Measurement method and apparatus, terminal, and computer-readable storage medium

Abstract

The present application discloses a measurement method and apparatus, and a terminal. The method comprises: a terminal performs L1 measurement, wherein the measurement delay of the L1 measurement is related to a first factor and / or the number of frequency points; and / or the terminal performs measurement by a first method or a second method, wherein the measurement comprises L1 measurement and / or L3 measurement; corresponding to the first method, the measurement delay of the L1 measurement is related to the number of cells involved in the L1 measurement and a second factor, and / or the measurement delay of the L3 measurement is related to the number of cells involved in the L1 measurement and a third factor; corresponding to the second method, the measurement delay of the L1 measurement is related to the number of cells involved in the L1 measurement and the number of frequency points involved in the L3 measurement, and / or the measurement delay of the L3 measurement is related to the number of cells involved in the L1 measurement and the number of frequency points involved in the L3 measurement.

Description

A measurement method and device, terminal, and computer-readable storage medium

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] This application is based on the Chinese patent application with application number 202311845160.1 and application date of December 28, 2023, and claims the priority of the Chinese patent application. The entire content of the Chinese patent application is hereby introduced into this application as a reference. Technical Field

[0003] The present application relates to the field of wireless technology, and in particular to a measurement method and device, a terminal, and a computer-readable storage medium. Background Art

[0004] For wireless mobile communication systems, accurate measurement of cell quality and beam quality is fundamental to effective radio resource management and mobility management. Due to limitations in terminal processing capabilities, it is generally assumed that a terminal can only receive or measure signals from one beam direction at a time. Because different cells receive signals from different directions, a terminal cannot simultaneously receive or measure signals from multiple cells. This leads to contention between measurements with overlapping measurement resources. For example, Layer 1 (L1) measurements cannot be performed simultaneously on different cells, nor can Layer 3 (L3) and L1 measurements be performed simultaneously. The terminal cannot determine how to allocate measurements between these non-simultaneous measurement scenarios, and thus cannot determine measurement latency, resulting in network scheduling issues. Summary of the Invention

[0005] To solve the above technical problems, the embodiments of the present application provide a measurement method and device, a terminal, a chip, and a computer-readable storage medium.

[0006] The measurement method provided in the embodiment of the present application includes:

[0007] The terminal performs L1 measurement, where the measurement delay of the L1 measurement is related to the first factor and / or the number of frequency points; and / or,

[0008] The terminal performs measurement through the first method or the second method, and the measurement includes L1 measurement and / or L3 measurement; wherein, corresponding to the first method, the measurement delay of the L1 measurement is related to the number of cells measured by the L1 and the second factor, and / or the measurement delay of the L3 measurement is related to the number of cells measured by the L1 and the third factor; corresponding to the second method, the measurement delay of the L1 measurement is related to the number of cells measured by the L1 and the number of frequencies measured by the L3, and / or the measurement delay of the L3 measurement is related to the number of cells measured by the L1 and the number of frequencies measured by the L3.

[0009] The measuring device provided in the embodiment of the present application is applied to a terminal, and the device includes:

[0010] The measurement unit is configured to perform L1 measurement, the measurement delay of the L1 measurement is related to the first factor and / or the number of frequency points; and / or, the measurement is performed by the first method or the second method, the measurement includes L1 measurement and / or L3 measurement; wherein, corresponding to the first method, the measurement delay of the L1 measurement is related to the number of cells measured by the L1 and the second factor, and / or the measurement delay of the L3 measurement is related to the number of cells measured by the L1 and the third factor; corresponding to the second method, the measurement delay of the L1 measurement is related to the number of cells measured by the L1 and the number of frequency points measured by the L3, and / or the measurement delay of the L3 measurement is related to the number of cells measured by the L1 and the number of frequency points measured by the L3.

[0011] The terminal provided in an embodiment of the present application includes: a processor and a memory, the memory is configured to store a computer program, and the processor is configured to call and run the computer program stored in the memory to perform any of the above-mentioned measurement methods.

[0012] The chip provided in an embodiment of the present application includes: a processor configured to call and run a computer program from a memory, so that a device equipped with the chip performs any one of the above-mentioned measurement methods.

[0013] The computer-readable storage medium provided in an embodiment of the present application is configured to store a computer program, and the computer program enables a computer to execute any one of the above-mentioned measurement methods.

[0014] The technical solution of the embodiment of the present application can clarify the measurement delay of L1 measurement and the measurement delay of L3 measurement by performing measurement allocation for L1 measurement between different cells, and performing measurement allocation for L3 measurement and L1 measurement, thereby providing a basis for network scheduling. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and, together with the description, serve to explain the principles of the present disclosure.

[0016] FIG1 is a schematic diagram of an application scenario of an embodiment of the present application;

[0017] FIG2 is a schematic flow chart of a measurement method according to an embodiment of the present application;

[0018] FIG3 is a first schematic diagram of a measurement object provided in an embodiment of the present application;

[0019] FIG4 is a second schematic diagram of a measurement object provided in an embodiment of the present application;

[0020] FIG5 is a third schematic diagram of a measurement object provided in an embodiment of the present application;

[0021] FIG6 is a fourth schematic diagram of a measurement object provided in an embodiment of the present application;

[0022] FIG7 is a schematic diagram of the structure of a measuring device provided in an embodiment of the present application;

[0023] FIG8 is a schematic structural diagram of a communication device provided in an embodiment of the present application;

[0024] FIG9 is a schematic structural diagram of a chip according to an embodiment of the present application. DETAILED DESCRIPTION

[0025] The following will describe the technical solutions in the embodiments of this application in conjunction with the drawings in the embodiments of this application. Obviously, the described embodiments are part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0026] FIG1 is a schematic diagram of an application scenario of an embodiment of the present application.

[0027] As shown in Figure 1, a communication system 100 may include a terminal 110 and a network device 120. The network device 120 may communicate with the terminal 110 via an air interface.

[0028] It should be understood that the embodiments of the present application are only illustrative of the communication system 100, but the embodiments of the present application are not limited thereto. In other words, the technical solutions of the embodiments of the present application can be applied to various communication systems, such as: 5G communication systems (also known as New Radio (NR) communication systems), or future communication systems.

[0029] 1 , the network device 120 may be an access network device that communicates with the terminal 110. The access network device may provide communication coverage for a specific geographical area and may communicate with the terminal 110 (eg, UE) located within the coverage area.

[0030] The network device 120 may be a base station (gNB) in an NR system or a network device in a future evolved public land mobile network (PLMN).

[0031] The terminal 110 may be any terminal, for example, the terminal 110 may be an access terminal, a user equipment (UE), a subscriber unit, a subscriber station, a mobile station, a mobile station, a remote station, a remote terminal, a mobile device, a user terminal, a terminal, a wireless communication device, a user agent, or a user device. The access terminal may be a cellular phone, a cordless phone, a Session Initiation Protocol (SIP) phone, an IoT device, a satellite handheld terminal, a Wireless Local Loop (WLL) station, a Personal Digital Assistant (PDA), a handheld device with wireless communication capabilities, a computing device or other processing device connected to a wireless modem, an in-vehicle device, a wearable device, a terminal in a 5G network or a terminal in a future evolution network, etc.

[0032] FIG1 exemplarily shows a base station and two terminals. Optionally, the wireless communication system 100 may include multiple base station devices and each base station may include other numbers of terminals within its coverage area, which is not limited in the embodiments of the present application.

