Information processing method and blade repair method

The information processing method addresses the challenge of generating machining control information by scheduling machining devices based on obtained machining and device information, resulting in improved processing efficiency.

WO2025094388A1PCT designated stage expired Publication Date: 2025-05-08NIKON CORP
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Patent Information

Application Number
PCT/JP2023/039727
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Filing Date
2023-11-02
Publication Date
2025-05-08

AI Technical Summary

Technical Problem

Existing machining systems face challenges in efficiently generating machining control information for processing various objects, leading to suboptimal machining operations.

Method used

An information processing method that obtains machining information for different objects and device information, and sets schedules for machining devices based on this information to optimize processing operations.

Benefits of technology

The method enables efficient scheduling and operation of machining devices, improving the processing efficiency and effectiveness for diverse machining tasks.

✦ Generated by Eureka AI based on patent content.

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Abstract

This information processing method comprises: acquiring first processing information for processing one or a plurality of first processing objects and second processing information for processing one or a plurality of second processing objects; acquiring at least one among processing device installation information pertaining to the installation of one or a plurality of processing devices and processing device vacancy information pertaining to a vacant time of the one or plurality of processing devices; and, on the basis of the first processing information, the second processing information, and at least one of the processing device installation information and the processing device vacancy information, setting a schedule for the one or plurality of processing devices to process each of the one or plurality of first processing objects and the one or plurality of second processing objects.
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Description

Information processing method and blade repair method

[0001] The present invention relates to the technical field of information processing methods and blade repair methods.

[0002] An example of a processing device that processes an object is described in Patent Document 1. One of the technical challenges of such a processing device is to appropriately generate processing control information for controlling the processing of the object.

[0003] US Patent Application Publication No. 2018 / 0029298

[0004] According to a first aspect, an information processing method is provided that includes acquiring first processing information for processing one or more first processing objects and second processing information for processing one or more second processing objects, acquiring at least one of processing equipment installation information regarding the installation of one or more processing equipment and processing equipment availability information regarding the availability time of the one or more processing equipment, and setting a schedule for the one or more processing equipment to process the one or more first processing objects and the one or more second processing objects, respectively, based on the first processing information, the second processing information, and at least one of the processing equipment installation information and the processing equipment availability information.

[0005] According to a second aspect, there is provided a blade repair method including: acquiring first repair flow information for measuring and additionally processing one or more first blades and second repair flow information for measuring and additionally processing one or more second blades; acquiring equipment information regarding one or more processing devices and one or more measuring devices; and setting a schedule for the one or more processing devices and the one or more measuring devices to measure and additionally process the one or more first blades and the one or more second blades, respectively, based on the first repair flow information, the second repair flow information, and the equipment information.

[0006] According to a third aspect, an information processing method is provided that includes acquiring first processing information for processing one or more first processing objects and second processing information for processing one or more second processing objects, acquiring equipment information regarding one or more processing devices, and setting a schedule for the one or more processing devices to process each of the one or more first processing objects and the one or more second processing objects based on the first processing information, the second processing information, and the equipment information.

[0007] According to a fourth aspect, an information processing method is provided that includes: acquiring first task information regarding a first task included in a processing flow for processing a workpiece, which task needs to be performed while the workpiece is placed on a measuring device or processing device; second task information regarding a second task included in the processing flow, which task can be performed even if the workpiece is not placed on a measuring device or processing device; and time information regarding the time required to complete the first task and the time required to complete the second task; identifying tasks that can be executed in parallel among the tasks in the processing flow based on the first task information, the second task information, and the time information; and setting the identified tasks to be executed in parallel.

[0008] According to a fifth aspect, there is provided an information processing method including: acquiring first processing information for processing a first workpiece, second processing information for processing a second workpiece, and processing equipment information including information regarding a processing equipment; and generating, based on the first processing information, the second processing information, and the processing equipment information, action instruction information indicating action instructions to an operator as part of at least one of status display data, first status display data indicating the progress of the processing flow of the one or more first workpieces, and second status display data indicating the progress of the processing flow of the one or more second workpieces.

[0009] FIG. 1 is a block diagram showing the overall configuration of a machining system according to an embodiment. FIG. 2 is a block diagram showing the system configuration of a machining apparatus according to an embodiment. FIG. 3 is a cross-sectional view showing the configuration of a machining apparatus according to an embodiment. FIG. 4 is a block diagram showing the system configuration of a measurement apparatus according to an embodiment. FIG. 5 is a diagram showing a schematic configuration of a shape measurement device provided in the measurement apparatus according to an embodiment. FIG. 6 is a block diagram showing the system configuration of an information processing apparatus according to an embodiment. FIG. 7 is a perspective view showing the structure of an example of a jig when not holding a workpiece. FIG. 8 is a perspective view showing the structure of an example of a jig when actually holding a workpiece. FIG. 9 is a perspective view showing the structure of an example of a jig when actually holding a workpiece. FIG. 10 is a perspective view showing the structure of another example of a jig when actually holding a workpiece. FIG. 11 is a perspective view showing the structure of another example of a jig when not holding a workpiece. FIG. 12 is a perspective view showing the structure of another example of a jig when actually holding a workpiece. FIG. 13 is a perspective view showing the structure of another example of a jig when actually holding a workpiece. FIG. 14 is a conceptual diagram showing an example of a method of arranging a workpiece on a jig. FIGS. 15( a) to 15(e) are cross-sectional views showing a state in which a certain area on a workpiece is irradiated with modeling light and a modeling material is supplied. FIGS. 16(a) to 16(c) are cross-sectional views showing a process of modeling a three-dimensional structure. FIGS. 17(a) to 17(b) are cross-sectional views showing a reference model and an object model. FIGS. 18(a) to 18(b) are cross-sectional views showing a reference model, an object model, and a differential model generated based on the reference model shown in FIG. 18(a) and the object model shown in FIG. 18(b). FIGS. 19 to 20(e) are cross-sectional views showing an example of a usage mode of the machining system according to the embodiment. FIGS. 20(a) to 20(e) are cross-sectional views showing an example of a transition of information registered in the information processing device according to the embodiment. FIGS. 21 to 22 are cross-sectional views showing an example of information related to a jig registered in the information processing device according to the embodiment. FIGS. 22 and 23 are cross-sectional views showing an example of a schedule. Fig. 23 is a flowchart showing an example of the batch information acquisition operation Fig. 24 is a diagram showing an example of a UI image.25 is a diagram showing another example of a UI image. FIG. 26 is a diagram showing another example of a UI image. FIG. 27 is a diagram showing another example of a UI image. FIG. 28 is a diagram showing another example of a UI image. FIG. 29 is a diagram showing another example of a UI image. FIG. 30 is a diagram showing another example of a UI image. FIG. 31 is a diagram showing another example of a UI image. FIG. 32 is a diagram showing another example of a UI image. FIG. 33 is a diagram showing an example of a flowchart pattern. FIG. 34 is a diagram showing an example of blocks included in a flowchart related to a sequence. FIG. 35 is a diagram showing another example of a UI image. FIG. 36 is a diagram showing another example of a UI image. FIG. 37 is a diagram showing another example of a UI image. FIG. 38 is a diagram showing another example of a UI image. FIG. 39 is a diagram showing another example of a UI image. FIG. 40 is a flowchart showing a method for setting repair information. FIG. 41 is a flowchart showing a method for setting a schedule. FIG. 42 is a flowchart showing a method for generating action instruction information. FIG. 43 is a flowchart showing a method for generating parallel display data for tasks related to one batch. Fig. 44 is a flowchart showing a method for generating parallel display data for tasks relating to a plurality of batches Fig. 45 is a block diagram showing a system configuration of a processing device according to a modified example of the embodiment.

[0010] Hereinafter, an embodiment of the information processing method and the blade repair method will be described with reference to the drawings. Hereinafter, the embodiment of the information processing method and the blade repair method will be described using a machining system SYS capable of machining a workpiece W.

[0011] In the following description, a turbine blade constituting a turbine will be given as a specific example of at least one of the workpiece W and the shaped object. Examples of turbines include at least one of a power generation turbine and an aircraft engine turbine. At least one of the workpiece W and the shaped object may be at least one of (i) a propeller-shaped part, (ii) a body part for a vehicle such as an automobile, motorcycle, electric vehicle, or railcar, (iii) an engine part for an automobile engine, motorcycle engine, or aerospace engine, and (iv) a battery part for an electric vehicle.

[0012] (1) Configuration of Machining System SYS (1-1) Overall Configuration of Machining System SYS First, the overall configuration of the machining system SYS will be described with reference to Fig. 1. Fig. 1 is a block diagram showing the overall configuration of the machining system SYS.

[0013] As shown in FIG. 1 , the processing system SYS includes a plurality of processing apparatuses 1, a plurality of measuring apparatuses 2, a conveying apparatus 3, and an information processing apparatus 4. In the example shown in FIG. 1 , the processing system SYS includes four processing apparatuses 1#1, 1#2, 1#3, and 1#4. However, the processing system SYS may include three or fewer processing apparatuses, or may include five or more processing apparatuses. In the example shown in FIG. 1 , the processing system SYS includes two measuring apparatuses 2#1 and 2#2. However, the processing system SYS may include a single measuring apparatus 2, or may include three or more measuring apparatuses 2. The number of processing apparatuses 1 included in the processing system SYS may be greater than the number of measuring apparatuses 2. Alternatively, the number of measuring apparatuses 2 included in the processing system SYS may be greater than the number of processing apparatuses 1.

[0014] For ease of explanation, in the following, when a description is common to a plurality of processing devices (e.g., processing devices 1#1, 1#2, 1#3, and 1#4), the plurality of processing devices will not be distinguished from one another and will simply be referred to as "processing device 1." Similarly, when a description is common to a plurality of measuring devices (e.g., measuring devices 2#1 and 2#2), the plurality of measuring devices will not be distinguished from one another and will simply be referred to as "measuring device 2."

[0015] In the example shown in Fig. 1, the processing system SYS includes a single transport device 3. However, the processing system SYS may include multiple transport devices 3. For example, the transport device 3 may be an automatic guided vehicle (AGV), a robot, a belt conveyor, or the like. The transport device 3 may include an arm, a carrier, a belt, a chain, or the like as a transport tool for transporting the workpiece W. Note that the processing system SYS does not necessarily have to include the transport device 3.

[0016] The information processing device 4 may control the operation of the entire processing system SYS. For example, the information processing device 4 may control the operation of each of the multiple processing devices 1. For example, the information processing device 4 may control the operation of each of the multiple measuring devices 2. For example, the information processing device 4 may control the operation of the transport device 3. The information processing device 4 may be able to communicate with at least one of the multiple processing devices 1, the multiple measuring devices 2, and the transport system 3.

[0017] For example, the information processing device 4 may be connected to at least one of the multiple processing devices 1, the multiple measuring devices 2, and the conveying system 3 via a wired and / or wireless network (or a data bus and / or communication line).

[0018] The wired network may be a network using a serial bus interface, such as at least one of IEEE1394, RS-232x, RS-422, RS-423, RS-485, and USB. The wired network may be a network using a parallel bus interface. The wired network may be a network using an Ethernet (registered trademark) interface, such as at least one of 10BASE-T, 100BASE-TX, and 1000BASE-T.

[0019] A network using radio waves may be used as the wireless network. An example of a network using radio waves is a network conforming to IEEE 802.1x (for example, at least one of a wireless LAN and Bluetooth (registered trademark)). A network using infrared rays may be used as the wireless network. A network using optical communication may be used as the wireless network.

[0020] The information processing device 4 and at least one of the multiple processing devices 1, the multiple measuring devices 2, and the transport system 3 may be configured to be able to send and receive various information via a network. The information processing device 4 may be able to send information such as commands and control parameters to at least one of the multiple processing devices 1, the multiple measuring devices 2, and the transport system 3 via the network. At least one of the multiple processing devices 1, the multiple measuring devices 2, and the transport system 3 may be equipped with a receiving device that receives information such as commands and control parameters from the information processing device 4 via the network. At least one of the multiple processing devices 1, the multiple measuring devices 2, and the transport system 3 may be equipped with a transmitting device that transmits information such as commands and control parameters to the information processing device 4 via the network (i.e., an output device that outputs information to the information processing device 4).

[0021] At least a part of the information processing device 4 may be located on a network. That is, at least a part of the information processing device 4 may be configured as, for example, a cloud server. As described above, the information processing device 4 may control the operation of the entire machining system SYS. For example, when at least a part of the information processing device 4 is configured as a cloud server, the information processing device 4 may be referred to as a control server. In this case, the information processing device 4 or the information processing device 4 may be, for example, a computer such as a notebook personal computer or a desktop personal computer.

[0022] The processing device 1 is capable of processing a workpiece W. In this embodiment, an example will be described in which the processing device 1 is a processing device that can process the workpiece W by irradiating the workpiece W with processing light EL (i.e., an energy beam in the form of light). However, the processing device 1 may also process the workpiece W without using the processing light EL.

[0023] The processing apparatus 1 is capable of performing additive processing on the workpiece W. In other words, the processing apparatus 1 is capable of forming a structure on the workpiece W by performing additive processing on the workpiece W. In this case, the processing apparatus 1 may form a structure that is integrated with or separable from the workpiece W by performing additive processing on the workpiece W. The structure formed by the processing apparatus 1 may refer to any object formed by the processing apparatus 1. For example, the processing apparatus 1 may form a three-dimensional structure ST (that is, a three-dimensional structure that has a size in all three-dimensional directions, a solid object, in other words, a structure that has a size in the X-axis direction, Y-axis direction, and Z-axis direction) as an example of a structure.

[0024] The processing apparatus 1 may perform additive processing using any additive processing method (i.e., a manufacturing method) capable of manufacturing a shaped object. Examples of additive processing methods include at least one of laser metal deposition (LMD), powder bed fusion (PBF) methods such as selective laser sintering (SLS), binder jetting, material jetting, stereolithography, and laser metal fusion (LMF). The laser build-up welding method may also be referred to as directed energy deposition (DED).

[0025] The workpiece W may be an item that has a missing portion and needs to be repaired. In this case, the processing device 1 may perform repair processing to repair (in other words, restore) the item that needs to be repaired by performing additional processing to form a shaped object to fill the missing portion. In other words, the additional processing performed by the processing device 1 may include additional processing to add a three-dimensional structure ST corresponding to the shaped object to fill the missing portion to the workpiece W. An example of an item that has a missing portion and needs to be repaired is a worn turbine blade.

[0026] The workpiece W may be a base for forming a three-dimensional structure ST. In this case, the processing device 1 may manufacture the three-dimensional structure ST from scratch by performing additional processing to form the three-dimensional structure ST on the workpiece W. As an example, the processing device 1 may manufacture a turbine blade from scratch by performing additional processing to form a three-dimensional structure ST corresponding to a turbine blade on the workpiece W.

[0027] The workpiece W may be an intermediate product produced in the process of forming a three-dimensional structure ST. In this case, the processing device 1 may perform additional processing on the workpiece W, which is an intermediate product of the three-dimensional structure ST, to complete the three-dimensional structure ST, thereby producing the three-dimensional structure ST from the intermediate product. As an example, the processing device 1 may perform additional processing on the workpiece W, which is an intermediate product of a turbine blade, to complete the turbine blade, thereby producing a finished turbine blade from the intermediate product of the turbine blade.

[0028] The processing device 1 may be capable of performing removal processing on the workpiece W in addition to or instead of performing additional processing. That is, the processing device 1 may be capable of performing removal processing to remove a part of the workpiece W. Note that, in addition to or instead of performing removal processing on the workpiece W, the processing device 1 may perform removal processing on a shaped object formed on the workpiece W by the processing device 1. Furthermore, an item requiring repair may be repaired by performing removal processing. This repair by removal processing may be combined with repair by additional processing.

[0029] The measuring device 2 measures the workpiece W before the processing device 1 actually starts processing the workpiece W. In this embodiment, the measuring device 2 measures the three-dimensional shape of the workpiece W. Once the three-dimensional shape of the workpiece W is determined, the position of the workpiece W in three-dimensional space in the measurement coordinate system of the measuring device 2 (for example, the position of the surface of the workpiece W) can be determined. For this reason, measuring the three-dimensional shape of the workpiece W is essentially equivalent to measuring the position of the workpiece W.

[0030] The measuring device 2 further generates processing control information based on the measurement results of the workpiece W. The processing control information is control information used to control the processing device 1 to process the workpiece W. For example, the processing control information may include processing path information. The processing path information may indicate a target irradiation position to which the processing light EL should be irradiated in order to process the workpiece W. Specifically, the processing path information may indicate a target movement path, which is a path to a target irradiation position to which the processing light EL should be irradiated in order to process the workpiece W. This target movement path may be referred to as a processing path or a tool path. In this case, the measuring device 2 may generate a G-code indicating the processing path or tool path as the processing control information. The measuring device 2 may generate a file with an extension "gcode" or "gco" as the processing control information.

[0031] 1, the processing device 1 and the measuring device 2 are separate devices. However, the processing system SYS may include a device in which the processing device 1 and the measuring device 2 are integrated. In other words, one processing device 1 and one measuring device 2 may be integrated.

[0032] The processing system SYS may include, in addition to the information processing device 4, a first computer (e.g., a control device 17 described later) that controls the processing device 1 as part of the processing device 1. That is, the processing device 1 may include the first computer. The processing system SYS may include, in addition to the information processing device 4, a second computer (e.g., a control device 23 described later) that controls the measuring device 2 as part of the measuring device 2. That is, the measuring device 2 may include the second computer. The processing system SYS may include, in addition to the information processing device 4, a third computer that controls the transport device 3 as part of the transport device 3. That is, the transport device 3 may include the third computer. The first computer, the second computer, and the third computer may be, for example, a notebook personal computer, a desktop personal computer, etc.

[0033] (1-2) Configuration of Processing Apparatus 1 The configuration of the processing apparatus 1 will be described with reference to Fig. 2 and Fig. 3. Fig. 2 is a block diagram showing the system configuration of the processing apparatus 1. Fig. 3 is a cross-sectional view showing the configuration of the processing apparatus 1.

[0034] In the following description, the positional relationships of the various components constituting the processing apparatus 1 will be described using an XYZ Cartesian coordinate system defined by mutually orthogonal X, Y, and Z axes as the processing coordinate system. For ease of explanation, the X-axis and Y-axis directions are each assumed to be horizontal (i.e., a predetermined direction within a horizontal plane), and the Z-axis direction is assumed to be vertical (i.e., a direction perpendicular to the horizontal plane, essentially an up-down direction). Furthermore, the rotation directions around the X-axis, Y-axis, and Z-axis (in other words, tilt directions) are referred to as the θX direction, θY direction, and θZ direction, respectively. Here, the Z-axis direction may be the direction of gravity. Furthermore, the XY plane may be assumed to be horizontal.

[0035] In addition, in the following description, for convenience of explanation, a configuration of a processing device 1 that performs additional processing will be described as an example of the configuration of the processing device 1. In particular, in the following description, a configuration of a processing device 1 that performs additional processing using a laser build-up welding method will be described as an example of the configuration of the processing device 1.

[0036] The processing device 1, which performs additive processing using the laser build-up welding method, performs additive processing by processing a modeling material M using processing light EL. The modeling material M is a material that can be melted by irradiation with processing light EL of a predetermined intensity or higher. For example, at least one of a metallic material and a resinous material can be used as the modeling material M. However, materials other than metallic materials and resinous materials may also be used as the modeling material M. The modeling material M is a powdered or granular material. In other words, the modeling material M is a powdered or granular material. However, the modeling material M does not have to be a powdered or granular material. For example, at least one of a wire-shaped modeling material and a gaseous modeling material may be used as the modeling material M.

[0037] A processing apparatus 1 that performs additive processing using laser build-up welding sequentially forms multiple structural layers SL (see FIG. 16 , which will be described later) to form a three-dimensional structure ST in which multiple structural layers SL are stacked. In this case, the processing apparatus 1 first sets the surface of the workpiece W as a printing surface MS on which the object is actually printed, and prints the first structural layer SL on the printing surface MS. The processing apparatus 1 then sets the surface of the first structural layer SL as a new printing surface MS, and prints the second structural layer SL on the printing surface MS. Thereafter, the processing apparatus 1 repeats the same operations to form a three-dimensional structure ST in which multiple structural layers SL are stacked.

[0038] 2 and 3 , the processing apparatus 1 includes a material supply source 11, a processing unit 12, a stage unit 13, a light source 15, a gas supply source 16, and a control device 17. The processing unit 12 and the stage unit 13 may be housed in a chamber space 183IN inside a housing 18. Note that at least one of the processing unit 12 and the stage unit 13 does not have to be housed in the chamber space 183IN inside the housing 18.

[0039] The material supply source 11 supplies the molding material M to the processing unit 12. The material supply source 11 supplies a desired amount of the molding material M according to the required amount so that the amount of the molding material M required per unit time for performing additive processing is supplied to the processing unit 12.

[0040] The processing unit 12 processes the modeling material M supplied from the material supply source 11 to form a model. To form the model, the processing unit 12 includes a processing head 121 and a head drive system 122. The processing head 121 further includes an irradiation optical system 1211 and a material nozzle 1212. In the example shown in FIGS. 2 and 3 , the processing head 121 includes a single irradiation optical system 1211, but the processing head 121 may include multiple irradiation optical systems 1211. In the example shown in FIGS. 2 and 3 , the processing head 121 includes a single material nozzle 1212, but the processing head 121 may include multiple material nozzles 1212.

[0041] The irradiation optical system 1211 is an optical system (e.g., a focusing optical system) for emitting the processing light EL. Specifically, the irradiation optical system 1211 is optically connected to the light source 15 that emits the processing light EL via an optical transmission member 151 such as an optical fiber or a light pipe. The irradiation optical system 1211 emits the processing light EL propagated from the light source 15 via the optical transmission member 151. The irradiation optical system 1211 irradiates the processing light EL downward (i.e., toward the -Z side) from the irradiation optical system 1211. A stage 131 is disposed below the irradiation optical system 1211. When a workpiece W is placed on the stage 131, the irradiation optical system 1211 irradiates the emitted processing light EL onto the workpiece W. In this case, the irradiation optical system 1211 irradiates the processing light EL from above the workpiece W toward the workpiece W. Specifically, the irradiation optical system 1211 can irradiate the processing light EL onto a target irradiation area EA that is set on or near the workpiece W as an area to be irradiated (typically, focused) with the processing light EL. Furthermore, under the control of the control device 17, the state of the irradiation optical system 1211 can be switched between a state in which the processing light EL is irradiated onto the target irradiation area EA and a state in which the processing light EL is not irradiated onto the target irradiation area EA.

[0042] The material nozzle 1212 supplies (e.g., injects, jets, spouts, or sprays) the modeling material M. The material nozzle 1212 is physically connected to the material supply source 11, which is a supply source of the modeling material M, via the supply pipe 111 and the mixer 112. The material nozzle 1212 supplies the modeling material M supplied from the material supply source 11 via the supply pipe 111 and the mixer 112. The material nozzle 1212 may pressure-feed the modeling material M supplied from the material supply source 11 via the supply pipe 111. That is, the modeling material M from the material supply source 11 and a conveying gas (i.e., a pressure-feed gas, for example, an inert gas such as nitrogen or argon) may be mixed in the mixer 112 and then pressure-feed to the material nozzle 1212 via the supply pipe 111. As a result, the material nozzle 1212 supplies the modeling material M together with the conveying gas. For example, a purge gas supplied from the gas supply source 16 is used as the conveying gas. However, the transport gas may be a gas supplied from a gas supply source different from the gas supply source 16. The material nozzle 1212 supplies the modeling material M downward (i.e., toward the -Z side) from the material nozzle 1212. A stage 131 is disposed below the material nozzle 1212. When a workpiece W is mounted on the stage 131, the material nozzle 1212 supplies the modeling material M toward the workpiece W or the vicinity of the workpiece W.

[0043] In this embodiment, the material nozzle 1212 supplies the modeling material M to the irradiation position of the processing light EL (i.e., the target irradiation area EA onto which the processing light EL from the irradiation optical system 1211 is irradiated). For this reason, the material nozzle 1212 and the irradiation optical system 1211 are aligned so that a target supply area MA, which is set on or near the workpiece W as the area onto which the material nozzle 1212 supplies the modeling material M, coincides with (or at least partially overlaps with) the target irradiation area EA. In this case, the modeling material M supplied from the material nozzle 1212 is irradiated with the processing light EL emitted by the irradiation optical system 1211. As a result, the modeling material M melts. That is, a molten pool MP containing the molten modeling material M is formed on the workpiece W.

[0044] The material nozzle 1212 may supply the forming material M to a molten pool MP formed by the processing light EL emitted from the irradiation optical system 1211. For example, the processing device 1 may melt the forming material M from the material nozzle 1212 using the irradiation optical system 1211 before the forming material M reaches the workpiece W, and then adhere the molten forming material M to the workpiece W.

[0045] The head drive system 122 moves the machining head 121 under the control of the control device 17. That is, the head drive system 122 moves the irradiation optical system 1211 and the material nozzle 1212 under the control of the control device 17. The head drive system 122 moves the machining head 121, for example, along at least one of the X-axis, Y-axis, Z-axis, θX direction, θY direction, and θZ direction. When the head drive system 122 moves the machining head 121, the relative positions of the machining head 121, the stage 131, and the workpiece W placed on the stage 131 change. As a result, the target irradiation area EA and the target supply area MA (and further, the molten pool MP) move relative to the workpiece W.

[0046] The stage unit 13 includes a stage 131 and a stage drive system 132 .

[0047] A workpiece W held by a jig 5 is placed on the stage 131. The stage 131 is capable of supporting the jig 5 placed on the stage 131. The stage 131 may be capable of holding the jig 5 placed on the stage 131. In this case, the stage 131 may be equipped with at least one of a mechanical chuck, an electrostatic chuck, a vacuum chuck, etc. to hold the jig 5. Alternatively, the stage 131 may not be capable of holding the jig 5 placed on the stage 131. In this case, the jig 5 may be placed on the stage 131 in a clampless manner. The workpiece W does not have to be held by a holder such as the jig 5. In this case, the workpiece W may be placed, supported, or held on the stage 131. At least one of the jig 5 and the workpiece W does not have to be placed on the stage 131, and may be placed on the floor, for example.

[0048] The stage drive system 132 moves the stage 131 under the control of the control device 17. The stage drive system 132 moves the stage 131, for example, along at least one of the X-axis, Y-axis, Z-axis, θX direction, θY direction, and θZ direction. When the stage drive system 132 moves the stage 131, the relative positions of the stage 131 and the workpiece W placed on the stage 131, and the machining head 121 change. As a result, the target irradiation area EA and the target supply area MA (and further, the molten pool MP) move relative to the workpiece W.

[0049] The light source 15 emits, for example, at least one of infrared light, visible light, and ultraviolet light as the processing light EL. However, other types of light may be used as the processing light EL. The processing light EL may include multiple pulsed lights (i.e., multiple pulse beams). The processing light EL may include continuous light (CW: Continuous Wave). The processing light EL may be laser light. In this case, the light source 15 may include a laser light source (for example, a semiconductor laser such as a laser diode (LD: Laser Diode)). The laser light source may be a fiber laser, a CO 2 The light source 15 may include at least one of a laser, a YAG laser, an excimer laser, etc. However, the processing light EL does not have to be laser light. The light source 15 may include any light source (for example, at least one of an LED (Light Emitting Diode), a discharge lamp, etc.).

[0050] The gas supply source 16 is a supply source of purge gas for purging the chamber space 183IN inside the housing 18. The purge gas includes an inert gas. Examples of the inert gas include nitrogen gas and argon gas. The gas supply source 16 is connected to the chamber space 183IN via a supply port 182 formed in a partition member 181 of the housing 18 and a supply pipe 161 connecting the gas supply source 16 and the supply port 182. The gas supply source 16 supplies purge gas to the chamber space 183IN via the supply pipe 161 and the supply port 182. As a result, the chamber space 183IN becomes a space purged with the purge gas. The purge gas supplied to the chamber space 183IN may be exhausted from an exhaust port (not shown) formed in the partition member 181. The gas supply source 16 may be a cylinder containing an inert gas. When the inert gas is nitrogen gas, the gas supply source 16 may be a nitrogen gas generator that generates nitrogen gas using air as a raw material.

[0051] When the material nozzle 1212 supplies the modeling material M together with a purge gas, the gas supply source 16 may supply the purge gas to the mixer 112 to which the modeling material M is supplied from the material supply source 11. Specifically, the gas supply source 16 may be connected to the mixer 112 via a supply pipe 162 connecting the gas supply source 16 and the mixer 112. As a result, the gas supply source 16 supplies the purge gas to the mixer 112 via the supply pipe 162. In this case, the modeling material M from the material supply source 11 may be supplied (specifically, pressure-fed) through the supply pipe 111 toward the material nozzle 1212 by the purge gas supplied from the gas supply source 16 via the supply pipe 162. In other words, the gas supply source 16 may be connected to the material nozzle 1212 via the supply pipe 162, the mixer 112, and the supply pipe 111. In this case, the material nozzle 1212 supplies the modeling material M together with a purge gas for pumping the modeling material M.

