Open and short circuit testing device and method

By using slider, tooth plate and gear structure in the open short circuit test equipment, combined with bidirectional screw and pressure sensor, the problem of alignment between the probe and the terminal is solved, and more accurate detection results are achieved, reducing misjudgment and subsequent workload.

WO2025118226A1PCT designated stage expired Publication Date: 2025-06-12JIANGXI HUACHUANG TOUCH CONTROL TECH CO LTD

Patent Information

Application Number
PCT/CN2023/137048
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Filing Date
2023-12-07
Publication Date
2025-06-12

AI Technical Summary

Technical Problem

During the short circuit test, the alignment problem between the probe and the terminals leads to the detection failure, which may lead to some circuit boards being misjudged as faults, increasing subsequent workload and affecting detection efficiency.

Method used

A device and method for open short circuit testing is designed. The slider, tooth plate and gear structure are used to drive the detection plate downward, combined with a bidirectional screw and pressure sensor to ensure the correct alignment of the probe and the terminal, and an abnormal signal is sent through the indicator light to remind re-check.

Benefits of technology

It effectively avoids misjudgment caused by not being truly connected to the probe and the terminal, improves the accuracy of the detection results, and reduces the misjudgment of the circuit board and subsequent workload.

✦ Generated by Eureka AI based on patent content.

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    Figure CN2023137048_12062025_PF_FP_ABST
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Abstract

An open and short circuit testing device and method. The device comprises a base (1), a support frame (2), a test board (5) and a placement frame (4). The test board (5) is slidably connected to the side opposite to the support frame (2), and the test board (5) moves downwards to drive a gear (14) to rotate; a limiting plate (17) is used for limiting reverse rotation of the gear (14); and a probe (26) is used for connecting to a circuit board to achieve testing. Under normal conditions, the friction force when the probe (26) is inserted into a wiring terminal (29) is less than the minimum elastic force of a second spring (25), when the probe (26) fails to be normally connected to the wiring terminal (29), the probe (26) is pressed downwards when a movable plate (23) moves downwards, the probe (26) is adjusted by means of the second spring (25) at the top of the probe (26), so that the probe (26) returns to normal, the pressure sensor (31) detects whether there is an abnormality, and when the second spring (25) at the top of the probe (26) is compressed, the pressure sensor (31) at the top of the second spring (25) measures an excessively large pressure value, i.e., indicating that a device abnormality occurs during the testing process rather than representing that there is necessarily a problem with the circuit board to be tested itself, thereby improving the accuracy of the testing result.
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Description

Device and method for open-short circuit testing Technical Field

[0001] The present invention relates to the technical field of circuit board detection, in particular to an open-short circuit test device and method. Background Art

[0002] The open-short circuit test is based on the principle of the forward conduction voltage drop of the ESD anti-static protection diode of the product's pins. It is mainly used to test the connection status of electronic devices. The open-short circuit test is to test open circuit and short circuit. Open circuit means that a certain point or a certain section in the circuit is not connected, resulting in the inability of current to pass. Short circuit means that two points or sections in the circuit that should not be connected are connected together, resulting in current shunting or excessive current.

[0003] Chinese patent publication number CN114200285A discloses a circuit board testing device, comprising a test board placement portion and a circuit board placement portion; self-locking clamps are provided at opposite ends of the test board placement portion, and the test board is disposed between the self-locking clamps; the self-locking clamps are provided with buckles; the buckles are movably connected to the self-locking clamps, and the buckles can be elastically flipped around the movable connection point; the test board is provided with connection terminals for detecting the circuit board to be tested; the connection terminals are arranged toward the circuit board placement portion; slots are provided at positions opposite to the buckles, and the circuit board to be tested is placed between the slots; the shapes of the slots and the buckles match. Therefore, when the test board placement portion is installed on the circuit board placement portion for circuit board testing, the buckles on the self-locking clamps are embedded in the slots of the circuit board placement portion, so that the test board placement portion is fixed to the circuit board placement portion by the self-locking clamps, preventing the test board from detaching from the circuit board during circuit board testing, causing a test failure. However, this patent may still have the following problems:

