Feeder automation test method and apparatus, device and storage medium
By introducing HLA and Agent architecture into the automated feeder testing, the test master station and test instrument can work together to solve the problem of low test reliability, ensure the orderly conduct of the test process, and improve the accuracy of test results.
Patent Information
- Application Number
- PCT/CN2024/142064
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-08-12
- Filing Date
- 2024-12-25
- Publication Date
- 2026-02-19
AI Technical Summary
Existing automated feeder testing methods lack coordination mechanisms between the test master station and the test instrument, resulting in low test reliability and a high risk of failure due to coordination issues.
By calculating the effective values of voltage and current of the feeder automation system under different fault handling conditions, and utilizing the HLA and Agent architecture, the test master station and test instrument are coordinated to achieve the coordinated operation, including time management strategies and message passing mechanisms, to ensure the accuracy and coordination of electrical quantity injection time windows.
This improved the reliability of automated feeder testing, ensured the orderly and coordinated progress of the testing process, and enhanced the accuracy and reliability of the test results.
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Figure CN2024142064_19022026_PF_FP_ABST
Abstract
Description
Feeder automation test method, device, equipment and storage medium TECHNICAL FIELD
[0001] The present application relates to the technical field of feeder automation test, and particularly relates to a feeder automation test method, device, equipment and storage medium. BACKGROUND
[0002] Due to feeder automation (FA) protection and control principle defects, cooperation between terminals of different manufacturers or different versions, communication interference or interruption, terminal parameter errors, inconsistency between main station topology and actual situation, main station front-end machine blockage and other problems, the success rate of the actually put into operation FA is reduced, and manual operation often occurs. Therefore, power grid companies mostly carry out warehouse debugging or on-site FA logic function test before the distribution automation is put into operation.
[0003] The existing FA test method mainly includes a main station injection test method, a terminal injection test method and a main station and secondary synchronization injection test method. The above test methods have been applied to the performance test of feeder automation system fault handling, and certain results have been achieved. However, in the existing FA test, many elements such as a distribution main station, a test main station, communication equipment, test equipment, a complex primary network frame and a large number of secondary terminals are involved, and the FA test is realized by the cooperation of the above many elements. It is a process of promoting by the test main station commanding multiple test instruments. Any problem in the cooperative process between the test main station and the test instrument may lead to the failure of the FA test, which greatly reduces the reliability of the FA test. However, the existing FA test method does not study the cooperative promotion means of the test main station and the test instrument, and the reliability of the FA test is not high. SUMMARY
[0004] The present application provides a feeder automation test method, device, equipment and storage medium to solve the technical problem that the existing FA test method does not study the cooperative promotion means of the test main station and the test instrument, and the reliability of the FA test is not high.
[0005] In order to solve the above technical problem, the present application provides a feeder automation test method, which comprises the following steps:
[0006] The effective value of the voltage and the effective value of the current of each node in the power distribution network frame under different fault handling sections of the feeder automation system are calculated.
[0007] send the voltage effective value and the current effective value to the corresponding tester, so that the corresponding tester, after receiving the voltage effective value and the current effective value, converts the voltage effective value into an analog quantity voltage waveform, converts the current effective value into an analog quantity current waveform, outputs the analog quantity voltage waveform and the analog quantity current waveform to the corresponding field power distribution terminal, and returns the switch position change information of the field power distribution terminal;
[0008] compare the switch position change information with the standard feeder automation action logic preset under the corresponding fault handling section, and then obtain the test result of the feeder automation according to the comparison result.
[0009] As a preferred solution, before calculating the voltage effective value and the current effective value of each node in the power distribution network framework under different fault handling sections of the feeder automation system, the method further comprises:
[0010] apply to the RTI runtime support environment for registration of the corresponding electrical quantity injection time window, until a time window registration success notification returned by the RTI is received;
[0011] after receiving the time window registration success notification, start the feeder automation test, apply to the RTI runtime support environment for a runtime window, so that the time window of the RTI runtime support environment starts to run.
[0012] As a preferred solution, sending the voltage effective value and the current effective value to the corresponding tester comprises:
[0013] when the RTI runtime support environment detects that the time window reaches the injection point, the voltage effective value and the current effective value are sent to the corresponding tester.
[0014] As a preferred solution, outputting the analog quantity voltage waveform and the analog quantity current waveform to the corresponding field power distribution terminal, and returning the switch position change information of the field power distribution terminal, comprises:
[0015] output the analog quantity voltage waveform and the analog quantity current waveform to the corresponding field power distribution terminal, so that the corresponding field power distribution terminal acts according to the analog quantity voltage waveform and the analog quantity current waveform to generate corresponding switch quantity;
[0016] generate the corresponding switch position change information according to the switch quantity of the field power distribution terminal, and return the switch position change information to the test master station.