[0052] The control device 17 controls the operation of the processing device 1. For example, the control device 17 may control the processing unit 12 (for example, at least one of the processing head 121 and the head drive system 122) provided in the processing device 1 so as to process the workpiece W. For example, the control device 17 may control the stage unit 13 (for example, the stage drive system 132) provided in the processing device 1 so as to process the workpiece W.

[0053] The control device 17 may include, for example, an arithmetic device 171 and a storage device 172. The arithmetic device 171 may include, for example, at least one of a CPU (Central Processing Unit) and a GPU (Graphics Processing Unit). Therefore, it can be said that the control device 17 includes at least one processor. The storage device 172 may include, for example, a memory. Therefore, it can be said that the control device 17 includes at least one memory. The control device 17 functions as a device that controls the operation of the machining device 1 by the arithmetic device 171 executing a computer program. This computer program is a computer program for causing the arithmetic device 171 to perform (i.e., execute) the operations to be performed by the control device 17, which will be described later. In other words, this computer program is a computer program for causing the control device 17 to function so as to cause the machining device 1 to perform the operations to be performed by the control device 17, which will be described later. The computer program executed by the arithmetic device 171 may be recorded in a storage device 172 (i.e., a recording medium) provided in the control device 17, or may be recorded in any storage medium (for example, a hard disk or semiconductor memory) built into the control device 17 or externally attachable to the control device 17. Alternatively, the arithmetic device 171 may download the computer program to be executed from a device external to the control device 17 via a network interface.

[0054] The control device 17 may control the emission mode of the processing light EL by the irradiation optical system 1211. The emission mode may include, for example, at least one of the intensity of the processing light EL and the emission timing of the processing light EL. When the processing light EL includes multiple pulsed lights, the emission mode may include, for example, at least one of the emission duration of the pulsed light, the emission cycle of the pulsed light, and the ratio between the emission duration of the pulsed light and the emission cycle of the pulsed light (so-called duty ratio). Furthermore, the control device 17 may control the movement mode of the processing head 121 by the head drive system 122. The control device 17 may control the movement mode of the stage 131 by the stage drive system 132. The movement mode may include, for example, at least one of the movement amount, movement speed, movement direction, and movement timing (movement time). Furthermore, the control device 17 may control the supply mode of the modeling material M by the material nozzle 1212. The supply mode may include, for example, at least one of the supply amount (particularly, the supply amount per unit time) and the supply timing (supply time).

[0055] A computational model that can be constructed by machine learning may be implemented in the control device 17 by the calculation device 171 executing a computer program. An example of a computational model that can be constructed by machine learning is a computational model including a neural network (so-called artificial intelligence (AI)). In this case, learning of the computational model may include learning of parameters of the neural network (e.g., at least one of a weight and a bias). The control device 17 may control the operation of the processing device 1 using the computational model. In other words, the operation of controlling the operation of the processing device 1 may include the operation of controlling the operation of the processing device 1 using the computational model.

[0056] Note that a computational model already constructed by offline machine learning using teacher data may be implemented in the control device 17. Furthermore, the computational model implemented in the control device 17 may be updated by online machine learning on the control device 17. Alternatively, the control device 17 may control the operation of the processing device 1 by using a computational model implemented in a device external to the control device 17 (i.e., a device provided outside the processing device 1) in addition to or instead of the computational model implemented in the control device 17.

[0057] The recording medium for recording the computer program executed by the control device 17 may be at least one of the following: a CD-ROM, CD-R, CD-RW, a flexible disk, an MO, a DVD-ROM, a DVD-RAM, a DVD-R, a DVD+R, a DVD-RW, a DVD+RW, and an optical disk such as Blu-ray (registered trademark), a magnetic medium such as a magnetic tape, a magneto-optical disk, a semiconductor memory such as a USB memory, and any other medium capable of storing a program. The recording medium may also include a device capable of recording a computer program (for example, a general-purpose device or a dedicated device in which a computer program is implemented in an executable state in at least one form such as software or firmware). Furthermore, each process or function included in the computer program may be realized by a logical processing block realized within the control device 17 (i.e., the computer) when the control device 17 executes the computer program, or may be realized by hardware such as a predetermined gate array (FPGA (Field Programmable Gate Array), ASIC (Application Specific Integrated Circuit)) provided in the control device 17, or may be realized in a form that combines logical processing blocks and partial hardware modules that realize some elements of the hardware.

[0058] The processing device 1 may include a scanner for reading a read code or a non-contact communication tag that indicates identification information for identifying the jig 5 and is attached to a part of the jig 5. The processing device 1 may include a moisture concentration measurement sensor that is arranged in a circulation path of the purge gas outside the space of the processing device 1. The processing device 1 may measure the moisture concentration of the gas that passes through a fume removal filter, for example, using the moisture concentration measurement sensor.

[0059] The processing device 1 may include an integrated circuit configured to execute instructions. The integrated circuit may include at least one of a calculation device (e.g., calculation device 171), a communication device, an input device, and an output device. In this case, the measuring device 1 may not include a memory device (e.g., memory device 172). That is, the device including the integrated circuit and the device including the memory device may be different. In this case, the device including the integrated circuit and the device including the memory device may communicate with each other (e.g., communicate).

[0060] (1-3) Configuration of the Measuring Apparatus 2 The configuration of the measuring apparatus 2 will be described with reference to FIGS. 4 and 5. FIG. 4 is a block diagram showing the system configuration of the measuring apparatus 2. FIG. 5 is a diagram showing the schematic configuration of the shape measuring apparatus 21 included in the measuring apparatus 2. As shown in FIG. 4, the measuring apparatus 2 includes the shape measuring apparatus 21, a control information generating apparatus 22, and a control apparatus 23. The control apparatus 23 may include an arithmetic unit 231 and a storage device 232. The arithmetic unit 231 may include, for example, at least one of a CPU and a GPU. Therefore, it can be said that the control apparatus 23 includes at least one processor. The storage device 212 may include, for example, a memory. Therefore, it can be said that the control apparatus 23 includes at least one memory. The shape measuring apparatus 21 and the control information generating device 22 may operate under the control of the control apparatus 23. The configuration of the control apparatus 23 shown in FIG. 4 may be different from the configuration of the control apparatus 17 of the machining apparatus 1 shown in FIG. 2. It can be said that the configuration of the control apparatus 23 is the same as the configuration of the control apparatus 17.

[0061] As shown in FIG. 5 , the shape measuring device 21 is capable of measuring the three-dimensional shape of a measurement object (e.g., workpiece W). In this embodiment, as described above, the measuring device 2 measures the workpiece W before the processing device 1 actually starts processing the workpiece W. Therefore, the measurement object of the shape measuring device 21 may include the workpiece W. Note that the measuring device 2 may measure a holder (e.g., jig 5) that actually holds the workpiece W before the processing device 1 actually starts processing the workpiece W. Therefore, the measurement object of the shape measuring device 21 may include the holder that actually holds the workpiece W. In other words, the measurement object of the shape measuring device 21 may include the holder that actually holds the workpiece W and the workpiece W held by the holder.

[0062] The shape measurement device 21 may have any configuration as long as it is capable of measuring the three-dimensional shape of the measurement object. For example, the shape measurement device 21 may measure the three-dimensional shape of the measurement object using a pattern projection method or a light section method, in which a measurement light is irradiated onto the surface of the measurement object to project a light pattern onto the surface, and the shape of the projected pattern is measured. In this case, the shape measurement head 211 provided in the shape measurement device 21 may include a stereo camera. For example, the shape measurement device 21 may measure the three-dimensional shape of the measurement object using a time-of-flight method, in which a measurement light is projected onto the surface of the measurement object, the time it takes for the projected measurement light to return from the measurement object to the shape measurement device 21 is calculated, and the distance to the measurement object based on this time is measured at multiple positions on the measurement object. For example, the shape measurement device 21 may measure the three-dimensional shape of the measurement object using at least one of a moire topography method (specifically, a grating illumination method or a grating projection method), a holographic interferometry method, an autocollimation method, a stereo method, an astigmatism method, a critical angle method, and a knife-edge method. In this way, the shape measurement device 21 may perform optical shape measurement of the measurement object, or may perform non-contact measurement of the measurement object.

[0063] It should be noted that the shape measurement device 21 is not limited to a device that measures the three-dimensional shape of a measurement object stored in the housing 210. For example, the shape measurement device 21 may be attached to a robot arm so as to be movable around the measurement object.

[0064] An example of the configuration of the shape measurement device 21 is shown in Figures 4 and 5. As shown in Figures 4 and 5, the shape measurement device 21 includes a shape measurement head 211, a head drive system 212, a stage 213, and a stage drive system 214. However, the shape measurement device 21 does not necessarily have to include at least one of the head drive system 212 and the stage drive system 214.

[0065] The shape measuring head 211 is a measuring device capable of measuring the three-dimensional shape of a measurement object. For example, the shape measuring head 211 may measure the three-dimensional shape of the measurement object using at least one of a pattern projection method, a light section method, a time-of-flight method, a moire topography method (specifically, a grating illumination method or a grating projection method), a holographic interferometry method, an autocollimation method, a stereo method, an astigmatism method, a critical angle method, and a knife-edge method.

[0066] The head drive system 212 moves the shape measuring head 211. The head drive system 212 may move the shape measuring head 211, for example, along at least one of the X-axis, Y-axis, Z-axis, θX direction, θY direction, and θZ direction in the measurement coordinate system of the measurement device 2. In the example shown in FIG. 5 , the shape measuring head 211 is attached to a first support mechanism 2111 that supports the shape measuring head 211 so that the depression angle can be changed, and to a second support mechanism 2112 that supports the first support mechanism 2111 and the shape measuring head 211 so that the first support mechanism 2111 and the shape measuring head 211 can move up and down. When the head drive system 212 moves the shape measuring head 211, the positional relationship between the measurement range FOV of the shape measuring head 211 and the measurement object changes. As a result, the shape measuring head 211 is more likely to be able to measure the three-dimensional shape of a portion of the measurement object whose three-dimensional shape could not be measured before the shape measuring head 211 moved. In other words, the blind spot of the shape measuring head 211 is narrowed or eliminated. In particular, in the example shown in FIG. 5, the shape measuring head 211 is movable in the Z-axis direction (up and down direction), so that a long workpiece W can be measured without unnecessarily widening the measurement range FOV (angle of view in the case of a camera) of the shape measuring head 211, thereby preventing a decrease in measurement accuracy due to an expansion of the measurement range FOV (angle of view).

[0067] A measurement target is placed on the stage 213. The stage 213 is capable of supporting the jig 5 placed on the stage 231. The stage 213 may be capable of holding the jig 5 placed on the stage 213. In this case, the stage 213 may be equipped with at least one of a mechanical chuck, an electrostatic chuck, a vacuum chuck, or the like in order to hold the jig 5. Alternatively, the stage 213 may not be capable of holding the jig 5 placed on the stage 213. In this case, the jig 5 may be placed on the stage 213 in a clampless manner.

[0068] The workpiece W does not have to be held by a holder such as the jig 5. In this case, the workpiece W may be placed, supported, or held on the stage 231. At least one of the jig 5 and the workpiece W does not have to be placed on the stage 231, and may be placed on the floor, for example.

[0069] The stage drive system 214 moves the stage 213. The stage drive system 214 moves the stage 213, for example, along at least one of the X-axis, Y-axis, Z-axis, θX direction, θY direction, and θZ direction in the measurement coordinate system of the measurement device 2. In the example shown in FIG. 5 , the stage 213 moves and rotates along the θZ direction, in other words, along a rotation direction around the Z axis. When the stage drive system 214 moves the stage 213, the positional relationship between the measurement range of the shape measuring head 211 and the measurement target placed on the stage 213 changes. As a result, the blind spot of the shape measuring head 211 is narrowed or eliminated, similar to when the shape measuring head 211 moves.

[0070] The control information generating device 22 generates the processing control information. The operation of generating the processing control information will be described in detail later. The measuring device 2 may be equipped with a scanner for reading a read code or a non-contact communication tag that indicates identification information for identifying the jig 5 and is attached to a part of the jig 5.

[0071] The measurement device 2 may include an integrated circuit configured to execute instructions. The integrated circuit may include at least one of an arithmetic unit (e.g., processor 231), a communication unit, an input unit, and an output unit. In this case, the measurement device 2 may not include a storage unit (e.g., memory 232). That is, the device including the integrated circuit and the device including the storage unit may be different. In this case, the device including the integrated circuit and the device including the storage unit may communicate with each other (e.g., telecommunications).

[0072] (1-4) Configuration of Information Processing Device 4 The configuration of the information processing device 4 will be described with reference to FIG. 6. FIG. 6 is a block diagram showing the system configuration of the information processing device 4. Note that the information processing device 4 may be a device different from the processing device 1 and the measuring device 2, as shown in FIG. 1. However, the information processing device 4 may be configured as a part of at least one of the processing device 1 and the measuring device 2 (e.g., a part of at least one of the control device 17 and the control device 23). Alternatively, the information processing device 4 may be built into at least one of the processing device 1 and the measuring device 2. For example, the information processing device 4 may be built into at least one of the processing device 1 and the measuring device 2 in the form of an information processing unit. Alternatively, the information processing device 4 may be realized in at least one of the processing device 1 and the measuring device 2 by, for example, executing a predetermined computer program (in other words, information processing software) by at least one of the control device 17 and the control device 23. In other words, the information processing device 4 may be a device realized by a predetermined computer program.

[0073] 6 , the information processing device 4 includes a calculation device 41, a storage device 42, a communication device 43, an input device 44, and an output device 45. The information processing device 4 does not necessarily have to include at least one of the input device 44 and the output device 45. Communication may be established between the calculation device 41, the storage device 42, the communication device 43, the input device 44, and the output device 45. For example, communication may be established between the calculation device 41, the storage device 42, the communication device 43, the input device 44, and the output device 45 via wireless or wired communication. For example, the calculation device 41, the storage device 42, the communication device 43, the input device 44, and the output device 45 may be connected via a data bus 46.

[0074] The arithmetic device 41 includes, for example, at least one of a CPU and a GPU. That is, the arithmetic device 41 includes at least one processor 411. The storage device 42 is capable of storing desired data. The storage device 42 may include at least one of a RAM (Random Access Memory), a ROM (Read Only Memory), a hard disk device, a magneto-optical disk device, an SSD (Solid State Drive), and a disk array device. That is, the storage device 42 may include a non-transitory recording medium. The information processing device 4 is not limited to a single storage device 42, and may include multiple storage devices 42.

[0075] The storage device 42 stores a computer program 421 including computer program instructions that control the operation of the information processing device 4. The computer program instructions provide logic and routines that enable the information processing device 4 to perform operations to be performed (for example, the method shown in at least one of Figures 39 and 40 described below).

[0076] The storage device 42 may include at least one of a RAM and a ROM, and may therefore be referred to as a memory. Therefore, it can be said that the information processing device 4 includes an arithmetic unit 41 including at least one processor, and the storage device 42 as a memory that stores computer program code.

[0077] The computer program 421 may arrive at the information processing device 4 via any suitable distribution mechanism. The distribution mechanism may be, for example, at least one of a computer-readable recording medium, a computer program product, a memory device, and a recording medium. The recording medium may be at least one of a CD-ROM and a DVD.

[0078] It should be understood that references to "computer-readable recording media," "computer program products," "tangibly embodied computer programs," etc., or to "controllers," "computers," "processors," etc., encompass computers having different configurations, e.g., single / multi-processor configurations, sequential (von Neumann) / parallel configurations, as well as specialized circuitry, e.g., field programmable gate arrays (FPGAs), application specific circuits (ASICs), signal processing devices, and other devices.

[0079] The arithmetic device 41 may read a computer program. For example, the arithmetic device 41 may read a computer program 421 stored in the storage device 42. For example, the arithmetic device 41 may read a computer program stored in a computer-readable, non-transitory storage medium using a storage medium reading device (not shown). The arithmetic device 41 may acquire (i.e., download or read) the computer program from a device (not shown) located outside the information processing device 4 via the communication device 43. That is, the arithmetic device 41 may acquire, via the communication device 43, a computer program stored in a storage device of a device (not shown) located outside the information processing device 4.

[0080] The arithmetic device 41 may execute the loaded computer program. As a result, logical functional blocks for executing operations to be performed by the information processing device 4 may be realized within the arithmetic device 41. In other words, the arithmetic device 41 can function as a controller for realizing logical functional blocks for executing operations to be performed by the information processing device 4. In this case, any device (typically, a computer) that executes the computer program can function as the information processing device 4.

[0081] Note that a computational model that can be constructed by machine learning may be implemented in the computational device 41 by the computational device 41 executing a computer program. An example of a computational model that can be constructed by machine learning is a computational model including a neural network (so-called artificial intelligence (AI)). In this case, learning of the computational model may include learning of parameters of the neural network (for example, at least one of weights and biases). Note that the information processing device 4 may set a schedule, which will be described later, using the computational model.

[0082] Note that a computational model already constructed by offline machine learning using teacher data may be implemented in the computational device 41. Furthermore, the computational model implemented in the computational device 41 may be updated by online machine learning on the computational device 41. Alternatively, the computational device 41 may set a schedule (described later) using a computational model implemented in a device external to the computational device 41 (i.e., a device provided outside the information processing device 4) in addition to or instead of the computational model implemented in the computational device 41.

[0083] For example, the storage device 42 may temporarily store a computer program executed by the arithmetic device 41. The storage device 42 may temporarily store data that is temporarily used by the arithmetic device 41 when the arithmetic device 41 is executing a computer program. The storage device 42 may store data that the information processing device 4 stores for a long period of time.

[0084] The communication device 43 is capable of communicating with at least one of the plurality of processing devices 1, the plurality of measuring devices 2, and the transport device 3 via a communication network (not shown).

[0085] The input device 44 is a device that accepts information input to the information processing device 4 from outside the information processing device 4. For example, the input device 44 may include an operation device that can be operated by a user (for example, at least one of a keyboard, a mouse, and a touch panel). For example, the input device 44 may include a reading device that can read information recorded as data on a recording medium that can be externally attached to the information processing device 4. For example, the input device 44 may accept information input from a computer external to the information processing device 4. Note that the information processing device 4 may include, as the input device 44, a scanner for reading a read code or a non-contact communication tag that indicates identification information for identifying the jig 5 and is attached to a part of the jig 5.

[0086] The output device 45 is a device that outputs information to the outside of the information processing device 4. For example, the output device 45 may output information as an image. That is, the output device 45 may include a display device 451 (a so-called display) that can display an image showing the information to be output. For example, the output device 45 may output information as sound. That is, the output device 45 may include an audio device (a so-called speaker) that can output sound. For example, the output device 45 may output information on paper. That is, the output device 45 may include a printing device (a so-called printer) that can print desired information on paper.

[0087] As shown in FIG. 1 , the information processing device 4 constitutes a part of the processing system SYS. However, the information processing device 4 does not have to be a part of the processing system SYS. In other words, the information processing device 4 may be a device external to the processing system SYS. For example, the information processing device 4 may be an information terminal device or a display system different from the processing system SYS. An example of a display system is at least one of a tablet terminal and a smartphone. For example, when the information processing device 4 constitutes a part of the processing system SYS, the processor 411 included in the information processing device 4 can be said to be a processor of the processing system SYS. When the information processing device 4 is a device external to the processing system SYS, the processor 411 included in the information processing device 4 can be said to be a processor of an information terminal device or a display system different from the processing system SYS.

[0088] The information processing device 4 may include an integrated circuit configured to execute instructions. The integrated circuit may include at least one of the above-mentioned arithmetic device 41, communication device 43, input device 44, and output device 45. In this case, the information processing device 4 may not include the storage device 42. In other words, the device including the integrated circuit and the device including the storage device 42 may be different. In this case, the device including the integrated circuit and the device including the storage device 42 may communicate with each other (for example, communicate).

[0089] (1-5) Configuration of the Jig 5 With reference to FIGS. 7 to 9 , an example structure of a jig 5 for holding a workpiece W will be described. FIG. 7 is a perspective view showing the structure of the jig 5 when it is not holding a workpiece W, and FIGS. 8 and 9 are perspective views showing the structure of the jig 5 when it is actually holding a workpiece W. FIGS. 7 to 9 illustrate the jig 5 placed on the stage 131 of the processing device 1. Note that the structure of the jig 5 shown in FIGS. 7 to 9 is only an example, and the structure of the jig 5 is not limited to the structure shown in FIGS. 7 to 9 . This is because the jig is created depending on the workpiece W to be processed and the processing location of the workpiece W. As a result, various types of jigs exist at the site where the workpiece W is processed. In order to efficiently process the workpiece W, the jig is often configured to be able to hold multiple workpieces W. Note that the jig 5 holds one or more workpieces W, and therefore may also be referred to as a holder.

[0090] 7 to 9 , the jig 5 includes a bottom member 51, a plurality of support members 52, and a plurality of connecting members 53. In the example shown in FIGS. 7 to 9 , the jig 5 includes four support members 52 (specifically, support members 52#1, 52#2, 52#3, and 52#4) and four connecting members 53. However, the jig 5 may include a single support member 52. The jig 5 may include a single connecting member 53. The jig 5 may not include the connecting member 53. The jig 5 may be kinematically supported. The jig 5 may be kinematically supported at three points. The jig 5 may be kinematically supported at two or fewer points or at four or more points.

[0091] The bottom member 51 is a plate-shaped member. The upper surface of the bottom member 51 (the surface facing the +Z side in the examples shown in FIGS. 7 to 9 ) may be a surface along the XY plane. The lower surface of the bottom member 51 (the surface facing the −Z side in the examples shown in FIGS. 7 to 9 ) may be a surface along the XY plane. The shape of the bottom member 51 is not limited to a rectangle. The bottom member 51 may be placed on the stage 131 of the processing apparatus 1. Specifically, the bottom member 51 may be placed on the stage 131 with the lower surface of the bottom member 51 facing the stage 131. Therefore, the jig 5 may be placed on the stage 131 via the bottom member 51. The stage 131 may support the jig 5 via the bottom member 51.

[0092] The bottom member 51 may be placed (i.e., arranged) at a predetermined position on the stage 131. In other words, the jig 5 may be placed (i.e., arranged) at a predetermined position on the stage 131 via the bottom member 51. The position determined as the position where the jig 5 is placed may be referred to as a "reference placement position."

[0093] In order to place the bottom member 51 at the reference placement position, alignment marks may be formed on at least one of the bottom member 51 and the stage 131. In the example shown in FIGS. 7 to 9 , alignment marks are formed on both the bottom member 51 and the stage 131. For example, as shown in FIGS. 7 to 9 , a plurality of pins 1311 may be formed on the stage 131 as alignment marks. The pins 1311 are members that protrude from the stage 131 along the Z-axis direction. Note that information regarding the positions of the pins 1311 on the stage 131 may be information known to the processing system SYS. Furthermore, as shown in FIGS. 7 to 9 , a plurality of through holes 511 may be formed in the bottom member 51 as alignment marks. The through holes 511 penetrate the bottom member 51 along the Z-axis direction. Note that two through holes 511 are formed in the bottom member 51. However, three or more through holes, or only one through hole, may be formed in the bottom member 51. 7 to 9 , the bottom member 51 may be placed on the stage 131 so that the pins 1311 are inserted into the through holes 511. The bottom member 51 may be placed on the stage 131 with the pins 1311 inserted into the through holes 511. Therefore, the arrangement of the through holes 511 is the same as the arrangement of the pins 1311. Furthermore, the number of through holes 511 may be the same as (or may be greater than) the number of pins 1311. As a result, the bottom member 51 is placed on the stage 131 at a position (i.e., a reference placement position) determined by the pins 1311 and the through holes 511. Therefore, in this case, information regarding the placement position of the bottom member 51 on the stage 131 (i.e., the placement position of the jig 5) is known information in the machining system SYS.

[0094] At least a portion of the upper surface of the bottom member 51 functions as a mounting surface 510 on which the workpiece W is placed. The workpiece W is placed on the mounting surface 510. The mounting surface 510 is capable of supporting the workpiece W placed on the mounting surface 510. The mounting surface 510 is capable of holding the workpiece W placed on the mounting surface 510. In this case, the mounting surface 510 may be equipped with at least one of a mechanical chuck, an electrostatic chuck, a vacuum chuck, or the like to hold the workpiece W. Alternatively, a workpiece holding member for holding the workpiece W may be arranged on the mounting surface 510. Alternatively, the mounting surface 510 may not be capable of holding the workpiece W placed on the mounting surface 510. In this case, the workpiece W may be placed on the mounting surface 510 without clamping.

[0095] 7 to 9, the mounting surface 510 is provided with a plurality of mechanical chucks 55. As shown in FIG. 8, the jig 5 may hold a number of workpieces W that is fewer than the number of chucks 55. Alternatively, as shown in FIG. 9, the jig 5 may hold a number of workpieces W that is the same as the number of chucks 55. The jig 5 may hold a plurality of workpieces W, or may hold a single workpiece W. The number of chucks 55 shown in FIGS. 7 to 9 is an example and is not limited to this. In other words, the jig 5 may be provided with five or fewer chucks 55, or may be provided with seven or more chucks 55. The jig 5 does not necessarily have to be provided with a chuck 55.

[0096] Each of the multiple support members 52 is a columnar member extending upward (toward the +Z side in the example shown in FIGS. 7 to 9 ) from the upper surface of the bottom member 51. Each of the multiple support members 52 is a member for supporting the above-mentioned base plate 50. Therefore, each of the multiple support members 52 supports multiple base plates 50. In the example shown in FIGS. 7 to 9 , the multiple support members 52#1 to 52#4 support multiple base plates 50#1 to 50#4, respectively. Therefore, multiple base plates 50 are arranged in the jig 5. However, if the jig 5 has a single support member 52, a single base plate 50 may be arranged in the jig 5.

[0097] 7 to 9, the multiple support members 52 are arranged at each vertex of a rectangular region on the top surface of the bottom member 51. However, the arrangement of the multiple support members 52 is not limited to the example shown in Figures 7 to 9. Also, in the example shown in Figures 7 to 9, four support members 52 are arranged on the bottom member 51. However, the number of support members 52 is not limited to four. Three or less or five or more support members 52 may be arranged on the bottom member 51.

[0098] Each support member 52 includes a plate fixing member 521 to which the base plate 50 is fixed. In this case, each support member 52 supports the base plate 50 via the plate fixing member 521.

[0099] The base plate 50 may be attached to the plate fixing member 521 so that the reference portion of the jig 5 and the base plate 50 have a predetermined positional relationship. The base plate 50 may be supported by the support member 52 so that the reference portion of the jig 5 and the base plate 50 have a predetermined positional relationship (i.e., the jig 5 does not need to be equipped with the plate fixing member 521). Information regarding the positional relationship between the reference portion of the jig 5 and the base plate 50 may be known information in the machining system SYS.

[0100] At least two of the multiple support members 52 may have different heights. In other words, the heights at which at least two of the multiple support members 52 support the base plate 50 may be different. Note that the "height" here may refer to the distance in the Z-axis direction from the bottom member 51. As a result, at least two of the multiple base plates 50 arranged in the jig 5 may be arranged at positions with different heights. However, all of the multiple support members 52 may have the same height. The height of at least one of the multiple support members 52 may be set to a height that matches the height of the workpiece W placed on the placement surface 510.

[0101] Each of the multiple connecting members 53 connects two adjacent support members 52. Therefore, each connecting member 53 may be a member extending in the direction in which the two adjacent support members 52 are aligned. Each connecting member 53 may be a member extending in a direction intersecting the direction in which the support members 52 extend. In the example shown in FIGS. 7 to 9 , the support members 52 extend along the Z-axis direction and two adjacent support members 52 are aligned along the X-axis direction or the Y-axis direction, so each connecting member 53 may extend along the X-axis direction or the Y-axis direction. In this case, one end of each connecting member 53 may be connected to two adjacent support members 52, and the other end of each connecting member 53 may be connected to two adjacent support members 52.

[0102] In addition to or instead of a single connecting member 53, a plurality of connecting members 53 may connect two adjacent support members 52 together.

[0103] At least one of a read code or a non-contact communication tag indicating identification information for identifying the jig 5 may be attached to a part of the jig 5 (for example, the bottom member 51). An example of the read code is at least one of a two-dimensional code and a barcode.

