Unit cell inspection device and unit cell inspection method using same

Abstract

The present invention relates to a unit cell inspection device and a unit cell inspection method using same. The unit cell inspection device inspects whether burrs have formed on a cut surface of a unit cell, and comprises: a support unit on which a unit cell is mounted; a first imaging unit for imaging the upper surface of an edge of the unit cell; and a second imaging unit for imaging a side surface of the edge of the unit cell.

Description

Unit cell inspection device and unit cell inspection method using the same

[0001] This application claims the benefit of priority to Korean Patent Application No. 10-2024-0084141, filed June 27, 2024, and Korean Patent Application No. 10-2024-0115915, filed August 28, 2024, the entire contents of which are incorporated herein by reference.

[0002] The present invention relates to a unit cell inspection device and a unit cell inspection method using the same, and more specifically, to a unit cell inspection device for inspecting whether a burr occurs on a unit cell cross-section and a unit cell inspection method using the same.

[0003]

[0004] As technological development and demand for mobile devices increase, rechargeable secondary batteries are increasingly being used as energy sources for a variety of mobile devices. Secondary batteries are also attracting attention as an energy source for electric and hybrid electric vehicles, offering an alternative to conventional gasoline and diesel vehicles that rely on fossil fuels.

[0005] Secondary batteries are classified into cylindrical and prismatic batteries, in which the electrode assembly is built into a cylindrical or prismatic metal can, and pouch-type batteries, in which the electrode assembly is built into a pouch-type case made of aluminum laminate sheet, depending on the shape of the battery case.

[0006] The electrode assembly can be manufactured by stacking the positive and negative electrodes so that a separator is interposed between them to form a monocell, and can be manufactured by stacking multiple monocells or by winding the monocells.

[0007] In order to manufacture a monocell, a unit anode cut from an anode sheet is attached to a separator sheet, a unit cathode cut from an anode sheet is attached to another separator sheet, and then the separator sheet with the unit anode attached and the separator sheet with the unit cathode attached are laminated, heated, and pressed to manufacture the monocell.

[0008] At this time, a burr may occur in the cut unit anode due to a cutting defect, exposing the anode foil, which is a current collector, to the cut vertical cross-section, and the occurrence of such a burr may damage the separator, leading to a defect in the secondary battery.

[0009] Fig. 1 is a conceptual diagram for explaining a unit cell inspection device according to the prior art, and Fig. 2 is a side view for explaining a monocell structure.

[0010] As shown in FIGS. 1 and 2, a monocell, which is an example of a unit cell (10) in which an anode (11), a separator (13), a cathode (12), and a separator (13) are sequentially laminated, is vertically placed on a jig (3) so that the side is visible, and the side of the monocell is inspected using a microscope (1) and light (2).

[0011] Since the unit cell inspection device according to this prior art must vertically place the monocell on the jig (3), it is practically impossible to inspect all the monocells produced.

[0012] In addition, because the worker directly visually determines whether burrs occur in the entire assembly, the reliability of the inspection results may be reduced, and furthermore, there is the problem that the inspection takes a long time.

[0013]

[0014] (Prior art literature)

[0015] (Patent Document 1) Korean Patent Publication No. 10-2019-0114322

[0016]

[0017] In order to solve the above problems, the present invention aims to provide a unit cell inspection device capable of accurately and quickly checking whether a burr occurs in a unit cell including a monocell, and a unit cell inspection method using the same.

[0018]

[0019] As a technical means for achieving the above purpose, a unit cell inspection device according to one embodiment of the present invention is a device for inspecting whether a burr occurs on a cut surface of a unit cell (10), and is characterized by including: a support part (100) on which the unit cell (10) is mounted; a first photographing part (200) for photographing an upper surface of an edge of the unit cell (10); and a second photographing part (300) for photographing an edge side surface of the unit cell (10).

