Parameter adaptation in the additive manufacturing of three-dimensional components

By dynamically adjusting path and beam parameters based on layer height and material properties, the method addresses temperature-dependent issues in additive manufacturing, ensuring consistent quality and reducing distortions in three-dimensional components.

WO2026037638A1PCT designated stage Publication Date: 2026-02-19AM GLOBAL HLDG GMBH
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Patent Information

Application Number
PCT/EP2025/072072
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-08-13
Filing Date
2025-07-31
Publication Date
2026-02-19

AI Technical Summary

Technical Problem

The additive manufacturing of three-dimensional components faces challenges due to thermodynamic and physical properties that lead to unwanted inhomogeneities and deviations in component properties, particularly due to temperature-dependent electrical conductivity and crystalline structure changes, which are not adequately addressed by existing methods.

Method used

A method and system that dynamically adjust path and beam parameter values during the manufacturing process based on layer height and material properties to compensate for temperature-dependent changes, ensuring consistent quality by controlling energy input and crystalline structure.

Benefits of technology

This approach ensures consistent thermal and mechanical properties across layers, reducing distortions and improving the geometric tolerances of the final product by accounting for fluctuating thermal conditions and crystalline structure changes.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention relates to a method for additive manufacturing of a three-dimensional component (20) through layer-by-layer application of a build material and through consolidation of the build material in selected areas by means of at least one beam that impinges on the build material, wherein a plurality of path parameter values that parameterize the beam projection path of the impinging beam and / or a plurality of beam parameter values that parameterize the physical properties of the beam (1) are adjusted and / or set during the manufacturing process, preferably according to a given layer height and / or material property of the component.
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Description

[0001] AM Global Holding GmbH M / EOSG-058-PC

[0002] Parameter adjustment in the additive manufacturing of three-dimensional components

[0003] Description

[0004] The invention relates to a method and a manufacturing system for the additive manufacturing of a three-dimensional component by layer-by-layer application of a build-up material and locally selective solidification of the build-up material by at least one beam impacting the build-up material. Furthermore, the present invention relates to a computer-readable storage medium.

[0005] For the locally selective solidification of the build-up material, according to the prior art, at least one corresponding irradiation unit (e.g. comprising at least one laser) is usually provided, which emits a beam onto the build-up material, which usually consists of a powder, in order to melt and thereby solidify the powder at the point where the beam hits.

[0006] After an initial layer has solidified on the original powder bed in this way, another layer of build material is typically applied, and the solidification process by blasting or sintering is repeated. This process is repeated until a finished component has been produced, from which unsolidified build material can easily be removed.

[0007] However, the stacking of layers presents problems arising from the thermodynamic and / or physical properties of the respective layers. For example, it is not economical to wait for a previously solidified layer to cool completely before applying more building material and solidifying another layer. This creates the problem that the energy input into each layer occurs not only through the beam but also through the transfer of residual heat energy from the layers below.

[0008] Many of the physically relevant properties of the build-up material, as well as the solidified material, are directly and / or temperature-dependent. In particular, electrical conductivity depends on the diameter (resistance is inversely proportional to the cross-sectional area through which the electric current flows). Thus, successive heating of layers leads to the external dimensions of components becoming smaller with increasing layer thickness. Furthermore, it is comparatively difficult to estimate the extent to which different layer temperatures will affect the crystalline structures of the solidified material.

[0009] If this temperature dependency is not taken into account, unwanted inhomogeneities and deviations in the properties of the component can occur.

[0010] There is therefore a need to provide a process and a corresponding manufacturing plant that ensures consistently high quality within a component. In particular, the invention preferably aims to at least partially compensate for or counteract the temperature dependence in the process. This objective is achieved in particular by a process according to claim 1 and a manufacturing plant according to claim 12.

[0011] Specifically, the problem is solved by a method for the additive manufacturing of a three-dimensional component by layer-by-layer application of a build-up material and locally selective solidification of the build-up material by at least one beam impacting the build-up material, wherein a plurality of path parameter values, which parameterize an irradiation path of the impacting beam, and / or a plurality of beam parameter values, which parameterize the physical properties of the beam, are adapted and / or set during manufacturing, preferably depending on a layer height and / or material property of the component.

[0012] A key concept of the present invention lies in the (particularly dynamic, i.e., adapted during the execution of the process, for example based on (measurement) values) adjustment of path and / or beam parameter values ​​to the thermal or mechanical properties of the component, even during manufacturing. In particular, the invention is based on the idea of ​​addressing the changing physical properties of the component during manufacturing by adjusting the path and / or beam parameter values, preferably depending on the layer thickness.