[0104] (First Modification) The structure of another example of a jig for holding a workpiece W will be described with reference to Fig. 10. Fig. 10 is a perspective view showing the structure of a jig 5a when actually holding a workpiece W. In Fig. 10, parts that are common to Figs. 7 to 9 are denoted by the same reference numerals. Also, for the jig 5a, descriptions that overlap with the description of the jig 5 described above will be omitted as appropriate.

[0105] As shown in Fig. 10 , the jig 5a has nine mechanical chucks 55. In the example shown in Fig. 10 , the jig 5a holds the same number of workpieces W as the number of chucks 55. That is, the jig 5a holds nine workpieces W. The jig 5a may hold a number of workpieces W that is fewer than the number of chucks 55. That is, the jig 5a may hold eight or fewer workpieces W. The jig 5a may hold multiple workpieces W, or may hold a single workpiece W.

[0106] (Second Modification) The structure of another example of a jig for holding a workpiece W will be described with reference to Figures 11 and 12. Figure 11 is a perspective view showing the structure of a jig 5b when it is not holding a workpiece W, and Figure 12 is a perspective view showing the structure of a jig 5b when it is actually holding a workpiece W. In Figures 11 and 12, parts that are common to Figures 7 to 9 are denoted by the same reference numerals. Also, with regard to the jig 5b, descriptions that overlap with the description of the jig 5 described above will be omitted as appropriate.

[0107] 11 and 12 , the jig 5b includes a bottom member 51, a plurality of support members 52, and a plurality of connecting members 53. At least a portion of the upper surface of the bottom member 51 functions as a mounting surface 510 on which the workpiece W is placed. A mechanical chuck 55 for holding the workpiece W may be disposed on the mounting surface 510.

[0108] At least one of a read code or a non-contact communication tag indicating identification information for identifying the jig 5b may be attached to a part of the jig 5b (for example, the bottom member 51). The workpiece W held by the jig 5b may be longer than the workpiece W held by the jigs 5 and 5a. In other words, the length of the workpiece W held by the jig 5b in the direction along the Z axis may be longer than the length of the workpiece W held by the jigs 5 and 5a in the direction along the Z axis.

[0109] (Third Modification) The structure of another example of a jig for holding a workpiece W will be described with reference to Fig. 13. Fig. 13 is a perspective view showing the structure of a jig 5c when actually holding a workpiece W. In Fig. 13, parts that are common to Figs. 7 to 9 are denoted by the same reference numerals. Also, for the jig 5c, descriptions that overlap with the description of the jig 5 described above will be omitted as appropriate.

[0110] As shown in FIG. 13 , the jig 5c includes a bottom member 51, a plurality of support members 52, and a plurality of connecting members 53. In the example shown in FIG. 13 , the stage 131 is rotated by a predetermined angle around the Y-axis. In this state, the stage 131 may be movable along the Y-Z plane. For example, if the workpiece W is a turbine blade with a shroud, the notch portion of the shroud can be machined by holding the workpiece W as shown in FIG. 13 (e.g., by holding the workpiece W so that the longitudinal direction of the workpiece W is aligned with the X-axis direction). Instead of or in addition to being rotatable around the Y-axis, the stage 131 may be configured to be rotatable around the X-axis.

[0111] At least one of a read code and a non-contact communication tag indicating identification information for identifying the jig 5c may be attached to a part of the jig 5c (for example, the bottom member 51).

[0112] If the stage 131 is configured not to be rotatable around the Y axis, the workpiece W may be tilted relative to the bottom member 51 of the jig 5, 5a, or 5b in order to machine the notch portion of the shroud, as shown in Fig. 14. When the notch portion is machined, at least one of cutting and removing may be performed in advance on the portion of the workpiece W to be repaired (for example, the notch portion).

[0113] (2) Operation of the Machining System SYS The operation performed by the machining system SYS will be described. In this embodiment, the machining system SYS may perform a machining operation for machining the workpiece W, mainly using the machining device 1. Furthermore, the machining system SYS may perform a control information generation operation for generating machining control information, mainly using the measuring device 2. Therefore, the machining operation and the control information generation operation will be described in order below.

[0114] (2-1) Processing Operation First, the processing operation will be described with reference to FIGS. 15 and 16 . In particular, as an example of the processing operation, the additional processing operation performed by the processing apparatus 1 will be described. As described above, the processing apparatus 1 forms the three-dimensional structure ST using the laser build-up welding method. Therefore, the processing apparatus 1 may form the three-dimensional structure ST by performing an existing additional processing operation that complies with the laser build-up welding method. Below, a brief description will be given of an example of the processing operation for forming the three-dimensional structure ST using the laser build-up welding method.

[0115] In order to form a three-dimensional structure ST, the processing apparatus 1 sequentially forms, for example, a plurality of layered partial structures (hereinafter referred to as "structural layers") SL arranged along the Z-axis direction. For example, the processing apparatus 1 sequentially forms a plurality of structural layers SL obtained by slicing the three-dimensional structure ST along the Z-axis direction, one by one. As a result, a three-dimensional structure ST is formed, which is a layered structure in which a plurality of structural layers SL are stacked. Below, the flow of operations for forming a three-dimensional structure ST by sequentially forming a plurality of structural layers SL one by one will be described.

[0116] First, the operation of forming each structure layer SL will be described with reference to Figures 15(a) to 15(e). Under the control of the control device 17, the processing device 1 moves at least one of the processing head 121 and the stage 131 so that the target irradiation area EA is set in a desired area on the printing surface MS corresponding to the surface of the workpiece W or the surface of the printed structure layer SL. Then, the processing device 1 irradiates the target irradiation area EA with processing light EL from the irradiation optical system 1211. At this time, the focusing surface on which the processing light EL is focused in the Z-axis direction may coincide with the printing surface MS. Alternatively, the focusing surface may be offset from the printing surface MS in the Z-axis direction.

[0117] As a result, as shown in FIG. 15( a), a molten pool (i.e., a pool of metal or the like melted by the processing light EL) MP is formed on the printing surface MS irradiated with the processing light EL. Furthermore, under the control of the control device 17, the processing device 1 supplies the printing material M from the material nozzle 1212. As a result, the printing material M is supplied to the molten pool MP. The printing material M supplied to the molten pool MP is melted by the processing light EL irradiated onto the molten pool MP. Alternatively, the printing material M supplied from the material nozzle 1212 may be melted by the processing light EL before reaching the molten pool MP, and the molten printing material M may be supplied to the molten pool MP. Subsequently, when the processing light EL is no longer irradiated onto the molten pool MP due to the movement of at least one of the processing head 121 and the stage 131, the molten printing material M in the molten pool MP cools and solidifies (i.e., solidifies). As a result, as shown in FIG. 15( c), a molded object made of the solidified printing material M is deposited on the printing surface MS.

[0118] The processing apparatus 1 repeats a series of printing processes, including forming a molten pool MP by irradiating the processing light EL, supplying the printing material M to the molten pool MP, melting the supplied printing material M, and solidifying the molten printing material M, while moving the processing head 121 relative to the printing surface MS in at least one of the X-axis direction and the Y-axis direction, as shown in Fig. 15(d) . During this process, the processing apparatus 1 irradiates the printing surface MS with the processing light EL in an area on the printing surface MS where a desired object is to be printed, while not irradiating the printing surface MS with the processing light EL in an area on the printing surface MS where a desired object is not to be printed. In other words, the processing apparatus 1 moves the target irradiation area EA along a predetermined movement path on the printing surface MS, and irradiates the printing surface MS with the processing light EL at a timing that corresponds to the distribution of the area where a desired object is to be printed.

[0119] The movement path of the target irradiation area EA on the printing surface MS may be referred to as a processing path (in other words, a tool path). The above-mentioned processing control information includes information related to this processing path as processing path information. Therefore, the control information generating device 22 may generate processing control information including the processing path information. Based on the processing control information, the processing device 1 moves the target irradiation area EA along a predetermined movement path on the printing surface MS, and irradiates the printing surface MS with the processing light EL at a timing appropriate for the distribution of the area where the object is to be printed. Note that the processing path (tool path) may also be the movement path of the target supply area MA. Based on the processing control information, the processing device 1 may move the target supply area MA along a predetermined movement path on the printing surface MS. At this time, the printing material M may be supplied to the molten pool MP or the processing light EL at a timing appropriate for the distribution of the area where the object is to be printed, or the printing material M may be continuously supplied while the target supply area MA is moved. Here, the movement path of the target supply area MA and the movement path of the target irradiation area EA may be the same or different.

[0120] As a result, the molten pool MP also moves on the build surface MS along a movement path corresponding to the movement path of the target irradiation area EA. Specifically, the molten pool MP is sequentially formed on the build surface MS in the area irradiated with the processing light EL within the area along the movement path of the target irradiation area EA. As a result, as shown in FIG. 15( e), a structure layer SL corresponding to an object, which is an aggregate of melted and solidified build material M, is formed on the build surface MS. That is, a structure layer SL corresponding to an aggregate of objects formed on the build surface MS in a pattern corresponding to the movement path of the molten pool MP (i.e., a structure layer SL having a shape corresponding to the movement path of the molten pool MP in a planar view) is formed. Note that if the target irradiation area EA is set in an area where an object is not desired to be built, the processing apparatus 1 may irradiate the target irradiation area EA with the processing light EL and stop supplying the build material M. In addition, when a target irradiation area EA is set in an area where it is not desired to form a molded object, the processing device 1 may supply the molding material M to the target irradiation area EA and irradiate the target irradiation area EA with processing light EL of an intensity that will not create a molten pool MP.

[0121] The processing apparatus 1 repeatedly performs operations for forming such a structure layer SL under the control of the control device 17 based on processing control information. Specifically, the processing apparatus 1 first performs operations for forming a first structure layer SL#1 on a printing surface MS corresponding to the surface of the workpiece W based on processing control information (e.g., information regarding a processing path for forming the structure layer SL#1). As a result, the structure layer SL#1 is formed on the printing surface MS as shown in FIG. 16( a). Thereafter, the processing apparatus 1 sets the surface (i.e., the upper surface) of the structure layer SL#1 as a new printing surface MS, and then forms a second structure layer SL#2 on the new printing surface MS. To form the structure layer SL#2, the control device 17 first controls at least one of the head drive system 122 and the stage drive system 132 so that the processing head 121 moves along the Z axis relative to the stage 131. Specifically, the control device 17 controls at least one of the head drive system 122 and the stage drive system 132 to move the processing head 121 toward the +Z side and / or the stage 131 toward the -Z side so that the target irradiation area EA is set on the surface of the structural layer SL#1 (i.e., the new printing surface MS). Then, under the control of the control device 17, the processing device 1 forms a structural layer SL#2 on the structural layer SL#1 based on the processing control information (e.g., processing path information for printing the structural layer SL#2) in the same manner as the operation for printing the structural layer SL#1. As a result, the structural layer SL#2 is printed as shown in FIG. 16( b). Thereafter, the same operation is repeated until all structural layers SL constituting the three-dimensional structure ST to be printed on the workpiece W are printed. As a result, as shown in FIG. 16( c), the three-dimensional structure ST is printed using a layered structure in which multiple structural layers SL are stacked.

[0122] (2-2) Control Information Generating Operation The control information generating operation will be described below. As described above, the measuring device 2 (particularly, the control information generating device 22) generates processing control information by performing the control information generating operation.

[0123] The control information generating device 22 may generate processing control information based on object information that indicates the actual three-dimensional shape of the object, the workpiece W, that the processing device 1 is about to process.

[0124] An example of object information is measurement information indicating the measurement results of the three-dimensional shape of the workpiece W by the shape measuring device 21. In this case, in order to generate processing control information, the shape measuring device 21 may measure the three-dimensional shape of the workpiece W, and the control information generating device 22 may generate the processing control information based on the measurement information. When the processing apparatus 1 processes multiple workpieces W, the shape measuring device 21 may measure the three-dimensional shapes of each of the multiple workpieces W collectively or sequentially, and the control information generating device 22 may sequentially generate multiple pieces of processing control information to be used for processing the multiple workpieces W, respectively, based on the measurement information of the multiple workpieces W.

[0125] However, when the processing device 1 processes multiple workpieces W that are assumed to have the same characteristics (e.g., shape), the shape measuring device 21 does not need to measure the three-dimensional shapes of all of the multiple workpieces W in order to generate processing control information. For example, the shape measuring device 21 may measure the three-dimensional shape of one workpiece W among the multiple workpieces W, while not measuring the three-dimensional shapes of the remaining workpieces W among the multiple workpieces W. In this case, the control information generating device 22 may generate processing control information that is commonly used to process each of the multiple workpieces W, based on measurement information indicating the measurement results of the three-dimensional shape of one workpiece W.

[0126] An example of multiple workpieces W assumed to have the same characteristics is multiple turbine blades attached to a rotor that constitutes a turbine and is rotatable around a rotation axis. Multiple turbine blades with the same characteristics are typically attached to the rotor. However, as the turbine is used, friction between the fluid and the turbine blades causes the turbine blades to wear. As a result, at least two of the multiple turbine blades that had the same characteristics before the turbine began to be used may have different characteristics (especially their shapes) due to the use of the turbine. However, even in this case, the amount of wear of the multiple turbine blades is likely to be approximately the same. As a result, at least two of the multiple turbine blades that had the same characteristics before the turbine began to be used may be considered to be approximately the same, even after the turbine has been used, although strictly speaking, they may be different. Furthermore, when repairing worn turbine blades, a portion of the worn portion of the turbine blade may be removed to make the shapes of the multiple turbine blades in need of repair approximately the same. In such cases, the shape measurement device 21 may measure the three-dimensional shape of one of the multiple worn turbine blades while not measuring the three-dimensional shapes of the remaining turbine blades. The control information generating device 22 may generate processing control information that is commonly used to process (typically repair) each of multiple worn turbine blades based on measurement information that indicates the measurement results of the three-dimensional shape of one turbine blade.

[0127] The object information may be any information as long as it can directly or indirectly indicate the actual three-dimensional shape of the workpiece W. For example, the object information may be point cloud information that indicates the actual three-dimensional shape of the workpiece W using multiple points. In this embodiment, an example is described in which an object model OM is used as object information. In other words, in this embodiment, an example is described in which model information indicating the object model OM is used as object information. The object model OM is a three-dimensional model that indicates the actual three-dimensional shape of the workpiece W. In other words, the object model OM is a three-dimensional model that has the same three-dimensional shape as the actual three-dimensional shape of the workpiece W. Examples of three-dimensional models include at least one of a wireframe model, a surface model, and a solid model. In this embodiment, an example is described in which a mesh model (typically a polygonal mesh model, the same applies hereinafter), which is a specific example of a surface model, is used as the object model OM. A mesh model is a three-dimensional model that represents the three-dimensional shape of an object using vertices, edges, and faces. A mesh model is a three-dimensional model that represents the three-dimensional shape of an object using multiple meshes (in other words, facets or computational grids) having polygonal shapes.

[0128] The object model OM may be generated based on measurement information indicating the measurement results of the three-dimensional shape of the workpiece W by the shape measuring device 21. In other words, the object model OM may be generated based on the measurement results of the three-dimensional shape of the workpiece W by the shape measuring device 21. In this case, the control information generating device 22 may generate the object model OM based on the measurement information. Alternatively, a device different from the control information generating device 22 (for example, the shape measuring device 21) may generate the object model OM based on the measurement information.

[0129] Alternatively, the object model OM may be generated without using measurement information indicating the measurement results of the three-dimensional shape of the workpiece W by the shape measurement device 21. For example, the control information generating device 22 (or a device different from the control information generating device 22, the same applies hereinafter in this paragraph) may estimate the actual three-dimensional shape of the workpiece W based on events that affect the three-dimensional shape of the workpiece W, and generate the object model OM based on the estimation results. In other words, the control information generating device 22 may generate a three-dimensional model indicating the estimated three-dimensional shape as the object model OM. In this case, the control information generating device 22 may estimate the actual three-dimensional shape of the workpiece W using a computational model that can be constructed by machine learning (e.g., a computational model including a neural network (so-called artificial intelligence (AI))). Alternatively, a user of the machining system SYS may estimate the actual three-dimensional shape of the workpiece W based on events that affect the three-dimensional shape of the workpiece W, and generate the object model OM based on the estimation results. In other words, the user may generate a three-dimensional model indicating the estimated three-dimensional shape as the object model OM. Alternatively, the control information generating device 22 may generate the object model OM based on the result of estimation of the actual three-dimensional shape of the workpiece W by the user.

[0130] An example of an event that affects the three-dimensional shape of the workpiece W is the environment in which the workpiece W is used. Another example of an event that affects the three-dimensional shape of the workpiece W is the force applied to the workpiece W under the conditions in which the workpiece W is used. Another example of an event that affects the three-dimensional shape of the workpiece W is the period of time the workpiece W is used. For example, if the workpiece W is the turbine blade described above, an example of an event that affects the three-dimensional shape of the turbine blade is at least one of the environment in which the turbine blade is used, the force applied to the turbine blade, and the period of time the turbine blade is used. In this case, the control information generating device 22, a device different from the control information generating device 22, or a user may estimate the amount of wear on the turbine blade (i.e., the missing portion of the turbine blade) based on the event that affects the three-dimensional shape of the turbine blade, and estimate the actual three-dimensional shape of the turbine blade based on the estimated amount of wear.

[0131] A three-dimensional model represented by a file representing CAD (Computer Aided Design) data may be used as the object model OM. Examples of files representing CAD data include at least one of a file with an extension "DWF," a file with an extension "DXF," a file with an extension "DWG," and a file with an extension "STP." When a mesh model is used as the object model OM, a three-dimensional model represented by a file with an extension "STL" may be used as the object model OM.

[0132] In addition to or instead of the object information described above, the control information generating device 22 may generate the processing control information based on reference information indicating a target shape of the workpiece W. In other words, the control information generating device 22 may generate the processing control information based on reference information indicating a designed or ideal three-dimensional shape of the workpiece W.

[0133] The reference information may be any information as long as it can directly or indirectly indicate the target shape of the workpiece W. For example, the reference information may be point cloud information that indicates the target shape of the workpiece W using a plurality of points. In this embodiment, an example will be described in which a reference model RM is used as reference information. In other words, in this embodiment, an example will be described in which model information indicating the reference model RM is used as reference information. The reference model RM is a three-dimensional model that indicates the target shape of the workpiece W. In other words, the reference model RM is a three-dimensional model that has the same three-dimensional shape as the target shape of the workpiece W. In this embodiment, an example will be described in which a mesh model, which is a specific example of a surface model, is used as the reference model RM.

[0134] A CAD model of a workpiece W having a target shape may be used as the reference model RM. A three-dimensional model generated based on information obtained by actually measuring the three-dimensional shape of a workpiece W having a target shape may be used as the reference model RM. In this case, a three-dimensional model indicated by a file indicating CAD data may be used as the reference model RM. Examples of files indicating CAD data include at least one of a file with an extension DWF, a file with an extension DXF, a file with an extension DWG, and a file with an extension STP. When a mesh model is used as the reference model RM, a three-dimensional model indicated by a file with an extension STL may be used as the reference model RM.

[0135] Here, as shown in FIGS. 17( a) and 17(b), which respectively schematically illustrate a reference model RM and an object model OM, the target shape of the workpiece W represented by the reference model RM (i.e., the design or ideal three-dimensional shape of the workpiece W) typically differs from the actual three-dimensional shape of the workpiece W represented by the object model OM. For example, as described above, if a defective part requiring repair is used as the workpiece W, as shown in FIG. 17(b), the object model OM represents the three-dimensional shape of the workpiece W that has been partially damaged due to use of the workpiece W, while as shown in FIG. 17(a), the reference model RM represents the three-dimensional shape of the workpiece W without any defects. In other words, the object model OM represents the three-dimensional shape of the workpiece W after actual use, while the reference model RM represents the three-dimensional shape of the workpiece W before it was actually used. As an example, if the workpiece W is a turbine blade with a worn portion, the object model OM represents the three-dimensional shape of the worn turbine blade, while the reference model RM represents the three-dimensional shape of the unworn turbine blade. That is, the object information indicates the three-dimensional shape of the turbine blade after it has actually been used as a turbine component, while the reference information indicates the three-dimensional shape of the turbine blade before it has actually been used as a turbine component. In other words, the object information indicates the three-dimensional shape of a used turbine blade, while the reference information indicates the three-dimensional shape of an unused turbine blade. Therefore, when a portion of the workpiece W is lost (e.g., worn) as the workpiece W is used, the target shape of the workpiece W indicated by the reference model RM usually differs from the actual three-dimensional shape of the workpiece W indicated by the object model OM. Note that because the reference model RM indicates the target shape of the workpiece W, the reference model RM may also be referred to as a target model.

[0136] In this embodiment, "use of the workpiece W" may include using the workpiece W in a manner suited to the intended use of the workpiece W. When the workpiece W is used as a component of a product, "use of the workpiece W" may include using a product including the workpiece W in a manner suited to the intended use of the product. For example, when the workpiece W includes a turbine blade, "use of the turbine blade" may include using a turbine including the turbine blade in a manner suited to the intended use of the turbine.

[0137] Furthermore, considering that a situation in which a portion of the workpiece W is lost (e.g., worn) due to use of the workpiece W as described above is an example of a situation in which the machining system SYS of this embodiment is used, "use of the workpiece W" may include use of the workpiece W that causes loss of a portion of the workpiece W. For example, "use of the workpiece W" may include use of the workpiece W for a long period of time that causes loss of a portion of the workpiece W. Therefore, an actually used workpiece W may include a workpiece W that has been used long enough to cause loss of a portion of the workpiece W. On the other hand, a workpiece W before actual use may include a workpiece W that has been used but not long enough to cause loss of a portion of the workpiece W. For example, a workpiece W before actual use may include use of the workpiece W for a short period of time that does not cause loss of a portion of the workpiece W (e.g., a test run of the workpiece W or a product including the workpiece W). Of course, a workpiece W before actual use may literally include a workpiece W that has not yet been used. For example, a workpiece W before actual use may include a workpiece W before it is shipped as a product or part. For example, a workpiece W before actual use may include a workpiece W in the design stage.

[0138] The reference model RM may be generated based on the measurement results of the three-dimensional shape of the workpiece W before it is actually used. In this case, the shape measuring device 21 (or a device different from the shape measuring device 21, the same applies hereinafter in this paragraph) measures the three-dimensional shape of the workpiece W before it is actually used, and the reference model RM may be generated based on the measurement results of the shape measuring device 21. Alternatively, the reference model RM may be generated based on CAD data or the like that indicates the designed three-dimensional shape of the workpiece W.

[0139] In this embodiment, the control information generating device 22 generates processing control information based on both an object model OM, which is an example of object information, and a reference model RM, which is an example of reference information. Specifically, as described above, the reference model RM indicates a target shape of the workpiece W, and the object model OM indicates an actual three-dimensional shape of the workpiece W. In this case, the difference between the reference model RM and the object model OM corresponds to a three-dimensional model indicating the three-dimensional shape of the object (i.e., the three-dimensional structure ST) to be formed by the processing device 1 performing additive processing. Therefore, the control information generating device 22 may generate a three-dimensional model corresponding to the difference between the reference model RM and the object model OM as a differential model DM indicating the three-dimensional shape of the three-dimensional structure ST to be formed by the processing device 1 performing additive processing. The differential model DM is typically a three-dimensional model corresponding to a portion of the reference model RM. Note that FIG. 18( a) schematically illustrates a reference model RM, FIG. 18( b) schematically illustrates an object model OM, and FIG. 18( c) schematically illustrates a differential model DM generated based on the reference model RM shown in FIG. 18( a) and the object model OM shown in FIG. 18( b). The control information generating device 22 may then generate processing control information based on the differential model DM. For example, the control information generating device 22 may perform a slicing process to divide the differential model DM into multiple layered models at a layering pitch corresponding to the thickness of the structural layer SL, thereby generating multiple slice data corresponding to each of the multiple structural layers SL that constitute the three-dimensional structure ST. The control information generating device 22 may then generate multiple pieces of processing control information used to form each of the multiple structural layers SL based on the multiple slice data.

[0140] A three-dimensional model represented by a file representing CAD data may be used as the differential model DM. Examples of files representing CAD data include at least one of a file with an extension "DWF," a file with an extension "DXF," a file with an extension "DWG," and a file with an extension "STP." When a mesh model is used as the differential model DM, a three-dimensional model represented by a file with an extension "STL" may be used as the differential model DM.

[0141] Assembly information may be included in a file (e.g., a CAD file representing CAD data; the same applies hereinafter in this paragraph). Here, "assembly information" may refer to information for associating data related to multiple parts with each other. For example, a file may include assembly information that associates information related to a differential model DM with information related to an object model OM. For example, a file may include assembly information that associates information related to a differential model DM with information related to an object model OM with information related to a reference model RM. In this case, the object model OM and the differential model DM, or the object model OM, the differential model DM, and the reference model RM, may be included in the file in the form of assembly information. The file may include a first object model OM obtained by measuring a workpiece W with a first measurement accuracy and a first object model OM obtained by measuring a workpiece W with a second measurement accuracy higher than the first measurement accuracy. In this case, the file may include information related to the measurement accuracy used when the object model OM was acquired. For example, a first object model OM may be associated in a file with information about the measurement accuracy used when the first object model OM was acquired, and for example, a second object model OM may be associated in a file with information about the measurement accuracy used when the second object model OM was acquired.

[0142] Alternatively, at least one of the object model OM, the reference model RM, and the differential model DM may be included in a file (e.g., a CAD file indicating CAD data; the same applies hereinafter in this paragraph) in an information format different from the information format of the assembly information. Alternatively, at least one of a file including the object model OM, a file including the reference model RM, and a file including the differential model DM may be stored in the storage device 222 or the like. In other words, the object model OM, the reference model RM, and the differential model DM may be included in separate files. In this case, a management file including information indicating that at least two of the file including the object model OM, the file including the reference model RM, and the file including the differential model DM are associated with each other may be stored in the storage device 222 or the like.

[0143] However, the control information generating device 22 may generate the processing control information using the object model OM but without using the reference model RM. The control information generating device 22 may generate the processing control information using the reference model RM but without using the object model OM.

[0144] (3) Usage of the Machining System SYS Next, an example of a usage of the machining system SYS will be described with reference to Figs. 19 to 22. Fig. 19 is a conceptual diagram showing an example of a usage of the machining system SYS. Figs. 20(a) to 20(e) are diagrams showing an example of the transition of information registered in the information processing device 4. Fig. 21 is a diagram showing an example of information related to jigs registered in the information processing device 4. Fig. 22 is a conceptual diagram showing an example of a schedule.

[0145] Here, the workpiece W is assumed to be a product that has a missing portion and needs to be repaired. For convenience, two processing devices 1 (e.g., processing devices 1#1 and 1#2) and a single measuring device 2 (e.g., measuring device 2#1) are depicted in Fig. 19, but the number of processing devices 1 and the number of measuring devices 2 are not limited to this. The processing device 1 and the measuring device 2 may be installed on the same floor, or on different floors.

[0146] Here, the measurement coordinates in the measuring device 2 and the processing coordinates in the processing device 1 (for example, processing devices 1#1 and 1#2) may be associated. The association of the measurement coordinates and the processing coordinates may mean that coordinates in one of the measurement coordinates and the processing coordinates can be converted into coordinates in the other of the measurement coordinates and the processing coordinates. Note that the measurement coordinates and the processing coordinates may be the same.

[0147] 19 , jig information related to a jig 5 that holds one or more workpieces W may be registered in the information processing device 4. That is, the calculation device 41 of the information processing device 4 may store the jig information related to the jig 5 in the storage device 42. The jig information may include identification information for identifying the jig 5. As described above, the jig 5 may be assigned at least one of a read code and a non-contact communication tag that indicate the identification information. Therefore, the information processing device 4 may acquire the identification information of the jig 5 by reading at least one of the read code and the non-contact communication tag assigned to the jig 5. The information processing device 4 may then register the acquired identification information. Note that an operator of the information processing device 4 may input the identification information of the jig 5 via the input device 44, thereby registering the identification information in the information processing device 4. Note that the identification information of the jig 5 may be the serial number of the jig 5.

[0148] Note that a character string indicating identification information for each jig may be written on the jig 5. In this case, the information processing device 4 may acquire and register jig information related to the jig 5 by detecting the identification information from an image in which the character string indicating the identification information written on the jig 5 appears.

[0149] Furthermore, workpiece information relating to one or more workpieces W held in the jig 5 may be registered in the information processing device 4. That is, the calculation device 41 may store the workpiece information relating to the workpiece W in the storage device 42. The workpiece W may be provided with at least one of a read code and a non-contact communication tag indicating identification information for identifying the workpiece W. Therefore, the information processing device 4 may acquire the identification information of the workpiece W by reading at least one of the read code and the non-contact communication tag provided to the workpiece W. The information processing device 4 may then register the acquired identification information. The operator of the information processing device 4 may input the identification information of the workpiece W via the input device 44, thereby registering the identification information in the information processing device 4. The identification information of the workpiece W may be the serial number of the workpiece W.

