Test method, system, apparatus and device for energy storage control system, and storage medium

Abstract

A test method, system, apparatus and device for an energy storage control system, and a storage medium. The test method comprises: receiving test indication information (S201); on the basis of the test indication information, simulating an associated device connected to a device to be tested in an energy storage control system, and determining simulation-associated parameters (S202); and on the basis of the simulation-associated parameters and the test indication information, testing the device to be tested, and receiving a test result of the device to be tested (S203). A test device (104) can implement the simulation of any device associated with a device to be tested in an energy storage control system. Specifically, interface implementations and function execution logic implementations of any device can be simulated, and the simulated interface implementations or function implementations are implemented by means of simulation-associated parameters. Therefore, the test process is not limited to testing a specific type of device to be tested, and multiple types of tests can be implemented, thereby improving the applicability of the test method to a certain extent.

Description

Energy storage control system test method, test system, device, equipment and storage medium Cross-references

[0001] This application refers to Chinese patent application No. 2023117369154, filed on December 15, 2023, entitled “Testing method, testing system, device, equipment and storage medium for energy storage control system”, which is incorporated into this application in its entirety by reference. Technical Field

[0002] The present application relates to the technical field of flexible direct energy storage valve testing, and in particular to a testing method, testing system, device, equipment and storage medium for an energy storage control system. Background Art

[0003] The flexible DC energy storage valve control and protection system serves as the "brain" of the energy storage valve product and plays a key role in the power conversion between the flexible DC system and the battery control system. The control and protection system cooperates with multiple systems such as the flexible DC control system, valve cooling system, fire protection system, battery control system, and sub-module control system to realize the startup, charge and discharge control, and protection functions of the energy storage valve.

[0004] In related technologies, the test system of the energy storage valve control system usually relies on a relay protection tester to verify some interface functions, and most of the tests can only be completed in the shutdown state, partial control, and protection function exit scenarios. However, the above-mentioned relay protection tester is difficult to meet the testing requirements of the energy storage valve control and protection system. Summary of the Invention

[0005] Based on this, it is necessary to provide a test method, test system, device, equipment and storage medium for an energy storage control system to address the above technical problems, which can efficiently test the energy storage valve control and protection system according to test requirements.

[0006] In a first aspect, the present application provides a method for testing an energy storage control system. The method is applied to a test device and includes:

[0007] receiving test instruction information;

[0008] Simulate the associated devices connected to the device under test in the energy storage control system according to the test instruction information, and determine the simulated associated parameters; the simulated associated parameters include simulated interface parameters or simulated function parameters;

[0009] The device to be tested is tested according to the simulation associated parameters and the test instruction information, and the test result of the device to be tested is received.

[0010] The test method of the energy storage control system described in the embodiment of the present application receives test indication information, and simulates the associated devices connected to the device under test in the energy storage control system according to the test indication information to determine the simulation associated parameters; tests the device under test according to the simulation associated parameters and the test indication information, and receives the test results of the device under test. In the above-mentioned test method, the test device can simulate any device associated with the device under test in the energy storage control system, specifically, it can simulate the interface implementation and function execution logic implementation of any device, and realize the above-mentioned simulated interface implementation or function implementation through simulation associated parameters, so that the above-mentioned test method can complete the test by performing data interaction with the device under test through the simulated interface implementation or function logic implementation. Therefore, the test process is not limited to testing a specific type of device under test, and can realize multiple types of tests, such as interface testing of the device under test or function testing of the device under test, which improves the applicability of the test method to a certain extent.

[0011] In one embodiment, simulating associated devices connected to the device under test in the energy storage control system according to the test instruction information and determining simulation associated parameters includes:

[0012] Get the preset point configuration table;

[0013] According to the preset point configuration table and the test type indicated by the test instruction information, simulate the associated equipment and determine the simulated associated parameters.

[0014] The method described in the embodiments of the present application configures the associated devices through a preset point matching table, so that the associated devices of any type of device to be tested can be simulated on the local machine, and the test module implemented by switching any type of simulated associated parameters can exchange information with the device to be tested to implement various types of tests. The test process does not need to be based on the device to be tested and the actual associated devices, which simplifies the physical machine required for the test to a certain extent, especially for multiple types of tests, and the test equipment itself occupies a small space, that is, it does not require the layout of a large-area physical machine and is not subject to any environmental restrictions, which improves the applicability of the method to a certain extent.

[0015] In one embodiment, the simulation association parameters include simulation interface parameters. According to the preset point configuration table and the test type indicated by the test instruction information, the simulation association parameters are obtained by simulating the associated equipment, including:

[0016] If the test type indicated by the test instruction information is an interface test, the interface configuration information is extracted from the preset point configuration table;

[0017] Configure relevant interfaces of various types in the associated device according to the interface configuration information to obtain simulation interface parameters.

[0018] The method described in the embodiments of the present application configures various types of related interfaces in the associated devices through a preset point matching table, so that any type of interface can be simulated on the local machine, and various types of interface tests can be realized by switching the test interface realized by the parameters of any type of simulated interface and performing information exchange with the corresponding interface in the device to be tested. The test process does not need to be based on the actual interface of the device to be tested and the actual interface of the associated device, which improves the applicability of the method to a certain extent.

[0019] In one embodiment, the simulation associated parameters include simulation function parameters. According to the preset point configuration table and the test type indicated by the test instruction information, the associated devices connected to the device under test in the energy storage control system are simulated to obtain the simulation associated parameters, including:

[0020] If the test type indicated by the test instruction information is a functional test, the test logic of each functional module in the associated device is extracted from the preset point configuration table;

[0021] Perform logic circuit configuration according to the test logic of each functional module in the associated equipment and generate simulation function parameters.

[0022] The method described in the embodiments of the present application configures each functional module in the associated device through a preset point configuration table, so as to realize the test logic of simulating each function on the local machine, that is, configuring the test module on the local machine to simulate the corresponding function of the associated device, and performing information interaction with the device under test through the functional module realized by simulating the functional parameters to realize the corresponding functional test. This test method can realize a test for the correctness of the execution logic of each function implemented on the device under test, that is, realize the test of the software process.

[0023] In one embodiment, obtaining a preset point allocation table includes:

[0024] Receive a preset point configuration table; the preset point configuration table includes interface configuration information of at least one type of related interface, and functional configuration information of at least one type of functional module; each interface configuration information includes operating parameters of the corresponding interface, and each functional configuration information includes test logic of the corresponding functional module.

[0025] The method described in the embodiment of the present application can receive a preset point configuration table to configure the test module on the local machine, which can achieve rapid configuration and thus improve test efficiency.

[0026] In one embodiment, testing the device under test according to the simulation-related parameters and the test instruction information, and receiving the test result of the device under test includes:

[0027] Parsing the test instruction information to obtain a first test task;

[0028] The test module of the local machine is configured according to the simulation association parameters, and the configured test module is driven to execute the first test task to test the device under test, and a test result obtained after the device under test is tested based on the first test task is received.

[0029] The test method provided in the embodiment of the present application only requires issuing test instruction information to the test equipment, and the test equipment can automatically parse the test task based on the test instruction information and automatically simulate any associated equipment to complete the test, thereby realizing a fully automatic testing method for the energy storage control system.

[0030] In one embodiment, the simulation-related parameters include simulation function parameters, the test module includes a function module, driving the configured test module to execute a first test task to test the device under test, and receiving a test result obtained after the device under test is tested based on the first test task, including:

[0031] The configured function module is driven to generate abnormal information according to the test parameters in the first test task; the simulated function parameters include any one of input function parameters, network communication function parameters, optical fiber communication function parameters, and output function parameters;

[0032] The abnormal information is sent to the device under test for testing, and a test result obtained after the device under test is tested based on the first test task is received.

[0033] The method described in the embodiment of the present application realizes a short-time fault insertion test function, and by simulating and generating abnormal information tests, the test can be refined to highly abnormal simulations such as cyclic redundancy check and frame loss of communication interfaces, and can also simulate various faults with a duration of microseconds.

[0034] In one embodiment, the exception information includes an exception message, and sending the exception information to the device under test for testing, and receiving a test result obtained after the device under test performs the test based on the first test task, includes:

[0035] The abnormal message is sent to the device under test for testing according to a preset sending period, and a test result obtained after the device under test is tested based on the first test task is received.

[0036] The method described in the embodiment of the present application realizes a short-term fault insertion test function, and by simulating the generation of abnormal message tests, the test can be refined to the abnormal simulation of cyclic redundancy check, frame loss, etc. of the high-level communication interface, and can also simulate various faults with a duration of microseconds.

[0037] In one embodiment, the simulation-related parameters include simulation interface parameters, driving the configured test module to execute the first test task to test the device under test, and receiving a test result obtained after the device under test is tested based on the first test task, including:

[0038] generating an abnormal signal according to the test parameters in the first test task and the type of the simulation interface parameters;

[0039] The configured test module is driven to send an abnormal signal to the device under test for testing, and receive a test result obtained after the device under test is tested based on the first test task.

[0040] The method described in the embodiment of the present application realizes another fault insertion test function, and by simulating and generating abnormal signal tests, the test can be refined to highly abnormal simulations such as cyclic redundancy check and frame loss of communication interfaces.

[0041] In one embodiment, the first test task includes multiple test subtasks, driving the configured test module to execute the first test task to test the device under test, and receiving the test results obtained after the device under test is tested based on the first test task, including:

[0042] Determining a first test parameter according to a first test subtask in the first test task;

[0043] The configured test module is driven to generate a first operating parameter according to the first test parameter;

[0044] Sending a first operating parameter to the device under test for testing, and receiving a first test result obtained after the device under test is tested based on the first operating parameter;

[0045] When the first test result indicates that the device under test is in normal working condition, new first test parameters and new first operating parameters are determined according to the next test subtask, and the test module after executing the drive configuration returns to the step of generating the first operating parameters according to the first test parameters until all test subtasks are executed.

[0046] The methods described in the embodiments of the present application implement a continuous state test method or a continuous logic test method, that is, the test is completed by simulating the interaction between the battery controller, the submodule controller, and the valve control protection system, which can improve test efficiency. In some embodiments, the test method provided in the embodiments of the present application implements a fully automatic test method by parsing multiple test subtasks for testing. It can also implement the testing of complex logical relationships by editing the logical relationships between multiple test subtasks.

