Fault detection method, electronic device and storage medium

Abstract

Disclosed in the present application are a fault detection method, an electronic device and a storage medium. The specific solution comprises: acquiring operating data under at least one acquisition index of a component to be tested; determining an analysis result of the operating data on the basis of the operating data acquired within a preset duration, the analysis result comprising a fault duration and a fault frequency of said component within the preset duration; on the basis of the fault duration and the fault frequency in the analysis result and predetermined reference data corresponding to said component, determining a target fault type of said component; and when the target fault type is a preset fault type, determining troubleshooting information corresponding to said component.

Description

Fault detection method, electronic device and storage medium

[0001] The present application claims priority to the Chinese patent application No. 2024112600221 filed on September 9, 2024 with the China Patent Office, the content of which is incorporated herein by reference in its entirety. TECHNICAL FIELD

[0002] The present application relates to the technical field of data processing, and in particular to a fault detection method, an electronic device and a storage medium. BACKGROUND

[0003] Currently, when a controller detects faults of each component, a method of setting a fault threshold is mainly used. When a fault occurs in a corresponding component, a parameter corresponding to the fault component is detected. If the parameter meets the fault threshold and lasts for a certain time, it is considered that there is a fault. TECHNICAL PROBLEM

[0004] However, in the above-mentioned manner, only the fault duration is used for fault judgment, which may result in low accuracy of fault detection. Some intermittent hardware faults cannot be accurately detected, which reduces the accuracy of fault detection and is not conducive to the normal operation of each component. TECHNICAL SOLUTION

[0005] In a first aspect, the present application provides a fault detection method, which comprises:

[0006] Obtaining running data of a to-be-detected component under at least one collection index;

[0007] Determining an analysis result of the running data according to the obtained running data within a preset time length; wherein the analysis result comprises a fault duration and a fault frequency of the to-be-detected component within the preset time length;

[0008] Determining a target fault type of the to-be-detected component according to the fault duration and the fault frequency in the analysis result and a pre-determined reference data corresponding to the to-be-detected component;

[0009] When the target fault type is a preset fault type, determining troubleshooting information corresponding to the to-be-detected component.

[0010] In a second aspect, the present application provides an electronic device, which comprises at least one processor and a memory in communication connection with the at least one processor.

[0011] The memory stores a program, and the at least one processor executes the program to perform the fault detection method.

[0012] The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor to enable the at least one processor to perform the fault detection method of any of the embodiments of the present application.

[0013] In a third aspect, the present application provides a computer readable storage medium storing computer instructions for enabling a processor to implement the fault detection method of any of the embodiments of the present application when executed by the processor. Advantages

[0014] The present application provides the following advantages: by obtaining the running data of the to-be-detected component under at least one collection index, data support is provided for subsequent data processing. According to the running data obtained within the preset time length, the analysis result of the running data is determined, so as to determine whether the to-be-detected component has a fault according to the analysis result. According to the fault duration and the fault frequency in the analysis result, and the pre-determined reference data corresponding to the to-be-detected component, the target fault type of the to-be-detected component is determined. When the target fault type is a preset fault type, the troubleshooting information corresponding to the to-be-detected component is determined, so as to realize the troubleshooting and processing of the to-be-detected component. The present application solves the problem of inaccurate fault detection in the related art, and realizes accurate detection of faults. By troubleshooting the to-be-detected component according to the target fault type, the fault existing in the to-be-detected component can be found in time, so that the to-be-detected component can operate normally. BRIEF DESCRIPTION OF DRAWINGS

[0015] FIG. 1 is a flowchart of a fault detection method according to an embodiment of the present application;

[0016] FIG. 2 is a structural example diagram of a vehicle control system according to an embodiment of the present application;

[0017] FIG. 3 is a flowchart of a fault detection method according to an embodiment of the present application;

[0018] FIG. 4 is a broken line example diagram corresponding to a fault frequency according to an embodiment of the present application;

[0019] FIG. 5 is a structural schematic diagram of a fault detection device according to an embodiment of the present application;

[0020] FIG. 6 is a structural schematic diagram of an electronic device implementing the fault detection method according to an embodiment of the present application.