[0150] Note that a character string indicating identification information may be written on the workpiece W. In this case, the information processing device 4 may acquire and register workpiece information related to the workpiece W by detecting the character string indicating the identification information written on the workpiece W from an image that includes the character string. If the workpiece W is a turbine blade, the workpiece information may include information related to the turbine to which the workpiece W, which is a turbine blade, belongs.

[0151] After one or more workpieces W are attached to the jig 5 (in other words, after one or more workpieces W are held in the jig 5), position information indicating the position of one or more workpieces W on the jig 5 may be registered in the information processing device 4 as part of the workpiece information.

[0152] An example of the read code is at least one of a two-dimensional code and a barcode. An example of the non-contact communication tag is at least one of an IC (Integrated Circuit) tag, an RFID (Radio Frequency Identification) tag, an NFC (Near Field Communication), and Felica (registered trademark).

[0153] Here, one jig 5 and one or more workpieces W held by the one jig 5 may be treated as one processing unit. Such one processing unit may be called a "batch." In the following description, one jig 5 and one or more workpieces W held by the one jig 5 will be referred to as a "batch" as appropriate. Furthermore, information related to one batch will be referred to as "batch information" as appropriate.

[0154] 20, the registration of the above-mentioned jig information and workpiece information in the information processing device 4 will be described. An image U1 shown in Fig. 20(a) is an example of an image displayed on the display device 451 of the information processing device 4. The image U1 has a display field U101 showing the name of one batch, a display field U102 showing jig information, a plurality of display fields U103 showing workpiece information, a display field U104 showing difference data, and a display field U105 showing machining paths.

[0155] For example, before the jig information is registered in the information processing device 4, the operator of the information processing device 4 may input the name of the batch via the input device 44. When the operator inputs the name of the batch via the input device 44 and furthermore the jig information related to the jig 5 is registered in the information registration device 4, the calculation device 41 of the information processing device 4 may control the output device 45 so that, for example, the image U2 shown in FIG. 20(b) is displayed on the display device 451. In FIG. 20(b), the name of the batch is "220320_1" (see display field U101 in FIG. 20(b)). Also, the jig information is "xxxxxx" (see display field U102 in FIG. 20(b)). Also, the jig information may be identification information of the jig 5.

[0156] When workpiece information related to one or more workpieces W held by the jig 5 is registered in the information processing device 4, the calculation device 41 may control the output device 45 so that, for example, image U3 shown in FIG. 20(c) is displayed on the display device 451. In FIG. 20(c), the workpiece information is denoted as "aaa" for convenience. However, the actual workpiece information may differ for each workpiece W. Although there are three display fields U103 in FIG. 20, the number of display fields U103 is not limited to three. For example, the number of display fields U103 may be the same as the maximum number of workpieces W that the jig 5 can hold. In this case, the number of display fields U103 may be changed based on the registered jig information. The position of the workpiece W (denoted as "Position A" in FIG. 20) may be information indicating, for example, which of the multiple mechanical chucks 55 provided on the jig 5 is being used (in other words, information indicating how many workpieces W are held by the jig 5).

[0157] In this way, in one batch of information, jig information (e.g., identification information of the jig 5) and work information (e.g., identification information and position information of the work W) are linked to each other. That is, the jig information and the work information are linked to each other and registered in the information processing device 4. In other words, the jig information and the work information may be linked to each other and stored in the storage device 42 of the information processing device 4.

[0158] Here, with reference to FIG. 21 , jig information will be further explained. For example, a table relating to jig information as shown in FIG. 21 may be stored in the storage device 42 of the information processing device 4. That is, the jig information may be organized and stored in the storage device 42. In FIG. 21 , the jig information may include the type of jig, the repair location, the maximum number of jigs that can be placed, the corresponding device, and the jig number. Although not shown in FIG. 21 , the jig information includes identification information (for example, a serial number). The type of jig, the repair location, the maximum number of jigs that can be placed, the corresponding device, and the jig number (jig No.) are examples of jig information, and the jig information is not limited to these.

[0159] For example, a jig type "JIG AA4" may include four jigs with jig numbers "AA4-001," "AA4-002," "AA4-003," and "AA4-004." For example, a jig type "JIG AA6" may include four jigs with jig numbers "AA6-001," "AA6-002," "AA6-003," and "AA6-004." For example, a jig type "JIG BB4" may include four jigs with jig numbers "BB4-001," "BB4-002," "BB4-003," and "BB4-004." For example, a jig type "JIG CC2" may include two jigs with jig numbers "CC2-001" and "CC2-002."

[0160] For example, when at least one of the reading code and the non-contact communication tag attached to the jig 5 is read, the calculation device 41 of the information processing device 4 may obtain information about the jig corresponding to the read information (e.g., identification information) based on the table shown in Figure 21.

[0161] For example, it is assumed that the read information indicates a jig with jig number "AA4-001." As shown in FIG. 21 , the jig with jig number "AA4-001" is a jig for repairing the tip portion of a turbine blade, which is the workpiece W. In this case, sequence information related to the repair of the tip portion may be linked to the jig with jig number "AA4-001." For example, when the read information indicates a jig with jig number "AA4-001," the calculation device 41 may acquire sequence information related to the repair of the tip portion linked to the jig with jig number "AA4-001." In this case, the calculation device 41 may include the sequence information related to the repair of the tip portion in the batch information. Note that the sequence information may mean information indicating a processing flow related to the workpiece W. When the workpiece W is processed according to sequence information, the sequence information may be referred to as a processing flow or processing information. When the workpiece W is measured according to the sequence information, the sequence information may be referred to as a measurement flow or measurement information. When the workpiece W is repaired according to the sequence information, the sequence information may be referred to as a repair flow or repair information.

[0162] As described above, after one batch of information is registered in the information processing device 4 (in other words, after the jig information and the work information are linked to each other and registered in the information processing device 4), the information processing device 4 may set a schedule for one batch corresponding to the one batch of information.

[0163] Here, multiple batch information items may be registered in the information processing device 4. If no measures are taken, there is a possibility that processing for each of the multiple batches (e.g., at least one of the processing process and the measurement process) may be delayed. Therefore, the information processing device 4 may set a schedule for each of the multiple batches to improve the operational efficiency of the processing system SYS. In other words, the information processing device 4 may set schedules for the multiple processing devices 1 and the multiple measuring devices 2 so that the multiple processing devices 1 and the multiple measuring devices 2 can efficiently process the multiple batches.

[0164] An example of a schedule will be described with reference to Fig. 22. In the example shown in Fig. 22, similar to the example shown in Fig. 19, the processing system SYS is assumed to include two processing apparatuses 1#1 and 1#2 and a single measuring apparatus 2.

[0165] It is assumed that four pieces of batch information are registered in the information processing device 4. Each of the four batches corresponding to the four pieces of batch information includes one jig 5 and four workpieces W held by the jig 5. The workpieces W may be turbine blades.

[0166] For each of the four batches, a pre-machining measurement task in which the measuring device 2 measures the workpiece W before the workpiece W is machined by the machining device 1, a machining task in which the machining device 1 machines the workpiece W, and a post-machining measurement task in which the measuring device 2 measures the workpiece W after the workpiece W is machined by the machining device 1 are performed. In other words, each of the four batch information may include sequence information including a pre-machining measurement task, a machining task, and a post-machining measurement task. Since the sequence information includes the machining task, it may also be referred to as machining information. Furthermore, since the sequence information includes the pre-machining measurement task and the post-machining measurement task, it may also be referred to as measurement information.

[0167] The information processing device 4 may set a schedule for each of the four batches based on, for example, sequence information included in each of the four batch information, processing device information for each of processing devices 1#1 and 1#2, and measuring device information for measuring device 2. The processing device information may include information indicating a time period during which no task is assigned to processing device 1 (in other words, an empty time period). The measuring device information may include information indicating a time period during which no task is assigned to measuring device 2 (in other words, an empty time period).

[0168] Hereinafter, the four batches will be referred to as batch B#1, batch B#2, batch B#3, and batch B#4. As shown in Fig. 22 , the information processing device 4 may set a schedule for batch B#1 so that the measuring device 2 performs a pre-machining measurement task from time t1, the machining task is performed by machining device 1#1 from time t2, and the measuring device 2 performs a post-machining measurement task from time t5.

[0169] As shown in Figure 22, the information processing device 4 may set a schedule for batch B#2 so that the pre-processing measurement task is performed by measuring device 2 from time t2, the processing task is performed by processing device 1#2 from time t3, and the post-processing measurement task is performed by measuring device 2 from time t6.

[0170] As shown in Figure 22, the information processing device 4 may set a schedule for batch B#3 so that the pre-processing measurement task is performed by measuring device 2 from time t3, the processing task is performed by processing device 1#1 from time t5, and the post-processing measurement task is performed by measuring device 2 from time t7.

[0171] As shown in Figure 22, the information processing device 4 may set a schedule for batch B#4 so that the pre-processing measurement task is performed by measuring device 2 from time t4, the processing task is performed by processing device 1#2 from time t6, and the post-processing measurement task is performed by measuring device 2 from time t8.

[0172] Since the machining system SYS is equipped with only one measuring device 2, the pre-machining measurement task and the post-machining measurement task for each of the four batches B#1, B#2, B#3, and B#4 are performed by the measuring device 2. Therefore, the information processing device 4 may assign the pre-machining measurement task and the post-machining measurement task for each of the four batches B#1, B#2, B#3, and B#4 to the measuring device 2. Furthermore, the measuring device 2 cannot, for example, simultaneously perform pre-machining measurement tasks for multiple batches. Therefore, the information processing device 4 may set a schedule so that the measuring device 2 performs the pre-machining measurement task for each of the four batches B#1, B#2, B#3, and B#4 in different time periods. Similarly, the information processing device 4 may set a schedule so that the measuring device 2 performs the post-machining measurement task for each of the four batches B#1, B#2, B#3, and B#4 in different time periods.

[0173] Since the processing apparatus SYS includes two processing apparatuses 1#1 and 1#2, the processing tasks for each of the four batches B#1, B#2, B#3, and B#4 may be shared and performed by the two processing apparatuses 1#1 and 1#2. Therefore, the information processing apparatus 4 may assign the processing tasks for each of the four batches B#1, B#2, B#3, and B#4 to either of the two processing apparatuses 1#1 and 1#2.

[0174] The time required for the pre-machining measurement task is shorter than the time required for the machining task. Therefore, for example, the pre-machining measurement task for batch B#2 by measuring device 2 will be completed before the machining task for batch B#1 by machining device 1#1 is completed. As shown in Figure 22, when machining device 1#1 is performing the machining task for batch B#1, machining device 1#2 is free (in other words, machining device 1#2 is in a standby state). Therefore, the information processing device 4 may assign the machining task for batch B#2 to machining device 1#2.

[0175] For example, the pre-machining measurement task for batch B#3 by measuring device 2 will be completed before the processing task for batch B#1 by processing device 1#1 and the processing task for batch B#2 by processing device 1#2 are completed. As shown in FIG. 22 , at the time when the pre-machining measurement task for batch B#3 is completed (time t4), both processing devices 1#1 and 1#2 are in operation (in other words, there is no processing device that can perform the processing task for batch B#3). Here, the time when processing device 1#1 completes the processing task for batch B#1 is earlier than the time when processing device 1#2 completes the processing task for batch B#2. Therefore, the information processing device 4 may assign the processing task for batch B#3 to processing device 1#1 in the time slot after processing device 1#1 completes the processing task for batch B#1.

[0176] An example different from the above example will be described. Batches B#1 and B#2 include one jig 5 and four workpieces W held by the jig 5. Batches B#3 and B#4 include one jig 5 and two workpieces W held by the jig 5. In this case, the time required to measure batches B#3 and B#4 is shorter than the time required to measure batches B#1 and B#2. Similarly, the time required to process batches B#3 and B#4 is shorter than the time required to process batches B#1 and B#2.

[0177] In this case, the information processing device 4 may, for example, assign the pre-machining measurement task for batch B#3 to the measuring device 2. The information processing device 4 may, for example, assign the pre-machining measurement task for batch B#4 to the measuring device 2 in a time period after the pre-machining measurement task for batch B#3 is completed. The information processing device 4 may, for example, assign the pre-machining measurement task for batch B#1 to the measuring device 2 in a time period after the pre-machining measurement task for batch B#4 is completed. The information processing device 4 may, for example, assign the pre-machining measurement task for batch B#2 to the measuring device 2 in a time period after the pre-machining measurement task for batch B#1 is completed.

[0178] The information processing device 4 may assign the processing task for batch B#3 to processing device 1#1. The information processing device 4 may assign the processing task for batch B#4 to processing device 1#2. The information processing device 4 may assign the processing task for batch B#1 to processing device 1#1 in a time period after the processing task for batch B#3 is completed. The information processing device 4 may assign the processing task for batch B#2 to processing device 1#2 in a time period after the processing task for batch B#4 is completed.

[0179] By setting the schedule in this manner, for example, the operating time of processing device 1#1 and the operating time of processing device 1#2 can be made closer, thereby shortening the time required to process the four batches B#1, B#2, B#3, and B#4.

[0180] 19 , after a schedule for each batch is set by the information processing device 4, at least one of measurement and processing is performed for each batch according to the set schedule. For example, for one batch, measurement is performed by the measuring device 2 (corresponding to the pre-processing measurement task described above), processing is then performed by the processing device 1 (corresponding to the processing task described above), and then measurement is performed by the measuring device 2 (corresponding to the post-processing measurement task described above).

[0181] When one batch (in other words, a jig 5 holding one or more workpieces W) is placed on the measuring device 2, the measuring device 2 may acquire identification information of the jig 5 by reading at least one of a read code and a non-contact communication tag attached to the jig 5. For example, the measuring device 2 may transmit the identification information of the jig 5 to the information processing device 4. The information processing device 4 may identify one batch information based on the identification information of the jig 5 transmitted from the measuring device 2. Then, the information processing device 4 may transmit workpiece information included in the identified one batch information (in other words, linked to the identification information of the jig 5 transmitted from the measuring device 2) to the measuring device 2.

[0182] The measuring device 2 may link the measurement results of one batch to the identification information of the jig 5 and transmit them to the information processing device 4. As a result, the information processing device 4 may register the measurement results of one batch in one piece of batch information corresponding to the one batch. In other words, when the measuring device 2 links the measurement results of one batch to the identification information of the jig 5 and transmits them to the information processing device 4, the information processing device 4 may add the measurement results of one batch to the one piece of batch information based on the identification information of the jig 5. In other words, the calculation device 41 of the information processing device 4 may link the measurement results of one batch to the jig information and workpiece information included in the corresponding one piece of batch information and store them in the storage device 42.

[0183] As described above, the measuring device 2 generates processing control information. For example, the measuring device 2 may transmit processing path information included in the processing control information to the information processing device 4 as the measurement result of one batch. Furthermore, the measuring device 2 may transmit information related to the differential model DM to the information processing device 4 as the measurement result of one batch. For example, the information processing device 4 may register the processing path information and information related to the differential model DM in one batch of batch information corresponding to one batch. In this case, the calculation device 41 of the information processing device 4 may control the output device 45 so that an image U4 shown in FIG. 20(d) is displayed on the display device 451. In the image U4, information related to the differential model DM may be displayed in the display field U104 showing the differential data. In the example shown in FIG. 20(d), a figure corresponding to the differential model DM is displayed in the display field U104. Processing path information may be displayed in the display field U105 showing the processing path. In the example shown in FIG. 20(d), an arrow indicating the processing path is displayed in the display field U105.

[0184] By registering the measurement results of one batch in one batch information, the measurement results (for example, at least one of information related to the differential model DM and machining path information) are linked to workpiece information. In this case, for example, the identification information of each workpiece W may be linked to the machining control information related to each workpiece W as the measurement results.

[0185] When the measuring device 2 is measuring another batch, the batch may be placed in a predetermined location (for example, a table marked "Waiting to scan" in FIG. 19).

[0186] The one batch measured by the measuring device 2 may be processed by either of the two processing devices 1#1 and 1#2. That is, one or more workpieces W included in one batch may be subjected to repair processing by one processing device 1. In other words, one processing device 1 may perform repair processing to repair one or more workpieces W having missing portions.

[0187] When one batch (in other words, a jig 5 holding one or more workpieces W) is placed on one processing device 1 (for example, one of processing devices 1#1 and 1#2), the processing device 1 may obtain identification information of the jig 5 by reading at least one of the reading code and the non-contact communication tag attached to the jig 5.

[0188] For example, the processing device 1 may transmit identification information of the jig 5 to the information processing device 4. The information processing device 4 may identify batch information based on the identification information of the jig 5 transmitted from the processing device 1. Then, the information processing device 4 may transmit workpiece information and processing control information included in the identified batch information (in other words, linked to the identification information of the jig 5 transmitted from the processing device 1) to the processing device 1. The processing device 1 may receive the workpiece information and processing control information transmitted from the information processing device 4. Having received the workpiece information and processing control information, the processing device 1 may process one or more workpieces W included in the batch based on the received processing control information.

[0189] Here, one or more workpieces W are targets to be processed by one processing device 1. Therefore, workpiece information may also be referred to as processing target information. As described above, one processing device 1 acquires the identification information of the jig 5, thereby acquiring workpiece information (i.e., processing target information) from the information processing device 4. Therefore, it can be said that processing target information related to one or more workpieces W is acquired by acquiring the identification information of the jig 5.

[0190] After the processing of one or more workpieces W is completed (in other words, after the processing of one batch is completed), the processing device 1 may, for example, link the processing details of the one or more workpieces W to the identification information of the jig 5 holding the one or more workpieces W and transmit the linked processing details to the information processing device 4. In other words, the processing device 1 may link the processing details of the batch to the identification information of the jig 5 and transmit the linked processing details to the information processing device 4. As a result, the information processing device 4 may register the processing details of the batch in the batch information corresponding to the batch. In other words, when the processing device 1 links the processing details of the batch to the identification information of the jig 5 and transmits the linked processing details of the batch to the information processing device 4, the information processing device 4 may add the processing details of the batch to the batch information based on the identification information of the jig 5. In other words, the calculation device 41 of the information processing device 4 may store the processing details of the batch in the storage device 42, linking the processing details of the batch to the jig information and workpiece information included in the corresponding batch information.

[0191] By registering the processing details of one batch in one batch information, the processing details and workpiece information are linked. In this case, for example, the identification information of each workpiece W may be linked to the processing details of each workpiece W.

[0192] Furthermore, when both of the two processing devices 1 are processing workpieces W included in another batch, the above-mentioned one batch may be placed in a predetermined location (for example, a table labeled "Waiting to be manufactured" in Figure 19).

[0193] A batch in which one or more workpieces W are machined by the above-mentioned one processing device 1 may be measured again by the measuring device 2. For example, the measuring device 2 may perform post-machining measurement (i.e., inspection) on one or more workpieces W that are included in one batch and machined by the above-mentioned one processing device 1.

[0194] When one batch is placed on the measuring device 2, the measuring device 2 may acquire identification information of the jig 5 by reading at least one of the read code and the non-contact communication tag attached to the jig 5. The measuring device 2 may link the measurement results of the one batch to the identification information of the jig 5 and transmit them to the information processing device 4. As a result, the information processing device 4 may register the measurement results of the one batch in one batch information corresponding to the one batch. In other words, when the measuring device 2 links the measurement results of the one batch to the identification information of the jig 5 and transmits them to the information processing device 4, the information processing device 4 may add the measurement results of the one batch to the one batch information based on the identification information of the jig 5. In other words, the calculation device 41 of the information processing device 4 may link the measurement results of the one batch to the jig information and workpiece information included in the corresponding one batch information and store them in the storage device 42.

[0195] In this case, the calculation device 41 of the information processing device 4 may control the output device 45 so that the image U5 shown in Fig. 20(e) is displayed on the display device 451. The image U5 has a display field U106 showing the measurement results of one or more workpieces W machined by the machining device 1. Note that the image U5 does not need to have multiple display fields U103 showing workpiece information. In the image U5, the display field U106 may display the three-dimensional shape of the workpiece W machined by the machining device 1.

[0196] When the measuring device 2 is measuring another batch, the batch may be placed in a predetermined location (for example, a table labeled "Waiting for inspection after molding" in FIG. 19).

[0197] After being measured again by the measuring device 2, one or more workpieces W included in the batch may be removed from the jig 5. At this time, for example, an operator of the information processing device 4 may compare the jig 5 and one or more workpieces W with the jig information and workpiece information registered in the information processing device 4, respectively.

[0198] Furthermore, at least part of the transportation of the workpiece W (specifically, the jig 5 holding the workpiece W) from the measuring device 2 to one of the processing devices 1, the transportation of the workpiece W from one of the processing devices 1 to the measuring device 2, and the transportation of the workpiece W from a predetermined location to the measuring device 2 or one of the processing devices 1 may be performed by the transporting device 3 or by a user of the processing system SYS.

[0199] Here, the transition of information included in the batch information described using Figures 20(a) to 20(e) (in other words, the method of acquiring batch information) will be explained with reference to the flowchart in Figure 23.

[0200] 23 , the arithmetic unit 41 of the information processing device 4 may acquire jig information related to the jig 5 (step S101). In this case, the arithmetic unit 41 may store the acquired jig information in the storage device 42 as part of one batch of information. In this case, the arithmetic unit 41 of the information processing device 4 may control the output device 45 so that, for example, image U2 shown in FIG. 20( b) is displayed on the display device 451. At this time, the arithmetic unit 41 may link the one batch of information to, for example, the jig 5 registered in the table shown in FIG. 21 based on the jig information.

[0201] Next, the calculation device 41 may acquire workpiece information related to one or more workpieces W held on the jig 5 (step S102). In this case, the calculation device 41 may store the acquired workpiece information in the storage device 42 as another part of one batch information. In this case, the calculation device 41 may control the output device 45 so that, for example, an image U3 shown in 20(c) is displayed on the display device 451.

[0202] When one or more workpieces W held by the jig 5 are measured by the measuring device 2 before being machined by one machining device 1, the calculation device 41 may acquire the results of the pre-machining measurement from the measuring device 2 (step S103). In this case, the calculation device 41 may store the acquired results of the pre-machining measurement (for example, at least one of information related to the differential model DM and machining path information) in the storage device 42 as another part of one batch information. In this case, the calculation device 41 of the information processing device 4 may control the output device 45 so that an image U4 shown in FIG. 20( d) is displayed on the display device 451.

[0203] When one or more workpieces W held by the jig 5 are processed by one processing device 1, the arithmetic device 41 may acquire the processing details from the one processing device 1 (step S104). In this case, the arithmetic device 41 may store the acquired processing details in the storage device 42 as another part of one batch information.

[0204] When one or more workpieces W held in the jig 5 are machined by one processing device 1 and then measured by the measuring device 2, the calculation device 41 may acquire the post-machining measurement results from the measuring device 2 (step S105). In this case, the calculation device 41 may store the acquired post-machining measurement results (e.g., information indicating the three-dimensional shape of the workpiece W after machining) in the storage device 42 as another part of one batch information. In this case, the calculation device 41 of the information processing device 4 may control the output device 45 so that an image U5 shown in FIG. 20( e) is displayed on the display device 451.

[0205] As a result of the operation shown in the flowchart of FIG. 23 , the work content for one batch is compiled into one batch of batch information (i.e., management data). As a result, for example, when an operator of the information processing device 4 tracks the repair information after repairing one batch, the operator can obtain the repair information (i.e., batch information) for each batch, which is the unit of processing (i.e., repair). In addition, the batch information includes workpiece information. Therefore, the operator can track the repair information for each workpiece W based on the batch information. Furthermore, as described above, one batch of batch information may be linked to a jig 5 registered, for example, in the table shown in FIG. 21 . In this case, the batch information linked to the jig 5 may be read from the jig 5 registered in the table shown in FIG. 21 . Specifically, when the computing device 41 acquires the jig information for the jig 5, the computing device 41 may read the past batch information linked to the jig 5 from the storage device 42.

[0206] By the above-described series of processes, at least a part of the process from receiving the workpieces W as items requiring repair to shipping the workpieces W after repair processing may be managed by the information processing device 4. The above-described series of processes is performed for each batch. That is, one or more workpieces W held in one jig 5 are measured by the measuring device 2, and one or more workpieces W held in one jig 5 are processed by one processing device 1. Therefore, it is possible to remove one or more workpieces W from one jig 5 and then measure and process the one or more workpieces W without attaching the one or more workpieces W to another jig 5.

[0207] As described above, the measurement results of one or more workpieces W by the measuring device 2 and the processing details of one or more workpieces W by one processing device 1 are included in one batch information. In other words, the measurement results and processing details are linked to the jig information included in the one batch information. Therefore, the operator of the information processing device 4 can track the measurement results of one or more workpieces W by the measuring device 2 and the processing details of one or more workpieces W by one processing device 1 for each jig 5 (in other words, for each batch).

[0208] For example, if the workpiece W is a turbine blade, the workpiece information may include information related to the turbine to which the turbine blade workpiece W belongs. The measurement results of one or more workpieces W by the measuring device 2 and the processing details of one or more workpieces W by one processing device 1 are also linked to the workpiece information included in the batch information. Therefore, the operator of the information processing device 4 can track the measurement results by the measuring device 2 and the processing details by one processing device 1 for each workpiece W. Furthermore, because the workpiece information includes information related to the turbine, the operator can track the measurement results by the measuring device 2 and the processing details by one processing device 1 for each turbine based on the information related to the turbine.

[0209] 20(a) to 20(e), the information included in one batch information increases as the processing (e.g., at least one of machining processing and measurement processing) for one batch corresponding to the one batch information progresses. Also, as shown in Fig. 21, the repair location of the workpiece W held by each type of jig 5 may be specified. In other words, the purpose of each jig 5 may be specified.

[0210] Here, after repair of one or more workpieces W held by a jig 5 is completed, the one or more workpieces W are removed from the jig 5. Thereafter, one or more new workpieces W may be attached to the jig 5. In other words, the jig 5 may be used repeatedly to repair workpieces W. For example, if a purpose is defined for each jig 5, there is a high probability that the one or more workpieces W removed from the jig 5 and the one or more workpieces W newly attached to the jig 5 are the same type of workpieces W.

[0211] Furthermore, even if there is a difference in shape between one or more workpieces W previously held in a jig 5 and one or more new workpieces W, for example, due to manufacturing errors and / or deformation over time, it may be determined that the type of one or more workpieces W previously held in a jig 5 is the same as the type of one or more new workpieces W.

[0212] It is assumed that the one or more workpieces W previously held in one jig 5 and the one or more new workpieces W are turbine blades. Even if there is a difference in shape between the one or more workpieces W previously held in one jig 5 and the one or more new workpieces W due to wear, for example, it may be determined that the type of the one or more workpieces W previously held in one jig 5 and the type of the one or more new workpieces W are the same.

[0213] Furthermore, if the shape of one or more new workpieces W is significantly different from the ideal shape of the workpieces W, for example due to wear, it may be determined that the type of one or more workpieces W previously held in a jig 5 is different from the type of one or more new workpieces W.

[0214] When one or more workpieces W removed from a jig 5 and one or more workpieces W newly attached to the jig 5 are the same type of workpieces W, the first batch information corresponding to the one or more workpieces W removed from the jig 5 and the second batch information corresponding to the one or more workpieces W newly attached to the jig 5 may include common information. An example of common information is jig information related to the jig 5.

[0215] When one or more workpieces W removed from a jig 5 and one or more workpieces W newly attached to the jig 5 are the same type of workpieces W, for example, sequence information related to repair of the workpieces W may be information common to the first batch information and the second batch information. In this case, for example, the reference model RM shown in FIG. 17( a) may also be information common to the first batch information and the second batch information. In other words, another example of the common information is at least one of sequence information related to repair and information related to the reference model RM.

[0216] When a jig 5 is reused to repair one or more new workpieces W, jig information related to the jig 5 and workpiece information related to the one or more new workpieces W may be registered in the information processing device 4. In other words, the information processing device 4 may register the jig information related to the jig 5 and the workpiece information related to the one or more new workpieces W, for example, as part of second batch information. At this time, in consideration of the above circumstances, the information processing device 4 may acquire at least a portion of the first batch information (i.e., batch information associated with the jig 5). Then, the information processing device 4 may register at least a portion of the acquired first batch information as part of the second batch information. In other words, the information processing device 4 may reuse at least a portion of the first batch information. In other words, at least a portion of the first batch information may be reused as part of other batch information (e.g., second batch information).

[0217] By configuring it in this manner, the operator of the information processing device 4 can avoid the need to repeatedly input information common to one or more workpieces W that were previously held in a jig 5 and one or more new workpieces W.

