Positioning methods and apparatuses, and storage medium

Abstract

Provided are positioning methods and apparatuses, and a storage medium. A positioning method comprises: receiving measurement results of a plurality of measurement units of a second node, wherein the measurement results of the measurement units comprise measured values, from the measurement units, of a plurality of beams to be measured; and determining location information of the second node on the basis of the measurement results of the plurality of measurement units.

Description

Positioning method, device and storage medium

[0001] This disclosure claims priority to Chinese patent application No. 202310803670.6, filed on June 30, 2023, the entire contents of which are incorporated herein by reference. Technical Field

[0002] The present disclosure relates to the field of communications, and in particular to a positioning method, device, and storage medium. Background Art

[0003] Reconfigurable intelligent surface (RIS) technology uses artificial electromagnetic materials with programmable electromagnetic properties to control the electromagnetic environment. For example, RIS controls the electromagnetic environment by adjusting the phase of each element to focus the outgoing beam to a desired direction or point.

[0004] Summary of the Invention

[0005] In one aspect, embodiments of the present disclosure provide a positioning method, applied to a first node. The positioning method includes: receiving measurement results from multiple measurement units of a second node, the measurement results including measurement values ​​of the measurement units for multiple beams to be measured; and determining location information of the second node based on the measurement results of the multiple measurement units.

[0006] In another aspect, an embodiment of the present disclosure provides a positioning method for a second node. The positioning method includes: determining measurement results of multiple measurement units, where the measurement results of the measurement units include measurement values ​​of the measurement units for multiple beams to be measured; and sending the measurement results of the multiple measurement units to a first node.

[0007] In another aspect, embodiments of the present disclosure provide a positioning device. The positioning device includes: a receiving unit and a processing unit; the receiving unit is configured to receive measurement results from multiple measurement units of a second node, the measurement results including measurement values ​​of the measurement units for multiple beams to be measured; and the processing unit is configured to determine location information of the second node based on the measurement results of the multiple measurement units.

[0008] In another aspect, an embodiment of the present disclosure provides a positioning device. The positioning device includes: a processing unit and a sending unit; the processing unit is configured to determine measurement results of multiple measurement units, wherein the measurement results of the measurement units include measurement values ​​of the measurement units for multiple beams to be measured; and the sending unit is configured to send the measurement results of the multiple measurement units to a first node.

[0009] In another aspect, an embodiment of the present disclosure provides a communication device comprising: a memory and a processor; the memory and the processor are coupled; the memory is configured to store a computer program; and the processor implements the positioning method of any of the above embodiments when executing the computer program.

[0010] In another aspect, an embodiment of the present disclosure provides a computer-readable storage medium having computer program instructions stored thereon, which, when executed by a processor, implements the positioning method of any of the above embodiments.

[0011] In another aspect, an embodiment of the present disclosure provides a computer program product, which includes computer program instructions, and when the computer program instructions are executed by a processor, implements the positioning method of any of the above embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] To more clearly illustrate the technical solutions of the present disclosure, the following briefly introduces the drawings required for use in some embodiments of the present disclosure. Obviously, the drawings described below are only drawings of some embodiments of the present disclosure, and those skilled in the art can also derive other drawings based on these drawings. Furthermore, the drawings described below are schematic diagrams and are not intended to limit the actual dimensions of the products, actual processes of the methods, actual timing of signals, and the like involved in the embodiments of the present disclosure.

[0013] FIG1 is a schematic diagram of the architecture of a communication system according to some embodiments.

[0014] FIG2 is a schematic diagram of the architecture of a RIS device according to some embodiments.

[0015] FIG3 is a schematic flow chart of a positioning method according to some embodiments.

[0016] FIG4 is a schematic diagram of an antenna panel according to some embodiments.

[0017] FIG5 is a schematic flow chart of another positioning method according to some embodiments.

[0018] FIG6 is a schematic flow chart of yet another positioning method according to some embodiments.

[0019] FIG7 is a schematic flow chart of yet another positioning method according to some embodiments.

[0020] FIG8 is a schematic structural diagram of a positioning device according to some embodiments.

[0021] FIG9 is a schematic structural diagram of another positioning device according to some embodiments.

[0022] FIG10 is a schematic structural diagram of yet another positioning device according to some embodiments. DETAILED DESCRIPTION

[0023] The following will be combined with the accompanying drawings to clearly and completely describe the technical solutions in some embodiments of the present disclosure. Obviously, the embodiments described are only some of the embodiments of the present disclosure, rather than all of the embodiments. Based on the embodiments provided by the present disclosure, all other embodiments obtained by ordinary technicians in this field are within the scope of protection of the present disclosure.

[0024] Unless the context requires otherwise, throughout the specification and claims, the term "comprise" and its other forms, such as the third person singular form "comprises" and the present participle form "comprising", are to be interpreted as open and inclusive, that is, "including, but not limited to". In the description of the specification, the terms "one embodiment", "some embodiments", "exemplary embodiments", "example", "specific example" or "some examples" are intended to indicate that the particular features, structures, materials or characteristics associated with the embodiment or example are included in at least one embodiment or example of the present disclosure. The schematic representation of the above terms does not necessarily refer to the same embodiment or example. In addition, the particular features, structures, materials or characteristics may be included in any one or more embodiments or examples in any appropriate manner.

[0025] In the following, the terms "first," "second," etc., are used for descriptive purposes only and should not be understood to indicate or imply relative importance or implicitly specify the number of the technical features indicated. Thus, a feature defined as "first," "second," etc. may explicitly or implicitly include one or more of the features. In the description of the embodiments of the present disclosure, unless otherwise specified, "plurality" means two or more.

[0026] “At least one of A, B and C” has the same meaning as “at least one of A, B or C” and both include the following combinations of A, B and C: A only, B only, C only, the combination of A and B, the combination of A and C, the combination of B and C, and the combination of A, B and C.

[0027] “A and / or B” includes the following three combinations: A only, B only, and a combination of A and B.

[0028] The use of "adapted to" or "configured to" herein is intended to be open and inclusive language that does not exclude devices adapted or configured to perform additional tasks or steps.

[0029] Additionally, the use of “based on” is meant to be open and inclusive, as a process, step, calculation, or other action “based on” one or more stated conditions or values ​​may, in practice, be based on additional conditions or values ​​beyond those stated.

[0030] Reconfigurable intelligent surfaces (RIS) and smart repeaters are important technologies in the current communications field. RIS uses artificial electromagnetic materials with programmable electromagnetic properties to control the electromagnetic environment. For example, RIS adjusts the phase of each element to focus the outgoing beam to a desired direction or point, thereby controlling the electromagnetic environment.

