Detection method and device for product quality detection apparatus, and electronic apparatus

Abstract

A detection method and device for a product quality detection apparatus, and an electronic apparatus. The detection method comprises: acquiring first image data of a first product by means of a first imaging unit, the first product being obtained by means of processing by a first process node in a production apparatus, and the first imaging unit corresponding to the first process node (101); according to the first image data and first detection information corresponding to the first process node, generating a first detection result of the first product, wherein the first detection information comprises at least one first detection item and a preset parameter range corresponding to each first detection item (102); and sending the first detection result to the production apparatus, so that the production apparatus removes the first product from the production line when the first detection result indicates that the first product has a defect (103).

Description

Product quality testing equipment detection method, device and electronic equipment

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] This application claims priority to Chinese patent application No. 202410179632.2, filed on February 18, 2024, entitled “Testing method, device and electronic device for product quality testing equipment,” the entire contents of which are incorporated herein by reference. Technical Field

[0003] The present application relates to the field of visual inspection, and in particular to an inspection method, device and electronic equipment for product quality inspection equipment. Background Art

[0004] With the development of modern manufacturing, manufacturing is moving towards intelligence and automation. In the process of production equipment operation, less and less human participation is required. In order to reduce product defects, it is usually necessary to conduct quality inspections on products to reduce the flow of defective products out of the factory.

[0005] At present, production equipment is often equipped with production quality inspection equipment to perform visual inspection of products before they leave the factory. However, due to the different process levels of different production equipment or changes in the specifications of the products produced, it is very easy for the production quality inspection equipment to make misjudgments during operation, resulting in insufficient accuracy in product quality inspection, which can easily lead to defective products leaving the factory.

[0006] Summary of the Invention

[0007] The present application provides a method, device and electronic equipment for detecting product quality, which can reduce the occurrence of misjudgment events, improve the detection accuracy of products, and help reduce the flow of defective products out of the factory.

[0008] In a first aspect, an embodiment of the present application provides a method for detecting a product quality detection device, which is applied to the product quality detection device, and the method includes:

[0009] Acquiring first image data of a first product by a first imaging unit, wherein the first product is obtained by processing a first process node in a production device, and the first imaging unit corresponds to the first process node;

[0010] generating a first inspection result of the first product based on the first image data and first inspection information corresponding to the first process node, wherein the first inspection information includes at least one first inspection item and a preset parameter range corresponding to each first inspection item;

[0011] The first inspection result is sent to the production equipment, so that the production equipment discharges the first product from the production line if the first inspection result includes that the first product has defects.

[0012] Based on this, during the production process of a product, the processing portion of the product at each process node in the production equipment can be inspected to determine whether there are defects in the processing portion of the product at each process node, which is beneficial to improving the inspection accuracy of the product. Taking the first process node as an example, the first image data of the first product is obtained by the first imaging unit. Next, based on the first inspection information corresponding to the first process node, a first inspection result of the first product is generated. After that, the first inspection result can be sent to the production equipment. If the first inspection result includes that the first product has defects, the production equipment can promptly discharge the first product from the production line, thereby reducing the risk of defective products continuing to be processed by other process nodes in the production equipment except the first process node, which is beneficial to reducing the occurrence of defective products in the finished product and reducing the flow of defective products out of the factory.

[0013] In some implementations of the first aspect, the first inspection item is used to indicate a first inspection portion in the first product, and the first inspection result includes whether the first inspection portion indicated by each first inspection item is defective;

[0014] Generating a first inspection result of the first product according to the first image data and first inspection information corresponding to the first process node includes:

[0015] Determining first collected data of the first product based on the first image data, wherein the first collected data includes a collected value of at least one first product parameter of the first product, and the first product parameter corresponds to the first detection item in a one-to-one manner;

[0016] determining whether a first inspection part corresponding to each first inspection item has a defect based on a preset parameter range corresponding to each first inspection item and the first collected data;

[0017] When a first inspection part corresponding to the first inspection item has a defect, the first inspection item is associated with a defect identifier to obtain a first inspection result of the first product, wherein the defect identifier is used to indicate that the first inspection part has a defect.

[0018] In some implementations of the first aspect, when the collected value of the first product parameter corresponding to the first detection item does not match the preset parameter range corresponding to the first detection item, it is determined that the first detection part corresponding to the first detection item is defective.

[0019] In some implementations of the first aspect, acquiring first image data of the first product by the first imaging unit includes:

[0020] Acquire a parameter information set corresponding to the production equipment, wherein the parameter information set includes operating parameters of the first imaging unit;

[0021] According to the node identifier of the first process node, obtaining operating parameters of the first imaging unit from the parameter information set, and configuring the first imaging unit according to the operating parameters of the first imaging unit;

[0022] The first product is photographed by the configured first imaging unit to obtain first image data.

[0023] According to the embodiments of the present application, by providing a parameter information set to the product quality inspection equipment, the product quality inspection equipment can configure the operating parameters of the imaging unit in conjunction with specific process nodes. Because the imaging unit itself requires numerous operating parameters to be adjusted, and the operating parameters required for quality inspection of different imaging units also vary, providing effective operating parameters to the visual inspection system facilitates effective management and control of the operating status of the imaging unit, reducing the risk of missed or incorrect detection of defective products due to parameter changes or inactive functions.

[0024] In some implementations of the first aspect, before photographing the first product using the configured first imaging unit to obtain the first image data, the method further includes:

[0025] photographing a second product using the configured first imaging unit to obtain second image data, wherein the second product includes at least one second inspection portion, the second inspection portion includes first preset defects, and each first preset defect corresponds to a second inspection item;

[0026] Determining second collected data of the second product based on the second image data, wherein the second collected data includes a collected value of at least one second product parameter of the second product, and the second product parameter corresponds to the second detection item in a one-to-one manner;

[0027] Determine whether each second inspection part has a defect based on a preset parameter range corresponding to each second inspection item and a second product parameter set, and obtain a second inspection result of the second product;

[0028] In a case where the second inspection result does not match the defect information of each second inspection portion including the first preset defect, the first imaging unit is controlled to suspend operation.

[0029] Based on this, after the imaging unit's operating parameters are configured and before large-scale batch production begins, a second product containing a preset defect is provided to the first imaging unit, causing the first imaging unit to capture second image data. The first data processing unit then verifies whether the second image data contains defects. This not only verifies whether the first imaging unit's operating parameters are correctly configured, but also verifies configuration information such as the image recognition algorithm and defect judgment logic in the first data processing unit, thereby improving the reliability and accuracy of the imaging unit's acquisition of product data and its determination of whether a product has defects.

[0030] In some implementations of the first aspect, the method further includes:

[0031] In a case where the second inspection result matches the defect information of each second inspection part including the first preset defect, the first product is photographed by the configured first imaging unit to obtain first image data.

[0032] Based on this, the configuration information such as the image recognition algorithm and defect judgment logic in the first data processing unit can be tested to improve the reliability and accuracy of the imaging unit in collecting product data and judging whether the product has defects.

[0033] In some implementations of the first aspect, after configuring the first imaging unit according to the operating parameters of the first imaging unit, the method further includes:

[0034] The working parameters of the first imaging unit are sent to the first monitoring device of the product quality detection device.

[0035] Based on this, by uploading the working parameters of the first imaging unit to the first monitoring device in real time, the first monitoring device can control the working parameters of the first imaging unit, thereby reducing the risk of missed inspection of defective products due to parameter changes and non-enabled functions.

[0036] In some implementations of the first aspect, when a first inspection part corresponding to the first inspection item has a defect, after associating the first inspection item with a defect identifier and obtaining a first inspection result of the first product, the method further includes:

[0037] Sending the first collected data and the first detection result to the production execution device;

[0038] receiving a third test result of the first product sent by the production execution device;

[0039] When the third inspection result of the first product is that the first product is not defective, first control information is sent to the production equipment so that the production equipment responds to the first control information and moves the first product to a second process node, wherein the second process node is a downstream process node of the first process node.

[0040] Based on this, the product quality inspection equipment sends the first inspection result and the first collected data to the production execution equipment, so that the production execution equipment can obtain the re-inspection result of the first product. In particular, when the first product is confirmed to be defective, the production equipment can be controlled to move the first product to the second process node to facilitate continued processing of the second product. Therefore, products with incorrect inspection results can also be returned to the production line for continued processing, reducing product waste and saving production costs. Moreover, the first product that has not been confirmed to be defective will not return to the production line, effectively reducing process waste and reducing the production risk of defective products.

[0041] In some implementations of the first aspect, after generating a first test result of the first product based on the first test information corresponding to the first process node, the method further includes:

[0042] The first collected data and the first detection result are sent to the server, so that the server stores the first detection result of the first product at the first process node.

[0043] Based on this, by storing the first collected data and first test results of the first product in a preset server, the storage duration of the first collected data and first test results can be easily adjusted to meet traceability requirements and reduce the occurrence of missed inspections and the lack of traceable image data, test results, and other test data. In addition, the image data of defective products in the preset memory can be used to optimize the algorithm model in the imaging unit and expand the imaging unit's verification image library.