[0218] For example, the information processing device 4 may reuse the sequence information included in the first batch information as part of the second batch information. For example, when the identification information of a jig 5 as an example of jig information related to a jig 5 is read, the calculation device 41 of the information processing device 4 may automatically acquire the sequence information included in the first batch information associated with the jig 5 from the storage device 42. The sequence information included in the first batch information may be reused for machining (in other words, repairing) the one or more new workpieces W. Because the sequence information is used for machining one or more new workpieces W, the sequence information may also be referred to as machining information. In this case, it can be said that the machining information included in the first batch information may be reused in machining one or more new workpieces W. In other words, it can be said that after machining one or more workpieces W held in a jig 5 has been completed, the machining information included in the first batch information may be reused in machining one or more new workpieces W held in the jig 5.

[0219] In this case, the information processing device 4 may set a schedule for processing the batch corresponding to the second batch information (i.e., one or more new workpieces W held in one jig 5) based on the processing information (i.e., sequence information) included in the first batch information and the processing device information for each of the processing devices 1#1 and 1#2.

[0220] By configuring in this manner, a series of operations (i.e., a sequence) registered (in other words, assigned) to one jig 5 can be performed on one or more workpieces W held on one jig 5, and then the series of operations registered to one jig 5 can be read out again, and the above series of operations can be set and performed on one or more new workpieces W held on one jig 5.

[0221] For example, if the machining locations of one or more workpieces W previously held in a jig 5 are the same as the machining locations of one or more new workpieces W, the information processing device 4 may acquire at least a portion of the batch information previously registered and associated with the jig 5 (in other words, information linked to the jig information related to the jig 5). Here, "the machining locations are the same" is not limited to meaning that the overall shapes of the workpieces W are the same or similar and the machining locations of the workpieces W are the same. For example, even if the overall shapes of the workpieces W are dissimilar, if the shapes of the machining locations of the workpieces W are the same or similar, it may be determined that "the machining locations are the same."

[0222] For example, the information processing device 4 may acquire at least a portion of batch information associated with another jig 5 of the same jig type as the jig type indicated by the jig information related to the one jig 5 (see, for example, FIG. 21 ) as part of the batch information associated with the one jig 5. For example, the information processing device 4 may acquire machining control information (specifically, machining path information) included in the batch information associated with the other jig 5 as part of the patch information associated with the one jig 5. In this case, the information processing device 4 may acquire the machining control information included in the batch information associated with the other jig 5 as part of the patch information associated with the one jig 5 before the machining of one or more workpieces W held on the other jig 5 is completed. Then, the machining control information included in the batch information associated with the other jig 5 may be used in machining one or more workpieces W held on the one jig 5. In this case, the machining of one or more workpieces W held on the one jig 5 and the machining of one or more workpieces W held on the other jig 5 may be performed in parallel. The end time of machining one or more workpieces W held by one jig 5 may coincide with the end time of machining one or more workpieces W held by another jig 5 .

[0223] In this way, the processing control information contained in the batch information associated with another jig 5 may be used in processing one or more workpieces W held in one jig 5, even if the processing of one or more workpieces W held in the other jig 5 has not yet been completed.

[0224] (4) Information Processing Device 4 (4-1) Repair Management Software As described above, the information processing device 4 may manage at least a part of the process, for example, from the reception of the workpiece W as an item requiring repair to the shipment of the workpiece W after repair processing. In other words, the information processing device 4 may manage the operation of each of the multiple processing devices 1, the multiple measuring devices 2, and the transport device 3 included in the processing system SYS. In order to realize the management of the operation of each of the multiple processing devices 1, the multiple measuring devices 2, and the transport device 3, operation management software may be installed in the information processing device 4. In other words, the information processing device 4 may manage the operation of each of the multiple processing devices 1, the multiple measuring devices 2, and the transport device 3 by executing the operation management software.

[0225] The following description will be given taking as an example operation management software that manages information related to repair processing of workpieces W that require repair, thereby managing the operations of the plurality of processing devices 1, the plurality of measuring devices 2, and the transport device 3. Such software may be referred to as repair management software.

[0226] The display device 451 of the information processing device 4 may display, for example, an image 4500 shown in FIG. 24 . Note that the image 4500 is an example of a UI (User Interface) image. The image 4500 shows a so-called tab bar. The image 4500 includes three icons, tab1, tab2, and tab3, each representing a tab. When an operator (i.e., a user) of the information processing device 4 selects the icon tab1 via the input device 44, the calculation device 41 may control the output device 45 to display repair information. When the operator of the information processing device 4 selects the icon tab2 via the input device 44, the calculation device 41 may control the output device 45 to display device information. When the operator of the information processing device 4 selects the icon tab3 via the input device 44, the calculation device 41 may control the output device 45 to display an image for creating a sequence.

[0227] A sequence is a flow that occurs when the workpiece W is machined by the machining system SYS. Procedures that occur before and after machining (for example, measurements before and after machining by the measuring device 2, purging of the machining device 1, generation of machining control information, etc.) may be included in the sequence. These procedures may also be called "tasks." When the workpiece W is machined by the machining system SYS, the sequence may be rephrased as a machining flow. When the workpiece W is repaired by the machining system SYS, the sequence may be rephrased as a repair flow.

[0228] (4-1-1) Display of Device Information When an operator of the information processing device 4 selects icon tab2 via the input device 44, the calculation device 41 may control the output device 45 so that, for example, an image 4501 shown in FIG. 25 is displayed on the display device 451. Note that the image 4501 is another example of a UI image. The image 4501 may include information related to devices registered in the information processing device 4 (for example, one or more processing devices 1, one or more measuring devices 2, etc.).

[0229] The information related to the measuring device 2 may include, for example, the device ID, installation location, workpiece size, and measurement resolution. Note that the information related to the measuring device 2 is not limited to the device ID, installation location, workpiece size, and measurement resolution, and may include any information. Note that if the measuring device 2 is not performing a measurement, the field corresponding to the workpiece size may be left blank. Note that the installation location may be, for example, identification information (e.g., name, identification number) indicating the location where the device is installed, or may be coordinates (e.g., latitude, longitude, and altitude) obtained using a GPS (Global Positioning System).

[0230] The information related to the processing device 1 may include, for example, the device ID, installation location, work size, and powder. Note that the information related to the processing device 1 is not limited to the device ID, installation location, work size, and powder, and may include any information. Note that when the processing device 1 is not performing processing, the fields corresponding to the work size and powder may be blank.

[0231] (4-1-2) Display of Repair Information When the operator of the information processing device 4 selects icon tab1 (see, for example, FIG. 24 ) via the input device 44, the calculation device 41 may control the output device 45 so that, for example, image 4502 shown in FIG. 26 is displayed on the display device 451. Note that image 4502 is another example of a UI image. Note that images 4503 to 4509, which will be described later, are also other examples of UI images.

[0232] In image 4502, the portion surrounded by a dashed frame 4502c shows repair information related to one batch (i.e., one or more workpieces W held on one jig 5). In other words, image 4502 can be said to be an image showing repair information for each batch. In other words, image 4502 can be said to be an image showing a list of multiple batches. Therefore, the operator can check the repair information for each of multiple batches at once. Note that repair information corresponds to an example of the batch information described above.

[0233] A method for registering repair information in the information processing device 4 will now be described. When the operator of the information processing device 4 selects button 4502a (i.e., the "command registration" button) via the input device 44, the calculation device 41 may control the output device 45 so that, for example, an image 4503 shown in FIG. 27 is displayed on the display device 451. Note that the image 4503 may be displayed superimposed on the image 4502.

[0234] The operator may edit (in other words, input) the jig serial number (jig SN) by selecting button 4503a (i.e., the "Edit" button) via the input device 44. The operator may select the name of a project registered in the information processing device 4 from a pull-down menu related to the project field via the input device 44. The operator may input the name of any project in the project field via the input device 44.

[0235] The name of the project may be given, for example, for each order for repair. In this case, the name of the project may be a list of numbers indicating the date of receipt of the order for repair. The name of the project may be, for example, the name of the part to be repaired. For example, if the workpiece W is a turbine blade that requires repair of the tip portion, the name of the project may be "Tip." Note that a project indicates customer information and an overview of the repair.

[0236] The operator may select a sequence registered in the information processing device 4 from a pull-down menu related to the sequence column via the input device 44. Note that only sequences corresponding to the project may be selectable from the pull-down menu related to the sequence column. Note that the sequence may differ depending on at least one of the type and shape of the workpiece W and the repair location of the workpiece W, for example. As described above, a sequence is a flow that occurs when the workpiece W is machined by the machining system SYS.

[0237] The operator may input the arrangement of each workpiece W in the jig 5 and the workpiece serial number of each workpiece W via the input device 44. Here, the serial number of each workpiece W may function as identification information assigned to each workpiece W to identify each workpiece W. The serial number does not have to be represented by a string of numbers. For example, the serial number may be represented by at least one of letters, numbers, and symbols. The serial number of the workpiece W may be input to the information processing device 4 by reading at least one of a read code and a non-contact communication tag assigned to the workpiece W with the information processing device 4 (e.g., the input device 44). The arrangement of the workpiece W may be represented, for example, by the position of each of the multiple mechanical chucks 55 provided in the jig 5. The arrangement of the workpiece W may be, for example, information indicating which of the multiple mechanical chucks 55 provided in the jig 5 is being used (in other words, information indicating how many workpieces W are held by the jig 5).

[0238] When the operator selects button 4503a via the input device 44, the calculation device 41 may control the output device 45 so that, for example, image 4504 shown in FIG. 28 is displayed on the display device 451. Note that image 4504 may be displayed superimposed on image 4503. When the operator uses scanning of a barcode (equivalent to an example of the read code described above) attached to the jig 5, the operator may select button 4504a (i.e., the "Start Scan" button) via the input device 44. In this case, the calculation device 41 may acquire information indicated by the barcode as the jig serial number. In other words, the operator may use a scanner to scan the barcode attached to the jig 5, thereby automatically inputting identification information of the jig 5 into the information processing device 4. When the barcode is scanned, the type of jig 5 and its individual component (e.g., jig No.) may be identified based on, for example, the table shown in FIG. 21. Then, the identification information (e.g., serial number) of the jig 5 may be identified from, for example, the table shown in FIG. 21 (in other words, pre-registered data). The serial number of the jig 5 may be expressed as a combination of a jig ID indicating the type of jig 5 and a jig number indicating the individual jig 5. For example, if the jig ID of the jig 5 is "00001" and the jig number of the jig 5 is "00001", the serial number of the jig 5 may be "00010001".

[0239] If the operator does not use scanning of the barcode attached to the jig 5, the operator may select the words "Manual Input" included in the image 4504 via the input device 44. When the words "Manual Input" are selected, information for identifying the jig 5 may be directly input by the operator instead of the barcode. In this case, the calculation device 41 may control the output device 45 so that, instead of the image 4504, an image 4505 shown in FIG. 29 is displayed on the display device 451. Note that, when the operator wishes to finish editing the jig serial number, the operator may select a button 4504b (i.e., a "Cancel" button) via the input device 44. In this case, the calculation device 41 may control the output device 45 so that the image 4504 is not displayed on the display device 451.

[0240] With image 4505 displayed on display device 452, the operator may select the radio button to the left of the words "Edit Jig SN" via input device 44. In this case, arithmetic unit 41 may control output device 45 so that the input field below the words "Edit Jig SN" becomes input-enabled. In this case, the operator may input the serial number of the jig 5 via input device 44. The arithmetic unit 41 may acquire the information input in the input field as the jig serial number. Note that the operator may input the serial number of the jig 5 via input device 44, for example, by selecting one jig 5 from a pull-down menu or a jig list.

[0241] With the image 4505 displayed on the display device 452, the operator may select the radio button to the left of the words "Jig Information Selection" via the input device 44. In this case, the calculation device 41 may control the output device 45 so that the jig ID field and the jig No. field are each selectable. The jig ID may be a number indicating the type or shape of the jig. The jig No. may be a serial number that manages the number of jigs of a specific type. At least one of the jig ID and the jig No. may be the same as the serial number of the jig 5, or both the jig ID and the jig No. may be different from the serial number of the jig 5.

[0242] The operator may select a registered jig ID from a pull-down menu via the input device 44. The operator may also select a jig No. from the pull-down menu via the input device 44. Then, the operator may select the button 4505a (i.e., the "Open" button) via the input device 44. As a result, the calculation device 41 may acquire the jig serial number identified based on the jig ID and jig No. As described above, for example, a table shown in FIG. 21 may be stored in the storage device 42. The calculation device 41 may identify one jig 5 from the table based on the jig ID and jig No. Then, the calculation device 41 may identify the identification information (e.g., the serial number) of the jig 5 from the table.

[0243] When the operator wishes to end the editing of the jig serial number, he or she may select the button 4505b (i.e., the "Cancel" button) via the input device 44. In this case, the calculation device 41 may control the output device 45 so that the image 4505 is not displayed on the display device 451.

[0244] When the calculation device 41 acquires the jig serial number, the calculation device 41 may control the output device 45 so that the acquired jig serial number is displayed in the jig SN field of image 4503 shown in Fig. 27. When the operator enters predetermined information into each of the multiple input fields included in image 4503 via the input device 44, the output device 45 may display, for example, image 4506 shown in Fig. 30 on the display device 451. When image 4506 is displayed on the display device 452, the operator selects button 4503b (i.e., the "Register" button) via the input device 44, whereby the repair information is registered.

[0245] 26, the repair information may include, for example, the following items: "jig serial number," "work name," "registration date," "progress," "measuring device," and "processing device." Note that the repair information is not limited to the items "jig serial number," "work name," "registration date," "progress," "measuring device," and "processing device," and may include any item.

[0246] The "jig serial number" field of the repair information for one batch may include the jig serial number registered by the above-mentioned registration operation. Note that the jig serial number corresponds to an example of the above-mentioned jig information.

[0247] The "Registration Date" column may include the date on which the repair information was registered in the information processing device 4. The "Progress" column may include information indicating the progress of the repair. The information indicating the progress of the repair may include the name of the task. Note that, if a task is currently being executed, the information indicating the progress of the repair may include a seek bar 4502d. The information indicating the progress of the repair of a batch for which repair has been completed may include the name of the last task performed. The information indicating the progress of the repair of a waiting batch may include the name of the next task to be performed.

[0248] As described above, image 4502 is an image showing a list of multiple batches. Therefore, image 4502 displays multiple progress statuses corresponding to the multiple batches. Therefore, the operator of information processing device 4 can recognize, for example, multiple batches that are being processed simultaneously from image 4502. In other words, image 4502 can present the operator with repair information for, for example, multiple batches that are being processed in parallel.

[0249] The "measuring device" column may include, for example, action instruction information 4502f indicating action instructions for at least one of the operator of the information processing device 4 and the user (e.g., worker) of at least one of the processing device 1 and the measuring device 2. Examples of action instruction information include an instruction to "carry the jig into the measuring device" and an instruction to "remove the jig from the measuring device."

[0250] The "processing device" column may include, for example, action instruction information 4502g indicating action instructions for at least one of the operator of the information processing device 4 and the user (e.g., worker) of at least one of the processing device 1 and the measuring device 2. Examples of action instruction information include an instruction to "carry the jig into the processing device" and an instruction to "remove the jig from the processing device."

[0251] When the operator of the information processing device 4 selects one of the items included in the filter column 4502b via the input device 44, the calculation device 41 may control the output device 45 so that repair information corresponding to the selected item is displayed on the display device 451.

[0252] For example, if the operator selects the check box to the left of the item "Unexecuted" included in the filter column 4502b via the input device 44, the calculation device 41 may control the output device 45 so that repair information related to the waiting batch is displayed on the display device 451.

[0253] For example, if the operator selects the check box to the left of the item "Running" included in the filter column 4502b via the input device 44, the calculation device 41 may control the output device 45 so that repair information related to the batch for which the task is being executed is displayed on the display device 451.

[0254] For example, if the operator selects the check box to the left of the item "Completed" included in the filter column 4502b via the input device 44, the calculation device 41 may control the output device 45 so that repair information related to the batch for which repair has been completed is displayed on the display device 451.

[0255] As described above, by the operator selecting one of the items included in the filter column 4502b via the input device 44, the operator can check the repair information for one or more batches for each batch status (in other words, repair status).

[0256] When the operator selects the button 4502e (i.e., the "details" button) via the input device 44, the calculation device 41 may control the output device 45 so that, for example, an image 4507 shown in FIG. 31 is displayed on the display device 451. Note that the image 4507 may be displayed superimposed on the image 4502.

[0257] When the operator selects the button 4507a (i.e., the "history" button) via the input device 44, the calculation device 41 may control the output device 45 so that, for example, an image 4508 shown in FIG. 32 is displayed on the display device 451. Note that the image 4508 may be displayed superimposed on the image 4507.

[0258] When all tasks related to the repair of one batch are completed, the word "Completed" may be displayed in the "Status" item. When the repair of one batch is interrupted before all tasks related to the repair of the batch are completed, the "Status" item may display a word indicating the reason for the interruption of the repair (for example, "Error Stopping" or "Canceled"). In this case, the "Process" item may display a word indicating the process in which the repair was interrupted (for example, "Machining Path Generation" or "Scanning"). Note that "Machining Path Generation" may refer to the process in which the control information generating device 22 of the measuring device 2 described above generates machining control information. "Scanning" may refer to the process in which the shape measuring device 21 of the measuring device 2 described above measures the three-dimensional shape of the workpiece W.

[0259] Returning to FIG. 31 , the sequence progress column 4507b of the image 4507 may include a flowchart showing a processing flow related to repair, i.e., a sequence. Since the workpiece W is repaired by processing the workpiece W, the processing flow related to repair may also be called a processing flow. As described above, a sequence is a flow that occurs when processing the workpiece W in the processing system SYS. Therefore, a sequence may also be called a processing flow or a processing flow.

[0260] For example, in an operation according to the flowchart displayed in the sequence progress column 4507b, the information processing device 4 may first instruct the control device 23 of one measuring device 2 to measure (i.e., scan) one or more workpieces W held on one jig 5. After the measurement of one or more workpieces W held on one jig 5 is completed, the control device 23 may send a signal indicating that the measurement is completed to the information processing device 4. The information processing device 4 may instruct the control device 23 to generate a machining path based on the measurement results of one or more workpieces W held on one jig 5. When one or more workpieces W held on one jig 5 are placed on one processing device 1, the control device 17 of the processing device 1 may send a signal indicating that the workpieces W have been placed to the information processing device 4. The information processing device 4 may instruct the control device 17 to purge the chamber space 183IN of the one processing device 1.

[0261] When the generation of the machining path is completed, the control device 23 may transmit a signal indicating that the generation of the machining path is completed to the information processing device 4. At this time, the control device 23 may transmit machining path information (or machining control information including the machining path information) to the information processing device 4. When the purging of the chamber space 183IN is completed, the control device 17 may transmit a signal indicating that the purging of the chamber space 183IN is completed to the information processing device 4. In this case, the information processing device 4 may transmit the machining path information (or machining control information) to the control device 17. The information processing device 4 may further instruct the control device 17 to machine one or more workpieces W held on one jig 5 based on the machining path information (or machining control information).

[0262] After the processing of one or more workpieces W held on one jig 5 is completed, the control device 17 may send a signal indicating that the processing is completed to the information processing device 4. Thereafter, when one or more workpieces W held on one jig 5 are placed on one measuring device 2, the control device 23 of the one measuring device 2 may send a signal indicating that the workpieces W have been placed to the information processing device 4. The information processing device 4 may instruct the control device 23 to measure (i.e., inspect) one or more workpieces W held on one jig 5.

[0263] The flowchart pattern included in the sequence progress column 4507b may change depending on the sequence related to the repair (for example, the sequence in the sequence column included in the image 4506 shown in FIG. 30). For example, the flowchart pattern may include a pattern including five blocks, "Scan," "Processing Path Generation," "Purge," "Modeling," and "Inspection," as shown in FIG. 33(a); a pattern including two blocks, "Scan" and "Processing Path Generation," as shown in FIG. 33(b); and a pattern including four blocks, "Scan," "Processing Path Generation," "Purge," and "Modeling," as shown in FIG. 33(c). The flowchart patterns are not limited to these. For example, a block called "Modeling" may follow a block called "Inspection" shown in FIG. 33(a). "Scan" may be referred to as "Pre-machining measurement." "Inspection" may be referred to as "Post-machining measurement."

[0264] The blocks included in the above flowchart will be further described with reference to FIG. 34. As shown in FIG. 34(a), one block includes three parts. Part col1 may include the type of device that executes the task and identification information for identifying the device. The identification information may be the device ID included in image 4501 shown in FIG. 25. Part col2 may include the name of the task. Part col3 may include information indicating the progress of the task. When the task is being executed, part col3 may include a seek bar and a character string indicating the time.

[0265] Note that the portion col3 of the block relating to the task being executed may contain the character string "Running" which indicates that the task is being executed.

[0266] In FIG. 34(a), "tt:tt:tt" in "tt:tt:tt / TT:TT:TT:TT" may indicate the elapsed time since the start of the task. "TT:TT:TT" may indicate the estimated time required for the task. Note that while col3 of a block related to a task that has not yet been executed may include a character string indicating the estimated time required for the task, it may not include a character string indicating the elapsed time since the start of the task. Alternatively, col3 of a block related to a task that has not yet been executed may include a seek bar.

[0267] The portion col3 of the block related to the completed task may include the character string "Completed" indicating that the task has been completed, as shown in Fig. 34(b). The portion col3 of the block related to the interrupted task may include a character string indicating the reason for the interruption of the task (e.g., "Error Stopping" or "Canceled").

[0268] The flowchart shown in FIG. 31 includes tasks related to the measuring device 2, such as “scanning,” “processing path generation,” and “inspection,” and tasks related to the processing device 1, such as “purging” and “molding.”

[0269] "Generation of machining path" is a task that can be executed even if the workpiece W is not placed in the measuring device 2. Therefore, after the measuring device 2 has finished "scanning" to measure the workpiece W, the workpiece W can be transported from the measuring device 2 to the processing device 1. As a result, "purging", in which the chamber space 183IN is purged with the workpiece W placed in the processing device 1, and "generation of machining path" may be performed in parallel.

[0270] As described above, the measuring device 2 includes the shape measuring device 21 and the control information generating device 22. A task (e.g., scanning) performed by the shape measuring device 21 requires that a workpiece W be placed in the measuring device 2. On the other hand, a task (e.g., machining path generation) performed by the control information generating device 22 can be executed even if a workpiece W is not placed in the measuring device 2. For example, a machining path generation task takes a time of several tens of minutes to several tens of minutes, and during that time, a task that can be executed on the machining device 1 side is executed in parallel with a task on the measuring device 2 side.

[0271] For example, there are tasks that cannot be executed unless one or more workpieces W held by the jig 5 are placed inside the device (e.g., at least one of the machining device 1 and the measuring device 2), and tasks that can be executed even if one or more workpieces W held by the jig 5 are not placed inside the device. Each task may be assigned a first flag indicating that one or more workpieces W held by the jig 5 must be placed inside the device, or a second flag indicating that the task can be executed even if one or more workpieces W held by the jig 5 are not placed inside the device. The calculation device 41 may determine whether two or more tasks can be executed in parallel based on the flag assigned to each task.

[0272] In the above flowchart, two or more tasks that can be performed in parallel may be displayed in parallel along a second direction (e.g., the left-right direction in FIG. 31 ) that intersects with a first direction (e.g., the up-down direction in FIG. 31 ) that indicates the passage of time. By displaying two or more tasks that can be performed in parallel in the second direction, the operator of the information processing device 4 can be visually notified of two or more tasks that can be performed in parallel.

[0273] (4-1-3) Creating a Sequence For example, one or more sequences suitable for at least one of the type and shape of the workpiece W and the repair location of the workpiece W may be prepared in advance. On the other hand, the operator of the information processing device 4 may create a new sequence. The following describes how the operator creates a new sequence.

[0274] When the arithmetic device 41 acquires the jig serial number, the arithmetic device 41 may control the output device 45 so that, for example, image 4509 shown in FIG. 35 is displayed on the display device 451. Note that image 4509 is another example of a UI image. Note that images 4510 to 4513, which will be described later, are also other examples of UI images. The acquired jig serial number may be displayed in the jig information field 4509b. In other words, in this embodiment, the jig 5 may be linked to a newly created sequence.

[0275] When the operator selects the button 4509a (i.e., the "change jig" button) via the input device 44, the calculation device 41 may control the output device 45 so that, for example, an image 4504 shown in Fig. 28 is displayed on the display device 451. As a result, the operator can change the jig 5 associated with the newly created sequence.

[0276] Existing sequences may be displayed in a sequence field 4509e of the image 4509. When the operator selects one of the existing sequences displayed in the sequence field 4509e via the input device 44 and then selects the button 4509d (i.e., the "Delete" button), the calculation device 41 deletes the selected sequence.

[0277] When the operator selects button 4509c (i.e., the "Create Sequence" button) via the input device 44, the calculation device 41 may control the output device 45 so that, for example, an image 4510 shown in FIG. 36 is displayed on the display device 451. Note that the image 4510 may be displayed superimposed on the image 4509. Note that, for example, the image 4506 shown in FIG. 30 may be configured to be able to transition to the image 4510 shown in FIG. 36.

[0278] The operator may input an arbitrary sequence name in the sequence name field of the image 4510 via the input device 44. The operator may input an arbitrary description (e.g., a description of the sequence) in the description field of the image 4510 via the input device 44. When ending the creation of the sequence, the operator may select the button 4510c (i.e., the "Cancel" button) via the input device 44. In this case, the calculation device 41 may control the output device 45 so that the image 4510 is not displayed on the display device 451.

[0279] When the operator selects the sub-sequence setting icon 4510a via the input device 44, the calculation device 41 may control the output device 45 so that, for example, an image 4511 shown in FIG. 37 is displayed on the display device 451. Note that the image 4511 may be displayed superimposed on the image 4510. Note that the sub-sequence refers to the sequence from measurement to the generation of processing control information. By changing the contents of the sub-sequence, it is possible to select repair specifications or the process up to the generation of processing control information. Sequences other than sub-sequences, i.e., sequences related to the execution of processing based on processing control information, may be called main sequences.

[0280] Existing subsequences may be displayed in a sequence field 4511c included in the image 4511. When the operator selects one of the existing subsequences displayed in the sequence field 4511c via the input device 44 and then selects the button 4511i (i.e., the "Delete" button), the calculation device 41 deletes the selected subsequence.

[0281] When the operator selects one of the existing subsequences displayed in the sequence column 4511c via the input device 44, the calculation device 41 may control the output device 45 so that information related to the selected subsequence is displayed in the edit column 4511d.

[0282] When the operator selects the button 4511e (i.e., the "Preview" button) via the input device 44 while information related to one subsequence is displayed in the editing field 4511d, the calculation device 41 may control the output device 45 so that, for example, the three-dimensional shape of the workpiece W related to the one subsequence is displayed in the editing field 4511d. As a result, for example, the image 4512 shown in FIG. 38 may be displayed on the display device 451. For example, the operator of the information processing device 4 may refer to the three-dimensional shape of the workpiece W to confirm whether the item to be repaired (i.e., the workpiece W), the location to be repaired, and the amount of repair are appropriate. If the operator determines that the subsequence is inappropriate, the operator may select a different subsequence or modify the current subsequence via the input device 44. Note that the modifications made by the operator via the input device 44 are reflected in the display of the editing field 4511d. This allows the operator to confirm whether their modifications are appropriate. 38, when the three-dimensional shape of the workpiece W related to one subsequence is displayed in the edit field 4511d and the operator selects a button 4511f (i.e., the "Details" button) via the input device 44, the calculation device 41 may control the output device 45 so that information related to the one subsequence is displayed in the edit field 4511d. As a result, for example, the image 4511 shown in FIG. 37 may be displayed on the display device 451.

[0283] When information related to one subsequence is displayed in the edit column 4511d, if the operator selects button 4511h (i.e., the "edit" button) via the input device 44, it becomes possible to edit the information related to one subsequence displayed in the edit column 4511d. Similarly, when the three-dimensional shape of the workpiece W related to one subsequence is displayed in the edit column 4511d, if the operator selects button 4511h (i.e., the "edit" button) via the input device 44, it becomes possible to edit the three-dimensional shape of the workpiece W related to one subsequence displayed in the edit column 4511d.

[0284] When the operator creates a new subsequence, the operator may select the button 4511a (i.e., the "Create New" button) via the input device 44. In this case, the calculation device 41 may control the output device 45 so that the new subsequence is added to the sequence field 4511c. For example, the operator may edit the name of the new subsequence added to the sequence field 4511c via the input device 44. For example, when the button 4511a is selected by the operator's input via the input device 44, the calculation device 41 may control the output device 45 so that the new subsequence is added to the sequence field 4511c in an editable state. In this case, the operator may edit the name of the new subsequence in an editable state via the input device 44.