[0031] Currently, programmable intelligent metasurface technology is still in the research phase. In practical applications, positioning technology for RIS devices remains a key component, as the RIS codebook must be designed based on the location information of the RIS device. Some RIS positioning technologies require multiple base stations to achieve accurate positioning.

[0032] To address the current difficulty in accurately locating RIS devices, the present disclosure provides a positioning method and apparatus. In the positioning method provided herein, a first node sends first configuration information to a second node, instructing the second node to activate multiple corresponding measurement units and perform reference signal received power (RSRP) measurements on multiple beams to be measured, thereby obtaining measurement results from the multiple measurement units. Subsequently, the first node can determine the location information of the second node based on the measurement results of the multiple measurement units for the multiple beams to be measured reported by the second node, thereby accurately locating the second node.

[0033] The resource allocation method and apparatus provided by the present disclosure are described in detail below in conjunction with the accompanying drawings. It should be noted that the various embodiments of the present disclosure may refer to or be mutually beneficial. For example, identical or similar steps, method embodiments, system embodiments, and apparatus embodiments may all refer to each other without limitation.

[0034] The technical solutions provided by the embodiments of the present disclosure can be applied to various communication systems, for example, a 5G New Radio (NR) communication system, a 6G communication system, a future evolution system, or a multi-communication convergence system.

[0035] For example, as shown in FIG1 , which is a schematic diagram of an architecture of a communication system provided by some embodiments of the present disclosure, the communication system may include: at least one base station 101 and at least one RIS device 102 .

[0036] Base station 101 is configured to obtain measurement results from multiple measurement units of a RIS device. The measurement results of the measurement units include measurement values ​​of the measurement units for multiple beams to be measured. Base station 101 is also configured to determine location information of the RIS device based on the measurement results of the multiple measurement units.

[0037] The RIS device 102 is configured to obtain measurement results of multiple measurement units. The measurement results of the measurement units include measurement values ​​of the measurement units for multiple beams to be measured. The RIS device 102 is also configured to send the measurement results of the multiple measurement units to the first node.

[0038] In some embodiments, the base station 101 may be a device with wireless transceiver functionality or a chip or chip system that may be provided in the device. The base station 101 includes, but is not limited to, a small base station, a wireless access point, a transmission receiving point (TRP), a transmission point (TP), a macro base station, a relay base station, and any other access node.

[0039] In yet other embodiments, the RIS device 102 may be a device utilizing RIS technology or a device utilizing Smart Repeater technology. The RIS device 102 may be deployed on land (including indoors or outdoors, handheld or vehicle-mounted). The RIS device 102 may also be deployed on water (e.g., on a ship). The RIS device 102 may also be deployed in the air (e.g., on an airplane, balloon, or satellite).

[0040] It should be noted that Figure 1 is only an exemplary framework diagram. The number of nodes and the names of each device included in Figure 1 are not restricted. In addition to the functional nodes shown in Figure 1, the communication system 30 can also include other nodes (such as core network devices). This disclosure does not impose any restrictions on this.

[0041] In some embodiments, the architecture of the RIS device 102 is shown in FIG2 . In FIG2 , the RIS device 102 includes a RIS controller 201 and a RIS panel 202 .

[0042] The RIS controller 201 is configured to receive antenna configuration information from a base station, activate multiple measurement units based on the received antenna configuration information to perform RSRP measurements, and report the measurement results to the base station. The RIS panel 202 is provided with an antenna to receive the reference signal beam transmitted by the base station.

[0043] It should be noted that, in the embodiment of the present disclosure, the second node may be implemented as the RIS controller 201, or may be implemented as a device having the function of a RIS controller, or may be implemented as a module having the function of a controller built into the second node.

[0044] The application scenarios of the embodiments of the present disclosure are not limited. The system architecture and business scenarios described in the embodiments of the present disclosure are intended to more clearly illustrate the technical solutions of the embodiments of the present disclosure and do not constitute a limitation on the technical solutions provided by the embodiments of the present disclosure. It is known to those skilled in the art that with the evolution of network architecture and the emergence of new business scenarios, the technical solutions provided by the embodiments of the present disclosure are also applicable to similar technical problems.

[0045] Exemplarily, as shown in FIG3 , FIG3 is a flow chart of a positioning method provided according to some embodiments, which includes the following steps.

[0046] S301: A second node determines measurement results of multiple measurement units.

[0047] The measurement result of the measurement unit includes the measurement values ​​of the measurement unit on multiple beams to be measured. The measurement unit includes one or more antennas.

[0048] In some embodiments, the second node is a reconfigurable intelligent metasurface, a network-controllable relay device, or an intelligent relay device. For example, the second node can be the RIS device described above. The measurement unit includes one or more antennas located on the RIS panel of the second node.

[0049] It should be noted that the second node may configure multiple measurement units by receiving the configuration information sent by the first node. The detailed process can be found in S501 below, which will not be described in detail in this embodiment.

[0050] In some embodiments, the first node may be the base station described above. The plurality of measurement units are determined by the first node.

[0051] For example, the first node first obtains angle information and configuration information of the second node's antenna panel. Then, the first node determines the location information of multiple measurement units based on the angle information and configuration information of the antenna panel. The location information of the multiple measurement units may be reflected in the configuration information sent by the first node to the second node. For details, see S501 below and are not further described here.

[0052] Furthermore, when the second node is a RIS device, since the antennas on the panel of the RIS device are large-scale antenna arrays, when determining the multiple measurement units, multiple antennas or multiple groups of antennas that meet the requirements can be selected at preset intervals in orthogonal directions of the horizontal and vertical panel orientations as the multiple measurement units of the second node.

[0053] In some other embodiments, the plurality of beams to be measured include: an optimal beam, a first horizontal beam, a second horizontal beam, a first vertical beam, and a second vertical beam.

[0054] The optimal beam is the beam corresponding to the largest measurement value among the multiple beam measurements of the first node by the antenna panel of the second node. The first horizontal beam is a beam that is positively offset from the optimal beam in the horizontal direction by a first preset angle. The second horizontal beam is a beam that is negatively offset from the optimal beam in the horizontal direction by the first preset angle. The first vertical beam is a beam that is positively offset from the optimal beam in the vertical direction by a second preset angle. The second vertical beam is a beam that is negatively offset from the optimal beam in the vertical direction by a second preset angle.