[0020] In addition, the unit cell inspection device according to one embodiment of the present invention is characterized in that the first photographing unit (200) includes a first camera unit (210) that photographs the upper edge surface of the unit cell (10), and the second photographing unit (300) includes a second camera unit (310) that photographs the side edge surface of the unit cell (10), and includes at least one of a first lighting unit (220) that provides light toward the upper edge surface of the unit cell (10) and a second lighting unit (320) that provides light toward the side edge surface of the unit cell (10).

[0021] In addition, the unit cell inspection device according to one embodiment of the present invention is characterized in that the second camera unit (310) is arranged to be inclined so as to form an acute angle with the edge side of the unit cell (10).

[0022] In addition, the unit cell inspection device according to one embodiment of the present invention is characterized in that the first lighting unit (220) and the second lighting unit (320) are equipped with near-infrared (NIR) lighting.

[0023] In addition, the unit cell inspection device according to one embodiment of the present invention is characterized in that the first lighting unit (220) and the second lighting unit (320) are equipped with lighting having a wavelength of 840 to 950 nm.

[0024] In addition, the unit cell inspection device according to one embodiment of the present invention is characterized in that the first lighting unit (220) is installed coaxially with the first camera unit (210), and the second lighting unit (320) is installed coaxially with the second camera unit (310).

[0025] In addition, the unit cell inspection device according to one embodiment of the present invention is characterized in that the first camera unit (210) and the second camera unit (310) are equipped with a filter that allows near infrared (NIR) rays to pass through.

[0026] In addition, the unit cell inspection device according to one embodiment of the present invention is characterized in that the filter passes a wavelength of 840 to 950 nm.

[0027] In addition, the unit cell inspection device according to one embodiment of the present invention is characterized in that the support member (100) is a conveyor.

[0028] In addition, the unit cell inspection device according to one embodiment of the present invention is characterized by further including a control unit (400) that inspects whether the unit cell (10) is defective through information provided from the first photographing unit (200) and the second photographing unit (300).

[0029] In addition, the unit cell inspection device according to one embodiment of the present invention is characterized by at least one of the following: whether a burr occurs on the edge side and / or the edge upper surface of the anode (11), the length of the burr, the area of ​​the burr, and the direction of the burr.

[0030] In addition, in the unit cell inspection device according to one embodiment of the present invention, the unit cell (10) is characterized by being any one of a monocell, an A-type bicell, a C-type bicell, and a half cell.

[0031] In addition, a unit cell inspection method using a unit cell inspection device according to one embodiment of the present invention is characterized by including: (S1) a step of settling the unit cell (10) on the upper side of the support member (100); (S2) a step of photographing the unit cell (10) through the first photographing unit (200) and the second photographing unit (300); and (S3) a step of inspecting whether the unit cell (10) is defective through the control unit (400).

[0032] In addition, the unit cell inspection method according to one embodiment of the present invention is characterized in that, in the step (S3), whether the unit cell (10) is defective is determined by comparing at least one of the occurrence of a burr, the length of the burr, the area of ​​the burr, and the direction of the burr with a reference value.

[0033]

[0034] As described above, the unit cell inspection device according to the present invention and the unit cell inspection method using the same include a first photographing unit for photographing the upper edge surface of the unit cell and a second photographing unit for photographing the side edge surface of the unit cell, thereby obtaining information on the upper edge surface and the side edge surface of the unit cell simultaneously, thereby providing the advantage of being able to accurately inspect whether a burr occurs on the cut surface of the unit cell.

[0035] In addition, according to the unit cell inspection device and the unit cell inspection method using the same according to the present invention, the first lighting unit and the second lighting unit are equipped with near-infrared (NIR) lighting, and the first camera unit and the second camera unit are equipped with a filter that allows near-infrared (NIR) to pass through, thereby improving the visibility of the unit cell, and consequently, there is an advantage in that a quick and accurate inspection can be performed.

[0036]

[0037] Figure 1 is a conceptual diagram for explaining a unit cell inspection device according to the prior art.

[0038] Figure 2 is a side view illustrating the monocell structure.

