Locally adaptive light-protective filter

The local-adaptive light-protective filter addresses the issues of low accuracy and limited dynamic range by using individually addressed modulating segments and shadow sector angular selectors, resulting in improved suppression of interfering light and enhanced visual perception.

WO2025095803A1PCT designated stage expired Publication Date: 2025-05-08OBSHCHESTVO S OGRANICHENNOJ OTVETSTVENNOSTYU 3D TEKHVIDENIE
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Patent Information

Application Number
PCT/RU2023/000358
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Priority Date
2023-11-02
Filing Date
2023-12-14
Publication Date
2025-05-08

AI Technical Summary

Technical Problem

Existing local-adaptive light-protective filters face challenges with low accuracy in determining the angular position of light sources and insufficient dynamic range in suppressing interfering light, due to optical aberrations and limited dynamic range of photosensitive matrices.

Method used

The device incorporates a light-protective modulator with individual electrical addressing of each modulating segment, a processor unit with multiple information outputs connected to the modulator, and angular selectors made as shadow sectors to improve accuracy and dynamic range.

Benefits of technology

This configuration enhances the accuracy of measuring interfering light and expands the dynamic range of suppression while maintaining high-quality visual perception, by allowing precise control of each modulating segment and reducing optical aberrations.

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Abstract

The invention relates to mobile light-protective devices both for human vision and for light-sensitive sensors used in machine vision. The present filter comprises at least one light-protective modulator, at least one M-channel meter for measuring the angle of arrival of light along a y coordinate, which is configured in the form of a shade y-selector and a first photodetector module arranged in succession, an N-channel meter for measuring the angle of arrival of light along an x coordinate, which is configured in the form of a shade x-selector and a second photodetector module arranged in succession, and a processing unit, the inputs of which are connected to the outputs of the angle meters, and the outputs of which are connected to individually addressable MxN modulation elements of the light-protective modulator which correspond to MxN optical viewing axes, the mn-th of which passes through an mn-th segment of the light-protective modulator and through an mn-th local region of an external scene (m=1, 2,..., М; n=1, 2,..., N), the output of the light-protective modulator being optically coupled to the input of a light-sensitive sensor that is to be protected, wherein the transfer function of the processing unit for an mn-th modulation element corresponds to an AND logic function from the output of an m-th channel of the M-channel meter of an angle along the y coordinate and from the output of an n-th channel of the N-channel meter of an angle along the x coordinate. The technical result consists in an increase in the operating accuracy of the device due to an absence of optical aberrations in the shade x- and y-selectors, and an increase in the dynamic range of suppression of interfering light by permitting individual addressing of the MxN modulation elements of the light-protective modulator and by creating MxN processing unit outputs having a corresponding functional.
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Description

[0001] LOCALLY ADAPTIVE LIGHT PROTECTION FILTER

[0002] Field of technology

[0003] The invention relates to light-protective means for human vision (eyes) and for light-sensitive sensors of technical vision, in particular to mobile light-protective devices (for example, sunglasses), and can be used to ensure normal conditions for visual perception of the surrounding environment in the presence of interfering light of excessive brightness, for example, direct light from the solar disk in the field of vision (perception) of an external scene.

[0004] State of the art

[0005] A locally adaptive light-protective filter is known [1], containing at least one light-protective modulator, at least one mini video camera and a processor unit, the control output of which is connected to the electrical input of the light-protective modulator, the input of the processor unit is connected to the output of the mini video camera, wherein the light-protective modulator contains in its aperture a matrix of MxN addressable modulation segments.

[0006] The input distribution of light brightness coming from the external scene passes through the light-protective modulator to the input of the pupil of the eye (the protected light-sensitive sensor). Simultaneously, the input distribution of light brightness is recorded using a mini video camera, at the output of which an electric video signal is formed with information on the distribution of light brightness in MxN local areas of the scene. The video signal is fed to the input of the processor unit, with the help of which, based on the characteristics of the video signal, the coordinates of the tn-th local area of ​​the scene (t = 1, 2, ...., M; n = 1, 2, ..., N) are determined, in which the light brightness exceeds the permissible limit (where the source of excessively bright light is located). As a result, a control voltage is supplied from the output of the processor unit to the electric input of the light-protective modulator, causing the transition of its corresponding tn-th segment to the closed optical state, blocking the passage of excessively bright light into the pupil of the eye.

[0007] A disadvantage of the known device is the narrow dynamic range of recording the distribution of light brightness due to the limited dynamic range of the photosensitive matrix in the mini video camera, which, as a rule, is made on complex photoelectric structures with non-uniform physical properties in the aperture of the CCD (charge-coupled device) or CMOS (complementary metal-oxide-semiconductor) type. The dynamic range of such structures in a miniature design, required for use in a mobile light-protective device, is insufficient for the correct analysis of the distribution of light brightness in an external scene in the presence of direct sunlight, when the differences in light brightness are about 1000:1 or more.

[0008] A locally adaptive light-shielding filter is known [2], which contains a light-shielding modulator, a matrix two-coordinate angle meter and a processor unit, the control output of which is connected to the electrical input of the light-shielding modulator, the input of the processor unit is connected to the output of the matrix two-coordinate angle meter, wherein the light-shielding modulator contains in its aperture a matrix of MxN address segments, which correspond to MxN optical viewing axes, the mn-th of which passes through the mn-th element of the light-shielding modulator and through the mn-th local region of the external scene (m = 1, 2, ..., M; u = 1, 2, ...,

[0009] N), and the output of the light-protective modulator is connected to the input of the protected light-sensitive sensor, in the aperture of which all optical axes of the view intersect, while the matrix two-coordinate angle meter contains a sequentially located auxiliary matrix modulator with MxN modulation elements and a photodetector with uniform physical properties along the aperture, the shape of which corresponds to a quasi-point (“pinhole”) diaphragm, while the tn-th optical axis of the view intersects in the tn-th local region of the external scene with the tn-th central measuring axis, passing through the tn-th element of the auxiliary modulator into the aperture of the photodetector.

[0010] When the known device is operating, each of the auxiliary matrix modulator opens in turn (changes from a closed optical state with maximum darkening to an open optical state with maximum enlightenment).

[0011] MxN elements of the auxiliary matrix modulator, opening different paths for the passage of light rays into the photodetector at corresponding angles (determined by the location of each element of the modulator relative to the central optical axis of the quasi-point aperture of the photodetector). A light beam from a source of excessively bright light, located, for example, in the tn-th local region of the external scene, passes through the tn-th element of the aperture of the auxiliary matrix modulator to the input of the photodetector, which causes the appearance at its output (in the corresponding tn-th working cycle of the device) of an information signal with an amplitude higher than a specified threshold level. The receipt of an information signal with such a level at the input of the processor unit leads to the appearance at its corresponding output of a closing electrical voltage at the electrical input of the tn-th element of the aperture of the light-protective modulator.This results in blocking the passage of light from the n-th local region of the external scene into the aperture of the protected light-sensitive sensor (the pupil of the eye).

