A method for metallization through-glass VIAS and a glass article manufacutured thereof
The method addresses the challenges of hermeticity and reliability in metallizing through-glass vias by electroplating copper with controlled electrolytes and adhesion layers, achieving seamless and reliable metallization for high aspect ratios.
Patent Information
- Application Number
- PCT/US2025/029320
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-05-29
- Filing Date
- 2025-05-14
- Publication Date
- 2025-12-04
AI Technical Summary
Conventional methods for metallizing through-glass vias face challenges in achieving hermeticity and thermomechanical reliability, particularly for small diameters and high aspect ratios, with dry processes being costly and wet processes resulting in voids or seams.
A method involving cleaning the glass substrate, depositing an adhesion layer, and using electrolytes with controlled current application to electroplate copper into the vias, followed by a laminated dry film resist to prevent lateral growth, ensuring complete and void-free metallization.
Enables seam and void-free metallization of through-glass vias with high aspect ratios, maintaining hermeticity and thermomechanical reliability, suitable for high-temperature processing.
Smart Images

Figure US2025029320_04122025_PF_FP_ABST
Abstract
Citation Information
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