[0017] As a preferred solution, the comparison of the switch position change information with the standard feeder automation action logic preset under the corresponding fault handling section, and then obtaining the test result of the feeder automation according to the comparison result, comprises:
[0018] The switch position information is compared with the preset standard feeder automation action logic under the corresponding fault handling section condition, when the switch position information is consistent with the preset standard feeder automation action logic under the corresponding fault handling section condition, it is determined that the feeder automation logic of the field power distribution terminal is correct, when the switch position information is not consistent with the preset standard feeder automation action logic under the corresponding fault handling section condition, it is determined that the feeder automation logic of the field power distribution terminal is incorrect.
[0019] On the basis of the above-mentioned embodiment, another embodiment of the present application provides a feeder automation testing device, comprising: an effective value calculation module, a switch position information acquisition module and a logic comparison module.
[0020] The effective value calculation module is used to calculate the voltage effective value and the current effective value of each node in the power distribution network framework under different fault handling section conditions of the feeder automation system.
[0021] The switch position information acquisition module is used to send the voltage effective value and the current effective value to the corresponding tester, so that the corresponding tester converts the voltage effective value into an analog voltage waveform, converts the current effective value into an analog current waveform, outputs the analog voltage waveform and the analog current waveform to the corresponding field power distribution terminal, and returns the switch position information of the field power distribution terminal.
[0022] The logic comparison module is used to compare the switch position information with the preset standard feeder automation action logic under the corresponding fault handling section condition, and then obtain the testing result of the feeder automation according to the comparison result.
[0023] As a preferred scheme, it further comprises a time window registration module and a time window running module.
[0024] The time window registration module is used to apply for registration of the corresponding electrical quantity injection time window to the RTI running time support environment, until the time window registration success notification returned by the RTI is received.
[0025] The time window running module is used to start the feeder automation testing after receiving the time window registration success notification, apply for running the time window to the RTI running time support environment, so that the time window of the RTI running time support environment starts running.
[0026] As a preferred scheme, the analog voltage waveform and the analog current waveform are output to the corresponding field power distribution terminal, and the switch position information of the field power distribution terminal is returned, which comprises:
[0027] output the analog quantity voltage waveform and the analog quantity current waveform to the corresponding field power distribution terminal, so that the corresponding field power distribution terminal acts according to the analog quantity voltage waveform and the analog quantity current waveform to generate a corresponding switching quantity;
[0028] According to the switching quantity of the field power distribution terminal, corresponding switching displacement information is generated and returned to the test master station.
[0029] On the basis of the above-mentioned embodiments, a further embodiment of the application provides an electronic device, which comprises a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, and the processor implements the feeder automation test method described in the above-mentioned embodiments of the application when executing the computer program.
[0030] On the basis of the above-mentioned embodiments, a further embodiment of the application provides a storage medium, which comprises a stored computer program, wherein the device where the storage medium is located executes the feeder automation test method described in the above-mentioned embodiments of the application when the computer program runs.
[0031] Compared with the prior art, the embodiments of the application have the following beneficial effects:
[0032] The application provides a feeder automation test method, which firstly calculates, by a test master station, voltage effective values and current effective values of each node in a power grid framework of a feeder automation system under different fault handling sections; then sends the voltage effective values and the current effective values to corresponding test instruments, so that the corresponding test instruments, after receiving the voltage effective values and the current effective values, convert the voltage effective values into analog quantity voltage waveforms, convert the current effective values into analog quantity current waveforms, output the analog quantity voltage waveforms and the analog quantity current waveforms to corresponding field power distribution terminals, and the field power distribution terminals act according to the analog quantity voltage waveforms and the analog quantity current waveforms, and return switching displacement information of the field power distribution terminals to the test master station by the test instruments; the test master station compares the switching displacement information with a standard feeder automation action logic preset under the corresponding fault handling section, and then obtains a test result of the feeder automation according to a comparison result. The feeder automation test method of the application studies the collaborative promotion of the test master station and the test instruments, and cooperatively tests the test master station electrical quantity injection, communication between the test master station and the test instruments, test instrument processing, power distribution terminal processing, and the like, thereby improving the reliability of the feeder automation test. BRIEF DESCRIPTION OF DRAWINGS
[0033] Fig. 1 is a flowchart of a feeder automation test method according to an embodiment of the application;
[0034] Fig. 2 is a diagram of the time window of the injection of the electrical quantity of the main station of the FA test;
[0035] Fig. 3 is a diagram of the architecture of the FA test system;
[0036] Fig. 4 is a diagram of the basic structure of the HLA;
[0037] Fig. 5 is a diagram of the basic structure of the Agent;
[0038] Fig. 6 is a diagram of the overall architecture of the FA test system based on the HLA / Agent;
[0039] Fig. 7 is a diagram of the interface functions of the RTI;
[0040] Fig. 8 is a diagram of the collaborative promotion strategy of the FA test based on the HLA;
[0041] Fig. 9 is a diagram of the specific promotion process of the FA test;
[0042] Fig. 10 is a diagram of the structure of a feeder automation test device according to an embodiment of the present application. DETAILED DESCRIPTION
[0043] In order to make the objectives, technical solutions and advantages of the present application clearer, the technical solutions in the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the scope of protection of the present application.
