Electrosurgical instrument and method of detecting tissue accumulation on end effector

The electrosurgical instrument uses non-therapeutic RF energy to measure impedance in the open jaw position, addressing debris accumulation issues and ensuring consistent seal quality by adjusting energy delivery or alerting users to clean the instrument.

WO2026022679A1 Publication Date: 2026-01-29CILAG GMBH INTERNATIONAL
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Patent Information

Application Number
PCT/IB2025/057378
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-07-25
Filing Date
2025-07-22
Publication Date
2026-01-29

AI Technical Summary

Technical Problem

Buildup of surgical debris on the end-effector of electrosurgical instruments leads to poor sticking performance, premature termination of energy delivery, and interference with sensing technologies, posing risks to seal quality and accuracy.

Method used

The instrument employs non-therapeutic RF energy to measure tissue impedance in the open jaw position, using impedance sensing to detect debris accumulation and adjust energy delivery algorithms or alert the user when cleaning is needed.

Benefits of technology

This method effectively detects debris buildup, ensuring consistent seal quality by maintaining optimal energy delivery and preventing interference with sensing technologies.

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Abstract

A surgical instrument includes an end effector and a controller. The end effector includes a first jaw, a second jaw, and an electrode associated with the first jaw. The first jaw and the second jaw can move between an open position and a clamped position in order to grasp tissue. Further, the electrode emits a therapeutic energy cycle to seal the grasped tissue. The controller can measure an impedance parameter associated with the end effector and compare the measured impedance parameter with an upper predetermined threshold. Further the controller can generate a cleaning instruction or alter an energy delivery algorithm of the RF therapeutic energy cycle if the measured impedance parameter is greater than the upper predetermined threshold.
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