[0285] When the operator selects a new subsequence, the calculation device 41 may control the output device 45 so that information related to the selected new subsequence is displayed in the edit field 4511d. When the operator selects the button 4511h (i.e., the "edit" button) via the input device 44 while the information related to the new subsequence is displayed in the edit field 4511d, the information related to the new subsequence displayed in the edit field 4511d can be edited.

[0286] For example, when the operator selects the item "Repair List" displayed in the edit column 4511d via the input device 44, an image 4513 shown in FIG. 39 may be displayed in the edit column 4511d.

[0287] The items included in the "Repair List" category, such as "Scan," "Trimming Process (Workpiece)," "Dividing Process (Workpiece)," "Trimming Process (Base)," "Dividing Process (Base)," "Alignment (Workpiece)," "Alignment (Base)," "Model Synthesis," "Difference Extraction," "Model Machining," and "Alignment," are names of tasks (in other words, subsequences). The names of the tasks included in the "Repair List" category are not limited to those described above. The names and number of tasks included in the "Repair List" category may vary depending on the workpiece W. For example, the operator may select a workpiece name from a pull-down menu of workpiece names displayed in the edit field 4511d of the image 4511 shown in FIG. 37 via the input device 44, thereby changing the names and number of tasks included in the "Repair List" category. If the workpiece W is a turbine blade, the selectable workpiece names may include at least one of, for example, "Shroud Rail," "Simulation of Shroud Rail," and "Tip Section."

[0288] Returning to FIG. 39 , the operator can edit each task by selecting the edit button to the right of the input field for each task via the input device 44. Note that if an appropriate input is made in the input field for a task, the task may be treated as part of the subsequence. On the other hand, if no input is made in the input field for a task (in other words, if the input field for a task is left blank), the task may not be treated as part of the subsequence. In other words, the operator can add a task to the subsequence by editing the input field for the task via the input device 44. On the other hand, the operator can remove a task from the subsequence by leaving the input field for the task blank via the input device 44.

[0289] 37 is completed, the operator may select button 4511g (i.e., the "DB registration" button) via input device 44. As a result, calculation device 41 may register the editing results of edit field 4511d in a database constructed in storage device 42, for example.

[0290] When the operator selects one of the subsequences displayed in the sequence field 4511c via the input device 44 and then selects button 4511j (i.e., the "Select" button), the calculation device 41 may control the output device 45 so that information related to the selected subsequence is displayed in the subsequence field included in the image 4510 shown in Figure 36. Thereafter, when the operator selects button 4510b (i.e., the "Record" button) via the input device 44, the calculation device 41 may create a new sequence based on the input content for the image 4510.

[0291] When editing a subsequence, an image showing a flowchart similar to the flowchart included in the sequence progress column 4507b of image 4507 shown in FIG. 31 may be displayed instead of or in addition to image 4513 shown in FIG. 39 . For example, when the operator selects a block included in the flowchart via the input device 44, the arithmetic unit 41 may control the output device 45 so that an image for editing the tasks related to the selected block is displayed on the display device 451. Furthermore, when the operator swaps the position of a block included in the flowchart with the position of another block via the input device 44, the arithmetic unit 41 may swap the execution order of the tasks related to the one block and the tasks related to the other block. This configuration allows the operator to intuitively edit a subsequence.

[0292] (4-2) Operation of Information Processing Device 4 The operation of the information processing device 4 will now be described.

[0293] (4-2-1) Setting of Repair Information The process of setting repair information performed by the information processing device 4 will be described with reference to the flowchart of Fig. 40. The process of setting repair information corresponds to the registration of repair information described with reference to Figs. 27 to 30.

[0294] 40 , the arithmetic device 41 of the information processing device 4 acquires processing object information (step S201). The processing object information is information related to the workpiece W held in one jig 5. For example, the arithmetic device 41 may acquire, as the processing object information, information related to the workpiece W input by an operator of the information processing device 4 via the input device 44. Note that the workpiece W may be provided with a readable code (e.g., at least one of a two-dimensional code and a barcode) or a non-contact communication tag. In this case, the arithmetic device 41 may acquire the processing object information by reading the readable code or the non-contact communication tag.

[0295] The calculation device 41 may read the processing object information from the read code or non-contact communication tag of the jig 5. Here, the jig 5 is made according to at least one of the type of workpiece W and the processing object (i.e., the workpiece W itself). Therefore, the jig 5 is linked to the type of workpiece W and the processing object. For example, the item "repair location" included in the table shown in FIG. 21 can be said to be information for linking the jig 5 with the type of workpiece W and the processing object.

[0296] For example, the calculation device 41 may acquire the processing object information based on the acquired identification information of the jig 5 and, for example, a table shown in FIG. 21. At a site where many types of workpieces W are processed and repair portions of the workpieces W are processed, a large number of different jigs exist. In this embodiment, the work process is organized based on the jig 5. In other words, the processing object information is managed by the jig 5. As a result, the work efficiency of the operator at the site can be improved. For example, by managing multiple jigs using the table shown in FIG. 21, data can be managed centrally.

[0297] In the processing of step S201, the calculation device 41 may obtain jig information related to the jig 5 (for example, the jig serial number mentioned above) by reading at least one of the reading code and the non-contact communication tag provided on the jig 5.

[0298] After the processing of step S201, the calculation device 41 acquires processing flow information related to the workpiece W (step S202). Here, the processing flow information may include, for example, processing information for processing the workpiece W, measurement information for measuring the workpiece W, and transport information for transporting the workpiece W. The processing flow information does not have to include at least one of the measurement information and the transport information. For example, the calculation device 41 may acquire processing flow information based on a sequence input by the operator of the information processing device 4 via the input device 44 (specifically, for example, one sequence selected from a pull-down menu related to the sequence field of the image 4503 shown in FIG. 27). The processing flow information may also be referred to as sequence information.

[0299] The machining information may include, for example, machining object information, machining task information, machining specification information, and machining time information. The machining object information may include information regarding the portion of the workpiece W to be machined and information regarding the quantity of the workpieces W. The machining task information may be set based on the above sequence. The machining task information may include, for example, at least one of a machining task, a purging task, a pre-machining task, a finishing machining task, and a powder filling task. The machining task information may include a task that is performed when the workpiece W is placed in the machining device 1, and a task that is performed when the workpiece W is not placed in the machining device 1. The machining specification information may include, for example, machining path information. The machining specification information may be information regarding the content of machining of the workpiece W by the machining device 1. The machining specification information may include target shape information regarding the target shape of the workpiece W after machining (for example, the reference model RM shown in FIG. 17( a)). The machining specification information may include difference information (for example, a difference model DM shown in FIG. 18( c)) regarding the difference between the target shape of the workpiece W after machining and the three-dimensional shape of the workpiece W measured by the measuring device 2. The machining time information is, for example, information indicating the time required to machine the workpiece W, estimated based on the machining task information and the machining specification information. The machining time information may include multiple processing times corresponding to multiple tasks related to machining. In other words, the machining time information may include the processing time for each task. The machining information may be set in association with the jig 5 that holds the workpiece W. In this case, the calculation device 41 may store the machining information in the storage device 42 in association with the jig 5 that holds the workpiece W. At least one of the processes of steps S201 to S204 included in the flowchart of FIG. 40 may include a process for storing the machining information in the storage device 42 in association with the jig 5 that holds the workpiece W.

[0300] The measurement information may include, for example, measurement target information, measurement task information, measurement specification information, and measurement time information. The measurement target information may be the same as the machining target information described above. The measurement task information may be set based on the above sequence. The measurement task information may include, for example, at least one of a measurement task (in other words, a pre-machining measurement task), a post-forming inspection task (in other words, a post-machining measurement task), and a machining path generation task. The measurement task information may include a task performed when the workpiece W is placed in the measurement device 2 and a task performed when the workpiece W is not placed in the measurement device 2. The measurement time information is, for example, information indicating the time required to measure the workpiece W, estimated based on the measurement task information and the measurement specification information. The measurement time information may include multiple processing times corresponding to multiple measurement-related tasks, respectively. In other words, the measurement time information may include the processing time for each task. The measurement information may be set in association with the jig 5 that holds the workpiece W. In this case, the calculation device 41 may store the measurement information in the storage device 42 in association with the jig 5 that holds the workpiece W.

[0301] The transport information may include, for example, transport target information, transport task information, transport specification information, and transport time information. The transport target information may be the same as the processing target information described above. The transport specification information may be information indicating the transport mode (e.g., transport by a person, automatic transport by a device, etc.). The transport time information is, for example, information indicating the time required to transport the workpiece W, estimated based on the transport task information and the transport specification information.

[0302] After the process of step S202, the calculation device 41 acquires flow time information (step S203). Here, the flow time information may be acquired based on the processing time information, measurement time information, and transport time information. For example, the calculation device 41 may acquire the total time of the processing time information, measurement time information, and transport time information as the flow time information.

[0303] The arithmetic unit 41 sets repair information based on the information acquired in the processes of steps S201 to S203 (step S204).

[0304] (4-2-2) Schedule Setting For example, as can be seen from image 4502 shown in FIG. 26 , multiple pieces of repair information (in other words, multiple pieces of batch information) corresponding to multiple batches may be registered in the information processing device 4. The information processing device 4 may set a schedule for each of the multiple batches in order to improve the operational efficiency of the processing system SYS. In other words, the information processing device 4 may set schedules for the multiple processing devices 1 and the multiple measuring devices 2 so that the multiple processing devices 1 and the multiple measuring devices 2 can efficiently process the multiple batches.

[0305] A schedule setting method performed by the information processing device 4 will be described below with reference to the flowchart of Fig. 41. In Fig. 41, the calculation device 41 of the information processing device 4 receives an execution instruction from an operator (step S301). For example, when the operator selects, via the input device 44, button 4502h (i.e., the "Execute" button) included in image 4502 shown in Fig. 26, the calculation device 41 may receive the execution instruction.

[0306] After the process of step S301, the calculation device 41 acquires the repair information for which execution has been instructed (step S302). In parallel with or before or after the process of step S302, the calculation device 41 acquires information about the devices included in the machining system SYS (step S303). Note that the information about the devices included in the machining system SYS may be referred to as device information.

[0307] The apparatus information may be generated based on the status of at least one of the processing apparatus 1, the measuring apparatus 2, and the transport apparatus 3, for example. Here, the apparatus information may include processing apparatus information related to the processing apparatus 1, measuring apparatus information related to the measuring apparatus 2, and transport apparatus information related to the transport apparatus 3. The apparatus information may include apparatus number information indicating the number of apparatuses included in the processing system SYS. The apparatus number information may indicate the number of processing apparatuses 1, the number of measuring apparatuses 2, and the number of transport apparatuses 3. The apparatus information may include installation location information indicating the installation locations of one or more apparatuses included in the processing system SYS. The installation location information may indicate the installation locations of the processing apparatus 1, the installation locations of the measuring apparatus 2, and the installation locations of the transport apparatus 3. The apparatus number information and the installation location information are collectively referred to as apparatus installation information. The processing apparatus information may include, for example, an apparatus ID related to the processing apparatus 1 and performance information indicating the performance (or specifications) of the processing apparatus 1. The performance information related to the processing device 1 may include, for example, at least one of information indicating the type of additional processing, information indicating laser power, information indicating specifications of the stage 131, information indicating the maximum size of the workpiece W that can be placed on the stage 131, and information related to the powder. The measuring device information may include, for example, a device ID related to the measuring device 2 and performance information indicating the performance (or specifications) of the measuring device 2. The transporting device information may include a device ID related to the transporting device 3 and performance information indicating the performance (or specifications) of the transporting device 3.

[0308] The device information may include, for example, at least one of information regarding the schedule of the processing device 1 and information regarding the schedule of the measuring device 2. Information regarding the schedule of the processing device 1 may be referred to as a processing schedule. If there are multiple processing devices 1, there may also be multiple processing schedules. That is, if there are processing devices 1#1 and 1#2, there may also be a processing schedule for the processing device 1#1 and a processing schedule for the processing device 1#2. Furthermore, information regarding the schedule of the measuring device 2 may be referred to as a measurement schedule. If there are multiple measuring devices 2, there may also be multiple measurement schedules. That is, if there are measuring devices 2#1 and 2#2, there may also be a measurement schedule for the measuring device 2#1 and a measurement schedule for the measuring device 2#2.

[0309] 22 , the machining schedule of machining device 1#1 is assigned a machining task for batch B#1 from time t2, and a machining task for batch B#3 from time t5. The machining schedule of machining device 1#2 is assigned a machining task for batch B#2 from time t3, and a machining task for batch B#4 from time t6. The measurement schedule of measuring device 2 is assigned a pre-machining measurement task for batch B#1 from time t1, a pre-machining measurement task for batch B#2 from time t2, a pre-machining measurement task for batch B#3 from time t3, and a pre-machining measurement task for batch B#4 from time t4. The measurement schedule of measuring device 2 is further assigned a post-machining measurement task for batch B#1 from time t5, a post-machining measurement task for batch B#2 from time t6, a post-machining measurement task for batch B#3 from time t7, and a post-machining measurement task for batch B#4 from time t8. 22, each of the machining schedule and the measurement schedule includes time periods when tasks are assigned (in other words, time periods when the tasks are in operation) and time periods when no tasks are assigned (in other words, time periods when the tasks are idle or on standby). Note that the machining schedule and the measurement schedule are not limited to schedules for devices that are capable of machining or measurement, and may include schedules for devices that are not in operation due to inspection, for example.

[0310] Incidentally, when a machining flow (i.e., a sequence) for one workpiece W includes a pre-machining measurement task, a machining task, and a post-machining measurement task, it is not necessary to set all of the schedules for the pre-machining measurement task, the machining task, and the post-machining measurement task at once. In other words, for one batch corresponding to one workpiece, the schedule for the pre-machining measurement task may be set first. Then, the schedule for the machining task may be set depending on when the pre-machining measurement task is completed. Then, the schedule for the post-machining measurement task may be set depending on when the machining task is completed. In other words, the schedule for each task included in the machining flow may be set sequentially depending on the progress of the machining flow for one workpiece W. By configuring in this way, an appropriate schedule can be set.

[0311] Next, the computing device 41 determines whether multiple execution instructions have been received (step S304). If it is determined in the process of step S304 that multiple execution instructions have been received (step S304: Yes), the computing device 41 sets the processing order of multiple batches corresponding to the multiple repair information items (step S305). In the process of step S305, the computing device 41 may select one or more batches from the multiple batches to be processed with priority over other batches. For example, if the project name included in the repair information (in other words, batch information) contains a predetermined character string, the computing device 41 may set the processing order of the batches so that the batch corresponding to the repair information item whose project name contains the predetermined character string is processed with priority. Note that the predetermined character string may be, for example, a character string indicating a specific customer or a character string indicating a delivery date.

[0312] The arithmetic device 41 may set the priority based on, for example, the number of workpieces W held in the jig 5 (in other words, the number of workpieces W included in one batch). For example, if the number of workpieces W included in one batch is smaller than the number of workpieces W included in other batches, the arithmetic device 41 may set the priority of the one batch higher than the priority of the other batches. The arithmetic device 41 may set the priority based on, for example, a project. The arithmetic device 41 may set the priority based on input from an operator via the input device 44. For example, the arithmetic device 41 may set the priorities of multiple batches in the order in which the operator inputs via the input device 44. The arithmetic device 41 may set the order of processing each batch based on the priority set for each batch.

[0313] If it is determined in the process of step S304 that multiple execution instructions have not been received (step S304; No), or after the process of step S305, the calculation device 41 sets a schedule based on the repair information acquired in the process of step S302 and the information regarding the schedule of each device acquired in the process of step S303 (step S306). The calculation device 41 may set a schedule based on the repair information, the information regarding the schedule of each device, and the device information. If multiple execution instructions have been received, the calculation device 41 may set a schedule for each of multiple batches based on the processing order set in the process of step S205. Based on the result of step S305, the calculation device 41 may set a schedule so that workpieces W included in a batch with a higher priority are processed in order. The calculation device 41 may set a schedule so that workpieces W included in a batch with a smaller number of workpieces W are processed first. The calculation device 41 may set a schedule so that workpieces W included in a batch related to a specific project are processed first.

[0314] 22 , when the calculation device 41 sets schedules for batches B#1 and B#2, the calculation device 41 may acquire repair information for batch B#1 and repair information for batch B#2. The calculation device 41 may acquire information regarding the schedules of the processing devices 1#1 and 1#2 and the measuring device 2. The calculation device 41 may set a schedule for repairing each of batches B#1 and B#2 based on the repair information for batch B#1, the repair information for batch B#2, and information regarding the schedules of the processing devices 1#1 and 1#2 and the measuring device 2.

[0315] Alternatively, when the calculation device 41 sets a schedule for batches B#1 and B#2, the calculation device 41 may acquire repair information for batch B#1 and repair information for batch B#2. The calculation device 41 may acquire information regarding the schedules of each of the processing devices 1#1 and 1#2 and the measuring device 2. The calculation device 41 may acquire device information for each of the processing devices 1#1 and 1#2 and the measuring device 2. The calculation device 41 may set a schedule for repairing each of batches B#1 and B#2 based on the repair information for batch B#1, the repair information for batch B#2, information regarding the schedules of each of the processing devices 1#1 and 1#2 and the measuring device 2, and the device information for each of the processing devices 1#1 and 1#2 and the measuring device 2.

[0316] When the calculation device 41 sets a schedule for repairing each of the batches B#1 and B#2, the calculation device 41 may identify time periods when no tasks are assigned to each of the processing devices 1#1 and 1#2 and the measuring device 2 (in other words, time periods when the processing devices 1#1 and 1#2 and the measuring device 2 are idle or on standby) from information about the schedules of each of the processing devices 1#1 and 1#2 and the measuring device 2. Therefore, setting a schedule for repairing each of the batches B#1 and B#2 based on information about the schedules of each of the processing devices 1#1 and 1#2 and the measuring device 2 can be said to be setting a schedule for repairing each of the batches B#1 and B#2 based on availability information about the availability of each of the processing devices 1#1 and 1#2 and the measuring device 2.

[0317] As explained with reference to the flowchart of Figure 40, repair information is set based on the processing flow information. Therefore, acquiring repair information for batch B#1 can be said to be acquiring the processing flow information for batch B#1. Similarly, acquiring repair information for batch B#2 can be said to be acquiring the processing flow information for batch B#2. Therefore, setting a schedule for repairing each of batches B#1 and B#2 based on the repair information for batch B#1 and the repair information for batch B#2 can be said to be setting a schedule for repairing each of batches B#1 and B#2 based on the processing flow information for batch B#1 and the processing flow information for batch B#2.

[0318] Furthermore, the processing flow information includes processing information and measurement information. Therefore, acquiring the processing flow information of batch B#1 can be said to be acquiring the processing information and measurement information of batch B#1. Similarly, acquiring the processing flow information of batch B#2 can be said to be acquiring the processing information and measurement information of batch B#2. Therefore, setting a schedule for repairing each of batches B#1 and B#2 based on the processing flow information of batch B#1 and the processing flow information of batch B#2 can be said to be setting a schedule for repairing each of batches B#1 and B#2 based on the processing information and measurement information of batch B#1 and the processing information and measurement information of batch B#2.

[0319] Furthermore, since the workpiece W is repaired by the processing device 1 processing the workpiece W, it can be said that the schedule for repairing each of batches B#1 and B#2 is a schedule for processing each of batches B#1 and B#2.

[0320] 22, the calculation device 41 sets a schedule by assigning four batches B#1, B#2, B#3, and B#4 to either of the processing devices 1#1 and 1#2. Therefore, it can be said that setting a schedule includes assigning each batch to either of the processing devices 1#1 and 1#2.

[0321] 22, for example, the processing task for batch B#1 is assigned to processing device 1#1, and the processing task for batch B#2 is assigned to processing device 1#2. Therefore, it can be said that setting a schedule includes assigning at least one task related to batch B#1 and at least one task related to batch B#2 to processing devices 1#1 and 1#2 so that they are executed in parallel by processing devices 1#1 and 1#2.

[0322] An example of setting a schedule for repairing each of batches B#1 and B#2 based on the device information of each of the processing devices 1#1 and 1#2 and the measuring device 2 is to assign each of batches B#1 and B#2 to the processing device 1 that is closest to each of batches B#1 and B#2 (in other words, closest to the current position of the jig 5 holding one or more workpieces W). That is, the calculation device 41 may assign each of batches B#1 and B#2 to either of the processing devices 1#1 and 1#2 so as to minimize the time required to transport each of batches B#1 and B#2. For example, when the processing task for batch B#1 is assigned to either the processing device 1#1 or 1#2, the calculation device 41 may assign the processing task for batch B#1 to the processing device 1 that is closest to the measuring device 2 based on the distance between the measuring device 2 and each of the processing devices 1#1 and 1#2. For example, if measuring device 2 and processing device 1#1 are installed on the same floor, and processing device 1#2 is installed on a different floor from measuring device 2 and processing device 1#1, the calculation device 41 may assign the processing task for batch B#1 to processing device 1#1, which is located closer to measuring device 2.

[0323] The calculation device 41 may assign batch B#1 to either processing device 1#1 or 1#2 based on the location of a user (e.g., an operator) transporting the jig 5 for batch B#1. The user's location may be obtained directly using, for example, GPS, or indirectly based on, for example, the location of the terminal device used by the user, information about the department to which the user belongs, etc.

[0324] If the number of processing devices 1 on which the workpiece W is not placed (in other words, the number of available processing devices 1) is greater than the number of batches, the calculation device 41 may assign the tasks of each patch to processing devices 1 on which the workpiece W is not placed so that the tasks of each batch are executed in parallel.

[0325] If the number of measuring devices 2 on which the workpiece W is not placed (in other words, the number of available measuring devices 2) is greater than the number of batches, the calculation device 41 may assign the tasks of each patch to measuring devices 2 on which the workpiece W is not placed so that the tasks of each batch are executed in parallel. In this case, the calculation device 41 may identify tasks that can be executed in parallel by multiple measuring devices 2, from among tasks related to measurement of one batch and tasks related to measurement of another batch. The calculation device 41 may assign the identified tasks to multiple measuring devices 2 so that the identified tasks are executed by each of the multiple measuring devices 2. This prevents batches from concentrating on one device, thereby reducing waiting times in the processing of each batch. Therefore, each batch can be processed quickly.

[0326] For example, the calculation device 41 may set a schedule for the pre-machining measurement tasks for each of the batches B#1 and B#2, and then set a schedule for the machining tasks for each of the batches B#1 and B#2.

[0327] (4-2-3) Progress Information For example, as shown in FIG. 26 , the image 4502 includes a progress status column that displays information indicating the progress of repair. For example, the calculation device 41 may generate progress status display data indicating the progress of repair for one batch based on the repair information and device information for one batch. Here, the calculation device 41 may acquire or update the device information by communicating with at least one of the control device 17 of the processing device 1 and the control device 23 of the measuring device 2 via the communication device 43.

[0328] As described above, the image 4502 includes a measuring device column and a processing device column that respectively display action instruction information 4502f and 4502g indicating action instructions for at least one of the operator and the user. The calculation device 41 may generate at least one of the action instruction information 4502f and 4502g as at least a part of the progress status display data. The action instruction information may include, for example, an instruction to "remove the jig from the measuring device and carry the jig into the processing device." In other words, the action instruction information may include an instruction to transport the jig 5 holding the workpiece W from one device to another device.

[0329] Here, a method for generating progress status display data will be described with reference to the flowchart of FIG. 42. In FIG. 42, the calculation device 41 acquires progress information for a batch of processing flow based on the repair information for that batch (step S401). In the process of step S401, the calculation device 41 may acquire progress information for each task included in the processing flow. The calculation device 41 may acquire progress information based on, for example, the progress of the G-code. The calculation device 41 may acquire progress information based on information other than the repair information for that batch. The calculation device 41 may communicate with at least one of the processing device 1 and the measuring device 2 via the communication device 43 to acquire progress information for tasks of at least one of the processing device 1 and the measuring device 2. The calculation device 41 may acquire progress information by predicting the progress of tasks based on the passage of time.

[0330] The progress information may include, for example, at least one of machining time information and measurement time information. Therefore, the progress information may include at least some of a plurality of processing times corresponding to a plurality of machining tasks and a plurality of processing times corresponding to a plurality of measurement tasks. The progress information may include stop information indicating that machining of the workpieces W has been stopped for a first predetermined time or more while the workpieces W of a batch are placed in the machining device 1. The progress information may include stop information indicating that measurement of the workpieces W has been stopped for a second predetermined time or more while the workpieces W of a batch are placed in the measurement device 2.

[0331] The arithmetic device 41 generates progress status display data indicating the progress information based on the progress information acquired in the processing of step S401 (step S402). In parallel with or before or after the processing of step S402, the arithmetic device 41 acquires information regarding the schedule of each device (step S403). Note that the arithmetic device 41 may generate, as part of the progress status display data, information indicating that the processing device 1 is processing the workpiece W based on information regarding the schedule of the processing device 1. Note that the arithmetic device 41 may generate, as part of the progress status display data, information indicating that the measuring device 2 is measuring the workpiece W based on information regarding the schedule of the measuring device 2. Note that the processing of step S403 does not have to be performed.

[0332] Next, the calculation device 41 determines whether user action (e.g., the operator of the information processing device 4) is required based on the progress information acquired in step S401 and the information regarding the schedules of each device acquired in step S403 (step S404). For example, the calculation device 41 may determine that user action is required when the remaining time of the processing task is shorter than a third predetermined time. Alternatively, for example, the calculation device 41 may determine that user action is required when a fourth predetermined time has elapsed since the processing task started. For example, the calculation device 41 may determine that user action is required when the remaining time of the measurement task is shorter than a fifth predetermined time. Alternatively, for example, the calculation device 41 may determine that user action is required when a sixth predetermined time has elapsed since the measurement task started. For example, the calculation device 41 may determine that user action is required when the progress of the repair has been halted for at least the first predetermined time or the second predetermined time.

[0333] In addition, the calculation device 41 may determine whether there is at least one of the following, in addition to or instead of determining whether user action is necessary: ​​"next action to take," "recommended action to take," "action desired to be taken," or "action to avoid backlog."

[0334] If it is determined in the processing of step S404 that user action is not required (step S404: No), the arithmetic device 41 transmits progress status display data to the output device 45 (specifically, the display device 451). On the other hand, if it is determined in the processing of step S404 that user action is required (step S404: Yes), the arithmetic device 41 generates action instruction information (step S405). Thereafter, the arithmetic device 41 transmits the progress status display data including the action instruction information to the output device 45 (specifically, the display device 451). In the processing of step S405, the arithmetic device 41 may generate action instruction information such as, for example, "The processing is finished, so please bring in the jig 5" or "Please remove the jig 5 from the measuring device 2." Note that the action instruction information indicating the removal of the jig 5 may include information indicating the location to which the jig 5 should be moved after being removed. For example, when measurement of one or more workpieces W held on a jig 5 is completed and the processing device 2 that processes the one or more workpieces W is waiting for availability, action instruction information such as "Please transport the jig 5 to a waiting area" may be generated. When all processing flows related to one or more workpieces W held on a jig 5 are completed, action instruction information such as "Processing is completed" may be generated. Note that the action instruction information is not limited to information that directly indicates the operator's action, but may also indirectly prompt the operator to take action. Action instruction information that indirectly prompts the operator to take action may include, for example, "Processing / measurement will be completed soon," "Processing / measurement is completed," "All flows are completed," etc. Note that the action instruction information may only display the estimated completion time of the task or the remaining time for task processing.

[0335] For example, if the progress of repair has stopped for more than the first predetermined time (e.g., if the progress information includes stop information), the calculation device 41 may generate action instruction information in step S405, such as "Please check the machining head because a machining error has occurred." That is, the calculation device 41 may generate action instruction information indicating a check instruction for the machining device 1. The action instruction information may include information corresponding to the importance of the action. The information corresponding to the importance of the action may include, for example, "urgent (must)," "as soon as possible," or "recommended." The calculation device 41 may generate the action instruction information by referring to the schedule information for each of multiple pieces of repair information (i.e., multiple pieces of batch information). This configuration allows action instructions to be issued by referring to the appropriate schedule. For example, it may be possible to instruct the jig 5 to be transported to a device that is available earlier, rather than the device originally set. In this case, the calculation device 41 may update the machining information based on the schedule changed due to the action instruction information.

[0336] For example, if the calculation device 41 determines, based on information regarding the schedules of each of the multiple processing devices 1, that the work W for a batch cannot be placed on any of the multiple processing devices 1, the calculation device 41 may generate action instruction information instructing the device to wait.