[0033] It should be noted that Figure 1 is merely an example of a system applicable to this application. Of course, the methods described in the embodiments of this application can also be applied to other systems. Furthermore, the terms "system" and "network" are often used interchangeably herein. The term "and / or" herein simply describes an association relationship between associated objects, indicating that three possible relationships exist. For example, "A and / or B" can represent: A exists alone, A and B exist simultaneously, or B exists alone. Furthermore, the character " / " generally indicates that the associated objects are in an "or" relationship. It should also be understood that the "indication" mentioned in the embodiments of this application can be a direct indication, an indirect indication, or an indication of an association relationship. For example, "A indicates B" can mean that A directly indicates B, for example, B can obtain information through A; it can also mean that A indirectly indicates B, for example, A indicates C, and B can obtain information through C; or it can mean that A and B have an association relationship. It should also be understood that the "correspondence" mentioned in the embodiments of this application can mean that there is a direct or indirect correspondence between two objects, or that there is an association relationship between the two objects, or a relationship between an indicator and the indicated, a configuration and the configured, and so on. It should also be understood that the “predefined” or “predefined rules” mentioned in the embodiments of the present application can be implemented by pre-saving corresponding codes, tables or other methods that can be used to indicate relevant information in a device (for example, including a terminal and a network device). The present application does not limit its specific implementation method. For example, predefined can refer to a definition in a protocol. It should also be understood that in the embodiments of the present application, the “protocol” may refer to a standard protocol in the field of communications, for example, it may include the NR protocol and related protocols used in future communication systems, and the present application does not limit this.

[0034] To facilitate understanding of the technical solutions of the embodiments of the present application, the relevant technologies of the embodiments of the present application are described below. The following relevant technologies can be arbitrarily combined with the technical solutions of the embodiments of the present application as optional solutions, and they all fall within the protection scope of the embodiments of the present application.

[0035] For 5G NR, two main types of reference signals are currently considered as measurement reference signals, namely the synchronization signal and physical broadcast channel block (Synchronization Signal / PBCH Block, SSB) and the channel state information reference signal (CSI-RS).

[0036] For SSB-based measurements, the network configures SSB measurement resources to the terminal through high-layer signaling so that the terminal can perform corresponding measurement operations. Exemplarily, the SSB measurement configuration includes: SSB frequency, SSB subcarrier spacing, SSB measurement timing configuration (SMTC), reference signal configuration, etc. Among them, the SSB frequency is the center frequency of the SSB to be measured. The SSB subcarrier spacing is the subcarrier spacing of the SSB to be measured. The SMTC configuration is the time domain resource configuration information of the SSB measurement, which is mainly used to configure a set of measurement time windows (called SMTC windows) based on the SSB measurement. The SSB configuration may further include an SSB to be measured indication (ssb-ToMeasure), etc. The SSB to be measured indication uses a bit map to indicate the position information of the SSB actually sent in the SSB burst set. The terminal can clearly know which SSB candidate positions actually sent the SSB and which SSB candidate positions did not send the SSB through the SSB to be measured indication. The terminal does not need to perform measurement at the position where the SSB is not sent, thereby achieving energy saving of the terminal.

[0037] SSB includes the Primary Synchronisation Signal (PSS), the Secondary Synchronisation Signal (SSS) and the Physical Broadcast Channel (PBCH). The frequency domain resources of SSB occupy 20 RBs. In the FR1 frequency band, the subcarrier spacing of SSB is 15kHz or 30kHz, and in the FR2 frequency band, the subcarrier spacing of SSB is 60kHz or 120kHz. The bandwidth corresponding to the frequency domain resources of SSB is related to the number of RBs it occupies and the subcarrier spacing. Specifically, the bandwidth corresponding to the frequency domain resources of SSB = the number of RBs occupied by the frequency domain resources of SSB × the subcarrier spacing of SSB × 12. For example: taking the subcarrier spacing of SSB as 15kHz as an example, the bandwidth corresponding to the frequency domain resources of SSB is 3.6MHz. For another example: taking the subcarrier spacing of SSB as 30kHz as an example, the bandwidth corresponding to the frequency domain resources of SSB is 7.2MHz.

[0038] SSBs appear periodically in the time domain in the form of SSB burst sets. Each SSB burst set can contain one or more SSBs. The terminal performs SSB measurements within the SMTC window, which appears periodically in the time domain. For example, if each SSB burst set contains 8 SSBs, the SSB transmission period is the time interval between two adjacent SSBs with the same SSB index. The SSB transmission period, SMTC window size, and SMTC window period are all adjustable.

[0039] For CSI-RS-based measurements, the network configures one or more CSI-RS resources through higher-layer signaling for the terminal to measure. Specifically, higher-layer signaling configures cell-level CSI-RS configuration parameters, such as the cell ID, cell measurement bandwidth, measurement density, and measurement resource list, on a cell-by-cell basis. Furthermore, since each cell can be configured with multiple CSI-RS resources, higher-layer signaling further configures configuration information at the level of each CSI-RS resource, such as the CSI-RS index of the CSI-RS resource, information about the time and / or frequency domain resources occupied by the CSI-RS resource, and the sequence generation method.

[0040] For example, the CSI-RS configuration information may include the content shown in Table 1 below:

[0041] Table 1

[0042] Among them, subcarrierSpacing is used to configure the subcarrier spacing of CSI-RS. nrofPRBs is used to configure the number of RBs occupied by the frequency domain resources of CSI-RS. startPRB is used to configure the starting RB occupied by the frequency domain resources of CSI-RS. In the FR1 frequency band, the candidate values ​​of the subcarrier spacing of CSI-RS are: 15kHz, 30kHz, 60kHz, and the candidate values ​​of the number of RBs occupied by the frequency domain resources of CSI-RS are: 24, 48, 96, 192, 264. In the FR2 frequency band, the candidate values ​​of the subcarrier spacing of CSI-RS are: 60kHz, 120kHz, and the candidate values ​​of the number of RBs occupied by the frequency domain resources of CSI-RS are: 24, 48, 96, 192, 264. The bandwidth corresponding to the CSI-RS frequency-domain resource is related to the number of RBs it occupies and the subcarrier spacing. Specifically, the bandwidth corresponding to the CSI-RS frequency-domain resource = the number of RBs occupied by the CSI-RS frequency-domain resource × the CSI-RS subcarrier spacing × 12. For example, if the number of RBs occupied by the CSI-RS frequency-domain resource is 24 and the CSI-RS subcarrier spacing is 15 kHz, the bandwidth corresponding to the CSI-RS frequency-domain resource is 4.32 MHz.

[0043] In the above solution, the frequency range corresponding to the FR1 band can be 410MHz to 7.125GHz, and the frequency range corresponding to the FR2 band can be 24.25GHz to 52.6GHz. Of course, the frequency ranges corresponding to the FR1 band and the FR2 band can also be adjusted.

[0044] When performing adjacent frequency / neighboring cell measurements, a terminal usually requires a measurement gap (MG). During the duration of the measurement gap, the terminal disconnects from the current serving frequency and tunes to the frequency position of the measurement reference signal for measurement. The measurement interval is configured by the network through high-layer signaling. The measurement interval configuration includes the measurement interval period, the measurement interval length, and the measurement interval offset. During the duration of a certain measurement interval, the terminal can only tune to one frequency point to measure that frequency point. If there are multiple frequency points that need to be measured, then these frequency points need to compete for the measurement gap. It should be noted that the measurement interval can also be referred to as a gap.

