Test method and test device

Abstract

The present application provides a test method and a test device. The method can be applied to the technical field of detection. The method comprises: acquiring a pulse sequence in a real failure scene of a control link of a laser emitting unit, the pulse sequence comprising an abnormal pulse; controlling the laser emitting unit to emit a pulse sequence capable of simulating the real failure scene, and determining an accessible emission limit and the energy of the abnormal pulse; and on the basis of the determined accessible emission limit and the determined energy of the abnormal pulse, determining whether the pulse sequence in the real failure scene can meet a human eye safety requirement. Embodiments of the present application can be used for performance evaluation of laser products, such as laser radars, of new energy vehicles or intelligent driving vehicles, and can estimate whether laser products, such as laser radars, meet a human eye safety requirement in a failure scene.

Description

Test method and test device

[0001] This application claims priority to the Chinese patent application filed with the State Intellectual Property Office of China on July 25, 2023, with application number 202310924171.2 and invention name “Testing Method and Testing Device”, the entire contents of which are incorporated by reference into this application. Technical Field

[0002] The present application relates to the field of detection technology, and more specifically, to a testing method and a testing device. Background Art

[0003] Laser technology is widely used in industrial production and daily life, such as ophthalmic laser curvature meters and laser scanners. Due to the narrow wavelength and concentrated energy characteristics of lasers, they may cause health problems to people, such as damage to people's eyes and skin. Lidar, as one of the key sensors in intelligent driving systems, usually operates in a band that is not perceptible to the human eye, making it easier for users to ignore the radiation intensity of the laser it emits and the possible risks to the human eye. In intelligent driving systems, the control link where the lidar is located may have multiple failure modes. When the control link fails, the continuous emission time of the laser will become uncontrollable, and it is more likely to cause health problems such as eye damage to people. How to determine whether laser products such as lidar may cause damage to people in failure scenarios has become an urgent problem to be solved.

[0004] Summary of the Invention

[0005] This application provides a testing method and testing device that can evaluate whether laser products such as lidar meet human eye safety requirements in failure scenarios.

[0006] In a first aspect, a testing method is provided. The method can be performed by a test device for a laser emitting unit, or by a chip or processor in the test device. In some possible implementations, the method can be performed by a test system consisting of a laser emitting unit and a test device. In some possible implementations, since laser products such as lidar include a laser emitting unit, the method can also be performed by a test device for the laser product, or by a chip or processor in the test device.

[0007] The method includes: controlling a first laser emitting unit to emit a first pulse sequence, the first pulse sequence including multiple first pulses, the first pulse including an abnormal pulse at the end of a second pulse sequence emitted by a second laser emitting unit, the first laser emitting unit and the second laser emitting unit being laser emitting units of the same type; determining a first accessible emission limit (AEL) and a first pulse energy based on the first pulse sequence; and determining whether the second pulse sequence meets eye safety requirements based on the first pulse energy and the first AEL.

[0008] In actual testing, in order to evaluate the performance of a certain type of laser product under a real failure scenario, it may be necessary to damage the laser product. For example, the laser product includes a laser emitting unit, and the control link of the laser emitting unit may include a drive unit and a drive switch, as well as other related processing circuits, control circuits and / or devices. When all or part of the control chain of the laser emitting unit is integrated into the laser product, and this part of the control link includes a failure element corresponding to the scenario to be tested, it may be necessary to destroy the laser product in order to test its performance under a real failure. For example, assuming that the drive switch is integrated into a laser radar, and the failure scenario to be tested is a short circuit of the drive switch, in order to obtain the pulse sequence emitted by the laser radar under this failure scenario, it is necessary to destroy the drive switch in the laser radar.

[0009] For example, the second laser emitting unit can be understood as a laser emitting unit that has a true failure in its control link. The second pulse sequence can be understood as a pulse sequence emitted by the second laser emitting unit that has a failure in the control link. The first pulse is an abnormal pulse in the second pulse sequence. The first pulse sequence can be obtained by periodically repeating the first pulse. The first pulse energy can be the energy of the abnormal pulse.

[0010] In one embodiment, the second laser emitting unit and the first laser emitting unit used to emit the first pulse train can be different laser emitting units of the same type. For example, if part or all of the control link of the laser emitting unit is integrated into the laser product, and if the laser product needs to be destroyed to test its performance under actual failure conditions, the first pulse train can be emitted using a sample of the same model, since the sample laser product used to emit the second pulse train has already been damaged.

[0011] In another embodiment, the second laser emitting unit and the first emitting unit may be the same laser emitting unit. For example, the control link of the laser emitting unit is disposed outside the laser product. In another example, a portion of the control link of the laser emitting unit is disposed outside the laser product, and this portion of the control link includes a failure element corresponding to the scenario to be tested.

[0012] For example, when the energy of the abnormal pulse is greater than the first AEL, it can be considered that the laser product does not meet the human eye safety requirements and may cause damage to the human eye. When the energy of the abnormal pulse is less than or equal to the first AEL, it can be considered that the laser product meets the human eye safety requirements.

[0013] Because the emission duration of laser pulses is typically in the nanosecond range, it is difficult to accurately measure the energy of abnormal pulses included in a pulse sequence, as well as emission parameters such as the center wavelength of the laser corresponding to the abnormal pulses, in real failure scenarios. In this application, when testing a certain type of laser product, a first pulse sequence is used to simulate abnormal pulses in a pulse sequence in a real failure scenario. Based on the energy of the abnormal pulses and the corresponding achievable emission limits, it is possible to assess whether the laser product meets eye safety requirements in the failure scenario.

[0014] In combination with the first aspect, in certain implementations of the first aspect, the second pulse sequence also includes a normal pulse, and the position of the normal pulse in the second pulse sequence is before the abnormal pulse. Determining whether the first pulse sequence meets the human eye safety requirement based on the first pulse energy and the first AEL may include: determining the second pulse energy based on the first pulse energy, the energy of the normal pulse and the number of normal pulses in the second pulse sequence; determining that the second pulse sequence meets the human eye safety requirement when the second pulse energy is less than or equal to the first AEL; or determining that the second pulse sequence does not meet the human eye safety requirement when the second pulse energy is greater than the first AEL.

[0015] For example, in a real failure scenario, the timing of the failure may be random, resulting in a random number of pulses in the second pulse sequence. In a real failure scenario, the abnormal pulse is located at the end of the second pulse sequence. One or more normal pulses may precede the abnormal pulse. The second pulse energy may be the average energy of a single pulse in the second pulse sequence. Alternatively, it can be the average energy of a single pulse in the second pulse sequence.

