information by replacing at least a portion of the multiple processing information received from the substrate processing device 1 with dummy data (step S35). Next, the dummy information generation unit 42 transmits the dummy information to the information collection unit 31 of the information analysis device 3 based on a command from the dummy information transmission command unit 43 (step S36). At this point, an abnormality detection operation (steps S20 to S24 in Figure 6 described above) is performed within the information analysis device 3. The alarm receiving unit 44 determines whether the output switching unit 45 has received an alarm from the information analysis device 3 (step S37). If the output switching unit 45 has received an alarm from the information analysis device 3, the determination unit 46 determines that the detection operation of the information analysis device 3 is appropriate (step S40). After that, the determination unit 46 returns to step S30. If the output switching unit 45 has not received an alarm from the information analysis device 3, the determination unit 46 determines that the detection operation of the information analysis device 3 is improper (step S38). In this case, the display unit 4a of the appropriateness determination device 4 displays a warning indicating that the detection operation of the information analysis device 3 is improper (step S39). Subsequently, the determination in step S30 is performed.

[0094] (8) Effects of the embodiment According to the appropriateness determination device 4 of the above embodiment, if the invariant relationship in the information analysis device 3 is compatible with the substrate processing device 1, when dummy information is provided to the information analysis device 3, the information analysis device 3 will detect an abnormality in the substrate processing device 1. On the other hand, if the invariant relationship in the information analysis device 3 is not compatible with the substrate processing device 1, the information analysis device 3 may not detect an abnormality in the substrate processing device 1 when dummy information is provided to the information analysis device 3. Therefore, it is possible to determine whether the invariant relationship in the information analysis device 3 is compatible with the substrate processing device 1 based on whether or not the information analysis device 3 detects an abnormality in the substrate processing device 1 when dummy information is provided to the information analysis device 3. This makes it possible to easily determine whether or not the detection operation of the information analysis device 3 is appropriate.

[0095] Furthermore, the determination unit 46 of the suitability determination device 4 determines that the detection operation of the information analysis device 3 is not proper if the information analysis device 3 does not detect any abnormalities in the substrate when dummy information is provided to the information analysis device 3 by the dummy information generation unit 42. In this case, it becomes possible to determine that the detection operation of the information analysis device is not proper with a simple determination.

[0096] Furthermore, if the detection operation of the information analysis device 3 is determined to be improper, a warning indicating that the detection operation of the information analysis device 3 is improper will be displayed on the display unit 4a. This allows the management operator to easily and quickly understand that the detection operation of the information analysis device is improper.

[0097] Furthermore, the dummy information generation unit 42 transmits one of the multiple processing information and dummy information collected from the substrate processing device 1 based on a command to transmit dummy information from the dummy information transmission command unit 43. In this case, the dummy information transmission command unit 43 can appropriately switch between the detection operation of abnormalities in the substrate processing device 1 by the information analysis device 3 and the determination by the appropriateness determination device 4 as to whether the detection operation of the information analysis device 3 is appropriate or not.

[0098] Furthermore, if dummy information is provided to the information analysis device 3, the output switching unit 45 does not transmit the results of the detection operation of the information analysis device 3 received by the information analysis device 3 to the substrate processing device 1. In this case, when determining whether the detection operation of the information analysis device 3 is appropriate or not, the detection result of an abnormality in the substrate processing device 1 due to dummy information is prevented from being provided to the substrate processing device 1. 、 This prevents the user from mistakenly perceiving whether or not the substrate processing device 1 is malfunctioning.

[0099] Furthermore, the dummy information generation unit 42 replaces processing information related to continuously operating components among the multiple components constituting the substrate processing device 1 with dummy data. The dummy data is set to a value that deviates from the processing information related to the component. In this case, when the invariant relationship in the information analysis device 3 is compatible with the substrate processing device 1 and dummy information is provided to the information analysis device 3, the likelihood of the information analysis device 3 detecting an abnormality in the substrate processing device 1 increases. This makes it possible to more accurately determine whether the detection operation of the information analysis device 3 is appropriate or not.