[0045] In mobility management, first, the network triggers the terminal to switch to the target cell based on the L3 measurement results reported by the terminal; then, based on the L1 measurement results of the target cell reported by the terminal, the network configures the Transmission Configuration Indicator (TCI) state through the RRC reconfiguration message, and the terminal selects the appropriate downlink beam for data reception according to the TCI state configured by the network. Regarding the L1 measurement here, the terminal only performs L1 measurement in the serving cell, and the terminal does not need to perform L1 measurement on the neighboring cell. In order to reduce the delay and signaling overhead caused by switching, one of the research directions is to carry out L1-based inter-cell mobility. This mechanism requires the terminal to perform L1 measurement of neighboring cells / adjacent frequencies (non-serving cells). Here, the L1 measurement of neighboring cells / adjacent frequencies can also be described as L1 measurement of non-serving cells, or as L1 / L2 triggered mobility measurement.

[0046] The terminal performs L1 measurement of the neighboring area / adjacent frequency, which increases the complexity of the competition for the measurement opportunity. Here, for scenarios where a measurement interval is required, the measurement opportunity refers to the measurement interval; for scenarios where a measurement interval is not required, the measurement opportunity refers to the measurement duration in the time domain, which can be understood as how long it takes to complete the measurement of the target frequency. It is necessary to clarify how the terminal handles the competition for measurement opportunities between the L3 measurement of the neighboring area / adjacent frequency and the L1 measurement of the adjacent frequency / neighboring area, as well as the competition for measurement opportunities between the L1 measurements of multiple different cells (such as between adjacent areas of the same frequency, between different frequency cells, and between adjacent areas and serving cells). To this end, the following technical solutions of the embodiments of the present application are proposed. Through the following technical solutions of the embodiments of the present application, the measurement delay of the L1 measurement and the L3 measurement can be clarified, that is, it is clear how long the terminal can complete the L1 measurement and the L3 measurement.

[0047] It's important to note that inter-cell measurement contention doesn't exist in L3 measurements, as it's generally assumed that terminals have a dedicated L3 module capable of simultaneously measuring multiple cells on the same frequency. However, L1 measurements differ. Terminals typically perform L1 measurements in the data demodulation module, which is typically based on FFT. Due to complexity and cost constraints, terminals can typically only complete L1 measurements for one cell at a time. Furthermore, unlike the coarse beams used for L3 measurements, terminals use fine beams for L1 measurements, which have a larger number of beams than coarse beams.

[0048] To facilitate understanding of the technical solutions of the embodiments of the present application, the technical solutions of the present application are described in detail below through specific embodiments. The above related technologies can be combined arbitrarily with the technical solutions of the embodiments of the present application as optional solutions, and all of them fall within the scope of protection of the embodiments of the present application. The embodiments of the present application include at least part of the following contents.

[0049] It should be noted that the L1 measurement described in the embodiments of the present application can also be described as layer 1 measurement of a neighboring cell / adjacent frequency. L1 measurement includes intra-frequency L1 measurement and / or inter-frequency L1 measurement. Among them, inter-frequency L1 measurement includes L1 measurement requiring a measurement interval and / or L1 measurement not requiring a measurement interval.

[0050] It should be noted that the L1 measurement described in the embodiments of the present application refers to the measurement of L1-reference signal received power (RSRP) and / or L1-signal to interference plus noise ratio (SINR).

[0051] It should be noted that the measurement delay described in the embodiments of the present application can also be described as a measurement period, or as a measurement duration, or as a measurement time. The corresponding English expressions can be measurement period or measurement delay.

[0052] It should be noted that the frequency points described in the embodiments of the present application can also be described as measurement objects (MOs) or as frequencies.

[0053] It should be noted that the “×” described in the embodiments of the present application represents a multiplication sign, and “max” represents the maximum value.

[0054] FIG2 is a flow chart of a measurement method provided in an embodiment of the present application. As shown in FIG2 , the measurement method includes one or more of the following steps:

[0055] Step 201: The terminal performs L1 measurement, where the measurement delay of the L1 measurement is related to a first factor and / or the number of frequency points.

[0056] Corresponding to step 201, the technical solution of the embodiment of the present application clarifies the measurement resource allocation of L1 measurements of different cells (measurement resource allocation can be understood as which type of measurement the terminal performs at a certain measurement time if there is a measurement conflict. The measurement time includes at least one of the measurement interval, SMTC, and SSB), solves the conflict problem of L1 measurements of different cells, and thus can determine the measurement delay. Here, the L1 measurement between different cells can be: L1 measurement of different neighboring cells (for example, the terminal needs to perform L1 measurement on at least two neighboring cells. In this case, if the terminal cannot perform L1 measurement of these neighboring cells at the same time, then the technical solution based on the present application can help the terminal determine how to measure the neighboring cells (for example, at a certain measurement time, with what probability or proportion to measure certain neighboring cells), and then determine the neighboring cell L1 measurement delay), or it can also be: L1 measurement of the neighboring cell and the serving cell (for example, the terminal needs to perform L1 measurement on the serving cell and the neighboring cell, and the number of neighboring cells for L1 measurement is at least 1. In this case, if the terminal cannot perform L1 measurement of the serving cell and the neighboring cell at the same time, then the technical solution based on the present application can help the terminal determine how to measure the serving cell and the neighboring cell (for example, at a certain measurement time, with what probability or proportion to measure the serving cell and / or with what probability or proportion to measure the neighboring cell), and then determine the neighboring cell L1 measurement delay and / or the serving cell L1 measurement delay.

[0057] Specifically, the technical aspects of the embodiments of the present application solve the measurement contention problem caused by the inability to measure L1 measurements of neighboring cells at the same time (including how to allocate measurement opportunities (or described as measurement resources) for L1 measurements of neighboring cells and serving cells, and how to allocate measurement opportunities for L1 measurements between multiple neighboring cells). For L1 measurements of neighboring cells, especially L1 measurements of FR2 cells, due to the different beam directions of different cells, the terminal cannot perform L1 measurements of multiple cells at the same time. Therefore, how the terminal allocates measurement opportunities and how to perform L1 measurements of neighboring cells and serving cells are problems that need to be solved. In addition, the specific measurement execution scheme will affect the measurement delay of the L1 measurement.

[0058] In an embodiment of the present application, the measurement delay of L1 measurement is related to the first factor and / or the number of frequency points, or it can also be described as: the measurement delay of L1 measurement includes at least one of the first factor and the number of frequency points, or it can also be described as: the measurement delay of L1 measurement is determined based on the first factor and / or the number of frequency points, or it can also be described as: the calculation formula of the measurement delay of L1 measurement includes at least the first factor and / or the number of frequency points.

[0059] The value of the first factor can be determined by one or more of the following schemes:

[0060] Solution 1) If the SSBs of the serving cell and the neighboring cell overlap or are adjacent, the value of the first factor is 2.

[0061] In some implementations, when the number of neighboring cells is 1, if the SSBs of the serving cell and the neighboring cell overlap or are adjacent, the value of the first factor is 2;

[0062] In some embodiments, when the number of neighboring cells is 1, if the SSBs of the serving cell and the neighboring cell overlap or are adjacent in the time domain, the value of the first factor is 2.

[0063] It should be noted that the number of neighboring cells in the embodiment of the present application can also be described as the number of neighboring cells to be measured.

[0064] Here, if the number of neighboring cells to be measured is 1, and the SSBs of the serving cell and the neighboring cell overlap or are adjacent, then the L1 measurement of the neighboring cell conflicts with the L1 measurement of the serving cell. The value of the first factor is 2, which means that the measurement opportunities are allocated at a ratio of 50%, that is, in a certain measurement opportunity, there is a 50% probability of performing the L1 measurement of the serving cell, and there is also a 50% probability of performing the L1 measurement of the neighboring cell. Since the impact of the measurement probability on the measurement delay is that the measurement delay will be extended, the first factor will be reflected in the measurement delay of the L1 measurement. Specifically, the measurement delay of the L1 measurement of the serving cell is extended to 2 times, and the measurement delay of the L1 measurement of the neighboring cell is extended to 2 times.