[0004] During the process of the inspection board moving down and the probe end contacting the circuit board to be inspected, the probe and the terminal may not be aligned. The probe end may fail to be inserted into the groove of the terminal and instead contact the peripheral position of the terminal. Then, when the inspection board moves down, the probe end is contacted, and the spring is compressed. When the inspection board moves down to the correct height, the probe end is not connected to the corresponding terminal. Alternatively, there may be foreign matter in the groove of the terminal, resulting in the lower end of the probe failing to connect normally with the circuit board. If this happens, the probe end cannot contact the terminal on the circuit board and fails to successfully connect with the circuit board to be inspected, resulting in the inspection instrument being unable to receive the probe's inspection information, thereby causing the inspection to fail and the inspection instrument issuing an abnormality message. However, this does not necessarily mean that the circuit board itself has an abnormality. If it is not distinguished and re-inspected after the inspection, some circuit boards will be mistakenly judged as faulty circuit boards, resulting in waste of circuit boards. If it is necessary to distinguish whether the abnormality is in the inspection process or in the circuit board itself after the inspection, it cannot be reflected in the inspection process, which also increases the subsequent workload and affects the inspection efficiency.

[0005] Therefore, the present invention provides an apparatus and method for open-short circuit testing. Summary of the Invention

[0006] The present invention is a device and method for open-short circuit testing designed to solve the problem that abnormalities in the detection process lead to abnormal detection results.

[0007] The technical solution adopted by the present invention to solve its technical problem is: an open-short circuit test device and method, including a base, a support frame, a detection plate and a placement frame, a group of symmetrical support frames fixedly installed on the top of the base, a detection plate slidably connected to the opposite side of the support frame, a placement frame is provided under the detection plate, the placement frame is fixedly connected to the top of the base, and the detection plate is slidably connected to the connecting plate, characterized in that it also includes:

[0008] A slider is disposed in the support frame, and a toothed plate fixedly connected to one side of the slider is engaged with the gear, and is used to drive the gear to rotate when the detection plate moves downward;

[0009] The limit plate is used to limit the reverse rotation of the gear to prevent the detection plate from being lifted up after moving down;

[0010] A probe, which is configured to be inserted into a terminal block on a circuit board for connecting to the circuit board to implement testing;

[0011] The two-way screw has threads at both ends arranged in an axisymmetric structure, which realizes the engagement and separation of the tooth plate and the gear by controlling the sliding of the connecting plate;

[0012] The pressure sensor has a second spring fixedly connected to its bottom. It is configured to detect an abnormality by the compression of the second spring when the probe is not aligned with the corresponding terminal and is squeezed, and then send a detection signal in conjunction with the indicator light corresponding to the probe.

[0013] Preferably, a first slide groove is provided in the support frame, the first slide groove is cross-shaped, the first slide groove is slidably connected to the slider, the opposite side of the slider is fixedly connected to the connecting plate, the end of the connecting plate away from the slider is slidably connected to the detection plate, and the side of the slider away from the connecting plate is fixedly connected to the tooth plate.

[0014] Preferably, a second slide groove is provided on the detection plate, the connecting plate passes through the second slide groove and is slidingly connected to the second slide groove, the two corresponding ends of the top of the detection plate are fixedly connected with fixed plates, the fixed plate is rotatably connected to the bidirectional screw, and the bidirectional screw passes through the connecting plate and is threadedly connected to the connecting plate.

[0015] Preferably, a group of symmetrical connecting boxes are fixedly installed at the bottom of the detection plate, and a third slide groove is opened on the opposite side of the two connecting boxes, and a pressing plate is slidably connected in the third slide groove. The two ends of the pressing plate are located in the connecting box, and a telescopic rod is fixedly installed at the center position of the bottom of the detection plate, and the movable end of the telescopic rod is fixedly connected to the top of the pressing plate. A movable plate is provided in the connecting box, and the top of the movable plate is fixedly connected to the bottom of the pressing plate. A limiting rod is fixedly connected in the connecting box, and the limiting rod passes through the movable plate and is slidably connected to the movable plate, and the probe is slidably connected to the connecting box.

