Integrated workstations for testing electrochemical cells

Abstract

Testing apparatuses configured to test electrochemical cells that each have a core-stacking axis. In some embodiments, such a testing apparatus includes: a test-assembly support plate configured to support one or more cells during testing so that each core stacking axis is parallel to a pressure- application axis; a pressing assembly that includes an upper pressing plate and a lower pressing plate spaced from the upper pressing plate along the pressure-application axis; and a pressing-assembly drive mechanism that is fixed relative to the test-assembly support plate and is operatively coupled to the upper pressing plate so that, when the pressing-assembly drive mechanism is operated, the pressing-assembly drive mechanism drives the pressing assembly along the pressure-application axis. Also disclosed are more complex embodiments, including embodiments switchable between constant-pressure and constant-spacing testing modes, workstations that include such test apparatuses, and methods of using such test apparatuses.

Description

INTEGRATED WORKSTATIONS FOR TESTING ELECTROCHEMICAL CELLSRELATED APPLICATION DATA

[0001] This application claims the benefit of priority of U.S. Provisional Patent Application Serial No. 63 / 616,948, filed on January 2, 2024, and titled “INTEGRATED WORKSTATIONS FOR TESTING ELECTROCHEMICAL CELLS”, which is incorporated by reference herein in its entirety.FIELD

[0002] The present disclosure generally relates to the field of testing battery cells. In particular, the present disclosure is directed to integrated workstations for testing electrochemical cells.BACKGROUND

[0003] In current technology for testing lithium-metal pouch-type battery cells, there are two testing protocols, one that uses a constant-pressure fixture 10 (see FIG. 1) and one that uses a constant-spacing fixture 20 (see FIG. 2). When using a constant-pressure fixture, such as the constant-pressure fixture 10 of FIG. 1, a pouch cell 12 and foam 14 is placed between upper and lower plates 10U and 10L of the fixture, and then four springs 10SP (three labeled) are installed and adjusted so that the spring height meets the required pressure by tightening screws 10SC (three labeled) on the fixture according to the pressure requirements for the testing. The upper and lower plates 10U and 10L will automatically adjust the distance through the springs 10SP, keeping the pressure of the cell 12 in a basically fixed state. By using a displacement sensor (not seen), the size of the expansion and contraction of the cell is detected using testing circuitry 16.

[0004] When using a constant-pressure fixture, such as the constant-pressure fixtures 10 of FIG. 1, the cell 12 expands or contracts during the testing process of charging and discharging. When using a constant-spacing fixture, such as the constant-spacing fixture 20 of FIG. 2, a pouch cell 22 and foam 24 between upper and lower plates 20U and 20L and screws 20SC are tightened according to pressure or spacing requirements for the testing. When using a constant- spacing fixture, such as the constant-spacing fixture 20 of FIG. 2, the spacing between the upper and lower plates 20U and 20L is constant during the testing process. When the cell 22 expands or contracts, the pressure on the cell will change. In the example shown in FIG. 2, one or more pressure sensors (not seen) are in operative communication with testing circuitry 26.

[0005] Whether using a constant-pressure fixture, such as the constant-pressure fixture 10 of FIG. 1, or a constant-spacing fixture, such as the constant-spacing fixture of FIG. 2, after a pouch cell (e.g., cell 12 and cell 22 of FIGS. 1 and 2, respectively) has been installed, the fixture is placed into an environmental-control enclosure 30 (see FIG. 3) to control the temperature during testing. This allows for controlling the temperature according to the testing protocol and for monitoring the temperature of the pouch cell during testing.

[0006] Drawbacks of conventional pouch-cell testing using the above-described fixtures and environmental-control chamber include:1. The fixture-installation process is quite complicated, requiring manual tightening of bolts multiple times to meet the experimental set pressure requirements.2. Due to manual installation of fixtures, it cannot be guaranteed that each installation status is completely the same.3. After a fixture is placed into the environmental-control chamber, temperature-sensor wires, pressure-sensor wires, and displacement-sensor wires need to be connected, which is a tedious process.4. During the testing, there is no way to adjust and control the gap between the upper and lower plates or to adjust the pressure on the pouch cell.5. In the closed environmental-control chamber, after the temperature in the chamber reaches the desired set temperature, the pouch cell needs to be left for a period of time to reach required temperature by achieving thermal equilibrium with the interior of the chamber.SUMMARY OF THE DISCLOSURE

[0007] In one implementation, the present disclosure is directed to a testing apparatus configured to test an electrochemical cell having a core-stacking axis. The testing apparatus includes a pressure-application axis; a test-assembly support plate designed and configured to support the electrochemical cell during testing so that the core-stacking axis is parallel to the pressure-application axis; a pressing assembly that includes: an upper pressing plate; and a lower pressing plate that is spaced from the upper pressing plate along the pressure-application axis; and a pressing-assembly drive mechanism that is fixed relative to the test-assembly support plate and is operatively coupled to the upper pressing plate so that, when the pressing-assembly drive mechanism is operated, the pressing-assembly drive mechanism drives the pressing assembly along the pressureapplication axis.

[0008] In another implementation, the present disclosure is directed to an integrated workstation, which includes the testing apparatus described directly above; and an environmental control enclosure containing the testing apparatus.