[0016] Because failures in real-world failure scenarios are random, this application combines the number of normal pulses in the second pulse sequence in these scenarios to determine the average single-pulse energy in these failure scenarios. This average single-pulse energy in these failure scenarios can be used to assess whether laser products meet eye safety requirements, improving the accuracy of test results.

[0017] In combination with the first aspect, in certain implementations of the first aspect, the abnormal pulse may be a pulse emitted by the second laser emitting unit when the driving switch is short-circuited.

[0018] For example, the control link of a laser emitting unit may include a driver unit and a driver switch. The driver unit may experience failures such as short circuits or abnormal output. The laser emitting unit may also experience failures such as wavelength drift and power drop. In the event of a failure in the control link, the pulse sequence emitted by the laser emitting unit will contain abnormal pulses.

[0019] Compared to other failure modes, a short circuit in the drive switch is more likely to cause the laser emitting unit to continuously emit laser light. This failure scenario is more likely to cause damage to the human eye than other failure scenarios. In this application, by evaluating the performance of the laser product when the drive switch is short-circuited, it is possible to reduce the number of test items for the laser product while ensuring the accuracy of the evaluation results, shorten the test process, and improve test efficiency.

[0020] In combination with the first aspect, in certain implementations of the first aspect, a failure protection circuit for driving a switch may be provided in the control link of the second laser emitting unit, and the failure protection circuit is used to control the second laser emitting unit to shut down within a first time from the starting moment of the abnormal pulse, and the first time includes the response time of the entire control link of the second laser emitting unit.

[0021] In the present application, a failure protection circuit is provided to avoid unexpected damage caused by continuous operation of the laser emitting unit.

[0022] In combination with the first aspect, in certain implementations of the first aspect, determining the first AEL based on the first pulse sequence includes: determining a first parameter based on the first pulse sequence, the first parameter including one or more of the central wavelength of the first pulse, the emission duration of the first pulse, and the subtended angle of the first apparent source; determining, based on the first parameter, the reachable emission limit AEL single of a single pulse, the reachable emission limit AELs.PT of a single pulse in the second time, and the reachable emission limit AEL string of a single pulse of the first pulse string, wherein AEL single is determined based on the central wavelength of the first pulse and the emission duration of the first pulse, AELs.PT is determined based on the reachable emission limit in the second time and the number of pulses in the second time, the second time is the emission duration of the first pulse sequence, the first pulse string is a pulse string in a third time, and when the third time includes multiple first pulses, AEL string is determined based on the third time; and determining the minimum value among AEL single, AELs.PT, and AEL string as the first AEL.

[0023] In this application, by taking the minimum value among AEL single, AELS.PT and AEL string as the first AEL, the requirements for human eye safety in various evaluation scenarios can be obtained, which can ensure that the laser products that pass the test can also meet the human eye safety requirements in failure scenarios.

[0024] In combination with the first aspect, in certain implementations of the first aspect, determining the first pulse energy based on the first pulse sequence may include: determining the first pulse energy based on the maximum optical power of the first pulse sequence and the repetition frequency of the first pulse within a second time, where the second time is the emission duration of the first pulse sequence.

[0025] In this application, the first pulse energy is determined by the maximum optical power of the first pulse sequence and the repetition frequency of the first pulse within its emission duration. For pulses with an emission duration of nanoseconds, the energy of the abnormal pulse can also be obtained more accurately, which can improve the accuracy of the test results.

[0026] In a second aspect, a testing device is provided, which includes: a control unit for controlling a first laser emitting unit to emit a first pulse sequence, the first pulse sequence including multiple first pulses, the first pulse including an abnormal pulse at the end of a second pulse sequence emitted by a second laser emitting unit, and the first laser emitting unit and the second laser emitting unit are laser emitting units of the same type; a processing unit for determining a first achievable emission limit AEL and a first pulse energy based on the first pulse sequence; and determining whether the second pulse sequence meets eye safety requirements based on the first pulse energy and the first AEL.

[0027] In combination with the second aspect, in some implementations of the second aspect, the second pulse sequence also includes a normal pulse, and the position of the normal pulse in the second pulse sequence is before the abnormal pulse. The processing unit can be used to: determine the second pulse energy based on the first pulse energy, the energy of the normal pulse and the number of normal pulses in the second pulse sequence; when the second pulse energy is less than or equal to the first AEL, determine that the second pulse sequence meets the human eye safety requirements; or, when the second pulse energy is greater than the first AEL, determine that the second pulse sequence does not meet the human eye safety requirements.

[0028] In combination with the second aspect, in certain implementations of the second aspect, the abnormal pulse may be a pulse emitted by the second laser emitting unit when the driving switch is short-circuited.

[0029] In combination with the second aspect, in certain implementations of the second aspect, a failure protection circuit for driving a switch may be provided in the control link of the second laser emitting unit. The failure protection circuit may be used to control the second laser emitting unit to shut down within a first time from the start moment of the abnormal pulse. The first time includes the response time of the entire control link of the second laser emitting unit.

[0030] In combination with the second aspect, in certain implementations of the second aspect, the processing unit can be used to: determine a first parameter based on a first pulse sequence, the first parameter including one or more of the central wavelength of the first pulse, the emission duration of the first pulse, and the subtended angle of the first apparent source; determine a single pulse reachable emission limit AEL single, a single pulse reachable emission limit AELs.PT within the second time, and a single pulse reachable emission limit AEL string of the first pulse string based on the first parameter, wherein AEL single is determined based on the central wavelength of the first pulse and the emission duration of the first pulse, AELs.PT is determined based on the reachable emission limit within the second time and the number of pulses within the second time, the second time is the emission duration of the first pulse sequence, the first pulse string is a pulse string within a third time, and when the third time includes multiple first pulses, the AEL string is determined based on the third time; and determine the minimum value among AEL single, AELs.PT, and AEL string as the first AEL.

[0031] In combination with the second aspect, in certain implementations of the second aspect, the processing unit can be used to: determine the first pulse energy based on the maximum optical power of the first pulse sequence and the repetition frequency of the first pulse within the second time, where the second time is the emission duration of the first pulse sequence.

[0032] In a third aspect, a testing device is provided, comprising: a memory for storing a computer program; and a processor for executing the computer program stored in the memory, so that the device performs the method in the above-mentioned first aspect and any possible implementation thereof.