[0065] Solution 2) If the TCI state of the neighboring cell is not in the activated TCI state list, the first factor is the number of neighboring cells multiplied by 3.

[0066] In some embodiments, when the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is not in the activated TCI state list, the value of the first factor is the first number of neighboring cells multiplied by 3, where the first number of neighboring cells includes the number of intra-frequency neighboring cells and / or the number of inter-frequency neighboring cells.

[0067] In some embodiments, when the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is not in the activated TCI state list, the value of the first factor is the first number of neighboring cells multiplied by 3, where the first number of neighboring cells includes the number of intra-frequency neighboring cells and / or the number of inter-frequency neighboring cells that do not require a measurement interval;

[0068] In some embodiments, when the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is not in the activated TCI state list, the value of the first factor is the first number of neighboring cells multiplied by 3, and the first number of neighboring cells includes the sum of the number of same-frequency neighboring cells and the number of different-frequency neighboring cells that do not require a measurement interval.

[0069] Here, if the number of neighboring cells to be measured is greater than one, and the TCI states of none of the neighboring cells are in the active TCI state list, the measurement opportunities are divided into three parts: L1 measurement of the serving cell, neighboring cells configured with TCI states, and other neighboring cells (neighboring cells not configured with TCI states), each accounting for 1 / 3 of the application opportunities. How to measure other neighboring cells and the number of cells measured depend on the terminal's own implementation. However, the terminal needs to complete measurements of the serving cell and neighboring cells configured with TCI states. Therefore, the impact on L1 measurement time is: the measurement delay of L1 measurement of the serving cell is extended by 3 times, and the measurement delay of L1 measurement of neighboring cells is extended by (3 × number of neighboring cells). The delay of L1 measurement of neighboring cells can be further understood as the delay of L1 measurement of neighboring cells configured with TCI states.

[0070] Solution 3) If the TCI state of the neighboring cell is in the activated TCI state list, the value of the first factor is the number of neighboring cells with the TCI state in the activated TCI state list multiplied by 3.

[0071] In some embodiments, when the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is in the activated TCI state list, the value of the first factor is the second number of neighboring cells multiplied by 3, and the second number of neighboring cells is the number of neighboring cells of the TCI state in the activated TCI state list. The neighboring cells of the TCI state in the activated TCI state list include co-frequency neighboring cells and / or inter-frequency neighboring cells. Specifically, the number of neighboring cells of the TCI state in the activated TCI state list includes the sum of the number of co-frequency neighboring cells of the TCI state in the activated TCI state list and the number of inter-frequency neighboring cells of the TCI state in the activated TCI state list.

[0072] Here, if the number of neighboring cells to be measured is greater than 1, and the TCI state of the neighboring cell is in the activated TCI state list (or is described as a neighboring cell with a TCI state in the activated TCI state list), then the measurement opportunity is divided into three parts: L1 measurement of the serving cell, L1 measurement of neighboring cells with a TCI state in the activated TCI state list, and L1 measurement of other neighboring cells (other neighboring cells include neighboring cells whose TCI state is not in the activated TCI state list and neighboring cells that are not configured with a TCI state), each accounting for 1 / 3 of the measurement opportunity. Regarding other neighboring cells, how to measure and how many cells to measure depends on the terminal's own implementation. However, the terminal needs to complete the measurement of the serving cell and the neighboring cells whose TCI state is in the activated TCI state list (TCI state in the activated TCI state list means that the network configuration terminal needs to measure the cell to facilitate subsequent LTM (L1 / L2 triggered mobility) switching). Therefore, the impact on the L1 measurement time is: the measurement delay of the L1 measurement of the serving cell is extended to 3 times, and the measurement delay of the L1 measurement of the neighboring cell is extended to (3×the number of neighboring cells with TCI state in the activated TCI state list) times. The delay of the L1 measurement of the neighboring cell can be further understood as the delay of the L1 measurement of the neighboring cell with TCI state in the activated TCI state list.

[0073] As an implementation method, the first factor is reflected as a multiplication factor in the calculation formula of the measurement delay. By adding the multiplication factor (ie, the first factor) to the calculation formula of the measurement delay, the measurement delay can be scaled.

[0074] In addition, if the SSBs of the serving cell and the neighboring cell do not overlap or are not adjacent, the value of the first factor is 1. In this scenario, since the SSBs of the serving cell and the neighboring cell do not overlap or are not adjacent, the terminal does not need to perform L1 measurement of the neighboring cell and L1 measurement of the serving cell at the same time.

[0075] It should be noted that the second number of neighboring cells in the embodiment of the present application is a subset of the first number of neighboring cells. The second number of neighboring cells includes co-frequency neighboring cells and / or inter-frequency neighboring cells. Furthermore, the second number of neighboring cells includes the number of co-frequency neighboring cells and / or the number of inter-frequency neighboring cells in the activated TCI state list.

[0076] It should be noted that the neighboring cell described in the embodiments of the present application can also be described as a cell, or as a cell with a physical cell identifier (PCI) different from that of the serving cell, or as a cell with a physical cell index different from that of the serving cell.

[0077] The number of frequencies in the above scheme can be determined by one or more of the following schemes:

[0078] Solution 1) The number of frequency points includes the number of same frequency points and / or the number of different frequency points;

[0079] Here, the same-frequency number can also be described as the number of same-frequency frequency points, and the different-frequency number can also be described as the number of different-frequency frequency points.

[0080] Solution 2) The number of frequency points is the sum of the number of same frequency points and the number of different frequency points;

[0081] Solution 3) The number of frequency points includes the number of same frequencies and / or the number of different frequencies that do not require measurement intervals;

[0082] Solution 4) The value of the number of frequency points is the sum of the number of same-frequency points used for L1 measurement and the number of different-frequency points used for L1 measurement that do not require measurement intervals.

[0083] The L1 measurement period in the above solution can be determined by one or more of the following solutions:

[0084] Solution 1) The L1 measurement period includes at least the neighboring cell SSB period × the number of frequency points;

[0085] Solution 2) The L1 measurement period must include at least max(neighboring cell SSB period, DRX cycle length) × number of frequency points.

[0086] Solution 3) The L1 measurement period includes at least the DRX cycle length × the number of frequency points;

[0087] Solution 4) The period of L1 measurement includes at least the first factor × N, where N=8;

[0088] Solution 5) The period of L1 measurement includes at least the first factor × N × the period of the neighboring cell SSB, where N = 8;

[0089] Solution 6) The L1 measurement period includes at least the first factor × N*max (neighboring cell SSB period, DRX cycle length), where N=8;

[0090] Solution 7) The period of L1 measurement includes at least the first factor×N×DRX cycle length, where N=8.

[0091] It should be noted that in the above solution, the L1 measurement period includes at least X, which can also be described as the L1 measurement period being determined based on X, or the L1 measurement period being at least related to X, or the calculation formula for the L1 measurement period including at least X. Here, X = neighboring cell SSB period × number of frequencies; or, X = max (neighboring cell SSB period, DRX cycle length) × number of frequencies; or, X = DRX cycle length × number of frequencies; or, X = first factor × N, N = 8; or, X = first factor × N × neighboring cell SSB period, N = 8; or, X = first factor × N * max (neighboring cell SSB period, DRX cycle length), N = 8; or, X = first factor × N × DRX cycle length, N = 8.

