Determination program

Abstract

This determination program is executed by a processing circuit of a monitoring unit that determines a processed state when a workpiece has undergone processing by being irradiated with laser light. The determination program includes: a control program that cannot be modified by a user; and a determination algorithm that can be selectively integrated into the control program.

Description

Judgment Program

[0001] The present disclosure relates to a judgment program for a welding process monitor used for processing point monitoring in laser processing.

[0002] To test manufactured products, test equipment is used to perform tests that are compatible with the products. Such test equipment is controlled according to a predetermined test program. For example, in a semiconductor test equipment for testing semiconductor devices, the test program is composed of a control program and a test algorithm module that defines a test algorithm. As an example, in Patent Document 1, multiple test algorithm modules, each defining a different test algorithm, are stored on an external server, and the test equipment obtains the target test algorithm module from the external server.

[0003] FIG. 12 is a diagram showing the structure of a test program installed in a conventional information processing device described in Patent Document 1. In FIG.

[0004] The test program 1240 is composed of a control program 1302 and a program module 1304. The control program 1302 is the basic part of the test program 1240 and is used in common regardless of the type of device under test or the test content. The control program 1302 provides the functions of a hardware access unit, authentication unit, execution unit, interrupt / match detection unit, display unit, and reception unit.

[0005] On the other hand, the program module 1304 can be selectively incorporated into the control program 1302. The program module 1304 is prepared by the manufacturer or service provider, and is roughly classified into a test algorithm module 1304a and an analysis tool module 1304b.

[0006] Patent No. 5816144

[0007] In conventional configurations, because the analysis tool module is provided by the service provider, users are sometimes unable to perform the tests they desire. For example, if the DUT is changed and the user performing the test wants to change the analysis and judgment algorithm accordingly, the user cannot change the algorithm unless the desired analysis tool module is provided by the service provider. As a result, the user is unable to perform the analysis and judgment they desire.

[0008] The present disclosure aims to provide a method for setting a judgment algorithm that allows a user to freely set an algorithm for analysis and judgment without modifying the executable program itself.

[0009] According to one aspect of the present disclosure, there is provided a judgment program executed by a processing circuit of a monitoring unit for judging a machining state when a workpiece is irradiated with laser light to perform machining. The judgment program includes a control program that cannot be changed by a user and a judgment algorithm that can be selectively incorporated into the control program. One or more parameters defined by the user can be incorporated into the judgment algorithm. By executing the judgment program, the processing circuit performs the following processes: receiving data indicating the intensity of the laser light and data indicating the intensities of the components of thermal radiation, visible light, and reflected light generated at a weld formed on the workpiece; judging the machining state based on the received data and the judgment algorithm incorporating the one or more parameters; and outputting the judgment result.

[0010] According to the judgment program disclosed herein, a judgment algorithm setting method can be provided that allows a user to freely set an algorithm for analysis and judgment without modifying the executable program itself.

[0011] Schematic diagram showing an example of a laser processing system in an embodiment according to the present disclosure. Schematic diagram showing an example of a laser processing device of the laser processing system. Schematic diagram showing the hardware configuration of a monitoring unit. Diagram showing a schematic flowchart of a monitoring unit in an embodiment according to the present disclosure. Diagram showing an example of a measured waveform in an embodiment according to the present disclosure. Diagram showing a flowchart of a judgment algorithm in an embodiment according to the present disclosure and a relationship with externally defined parameters. Flowchart of a variable definition algorithm in an embodiment according to the present disclosure. Flowchart of a feature extraction calculation process in an embodiment according to the present disclosure. Flowchart of a composite feature calculation process in an embodiment according to the present disclosure. Flowchart of a judgment calculation process in an embodiment according to the present disclosure. FIG. 1 is a diagram showing an example of a label registration screen in a display screen for a determination result in an embodiment according to the present disclosure. FIG. 2 is a diagram showing a conventional determination algorithm setting method described in Patent Document 1. FIG. 3 is a diagram showing a conventional determination algorithm setting method described in Patent Document 1.

[0012] Hereinafter, embodiments of the present disclosure will be described with reference to the drawings. However, unnecessary detailed descriptions may be omitted. For example, detailed descriptions of well-known matters or redundant descriptions of substantially identical configurations may be omitted. This is to avoid unnecessary redundancy in the following description and to facilitate understanding by those skilled in the art. Note that the inventors provide the accompanying drawings and the following description to enable those skilled in the art to fully understand the present disclosure, and the subject matter described in the claims is not limited by them.

[0013] Before describing the embodiments, the problems that the inventors faced will be described in more detail.