[0033] In a fourth aspect, a test system is provided, which includes a laser emitting unit and a test platform, and the test platform includes the device of the second aspect or the third aspect and any possible implementation thereof.

[0034] In a fifth aspect, a computer program product is provided, comprising: a computer program code, which, when executed on a computer, enables the computer to execute the method in the first aspect and any possible implementation thereof.

[0035] In a sixth aspect, a computer-readable storage medium is provided, wherein the computer-readable medium stores a computer program. When the computer program runs on a computer, the computer executes the method in the first aspect and any possible implementation thereof.

[0036] In a seventh aspect, a chip is provided, which includes a circuit for executing the method in the above-mentioned first aspect and any possible implementation thereof. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] FIG1 is a schematic diagram of a system architecture provided in an embodiment of the present application;

[0038] FIG2 is a schematic diagram of a pulse sequence provided in an embodiment of the present application;

[0039] FIG3 is a schematic diagram of a test scenario provided in an embodiment of the present application;

[0040] FIG4 is a flow chart of a testing method provided in an embodiment of the present application;

[0041] FIG5 is a schematic diagram of a pulse sequence for testing provided in an embodiment of the present application;

[0042] FIG6 is a schematic diagram of the waveform of an abnormal pulse provided in an embodiment of the present application;

[0043] FIG7 is a schematic diagram of the process of another testing method provided in an embodiment of the present application;

[0044] FIG8 is a schematic diagram of a testing device provided in an embodiment of the present application;

[0045] FIG9 is a schematic diagram of another testing device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0046] First, some technical terms involved in the embodiments of this application are introduced.

[0047] 1. Accessible Emission Limit (AEL): This is used to categorize laser products and can be understood as the maximum allowable emission level within a specific category. The AEL can be calculated based on the Maximum Permissible Exposure (MPE). Different AEL values ​​can be used for different evaluation items.

[0048] AEL 单 , used to represent the attainable emission limit of a single pulse, which can be determined based on the duration and central wavelength of a single pulse and can also be recorded as AEL single .

[0049] AEL T , used to indicate the achievable emission limit within the selected time reference T, which can be determined based on the selected time reference T.

[0050] AEL S.P.T =AEL T / N T , represents the achievable emission limit for a single pulse within a selected time base T, N T It can represent the number of pulses within the time base T.

[0051] AEL 串 , used to indicate the achievable emission limit of any single pulse in a pulse train, also known as AEL train For example, in time period T i When there are multiple pulse trains within a certain period (e.g., within 5 microseconds), the multiple pulse trains can be regarded as one pulse, and the AEL of any single pulse in the pulse train can be obtained. 串 =AEL 单 (T i )*C5, C5 is the correction factor. For example, when the single pulse duration is less than 0.25s, C5=N -0.25 , where N is the number of valid pulses in the pulse train within the evaluated transmission duration.

[0052] In some possible scenarios, AEL can be 单 , AEL S.P.T and AEL 串 The minimum value among the above is taken as the AEL of the evaluated laser product. The description of AEL can be found in the relevant technical documents and will not be repeated here.

[0053] The technical solution in this application will be described below with reference to the accompanying drawings.

[0054] For example, FIG1 is a schematic diagram of a system architecture provided in an embodiment of the present application. As shown in FIG1 , the system architecture 100 may include a driving unit 110, a driving switch 120, and a laser emitting unit 130. The driving unit 110 may provide a stable current and voltage for the laser emitting unit 130, so that the laser emitting unit 130 can output a laser of a specified wavelength and power. The driving switch 120 may be used to control the on / off between the driving unit 110 and the laser emitting unit 130. In some possible implementations, the driving switch 120 may be a metal-oxide-semiconductor field-effect transistor (MOSFET).

[0055] The system architecture 100 can be applied to various types of laser products. The laser product can include a laser emitting unit 130, and the drive unit 110 and / or drive switch 120 can be disposed outside the laser product or integrated within the laser product, as is not limited in this embodiment of the present application. The following description uses a laser radar as an example.

[0056] For example, the laser radar may include the laser emitting unit 130, and may also include a driving unit 110 and a driving switch 120. The laser radar may emit a laser pulse sequence (referred to as a pulse sequence), which may include one or more pulses. The pulse sequence output by the laser emitting unit is briefly described below with reference to FIG2 .

[0057] In one embodiment, when the laser radar is operating normally, the pulse sequence emitted by the laser radar may include multiple normal pulses. These multiple normal pulses may have the same energy and pulse width, and the time intervals between adjacent pulses may also be the same, as shown in FIG2(a). The energy, pulse width, and / or time intervals between adjacent pulses of these multiple normal pulses may also have deviations within an allowable error range.

[0058] The risks posed by laser products to human health are related to the parameters of the laser. The mechanisms by which laser irradiation causes damage to biological tissues may include thermal reactions, thermoacoustic transients, photochemical effects, and nonlinear effects. The inherent physical parameters of the laser irradiation source, such as wavelength, pulse width, focal size, irradiance, and irradiation dose, affect the main damage mechanism. For example, when the laser irradiation time is in the nanosecond or sub-nanosecond level, the main damage mechanisms are acoustic transient effects and nonlinear effects. For another example, when the laser irradiation time is from 1 millisecond to several seconds, the main damage mechanism is thermal effects. For another example, when the laser irradiation time exceeds 10 seconds, the main damage mechanism is photochemical effects.

[0059] Laser products can be classified into multiple levels based on the hazards they pose to human health. For example, for Class 1 laser products, direct viewing of the laser beam for extended periods during use, even when using an optical observation instrument, remains safe. For another example, for Class 1M laser products, direct viewing of the laser beam for extended periods with the naked eye is considered safe. For another example, Class 2 laser products are safe during momentary exposure, but may be hazardous if intentionally looking into the laser beam. For another example, for Class 4 laser products, both direct viewing of the laser beam and skin exposure are hazardous. Other classification methods may also be used in actual testing scenarios.