[0047] In one embodiment, the method further comprises:

[0048] Establish a communication connection between the configured test module and the device under test;

[0049] Sending a second operating parameter to the device under test, and receiving a second test result obtained after the device under test performs a test based on the second operating parameter;

[0050] When the second test result indicates that the device under test is in a fault cleared state, the step of parsing the test instruction information to obtain the first test task is performed.

[0051] The embodiment of the present application implements a fault detection method, that is, fault detection can be completed based on multiple interactive steps, that is, an automatic fault detection method is implemented.

[0052] In one embodiment, establishing a communication connection between the configured test module and the device under test includes:

[0053] Extract communication protocol information from the preset point configuration table;

[0054] Establish a communication connection between the configured test module and the device under test according to the communication protocol information.

[0055] In the embodiment of the present application, a communication connection between the configured test module and the device under test is established through a preset point matching table. Since the preset point matching table is a tree structure, a communication connection can be quickly established based on the preset point matching table, which can improve test efficiency.

[0056] In one embodiment, the method further comprises:

[0057] Report the test results to the host computer.

[0058] According to the method described in the embodiment of the present application, the test equipment can report the test results of each test subtask or test task to the host computer so that the user of the host computer can view the test results in time, or update or modify the test parameters according to the test results, and then issue new test instruction information for testing.

[0059] In a second aspect, the present application provides a test system for energy storage valve control, which includes a host computer, a test device, and an energy storage control system; the energy storage control system includes at least a submodule controller, a main control chassis, and an expansion device;

[0060] The test equipment is used to receive test indication information sent by the host computer, simulate the associated equipment connected to the device under test in the energy storage control system according to the test indication information, determine the simulation associated parameters, test the device under test according to the simulation associated parameters and the test indication information, and receive the test results of the device under test; the simulation associated parameters include simulation interface parameters or simulation function parameters.

[0061] In a third aspect, the present application provides a test device for an energy storage control system, the test device comprising:

[0062] A receiving module, configured to receive test instruction information;

[0063] A simulation module is used to simulate the associated devices connected to the device under test in the energy storage control system according to the test instruction information, and determine simulation associated parameters; the simulation associated parameters include simulation interface parameters or simulation function parameters;

[0064] The test module is used to test the device under test according to the simulation associated parameters and the test instruction information, and receive the test results of the device under test.

[0065] In a fourth aspect, the present application provides a test device for an energy storage control system, the test device comprising:

[0066] A sending module, used for sending test instruction information to the test equipment;

[0067] The receiving module is used to receive the simulated associated parameters obtained by the test equipment according to the test indication information to simulate the associated equipment connected to the device under test in the energy storage control system, and use the simulated associated parameters to test the device under test according to the test indication information and return the test results; the simulated associated parameters include simulated interface parameters or simulated function parameters.

[0068] In a fifth aspect, the present application further provides a computer device, which includes a memory and a processor, wherein the memory stores a computer program, and the processor implements the method described in the first or second aspect above when executing the computer program.

[0069] In a sixth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the method described in the first or second aspect above.

[0070] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0071] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments of the present application. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on the drawings without inventive work. In the drawings:

[0072] FIG1 is a schematic structural diagram of a test system according to an embodiment;

[0073] FIG2 is a schematic flow chart of a method for testing an energy storage control system in one embodiment;

[0074] FIG3 is a schematic flow chart of a method for testing an energy storage control system in another embodiment;

[0075] FIG4 is a schematic diagram of a preset point allocation table in one embodiment;

[0076] FIG5 is a schematic flow chart of a method for testing an energy storage control system in another embodiment;

[0077] FIG6 is a schematic flow chart of a method for testing an energy storage control system in another embodiment;

[0078] FIG7 is a schematic flow chart of a method for testing an energy storage control system in another embodiment;

[0079] FIG8 is a schematic flow chart of a method for testing an energy storage control system in another embodiment;

[0080] FIG9 is a schematic flow chart of a method for testing an energy storage control system in another embodiment;

[0081] FIG10 is a flow chart of a method for testing an energy storage control system in another embodiment;

[0082] FIG11 is a flow chart of a method for testing an energy storage control system in another embodiment;

[0083] FIG12 is a flow chart of a method for testing an energy storage control system in another embodiment;

[0084] FIG13 is a flow chart of a method for testing an energy storage control system in another embodiment;

[0085] FIG14 is a flow chart of a method for testing an energy storage control system in another embodiment;

[0086] FIG15 is a flow chart of a method for testing an energy storage control system in another embodiment;

[0087] FIG16 is a schematic flow chart of a method for testing an energy storage control system in another embodiment;

[0088] FIG17 is a schematic structural diagram of a testing device for an energy storage control system according to one embodiment;

[0089] FIG18 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0090] In order to make the purpose, technical solutions and advantages of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0091] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" and any variations thereof in the specification and claims of this application and the above-mentioned figure descriptions are intended to cover non-exclusive inclusions.

[0092] In the description of the embodiments of this application, the technical terms "first" and "second" are used only to distinguish different objects and should not be understood to indicate or imply relative importance or implicitly specify the quantity, specific order, or primary and secondary relationship of the indicated technical features. In the description of the embodiments of this application, the meaning of "plurality" is more than two, unless otherwise clearly and specifically defined.

[0093] References herein to "embodiments" mean that a particular feature, structure, or characteristic described in connection with the embodiments may be included in at least one embodiment of the present application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor does it constitute an independent or alternative embodiment that is mutually exclusive of other embodiments. It is understood, both explicitly and implicitly, by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0094] The control and protection system of the flexible DC energy storage valve is the "brain" of the energy storage valve product. It plays a key role in the power conversion between the flexible DC system and the battery control system. The control and protection system cooperates with multiple systems such as the flexible DC control system, valve cooling system, fire protection system, battery control system, sub-module control system, etc., and realizes the startup, charge and discharge control, protection and other functions of the energy storage valve.

[0095] However, the current energy storage valve control and protection system lacks a static test system and method like the relay protection product. The static test of the control and protection system is often verified by means of a relay protection tester to verify some interface functions. For example, it is difficult to test different forms of optical fiber communication such as Gigabit Ethernet, FT3, Aurora, etc. At the same time, the energy storage valve control and protection system lacks an effective test system, resulting in a shutdown state. When some control and protection functions are exited, it is difficult to test or verify the above-mentioned relay protection tester when there are some project test requirements such as electromagnetic compatibility (EMC) test, climate environment test, and mechanical performance test. In some embodiments, the system for testing or verification using a relay protection tester requires the use of a large number of physical objects. The entire test platform is heavy and occupies a large area, making it difficult to carry and build. It is not suitable for EMC, climate environment, mechanical performance and other tests, and the above-mentioned test system cannot realize automated testing. In response to the above problems, the embodiments of the present application provide a test method and test system for energy storage valve control. The following embodiments will specifically illustrate the test method and test system described in the embodiments of the present application.

[0096] The energy storage control and protection test method provided in the embodiment of the present application can be applied to the test system 1 shown in Figure 1. The test system includes a host computer 102, a test device 104 and an energy storage valve control and protection system 106. The test device 104 is connected to the host computer 102 and the energy storage valve control and protection system 106 respectively; wherein, the host computer 102 can communicate with the test device 104 in a wired or wireless manner. The test device 104 can communicate with the energy storage valve control and protection system 106 in a wired or wireless manner. The host computer 102 can be, but is not limited to, various personal computers, laptops, smart phones, tablet computers, Internet of Things devices and portable wearable devices. The Internet of Things devices can be smart speakers, smart TVs, smart air conditioners, smart car-mounted devices, etc. Portable wearable devices can be smart watches, smart bracelets, head-mounted devices, etc. In some embodiments, the host computer 102 can also be implemented using an independent server or a server cluster consisting of multiple servers. Test device 104 can be used to simulate any device or apparatus in energy storage valve control and protection system 106 , including, but not limited to, various personal computers, laptops, smartphones, tablet computers, servers, etc. Energy storage valve control and protection system 106 includes at least a submodule controller 1061 , a main control chassis 1062 , and expansion devices 1063 .

[0097] Those skilled in the art will understand that the test system shown in Figure 1 is merely a block diagram of a partial structure related to the scheme of the present application, and does not constitute a limitation on the test system to which the scheme of the present application is applied. The specific test system may include more or fewer components than shown in the figure, or combine certain components, or have a different component arrangement.

[0098] In one embodiment, as shown in FIG2 , a method for testing energy storage control and protection is provided. The method is described by applying it to the test equipment in FIG1 as an example, and includes the following steps:

[0099] S201, receiving test instruction information.

[0100] The test instruction information may include test cases, test scripts, state sequences, test parameters, operating parameters, instruction information, etc. The instruction information is used to indicate the test type. For example, the instruction information may be used to indicate that the test type is an interface test, that is, to instruct the communication or interaction functions of the interface in the energy storage control system to be tested. The instruction information may also be used to indicate that the test type is a functional test, that is, to instruct the functional logic in the energy storage control system to be tested, such as determining and testing the logic that implements each function.

[0101] In some embodiments, the test device can receive test instruction information sent by the host computer. The host computer is installed with host computer test software, which can interact with the test device through the TCP / IP protocol. The host computer is used for tasks such as monitoring the test equipment, developing and executing test scripts, and generating test reports. The host computer can set up a human-computer interaction interface, an automatic test debugging interface, and a point matching table configuration interface. Users can select test objects, edit test tasks, or modify test parameters based on the human-computer interaction interface; users can also issue test instruction information based on the automatic test debugging interface for testing; users can also build preset point matching tables based on the point matching table configuration interface. Test instructions

[0102] The test equipment is used to simulate various external devices or systems (i.e., associated devices) that communicate with any device in the energy storage control system. For example, the test equipment can simulate various external systems or devices that communicate with the main control device, including the merging unit, the energy storage valve control and protection system (VSC), the fire protection system, the valve cooling system, etc.; or, the test equipment can also simulate various external systems or devices that communicate with the expansion chassis, including the submodule system, etc.; or, the test equipment can also simulate various external systems or devices that communicate with the submodule controller, including the energy storage valve control system, the battery control system, the isolation switch, the bypass switch, the insulated-gate bipolar transistor (IGBT), etc. The test equipment is installed with test software that has configuration processing functions, including support for configuration file parsing and distribution, including point configuration tables for communication between the test equipment and the host computer, and configuration information for the test equipment's underlying hardware boards and interfaces. In some embodiments, the test device includes a test task execution engine that parses the state sequence contained in the test instructions issued by the host computer and executes each parsed test task, and the jump conditions between each test task are determined by the test device. In some embodiments, the test device is provided with programs for communicating with the test software of the host computer, including programs for single and multiple data reading and writing, test task issuance, file transfer, abnormal message, abnormal signal generation, etc. In some embodiments, the test software on the test device also has an event recording function, which performs real-time detection of signals marked as events in the point allocation table and records signals that have changed position.