[0044] In some implementations of the first aspect, after generating a first test result of the first product based on the first test information corresponding to the first process node, the method further includes:

[0045] Obtaining first detection results corresponding to a plurality of first products processed by a first process node within a preset time period;

[0046] Determining a product defect rate corresponding to a first process node within a preset time period based on the plurality of first detection results;

[0047] When the product defect rate is greater than a preset defect threshold, the acquisition of the image data of the first product is stopped, and second control information is sent to the production equipment, so that the production equipment stops operating in response to the second control information.

[0048] Based on this, production quality inspection equipment counts product defect rates, which is conducive to timely reflection when problems occur in any link of product quality inspection, controlling the link where the problem occurs to stop operation, and helping to control the number of defective products produced and reduce the risk of defective products flowing out.

[0049] In some implementations of the first aspect, after generating a first test result of the first product based on the first test information corresponding to the first process node, the method further includes:

[0050] providing the first product to a second monitoring device of the product quality inspection device so that the second monitoring device generates a fourth inspection result of the first product;

[0051] When the fourth detection result of the first product is inconsistent with the first detection result, receiving third control information sent by the second monitoring device, wherein the fourth detection result is detected by the second monitoring device;

[0052] In response to the third control information, the first imaging unit is controlled to stop acquiring image data.

[0053] Based on this, by randomly selecting process nodes in the production equipment, product inspection and inspection of the corresponding imaging units of the process nodes are carried out, and when problems are detected in any link of the process nodes or product quality inspection equipment, timely feedback can be given, and the link where the problem occurs can be controlled to stop running, which is conducive to controlling the number of defective products produced and reducing the risk of defective products flowing out.

[0054] In some implementations of the first aspect, the production equipment includes a plurality of process nodes, and the product quality inspection equipment includes an imaging unit corresponding to each process node;

[0055] Before acquiring the first image data of the first product, the method further includes:

[0056] Obtain a measurement system analysis (MSA) guidance document set, where the MSA guidance document set includes an MSA guidance document corresponding to each process node in the production equipment;

[0057] According to the instructions in the MSA guidance document corresponding to each process node, determine the output channel of the processed product corresponding to each process node, the test information corresponding to each process node, and the data output type of the test result corresponding to each process node, where the data output type is either metrological or counting;

[0058] Acquire image data collected by the plurality of imaging units on a test sample set, wherein the test sample set includes a plurality of test samples, each test sample includes at least one third test item, and the plurality of test samples include a first preset number of good products and a second preset number of defective products;

[0059] For each process node, based on the image data collected by the imaging unit, a test result of each third test item in each test sample is generated;

[0060] The detection accuracy of the product quality detection equipment is determined based on the detection result of each third detection item in each detection sample and the reference result of each third detection item in each detection sample.

[0061] According to the embodiment of the present application, since an MSA-based guidance document is generated for the product quality inspection equipment, the product quality inspection equipment can combine the MSA guidance document with a preset self-inspection cycle to inspect the product quality inspection equipment itself, which is beneficial to improving the reliability of the product quality inspection equipment in actual applications.

[0062] In a second aspect, an embodiment of the present application provides a detection device for product quality detection equipment, the device comprising:

[0063] a first imaging unit, configured to obtain first image data of a first product, wherein the first product is obtained by processing at a first process node in a production device, and the first imaging unit is associated with the first process node;

[0064] a data processing unit, configured to generate a first test result of the first product based on first test information corresponding to the first process node, wherein the first test information includes at least one first test item and a preset parameter range corresponding to each first test item;

[0065] The sending unit is used to send the first detection result to the production equipment, so that the production equipment discharges the first product from the production line if the first detection result includes that the first product has defects.

[0066] Based on this, during the production process of a product, the processing portion of the product at each process node in the production equipment can be inspected to determine whether there are defects in the processing portion of the product at each process node, which is beneficial to improving the inspection accuracy of the product. Taking the first process node as an example, the first image data of the first product is obtained by the first imaging unit. Next, based on the first inspection information corresponding to the first process node, a first inspection result of the first product is generated. After that, the first inspection result can be sent to the production equipment. If the first inspection result includes that the first product has defects, the production equipment can promptly discharge the first product from the production line, thereby reducing the risk of defective products continuing to be processed by other process nodes in the production equipment except the first process node, which is beneficial to reducing the occurrence of defective products in the finished product and reducing the flow of defective products out of the factory.

[0067] In a third aspect, an embodiment of the present application provides an electronic device comprising a processor, a memory, and a program or instruction stored in the memory and executable on the processor. When the program or instruction is executed by the processor, the steps of the detection method of the product quality detection device as described in the first aspect or any implementable method of the first aspect are implemented.

[0068] In a fourth aspect, an embodiment of the present application provides a readable storage medium, on which a program or instruction is stored. When the program or instruction is executed by a processor, the steps of the detection method of the product quality detection equipment as described in the first aspect or any implementable method of the first aspect are implemented.

[0069] In the fifth aspect, an embodiment of the present application provides a computer program product. When the instructions in the computer program product are executed by the processor of an electronic device, the electronic device performs the steps of the detection method of the product quality detection device as described in the first aspect or any implementation method of the first aspect.

[0070] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0071] Various other advantages and benefits will become apparent to those skilled in the art by reading the detailed description of the embodiments below. The accompanying drawings are only for the purpose of illustrating the embodiments and are not to be considered as limiting the present application. In the accompanying drawings:

[0072] FIG1 is a flow chart of a detection method of a product quality detection device provided in an embodiment of the present application;

[0073] FIG2 is a flow chart of another method for detecting product quality using a detection device according to an embodiment of the present application;

[0074] FIG3 is a schematic structural diagram of a detection device of a product quality detection device provided in an embodiment of the present application;

[0075] FIG4 is a schematic structural diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0076] To make the purpose, technical solutions, and advantages of the embodiments of this application more clear, the technical solutions in the embodiments of this application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of this application. Obviously, the described embodiments are part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0077] Unless otherwise defined, all technical and scientific terms used in this application have the same meanings as commonly understood by technicians in the technical field to which this application belongs; the terms used in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

[0078] The terms "first," "second," and so on, in the specification and claims of this application or the accompanying drawings are used to distinguish different objects, not to describe a specific order or a primary-secondary relationship. In the description of the embodiments of this application, "plurality" means more than two, unless otherwise specifically defined.

[0079] References herein to "embodiments" mean that a particular feature, structure, or characteristic described in connection with the embodiments may be included in at least one embodiment of the present application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor does it constitute an independent or alternative embodiment that is mutually exclusive of other embodiments. It is understood, both explicitly and implicitly, by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0080] With the development of modern manufacturing, manufacturing is moving towards intelligence and automation. In the process of production equipment operation, less and less human participation is required. In order to reduce product defects, it is usually necessary to conduct quality inspections on products to reduce the flow of defective products out of the factory.

[0081] At present, production equipment is often equipped with production quality inspection equipment to perform visual inspection of products before they leave the factory. However, due to the different process levels of different production equipment or changes in the specifications of the products produced, it is very easy for the production quality inspection equipment to make misjudgments during operation, resulting in insufficient accuracy in product quality inspection, which can easily lead to defective products leaving the factory.

[0082] To improve the accuracy of product quality testing, manual inspections are often performed on individual products or spot checks before they leave the factory. However, with increasingly stringent quality requirements in the production process and increasingly sophisticated product construction, manual inspections not only place significant pressure on inspectors, but can also lead to issues such as inadequate inspections and low efficiency, resulting in high labor costs.

[0083] Based on the above considerations, in order to reduce the occurrence of misjudgment events, improve the accuracy of product inspection, and help reduce the flow of defective products out of the factory, the embodiments of the present application provide a detection method, device, and electronic equipment for product quality inspection equipment. Specifically, the production quality inspection equipment obtains first image data of a first product through a first imaging unit, wherein the first product is obtained by processing a first process node in the production equipment; generates a first inspection result of the first product based on the first image data and the first inspection information corresponding to the first process node, wherein the first inspection information includes at least one first inspection item and a preset parameter range corresponding to each first inspection item; sends the first inspection result to the production equipment, so that the production equipment will discharge the first product from the production line if the first inspection result includes that the first product has defects.

[0084] Based on this, in the process of producing products, if the first inspection result includes that the first product has defects, the production equipment can promptly discharge the first product from the production line, thereby reducing the risk of defective products continuing to be processed by other process nodes in the production equipment except the first process node, which is conducive to reducing the occurrence of defective products in the finished products and reducing the outflow of defective products from the factory.

[0085] The technical solutions described in the embodiments of this application are applicable to the production of batteries, vehicles and other products produced based on physical manufacturing processes.

[0086] The following will describe in detail the detection method, device and electronic equipment of the product quality detection equipment provided in the embodiments of the present application in conjunction with the accompanying drawings.

[0087] FIG1 is a flow chart of a method for detecting a product quality detection device provided by an embodiment of the present application. The method for detecting a product quality detection device can be applied to a product quality detection device. As shown in FIG1 , the method for detecting a product quality detection device includes steps 101 to 103.