[0021] Embodiments of the present application

[0022] Before the technical solutions provided in the present application are executed, the application scenario can be described. The technical method provided in the embodiments of the present application can be applied in a control system including a controller and at least one to-be-detected component in communication with the controller, to realize detection of faults. The controller includes a collection chip and a processing chip. The collection chip is in communication with at least one data collection sensor in the to-be-detected component, and is configured to acquire operation data of the to-be-detected component collected by the data collection sensor. The processing chip is configured to process the operation data acquired by the collection chip, to realize detection of faults. It should be noted that the control system can be a new energy vehicle end control system, an industrial and commercial energy storage control system, a household appliance control system, and the like, and the present application does not limit the specific control system.

[0023] Embodiment one

[0024] FIG. 1 is a flowchart of a fault detection method provided in the first embodiment of the present application. The present embodiment can be applied to the case of detecting faults of a device including a to-be-detected component. The method can be executed by a fault detection apparatus, which can be implemented in the form of hardware and / or software, and can be configured in an electronic device such as a mobile phone, a computer, or a server. As shown in FIG. 1, the method includes the following steps.

[0025] S110, acquiring operation data of the to-be-detected component under at least one collection index.

[0026] In order to ensure the normal operation of the control system, at least one hardware component included in the control system can be detected. The hardware component currently being detected can be regarded as a to-be-detected component. For example, if the control system is a whole vehicle control system, the to-be-detected component can be a battery. In the present application, the fault detection processing mode for each hardware component is similar. Therefore, the following description takes the to-be-detected component as an example. The collection index can be an index for detecting or evaluating the running state, performance characteristics, and possible problems of the to-be-detected component. For example, if the to-be-detected component is a battery, the data corresponding to the collection index can be index data such as the temperature, current, and voltage of the battery. The operation data can be data collected when the to-be-detected component is in a running state.

[0027] Specifically, in order to facilitate the collection of various data of the to-be-detected component, at least one data collection sensor can be deployed at a preset position of the to-be-detected component, to collect operation data corresponding to at least one collection index based on the data collection sensor. It should be noted that the number and type of the data collection sensor are determined according to actual requirements and the collection index.

[0028] Optionally, the operation data of the to-be-detected component under at least one collection index is acquired, including: when it is determined that the data acquisition condition is met, acquiring original data collected by at least one data collection sensor deployed at a preset position of the to-be-detected component; and performing data cleaning processing on the original data to obtain operation data corresponding to at least one collection index.

[0029] The data acquisition condition can be a condition set in advance according to actual needs. For example, the following conditions can be used as the data acquisition condition: the to-be-detected component is normally powered on, the data collection wire harness is normal, and there is no other problem affecting fault detection in the control system. The preset position can be a designated position on the to-be-detected component set in advance. The data collection sensor is used to collect original data when the to-be-detected component is running. The collection index corresponding to different data collection sensors is different. The data cleaning processing can be processing or error correction on the original data to solve problems such as inconsistency and incompleteness of the original data. Optionally, the data cleaning processing can include data deduplication, data filling and the like.

[0030] Specifically, before collecting data, it can be determined whether the data acquisition condition is met. When it is determined that the data acquisition condition is met, original data collected by at least one data collection sensor deployed at a preset position is acquired. The original data is subjected to data cleaning processing to improve the accuracy of subsequent data processing, and operation data corresponding to at least one collection index is obtained.

[0031] For example, referring to FIG. 2, the data collection sensor is the sensor in FIG. 2. FIG. 2 is an example diagram of a vehicle control system. The vehicle control system includes a controller and at least one to-be-detected component in communication with the controller. There are n data collection sensors deployed on the to-be-detected component for collecting original information of the to-be-detected component. The controller includes a collection chip, a processing chip (Microcontroller Unit, MCU) and a Controller Area Network (CAN) chip. The collection chip is in communication with the n data collection sensors on the to-be-detected component through a collection wire harness. The processing chip is used to process the original data acquired by the collection chip, and transmit the processed result to the Controller Area Network chip. The Controller Area Network chip feeds back the processed result to the vehicle terminal through the CAN communication line, so that the vehicle terminal performs fault signal prompting or display.

[0032] In combination with the above examples, before data collection, the controller can be woken up to complete the initialization of the controller. When collecting the original data of the to-be-detected object, it is determined whether the data acquisition condition is met. For example, whether the controller is running normally, whether the power supply of the controller is within the normal range, etc. If the data acquisition condition is met, the identifier in the processing chip of the controller for marking the fault state is set to uncertain, and the collection chip in the controller acquires the original data of the to-be-detected object through the collection harness connected to the data collection sensor. Among them, the collection period is set in advance according to the characteristics of the data collection sensor and the function and accuracy of the controller. Correspondingly, if the data acquisition condition is not met, the corresponding prompt information is generated and the controller and other components are adjusted to meet the data acquisition condition.