[0044] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the present application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit the present application; the terms "include" and "have" and any variations thereof in the specification and claims of the present application and the above description of drawings are intended to cover non-exclusive inclusion.
[0045] In the description of the embodiments of the present application, the technical terms "first", "second", etc. are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the meaning of "a plurality of" is two or more, unless otherwise explicitly specified.
[0046] Reference herein to "one embodiment" or "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase "in one embodiment" or "an embodiment" in various places in the specification are not necessarily all referring to the same embodiment, nor are they necessarily mutually exclusive of one another. It is expressly understood that any of the embodiments described herein can be incorporated into any other embodiment.
[0047] In the description of the embodiments of the present application, the term "and / or" is merely used to describe an associated relationship between associated objects, and indicates that three relationships can exist, for example, A and / or B can mean that A exists alone, A and B exist together, and B exists alone. In addition, the character " / " herein generally indicates that the front and rear associated objects are in an "or" relationship.
[0048] In the description of the embodiments of the present application, the term "a plurality of" refers to two or more (including two), and similarly, "a plurality of groups" refers to two or more groups (including two groups), and "a plurality of pieces" refers to two or more pieces (including two pieces).
[0049] In the description of the embodiments of the present application, unless otherwise explicitly specified and limited, the technical terms "mounting", "connection", "connection", "fixing" and the like should be understood in a broad sense, for example, can be fixedly connected, or can be detachably connected, or can be integrated; can be mechanically connected, or can be electrically connected; can be directly connected, or can be indirectly connected through an intermediate medium, or can be the internal communication of two elements or the interaction relationship between two elements. For those skilled in the art, the specific meaning of the above terms in the embodiments of the present application can be understood according to the specific circumstances.
[0050] Embodiment one
[0051] Please refer to FIG. 1, which is a flowchart of a feeder automation test method provided by an embodiment of the present application, including the following specific steps:
[0052] S1, calculating the voltage effective value and the current effective value of each node in the power distribution network framework under different fault handling section conditions of the feeder automation system;
[0053] Preferably, before calculating the voltage effective value and the current effective value of each node in the power distribution network framework under different fault handling section conditions of the feeder automation system, it further includes: applying to the RTI runtime support environment for registration of a corresponding electrical quantity injection time window, until a time window registration success notification returned by the RTI is received; after receiving the time window registration success notification, starting to perform feeder automation test, applying to the RTI runtime support environment for a runtime window, so that the time window of the RTI runtime support environment starts to run.
[0054] In view of the problems existing in the prior art, the application proposes a collaborative promotion means for FA testing based on a high-level architecture (HLA) and an agent (Agent) to improve the reliability of FA testing and realize orderly and collaborative promotion of the dynamic process of FA testing.
[0055] The application first establishes an HLA / Agent-based FA testing framework based on the principles of HLA and Agent; then, based on the HLA time management service, analyzes a time management strategy and a message passing mechanism suitable for the collaborative promotion of FA testing, and in combination with a test master station electrical quantity injection time window, proposes an FA testing collaborative promotion strategy. It should be noted that the test master station electrical quantity injection time window is a key problem of FA testing, and is the brain commanding the orderly promotion of FA testing according to each section. The time constraint passed by each node is the key to the success or failure of FA testing. Please refer to FIG. 2 for a schematic diagram of the test master station electrical quantity injection time window.
[0056] I. FA field test system framework
[0057] The FA field test system framework mainly consists of a test master station, a communication network, a test instrument, a virtual relay protection device, a virtual power distribution terminal and a field power distribution terminal. Please refer to FIG. 3 for a diagram of the FA test system framework.
[0058] In FIG. 3, the test master station is the command center of FA testing and should at least have: (1) a 10kV primary equipment power distribution network framework to be built, with the ability of power distribution network power flow calculation and short-circuit calculation, to generate voltage and current electrical quantity effective values of each time sequence of FA; (2) the test master station sends the electrical quantity effective values of each node of the framework to the test instrument, and receives the simulated circuit breaker position information of the test instrument; (3) a virtual power distribution terminal module with "three remote" and FA functions of the physical power distribution terminal; (4) a virtual protection device module with at least current protection I~II, zero sequence current protection and reclosing functions. The test instrument should have the function of receiving the electrical quantity effective value information of the test master station and converting it into continuous analog waveform to inject into the field power distribution terminal.