[0013] The invention prevents inaccuracies in the final product arising from process-related changes within the component, such as fluctuating thermal conductivity, electrical conductivity, density, etc. Specifically, due to various thermal influences, the direct process conditions of the powder bed and thus the melt pool change continuously during the additive manufacturing process, particularly for metallic additively manufactured components using laser processes. A (e.g., dynamic) adjustment of the path and / or beam parameter values, based especially on the layer height, accounts for these changes during the manufacturing process and thus allows for consistent quality of the manufactured components. Overall, the gradual heating of the underlying layers is effectively addressed.

[0014] Thus, the successive heating of layers leads to a decrease in the external dimensions of components as the layer thickness increases. Furthermore, it is comparatively difficult to estimate the extent to which different layer temperatures will affect the crystalline structures of the solidified material.

[0015] Path parameters (values) are understood to be, in particular, parameters (values) that parameterize or determine / characterize the path of the incident beam during the manufacturing process. Specifically, the spatial trajectory of the beam during the manufacturing process can be derived from the path parameters.

[0016] Beam parameters (values) are understood to be, in particular, parameters (values) that determine or characterize the characteristics of the beam. These include, for example, the intensity of the emitted radiation, the power of the emitted radiation, the beam diameter, the frequency, and / or, if applicable, the phase of the emitted radiation.

[0017] The layer height is, in particular, an index, which can be given by a natural number, and characterizes the height of the layer in question. Specifically, the first layer is the layer formed by the initial irradiation of the powder bed. Layers with a consecutive index are therefore arranged directly above or below each other.

[0018] A set is understood here to be a set comprising one or more parameter values. A set can therefore also consist of a single parameter value. In a preferred embodiment, the multitude of path parameters can be adjusted to compensate for distortion, preferably to compensate for a decrease in an external dimension of the component with increasing layer height.

[0019] In addition to or as an alternative to adjusting the beam parameter values, it is possible to adjust the path parameter values ​​to account for changing thermal conditions. Since the component being manufactured exhibits sometimes significantly fluctuating temperatures at different layer heights as the processing time increases, which in turn affects the wall thicknesses, outer diameters, component thicknesses, and cooling rates of the respective layers, otherwise layer distortion will occur during the additive manufacturing process.

[0020] In particular, higher layers experience a higher energy input due to the lower heat transfer capacity of the lower layers, which are already at a higher temperature. Furthermore, unconsolidated powder is often present beneath and within the component during manufacturing, which also reduces thermal conductivity with increasing (Z) height and increases temperature. This generally results in a reduction of the component layers' external dimensions, as the temperature difference and therefore the distortion in the upper layers are greater. This can be mitigated, and preferably corrected, by adjusting the beam and / or path parameter values.

[0021] In a preferred embodiment, the multitude of path parameter values ​​can be adjusted to compensate for distortion, preferably to compensate for a change, in particular a decrease, in an external dimension of the component with increasing layer height. In this embodiment, the path parameter values ​​are adjusted depending on input parameter values ​​that represent a distortion to be compensated. This preferably includes the aforementioned decrease in the external dimension of the component, which is to be compensated, based on previously acquired knowledge.

[0022] Adjusting the beam and / or path parameter values ​​allows for coordination and / or counteracting of this distortion, thereby keeping the geometric tolerances of the component to be manufactured as low as possible even with increasing layer heights.

[0023] In a further preferred embodiment, an intensity parameter value and / or exposure time parameter value of the beam is adjusted, preferably such that, with layer-independent energy input, a layer-specific power contribution results for each layer height, preferably based on a layer-dependent heat transfer capacity. Alternatively, an exposure rate can be parameterized instead of the exposure time. This predetermines an exposure strategy.

[0024] By adjusting the intensity and / or exposure time parameters of the beam, the portion of energy input into a layer generated by the laser power can be precisely controlled. This is advantageous because it allows the overall energy input to be influenced in order to achieve a desired manufacturing result. In particular, setting a constant amount of energy input into each layer enables consistent thermal properties across all layer thicknesses throughout the entire manufacturing process, thereby improving the quality of the components.

[0025] In particular, the heat transfer capacity of the different layers is not constant, since, especially in the case of higher layers, the underlying layers still carry unabsorbed heat energy from their sintering or solidification processes (and, depending on the material, the intrinsic thermal conductivity may also decrease with increasing temperature, as is the case with many metals). However, since the heat transfer capacity (i.e., the rate at which a layer releases thermal energy) depends on the temperature (especially the relative temperature to adjacent layers), this leads to uneven cooling of the different layers, depending on their thickness. Hotter, higher layers transfer more thermal energy to the layers above them, which would increase the total energy input if the laser input remained constant.Furthermore, these layers also cool down more slowly, as the heat transfer capacity generally decreases with higher temperature, since there is a smaller temperature gradient to newly manufactured layers.