[0012] The photodetector of the device, with uniform physical properties across the aperture, is made, for example, on the basis of a photosensitive pin structure operating with reverse polarity of the bias electric voltage on the resistor load, which ensures a linear dependence of the output (measuring) voltage in a very wide (about 10 5 : 1) the dynamic range of the input light [3]. In this case, even in the presence of a temporary overload at the optical input, the pin photodetector quickly returns to the working state immediately after the removal of this overload, since the presence of a depleted i-semiconductor between the p- and n-semiconductors promotes the rapid absorption of charge carriers and the exit of the entire pin junction from the state of temporary saturation.

[0013] The main disadvantage of the known device is the insufficient optical efficiency of obtaining samples of the input light brightness distribution in each of the MxN optical paths (measuring channels). The reason is that in each working cycle only one of the elements of the auxiliary matrix modulator is open. The energy of light passing through one such element of the aperture of the auxiliary matrix modulator is determined by the area of ​​the aperture of this element, which is MN times smaller than the area of ​​the full aperture of the auxiliary matrix modulator. Consequently, in each working cycle only 1 / MN part of the input light energy gets to the input of the photo receiver.

[0014] Another disadvantage of the known device is the difficulty of obtaining a sufficiently large darkening difference in each element of the auxiliary matrix modulator. For example, with passive row-column addressing of the elements of the auxiliary modulator to change the optical transmission of its m-th element by applying to it an electric control voltage of magnitude U, a voltage of, for example, +U / 2 on the m-th row and - U / 2 on the n-th column of the matrix is ​​simultaneously applied. In this case, the m-th element of the normally closed (initially in the closed optical state) auxiliary modulator at the absolute value of voltage U should go into the open optical state (in the state of complete enlightenment), while all other elements of the m-th row and n-nth column of the matrix modulator, which are automatically under voltage U / 2, should remain in the original, closed optical state (in the state of maximum darkening).To achieve a sufficiently high contrast (not worse than one hundred to one), the layer of the modulator's electro-optical working substance must be characterized in this case by a very steep transient response, so that when the absolute value of the voltage changes in a narrow range from U / 2 to U, it goes from one extreme optical state (corresponding to complete darkening of the modulator element) to another extreme state (corresponding to complete enlightenment of the element), which is problematic to implement in practice. Therefore, with passive row-column addressing, the actually achievable optical contrast is not high enough to ensure sufficient selective properties, taking into account the wide range of input light brightness.

[0015] The use of active row-column addressing (with a separate electrically controlled transistor switch for each of the MxN elements of the auxiliary matrix modulator to obtain a voltage drop from 0 to U on each element) in a mobile light-protective device is problematic due to the miniature dimensions of the auxiliary modulator aperture.

[0016] In addition, in each working cycle of the device, each subsequent of the MxN aperture elements of the auxiliary matrix modulator should be switched over time t отkр from a closed to an open optical state only after a transition in time t закр of the previous element from the open to the closed state. Therefore, the total time of the two-coordinate measurement of the angles of the position of the source of excessively bright light is equal to a sufficiently long time MN (t откр ++ t заКр) sequential enumeration of all elements of the auxiliary matrix modulator. For liquid crystal (hereinafter referred to as LC) substances of the nematic type as a working electro-optical substance, the characteristic value t откр amounts to a time of the order of tens to hundreds of milliseconds [4], which even for small values ​​of MN (from 10 to 100) leads to a fairly long total time (units to tens of seconds) for measuring the brightness of light from an external scene.

[0017] The closest in technical essence to the claimed device is a locally adaptive light-protective filter [5], containing a light-protective modulator, an M-channel angle meter along the y coordinate, an N-channel angle meter along the x coordinate and a processor unit, wherein the M-channel angle meter along the y coordinate is made in the form of a sequentially arranged first cylindrical lens having a spherical curvature along the y coordinate, and an array of M linear photodetectors uniform in aperture, arranged along the y coordinate at the focus of the first cylindrical lens, the N-channel angle meter along the x coordinate is made in the form of a sequentially arranged second cylindrical lens having a spherical curvature along the x coordinate, and an array of N linear photodetectors uniform in aperture, arranged along the x coordinate at the focus of the second cylindrical lens,the light-shielding modulator comprises M addressable conductive line buses and N addressable conductive column buses, at the intersections of which M x N modulation segments are located, to which M x N optical viewing axes correspond, the mn-th of which passes through the mn-th modulation element of the light-shielding modulator and through the mn-th local region of the external scene (m = 11,, 22,, ......,, MM; n = 1, 2, ..., N), and the output of the light-shielding modulator is optically coupled to the input of the protected light-sensitive sensor, in which all optical viewing axes intersect, the processor unit is designed as a separate processor y-module and a separate processor x-module, wherein the electrical inputs of the M addressable conductive line buses of the light-shielding modulator are connected to the outputs of the processor y-module, the inputs of which are connected to the corresponding outputs of the array of M linear photodetectors uniform in aperture,and the electrical inputs of the N addressable conductive column buses of the light-protective modulator are connected to the outputs of the processor x-module, the inputs of which are connected to the corresponding outputs of the array of N linear homogeneous photodetectors.

[0018] In the known device, each photodetector is filled with uniform physical properties across its aperture, which potentially allows for a high dynamic range of recording the intensity of the input light [3]. At the same time, the speed of this device is determined better than in the known device [2], since the number of required working cycles in the first known device is determined by the larger of the numbers M and N, and in the second known device - by the number MxN.

[0019] One disadvantage of the known device selected as a prototype is the low accuracy of determining the angular position of the input light sources for each coordinate due to significant optical aberrations in cylindrical lenses in the plane corresponding to its spherical curvature for large values ​​of angles (φ = 70°-80°) of the incoming light - similar to significant optical aberrations for off-axis optical beams in spherical lenses [6]). Another disadvantage of the known device is an insufficiently wide dynamic range of suppression of interfering light. When using passive row-column addressing of the segments of the light-protective modulator, this disadvantage is due to the narrow range of values ​​(from U / 2 to U) of the control voltage on each modulation segment of the light-protective modulator (for the reasons discussed above for similar addressing of the auxiliary modulator in the known device [2]).This leads to the impossibility of simultaneously providing a high degree of darkening in each of the M*N modulation segments of the light-protective modulator in its closed state and a high degree of its transparency in the open state. Namely, if we use the value of the Umax control voltage to obtain complete darkening of the modulation segment, then when it is transferred to the initial state, a residual address voltage of the value U will be present on it. макс / 2, preventing its complete enlightenment (which is achieved only at U-0), which will lead to a deterioration in the quality of the view of the surrounding space by the protected light-sensitive sensor due to the insufficiently high transparency of the light-protective modulator in the open state.