[0055] It is understandable that the second node can configure the transmission resources of multiple beams to be measured and configure multiple measurement units to measure the beams to be measured by receiving the configuration information sent by the first node. The detailed process can be seen in S601 below, and this embodiment will not be repeated here.

[0056] S302: The second node sends measurement results of multiple measurement units to the first node. Correspondingly, the first node receives the measurement results of the multiple measurement units.

[0057] In some embodiments, the second node performs RSRP measurement on the multiple beams to be measured based on the multiple measurement units, and determines the RSRP measurement results of the multiple beams to be measured as the measurement results of the multiple measurement units, and sends them to the first node.

[0058] It should be noted that when the second node performs RSRP measurement, each measurement unit independently performs RSRP measurement on multiple beams to be measured. For example, if the number of beams to be measured is a and the number of measurement units is b, the final measurement result of the multiple measurement units is a*b RSRP values.

[0059] In some embodiments, the second node integrates the measurement results of the multiple measurement units into a data packet and reports it via a physical uplink shared channel (PUSCH). The PUSCH is indicated by a downlink control information (DCI) message sent by the first node.

[0060] S303: The first node determines location information of the second node based on measurement results of multiple measurement units.

[0061] In some embodiments, the location information of the second node includes at least one of the following: the horizontal angle of the second node relative to the first node, the vertical angle of the second node relative to the first node, the horizontal distance of the second node relative to the first node, and the vertical distance of the second node relative to the first node.

[0062] For example, in combination with the example in S301 above, when multiple beams to be measured include: an optimal beam, a first horizontal beam, a second horizontal beam, a first vertical beam, and a second vertical beam, the calculation method of the four items of data included in the position information of the second node is explained.

[0063] (1) Calculation of the horizontal angle of the second node relative to the first node.

[0064] a) The first node determines the offset direction of the horizontal angle according to the magnitude relationship between the measurement value of the first horizontal beam and the measurement value of the second horizontal beam.

[0065] The offset direction includes positive offset and negative offset. The judgment of positive offset and negative offset is as follows:

[0066] In response to the measurement value of the first horizontal beam being greater than or equal to the measurement value of the second horizontal beam, determining that the offset direction of the horizontal angle is a positive offset; or,

[0067] In response to the measurement value of the first horizontal beam being less than the measurement value of the second horizontal beam, the offset angle in the horizontal direction is determined to be a negative offset.

[0068] b) The first node determines a first measurement value according to the offset direction of the horizontal angle.

[0069] The first measurement value is the maximum value of the measurement value of the first horizontal beam and the measurement value of the second horizontal beam.

[0070] That is, when the offset direction of the horizontal angle is positive, the measurement value of the first horizontal beam is determined as the first measurement value; when the offset direction of the horizontal angle is negative, the measurement value of the second horizontal beam is determined as the first measurement value.

[0071] c) The first node determines the horizontal angle value according to the difference between the first measurement value and the measurement value of the optimal beam.

[0072] The process of determining the horizontal angle value is as follows:

[0073] In response to the measured value of the first horizontal beam being greater than or equal to the measured value of the second horizontal beam, based on the difference between the measured value of the first horizontal beam and the measured value of the optimal beam and the first preset correspondence, determine the angular value of the horizontal angle. The first preset correspondence includes multiple angular values and the differences between the theoretical measured values of the first horizontal beam corresponding to the multiple angular values and the theoretical measured value of the optimal beam; or,

[0074] In response to the measured value of the first horizontal beam being less than the measured value of the second horizontal beam, based on the difference between the measured value of the second horizontal beam and the measured value of the optimal beam and the second preset correspondence, determine the angular value of the horizontal angle. The second preset correspondence includes multiple angular values and the differences between the theoretical measured values of the second horizontal beam corresponding to the multiple angular values and the theoretical measured value of the optimal beam.

[0075] Exemplarily, for the sake of understanding, the calculation of the horizontal angle is described with numerical values: use beam#0, beam#1, and beam#2 to represent the optimal beam, the first horizontal beam, and the second horizontal beam respectively, and the central angle of beam#0 is θ. The first node obtains the energy magnitudes of beam#0, beam#1, and beam#2 at each angle within the range of [θ±α0°] theoretically, which are respectively denoted as RSRP#0_theroy[t], RSRP#1_theroy[t], and RSRP#2_theroy[t], where t represents the angle.

[0076] After that, within the angular range of [θ-α°0, θ+α°0], the first node calculates the RSRP difference at every 0.1 degree. Within the range of [θ, θ+α°0], only the difference between RSRP#0_t and RSRP#1_t is calculated. Within the range of [θ-α°0, θ], only the difference between RSRP#0_t and RSRP#2_t is calculated, obtaining an RSRP difference table for each angle. It should be understood that after the first node receives the measurement results of multiple measurement units sent by the second node, it can either select only the RSRP#1 and RSRP#2 measurement results of one antenna in the measurement unit for calculation, or calculate multiple angular offset results respectively using the RSRP of multiple antennas in the measurement unit, and finally take the average.

[0077] Furthermore, the first node determines the horizontal angle of the second node relative to the first node according to the measurement results of multiple measurement units sent by the second node: if the measured RSRP#1 > RSRP#2, it is determined that the offset direction is a positive offset, and the angular range is [θ, θ+α°0], and calculate the difference between RSRP#0 and RSRP#1; if the measured RSRP#1 < RSRP#2, it is determined that the offset direction is a negative offset, and the angular range is [θ-α°0, θ], and calculate the difference between RSRP#0 and RSRP#2.

[0078] Finally, the first node queries the RSRP difference table to obtain the horizontal angle of the second node relative to the first node.

[0079] (2) Calculation of the vertical angle of the second node relative to the first node.

[0080] d) The first node determines the offset direction of the vertical angle according to the magnitude relationship between the measurement value of the first vertical beam and the measurement value of the second vertical beam.

[0081] The offset direction includes positive offset and negative offset. The judgment of positive offset and negative offset is as follows:

[0082] In response to the measurement value of the first vertical beam being greater than or equal to the measurement value of the second vertical beam, the vertical angle offset direction is determined to be a positive offset; or, in response to the measurement value of the first vertical beam being less than the measurement value of the second vertical beam, the vertical angle offset direction is determined to be a negative offset.

[0083] e) The first node determines a second measurement value according to the offset direction of the vertical angle.

[0084] The second measurement value is the maximum value of the measurement value of the first vertical beam and the measurement value of the second vertical beam.