[0014] As mentioned above, if a tester wanted to change the analysis or judgment algorithm, they could not do so unless the service provider provided the desired analysis tool module. Therefore, they had to request the change or modification from the service provider individually. However, it takes time to change the algorithm after requesting the service provider. For example, it can take more than two weeks from creating the software modification specifications to placing the order and delivery. This has been the current practice.

[0015] In actual production, when a defect or product change occurs, it may be necessary to review manufacturing conditions and quickly change the pass / fail criteria. If it takes time to change the algorithm, it will result in lost business opportunities.

[0016] If users could change the algorithm themselves, it would be possible to implement the change in just a few hours, which would reduce opportunity losses.

[0017] Therefore, the present inventors have considered adopting the configuration according to the embodiment described below, and have come to realize it.

[0018] (Embodiment) In this specification, as an exemplary embodiment, a determination system will be described that detects components of light generated during laser processing for welding and determines the weld shape as the processing state based on a signal corresponding to the change over time of the detected components.

[0019] 1. Configuration A laser processing system according to this embodiment will be described with reference to FIG. 1A.

[0020] FIG. 1A is a diagram showing an overview of a laser processing system 100.

[0021] 1-1. System Overview The laser processing system 100 has a laser oscillator 1, a laser processing device 10, a spectroscope 14, and a monitoring unit 15. The laser oscillator 1 and the laser processing device 10 are connected by an optical fiber 2. Similarly, the laser processing device 10 and the spectroscope 14 are connected by an optical fiber 13. The spectroscope 14 and the monitoring unit 15 are connected by a signal line. Similarly, the laser processing device 10 and the monitoring unit 15 are connected by a signal line.

[0022] The laser oscillator 1 and the laser processing device 10 perform laser processing, for example, for line welding. Fig. 1B shows an example of the internal configuration of the laser processing device 10. The laser processing device 10 has an output collimator 3, a bending unit 5, a condenser lens unit 6, a detector unit 9, and a condenser collimator 12. Laser light is input to the laser processing device 10 via an optical fiber 2. The laser light 4 in the laser processing device 10 is converted into a parallel beam by the output collimator 3. A portion of the parallel beam is deflected by a dielectric multilayer film mirror 16 and enters the condenser lens unit 6, and the remaining portion enters the detector unit 9.

[0023] The collimated beam incident on the condenser lens unit 6 is emitted outside the laser processing apparatus 10. At this time, the condenser lens unit 6 converges the collimated beam. The converged light is irradiated onto a workpiece at a processing point 8 on a workpiece 7 to be processed. For example, the workpiece 7 is made of metal, and two members are overlapped and welded together. In this specification, the workpiece 7 to be processed may also be referred to as a "workpiece."

[0024] At the processing point 8, when the laser beam 4 is irradiated onto the workpiece 7, thermal radiation in the near-infrared region occurs due to a temperature rise, and metal-specific light or plasma light emission, which is mainly a visible light component, occurs. Furthermore, a portion of the laser beam 4 that does not contribute to processing is reflected as returned light. In this way, when the laser beam 4 is irradiated onto the workpiece 7 from the laser processing device 30, thermal radiation, visible light, and reflected light occur at the processing point 8 formed by melting the metal on the workpiece 7. For convenience of description, the thermal radiation component may be referred to as "thermal radiation light" in this specification.

[0025] At the processing point 8, the reflected light of the laser light 4 and the light emitted by the processing return toward the condenser lens unit 6 and the bending unit 5. Hereinafter, these will be referred to as "returned light." As described above, the returned light includes components of thermal radiation light, plasma light, and reflected light. The returned light enters the condenser lens unit 6 and then the bending unit 5. The returned light that has passed through the dielectric multilayer film mirror 16 is incident on the spectroscope 14 via the condenser collimator 12 and optical fiber 13.

[0026] The spectroscope 14 separates the returned light into reflected laser light, plasma light emitted from the processing point, and thermal radiation light. Each light undergoes photoelectric conversion by a photodetector and is sent to the monitoring unit 15. In this embodiment, a well-known spectroscope 14 is used, and therefore a detailed description of the configuration of the spectroscope 14 will be omitted.

[0027] Meanwhile, the detector unit 9 receives the light that has passed through the dielectric multilayer mirror 16 and performs optical-electrical conversion to generate an electrical signal that indicates the intensity of the laser light 4. The rising edge of the intensity of the laser light 4, represented by the electrical signal, is used as a trigger for recording waveform data. The electrical signal is sent to the monitoring unit 15.

[0028] The monitoring unit 15 receives electrical signals that indicate the intensities of the reflected light, plasma light, and thermal radiation light that have been photoelectrically converted by the spectroscope 14. At the same time, the monitoring unit 15 receives electrical signals that indicate changes in the intensity of the laser light 4 from the detector unit 9. Based on the received electrical signals, the monitoring unit 15 makes a predetermined judgment and records the judgment results. The monitoring unit 15 performs, for example, hole judgment, welding focus judgment, and gap judgment.