[0033] S120, determining an analysis result of the running data according to the running data obtained within the preset time length; wherein the analysis result includes a fault duration time and a fault frequency of the to-be-detected component within the preset time length.

[0034] The preset time length can be a pre-set fault detection time length. The fault duration time can be understood as the duration time corresponding to the fault of the to-be-detected component. For example, the fault duration time can be 4 seconds. The fault frequency can be understood as the number of times of faults of the to-be-detected component within the preset time length. Optionally, the analysis result can be determined by a pre-set fault trigger threshold. The pre-set fault trigger threshold is pre-set and is used to determine whether the to-be-detected component has a fault. When the running data reaches the pre-set fault trigger threshold, the fault frequency is counted once. For example, the pre-set fault trigger threshold can be a battery temperature of 125 degrees Celsius. When the battery temperature in the collected running data reaches 125 degrees Celsius within the preset time length, the fault frequency is counted once.

[0035] Specifically, according to the running data obtained within the preset time length, the number of times that the running data reaches the pre-set fault trigger threshold, i.e. the fault frequency, is determined. And the duration time of each running data reaching the pre-set fault trigger threshold within the preset time length, i.e. the fault duration time, is determined.

[0036] For example, in combination with the above examples, taking the to-be-detected component as a battery and the running data as the data corresponding to the battery voltage. The fault trigger threshold corresponding to the running data is set to 4.8V. Within the preset time length, the number of times that the collected running data reaches 4.8V is determined, which is the fault frequency. The duration time corresponding to each running data reaching 4.8V is determined, which is the fault duration time. If the fault frequency is not once, and at least two duration times are determined, the maximum duration time is taken as the fault duration time.

[0037] S130, determining the target fault type of the component to be detected according to the fault duration and the fault frequency in the analysis result, and the reference data corresponding to the component to be detected.

[0038] The reference data can be preset reference data. Alternatively, the reference data can be a preset fault frequency threshold. The target fault type can include a continuous fault type and an intermittent fault type. If the fault duration of the component to be detected is relatively long, the target fault type of the component to be detected can be determined as the continuous fault type. For example, if the fault duration of the component to be detected reaches the preset duration, the target fault type can be the continuous fault type. If the fault duration of the component to be detected is relatively short and the fault occurs randomly, when the fault frequency reaches the reference data, the target fault type can be determined as the intermittent fault type. For example, the intermittent fault type can be a short circuit, an open circuit, a short circuit to ground, or a short circuit to power supply, and the embodiment does not limit the intermittent fault type.

[0039] Specifically, whether the fault duration reaches the preset duration is determined according to the fault duration in the analysis result and the preset duration. If the fault duration reaches the preset duration, the target fault type of the component to be detected is the continuous fault type. If the fault duration does not reach the preset duration, and the fault frequency within the preset duration reaches the reference data, the target fault type of the component to be detected is the intermittent fault type. In this way, the target fault type of the component to be detected under different conditions can be accurately determined, and accurate fault detection can be achieved.

[0040] S140, when the target fault type is a preset fault type, determining the troubleshooting information corresponding to the component to be detected.

[0041] The preset fault type can be a preset fault type. The preset fault type can be a continuous fault type or an intermittent fault type. Different fault types correspond to different processing methods, and the corresponding troubleshooting information is also different. The troubleshooting information can be information obtained by sequentially troubleshooting each part of the component to be detected.

[0042] Specifically, when the target fault type is determined as the preset fault type, the information corresponding to the target fault type is fed back to the target terminal, so that the target terminal reminds the corresponding personnel to sequentially troubleshoot each part of the component to be detected according to the feedback information, so as to obtain the corresponding troubleshooting information.

[0043] Optionally, the method further comprises: recording the operation data of the component to be detected, the analysis result corresponding to the operation data, and the troubleshooting information of the component to be detected in a fault detection list, so as to determine the troubleshooting information of the component to be processed based on the fault detection list when the operation data of the component to be processed is detected.

[0044] The fault detection list can be used to record the running data, analysis result and troubleshooting information corresponding to each fault detection within a preset time period. The fault detection list can shorten the subsequent fault detection time.