[0092] Step 202: The terminal performs measurement through the first method or the second method, where the measurement includes L1 measurement and / or L3 measurement; wherein, corresponding to the first method, the measurement delay of the L1 measurement is related to the number of cells measured by L1 and the second factor, and / or the measurement delay of the L3 measurement is related to the number of cells measured by L1 and the third factor; corresponding to the second method, the measurement delay of the L1 measurement is related to the number of cells measured by L1 and the number of frequency points measured by L3, and / or the measurement delay of the L3 measurement is related to the number of cells measured by L1 and the number of frequency points measured by L3.

[0093] Corresponding to step 202, the technical solution of the embodiment of the present application clarifies the measurement delay allocation between L1 measurement and L3 measurement, and solves the conflict problem between L1 measurement and L3 measurement. The first method and the second method are described below.

[0094] First method

[0095] For the first approach, the measurement delay of the L1 measurement is related to the number of cells measured by the L1 and a second factor; the measurement delay of the L3 measurement is related to the number of cells measured by the L1 and a third factor.

[0096] In some implementations, the measurement delay of the L1 measurement may be determined by:

[0097] 1-1) The measurement delay of the L1 measurement is determined based on a first value and a second factor, wherein the first value is determined based on the number of cells measured by the L1; or

[0098] 1-2) The measurement delay of the L1 measurement is determined based on a second value, where the second value is determined based on the number of cells measured in the L1 measurement and a second factor.

[0099] Furthermore, the measurement delay of the L1 measurement is also determined based on the first duration, which is related to the period of the reference signal. Taking the reference signal as SSB as an example, the period of the reference signal refers to the SSB period.

[0100] In some implementations, the measurement delay of the L3 measurement may be determined by:

[0101] 2-1) The measurement delay of the L3 measurement is determined based on the first value and the third factor, wherein the first value is determined based on the number of cells measured in the L1 measurement; or

[0102] 2-2) The measurement delay of the L3 measurement is determined based on a third value, where the third value is determined based on the number of cells measured in the L1 measurement and a third factor.

[0103] Furthermore, the measurement delay of the L3 measurement is also determined based on the second duration, which is related to the period of the measurement window of the reference signal. Taking the reference signal as SSB as an example, the period of the measurement window of the reference signal is the SMTC period.

[0104] In the above solution, the second factor / third factor resolves the conflict problem (or contention problem) between L1 measurements (which can be described as SSB or CSI-RS-based measurements) and L3 measurements (which can be described as SMTC-based measurements). The second factor / third factor can also be described as a sharing factor or allocation factor. For example, if L1 and L3 measurements allocate measurement resources in a 1:2 ratio (or described as applying conflicting reference signals in this ratio), then a second factor of 3 means that the measurement delay of the L1 measurement will be extended by 3 times. Correspondingly, a third factor of 1.5 means that the measurement delay of the L3 measurement will be extended by 1.5 times.

[0105] The first method can be understood as follows: first, the measurement delay between L1 measurement and L3 measurement is allocated according to the second factor / third factor; then, for L1 measurement, the measurement delay between L1 measurements of multiple cells is allocated according to the first value (related to the number of cells measured by L1).

[0106] As an implementation method, the terminal may first determine the second factor / third factor between the L1 measurement and the L3 measurement, and then determine the first value (related to the number of cells measured by L1). As another implementation method, the terminal may first determine the first value (related to the number of cells measured by L1), and then determine the second factor / third factor between the L1 measurement and the L3 measurement.

[0107] In some embodiments, the above-mentioned second factor and / or third factor can be obtained in the following manner: the terminal receives first information sent by the network device, the first information is used to configure the allocation ratio between the measurement resources of L1 measurement and the measurement resources of L3 measurement; the terminal determines the second factor and / or third factor based on the allocation ratio.

[0108] Here, the network device configures an allocation ratio of N1:N2 between measurement resources for L1 measurement and measurement resources for L3 measurement; the terminal determines the second factor as (N1+N2) / N1 and the third factor as (N1+N2) / N2 according to the allocation ratio.

[0109] In other implementations, the second factor and / or the third factor may be obtained in the following manner: the terminal may receive second information sent by the network device, where the second information is used to configure the second factor and / or the third factor.

[0110] Here, the network device directly configures the second factor and the third factor.

[0111] In one example, the measurement delay of the L1 measurement is determined based on the first value and the second factor, and the measurement delay of the L3 measurement is determined based on the first value and the third factor, where the first value is equal to the number of cells measured by L1. Specifically, the measurement delay of the L1 measurement includes at least the SSB period × N × the first value × the second factor × M, where N = 8 and M = 1 or 3. The measurement delay of the L3 measurement includes at least the SMTC period × N × the first value × the third factor × K, where N = 8 and K = 5 or 8.

[0112] In one example, the measurement delay of the L1 measurement is determined based on a second value, which is determined based on the number of cells measured by the L1 and a second factor (the second value may be equal to the number of cells measured by the L1 multiplied by the second factor), and the measurement delay of the L3 measurement is determined based on a third value, which is determined based on the number of cells measured by the L1 and a third factor (the third value may be equal to the number of cells measured by the L1 multiplied by the third factor). Specifically, the measurement delay of the L1 measurement includes at least SSB period × N × second value × M, where N = 8 and M = 1 or 3; the measurement delay of the L3 measurement includes at least SMTC period × N × third value × K, where N = 8 and K = 5 or 8.

[0113] The technical solution of the embodiment of the present application is illustrated below with reference to FIG3 and FIG4 .

[0114] As shown in Figure 3, f1 and f2 represent two different frequencies. The terminal needs to perform L3 measurements on f1 and f2, and L1 measurements on f1. The terminal needs to perform L1 measurements on cells 1 and 2 under f1. The terminal uses the first method described above for measurement, with the first value = 2 (i.e., the number of cells for L1 measurement), the second factor value = 3, and the third factor value = 1.5. Therefore, the measurement delay for L1 measurement is T × first value × second factor = 6T, where T is related to the SSB period, the number of samples M, etc. For example, T = SSB period × N × M, where N = 8 and M = 1 or 3. The measurement delay for L3 measurement is T' × first value × third factor = 3T', where T' is related to the SMTC period, the number of samples K, etc. For example, T' = SMTC period × N × K, where N = 8 and K = 5 or 8.

[0115] As shown in Figure 4, f1, f2, and f3 represent three different frequencies. The terminal needs to perform L3 measurements on f1 and f2, and L1 measurements on f1 and f3. Specifically, the terminal needs to perform L1 measurements on cells 1 and 2 under f1, and L1 measurements on cell 3 under f3. The terminal uses the first method described above for measurement, with the first value = 3 (i.e., the number of cells for L1 measurement), the second factor = 3, and the third factor = 1.5. Therefore, the measurement delay for L1 measurement is T * first value * second factor = 9T, where T is related to the SSB period, the number of samples M, etc. For example, T = SSB period × N × M, where N = 8 and M = 1 or 3. The measurement delay for L3 measurement is T' × first value × third factor = 4.5T', where T' is related to the SMTC period, the number of samples K, etc. For example, T' = SMTC period × N × K, where N = 8 and K = 5 or 8.

[0116] Second method

[0117] For the second method, the measurement delay of L1 measurement is related to the number of cells measured by L1 and the number of frequencies measured by L3; the measurement delay of L3 measurement is related to the number of cells measured by L1 and the number of frequencies measured by L3.

[0118] In some implementations, the measurement delay of the L1 measurement may be determined by:

[0119] The measurement delay of the L1 measurement is determined based on a third value, where the third value is determined based on the number of cells measured in the L1 measurement and the number of frequencies measured in the L3 measurement.

[0120] Furthermore, the measurement delay of the L1 measurement is also determined based on the first duration, which is related to the period of the reference signal. Taking the reference signal as SSB as an example, the period of the reference signal refers to the SSB period.