[0029] FIG. 1C is a diagram showing the hardware configuration of the monitoring unit 15.

[0030] The monitoring unit 15 includes a processing circuit 152 , a storage device 154 , and an AD conversion interface (I / F) 156 .

[0031] The processing circuitry 152 includes a CPU and the like, and the CPU executes a program (software) to realize the processing and functions of the monitoring unit 15 according to this embodiment. Instead of a CPU, the processing circuitry 152 may include a processor configured with a dedicated electronic circuit designed to realize a predetermined function. That is, the processing circuitry 152 can be realized by various processors such as a CPU, MPU, GPU, DSU, FPGA, ASIC, etc. The processing circuitry 152 may be configured with one or more processors.

[0032] The storage device 154 is a recording medium that functions as a work memory for the monitoring unit 15. The storage device 154 may include a DRAM and / or a flash ROM. In this embodiment, the storage device 154 stores a determination program 155 and a parameter setting file 155c that are executed by the processing circuit 152.

[0033] The judgment program 155 includes a control program 155a and a judgment algorithm 155b. The control program 155a is a computer program that is pre-installed in the software and cannot be changed by the user. The judgment algorithm 155b is a program that is selectively installed in the control program 155a by the user. A parameter setting file 155c that can be freely set by the user is loaded into the judgment algorithm 155b. The parameter setting file 155c is a collection of externally defined parameters defined by the user.

[0034] The AD conversion I / F 156 samples the analog signal at regular intervals to convert it into a digital signal. The digital signal can be used as a calculation target in the processing device 152. In this embodiment, the AD conversion I / F 156 is an interface capable of receiving electrical signals from the spectrometer 14 and the detector unit 9 of the laser processing device 10.

[0035] The above-mentioned series of operations will be described with reference to FIG.

[0036] 2 is a diagram mainly showing a schematic flowchart of the monitoring unit 15 in this embodiment. Numbers in parentheses in the following description correspond to the reference symbols assigned to the processes in FIG.

[0037] When laser welding starts, the return light, which is a mixture of reflected light, plasma light, and thermal radiation light, is transmitted through the optical fiber 13 into the spectrometer 14 (202). After being split by wavelength (203), the light undergoes optical-electrical conversion by the photodetector (204), and the electrical signal is input to the monitoring unit 15.

[0038] The subsequent processing of the monitoring unit 15 is mainly executed by the processing circuit 152. The monitoring unit 15 acquires the waveform via the AD conversion I / F 156 (205). The processing circuit 152 of the monitoring unit 15 performs preprocessing such as low-pass filtering on the waveform data (206), and then passes the processing to a waveform data storage process (207) and a judgment routine (220). The waveform data storage process (207) stores waveform data of signals indicating the intensity of the laser beam 4 and waveform data of signals indicating the intensities of the thermal radiation light, visible light, and reflected light generated at the weld formed on the workpiece 7.

[0039] The determination routine (220) corresponds to the determination program 155 (FIG. 1C). The calculation process (208) realized by the determination routine (220) is based on the control program 155a and the determination algorithm 155b selectively incorporated by the user.

[0040] As a prerequisite for the operation of the determination algorithm 155b, the determination algorithm 155b is preloaded with a user-defined parameter list 209. The user-defined parameter list 209 is a list prepared using the parameter setting file 155c, and is a set of one or more externally defined parameters selected by the user in accordance with the determination routine (220).

[0041] The calculation process (208) may include multiple calculation processes. The user-defined parameter list 209 may be written in a list format to indicate the execution order of the multiple calculation processes. That is, the calculation processes (208) may be executed in the order listed in the user-defined parameter list 209.

[0042] The user-defined parameter list 209 can be freely rewritten by the user according to the content of the process to be determined by the determination routine 220. By employing such a software configuration, the user-defined parameter list 209 can be used to change the determination process to the user's preference without modifying the control program 155a of the monitoring unit 15 itself.

[0043] The processing circuit 152 executes the calculation process according to the control program 155a and the determination algorithm 155b based on the user-defined parameter list 209 (208).

[0044] The user-defined parameter list 209 used in the determination process can be saved in the storage device 154 or other storage device as an external file for the software of the monitoring unit 15. The processing circuit 152 can save or read the user-defined parameter list 209 through a parameter setting file save / read process (212). For example, the processing circuit 152 can reset the parameters at the time of saving by reading a saved file. Saving the user-defined parameter list 209 for each product model as an external file facilitates data deployment to other devices when switching models. Saving the external file as a binary file or an encrypted file makes it more difficult to read the contents even if the file is leaked, such as when deployed to another device, compared to saving it in a CSV format containing text, for example. This provides greater security. When a file is encrypted, only authenticated individuals can obtain the decryption key.