[0039] Figure 3 is a side view illustrating the A-type bicell structure.

[0040] Figure 4 is a side view illustrating a C-type bi-cell structure.

[0041] Figure 5 is a side view illustrating the half-cell structure.

[0042] Figure 6 is a schematic diagram for explaining a unit cell inspection device according to the first embodiment of the present invention.

[0043] Fig. 7 is a schematic diagram for explaining a unit cell inspection device according to a second embodiment of the present invention.

[0044] Fig. 8 is a schematic diagram for explaining a unit cell inspection device according to a third embodiment of the present invention.

[0045] Figure 9 is a flowchart for explaining a unit cell inspection method using a unit cell inspection device according to the present invention.

[0046]

[0047] Hereinafter, with reference to the attached drawings, embodiments of the present invention will be described in detail, so that those skilled in the art can easily implement the present invention. However, when describing the operating principles of preferred embodiments of the present invention in detail, if a detailed description of a related known function or configuration is judged to unnecessarily obscure the gist of the present invention, such detailed description will be omitted.

[0048] Additionally, the same drawing reference numerals are used for parts with similar functions and actions throughout the drawings. Throughout the specification, when a part is said to be connected to another part, this includes not only direct connections but also indirect connections with other elements intervening. Furthermore, inclusion of a component does not exclude other components unless specifically stated otherwise, but rather implies the inclusion of additional components.

[0049]

[0050] Below, a unit cell inspection device according to the present invention and a unit cell inspection method using the same are described.

[0051] Unit cell refers to monocell, A-type bicell, C-type bicell, and half-cell, but also includes various deformed and laminated cells not mentioned above.

[0052] For example, referring to Fig. 2, which is a side view for explaining a monocell structure, a monocell, which is an example of a unit cell (10), may have a form in which an anode (11), a separator (13), a cathode (12), and a separator (13) are sequentially stacked from top to bottom.

[0053] The positive electrode (11) is composed of a positive electrode current collector (11a) and a positive electrode material (11b) applied to the upper and lower surfaces of the positive electrode current collector (11a).

[0054] Here, the positive electrode collector (11a) may include aluminum, but is not necessarily limited thereto.

[0055] In addition, the cathode material (11b) may be a mixture of a cathode active material, a conductive material, and a binder, and, if necessary, a filler may be further added.

[0056] The negative electrode (12) is composed of a negative electrode current collector (12a) and a negative electrode material (12b) applied to the lower and upper surfaces of the negative electrode current collector (12a).

[0057] Here, the negative electrode current collector (12a) may include copper, but is not necessarily limited thereto.

[0058] In addition, the negative electrode material (12b) can be coated on the negative electrode current collector by additionally mixing a negative electrode active material, a conductive material, and a binder.

[0059] The separator (13) is positioned between the aforementioned negative electrode (12) and positive electrode (11) to prevent short circuits and allow only the movement of lithium ions. The material of the separator (13) is preferably one selected from among polyethylene, polypropylene, polyethylene / polypropylene double layer, polyethylene / polypropylene / polyethylene triple layer, polypropylene / polyethylene / polypropylene triple layer, and organic fiber filter paper, but is not limited thereto.

[0060] Meanwhile, in the monocell, an anode (11) is cut on the upper surface of a separator (13) and then laminated, and an anode (12) is cut on the upper surface of another separator (13) and then laminated. In addition, a separator (13) on which an anode (11) is laminated is laminated on the upper surface of the separator (13) on which an anode (12) is laminated (i.e., the upper surface of the cathode (12)), and as a result, the anode (11), the separator (13), the cathode (12), and the separator (13) are sequentially laminated from top to bottom, and a monocell can be manufactured by cutting a sheet of the separator (13) between the anode (11) and the cathode (12), but is not necessarily limited thereto.

[0061] Also, referring to Fig. 3, which is a side view for explaining the A-type bicell structure, another example of a unit cell (10), the A-type bicell may have a form in which an anode (11), a separator (13), a cathode (12), a separator (13), an anode (11), and a separator (13) are sequentially stacked from top to bottom.