[0085] That is, when the vertical angle offset direction is positive, the measurement value of the first vertical beam is determined as the second measurement value; when the vertical angle offset direction is negative, the measurement value of the second vertical beam is determined as the second measurement value.

[0086] f) The first node determines the vertical angle value according to the difference between the second measurement value and the measurement value of the optimal beam.

[0087] The process of determining the angle value of the vertical angle is as follows:

[0088] In response to the measurement value of the first vertical beam being greater than or equal to the measurement value of the second vertical beam, determining an angle value of the vertical angle based on a difference between the measurement value of the first vertical beam and the measurement value of the optimal beam and a third preset correspondence. The third preset correspondence includes a plurality of angle values, each corresponding to a difference between a theoretical measurement value of the first vertical beam and a theoretical measurement value of the optimal beam; or

[0089] In response to the measurement value of the first vertical beam being less than the measurement value of the second vertical beam, an angle value of the vertical angle is determined based on a difference between the measurement value of the second vertical beam and the measurement value of the optimal beam and a fourth preset correspondence. The fourth preset correspondence includes a plurality of angle values, each corresponding to a difference between a theoretical measurement value of the second vertical beam and a theoretical measurement value of the optimal beam.

[0090] It should be understood that the calculation principle of the vertical angle of the second node relative to the first node is the same as the horizontal angle calculation, and the calculation of the vertical angle will not be described here with examples combined with data.

[0091] (3) Calculation of the horizontal distance of the second node relative to the first node.

[0092] g) The first node determines a horizontal angle formed between the first node and the first test unit and the second test unit according to the test result of the first test unit and the test result of the second test unit.

[0093] The first test unit and the second test unit are parallel in a horizontal direction.

[0094] The measurement results of the first and second test units on beam#0 are recorded as RSRP#0_antenna_0 and RSRP#0_antenna_1, respectively. Based on the theoretical energy of beam#0 at each angle within its coverage area, the angular difference between RSRP#0_antenna_0 and RSRP#0_antenna_1 is calculated and recorded as γ0.

[0095] It should be understood that if there are multiple beams to be measured that differ only in horizontal angle, the horizontal angles of these beams can also be calculated. For example, the horizontal angles of beam #1 and beam #2 can be recorded as γ1 and γ2, and the average of γ0, γ1, and γ2 is calculated as the final angle γ. If there are no multiple beams to be measured that differ only in horizontal angle, only γ0 is used as the final angle γ.

[0096] h) The first node determines the horizontal distance according to the horizontal angle and the horizontal spacing between the first test unit and the second test unit.

[0097] It should be understood that the horizontal spacing between the first test unit and the second test unit is the distance d between the two test units on the antenna panel of the second node.

[0098] For example, Figure 4 is a schematic diagram of an antenna panel of a second node provided in some embodiments of the present disclosure. Figure 4 shows the geometric relationship between γ and d, from which the horizontal distance of the second node relative to the first node can be calculated based on trigonometric functions.

[0099] (4) Calculation of the vertical distance of the second node relative to the first node.

[0100] i) The first node determines a vertical angle formed between the third node and the third test unit and the fourth test unit according to the test results of the third test unit and the test results of the fourth test unit.

[0101] The third test unit and the fourth test unit are parallel in a vertical direction.

[0102] j) The first node determines the vertical distance based on the vertical angle and the vertical spacing between the third test unit and the fourth test unit.

[0103] It should be understood that the calculation principle of the vertical distance of the second node relative to the first node is the same as the horizontal distance calculation, and the calculation of the vertical angle will not be described in detail here with examples.

[0104] In combination with the example in S301 above, the calculation process of the position information of the second node is introduced when the multiple beams to be measured include the optimal beam, the first horizontal beam, the second horizontal beam, the first vertical beam and the second vertical beam.

[0105] Based on the above technical solution, when locating a RIS device, the base station can determine the location information of the RIS device based on the measurement results of multiple measurement units for multiple measured beams reported by the RIS device, thereby achieving accurate positioning of the RIS device.

[0106] For example, in combination with Figure 3, as shown in Figure 5, Figure 5 is a flowchart of another positioning method provided by some embodiments of the present disclosure. The positioning method provided by the present disclosure further includes the following steps.

[0107] S501: A first node sends first configuration information to a second node. Correspondingly, the second node receives the first configuration information.

[0108] The first configuration information is used to configure multiple measurement units.

[0109] In some embodiments, the first configuration information includes a plurality of measurement unit configuration information, where the measurement unit configuration information is used to configure the position of an antenna included in a measurement unit on the antenna panel of the second node.

[0110] Exemplarily, the measurement unit configuration information includes an identifier of the measurement unit, a first bitmap, and a second bitmap; the first bitmap is used to indicate the row identifier of the antenna included in the measurement unit on the antenna panel; the second bitmap is used to indicate the column identifier of the antenna included in the measurement unit on the antenna panel. Exemplarily, the measurement unit configuration information may include an AntennaPattern field, which includes the identifier of the measurement unit, the first bitmap, and the second bitmap. For details, see the example description of the first configuration information below.

[0111] In some embodiments, the first configuration information further includes at least one of the following: an identifier of an activated measurement unit, an identifier of a deactivated measurement unit, and a maximum number of measurement units. An activated measurement unit is an antenna or antenna group that participates in RSRP measurement of the multiple beams to be measured, and a deactivated measurement unit is an antenna or antenna group that does not participate in RSRP measurement of the multiple beams to be measured.

[0112] In one implementation, the first configuration information may be carried in RRC signaling between the first node and the second node, and the details are as follows:

[0113] measActiveAntennaToAddModList: indicates the set of active antenna patterns configured by the base station in the RIS panel. The elements in the queue are AntennaPattern, that is, measurement units. The number of elements in the queue indicates the number of antenna patterns activated in the panel.

[0114] And, measActiveAntennaToReleaseList: represents the set of deactivated antenna patternIds configured by the base station in the RIS panel. The elements in the queue are Antenna PatternIds, and the queue can deactivate the Antenna Pattern by indicating the index value;

[0115] And, AntennaPattern is composed of the following three items: its corresponding index Id: AntennaPatternId (that is, the identifier of the measurement unit), column bitmap indication: colunmsBitmap (that is, the first bitmap) and row bitmap indication: rowBitmap (that is, the second bitmap). By configuring the column bitmap and row bitmap, one or more antennas in a panel composed of m*n antennas can be indicated. If one antenna is activated, it means that only this antenna will be used in subsequent measurements. If a group of antennas is activated, it means that this group of antennas will be used in subsequent measurements. It should be pointed out that in measActiveAntennaToAddModList, multiple patterns need to limit the number of indicated antennas to be the same, but the detailed positions can be different;

[0116] And, maxNrofmeasActiveAntenna: indicates the maximum number of antenna patterns that can be configured in measActiveAntennaToAddModList, which is 1 at most. The detailed value can be configured according to actual conditions.