[0045] As a result of the execution of the calculation process (208), the processing circuit 152 acquires one or more judgment results selected by the user, performs a comprehensive judgment by combining the judgment results (210), and performs judgment result output processing (211).

[0046] FIG. 3 is a diagram showing an example of a measured waveform in this embodiment.

[0047] In Figure 3, the horizontal axis represents the number of samples taken when an analog signal is converted to digital form and then captured, and the vertical axis represents the voltage value output when the optical output is received by a photodetector. The actual elapsed time is represented by the number of samples multiplied by the sampling interval time set by the parameter. In this embodiment, the sampling time interval is 5 μs. The scale 1100 on the horizontal axis of the graph in Figure 3 represents 5.5 milliseconds.

[0048] A waveform 20 represents the output intensity of the laser light 4 .

[0049] Waveform 21a represents the intensity of reflected light, waveform 21b represents the intensity of thermal radiation light, and waveform 21c represents the intensity of plasma light. As shown in waveform 20, the output of laser light 4 rises from 100 to 200 on the horizontal axis. Then, it can be observed that the intensity of reflected light increases (waveform 21a) until the weld begins to melt, and once melting begins, the intensity of plasma light (waveform 21c) and the intensity of thermal radiation light (waveform 21b) rise.

[0050] 4A to 4E are flowcharts showing the processing procedure of the monitoring unit 15 in this embodiment.

[0051] FIG. 4A shows the procedure for introducing externally defined parameters into the decision algorithm, which is performed in the processing circuit 152.

[0052] The processing circuitry 152 uses the preprocessed waveform data 400 to define variables using user-defined label settings 461 (401). The processing circuitry 152 reads user-defined feature setting parameters 462 based on the defined variables and performs feature extraction calculations (402). The feature setting parameters 462 include, for example, output variable names, waveform data, calculation target ranges, feature extraction processes (average values, maximum values, etc.), and flags (use, file output).

[0053] Next, the processing circuitry 152 performs a composite feature calculation (403) using user-defined composite feature setting parameters 463. The composite feature setting parameters 463 include, for example, output variable names, target variable names, target numerical values, operators (addition, subtraction, multiplication, division, factorial, etc.), and flags (use, file output).

[0054] Next, the processing circuit 152 performs a judgment calculation (404) using a user-defined judgment processing setting 464. The parameters of the judgment processing setting 464 include, for example, the output variable name, the name of the variable to be calculated, the numerical operator to be calculated (comparison, logic), and flags (use, file output, final judgment, display).

[0055] The externally defined judgment algorithm is defined in list format in the feature setting 462, feature setting (composite) 463, and judgment process setting 464, and the algorithm can be constructed by performing calculations sequentially from the top of the list to the bottom. In this way, by adopting a structure that allows the calculation order and calculation targets to be defined outside the software, the user can freely set complex judgment formulas without modifying the software.

[0056] 6A and 6B are diagrams illustrating the feature quantities of the measured waveform in this embodiment. The concept of the feature quantities will be described with reference to FIGS. 6A and 6B.

[0057] FIG. 6A is a diagram illustrating the concept of waveform data deviating from the normal range. Normal waveform data is typically observed between the upper and lower limits of the normal range, centered on the standard waveform. To calculate the feature, the range of sampling numbers to be calculated is defined as the calculation range. Within the calculation range, the "average signal waveform" is the average of the signal values, and the "maximum signal value" is the maximum signal value. The "NG rate" indicates the rate at which the measured light intensity exceeds the upper limit or falls below the lower limit of the normal range within the calculation range. The "peak height" indicates the value obtained by normalizing the "maximum signal value" by dividing it by the "average signal value" of the standard waveform.

[0058] 6B illustrates the concept of the variability. The variability represents the percentage change in the average signal value of the measured waveform relative to the average signal value of the standard waveform within the calculation range. If the average signal value of the standard waveform is 100%, and the average signal value of the measured waveform is 120%, the variability is 20%. If the average signal value of the measured waveform is lower than the average signal value of the standard waveform, the variability will be a negative value.

[0059] FIG. 6C illustrates the concept of measuring multiple waveforms when multiple laser irradiations are performed within a single measurement sampling data set. The two solid waveforms represent the change in signal values ​​measured during laser irradiation. The example in FIG. 6C shows two locations where welding was performed using the same parameters. By setting a calculation range for each feature to be extracted, it is possible to extract corresponding features at the first and second welding positions. In this example, the calculation ranges for the early stage of welding are associated with (A-1) and (A-2), the calculation ranges for the stable period in the middle stage of welding are associated with (B-1) and (B-2), and the calculation ranges for the final stage of welding are associated with (C-1) and (C-2). While two waveforms are shown in this example, three or more waveforms may be included within a single measurement sampling data set.