[0020] If in the device taken as a prototype, active row-column addressing is used (with a separate electrically controlled transistor key for each of the M*N modulation segments of the light-protective modulator in order to obtain a full voltage drop from 0 to U макс on each modulation segment), it is necessary to provide gaps (about 100 micrometers wide) between all modulation elements to accommodate the active elements

[0021] (thin-film transistor switches). Then, in the state of complete darkening in any group of modulation elements of the light-protective modulator, these gaps will become channels for leakage of interfering high-brightness light into the protected light-sensitive sensor. If, however, in order to prevent such leakage of interfering light, for example, a black grid is applied between the modulation elements of the light-protective modulator with a stripe width of no less than the width (about 100 micrometers) of the specified gaps, then in the state of complete enlightenment of the light-protective modulator, the presence of this black grid will reduce the quality of the view of the surrounding space for the protected light-sensitive sensor.

[0022] Thus, the known device is characterized by insufficient accuracy of determining the coordinates of the source of interfering light and a low dynamic range of suppression of interfering light. The problem solved by the invention is to increase the accuracy of the device with an increase in the dynamic range of suppression of interfering light while maintaining a high quality of viewing the surrounding space.

[0023] The essence of the invention

[0024] The stated task with achieving the corresponding technical results in a locally adaptive light-protective filter containing at least one light-protective modulator, an angle meter along the y coordinate,

[0025] N-channel angle meter along the x-coordinate and a processor unit, while

[0026] The M-channel angle meter along the y-coordinate is made in the form of a sequentially located angular selector of ^-channels and the first photoreceiver module,

[0027] The N-channel angle meter along the x-coordinate is made in the form of a sequentially located x-channel angular selector and a second photodetector module, wherein the first and second inputs of the processor unit are connected to the outputs of the first and second photodetector modules, respectively, and at least one information output of the processor unit is connected to the electrical input of the light-shielding modulator, containing in its aperture MxN modulation segments, to which MxN optical viewing axes correspond, the tn-th of which passes through the tn-th segment of the light-shielding modulator and the tn-th local region of the external scene (t 1, 2, ..., M; n

[0028] = 1, 2, ..., N), and the output of the light-shielding modulator is optically coupled to the input of the protected light-sensitive sensor, in the aperture of which M x N optical viewing axes intersect, is solved in that the angular selector of the y-channels is made in the form of a shadow y-selector, the angular selector of the x-channels is made in the form of a shadow x-selector, wherein in the shadow y-selector M central measuring planes for the angle along the y coordinate (hereinafter referred to as y-CMP) mutually intersect, and in the shadow x-selector N central measuring planes for the angle along the x coordinate (hereinafter referred to as x-CMP) mutually intersect, wherein the light-shielding modulator is made with individual electrical addressing of each of the M x N modulation segments, the processor unit is made with M x N information outputs, which are connected to the corresponding electrical inputs of the MXN modulation segments of the light-shielding modulator,and the transfer function of the processor unit for the m-th modulation segment of the light-shielding modulator corresponds to the logical function “AND” from the output of the m-th channel of the M-channel angle meter along the y coordinate and from the output of the n-th channel of the N-channel angle meter along the x coordinate.

[0029] In the first particular embodiment of the device, the shadow y-selector is implemented in the form of a sequentially located M-channel auxiliary modulator and a rear slit diaphragm with selection along the y coordinate (hereinafter referred to as the rear slit diaphragm with ^-selection), and the shadow x-selector is implemented in the form of a sequentially located N-channel auxiliary modulator and a rear slit diaphragm with selection along the x coordinate (hereinafter referred to as the rear slit diaphragm with x-selection), the first (second) photodetector module is implemented in the form of a first (second) photodetector, wherein the M-channel auxiliary modulator (N-channel auxiliary modulator) is implemented with at least one group of M modulation elements (N modulation elements), M y-CIP (N x-CIP) intersect on the long central line of the rear slit diaphragm with y-selection (rear slit diaphragm with x-selection),the long central line of the / m-th (n-th) modulation element is oriented along the x-coordinate (y-coordinate) and is located in the m-th y-CIGT (n-th x-CIP), and the electrical inputs of the M-channel (N-channel) auxiliary modulator are connected to the control output of the processor unit, wherein the m-th channel of the M-channel angle meter along the y-coordinate corresponds to the optical path from the aperture of the m-th modulation element of the M-channel auxiliary modulator to the aperture of the first photodetector, and the n-th channel of the N-channel angle meter along the y-coordinate corresponds to the optical path from the aperture of the n-th modulation element of the N-channel auxiliary modulator to the aperture of the second photodetector.,

[0030] In the first particular embodiment of the device, the light-shielding modulator, the M-channel auxiliary modulator and the N-channel auxiliary modulator contain a front linear polarizer, a front LC layer, an intermediate linear polarizer, a rear LC layer and a rear linear polarizer, wherein the polarization direction of the intermediate linear polarizer is orthogonal to the polarization directions of the front and rear linear polarizers.

[0031] In an example of a specific implementation of the first chchaassttnnoooo variant of the device, the M-channel auxiliary modulator is implemented with a first group of M address strip electrodes for the front LC layer and with a second group of M address strip electrodes for the rear LC layer, the N-channel auxiliary modulator is implemented with a first group of N address strip electrodes for the front LC layer and with a second group of N address strip electrodes for the rear LC layer, wherein the long central lines of the m-th address strip electrodes for the front and rear LC layers of the M-channel auxiliary modulator, corresponding to its m-th modulation element, are in the m-th y-CIP, the long central lines of the n-th address strip electrodes for the front and rear LC layers of the N-channel auxiliary modulator, corresponding to its n-th modulation element, are in the n-th x-CIP,the length and width of each address strip electrode of the M-channel auxiliary modulator is directly proportional to the distance of this address strip electrode to the slit diaphragm with y-selection, and the length and width of each address strip electrode of the N-channel auxiliary modulator is directly proportional to the distance of this address strip electrode to the slit diaphragm with x-selection.

[0032] In the second particular embodiment of the device, the shadow y-selector is made in the form of a front slit diaphragm with y-selection, the shadow x-selector is made in the form of a front slit diaphragm with x-selection, wherein M y-CIPs intersect on the long central line of the front slit diaphragm with y-selection, N x-CIPs intersect on the long central line of the front slit diaphragm with x-selection, the first photodetector module is made in the form of an M-channel array of photodetectors, the second photodetector module is made in the form of an N-channel array of photodetectors, wherein the center of the aperture of the m-th photodetector of the M-channel array of photodetectors is located in the m-th y-CIP, and the center of the aperture of the i-th photodetector of the N-channel array of photodetectors is located in the n-th x-CIP, wherein the output of the m-th channel of the M-channel angle meter along the y coordinate corresponds to the output of the m-th photodetector of the M-channel array photodetectors,and the output of the i-th channel of the N-channel angle meter along the y coordinate corresponds to the output of the i-th photodetector of the N-channel photodetector array.

[0033] In the first example of a specific implementation of the second particular embodiment of the device, the photodetectors of the M-channel array of photodetectors are located in the first plane, and the photodetectors of the N-channel array of photodetectors are located in the second plane, orthogonal to the first plane.

[0034] In the second example of a specific implementation of the second particular variant of the device, the photodetectors of the M-channel array of photodetectors are located along the first circle with the center in the middle of the slit of the front slit diaphragm with y-selection, and the photodetectors of the N-channel array of photodetectors are located along the second circle with the center in the middle of the slit of the front slit diaphragm with x-selection, wherein the plane of the first circle is orthogonal to the plane of the second circle.