[0060] In terms of eye safety, laser products of different levels may correspond to different AELs. For the same laser product, when emitting different pulse sequences, the corresponding AEL can be determined based on the emission parameters. For example, when a laser radar is operating normally, the corresponding AEL can be determined based on parameters such as the operating center wavelength, pulse timing, and apparent source angle. This AEL can be used to evaluate whether the laser radar will cause damage to human eyes. The AEL of the laser radar in normal operating scenarios can be determined based on relevant technical documents (such as IEC 60825). For another example, by measuring the average optical power and maximum optical power of the light spot emitted by the laser radar after passing through the aperture grating, the actual maximum single pulse energy of the laser radar can be determined. When the maximum single pulse energy of the laser radar is greater than the AEL of the laser radar, it can be considered that the laser radar will cause damage to the eyes; when the maximum single pulse energy of the laser radar is less than or equal to the AEL, it can be considered that the laser radar will not cause damage to the eyes.

[0061] For example, Figure 3 is a schematic diagram of a scenario for measuring parameters of a laser radar provided in an embodiment of the present application. When other laser products are involved, the method shown in Figure 3 can also be used to determine their parameters.

[0062] As shown in (a) of FIG3 , the central wavelength of the pulse emitted by the laser radar (also referred to as the operating central wavelength of the laser radar) can be measured by a spectrum analyzer.

[0063] As shown in Figure 3(b), the optical power of the LiDAR can be measured by an integrating sphere power meter to determine the energy of the laser pulse emitted by the LiDAR. For example, in this scenario, the total energy of the normal pulses within a period of time can be obtained. Combined with the number of normal pulses in this period of time, the single pulse energy of the normal pulse (denoted as E normal ).

[0064] As shown in (c) in Figure 3, the timing information of the pulses sent by the laser radar, such as the start and end time, energy peak time, and interval between adjacent pulses, can be determined through a photoelectric conversion device and an oscilloscope.

[0065] As shown in (d) of FIG3 , the apparent source subtending angle of the laser pulse emitted by the laser radar can be determined by a photosensitive camera and a hole grating (such as a 7 mm hole grating).

[0066] In actual scenarios, various units in the system architecture 100 may fail. For example, the driver unit 110 may experience failures such as short circuit, no output, and abnormal output. For another example, a MOSFET may experience failures such as gate (G)-drain (D)-source (S) short circuit, drain / source voltage drop, drain-source on resistance (RDSon) increase, gate leakage increase, DS leakage increase, threshold voltage drift, gate parasitic resistance increase. For another example, the laser emitting unit 130 may experience failures such as wavelength drift, power drop, and no light emission.

[0067] Even if a LiDAR does not pose a health hazard to the eyes under normal operating conditions, it may still cause eye damage if there is a failure in the entire control chain of the LiDAR. For example, if the drive switch 120 is short-circuited, the laser emitting unit 130 may continue to emit laser light, as shown in Figure 2(b). For another example, if the wavelength of the laser emitting unit 130 drifts, it may cause the operating center wavelength of the LiDAR to change, thereby affecting the corresponding AEL.

[0068] In some possible implementations, in order to cope with possible failure scenarios, a failure protection circuit can be set in the system architecture to avoid unexpected consequences caused by the failure of the drive unit 100, the drive switch 120 and / or the laser emission unit 130. For example, when the drive switch 120 is short-circuited, the corresponding failure protection circuit can successfully shut down the laser emission unit 130 within a preset time when the abnormal pulse occurs, so as to avoid unexpected damage caused by its continued operation, as shown in (b) in Figure 2. However, even if a failure protection circuit is provided, the performance and parameters of laser products such as lidar may still change compared to their normal working state. Therefore, it is of great significance to evaluate whether laser products such as lidar may cause damage to personnel in failure scenarios.

[0069] In view of this, the embodiments of the present application provide a testing method and a testing device that can evaluate whether laser products such as lidar can meet the safety requirements of human eyes in random pulse failure scenarios.

[0070] For example, FIG4 is a flow chart of a test method provided in an embodiment of the present application. This method 400 can be used to test laser products such as lidar. This method 400 can be performed by a test device for a laser product, or by a chip or processor in the test device, or by a test system consisting of the test device and the laser product. This method 400 may include:

[0071] S410, controlling the first laser emitting unit to emit a first pulse sequence, where the first pulse sequence includes a plurality of first pulses, where the first pulse includes an abnormal pulse at the end of a second pulse sequence emitted by the second laser emitting unit, and the first laser emitting unit and the second laser emitting unit are laser emitting units of the same type.

[0072] Exemplarily, the control link of the laser emitting unit may include its driving unit and driving switch. In actual test scenarios, the control link may also include other processing circuits, control circuits and / or control devices. When there is a failure in the control link of the laser control unit, the pulse sequence emitted by the laser emitting unit may include abnormal pulses. For example, the driving unit may have failures such as short circuit and output abnormality. For another example, the MOSFET may have failures such as GDS short circuit, drain / source voltage drop, RDSon increase, gate leakage increase, DS leakage increase, threshold voltage drift, gate parasitic resistance increase. For another example, the laser emitting unit may have failures such as wavelength drift and power drop.

[0073] Because in real failure scenarios, the pulse sequence emitted by the laser emitting unit often only has one abnormal pulse at the end of the sequence, and the pulse emission duration is usually at the nanosecond level, it is difficult to accurately measure the optical power of the abnormal pulse included in the pulse sequence and the emission parameters corresponding to the abnormal pulse (such as the working center wavelength, etc.) in real failure scenarios.

[0074] Furthermore, in order to evaluate the performance of a certain type of laser product under real-world failure scenarios, it may be necessary to damage the laser product, for example, when part or all of the control chain of the laser emission unit is integrated into the laser product.

[0075] For example, the second laser emitting unit can be understood as a laser emitting unit that has a true failure in its control link. The pulse sequence emitted by the second laser emitting unit with a failure in the control link is the second pulse sequence. The first pulse is the abnormal pulse in the second pulse sequence. The first pulse sequence can be obtained by periodically repeating the first pulse.

[0076] The second laser emitting unit and the first laser emitting unit for emitting the first pulse sequence may be the same laser emitting unit, or may be different laser emitting units of the same type.

[0077] In one embodiment, it is assumed that laser radar samples #1 and #2 are both type A (or sample #1 and sample #2 are the same model). The type A laser radar integrates a drive switch, a drive unit, and a laser emission unit. In a normal operating scenario, samples #1 and #2 can emit a normal pulse sequence (referred to as pulse sequence #0), as shown in (a) in Figure 2. To test whether the type A laser radar meets the eye safety requirements in a failure scenario, the control link of the laser emission unit of sample #1 can be destroyed, such as by short-circuiting the drive switch, and controlling sample #1 to emit laser pulses. The pulse sequence emitted by the type A laser radar in a real failure scenario (referred to as pulse sequence #1) is obtained, such as shown in (b) in Figure 2. Through the test scenario in (c) in Figure 3, the abnormal pulse emitted by sample #1 can be obtained. Based on the abnormal pulse, a pulse sequence for testing (referred to as pulse sequence #2) can be constructed. Since sample #1 is damaged, sample #2 can be controlled to emit pulse sequence #2 to evaluate whether this type of lidar can meet human eye safety requirements in a failure scenario.