[0059] II. HLA / Agent principles
[0060] HLA is a general high-level architecture in the field of modeling and simulation, which consists of a simulation federation and a plurality of federation members. The simulation federation refers to a hybrid simulation system composed of multiple different simulation platforms, and the federation member refers to a simulation program running in the simulation federation. The interface standard of HLA is realized by RTI, which defines time management services including time management strategies and message passing mechanisms to ensure the correctness of the collaborative promotion among the federation members. Please refer to FIG. 4 for a basic structure diagram of HLA.
[0061] Agent is an intelligent entity that can perceive the environment and act on it, with autonomy, reactivity, and interactivity. The basic idea is to divide the research object into multiple Agents according to different functions, each Agent contains specific functions, by studying the specific functions of individual system, and then obtaining the macro behavior of the system, which can clearly reflect the coupling relationship between the functions of the FA test elements, and improve the efficiency of the cooperation between the modules in the test master station and the test instrument. Please refer to Figure 5 for the basic structure of Agent.
[0062] The main structure of Agent can be divided into three types: reactive, deliberative and hybrid. Reactive Agent can quickly respond when the conditions set by itself are met, with fast response speed, but without reasoning ability; deliberative Agent can reason and respond according to external models, so its response speed is slower. Hybrid Agent integrates the advantages of the first two, it can both reason and respond quickly. The choice of Agent main structure should be based on the functional requirements of the device or software. For example, the simulation Agent of the test master station needs to perform power flow calculation or short circuit calculation on the voltage and current at each circuit breaker, load switch and sectionalizing switch node in the distribution network, involving the calculation and reasoning of its own data, so it is appropriate to use a deliberative structure; while for the analog output interface Agent of the test instrument, since it only receives voltage and current analog waveform data and forwards them, there is no reasoning process, so a reactive structure can be used.
[0063] III. FA test collaborative promotion framework
[0064] Please refer to Figure 6 for the overall architecture of the FA test system based on HLA / Agent, which is composed of test master station federation members, test instrument federation members and field distribution terminal. Each federation member is composed of multiple Agents, and the information exchange between the test master station and the test instrument is realized under the optical fiber or wireless communication wide area network, and the collaborative promotion of each element of FA test is realized under the support of RTI interface, to achieve the established FA test goal.
[0065] The test master station federation member includes:
[0066] (1) Simulation Agent: with power flow calculation and short circuit calculation functions for distribution network, responsible for generating the effective value of voltage and current at each node of the distribution network; with distribution network topology change function, receiving analog circuit breaker position change information and changing the distribution network topology; with FA logic correctness determination function, mainly responsible for determining the switch action information fed back from the field distribution terminal to the master station, if it meets the established FA logic, the topology will be changed and the next test will continue, otherwise the test will be stopped.
[0067] (2) Virtual relay protection Agent: with functions of current protection I~II, zero sequence current protection and secondary reclosing; Virtual distribution terminal Agent: with functions of "three remote" and FA of physical distribution terminal.
[0068] (3) FA test time sequence section control Agent: according to FA test flow, it is divided into multiple FA test time sequence sections, and FA test is carried out according to the time sequence section.
[0069] (4) RTI interface and RTI runtime support environment: according to the time management service of RTI runtime support environment, it is orderly promoted according to the established time window of FA test master station electrical quantity injection.
[0070] Test instrument federation members include:
[0071] (1) Waveform generation Agent: responsible for receiving test master station voltage and current effective value information, and generating continuous voltage and current analog waveform.
[0072] (2) Analog circuit breaker Agent: responsible for receiving switch quantity information of field distribution terminal, and simulating field switch action as an analog circuit breaker.
[0073] (3) Interface Agent: on the one hand, it continuously outputs waveform to the distribution terminal, and on the other hand, it receives switch quantity of the distribution terminal. Communication between Agents is realized by KQML to support cooperative work between simulation entity Agents. KQML message follows the following syntax format:
[0074] (ask-all / / operation name;
[0075] :sender Agent sending the message;
[0076] :receiver Agent receiving the message;
[0077] :content specific content of the message expressed by the communication primitive;
[0078] :language name of the language used in the content parameter field;
[0079] :ontology name of the term definition set in the content parameter field)
[0080] The time management service of RTI runtime support environment is the key to realize the cooperative promotion of FA test. Therefore, first, the test master station and test instrument are connected to the RTI runtime support environment through the RTI interface. Please refer to FIG. 7 for a schematic diagram of various RTI interface functions.
[0081] Four, FA test cooperative promotion strategy based on HLA
[0082] 4.1 Time management strategy
[0083] In the voltage time type FA test, the effective value injection time window of the electrical quantity of the test master station, the network delay between the test master station and the tester, the processing time of each element, the closing time limit (X time limit) with pressure on one side, the locking time limit (Y time limit), the reclosing time and other time factors are the key to the success of the FA test promotion. Therefore, the time management service in HLA is introduced to ensure the cooperation and promotion of each element in the FA test. Time management mainly includes three aspects of time management strategy of federal members, message passing mechanism and logical time promotion.