[0035] The first technical result achieved consists of increasing the accuracy of operation of single-coordinate angle meters along the y-coordinate and x-coordinate due to the absence of optical aberrations in the shadow y-selector and shadow x-selector for any values ​​of the angles of light arrival.

[0036] The second technical result achieved consists in increasing the maximum darkening value in each element of the light-protective modulator in its closed state while maintaining the maximum value of its transparency in the open state due to individual electrical control of each modulation element of the light-protective modulator from the corresponding output of the processor unit. This allows the control voltage to be supplied to each modulation element with any necessary difference in the control voltage levels, starting from the zero value U=0 to the maximum value U макс, which allows achieving the maximum darkening value in each modulation element (at voltage U макс) с maintaining its high transparency in the initial state (at voltage U=0). At the same time, for the address electrodes laid between the segments in the aperture of the light-protective modulator for the purpose of implementing their individual electrical addressing, a minimum width (from units to tens of micrometers) of gaps between the segments is required, which corresponds to the minimum value of the transmitted light in the darkened state of the light-protective modulator (insignificant for the perception of the light-sensitive sensor).

[0037] In a preferred specific example of the device implementation with light-shielding and auxiliary modulators on two-layer LC structures, a minimum value of about 0.1% of optical transmission is ensured in a significantly wider (at least 5 times) angular range of selection by angles of arrival of light rays from the external scene compared to modulators on single-layer LC structures. Mathematically, this is mainly due to the multiplication of the characteristics of two successively located single-layer amplitude modulators.In this case, the sequential arrangement of two topologies of individually electrically addressable segments with the specified small gaps for laying electrically conductive address buses in two adjacent single-layer LC modulators will in practice lead to a virtually complete blocking of light, which, having passed through the gaps of the closed first LC modulator, will be blocked by the modulation elements of the second closed LC modulator, since the dimensions of these gaps are much smaller than the inevitable technological spread in the mutual arrangement of modulation segments in the planes of the apertures of each of these two LC modulators.

[0038] The combination of the first technical result (increasing the accuracy of single-coordinate angle meters) and the second technical result (increasing the degree of darkening of the light-shielding modulator in the closed state while maintaining the maximum transparency of the light-shielding modulator in the open state) ensures the solution of the stated problem of increasing the accuracy of measuring the angles of arrival of interfering light while expanding the dynamic range of suppression of interfering light while maintaining the quality of the view of the surrounding space for the protected light-sensitive sensor.

[0039] List of drawings

[0040] The essence of the claimed invention is explained by drawings.

[0041] Fig. 1 - general diagram of the device.

[0042] Fig. 2 - general view of corner selectors.

[0043] Fig. 3 - diagram of the first particular version of the device.

[0044] Fig. 4 - diagram of optical paths in the n-th modulation segment of the light-shielding modulator.

[0045] Fig. 5 - diagram of optical paths in the m-th channel of the M-channel angle of arrival meter of light along the y coordinate.

[0046] Fig. 6 - diagram of optical paths in the n-th channel of the N-channel angle of arrival meter of light along the x coordinate.

[0047] Fig. 7 - an example of a specific implementation of the n-th channel of the N-channel angle of arrival meter of light along the x coordinate.

[0048] Fig. 8 - optical diagram of the channels for measuring the angle of arrival of light along the x coordinate.

[0049] Fig. 9 optical diagram of the channels for measuring the angle of arrival of light along the coordinate

[0050] U-

[0051] Fig. 10 - geometry of addressable conductive segments and modulation segments in the front and rear LC layers of the light-protective modulator when operating with one closed modulation segment with the remaining modulation segments open. Fig. 11 - distribution maps of the characteristic value of the minimum optical transmission (darkening) of a closed LC modulator depending on the value of the angle of arrival of light in the presence of one or two LC layers in the modulator.

[0052] Fig. 12, 13 - optical diagrams of the M-channel angle meter along the y coordinate (with a shadow y-selector) and the N-channel angle meter along the x coordinate (with a shadow x-selector) in the first example of a specific implementation of the second particular version of the device.

[0053] Fig. 14, 15 - optical diagrams of the M-channel angle meter along the y coordinate (with a shadow y-selector) and the N-channel angle meter along the x coordinate (with a shadow x-selector) in the second example of a specific implementation of the second particular version of the device.

[0054] Implementation of the invention

[0055] The device (Fig. 1) contains at least one light-protective modulator 1,

[0056] M-channel meter 2 angle of arrival of light along the coordinate y (hereinafter -

[0057] M-channel <p -meter 2), N-channel angle meter 3 (φ х , the arrival of light along the x-coordinate (hereinafter referred to as N-channel <φ х- meter 3) and processor unit 4. At the output of light-protective modulator 1 there is a protected light-sensitive sensor 5, for example, the pupil of the human eye. M*N information outputs of processor unit 4 are connected to electrical inputs of individually electrically addressable MxN modulation segments of light-protective modulator 1, which correspond to MxN local areas of the external scene, in the tn-th local area of ​​which there is a source 6 of interfering light with a brightness exceeding the permissible limit, for example, the solar disk (m = 1, 2, ..., M; n = 1, 2, ..., N). Optical viewing axis with number mn, with an angle along the x coordinate and with an angle along the y coordinate passes successively through the center of the aperture (pupil) of the protected light-sensitive sensor 5, the center of the m-th modulation segment of the light-protective modulator 1 and the center of the m-th local region of the external scene. The direction of the x-coordinate and the direction of the y-coordinate coincide with the direction of orientation of the virtual lines and virtual matrices of the individually electrically MxN modulation segments in the aperture of the light-protective modulator 1.

[0058] Fig. 2 shows the M-channel <φ y - meter 2 (on the left in the figure), containing a sequentially located shadow y-selector 21 and the first photodetector module 22, as well as an N-channel <φ х meter 3 (on the right), containing a shadow x-selector 31 and a second photoreceiving module Z2.

[0059] The first and second inputs of the processor unit 4 are connected to the outputs of the first photoreceiving module of the M-channel φ, respectively. y -meter 2 and the second photodetector module of the N-channel φ х-meter 3. Through the M-channel φ y - measuring instrument 2 passes M central measuring planes for angle φ y (hereinafter referred to as the CIP for f н ), and through

[0060] N-channel angle meter φ, passes N central measuring planes for angle φ х (hereinafter referred to as the CIP for f х ). In this case, the m-th CIP for φ and the n-th CIP for φ х intersect at the center of the tn-th local region of the external scene. The optical axis with angle φ m y (as part of the t-th CIP for φ m y ) and the optical axis with angle φ x n (as part of the n-th CIP for φ х ) intersect at the center of the n-th local region of the external scene.