[0121] In some implementations, the measurement delay of the L3 measurement may be determined by:

[0122] The measurement delay of the L3 measurement is determined based on a third value, where the third value is determined based on the number of cells measured in the L1 measurement and the number of frequencies measured in the L3 measurement.

[0123] Furthermore, the measurement delay of the L3 measurement is also determined based on the second duration, which is related to the period of the measurement window of the reference signal. Taking the reference signal as SSB as an example, the period of the measurement window of the reference signal is the SMTC period.

[0124] In some implementations, the third value includes the number of cells measured by L1 and the number of frequencies measured by L3, that is, the third value is equal to the sum of the number of cells measured by L1 and the number of frequencies measured by L3.

[0125] It should be noted that if the frequency point measured by L1 and the frequency point measured by L3 are the same frequency point, the third value needs to be counted twice.

[0126] In some embodiments, the third value includes the number of frequency points measured within the measurement interval and the number of cells performing L1 measurement within the measurement interval. The frequency point measured within the measurement interval means that the SMTC duration of the frequency point is completely covered by the measurement interval length (MGL) excluding the radio frequency (RF) conversion time (i.e., the SMTC duration completely falls within the MGL excluding the RF conversion time) and / or the CSI-RS resource window of the frequency point is completely covered by the MGL excluding the RF conversion time (i.e., the CSI-RS resource window completely falls within the MGL excluding the RF conversion time). The cell performing L1 measurement within the measurement interval means that the SSB duration of the cell is completely covered by the MGL excluding the RF conversion time (i.e., the SSB duration completely falls within the MGL excluding the RF conversion time).

[0127] The second approach can be understood as: L1 measurement is performed at the cell granularity and L3 measurement frequency points are used to allocate measurement resources. Unlike the first approach, the second approach no longer needs to consider the influence of the second factor / third factor.

[0128] In one example, the measurement delays for L1 and L3 are determined based on a third value, where the third value is equal to the number of cells measured for L1 plus the number of frequencies measured for L3. Specifically, the measurement delay for L1 measurement includes at least SSB period × N × third value × M, where N = 8 and M = 1 or 3. The measurement delay for L3 measurement includes at least SMTC period × N × third value × K, where N = 8 and K = 5 or 8.

[0129] The technical solution of the embodiment of the present application is illustrated below with reference to FIG5 and FIG6 .

[0130] As shown in Figure 5, f1 and f2 represent two different frequency points. The terminal needs to perform L3 measurements on f1 and f2, and L1 measurements on f1. The terminal needs to perform L1 measurements on cells 1 and 2 under f1. The terminal uses the second method described above for measurement, with the third value = 4 (i.e., the number of cells measured in L1 + the number of frequencies measured in L3). Then, the measurement delay of the L1 measurement is T × the third value = 4T, where T is related to the SSB period, the number of samples M, etc. For example, T = SSB period × N × M, where N = 8 and M = 1 or 3. The measurement delay of the L3 measurement is T' × the third value = 4T', where T' is related to the SMTC period, the number of samples K, etc. For example, T' = SMTC period × N × K, where N = 8 and K = 5 or 8.

[0131] As shown in Figure 6, f1, f2, and f3 represent three different frequencies. The terminal needs to perform L3 measurements on f1 and f2, and L1 measurements on f1 and f3. Specifically, the terminal needs to perform L1 measurements on cells 1 and 2 under f1, and L1 measurements on cell 3 under f3. The terminal uses the second method described above for measurement, with the third value = 5 (i.e., the number of frequencies for L3 measurement + the number of cells for L1 measurement). Therefore, the measurement delay for L1 measurement is T × the third value = 5T, where T is related to the SSB period, the number of samples M, etc. For example, T = SSB period × N × M, where N = 8 and M = 1 or 3. The measurement delay for L3 measurement is T' × the third value = 5T', where T' is related to the SMTC period, the number of samples K, etc. For example, T' = SMTC period × N × K, where N = 8 and K = 5 or 8.

[0132] In some implementations, before step 202, the network device flexibly instructs the terminal whether to use the first or second method for measurement. Specifically, the terminal receives third information sent by the network device, the third information being used to instruct the terminal to use the first or second method for measurement.

[0133] Here, for the first and second methods described above, different methods result in different measurement delays. Taking Figures 3 and 5 as examples, Figure 3, based on Method 1, achieves a 6T measurement delay for L1 measurements; Figure 5, based on Method 2, achieves a 4T measurement delay for L1 measurements. Compared to Method 1, Method 2 can reduce L1 measurement delay. Because Method 2 allocates measurement opportunities based on the cell granularity of L1 measurements and the frequency granularity of L3 measurements, the cost of Method 2 is an increase in L3 measurement delay. Given the greater robustness of L3 measurements and the rapid feedback provided by L1 measurements, the network device can flexibly adjust the measurement delays of L3 and L1 measurements by instructing the terminal to use Method 1 or Method 2. If stability is desired, the network device can instruct the terminal to use Method 1 for measurement; if higher speed is required, the network device can instruct the terminal to use Method 2.

[0134] It should be noted that the above step 201 and step 202 of the embodiment of the present application can be performed separately or both. When both step 201 and step 202 are performed, the present application does not limit the execution order of step 201 and step 202.

[0135] FIG7 is a schematic diagram of the structure of a measuring device provided in an embodiment of the present application, which is applied to a terminal. As shown in FIG7 , the measuring device includes:

[0136] The measurement unit 701 is configured to perform L1 measurement, where the measurement delay of the L1 measurement is related to a first factor and / or the number of frequency points; and / or, perform measurement through a first method or a second method, where the measurement includes L1 measurement and / or L3 measurement; wherein, corresponding to the first method, the measurement delay of the L1 measurement is related to the number of cells measured by the L1 and the second factor, and / or the measurement delay of the L3 measurement is related to the number of cells measured by the L1 and the third factor; corresponding to the second method, the measurement delay of the L1 measurement is related to the number of cells measured by the L1 and the number of frequency points measured by the L3, and / or the measurement delay of the L3 measurement is related to the number of cells measured by the L1 and the number of frequency points measured by the L3.

[0137] In some implementations, the measurement delay of the L1 measurement is related to the number of cells measured by the L1 and a second factor, specifically:

[0138] The measurement delay of the L1 measurement is determined based on a first value and the second factor, wherein the first value is determined based on the number of cells measured by the L1; or

[0139] The measurement delay of the L1 measurement is determined based on a second value, wherein the second value is determined based on the number of cells measured in the L1 and the second factor.

[0140] In some implementations, the measurement delay of the L3 measurement is related to the number of cells measured in the L1 measurement and a third factor, specifically:

[0141] The measurement delay of the L3 measurement is determined based on a first value and the third factor, wherein the first value is determined based on the number of cells measured in the L1 measurement; or,

[0142] The measurement delay of the L3 measurement is determined based on a third value, wherein the third value is determined based on the number of cells measured in the L1 measurement and the third factor.

[0143] In some embodiments, the apparatus further includes: a receiving unit 702 configured to receive first information sent by a network device, wherein the first information is used to configure an allocation ratio between the measurement resources for the L1 measurement and the measurement resources for the L3 measurement; and a determining unit 703 configured to determine the second factor and / or the third factor based on the allocation ratio.

[0144] In some implementations, the receiving unit 702 is configured to receive second information sent by a network device, where the second information is used to configure the second factor and / or the third factor.

[0145] In some implementations, the measurement delay of the L1 measurement is related to the number of cells measured by the L1 and the number of frequencies measured by the L3, specifically:

[0146] The measurement delay of the L1 measurement is determined based on a third value, wherein the third value is determined based on the number of cells measured by the L1 and the number of frequencies measured by the L3.