[0337] Furthermore, if an action based on the action instruction information is not performed within the fifth predetermined time, the calculation device 41 may instruct at least one of the processing device 1 and the measuring device 2 to stop repairing the work W related to the batch for which the action instruction information was generated.

[0338] (4-2-4) Generation of Flowchart The process of generating a flowchart displayed in the sequence progress column 4507b of the image 4507 shown in FIG. 31 will be described with reference to the flowchart in FIG.

[0339] 43, the calculation device 41 of the information processing device 4 acquires processing target information for one batch (step S501). Next, the calculation device 41 acquires processing flow information for the work W (step S502). Next, the calculation device 41 acquires task information from the processing flow information (step S503). Here, the calculation device 41 may acquire processing task information and measurement task information as the task information.

[0340] Next, the calculation device 41 identifies tasks that can be performed in parallel from among the tasks included in the processing task information and the tasks included in the measurement task information (step S504). Note that "can be performed in parallel" is not limited to a case where one task is performed in parallel with another task, but also includes, for example, a case where multiple tasks are performed in parallel with one task, or a case where part of one task is performed in parallel with part of another task.

[0341] For example, the calculation device 41 may identify, from among the tasks included in the processing task information, a task that needs to be performed with the workpiece W placed in the processing device 1. Similarly, the calculation device 41 may identify, from among the tasks included in the measurement task information, a task that needs to be performed with the workpiece W placed in the measurement device 2. Furthermore, from among the tasks included in the processing task information, the calculation device 41 may identify a task that can be performed even if the workpiece W is not placed in the processing device 1. Similarly, from among the tasks included in the measurement task information, the calculation device 41 may identify a task that can be performed even if the workpiece W is not placed in the measurement device 2. The calculation device 41 may acquire, from the processing flow information, a plurality of processing times corresponding respectively to a plurality of tasks related to processing and a plurality of processing times corresponding respectively to a plurality of tasks related to measurement.

[0342] The calculation device 41 may identify tasks that can be performed in parallel based on information regarding tasks that must be performed with the workpiece W placed in the processing device 1, tasks that must be performed with the workpiece W placed in the measuring device 2, tasks that can be performed even if the workpiece W is not placed in the processing device 1, and tasks that can be performed even if the workpiece W is not placed in the measuring device 2, as well as a plurality of processing times corresponding to a plurality of tasks related to processing and a plurality of processing times corresponding to a plurality of tasks related to measurement. Note that when tasks that can be performed in parallel are identified, information regarding some of the tasks out of the information regarding the plurality of tasks may not be used.

[0343] For example, the calculation device 41 may identify tasks that can be performed in parallel based on information about tasks that are performed when the workpiece W is placed in the processing device 1 or the measuring device 2 and information about tasks that can be performed even when the workpiece W is not placed in either the processing device 1 or the measuring device 2. The calculation device 41 may, for example, identify tasks that are performed before the workpiece W is processed by the processing device 1 as tasks that can be performed in parallel. The calculation device 41 may, for example, identify tasks that are performed after the workpiece W is processed by the processing device 1 as tasks that can be performed in parallel. The calculation device 41 may, for example, identify tasks that are performed before the workpiece W is processed by the processing device 1 or tasks that are performed after the workpiece W is processed by the processing device 1 as tasks that can be performed in parallel based on information about tasks that are performed before the workpiece W is processed by the processing device 1 or tasks that are performed before the workpiece W is measured by the measuring device 2 or tasks that are performed after the workpiece W is measured by the measuring device 2.

[0344] Here, it is prohibited to perform in parallel a task that needs to be performed while the workpiece W is placed in the processing device 1 and a task that needs to be performed while the workpiece W is placed in the measuring device 2. For this reason, combinations of tasks that can be performed in parallel are (i) a combination of a task that needs to be performed while the workpiece W is placed in the processing device 1 and a task that can be performed even if the workpiece W is not placed in the measuring device 2, (ii) a combination of a task that needs to be performed while the workpiece W is placed in the measuring device 2 and a task that can be performed even if the workpiece W is not placed in the processing device 1, and (iii) a combination of a task that can be performed even if the workpiece W is not placed in the processing device 1 and a task that can be performed even if the workpiece W is not placed in the measuring device 2.

[0345] An example of a task that can be performed even if the workpiece W is not placed in the measuring device 2 is a task related to data processing for machining the workpiece W. A specific example of a task related to data processing for machining the workpiece W is a task for generating machining control information. More specifically, at least one of a difference extraction task and a machining path generation task is included. The difference extraction task is a task for acquiring difference information (for example, a differential model DM shown in FIG. 18(c)) regarding the difference from the three-dimensional shape of the workpiece W measured by the measuring device 2. The difference extraction task may be part of the machining path generation task, or may be a task independent of the machining path generation task.

[0346] In a combination of tasks that must be performed while the workpiece W is placed in the processing device 1 and tasks that can be performed even if the workpiece W is not placed in the measuring device 2, an example of a task that must be performed while the workpiece W is placed in the processing device 1 is a task that is performed before the processing of the workpiece W. Specific examples of tasks that are performed before the processing of the workpiece W include at least one of a purging task, a task of preheating the placement device that places the workpiece W in the processing device 1 and the workpiece W, and a task related to the position calibration of the processing head.

[0347] An example of a task that can be performed even if a workpiece W is not placed in the processing device 1 is a task that is performed after processing one workpiece W in order to process another workpiece W. Specific examples of tasks that are performed after processing one workpiece W in order to process another workpiece W include at least one of a task related to cooling the processing head, a task related to cleaning the inside of the processing device 1, and a task related to powder replenishment. The task related to cleaning the inside of the processing device 1 may be performed mechanically (in other words, automatically) or manually by the user. When the user manually performs the task related to cleaning the inside of the processing device 1, the calculation device 41 may generate action instruction information that prompts the user to perform cleaning.

[0348] In a combination of a task that must be performed while the workpiece W is placed in the measuring device 2 and a task that can be performed even if the workpiece W is not placed in the processing device 1, an example of a task that must be performed while the workpiece W is placed in the measuring device 2 is a task that is performed on the processed workpiece W. A specific example of a task that is performed on the processed workpiece W is a task related to measurement that is performed by placing the processed workpiece W on the measuring device 2.

[0349] After the processing of step S504, the calculation device 41 generates parallel display data (step S505). Here, the parallel display data is data for displaying a flowchart in the sequence progress column 4507b. In the processing of step S505, the calculation device 41 may generate, as part of the parallel display data, display data for displaying the processing flow on the display device 451 along a first direction (e.g., the up-and-down direction in FIG. 31 ) indicating the passage of time in the processing flow. The calculation device 41 may further generate, as another part of the parallel display data, display data for displaying the tasks that can be performed in parallel, identified in the processing of step S504, in parallel on the display device 451 along a second direction (e.g., the left-right direction in FIG. 31 ) intersecting the first direction.

[0350] Next, the calculation device 41 determines whether the task information has been updated (step S506). If it is determined in the process of step S506 that the task information has not been updated (step S506: No), the process ends. On the other hand, if it is determined in the process of step S506 that the task information has been updated (step S506: Yes), the calculation device 41 regenerates the parallel display data based on the updated task information (step S507).

[0351] After an image based on the parallel display data generated in the processing of step S505 (for example, the flowchart displayed in the sequence progress column 4507b in FIG. 31 ) is displayed on the display device 451, the operator of the information processing device 4 may change the task via the input device 44. For example, when a task is changed by an input from the operator via the input device 44, the calculation device 41 may determine in the processing of step S506 that the task information has been updated.

[0352] For example, the operator may select, via the input device 44, a block relating to the "Purge" task in the flowchart displayed in the sequence progress column 4507b in Fig. 31. In this case, the calculation device 41 may generate display data for displaying an image (e.g., image 4513 in Fig. 39) including an input area for inputting machining specification information. Thereafter, the operator may input information relating to the machining specification information via the input device 44. An example of input relating to the machining specification information is an input for changing the target shape of the workpiece W.

[0353] For example, if the operator performs an input to change the target shape of the workpiece W via the input device 44, the time required for at least one of difference extraction and G-code generation in the "machining path generation" task of the flowchart displayed in the sequence progress column 4507b may be extended. In this case, the "purging" task and the "preheating" task may be performed in the machining device 1 in parallel with the "machining path generation" task in the measuring device 2. In this case, the calculation device 41 may regenerate parallel display data such that the "machining path generation" task, the "purging" task, and the "preheating" task are displayed in parallel along the second direction. In this way, when an input to change the target shape of the workpiece W is performed, the tasks being performed in parallel may be changed.

[0354] Furthermore, when the operator inputs a change to the target shape of the workpiece W via the input device 44, the time required for at least one of the difference extraction and G-code generation in the "machining path generation" task of the flowchart displayed in the sequence progress column 4507b may not be short.

[0355] If the parallel display data generated in the processing of step S505 is referred to as "first parallel display data," the parallel display data generated in the processing of step S507 may be referred to as "second parallel display data."

[0356] (4-2-5) Schedule Display The arithmetic unit 41 of the information processing device 4 may control the output device 45 so that an image showing a schedule, as shown in Fig. 22, is displayed on the display device 451. Here, a method for generating data for displaying the image showing the schedule will be described with reference to the flowchart in Fig. 44.

[0357] 44, the calculation device 41 acquires multiple pieces of repair information corresponding to multiple batches (step S601). It is assumed that a schedule is set for each of the multiple batches. For details on how to set a schedule, see "(4-2-2) Schedule Setting."

[0358] Next, the calculation device 41 acquires task information from each of the plurality of pieces of repair information acquired in the process of step S601 (step S602). Next, the calculation device 41 generates parallel display data (step S603). Here, the parallel display data is data for displaying the schedule of each of the plurality of batches.

[0359] 22, the order of the top-bottom display (i.e., the order of displaying the devices) may be changed depending on the batch sequence selected by the operator of the information processing device 4. For example, if the operator selects B#1 via the input device 44, which has the tasks of pre-machining measurement by the measuring device 2, machining by the machining device 1#1, and post-machining measurement by the measuring device 2, the arithmetic unit 41 may control the output device 45 so that the measuring device 2 and the machining device 1#1 are displayed in this order from top to bottom in FIG. 22. For example, if the operator selects B#2 via the input device 44, which has the tasks of pre-machining measurement by the measuring device 2, machining by the machining device 1#2, and post-machining measurement by the measuring device 2, the arithmetic unit 41 may control the output device 45 so that the measuring device 2 and the machining device 1#2 are displayed in this order from top to bottom in FIG.

[0360] In the processing of step S603, the calculation device 41 may generate, as part of the parallel display data, display data for displaying at least one task included in the task information along a third direction (e.g., the horizontal direction in FIG. 22 ) indicating a time meter of the processing flow on the display device 451 in accordance with the schedule set for each of the multiple batches. The calculation device 41 may further generate, as another part of the parallel display data, display data for displaying tasks that can be performed in parallel by at least two devices, for example, the processing devices 1#1 and 1#2 and the measuring device 2, in parallel on the display device 451 along a fourth direction (e.g., the vertical direction in FIG. 22 ) intersecting the third direction.

[0361] Next, the calculation device 41 determines whether the task information has been updated (step S604). If it is determined in the process of step S604 that the task information has not been updated (step S604: No), the process ends. On the other hand, if it is determined in the process of step S604 that the task information has been updated (step S604: Yes), the calculation device 41 regenerates the parallel display data based on the updated task information (step S605).

[0362] After the image (e.g., see FIG. 22 ) based on the parallel display data generated in the process of step S603 is displayed on the display device 451, the operator of the information processing device 4 may change the task via the input device 44. For example, the operator may swap the processing task of batch B#1 assigned to processing device 1#1 with the processing task of batch B#2 assigned to processing device 1#2 in FIG. 22 via the input device 44. For example, when the task is changed by the operator's input via the input device 44, the calculation device 41 may determine in the process of step S604 that the task information has been updated.

[0363] (5) Modifications The processing system SYS may include a processing device 6 in addition to the multiple processing devices 1 or instead of at least one of the multiple processing devices 1. The processing device 6 may be a processing device that performs processing using powder bed fusion (PBF), as described below. The processing system SYS may include various stereolithography processing devices, such as a processing device 1 that performs additive processing using directed energy deposition (DED), and a processing device 6. The processing system SYS may include multiple processing devices that employ the same type of processing method but are different models. The processing system SYS may include at least one of a processing device that performs laser removal processing and a processing device that performs mechanical cutting processing, in addition to the processing device 1 and the processing device 6, or instead of at least one of the processing device 1 and the processing device 6.

[0364] The identification information of the jig 5 may include information about an apparatus (e.g., a processing apparatus) to which the jig 5 is applicable. This is because different jigs are generally made for each apparatus to which the jig is compatible. The information processing device 4 may allocate each batch (in other words, each workpiece W) to the processing device 1 or the processing device 6 according to the processing information of each batch.

[0365] (5-1) Configuration of Processing Apparatus 6 The configuration of the processing apparatus 6 will be described with reference to FIG. 45. FIG. 45 is a cross-sectional view showing the structure of the processing apparatus 6. As shown in FIG. 45, the processing apparatus 6 includes a carrier 611 and a material application device 612. The carrier 611 is a component on which a material layer ML is formed. The material application device 612 is a device capable of forming the material layer ML on the carrier 611 under the control of a control device 63 conceptually shown in FIG. 45. Note that, for ease of explanation, FIG. 45 does not show a cross section of the control device 63. The material layer ML is a layer of a modeling material M. The modeling material M is, for example, a powder. As an example, the modeling material M may be at least one of a metal powder and a resin powder. However, the modeling material M does not have to be a powder.

[0366] The processing device 6 irradiates at least a portion of the material layer ML formed on the carrier 611 with processing light EL. The processing light EL may also be referred to as a processing beam or a processing beam. The processing light EL may also be referred to as an energy beam. When the processing light EL is irradiated onto at least a portion of the material layer ML, at least a portion of the material layer ML melts. Then, after the processing light EL is no longer irradiated onto the molten material layer ML, the molten material layer ML solidifies. As a result, a structure layer SL corresponding to the solidified material layer ML is formed. The structure layer SL may be equivalent to a sintered layer formed by sintering the modeling material M.

[0367] The processing device 6 includes a beam scanning device 62 capable of emitting the processing light EL to irradiate the material layer ML with the processing light EL. The processing device 6 may irradiate the material layer ML with the processing light EL emitted from the beam scanning device 62. The beam scanning device 62 may selectively irradiate the material layer ML with the processing light EL under the control of the control device 63 to selectively solidify the material layer ML. To selectively irradiate the material layer ML with the processing light EL, the beam scanning device 62 may deflect the processing light EL using a scanning optical element (not shown), which may be, for example, a galvanometer mirror. In other words, the beam scanning device 62 may use the scanning optical element to change the emission direction of the processing light EL emitted from the beam scanning device 62.

[0368] The beam scanning device 62 may be called an irradiation device because it irradiates the material layer ML with the processing light EL. The beam scanning device 62 is capable of emitting the processing light EL.

[0369] For example, the beam scanning device 62 may deflect the processing light EL in the θx direction, which is a rotation direction about the X axis in FIG. 45 , and the θy direction, which is a rotation direction about the Y axis. As a result, the irradiation position of the processing light EL on the surface of the material layer ML may move along a direction parallel to the carrier 611 (i.e., a direction parallel to the material layer ML, which in the example shown in FIG. 45 is parallel to the XY plane). In this way, the beam scanning device 62 can scan the processing light EL. In other words, the beam scanning device 62 can scan with the processing light EL. In yet another way, the beam scanning device 62 can scan using the processing light EL. For example, the beam scanning device 62 can scan at least a portion of the material layer ML with the processing light EL.

[0370] The beam scanning device 62 may deflect the processing light EL based on processing path information indicating the movement trajectory of the irradiation position of the processing light EL so that the processing light EL is irradiated at the position indicated by the processing path information. The processing path information may be generated based on, for example, CAD data of the three-dimensional structure to be formed. Therefore, the structure layer SL to be formed matches the shape of a part of the three-dimensional structure to be formed.

[0371] After forming the structure layer SL, the processing device 6 may lower the carrier 611. Therefore, the carrier 611 is movable along the Z-axis direction in FIG. 45 . To move the carrier 611 in the Z-axis direction, the processing device 6 includes a carrier moving device 613. The carrier moving device 613 is a device that can move the carrier 611 along the Z-axis direction under the control of the control device 63. After the carrier moving device 613 lowers the carrier 611 (in the example shown in FIG. 45 , the carrier 611 is moved toward the −Z side), the material application device 612 may form a new material layer ML on the carrier 611 (more specifically, on the already-formed structure layer SL and the already-formed old material layer ML). Thereafter, the processing device 6 may irradiate the newly formed material layer ML with the processing light EL emitted from the beam scanning device 62. As a result, a new structure layer SL is formed on the already-formed structure layer SL. In other words, the new structure layer SL is stacked on the already-formed structure layer SL.

[0372] Thereafter, the processing device 6 repeats the same operations. That is, the processing device 6 alternately repeats the operation of forming a material layer ML, the operation of solidifying at least a portion of the formed material layer ML to form a structure layer SL, and the operation of lowering the carrier 611. As a result, a three-dimensional structure in which a plurality of structure layers SL are stacked is formed on the carrier 611. That is, the processing device 6 forms a three-dimensional structure on the carrier 611 by performing additional processing on the carrier 611 (specifically, by performing additional processing using the material layer ML formed on the carrier 611). In other words, the processing device 6 forms a three-dimensional structure on the carrier 611 by performing additional processing on the carrier 611 using the material layer ML formed on the carrier 611. In this way, the processing device 6 performs additive processing based on powder bed fusion, such as selective laser sintering (SLS), to form a three-dimensional structure.

[0373] 45 , a build plate 614 may be disposed on a carrier 611. In this case, the processing apparatus 6 may form a material layer ML on the build plate 614. As a result, a three-dimensional structure in which a plurality of structural layers SL are stacked may be formed on the build plate 614. That is, the processing apparatus 6 may form a three-dimensional structure on the build plate 614 by performing additional processing on the build plate 614 (i.e., performing additional processing using the material layer ML formed on the build plate 614). In other words, the processing apparatus 6 may form a three-dimensional structure on the build plate 614 by performing additional processing on the build plate 614 using the material layer ML formed on the build plate 614.

[0374] The processing device 6 may further include a build cylinder 615. The build cylinder 615 includes at least one side wall 6151. The at least one side wall 6151 may be in contact with the building material M. In this case, the build cylinder 615 may function as a container for containing the building material M. The at least one side wall 6151 may be in contact with the carrier 611. In this case, the build cylinder 615 may function as a guide member for guiding the carrier 611, which is movable along the Z-axis direction. Specifically, after the structure layer SL is built as described above (i.e., after irradiation of the already formed material layer ML with the processing light EL is completed), the processing device 6 may lower the carrier 611 inside the build cylinder 615 so that a new material layer ML can be formed on the carrier 611.

[0375] The processing apparatus 6 may further include a processing chamber 620. The processing chamber 620 may also be referred to as a processing room. The processing chamber 620 includes a side wall 621 extending perpendicular to the XY plane, and a bottom wall 622 and a top wall 623 extending parallel to the XY plane. The processing chamber 620 is a box-shaped structure having a rectangular parallelepiped or cubic shape. However, the processing chamber 620 may also have a box-shaped structure having another shape. For example, the processing chamber 620 may be a box-shaped structure having a cylindrical, conical, or pyramidal shape.

[0376] The processing chamber 620 defines a chamber space SP620 therein. The chamber space SP620 is a space surrounded by a side wall 621, a bottom wall 622, and a top wall 623. The processing chamber 620 performs a housing function for maintaining a spatially, environmentally, and fluidically closed (or substantially closed) processing environment within the chamber space SP620.

[0377] The processing chamber 620 does not need to be sealed from the space outside the processing chamber 620. For example, an opening capable of functioning as at least one of a gas inlet and a gas outlet may be formed in the side wall 621 of the processing chamber 620. For example, an opening 6231 through which the processing light EL emitted from the beam scanning device 62 can pass may be formed in the top wall 623 of the processing chamber 620. As a result, the processing light EL emitted from the beam scanning device 622 may enter the chamber space SP620 inside the processing chamber 620 through the opening 6231. Alternatively, the processing chamber 620 may not have an top wall 623. For example, an opening 6221 through which the processing light EL entering the chamber space SP620 can pass may be formed in the bottom wall 622 of the processing chamber 620. Alternatively, the processing chamber 620 may not have a bottom wall 622.

[0378] The build cylinder 615 may be directly adjacent to the processing chamber 620. In particular, the build cylinder 615 may be directly adjacent to the processing chamber 620 below the processing chamber 620. Specifically, the build cylinder 615 may be adjacent to an opening 6221 formed in a bottom wall 622 of the processing chamber 620. As a result, the processing light EL emitted from the beam scanning device 62 is irradiated onto the material layer ML through the opening 6221.

[0379] The build cylinder 615 may be attached to the processing chamber 620. For example, the build cylinder 615 may be attached to the processing chamber 620 so that the build cylinder 615 is fixed to the processing chamber 620. As a result, the material layer ML formed on the carrier 611 located in the build cylinder 615 substantially faces the chamber space SP620 in the processing chamber 620. In other words, the material layer ML is substantially located within the chamber space SP620 of the processing chamber 620. Therefore, the chamber space SP620 may substantially be the space in which the material layer ML is processed (in other words, where additional processing is performed). However, the build cylinder 615 may be attached to the processing chamber 620 in a state in which it is detachable from the processing chamber 620. Alternatively, the build cylinder 615 does not have to be directly adjacent to the processing chamber 620. For example, the build cylinder 615 may be attached to the processing chamber 620 so that the processing chamber 620 is at least partially open.

[0380] A carrier plate 643 may be disposed above the processing chamber 620, and one or more beam scanning devices 62 may be disposed on the carrier plate 643. The processing apparatus 6 does not necessarily have to include the carrier plate 643. In this case, the beam scanning device 62 may be disposed on the top plate of the processing chamber 623. Therefore, the beam scanning device 62 is disposed above the processing chamber 620. In this case, the beam scanning device 62 emits the processing light EL downward. Specifically, the beam scanning device 62 irradiates the material layer ML located below the beam scanning device 62 with the processing light EL. Because the material layer ML is processed by the processing light EL, the processing position where the material layer ML is processed is located below the beam scanning device 62. This processing position may also be referred to as the irradiation position of the processing light EL. The beam scanning device 62 may be supported by a member provided in the processing apparatus 6.

[0381] As shown in FIG. 45 , a gap may be provided between the processing chamber 620 and the carrier plate 643 so that the processing chamber 620 and the carrier plate 643 are thermally decoupled from each other. As a result, the processing chamber 620 and the beam scanning device 62 are thermally and mechanically decoupled from each other. Therefore, during a fabrication period in which a fabrication operation for fabricating a three-dimensional structure is performed, the relative positional relationship between the processing chamber 620 (particularly, the lower portion of the processing chamber 620 where the material layer ML is formed) and the beam scanning device 62 is unlikely to change unintentionally. In other words, during the fabrication period, the beam scanning device 62 is unlikely to move unintentionally relative to the processing chamber 620. This improves the fabrication accuracy of the three-dimensional structure. As a result, the quality of the fabricated three-dimensional structure is improved.

[0382] A gas may be flowed through the gap between the processing chamber 620 and the carrier plate 643. This gas may be used to adjust (e.g., cool) the temperature of at least one of the processing chamber 620 and the carrier plate 643 (and, in some cases, the beam scanning device 62). The carrier plate 643 may constitute a part of the processing chamber 620, typically the upper wall of the processing chamber 620. In other words, the beam scanning device 62 may be attached to the ceiling of the processing chamber 620.

[0383] The control device 63 can control the operation of the processing device 6. For example, the control device 63 may be able to control the movement of the carrier 611 by the carrier moving device 613. That is, the control device 63 may be able to control the carrier moving device 613. For example, the control device 63 may be able to control the formation of the material layer ML by the material coating device 612. That is, the control device 63 may be able to control the material coating device 612. For example, the control device 63 may be able to control the irradiation of the processing light EL by the beam scanning device 62. That is, the control device 63 may be able to control the beam scanning device 62.

[0384] <Supplementary Notes> The following supplementary notes are further disclosed regarding the above-described embodiment.

[0385] (Supplementary Note 1) An information processing method including: acquiring first processing task information relating to tasks relating to processing one or more first processing objects, which is included in a processing flow relating to the processing of the one or more first processing objects; second processing task information relating to tasks relating to processing one or more second processing objects, which is included in a processing flow relating to the processing of the one or more second processing objects; and multiple processing schedule information relating to the schedules of multiple processing devices; identifying tasks that can be executed in parallel from the first processing task information and the second processing task information based on the multiple processing schedule information; and setting the identified tasks to be executed in parallel on each of the multiple processing devices.

[0386] (Supplementary Note 2) The information processing method according to Supplementary Note 1, further comprising: displaying the identified tasks in parallel on a screen along a second direction intersecting a first direction indicating the passage of time.

[0387] (Supplementary Note 3) The information processing method according to Supplementary Note 2, including: acquiring first measurement task information related to tasks relating to measurement of the one or more first workpieces, which is included in the processing flow of the one or more first workpieces; second measurement task information related to tasks related to measurement of the one or more second workpieces, which is included in the processing flow of the one or more second workpieces, and measurement schedule information related to a schedule of a measuring device; and displaying at least one task of the first processing task information and the second processing task information, and at least one task of the first measurement task information and the second measurement task information, which are executed in parallel by at least one processing device of the plurality of processing devices and the measuring device, in parallel along the second direction on a screen based on the first processing task information, the second processing task information, the first measurement task information, the second measurement task information, the plurality of processing schedule information, and the measurement schedule information.

[0388] (Supplementary Note 4) The information processing method described in Supplementary Note 3, wherein the first measurement task information includes a first pre-processing measurement task relating to a task relating to measurement of the one or more first workpieces before at least one processing device of the plurality of processing devices processes the one or more first workpieces, and a first post-processing measurement task relating to a task relating to measurement of the one or more first workpieces after the at least one processing device has processed the one or more first workpieces; and the second measurement task information includes a second pre-processing measurement task relating to a task relating to measurement of the one or more second workpieces before at least one processing device of the plurality of processing devices processes the one or more second workpieces, and a second post-processing measurement task relating to a task relating to measurement of the one or more second workpieces after the at least one processing device has processed the one or more second workpieces.

[0389] (Supplementary Note 5) The information processing method according to Supplementary Note 3 or 4, further comprising: displaying, in parallel on a screen along the second direction, at least one first processing task of the first processing task information and at least one second measurement task of the second measurement task information, which are executed in parallel by at least one processing device of the plurality of processing devices and the measurement device, based on the first processing task information, the second measurement task information, the plurality of processing schedule information, and the measurement schedule information.

[0390] (Supplementary Note 6) An information processing method including: acquiring first measurement information for measuring one or more first workpieces and second measurement information for measuring one or more second workpieces; acquiring device information related to one or more measuring devices; and setting a measurement schedule for the one or more measuring devices to measure each of the one or more first workpieces and the one or more second workpieces based on the first measurement information, the second measurement information, and at least one of the information.

[0391] (Supplementary Note 7) A computer program for causing a computer to execute an information processing method, the computer program comprising: acquiring first processing information for processing one or more first workpieces and second processing information for processing one or more second workpieces; acquiring at least one of processing equipment installation information regarding the installation of one or more processing equipment and processing equipment availability information regarding the availability time of the one or more processing equipment; and setting a schedule for the one or more processing equipment to process the one or more first workpieces and the one or more second workpieces, respectively, based on the first processing information, the second processing information, and at least one of the processing equipment installation information and the processing equipment availability information.

[0392] (Appendix 8) A recording medium having recorded thereon a computer program for causing a computer to execute an information processing method, the information processing method including: acquiring first processing information for processing one or more first workpieces and second processing information for processing one or more second workpieces; acquiring at least one of processing equipment installation information regarding the installation of one or more processing equipment and processing equipment availability information regarding the availability times of the one or more processing equipment; and setting a schedule for the one or more processing equipment to process the one or more first workpieces and the one or more second workpieces, respectively, based on the first processing information, the second processing information, and at least one of the processing equipment installation information and the processing equipment availability information.

[0393] (Supplementary Note 9) A computer program for causing a computer to execute an information processing method, the computer program comprising: acquiring first processing flow information for measuring and processing one or more first processing objects and second processing flow information for measuring and processing one or more second processing objects; acquiring device information relating to one or more processing devices and one or more measuring devices; and setting a schedule for the one or more processing devices and the one or more measuring devices to measure and process the one or more first processing objects and the one or more second processing objects, respectively, based on the first processing flow information, the second processing flow information, and the device information.