[0117] It should be understood that m represents the number of columns in the antennas of the RIS panel, and n represents the number of rows in the antennas of the RIS panel.

[0118] Based on the above technical solution, in the embodiment of the present disclosure, after receiving the first configuration information sent by the first node, the second node can activate the corresponding multiple measurement units to facilitate subsequent RSRP measurement of multiple beams to be measured to obtain measurement results of multiple measurement units.

[0119] For example, in combination with Figure 3, as shown in Figure 6, Figure 6 is a flowchart of another positioning method provided by some embodiments of the present disclosure. The positioning method provided by the present disclosure further includes the following steps.

[0120] S601: A first node sends second configuration information to a second node. Correspondingly, the second node receives the second configuration information.

[0121] The second configuration information is used to configure transmission resources of multiple beams to be measured.

[0122] In some embodiments, the multiple beams to be measured corresponding to the second configuration information may be a group of scanning beams. After receiving the second configuration information, the second node reports a scanning result for the scanning beams. Based on the scanning result reported by the second node, the first node determines the beam corresponding to the largest RSRP measurement value among the multiple beams included in the scanning result as the optimal beam.

[0123] It should be noted that, in this step, the second node adopts a normal antenna configuration to receive the scanning beam according to the second configuration information.

[0124] In other embodiments, the first node determines the optimal beam by sending second configuration information to the second node, and then determines the number of beams to be measured and the offset angle of each beam to be measured relative to the optimal beam based on the center angle and beam width of the optimal beam.

[0125] Exemplarily, the first node configures a preset number n of Channel State Information-Reference Signal (CSI-RS) symbols, where each of the n symbols uses a different beam to be measured. For example, when n is 5, the offset angle of the beam used by each symbol is as follows:

[0126] The CSI-RS beam of the first symbol is the optimal beam, denoted as beam#0;

[0127] The CSI-RS beam of the second symbol is offset horizontally from the optimal beam. The beam is denoted as beam#1;

[0128] The CSI-RS beam of the third symbol is offset horizontally from the optimal beam. The beam is denoted as beam#2;

[0129] The CSI-RS beam of the fourth symbol is offset vertically from the optimal beam. The beam is denoted as beam#3;

[0130] The CSI-RS beam of the 5th symbol is offset vertically from the optimal beam. The beam is recorded as beam#4.

[0131] The size is determined by half of the horizontal coverage angle of beam#0. The size of is determined by half of the vertical coverage angle of beam#0.

[0132] It should be understood that when the value of n is less than 5, beams offset by preset angles in the horizontal and vertical directions can be flexibly combined. For example, when the value of n is 3, the optimal beam, a beam offset in the horizontal direction, and a beam offset in the vertical direction can be selected. In this case, to ensure the accuracy of the final positioning, the position information of the second node can be calculated multiple times. For another example, when the value of n is greater than 5, more beams with different offset angles in the horizontal or vertical directions can be selected.

[0133] Based on the above technical solution, in the embodiment of the present disclosure, the first node determines multiple beams to be measured by sending second configuration information to the second node, and sends down n consecutive symbols within a unit time slot, so that the second node can subsequently perform RSRP measurement on the multiple beams to be measured.

[0134] For example, in combination with Figure 3, as shown in Figure 7, Figure 7 is a flowchart of another positioning method provided by some embodiments of the present disclosure. The positioning method provided by the present disclosure also includes the following steps.

[0135] S701: A first node sends third configuration information to a second node. Correspondingly, the second node receives the third configuration information.

[0136] The third configuration information is used to configure the second node to perform beam measurement using multiple measurement units. Exemplarily, the third configuration information may be implemented as a DCI message, or by adding a new field in the DCI message.

[0137] Exemplarily, a new field, Active antenna pattern indicator – 1 bit, is added to the DCI message. When the field is set to 0, it indicates that the measurement unit indicated by the first configuration information is not used for RSRP measurement. When the field is set to 1, it indicates that the measurement unit indicated by the first configuration information is used for RSRP measurement, and the measurement results of the multiple measurement units are sent to the first node.

[0138] Based on the above technical solution, in the embodiment of the present disclosure, after the first node determines multiple beams to be measured by sending second configuration information to the second node, the first node will send third configuration information to the second node, instructing the second node to use multiple measurement units to perform RSRP measurement on the multiple beams to be measured according to the first configuration information, and report the measurement results of the multiple measurement units.

[0139] The embodiments of the present disclosure can divide the positioning device generated by the above-mentioned method example into functional modules or functional units. For example, each functional module or functional unit can be divided according to each function, or two or more functions can be integrated into one processing module. The above-mentioned integrated module can be implemented in the form of hardware or in the form of software functional modules or functional units. The division of modules or units in the embodiments of the present disclosure is schematic and is only a logical functional division. In actual implementation, other division methods may be used.

[0140] For example, FIG8 is a schematic diagram of a structure of a positioning device provided by some embodiments of the present disclosure. As shown in FIG8 , the positioning device 800 includes: a receiving unit 801 , a processing unit 802 , and a sending unit 803 .

[0141] The receiving unit 801 is configured to obtain measurement results of multiple measurement units of the second node, where the measurement results of the measurement units include measurement values ​​of the measurement units on multiple beams to be measured.

[0142] The processing unit 802 is configured to determine the location information of the second node based on the measurement results of the multiple measurement units.

[0143] In some embodiments, the sending unit 803 is configured to send first configuration information to the second node, where the first configuration information is used to configure multiple measurement units.

[0144] In some embodiments, the sending unit 803 is further used to send second configuration information to the second node, where the second configuration information is used to configure transmission resources of multiple beams to be measured.

[0145] In some embodiments, the sending unit 803 is further configured to send third configuration information to the second node, where the third configuration information is used to configure the second node to perform measurement of the beam to be measured using multiple measurement units.

[0146] In some embodiments, the receiving unit 801 is further configured to obtain angle information of the antenna panel of the second node and configuration information of the antenna panel.

[0147] In some embodiments, the processing unit 802 is further configured to determine a plurality of measurement units according to the angle information of the antenna panel and the configuration information of the antenna panel.