[0026] By taking into account the layer-specific heat transfer capacity, it can therefore be ensured that the same total energy is delivered to each layer, regardless of the layer height, thus resulting in more homogeneous material properties of the finished component.

[0027] An intensity parameter is an example of a radiation parameter and indicates the intensity of the emitted radiation. AM Global Holding GmbH 6 M / EOSG-058-PC

[0028] An exposure time parameter is also an example of a beam parameter and specifies how long the beam remains at a particular point, the so-called exposure time. In the case of non-continuous irradiation, an exposure time parameter can also specify the length of the irradiation pulses and / or the irradiation pauses.

[0029] The energy input (or total energy input) into a layer indicates the total energy that is introduced into that layer during the manufacturing process. This essentially consists of two components:

[0030] Firstly, the energy supplied to the layer by the beam, which essentially results from the beam power in combination with the exposure time. The corresponding amount of energy is often referred to as the power level.

[0031] Secondly, the energy supplied to the layer through heat transfer from the layer below, which is also referred to as heat energy input.

[0032] In a further preferred embodiment, at least one beam parameter value is adjusted depending on the electrical conductivity of one or more layers of the component.

[0033] The electrical conductivity of a component depends on its diameter. As described above, adjusting the beam parameter values ​​can change the diameter, thereby altering the electrical conductivity of the finished component. Furthermore, adjusting the beam parameter values ​​can influence other physical properties of a layer, since electrical conductivity also depends on roughness, crystal structure, crystal size, and similar factors, which are directly affected by the beam parameters (laser parameters).

[0034] Furthermore, it is preferred that at least one beam parameter value and / or at least one path parameter value is adjusted to generate a predetermined crystal structure of the component. AM Global Holding GmbH 7 M / EOSG-058-PC

[0035] As described above, changes in a Krista II structure can be generated by adjusting the beam parameter values ​​or the path parameter values, for example, by influencing peak temperatures and / or cooling rates. Targeted adjustment of a component's crystal structure allows for advantageous influence on its physical properties. Particularly in metallic components, the crystalline structure of the metal phases has a decisive influence on physical properties such as brittleness, hardness, and impurity content.

[0036] It is also preferred that at least one beam parameter value and / or at least one path parameter value is adapted to a dimension of the component, preferably to a length and / or thickness of the component, at a given layer height.

[0037] By adjusting beam or path parameter values ​​to the length and / or thickness of a component, the thermal properties can be specifically influenced during manufacturing. In particular, for especially large components or component parts, it is possible to choose a procedure whereby the irradiation is as distributed or as concentrated as possible in order to influence, preferably maximizing or minimizing, the propagation of heat energy within the component.

[0038] For example, with elongated components, a path can be chosen in which the laser beam is moved essentially along the elongated direction of expansion of the component in order to achieve the longest possible cooling times before the beam returns to the vicinity of an already irradiated area of ​​the layer.

[0039] It is particularly preferred that a scan path is defined for each layer, which preferably includes a large number of scan vectors.

[0040] By defining a scan path and scan vectors, the scanning of a component within a layer can be specifically controlled, and the time offsets between the return of the beam to a certain region of the component can be better controlled.

[0041] It is particularly preferred that a large number of scan paths and / or a large number of scan vectors are classified, with each class being assigned a set of path parameter values ​​and / or ray parameter values. AM Global Holding GmbH 8 M / EOSG-058-PC

[0042] Edges and walls of the component, as well as scan vectors and scan paths, are preferably classified and sorted. Structural elements of the component (for example, walls) can be classified / sorted, for instance, according to their length and / or horizontal extent (in the x / y axis direction). A wall can, for example, be identified as such, and the corresponding scan vectors and scan paths are classified accordingly. A wall that is relatively elongated compared to other walls and interrupted by small vectors can, for example, be exposed earlier ("earlier" also means, throughout the following, earlier in time within the scope of the invention, and preferably first). Depending on the class of scan vectors and / or scan paths, different scan settings, i.e., parameter values, can be assigned to them.

[0043] A scan path, also called an exposure trajectory, can consist of multiple scan strips or scan vectors. A scan path that is strongly tangent to other vectors is, for example, preferentially exposed earlier. Strong tangent to a scan path means that scan vectors touch the scan path at a relatively short distance (compared to other scan paths in the process) – that is, they approach it very closely or even touch it.

[0044] Alternatively, if a first scan vector is stronger than a second scan vector and / or tangent, then the distance between two scan vectors that intersect the first tangent scan vector is smaller than the distance between two scan vectors that intersect the second tangent scan vector.