[0060] 4B is a flowchart showing the detailed procedure of the variable definition algorithm. After importing the preprocessed waveform data 400, the processing circuit 152 reads the label names defined by the user from the top of the list (411) and defines the variables (412). The processing circuit 152 determines whether the current process is the last in the list (413). If yes, the process proceeds to "Go to Step 2" (414). If no, the process reads the label names according to the next line in the list (411).

[0061] FIG. 5 is a diagram showing an example of a label registration screen in this embodiment.

[0062] 5, label registration can be set for each of three categories: "feature value setting label," "feature value setting (composite) label," and "determination process setting label," and detailed items are set for each of these categories.

[0063] In this embodiment, L_ / R_ / P_ / T_ are used as prefixes for "feature setting labels." These represent laser output, reflected light, plasma light, and thermal light, respectively, making it easier for users to intuitively understand which light the feature corresponds to. The prefix C_ for "feature setting (complex) label" stands for "complex" and is used to make it easier to understand that it is a composite feature. The character after C_ is the same as the prefix for "feature setting label." The prefix J_ for "judgment processing setting label" stands for "judgment," making it easier for users to intuitively understand that it is a label for judgment processing.

[0064] Labels can be written in a list format, and are allocated as variables in memory in order from the top of the list. Each list can be inserted or deleted on a line-by-line basis, making it easy to change the order of items. It is also possible to set blank lines, which contributes to improved visibility.

[0065] By setting each label, it becomes possible to use the label as a variable name in the subsequent processes of feature amount setting, feature amount setting (combination), and judgment processing, thereby preventing setting errors. Note that the specific display shown in Figure 5 is an example. Other expressions can also be used.

[0066] Fig. 4C is a flowchart showing the details of the algorithm for the feature extraction calculation. Fig. 7 is a diagram showing an example of a list screen for inputting parameters for the feature extraction calculation in this embodiment. The feature extraction calculation will be described below using Figs. 4C and 7.

[0067] In Fig. 4C, Step 2 of the variable definition algorithm is started (420). At this point, the processing circuitry 152 retrieves each label of the variable definition algorithm. The processing circuitry 152 reads the user-defined parameters defined in the list, sequentially from the top (421). As shown in Fig. 7, the user-defined parameters consist of "usage flag," "file output flag," "label," "waveform type," "calculation domain_start point," "calculation domain_end point," "function," and "comment."

[0068] Referring again to Figure 4C, the processing circuit 152 determines whether or not a use flag is set (422). If the result is No, the processing circuit 152 skips further processing and reads the parameters in the next row of the list. If the result is Yes, the processing circuit 152 proceeds to processing to perform calculations from the top of the list (423).

[0069] For the calculation process, the processing circuit 152 sets the "label" as a variable to which the calculation result is output and the signal type of the target waveform data as the "waveform type." The calculation target range of the waveform data is set as "calculation area_start point" to "calculation area_end point" using the number of sampling points as an index, and fixed processing can be defined as a "function" and selected from a list.

[0070] One of the features of the processing in this embodiment is that a calculation range can be set for each calculation process. When at least two or more welds are performed on one product, a calculation range corresponding to each weld can be set. This makes it possible to combine waveform data for the number of welds required for one product into a single sampled waveform.

[0071] As described above, by treating the waveform data as a single sampled data, the data is organized while maintaining the relationships between related data, leading to improved judgment accuracy. Furthermore, the ability to set the calculation range allows feature values ​​to be extracted for any location within a single sampled data, making it possible to capture physical features necessary for judgment, such as the calculation range for the early stage of welding, the stable period in the middle of welding, and the final stage of welding. Furthermore, the number of extracted feature values ​​can be easily increased by adding rows to the feature setting screen shown in Figure 7.

[0072] The "function" of the standard processing may be, for example, the average value, maximum value, minimum value, integral value, PV value, standard deviation, the percentage of deviation from the allowable range of signal fluctuation, the percentage of deviation upward from the upper limit of the allowable range of signal fluctuation, the percentage of deviation downward from the lower limit of the allowable range of signal fluctuation, etc.

[0073] Any text can be entered in the "comment" field in Fig. 7. The "comment" field is used when displaying the feature on the screen during actual operation to make it easier for the user to understand the content.

[0074] Referring again to Figure 4C, the processing circuit 152 determines whether to output a file (424). If the "file output flag" is checked, the processing circuit 152 saves the feature values, which are the calculation results, in a file (425). If the "file output flag" is not checked, the processing proceeds to the next step (426).