[0148] In some embodiments, the processing unit 802 is further configured to determine an offset direction of the horizontal angle according to a magnitude relationship between a measurement value of the first horizontal beam and a measurement value of the second horizontal beam.

[0149] In some embodiments, the processing unit 802 is further configured to determine the horizontal angle value based on a difference between the first measurement value and the measurement value of the optimal beam, wherein the first measurement value is the maximum value between the measurement value of the first horizontal beam and the measurement value of the second horizontal beam.

[0150] In some embodiments, the processing unit 802 is further configured to determine that the offset direction of the horizontal angle is a positive offset when the measurement value of the first horizontal beam is greater than or equal to the measurement value of the second horizontal beam.

[0151] In some embodiments, the processing unit 802 is further configured to determine that the horizontal offset angle is a negative offset when the measurement value of the first horizontal beam is less than the measurement value of the second horizontal beam.

[0152] In some embodiments, the processing unit 802 is further configured to, when the measured value of the first horizontal beam is greater than or equal to the measured value of the second horizontal beam, determine a horizontal angle value based on a difference between the measured value of the first horizontal beam and the measured value of the optimal beam and a first preset correspondence. The first preset correspondence includes a plurality of angle values, and each of the plurality of angle values ​​corresponds to a difference between a theoretical measured value of the first horizontal beam and a theoretical measured value of the optimal beam.

[0153] In some embodiments, the processing unit 802 is further configured to, when the measured value of the first horizontal beam is less than the measured value of the second horizontal beam, determine an angle value of the horizontal angle based on a difference between the measured value of the second horizontal beam and the measured value of the optimal beam and a second preset correspondence. The second preset correspondence includes a plurality of angle values, and a difference between a theoretical measured value of the second horizontal beam and a theoretical measured value of the optimal beam corresponding to each of the plurality of angle values.

[0154] In some embodiments, the processing unit 802 is further configured to determine an offset direction of the vertical angle according to a magnitude relationship between a measurement value of the first vertical beam and a measurement value of the second vertical beam.

[0155] In some embodiments, the processing unit 802 is further configured to determine the vertical angle value based on a difference between a second measurement value and a measurement value of the optimal beam, wherein the second measurement value is a maximum value between a measurement value of the first vertical beam and a measurement value of the second vertical beam.

[0156] In some embodiments, the processing unit 802 is further configured to determine that the offset direction of the vertical angle is a positive offset when the measurement value of the first vertical beam is greater than or equal to the measurement value of the second vertical beam.

[0157] In some embodiments, the processing unit 802 is further configured to determine that the vertical offset angle is a negative offset when the measurement value of the first vertical beam is less than the measurement value of the second vertical beam.

[0158] In some embodiments, the processing unit 802 is further configured to determine, when the measurement value of the first vertical beam is greater than or equal to the measurement value of the second vertical beam, an angle value of the vertical angle based on a difference between the measurement value of the first vertical beam and the measurement value of the optimal beam and a third preset correspondence. The third preset correspondence includes a plurality of angle values, and each of the plurality of angle values ​​corresponds to a difference between a theoretical measurement value of the first vertical beam and a theoretical measurement value of the optimal beam.

[0159] In some embodiments, the processing unit 802 is further configured to, when the measured value of the first vertical beam is less than the measured value of the second vertical beam, determine an angle value of the vertical angle based on a difference between the measured value of the second vertical beam and the measured value of the optimal beam and a fourth preset correspondence. The fourth preset correspondence includes a plurality of angle values, each corresponding to a difference between a theoretical measured value of the second vertical beam and a theoretical measured value of the optimal beam.

[0160] In some embodiments, the processing unit 802 is further configured to determine a horizontal angle formed between the first node and the first test unit and the second test unit according to the test result of the first test unit and the test result of the second test unit.

[0161] In some embodiments, the processing unit 802 is further configured to determine the horizontal distance according to the horizontal angle and the horizontal distance between the first test unit and the second test unit.

[0162] In some embodiments, the processing unit 802 is further configured to determine a vertical angle formed between the third node and the third test unit and the fourth test unit according to a test result of the third test unit and a test result of the fourth test unit.

[0163] In some embodiments, the processing unit 802 is further configured to determine the vertical distance according to the vertical angle and the vertical spacing between the third test unit and the fourth test unit.

[0164] In some embodiments, the positioning device 800 may further include a storage unit (shown as a dotted box in Figure 8), which stores a program or instruction. When the receiving unit 801, the processing unit 802 and the sending unit 803 execute the program or instruction, the positioning device can execute the positioning method described in the above method embodiment.

[0165] In addition, the technical effects of the positioning device described in FIG8 can refer to the technical effects of the positioning method described in the above embodiment, and will not be repeated here.

[0166] For example, FIG9 is a schematic diagram of the structure of another positioning device provided in some embodiments of the present disclosure. As shown in FIG9 , the positioning device 900 includes: a processing unit 901 , a sending unit 902 , and a receiving unit 903 .

[0167] The processing unit 901 is configured to determine measurement results of multiple measurement units, where the measurement results of the measurement units include measurement values ​​of the measurement units on multiple beams to be measured.

[0168] The sending unit 902 is configured to send measurement results of multiple measurement units to the first node.

[0169] In some embodiments, the receiving unit 903 is configured to receive first configuration information sent by a first node, where the first configuration information is used to configure multiple measurement units.

[0170] In some embodiments, the receiving unit 903 is further used to receive second configuration information sent by the first node, where the second configuration information is used to configure transmission resources of multiple beams to be measured.

[0171] In some embodiments, the receiving unit 903 is further configured to receive third configuration information sent by the first node, where the third configuration information is used to configure the second node to perform measurement of the beam to be measured using multiple measurement units.

[0172] In some embodiments, the positioning device 900 may further include a storage unit (shown as a dotted box in Figure 9), which stores a program or instruction. When the processing unit 901, the sending unit 902 and the receiving unit 903 execute the program or instruction, the positioning device can execute the positioning method described in the above method embodiment.

[0173] In addition, the technical effects of the positioning device described in FIG9 can refer to the technical effects of the positioning method described in the above embodiment, and will not be repeated here.

[0174] For example, Fig. 10 is another structural diagram of the positioning device involved in the above embodiment. As shown in Fig. 10 , the positioning device 1000 includes: a processor 1002 .

[0175] Processor 1002 is used to control and manage the actions of the positioning device, for example, to execute the steps performed by the above-mentioned receiving unit 801, processing unit 802, sending unit 803, processing unit 901, sending unit 902 and receiving unit 903, and / or to execute other processes of the technical solution described in this document.