[0045] The fact that a scan vector is more strongly tangent further means that there is a distance between two scan vectors that intersect the tangent vector that is smaller than a specified minimum distance.

[0046] A straight scan path that is strongly tangent is preferentially exposed earlier; the same can be said for a scan path with a larger (within an interval) radius of curvature (compared to other curved scan paths).

[0047] A scan path is, in particular, a continuous path within a layer that maps the trajectory of the beam projected onto the layer.

[0048] A scan vector is, in particular, a vector that is at least substantially tangential to the scan path. The scan vector therefore runs at least substantially straight along the sections of the scan path that are at least substantially straight on the layer. AM Global Holding GmbH 9 M / EOSG-058-PC

[0049] A division into scan paths and scan vectors offers the advantage of enabling a more precise partitioning of the components. Furthermore, this allows for adjustment of the beam parameters to the specific requirements even within the processing of a single layer, resulting in even more precise settings and thus improving component quality. Preferably, the scan vectors are subdivided into scan paths in such a way that both a more homogeneous coverage of the component by the irradiation unit is achieved, and a better adaptation of the path parameter values ​​and / or beam parameter values ​​to the geometric shape of the component is possible.

[0050] In a further preferred embodiment of the invention, the scan paths and / or scan vectors and / or path parameters and / or beam parameters are classified. The classification of the scan paths and / or scan vectors and / or path parameters and / or beam parameters is carried out, for example, based on their characteristics; in particular, the classification of the path parameters and / or beam parameters can be based on path parameter values ​​and / or beam parameter values.

[0051] A characteristic of a scan path is, for example, its length, direction of travel or extension, curvature or radius of curvature, inclination or angle to another scan path and / or to an edge of the component.

[0052] A characteristic of a scan vector is, for example, its length, direction of travel or extension, curvature or radius of curvature, inclination or angle to a scan path (preferably to the scan path in which the scan vector lies) and / or to an edge of the component and / or to another scan vector of the component.

[0053] A characteristic of a path parameter is, for example, the speed of movement of the laser beam in the construction plane, a direction of movement, a trajectory; in particular, a characteristic of a path parameter is a path parameter value.

[0054] A characteristic of a beam parameter is, for example, its intensity, shape, profile, spatial extent in a direction (e.g., a direction in the plane of the structure or along a beam axis), and / or symmetry or asymmetry of the beam profile at the beam focus; in particular, a characteristic of a beam parameter is a beam parameter value. AM Global Holding GmbH 10 M / EOSG-058-PC

[0055] Classes are derived from the classification. Scan paths, scan vectors, path parameters and / or beam parameters that are similar, preferably essentially the same, due to their classification, belong to one class.

[0056] Alternatively, a class is a feature assigned to scan paths, scan vectors, orbital parameters, or beam parameters that are similar, preferably substantially the same. That scan paths, scan vectors, orbital parameters are similar means, for example, that one (or more) of their characteristics fulfills a predetermined criterion. Such a criterion could be, for instance, fulfilling a numerical value (e.g., a predefined intensity). In particular, orbital or beam parameters can also form the basis of the criterion. For example, the set of scan vectors for which one or more specific orbital or beam parameters are the same or similar can form a class of scan vectors, and so on. The criterion can also be the membership of a value in a specific interval.

[0057] A collection comprising at least one scan path and / or at least one scan vector and / or at least one path parameter and / or at least one beam parameter can be stored with its corresponding class (e.g., in a storage medium). A class (as a collection) or a class membership (as a feature) can be retrieved from the storage medium, for example, to determine process parameters and / or for process control.

[0058] In a preferred embodiment, a correlation is determined between different classes and / or component elements.

[0059] In particular, classes of scan paths, scan vectors, orbit parameters, beam parameters and / or scan paths, scan vectors, orbit parameters, beam parameters, each belonging to a class, are correlated.

[0060] Correlation is achieved by combining different classes and / or scan paths, scan vectors, orbital parameters, and beam parameters, depending on the class to which they belong. Class correlation is based on a relationship between the characteristics of the scan paths, scan vectors, orbital parameters that define these classes.

[0061] For example, a first class is correlated with a second class, whereby a characteristic of a scan pad, a scan vector, a path parameter, a beam parameter of the first class is brought into a specific (e.g. numerical) relationship with a characteristic of a scan pad, a scan vector, a path parameter, a beam parameter of the second class.

[0062] It is also possible to correlate a first class with a second class, where a characteristic of a scan pad, scan vector, path parameter, or beam parameter of the first class lies within or outside an interval (or alternatively, above or below a boundary), and simultaneously a characteristic of a scan pad, scan vector, path parameter, or beam parameter of the second class lies within or outside an interval (or alternatively, above or below a boundary). A correlation between classes (or a correlation between scan paths, scan vectors, path parameters, or beam parameters, depending on the class to which they belong) serves to determine or select process parameters and / or to control a build process.