[0103] In an embodiment of the present application, when it is necessary to test any device in the energy storage control system, the host computer or other device can send test instruction information to the test device by sending a test script, or a test case, or a state sequence, or an indication information, and the test device can receive the test instruction information; in some embodiments, the above-mentioned test script, or a test case, or a state sequence, or an indication information can be pre-saved in the host computer or other device, and when the host computer or other device triggers a test, the host computer or other device directly calls the above-mentioned test script, or a test case, or a state sequence, or an indication information to generate a test instruction for sending; in some embodiments, the user can edit the above-mentioned test script, or a test case, or a state sequence, or an indication information online to generate a test instruction for sending.

[0104] S202 , simulating associated devices connected to the device under test in the energy storage control system according to the test instruction information, and determining simulated associated parameters, where the simulated associated parameters include simulated interface parameters or simulated function parameters.

[0105] The energy storage control system includes a submodule controller, a main control chassis, an expansion device, a battery controller, an isolation switch circuit, a bypass switch circuit, an energy storage valve control protection system, etc. The test results include the test results of any device in the energy storage control system. The test of the energy storage control system includes fault testing of components or interfaces, status testing, or logical function testing of hardware (or software). The simulation interface parameters are the implementation parameters of the hardware interface or software interface corresponding to each interface in the energy storage control system implemented by software or hardware on the test device; the simulation function parameters are the implementation parameters of the logic circuit module, or software module, or program module corresponding to each functional module or each functional item in the energy storage control system implemented by software or hardware on the test device. That is, the corresponding test module on the local machine can be configured through the simulation interface parameters to obtain a simulation interface with a similar interface implementation, and the corresponding test module on the local machine can be configured through the simulation function parameters to obtain a simulation function module with a similar interface implementation.

[0106] The device under test can be any device in the energy storage control system, or any number of devices. Correspondingly, the associated devices of the device under test can be various external devices or systems that communicate with the device under test. For example, if the device under test is a master control device, the associated devices can be a merging unit, VSC control and protection system, fire protection system, valve cooling system, etc.; or if the device under test is an expansion chassis, the associated devices can be a submodule system, etc.; or if the device under test is a submodule controller, the associated devices can be an energy storage valve control system, battery control system, isolating switch, bypass switch, IGBT, etc.

[0107] In an embodiment of the present application, after receiving the test indication information, the test device can further interpret the test indication information, and interpret the indication information, test tasks, test parameters, test cases, test scripts, state sequences, operating parameters, etc. from the test indication information, and determine the test type according to the indication of the indication information, and determine the device to be tested in the energy storage control system according to the indication of the indication information. Specifically, the test device can extract the device identifier from the indication information to identify the device to be tested; and then, accordingly, determine its associated devices based on the determined device to be tested. In some embodiments, after the test device determines the device to be tested, it can send a data request to the device to be tested to request the configuration information or configuration file of the device to be tested. The device to be tested will feed back its own configuration information or configuration file to the test device. The test device can then find the associated device to which the device to be tested is connected, as well as the configuration information of the associated device, from the configuration information or configuration file based on the type of the device to be tested or the device identification. The test device can then determine the simulation association parameters based on the configuration information of the associated device. In some embodiments, after the test device determines the device to be tested, the test device can also obtain a preset point configuration table sent by a host computer or other device, and find the associated device connected to the device to be tested, as well as the configuration information of the associated device, from the preset point configuration table based on the device identification of the device to be tested. The test device can then determine the simulation association parameters based on the configuration information of the associated device. In some embodiments, the test indication information also includes the user's configuration information on the associated device, that is, the user end can determine the configuration information of the associated device associated with the device to be tested in advance based on the test requirements and the configuration information of the device to be tested, and carry the configuration information of the associated device in the test indication information and send it to the test device. After the test device receives the test indication information, it can directly simulate the associated device connected to the device to be tested based on the configuration information of the associated device contained in the test indication information, and determine the simulated association parameters.

[0108] S203: Test the device to be tested according to the simulation-related parameters and the test instruction information, and receive the test result of the device to be tested.

[0109] In an embodiment of the present application, test software is installed on the test device, and the test software is capable of simulating the functions of any device in the energy storage control system. For example, logic control software can be installed on the test device, and the logic control software can be used to implement any function of any device in the energy storage control system through program code, thereby completing the functional test by executing the program code to achieve communication or data exchange between the simulated device and the device under test. For another example, interface configuration software can be installed on the test device, and the interface configuration software can be used to implement any interface of any device in the energy storage control system through program code, thereby completing the interface test by executing the program code to achieve communication or data exchange between the simulated device and the device under test. During a specific test, the test device parses the test indication information, and parses the test task, or test case, or test script, or state sequence, or test parameter, or operating parameter, or indication information from the test indication information, and then determines the device to be tested and the associated device according to the indication of the indication information, and determines some configuration parameters and implementation parameters for simulating the associated device. That is, after determining the simulation associated parameters, the device simulated according to the simulation associated parameters can communicate with the device to be tested, thereby realizing test data interaction to complete the test. During this test process, if an interface type test is implemented, the test is implemented by transferring the test parameters between the interface simulated by the simulation interface parameters and the corresponding interface of the device to be tested; if a function type test is implemented, the test is implemented by transferring the operating parameters between the function module simulated by the simulation function parameters and the device to be tested. It should be noted that if the simulation associated parameters are simulation interface parameters, the various test modules that implement the interface function of the test device support custom configuration of the interface implementation. The host computer software or the test software on the test device can be set to send high-speed serial communication protocols, Ethernet protocols, Aurora protocols and other general and private protocols. If the simulation-related parameters are simulation function parameters, the various test modules implementing the function support custom configuration of the function implementation, and can also be customized to edit or modify the function test logic. After the test device completes the test on the device under test, the device under test will feedback the test results to the test device, which then receives the test results.

[0110] In some embodiments, after receiving the test results, the test device can directly report the test results to the host computer, instructing the host computer to display the test results to the user for analysis, or instructing the host computer to perform statistical analysis on the test results. In some embodiments, after receiving the test results, the test device can also analyze the test results to determine whether to continue with other task tests. If it is determined that other task tests are necessary, the test device can continue to trigger the test, that is, communicate with the energy storage control system according to the instructions of the test instruction information until all tests are completed, thereby realizing a fully automatic multi-task test.

[0111] The energy storage valve control test method described in the embodiment of the present application receives test indication information, and simulates the associated device connected to the device under test in the energy storage control system according to the test indication information to determine the simulated associated parameters; tests the device under test according to the simulated associated parameters and the test indication information, and receives the test results of the device under test. In the above test method, the test device can simulate any device associated with the device under test in the energy storage control system, specifically, it can simulate the interface implementation and function execution logic implementation of any device, and realize the above-mentioned simulated interface implementation or function implementation through the simulation associated parameters, so that the above test method can complete the test by performing data interaction with the device under test through the simulated interface implementation or function logic implementation. Therefore, the test process is not limited to testing a specific type of device under test, and can realize multiple types of tests, such as interface testing of the device under test or function testing of the device under test, which improves the applicability of the test method to a certain extent.

[0112] In one embodiment, a method for performing a test according to a test instruction is provided. That is, when the test device executes the above-mentioned S202 "simulating the associated devices connected to the device under test in the energy storage control system according to the test instruction information to obtain simulated associated parameters", as shown in Figure 3, the specific execution steps are as follows:

[0113] S301, obtaining a preset point allocation table.

[0114] The preset point configuration table includes the actual interaction data of the hardware interface, the internal parameters of each test module, the configuration information of each test module, the interface parameters of each test module, the test parameters of each test task, the test logic of each functional module, the configuration information of each functional module, etc. Specifically, the preset point configuration table may include the monitoring data, control data, configuration parameters, version information, interaction data, test parameters, functional configuration parameters, test logic, test code, etc. of the test equipment, wherein the functional configuration parameters include the relevant functional parameters of optical fiber communication, the relevant functional parameters of input function, the relevant functional parameters of network communication, and the relevant functional parameters of output function. The test logic includes the test logic of the relevant functions of control communication, the test logic of the relevant functions of input function, the test logic of the relevant functions of network communication, and the test logic of the relevant functions of output function. The preset point configuration table can be configured by the host computer. In some embodiments, the preset point configuration table can be a tree structure (see the schematic diagram in Figure 4), with the root node being the IED, which can simultaneously connect to multiple test modules, such as Device1, Device2, etc. A test module can include two types of groups. One group is the actual interaction data group of the hardware interface, which can be divided into multiple groups based on the number of hardware interfaces, such as group1 and group2 interfaces. This group generally includes configuration information such as the board number, channel number, and communication rate. The other group is fixed as cfg, and its child nodes are all internal parameters of the test module, related to the test task and the test logic of the functional module. Each group contains business interaction data, such as Data1 and Data2. The transmitted data is the corresponding reference in the preset point configuration table. These references are used to identify the path information of the tree information. For example, Device1.group1.Data1 represents Data 1 of Group 1 of Test Module 1.

[0115] In some embodiments, the test device can receive a preset point configuration table sent by a host computer or other device; the preset point configuration table includes interface configuration information of at least one type of related interface, and functional configuration information of at least one type of functional module; each interface configuration information includes the operating parameters of the corresponding interface, and each functional configuration information includes the test logic of the corresponding functional module.