[0075] Next, the processing circuitry 152 determines whether the current process is the last in the list (426). For example, if the last line in the list of the feature setting screen shown in Fig. 7 has not yet been executed, the processing circuitry 152 returns to the user setting parameter reading process (421) and continues processing for the next line in the list. Once execution of the last line has been completed, the processing proceeds to "Go to Step 3" (427).

[0076] Fig. 4D is a flowchart showing the details of the algorithm for the composite feature calculation. Fig. 8 is a diagram showing an example of a list screen for inputting parameters for the composite feature calculation in this embodiment. The composite feature calculation will be described below with reference to Figs. 4D and 8.

[0077] 4D, Step 3 of the composite feature calculation algorithm is started (430). At this point, the processing circuitry 152 has acquired each feature using the feature extraction calculation algorithm.

[0078] The processing circuitry 152 reads the user-defined parameters defined in the feature setting (composite) list shown in Fig. 8 in order from the top (431). As shown in Fig. 8, the user-defined parameters consist of a "use flag," a "file output flag," a "label," a "calculation formula," and a "comment." For example, the user can set the values ​​of two items, which are set from a "label" variable or a "numeric value," and the operator used to calculate them, for the "calculation formula."

[0079] Referring again to Figure 4D, the processing circuit 152 determines whether or not a use flag is present (432). If the result is No, the processing circuit 152 skips further processing and proceeds to a determination of whether or not the list is at its end (436). If the result is Yes, the processing circuit 152 proceeds to a process of performing calculations from the top of the list (433).

[0080] In the calculation process, the processing circuit 152 uses the "feature setting (composite) label" as a variable to which the calculation result is output, inputs the variable or numerical value set in the "feature setting label" into the "calculation formula," and performs the calculation. The calculation may be addition, subtraction, multiplication, division, or multiplication. Any text can be input into the "comment," and is used when displaying the feature on the screen during actual operation to make the content easier for the user to understand.

[0081] Referring again to Figure 4D, the processing circuit 152 determines whether to output a file (434). If the "file output flag" is checked, the processing circuit 152 saves the feature values, which are the calculation results, in a file (435). If the flag is not checked, the processing proceeds to the next step (436).

[0082] Next, the processing circuitry 152 determines whether the current process is the last in the list (436). For example, if the last line in the list of the feature setting (composite) screen shown in Fig. 8 has not yet been executed, the processing circuitry 152 returns to the user setting parameter reading process (431) and executes the process for the next line in the list. When the execution of the last line is completed, the process proceeds to "Go to Step 4" (437).

[0083] Fig. 4E is a diagram showing the algorithm of the determination calculation. Fig. 9 is a diagram showing an example of a list screen for inputting parameters for the determination processing calculation in this embodiment. Fig. 10 is a diagram showing an example of a display screen for the determination results. The determination processing calculation will be explained below using Figs. 4E, 9 and 10.

[0084] 4E, Step 4 of the composite feature calculation algorithm begins (440). At this point, processing circuitry 152 has acquired each feature.

[0085] The processing circuit 152 reads the user-defined parameters defined in the list of determination process settings shown in Fig. 9 in order from the top (441). As shown in Fig. 9, the user-defined parameters consist of a "use flag," a "file output flag," a "final determination flag," a "display flag," a "label," a "determination formula," and a "comment." The "determination formula" can be set by the user using two item values ​​set from a "label" variable or a "numeric value," and an operator used for their comparison or logical operation.

[0086] Referring again to Figure 4E, processing circuit 152 determines whether or not a use flag is present (442). If the result is No, processing circuit 152 skips further processing and proceeds to a determination of whether or not the list is at its end (450). If the result is Yes, processing circuit 152 proceeds to processing to perform operations from the top of the next list (443).

[0087] In the calculation process, the processing circuit 152 uses the "determination process setting label" as a variable to which the calculation result is output, and inputs the variables or numerical values ​​set by the "feature amount setting label," "feature amount setting (composite) label," and "determination process setting label" into the "determination formula" to perform a judgment calculation. The comparison operators used in the judgment calculation may be ">, ≧, <, ≦, =, ≠, etc.", and the logical operators may be "AND, OR, NAND, NOR, NOT, XOR, etc." Any text can be entered in the "comment," and is used when displaying features on the screen during actual operation to make the content easier for the user to understand.

[0088] Referring again to Figure 4E, the processing circuit 152 determines whether or not to output a file (444). If the "file output flag" is checked, the processing circuit 152 saves the result of the determination process in a file (445). If the flag is not checked, the file saving process is skipped.