[0394] (Supplementary Note 10) A recording medium having recorded thereon a computer program for causing a computer to execute an information processing method, the information processing method including: acquiring first processing flow information for measuring and processing one or more first processing objects and second processing flow information for measuring and processing one or more second processing objects; acquiring device information regarding one or more processing devices and one or more measuring devices; and setting a schedule for the one or more processing devices and the one or more measuring devices to measure and process the one or more first processing objects and the one or more second processing objects, respectively, based on the first processing flow information, the second processing flow information, and the device information.

[0395] (Supplementary Note 11) A computer program for causing a computer to execute an information processing method, including: acquiring first processing information for processing one or more first processing objects and second processing information for processing one or more second processing objects; acquiring equipment information regarding one or more processing devices; and setting a schedule for the one or more processing devices to process each of the one or more first processing objects and the one or more second processing objects based on the first processing information, the second processing information, and the equipment information.

[0396] (Supplementary Note 12) A recording medium having recorded thereon a computer program for causing a computer to execute an information processing method, the method including: acquiring first processing information for processing one or more first processing objects and second processing information for processing one or more second processing objects; acquiring equipment information regarding one or more processing devices; and setting a schedule for the one or more processing devices to process each of the one or more first processing objects and the one or more second processing objects based on the first processing information, the second processing information, and the equipment information.

[0397] (Supplementary Note 13) A computer program for causing a computer to execute an information processing method, the computer program comprising: acquiring first task information relating to a first task included in a processing flow relating to processing of an object to be processed, which task must be performed while the object is placed on a measuring device or a processing device; second task information relating to a second task included in the processing flow, which task can be performed even if the object is not placed on a measuring device or a processing device; and time information relating to a time required to complete the first task and a time required to complete the second task; identifying tasks that can be executed in parallel among the tasks of the processing flow based on the first task information, the second task information, and the time information; and setting the identified tasks to be executed in parallel.

[0398] (Supplementary Note 14) A recording medium having recorded thereon a computer program for causing a computer to execute an information processing method, the information processing method including: acquiring first task information relating to a first task included in a processing flow for processing a workpiece, which task must be performed while the workpiece is placed on a measuring device or a processing device; second task information relating to a second task included in the processing flow, which task can be performed even if the workpiece is not placed on a measuring device or a processing device; and time information relating to a time required to complete the first task and a time required to complete the second task; identifying tasks that can be executed in parallel among the tasks in the processing flow based on the first task information, the second task information, and the time information; and setting the identified tasks to be executed in parallel.

[0399] (Supplementary Note 15) A computer program for causing a computer to execute an information processing method, the computer program comprising: acquiring first processing information for processing a first workpiece, second processing information for processing a second workpiece, and processing device information including information on a processing device; and generating, based on the first processing information, the second processing information, and the processing device information, action instruction information that indicates action instructions to an operator as part of at least one of status display data, first status display data that indicates a progress status of the processing flow of the one or more first workpieces, and second status display data that indicates a progress status of the processing flow of the one or more second workpieces.

[0400] (Supplementary Note 16) A recording medium having recorded thereon a computer program for causing a computer to execute an information processing method, the method including: acquiring first processing information for processing a first workpiece, second processing information for processing a second workpiece, and processing device information including information on a processing device; and generating, based on the first processing information, the second processing information, and the processing device information, action instruction information that indicates action instructions to an operator as part of at least one of status display data, first status display data that indicates a progress status of the processing flow of the one or more first workpieces, and second status display data that indicates a progress status of the processing flow of the one or more second workpieces.

[0401] (Supplementary Note 17) A processing system comprising one or more processing devices, comprising: at least one processor; and at least one memory containing computer program code, wherein the at least one memory and the computer program code, together with the at least one processor, cause the processing system to at least do the following: acquire first processing information for processing one or more first workpieces and second processing information for processing one or more second workpieces, acquire at least one of processing device installation information regarding the installation of the one or more processing devices and processing device availability information regarding the availability times of the one or more processing devices, and set a schedule for the one or more processing devices to process the one or more first workpieces and the one or more second workpieces, respectively, based on the first processing information, the second processing information, and at least one of the processing device installation information and the processing device availability information.

[0402] (Supplementary Note 18) A processing system comprising one or more processing devices and one or more measuring devices, comprising: at least one processor; and at least one memory containing computer program code, wherein the at least one memory and the computer program code, together with the at least one processor, cause the processing system to at least do the following: acquire first processing flow information for measuring and processing one or more first workpieces and second processing flow information for measuring and processing one or more second workpieces, acquire equipment information regarding the one or more processing devices and the one or more measuring devices, and set schedules for the one or more processing devices and the one or more measuring devices to measure and process the one or more first workpieces and the one or more second workpieces, respectively, based on the first processing flow information, the second processing flow information, and the equipment information.

[0403] (Supplementary Note 19) A processing system comprising one or more processing devices, comprising: at least one processor; and at least one memory containing computer program code, wherein the at least one memory and the computer program code, together with the at least one processor, cause the processing system to at least do the following: acquire first processing information for processing one or more first workpieces and second processing information for processing one or more second workpieces, acquire device information regarding the one or more processing devices, and set a schedule for the one or more processing devices to process each of the one or more first workpieces and the one or more second workpieces based on the first processing information, the second processing information, and the device information.

[0404] (Supplementary Note 20) A processing device provided in a processing system, comprising: at least one processor; and at least one memory including computer program code, wherein the at least one memory and the computer program code, together with the at least one processor, cause the processing device to at least do the following: process one or more first workpieces and one or more second workpieces according to a schedule for processing the one or more first workpieces and the one or more second workpieces, respectively, which is set based on first processing information for processing one or more first workpieces, second processing information for processing one or more second workpieces, and at least one of processing device installation information regarding the installation of the processing device and processing device availability information regarding the availability time of the processing device.

[0405] (Supplementary Note 21) A processing device included in a processing system having one or more measuring devices, comprising: at least one processor; and at least one memory containing computer program code, wherein the at least one memory and the computer program code, together with the at least one processor, cause the processing device to at least do the following: process one or more first workpieces and one or more second workpieces according to a schedule for the processing device and the one or more measuring devices to measure and process the one or more first workpieces and the one or more second workpieces, respectively, the schedule being set based on first processing flow information for measuring and processing one or more first workpieces, second processing flow information for measuring and processing one or more second workpieces, and device information relating to the processing device and the one or more measuring devices.

[0406] (Supplementary Note 22) A processing device provided in a processing system, comprising: at least one processor; and at least one memory including computer program code, wherein the at least one memory and the computer program code, together with the at least one processor, cause the processing device to at least do the following: process each of the one or more first workpieces and the one or more second workpieces according to a schedule set based on first processing information for processing one or more first workpieces, second processing information for processing one or more second workpieces, and device information related to the processing device.

[0407] (Supplementary Note 23) A blade repair method comprising: acquiring first repair information for additional processing of one or more first blades and second repair information for additional processing of one or more second blades; acquiring at least one of processing device installation information relating to the installation of one or more processing devices and processing device availability information relating to the availability times of the one or more processing devices; and setting a schedule for the one or more processing devices to additionally process the one or more first blades and the one or more second blades, respectively, based on the first repair information, the second repair information, and at least one of the processing device installation information and the processing device availability information.

[0408] (Supplementary Note 24) A blade repair method comprising: acquiring first repair information for additional processing of one or more first blades and second repair information for additional processing of one or more second blades; acquiring equipment information relating to one or more processing equipment; and setting a schedule for the one or more processing equipment to additionally process each of the one or more first blades and the one or more second blades based on the first repair information, the second repair information and the equipment information.

[0409] (Supplementary Note 25) A blade repair method comprising: acquiring first task information relating to a first task included in a repair flow relating to additional processing on a blade, the first task having to be performed while the blade is placed on a measuring device or processing device; second task information relating to a second task included in the repair flow that can be performed without the blade being placed on a measuring device or processing device; and time information relating to the time required to complete the first task and the time required to complete the second task; identifying tasks in the repair flow that can be executed in parallel based on the first task information, the second task information, and the time information; and setting the identified tasks to be executed in parallel.

[0410] (Supplementary Note 26) A blade repair method comprising: acquiring first repair information for additional processing of a first blade, second repair information for additional processing of a second blade, and processing device information including information on a processing device; and generating, based on the first repair information, the second repair information, and the processing device information, action instruction information that indicates action instructions to an operator as part of at least one of status display data, first status display data that indicates a progress status of the repair flow of the first blade, and second status display data that indicates a progress status of the repair flow of the second blade.

[0411] (Supplementary Note 27) An information processing method including: acquiring first repair task information relating to a task relating to additional processing of one or more first blades, which is included in a repair flow relating to additional processing of the one or more first blades; second repair task information relating to a task relating to additional processing of one or more second blades, which is included in a repair flow relating to additional processing of the one or more second blades; and a plurality of pieces of processing schedule information relating to the respective schedules of a plurality of processing devices; identifying tasks from the first repair task information and the second repair task information that can be executed in parallel based on the plurality of pieces of processing schedule information; and setting the identified tasks to be executed in parallel on each of the plurality of processing devices.

[0412] (Supplementary Note 28) A blade repair method comprising: acquiring first measurement information for measuring one or more first blades and second measurement information for measuring one or more second blades; acquiring device information for one or more measuring devices; and setting a measurement schedule for the one or more measuring devices to measure each of the one or more first blades and the one or more second blades based on the first measurement information, the second measurement information, and at least one of the information.

[0413] The present invention is not limited to the above-described embodiments, but can be modified as appropriate within the scope of the claims and the gist or concept of the invention as can be read from the entire specification, and information processing methods and blade repair methods involving such modifications are also included in the technical scope of the present invention.

[0414] SYS Machining system 1 Machining device 2 Measuring device 3 Conveying device 4 Information processing device

Claims

1. An information processing method comprising: acquiring first processing information for processing one or more first workpieces and second processing information for processing one or more second workpieces; acquiring at least one of processing equipment installation information regarding the installation of one or more processing equipment and processing equipment availability information regarding the availability time of the one or more processing equipment; and setting a schedule for the one or more processing equipment to process the one or more first workpieces and the one or more second workpieces, respectively, based on the first processing information, the second processing information, and at least one of the processing equipment installation information and the processing equipment availability information.

2. A blade repair method comprising: acquiring first repair flow information for measuring and additional processing one or more first blades and second repair flow information for measuring and additional processing one or more second blades; acquiring equipment information regarding one or more processing devices and one or more measuring devices; and setting a schedule for the one or more processing devices and the one or more measuring devices to measure and additionally process the one or more first blades and the one or more second blades, respectively, based on the first repair flow information, the second repair flow information, and the equipment information.

3. An information processing method comprising: acquiring first processing information for processing one or more first processing objects and second processing information for processing one or more second processing objects; acquiring equipment information regarding one or more processing devices; and setting a schedule for the one or more processing devices to process each of the one or more first processing objects and the one or more second processing objects based on the first processing information, the second processing information and the equipment information.

4. The information processing method described in claim 3, wherein the one or more first workpieces are held by a first holder, the one or more second workpieces are held by a second holder, the first processing information is set in association with the first holder, and the second processing information is set in association with the second holder.

5. The information processing method according to claim 4, further comprising: storing the first processing information in association with the first holder in a storage device; and storing the second processing information in association with the second holder in the storage device.

6. The information processing method according to claim 5, comprising, when one or more third processing objects are held in the first holder and processed, acquiring at least a portion of the first processing information from the memory device by acquiring identification information provided on the first holder.

7. The information processing method of claim 6, wherein after processing of the one or more first workpieces is completed, the one or more first workpieces are removed from the first holder and the one or more third workpieces are attached so as to be held by the first holder.

8. The information processing method according to claim 7, further comprising: when the first holder is used in processing the one or more third workpieces, the first processing information associated with the first holder is automatically acquired from the storage device.

9. An information processing method as claimed in any one of claims 6 to 8, comprising setting a schedule for the one or more processing devices to process each of the one or more third processing objects based on the first processing information and the device information.

10. An information processing method as claimed in any one of claims 6 to 9, comprising setting a schedule for the one or more processing devices to process each of the one or more third processing objects and the one or more second processing objects based on the first processing information, the second processing information and the device information.

11. The information processing method according to any one of claims 6 to 10, wherein the identification information is at least one of a two-dimensional code and a non-contact communication tag.

12. An information processing method according to any one of claims 6 to 11, wherein the one or more first workpieces and the one or more third workpieces are the same type of item.

13. The information processing method according to claim 12, wherein the one or more first workpieces and the one or more third workpieces are turbine blades.

14. The information processing method according to claim 12 or 13, wherein the one or more first processing objects and the one or more third processing objects are processed at the same type of locations.

15. The information processing method according to any one of claims 12 to 14, wherein the first processing information is reused in processing the one or more third processing objects.

16. An information processing method according to any one of claims 3 to 15, wherein, when there are multiple processing devices, the set schedule includes a processing schedule for each of the multiple processing devices, and setting the schedule includes assigning the one or more first processing objects and the one or more second processing objects to one of the multiple processing devices.

17. The information processing method according to claim 16, wherein setting the schedule includes assigning at least one task included in the first processing information and at least one task included in the second processing information to be executed in parallel by each of the multiple processing devices.

18. An information processing method according to any one of claims 3 to 17, wherein the first processing information is reused in processing another object to be processed.

19. The information processing method according to claim 17, wherein the first processing information is reused in processing another object after the first object has been processed based on the first processing information.

20. The information processing method according to claim 17, wherein the first processing information is used in processing another object to be processed even if the first object to be processed has not been processed based on the first processing information.

21. An information processing method according to any one of claims 3 to 20, wherein the equipment information includes processing equipment availability information relating to the availability time of the processing equipment.

22. The information processing method according to any one of claims 3 to 21, wherein the equipment information includes processing equipment installation information relating to the installation of the one or more processing equipment.

23. The information processing method according to claim 22, wherein the processing device installation information includes information regarding installation locations of the one or more processing devices.

24. The information processing method according to claim 23, wherein setting the schedule further includes setting a processing device that is closest to a position of the one or more first processing objects by referring to information regarding the installation locations of the one or more processing devices.

25. The information processing method according to claim 24, further comprising, when the system further comprises one or more measuring devices, said device information including measuring device installation information relating to the installation of said one or more measuring devices.

26. The information processing method according to claim 25, wherein setting the schedule further includes setting a measuring device and a processing device that are located closest to each other by referring to information regarding installation locations of the one or more measuring devices contained in the measuring device installation information and information regarding the installation locations contained in the processing device installation information.

27. The information processing method according to claim 22 or 23, wherein the processing device installation information includes information regarding the number of the one or more processing devices that are installed.

28. The information processing method according to claim 27, wherein the one or more first workpieces and the one or more second workpieces are placed on the one or more processing devices while being held by respective holders, and when there are a plurality of processing devices and the number of processing devices is greater than the number of holders, setting the schedule includes assigning the holders to the plurality of processing devices, respectively.

29. The information processing method according to claim 27 or 28, further comprising, when one or more measuring devices are included, the device information includes information regarding the number of the one or more measuring devices.

30. The information processing method of claim 29, wherein the one or more first workpieces and the one or more second workpieces are placed on the one or more measuring devices while being held by respective holders, and when there are multiple measuring devices and the number of measuring devices is greater than the number of holders, setting the schedule includes assigning the holders to the multiple measuring devices, respectively.

31. An information processing method according to any one of claims 3 to 30, further comprising acquiring first measurement information for one or more measuring devices to measure the one or more first workpieces, second measurement information for the one or more measuring devices to measure the one or more second workpieces, and measuring device information which is information relating to the one or more measuring devices, and setting the schedule includes setting a measurement schedule for the one or more measuring devices to measure in association with the processing of each of the one or more first workpieces and the one or more second workpieces based on the first measurement information, the second measurement information, and the measuring device information.

32. The information processing method described in claim 31, wherein the one or more first workpieces are held by a first holder, the one or more first workpieces held by the first holder are measured by the one or more measuring devices, and the one or more first workpieces held by the first holder are processed by the one or more processing devices.

33. The information processing method according to claim 31 or 32, wherein the measurement coordinates in said one or more measuring devices and the processing coordinates in said one or more processing devices are associated with each other.

34. The information processing method according to claim 33, wherein the measurement coordinates in said one or more measuring devices and the processing coordinates in said one or more processing devices are common.

35. An information processing method according to any one of claims 31 to 34, wherein after the measurement schedule is set, a processing schedule is set for processing each of the one or more first workpieces and the one or more second workpieces.

36. An information processing method according to any one of claims 31 to 35, wherein the first measurement information includes first pre-processing measurement information relating to measurement of the one or more first workpieces before processing is performed by the one or more processing devices, and the second measurement information includes second pre-processing measurement information relating to measurement of the one or more second workpieces before processing is performed by the one or more processing devices.

37. An information processing method according to any one of claims 31 to 36, wherein the first measurement information includes first post-processing measurement information relating to measurement of the one or more first processed objects after processing by the one or more processing devices, and the second measurement information includes second post-processing measurement information relating to measurement of the one or more second processed objects after processing by the one or more processing devices.

38. An information processing method according to any one of claims 31 to 37, wherein, in the case where there are multiple measuring devices, the measurement schedule information includes a measurement schedule for each of the multiple measuring devices, and setting the measurement schedule includes assigning each of measurements of the one or more first workpieces and the one or more second workpieces to one of the multiple measuring devices.

39. The information processing method of claim 38, wherein setting the measurement schedule further includes identifying a task among the tasks included in the first measurement information and the tasks included in the second measurement information that can be executed in parallel by the multiple measurement devices, and assigning to any of the multiple measurement devices includes assigning the identified task so that it is executed in parallel by each of the multiple measurement devices.

40. An information processing method as claimed in any one of claims 3 to 39, wherein the first processing information is generated based on first processing object information relating to the one or more first processing objects, first processing task information relating to a first task relating to the processing of the one or more first processing objects, and first processing specification information indicating the processing specifications for the one or more first processing objects, and the second processing information is generated based on second processing object information relating to the one or more second processing objects, second processing task information relating to a second task relating to the processing of the one or more second processing objects, and second processing specification information indicating the processing specifications for the one or more second processing objects.

41. The information processing method described in claim 40, wherein the one or more first workpieces are held by a first holder, the one or more second workpieces are held by a second holder, the first workpiece information is acquired by obtaining identification information provided on the first holder, and the second workpiece information is acquired by obtaining identification information provided on the second holder.

42. An information processing method as described in claim 40 or 41, wherein the first processing information includes first time information related to the processing of the one or more first processed objects, and the second processing information includes second time information related to the processing of the one or more second processed objects.

43. An information processing method according to any one of claims 40 to 42, wherein the first processing information includes a plurality of first task processing time information each corresponding to the processing of the first task, and the second processing information includes a plurality of second task processing time information each corresponding to the processing of the second task.

44. An information processing method as claimed in any one of claims 40 to 43, wherein the first task includes at least one of a task performed before processing of the one or more first processed objects and a task performed after processing of the one or more first processed objects, and a processing task performed on the one or more first processed objects, and the second task includes a task performed before processing of the one or more second processed objects and at least one of a task performed after processing of the one or more second processed objects, and a processing task performed on the one or more second processed objects.

45. An information processing method as claimed in any one of claims 40 to 44, wherein the first task includes a task performed on the one or more first workpieces placed on the one or more processing devices, and the second task includes a task performed on the one or more second workpieces placed on the one or more processing devices.

46. ​​An information processing method described in any one of claims 40 to 45, wherein the first processing object information includes information regarding the portion to be processed of the one or more first processing objects, and the second processing object information includes information regarding the portion to be processed of the one or more second processing objects.

47. An information processing method described in any one of claims 40 to 46, wherein the first processing object information includes information regarding the quantity of the one or more first processing objects, and the second processing object information includes information regarding the quantity of the one or more second processing objects.

48. An information processing method according to any one of claims 40 to 47, wherein the first processing specification information and the second processing specification information are information relating to the content of processing to be performed by the one or more processing devices.

49. An information processing method according to any one of claims 40 to 48, wherein the first processing specification information includes first target shape information regarding a target shape after processing of the one or more first processed objects, and the second processing specification information includes second target shape information regarding a target shape after processing of the one or more second processed objects.

50. An information processing method according to any one of claims 40 to 49, wherein the first processing specification information includes first difference information regarding the difference between a target shape after processing of the one or more first processed objects and a measured three-dimensional shape of the one or more first processed objects, and the second processing specification information includes second difference information regarding the difference between a target shape after processing of the one or more second processed objects and a measured three-dimensional shape of the one or more second processed objects.

51. An information processing method according to any one of claims 3 to 50, wherein the first processing information and the second processing information are set by an operator through input via an input device, and the device information is generated based on the status of the one or more processing devices.

52. An information processing method according to any one of claims 3 to 51, further comprising generating at least one of first progress status display data indicating a processing progress status of the one or more first processed objects and second progress status display data indicating a processing progress status of the one or more second processed objects based on the first processing information, the second processing information and the device information.

53. The information processing method according to claim 52, further comprising generating, as a part of at least one of said first progress status display data and said second progress status display data, action instruction information indicating an action instruction to an operator.

54. The information processing method according to claim 53, wherein the action instruction information includes transporting at least one of the one or more first processing objects and the one or more second processing objects from another device to the one or more processing devices.

55. The information processing method according to claim 53 or 54, further comprising the step of: updating a schedule corresponding to said action instruction information if an action based on said action instruction information is not performed within a certain period of time.

56. An information processing method including: acquiring first task information relating to a first task included in a processing flow for processing of an object to be processed, which task needs to be performed while the object is placed on a measuring device or processing device; second task information relating to a second task included in the processing flow that can be performed without the object being placed on a measuring device or processing device; and time information relating to the time required to complete the first task and the time required to complete the second task; identifying tasks that can be executed in parallel among the tasks in the processing flow based on the first task information, the second task information, and the time information; and setting the identified tasks to be executed in parallel.

57. The information processing method according to claim 56, wherein the time information includes first task time information relating to the execution of the first task, and second task time information relating to the execution of the second task.

58. The information processing method according to claim 57, wherein each of the first task time information and the second task time information varies depending on the number of the workpieces.

59. The information processing method according to any one of claims 56 to 58, wherein the first tasks are not executed in parallel with each other.

60. The information processing method according to any one of claims 56 to 59, wherein the second task identified as a task that can be executed in parallel includes a task related to data processing for processing the object to be processed.

61. The information processing method according to claim 60, wherein the task related to data processing for processing the object includes a task for generating processing control information.

62. An information processing method according to claim 60 or 61, wherein a task related to data processing for machining the object to be machined includes a task of acquiring difference information relating to a difference between a target shape of the object to be machined after machining and a three-dimensional shape of the object to be machined measured by the measuring device.

63. The information processing method according to any one of claims 60 to 62, wherein the first task identified as a task that can be executed in parallel is a task that is performed before the processing.

64. The information processing method according to claim 63, wherein the task performed prior to the processing is at least one of a purging task within the processing device, a placement device for placing the object to be processed within the processing device and a task related to preheating the object to be processed, and a positional calibration task related to a processing head provided in the processing device.

65. The information processing method according to any one of claims 56 to 64, wherein the second task identified as a task that can be executed in parallel includes a task that is performed on the workpiece after the processing.

66. The information processing method according to claim 65, wherein the second task identified as a task that can be executed in parallel includes a task related to measurement of the processed object placed on the measuring device.

67. The information processing method according to claim 65 or 66, wherein the first task identified as a task that can be executed in parallel includes a task that is performed to process another object after the object has been processed.

68. An information processing method according to any one of claims 65 to 67, wherein the first task identified as a task that can be executed in parallel is at least one of a task related to cooling a processing head provided in the processing device, a task related to cleaning the inside of the processing device, and a task related to powder replenishment when the processing device is an additive processing device that performs additive processing using powder.

69. An information processing method according to any one of claims 56 to 68, further comprising: using the first task information and the second task information, generating first display data for displaying the processing flow on a display device along a first direction indicating the passage of time of the processing flow.

70. The information processing method according to claim 69, wherein the first display data includes data for displaying the tasks to be executed in parallel in a second direction intersecting the first direction.

71. The information processing method according to claim 70, further comprising: changing the tasks to be executed in parallel in response to a user's input via an input device.

72. The information processing method according to claim 71, wherein the user's input includes an input regarding processing specification information indicating the details of processing to be performed on the object to be processed.

73. The information processing method according to claim 72, wherein, when an input for changing a target shape of the object after machining is made as an input related to the machining specification information, the tasks to be performed in parallel are changed in accordance with the target shape.

74. An information processing method according to claim 72 or 73, comprising generating second display data for displaying an input area for the user to input the processing specification information when an input from the user selecting an area showing the first task processing information on a display device is accepted.

75. An information processing method as described in any one of claims 71 to 74, wherein on a screen based on the first display data, a task different from at least one of the tasks to be performed in parallel that was displayed in parallel along the second direction before the task to be performed in parallel was changed is displayed in parallel along the second direction.

76. An information processing method according to any one of claims 56 to 75, wherein the workpiece is held by a holder, the workpiece held by the holder is measured by the measuring device, and the workpiece held by the holder is processed by the processing device.

77. An information processing method according to any one of claims 56 to 76, wherein the measurement coordinates in the measurement device and the processing coordinates in the processing device are associated with each other.

78. The information processing method according to claim 77, wherein the measurement coordinates in the measurement device and the processing coordinates in the processing device are common.

79. An information processing method comprising: acquiring first processing information for processing a first object to be processed, second processing information for processing a second object to be processed, and processing equipment information including information related to a processing equipment; and generating action instruction information indicating action instructions to an operator as part of at least one of status display data, first status display data indicating a progress status of the processing flow of the first object to be processed, and second status display data indicating a progress status of the processing flow of the second object to be processed, based on the first processing information, the second processing information, and the processing equipment information.

80. An information processing method as described in claim 79, wherein the first processing information includes information regarding measurement of the first object to be processed before processing of the first object to be processed and information regarding measurement of the first object to be processed after processing of the first object to be processed, and the second processing information includes information regarding measurement of the second object to be processed before processing of the second object to be processed and information regarding measurement of the second object to be processed after processing of the second object to be processed.

81. An information processing method as described in claim 79 or 80, wherein the action instruction information includes at least one of transporting at least one of the first processing object and the second processing object from the processing device to another device different from the processing device, and transporting at least one of the first processing object and the second processing object from the other device to the processing device.

82. An information processing method according to any one of claims 79 to 81, wherein the first processing information includes first processing control information for the processing device to process the first object, and the second processing information includes second processing control information for the processing device to process the second object, and the information processing method includes: acquiring first progress information indicating a progress status of a processing flow of the first object based on the first processing control information; and acquiring second progress information indicating a progress status of the processing flow of the first object based on the second processing control information.

83. The information processing method according to any one of claims 79 to 82, further comprising generating the action instruction information based on situation information relating to a situation in which the action of the operator is required.

84. An information processing method as described in claim 83, wherein the status information includes task processing times corresponding to one or more tasks included in the processing flow of the first processed object, which are included in the first processing information, and task processing times corresponding to one or more tasks included in the processing flow of the second processed object, which are included in the second processing information.

85. An information processing method as described in claim 83 or 84, wherein the status information includes at least one of first stop information indicating that processing of the first object to be processed has been stopped for a predetermined time or more while the first object to be processed is placed in the processing device, and second stop information indicating that processing of the second object to be processed has been stopped for the predetermined time or more while the second object to be processed is placed in the processing device.

86. The information processing method according to claim 85, wherein, when the status information includes the first stop information or the second stop information, the action instruction information is generated, which indicates an instruction to the operator to check the processing device.

87. An information processing method according to any one of claims 79 to 86, wherein the processing device information includes processing schedule information for each of a plurality of processing devices, the first status display data includes information indicating that one of the plurality of processing devices is processing the first workpiece, and the second status display data includes information indicating that another of the plurality of processing devices is processing the second workpiece.

88. An information processing method according to any one of claims 79 to 87, comprising: acquiring measurement schedule information relating to a schedule of a measuring device; generating information indicating that the measuring device is measuring the first workpiece as part of the first status display data; and generating information indicating that the measuring device is measuring the second workpiece as part of the second status display data.

89. An information processing method as claimed in any one of claims 79 to 88, wherein, when the second object to be processed cannot be placed on any of a plurality of devices including the processing device, the action instruction information instructing the operator to wait is generated as part of the second status display data.

90. An information processing method according to any one of claims 79 to 89, wherein, if an action based on said action instruction information is not performed within a certain period of time, processing of the object corresponding to said action instruction information is stopped.

91. The information processing method according to any one of claims 79 to 90, further comprising transmitting the action instruction information to a display device.

92. The information processing method according to any one of claims 79 to 91, further comprising transmitting the first status indication data and the second status indication data to a display device.

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