[0009] In yet another implementation, the present disclosure is directed to a testing apparatus configured to test an electrochemical cell. The testing apparatus includes a pressing assembly that includes upper and lower pressing plates spaced apart from one another by at least one spring provided to allow the testing apparatus to operate in a constant-pressure testing mode; wherein a pressing-assembly drive mechanism is operatively coupled to the upper pressing plate so as to drive the pressing assembly during operation.

[0010] In still another implementation, the present disclosure is directed to a testing apparatus configured to test an electrochemical cell. The testing apparatus includes a pressure-application axis along which the testing apparatus applies pressure to the electrochemical cell during testing; a moveable lower-support assembly supporting the electrochemical cell during testing, wherein the moveable lower-support assembly is drivable by an actuator to move the electrochemical cell in a direction perpendicular to the pressure-application axis to allow the electrochemical cell to be loaded into and removed from the testing apparatus before and after the moveable lower-support assembly moves the electrochemical cell into a testing position.

[0011] In another implementation, the present disclosure is directed to a testing apparatus configured to test an electrochemical cell. The testing apparatus includes a testing-apparatus base plate; a floating test-assembly support plate for supporting a test assembly containing the electrochemical cell during testing; a pressing assembly for applying force to the electrochemical cell and the floating test-assembly support plate during testing; and at least one load cell operatively located between the floating test-assembly support plate and the testing-apparatus base plate so as to sense the force applied to the electrochemical cell during the testing.

[0012] In yet another implementation, the present disclosure is directed to a testing workstation, which includes the testing apparatus described immediately above; and an environmental-control enclosure containing the testing apparatus.BRIEF DESCRIPTION OF THE DRAWINGS

[0013] For the purpose of illustration, the accompanying drawings show aspects of one or more embodiments of the disclosure. However, it should be understood that the scope of this disclosure is / are not limited to the precise arrangements and instrumentalities shown in the drawings, wherein:

[0014] FIG. 1 is a diagram of a conventional pouch-cell testing system that includes a constantpressure fixture and a pressure-distribution sensor;

[0015] FIG. 2 is a diagram of a conventional pouch-cell testing system that includes a constantspacing fixture and a pressure-distribution sensor;

[0016] FIG. 3 is a perspective view of a conventional environmental-control chamber with which the conventional pouch-cell testing systems of FIGS. 1 and 2 are used;

[0017] FIG. 4 is a top perspective view of an example integrated workstation made in accordance with aspects of the present disclosure;

[0018] FIG. 5 is a partial diagrammatic view and partial enlarged top-front perspective view of a testing apparatus internal to the integrated workstation of FIG. 4 and a testing controller in operative communication with the testing apparatus;

[0019] FIG. 5A is an enlarged isolated view of components relating to the lower sliding plate of the testing apparatus, as isolated from region A of FIG. 5;

[0020] FIG. 6 is a front elevational view of the testing apparatus of FIG. 5;

[0021] FIG. 7 is a top-rear perspective view of the testing apparatus of FIG. 5;

[0022] FIG. 8 is a rear elevational view of the testing apparatus of FIG. 5; and

[0023] FIG. 9 is a further enlarged left-side perspective view of the testing apparatus of FIG. 5.DETAILED DESCRIPTION

[0024] The entire contents of the appended claims are incorporated into this Detailed Description section as if originally presented herein.

[0025] Referring again to the drawings, FIG. 4 is an external view of the overall example workstation 400 showing the workstation as including an environmental-control enclosure 404 that defines an interior chamber 408, with a testing apparatus 412 located substantially within the enclosure. In this example, the testing apparatus 412 is considered “located substantially within” the enclosure 404 because the enclosure, in total, is defined by an upper housing 416 composed of foursidewalls 420 (only two visible in the view shown) and a top wall 424, with the bottom of the enclosure being a base 428 of the testing apparatus. In this example, the base 428 includes an optional pair of handles 428H on opposing sides of the workstation 400 to allow one or more users to readily move the workstation.