[0116] In an embodiment of the present application, a host computer or other device can configure the point table to obtain a preset point matching table. After the point matching table is configured, it can be directly transmitted to the test device through the configuration software on the host computer or other device to ensure the consistency of the configuration file. The test device can store it after receiving the preset point matching table. When the test device receives a test instruction, it can extract the preset point matching table from the storage space to find the configuration information of the associated device of the device under test, so that the test device can then determine the simulation association parameters based on the configuration information of the associated device, and configure the test module on it according to the simulation association parameters, so that the test module can achieve the same function as the associated device, thereby facilitating the communication test with the device under test based on the test module in the later stage. For example, the test device can parse the configuration information of the associated device, configure the various grouping information under the corresponding test module in the point matching table to the hardware of each board of the test device, and realize the binding of business information data with registers. If it is found during the configuration process that the information in the preset point matching table does not correspond to the actual hardware, the configuration of the test module according to the configuration information in the preset point matching table is stopped, and the host computer fault code is sent to the host computer so that the tester can find the cause of the problem according to the fault code. The embodiment of the present application obtains the configuration information of the associated devices through the point configuration table, which can realize rapid configuration and thus improve test efficiency.

[0117] S302: Simulate associated equipment according to the preset point allocation table and the test type indicated by the test instruction information, and determine simulation associated parameters.

[0118] In an embodiment of the present application, after the test device receives the test indication information, it can further interpret the test indication information, interpret the indication information, test tasks, test parameters, test cases, test scripts, state sequences, operating parameters, etc. from the test indication information, and determine the test type according to the indication of the indication information, and determine the device to be tested in the energy storage control system according to the indication of the indication information. Specifically, the test device can extract the device identifier from the indication information to identify the device to be tested; and then correspondingly, find its associated device according to the determined device to be tested; in some embodiments, the test device can also search for the associated device that is communicatively connected to the device to be tested from the preset point configuration table according to the device identifier of the device to be tested. In some embodiments, after the test device determines the associated device, it can further extract configuration information related to the associated device from the preset point configuration table, and determine the simulation association parameters based on the configuration information, and configure the test module on the local machine based on the simulation association parameters, so that the test module can simulate various interface implementations or function implementations of the associated device of the device to be tested.

[0119] The method described in the embodiments of the present application configures the associated devices through a preset point matching table, so that the associated devices of any type of device to be tested can be simulated on the local machine, and the test module implemented by switching any type of simulated associated parameters can exchange information with the device to be tested to implement various types of tests. The test process does not need to be based on the device to be tested and the actual associated devices, which simplifies the physical machine required for the test to a certain extent, especially for multiple types of tests, and the test equipment itself occupies a small space, that is, it does not require the layout of a large-area physical machine and is not subject to any environmental restrictions, which improves the applicability of the method to a certain extent.

[0120] In one embodiment, when the above-mentioned simulation association parameters are simulation interface parameters, an implementation method for determining the simulation association parameters as simulation interface parameters is provided, as shown in FIG5 , the method includes:

[0121] S401: If the test type indicated by the test indication information is an interface test, extract interface configuration information from a preset point configuration table.

[0122] S402: Configure various types of related interfaces in the associated device according to the interface configuration information to determine analog interface parameters.

[0123] The preset point configuration table includes interface configuration information and interface configuration parameters of various types of interfaces on any device in the energy storage control system.

[0124] The embodiments of the present application involve the case where the simulation association parameters are simulation interface parameters. Based on this, when the test device receives the test indication information, it can extract the indication information therefrom and determine the test type according to the indication information. If the test type is an interface test, it means that the relevant interfaces of the device to be tested need to be tested. At this time, the test device obtains the preset point matching table and searches for the associated device connected to the device to be tested therefrom. After determining the associated device, it can further determine the various types of related interfaces connected to the device to be tested on the associated device, and then extract the interface configuration information and interface configuration parameters of the various types of related interfaces connected to the device to be tested from the preset point matching table, and determine the simulation interface parameters according to the interface configuration information and interface configuration parameters of each type of interface, and configure the corresponding implementation interface on the local machine based on the simulation interface parameters (that is, configure the corresponding test module to implement any type of interface).

[0125] The method described in the embodiments of the present application configures various types of related interfaces in the associated devices through a preset point matching table, so that any type of interface can be simulated on the local machine, and various types of interface tests can be realized by switching the test interface realized by the parameters of any type of simulated interface and performing information exchange with the corresponding interface in the device to be tested. The test process does not need to be based on the actual interface of the device to be tested and the actual interface of the associated device, which improves the applicability of the method to a certain extent.

[0126] In one embodiment, when the simulation-related parameters are simulation function parameters, a method for implementing the simulation-related parameters is provided, as shown in FIG6 , and the method includes:

[0127] S501: If the test type indicated by the test instruction information is a functional test, the test logic of each functional module in the associated device is extracted from the preset point configuration table.

[0128] S502 , performing logic circuit configuration according to the test logic of each functional module in the associated device, and generating simulation function parameters.

[0129] The preset point configuration table includes the functional configuration information, functional configuration parameters (i.e., operating parameters), and test logic of each functional module for any device in the energy storage control system to implement each function.

[0130] The embodiments of the present application involve the case where the simulation association parameters are simulation function parameters. Based on this, when the test device receives the test indication information, it can extract the indication information therefrom and determine the test type according to the indication information. If the test type is a functional test, it means that the various functions of the device to be tested or the implementation logic of each function need to be tested. At this time, the test device obtains the preset point matching table and searches for the associated device connected to the device to be tested therefrom. After determining the associated device, the functional modules or functional logic of various functions implemented by the associated device in connection with the device to be tested can be further determined. Then, the test logic, functional configuration information, and functional configuration parameters of various functional modules implemented by the device to be tested in the preset point matching table are extracted. The simulation function parameters are determined according to the test logic, functional configuration information, and functional configuration parameters of various functional modules, and the corresponding functional modules are configured on the local machine based on the simulation function parameters (that is, the corresponding test module is configured to implement any type of functional module).

[0131] The method described in the embodiments of the present application configures each functional module in the associated device through a preset point configuration table, so as to realize the test logic of simulating each function on the local machine, that is, configuring the test module on the local machine to simulate the corresponding function of the associated device, and performing information interaction with the device under test through the functional module realized by simulating the functional parameters to realize the corresponding functional test. This test method can realize a test for the correctness of the execution logic of each function implemented on the device under test, that is, realize the test of the software process.

[0132] In one embodiment, a plurality of test modules are provided on the test device, and the test modules can be configured according to the simulated association parameters determined by the configuration information of the associated device, so that the configured test modules can realize functions similar to those of the associated device. Thereafter, the configured test modules can be used to test the device to be tested according to the test indication information to obtain the test results.

[0133] Among them, different test modules can realize different functions through configuration. For example, the test module can realize the function of the battery management controller, the test module can also realize the function of the sub-module controller, and the test module can also realize the functions of various interfaces in the valve control protection system.

[0134] In an embodiment of the present application, when the test device determines the associated device of the device under test, it can further obtain the configuration information of the associated device from the point matching table or the configuration table, and generate simulation associated parameters according to the configuration information of the associated device, and configure the test module on the test device according to the simulation associated parameters. In some embodiments, when the associated device is one device, a certain test module on the test device can be configured accordingly; in some embodiments, when the associated device is multiple devices, a corresponding number of test modules on the test device can be configured accordingly, so that the configured test module or multiple test modules can simulate the associated device of the device under test to perform a communication test with the device under test. During the specific test, the configured test module can communicate with the device under test in the energy storage valve control protection system according to the instructions of the test task or according to the test parameters, thereby realizing the test data interaction to complete the test. Among them, the various communication interfaces of the test module on the device under test support custom configuration, and the corresponding software can be used to set the sending of general and private protocols such as high-speed serial communication protocol, Ethernet protocol, and Aurora protocol.

[0135] In the test method described in the embodiment of the present application, the test equipment simulates the associated devices of different devices under test by configuring different test modules, thereby realizing communication testing with various devices under test. That is, it realizes the testing of any device and any test item in the energy storage control system, thereby improving the comprehensiveness of the test to a certain extent.

[0136] In one embodiment, an implementation of the above S203 is provided, that is, the above S203 "testing the device under test according to the simulation-related parameters and the test instruction information, and receiving the test results of the device under test" is shown in Figure 7, including:

[0137] S601: parse the test instruction information to obtain a first test task.

[0138] The first test task may be a fault test task, an interface function test task, or a status detection task. The first test task includes test cases, test parameters, operating parameters, test logic, and the like.

[0139] In an embodiment of the present application, after receiving the test instruction information, the test device can further parse the test instruction information and parse the first test task from the test instruction information. The first test task can be a test task corresponding to the test item, or it can be multiple test subtasks corresponding to the test item. When there are multiple test subtasks, they can be test subtasks that are executed continuously or test subtasks that are executed discontinuously. For example, the multiple test subtasks can be continuous tasks for fault testing, continuous tasks for interface function testing, or continuous tasks for status detection.

[0140] S602 , simulating associated parameters according to the configuration of the test module of the local machine, and driving the configured test module to execute a first test task to test the device under test, and receiving a test result obtained after the device under test is tested based on the first test task.

[0141] In an embodiment of the present application, when the test device determines the simulation association parameters, since the simulation association parameters include implementation parameters of various types of interfaces corresponding to the device to be tested on the associated device and implementation parameters of various types of functions corresponding to the device to be tested on the associated device, the test device can configure any test module of the local device according to the simulation association parameters, so that the configured test module can implement various types of interfaces or various types of functions.

[0142] In an embodiment of the present application, after the test device parses the first test task, it can establish a communication connection with the device under test according to the instructions of the first test task, and implement the test of the device under test by transferring test parameters between the configured test module and the device under test, and obtain the test result corresponding to the first test task. When the first test task includes multiple test subtasks, during the specific test, the test device can test the device under test according to the multiple test subtasks in sequence, that is, multiple times transfer the test parameters in different test subtasks between the configured test module and the device under test to implement the test of the device under test, and obtain the test result corresponding to each test subtask; in some embodiments, the test device can also test the device under test according to each test subtask at the same time, and obtain the test result corresponding to each test subtask.

[0143] The test method provided in the embodiment of the present application only requires issuing test instruction information to the test equipment, and the test equipment can automatically parse the test task based on the test instruction information and automatically simulate any associated equipment to complete the test, thereby realizing a fully automatic testing method for the energy storage control system.