[0084] The time management strategy of federal members in HLA describes the relationship between the logical time promotion of federal members and other federal members, which is divided into time control and time limited, as shown in the following table 1.
[0085] Table 1 Time management strategy type and meaning
[0086] In the process of FA test promotion, the test master station injects voltage and current electrical quantity to each tester according to the electrical quantity injection time window, which affects the operation of each tester. However, the test master station is not affected by the tester federal member due to the control of the test master station time window, so the test master station federal member adopts only "time control" mode; The tester needs to receive the voltage and current effective value of the test master station to generate continuous analog quantity waveform output to the field distribution terminal, so the tester is affected by the voltage and current effective value injection of the test master station. However, the test master station has set the injection point of electrical quantity, so the processing time of the tester does not affect the time promotion of the test master station, and the tester is "time limited".
[0087] 4.2 Message passing mechanism
[0088] The message passing mechanism of HLA includes two aspects: one is the message transmission mode; The second is the message passing sequence. Among them, the message transmission mode is divided into "reliable" and "best effort" two kinds, the former adopts TCP / IP protocol, has retransmission mechanism, that is, when a message passing fails, it will be transmitted again, which can effectively guarantee the reliability of information transmission, but usually needs to increase the transmission delay. The latter adopts UDP / IP protocol, does not have retransmission mechanism, so its transmission reliability is poor, but can effectively reduce the transmission delay. The time window constraint condition of the effective value injection of electrical quantity in the process of FA test involves high time delay requirement, and for reliability, the reliability of information transmission can be improved by setting messages and heartbeats in the test master station, so the "best effort" mode is more suitable.
[0089] HLA supports two message passing orders: receiving order (RO) and time stamp order (TSO). RO is the way with minimum delay, RTI creates a queue for each federation member and passes messages to the member in FIFO order. This way is used in the case where the requirement for transmission delay is higher than the requirement for causality; TSO is the way to guarantee message causality, RTI will ensure that all messages delivered to the member are in time stamp order, i.e. the received messages are stored in the queue until it is confirmed that there is no smaller time stamp message to arrive, and then these messages are forwarded to the member.
[0090] If the system requires causality higher than the delay requirement, TSO is used for transmission to ensure the correctness of the causality logic in the system; if the system requires delay higher than the causality requirement, RO is used for transmission to improve transmission speed. There are many time factors involved in the FA test process, such as one side of the pressure delay closing time limit (X time limit), lockout determination time limit (Y time limit), residual voltage lockout discrimination time limit (Z time limit), contact switch delay closing time limit (XL time limit) and reclosing time limit. As long as the electrical quantity injection time window constraint condition proposed in this paper is met, the orderly progress of FA test can be guaranteed, therefore, the "RO" way with the smallest delay is needed to be used to better adapt to the FA test master electrical quantity effective value injection time window and ensure the orderly collaborative progress of FA test.
[0091] 4.3 FA test collaborative progress strategy based on HLA
[0092] Please refer to Figure 8 for the FA test collaborative progress strategy based on HLA. First, the pre-test preparation work is carried out, the test master and test instrument federation members apply for registration of electrical quantity effective value injection time window to RTI runtime support environment through registerFederationSynchronizationPoint() function, and RTI will return synchronizationPointRegistrationSuceeded() function to inform each federation member of the success of time window registration. Then the FA test can be started, the test master applies for runtime window to RTI runtime support environment through nextEventRequest() function, after the runtime window starts, when a certain injection point is reached, RTI runtime support environment sends timeAdvanceGrant() function to inform the test master federation member to allow injection, the test master starts effective value injection immediately, and so on, until the FA test is completed.
[0093] 4.4 FA test collaborative progress process based on HLA
[0094] During the FA test process, due to the influence of continuous and discrete events such as test master station voltage and current electrical quantity injection, optical fiber or wireless communication network delay, test instrument processing, power distribution terminal processing, protection device processing, and important time factors such as one-side voltage delay closing time limit (X time limit) and locking determination time limit (Y time limit) existing in the test process, it may cause the FA test to advance incorrectly, and even fail. Therefore, based on the powerful time advance function of HLA, combined with the effective value injection time window of the test master station electrical quantity, the orderly advancement of the FA test is ensured. Please refer to FIG. 9 for the specific advancement process diagram of the FA test.
[0095] The advancement process is as follows:
[0096] (1) The test master station applies for registration of the electrical quantity injection time window to the RTI runtime support environment, and the RTI informs the test master station that the time window registration is successful. The FA test starts, and the test master station applies for a runtime window to the RTI runtime support environment. The time window starts running.
[0097] (2) The test master station builds a measured power distribution network framework. Through power flow calculation and short-circuit calculation, the voltage effective value and current effective value of each node in the power distribution network framework under different fault handling sections of the feeder automation system are obtained.