[0026] FIGS. 5 through 9 show various views of the testing apparatus 412 contained within the chamber 408 of the environmental-control enclosure 404 (FIG. 4). In FIGS. 5 through 9, the following element numerals are used to denote the corresponding components of the testing apparatus 412. For convenience, the leading digit of each element identifier corresponds to the one of FIGS. 5 through 9 in which the corresponding element is first labeled. In the case of FIG. 5A, each element identifier for FIG. 5A includes an “A” following the leading digit.5A00 - Cell. The device under test. In an example, the cell 5A00 is a pouch-type lithium-metal electrochemical cell. In other embodiments, the cell 5A00 may be another type of cell, and / or more than one cell may be present.5A04 - Cell Positioning Plate. Support for the cell 5A00 that is moveable along a positioningplate-movement axis (PPMA) to allow for easy loading and positioning of the cell within the environmental-control enclosure 404 (FIG. 4).5A08 - Lower Cooling Plate. A plate or similar structure that engages the bottom face (not seen) of the cell 5A00 for controlling the temperature of the cell during testing. The lower cooling plate 5A08 may be, for example, a liquid-cooled plate or a thermoelectrically cooled plate that operates based on the Peltier effect, or a combination of the two, among other types. It is noted that the lower cooling plate 5A08 may also optionally provide heat in addition to cooling, for example, using one or more electrical resistance heaters or other type of heat source known in the art.600 - Upper Cooling Plate. A plate or similar structure that engages the top face (not seen) of the cell 5A00 for controlling the temperature of the cell during testing. The upper cooling plate 600 may be, for example, a liquid-cooled plate or a thermoelectrically cooled plate that operates based on the Peltier effect, or a combination of the two, among other types. It is noted that the upper cooling plate 600 may also optionally provide heat in addition to cooling, for example using one or more electrical resistance heaters or other type of heat source known in the art.02 - Thermal Insulation Board (one for each upper and lower water-cooling plate 600, 5A08). Thermal insulation for inhibiting heat from transferring between the testing region and each of a lower pressing plate 528 and a base plate 536. Al 6 -Working-Fluid Pipe Joints (multiple). When the upper and lower cooling plates 600 and 5A08, respectively, are of the working-fluid type, the working-fluid pipe joints 5 Al 6 are part of a working-fluid-delivery system that delivers working fluid to the upper and lower cooling plates. When the upper and lower cooling plates 600 and 5A08 are of the thermoelectric type, relevant ones of the working-fluid pipe joints 5 Al 6 may be replaced for suitable electrical connections. A20 -Temperature Sensor (one or more). Temperature sensor(s) for sensing the temperature of the lower cooling plate 5A08. When the temperature of the cell 5A00 is in equilibrium with the temperature of the lower cooling plate 5A08, these temperature sensors 5A20 provide an indirect measurement of the temperature of the cell. In other embodiments, these temperature sensors 5A20 may be augmented or replaced by one or more temperature sensors (not shown) in one or more other locations. A24 - Slider Plate. Plate that supports the lower cooling plate 5A08 during cell testing and carries the lower cooling plate and the cell 5A00 during positioning of the cell along the positioning-plate-movement axis PPMA. A28 - Slide Rails (2 pieces). Rails secured to a test-assembly support plate 532 that allow movement of a moveable lower-support assembly 5A30 (generally, a combination of the slider plate 5A24 + the lower cooling plate 5A08 + the cell positioning plate 5A04) along the positioning-plate-movement axis PPMA. A32 - Sliders (2 pieces). Structures that ride, respectively, on the slide rails 5A28 as a lead- screw stepper motor 700 moves the moveable lower-support assembly 5A30 along the positioning-plate-movement axis PPMA. The sliders 5A32 and the slide rails 5A28 are suitably designed to withstand at least the maximum force that the testing apparatus 412 can apply to the cell during testing. 00 - Lead-screw Stepper Motor. Motor that moves the moveable lower-support assembly 5A30 along the positioning-plate-movement axis PPMA by turning a lead screw (not labeled) of the stepper motor. In other embodiments, each of the lead screw and stepper motor 700 can be replaced by other types of mechanisms. For example, the lead screw can be replaced by a mechanical-transmission-type mechanism and the stepper motor 700 can be replaced by a servo motor. In other embodiments, both the lead screw and steppermotor 700 can be replaced by another type of mechanism, such as a piston-type linear actuator, among others. In general, the mechanism that drives the moveable lower- support assembly 5A30, which includes the cell-positioning plate 5A04, is also referred to herein and in the appended claims as the “positioning-plate drive system. 04 - Motor Mounting Bracket. Structure for fixedly securing the stepper motor 700 to the testassembly support plate 532. 08 - Motor Shaft Sleeve. Sleeve through which the shaft of the stepper motor 700 passes through. The motor shaft sleeve 708 mainly serves to support the motor shaft, enabling it to maintain a stable state during rotation, reduce vibration, and thereby improve the working efficiency of the stepper motor 700. The motor shaft sleeve 708 also can protect the surface of the motor shaft, avoid surface wear and damage caused by contact, friction, and other things, and protect the performance and lifespan of the motor. During the rotation of the motor shaft, the motor shaft sleeve 708 can serve as a friction-and-noise- reduction device, reducing friction between the motor shaft and bearings, reducing noise generation, and also reducing energy consumption of the stepper motor 700. 12 - Connection Block. Structure for connecting the motor shaft (not shown) to the lead screw (not shown) and to support the connection between these two components. 04 - Tank Chain. Link-type structure for holding and managing electrical wires / cables and working-fluid conduit(s) during movement of the moveable lower-support assembly 5A30 along the positioning-plate-movement axis PPMA. In other embodiments, the tank chain 604 can be replaced with another support structure that provides the same or similar moveability function or may be eliminated if the wires, cables, and / or conduits have configurations not requiring such a support structure. A36 - Anti-collision Blocks (2 pieces). Structures for preventing the moveable lower-support assembly 5A30 from moving beyond its travel limit in a direction away from the lead- screw stepper motor 700. A40 - Photoelectric Sensor Mounting Base. Structure for mounting photoelectric sensors 5A44 to the test-assembly support plate 532. A44 - Photoelectric Sensors and Connectors (3 pieces). Sensors for determining the position of the moveable lower-support assembly 5A30 along the positioning-plate-movement axis PPMA during cell-loading and cell-positioning operations. 08 - Trip Plate. Structure that, when it is moved between the photoelectric sensors 5A44, trips the photoelectric sensors so as to cause the cell-positioning plate 5A04 to stop.- Insulation Board and Conductive Copper Electrode. Components of the testing apparatus 412 involved in the charging and discharging of the cell 5A00 during testing. - Servo Motor. Electrical motor for driving upper and lower pressing plates 524 and 528 during testing operations. In other embodiments, the servo motor 500 can be replaced by a stepper motor or other actuator(s), such as one or more hydraulic pistons, among others. - Reducer. Transmission for reducing the speed and increase the output torque of the output shaft of the servo motor 500 to desired speed and torque values for driving a pressing lead screw 612 that drives a pressing assembly 506 (generally, the combination of the upper and pressing plates 524 and 528). The torque output of the reducer 504 is based on the output of the servo motor 500 multiplied by the reduction ratio of the reducer. In the present embodiment, the reduction ratio is 20, but in other embodiments the reduction ratio can be different (e.g., 10, 15, 30, etc.) to meet the relevant parameters, such as the output of the servo motor 500, the pitch of the threads on the pressing lead screw 612, and the maximum load that the pressing assembly 506 is designed to apply to the cell 5A00. In other embodiments, the reducer 504 may have a side-exiting output linked to a horizonal drive shaft. - Reducer Mounting Bracket. Structure for fixing the reducer 504 to the top plate 520. - Timing Pulley. Pulley for turning the pressing lead screw 612 that drives the movement of the pressing assembly 506. In other embodiments, the timing pulley 512 can be replaced by another mechanism, such as a direction-changing gear box having a side input connected to a horizonal drive shaft from the reducer and a bottom output connected to the pressing lead screw 612. - Toothed Belt. Means for transferring rotational movement of the output shaft of the servo motor 500 to the timing pulley 512. In other embodiments, the toothed belt 516 can be replaced by another means, such as a drive chain or a horizonal transfer shaft, among others. - Pressing Lead Screw. Screw ultimately driven by the servo motor 500 via the reducer 504 and timing pulley 512 that moves the pressing assembly 506 that includes the upper and lower pressing plates 524 and 528 along a pressure-application axis PAA. In other embodiments, the pressing lead screw 612 can be replaced by one or more hydraulic pistons, among other mechanisms. As those skilled in the art will appreciate, when each cell 5A00 that the testing apparatus 