[0144] In one embodiment, when the simulation-related parameters include simulation function parameters and the corresponding test modules include function modules, that is, when the test device executes the above-mentioned S602 "driving the configured test module to execute the first test task to test the device under test, and receiving the test results obtained after the device under test is tested based on the first test task", as shown in Figure 8, the specific execution steps are:

[0145] S701, driving the configured functional module to generate abnormal information according to the test parameters in the first test task; the simulated functional parameters include any one of input functional parameters, network communication functional parameters, optical fiber communication functional parameters, and output functional parameters.

[0146] The abnormal information may include an abnormal message. The type of abnormal information is determined by the type of the analog function parameter. For example, if the analog function parameter is an input function parameter, the abnormal information may be determined to be abnormal input information; if the analog function parameter is an output function parameter, the abnormal information may be determined to be abnormal output information; if the analog function parameter is a network communication function parameter, the abnormal information may be determined to be abnormal network information; and if the analog function parameter is a fiber optic communication function parameter, the abnormal information may be determined to be abnormal fiber optic information.

[0147] In an embodiment of the present application, when the test device determines that the simulation-related parameters are simulation function parameters, and extracts the first test task from the test indication information, it can further extract test cases, test parameters, operating parameters, test logic, etc. from the first test task, and directly execute the first test task based on these extracted parameters, or test cases, or test logic, and generate exception information corresponding to the simulation function parameters in combination with the type of the simulation function parameters.

[0148] S702: Send the abnormal information to the device under test for testing, and receive the test result obtained after the device under test performs the test based on the first test task.

[0149] In an embodiment of the present application, when the test device generates abnormal information, the configured functional module can be started to send the abnormal information to the device under test. The device under test verifies or verifies the content of the abnormal information, or verifies or verifies the operation logic of the abnormal information, and obtains the test result based on the verification result or verification result, and feeds back the test result to the test device.

[0150] In some embodiments, when the abnormal information includes an abnormal message, a short-term fault insertion test function can be implemented. Specifically, when the test device specifically performs the above-mentioned step S701, the test device specifically performs the following steps: sending the abnormal message to the device under test for testing according to a preset sending period, and receiving the test results obtained by the device under test after the test is performed based on the first test task. The preset sending period can be pre-set and can be one communication cycle or two communication cycles.

[0151] In an embodiment of the present application, when the test module executes the first test task and generates an abnormal message, for example, an abnormal message containing an incorrect message start character can be generated. In some embodiments, the test module can drive a programmable logic controller (Field Programmable Gate Array, FPGA) to generate the abnormal message. Before the specific test, some simple test programs can be developed in advance in the FPGA, and logical control can be performed through the internal parameters of the test device. The host computer can control the execution of the test program by modifying the internal parameters of the test device.

[0152] In an embodiment of the present application, when the test device generates an abnormal message, the abnormal message can be sent according to a preset sending cycle, and a recovery timing can be set. For example, the abnormal message is sent for one communication cycle and then restored. When the device under test receives the abnormal message, it can check whether the sending logic of its own message is consistent with the preset sending cycle and recovery timing of the abnormal message set by the test module. If it is consistent, the test passes. If it is inconsistent, the test fails. After obtaining the test result, the test result can be returned to the test device. It should be noted that after the FPGA can be driven to generate an abnormal message, the abnormal message can be sent to the device under test according to the preset sending cycle and recovery timing. Since the FPGA can reach a sending speed of microseconds, the generation and sending of abnormal messages by the FPGA can achieve a microsecond fault test. It should be noted that the device under test in this embodiment can be a submodule controller.

[0153] The method described in the embodiment of the present application realizes a short-term fault insertion test function, and by simulating the generation of abnormal message tests, the test can be refined to the abnormal simulation of cyclic redundancy check (CRC) and frame loss of the high-level communication interface, and can also simulate various faults with a duration of microseconds.

[0154] In one embodiment, when the simulation-related parameters include simulation interface parameters, that is, when the test device executes the above-mentioned S602 "driving the configured test module to execute the first test task to test the device under test, and receiving the test results obtained after the device under test is tested based on the first test task", as shown in Figure 9, the specific execution steps are:

[0155] S801: Generate an abnormal signal according to the test parameters in the first test task and the types of the simulation interface parameters.

[0156] The type of the abnormal signal is determined according to the type of the analog interface parameter. For example, if the analog interface parameter is an optical fiber interface parameter, the abnormal signal can be determined to be an abnormal optical fiber signal; if the analog interface parameter is a network interface parameter, the abnormal signal can be determined to be an abnormal network signal.

[0157] In an embodiment of the present application, when the test device determines that the simulation-related parameter is an analog interface parameter and extracts the first test task from the test indication information, it can further extract test cases, test parameters, operating parameters, test logic, etc. from the first test task, and directly execute the first test task based on these extracted parameters, or test cases, or test logic, and generate an abnormal signal corresponding to the analog interface parameter in combination with the test parameters in the first test task and the type of the analog interface parameter. For example, if an optical drive signal is determined based on the type of the analog interface parameter, the implementation method of the optical drive signal can be set according to the test parameters in the first test task. For example, if the test parameter is a signal strength value, the signal strength of the optical drive signal is set according to the signal strength value indicated by the test parameter.

[0158] In some embodiments, when the test equipment generates an abnormal signal, for example, a feedback signal from the IGBT1 driver board with a dark period exceeding 800µs, corresponding to the IGBT1 test interface, the test equipment can simulate an IGBT1 driver board feedback signal exceeding 800µs. It should be noted that this abnormal signal can be determined based on test parameters in a preset point configuration table or can be edited by the tester and sent down from a lower computer.

[0159] S802 , driving the configured test module to send an abnormal signal to the device under test for testing, and receiving a test result obtained after the device under test performs the test based on the first test task.

[0160] In an embodiment of the present application, when the test device generates an abnormal signal, the abnormal signal can be sent to the corresponding interface of the device under test through the configured test module. The device under test detects, checks, or verifies the abnormal signal, or checks or verifies the sending logic of the abnormal signal, and obtains the test result based on the detection result, check result, or verification result, and feeds back the test result to the test device.

[0161] In some embodiments, in the embodiments of the present application, when the test device generates an abnormal signal, the abnormal signal can be sent to the device under test. When the device under test receives the abnormal signal, a fault signal can be generated according to the abnormal signal to obtain a test result; for example, if the abnormal signal is an IGBT1 driver board feedback signal with a light-free length exceeding 800us, the corresponding fault signal is a valve-controlled protection system VBC IGBT1 drive voltage secondary fault signal. The test result is returned to the test device. When the test device receives the test result, the test result can be reported to the host computer to display the fault status of the device under test to the tester, so that the tester can check that the fault information is reported normally and the test is passed. It should be noted that the device under test in this embodiment can be a sub-module controller.

[0162] Another implementation of the above test method can be briefly described as follows: fault status test indication information is sent through the host computer; when the test equipment receives the fault status test indication information, it immediately simulates that the light-free length of the IGBT1 driver board feedback signal exceeds 800us, and sends the abnormal signal to the device under test; after receiving the abnormal signal, the device under test performs a test and reports the VBC IGBT1 driver voltage secondary side fault signal through the VBC interface; the test equipment receives the fault signal sent by the device under test and reports the fault signal to the host computer; the host computer displays the fault status of the device under test, and the tester checks that the fault information is correctly reported, and the test passes.

[0163] The method described in the embodiment of the present application realizes another fault insertion test function, and by simulating and generating abnormal signal tests, the test can be refined to highly abnormal simulations such as cyclic redundancy check and frame loss of communication interfaces.

[0164] In one embodiment, a test method is provided in which a test device executes multiple test subtasks. That is, a first test task includes multiple test subtasks. When the test device executes the above-mentioned S602 "driving the configured test module to execute the first test task to test the device under test, and receiving the test results obtained by the device under test based on the first test task", as shown in Figure 10, the specific execution steps are as follows:

[0165] S901: Determine a first test parameter according to a first test subtask in a first test task.

[0166] The multiple test subtasks in the first test task may be multiple test subtasks determined in the order of execution time.

[0167] In an embodiment of the present application, after the test device receives the test indication information, it can further parse the test indication information and parse out multiple test subtasks from the test indication information. These multiple test subtasks can be multiple test subtasks corresponding to one test item, and can specifically be tasks that are executed continuously or tasks that are executed discontinuously. For example, the multiple test subtasks can be continuous tasks for fault testing, continuous tasks for interface function testing, continuous tasks for status detection, or continuous tasks for function testing. When the test device parses out multiple test subtasks, it can first execute the first test subtask and extract the first test parameter from the first test subtask so that the test subtask can be tested according to the first test parameter later.

[0168] S902: Drive the configured test module to generate first operating parameters according to the first test parameters.

[0169] The first operating parameter may be a signal or information set according to the first test parameter; the first operating parameter may be a signal or information transmitted between the configured test module and the device under test.

[0170] In the embodiment of the present application, after the test device extracts the first test parameter, it can drive or start the configured test module to generate the first operating parameter based on the first test parameter. For example, if the simulation-related parameter is an analog interface parameter, and the first test parameter is a performance parameter of the signal sent by the configured test module, such as signal strength, signal period, etc., then the first operating parameter corresponding to the configured test module can be generated based on the first test parameter.

[0171] S903: Send a first operating parameter to the device under test for testing, and receive a first test result obtained after the device under test is tested based on the first operating parameter.

[0172] In an embodiment of the present application, after the test device generates a first operating parameter, the configured test module can be started to send the first operating parameter to the device under test. When the device under test receives the first operating parameter, it can check or verify the first operating parameter, or check or verify the operating logic of the first operating parameter, or execute the corresponding interface or functional module according to the first operating parameter, and obtain the test result based on the check result, verification result, or execution result, and feed back the test result to the test device.

[0173] S904, when the first test result indicates that the device under test is in normal working condition, determine the new first test parameters and the new first operating parameters according to the next test subtask, and return to the step of executing the test module after the driver configuration to generate the first operating parameters according to the first test parameters until all test subtasks are executed.

[0174] The embodiment of the present application relates to a cyclic testing process, that is, according to the execution order of each test subtask, the above-mentioned methods S902 and S903 are repeatedly executed, for example, the first test subtask, the second test subtask, the second test subtask... the Nth test subtask, etc. are executed in sequence until all test subtasks are completed. In some embodiments, a loop end condition can also be set to end the cyclic test, such as setting the number of loops, or the test result corresponding to each test subtask indicates that the device under test is in an abnormal state. It should be noted that the device under test can be a submodule controller.