[0098] Specifically, the test master station includes a power distribution network simulation platform. The power distribution network framework can be built, and the fault can be set. Combined with the power flow calculation and short-circuit calculation theoretical formula algorithm, the voltage and current effective values of each node under different fault handling sections of the FA are automatically generated through the simulation platform.
[0099] S2, send the voltage effective value and current effective value to the corresponding test instrument, so that the corresponding test instrument converts the voltage effective value into an analog voltage waveform and the current effective value into an analog current waveform after receiving the voltage effective value and current effective value, outputs the analog voltage waveform and analog current waveform to the corresponding field power distribution terminal, and returns the switch displacement information of the field power distribution terminal;
[0100] Preferably, sending the voltage effective value and current effective value to the corresponding test instrument comprises: when the RTI runtime support environment detects that the time window reaches the injection point, sending the voltage effective value and current effective value to the corresponding test instrument.
[0101] Preferably, the analog voltage waveform and the analog current waveform are output to the corresponding field power distribution terminal, and the switch position information of the field power distribution terminal is returned, including: outputting the analog voltage waveform and the analog current waveform to the corresponding field power distribution terminal, so that the corresponding field power distribution terminal acts according to the analog voltage waveform and the analog current waveform to generate a corresponding switch quantity; generating corresponding switch position information according to the switch quantity of the field power distribution terminal, and returning the switch position information to the test master station.
[0102] (3) The test master station injects the voltage and current effective value data into the tester:
[0103] The RTI runtime support environment monitors the time window to reach the first injection point, and then informs the test master station to allow the first injection. The test master station injects the voltage effective value and the current effective value into the tester, the virtual relay protection device and the virtual power distribution terminal, respectively, with field and virtual network delays.
[0104] (4) After the tester receives the data, the effective value is converted into an analog voltage and current waveform, which is continuously output to the field power distribution terminal:
[0105] For the field: the tester converts the effective value data into continuous voltage and current analog waveforms: the voltage effective value is converted into an analog voltage waveform, and the current effective value is converted into an analog current waveform; for the virtual device: the waveforms are simulated and generated inside the virtual protection and virtual power distribution terminal. Specifically, the tester itself contains a function module that expands the voltage and current effective value into a waveform, which can accept the effective value of the test master station and automatically generate an analog waveform output to the power distribution terminal.
[0106] For the field: the tester continuously injects the voltage and current analog waveforms into the field power distribution terminal. For the virtual device: the waveforms are simulated and injected inside the virtual device.
[0107] (5) After the field power distribution terminal receives the analog voltage and current waveforms, if it needs to act, it will return the switch quantity to the tester simulation circuit breaker; the virtual device starts the protection principle judgment and the FA principle judgment, and if it acts, it will return the switch quantity to the simulation circuit breaker in the virtual device.
[0108] Specifically, if the fault setting value is exceeded, the power distribution terminal will act (open), otherwise, if the power distribution terminal is continuously powered and meets the FA logic, it will be closed (specifically refer to the FA logic). After acting, the power distribution terminal will generate a switch quantity and return it to the tester simulation circuit breaker. The returned switch quantity can be understood as a signal "1" or "0", for example, "1" represents the switch closed, and "0" represents the switch open.
[0109] (6) For the field: the tester acts as a simulated circuit breaker; for the virtual device: simulate the circuit breaker action inside the virtual device.
[0110] For the field: the tester simulates the circuit breaker to return the switch position information to the test master station, with field network delay; for the virtual device: the virtual device returns the switch position information to the test master station, with virtual network delay.
[0111] Specifically, the tester as a simulated circuit breaker accepts signal "1" and responds to signal "1" to act. After the simulated circuit breaker acts, "switch position information" is generated, which can also be understood as "1" and "0", for example, "1" is the closed state of the switch, and "0" is the open state of the switch, which is sent back to the test master station, and the test master station acts according to the switch position information to simulate the power distribution network topology.
[0112] S3, compare the switch position information with the standard feeder automation action logic preset under the corresponding fault handling section, and then obtain the test result of the feeder automation according to the comparison result.
[0113] Preferably, the comparison of the switch position information with the standard feeder automation action logic preset under the corresponding fault handling section, and then obtaining the test result of the feeder automation according to the comparison result, comprises: comparing the switch position information with the standard feeder automation action logic preset under the corresponding fault handling section, when the switch position information conforms to the standard feeder automation action logic preset under the corresponding fault handling section, it is determined that the feeder automation logic of the field power distribution terminal is correct; when the switch position information does not conform to the standard feeder automation action logic preset under the corresponding fault handling section, it is determined that the feeder automation logic of the field power distribution terminal is incorrect.
[0114] (7) For the field: the test master station determines the correctness of the switch position information; for the virtual device: since it is independently developed, the correctness of the switch position information can be ensured, so there is no need to determine.
[0115] (8) The test master station simulates the action of the network topology.
[0116] (9) The RTI runtime support environment monitors the time window to reach the second injection point, and immediately informs the test master station to allow the second effective value injection.