[0088] Step 101: Acquire first image data of a first product by a first imaging unit, wherein the first product is obtained by processing at a first process node in a production device, and the first imaging unit corresponds to the first process node;

[0089] Step 102: Generate a first inspection result of the first product based on the first image data and first inspection information corresponding to the first process node, wherein the first inspection information includes at least one first inspection item and a preset parameter range corresponding to each first inspection item;

[0090] Step 103: Send the first inspection result to the production equipment, so that the production equipment removes the first product from the production line if the first inspection result indicates that the first product has defects.

[0091] The above steps are introduced below in conjunction with specific embodiments.

[0092] First, referring to the above step 101, the production equipment may include multiple process nodes, the first process node may be any process node in the production equipment, and the product quality inspection equipment may include an imaging unit corresponding to each process node.

[0093] For example, production equipment can be used to produce industrial products. For example, pole piece production equipment can produce pole pieces by stirring the positive electrode material and the negative electrode material separately, and then coating, rolling, and cutting the pole pieces. Another example of production equipment is electrode assembly production equipment, which can obtain battery cells by aligning, winding, or stacking the pole pieces and separators, and then encapsulating, injecting liquid, and other processing to obtain electrode assemblies. The specific industrial products produced by production equipment and production equipment are not listed here one by one.

[0094] The production equipment may include one or more process nodes, where "multiple" refers to two or more. For example, the number of process nodes is multiple. For example, in the case of electrode assembly manufacturing equipment, the multiple process nodes may include winding, lamination, welding, drying, injection, sealing, and so on. It should be understood that the process nodes listed above are merely examples and do not constitute specific process limitations for manufacturing electrode assemblies.

[0095] In some embodiments, the number of imaging units in the inspection method of a product quality inspection device can be one or more. Optionally, the imaging units are configured in a one-to-one correspondence with process nodes. Therefore, the number of imaging units can be determined in conjunction with the number of process nodes. The product quality inspection device can also include a data processing unit that analyzes image data collected by the imaging unit to generate inspection results for products produced at the process node. The data processing unit can be, but is not limited to, a processor with data processing capabilities.

[0096] The first product is obtained by processing at the first process node in the production equipment. Based on this, the first imaging unit can capture an image of the first product to obtain first image data. Optionally, the first image data may include one or more images. The image type may be an RGB image, a grayscale image, an infrared image, a line scan image, etc. The image type is not limited here.

[0097] Next, referring to the above-mentioned step 102, a first inspection result of the first product is generated according to the first image data and the first inspection information corresponding to the first process node, wherein the first inspection information includes at least one first inspection item and a preset parameter range corresponding to each first inspection item.

[0098] Optionally, a data set of detection information may be pre-stored in the product quality detection device, and the data set of detection information may include detection items corresponding to each process node and preset parameter ranges corresponding to the detection items.

[0099] Exemplarily, the processed product in each process node includes one or more corresponding inspection items. For example, in the process node where the positive and negative electrodes are aligned, the inspection items may include preset inspection items such as the spacing between the tabs, the tab height, and the wrinkling phenomenon between the positive and negative electrodes and the diaphragm; accordingly, the preset parameter ranges are the preset tab spacing range, the preset tab height range, whether there is wrinkling phenomenon, etc. The inspection items corresponding to each process node are not listed here one by one.

[0100] In some embodiments, in product quality inspection equipment, image recognition algorithms, verification logic, etc. may be configured for each process node. Each imaging unit in the quality inspection equipment may include an industrial camera with high image stability, high transmission capacity, and strong anti-interference ability. For example, a camera based on a charge coupled device (CCD) or a complementary metal oxide semiconductor (CMOS) chip may be used.

[0101] As a specific embodiment, the first imaging unit corresponds to the first process node. After the first product is processed by the first process node, the first imaging unit can obtain first image data of the first product before entering the next process node.

[0102] For the first product obtained by processing the first process node in the production equipment, the product quality inspection equipment can find the first inspection information in the data set of the inspection information based on the node identifier of the first process node, and the first inspection information includes at least one first inspection item and a preset parameter range corresponding to each first inspection item.

[0103] Based on this, the product quality inspection device can identify relevant information about the first product in the first image data and, based on each first inspection item and the preset parameter range corresponding to each first inspection item, analyze whether the first product has defects. After the first imaging unit completes inspection of each first inspection item of the first product, a first inspection result for the first product can be obtained, which can include the inspection result corresponding to each first inspection item.

[0104] The detection result corresponding to each first detection item can be that the detection portion corresponding to the first detection item is defective, or that the detection portion corresponding to the first detection item is not missing, or that the imaging unit fails to obtain image data of the detection portion corresponding to the first detection item and cannot detect the detection portion corresponding to the first detection item. In this case, the detection result of the detection portion corresponding to the first detection item is empty. Optionally, if the detection portion corresponding to the first detection item cannot be detected, it can be defaulted to that the detection portion corresponding to the first detection item is defective to reduce the possibility of missed detections.

[0105] Next, in step 103, after the product quality inspection equipment obtains the first inspection result for the first product, it can send the first inspection result to the production equipment. After receiving the first inspection result, the production equipment can determine whether the first product is defective based on the first inspection result. It can be understood that if the inspection section corresponding to any of the first inspection items is defective, it indicates that the first product is defective. Furthermore, to reduce the risk of defective products being continuously processed on the production line, if the inspection result for the inspection section corresponding to the first inspection item is empty, the production equipment can remove the first product from the production line, thereby reducing the risk of missed defective products.

[0106] According to an embodiment of the present application, the first imaging unit corresponds to the first process node. The first imaging unit obtains the first image data of the first product after processing at the first process node, and generates a first detection result of the first product according to the target detection information corresponding to the first process node. Based on this, in the process of producing the product, the processing part of the product at each process node can be inspected to determine whether there are defects in the processing part of the product at each process node, which is beneficial to improving the detection accuracy of the product. In the event that there are defects in the processing part of the product at the process node, the product can be promptly discharged from the production line, thereby reducing the risk of defective products continuing to be processed by other process nodes of the production equipment, which is beneficial to reducing the occurrence of defective products in the finished product and reducing the outflow of defective products out of the factory. At the same time, since the imaging unit can detect the processing part of the product at each process node, it can effectively improve the detection accuracy of visual inspection, reduce manual participation in inspection, and help reduce labor costs.

[0107] In some embodiments of the present application, the above step 101 is continued, and first image data of the first product is obtained by the first imaging unit. For details, please refer to the following steps:

[0108] Acquire a parameter information set corresponding to the production equipment, wherein the parameter information set includes operating parameters of the first imaging unit;

[0109] According to the node identifier of the first process node, obtaining operating parameters of the first imaging unit from the parameter information set, and configuring the first imaging unit according to the operating parameters of the first imaging unit;

[0110] The first product is photographed by the configured first imaging unit to obtain first image data.

[0111] Specifically, the parameter information set corresponding to the production equipment may include the working parameters of the imaging unit corresponding to each process node. The parameter information set corresponding to the production equipment may be pre-stored in the product quality inspection device.

[0112] For the first process node, the product quality inspection equipment can obtain operating parameters of the first imaging unit from the parameter information set based on the node identifier of the first process node, and configure the first imaging unit based on the operating parameters of the first imaging unit, so that the first imaging unit captures first image data of the first product processed at the first process node based on the operating parameters. The operating parameters of the first imaging unit include, for example, camera parameters and function activation parameters, which are not listed here.

[0113] For example, different production bases, different production equipment in the production bases, and each production equipment produces different types of products. Based on this, the staff can sort out the various production bases and various production equipment, and use the testing requirements of each different type of product to obtain the parameter information set of the generated equipment.

[0114] After the first imaging unit is configured according to the working parameters of the first imaging unit, the first product may be photographed by the configured first imaging unit to obtain the first image data.

[0115] According to the embodiments of the present application, by providing a parameter information set to the product quality inspection equipment, the product quality inspection equipment can configure the operating parameters of the imaging unit in conjunction with specific process nodes. Since the imaging unit itself has many operating parameters that need to be adjusted, and the operating parameters required for quality inspection of different imaging units also vary, providing effective operating parameters to the production quality inspection equipment facilitates effective management and control of the operating status of the imaging unit, reducing the risk of missed or incorrect detection of defective products due to parameter changes or inactive functions.

[0116] Optionally, after configuring the first imaging unit according to the working parameters of the first imaging unit, the method further includes: sending the working parameters of the first imaging unit to a first monitoring device of the product quality inspection device.

[0117] By uploading the working parameters of the first imaging unit to the first monitoring device in real time, the first monitoring device can control the working parameters of the first imaging unit, thereby reducing the risk of missing defective products due to parameter changes and non-enabled functions.