[0175] The method described in the embodiments of the present application implements a continuous state test method or a continuous logic test method, that is, the test is completed by simulating the interaction between the battery controller, the submodule controller and the valve control protection system, which can improve the test efficiency.

[0176] In one embodiment, before executing the first test task, the test device needs to perform the following steps as shown in FIG11 :

[0177] S1001: Establish a communication connection between the configured test module and the device under test.

[0178] In an embodiment of the present application, the test device can configure the test module on the machine with the configuration parameters in the preset point configuration table, so that the test module can simulate the function of the associated device of the device under test, or can realize the function of the associated device of the device under test, and then establish a communication connection with the device under test, so as to test the device under test later. The preset point configuration table includes configuration parameters of various types of associated devices, interaction data and functional configuration parameters of each communication module (see the optical fiber communication parameters, network communication parameters, input function parameters and output function parameters in Figure 4). Therefore, the test device determines the device under test, and further determines the functional configuration parameters of each communication module of the associated device related to the device under test, and determines the simulation association parameters based on these functional configuration parameters, and configures the simulation association device in the device under test based on the simulation association parameters, so that the configured test module establishes a normal communication connection with the device under test.

[0179] In some embodiments, when establishing a communication connection between a configured test module and a device under test, the test device may specifically perform the following steps: extracting communication protocol information from a preset point configuration table; and establishing a communication connection between the configured test module and the device under test based on the communication protocol information. The preset point configuration table may include multiple types of communication protocols. The test device may extract corresponding communication protocol information from the preset point configuration table based on the communication type or communication method between the configured test module and the device under test, and perform communication configuration between the configured test module and the device under test based on the communication protocol information to establish a communication connection between the configured test module and the device under test.

[0180] S1002: Send a second operating parameter to the device under test, and receive a second test result obtained after the device under test performs a test based on the second operating parameter.

[0181] The second test result is used to indicate that the device under test is in a normal working state, or is used to indicate that the device under test is in an abnormal working state.

[0182] In an embodiment of the present application, after the configured test module establishes a communication connection with the device under test, the configured test module or test device can further generate a second operating parameter based on the default test parameter in the preset point configuration table, and send the second operating parameter to the device under test. When the device under test receives the second operating parameter, it can perform a fault clearing operation according to the second operating parameter, that is, clear all faults and alarms of the machine, so that the device under test is in a normal working state. After the device under test performs the fault clearing operation, it detects the current working state of the device under test. If the device under test is in a normal working state, it returns a second test result indicating that the device under test is in a normal working state; if the device under test is in an abnormal working state, it returns a second test result indicating that the device under test is in an abnormal working state. In some embodiments, when the test module receives the second test result, it can also report the second test result to the host computer, and then the host computer displays the second test result so that the personnel of the host computer can view the second test result in real time.

[0183] Another implementation of the above-mentioned test method can be briefly described as follows: the test indication information is sent through the host computer; after the test device receives the test indication information, it communicates with the device under test according to the default parameters in the preset point configuration table and sends the second operating parameters; when the device under test receives the second operating parameters, it performs the fault and alarm clearing operation and returns the second test result; after receiving the second test result, the test device reports it; the host computer displays the second test result sent by the device under test.

[0184] S1003 , when the second test result indicates that the device under test is in a fault cleared state, executing the step of parsing the test instruction information to obtain the first test task.

[0185] In an embodiment of the present application, when the test device receives the second test result returned by the device under test, if the second test result indicates that the device under test is in normal working condition, the test device can continue to execute the first test task, specifically, the test parameters in the preset point matching table can be updated, and the new test parameters can be sent to the device under test to test the device under test, and the first test result returned by the device under test can be received. Among them, the new test parameters can be some parameters required for various fault detections, and can be pre-configured in the preset point matching table, or can be set according to the test requirements of different types of devices under test during fault testing. In some embodiments, when the test device receives the second test result, it can also report the second test result to the host computer, and then the host computer displays the second test result so that the personnel of the host computer can view the second test result corresponding to the second test task in real time.

[0186] The embodiment of the present application implements a fault detection method, that is, fault detection can be completed based on multiple interactive steps, that is, an automatic fault detection method is implemented.

[0187] In some embodiments, based on the test method described in the above embodiment, the process of the above method is exemplified, as shown in Figure 12, and the process includes: S1, establishing a network connection. S2, issuing test instruction information (selecting a use case, starting the test, state sequence, simulation-related parameters, etc.). S3, parsing the test instruction information into a second test task and executing the first test task. S4, executing the second test task and generating second operating parameters. S5, sending the second operating parameters. S6, clearing the submodule controller fault. S7, returning the second test result. S8, reading the interface data (the second test result). S9, reporting the second test result. S10, configuring the test module according to the simulation-related parameters, executing the first test task, and triggering the test program of the configured test module. S11, generating an exception message. S12, sending the exception message according to a preset period. S13, performing a test based on the exception message and obtaining the first test result. S14, returning the first test result. S15, reading the interface data (the first test result). S16, reporting the first test result.

[0188] Another implementation of the above test method can be briefly described as follows: fault test indication information is sent through the fault status interface of the host computer; the test device immediately generates an abnormal message with an incorrect message start character after receiving the test indication information, and simulates the way the valve control system sends the message (sent in a restored manner after 1 communication cycle); the device under test returns the fault test result when it receives the abnormal message; the test device receives the fault test result and reports the test result to the host computer; the host computer displays the fault status of the device under test, and the tester checks that there is no fault report and the test passes.

[0189] In one embodiment, the first test task may include two test subtasks, namely, a first test subtask and a second test subtask. When the test device specifically executes the first test subtask, it may specifically execute the following steps: establishing a communication connection with the device under test according to the first test subtask, sending a first test parameter to the device under test, and receiving a first test result returned by the device under test; the first test result is the result returned after the device under test performs a fault clearing operation based on the first test parameter; when the first test result indicates that the device under test is in a normal working state, the device under test is tested according to the second test subtask to obtain a second test result corresponding to the second test subtask. The embodiment of the present application implements a method for fault detection, namely, fault detection can be completed based on two test tasks, that is, an automatic fault detection method is implemented.

[0190] In some embodiments, when the testing device executes the step of "testing the device to be tested according to the second test subtask to obtain a second test result corresponding to the second test subtask", the specific execution steps are: generating an exception message according to the second test subtask; sending the exception message to the device to be tested for testing according to a preset sending cycle, and obtaining a second test result corresponding to the second test subtask.

[0191] In some embodiments, the test device may further perform the steps of: generating an abnormal signal according to the second test subtask; sending the abnormal signal to the device under test for testing, and obtaining a second test result corresponding to the second test subtask. The method described in the embodiments of the present application implements another fault insertion test function, and by simulating the generation of abnormal signal tests, the test can be refined to simulate abnormalities such as cyclic redundancy check and frame loss of a high-level communication interface.

[0192] In some embodiments, the testing device may further perform the steps of: generating a battery voltage signal according to a second test subtask; sending the battery voltage signal to the device under test through a first interface for testing, and receiving a second test result corresponding to the second test subtask returned by the device under test through a second interface.

[0193] In an embodiment of the present application, when the test module executes the second test subtask and determines that the second test subtask indicates a transparent transmission state test, a battery voltage signal can be generated. For example, the "system voltage" of the battery manager BMC can be generated as 1000V. In some embodiments, the battery voltage signal can be determined by the test module updating the test parameters in the point configuration table, or it can be edited by the tester and determined by the lower computer.

[0194] The first interface and the second interface are interfaces of different modules, for example, the first interface is a BMC interface simulated by the test module, and the second interface is a VBC interface on the device under test. The device under test in this embodiment can be a submodule controller.

[0195] In an embodiment of the present application, when the test device generates a battery voltage signal, the battery voltage signal can be sent to the device under test through a first interface (an interface implemented by analog interface parameters). The device under test can receive the battery voltage signal through an interface of the same type as the first interface (an interface implemented by analog interface parameters). For example, if the first interface is a BMC interface, the device under test receives the battery voltage signal through the BMC interface, and then immediately forwards the battery voltage signal to the second interface (for example, a VBC interface), which is then returned to the test device by the second interface. The test device can receive the battery voltage signal through the second interface (an interface implemented by analog interface parameters) (for example, a VBC interface), and can further determine whether the received battery voltage signal is consistent with the configured battery voltage signal. If consistent, the test passes; if inconsistent, the test fails. In some embodiments, the test device can also report the received battery voltage signal to the host computer to display the battery voltage signal to the tester. The host computer can display the battery voltage signal so that the tester can compare and determine the test results.

[0196] Another implementation of the above test method can be briefly described as follows: modify the test parameters through the fault status interface of the upper computer, for example, modify the "system voltage" of the test parameter BMC to 1000V, and send it to the test equipment; the test equipment sends a signal of "system voltage" of 1000V to the device under test through the BMC interface; the device under test receives it through the BMC interface and immediately forwards it to the VBC interface; the test equipment receives the "system voltage" of 1000V sent by the device under test through the VBC interface and reports it to the upper computer; the upper computer displays the "system voltage" as 1000V on the VBC display interface, and the tester compares the two and finds that they are consistent, which means the test has passed.

[0197] The method described in the embodiment of the present application realizes a test of the transparent transmission function of different interfaces, that is, the test is realized by simulating the interface of the battery controller and the interface of the valve-controlled protection system, and the test is completed by simulating the associated equipment of the sub-module controller (battery controller and valve-controlled protection system), which can improve the test efficiency.

[0198] Based on the above embodiment, a continuous state test method or a continuous logic test method is also provided, that is, the test method requires multiple test subtasks to be implemented, that is, the above second test subtask includes multiple test subtasks, and when the test device executes the above step of "testing the device to be tested according to the second test subtask to obtain the second test result corresponding to the second test subtask", the specific execution steps are: according to the first test subtask in the second test subtask, determine the second test parameter. Send the second test parameter to the device to be tested to obtain a third test result. The third test result is used to indicate that the device to be tested is in a normal working state, or to indicate that the device to be tested is in an abnormal working state. In the case where the third test result indicates that the device to be tested is in a normal working state, determine a new second test parameter according to the next test subtask, and return to execute the step of sending the second test parameter to the device to be tested until all test subtasks are executed.