[0176] The processor 1002 may implement or execute the various exemplary logic blocks, modules, and circuits described in conjunction with the present disclosure. The processor may be a central processing unit, a general-purpose processor, a digital signal processor, an application-specific integrated circuit, a field-programmable gate array, or other programmable logic device, a transistor logic device, a hardware component, or any combination thereof. The processor 1002 may implement or execute the various exemplary logic blocks, modules, and circuits described in conjunction with the present disclosure. The processor may also be a combination that implements computing functions, such as a combination of one or more microprocessors, a combination of a DSP and a microprocessor, and the like.

[0177] In some embodiments, the positioning device 1000 may further include a communication interface 1003, a memory 1001, and a bus 1004. The communication interface 1003 is used to support communication between the positioning device 1000 and other network entities. The memory 1001 is used to store program codes and data of the positioning device.

[0178] The memory 1001 may be a memory in the positioning device, which may include a volatile memory, such as a random access memory; the memory may also include a non-volatile memory, such as a read-only memory, a flash memory, a hard disk or a solid-state drive; the memory may also include a combination of the above types of memory.

[0179] Bus 1004 may be an Extended Industry Standard Architecture (EISA) bus, etc. Bus 1004 may be divided into an address bus, a data bus, a control bus, etc. For ease of illustration, FIG10 shows only one thick line, but this does not mean that there is only one bus or only one type of bus.

[0180] Through the description of the above embodiments, those skilled in the art will clearly understand that for the sake of convenience and brevity, only the division of the above functional modules is used as an example. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. The working process of the above-described system, device, and module can refer to the corresponding process in the aforementioned method embodiment and will not be repeated here.

[0181] An embodiment of the present disclosure provides a computer program product comprising instructions. When the computer program product is run on an electronic device of the present disclosure, the computer is enabled to execute the positioning method described in the above method embodiment.

[0182] The present disclosure also provides a computer-readable storage medium having instructions stored therein. When a computer executes the instructions, the electronic device of the present disclosure executes the steps performed by the positioning device in the method flow shown in the above method embodiment. The computer-readable storage medium includes a non-transitory computer-readable storage medium.

[0183] Computer-readable storage media may be, for example, but not limited to, electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices, or components, or any combination thereof. Detailed examples (a non-exhaustive list) of computer-readable storage media include: an electrical connection having one or more wires, a portable computer disk, a hard disk. Random Access Memory (RAM), Read-Only Memory (ROM), Erasable Programmable Read Only Memory (EPROM), a register, a hard disk, an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any other form of computer-readable storage medium known in the art in a suitable combination of the foregoing. An exemplary storage medium is coupled to a processor so that the processor can read information from the storage medium and write information to the storage medium. Of course, the storage medium may also be an integral part of the processor. The processor and the storage medium may be located in an application-specific integrated circuit (ASIC). In the embodiments of the present disclosure, a computer-readable storage medium may be any tangible medium that contains or stores a program that can be used by or in connection with an instruction execution system, apparatus, or device.

[0184] The above is only a specific embodiment of the present disclosure, but the scope of protection of the present disclosure is not limited thereto. Any changes or replacements within the technical scope disclosed in the present disclosure should be included in the scope of protection of the present disclosure. Therefore, the scope of protection of the present disclosure should be based on the scope of protection of the claims.

Claims

1. A positioning method, wherein: The method is applied to a first node and comprises: Receiving measurement results of multiple measurement units of the second node, where the measurement results of the multiple measurement units include measurement values ​​of each measurement unit in the multiple measurement units for multiple beams to be measured; Based on the measurement results of the multiple measurement units, the location information of the second node is determined.

2. The method according to claim 1, wherein: Each of the plurality of measuring units includes one or more antennas.

3. The method according to claim 2, further comprising: Sending first configuration information to the second node, where the first configuration information is used to configure the multiple measurement units.

4. The method according to claim 3, wherein: The first configuration information includes a plurality of measurement unit configuration information, each of which is used to configure the position of an antenna included in a corresponding measurement unit on an antenna panel of the second node.

5. The method according to claim 4, wherein: The measurement unit configuration information includes an identifier of the measurement unit, a first bit map, and a second bit map; wherein the first bit map is used to indicate the row identifier of the antenna included in the measurement unit on the antenna panel; and the second bit map is used to indicate the column identifier of the antenna included in the measurement unit on the antenna panel.

6. The method according to claim 4, wherein: The first configuration information further includes at least one of the following: an identifier of an activated measurement unit, an identifier of a deactivated measurement unit, and a maximum number of measurement units.

7. The method according to claim 1, further comprising: Send second configuration information to the second node, where the second configuration information is used to configure transmission resources of the multiple beams to be measured.

8. The method according to claim 1, further comprising: Send third configuration information to the second node, where the third configuration information is used to configure the second node to perform measurement of the beam to be measured using the multiple measurement units.

9. The method according to claim 1, further comprising: Acquire angle information of the antenna panel of the second node and configuration information of the antenna panel; The position information of the plurality of measurement units is determined according to the angle information of the antenna panel and the configuration information of the antenna panel.

10. The method according to claim 1, wherein: The multiple beams to be measured include: an optimal beam, a first horizontal beam, a second horizontal beam, a first vertical beam and a second vertical beam; wherein the optimal beam is the beam corresponding to the largest measurement value among the measurement values ​​of the antenna panel of the second node on the multiple beams of the first node; the first horizontal beam is a beam that is positively offset by a first preset angle in the horizontal direction from the optimal beam; the second horizontal beam is a beam that is negatively offset by the first preset angle in the horizontal direction from the optimal beam; the first vertical beam is a beam that is positively offset by a second preset angle in the vertical direction from the optimal beam; and the second vertical beam is a beam that is negatively offset by the second preset angle in the vertical direction from the optimal beam.

11. The method according to claim 10, wherein: The location information of the second node includes at least one of the following: a horizontal angle of the second node relative to the first node, a vertical angle of the second node relative to the first node, a horizontal distance of the second node relative to the first node, and a vertical distance of the second node relative to the first node.

12. The method according to claim 11, wherein: The horizontal angle is determined by: Determining the offset direction of the horizontal angle according to a magnitude relationship between a measurement value of the first horizontal beam and a measurement value of the second horizontal beam; Determine a first measurement value according to the offset direction of the horizontal angle, where the first measurement value is a maximum value between a measurement value of the first horizontal beam and a measurement value of the second horizontal beam; The angle value of the horizontal angle is determined according to the difference between the first measurement value and the measurement value of the optimal beam.