412 is of the pouch type, the pressure-application axis PAA is parallel to the stacking direction, i.e., stacking axis, of the core of the cell.That is, the stacking axis is perpendicular to the major planes of the anode, cathode, separator, etc., layers that form the core of the cell. - Adjustment block (2 pieces). Structures fixed to a top plate 520 that provides for adjusting the tension in the toothed belt 516 by way of horizontal adjusting screws (not separately labeled) that engage the reducer mounting bracket 508, which is mounted to the top plate 520 via slot holes, and can move the reducer 504 away from and toward the timing pulley 512. - Pulley Base Plate. Plate for securing the timing pulley 512 to the top plate 520. - Nut. Structure having internal threads that threadingly engages the external threads of the pressing lead screw 612. The nut 624 is fixedly secured to a load-bearing shaft 628. - Load-bearing Shaft. Support structure that holds the nut 624 fixed relative to the upper pressing plate 524 of the pressing assembly 506. - Top Plate. The structure that supports, among other things, the stepper motor 700, the reducer 504, and the timing pulley 512, and is held in fixed position relative to a workstation base plate 536 by four guide columns 632. - Upper Pressing Plate. Structure of the pressing assembly 506 that is directly driven by a pressing-assembly drive mechanism 526, here a combination of the pressing lead screw 612 and servo motor 500 and functionally related component. In other embodiments, the pressing-assembly drive mechanism 526 could include, for example, one or more hydraulic pistons, among other things. The upper pressing plate 528 is movable relative to the top plate 520 and the workstation base plate 536 along the four guide columns 632. - Lower Pressing Plate. The structure of the pressing assembly 506 that, during testing, applies a load to the cell 5A00 within a cell-testing region (not labeled) of the integrated workstation 400 (FIG. 4). The lower pressing plate 528 is spaced from the upper pressing plate 524 by a set of springs 540, which are used to maintain the upper and lower pressing plates in balanced parallel relation with one another and to allow the integrated workstation 400 (FIG. 4) to perform constant-pressure testing. The lower pressing plate 528 is movable relative to the top plate 520 and the workstation base plate 536 along the four guide columns 632 and can be moveable relative to the upper pressing plate 524 or fixed relative to the upper pressing plate depending on whether or not the integrated workstation 400 (FIG. 4) is in a constant-pressure testing mode (wherein the lower pressing plate is moveable relative to the upper pressing plate) or aconstant-spacing testing mode (wherein the lower pressing plate is fixed relative to the upper pressing plate). - Plate-Locking Mechanism. Mechanism that, when engaged, allows the upper and lower pressing plates 524 and 528 to be locked together for the constant-spacing testing mode. In this example, the locking mechanism includes four threaded rods and four corresponding threaded nuts. During the constant- spacing testing mode, locking the upper and lower pressing plates 524 and 528 together with the plate-locking mechanism 802 so that they move in unison with one another as the servo motor 500 drives the pressing lead screw 612 and remove the springs 540 from the load path from the top plate 520 and the workstation base plate 536. Consequently, once the servo motor 500 is controlled to set the spacing between the lower pressing plate 528 and the test-assembly support plate 532, that spacing remains constant during charging and discharging of the cell 5A00 so as to provide the constant-spacing testing mode. Conversely, when the plate-locking mechanisms 802 are not engaged, the lower pressing plate 528 is free to move relative to the upper pressing plate 524 against the compliance of the springs 540 during the constant-pressure testing mode. As used herein and in the appended claims, the term “selectively moveable / fixable” denotes that the state of the lower pressing plate 528 and the upper pressing plate 524 is switchable between a moveable state in which the lower pressing plate is moveable relative to the upper pressing plate and a fixed state in which the lower pressing plate is fixed, or locked, relative to the upper pressing plate. While the plate-locking mechanism 802 is shown as including four rods and nuts, in other embodiments the plate-locking mechanism can include any suitable structure(s) that provide the locking functionality, can withstand the forces that are generated during constant-spacing testing, and be selectively engaged and disengaged to allow switching between the constant-pressure testing mode and the constant-spacing testing mode. - Test-assembly Support Plate. The structure that supports the moveable lower-support assembly 5A30. The test-assembly support plate 532 is generally free-floating, but substantially fixed, relative to the workstation base plate 536 and is supported, in this example, by one or more pressure sensors 636 so that the pressure sensor(s) can sense loads applied to the cell 5A00 by the pressing assembly 506. - Workstation Base Plate. A plate that supports the internal components of the integrated workstation 400 (FIG. 4) and the upper housing 416 of the integrated workstation.- Guide Columns (4 pieces). Structures serving trifold purposes of fixing the top plate 520 to the workstation base plate 536, guiding the upper and lower pressing plates 524 and 528 as the pressing-assembly drive mechanism 526 drives the pressing assembly 506 along the pressure-application axis PAA, and allowing the test-assembly support plate 532 to float in a direction parallel to the pressure-application axis PAA so that the pressure sensor(s) 636 sense(s) loads that the pressing assembly applies to the cell 5A00 along the pressure-application axis PAA during pressing operations. In other embodiments, a different number of guide columns 632 can be provided, such as 2 or 3 or 5 or more. - Linear Bearing (8 pieces). Each linear bearing 716 conformally and slidingly engages a corresponding one of the guide columns 632. Each of the upper and lower pressing plates 524 and 528 has four linear bearings 716 to allow that plate to move down and up relative to the workstation base plate 536 and the top plate 520. - Linear Bearing (4 pieces). Each linear bearing 720 conformally and slidingly engages a corresponding one of the guide columns 632. - Spring (4 pieces). The springs 540 hold the upper and lower pressing plates 524 and 528 in balanced parallel relation to one another and allow the integrated workstation 400 (FIG. 4) to operate in a constant-pressure cell-testing mode. In other embodiments, a different number of springs 540 can be provided. In addition, the springs 540 need not be located so as to surround corresponding ones of the guide columns 632. - Pressure Sensor(s) (e.g., a load cell). Pressure sensor(s) that allow(s) the integrated apparatus to measure and / or monitor loads, and therefore pressures, that the pressing assembly 506 applies to the cell 5A00 during testing. In other embodiments, the pressure sensor(s) may be replaced by one or more pressure sensors other than a load cell. - Spring Buffer. Structures provided for buffering the engagement of the lower pressing plate 528 with parts below the lower pressing plate as the pressing plate is moved downward to avoid an impulsive impact between the lower pressing plate and the parts below. - Hexagonal Nut (16 pieces). Each of the guide columns 632 is “double nutted” (1 loading nut + one locking nut) with two hexagonal nuts 728 at each end to fixedly secure the workstation base plate 536 and the top plate 520 to one another. In other embodiments, other fastening means known in the art can be used.640 - Groove Joint Mounting Bracket. Structure secured to the workstation base plate 536 and the top plate 520 that provides a bracket for receiving and fixedly holding a photoelectric sensor 544 for sensing the position of the upper pressing plate 524.544 - Photoelectric Sensor and Connector. Works in conjunction with a trip piece 548 to provide input for determining that the upper pressing plate 524 is moving within a specified range of vertical movement.548 - Trip Piece. Component sensed by a photoelectric sensor to determine that the upper pressing plate 524 is moving within a specified range of vertical movement.732 - Handle Rod (2 pieces). Structure fixedly attached to the workstation base plate 536 of the base (428) (FIG. 4) that provides a handle for one or more users to lift the integrated workstation 400 (FIG. 4).804 - Rubber Foot Pad (4 pieces). Structures affixed to the workstation base plate 536 for engaging a flat surface (e.g., a countertop, workbench top, table top, etc.) upon which the integrated workstation is deployed for use. In other embodiments, the rubber foot pads 804 can be eliminated, for example, if the workstation 400 (FIG. 4) is integrated into a fixed or rolling structure that engages a floor, among other possibilities.900 - Displacement Sensor. Sensor for measuring displacements between the lower pressing plate 528 and the test-assembly support plate 532 for measuring, among other things, space in which the cell 5A00 is constrained (e.g., in constant-spacing testing) and cell expansion and cell contraction (e.g., in constant-pressure testing).904 - Displacement Sensor Bracket. Structure that fixedly secures the displacement sensor 900 to the lower pressing plate 528.908 - Standard Height Block. Structure fixedly attached to the test-assembly support plate 532 that a plunger element of the displacement sensor 900 engages for measuring displacement. In other embodiments, the standard height block 908 can be configured differently or eliminated, depending on the type of displacement sensor 900 used.