[0118] In some embodiments, before photographing the first product using the configured first imaging unit to obtain first image data, the method further includes:

[0119] photographing a second product using the configured first imaging unit to obtain second image data, wherein the second product includes at least one second inspection portion, the second inspection portion includes first preset defects, and each first preset defect corresponds to a second inspection item;

[0120] Determining second collected data of the second product based on the second image data, wherein the second collected data includes a collected value of at least one second product parameter of the second product, and the second product parameter corresponds to the second detection item in a one-to-one manner;

[0121] Determine whether each second inspection part has a defect based on a preset parameter range corresponding to each second inspection item and a second product parameter set, and obtain a second inspection result of the second product;

[0122] In a case where the second inspection result does not match the defect information of each second inspection portion including the first preset defect, the first imaging unit is controlled to suspend operation.

[0123] Specifically, after the working parameters of the first imaging unit are configured and before it is officially put into use, the second product can be provided to the first imaging unit so that the first imaging unit can collect second image data of the second product based on the working parameters.

[0124] The second product includes preset defects, each of which corresponds to a second inspection item. Optionally, the second inspection item may be consistent with the first inspection item, or may be partially consistent with the first inspection item. Optionally, based on the preset defects of the second product, the validity of the operation logic in the first data processing unit can be determined. The failure of the light source system and grayscale value algorithm can also be determined through film. In addition, the failure of key defect identification in product quality inspection equipment can also be determined through the second product.

[0125] The product quality inspection device determines second acquisition data of the second product based on the second image data, where the second acquisition data includes an acquisition value of at least one second product parameter of the second product, and the second product parameter corresponds to the second inspection item one-to-one; next, the preset parameter range and the second product parameter set corresponding to each second inspection item are used to determine whether each second inspection part has a defect, and obtain a second inspection result of the second product; if the second inspection result does not match the defect information of each second inspection part including the preset defect, the first imaging unit is controlled to terminate operation.

[0126] It can be understood that when the second detection result matches the defect information of each second detection part including the first preset defect, the first product is photographed by the configured first imaging unit to obtain the first image data.

[0127] According to an embodiment of the present application, after the imaging unit's operating parameters are configured and before large-scale mass production begins, a second product containing a predetermined defect is provided to the first imaging unit, causing the first imaging unit to capture second image data. The first data processing unit then verifies whether the second image data contains defects. This not only verifies whether the first imaging unit's operating parameters are correctly configured, but also verifies configuration information such as the image recognition algorithm and defect determination logic within the first data processing unit, thereby improving the reliability and accuracy of the imaging unit's acquisition of product data and its determination of product defects.

[0128] In some embodiments of the present application, the first inspection item is used to indicate a first inspection portion in the first product, and the first inspection result includes whether the first inspection portion indicated by each first inspection item is defective;

[0129] Continuing with the above step 102 , a first detection result of the first product is generated according to the first detection information corresponding to the first process node. For details, please refer to steps 201 to 203 .

[0130] Step 201: determining first collected data of a first product based on the first image data, wherein the first collected data includes a collected value of at least one first product parameter of the first product, and the first product parameter corresponds to a first detection item in a one-to-one manner;

[0131] Step 202: determining whether a first inspection part corresponding to each first inspection item has a defect based on the preset parameter range corresponding to each first inspection item and the first collected data;

[0132] Step 203 : When a defect exists in the first inspection part corresponding to the first inspection item, the first inspection item is associated with a defect identifier to obtain a first inspection result of the first product, wherein the defect identifier is used to indicate that a defect exists in the first inspection part.

[0133] Specifically, the product quality inspection equipment may include a data processing unit, through which the image data collected by the imaging unit can be analyzed. Specifically, corresponding image recognition algorithms, verification logic, etc. corresponding to the products processed at each process node can be pre-configured in the data processing unit. It is understandable that the products processed at different process nodes are different, and the calculation logic used in the imaging unit corresponding to each process node may be different. Optionally, the calculation logic used in the imaging unit corresponding to each process node can be determined in combination with the specific process node corresponding to the imaging unit.

[0134] As a specific example, for a first product processed by a first process node, analysis can be performed based on the first image data to determine first collected data of the first product, wherein the first collected data includes a collected value of at least one first product parameter of the first product, and the first product parameter corresponds one-to-one with the first detection item. Exemplarily, continuing with the example of a process node where the positive and negative electrode sheets are aligned, the collected values ​​of the first product parameters are the spacing between the tabs, the tab height, and whether there is wrinkling between the positive and negative electrode sheets and the separator. Optionally, if there is wrinkling between the positive and negative electrode sheets, the collected value can be 1, and if there is no wrinkling between the positive and negative electrode sheets, the collected value can be 0.

[0135] After obtaining the first collected data of the first product, it is possible to determine whether the first detection part corresponding to each first detection item has defects based on the preset parameter range corresponding to each first detection item in the first detection information, and if there is a defect in the first detection part, the first detection item is associated with the defect identifier, thereby producing the first detection result of the first product.

[0136] Exemplarily, the defect identifier is used to indicate that there is a defect in the first detection part, that is, there is a one-to-one correspondence between the defect identifier and the first detection item, and the first detection parts corresponding to different first detection items have different defect identifiers.

[0137] In the case where a defect is detected in the first inspection part, the first inspection item is associated with a defect identifier corresponding to the first inspection part corresponding to the first inspection item.

[0138] Based on this, after receiving the first inspection result of the first product, the production equipment can directly detect whether the first inspection result includes a defect identifier, and if the first inspection result includes a defect identifier, the first product is discharged from the production line.

[0139] According to an embodiment of the present application, when a defect is detected in the first inspection part corresponding to the first inspection item, by establishing a defect identifier associated with the first inspection item, the production equipment can easily identify whether the first product needs to be removed from the production line after receiving the first inspection result, thereby helping to improve the reliability of screening out defective products.

[0140] Specifically, when the collected value of the first product parameter corresponding to the first detection item does not match the preset parameter range corresponding to the first detection item, it is determined that the first detection part corresponding to the first detection item has a defect.

[0141] Continuing with the example of the process node where the positive and negative electrodes are aligned, the first inspection item may be the tab spacing, and the preset parameter range is the preset tab spacing range. If the spacing between the tabs is within the preset tab spacing range, then the first inspection portion corresponding to the first inspection item is free of defects; if the spacing between the tabs is not within the preset tab spacing range, then the first inspection portion corresponding to the first inspection item is defective. The first inspection item may be the tab height, and the preset parameter range is the preset tab height range. If the tab height is within the preset tab height range, then the first inspection portion corresponding to the first inspection item is free of defects; if the tab height is not within the preset tab height range, then the first inspection portion corresponding to the first inspection item is free of defects. Here, the inspection items corresponding to each process node are not listed one by one.

[0142] According to the embodiment of the present application, each first detection item can be identified quickly and accurately, and it can be determined whether the first product has defects.

[0143] In some embodiments, the production equipment may also discharge the first product from the production line if the first test result of the first product is not received within a preset time range, wherein the preset time range is determined according to the processing speed of the first process node.

[0144] For example, each imaging unit can be connected to the production equipment for communication. The communication between the imaging unit and the production equipment can be wired communication or wireless communication, which is not specifically limited here.

[0145] In a production facility, the time consumed by each process node to process a product can be estimated, thereby determining the average processing time for each process node to process a product. Accordingly, the time interval at which each imaging unit transmits its test results to the production facility can be consistent with the average processing time. In some embodiments, the longer the average processing time, the longer the time interval at which the imaging unit transmits its test results to the production facility.

[0146] Optionally, the preset time range may be (t+a1, t+a2), where t is the average processing time for processing a product at a process node, a1 and a2 are preset positive numbers, and a1 is less than a2.

[0147] Next, the embodiment of the present application will be described in conjunction with the first imaging unit. Specifically, based on the communication connection between the first imaging unit and the production equipment, the first imaging unit can send the first detection result of the first product to the production equipment. Taking the first process node as an example, the average time consumed by the first process node to process a first product is 5 seconds. Based on this, the preset time range corresponding to the first imaging unit is (5+a1, 5+a2). If the production equipment does not receive the first detection result within the time range of (5+a1, 5+a2) after receiving the first detection result of the previous first product, the production equipment can directly discharge the first product from the production line.

[0148] According to the embodiment of the present application, since the imaging unit and the production equipment follow a unified linkage specification, if the production equipment does not receive the detection results within the preset time range, the first product will be discharged from the production line by default, thereby reducing the risk of defective products flowing out due to reasons such as loss of communication signals.

[0149] In some embodiments of the present application, the product quality inspection equipment can also be communicated with the production execution equipment. The production execution equipment can record and track the operating data generated by the production equipment in real time, and can also control the operation of the production equipment. Optionally, the production execution equipment can be implemented based on the production execution system (Manufacturing Execution System, MES).

[0150] Specifically, when there is a defect in the first inspection part corresponding to the first inspection item, the first inspection item is associated with the defect identifier. After obtaining the first inspection result of the first product, the product quality inspection equipment can also: send the first collection data and the first inspection result to the production execution equipment; receive the third inspection result of the first product sent by the production execution equipment; and when the third inspection result of the first product is that the first product is not defective, send first control information to the production equipment, so that the production equipment responds to the first control information and moves the first product to the second process node, wherein the second process node is a downstream process node of the first process node.