[0045] Specifically, the running data corresponding to the current preset time period, the analysis result corresponding to the running data and the troubleshooting information of the to-be-detected component are recorded in the fault detection list. According to the fault detection list, when the running data of the to-be-processed component is subsequently obtained, the analysis result corresponding to the running data of the to-be-processed component and the troubleshooting information can be determined, so as to simplify the subsequent fault maintenance process.

[0046] Optionally, the method further comprises: for a target device integrating at least one to-be-detected component, based on the troubleshooting information corresponding to each to-be-detected component, optimizing the target device to obtain an optimized target device.

[0047] The target device can integrate at least one to-be-detected component. For example, taking a new energy vehicle as the target device, the to-be-detected components integrated by the target device can include a battery, a vehicle control unit (VCU) or a vehicle speed sensor, etc. This is only an example and does not limit the specific target device.

[0048] Specifically, for a target device integrating at least one to-be-detected component, each to-be-detected component can be detected based on the above-mentioned fault detection method, and the corresponding target fault type and troubleshooting information corresponding to the target fault type can be determined. According to the troubleshooting information corresponding to each to-be-detected component, the target device is maintained or adjusted to obtain an optimized target device, so that the target device can operate normally and stably.

[0049] The technical scheme of the embodiment provides data support for subsequent data processing by obtaining the running data of the to-be-detected component under at least one collection index. According to the running data obtained within a preset time period, the analysis result of the running data is determined, so as to determine whether the to-be-detected component has a fault according to the analysis result. According to the fault duration and fault frequency in the analysis result and the pre-determined reference data corresponding to the to-be-detected component, the target fault type of the to-be-detected component is determined. When the target fault type is a preset fault type, the troubleshooting information corresponding to the to-be-detected component is determined to realize the troubleshooting and processing of the to-be-detected component. The present application solves the problem of inaccurate fault detection in the related art, and realizes accurate detection of faults. The to-be-detected component can be processed by troubleshooting according to the target fault type, so that the fault of the to-be-detected component can be found in time, so that the to-be-detected component can operate normally.

[0050] Embodiment Two

[0051] FIG. 3 is a flowchart of a fault detection method according to Embodiment Two of the present application. This embodiment is an optional embodiment of the above-mentioned embodiment. The specific implementation can be referred to the technical solution of this embodiment. The same or corresponding technical terms as those of the above-mentioned embodiment are not repeated here. As shown in FIG. 3, the method comprises the following steps:

[0052] S210, obtaining running data of the component to be detected under at least one collection index.

[0053] S220, detecting the running data based on a preset detection frequency within a preset time length, and determining a fault frequency of the running data reaching a preset fault trigger threshold.

[0054] The preset detection frequency can be set according to actual needs, and is the detection frequency within the preset time length. For example, the preset detection frequency can be 50 times per second, i.e., the running data needs to be detected once every 0.02 seconds.

[0055] Specifically, the running data is detected based on the preset detection frequency within the preset time length, and the fault frequency of the running data reaching the preset fault trigger threshold is determined.

[0056] For example, the preset time length is 4 seconds, and the preset detection frequency is 50 times per second, so that the running data can be detected 200 times within the preset time length. That is, the running data is judged once every 0.02 seconds within the preset time length to determine whether the running data reaches the preset fault trigger threshold. If the running data reaches the preset fault trigger threshold, the fault frequency is counted once, until the fault frequency reaches a preset fault frequency threshold. If the fault frequency reaches the preset fault frequency threshold within the preset time length, the fault detection can be stopped, an identifier for marking a fault state is set as Fail, and a target fault type is determined. If the fault frequency does not reach the preset fault frequency threshold within the preset time length, it is determined that no fault occurs at present, the identifier for marking the fault state is set as Pass, and the fault detection within the next preset time length is started.

[0057] S230, determining at least one to-be-analyzed duration corresponding to the running data reaching the preset fault trigger threshold within the preset time length.

[0058] The to-be-analyzed duration can be the time length during which the running data reaches the preset fault trigger threshold.

[0059] Specifically, in the preset time length, when the detection of the to-be-detected component is performed according to the preset detection frequency, at least one to-be-analyzed duration corresponding to each time when the operation data reaches the preset fault triggering threshold is determined. The target fault type of the to-be-detected component is determined according to the at least one to-be-analyzed duration.

[0060] S240, the fault duration of the to-be-detected component is determined based on the at least one to-be-analyzed duration.