[0027] It is noted that relative locational terms, such as “upper”, “lower”, and “top”, used above are relative to the relevant views shown in the accompanying drawings when viewed according to convention. For example, when the drawing sheet at issue is oriented conventionally, a component that is an “upper” component is located closer to the top of the drawing sheet than a similar component that is located closer to the bottom. Conversely, the “lower” component is located closer to the bottom of the drawing sheet than the upper component. Similarly, the “top” component is theone component out of multiple like components that is located closest to the top of the drawing sheet. That said, other embodiments may be in other orientations during use. For example, in an embodiment that is upside down relative to FIG. 5, the top plate 520 may become the bottom plate, and the upper and lower pressing plates 524 and 528 may become, respectively, the lower and upper pressing plates but still have the same functionalities as, respectively, the upper and lower pressing plates in FIG. 5 despite the name change. Similarly, the embodiment of FIG. 5 may be effectively laid on a side, with the top plate 520 becoming the right-most plate and the upper and lower pressing plates 524 and 528 becoming, respectively, right and left pressing plates but still have the same functionalities as, respectively, the upper and lower pressing plates in FIG. 5. Other orientations are possible, and correspondingly, other absolute locations are possible.

[0028] In addition to the testing apparatus, FIG. 5 illustrates an example testing controller 552 that is in operative communication with the testing apparatus 412. In this example, the testing controller 552 includes one or more microprocessors 556 for executing software containing algorithms (collectively, software / algorithms 560) for causing the testing apparatus 412 to perform any one or more operations, including operations for automating one or more tasks that the testing apparatus can perform. The software / algorithms 560 are stored in machine memory 564, which singly and collectively represents any one or more hardware memories known and ubiquitous in the computing arts, including any one or more long-term memories and / or short-term memories. According to convention, the machine memory 564 is singly and collectively referred to as a “machine-readable storage medium”, which explicitly excludes information present on a carrier wave (e.g., a digital signal encoded into a carrier wave) or in a series of pulses (e.g., light pulses carrying digital data).