[0100] (9) Other embodiments (9-1) In the above embodiment, the substrate processing apparatus 1 is a batch-type substrate cleaning apparatus, but the present invention is not limited thereto. The substrate processing apparatus 1 may be a single-wafer type substrate cleaning apparatus instead of a batch-type apparatus, and may have a configuration that performs processing other than cleaning. For example, the substrate processing apparatus 1 may be other substrate processing apparatus such as a coating apparatus, a developing apparatus, a heating apparatus, a cooling apparatus, or a transport apparatus.

[0101] (9-2) In the above embodiment, the suitability determination device 4 includes a dummy data storage unit 41, but it may not include a dummy data storage unit 41. In this case, the dummy information generation unit 42 of the suitability determination device 4 may acquire dummy data from, for example, a cloud on the internet. In this case, the number of components of the suitability determination device 4 is reduced. In addition, the dummy data storage unit 41 can be shared by multiple suitability determination devices 4.

[0102] (9-3) In the above embodiment, the multiple processing information of the substrate processing apparatus 1 is transmitted to the information analysis apparatus 3 via the suitability determination apparatus 4, but the multiple processing information may also be transmitted directly to the information analysis apparatus 3. In this case, the multiple processing information of the substrate processing apparatus 1 may be transmitted to the suitability determination apparatus 4 only at the start of the suitability determination operation of the suitability determination apparatus 4. Alternatively, the dummy information generation unit 42 may transmit dummy information to the information analysis apparatus 3 only at the start of the suitability determination operation of the suitability determination apparatus 4 by replacing all of the multiple processing information with dummy data.

[0103] (9-4) In the above embodiment, the dummy information generation unit 42 transmits dummy information to the information collection unit 31 of the information analysis device 3 based on a command from the dummy information transmission command unit 43, but the present invention is not limited thereto. For example, the dummy information generation unit 42 may transmit dummy information to the information collection unit 31 of the information analysis device 3 at the timing when a command is given by the administrator via the operation unit 4b of the suitability determination device 4. In this case, the suitability determination device 4 does not need to be provided with a dummy information transmission command unit 43. This reduces the number of functional components of the suitability determination device 4.

[0104] (9-5) In the above embodiment, the alarm from the information analysis device 3 is transmitted to the substrate processing device 1 via the suitability determination device 4, but it may also be transmitted directly to the substrate processing device 1. In this case, the output switching unit 45 may acquire only the alarms transmitted when the suitability determination device 4 is performing a suitability determination operation.

[0105] (9-6) In the above embodiment, if the detection operation of the information analysis device 3 is deemed inappropriate by the suitability determination device 4, a warning indicating that the detection operation of the information analysis device 3 is inappropriate is displayed on the display unit 4a, but the present invention is not limited thereto. If the detection operation of the information analysis device 3 is deemed inappropriate by the suitability determination device 4, the warning may be notified by the illumination of a lamp or the like, by a display on the screen of a display device, or by an audible warning.

[0106] (9-7) In the above embodiment, the substrate processing apparatus 1 and the information analysis apparatus 3 are provided separately, but the substrate processing apparatus 1 and the information analysis apparatus 3 may be provided as an integrated unit. Also, in the above embodiment, the information analysis apparatus 3 and the suitability determination apparatus 4 are provided separately, but the information analysis apparatus 3 and the suitability determination apparatus 4 may be provided as an integrated unit. [Explanation of Symbols]

[0107] 1...Substrate processing device, 3...Information analysis device, 4...Appropriateness determination device, 4a...Display unit, 4b...Operation unit, 11...Processing tank, 12...Substrate holding unit, 13...Lifting device, 14...Cleaning solution generation device, 14a...Storage tank, 15...Liquid supply pipe, 16...Pump, 17...Valve, 18...Liquid discharge pipe, 19...Valve, 20...Concentration meter, 30...Transport robot, 31...Information collection unit, 32...Score calculation unit, 33...Score transmission unit, 34...Alarm transmission unit, 40...Control device, 41...Dummy data storage unit, 42...Dummy information generation unit, 43...Dummy information transmission command unit, 44...Alarm reception unit, 45...Output switching unit, 46...Determination unit, 91...Chemical solution supply pipe, 92...Pure water supply pipe, 93...Additional chemical solution supply pipe, 94...Drainage pipe, V1~V4...Valve, W...Substrate