[0062] Also, referring to Fig. 4, which is a side view for explaining the C-type bicell structure, the C-type bicell, which is another example of a unit cell (10), may have a form in which a cathode (12), a separator (13), an anode (11), a separator (13), a cathode (12), and a separator (13) are sequentially stacked from top to bottom.

[0063] Referring to Fig. 5, which is a side view for explaining the half-cell structure, another example of a unit cell (10), a half-cell, may have a shape in which a cathode (12) is interposed between a pair of separators (13), i.e., a shape in which a separator (13), a cathode (12), and a separator (13) are sequentially stacked from top to bottom.

[0064] The cathode, separator, and anode constituting the A-type bicell, C-type bicell, or half-cell are as described with reference to Fig. 2, so redundant description will be omitted.

[0065]

[0066] Figure 6 is a schematic diagram for explaining a unit cell inspection device according to the first embodiment of the present invention.

[0067] Referring to FIGS. 2 to 6 together, a unit cell inspection device for inspecting whether a burr occurs on a cross-section of a unit cell (10) having the aforementioned configuration may be configured to include a support unit (100), a first photographing unit (200), a second photographing unit (300), and a control unit (400).

[0068] First, the support member (100) may be provided so that the unit cell (10) may be settled. At this time, the unit cell (10) may be settled in a horizontal direction. Here, the horizontal direction is a horizontal direction (x-axis direction) orthogonal to the stacking direction (y-axis direction) of the unit cell (10).

[0069] The support (100) may be a conveyor, and may be provided to move the unit cell (10) installed on the upper side (12 o'clock direction based on FIG. 3) to one side (9 o'clock direction based on FIG. 3).

[0070] The first photographing unit (200) may be equipped to photograph the upper surface of the edge of the unit cell (10). Here, the upper surface of the edge of the unit cell (10) may be the upper surface of the edge on the long side of the unit cell (10).

[0071] In more detail, the first photographing unit (200) may be arranged to be spaced upward from the support unit (100) on which the unit cell (10) is mounted, and may be provided to photograph the upper surface of the edge of the unit cell (10). The above-described first photographing unit (200) may be configured to include a first camera unit (210) and a first lighting unit (220).

[0072] First, the first camera unit (210) can be positioned vertically (y-axis direction) orthogonal to the horizontal direction of the unit cell (10) to photograph the upper surface of the edge of the unit cell (10).

[0073] For example, the first camera unit (210) may be equipped with a camera having a pixel size of 25M (5120X5120 pixels) or more and an image resolution of 1 to 4.5 μm. In addition, as another example, the first camera unit (210) may be equipped with a camera pixel resolution of 1 to 5 μm by applying a lens with a magnification of 1 to 5.

[0074] However, the first camera unit (210) is not limited to this, and it goes without saying that camera units with various specifications can be applied depending on the specifications to be detected. In this case, the first camera unit (210) can be selected to have a pixel resolution of 1 / 5 to 1 / 10 of the specifications to be detected so that the inspection specifications and the coating amount of the active material can be inferred.

[0075] The first camera unit (210) may be equipped with a filter that allows long-wavelength near-infrared (NIR) rays to pass through. More specifically, the filter may be equipped with a filter that allows wavelengths of 840 to 950 nm to pass through the 750 to 3000 nm range of near-infrared (NIR) rays.

[0076] Meanwhile, information on the upper surface of the edge of the unit cell (10) photographed by the first camera unit (210), such as whether a burr occurs, the length of the burr, the area of ​​the burr, and the direction of the burr, can be provided to the control unit (400).

[0077] Here, the burr captured by the first camera unit (210) may be a horizontal burr. At this time, the horizontal burr is a burr that protrudes from the positive electrode collector (11a) and is formed horizontally when the unit cell (10) is viewed from above.