[0016] Preferably, the bottom of the movable plate is fixedly connected to the pressure sensor, the pressure sensor is arranged in a ring shape, a fixing rod is provided in the middle of the pressure sensor, the top of the fixing rod is fixedly connected to the bottom of the movable plate, the lower end of the fixing rod is slidably connected inside the probe, the top of the probe is fixedly connected to the second spring, the end of the second spring away from the probe is fixedly connected to the pressure sensor, the number of the pressure sensors corresponds to the number of probes, an outer wall of the connection box is fixedly connected to the indicator light, and the indicator light is electrically connected to the pressure sensor.

[0017] Preferably, a placement rack is fixedly installed on the top of the base, the circuit board is placed on the placement rack, the top of the circuit board is fixedly connected to the wiring terminals, and the wiring terminals correspond to the probes.

[0018] Preferably, a support plate is fixedly installed on the side away from the support frame, and the support plate is fixedly connected to the first fixed shaft, and a ratchet is rotatably connected to the first fixed shaft, and the first fixed shaft is rotatably connected to the gear, and the ratchet and the gear are sleeved, and the ratchet and the gear are engaged, and the length of the ratchet is smaller than the length of the gear, and limiting mounting frames are fixedly installed on both ends of the first fixed shaft, and the limiting mounting frame is fixedly connected to the second fixed shaft, and the second fixed shaft is rotatably connected to the limiting plate, and a first spring is fixedly connected to the bottom of the limiting plate.

[0019] Preferably, a method for using an open-short circuit test device comprises the following steps:

[0020] S1: First, place the circuit board to be tested on the placement rack, and control the downward movement of the test board and the extension of the telescopic rod to insert the probe into the corresponding terminal groove;

[0021] S2; the detection plate drives the tooth plate to move downward, thereby driving the gear engaged with the tooth plate to rotate, and the limit plate limits the gear to prevent the gear from reversing. At this time, the probe is normally connected to the circuit board to be tested and is tested;

[0022] S3: When there is a deviation between the probe and the corresponding terminal position, the probe moves downward, causing the second spring to be compressed to a certain extent. The pressure sensor detects the pressure value and reflects the information on the indicator light, indicating that there is an abnormality in the detection process;

[0023] S4: By controlling the rotation of the bidirectional screw, the two connecting plates are brought closer to each other, thereby separating the tooth plate from the gear. At this time, the detection plate is controlled to move upward to separate the probe from the circuit board.

[0024] Beneficial effects of the present invention:

[0025] (1) The present invention discloses an open-short circuit test device and method. Under normal circumstances, the friction force when the probe is inserted into the terminal is less than the minimum elastic force of the second spring. When there is a deviation between the position of the probe end and the corresponding terminal groove, the probe may be temporarily stuck during the downward movement of the detection plate, resulting in the probe end failing to connect normally with the circuit board, or there is a foreign object in the terminal, resulting in the probe end failing to connect normally with the circuit board. The detection process is abnormal. When the movable plate moves downward again, it presses the probe downward. The elastic force of the second spring at the top of the probe may restore the temporarily stuck probe to the normal connection with the terminal. At this time, the detection can be carried out normally. If the movable plate still fails to connect the probe with the circuit board after moving downward, the second spring at the top of the probe is compressed. The pressure sensor at the top of the second spring detects an excessive pressure value and reflects the information to the corresponding indicator light. At this time, the indicator light is on, indicating that the probe and the terminal are abnormally engaged during the detection process, which can remind the staff to re-inspect. It does not mean that there must be a problem with the circuit board itself. It avoids misjudgment due to the probe and the terminal not being properly engaged, thereby improving the accuracy of the detection result.

[0026] (2) In the device and method for open-short circuit testing described in the present invention, when the detection plate moves downward, the tooth plate drives the gear to rotate. If the detection plate is to move upward, the limit plate automatically engages with the inner side of the gear to limit the gear from reversing, thereby fixing the detection plate and preventing the detection plate from being lifted up by the second spring, causing the probe to be unable to connect normally with the circuit board to be detected, thereby affecting the detection work. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] The present invention will be further described below with reference to the accompanying drawings and examples.