Claims

1. An appropriateness determination device that determines whether the detection operation of an information analysis device configured to detect an abnormality in a substrate processing device is appropriate, based on the invariant relationships between a plurality of processing information indicating operations or states related to the processing of a substrate of a substrate processing device and a plurality of processing information actually collected from the substrate processing device, A dummy information generation unit generates dummy information by replacing at least a portion of the plurality of processing information collected from the substrate processing apparatus with dummy data, and provides the dummy information to the information analysis device. The system includes a determination unit that determines whether the detection operation of the information analysis device is appropriate, based on whether the information analysis device detects an abnormality in the substrate processing device when the dummy information is provided to the information analysis device by the dummy information generation unit, and determines whether the invariant relationship in the information analysis device is suitable for the substrate processing device. The information analysis device calculates the degree of discrepancy between a predetermined set of invariant relationships for the set of processing information and the relationship between a set of combinations of the set of processing information actually collected, as a set of discrepancies, and calculates the degree of abnormality of the substrate processing device as an abnormality score based on the set of discrepancies. The dummy data is data set such that when the dummy information is provided to the information analysis device when the invariant relationship in the information analysis device is suitable for the substrate processing device, the abnormality score calculated by the information analysis device exceeds a predetermined abnormality determination threshold, thereby detecting an abnormality in the substrate processing device.

2. The appropriateness determination device according to claim 1, wherein the determination unit determines that the detection operation of the information analysis device is not appropriate when the information analysis device does not detect an abnormality of the substrate processing device when the dummy information is provided to the information analysis device by the dummy information generation unit.

3. The appropriateness determination device according to claim 1 or 2, further comprising a notification unit that notifies the information analysis device that its detection operation is not appropriate when the determination unit determines that the detection operation of the information analysis device is not appropriate when the dummy information is provided to the information analysis device.

4. The dummy information generation unit further comprises a dummy information transmission command unit that gives the dummy information generation unit a command to transmit the dummy information to the information analysis device, The appropriateness determination device according to any one of claims 1 to 3, wherein the dummy information generation unit transmits the plurality of processing information collected from the substrate processing device to the information analysis device when the dummy information transmission command unit has not commanded the transmission of the dummy information, and transmits the dummy information generated by the dummy information generation unit to the information analysis device when the dummy information transmission command unit has commanded the transmission of the dummy information.

5. The system further includes an output switching unit that receives the results of the detection operation of the information analysis device and transmits the received results of the detection operation to the substrate processing device or the determination unit, The appropriate determination device according to any one of claims 1 to 4, wherein the output switching unit does not transmit the result of the received detection operation to the substrate processing device when the dummy information is provided to the information analysis device.

6. The appropriateness determination device according to any one of claims 1 to 5, wherein the dummy information generation unit replaces processing information related to a continuously operating component among a plurality of components constituting the substrate processing device with dummy data, and the dummy data is set to a value that deviates from the processing information related to the component.

7. A method for determining whether the detection operation of an information analysis device configured to detect abnormalities in a substrate processing device is appropriate, based on invariant relationships between multiple processing information items indicating operations or states related to the processing of a substrate of a substrate processing device and multiple processing information items actually collected from the substrate processing device, The steps include generating dummy information by replacing at least a portion of the plurality of processing information collected from the substrate processing apparatus with dummy data, and providing the dummy information to the information analysis apparatus, The system includes a step of determining whether the detection operation of the information analysis device is appropriate, based on whether or not the information analysis device detects an abnormality in the substrate processing device when the dummy information is provided to the information analysis device, by determining whether the invariant relationship in the information analysis device is suitable for the substrate processing device. The information analysis device calculates the degree of deviation between the relationships between multiple combinations of the multiple processing information actually collected and the predetermined multiple invariant relationships for the multiple processing information as multiple deviation degrees, and calculates the degree of abnormality of the substrate processing device as an abnormality score based on the multiple deviation degrees. The dummy data is data set such that when the dummy information is provided to the information analyzer when the invariant relationship in the information analyzer is suitable for the substrate processing apparatus, the abnormality score calculated by the information analyzer exceeds a predetermined abnormality threshold, thereby detecting an abnormality in the substrate processing apparatus.

Images