[0147] In some implementations, the measurement delay of the L3 measurement is related to the number of cells measured in the L1 measurement and the number of frequencies measured in the L3 measurement, specifically:

[0148] The measurement delay of the L3 measurement is determined based on a third value, wherein the third value is determined based on the number of cells measured in the L1 measurement and the number of frequencies measured in the L3 measurement.

[0149] In some implementations, the measurement delay of the L1 measurement is further determined based on a first duration, where the first duration is related to a period of a reference signal.

[0150] In some implementations, the measurement delay of the L3 measurement is further determined based on a second duration, where the second duration is related to a period of a measurement window of a reference signal.

[0151] In some implementations, the receiving unit 702 is configured to receive third information sent by a network device, where the third information is used to instruct the terminal to perform the measurement in the first manner or in the second manner.

[0152] In some embodiments, the value of the first factor is determined by at least one of the following methods:

[0153] If the SSBs of the serving cell and the neighboring cell overlap or are adjacent, the value of the first factor is 2;

[0154] If the TCI state of the neighboring cell is not in the activated TCI state list, the first factor is the number of neighboring cells multiplied by 3;

[0155] If the TCI state of the neighboring cell is in the activated TCI state list, the value of the first factor is the number of neighboring cells whose TCI state is in the activated TCI state list multiplied by 3.

[0156] In some embodiments, the value of the first factor is determined by at least one of the following methods:

[0157] When the number of neighboring cells is 1, if the SSBs of the serving cell and the neighboring cell overlap or are adjacent, the value of the first factor is 2;

[0158] When the number of neighboring cells is 1, if the SSBs of the serving cell and the neighboring cell overlap or are adjacent in the time domain, the value of the first factor is 2;

[0159] When the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is not in the activated TCI state list, the value of the first factor is the number of the first neighboring cells multiplied by 3, where the first number of neighboring cells includes the number of same-frequency neighboring cells and / or the number of inter-frequency neighboring cells;

[0160] When the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is not in the activated TCI state list, the value of the first factor is the number of the first neighboring cells multiplied by 3, where the first number of neighboring cells includes the number of same-frequency neighboring cells and / or the number of inter-frequency neighboring cells that do not require a measurement interval;

[0161] When the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is in the activated TCI state list, the value of the first factor is the second number of neighboring cells multiplied by 3, where the second number of neighboring cells is the number of neighboring cells in the activated TCI state list.

[0162] In some embodiments, the number of frequency points is determined by at least one of the following methods:

[0163] The number of frequency points includes the number of same frequency points and / or the number of different frequency points;

[0164] The value of the frequency point number is the sum of the same frequency number and the different frequency number;

[0165] The number of frequency points includes the number of same frequencies and / or the number of different frequencies that do not require measurement intervals;

[0166] The value of the number of frequency points is the sum of the number of same-frequency points used for L1 measurement and the number of different-frequency points used for L1 measurement that do not require measurement intervals.

[0167] In some embodiments, the period of the L1 measurement is determined by at least one of the following methods:

[0168] The L1 measurement period includes at least the neighboring cell SSB period × the number of frequency points;

[0169] The L1 measurement period includes at least max (neighboring cell SSB period, DRX cycle length) × number of frequency points;

[0170] The L1 measurement period includes at least the DRX cycle length × the number of frequency points;

[0171] The period of the L1 measurement includes at least the first factor×N, where N=8;

[0172] The L1 measurement period includes at least the first factor × N × the period of the neighboring cell SSB, where N = 8;

[0173] The L1 measurement period includes at least the first factor×N×max(neighboring cell SSB period, DRX cycle length), where N=8;

[0174] The L1 measurement period includes at least the first sub×N×DRX cycle length, where N=8.

[0175] Those skilled in the art will appreciate that the functions implemented by each unit in the measurement device shown in FIG7 can be understood with reference to the relevant description of the aforementioned method. The functions of each unit in the measurement device shown in FIG7 can be implemented by a program running on a processor or by a specific logic circuit.

[0176] Figure 8 is a schematic structural diagram of a communication device 800 provided in an embodiment of the present application. The communication device may be a terminal, and the communication device 800 shown in Figure 8 includes a processor 810, which can call and run a computer program from a memory to implement the method in the embodiment of the present application.

[0177] Optionally, as shown in Figure 8, the communication device 800 may further include a memory 820. The processor 810 may call and execute a computer program from the memory 820 to implement the method in the embodiment of the present application.

[0178] The memory 820 may be a separate device independent of the processor 810 , or may be integrated into the processor 810 .

[0179] Optionally, as shown in FIG8 , the communication device 800 may further include a transceiver 830 , and the processor 810 may control the transceiver 830 to communicate with other devices, specifically, to send information or data to other devices, or to receive information or data sent by other devices.

[0180] The transceiver 830 may include a transmitter and a receiver. The transceiver 830 may further include an antenna, and the number of antennas may be one or more.

[0181] The communication device 800 may specifically be a terminal in an embodiment of the present application, and the communication device 800 may implement the corresponding processes implemented by the terminal in each method in the embodiment of the present application, which will not be described in detail here for the sake of brevity.

[0182] Figure 9 is a schematic structural diagram of a chip according to an embodiment of the present application. The chip 900 shown in Figure 9 includes a processor 910, which can call and run a computer program from a memory to implement the method according to the embodiment of the present application.

[0183] Optionally, as shown in FIG9 , the chip 900 may further include a memory 920 , wherein the processor 910 may call and execute a computer program from the memory 920 to implement the method in the embodiment of the present application.

[0184] The memory 920 may be a separate device independent of the processor 910 , or may be integrated into the processor 910 .

[0185] Optionally, the chip 900 may further include an input interface 930. The processor 910 may control the input interface 930 to communicate with other devices or chips, and specifically, may obtain information or data sent by other devices or chips.

[0186] Optionally, the chip 900 may further include an output interface 940. The processor 910 may control the output interface 940 to communicate with other devices or chips, and specifically, may output information or data to other devices or chips.

[0187] The chip can be applied to the terminal in the embodiment of the present application, and the chip can implement the corresponding processes implemented by the terminal in each method of the embodiment of the present application. For the sake of brevity, it will not be repeated here.

[0188] It should be understood that the chip mentioned in the embodiments of the present application can also be called a system-level chip, a system chip, a chip system or a system-on-chip chip, etc.

[0189] It should be understood that the processor of the embodiments of the present application may be an integrated circuit chip with signal processing capabilities. During implementation, each step of the above method embodiment can be completed by hardware integrated logic circuits in the processor or software instructions. The above processor can be a general-purpose processor, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. The various methods, steps, and logic block diagrams disclosed in the embodiments of the present application can be implemented or executed. The general-purpose processor can be a microprocessor or any conventional processor. The steps of the method disclosed in the embodiments of the present application can be directly embodied as being executed by a hardware decoding processor, or can be executed by a combination of hardware and software modules in the decoding processor. The software module can be located in a storage medium mature in the art, such as random access memory, flash memory, read-only memory, programmable read-only memory, electrically erasable programmable memory, registers, etc. The storage medium is located in the memory, and the processor reads the information in the memory and completes the steps of the above method in combination with its hardware.

[0190] It is understood that the memory in the embodiments of the present application may be a volatile memory or a non-volatile memory, or may include both volatile and non-volatile memories. Among them, the non-volatile memory may be a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), or a flash memory. The volatile memory may be a random access memory (RAM), which is used as an external cache. By way of example and not limitation, many forms of RAM are available, such as static random access memory (SRAM), dynamic random access memory (DRAM), synchronous dynamic random access memory (SDRAM), double data rate synchronous dynamic random access memory (DDR SDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchronous link dynamic random access memory (SLDRAM), and direct RAM bus random access memory (DR RAM). It should be noted that the memory of the systems and methods described herein is intended to include, but is not limited to, these and any other suitable types of memory.