[0029] In this example, control-interface electronics 568 are illustrated as being partially internal to the testing controller 552 and partially external to the testing controller. As those skilled in the art will appreciate, the control-interface electronics 568 include any and / or all electronics needed for the testing controller 552 to interface with instrumentation (e.g., sensor(s)), actuator(s) (e.g., motor(s)), and / or any associated component(s) of an actuator (e.g., hydraulic valve, motor controller, etc.) of the testing apparatus 412. Examples of control-interface electronics 568 include, but are not limited to, digital-to-analog converters, analog-to-digital converters, signal conditioners, amplifiers, and transformers, among others, and any necessary combination thereof. Those skilled in the art will readily appreciate the type(s) of control-interface electronics 568 needed for a particular deployment knowing the relevant instrumentation, actuator(s), and any associated components usedto make the testing apparatus 412 at issue. While the control-interface electronics 568 are illustrated as being partially internal and partially external to the testing controller 552, those skilled in the art will readily understand that all of the control-interface electronics may be exclusively internal to the testing controller or exclusively external to the testing controller, depending on the design of the testing system.

[0030] Examples of the algorithms encoded into the software 560 include but are not limited to automatically applying and holding a desired constant test pressure in response to a corresponding signal, automatically setting and holding a desired fixed spacing in response to a corresponding signal, automatedly moving the moveable lower-support assembly 5A30 (FIG. 5 A) from a testing position to a loading position in response to a corresponding signal, automatedly moving the moveable lower-support assembly from the loading position to the testing position in response to a corresponding signal, and automatically executing one or more tests upon the cell(s) 5A00, including automatically switching between at least one each of a constant-pressure test and a constant-spacing test, among many others.

[0031] Those skilled in the art will understand that FIGS. 4 through 9 illustrate one example workstation 400 of many testing workstations that can be made in accordance with the teachings of the present disclosure. The illustrated example includes all of the features discussed above and with such features implemented in particular manners. However, those skilled in the art will readily appreciate that other embodiments / examples of workstations of the present disclosure may have fewer than all of the above-discussed features and / or may have one, some, or all features implemented in other manners that provide the same or substantially the same functionality(ies) as described above.

[0032] Various modifications and additions can be made without departing from the spirit and scope of this disclosure. Features of each of the various embodiments described above may be combined with features of other described embodiments as appropriate in order to provide a multiplicity of feature combinations in associated new embodiments. Furthermore, while the foregoing describes a number of separate embodiments, what has been described herein is merely illustrative of the application of the principles of the present invention. Additionally, although particular methods herein may be illustrated and / or described as being performed in a specific order, the ordering is highly variable within ordinary skill to achieve aspects of the present disclosure.Accordingly, this description is meant to be taken only by way of example, and not to otherwise limit the scope of this invention.

