Constructive light imaging device for 3D measurement or surface inspection

USD1107570SActive Publication Date: 2025-12-30SHENZHEN HANSWELL TECHNOLOGY CO LTD
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Patent Information

Application Number
US35/524191
Authority / Receiving Office
US · United States
Patent Type
Designs(United States)
Current Assignee / Owner
Priority Date
2024-08-30
Filing Date
2025-01-24
Publication Date
2025-12-30
Estimated Expiration
2040-12-30

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Description

[0001] 1. Constructive light imaging device for 3D measurement or surface inspection

[0002] 1.1 : Front

[0003] 1.2 : Back

[0004] 1.3 : Left

[0005] 1.4 : Right

[0006] 1.5 : Top

[0007] 1.6 : Bottom

[0008] 1.7 : Perspective

[0009] 1.8 : Perspective

Claims

The ornamental design for a constructive light imaging device for 3D measurement or surface inspection as shown and described.

Citation Information

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  • Registration calculation between three-dimensional (3D) scans based on two-dimensional (2D) scan data from a 3D scanner

    US20160033643A1

  • Scanning Illuminated Three-Dimensional Imaging Systems

    US20170310948A1