[0078] The first lighting unit (220) may be provided to provide light toward the upper surface of the edge of the unit cell (10). The first lighting unit (220) may be provided as a first a lighting unit (221) that is installed coaxially with the first camera unit (210) and is arranged in a vertical direction (y-axis direction) orthogonal to the horizontal direction of the unit cell (10).

[0079] Here, the first lighting unit (220) may be equipped with lighting that irradiates near-infrared (NIR) rays. More specifically, the first lighting unit (220) may be equipped with lighting that irradiates a wavelength of 840 to 950 nm among the 750 to 3000 nm wavelength range of near-infrared (NIR) rays.

[0080] Accordingly, the first lighting unit (220) can provide light having a wavelength of near infrared (NIR) toward the upper edge surface of the unit cell (10), and the first camera unit (210) can photograph the upper edge surface of the unit cell (10) illuminated with light having a wavelength of near infrared (NIR) through the first lighting unit (220).

[0081] Through the first camera unit (210) and the first lighting unit (220), the visibility of the positive electrode collector (11a), the positive electrode material (11b), and the separator (13) of the unit cell (10) is improved, so that their boundaries can be distinguished more accurately. In particular, due to the difference in reflectivity between the positive electrode material (11b) and the positive electrode collector (11a), the positive electrode collector (11a) can be photographed relatively clearly, and thus, accurate information regarding burrs can be obtained.

[0082] Continuing, the second photographing unit (300) may be equipped to photograph the edge side of the unit cell (10). Here, the edge side of the unit cell (10) may be the edge side of the long side of the unit cell (10).

[0083] In more detail, the second photographing unit (300) may be arranged to be spaced upward from the support unit (100) on which the unit cell (10) is mounted, and may be provided to photograph the edge side of the unit cell (10).

[0084] This second shooting unit (300) may include a second camera unit (310) and a second lighting unit (320).

[0085] First, the second camera unit (310) may be provided to photograph the edge side of the unit cell (10), and the second camera unit (310) may be arranged at an acute angle, for example, 40° to 50°, with respect to the edge side of the unit cell (10). More preferably, the second camera unit (310) may be arranged at an angle of 45° with respect to the edge side of the unit cell (10).

[0086] At this time, the second camera unit (310) may be arranged to be tilted 45° in one direction (9 o'clock direction based on FIG. 3) in which the support member (100) moves the unit cell (10). That is, the second camera unit (310) may be arranged to photograph one edge side according to one direction in which the unit cell (10) moves.

[0087] For example, the second camera unit (310) may be equipped with a camera having a pixel size of 25M (5120X5120 pixels) or more and an image resolution of 1 to 4.5 μm. In addition, as another example, the first camera unit (210) may be equipped with a camera pixel resolution of 1 to 5 μm by applying a lens with a magnification of 1 to 5.

[0088] However, the second camera unit (310) is not limited to this, and can be applied as a camera unit with various specifications depending on the specifications to be detected. In this case, the second camera unit (310) can be selected as a pixel resolution of 1 / 5 to 1 / 10 of the specifications to be detected so as to enable inference of the inspection specifications and the coating amount of the active material.

[0089] Additionally, the second camera unit (310) may be equipped with a filter that allows long-wavelength near-infrared (NIR) rays to pass through. More specifically, the filter may be equipped with a filter that allows wavelengths of 840 to 950 nm to pass through the 750 to 3000 nm range of near-infrared (NIR) rays.

[0090] Meanwhile, information about the edge side of the unit cell (10) photographed by the second camera unit (310), such as whether a burr occurs, the length of the burr, the area of ​​the burr, and the direction of the burr, can be provided to the control unit (400).

[0091] Here, the burr captured by the second camera unit (310) may be a vertical burr. At this time, the vertical burr is a burr that protrudes vertically from the positive electrode collector (11a) when the unit cell (10) is viewed from the side.

[0092] The second lighting unit (320) may be provided to provide light toward the edge side of the unit cell (10). The second lighting unit (320) may be provided as a second a lighting unit (321) that is installed coaxially with the second camera unit (310) and is tilted at an acute angle, for example, 40° to 50°, with respect to the edge side of the unit cell (10).