[0151] For example, in some embodiments, if a first product is defective, after the production equipment removes the first product from the production line, another inspection device can re-inspect the first product to obtain a third inspection result for the first product. Alternatively, the other inspection device can be another imaging unit, a manually operated inspection device, or a manual visual inspection. The specific method for obtaining the third inspection result is not particularly limited herein.

[0152] After obtaining the third test result, if the third test result of the first product indicates that the first product is non-defective, the production execution device may send first control information to the production device, causing the production device to move the first product to a second process node in response to the first control information, wherein the second process node is a process node downstream of the first process node. It is understood that the second process node is a process node subsequent to the first process node.

[0153] After receiving the first control information, the production equipment can move the first product to the second process node so that the second process node can continue to process the first product.

[0154] According to an embodiment of the present application, the product quality inspection equipment sends the first inspection result and the first collected data to the production execution equipment, so that the production execution equipment can obtain the re-inspection result of the first product. In particular, when the first product is confirmed to be defective, the production equipment can be controlled to move the first product to the second process node to facilitate continued processing of the second product. Therefore, products with incorrect inspection results can also be returned to the production line for continued processing, reducing product waste and saving production costs. Moreover, the first product that has not been confirmed to be defective will not return to the production line, effectively reducing process waste and reducing the production risk of defective products.

[0155] In some embodiments, after generating a first detection result of the first product based on the first detection information corresponding to the first process node, the method further includes: sending the first collection data and the first detection result to the server so that the server stores the first detection result of the first product at the first process node.

[0156] Exemplarily, the product quality inspection device may also be directly connected to the server for communication, and send the first collected data and the first inspection result of the first product to the preset server to store the first collected data and the first inspection result of the first product.

[0157] Optionally, after receiving the first collected data and the first test result of the first product, the production execution device may store the first collected data and the first test result of the first product in a server.

[0158] Based on this, by storing the first collected data and first test results of the first product in a preset server, the storage duration of the first collected data and first test results can be easily adjusted to meet traceability requirements and reduce the occurrence of missed inspections and the lack of traceable image data, test results, and other test data. In addition, the image data of defective products in the preset memory can be used to optimize the algorithm model in the imaging unit and expand the imaging unit's verification image library.

[0159] In some embodiments, after generating a first test result of the first product based on the first test information corresponding to the first process node, the product quality testing device may further perform the following steps:

[0160] Obtain first detection results corresponding to multiple first products processed by the first process node within a preset time period; determine the product defect rate corresponding to the first process node within the preset time period based on the multiple first detection results; when the product defect rate is greater than a preset defect threshold, terminate the acquisition of image data of the first product, and send second control information to the production equipment, so that the production equipment terminates operation in response to the second control information.

[0161] Specifically, the product quality inspection equipment can perform statistical analysis on the first inspection results within a preset time period. For example, for multiple consecutively received first inspection results, the equipment can determine whether a product is defective based on whether each first inspection result includes a defect identifier. Based on this, the production control unit can count the number of defective products within the preset time period to obtain the product defect rate corresponding to the first process node within the preset time period.

[0162] If the product defect rate exceeds the preset defect threshold, the image recognition algorithm configured in the product quality inspection equipment may have operational logic errors, or there may be operational errors at the first process node. Among them, operational logic errors can easily lead to unreliable inspection results for the first product, easily causing good products to be diagnosed as defective without being identified; operational errors at the first process node can easily cause defects in the first product, that is, it is easy to produce defective products.

[0163] In order to reduce misjudgments and reduce the production volume of defective products, the product quality inspection equipment can stop collecting image data of the first product and stop the first process node from continuing to run, so as to facilitate workers to inspect the first imaging unit and the first process node. Optionally, if an error occurs in the operation logic, the staff can optimize the operation logic. For example, they can check whether the visual inspection has logical loopholes, whether it is compatible with different product processes, incoming material fluctuations and other issues; if there is an operation error in the first process node, the process node can debug the first process node.

[0164] Optionally, the product quality inspection equipment can also obtain the defect identification associated with the first inspection item in each first inspection result, thereby determining the defect rate of defects in each first inspection item, and provide the defect rate of defects in each first inspection item to the staff, which is conducive to improving the efficiency of the staff in inspecting production equipment or product quality inspection equipment.

[0165] According to the embodiment of the present application, the production quality inspection equipment counts the product defect rate, which is conducive to timely reporting when problems occur in any link of the product quality inspection, controlling the link where the problem occurs to stop running, and is conducive to controlling the number of defective products produced and reducing the risk of defective products flowing out.

[0166] At the same time, as the staff promptly detects the computing logic in the imaging unit and adjusts the logic specifications in a timely manner when logic loopholes occur, the computing logic in the production quality inspection equipment is continuously optimized and updated.

[0167] In some embodiments, after generating the first test result of the first product based on the first test information corresponding to the first process node, the production quality testing device may further perform the following steps:

[0168] Provide the first product to the second monitoring device of the product quality inspection device so that the second monitoring device generates a fourth inspection result for the first product; when the fourth inspection result of the first product is inconsistent with the first inspection result, receive third control information sent by the second monitoring device, wherein the fourth inspection result is obtained by detection by the second monitoring device; in response to the third control information, control the first imaging unit to stop acquiring image data.

[0169] Exemplarily, the second monitoring device may refer to another set of imaging units, or may refer to a detection device that requires manual operation, or may refer to manual visual inspection. The specific method of performing the detection by the second monitoring device is not specifically limited.

[0170] The product quality inspection device can randomly determine a target process node from one or more process nodes included in the production equipment. When the target process node is the first node, the production quality inspection device can provide the first product to the second monitoring device of the product quality inspection device.

[0171] The second monitoring device can re-inspect the first product and generate a fourth inspection result. It is understood that the second monitoring device pre-stores a data set of inspection information, and the data set of inspection information can include inspection items corresponding to each process node and preset parameter ranges corresponding to the inspection items.

[0172] The second monitoring device can obtain the first detection information from the detection information data set, and determine the detection result of the first product, that is, the fourth detection result, based on the first detection items included in the first detection information and the preset parameter range corresponding to each first detection item.

[0173] When the fourth inspection result of the first product is inconsistent with the first inspection result, the second monitoring device can send third control information to the product quality inspection device. The product quality inspection device receives the third control information sent by the second monitoring device and, in response to the third control information, can control the first imaging unit to stop acquiring image data.

[0174] If the fourth test result of the first product is inconsistent with the first test result, it may be due to a bug in the operational logic of the product quality inspection equipment. Such an error in the operational logic can easily lead to unreliable test results for products processed at the first target process node, potentially causing good products to be mistakenly diagnosed as defective. Alternatively, an operational error in the first process node can easily lead to defects in products processed at the first target process node, potentially resulting in the production of defective products.

[0175] According to the embodiment of the present application, by randomly extracting process nodes in the production equipment, product inspection and inspection of the imaging units corresponding to the process nodes are carried out, and when problems are detected in any link of the process node or product quality inspection equipment, timely feedback can be given, and the link where the problem occurs is controlled to stop running, which is conducive to controlling the number of defective products produced and reducing the risk of defective products flowing out.

[0176] In some embodiments, the second monitoring device can also obtain the first N products processed by the production equipment after the production equipment is initialized, and inspect the N products according to the second preset inspection parameters to generate N sixth inspection results corresponding to the N products, where N is a positive integer; if the N sixth inspection results include defective products, the production equipment can be controlled to stop running.

[0177] Specifically, the initialization of the production equipment may refer to configuring the production parameters of each process node in the production equipment. After the configuration of the production parameters of each process node is completed, the initialization of the production equipment is completed.

[0178] After the production equipment is initialized and before it is put into production, the second monitoring device can be used to detect the first N products processed by the production equipment to determine whether the production equipment is initialized normally. Optionally, in the embodiment of the present application, N is a positive integer, and the specific value of N is not limited here.

[0179] If the N sixth test results corresponding to N products all indicate a non-defective product, the production equipment can continue production. If, based on the N sixth test results corresponding to N products, N products are determined to be defective, the second monitoring device can control the equipment to stop operation. Next, a risk assessment of the production equipment is required to reduce the risk of producing too many defective products.

[0180] According to the embodiment of the present application, before the production equipment is put into large-scale production, the risk of producing too many defective products is reduced by verifying whether the production equipment is capable of normal production, thereby saving production costs.

[0181] In some embodiments of the present application, in order to further improve the accuracy of product quality inspection, before obtaining the first image data of the first product, the product quality inspection device may further perform steps 301 to 306.

[0182] Step 301: Obtain a measurement system analysis (MSA) guidance file set, wherein the MSA guidance file set includes an MSA guidance file corresponding to each process node in the production equipment;

[0183] Step 302: Determine the output channel of the processed product corresponding to each process node, the test information corresponding to each process node, and the data output type of the test result corresponding to each process node based on the instructions in the MSA guidance file corresponding to each process node, where the data output type is either metrological or counting.