[0078] In another embodiment, it is assumed that sample #3 and sample #4 are both laser products of type B. The laser product of type B is provided with a laser emission unit, but its drive switch and / or drive unit is provided outside the laser product. The drive switch and / or drive unit can be rendered inoperable by technical means without causing damage to the laser product. In this case, when evaluating whether the laser product of type B meets human safety needs in a scenario where the control chain fails, sample #3 can be controlled to emit pulse sequence #1. Based on the abnormal pulses in pulse sequence #1, pulse sequence #2 is constructed. Then, sample #3 is controlled to emit pulse sequence #2, and whether the laser product of type B meets human safety needs is evaluated based on the test results.

[0079] In another embodiment, in a real-world failure scenario, the timing of the failure may be random. After the failure occurs, pulse sequence #1 will terminate, resulting in a random number of pulses in pulse sequence #1, with the abnormal pulse located at the end of pulse sequence #1. For example, pulse sequence #1 may include only one abnormal pulse. In another example, pulse sequence #1 may also include one or more normal pulses, with the normal pulse located before the abnormal pulse in pulse sequence #1.

[0080] The pulse sequence #1 in the above embodiment can be understood as the second pulse sequence in step S410, and the pulse sequence #2 can be understood as the first pulse sequence in step S410.

[0081] S420: Determine a first attainable emission limit AEL and a first pulse energy according to the first pulse sequence.

[0082] For example, according to the scenario shown in (b) of Figure 3 , the energy of the first pulse sequence can be measured. Combined with the number of pulses in the first pulse sequence, the energy of the first pulse can be calculated. In other words, the energy of the abnormal pulse in the second pulse sequence can be obtained. The first pulse energy includes the energy of the abnormal pulse.

[0083] For example, in the scenario shown in FIG3 , a first parameter can be measured based on the first pulse sequence. The first parameter can include one or more of the following: an operating center wavelength, a single pulse emission duration, and an apparent source subtended angle. Based on the measured first parameter of the lidar, a corresponding first AEL can be determined.

[0084] In one embodiment, the AEL can be adjusted according to the actual use scenario of the laser product. 单 、AEL S.P.T or AEL 串 Determine the first AEL.

[0085] For example, the first AEL may be AEL 单 、AEL S.P.T and AEL 串 The minimum value of the AEL 单 、AEL S.P.T and AEL 串 It can be obtained from the corresponding parameters. For example, the AEL 单 It can be obtained from the central wavelength and emission duration of the first pulse; AEL S.P.T It can be determined by the emission duration of the first pulse sequence and the number of pulses within the time; when a preset time (such as 5 microseconds) includes multiple pulses, the AEL can be determined based on the preset time. 串 .

[0086] S430: Determine whether the second pulse sequence meets eye safety requirements based on the first AEL and the first pulse energy.

[0087] As mentioned above, in a real failure scenario, the time when the failure occurs is random. Accordingly, whether the second pulse sequence includes normal pulses and the number of normal pulses included can be random.

[0088] In one embodiment, when the second pulse sequence includes only abnormal pulses and the first pulse energy is less than or equal to the first AEL, the second pulse sequence can be determined to meet eye safety requirements. When the first pulse energy is greater than the first AEL, the second pulse sequence can be considered to not meet eye safety requirements and may cause damage to the human eye.

[0089] In another embodiment, when the second pulse sequence also includes normal pulses, a second pulse energy can be determined based on the first pulse energy and the number and energy of normal pulses in the second pulse sequence. The second pulse energy can represent the average energy of a single pulse in the second pulse sequence. When the second pulse energy is less than or equal to the first AEL, the second pulse sequence can be determined to meet eye safety requirements. Otherwise, the second pulse energy can be considered to not meet eye safety requirements.

[0090] Exemplarily, the energy of the first pulse may be determined according to the maximum optical power of the first pulse sequence and the repetition frequency of the first pulse in the first pulse sequence.

[0091] The following briefly describes method 400, using the example of evaluating whether a laser radar meets eye safety requirements in the event of a failure, in conjunction with Figures 5 through 7 . The method embodiments in Figures 5 through 7 can be understood as variations or extensions of method 400. When other laser products are involved, or when assessing whether skin safety requirements are met, relevant parameters can be adaptively adjusted.

[0092] Compared with other possible failure modes of the system architecture 100, a short circuit in the drive switch 120 may cause the laser emitting unit 130 to continuously emit lasers, and this failure mode is more likely to cause damage to the human eye. In other words, in terms of the human eye safety requirements that the laser radar needs to meet, the failure scenario of a short circuit in the drive switch is more likely to cause damage to the human eye than other failure scenarios. Therefore, this failure scenario can be considered the most stringent test scenario. By evaluating the performance of the laser radar when the drive switch is short-circuited, it can be determined whether the laser radar can meet the human eye safety requirements under various failure scenarios. In this way, while ensuring the accuracy of the evaluation results, the test items for the laser radar can be reduced and the test process can be shortened.

[0093] The following describes a failure scenario in which a drive switch in a control link is short-circuited as an example.

[0094] For example, the waveform parameters of a pulse sequence in a real drive switch failure scenario can be determined based on the scenario shown in (c) of FIG3 . In a real failure scenario, an abnormal pulse can appear at any position in the pulse sequence. For example, in the pulse sequence, the abnormal pulse can be preceded by one or more normal pulses, or there can be no pulse at all.

[0095] In a real-world failure scenario, a pulse sequence contains only one abnormal pulse, located at the end of the sequence. However, LiDAR pulse widths are typically in the nanosecond (ns) range, making it difficult to accurately measure the optical power of a single abnormal pulse within a pulse sequence.

[0096] As described above, pulse sequence #1 can represent the pulse sequence emitted by the laser radar in a real failure scenario. By determining the waveform of the abnormal pulse in the real failure scenario, the laser radar can be controlled to emit a pulse sequence #2 including multiple abnormal pulses. That is to say, after determining the abnormal pulse in pulse sequence #1, the laser radar can be controlled to periodically emit the abnormal pulse. For example, taking the failure scenario shown in (b) in Figure 2 as an example, pulse sequences #1 and #2 can be as shown in Figure 5. For another example, the position of the abnormal pulse in pulse sequence #1 or the order in the sequence can be determined, and the number of normal pulses in the pulse sequence #1 can also be determined.