[0063] By aligning the classification with the component dimensions, both a more homogeneous coverage of the component by the irradiation unit can be achieved, as well as a better adaptation of the path parameters and / or beam parameters to the geometric shape of the component.

[0064] In a further preferred embodiment of the invention, structural characteristics of the component or structural component elements of the component are defined. A component element (building element) is a part of a component that is geometrically distinguished or that can be geometrically defined (e.g., a strut or a contour). A structural characteristic is, for example, a width (in the build plane), a radius of curvature, an angle between a component element and the axis of movement of the build platform, between a component element and the build plane or between a component element and another component element, a height on the axis of the direction of movement of the build platform (i.e., a distance from the build platform), a distance from the edge of the build platform (in the build plane), a distance between a building element and the axis of movement of the build platform, between a component element and the build plane or between a component element and another component element.

[0065] Scan paths, scan vectors, path parameters, and beam parameters can be determined in relation to a structural characteristic. For example, the beam intensity and the speed of the beam's movement on the construction plane (scan speed) can be determined as a function of the height along the axis of movement of the build platform (on the z-axis). Furthermore, the structural component elements of a component can be classified, and classes can be derived from this classification (for example, all scan vectors belonging to a component element can be considered a single class, etc.).

[0066] Component elements that are similar, preferably essentially identical, also belong to a class. In this case, a class is a collection of component elements that, according to their classification, are similar, preferably essentially identical.

[0067] That structural components are similar means, for example, that one (or more) of their characteristics fulfill a predetermined criterion. Furthermore, it can mean that one (or more) of their characteristics lies within a predetermined interval (or alternatively above or below a predetermined limit). That structural components are essentially the same means that they are essentially identical.

[0068] Furthermore, classes of scan paths, scan vectors, path parameters, and beam parameters can be correlated with classes of component elements (or alternatively, scan paths, scan vectors, path parameters, beam parameters, and structural component elements can be correlated according to the class to which they belong). A correlation between classes (or a correlation between scan paths, scan vectors, path parameters, beam parameters, and structural components according to the class to which they belong) serves to determine or select process parameters and / or to control a build process. For example, the process parameters are determined, or the build process is controlled, so that structural component elements of a class are built with scan paths, scan vectors, path parameters, and beam parameters from classes that are correlated with the class of these components.

[0069] In a preferred embodiment, the path parameter values ​​and / or beam parameter values ​​are set depending on the length of one or more scan vectors, preferably to irradiate scan vectors with a greater length earlier than scan vectors with a shorter length.

[0070] By irradiating the scan vectors in order of their length, the time it takes for the laser beam to return to the vicinity of a previously irradiated point can be controlled. This allows for a more uniform or targeted energy input across the entire surface of the layer.

[0071] For example, when irradiating relatively long vectors is preferred, more time elapses between the return of the irradiation unit to the vicinity of a previously irradiated point (node). This increases, for instance, the time in which temperature equalization with adjacent material can occur, resulting in greater local cooling.

[0072] Points are, in particular, nodes. A node is a point that lies on at least two scan vectors and / or scan threads that intersect in the same layer. A node in the z-direction can also be understood as a location that lies on at least two scan vectors and / or scan paths that do not intersect in the same layer, but rather in two layers that are superimposed or one below the other. The fact that a scan vector and / or scan path is intersected by scan vectors and / or scan paths in a layer above or below it means that the projections of the scan vectors and / or scan paths in the different layers intersect on a projection plane.

[0073] A scan vector (a tangent scan vector and / or a tangent scan vector) can, for example, be at least partially straight or curved. Straight tangent scan vectors form an angle with a straight tangent scan vector. This angle can be at least 5°, preferably at least 30°, particularly preferably at least 80° and / or at most 175°, preferably at most 150°, particularly preferably at most 95°.

[0074] Straight tangent scan vectors form an angle with the tangent of curved tangent scan vectors. This angle can be at least 5°, preferably at least 30°, particularly preferably at least 80° and / or at most 175°, preferably at most 150°, particularly preferably at most 95°. Curved tangent scan vectors and curved tangent scan vectors can intersect such that their respective tangents form an angle. This angle can be at least 5°, preferably at least 30°, particularly preferably at least 80° and / or at most 175°, preferably at most 150°, particularly preferably at most 95°. AM Global Holding GmbH 14 M / EOSG-058-PC

[0075] A further preferred embodiment includes adjusting the path parameter values ​​and / or beam parameter values ​​such that scan vectors which are more strongly tangent are irradiated earlier than other scan vectors.