[0061] In the first particular embodiment of the device (Fig. 3), the shadow y-selector 7 is made in the form of a sequentially located M-channel auxiliary modulator 71 (equipped with at least one group of M modulation elements) of the rear slit diaphragm 72 with selection along the y coordinate (hereinafter referred to as the front diaphragm 72 with y-selection), the first photodetector module is made in the form of the first photodetector 8, the shadow x-selector 9 is made in the form of a sequentially located N-channel auxiliary modulator 9 (equipped with at least one group of N modulation elements), and the second photodetector module is made in the form of a rear slit diaphragm 92 with selection along the x coordinate (hereinafter referred to as the front diaphragm 92 with x-selection) and the second photodetector 10. In this case, the M CIPs for f intersect on the long central line of the rear diaphragm 72 with y-selection, and N CIP for φ хintersect at the center line of the rear slit diaphragm 92 with x-selection. The long center line of the m-th modulation element of the M-channel auxiliary modulator 71 is directed along the x coordinate and is located in the m-th CMC for the long center line of the n-th modulation element of the N-channel auxiliary modulator 91 is directed along the y coordinate and is located in the n-th CMC for φ х , and the electrical inputs of the M-channel auxiliary modulator 71 and

[0062] N-channel auxiliary modulator 91 are connected to the control output of processor unit 4. In this case, the m-th channel of the M-channel angle meter along the y coordinate corresponds to the optical path from the aperture of the m-th modulation element of the M-channel auxiliary modulator to the aperture of the first photodetector, and the n-th channel of the N-channel angle meter along the y coordinate corresponds to the optical path from the aperture of the n-th modulation element of the N-channel auxiliary modulator to the aperture of the second photodetector.

[0063] In the example of a specific implementation of the first particular embodiment of the device, the light-shielding modulator 1, the M-channel auxiliary modulator 71 and the N-channel auxiliary modulator 91 contain a front linear polarizer, a front liquid crystal layer LCD1 (hereinafter referred to as the LCD1 layer), an intermediate linear polarizer, a rear liquid crystal layer LCD2 (hereinafter referred to as the LCD2 layer) and a rear linear polarizer, wherein the polarization direction of the intermediate linear polarizer is orthogonal to the polarization directions of the front and rear linear polarizers. In this case, the light-shielding modulator 1 includes a first group of MxN address segment electrodes for the LCD1 layer and a second group of MxN address segment electrodes for the LCD2 layer, electrical addressing of the tn-th modulating segment (Fig. 4) is carried out using the first tn-th address segment electrode in the LCD1 layer and using the second tn-th address segment electrode - in the LC2 layer (for simplicity, the LC layers and polarizers are not shown).

[0064] H orizontal (vertical) size of the first (second) address segment t p electrode and horizontal (vertical ) the size of the second address segment electrode is directly proportional to the distances and these а address electrodes to the aperture of the protected light-sensitive sensor 5.

[0065] Optical axis of view at angles And along the coordinates x and y, connecting the center of the aperture (pupil) of the light-sensitive sensor 5 with the center of the tn-th local region of the external scene (in which the light source b with excess brightness is located), passes through the centers of the first and second address segment electrodes Angles 6 are the full angles of perception (viewing) of objects of the external scene protected by the light-sensitive sensor (the pupil of the eye) 5 along the coordinates x and y, respectively.

[0066] The M-channel auxiliary modulator 71 includes a first group of M address strip electrodes for the layer LC1 and a second group of M address strip electrodes for the layer LC2, wherein electrical addressing in the m-th strip modulation segment of the M-channel auxiliary modulator 71 (Fig. 5) is carried out using the first m-th address strip electrode in the layer LC1 and using the second m-th address strip electrode in the layer LCD2. Length

[0067] (width) of the first m-th address strip electrode and the length (width ^ ) the second address strip electrode ) are directly proportional to the distances these electrodes to the rear slit diaphragm sous-filtration. Long the central lines of the t-th address strip electrodes are located on the t-th CIP for fu . The central axis of the m -th channel for measuring the angular position of the source b of excessively bright light along the y-coordinate, connecting the center of the input of the first photodetector 8 with the center of the m-th local region of the external scene, has an angular coordinate and passes through the centers of the address strip electrodes

[0068] The angular coordinate can take any value in the corresponding partial (within the m-th channel) viewing angle Full horizontal angle Ф х perception for the first photodetector 8 covers the entire external scene horizontally and is the same for each of the M channels for measuring the angle φ y .

[0069] The N-channel auxiliary modulator 9 includes a first group of N address strip electrodes for the LCD1 layer and a second group of N address strip electrodes for the LCD2 layer, wherein electrical addressing in the n-M strip modulation segment (Fig. 6) is carried out using the first address strip electrode in the LCD1 layer and using the second address vertical electrode in the LC2 layer (LC layers and polarizers are not shown). The length (width of the first address strip electrode and length (width of the second address strip electrode are directly proportional to the distances of these electrodes to the rear slit diaphragm with x-filtration. Long central lines of n -th address strip electrodes are located on the n-th CIP for φ х .

[0070] The central axis of the n-th channel for measuring the angular position of the source 6 of excessively bright light, connecting the center of the input of the second photodetector 10 with the center of the n-th local region of the external scene, has an angular coordinate and passes through the centers addressable strip electrodes e The angular coordinate can take any value in the partial (within the n -th channel) viewing angle Full vertical angle Ф у The perception range for the second photodetector 10 covers the entire external scene vertically and is the same for each of the N angle measurement channels along the x coordinate.

[0071] In this case, the structure of the n-th angle measurement channel (Fig. 7) contains a frontal linear polarizer P1, layer LC1, intermediate linear polarizer P2, layer

[0072] LCD2, rear linear polarizer RZ, rear slit diaphragm and second photodetector 10. Layers LCD1 and LCD2 are provided with first and second address strip electrodes, respectively, located on one side corresponding layers of LC1 and LC2. On the opposite side of each of the layers of LC1 and LC2 there are common electrodes with zero potential. Each address electrode has an electrical input for supplying a control voltage U, creating the lines of force of the electric field E across those sections of layers LC1 and LC2 that are located under the corresponding address electrodes. The topologies of all strip modulation elements in layers LC1 and LC2 for each of the M and N channels for measuring the angle along the x coordinate are determined by the topologies of the corresponding address strip electrodes in these channels. The n-th measuring channel contains the n-th LC modulation element of the N-channel auxiliary modulator 91, which consists of two successively located n-th LC modulation subelements. The first n-th LC modulation subelement of the N-channel auxiliary modulator 91 contains sections of the input linear polarizer P1, layer LC1, and the second linear polarizer P2 corresponding to each other, where the topology of the section of layer LC1 is determined by the topology of the first address strip electrode. The second n-th LC modulation the subelement of the N-channel auxiliary modulator 91 contains sections of the second linear polarizer P2, the layer LCD2 and the third linear polarizer P3 corresponding to each other, where the topology of the section of the layer LCD2 is determined by the topology of the second address strip electrode

[0073] As a specific example of implementation, Fig. 8 shows an optical diagram of addressable strip electrodes for a set of N=4 channels for measuring the angle along the x coordinate with strip modulation elements open in channel n=2 for each of the layers LC1 and LC2 when measuring the corresponding central angle within the partial angle With the same value of the partial angle of perception in each of the N channels, the width of the address strip electrodes increases as they move away from the central channel to the peripheral ones with a flat configuration of the LC layers (modulators).