[0097] For example, FIG6 is a schematic diagram of the waveform of an abnormal pulse provided by an embodiment of the present application. In the case where a failure protection circuit for the drive switch is not provided in the control chain of the laser radar, when the drive switch is short-circuited, the waveform of the abnormal pulse in pulse sequence #1 may be as shown in FIG6(a). In the case where a failure protection circuit for the drive switch is provided in the control chain of the laser radar, when the drive switch is short-circuited, the waveform of the abnormal pulse in pulse sequence #1 may be as shown in FIG6(b). The start time of the abnormal pulse is t0.

[0098] In one embodiment, for a laser radar that is not equipped with a failsafe circuit in the control chain, when a short circuit occurs in the driving switch, the pulse emitted by the laser radar will inevitably experience a power drop after a period of time. The pulse starting from the start time of the abnormal pulse can be divided into two parts. For example, as shown in (a) in Figure 6, t1 is the starting point of the DC component. The pulse starting from the start time of the abnormal pulse can be divided into an abnormal pulse and a DC component according to t1. The abnormal pulse can include the pulse between t0 and t1. For another example, the pulse between t0 and t1 is recorded as pulse #1, and the periodic repetition of pulse #1 can constitute pulse sequence #2.

[0099] In some possible implementations, the first part and the second part may be determined in other ways, for example, t1 corresponds to a moment of 1% or 5% of the peak power of the trailing edge of the abnormal pulse.

[0100] In another embodiment, for a LiDAR with a failsafe circuit in its control chain, if a short circuit occurs in the driver switch, assuming the LiDAR's laser emitting unit can be successfully shut down at time t2, (t2-t0) can be recorded as the safe cutoff time t. Pulse sequence #2 can be constructed based on the waveform between t0 and t2. For example, the pulse between t0 and t2 is recorded as pulse #2. Pulse sequence #2 can be composed of multiple pulses #2, and the periodic repetition of pulse #2 can constitute pulse sequence #2.

[0101] By obtaining the working center wavelength, timing information, apparent source angle and other parameters of the laser radar corresponding to pulse sequence #2, the AEL corresponding to pulse sequence #2 can be determined. 失效 For example, the AEL corresponding to the pulse sequence #2 can be determined 单 、AEL S.P.T and AEL 串 and take the minimum value as the AEL under the failure scenario 失效 The AEL 失效 It can be understood as the first AEL in steps S420 and S430.

[0102] For example, according to the scenario shown in (b) of FIG3 , the maximum optical power P received by the failure light spot corresponding to pulse sequence #2 on the human eye can be measured. max and the human eye reception efficiency γ. Based on the emission time T1 of pulse sequence #2 and the pulse repetition frequency (PRF) during this time period, the energy of a single abnormal pulse can be calculated using the following formula: E′=P max *T1 / PRF*γ

[0103] Assuming that the nth pulse in pulse sequence #1 is an abnormal pulse (n is a positive integer), the energy of a single pulse in the failure case can satisfy E average =(E′+(n-1)*E normal ) / n. For example, in E average Less than or equal to AEL 失效 When E average Greater than AEL 失效 When the laser radar fails, it can be considered that it cannot meet the requirements of human eye safety.

[0104] For example, FIG7 is a flow chart of another measurement method provided in an embodiment of the present application. The method 700 can be understood as an extension or variation of the method 400. The method 700 may include the following steps:

[0105] S701: Power on, simulate a failure scenario, and start measurement.

[0106] Illustratively, before step S701 , a test environment may be built according to the scenario shown in FIG3 .

[0107] For example, before testing, the actual failure scenario of a drive switch short circuit can be determined. For example, the number of normal pulses in pulse sequence #1, the energy of the normal pulses, and the waveform of the abnormal pulses can be determined. For another example, when a failsafe circuit for a drive switch short circuit is provided in the control link of the lidar, the corresponding safe cutoff time can be determined. For another example, when a failsafe circuit for a drive switch short circuit is not provided in the control link of the lidar, the non-DC portion of the abnormal waveform can be determined. After the above preparations, the lidar can subsequently be controlled to transmit pulse sequence #2.

[0108] S702, measuring parameters in a laser radar failure scenario.

[0109] For example, by controlling the laser radar to transmit pulse sequence #2, parameters such as the corresponding working center wavelength, the apparent source angle, and the emission duration of a single pulse in pulse sequence #2 can be measured.

[0110] S703, calculate the accessible energy limit AEL 失效 .

[0111] For example, according to the parameters determined in step S702, the AEL corresponding to the pulse sequence #2 can be determined. 单 、AEL S.P.T and AEL 串 , the minimum value among the three can be determined as AEL 失效 .

[0112] S704, measuring the energy E′ of a single abnormal pulse.

[0113] For example, the maximum average optical power P corresponding to pulse sequence #2 can be measured. max and the human eye reception efficiency γ.

[0114] It should be understood that step S702 may be performed first, or step S704 may be performed first, or steps S702 and S704 may be performed simultaneously, and this embodiment of the present application does not limit this.

[0115] S705: In the random failure scenario, calculate the average single-shot energy E of the accumulated normal pulses and abnormal pulses. average .

[0116] For example, according to the number of normal pulses in pulse sequence #1, the single pulse energy of normal pulses and the abnormal pulse energy E′, the average single shot energy E of pulse sequence #1 can be calculated. average .

[0117] S706, determine AEL 失效 Is it greater than E? average .

[0118] In AEL 失效 Greater than E average When, jump to step S708; or, in AEL 失效 Less than or equal to E average When , jump to step S707.

[0119] S707, meets eye safety requirements.

[0120] In AEL 失效 Less than or equal to E average When the driving switch is short-circuited, the performance of the lidar meets the safety requirements of the human eye.

[0121] S708, does not meet eye safety requirements.

[0122] In AEL 失效 Greater than E average When the driving switch is short-circuited, the performance of the lidar does not meet the safety requirements of the human eye.

[0123] The method provided in the embodiments of the present application is described in detail above with reference to Figures 4 to 7 . The apparatus provided in the embodiments of the present application will be described in detail below with reference to Figures 8 and 9 . The description of the apparatus embodiment corresponds to the description of the method embodiment. Therefore, any details not described in detail can be referred to in the method embodiment above.