[0076] By emitting scan vectors that are more strongly tangent to the beam earlier, it is also possible to influence, and in particular maximize, the time it takes for the laser beam to return to the vicinity of a previously irradiated point. Points located on scan vectors that are strongly tangent are often close to the laser beam, which may result in them being heated more than points located on scan vectors that are less tangent.

[0077] The task is further solved by a system for the additive manufacturing of objects, in particular a laser sintering or laser melting system comprising a control unit which is configured to control an adjustment or setting unit according to the procedure described above.

[0078] The system according to the invention offers corresponding advantages, as already described in connection with the method according to the invention. It should be noted that the features described in the context of the method according to the invention can also apply to the system according to the invention for the additive manufacturing of a three-dimensional component. Likewise, features of the system according to the invention can be transferred to the method according to the invention by configuring the system in such a way that it is suitable for carrying out the corresponding method features.

[0079] A system according to the invention preferably comprises a controller or control unit designed to control the manufacturing plant according to the method described above. In particular, the system may also include a processor, especially a microprocessor, particularly to instruct the system to implement the method as described above. The system may include a memory, preferably containing instructions that the processor can access to instruct the control unit to execute the method described above, and / or at least one input and / or output device for data transfer.

[0080] In another aspect, the present invention relates to a computer-readable storage medium containing instructions that include at least one AM Global Holding GmbH 15 M / EOSG-058-PC

[0081] induce the processor to implement a method according to the invention when the instructions are executed by the at least one processor.

[0082] The invention is described below with regard to further details, features, and advantages, which are explained in more detail with reference to the figures. The described features and combinations of features, as shown below in the figures and described with reference to the drawing, are applicable not only in the combinations specified, but also in other combinations or individually, without departing from the scope of the invention.

[0083] In relation to embodiments of the invention:

[0084] Figure 1: An example of adjusting path parameter values ​​at different layer heights.

[0085] Figure 2: In cross-section, an example of parameter selection for different

[0086] Layer heights.

[0087] Figure 3a: Top view illustration of scan paths and scan vectors.

[0088] Figure 3b: In top view, another illustration of a scan path and scan vectors.

[0089] Figure 4: Top view showing an example of the different tangency of scan vectors

[0090] Figure 5: A side view of a layer-height-dependent distortion to be compensated

[0091] Figure 6: Top view illustration of different classes

[0092] Scan vectors

[0093] Figure 7: Shows an exemplary system comprising a control unit and a manufacturing plant. AM Global Holding GmbH 16 M / EOSG-058-PC

[0094] Figure 1 shows the adaptation of path and / or beam parameter values ​​according to the invention as a function of layer height. A first path 11 is shown, which results from a set of first path parameter values. The first path is the path that the beam traces on the build-up material to solidify a first layer (not shown here). A second path 12, corresponding to a second set of path parameter values, is also shown, which the beam traces to solidify a second layer (not shown here). The second layer, or path 12, lies above the first layer, and the view is a bird's-eye view for illustrative purposes.

[0095] As mentioned previously, distortion can occur with increasing layer height if the path parameter values ​​are not adjusted. Accordingly, Figure 1 shows an example where the second path parameter values ​​(i.e., those corresponding to a greater layer height) have been adjusted (in this case, by reducing the radius of a circular path) to counteract such distortion. This is merely an example. It would also be conceivable to increase a radius or perform other scaling adjustments to compensate for layer height-dependent distortion.

[0096] Instead of or in addition to the path parameters, beam parameters, such as intensity, could also be adjusted. For example, it is possible that the first path 11 was emitted with a different exposure time than the second path 12.

[0097] Figure 2 shows a cross-section through a component 20, illustrating the different layers. Specifically, a first layer 21, a second layer 22, a third layer 23, and a fourth layer 24 are shown, each arranged one above the other. Accordingly, the fourth layer 24 has a layer height of 4, the third layer 23 a layer height of three, and so on.

[0098] Since, for example, during the solidification of the third layer 23 the underlying layer 22 has a warmer temperature than, for example, the first layer 21, the radiation intensity can preferably be reduced during the exposure of the third layer 23 in order to keep the total energy input into the third layer 23 constant, for example, the same as in the first layer 21. It is also possible, preferably additionally, to adjust the path parameter values ​​for the solidification of the third layer 23 to the warmer temperature of the underlying layers 22, 21 in order to counteract or compensate for (in particular, to completely compensate for) distortion. AM Global Holding GmbH 17 M / EOSG-058-PC

[0099] The adaptation according to the invention is then preferably carried out iteratively for each layer height; in particular, when solidifying the fourth layer 24, it must be taken into account that, due to the lower heat transfer capacity at high temperatures, the underlying third layer 23 may have an even higher temperature than, for example, the second layer 22 in the previous iteration step.