13. The method according to claim 12, wherein: The determining the offset direction of the horizontal angle according to the magnitude relationship between the measurement value of the first horizontal beam and the measurement value of the second horizontal beam includes: In response to the measurement value of the first horizontal beam being greater than or equal to the measurement value of the second horizontal beam, determining that the offset direction of the horizontal angle is a positive offset; or, In response to the measurement value of the first horizontal beam being smaller than the measurement value of the second horizontal beam, the offset angle in the horizontal direction is determined to be a negative offset.

14. The method according to claim 12, wherein: The determining the angle value of the horizontal angle according to the difference between the first measurement value and the measurement value of the optimal beam comprises: In response to the measurement value of the first horizontal beam being greater than or equal to the measurement value of the second horizontal beam, the angle value of the horizontal angle is determined based on the difference between the measurement value of the first horizontal beam and the measurement value of the optimal beam and a first preset corresponding relationship; wherein the first preset corresponding relationship includes a plurality of angle values, and the difference between the theoretical measurement value of the first horizontal beam and the theoretical measurement value of the optimal beam corresponding to each of the plurality of angle values; or, In response to the measurement value of the first horizontal beam being less than the measurement value of the second horizontal beam, the angle value of the horizontal angle is determined based on the difference between the measurement value of the second horizontal beam and the measurement value of the optimal beam and a second preset correspondence; wherein the second preset correspondence includes multiple angle values, and the difference between the theoretical measurement value of the second horizontal beam and the theoretical measurement value of the optimal beam corresponding to each of the multiple angle values.

15. The method according to claim 11, wherein: The vertical angle is determined by: Determining the offset direction of the vertical angle according to a magnitude relationship between a measurement value of the first vertical beam and a measurement value of the second vertical beam; Determine a second measurement value according to the offset direction of the vertical angle, where the second measurement value is a maximum value between a measurement value of the first vertical beam and a measurement value of the second vertical beam; The angular value of the vertical angle is determined according to the difference between the second measurement value and the measurement value of the optimal beam.

16. The method according to claim 15, wherein: The determining the offset direction of the vertical angle according to the magnitude relationship between the measurement value of the first vertical beam and the measurement value of the second vertical beam includes: In response to the measurement value of the first vertical beam being greater than or equal to the measurement value of the second vertical beam, determining that the offset direction of the vertical angle is a positive offset; or, In response to the measurement value of the first vertical beam being less than the measurement value of the second vertical beam, the offset angle in the vertical direction is determined to be a negative offset.

17. The method according to claim 15, wherein: Determining the angle value of the vertical angle according to the difference between the second measurement value and the measurement value of the optimal beam includes: In response to the measurement value of the first vertical beam being greater than or equal to the measurement value of the second vertical beam, determining the angle value of the vertical angle based on the difference between the measurement value of the first vertical beam and the measurement value of the optimal beam and a third preset corresponding relationship; wherein the third preset corresponding relationship includes a plurality of angle values, and the difference between the theoretical measurement value of the first vertical beam and the theoretical measurement value of the optimal beam corresponding to each of the plurality of angle values; or, In response to the measurement value of the first vertical beam being less than the measurement value of the second vertical beam, the angle value of the vertical angle is determined based on the difference between the measurement value of the second vertical beam and the measurement value of the optimal beam and a fourth preset corresponding relationship; wherein the fourth preset corresponding relationship includes a plurality of angle values, and the theoretical measurement value of the second vertical beam corresponding to each of the plurality of angle values ​​is the same as the theoretical measurement value of the optimal beam. The difference between the theoretical measurements of the beam.

18. The method according to claim 11, wherein: The plurality of test units at least include a first test unit and a second test unit that are parallel in a horizontal direction; the horizontal distance is determined by: Determine, according to the test result of the first test unit and the test result of the second test unit, a horizontal angle formed between the first node and the first test unit and the second test unit; The horizontal distance is determined according to the horizontal angle and a horizontal spacing between the first test unit and the second test unit.

19. The method according to claim 11, wherein: The plurality of test units at least include a third test unit and a fourth test unit parallel in a vertical direction; the vertical distance is determined by: Determine, according to the test result of the third test unit and the test result of the fourth test unit, a vertical angle formed by the third node and the third test unit and the fourth test unit; The vertical distance is determined according to the vertical angle and a vertical interval between the third test unit and the fourth test unit.

20. The method according to claim 1, wherein: The second node is a reconfigurable intelligent metasurface, a network-controllable relay device or an intelligent relay device.

21. A positioning method, wherein: The method is applied to the second node and comprises: Determine measurement results of a plurality of measurement units, where the measurement results of the plurality of measurement units include measurement values ​​of each measurement unit in the plurality of measurement units for a plurality of beams to be measured; The measurement results of the multiple measurement units are sent to the first node.

22. The method according to claim 21, wherein: Each of the plurality of measuring units includes one or more antennas.

23. The method according to claim 22, further comprising: First configuration information sent by the first node is received, where the first configuration information is used to configure the multiple measurement units.

24. The method according to claim 23, wherein: The first configuration information includes a plurality of measurement unit configuration information, and the measurement unit configuration information is used to configure the position of an antenna included in a measurement unit on the antenna panel of the second node.

25. The method according to claim 24, wherein: The measurement unit configuration information includes an identifier of the measurement unit, a first bit map, and a second bit map; wherein the first bit map is used to indicate the row identifier of the antenna included in the measurement unit on the antenna panel; and the second bit map is used to indicate the column identifier of the antenna included in the measurement unit on the antenna panel.

26. The method according to claim 24, wherein: The first configuration information further includes at least one of the following: an identifier of an activated measurement unit, an identifier of a deactivated measurement unit, and a maximum number of measurement units.

27. The method of claim 21, further comprising: Receive second configuration information sent by the first node, where the second configuration information is used to configure transmission resources of the multiple beams to be tested.

28. The method of claim 21, further comprising: Receive third configuration information sent by the first node, where the third configuration information is used to configure the second node to perform measurement of the beam to be measured using the multiple measurement units.

29. A communication device, comprising: Memory and processor; The memory is coupled to the processor; The memory is used to store instructions executable by the processor; When the processor executes the instructions, the method according to any one of claims 1 to 20 or the method according to any one of claims 21 to 28 is performed.

30. A computer-readable storage medium, wherein: The computer-readable storage medium stores computer instructions, and when the computer instructions are executed on a computer, the computer is caused to perform the method according to any one of claims 1 to 20, or the method according to any one of claims 21 to 28.

Images