[0061] Specifically, the maximum to-be-analyzed duration is determined from the at least one to-be-analyzed duration corresponding to the to-be-detected component, and the maximum to-be-analyzed duration is taken as the fault duration, so as to determine the target fault type of the to-be-detected component according to the fault duration.

[0062] Optionally, the fault duration of the to-be-detected component is determined based on the at least one to-be-analyzed duration, including: determining the maximum to-be-analyzed duration corresponding to the at least one to-be-analyzed duration, and taking the maximum to-be-analyzed duration as the fault duration of the to-be-detected component.

[0063] Specifically, the maximum to-be-analyzed duration is determined from the at least one to-be-analyzed duration corresponding to the to-be-detected component, and the maximum to-be-analyzed duration is taken as the fault duration, so as to determine the target fault type of the to-be-detected component according to the fault duration.

[0064] In the case that the reference data is the preset fault frequency threshold, the target fault type can be determined as follows. S250, if the fault duration reaches the preset time length, it is determined that the target fault type of the to-be-detected component is the continuous fault type.

[0065] Specifically, when the fault duration reaches the preset time length, it is determined that the target fault type of the to-be-detected component is the continuous fault type, so as to perform troubleshooting on the to-be-detected component according to the current target fault type, and to optimize the to-be-detected component.

[0066] S260, if the fault duration does not reach the preset time length, and the fault frequency reaches the preset fault frequency threshold, it is determined that the target fault type of the to-be-detected component is the intermittent fault type.

[0067] Specifically, if the fault duration does not reach the preset time length, and the fault frequency reaches the preset fault frequency threshold, it is determined that the target fault type of the to-be-detected component is the intermittent fault type. Correspondingly, if the fault duration does not reach the preset time length, and the fault frequency does not reach the preset fault frequency threshold, it is determined that the to-be-detected component does not have a fault.

[0068] For example, referring to FIG. 4, FIG. 4 is a line chart corresponding to the fault frequency. The total detection number is determined according to the preset time length and the preset detection frequency. In combination with the above example, if the running data is determined once every 0.02 seconds whether it reaches the preset fault trigger threshold, when the running data reaches the preset fault trigger threshold, the fault frequency is counted once, the total detection number is counted once, and the waiting analysis duration that the running data reaches the preset fault trigger threshold is determined. When the running data does not reach the preset fault trigger threshold, the fault frequency is not counted, and the total detection number is counted once. Moreover, as shown in FIG. 4, within the preset time length, after the fault frequency reaches the preset fault number threshold, the current fault detection can be ended, and the determination of the target fault type is performed, that is, the target fault type is determined as the intermittent fault type. If the fault frequency does not reach the preset fault number threshold within the preset time length, it is determined that the to-be-detected component does not have a fault. In addition, the duration corresponding to the time when the fault frequency reaches the preset fault number threshold within the preset time length can be determined, and the duration and the preset time length are recorded in the fault detection list to facilitate subsequent query.

[0069] S270, when the target fault type is the preset fault type, generating a warning prompt information based on the target fault type, and feeding back the warning prompt information to the target terminal, so that the target terminal determines the troubleshooting information corresponding to the to-be-detected component based on the warning prompt information.

[0070] The warning prompt information can be information generated according to the target fault type. The warning prompt information can be displayed on the target terminal in the form of voice, text or other forms. For example, taking a new energy vehicle as the target device, the warning prompt information can be a fault information displayed on the vehicle display screen at a preset position. The target terminal can be a display component set in advance, for example, the target terminal can be a display terminal of a new energy vehicle.

[0071] Specifically, when the target fault type is the preset fault type, the warning prompt information is generated according to the target fault type, and the warning prompt information is sent to the target terminal, so that the target terminal performs warning prompt according to the warning prompt information, thereby determining the troubleshooting information corresponding to the to-be-detected component.

[0072] For example, as shown in FIG. 2, in combination with the above example, after the processing chip processes the original data collected by the collection chip, the target fault type and the warning prompt information corresponding to the target fault type are obtained. The warning prompt information is transmitted to the vehicle terminal through the controller area network chip, so as to realize the fault troubleshooting of the to-be-detected component. It should be noted that when the warning prompt information is transmitted to the vehicle terminal, the fault frequency, the fault duration and other information stored in the processing chip are cleared, and the fault detection of the next preset time length is started again.