[0184] Step 303: Acquire image data collected by multiple imaging units for a test sample set, wherein the test sample set includes multiple test samples, each test sample includes at least one third test item, and the multiple test samples include a first preset number of good products and a second preset number of defective products;

[0185] Step 304 , corresponding to each process node, generating a test result of each third test item in each test sample based on the image data collected by the imaging unit;

[0186] Step 305 : determining the detection accuracy of the product quality detection equipment according to the detection result of each third detection item in each detection sample and the reference result of each third detection item in each detection sample.

[0187] Exemplarily, the MSA guidance file set includes an MSA guidance file corresponding to each process node in the production equipment.

[0188] Different production bases, different production equipment in the production bases, and different process nodes in each production equipment. Based on this, the staff can sort out each production base and each production equipment, and use the process nodes in each production equipment to generate the corresponding measurement system analysis (MSA) guidance documents for each process node.

[0189] In the MSA guidance document, the instruction information in the MSA guidance document corresponding to each process node, for example, determines the equipment identification of the production equipment, determines the output channel of the processed product corresponding to each process node in the production equipment, the detection information corresponding to each process node and the data output type of the detection result corresponding to the process node.

[0190] Each process node may correspond to one or more output channels, for example, process nodes such as pairing, ultrasonic, soft connection, and shell entry nodes, wherein the shell entry process node may include an output channel.

[0191] After the product quality inspection device performs the above actions according to the instruction information, a test sample can be provided to the product quality inspection device, and the product quality inspection device can inspect the test sample to determine whether the product quality inspection device can perform normal inspection.

[0192] The test samples provided to the product quality testing device may include a first preset number of good products and a second preset number of defective products, wherein:

[0193] The first preset number of good products may also include products of different good grades, for example, 10 good products of the highest good grade and 15 good products of the second good grade, wherein the highest good grade corresponds to products without defects, and the second good grade corresponds to products with defects, but the defects do not affect the classification of the products as good products.

[0194] The second preset number of defective products may also include products of different severity levels, for example, 10 defective products of the highest severity level and 15 defective products of the third severity level. The highest severity level corresponds to products with numerous and obvious defects, while the second severity level corresponds to products with fewer defects, but the defects that exist warrant classification as defective.

[0195] After each imaging unit completes image data acquisition, the product quality inspection device may generate a test result for each third inspection item in each inspection sample based on the image data. The product quality inspection device may combine and summarize the tests for each third inspection item, and compare the test result for each third inspection item in each inspection sample with a reference result for each third inspection item in each inspection sample one by one to determine whether the test result for each third inspection item by the product quality inspection device is accurate, and based on this, determine the inspection accuracy of the product quality inspection device.

[0196] It is understandable that when the detection accuracy of the product quality detection equipment is greater than the preset accuracy threshold, the product quality detection equipment can be put into actual product detection scenarios.

[0197] When the detection accuracy is less than or equal to the preset accuracy threshold, the product quality inspection equipment needs to be re-debugged and put into actual product inspection scenarios only after the detection accuracy of the product quality inspection equipment is greater than the preset accuracy threshold.

[0198] According to the embodiment of the present application, since an MSA-based guidance document is generated for the product quality inspection equipment, the product quality inspection equipment can combine the MSA guidance document with a preset self-inspection cycle to inspect the product quality inspection equipment itself, which is beneficial to improving the reliability of the product quality inspection equipment in actual applications.

[0199] In order to more clearly introduce the embodiments of the present application, Figure 2 is a flow chart of another detection method of product quality detection equipment provided in the embodiments of the present application. Combined with Figure 2, the detection method of the product quality detection equipment may include steps 401 to 412.

[0200] Step 401, obtaining a parameter information set corresponding to the production equipment;

[0201] Specifically, the parameter information set includes the working parameters of the first process node including the first imaging unit.

[0202] Step 402 , obtaining operating parameters of a first imaging unit from a parameter information set according to a node identifier of a first process node, and configuring the first imaging unit according to the operating parameters of the first imaging unit;

[0203] Step 403: The first imaging unit collects second image data of the second product based on the working parameters;

[0204] The second product includes at least one second inspection part, the second inspection part includes preset defects, and each preset defect corresponds to a second inspection item.

[0205] Step 404: determining second collected data of the second product based on the second image data;

[0206] Step 405 , determining whether each second inspection part has a defect based on the preset parameter range corresponding to each second inspection item and the second product parameter set, and obtaining a second inspection result for the second product;

[0207] Step 406 , when the second inspection result matches the defect information of each second inspection part including the preset defect, the first imaging unit acquires first image data of the first product processed at the first process node;

[0208] Step 407, determining first collected data of the first product based on the first image data;

[0209] The first collected data includes a collected value of at least one first product parameter of the first product, and the first product parameter corresponds to the first detection item one by one;

[0210] Step 408: Determine whether a first inspection part corresponding to each first inspection item has a defect based on the preset parameter range corresponding to each first inspection item and the first collected data. If the first inspection part corresponding to the first inspection item has a defect, associate the first inspection item with the defect identifier to obtain a first inspection result for the first product.

[0211] The defect indicator is used to indicate that there is a defect in the first detection part.

[0212] Step 409: Send the first test result to the production equipment;

[0213] Step 410: Sending the first collected data and the first detection result to the production execution device;

[0214] Step 411: If the first inspection result indicates that the first product is defective, the production equipment removes the first product from the production line.

[0215] Optionally, if the production equipment does not receive the first test result of the first product within a preset time range, the first product is also discharged from the production line.

[0216] Step 412: The production execution device receives a first test result of the first product at the first process node;

[0217] Step 413: The production execution device obtains the third test result of the first product, and sends the first control information to the production device if the third test result indicates that the first product is free of defects.

[0218] In step 414 , the production equipment moves the first product to the second process node in response to the first control information, so that the second process node processes the first product.

[0219] According to an embodiment of the present application, the first imaging unit corresponds to the first process node. Based on this, in the process of producing the product, the processing part of the product at each process node can be inspected to determine whether there are defects in the processing part of the product at each process node, which is beneficial to improving the detection accuracy of the product. Taking the first process node as an example, after the first imaging unit obtains the first detection result, the first detection result can be sent to the production equipment. The production equipment can promptly discharge the first product from the production line when the first detection result includes that the first product has defects, thereby reducing the risk of defective products continuing to be processed by other process nodes in the production equipment except the first process node, which is beneficial to reducing the occurrence of defective products in the finished product and reducing the outflow of defective products from the factory. At the same time, since the imaging unit can detect the processing part of the product at each process node, it can effectively improve the detection accuracy of visual inspection, reduce manual participation in inspection, and help reduce labor costs.

[0220] Figure 3 is a structural schematic diagram of a detection device of a product quality detection device provided in an embodiment of the present application. As shown in Figure 3, the detection device of the product quality detection device includes: an imaging unit 310, a data processing unit 320 and a sending unit 330.

[0221] A first imaging unit 310 is configured to obtain first image data of a first product, wherein the first product is obtained by processing at a first process node in a production device, and the first imaging unit 310 is associated with the first process node;

[0222] a data processing unit 320 configured to generate a first test result of the first product based on first test information corresponding to the first process node, wherein the first test information includes at least one first test item and a preset parameter range corresponding to each first test item;

[0223] The sending unit 330 is configured to send the first detection result to the production equipment, so that the production equipment discharges the first product from the production line if the first detection result indicates that the first product has defects.

[0224] In some embodiments, the first inspection item is used to indicate a first inspection portion in the first product, and the first inspection result includes whether the first inspection portion indicated by each first inspection item is defective;

[0225] The data processing unit 320 is further configured to determine first collected data of the first product based on the first image data, wherein the first collected data includes a collected value of at least one first product parameter of the first product, and the first product parameter corresponds to the first detection item in a one-to-one manner;

[0226] The data processing unit 320 is further configured to determine whether a first inspection part corresponding to each first inspection item has a defect based on a preset parameter range corresponding to each first inspection item and the first collected data;

[0227] The data processing unit 320 is further configured to associate the first inspection item with a defect identifier to obtain a first inspection result of the first product when a defect exists in the first inspection part corresponding to the first inspection item, wherein the defect identifier is used to indicate that a defect exists in the first inspection part.

[0228] In some embodiments, the data processing unit 320 is further configured to determine that a first inspection part corresponding to the first inspection item is defective when the collected value of the first product parameter corresponding to the first inspection item does not match the preset parameter range corresponding to the first inspection item.

[0229] In some embodiments, the apparatus further comprises:

[0230] An acquisition module, configured to acquire a parameter information set corresponding to the production equipment, wherein the parameter information set includes operating parameters of the first imaging unit 310;

[0231] The data processing unit 320 is further configured to obtain operating parameters of the first imaging unit 310 from the parameter information set according to the node identifier of the first process node, and configure the first imaging unit 310 according to the operating parameters of the first imaging unit 310;

[0232] The data processing unit 320 is further configured to photograph the first product through the configured first imaging unit 310 to obtain first image data.