[0191] It should be understood that the above-mentioned memories are exemplary but not restrictive. For example, the memories in the embodiments of the present application may also be static random access memory (SRAM), dynamic random access memory (DRAM), synchronous dynamic random access memory (SDRAM), double data rate synchronous dynamic random access memory (DDR SDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchronous link dynamic random access memory (SLDRAM), and direct RAM RAM (DR RAM), etc. In other words, the memories in the embodiments of the present application are intended to include, but are not limited to, these and any other suitable types of memories.

[0192] The present application also provides a computer-readable storage medium for storing a computer program. This computer-readable storage medium can be applied to a terminal in the present application, and the computer program causes a computer to execute the corresponding processes implemented by the terminal in each method of the present application. For the sake of brevity, these are not further described here.

[0193] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in the present application should be included in the scope of protection of the present application. Therefore, the scope of protection of the present application should be based on the scope of protection of the claims.

Claims

1. A measurement method, the method comprising: The terminal performs layer 1 (L1) measurement, and the measurement delay of the L1 measurement is related to a first factor and / or the number of frequency points; And / or, The terminal performs measurement by a first method or a second method, and the measurement includes L1 measurement and / or layer 3 (L3) measurement; wherein, corresponding to the first method, the measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and a second factor, and / or the measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and a third factor; corresponding to the second method, the measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement, and / or the measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement.

2. The method according to claim 1, wherein The measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and a second factor, specifically: The measurement delay of the L1 measurement is determined based on a first value and the second factor, wherein the first value is determined based on the number of cells of the L1 measurement; or, The measurement delay of the L1 measurement is determined based on a second value, wherein the second value is determined based on the number of cells of the L1 measurement and the second factor.

3. The method according to claim 1, wherein The measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and a third factor, specifically: The measurement delay of the L3 measurement is determined based on a first value and the third factor, wherein the first value is determined based on the number of cells of the L1 measurement; or, The measurement delay of the L3 measurement is determined based on a third value, wherein the third value is determined based on the number of cells of the L1 measurement and the third factor.

4. The method according to any one of claims 1 to 3, wherein, The method further comprises: The terminal receives first information sent by a network device, and the first information is used to configure the allocation ratio between the measurement resources of the L1 measurement and the measurement resources of the L3 measurement; The terminal determines the second factor and / or the third factor based on the allocation ratio.

5. The method according to any one of claims 1 to 3, wherein, The method further comprises: The terminal receives second information sent by a network device, and the second information is used to configure the second factor and / or the third factor.

6. The method according to claim 1, wherein The measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement, specifically: The measurement delay of the L1 measurement is determined based on a third value, wherein the third value is determined based on the number of cells of the L1 measurement and the number of frequency points of the L3 measurement.

7. The method according to claim 1, wherein The measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement, specifically: The measurement delay of the L3 measurement is determined based on a third value, wherein the third value is determined based on the number of cells of the L1 measurement and the number of frequency points of the L3 measurement.

8. The method according to claim 2 or 6, wherein, The measurement delay of the L1 measurement is further determined based on a first duration, and the first duration is related to the period of a reference signal.

9. The method according to claim 3 or 7, wherein, The measurement delay of the L3 measurement is further determined based on a second duration, and the second duration is related to the period of a measurement window of a reference signal.

10. The method according to any one of claims 1 to 3, wherein, The method further comprises: The terminal receives third information sent by a network device, where the third information is used to instruct the terminal to perform the measurement in the first manner or in the second manner.

11. The method according to claim 1, wherein, The value of the first factor is determined by at least one of the following methods: If the synchronization signal blocks (SSBs) of the serving cell and the neighboring cell overlap or are adjacent, the value of the first factor is 2; If the transmission configuration indication (TCI) state of the neighboring cell is not in the active TCI state list, the value of the first factor is the number of neighboring cells multiplied by 3; If the TCI state of the neighboring cell is in the active TCI state list, the value of the first factor is the number of neighboring cells with the TCI state in the active TCI state list multiplied by 3.

12. The method according to claim 1, wherein The value of the first factor is determined by at least one of the following methods: When the number of neighboring cells is 1, if the SSBs of the serving cell and the neighboring cell overlap or are adjacent, the value of the first factor is 2; When the number of neighboring cells is 1, if the SSBs of the serving cell and the neighboring cell overlap or are adjacent in the time domain, the value of the first factor is 2; When the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is not in the active TCI state list, the value of the first factor is the first number of neighboring cells multiplied by 3, where the first number of neighboring cells includes the number of co-frequency neighboring cells and / or the number of inter-frequency neighboring cells; When the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is not in the active TCI state list, the value of the first factor is the first number of neighboring cells multiplied by 3, where the first number of neighboring cells includes the number of co-frequency neighboring cells and / or the number of inter-frequency neighboring cells that do not require a measurement gap; When the number of neighboring cells is greater than 1, if the TCI state of the neighboring cell is in the active TCI state list, the value of the first factor is the second number of neighboring cells multiplied by 3, where the second number of neighboring cells is the number of neighboring cells with the TCI state in the active TCI state list.

13. The method according to claim 1, wherein The number of frequency points is determined by at least one of the following methods: The number of frequency points includes the number of co-frequency points and / or the number of inter-frequency points; The value of the number of frequency points is the sum of the number of co-frequency points and the number of inter-frequency points; The number of frequency points includes the number of co-frequency points and / or the number of inter-frequency points that do not require a measurement gap; The value of the number of frequency points is the sum of the number of co-frequency points used for L1 measurement and the number of inter-frequency points that do not require a measurement gap used for L1 measurement.

14. The method according to any one of claims 1, 11 to 13, wherein The period of the L1 measurement is determined by at least one of the following methods: The period of the L1 measurement at least includes the neighbor SSB period × the number of frequency points; The period of the L1 measurement at least includes max(neighbor SSB period, DRX cycle length) × the number of frequency points; The period of the L1 measurement at least includes the DRX cycle length × the number of frequency points; The period of the L1 measurement at least includes the first factor × N, where N = 8; The period of the L1 measurement at least includes the first factor × N × the neighbor SSB period, where N = 8; The period of the L1 measurement at least includes the first factor × N × max(neighbor SSB period, DRX cycle length), where N = 8; The period of the L1 measurement includes at least the first factor × N × DRX cycle length, where N = 8.

15. A measurement device, applied to a terminal, the device comprising: a measurement unit configured to perform an L1 measurement, the measurement delay of the L1 measurement being related to a first factor and / or the number of frequency points; and / or, performing measurements in a first manner or a second manner, the measurements including L1 measurements and / or L3 measurements; wherein, corresponding to the first manner, the measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and a second factor, and / or the measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and a third factor; corresponding to the second manner, the measurement delay of the L1 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement, and / or the measurement delay of the L3 measurement is related to the number of cells of the L1 measurement and the number of frequency points of the L3 measurement.

16. A terminal, comprising: a processor and a memory, the memory configured to store a computer program, the processor configured to call and run the computer program stored in the memory to execute the method according to any one of claims 1 to 14.

17. A chip, comprising: a processor, configured to call and run a computer program from a memory, such that a device installed with the chip executes the method according to any one of claims 1 to 14.

18. A computer-readable storage medium, configured to store a computer program, the computer program causing a computer to execute the method according to any one of claims 1 to 14.

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