[0089] Next, the processing circuit 152 determines whether the "final determination flag" is set (446). If the "final determination flag" is set, the processing circuit 152 adds the determination result to the overall determination (447). If the "final determination flag" is set, the processing circuit 152 proceeds to the next process (448).

[0090] Next, the processing circuit 152 determines whether a display flag exists (448). If the "display flag" is checked, the processing circuit 152 adds the determination result to the selection list of screen display items (449). As a result, the determination result is displayed in the "individual determination" column as shown in FIG. 10. If the flag is not checked, the processing circuit 152 proceeds to the next process (450).

[0091] Next, the processing circuit 152 determines whether or not the list is at its end (450). If the final line of the list on the judgment processing setting screen shown in FIG. 9 has not yet been executed, the processing circuit 152 returns to the user-set parameter reading process (450) for the next line in the list and continues processing. Once execution of the final line is complete, the processing circuit 152 proceeds to the overall judgment result output process (451). The overall judgment is deemed OK when all of the items extracted by "Add judgment results to overall judgment target" 447 and the laser output judgment items are judged as OK.

[0092] FIG. 11 is a diagram showing an example of a measurement screen in this embodiment.

[0093] In Figure 11, the relationship between the number of samples of laser output, reflected light, plasma light, and thermal radiation light and the voltage value corresponding to the intensity of the optical output is shown in graphs. Feature display areas are provided below and to the right of each graph. The user can select any feature from a pull-down list to display it. Displaying all the feature values ​​on the label registration screen shown in Figure 5 would be cumbersome. Therefore, only the feature values ​​for which the file output flag is checked on the feature setting screen shown in Figure 7, the feature (composite) setting screen shown in Figure 8, and the judgment process setting screen shown in Figure 9 are displayed.

[0094] The feature setting screen shown in Fig. 7, the feature (composite) setting screen shown in Fig. 8, and the judgment process setting screen shown in Fig. 9 are characterized in that the calculation process is performed from the top of the list to the bottom, and the user can enter the list in order according to the algorithm he or she wants to set. Each list also has editing functions such as inserting, deleting, changing the order, copying, and pasting for each line.

[0095] According to the above-described configuration, by creating a list of the processing procedures for the arithmetic processing of the judgment algorithm and providing the list to the program as user parameters, it becomes possible to change the judgment algorithm without modifying the program code, and it becomes possible to quickly respond to changes in the analysis and judgment methods due to changes in product types, etc. at the production site, and to minimize opportunity loss.

[0096] When welding is performed in the mass production of electronic components, if a defect occurs in a product, it is necessary to quickly review the manufacturing conditions to minimize downtime in the manufacturing process. Accordingly, it becomes necessary to change the pass / fail judgment criteria and judgment algorithm. In such a case, if a manufacturer is requested to modify the software, it usually takes several weeks from creating the modification specifications to placing an order and delivery. However, according to an embodiment of the present disclosure, the pass / fail judgment criteria and algorithm can be modified by the user at the production site, thereby reducing opportunity loss without waiting for a response from the service provider.

[0097] The above explanation is merely an example. For example, for at least one of feature extraction, feature numerical calculation, and logical calculation, the "calculation formula" may be constructed using the values ​​of two items set from "label" variables or "numeric values" and the operators used in the calculation.

[0098] (Aspects of the Present Disclosure) As described above, the present disclosure includes the following aspects.

[0099] (Aspect 1) A judgment program executed by a processing circuit of a monitoring unit that judges a processing state when a workpiece is irradiated with laser light to perform processing, the judgment program including: a control program that cannot be changed by a user; and a judgment algorithm that can be selectively incorporated into the control program, wherein one or more parameters defined by a user can be incorporated into the judgment algorithm, and the processing circuit executes the judgment program to perform the following processes: receiving data indicating the intensity of the laser light and data indicating the intensities of each component of thermal radiation, visible light, and reflected light generated at a weld formed on the workpiece; judging the processing state based on the received data and the judgment algorithm into which the one or more parameters have been incorporated; and outputting the judgment result.

[0100] (Aspect 2) The judgment algorithm includes multiple types of arithmetic processing, the one or more parameters are multiple parameters that are incorporated into the judgment algorithm before execution of the judgment program as data required for each of the multiple types of arithmetic processing, and indicate the order in which the multiple types of arithmetic processing are executed, and the processing circuit, by executing the judgment program, executes the multiple types of arithmetic processing in accordance with the order indicated by the multiple parameters, a judgment program according to aspect 1.

[0101] (Aspect 3) The judgment program according to aspect 2, wherein the plurality of parameters are created in list format, and the order of the list indicates the order in which the plurality of types of calculation processing are executed, and the list is created in advance by the user and incorporated into the judgment algorithm before the judgment program is executed.