[0233] In some embodiments, the data processing unit 320 is further configured to photograph a second product using the configured first imaging unit 310 to obtain second image data, wherein the second product includes at least one second inspection portion, the second inspection portion includes first preset defects, and each first preset defect corresponds to a second inspection item;

[0234] The data processing unit 320 is further configured to determine second collected data of the second product based on the second image data, wherein the second collected data includes a collected value of at least one second product parameter of the second product, and the second product parameter corresponds to the second detection item in a one-to-one manner;

[0235] The data processing unit 320 is further configured to determine whether each second inspection part has a defect based on a preset parameter range corresponding to each second inspection item and the second product parameter set, and obtain a second inspection result of the second product;

[0236] The data processing unit 320 is further configured to control the first imaging unit 310 to stop operating when the second detection result does not match the defect information of each second detection part including the first preset defect.

[0237] In some embodiments, the data processing unit 320 is further used to photograph the first product through the configured first imaging unit 310 to obtain first image data when the second detection result matches the defect information of each second detection part including the first preset defect.

[0238] In some embodiments, the sending unit 330 is further configured to send the working parameters of the first imaging unit 310 to the first monitoring device of the product quality inspection device.

[0239] In some embodiments, the sending unit 330 is further configured to send the first collected data and the first detection result to the production execution device;

[0240] a receiving unit, configured to receive a third test result of the first product sent by the production execution device;

[0241] The sending unit 330 is also used to send first control information to the production equipment when the third inspection result of the first product is that the first product is not defective, so that the production equipment responds to the first control information and moves the first product to the second process node, wherein the second process node is a downstream process node of the first process node.

[0242] In some embodiments, the sending unit 330 is further configured to send the first collected data and the first detection result to the server, so that the server stores the first detection result of the first product at the first process node.

[0243] In some embodiments, the acquiring unit is further configured to acquire first detection results respectively corresponding to a plurality of first products processed by the first process node within a preset time period;

[0244] The data processing unit 320 is further configured to determine a product defect rate corresponding to a first process node within a preset time period based on the plurality of first detection results;

[0245] The data processing unit 320 is further configured to stop acquiring image data of the first product when the product defect rate is greater than a preset defect threshold, and to send second control information to the production equipment so that the production equipment stops operating in response to the second control information.

[0246] In some embodiments, the sending unit 330 is further configured to provide the first product to a second monitoring device of the product quality inspection device, so that the second monitoring device generates a fourth inspection result for the first product;

[0247] The receiving unit is further configured to receive third control information sent by the second monitoring device when a fourth detection result of the first product is inconsistent with the first detection result, wherein the fourth detection result is detected by the second monitoring device;

[0248] The data processing unit 320 is further configured to control the first imaging unit 310 to stop acquiring image data in response to the third control information.

[0249] In some embodiments, the production equipment includes a plurality of process nodes, and the product quality inspection equipment includes an imaging unit corresponding to each process node;

[0250] The acquisition unit is further used to acquire a measurement system analysis MSA guidance document set, wherein the MSA guidance document set includes an MSA guidance document corresponding to each process node in the production equipment;

[0251] The data processing unit 320 is further configured to determine, based on the instructions in the MSA guidance file corresponding to each process node, the processed product output channel corresponding to each process node, the test information corresponding to each process node, and the data output type of the test result corresponding to the process node, wherein the data output type is either metrological or counting;

[0252] The acquisition unit is further configured to acquire image data collected by the plurality of imaging units on the test sample set, wherein the test sample set includes a plurality of test samples, each test sample includes at least one third test item, and the plurality of test samples include a first preset number of good products and a second preset number of defective products;

[0253] The data processing unit 320 is further configured to generate, corresponding to each process node, a test result of each third test item in each test sample based on the image data collected by the imaging unit;

[0254] The data processing unit 320 is further configured to determine the detection accuracy of the product quality detection equipment based on the detection result of each third detection item in each detection sample and the reference result of each third detection item in each detection sample.

[0255] It can be understood that the detection device of the product quality detection equipment of the embodiment of the present application can correspond to the execution entity of the detection method of the product quality detection equipment provided in the embodiment of the present application. The specific details of the operation and / or function of each module / unit of the detection device of the product quality detection equipment can be referred to the description of the corresponding parts in the detection method of the product quality detection equipment provided in the above embodiment of the present application. For the sake of brevity, they will not be repeated here.

[0256] Figure 4 shows a schematic diagram of the structure of an electronic device provided by an embodiment of the present application. As shown in Figure 4, the device may include a processor 601 and a memory 602 storing computer program instructions.

[0257] Specifically, the processor 601 may include a central processing unit (CPU) or an application specific integrated circuit (ASIC), or may be configured to implement one or more integrated circuits of the embodiments of the present application.

[0258] Memory 602 may include a large capacity memory for information or instructions. By way of example and not limitation, memory 602 may include a hard disk drive (HDD), a floppy disk drive, a flash memory, an optical disk, a magneto-optical disk, a magnetic tape, or a Universal Serial Bus (USB) drive, or a combination of two or more of these. In one example, memory 602 may include removable or non-removable (or fixed) media, or memory 602 may be a non-volatile solid-state memory. Memory 602 may be internal or external to the electronic device.

[0259] The memory may include read-only memory (ROM), random access memory (RAM), magnetic disk storage media devices, optical storage media devices, flash memory devices, electrical, optical or other physical / tangible memory storage devices. Thus, generally, the memory includes one or more tangible (non-transitory) computer-readable storage media (e.g., memory devices) encoded with software including computer-executable instructions, and when the software is executed (e.g., by one or more processors), it is operable to perform the operations described with reference to the method according to an aspect of the present disclosure.

[0260] The processor 601 implements the method described in the embodiment of the present application by reading and executing the computer program instructions stored in the memory 602, and achieves the corresponding technical effect achieved by executing the method in the embodiment of the present application. For the sake of brevity, it will not be repeated here.

[0261] In one example, the electronic device may further include a communication interface 603 and a bus 604. As shown in FIG4, the processor 601, the memory 602, and the communication interface 603 are connected via the bus 604 and communicate with each other.

[0262] The communication interface 603 is mainly used to implement communication between various modules, devices, units and / or equipment in the embodiments of the present application.

[0263] Bus 604 includes hardware, software or both, and couples the components of the online information flow metering device to each other. For example, and not limitation, the bus may include an Accelerated Graphics Port (AGP) or other graphics bus, an Extended Industry Standard Architecture (EISA) bus, a Front Side Bus (FSB), a Hyper Transport (HT) interconnect, an Industry Standard Architecture (ISA) bus, an InfiniBand interconnect, a Low Pin Count (LPC) bus, a memory bus, a Micro Channel Architecture (MCA) bus, a Peripheral Component Interconnect (PCI) bus, a PCI-Express (PCI-X) bus, a Serial Advanced Technology Attachment (SATA) bus, a Video Electronics Standards Association Local (VLB) bus, or other suitable buses or a combination of two or more of these. Where appropriate, bus 604 may include one or more buses. Although the present application describes and illustrates a specific bus, the present application contemplates any suitable bus or interconnect.

[0264] The electronic device can execute the detection method of the product quality detection device in the embodiment of the present application, thereby achieving the corresponding technical effects of the detection method of the product quality detection device described in the embodiment of the present application.

[0265] In addition, in combination with the detection method of the product quality detection device in the above embodiment, the embodiment of the present application may provide a readable storage medium for implementation. The readable storage medium stores computer program instructions; when the computer program instructions are executed by the processor, any one of the detection methods of the product quality detection device in the above embodiment is implemented. Examples of readable storage media may be non-transitory machine-readable media, such as electronic circuits, semiconductor memory devices, read-only memories (ROM), floppy disks, compact discs (CD-ROM), optical discs, hard disks, etc.

[0266] It should be understood that the present application is not limited to the specific configurations and processes described above and shown in the figures. For the sake of simplicity, a detailed description of the known methods is omitted here. In the above embodiments, several specific steps are described and shown as examples. However, the method process of the embodiments of the present application is not limited to the specific steps described and shown. Those skilled in the art can make various changes, modifications and additions, or change the order between the steps after understanding the spirit of the present application.

[0267] The functional blocks shown in the above-described block diagram can be implemented as hardware, software, firmware or a combination thereof. When implemented in hardware, it can be, for example, an electronic circuit, an application specific integrated circuit (ASIC), appropriate firmware, a plug-in, a function card, etc. When implemented in software, the elements of the present application are programs or code segments used to perform the required tasks. The program or code segment can be stored in a machine-readable medium, or transmitted on a transmission medium or a communication link via a data signal carried in a carrier wave. "Machine-readable medium" can include any medium capable of storing or transmitting information. Examples of machine-readable media include electronic circuits, semiconductor memory devices, read-only memories (ROMs), flash memories, erasable read-only memories (EROMs), floppy disks, compact disc read-only memories (CD-ROMs), optical discs, hard disks, optical fiber media, radio frequency (RF) links, etc. The code segments can be downloaded via computer networks such as the Internet, intranets, etc.