[0100] Figure 3a shows a first example of covering a layer to be solidified with a first scan path 31. In the embodiment shown, the first scan path 31 runs at least substantially parallel to the direction of expansion of the component 20 and is only briefly converted to an orthogonal direction (here substantially a vertical direction parallel to the Z-axis) when reaching the edge region, in order to then run back parallel to the direction of expansion until a covering of the component 20 is achieved.

[0101] The first scan vectors 33 belonging to the first scan path 31 are shown below. These first scan vectors 33 are the tangent vectors of the sections of the first scan path 31 that are at least essentially straight.

[0102] Figure 3b shows another example of a layer to be consolidated being covered by a second scan path 32. The corresponding second scan vectors 34 shown below are again at least substantially tangential to the second scan path 32.

[0103] It is not necessary for each part of a component 20 to be covered by only one scan path 31, 32; embodiments are also conceivable in which a first scan path 31 and a second scan path 32 overlap (in one layer or in successive layers). This can then lead to a node of the scan vectors 33, 34. It is also within the scope of the present invention that the first scan path 31 and the second scan path 32 are combined to form a single scan path, which then defines both the first 33 and the second 34 scan vectors.

[0104] When setting the beam parameter values ​​and / or path parameter values ​​belonging to a class of scan vectors, the length of the scan vectors can be taken into account. For example, the path parameters can be set so that the longer first scan vectors 33 are irradiated before the shorter second scan vectors 34, and / or irradiated with a different exposure time and / or intensity. AM Global Holding GmbH 18 M / EOSG-058-PC

[0105] Figure 4 shows another component 20, with three classes of scan vectors. A first scan vector 33 and a third scan vector 40 extend at least substantially in the x-direction, while second scan vectors 34 extend at least substantially in the y-direction. As shown, the component's dimensions in different directions were taken into account when classifying the scan vectors. The classification of the scan vectors also considered that the third scan vector 40 is tangent more frequently than the first scan vector 33, since the second scan vectors 34 each originate from it. Preferably, the path parameter values ​​and / or beam parameter values ​​can be set such that the third scan vector 40, which is tangent more frequently, is irradiated before the first scan vector 33 and the second scan vectors 34, and / or is irradiated with different beam parameter values.

[0106] Figure 5 shows an adjustment of the web parameters to compensate for warpage. Figure 5 is essentially a side view of the principle illustrated in Figure 1. The component 20 on the left shows the shrinkage of layers 21, 22, 23, and 24 with increasing layer height when no compensation according to the invention is applied. On the right, it is shown that the web parameter values ​​of the second layer 22 have been adjusted to cover a larger area than that covered by the first layer 21. Since the temperature increases with greater layer height, the web parameters of the third layer 23 and fourth layer are then further "increased." The result should be a component 20 that exhibits no or only a reduced warpage on the left and therefore has at least a substantially rectangular cross-section.

[0107] Fig. 6 shows a cross-section of a component and scan paths in which scan vectors are or are to be arranged. Beam parameters and path parameters, including a scan speed (path parameter), are also to be defined for the manufacturing of the component. In this example, the scan paths are characterized by their distance from the component edge (one characteristic of the scan paths is their distance from the component edge). Scan paths whose distance from the component edge lies between certain distance values ​​from the center belong to Class 50 (First), Class 51 (Second), Class 52 (Third), etc. AM Global Holding GmbH 19 M / EOSG-058-PC

[0108] Scan vectors are characterized by their direction of travel. In this example, the first 33 scan vectors, which run parallel to the edge of the component, belong to the first class 50, and the third scan vectors 40, which run from the edge of the component to the center of the component, belong to the third class 52.

[0109] The scan speed (path parameter) is characterized by its path parameter value. Therefore, it is also possible to classify the scan vectors and / or scan paths according to the scan speed. In the figure shown, the first scan vectors 33 are traversed at a first scan speed, whereas the second scan vectors 34 are traversed at a second scan speed. Therefore, the first and second scan vectors 33, 34 can belong to different classes (namely, the first and second classes 50, 51, respectively) even though they have the same geometric orientation (unlike, for example, the third class 52).

[0110] Table I

[0111] Table I shows a correlation between the height in the z-direction (element), the scan speed (path parameter), and the beam intensity (beam parameter). During the construction process, process parameters are determined based on this correlation. In particular, process parameters, including path parameters (scan speed) and beam parameters (beam intensity), can be determined, or the construction process can be controlled, so that a cross-section is built at a z-height with a scan speed and beam intensity corresponding to the correlation shown in Table I.