[0028] FIG1 is a schematic diagram of the overall structure provided by the present invention;

[0029] FIG2 is a schematic diagram of the bottom of the detection board provided by the present invention;

[0030] FIG3 is a schematic diagram of the connection between the pressing plate and the probe provided by the present invention;

[0031] FIG4 is a schematic diagram showing the connection between the probe and the pressure sensor provided by the present invention;

[0032] FIG5 is a top cross-sectional view of a support frame provided by the present invention;

[0033] FIG6 is a schematic diagram of the connection between the tooth plate and the gear provided by the present invention;

[0034] FIG7 is a schematic diagram of the connection between the first fixed shaft and the limiting plate provided by the present invention;

[0035] FIG8 is an enlarged view of point A in FIG7 ;

[0036] FIG9 is a schematic diagram of the connection between the bidirectional screw and the connecting frame provided by the present invention;

[0037] FIG10 is a flowchart of the use of the present invention.

[0038] In the figure: 1. base; 2. support frame; 3. first slide; 4. placement frame; 5. detection plate; 6. second slide; 7. connecting plate; 8. slider; 9. tooth plate; 10. fixed plate; 11. bidirectional screw; 12. first fixed shaft; 13. ratchet; 14. gear; 15. limit mounting frame; 16. second fixed shaft; 17. limit plate; 18. first spring; 19. telescopic rod; 20. pressing plate; 21. connecting box; 22. third slide; 23. movable plate; 24. fixed rod; 25. second spring; 26. probe; 27. indicator light; 28. limit rod; 29. ​​terminal; 30. support plate; 31. pressure sensor. DETAILED DESCRIPTION

[0039] In order to make the technical means, creative features, objectives and effects achieved by the present invention easier to understand, the present invention is further described below in conjunction with specific implementation methods. Example 1

[0040] As shown in Figures 1 to 10, an open-short circuit test device and method according to the present invention include a base 1, a support frame 2, a detection plate 5 and a placement frame 4. A group of symmetrical support frames 2 are fixedly installed on the top of the base 1, and a detection plate 5 is slidably connected to the opposite side of the support frame 2. A placement frame 4 is provided under the detection plate 5, and the placement frame 4 is fixedly connected to the top of the base 1. The detection plate 5 is slidably connected to the connecting plate 7. The device and method also include: a slider 8, which is arranged in the support frame 2, a toothed plate 9 fixedly connected to one side of the slider 8 is engaged with the gear 14, and is used to drive the gear 14 to rotate when the detection plate 5 moves downward; a limit plate 17, which is used to limit the gear 14 Reverse rotation to prevent the detection plate 5 from being lifted up after moving down; the probe 26 is configured to be inserted into the terminal 29 on the circuit board to connect the circuit board for testing; the two-way screw 11 has threads at both ends arranged in an axially symmetrical structure, which realizes the engagement and separation of the tooth plate 9 and the gear 14 by controlling the sliding of the connecting plate 7; the pressure sensor 31 has a second spring 25 fixedly connected to its bottom, which is configured to be squeezed when the probe 26 is not aligned with the corresponding terminal 29, and can judge the abnormality by the compression of the second spring 25, and then cooperate with the indicator light 27 corresponding to the probe 26 to send a detection signal.

[0041] When the detection plate 5 is moved downward, the slider 8 slides downward in the first slide groove 3, so that the toothed plate 9 fixedly connected to the slider 8 drives the gear 14 to rotate. The limit plate 17 installed on the first fixed shaft 12 cooperates with the ratchet 13 and the gear 14, so that the gear 14 can only rotate in one direction during the detection process. When the reverse rotation is to occur, the limit plate 17 is engaged with the gear 14, and the limit mounting frame 15 limits the rotation angle of the limit plate 17, so that the gear 14 cannot rotate in the reverse direction, thereby fixing the detection plate 5. After the detection plate 5 moves downward to the maximum limit, the control telescopic rod 19 is extended so that the pressing plate 20 drives the movable plate 23 to move downward. After the probe 26 is inserted into the corresponding terminal 29, it is connected to the circuit board. The circuit board is inspected. If the end of the probe 26 fails to be inserted into the groove of the terminal 29, or there is a foreign object in the terminal 29, the probe 26 is squeezed during the downward movement, so that the probe 26 approaches the pressure sensor 31. The second spring 25 is compressed, and the pressure sensor 31 detects an excessively large pressure value and sends a signal to its corresponding indicator light 27, indicating that there is an abnormality in the connection between the probe 26 and the circuit board, rather than that there is an abnormality in the circuit board itself. The two possible abnormal situations are distinguished to reduce subsequent screening work. When the probe 26 needs to be separated from the circuit board, the bidirectional screw 11 is controlled to make the two connecting plates 7 slide toward the middle direction, drive the tooth plate 9 to separate from the gear 14, and then lift the position of the detection plate 5.