[0199] In an embodiment of the present application, the test device can update the test parameters in the point configuration table to generate second test parameters. The second test parameters can be parameters required for various state tests or continuous logic tests, and can be pre-configured in the point configuration table or set according to the test requirements of different types of devices under test during various state tests or continuous logic tests.

[0200] In an embodiment of the present application, after the test module determines the second test parameter, the test module can send the second test parameter to the device under test. When the device under test receives the second test parameter, it can perform corresponding status detection or continuous logic detection according to the second test parameter, so that the device under test works according to the preset logic or normal working process. After the device under test completes the status detection or continuous logic detection, it detects the current working state of the device under test. If the device under test is in a normal working state, that is, it complies with the preset logic or normal working process, then a third test result indicating that the device under test is in a normal working state is returned; if the device under test is in an abnormal working state, that is, it does not comply with the preset logic or the normal working process, then a third test result indicating that the device under test is in an abnormal working state is returned. In some embodiments, when the test module receives the third test result, it can also report the third test result to the host computer, and then the host computer displays the third test result so that the personnel of the host computer can view the first test result corresponding to the first test subtask in real time.

[0201] The embodiments of the present application relate to a cyclic testing process, that is, the test steps are repeatedly executed according to the execution order of each test subtask, for example, the first test subtask, the second test subtask, the second test subtask... the Nth test subtask, etc. are executed in sequence until all test subtasks are completed. In some embodiments, a loop end condition can also be set to end the cyclic test, such as setting the number of loops, or the test result corresponding to each test subtask indicates that the device under test is in an abnormal state. It should be noted that the device under test can be a submodule controller.

[0202] The method described in the embodiments of the present application implements a continuous state test method or a continuous logic test method, that is, the test is completed by simulating the interaction between the battery controller, the submodule controller and the valve control protection system, which can improve the test efficiency.

[0203] In one embodiment, another method for state detection or continuous logic detection is provided. Specifically, when the second test subtask includes the third test subtask, the fourth test subtask, and the fifth test subtask, the test device executes the step of "testing the device under test according to the second test subtask to obtain a second test result corresponding to the second test subtask," the following steps are specifically performed:

[0204] K1: Generate battery fault parameters according to the third test subtask;

[0205] The battery fault parameter may represent a battery fault level, for example, the battery fault parameter may be “battery module level 5 fault”.

[0206] In an embodiment of the present application, when the testing device executes the first test subtask and determines that the first test subtask indicates a battery fault status test or a battery operation logic test, a battery fault parameter can be generated. For example, a "battery module level 5 fault" of the BMC can be generated.

[0207] K2: Send battery fault parameters to the device under test to obtain the fourth test result corresponding to the third test subtask;

[0208] In an embodiment of the present application, when the testing device generates battery fault parameters, the battery fault parameters can be sent to the device under test. After receiving the battery fault parameters, the device under test can transparently transmit the battery fault parameters through different interfaces to obtain a fourth test result, and return the fourth test result to the testing module, where the fourth test result includes the transparently transmitted battery fault parameters. In some embodiments, the testing device can also report the fourth test result to a host computer so that testers can view the fourth test result corresponding to the first test subtask.

[0209] K3: If the fourth test result indicates that the device under test is in a normal working state, send a bypass instruction to the device under test according to the fourth test subtask to obtain a fifth test result corresponding to the fourth test subtask;

[0210] In an embodiment of the present application, when the test device receives the fourth test result and determines that the fourth test result indicates that the device under test is in a normal operating state, a bypass instruction can be generated according to the instruction of the second test subtask and sent to the device under test. After receiving the bypass instruction, the device under test can further perform a corresponding bypass detection operation according to the bypass instruction to obtain a fifth test result, and return the fifth test result to the test module. In some embodiments, the test module can also report the fifth test result to a host computer so that the tester can view the fifth test result corresponding to the second test subtask.

[0211] K4: When the fifth test result indicates that the device under test is in a normal working state, a switch closing signal is sent to the device under test according to the fifth test subtask to obtain a sixth test result corresponding to the fifth test subtask.

[0212] In an embodiment of the present application, when the test device receives the fifth test result and determines that the fifth test result indicates that the device under test is in a normal operating state, it can generate a switch-on signal according to the instructions of the third test subtask and send the switch-on signal to the device under test. After receiving the switch-on signal, the device under test can further perform a corresponding switch-on detection operation based on the switch-on signal to obtain a sixth test result, and return the sixth test result to the test module. In some embodiments, the test device can also report the sixth test result to a host computer so that test personnel can view the sixth test result corresponding to the third test subtask.

[0213] The method described in the embodiment of the present application completes the test by issuing multiple test subtasks, which can realize a continuous state test or continuous logic test, thereby realizing functional testing of complex logic when various devices interact in the valve-controlled protection system, and expanding the application scope of the above-mentioned test method.

[0214] Based on the test method described in the above embodiment, the process of the above method is exemplified, as shown in Figure 13, the process includes: L1, establishing a network connection; L2, issuing test indication information (selecting a use case, starting a test, state sequence, simulation-related parameters, etc.); L3, parsing the test indication information into a first test task and a second test task for execution, the second test task including multiple test subtasks; L4, executing the first test task and generating a first test parameter; L5, sending the first test parameter; L6, clearing the fault of the submodule controller; L7, returning the first test result; SL8, reading the interface data (first test result); SL9, reporting the first test result; L10, configuring the test module according to the simulation-related parameters, executing the first test subtask, and triggering the test program of the configured test module; L11, generating a second test parameter; L12, sending the second test parameter; S13, testing according to the second test parameter to obtain the second test result; L14, returning Return the second test result; L15, read the interface data (second test result); L16, report the second test result; L17, determine whether the loop end condition is met; L18, execute the second test subtask, trigger the test program; L19, generate the third test parameter; L20, send the third test parameter; S21, test according to the third test parameter to obtain the third test result; L22, return the third test result; L23, read the interface data (third test result); L24, report the third test result; .... LX, execute the Nth test subtask, trigger the test program; LX+1, send the Nth test parameter; SX+2, test according to the Nth test parameter to obtain the Nth test result; LX+3, return the Nth test result; LX+4, read the interface data (third test result); LX+5, report the Nth test result; LX+6, determine whether the loop end condition is met (if met); LX+7, report all test results.

[0215] Another implementation of the above test method can be briefly described as follows: the test parameters can be modified through the fault status interface of the host computer, that is, the "battery module level 5 fault" of the test parameter BMC is modified and sent to the test equipment; the test equipment sends the "battery module level 5 fault" to the device under test (for example, the submodule controller) through the BMC interface; the device under test receives it through the BMC interface and immediately forwards it to the VBC interface; the test equipment receives the "battery module level 5 fault" signal from the device under test through the VBC interface, and immediately sends a bypass instruction to the device under test; the device under test sends the "battery module level 5 fault" signal to the VBC interface. After receiving the bypass command, the C interface immediately sends a signal to close the bypass switch; the test equipment immediately feeds back the bypass switch closing signal position signal after receiving the bypass command from the device under test; the device under test immediately forwards the bypass switch closing signal to the VBC interface after receiving it; the test equipment receives the bypass switch closing signal through the VBC interface and reports the signal to the host computer; the host computer displays "Battery module level 5 fault" on the VBC display interface, and the bypass switch is closed. The tester checks that the fault display is correct ("Battery module level 5 fault") and the protection action result (bypass switch closed) is correct, then the test passes.

[0216] In one embodiment, the method described in any of the aforementioned embodiments can also report the test results corresponding to each test task or each test subtask to the host computer after the test device obtains the test results.

[0217] According to the method described in the embodiments of the present application, the test equipment can report the test results of each test subtask or test task to the host computer so that the user of the host computer can view the test results in a timely manner, or update or modify the test parameters according to the test results, and then issue new test instruction information for testing. A one-key test function can also be set on the host computer, that is, a one-key test control is set. When the user clicks or triggers the one-key test control on the test interface, the host computer issues test instruction information to the test equipment, and the test equipment performs testing based on the test instruction information. When the test instruction information indicates that multiple test subtasks are to be tested, one-key testing can be implemented to achieve fully automatic testing.

[0218] In one embodiment, a test method for the energy storage control system on the host computer side is also provided. The test method is applied to the host computer in FIG1 , as shown in FIG14 , and the test method includes:

[0219] S1101, sending test instruction information to a test device; the test instruction information is used to instruct the test device to test the energy storage control system and obtain test results.

[0220] S1102, receiving a test device to simulate associated devices connected to the device under test in the energy storage control system according to the test instruction information to obtain simulated associated parameters, and testing the device under test according to the simulated associated parameters and the test instruction information to return a test result; the simulated associated parameters include simulated interface parameters or simulated function parameters.

[0221] The method described in the embodiment of the present application corresponds to the method described in the embodiment of Figure 2 above. The description of each step is introduced in the above content. Please refer to the above description for details and will not be repeated here.

[0222] In one embodiment, the method described in FIG14 , as shown in FIG15 , further includes:

[0223] S1103, display the test results returned by the test equipment.

[0224] The method described in the embodiments of the present application corresponds to the method described in the aforementioned embodiments. The description of each step is introduced in the aforementioned content. Please refer to the aforementioned description for details and will not be repeated here.

[0225] In one embodiment, the method described in FIG. 14 , as shown in FIG. 16 , further includes:

[0226] S1104 : Constructing a preset point allocation table based on the configuration parameters of various types of related interfaces in the energy storage control system and the test logic of each functional module in the energy storage control system.

[0227] S1105 : Send the preset point allocation table to the test equipment to instruct the test equipment to test the energy storage control system according to the preset point allocation table.

[0228] The method described in the embodiments of the present application corresponds to the method described in the aforementioned embodiments. The description of each step is introduced in the aforementioned content. Please refer to the aforementioned description for details and will not be repeated here.