[0074] Fig. 9 shows the optical diagram of the address electrodes for a set of M=5 channels for measuring angles along the y coordinate with address elements open in channel m=3 for each of the layers LCD1 and LCD2, while the value of the partial viewing angle ) is the same in each of the M channels. Fig. 10 shows an example. corresponding to the specific implementation of the light-protective modulator 1, having 20 rectangular modulation segments, arranged in five rows (M=5) and four columns (N=4) with a closed modulation segment at the intersection of the third row (m=3) and the second column (n=2) in each of the layers of LCD1 and LCD2.

[0075] Fig. 11 shows approximate maps of optical transmission with a value of T=0.1% for effective suppression of direct light from the solar disk in an LCD modulator in a closed optical state, depending on the values ​​of the angles incidence of light on the input of the LCD modulator, measured from the normal to its aperture. The transmittance value T on the map on the left refers to a modulator on a single LC layer, and the transmittance value T on the right refers to a modulator on two LC layers.

[0076] In the first example of a specific implementation of the second particular version of the device

[0077] (Fig. 12) M-channel φ х - the meter is made with a shadow x-selector in the form of a front slit diaphragm x-selection and with N-channel photodetector array located in the first plane PL1, with N CIP for φ х intersect each other on the long central line of the frontal slit diaphragm S x , the center of the aperture of the n-th photodetector is located in the n-th CIP for φ х , and the N-channel f-meter is made with a shadow y-selector (Fig. 13) in the form of a frontal slit diaphragm with y-selection and with an M-channel array of photodetectors located in the plane PL2, where M

[0078] CIP for φ ymutually intersect on the long central line of the frontal slit diaphragm with y-selection, the center of the aperture of the m -th photodetector is located in the m-th CIP for , and the plane PL1 is orthogonal to the plane PL2.

[0079] The second example of a specific implementation of the second particular variant of the device (Fig. 14, 15) differs from the first specific implementation variant in that the photodetectors of the N-channel photodetector array are arranged circle 01 (Fig. 14), and the photo receivers of the M-channel array of photo receivers are located along the circle 02 (Fig. 15), while the plane the location of circle 01 is orthogonal to the plane of location of circle 02, the plane of aperture of n -th photodetector orthogonal to the 77th CIP for f х , and the aperture plane of the m-th photodetector orthogonal to the m -th CIP for φ y .

[0080] The device operates as follows. The brightness distribution of the input light from the external scene is modulated by the light-shielding modulator 1 and simultaneously the input light enters the M-channel φ y -meter 2 and in N-channel φ х -meter 3 (Fig. 1, 2), from the outputs of which the electrical signals are fed to the first and second inputs of the processor unit 4. The modulated light from the output of the light-protective modulator 1 goes to the input of the light-sensitive sensor (pupil of the eye) 5. With the help of the processor unit 4, in each working cycle, the amplitude level of each of the M electrical signals at the output of the M-channel φ -meter 2 is compared with the amplitude level of each of the N electrical signals at the output of the N-channel φ х-meter 3 in accordance with the logical function "AND". Due to the presence in the mn -th local region of the external scene of a light source b with a brightness exceeding the permissible (for normal functioning of the light-sensitive sensor 5) limit, in the m -th working cycle at the output of the M-channel φ y -meter 2 and in the n -th working cycle at the output of the N-channel φ х - measuring device 3 generates the m -th and 77-th electrical signals with amplitudes exceeding the specified threshold level at the inputs of the processor unit. At the end of the last working cycle (the number of which corresponds to the larger of the numbers M and N) at the mn -th output of the processor unit 4 in accordance with the result of executing the logical function "AND" for the output of the m-th channel

[0081] M-channel φ y -meter 2 and for the output of the n -th channel of the N-channel φ х- measuring device 3 on the mn -th modulation segment of the light-protective modulator 1, a control voltage is generated that ensures the transition of this modulation segment from open into a closed (completely darkened) optical state, which ensures blocking the entry of light with excess brightness from the mn -th local region of the external scene into the light-sensitive sensor 5.

[0082] The peculiarity of the operation of the device in the first particular embodiment (Fig. 3) consists in the specificity of the operation of the M-channel φ y -2 and N-channel φ meter y- meter 3, consisting in sequentially switching to the open state each of the M band-pass modulation elements in the M-channel auxiliary modulator 71 and each of the N band-pass modulation elements in the N-channel auxiliary modulator 91 while implementing, respectively, y-selection using diaphragm 72 and x-selection using diaphragm 92 with registration in the memory of the processor unit 4 of the results of the selection of levels of electrical signals exceeding a specified threshold level, in each of the M channels at the output of the photodetector 8 and in each of the N channels at the output of the photodetector 10.

[0083] The operation of the device in a specific example of implementation with two LC layers (LC1 and LC2) in the light-protective modulator 1, the M-channel auxiliary modulator 71 and the N-channel auxiliary modulator 91 (Fig. 3) is carried out as follows using the example of measuring the angle . In the n-th working cycle, the light from the light source 6, the central whose angular x-coordinate is in the partial range of angles (Fig.

[0084] 6), passes into the n-th measuring channel (Fig. 7) through the open LC modulation element (through the open first and second LC subelements, the topology of which is determined by the topology of the electrodes ) ( ) On the electrodes (( ) the level of the control voltage U, coming from the corresponding output of the processor unit 4, is equal to the minimum value or zero (U=0), which corresponds to the preservation of the initial orientation of the LC molecules in the corresponding sections of the layers LC1 and LC2. With the initial orientation of the LC molecules, a 90° rotation of the linear polarization vector of the light that has passed through the corresponding LC layer is carried out. This rotation is caused, for example, by the waveguide effect of optical activity in the layer of nematic LC molecules twisted by 90° with positive dielectric anisotropy [7]. If the linear polarization vector of the light at the output of the first linear polarizer P1 is directed, for example, horizontally (according to the drawing in Fig. 7), then the section of the LC1 layer located under the first address strip electrode will provide a rotation vector of linear polarization of the output light in the direction orthogonal to the plane of the drawing and coinciding with the direction of polarization of the second linear polarizer P2. Therefore, from the output of the considered section of the layer LC1, the light will pass the second linear polarizer P2 without noticeable attenuation. This means that the first LCn-modulation subelement of the N-channel auxiliary modulator 91, corresponding to the first address strip electrode, is in the open optical state (Fig.