[0093] Here, the second lighting unit (320) may be equipped with lighting that irradiates near-infrared (NIR) rays. More specifically, the second lighting unit (320) may be equipped with lighting having a wavelength of 840 to 950 nm within the 750 to 3000 nm range of the near-infrared (NIR) wavelength range.

[0094] Accordingly, the second lighting unit (320) can provide light having a wavelength of near infrared (NIR) toward the edge side of the unit cell (10), and the second camera unit (310) can photograph the edge side of the unit cell (10) illuminated with light having a wavelength of near infrared (NIR) through the second lighting unit (320).

[0095] Through the second camera unit (310) and the second lighting unit (320), the visibility of the positive electrode collector (11a), the positive electrode material (11b), and the separator (13) of the unit cell (10) is improved, so that their boundaries can be distinguished more accurately. In particular, due to the difference in reflectivity between the positive electrode material (11b) and the positive electrode collector (11a), the positive electrode collector (11a) can be photographed relatively clearly, and thus, accurate information regarding burrs can be obtained.

[0096] As described above, when only one of the first photographing unit (200) or the second photographing unit (300) is provided, it is possible to detect a burr formed in a horizontal direction or a burr formed in a vertical direction from the positive electrode collector (11a). Therefore, in order to obtain highly reliable information, it is preferable to provide both the first photographing unit (200) and the second photographing unit (300).

[0097] Meanwhile, the control unit (400) can inspect whether the unit cell (10) is defective through the information provided from the first photographing unit (200) and the second photographing unit (300). At this time, the information provided to the control unit (400) from the first photographing unit (200) and the second photographing unit (300) may be the upper surface and the side surface of the edge of the positive electrode (11) of the unit cell (10) photographed by the first camera unit (210) and the second camera unit (310), respectively.

[0098] Additionally, the control unit (400) can receive information about horizontal burrs through the first photographing unit (200) and can receive information about vertical burrs through the second photographing unit (300).

[0099] Whether or not the unit cell (10) is defective can be determined through a burr formed on the edge side of the positive electrode collector (11a) of the unit cell (10).

[0100] For example, the control unit (400) can measure the occurrence of a burr, the length of the burr, the area of ​​the burr, the direction of the burr, etc. by utilizing the brightness deviation (GV deviation, Gray value) for the burr and the positive electrode material (11b). At this time, since the burr is brighter than the active material of the positive electrode material (11b), the GV value per pixel can be measured relatively high.

[0101] For example, if a vertical burr of 5㎛ or more is to be detected using an optical system with a resolution of 1㎛ per image pixel, and if the average GV value for the burr is 180, and if five pixels with a GV value of 180 or more are counted consecutively in the upper and lower direction of the image, it is determined that a burr has occurred, and its length, area, etc. can be measured.

[0102] At this time, the control unit (400) presets a reference value (e.g., length, area, direction, etc. of the burr) for a burr formed on the positive electrode current collector (11a), and compares the upper surface and the side surface of the edge of the unit cell (10) photographed by the first photographing unit (200) and the second photographing unit (300) with the preset reference value to determine whether a burr of the positive electrode current collector (11a) is defective (formed), and determines whether the unit cell (10) is defective.

[0103] In other words, when the measurement results transmitted from the first shooting unit (200) and the second shooting unit (300) deviate from the preset standard value for burr, the corresponding unit cell (10) can be judged as defective.

[0104] In addition, as another example, the control unit (400) can use the deep learning function to determine whether the unit cell (10) is defective. For example, if the control unit (400) receives an image from the first photographing unit (200) and the second photographing unit (00) that has a different singularity from the deep learning-based image for a normal area where no burr has occurred, the control unit (400) can determine that a burr has occurred.