[0073] The technical scheme of the embodiment obtains the running data of the to-be-detected component under at least one collection index, thereby providing data support for subsequent data processing. In a preset time length, the running data is detected based on a preset detection frequency, the fault frequency at which the running data reaches a preset fault triggering threshold is determined, and at least one to-be-analyzed continuous time length corresponding to the running data reaching the preset fault triggering threshold in the preset time length is determined. According to the at least one to-be-analyzed continuous time length, the fault continuous time length of the to-be-detected component is determined. Based on this, the subsequent fault frequency and fault continuous time length can be used to determine the target fault type. If the fault continuous time length reaches a preset time length, the target fault type of the to-be-detected component is determined to be a continuous fault type; if the fault continuous time length does not reach the preset time length and the fault frequency reaches a preset fault frequency threshold, the target fault type of the to-be-detected component is determined to be an intermittent fault type. When the target fault type is a preset fault type, a warning prompt information is generated based on the target fault type, and the warning prompt information is fed back to a target terminal, so that the target terminal determines troubleshooting information corresponding to the to-be-detected component based on the warning prompt information, thereby achieving troubleshooting and processing of the to-be-detected component. The application solves the problem of inaccurate fault detection in the related art, and realizes accurate detection of faults. Through the troubleshooting and processing of the to-be-detected component based on the target fault type, the fault existing in the to-be-detected component can be found in time, so that the to-be-detected component can operate normally.

[0074] Embodiment three

[0075] FIG. 5 is a structural schematic diagram of a fault detection device provided by embodiment three of the application. As shown in FIG. 5, the device includes a data acquisition module 310, a data analysis module 320, a fault type determination module 330, and a troubleshooting information determination module 340.

[0076] The data acquisition module 310 is configured to acquire running data of a to-be-detected component under at least one collection index. The data analysis module 320 is configured to determine an analysis result of the running data according to the acquired running data in a preset time length. The analysis result includes a fault continuous time length and a fault frequency of the to-be-detected component in the preset time length. The fault type determination module 330 is configured to determine a target fault type of the to-be-detected component according to the fault continuous time length and the fault frequency in the analysis result and a pre-determined reference data corresponding to the to-be-detected component. The troubleshooting information determination module 340 is configured to determine troubleshooting information corresponding to the to-be-detected component when the target fault type is a preset fault type.

[0077] The technical scheme of the embodiment provides data support for subsequent data processing by acquiring operation data of the to-be-detected component under at least one collection index. The analysis result of the operation data is determined according to the operation data acquired within a preset time length, so as to determine whether the to-be-detected component has a fault according to the analysis result. The target fault type of the to-be-detected component is determined according to the fault duration and the fault frequency in the analysis result and the pre-determined reference data corresponding to the to-be-detected component. When the target fault type is a preset fault type, the troubleshooting information corresponding to the to-be-detected component is determined, so as to realize troubleshooting and processing of the to-be-detected component. The application solves the problem of inaccurate fault detection in the related art, and realizes accurate detection of faults. The to-be-detected component can be processed by troubleshooting according to the target fault type, so that the fault existing in the to-be-detected component can be found in time, and the to-be-detected component can operate normally.

[0078] On the basis of the above-mentioned embodiments, the data acquisition module comprises: an original data acquisition unit, configured to acquire original data collected by at least one data collection sensor deployed at a preset position of the to-be-detected component when it is determined that the data acquisition condition is met; and a data cleaning unit, configured to perform data cleaning processing on the original data to obtain operation data corresponding to at least one collection index.

[0079] Optionally, the data analysis module comprises: a fault frequency determination unit, configured to detect the operation data based on a preset detection frequency within a preset time length, and determine a fault frequency at which the operation data reaches a preset fault triggering threshold; a to-be-analyzed duration determination unit, configured to determine at least one to-be-analyzed duration corresponding to a case where the operation data reaches the preset fault triggering threshold within the preset time length; and a fault duration determination unit, configured to determine a fault duration of the to-be-detected component based on the at least one to-be-analyzed duration.

[0080] Optionally, the fault duration determination unit is configured to determine a maximum to-be-analyzed duration corresponding to the at least one to-be-analyzed duration, and take the maximum to-be-analyzed duration as the fault duration of the to-be-detected component.

[0081] Optionally, the reference data is a preset fault frequency threshold, and the fault type determination module is configured to: if the fault duration reaches a preset time length, determine that the target fault type of the to-be-detected component is a continuous fault type; and if the fault duration does not reach the preset time length and the fault frequency reaches the preset fault frequency threshold, determine that the target fault type of the to-be-detected component is an intermittent fault type.