[0117] (10) According to the above process, the sequence is pushed forward until the FA test is completed.
[0118] The test master station comprises a correct FA logic process, and in the test process, the test master station compares the switch position of each section of the actual test network frame with the correct FA action logic to realize the correct FA logic judgment.
[0119] Embodiment two
[0120] Referring to FIG. 10, a structural schematic diagram of a feeder automation test device provided by an embodiment of the present application is shown, which comprises an effective value calculation module, a switch position information acquisition module and a logic comparison module.
[0121] The effective value calculation module is configured to calculate the voltage effective value and the current effective value of each node in the power distribution network frame under different fault handling section conditions of the feeder automation system.
[0122] The switch position information acquisition module is configured to send the voltage effective value and the current effective value to the corresponding test instrument, so that the corresponding test instrument converts the voltage effective value into an analog voltage waveform, converts the current effective value into an analog current waveform, outputs the analog voltage waveform and the analog current waveform to the corresponding field power distribution terminal, and returns the switch position information of the field power distribution terminal.
[0123] The logic comparison module is configured to compare the switch position information with the standard feeder automation action logic preset under the corresponding fault handling section condition, and then obtain the test result of the feeder automation according to the comparison result.
[0124] Preferably, the device further comprises a time window registration module and a time window running module; the time window registration module is configured to apply for registration of the corresponding electrical quantity injection time window to the RTI running time support environment until a time window registration success notification returned by the RTI is received; and the time window running module is configured to start the feeder automation test after the time window registration success notification is received, apply for running of the time window to the RTI running time support environment, so that the time window of the RTI running time support environment starts running.
[0125] Preferably, the outputting of the analog voltage waveform and the analog current waveform to the corresponding field power distribution terminal and the returning of the switch position information of the field power distribution terminal comprise: outputting the analog voltage waveform and the analog current waveform to the corresponding field power distribution terminal, so that the corresponding field power distribution terminal performs an action according to the analog voltage waveform and the analog current waveform to generate a corresponding switch quantity; and generating the corresponding switch position information according to the switch quantity of the field power distribution terminal and returning the switch position information to the test master station.
[0126] It should be noted that the apparatus embodiments described above are only illustrative, and the units described as separate components can or can not be physically separated, and the components displayed as units can or can not be physical units, i.e., they can be located in one place or distributed on multiple network units. Part or all of the modules can be selected to achieve the purpose of the embodiment according to actual needs. In addition, the connection relationship between the modules in the apparatus embodiments provided by the present application indicates that there is a communication connection between them, which can be implemented as one or more communication buses or signal lines. Those skilled in the art can understand and implement it without creative labor.
[0127] Those skilled in the art can clearly understand that, for the convenience and brevity, the specific working process of the apparatus described above can refer to the corresponding process in the foregoing method embodiments, which will not be repeated here.
[0128] Embodiment three
[0129] Correspondingly, an electronic device is provided, which includes a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, and the processor implements the feeder automation test method described in the foregoing embodiments of the application when executing the computer program.
[0130] The electronic device can be a desktop computer, a notebook computer, a palm computer, a cloud server, and the like. The device can include but is not limited to a processor and a memory.
[0131] The processor can be a central processing unit (CPU), and can also be other general-purpose processors, digital signal processors (DSP), application specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, and the like. The general-purpose processor can be a microprocessor or any conventional processor, and the like. The processor is the control center of the device, and is connected with various parts of the device through various interfaces and lines.
[0132] Embodiment four
[0133] Correspondingly, the embodiment of the present application provides a storage medium, the storage medium comprising a stored computer program, wherein the computer program controls a device where the storage medium is located to perform the feeder automation test method when the computer program is running.
[0134] The memory can be used to store the computer program, and the processor realizes various functions of the device by running or executing the computer program stored in the memory and calling data stored in the memory. The memory can mainly include a program storage area and a data storage area, wherein the program storage area can store an operating system, at least one application required by a function, and the like; and the data storage area can store data created according to the use of the mobile phone and the like. In addition, the memory can include a high-speed random access memory, and can also include a non-volatile memory, for example, a hard disk, a memory, a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, at least one disk storage device, a flash memory device, or other volatile solid-state memory devices.
[0135] The storage medium is a computer readable storage medium, and the computer program is stored in the computer readable storage medium. The computer program can realize the steps of each method embodiment when executed by the processor. The computer program includes computer program code, which can be in the form of source code, object code, executable files, or some intermediate forms, etc. The computer readable medium can include any entity or device capable of carrying the computer program code, recording medium, U disk, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electrical carrier signal, telecommunication signal, and software distribution medium, etc. It should be noted that the contents included in the computer readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction, for example, in some jurisdictions, according to legislation and patent practice, the computer readable medium does not include electrical carrier signals and telecommunication signals.