[0229] In one embodiment, a test system for energy storage valve control is also provided, which includes a host computer, a test device, and an energy storage control system; the energy storage control system includes at least a submodule controller, a main control chassis, and an expansion device; the test device is used to receive the test instruction information sent by the host computer, and simulate the associated device connected to the device under test in the energy storage control system according to the test instruction information, determine the simulated associated parameters, and test the device under test according to the simulated associated parameters and the test instruction information, and receive the test results of the device under test; the simulated associated parameters include simulated interface parameters or simulated function parameters. The composition of this test system is consistent with the composition of the test system shown in Figure 1. The detailed structure can be found in the test system shown in Figure 1, and the test device can execute the test method described in any of the above-mentioned Figures 2 to 16, which will not be repeated here.

[0230] It should be understood that, although the various steps in the flowcharts involved in the various embodiments described above are displayed in sequence according to the instructions of the arrows, these steps are not necessarily executed in sequence in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and these steps can be executed in other orders. Moreover, at least a portion of the steps in the flowcharts involved in the various embodiments described above can include multiple steps or multiple stages, and these steps or stages are not necessarily executed and completed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a portion of steps or stages in other steps.

[0231] Based on the same inventive concept, embodiments of the present application also provide a device for testing energy storage and protection for implementing the aforementioned method for testing energy storage and protection. The solution provided by this device is similar to the solution described in the aforementioned method. Therefore, the specific limitations in one or more embodiments of the device for testing energy storage and protection provided below can be found in the aforementioned method for testing energy storage and protection, and will not be further elaborated here.

[0232] In one embodiment, as shown in FIG17 , a test device for an energy storage control system is provided, comprising:

[0233] Receiving module 10, used for testing instructions;

[0234] A simulation module 11 is configured to simulate associated devices in the energy storage valve control protection system according to the test instruction and determine simulation associated parameters, wherein the simulation associated parameters include simulation interface parameters or simulation function parameters;

[0235] The testing module 12 is configured to test the device under test according to the simulation-related parameters and the test instruction information, and receive a test result of the device under test.

[0236] Each module in the aforementioned energy storage control and protection testing device can be implemented in whole or in part through software, hardware, or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in hardware form, or stored in a computer device memory in software form, allowing the processor to call and execute the corresponding operations of each module.

[0237] In one embodiment, a computer device is provided. The computer device may be a server, and its internal structure diagram may be as shown in FIG18 . The computer device includes a processor, a memory, a communication interface, a display screen, and an input device connected via a system bus. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner. The wireless manner may be achieved through WIFI, a mobile cellular network, NFC (near field communication), or other technologies. When the computer program is executed by the processor, a test method for energy storage control and protection is implemented. The display screen of the computer device may be a liquid crystal display or an electronic ink display screen. The input device of the computer device may be a touch layer covering the display screen, or a key, trackball, or touchpad provided on the computer device housing, or an external keyboard, touchpad, or mouse.

[0238] Those skilled in the art will understand that the structure shown in Figure 18 is merely a block diagram of a portion of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different component arrangement.

[0239] In one embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the following steps are implemented:

[0240] receiving test instruction information;

[0241] Simulate the associated devices connected to the device under test in the energy storage control system according to the test instruction information to obtain simulated associated parameters; the simulated associated parameters include simulated interface parameters or simulated function parameters;

[0242] The device under test is tested according to the simulation-related parameters and the test instruction information, and a test result of the device under test is received.

[0243] The computer device provided in the above embodiment has an implementation principle and technical effects similar to those of the above method embodiment, and will not be described in detail here.

[0244] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the following steps are implemented:

[0245] receiving test instruction information;

[0246] Simulate the associated devices connected to the device under test in the energy storage control system according to the test instruction information to obtain simulated associated parameters; the simulated associated parameters include simulated interface parameters or simulated function parameters;

[0247] The device under test is tested according to the simulation-related parameters and the test instruction information, and a test result of the device under test is received.

[0248] The above embodiment provides a computer-readable storage medium, whose implementation principle and technical effects are similar to those of the above method embodiment, and will not be repeated here.

[0249] Those skilled in the art will appreciate that all or part of the processes in the above-mentioned embodiment methods can be implemented by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, database or other media used in the embodiments provided in this application may include at least one of non-volatile and volatile memory. Non-volatile memory may include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory may include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in the various embodiments provided herein may include at least one of a relational database and a non-relational database. Non-relational databases may include, but are not limited to, distributed databases based on blockchains. The processor involved in the various embodiments provided herein may be, but are not limited to, a general-purpose processor, a central processing unit, a graphics processing unit, a digital signal processor, a programmable logic unit, a data processing logic unit based on quantum computing, and the like.

[0250] The technical features of the above embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0251] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present application. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, and these modifications and improvements fall within the scope of protection of the present application. Therefore, the scope of protection of the present application shall be determined by the appended claims.

Claims

1. A method for testing an energy storage control system, wherein: The test method includes: receiving test instruction information; According to the test indication information, simulate the associated device connected to the device under test in the energy storage control system to determine the simulated associated parameters; the simulated associated parameters include simulated interface parameters or simulated function parameters; The device under test is tested according to the simulation association parameters and the test indication information, and a test result of the device under test is received.

2. The method according to claim 1, wherein: The step of simulating the associated device connected to the device under test in the energy storage control system according to the test indication information and determining the simulated associated parameters includes: Get the preset point configuration table; The associated device is simulated according to the preset point allocation table and the test type indicated by the test indication information, and the simulated associated parameters are determined.

3. The method according to claim 2, wherein: The simulation association parameters include simulation interface parameters, and the simulation of the associated device and determination of the simulation association parameters according to the preset point configuration table and the test type indicated by the test indication information include: If the test type indicated by the test indication information is an interface test, extracting interface configuration information from the preset point configuration table; The related interfaces of various types in the associated device are configured according to the interface configuration information to determine the analog interface parameters.

4. The method according to claim 2, wherein: The simulation association parameters include simulation function parameters, and the simulation of the associated devices connected to the device under test in the energy storage control system according to the preset point allocation table and the test type indicated by the test indication information to determine the simulation association parameters includes: If the test type indicated by the test indication information is a functional test, extracting the test logic of each functional module in the associated device from the preset point configuration table; The logic circuit is configured according to the test logic of each functional module in the associated device to generate the simulation function parameters.

5. The method according to any one of claims 1 to 4, wherein: The step of obtaining the preset point allocation table includes: Receive a preset point configuration table; the preset point configuration table includes interface configuration information of at least one type of related interface, and functional configuration information of at least one type of functional module; each of the interface configuration information includes operating parameters of the corresponding interface, and each of the functional configuration information includes test logic of the corresponding functional module.

6. The method according to claim 1, wherein: The step of testing the device under test according to the simulation association parameter and the test indication information and receiving the test result of the device under test includes: Parsing the test instruction information to obtain a first test task; The test module of the local machine is configured according to the simulation association parameters, and the configured test module is driven to execute the first test task to test the device under test, and a test result obtained after the device under test is tested based on the first test task is received.

7. The method according to claim 6, wherein: The simulation-related parameters include simulation function parameters, the test module includes a function module, the test module after the driver configuration executes the first test task to test the device under test, and receives a test result obtained after the device under test is tested based on the first test task, including: The configured function module is driven to generate abnormal information according to the test parameters in the first test task; the simulation function parameters include any one of input function parameters, network communication function parameters, optical fiber communication function parameters, and output function parameters; The abnormal information is sent to the device under test for testing, and a test result obtained after the device under test is tested based on the first test task is received.

8. The method according to claim 7, wherein: The abnormal information includes an abnormal message, and the sending of the abnormal information to the device under test for testing, and receiving a test result obtained after the device under test is tested based on the first test task, includes: The abnormal message is sent to the device under test for testing according to a preset sending period, and a test result obtained after the device under test is tested based on the first test task is received.

9. The method according to claim 6, wherein: The simulation-related parameters include simulation interface parameters, the test module after the driver configuration executes the first test task to test the device under test, and receives a test result obtained after the device under test is tested based on the first test task, including: generating an abnormal signal according to the test parameters in the first test task and the type of the simulation interface parameter; The configured test module is driven to send the abnormal signal to the device under test for testing, and receive a test result obtained after the device under test is tested based on the first test task.

10. The method according to claim 6, wherein: The first test task includes a plurality of test subtasks, the test module after the driver configuration executes the first test task to test the device under test, and receives a test result obtained after the device under test is tested based on the first test task, including: Determining a first test parameter according to a first test subtask in the first test task; driving the configured test module to generate a first operating parameter according to the first test parameter; Sending the first operating parameter to the device under test for testing, and receiving a first test result obtained after the device under test is tested based on the first operating parameter; When the first test result indicates that the device under test is in normal working condition, new first test parameters and new first operating parameters are determined according to the next test subtask, and the step of driving the configured test module to generate first operating parameters according to the first test parameters is returned to execute until all the test subtasks are executed.

11. The method according to claim 6, wherein: The method further comprises: Establishing a communication connection between the configured test module and the device under test; Sending a second operating parameter to the device under test, and receiving a second test result obtained after the device under test is tested based on the second operating parameter; When the second test result indicates that the device under test is in a fault clearing state, the step of parsing the test indication information to obtain the first test task is performed.

12. The method according to claim 11, wherein: The establishing of a communication connection between the configured test module and the device under test includes: Extract communication protocol information from the preset point configuration table; A communication connection is established between the configured test module and the device under test according to the communication protocol information.

13. The method according to claim 1, wherein: The method further comprises: The test results are reported to the host computer.

14. A test system for energy storage valve control, wherein: The test system includes a host computer, a test device and an energy storage control system; the energy storage control system includes at least a submodule controller, a main control chassis, and an expansion device; The test device is used to receive the test indication information sent by the host computer, and simulate the associated equipment connected to the device under test in the energy storage control system according to the test indication information, determine the simulation associated parameters, test the device under test according to the simulation associated parameters and the test indication information, and receive the test results of the device under test; the simulation associated parameters include simulation interface parameters or simulation function parameters.

15. A test device for an energy storage control system, wherein: The testing device comprises: A receiving module, used for receiving test instruction information; A simulation module, used to simulate the associated equipment connected to the device under test in the energy storage control system according to the test indication information, and determine simulation associated parameters; the simulation associated parameters include simulation interface parameters or simulation function parameters; A test module is used to test the device under test according to the simulation associated parameters and the test indication information. Test and receive the test result of the device under test.

16. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 13 are implemented.

17. A computer-readable storage medium having a computer program stored thereon, wherein: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 13 are implemented.

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