[0042] As shown in Figures 5, 6 and 9, a first slide groove 3 is provided in the support frame 2, and the first slide groove 3 is cross-shaped. The first slide groove 3 is slidably connected to the slider 8, and the opposite side of the slider 8 is fixedly connected to the connecting plate 7. The end of the connecting plate 7 away from the slider 8 is slidably connected to the detection plate 5, and the side of the slider 8 away from the connecting plate 7 is fixedly connected to the tooth plate 9; a second slide groove 6 is provided on the detection plate 5, and the connecting plate 7 passes through the second slide groove 6 and is slidably connected to the second slide groove 6, and the corresponding two ends of the top of the detection plate 5 are fixedly connected with a fixed plate 10, and the fixed plate 10 is rotatably connected to the bidirectional screw 11, and the bidirectional screw 11 passes through the connecting plate 7 and is threadedly connected to the connecting plate 7.

[0043] In this embodiment, the function of the first slide groove 3 is that the slider 8 can slide up and down inside it, and can also slide left and right in a small range. The range of left and right sliding is limited by the second slide groove 6, and the position of the gear 14 remains unchanged. During detection, the tooth plate 9 is engaged with the gear 14. Therefore, when the detection plate 5 drives the slider 8 to move downward, the gear 14 engaged with the tooth plate 9 rotates accordingly. The limit plate 17 on the first fixed shaft 12 can limit the gear 14 from rotating in the opposite direction, and is used to limit the position of the detection plate 5 during detection to achieve the fixation of the detection plate 5. When the detection plate 5 needs to be moved up, the bidirectional screw 11 is controlled to make the connecting plate 7 slide toward the middle of the detection plate 5 in the second slide groove 6, thereby separating the tooth plate 9 from the gear 14, and the detection plate 5 can be controlled to move up.

[0044] As shown in Figures 1 to 4, a group of symmetrical connection boxes 21 are fixedly installed at the bottom of the detection board 5, and a third slide groove 22 is opened on the opposite side of the two connection boxes 21. A pressing plate 20 is slidably connected in the third slide groove 22. The two ends of the pressing plate 20 are located in the connection box 21. A telescopic rod 19 is fixedly installed at the center position of the bottom of the detection board 5. The movable end of the telescopic rod 19 is fixedly connected to the top of the pressing plate 20. A movable plate 23 is provided in the connection box 21. The top of the movable plate 23 is fixedly connected to the bottom of the pressing plate 20. A limiting rod 28 is fixedly connected in the connection box 21. The limiting rod 28 passes through the movable plate 23 and is slidably connected to the movable plate 23. The probe 26 is slidably connected to the connection box 21; the bottom of the movable plate 23 is connected to the pressure sensor 31 Fixed connection, the pressure sensor 31 is arranged in a ring shape, a fixed rod 24 is provided in the middle of the pressure sensor 31, the top of the fixed rod 24 is fixedly connected to the bottom of the movable plate 23, the lower end of the fixed rod 24 is slidably connected inside the probe 26, the top of the probe 26 is fixedly connected to the second spring 25, and the end of the second spring 25 away from the probe 26 is fixedly connected to the pressure sensor 31. The number of pressure sensors 31 corresponds to the number of probes 26. An outer wall of the connection box 21 is fixedly connected to the indicator light 27, and the indicator light 27 is electrically connected to the pressure sensor 31; a placement rack 4 is fixedly installed on the top of the base 1, and the circuit board is placed on the placement rack 4. The top of the circuit board is fixedly connected to the wiring terminal 29, and the wiring terminal 29 corresponds to the probe 26.