[0102] (Aspect 4) The judgment program according to Aspect 3, wherein the plurality of parameters include labels indicating each of the plurality of types of arithmetic processing, and each label can be set with a plurality of parameters corresponding to the arithmetic processing, and the plurality of types of arithmetic processing includes: extracting a predetermined feature amount contained in the intensity of at least one of the thermal radiation, the visible light, and the reflected light based on received data indicating the intensity of the laser light and data indicating the intensity of each component of the thermal radiation, the visible light, and the reflected light; performing a numerical calculation on the predetermined feature amount; and performing a logical calculation for judgment based on the extracted result of the numerical calculation.

[0103] (Aspect 5) The determination program according to aspect 2, wherein the plurality of parameters are stored in a file, and the file is loaded before the determination program is executed, thereby incorporating the parameters into the determination algorithm.

[0104] (Aspect 6) The determination program according to aspect 5, wherein the file is a binary file or an encrypted file.

[0105] (Aspect 7) The judgment program according to aspect 4, wherein the plurality of parameters include at least one calculation formula, and the processing circuit executes the judgment program to perform the numerical calculation and / or the logical calculation in accordance with the at least one calculation formula.

[0106] (Aspect 8) The data indicating the intensity of the laser light and the data indicating the intensity of each component of the thermal radiation, the visible light, and the reflected light are waveform data indicating the waveform of each intensity, and the plurality of parameters include a specification of a range to be used in calculations for each waveform data.

[0107] The judgment algorithm setting method according to the present disclosure has the function of quickly responding to changes in analysis and judgment methods due to changes in product types at the production site, and can also be applied to quality assurance purposes in the production of electronic components such as batteries.

[0108] REFERENCE SIGNS LIST 1 Laser oscillator 2 Optical fiber 3 Emission collimator 4 Laser light 5 Bending unit 6 Condenser lens unit 7 Workpiece 8 Processing point 9 Detector unit 10 Signal line 11 Reflected light, plasma light, thermal radiation light 12 Condenser collimator 13 Optical fiber 14 Spectrometer 15 Optical signal collection unit 16 Dielectric multilayer mirror

Claims

1. A judgment program executed by a processing circuit of a monitoring unit for judging a processing state when a workpiece is irradiated with laser light to perform processing, said judgment program including a control program that cannot be changed by a user, and a judgment algorithm that can be selectively incorporated into said control program, and one or more parameters defined by a user can be incorporated into said judgment algorithm, and by executing said judgment program, said processing circuit executes the following processes: receiving data indicating the intensity of the laser light and data indicating the intensities of each component of thermal radiation, visible light and reflected light generated at a weld formed on the workpiece; judging the processing state based on the received data and the judgment algorithm into which the one or more parameters have been incorporated; and outputting the judgment result.

2. The judgment program of claim 1, wherein the judgment algorithm includes a plurality of types of arithmetic processing, the one or more parameters are a plurality of parameters which are incorporated into the judgment algorithm before execution of the judgment program as data required for each of the plurality of types of arithmetic processing and indicate the order in which the plurality of types of arithmetic processing are executed, and the processing circuit, by executing the judgment program, executes the plurality of types of arithmetic processing in accordance with the order indicated by the plurality of parameters.

3. The judgment program according to claim 2, wherein the multiple parameters are created in list form, and the order of the list indicates the order in which the multiple types of calculation processing are executed, and the list is created in advance by the user and incorporated into the judgment algorithm before the judgment program is executed.

4. The judgment program of claim 3, wherein the multiple parameters include labels indicating each of the multiple types of arithmetic processing, and each label can be set with multiple parameters corresponding to the arithmetic processing, and the multiple types of arithmetic processing include: extraction of a predetermined feature contained in the intensity of at least one of the thermal radiation, the visible light and the reflected light based on received data indicating the intensity of the laser light and data indicating the intensities of each component of the thermal radiation, the visible light and the reflected light; numerical calculation of the predetermined feature; and logical calculation for judgment based on the extracted result of the numerical calculation.

5. The judgment program according to claim 2, wherein the plurality of parameters are stored in a file, and the file is loaded before the judgment program is executed, thereby incorporating the parameters into the judgment algorithm.

6. The determination program of claim 5, wherein the file is a binary file or an encrypted file.

7. The judgment program according to claim 4, wherein the plurality of parameters include at least one calculation formula, and the processing circuit executes the judgment program to perform the numerical calculation and / or the logical calculation in accordance with the at least one calculation formula.

8. The judgment program according to claim 4, wherein the data indicating the intensity of the laser light and the data indicating the intensities of each component of the thermal radiation, the visible light and the reflected light are waveform data indicating the waveforms of each intensity, and the multiple parameters include a designation of a range to be used in calculations for each waveform data.

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