[0112] Table 1 | | |

[0113] Table II shows a correlation between the diameter of the component or its width, the scan speed (path parameters) and the beam intensity. AM Global Holding GmbH 20 M / EOSG-058-PC

[0114] (Beam parameters). During the construction process, process parameters are determined based on the correlation between the diameter, the scan speed, and the beam speed. In particular, process parameters, including path parameters (scan speed) and beam parameters (beam intensity), can be determined, or the construction process is controlled, so that a cross-section of a specific dimension is constructed with a scan speed and a beam intensity corresponding to the correlation shown in Table II.

[0115] It should be noted here that all parts described above, considered individually and in any combination, especially the details shown in the drawings, are claimed as essential to the invention. Modifications to this are familiar to those skilled in the art.

[0116] Furthermore, it is noted that the broadest possible scope of protection is sought. Therefore, the disclosure contained in the claims can also be specified by features that are described by further features (even if these further features are not necessarily included). It is explicitly pointed out that parentheses and the term "in particular" are intended to emphasize the optionality of features in the respective context (which does not imply that a feature is to be considered mandatory in the corresponding context without such indication).

[0117] Reference symbol list:

[0118] 10 beam

[0119] 11 First lane

[0120] 12 Second lane

[0121] 20 components

[0122] 21 First shift

[0123] 22 Second shift

[0124] 23 Third shift

[0125] 24 Fourth Shift

[0126] 31 First scan path

[0127] 32 Second scan path

[0128] 33 First scan vector

[0129] 34 Second scan vector

[0130] 40 Third scan vector

[0131] 50 First Class

[0132] 51 Second Class

[0133] 52 Third Class

Claims

AM Global Holding GmbH 21 M / EOSG-058-PC Claims 1. Method for the additive manufacturing of a three-dimensional component (20) by layer-by-layer application of a build-up material and locally selective solidification of the build-up material by at least one beam impacting the build-up material, wherein a plurality of path parameter values ​​that parameterize an irradiation path of the impacting beam, and / or a plurality of beam parameter values ​​that parameterize the physical properties of the beam (1), preferably depending on a layer height and / or material property of the component, are adapted and / or set during manufacturing.

2. Method according to claim 1, wherein the plurality of web parameter values ​​are adjusted to compensate for distortion, preferably to compensate for a decrease in an external dimension of the component (20) with increasing layer height.

3. Method according to one of the preceding claims, wherein an intensity parameter value and / or exposure time parameter value of the beam (1) is adjusted as the beam parameter value, preferably such that, with layer-independent energy input, a layer-specific power contribution results for each layer height, preferably based on a layer-dependent heat transfer capacity.

4. Method according to one of the preceding claims, wherein at least one beam parameter value is adjusted depending on the electrical conductivity of one or more layers of the component.

5. Method according to one of the preceding claims, wherein at least one beam parameter value and / or at least one path parameter value is adjusted to generate a predetermined crystal structure of the component.

6. Method according to one of the preceding claims, wherein at least one beam parameter value and / or at least one path parameter value is adapted at a given layer height as a function of a dimension of the component (20), preferably a length and / or thickness of the component (20). AM Global Holding GmbH 22 M / EOSG-058-PC 7. Method according to one of the preceding claims, wherein a scan path is defined for each layer, which preferably comprises a plurality of scan vectors.

8. Method according to one of the preceding claims, in particular according to claim 7, wherein a plurality of scan paths and / or a plurality of scan vectors are classified, wherein each class is assigned a set of path parameter values ​​and / or ray parameter values.

9. Method according to any of the preceding claims, in particular according to claim 8, wherein the classification is based on the dimensions of the component (20) and / or its membership in a component element.

10. Method according to one of the preceding claims, in particular according to claim 8, wherein a correlation between different classes and / or component elements is determined.

11. Method according to one of the preceding claims, in particular according to one of claims 7 to 9, wherein the path parameter values ​​and / or beam parameter values ​​are set as a function of the length of one or more scan vectors, preferably to irradiate scan vectors of a greater length earlier.

12. Method according to any of the preceding claims, in particular according to claims 7 to 10, wherein the path parameter values ​​and / or beam parameter values ​​are set such that scan vectors which are more strongly tangent are irradiated earlier.

13. Manufacturing plant for the additive manufacturing of objects, in particular laser sintering or laser melting plant, comprising a control unit which is configured to control an adjustment or setting unit according to the method according to one of claims 1 to 11.

14. Computer-readable storage medium containing instructions that cause at least one processor to implement a method according to any one of claims 1 to 12 when the instructions are executed by the at least one processor.

Citation Information

Patent Citations

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