[0045] In this embodiment, during normal use, the bottom of the slider 8 contacts the bottom of the first slide groove 3, and the pressing plate 20 moves down to the maximum extent. At this time, the bottom of the probe 26 contacts the circuit board, and the second spring 25 is compressed to a certain extent, so that the contact between the probe 26 and the circuit board is closer, avoiding the influence of poor contact on the detection result. If there is a deviation between the position of the end of the probe 26 and the corresponding groove of the terminal 29, the probe 26 may directly contact the terminal 29 when moving down, instead of being vertically inserted into the terminal 29, or there is a foreign object in the terminal 29, resulting in the end of the probe 26 failing to connect normally with the circuit board, so the movable plate 23 When the plate 23 moves downward, two situations may occur: one is that the elastic force of the second spring 25 presses the probe 26 downward, so that the temporarily stuck probe 26 resumes normal connection with the terminal 29, and the probe 26 is successfully connected to the circuit board; the other is that the movable plate 23 moves downward and the probe 26 is completely resisted, so that the probe 26 approaches the direction of the pressure sensor 31. At this time, the second spring 25 is compressed, and the pressure sensor 31 detects a pressure value greater than that during normal detection. The corresponding indicator light 27 sends a signal, which means that there is an equipment abnormality in the detection process, rather than that there is an open short circuit problem in the circuit board itself, thereby improving the accuracy of the detection.

[0046] As shown in Figures 5 to 8, a support plate 30 is fixedly installed on the side away from the support frame 2, and a first fixed shaft 12 is fixedly connected to the support plate 30, and a ratchet 13 is rotatably connected to the first fixed shaft 12. The first fixed shaft 12 is rotatably connected to the gear 14, and the ratchet 13 and the gear 14 are sleeved and engaged with the ratchet 13. The length of the ratchet 13 is smaller than the length of the gear 14. Limit mounting frames 15 are fixedly installed at both ends of the first fixed shaft 12, and a second fixed shaft 16 is fixedly connected to the limit mounting frame 15. The second fixed shaft 16 is rotatably connected to the limit plate 17, and a first spring 18 is fixedly connected to the bottom of the limit plate 17.

[0047] In this embodiment, when the gear 14 is driven by the toothed plate 9 to rotate, the limit plate 17 on the first fixed shaft 12 does not limit the rotation of the gear 14 under the action of the first spring 18. When the toothed plate 9 is engaged with the gear 14, when the detection plate 5 is to move up, the end of the limit plate 17 away from the second fixed shaft 16 engages with the inner wall of the gear 14 and is fixed under the action of the limit mounting frame 15, so that the gear 14 cannot rotate in the opposite direction, thereby fixing the detection plate 5 and avoiding the detection plate 5 being lifted up due to the rebound force of the second spring 25 during detection, thereby affecting the detection result.

[0048] When the detection plate 5 is lifted up due to the rebound force of the second spring 25 on the top of the probe 26, the limit plate 17 is engaged with the inner wall of the gear 14, limiting the gear 14 from reversing and preventing the detection plate 5 from moving up, thereby fixing the detection plate 5;

[0049] After the detection plate 5 moves down to the maximum extent, the telescopic rod 19 is controlled to extend, so that the pressing plate 20 drives the movable plate 23 to move down, pressing the probe 26 downward. The moving range of the pressing plate 20 is limited by the third slide groove 22. During normal detection, the bottom of the slider 8 contacts the bottom of the first slide groove 3. The pressing plate 20 moves down to the maximum extent. The friction force when the probe 26 is inserted into the terminal 29 is less than the minimum elastic force of the second spring 25. At this time, the bottom of the probe 26 contacts the circuit board, and the second spring 25 is compressed to a certain extent, making the contact between the probe 26 and the circuit board closer, avoiding poor contact affecting the detection results.

[0050] When there is a misalignment between the end of the probe 26 and the corresponding groove of the terminal 29, the probe 26 may directly contact the terminal 29 when it moves downward instead of being properly connected to the terminal 29. Therefore, two situations may occur when the movable plate 23 moves downward, as follows:

[0051] 1. When the probe 26 is pressed down, it returns to the correct position. The probe 26 and the terminal 29 are normally connected. All the indicator lights are off. In this case, the detector can produce two results:

[0052] (1) The tester detects that the circuit board is successfully connected and the circuit board is tested and qualified;

[0053] (2) The tester detects that the circuit connection of the circuit board is unsuccessful and the circuit board test fails. No re-inspection is required.