[0105] In addition, the control unit (400) uses the above-described deep learning function to determine whether the unit cell (10) is defective, and if it is determined that a burr has occurred, it is possible to measure the length, area, direction, etc. of the burr by using the brightness deviation (GV deviation, Gray value) between the burr and the cathode material (11b) to determine whether the unit cell (10) is defective.

[0106] Meanwhile, the control unit (400) performs overall control to ensure that each component performs its function normally. This control unit (400) may be implemented in hardware, software, or a combination of hardware and software. The control unit (400) may be implemented in various forms readily apparent to those skilled in the art.

[0107] The control unit (400) can obtain information about burrs in the vertical and horizontal directions in which burrs may occur on the edge side of the positive electrode collector (11a) of the unit cell (10) through the first photographing unit (200) and the second photographing unit (300), and when the information obtained through the first photographing unit (200) and the second photographing unit (300) is combined, measurement and judgment of burrs can be made in 3D form as well.

[0108]

[0109] Fig. 7 is a schematic diagram for explaining a unit cell inspection device according to a second embodiment of the present invention.

[0110] A unit cell inspection device according to a second embodiment of the present invention includes a support unit (100), a first photographing unit (200), a second photographing unit (300), and a control unit (400), similar to the first embodiment.

[0111] However, unlike the first embodiment, in the second embodiment, the first lighting unit (220) and the second lighting unit (320) are not fixed to the same axis as the camera unit, but may be fixed by a separate support member (not shown). Of course, even if the first lighting unit (220) and the second lighting unit (320) are not fixed to the same axis as the camera unit, it is obvious that near-infrared (NIR) must be irradiated to the upper surface and the side surface of the edge of the unit cell (10), respectively.

[0112] Of course, if there is an environment in which sufficient light is secured to photograph the upper surface and side of the edge of the unit cell (10), it is possible to have only one of the first lighting unit (220) and the second lighting unit (320), and this can be applied equally to Example 1.

[0113]

[0114] Fig. 8 is a schematic diagram for explaining a unit cell inspection device according to a third embodiment of the present invention.

[0115] A unit cell inspection device according to a third embodiment of the present invention includes a support unit (100), a first photographing unit (200), a second photographing unit (300), and a control unit (400), similar to the first and second embodiments.

[0116] However, unlike the first and second embodiments, in the third embodiment, the first lighting unit (220) may include both the first a lighting unit (221) and the first b lighting unit (222), and the second lighting unit (320) may include the second a lighting unit (321) and the second b lighting unit (322).

[0117]

[0118] Figure 9 is a flowchart for explaining a unit cell inspection method using a unit cell inspection device according to the present invention.

[0119] Referring to FIGS. 2 to 6 and FIG. 9 together, a method for inspecting a unit cell using a unit cell inspection device according to the present invention includes (S1) a step of mounting a unit cell (10) on the upper side of a support member (100), (S2) a step of photographing the unit cell (10) through a first photographing member (200) and a second photographing member (300), and (S3) a step of inspecting whether the unit cell (10) is defective through a control member (400).

[0120] In step (S1), the support (100) can move the unit cell (10) settled on the upper side to one side (9 o'clock direction based on FIG. 3).

[0121] In addition, in step (S2), the first photographing unit (200) and the second photographing unit (300) can photograph the upper surface and side surface of one edge of the unit cell (10) moving to one side.

[0122] In addition, in step (S3), the control unit (400) can inspect for defects in the unit cell (10) based on information on the upper surface and side of the edge of the unit cell (10) photographed in step (S2).

[0123] Here, whether the unit cell (10) is defective can be determined by comparing one or more of the occurrence of a burr, the length of the burr, the area of ​​the burr, and the direction of the burr with a reference value.

[0124] That is, in step (S3), the control unit (400) presets a reference value (e.g., occurrence, length, area, direction, etc.) for a burr formed on the positive electrode current collector (11a), and compares the upper surface and the side surface of the edge of the unit cell (10) photographed through the first photographing unit (200) and the second photographing unit (300) with the preset reference value to determine whether a burr of the positive electrode current collector (11a) is defective (formed), and determines whether the unit cell (10) is defective.