[0033] Exemplary embodiments have been disclosed above and illustrated in the accompanying drawings. It will be understood by those skilled in the art that various changes, omissions, and additions may be made to that which is specifically disclosed herein without departing from the spirit and scope of the present invention.

Claims

What is claimed is:

1. A testing apparatus configured to test an electrochemical cell having a core-stacking axis, the testing apparatus comprising: a pressure-application axis; a test-assembly support plate designed and configured to support the electrochemical cell during testing so that the core-stacking axis is parallel to the pressure-application axis; a pressing assembly that includes: an upper pressing plate; and a lower pressing plate that is spaced from the upper pressing plate along the pressureapplication axis; and a pressing-assembly drive mechanism that is fixed relative to the test-assembly support plate and is operatively coupled to the upper pressing plate so that, when the pressing-assembly drive mechanism is operated, the pressing-assembly drive mechanism drives the pressing assembly along the pressure-application axis.

2. The testing apparatus of claim 1 , wherein the lower pressing plate is selectively switchable between a rigidly fixed relationship with the upper pressing plate and a movable relationship with the upper pressing plate.

3. The testing apparatus of either one of claims 1 and 2, wherein the pressing assembly further includes a plurality of springs extending between the upper and lower pressing plates so as to allow the lower pressing plate to move relative to the upper pressing plate in a direction along the pressure-application axis.

4. The testing apparatus of claim 3, wherein the pressing assembly further includes a plate-locking mechanism that selectively locks the lower pressing plate to the upper pressing plate so that they are rigidly fixed relative to one another.

5. The testing apparatus of claim 4, wherein the plate-locking mechanism comprises a plurality of threaded rods.

6. The testing apparatus of any one of claims 1-5, wherein the pressing-assembly drive mechanism includes:a pressing lead screw having a longitudinal axis extending parallel to the pressure-application axis and rotatably engaged with the upper pressing plate; and an electric motor operatively connected to the pressing lead screw so as to drive the pressing lead screw during operation of the testing apparatus.

7. The testing apparatus of claim 6, wherein the electric motor is a servomotor.

8. The testing apparatus of claim 6, wherein the pressing-assembly drive mechanism further includes a reducer.

9. The testing apparatus of any of claims 1-8, further comprising a plurality of guide columns having corresponding longitudinal axes parallel to the pressure-application axis, wherein each of the upper and lower pressing plates are slidably engaged with each of the plurality of guide columns.

10. The testing apparatus of claim 9, wherein each of the upper and lower pressing plates are slidably engaged with the plurality of guide columns with corresponding respective linear bearings.

11. The testing apparatus of claim 10, further comprising a base plate and a load cell operatively located between the test-assembly support plate and the base plate.

12. The testing apparatus of claim 11, wherein the test-assembly support plate is slidably engaged with each of the plurality of guide columns.

13. The testing apparatus of claim 9, wherein the test-assembly support plate is slidably engaged with the plurality of guide columns with corresponding respective linear bearings.

14. The testing apparatus of claim 1, further comprising a base plate and a load cell operatively located between the test-assembly support plate and the base plate.

15. The testing apparatus of claim 1, further comprising one or more position sensors for determining the location of the lower pressing plate in a direction parallel to the pressureapplication axis.

16. The testing apparatus of any one of claims 1-15, further comprising a lower-support assembly engaged with the test-assembly support plate and located between the test-assembly support plateand the lower pressing plate, wherein the lower-support assembly supports the electrochemical cell during testing operations.

17. The testing apparatus of claim 16, wherein the lower-support assembly comprises: a positioning plate designed and configured to support the electrochemical cell during testing, wherein the positioning plate is movable along a positioning-plate-movement axis that is perpendicular to the pressure-application axis; and a positioning-plate drive system operatively coupled to the positioning plate, wherein the positioning-plate drive system is designed and configured to controllably move the positioning plate in a direction along the positioning-plate-movement axis.

18. The testing apparatus of either of claims 16 and 17, wherein the lower-support assembly further includes: at least one slide rail fixedly coupled to the test-assembly support plate; and a slider plate fixedly coupled to the positioning plate and slidably engaged with the at least one slide rail.

19. The testing apparatus of claim 18, wherein the positioning-plate drive system includes an electric motor and a lead screw operatively engaged with the slider plate so that, when the electric motor is operated, the lead screw moves the lower-support assembly in a direction along the positioning-plate-movement axis.

20. The testing apparatus of claim 19, wherein the electric motor is a stepper motor.

21. The testing apparatus of any one of claims 17-20, further comprising a position-sensing system for sensing positions of the positioning plate along the positioning-plate-movement axis.

22. The testing apparatus of claim 21, wherein the position-sensing system includes at least one photoelectric sensor.

23. The testing apparatus of any one of claims 17-22, further comprising: a base; and a load cell located between the positioning plate and the base, wherein the load cell sensing loads in a direction along the pressure-application axis.