[0085] 8). Similarly, the second n-th LCD modulation subelement of the N-channel auxiliary modulator 9c corresponding to the second address strip electrode is also in the open optical state, since the corresponding section of the layer LC2 rotates the linear polarization vector of the light coming from the output of the second linear polarizer P2 by 90°, ensuring parallelism of the linear polarization vector of the transmitted light to the direction of the linear polarization of the third linear polarizer P3. The remaining N-1 LC modulation elements of the N-channel auxiliary modulator 91 are in a closed optical state, since the control voltage is applied to the corresponding address strip electrodes relative to the common electrodes (Fig. 7), which creates an electric field E with lines of force orthogonal to the planes of the electrodes in the corresponding sections of the LC1 and LC2 layers. The nematic LC molecules in the considered sections of the LC1 and LC2 layers become electric dipoles due to the presence of the electric field E and align their long axes in the direction of its lines of force. This leads to the absence of an effect of the corresponding sections of the LC1 and LC2 layers on the direction of the linear polarization vector of the transmitted light, since the light in this case goes along the optical axis of the LC layers in question. As a result, each of the corresponding N-1 modulation elements of the N-channel auxiliary modulator 91 turns out to be closed due to strong attenuation of light in two pairs of linear polarizers Pl, P2 and P2, P3 with mutually crossed polarization directions in each pair.

[0086] Similarly, in the tt-mm working cycle, the m-th strip modulation element (consisting of the first and second m-th LCD modulation subelements corresponding to the first and second address strip electrodes of the M-channel auxiliary modulator 7,), is in an open optical state for light coming from source 6 with excess brightness, which corresponds to a partial central angle along the y coordinate, which is in the range of angles (Fig. 9).

[0087] The open optical state of the considered m-th LC modulation subelements is ensured in the m-th working cycle due to the low (zero) level of the control voltage U, which is below the threshold of reorientation of LC molecules in the corresponding sections of the layers LC1 and LC2. The remaining M-1 pairs of address electrodes are in the closed state, since the control voltage is applied to them creating an electric field E, the lines of force of which cause a reorientation of the LC molecules in the direction across the planes of the layers LC1 and LC2. With a sequential transition to the open state of each of the N modulation elements of the N-channel auxiliary modulator 91 in N working cycles (each of the M modulation elements of the M-channel auxiliary modulator 71 in M ​​working cycles), scanning of the angles of arrival of light along the coordinates x and y will be performed for all M*N local areas of the scene with the formation of M and N information electrical signals, respectively, at the outputs of photodetectors 8 and 10.Based on the results of the comparison at the two inputs of the processor unit 4 in accordance with the logical function "AND" of the levels of each of the M electrical signals with the level of each of the N electrical signals, a high level of coincidence will be obtained at the mn-th output of the processor unit 4, exceeding the specified threshold value for the pair of input m-th and n-th electrical signals, since in the mn -th local region of the scanned scene there is a source 6 of excessively bright light. The high level of the logical function "AND" at the m n-th output of the processor unit 4 corresponds to the appearance of a high level of control voltage U at this output. макс. This voltage is supplied to the individually electrically addressable tn-th modulation segment of the light-protective modulator 1, transferring this segment to a closed optical state with maximum darkening, which ensures blocking of the optical path from the tn-th local region of the scene, where the source 6 of the interfering light is located, to the protected light-sensitive sensor 5

[0088] (Fig. 3, 4).

[0089] As a specific example, Fig. 8 (Fig. 9) shows the situation with open modulation elements of the four-channel auxiliary modulator 91 (five-channel auxiliary modulator 71), corresponding to the address strip electrodes, when light from the external scenes with excessive brightness levels come at a central angle within partial angle to the input of the photodetector 8 (at a central angle of within the partial angle at the photodetector input 10). In this case, for optical closing of the corresponding modulation LCD segment of the light-protective modulator 1, the processor unit 4 generates a control voltage supplied to the corresponding address segment electrodes (Fig. 10) directly through the corresponding narrow conductive buses (located in the gaps between the segment electrodes - not shown in the figure), which blocks the optical path along this optical channel to the protected light-sensitive sensor (the pupil of the eye) 5 for light with excessive brightness from the source 6, coming at central angles from the corresponding (m = 3; n = 2) local region of the external scene.

[0090] If the angular dimensions of the source 6 of excessively bright light exceed the partial viewing angles for the n-th and / or m-th angle measurement channels, respectively along the coordinates x and / or y, then simultaneously at the output of at least one of the other adjacent channels for measuring angular coordinates (into whose partial viewing angle the interfering light from source 6 will fall) an electrical signal with an amplitude level higher than the threshold level will appear, which will lead, in addition to the darkening of the m-th modulation segment of the light-protective modulator 1, to the simultaneous darkening of the corresponding adjacent modulation segments.

[0091] The light-shielding modulator 1, the M-channel auxiliary modulator 71 and the N-channel auxiliary modulator 91, made with two LC layers and three linear polarizers, provide optical attenuation values ​​of about T = 0.1% within about ± 80° for angles of incidence of light at the LC input. modulator (Fig. 11, right) with the angle measured at 0° from the normal to the modulator aperture.

[0092] A modulator on a single LC layer of a similar type with two (input and output) crossed linear polarizers provides significantly smaller operating ranges of these angles - up to ± 15° (Fig. 9, left), but with greater optical efficiency in the open state due to a smaller number of light-modulating layers.

[0093] The specific values ​​of the maximum operating ranges of angles and optical efficiency of the light-shielding modulator 1 depend on the electro-optical material used for the light-modulating layer.

[0094] The peculiarity of the operation of the second particular version of the device: in the measuring block (Fig. 12-15) simultaneously all light beams from all perceived local areas of the external scene are fed to all photodetectors through front slit diaphragm and also on all photodetectors through the frontal slit diaphragm to determine the appropriate angles for the location of the source 6 of excessively bright light.

[0095] The choice of the slit width of the slit diaphragms is a compromise; a smaller the width of each slit leads to a smaller value of the angular spread of the beams (to a further increase in the accuracy of determining the angle along the corresponding coordinate), but reduces the optical efficiency of the measuring channels. Industrial applicability

[0096] The device can be made, for example, in the form of light-protective glasses or as a light-protective (sun-protective) filter at the input of an augmented reality device.

[0097] The practical implementation of device modulators is advisable on the basis of nematic LC structures, for example, in the form of twist, supertwist or π (pi) structures [7-9]. Any other optical material with suitable electro-optical characteristics can be used as a working electro-optical substance in the light-protective modulator and in auxiliary modulators.

[0098] LITERATURE

[0099] 1. Knoll NG Electronic spectacles / / US Patent No. 10444545, priority date 03 / 10 / 2019, published 10 / 19 / 2019.

[0100] 2. Yezhov V.A. Method of light-protective filtration with zonal adaptation and device for its implementation / / Russian Federation Patent No. 2482526, declared 13.10.2011, published 20.05.2013.

[0101] 3. Photodiode TEMD5510FX01 / / Vishay Semiconductors data sheet.

[0102] 4. Yang DK, Wu FT Fundamentals of liquid crystal devices. Wiley. 2015.

[0103] 5. Khromygin F. M., Khromygina L. S. Anti-glare glasses / / Russian Federation Patent No. 2036496, declared 08 / 27 / 1991, published 05 / 27 / 1995 (prototype).

[0104] 6. Born M., Wolf E. Fundamentals of Optics. M. Science. 1973.

[0105] 7. Schadt M., Helfrich W. Voltage-dependent optical activity of a twisted nematic liquid crystal / / Appl. Phys. Letts. 1971. V. 18. No. 4. P. 127-128.