[0125]

[0126] As described above, specific parts of the present invention have been described in detail. To those skilled in the art, such specific descriptions are merely preferred embodiments, and the scope of the present invention is not limited thereby. It is obvious to those skilled in the art that various changes and modifications are possible within the scope and technical idea of ​​the present invention, and it is natural that such changes and modifications fall within the scope of the appended patent claims.

[0127] (Explanation of symbols)

[0128] 10: Unit cell

[0129] 11: Bipolar

[0130] 11a: Cathode current collector 11b: Cathode material

[0131] 12: Cathode

[0132] 12a: Negative current collector 12b: Negative electrode material

[0133] 13: Membrane

[0134] 100: Support

[0135] 200: First Filming Unit

[0136] 210: First camera unit

[0137] 220: First lighting unit

[0138] 221: 1a lighting unit 222: 1b lighting unit

[0139] 300: Second Filming Unit

[0140] 310: Second camera unit

[0141] 320: Second lighting unit

[0142] 321: 2a lighting unit 322: 1b lighting unit

[0143] 400: Control Unit

Claims

1. A device for inspecting whether a burr occurs on the cross-section of a unit cell. A support on which the above unit cell is mounted; A first photographing unit for photographing the upper surface of the edge of the unit cell; and A unit cell inspection device characterized by including a second photographing unit for photographing the edge side of the unit cell.

2. In paragraph 1, The first photographing unit includes a first camera unit that photographs the upper surface of the edge of the unit cell, The second photographing unit includes a second camera unit that photographs the edge side of the unit cell, A unit cell inspection device characterized by including at least one of a first lighting unit that provides light toward the upper edge surface of the unit cell and a second lighting unit that provides light toward the edge side surface of the unit cell.

3. In paragraph 2, A unit cell inspection device characterized in that the second camera unit is arranged so as to form an acute angle with the edge side of the unit cell.

4. In paragraph 3, A unit cell inspection device characterized in that the first lighting unit and the second lighting unit are equipped with near-infrared (NIR) lighting.

5. In paragraph 4, A unit cell quality inspection device, characterized in that the first lighting unit and the second lighting unit are equipped with lighting having a wavelength of 840 to 950 nm.

6. In paragraph 4, The above first lighting unit is installed coaxially with the above first camera unit, A unit cell inspection device, characterized in that the second lighting unit is installed coaxially with the second camera unit.

7. In paragraph 4, A unit cell inspection device characterized in that the first camera unit and the second camera unit are equipped with a filter that allows near-infrared (NIR) rays to pass through.

8. In paragraph 7, A unit cell inspection device characterized in that the above filter passes a wavelength of 840 to 950 nm.

9. In paragraph 2, A unit cell inspection device characterized in that the above support is a conveyor.

10. In paragraph 2, A unit cell inspection device characterized in that it further includes a control unit that inspects whether the unit cell is defective through information provided from the first and second photographing units.

11. In paragraph 10, A unit cell inspection device characterized in that the information provided from the first and second photographing units includes at least one of the following: whether a burr occurs on the edge side and / or the edge upper surface of the anode, the length of the burr, the area of ​​the burr, and the direction of the burr.

12. In paragraph 1, A unit cell inspection device characterized in that the above unit cell is any one of a monocell, an A-type bicell, a C-type bicell, and a half cell.

13. A unit cell inspection method using a unit cell inspection device according to any one of clauses 1 to 12, (S1) A step of settling the unit cell on the upper side of the support; (S2) a step of photographing the unit cell through the first photographing unit and the second photographing unit; and (S3) A unit cell inspection method, characterized by including a step of inspecting whether the unit cell is defective through the control unit.

14. In paragraph 13, A unit cell inspection method characterized in that, in the step (S3), whether the unit cell is defective is determined by comparing a reference value with at least one of the occurrence of a burr, the length of the burr, the area of ​​the burr, and the direction of the burr.

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