[0124] For example, FIG8 shows a schematic block diagram of a testing device 1000 (hereinafter referred to as device 1000 ) provided in an embodiment of the present application. The device may include a control unit 1010 and a processing unit 1020 .

[0125] The apparatus 1000 may include units for executing any one of the methods in FIG. 4 to FIG. 7 , and each unit in the apparatus 1000 may be used to execute a corresponding process in any one of the method embodiments in FIG. 4 to FIG. 7 .

[0126] When the device 1000 is used to execute the method 400 in FIG. 4 , the control unit 1010 may be used to execute step S410 in the method 400 , and the processing unit 1020 may be used to execute steps S420 and S430 in the method 400 .

[0127] Specifically, the control unit 1010 can be configured to control the first laser emitting unit to emit a first pulse sequence, the first pulse sequence including a plurality of first pulses, the first pulse including an abnormal pulse at the end of a second pulse sequence emitted by the second laser emitting unit, wherein the first laser emitting unit and the second laser emitting unit are of the same type. The processing unit 1020 can be configured to determine a first AEL and a first pulse energy based on the first pulse sequence, and to determine whether the second pulse sequence meets eye safety requirements based on the first AEL and the first pulse energy.

[0128] In one embodiment, the device 1000 can control the laser emitting unit to be measured, or the corresponding laser product to emit a pulse sequence in the scenario shown in FIG. 3 to obtain a measurement result.

[0129] Exemplarily, the second pulse sequence further includes a normal pulse, and the normal pulse is positioned before the abnormal pulse in the second pulse sequence. The processing unit 1020 may be configured to determine a second pulse energy based on the first pulse energy, the energy of the normal pulse, and the number of normal pulses in the second pulse sequence. The second pulse energy may be the average energy of a single pulse in the second pulse sequence.

[0130] In some possible implementations, the abnormal pulse in the second pulse sequence may be a pulse emitted by the second laser emitting unit when the driving switch is short-circuited.

[0131] In some possible implementations, a failure protection circuit for driving a switch is provided in the control link of the second laser emitting unit. The failure protection circuit is used to control the second laser emitting unit to shut down within a first time from the start moment of the abnormal pulse. The first time includes the response time of the entire control link of the second laser emitting unit.

[0132] In some possible implementations, the processing unit 1020 may be configured to: determine a first parameter based on the first pulse sequence, the first parameter including one or more of a central wavelength of the first pulse, an emission duration of the first pulse, and a first apparent source subtended angle; and determine an attainable emission limit AEL of a single pulse based on the first parameter. 单 , Single pulse within the second time can reach the emission limit AEL S.P.T and the single pulse of the first pulse train can reach the emission limit AEL 串 , among which AEL 单 It is determined by the central wavelength of the first pulse and the emission duration of the first pulse, AEL S.P.T It is determined based on the reachable emission limit within the second time and the number of pulses within the second time. The second time is the emission duration of the first pulse sequence, and the first pulse train is the pulse train within the third time. When the third time includes multiple first pulses, AEL串 It is determined based on the third time; AEL 单 、AEL S.P.T and AEL 串 The minimum value among them is determined as the first AEL.

[0133] In some possible implementations, the processing unit 1020 may be configured to determine the first pulse energy based on the maximum optical power of the first pulse sequence and the repetition frequency of the first pulse within a second time, where the second time is the emission duration of the first pulse sequence.

[0134] The division of the various units in the above devices is merely a division of logical functions. In actual implementation, they may be fully or partially integrated into a single physical entity, or physically separated. All units in the above devices may be implemented entirely through a processor calling software, entirely through hardware circuits, or partially through a processor calling software, with the remainder implemented through hardware circuits.

[0135] In a specific implementation process, the control unit 1010 can be implemented by at least one transceiver or transceiver-related circuits, and the processing unit 1020 can be implemented by at least one processor or processor-related circuits. In one example, one or more processors can determine the first AEL based on the first pulse sequence. In one example, one or more processors can determine the first pulse energy based on the first pulse sequence. In one example, one or more processors can determine the average single pulse energy of the second pulse sequence based on the first pulse energy, the energy of the normal pulse, and the number of normal pulses in the second pulse sequence. Exemplarily, in a specific implementation process, the device 1000 can be a test device corresponding to the laser emitting unit in the scenario shown in FIG. 3 , or a chip or processor provided in the test device.

[0136] For example, FIG9 is a schematic block diagram of another test device 2000 (hereinafter referred to as device 2000) provided in an embodiment of the present application. The device 2000 may include: a processor 2010, an interface circuit 2020, and a memory 2030. The processor 2010, the interface circuit 2020, and the memory 2030 are connected via an internal connection path, the memory 2030 is used to store instructions, the processor 2010 is used to execute the instructions stored in the memory 2030, and the interface circuit 2020 receives / sends some parameters. Optionally, the memory 2030 can be coupled to the processor 2010 via an interface, or can be integrated with the processor 2010.

[0137] It should be noted that the interface circuit 2020 may include, but is not limited to, a transceiver device such as an input / output interface to enable communication between the device 2000 and other devices or communication networks. For example, the interface circuit 2020 may communicate with a laser emitting unit and / or a driver of the laser emitting unit. For another example, the interface circuit 2020 may communicate with a laser radar to control the laser radar to emit a first pulse sequence.

[0138] An embodiment of the present application further provides a testing system, which includes a laser emitting unit and the above-mentioned device 1000 or device 2000.

[0139] An embodiment of the present application also provides a computer program product, which includes: computer program code, which, when running on a computer, enables the computer to execute any one of the method embodiments in Figures 4 to 7 above, and any possible implementation thereof.

[0140] An embodiment of the present application also provides a computer-readable storage medium, which stores program code or instructions. When the computer program code or instructions are executed by a computer processor, the processor implements any method embodiment in Figures 4 to 7 above, and any possible implementation method thereof.

[0141] An embodiment of the present application also provides a chip, including a circuit, for executing any method embodiment in Figures 4 to 7 above, and any possible implementation thereof.

[0142] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0143] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working processes and beneficial effects of the above-described systems, devices and units can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0144] In the several embodiments provided in this application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. For example, the device embodiments described above are merely schematic. For example, the division of the units is merely a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0145] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0146] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0147] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory, a random access memory, a magnetic disk, or an optical disk.