[0106] 8. Schadt M., Leenhouts F. Electro-optical performance of a new, black-white and highly multiplexable liquid crystal display. Appl. Phys. Letts / / 1987. V. 50. No. 5. P. 236-238.

[0107] 9. Bos PJ, Koehler-Beran KR The pi-cell: A fast liquid-crystal optical switching device / / Molec. Christ. Liq. Christ. 1984. V. 113.P 329-339.

Claims

CLAUSE OF THE INVENTION 1. A locally adaptive light-protective filter comprising at least one light-protective modulator, an M-channel angle meter along the y coordinate, an N-channel angle meter along the x coordinate and a processor unit, wherein the M-channel angle meter along the y coordinate is made in the form of a sequentially located y-channel angular selector and a first photoreceiving module, The N-channel angle meter along the x coordinate is made in the form of a sequentially located angular selector of x channels and a second photodetector module, wherein the first and second inputs of the processor unit are connected to the outputs of the first and second photodetector modules, respectively, and at least one information output of the processor unit is connected to the electrical input of a light-shielding modulator containing in its aperture MxN modulation segments to which MxN optical viewing axes correspond, the tn-th of which passes through the tn-th segment of the light-shielding modulator and the tn-th local region of the external scene (m = 1, 2, M; n = 1, 2, ..., N), and the output of the light-shielding modulator is optically coupled to the input of the protected light-sensitive sensor, in the aperture of which all optical viewing axes intersect, characterized in that the angular selector of the y channels is made in the form of a shadow y selector, the angular selector of the x channels is made in the form of a shadow x-selectors,wherein in the shadow y-selector M central measuring planes for the angle along the y coordinate intersect each other, and in the shadow x-selector N central measuring planes for the angle along the x coordinate intersect each other, wherein the light-shielding modulator is implemented with individual electrical addressing of each of the MxN modulation segments, the processor unit is implemented with MxN information outputs, which are connected to the corresponding electrical inputs of the MxN modulation segments of the light-shielding modulator, and the transfer function of the processor unit for the mn-th modulation segment of the light-shielding modulator corresponds to the logical function "AND" from the output of the m-th channel of the M-channel angle meter along the y coordinate and from the output of the n-th channel of the N-channel angle meter along the x coordinate.

2. The filter according to item 1, characterized in that the shadow y-selector is made in the form of a sequentially located M-channel auxiliary modulator and a rear slit diaphragm with selection along the y coordinate, the shadow x-selector is made in the form of a sequentially located N-channel auxiliary modulator and a rear slit diaphragm with selection along the x coordinate, the first photoreceiving module is made in the form of a first photodetector, the second photodetector module is made in the form of a second photodetector, wherein the M-channel auxiliary modulator is made with at least one group of M modulation elements, the N-channel auxiliary modulator is made with at least one group of N modulation elements, M central measuring planes for the angle along the y coordinate intersect on the long central line of the rear slit diaphragm with selection along the y coordinate, N central measuring planes for the angle along the x coordinate intersect on the long central line of the rear slit diaphragm with selection along the x coordinate, the long central line of the m-th modulation element The M-channel auxiliary modulator is directed along the x-coordinate and is located in the m-th central measuring plane for the angle along the y-coordinate, the long central line of the n-th modulation element of the N-channel auxiliary modulator is directed along the y-coordinate and is located in the n-th central measuring plane for the angle along the x-coordinate, and the electrical inputs of the M-channel auxiliary modulator and the N-channel auxiliary modulator are connected to the control output of the processor unit, wherein the m-th channel of the M-channel angle meter along the y-coordinate corresponds to the optical path from the aperture of the m-th modulation element of the M-channel auxiliary modulator to the aperture of the first photodetector, and the n-th channel of the N-channel angle meter along the y-coordinate corresponds to the optical path from the aperture of the n-th modulation element of the N-channel auxiliary modulator to the aperture of the second photodetector.

3. The filter according to item 22, characterized in that the light-shielding modulator, the M-channel auxiliary modulator and the N-channel auxiliary modulator contain a front linear polarizer, a front liquid crystal layer, an intermediate linear polarizer, a rear liquid crystal layer and a rear linear polarizer, wherein the direction of polarization of the intermediate linear polarizer is orthogonal to the directions of polarization of the front and rear linear polarizers.

4. The filter according to item 3, characterized in that the M-channel auxiliary modulator is made with a first group of M addressable strip electrodes for the front liquid crystal layer and with a second group of M addressable strip electrodes for the rear liquid crystal layer, the N-channel the auxiliary modulator is made with a first group of N address strip electrodes for the front liquid crystal layer and with a second group of N address strip electrodes for the rear liquid crystal layer, wherein the long central lines of the m-th address strip electrodes for the front and rear liquid crystal layers of the M-channel auxiliary modulator, corresponding to its m-th modulation element, are located in the m-th central plane for measuring the angle along the y coordinate, the long central lines of the n-th address strip electrodes for the front and rear liquid crystal layers of the N-channel auxiliary modulator, corresponding to its n-th modulation element, are located in the n-th central plane for measuring the angle along the x coordinate,the length and width of each address strip electrode of the M-channel auxiliary modulator are directly proportional to the distance of this address strip electrode to the slit diaphragm with selection along the y coordinate, and the length and width of each address strip electrode, N-channel auxiliary modulator is directly proportional to the distance of this address strip electrode to the slit diaphragm with selection along the x coordinate.

5. The filter according to claim 1, characterized in that the shadow y-selector is made in the form of a front slit diaphragm with selection along the y coordinate, the shadow x-selector is made in the form of a front slit diaphragm with selection along the x coordinate, wherein M central measuring planes for the angle along the y coordinate intersect on the long central line of the front slit diaphragm with selection along the y coordinate, N central measuring planes for the angle along the x coordinate intersect on the long central line of the front slit diaphragm with selection along the x coordinate, the first photodetector module is made in the form of an M-channel array of photodetectors, the second photodetector module is made in the form of an N-channel array of photodetectors, wherein the center of the aperture of the m-th photodetector of the M-channel array of photodetectors is located in the m-th central measuring plane for the angle along the y coordinate,and the center of the aperture of the n-th photodetector of the N-channel array of photodetectors is located in the n-th central measuring plane for the angle along the x coordinate, while the output of the m-th channel of the M-channel angle meter along the y coordinate corresponds to the output of the m-th photodetector of the M-channel array of photodetectors, and the output of the n-th channel of the N-channel angle meter along the y coordinate corresponds to the output of the n-th photodetector of the N-channel array of photodetectors.

6. A filter according to claim 5, characterized in that the photodetectors of the M-channel array of photodetectors are located in the first plane, and the photodetectors of the N-channel array of photodetectors are located in the second plane, orthogonal to the first plane.

7. A filter according to item 5, characterized in that the photodetectors of the M-channel array of photodetectors are located along the first circle with the center in the middle of the slit of the front slit diaphragm with y-selection, and the photodetectors of the N-channel array of photodetectors are located along the second circle with the center in the middle of the slit of the front slit diaphragm with x-selection, wherein the plane of the first circle is orthogonal to the plane of the second circle.

Citation Information

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