[0082] Optionally, the troubleshooting information determination module is configured to generate a warning prompt information based on the target fault type when the target fault type is a preset fault type, and feed back the warning prompt information to the target terminal, so that the target terminal determines the troubleshooting information corresponding to the to-be-detected component based on the warning prompt information.

[0083] Optionally, the apparatus further comprises a data recording module configured to record the operation data of the to-be-detected component, the analysis result corresponding to the operation data, and the troubleshooting information of the to-be-detected component in a fault detection list, so as to determine the troubleshooting information of the to-be-detected component based on the fault detection list when the operation data of the to-be-detected component is detected.

[0084] Optionally, the apparatus further comprises a target device optimization module configured to optimize the target device integrated with at least one to-be-detected component based on the troubleshooting information corresponding to each to-be-detected component, to obtain an optimized target device.

[0085] The fault detection apparatus provided by the embodiments of the present application can execute the fault detection method provided by any of the embodiments of the present application, and has the corresponding function modules and beneficial effects of the execution method.

[0086] Embodiment Four

[0087] FIG. 6 is a structural schematic diagram of an electronic device provided by Embodiment Four of the present application. The electronic device 10 is intended to represent various forms of digital computers, such as laptops, desktops, workstations, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. The electronic device can also represent various forms of mobile devices, such as personal digital processors, cellular telephones, smart phones, wearable devices (such as helmets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions, are meant to be examples only, and are not intended to limit the implementations of the present application described and / or claimed in this document.

[0088] As shown in FIG. 6, the electronic device 10 includes at least one processor 11, and a memory, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc., which is in communication connection with the at least one processor 11, wherein the memory stores a computer program that can be executed by the at least one processor. The processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or the computer program loaded from the storage unit 18 into the random access memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other through a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0089] A plurality of components in the electronic device 10 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a magnetic disk, an optical disk, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices through a computer network, such as the Internet, and / or various telecommunication networks.

[0090] The processor 11 can be various general and / or special purpose processing components with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 11 performs various methods and processes described above, such as the fault detection method.

[0091] In some embodiments, the fault detection method can be implemented as a computer program tangibly embodied in a computer readable storage medium, such as the storage unit 18. In some embodiments, part or all of the computer program can be loaded and / or installed onto the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded onto the RAM 13 and executed by the processor 11, one or more steps of the fault detection method described above can be performed. Alternatively, in other embodiments, the processor 11 can be configured to perform the fault detection method by any other appropriate means, such as by means of firmware.

[0092] Various implementations of the systems and techniques described above can be realized in digital electronic circuitry, integrated circuitry, a field programmable gate array (FPGA), an application specific integrated circuit (ASIC), a system on a chip (SOC), a programmable logic device (CPLD), computer hardware, firmware, software, and / or combinations thereof. These various implementations can include implementation in one or more computer programs that are executable and / or interpretable on a programmable system including at least one programmable processor, which can be special or general purpose, coupled to receive data and instructions from, and to transmit data and instructions to, a storage system, at least one input device, and at least one output device.

[0093] A computer program for implementing the fault detection method of the present application can be written in any combination of one or more programming languages. These computer programs can be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the computer program, when executed by the processor, implements the functions / operations specified in the flow diagrams and / or the block diagrams. The computer program can be executed in whole on the machine, partially on the machine, partially on the machine as a stand-alone software package, and partially on a remote machine or a server.

[0094] Embodiment Five

[0095] The embodiment five of the present application also provides a computer readable storage medium, which stores computer instructions for causing a processor to execute a fault detection method, the method comprising:

[0096] obtaining running data of a component to be detected under at least one collection index; determining an analysis result of the running data according to the obtained running data within a preset time length; wherein the analysis result comprises a fault duration and a fault frequency of the component to be detected within the preset time length; determining a target fault type of the component to be detected according to the fault duration and the fault frequency in the analysis result and a pre-determined reference data corresponding to the component to be detected; and determining troubleshooting information corresponding to the component to be detected when the target fault type is a preset fault type.