[0148] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of this application. Therefore, the scope of protection of this application should be based on the scope of protection of the claims.

Claims

1. A testing method, characterized in that: include: Controlling a first laser emitting unit to emit a first pulse sequence, wherein the first pulse sequence includes a plurality of first pulses, wherein the first pulse includes an abnormal pulse at the end of a second pulse sequence emitted by a second laser emitting unit, wherein the first laser emitting unit and the second laser emitting unit are laser emitting units of the same type; Determining a first achievable emission limit AEL and a first pulse energy according to the first pulse sequence; Determine whether the second pulse sequence meets eye safety requirements according to the first pulse energy and the first AEL.

2. The method according to claim 1, characterized in that The second pulse sequence also includes a normal pulse, and the position of the normal pulse in the second pulse sequence is before the abnormal pulse. The determining, according to the first pulse energy and the first AEL, whether the first pulse sequence meets the human eye safety requirement includes: determining a second pulse energy according to the first pulse energy, the energy of the normal pulse and the number of the normal pulses in the second pulse sequence; When the second pulse energy is less than or equal to the first AEL, determining that the second pulse sequence meets the human eye safety requirement; or, When the second pulse energy is greater than the first AEL, it is determined that the second pulse sequence does not meet the human eye safety requirement.

3. The method according to claim 1 or 2, characterized in that: The abnormal pulse is a pulse emitted by the second laser emitting unit when a driving switch is short-circuited.

4. The method according to claim 3, characterized in that A failure protection circuit of the driving switch is provided in the control link of the second laser emitting unit, and the failure protection circuit is used to control the second laser emitting unit to shut down within a first time from the starting moment of the abnormal pulse, and the first time includes the response time of the entire control link of the second laser emitting unit.

5. The method according to any one of claims 1 to 4, wherein determining a first attainable emission limit AEL according to the first pulse sequence comprises: Determining a first parameter according to the first pulse sequence, the first parameter comprising one or more of a central wavelength of the first pulse, an emission duration of the first pulse, and a first apparent source subtending angle; According to the first parameter, the reachable emission limit AEL of a single pulse is determined 单 , the single pulse in the second time can reach the emission limit AEL S.P.T and the single pulse of the first pulse train can reach the emission limit AEL 串 , Among them, the AEL 单 is determined according to the central wavelength of the first pulse and the emission duration of the first pulse, the AEL S.P.T is determined according to the achievable emission limit within the second time and the number of pulses within the second time, the second time is the emission duration of the first pulse sequence, the first pulse train is the pulse train within the third time, and when the third time includes multiple first pulses, AEL 串 is determined according to the third time; The AEL 单 、The AEL S.P.T and the AEL 串 The minimum value among them is determined as the first AEL.

6. The method according to any one of claims 1 to 5, characterized in that The step of determining a first pulse energy according to the first pulse sequence comprises: The first pulse energy is determined according to the maximum optical power of the first pulse sequence and the repetition frequency of the first pulse within a second time, where the second time is the emission duration of the first pulse sequence.

7. A testing device, characterized in that: include: a control unit, configured to control the first laser emitting unit to emit a first pulse sequence, wherein the first pulse sequence includes a plurality of first pulses, wherein the first pulse includes an abnormal pulse at the end of a second pulse sequence emitted by the second laser emitting unit, and the first laser emitting unit and the second laser emitting unit are laser emitting units of the same type; a processing unit, configured to determine a first achievable emission limit AEL and a first pulse energy according to the first pulse sequence; Determine whether the second pulse sequence meets eye safety requirements according to the first pulse energy and the first AEL.

8. The testing device according to claim 7, characterized in that: The second pulse sequence further includes a normal pulse, and the position of the normal pulse in the second pulse sequence is before the abnormal pulse, and the processing unit is used to: determining a second pulse energy according to the first pulse energy, the energy of the normal pulse and the number of the normal pulses in the second pulse sequence; When the second pulse energy is less than or equal to the first AEL, determining that the second pulse sequence meets the human eye safety requirement; or, When the second pulse energy is greater than the first AEL, it is determined that the second pulse sequence does not meet the human eye safety requirement.

9. The testing device according to claim 7 or 8, characterized in that: The abnormal pulse is a pulse emitted by the second laser emitting unit when a driving switch is short-circuited.

10. The testing device according to claim 9, characterized in that: A failure protection circuit of the driving switch is provided in the control link of the second laser emitting unit, and the failure protection circuit is used to control the second laser emitting unit to shut down within a first time from the starting moment of the abnormal pulse, and the first time includes the response time of the entire control link of the second laser emitting unit.

11. The testing device according to any one of claims 7 to 10, characterized in that: The processing unit is used for: Determining a first parameter according to the first pulse sequence, the first parameter comprising one or more of a central wavelength of the first pulse, an emission duration of the first pulse, and a first apparent source subtending angle; According to the first parameter, the reachable emission limit AEL of a single pulse is determined 单 , the single pulse in the second time can reach the emission limit AEL S.P.T and the single pulse of the first pulse train can reach the emission limit AEL 串 , Among them, the AEL 单 is determined according to the central wavelength of the first pulse and the emission duration of the first pulse, the AEL S.P.T is determined according to the achievable emission limit within the second time and the number of pulses within the second time, the second time is the emission duration of the first pulse sequence, the first pulse train is the pulse train within the third time, and when the third time includes multiple first pulses, AEL 串 is determined according to the third time; The AEL 单 、The AEL S.P.T and the AEL 串 The minimum value among them is determined as the first AEL.

12. The testing device according to any one of claims 7 to 11, characterized in that: The processing unit is used for: The first pulse energy is determined according to the maximum optical power of the first pulse sequence and the repetition frequency of the first pulse within a second time, where the second time is the emission duration of the first pulse sequence.

13. A testing device, characterized in that: The device comprises: Memory for storing computer programs; A processor, configured to execute the computer program stored in the memory, so that the apparatus performs the method according to any one of claims 1 to 6.

14. A testing system, characterized in that: The system comprises a laser emitting unit and a testing platform, wherein the testing platform comprises the device according to any one of claims 7 to 13.

15. A computer-readable storage medium, characterized in that: A computer program is stored thereon, and when the computer program is executed by a computer, the method according to any one of claims 1 to 6 is implemented.

16. A computer program product, characterized in that The computer program product comprises a computer program code. When the computer program code is run on a computer, the method according to any one of claims 1 to 6 is executed.

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