Semiconductor device and measurement method

Abstract

To provide a semiconductor device that allows an external device to accurately measure internal voltage.SOLUTION: A semiconductor device comprises: a voltage generation circuit that generates predetermined voltage; a first MOSFET; and a first external connection terminal that is a terminal for external connection. In a first operation mode, the predetermined voltage is applied to a back gate of the first MOSFET, and a drain of the first MOSFET is electrically connected with the first external connection terminal.SELECTED DRAWING: Figure 2

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