[0136] The above is the preferred embodiment of the present application. It should be noted that for those skilled in the art, without departing from the principles of the present application, a number of improvements and refinements can be made, which are also considered within the scope of protection of the present application.
Claims
1. A method of feeder automation testing, the method comprising: The method comprises the following steps: calculating the voltage effective value and the current effective value of each node in the power distribution network framework under different fault handling section conditions of the feeder automation system; sending the voltage effective value and the current effective value to the corresponding tester, so that the corresponding tester converts the voltage effective value into an analog voltage waveform and converts the current effective value into an analog current waveform after receiving the voltage effective value and the current effective value, and outputs the analog voltage waveform and the analog current waveform to the corresponding field power distribution terminal and returns the switch position information of the field power distribution terminal; comparing the switch position information with the standard feeder automation action logic preset under the corresponding fault handling section condition, and then obtaining the test result of the feeder automation according to the comparison result.
2. The feeder automation testing method of claim 1, wherein, Before calculating the voltage effective value and the current effective value of each node in the power distribution network framework under different fault handling section conditions of the feeder automation system, the method further comprises the following steps: applying for registration of the corresponding electrical quantity injection time window to the RTI runtime support environment until a time window registration success notification returned by the RTI is received; after receiving the time window registration success notification, starting the feeder automation test and applying for a runtime window to the RTI runtime support environment, so that the time window of the RTI runtime support environment starts to run.
3. The feeder automation testing method of claim 2, wherein, The method for sending the voltage effective value and the current effective value to the corresponding tester comprises the following steps: when the RTI runtime support environment detects that the time window reaches the injection point, the voltage effective value and the current effective value are sent to the corresponding tester.
4. The feeder automation testing method of claim 1, wherein, The method for outputting the analog voltage waveform and the analog current waveform to the corresponding field power distribution terminal and returning the switch position information of the field power distribution terminal comprises the following steps: the analog voltage waveform and the analog current waveform are output to the corresponding field power distribution terminal, so that the corresponding field power distribution terminal performs an action according to the analog voltage waveform and the analog current waveform to generate corresponding switch quantity; the switch position information is generated according to the switch quantity of the field power distribution terminal, and the switch position information is returned to the test master station.
5. The feeder automation testing method of claim 1, wherein, The method for comparing the switch position information with the standard feeder automation action logic preset under the corresponding fault handling section condition and then obtaining the test result of the feeder automation according to the comparison result comprises the following steps: the switch position information is compared with the standard feeder automation action logic preset under the corresponding fault handling section condition, when the switch position information conforms to the standard feeder automation action logic preset under the corresponding fault handling section condition, it is determined that the feeder automation logic of the field power distribution terminal is correct, and when the switch position information does not conform to the standard feeder automation action logic preset under the corresponding fault handling section condition, it is determined that the feeder automation logic of the field power distribution terminal is incorrect.
6. A feeder automation testing apparatus characterized by comprising: The method comprises the following steps: an effective value calculation module, a switch position information acquisition module and a logic comparison module; the effective value calculation module is used to calculate the voltage effective value and the current effective value of each node in the power distribution network framework under different fault handling section conditions of the feeder automation system; The switch displacement information acquisition module is configured to send the voltage effective value and the current effective value to a corresponding test instrument, so that the corresponding test instrument converts the voltage effective value into an analog voltage waveform and converts the current effective value into an analog current waveform after receiving the voltage effective value and the current effective value, and outputs the analog voltage waveform and the analog current waveform to a corresponding field power distribution terminal and returns switch displacement information of the field power distribution terminal. The logic comparison module is configured to compare the switch displacement information with a standard feeder automation action logic preset in a corresponding fault processing section, and then obtain a test result of feeder automation according to a comparison result.
7. The feeder automation testing apparatus of claim 6, wherein, Further comprising: a time window registration module and a time window running module; The time window registration module is configured to apply for registration of a corresponding electrical quantity injection time window to an RTI running time support environment until a time window registration success notification returned by the RTI is received. The time window running module is configured to start feeder automation testing after receiving the time window registration success notification, apply for running of a time window to the RTI running time support environment, so that the time window of the RTI running time support environment starts running.
8. The feeder automation testing apparatus of claim 6, wherein, The analog voltage waveform and the analog current waveform are output to the corresponding field power distribution terminal, so that the corresponding field power distribution terminal performs an action according to the analog voltage waveform and the analog current waveform to generate a corresponding switch quantity. According to the switch quantity of the field power distribution terminal, corresponding switch displacement information is generated and returned to the test master station. The storage medium comprises a stored computer program, wherein the computer program controls a device where the storage medium is located to perform the feeder automation test method according to any one of claims 1 to 5 when the computer program is running.
9. An electronic device, comprising: The storage medium comprises a stored computer program, wherein the computer program controls a device where the storage medium is located to perform the feeder automation test method according to any one of claims 1 to 5 when the computer program is running.
10. A storage medium, characterized by
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