[0054] When pressing down, the probe 26 is stuck and the corresponding indicator light is on, indicating that the circuit board test fails. During this process, the probe 26 approaches the pressure sensor 31, the second spring 25 is compressed, and the pressure sensor 31 detects a pressure value greater than that during normal testing, and reflects the information to the indicator light 27 corresponding to the pressure sensor 31. At this time, the indicator light 27 is on, indicating that there is an abnormality in the detection process. The probe 26 failed to engage with the terminal 29 normally, rather than the circuit board itself having an open short circuit problem. Whether the circuit board is abnormal still needs to be re-inspected. Distinguishing the two abnormal situations can reduce the subsequent differentiation work, improve the accuracy of the detection results, and reduce the misjudgment of the circuit board. In this case, the detector can obtain two results:

[0055] (1) The tester detects that the circuit connection of the circuit board is successful, but the circuit board test fails because the probe 26 cannot normally engage with the terminal 29. In this case, the terminal 29 needs to be repaired;

[0056] (2) The detector detects that the circuit connection of the circuit board is unsuccessful and the circuit board test fails. In this case, manual re-inspection is required.

[0057] When the probe 26 needs to be separated from the circuit board, the bidirectional screw 11 is controlled to make the two connecting plates 7 slide closer to each other in the second slide groove 6, driving the tooth plate 9 and the gear 14 to separate, and then the detection plate 5 can be moved up.

[0058] The basic principles, main features, and advantages of the present invention are shown and described above. Those skilled in the art should understand that the present invention is not limited to the above-described embodiments. The above-described embodiments and descriptions are merely illustrative of the principles of the present invention. Various changes and modifications may be made to the present invention without departing from the spirit and scope of the present invention. Such changes and modifications are intended to fall within the scope of the present invention. The scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. An open - short - circuit test device, comprising a base (1), a support frame (2), a detection board (5) and a placement rack (4). A set of symmetric support frames (2) are fixedly installed on the top of the base (1). A detection board (5) is slidably connected to the opposite sides of the support frames (2). A placement rack (4) is arranged under the detection board (5), and the placement rack (4) is fixedly connected to the top of the base (1). The detection board (5) is slidably connected to a connection board (7). It is characterized in that: It further comprises: A slider (8) which is arranged in the support frame (2). A toothed plate (9) fixedly connected to one side of the slider (8) meshes with a gear (14), and is used to drive the gear (14) to rotate when the detection board (5) moves downward; A limit plate (17) which is used to limit the reverse rotation of the gear (14) to prevent the detection board (5) from being jacked up after moving downward; A probe (26) which is arranged to be inserted into a terminal (29) on a circuit board for connecting the circuit board to achieve testing; A bidirectional screw (11) whose threads at both ends are arranged in an axisymmetric structure, and it realizes the engagement and separation of the toothed plate (9) and the gear (14) by controlling the sliding of the connection board (7); A pressure sensor (31) whose bottom is fixedly connected to a second spring (25). It is arranged such that when the probe (26) is not aligned with the corresponding terminal (29) and is squeezed, it can judge the abnormality through the compression condition of the second spring (25), and then cooperate with an indicator light (27) corresponding to the probe (26) to emit a detection signal.

2. An open - short - circuit test device according to claim 1, It is characterized in that: A first chute (3) is opened in the support frame (2). The first chute (3) is cross - shaped. The first chute (3) is slidably connected to the slider (8). The opposite sides of the slider (8) are fixedly connected to the connection board (7). One end of the connection board (7) away from the slider (8) is slidably connected to the detection board (5). One side of the slider (8) away from the connection board (7) is fixedly connected to the toothed plate (9).