[0097] In the context of the present application, the computer readable storage medium can be a tangible medium, which can contain or store a computer program for use by or in connection with an instruction execution system, apparatus, or device. The computer readable storage medium can include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the above. Alternatively, the computer readable storage medium can be a machine readable signal medium. More specific examples of the machine readable storage medium will include one or more lines of electrical connections, portable computer disks, hard disk drives, random access memories (RAM), read-only memories (ROM), erasable programmable read-only memories (EPROM or flash memory), optical fibers, portable compact disk read-only memories (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the above.

[0098] To provide for interaction with a user, the systems and techniques described here can be implemented on an electronic device having a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user and a keyboard and a pointing device (e.g., a mouse or a trackball) by which the user can provide input to the electronic device. Other kinds of devices can be used to provide for interaction with a user as well; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form, including acoustic, speech, or tactile input.

[0099] The systems and techniques described here can be implemented in a computing system that includes a back end component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front end component (e.g., a user computer having a graphical user interface or a Web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such back end, middleware, or front end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0100] The computing system can include clients and servers. A client and server are generally remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other. A server can be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system, and solves the defects of large management difficulty and weak business scalability in traditional physical host and VPS service.

Claims

1. A fault detection method applied to a controller and at least one component to be detected in communication with the controller, the controller being configured to acquire operation data of the component to be detected and process the operation data, the method comprising: acquiring operation data of the component to be detected under at least one collection index; determining an analysis result of the operation data according to the operation data acquired within a preset time length, wherein the analysis result comprises a fault duration and a fault frequency of the component to be detected within the preset time length; determining a target fault type of the component to be detected according to the fault duration and the fault frequency in the analysis result and a reference data corresponding to the component to be detected determined in advance; and determining troubleshooting information corresponding to the component to be detected when the target fault type is a preset fault type. The operation data of the component to be detected under at least one collection index is acquired, comprising: acquiring original data collected by at least one data collection sensor deployed at a preset position of the component to be detected when it is determined that a data acquisition condition is met; and performing data cleaning processing on the original data to obtain operation data corresponding to at least one collection index. The analysis result of the operation data is determined according to the operation data acquired within the preset time length, comprising: detecting the operation data based on a preset detection frequency within the preset time length to determine a fault frequency at which the operation data reaches a preset fault trigger threshold; determining at least one to-be-analyzed duration corresponding to the operation data reaching the preset fault trigger threshold within the preset time length; and determining a fault duration of the component to be detected based on at least one to-be-analyzed duration. The fault duration of the component to be detected is determined based on at least one to-be-analyzed duration, comprising: determining a maximum to-be-analyzed duration corresponding to at least one to-be-analyzed duration, and taking the maximum to-be-analyzed duration as the fault duration of the component to be detected. The reference data is a preset fault frequency threshold, and the target fault type of the component to be detected is determined according to the fault duration and the fault frequency in the analysis result and the reference data corresponding to the component to be detected determined in advance, comprising: determining that the target fault type of the component to be detected is a continuous fault type if the fault duration reaches the preset time length; and determining that the target fault type of the component to be detected is an intermittent fault type if the fault duration does not reach the preset time length and the fault frequency reaches a preset fault frequency threshold.

2. The method of claim 1, wherein, The troubleshooting information corresponding to the component to be detected is determined when the target fault type is a preset fault type, comprising: generating a warning prompt information based on the target fault type when the target fault type is a preset fault type, and feeding back the warning prompt information to a target terminal, so that the target terminal determines the troubleshooting information corresponding to the component to be detected based on the warning prompt information. Further comprising: ​ 3. The method of claim 1, wherein, ​ ​ ​ ​ 4. The method of claim 3, wherein, ​ ​ 5. The method of claim 1, wherein, ​ ​ ​ 6. The method of claim 1, wherein, ​ ​ 7. The method of claim 1, wherein, ​ The operation data of the component to be detected, the analysis result corresponding to the operation data, and the troubleshooting information of the component to be detected are recorded in a fault detection list, so as to determine the troubleshooting information of the component to be processed based on the fault detection list when the operation data of the component to be processed is detected.

8. The method of claim 1, wherein, Further comprising: For a target device integrating at least one component to be detected, the target device is subjected to an optimization process based on the troubleshooting information corresponding to each component to be detected, so as to obtain an optimized target device.

9. An electronic device, comprising: At least one processor; And A memory in communication connection with the at least one processor; wherein The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor to enable the at least one processor to execute the fault detection method in any one of claims 1-8. 10.A computer readable storage medium storing computer instructions for enabling a processor to implement the fault detection method in any one of claims 1-8 when executed.

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