[0268] It should also be noted that the exemplary embodiments mentioned in this application describe some methods or systems based on a series of steps or devices. However, this application is not limited to the order of the above steps. In other words, the steps can be performed in the order mentioned in the embodiments, or in a different order, or several steps can be performed simultaneously.

[0269] An embodiment of the present application also provides a computer-readable storage medium having computer program instructions stored thereon; when the computer program instructions are executed by a processor, the detection method of the product quality detection equipment provided in the embodiment of the present application is implemented.

[0270] In addition, in combination with the detection methods, apparatuses, and readable storage media of the product quality detection devices in the above embodiments, embodiments of the present application may be implemented by providing a computer program product. When the instructions in the computer program product are executed by a processor of an electronic device, the electronic device performs any of the detection methods of the product quality detection devices in the above embodiments.

[0271] Aspects of the present disclosure have been described above with reference to the flowcharts and / or block diagrams of the methods, devices (systems) and computer program products according to the embodiments of the present disclosure. It should be understood that each box in the flowchart and / or block diagram and the combination of each box in the flowchart and / or block diagram can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer or other programmable data processing device to produce a machine so that these instructions executed by the processor of the computer or other programmable data processing device enable the implementation of the function / action specified in one or more boxes of the flowchart and / or block diagram. Such a processor can be, but is not limited to, a general-purpose processor, a special-purpose processor, a special application processor or a field programmable logic circuit. It is also understood that each box in the block diagram and / or flowchart and the combination of the boxes in the block diagram and / or flowchart can also be implemented by dedicated hardware that performs the specified function or action, or can be implemented by a combination of dedicated hardware and computer instructions.

[0272] The above description is only a specific embodiment of the present application. Those skilled in the art will clearly understand that for the convenience and brevity of description, the specific working processes of the systems, modules and units described above can refer to the corresponding processes in the aforementioned method embodiments, and will not be repeated here. It should be understood that the scope of protection of the present application is not limited thereto. Any person skilled in the art can easily think of various equivalent modifications or replacements within the technical scope disclosed in the present application, and these modifications or replacements should be included in the scope of protection of the present application.

Claims

1. A method for detecting product quality detection equipment, applied to the product quality detection equipment, the method comprising: Acquiring first image data of a first product by a first imaging unit, wherein the first product is obtained by processing at a first process node in a production device, and the first imaging unit corresponds to the first process node; generating a first inspection result of the first product according to the first image data and first inspection information corresponding to the first process node, wherein the first inspection information includes at least one first inspection item and a preset parameter range corresponding to each first inspection item; The first inspection result is sent to the production equipment, so that the production equipment discharges the first product from the production line if the first inspection result indicates that the first product has defects.

2. The method according to claim 1, wherein The first detection item is used to indicate a first detection part in the first product, and the first detection result includes whether the first detection part indicated by each first detection item has a defect; Generating a first test result of the first product according to the first test information corresponding to the first process node includes: determining first collected data of the first product based on the first image data and the first image data, wherein the first collected data includes a collected value of at least one first product parameter of the first product, and the first product parameter corresponds one-to-one to the first detection item; determining whether a first inspection part corresponding to each first inspection item has a defect based on the preset parameter range corresponding to each first inspection item and the first collected data; In the case that a first inspection part corresponding to the first inspection item has a defect, the first inspection item is associated with a defect identifier to obtain a first inspection result of the first product, wherein the defect identifier is used to indicate that the first inspection part has a defect.

3. The method according to claim 2, wherein: When the collected value of the first product parameter corresponding to the first detection item does not match the preset parameter range corresponding to the first detection item, it is determined that the first detection part corresponding to the first detection item has a defect.

4. The method according to claim 1, wherein The acquiring first image data of the first product by the first imaging unit includes: Acquire a parameter information set corresponding to the production equipment, wherein the parameter information set includes operating parameters of the first imaging unit; acquiring, according to the node identifier of the first process node, operating parameters of the first imaging unit in the parameter information set, and configuring the first imaging unit according to the operating parameters of the first imaging unit; The first product is photographed by the configured first imaging unit to obtain the first image data.

5. The method according to claim 4, wherein Before photographing the first product with the configured first imaging unit to obtain the first image data, the method further includes: photographing a second product with the configured first imaging unit to obtain second image data, wherein the second product includes at least one second inspection portion, the second inspection portion includes first preset defects, and each first preset defect corresponds to a second inspection item; determining second collected data of the second product based on the second image data, wherein the second collected data includes a collected value of at least one second product parameter of the second product, and the second product parameter corresponds one-to-one to the second detection item; determining whether each second inspection part has a defect based on the preset parameter range corresponding to each second inspection item and the second product parameter set, and obtaining a second inspection result of the second product; In a case where the second detection result does not match the defect information of each second detection portion including the first preset defect, the first imaging unit is controlled to stop operating.

6. The method according to claim 5, further comprising: In a case where the second detection result matches the defect information of each second detection part including the first preset defect, the first product is photographed by the configured first imaging unit to obtain the first image data.

7. The method according to claim 4, wherein: After configuring the first imaging unit according to the operating parameters of the first imaging unit, the method further includes: The working parameters of the first imaging unit are sent to a first monitoring device of the product quality detection device.

8. The method according to claim 2, wherein: If a first inspection part corresponding to the first inspection item has a defect, associating the first inspection item with a defect identifier to obtain a first inspection result of the first product, the method further includes: Sending the first collected data and the first detection result to a production execution device; receiving a third test result of the first product sent by the production execution device; If the third test result of the first product is that the first product has no defects, The production equipment sends first control information to enable the production equipment to move the first product to a second process node in response to the first control information, wherein the second process node is a downstream process node of the first process node.

9. The method according to any one of claims 2 to 7, wherein: After generating a first test result of the first product according to the first test information corresponding to the first process node, the method further includes: The first collected data and the first detection result are sent to a server, so that the server stores the first detection result of the first product at the first process node.

10. The method according to claim 1, wherein After generating a first test result of the first product according to the first test information corresponding to the first process node, the method further includes: Obtaining first detection results corresponding to a plurality of first products processed by the first process node within a preset time period; Determining a product defect rate corresponding to the first process node within the preset time period based on the plurality of first detection results; When the product defect rate is greater than a preset defect threshold, obtaining the image data of the first product is stopped, and second control information is sent to the production device, so that the production device stops operating in response to the second control information.

11. The method according to claim 7, wherein: After generating a first test result of the first product according to the first test information corresponding to the first process node, the method further includes: providing the first product to a second monitoring device of the product quality inspection device so that the second monitoring device generates a fourth inspection result of the first product; When a fourth detection result of the first product is inconsistent with the first detection result, receiving third control information sent by the second monitoring device, wherein the fourth detection result is detected by the second monitoring device; In response to the third control information, the first imaging unit is controlled to stop acquiring image data.

12. The method according to claim 1, wherein The production equipment includes a plurality of process nodes, and the product quality inspection equipment includes an imaging unit corresponding to each of the process nodes; Before acquiring the first image data of the first product, the method further includes: Obtaining a measurement system analysis (MSA) guidance document set, wherein the MSA guidance document set includes an MSA guidance document corresponding to each process node in the production equipment; According to the instruction information in the MSA guidance file corresponding to each process node, the processing product output channel corresponding to each process node, the detection information corresponding to each process node and the detection information corresponding to the process node are determined. The data output type of the result, wherein the data output type is quantitative or counting; Acquire image data collected by multiple imaging units on a test sample set, wherein the test sample set includes multiple test samples, each of the test samples includes at least one third test item, and the multiple test samples include a first preset number of good products and a second preset number of defective products; Corresponding to each of the process nodes, generating a detection result of each third detection item in each of the detection samples according to the image data collected by the imaging unit; determining the detection accuracy of the product quality testing equipment according to the detection result of each third detection item in each of the test samples and the reference result of each third detection item in each of the test samples; When the detection accuracy rates are all greater than a preset accuracy threshold, first image data of the first product is acquired.

13. A detection device for product quality detection equipment, the device comprising: a first imaging unit, configured to acquire first image data of a first product, wherein the first product is obtained by processing at a first process node in a production device, and the first imaging unit corresponds to the first process node; a data processing unit, configured to generate a first inspection result of the first product based on the first image data and first inspection information corresponding to the first process node, wherein the first inspection information includes at least one first inspection item and a preset parameter range corresponding to each first inspection item; A sending unit is used to send the first detection result to the production equipment, so that the production equipment discharges the first product from the production line when the first detection result includes that the first product has defects.

14. An electronic device, comprising: a processor, and a memory storing computer program instructions; The processor reads and executes the computer program instructions to implement the detection method of the product quality detection equipment according to any one of claims 1 to 13.

15. A readable storage medium having computer program instructions stored thereon, wherein the computer program instructions, when executed by a processor, implement the detection method of the product quality detection device according to any one of claims 1 to 13.

16. A computer program product, wherein when instructions in the computer program product are executed by a processor of an electronic device, the electronic device executes the detection method of the product quality detection device according to any one of claims 1 to 13.

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