3. An open - short - circuit test device according to claim 2, It is characterized in that: A second chute (6) is opened on the detection board (5). The connection board (7) penetrates through the second chute (6) and is slidably connected to the second chute (6). At both ends corresponding to the top of the detection board (5), fixing plates (10) are fixedly connected. The fixing plates (10) are rotatably connected to the bidirectional screw (11). The bidirectional screw (11) penetrates through the connection board (7) and is threadedly connected to the connection board (7).

4. An open - short - circuit test device according to claim 3, It is characterized in that: A pair of symmetric connection boxes (21) are fixedly installed at the bottom of the detection board (5). A third sliding groove (22) is formed on the opposite side of the two connection boxes (21). A pressing plate (20) is slidably connected in the third sliding groove (22). Both ends of the pressing plate (20) are located inside the connection box (21). A telescopic rod (19) is fixedly installed at the center position of the bottom of the detection board (5). The movable end of the telescopic rod (19) is fixedly connected to the top of the pressing plate (20). An activity plate (23) is arranged inside the connection box (21). The top of the activity plate (23) is fixedly connected to the bottom of the pressing plate (20). A limiting rod (28) is fixedly connected inside the connection box (21). The limiting rod (28) penetrates through the activity plate (23) and is slidably connected to the activity plate (23). The probe (26) is slidably connected to the connection box (21).

5. An open - short circuit test device according to claim 4, characterized in that: The bottom of the activity plate (23) is fixedly connected to a pressure sensor (31). The pressure sensor (31) is annularly arranged. A fixing rod (24) is arranged in the middle of the pressure sensor (31). The top of the fixing rod (24) is fixedly connected to the bottom of the activity plate (23). The lower end of the fixing rod (24) is slidably connected inside the probe (26). The top of the probe (26) is fixedly connected to a second spring (25). One end of the second spring (25) away from the probe (26) is fixedly connected to the pressure sensor (31). The number of the pressure sensors (31) corresponds to the number of the probes (26). One outer side wall of the connection box (21) is fixedly connected to an indicator light (27). The indicator light (27) is electrically connected to the pressure sensor (31).

6. An open - short circuit test device according to claim 1, characterized in that: A placement rack (4) is fixedly installed on the top of the base (1). The circuit board is placed on the placement rack (4). The top of the circuit board is fixedly connected to a wiring terminal (29). The wiring terminal (29) corresponds to the probe (26).

7. An open - short circuit test device according to claim 2, characterized in that: Support plates (30) are fixedly installed on the opposite sides of the support frame (2). A first fixed shaft (12) is fixedly connected to the support plate (30). A ratchet wheel (13) is rotatably connected to the middle of the first fixed shaft (12). The first fixed shaft (12) is rotatably connected to a gear (14). The ratchet wheel (13) and the gear (14) are sleeved, and the ratchet wheel (13) is engaged with the gear (14). The length of the ratchet wheel (13) is less than the length of the gear (14). Limiting mounting frames (15) are fixedly installed at both ends of the first fixed shaft (12). A second fixed shaft (16) is fixedly connected to the limiting mounting frame (15). The second fixed shaft (16) is rotatably connected to a limiting plate (17). A first spring (18) is fixedly connected below the limiting plate (17).

8. A use method of an open - short circuit test device, characterized in that, the steps are as follows: S1: First, place the circuit board to be detected on the placement rack (4). By controlling the downward movement of the detection board (5) and the extension of the telescopic rod (19), the probe (26) is inserted into the groove of the corresponding terminal (29). S2; The detection board (5) drives the toothed plate (9) to move downward, thereby driving the gear (14) meshing with the toothed plate (9) to rotate. The limiting plate (17) restricts the gear (14) to prevent the gear (14) from reversing. At this time, the probe (26) is normally connected to the circuit board to be detected for detection. S3: When there is a deviation in the position of the probe (26) from the corresponding terminal (29), the probe (26) moves downward, causing the second spring (25) to be compressed to a certain extent. The pressure sensor (31) detects the pressure value and reflects the information on the indicator light (27), indicating that there is an abnormality in the detection process. S4: By controlling the rotation of the bidirectional screw (11), the two connecting plates (7) are moved closer to each other, so that the toothed plate (9) is separated from the gear (14). At this time, controlling the upward movement of the detection board (5) can separate the probe (26) from the circuit board.

Citation Information

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