24. The testing apparatus of any one of claims 16-23, wherein:the lower support assembly further comprises a first cooling plate designed, configured, and located to controllably cool the electrochemical cell during testing operations; and the lower pressing plate supports a second cooling plate designed, configured, and located to controllably cool the electrochemical cell during testing operations.

25. The testing apparatus of any one of claims 16-24, wherein: the lower support assembly further comprises a first heater designed, configured, and located to controllably heat the electrochemical cell during testing operations; and the lower pressing plate supports a second heater designed, configured, and located to controllably heat the electrochemical cell during testing operations.

26. The testing apparatus of any one of claims 1-25, further comprising a testing controller that includes: control-interface electronics; machine memory containing machine-executable instructions; and at least one processed in operative communication with the control-interface electronics and the machine memory and configured to execute the machine-executable instructions; wherein the machine-executable instructions include machine-executable instructions that allow selection between operating the testing apparatus in a constant-pressure mode and in a constant-spacing mode.

27. The testing apparatus of claim 1 , further comprising a testing controller and instrumentation for controlling the pressing-assembly drive mechanism so as to perform constant-pressure testing upon the electrochemical cell.

28. The testing apparatus of claim 1, further comprising a testing controller and instrumentation for controlling the pressing-assembly drive mechanism so as to perform constant-spacing pressure testing upon the electrochemical cell.

29. The testing apparatus of claim 1 , further comprising the testing controller and instrumentation of claims 27 and 28.

30. The testing apparatus of claim 1, further comprising a moveable lower-support assembly engaged with the test-assembly support plate and located between the test-assembly support plateand the lower pressing plate, wherein the moveable lower-support assembly supports the electrochemical cell during testing operations.

31. The testing apparatus of claim 30, further comprising a testing controller and instrumentation for controlling the actuator to automatically move the moveable lower-support assembly from a testing position to a loading position in response to a single command.

32. The testing apparatus of claim 30, further comprising a testing controller and instrumentation for controlling the actuator to automatically move the moveable lower-support assembly from a loading position to a testing position in response to a single command.

33. The testing apparatus of claim 30, further comprising the testing controller and instrumentation of claims 31 and 32.

34. An integrated workstation, comprising: the testing apparatus of any one of claims 1 through 33; and an environmental-control enclosure containing the testing apparatus.

35. A testing apparatus configured to test an electrochemical cell, the testing apparatus comprising: a pressing assembly that includes upper and lower pressing plates spaced apart from one another by at least one spring provided to allow the testing apparatus to operate in a constant-pressure testing mode; wherein a pressing-assembly drive mechanism is operatively coupled to the upper pressing plate so as to drive the pressing assembly during operation.

36. The testing apparatus of claim 35, further comprising a testing controller and instrumentation for controlling the pressing-assembly drive mechanism so as to perform constant-pressure testing upon the electrochemical cell.

37. The testing apparatus of claim 35, further comprising a testing controller and instrumentation for controlling the pressing-assembly drive mechanism so as to perform constant-spacing pressure testing upon the electrochemical cell.

38. The testing apparatus of claim 35, further comprising the testing controller and instrumentation of claims 36 and 37.

39. A testing apparatus configured to test an electrochemical cell, the testing apparatus comprising:a pressure-application axis along which the testing apparatus applies pressure to the electrochemical cell during testing; a moveable lower-support assembly supporting the electrochemical cell during testing, wherein the moveable lower-support assembly is drivable by an actuator to move the electrochemical cell in a direction perpendicular to the pressure-application axis to allow the electrochemical cell to be loaded into and removed from the testing apparatus before and after the moveable lower-support assembly moves the electrochemical cell into a testing position.

40. The testing apparatus of claim 39, further comprising a testing controller and instrumentation for controlling the actuator to automatically move the moveable lower-support assembly from a testing position to a loading position in response to a single command.

41. The testing apparatus of claim 39, further comprising a testing controller and instrumentation for controlling the actuator to automatically move the moveable lower-support assembly from a loading position to a testing position in response to a single command.

42. The testing apparatus of claim 39, further comprising the testing controller and instrumentation of claims 40 and 41.

43. A testing apparatus configured to test an electrochemical cell, the testing apparatus comprising: a testing-apparatus base plate; a floating test-assembly support plate for supporting a test assembly containing the electrochemical cell during testing; a pressing assembly for applying force to the electrochemical cell and the floating testassembly support plate during testing; and at least one load cell operatively located between the floating test-assembly support plate and the testing-apparatus base plate so as to sense the force applied to the electrochemical cell during the testing.

44. A testing apparatus that includes all limitations of any one of claims 35-38 in combination with all limitations of any one of claims 39-42.

45. A testing apparatus that includes all limitations of any one of claims 35-38 in combination with all limitations of claim 43.

46. A testing apparatus that includes all limitations of any one of claims 39-42 in combination with all limitations of claim 43.

47. A testing apparatus that includes all limitations of any one of claim 35-38 in combination with all limitations of any one of claims 39-42 and in further combination with all limitations of claim 43.

48. A testing workstation, comprising: the testing apparatus of any one of claims 1 through 47; and an environmental-control enclosure containing the testing apparatus. 1

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