Appliance for the dimensional inspection of ceramic tiles

Abstract

The appliance (1) for the dimensional inspection of ceramic tiles, comprising a substantially vertical supporting frame (2), configured to vertically support a ceramic tile (P), and dimensional inspection means (9, 10, 11, 12) of a ceramic tile (P), wherein said dimensional inspection means (9, 10, 11, 12) comprise: a length measurement sensor (9) of the tile (P); an orthogonality measurement sensor (10) of the tile (P); a straightness measurement sensor (11) of the tile (P); a plurality of planarity measurement sensors (12) of the tile (P); a processing unit operationally connected to the dimensional inspection means (9, 10, 11, 12) and configured to calculate the dimensional parameters of the tile (P) and to carry out a phase of calibration of the dimensional inspection means (9, 10, 11, 12); wherein the appliance (1) comprises actuation means for the movement of the length measurement sensor (9), wherein the length measurement sensor (9) comprises an incremental encoder configured to detect the position of the length measurement sensor (9) on said frame, and wherein the calibration phase comprises the following steps: placing said length measurement sensor (9) at a reference position on the supporting frame (2); detecting the reference position by means of the incremental encoder and storing the reference position.

Description

[0001] APPLIANCE FOR THE DIMENSIONAL INSPECTION OF CERAMIC TILES

[0002] Technical Field

[0003] The present invention relates to an appliance for the dimensional inspection of ceramic tiles, which can be particularly used for checking the quality of ceramic tiles and other slab materials such as natural stones, agglomerates, or other materials.

[0004] Background Art

[0005] There are various known types of appliances which allow measuring the dimensional characteristics of ceramic tiles, which can be particularly used to check the length, width, straightness of the edges, orthogonality, and planarity of the tile.

[0006] According to a first type of appliance known type, the measurement of the dimensional characteristics is carried out on ceramic tiles arranged horizontally and resting on three points.

[0007] However, the horizontal arrangement of the tiles has obvious limitations, specifically with regard to the reliability of the planarity measurement, and therefore of the various curvatures present, particularly for large-format ceramic tiles.

[0008] In fact, according to existing regulations, the appliance sensors must be calibrated prior to measurement, and this calibration is carried out using ground metal plates.

[0009] However, this calibration does not take into account the fact that each tile has a specific weight and rigidity / flexibility that differ from those of the metal plate, differences that are even more pronounced for large-format tiles and which can lead to different curvatures due to the horizontal positioning on three points.

[0010] To overcome this drawback, appliances are known to be used to measure the dimensional characteristics with the tiles arranged vertically.

[0011] Specifically, these appliances do have a vertically arranged supporting frame adapted to vertically support a ceramic tile during measurement.

[0012] The frame supports a plurality of measurement sensors, consisting, e.g., of digital comparators, which can be moved along the frame by means of appropriate actuators for measurements at different points on the sides and on at least one of the tiles, for tiles of different sizes.

[0013] These sensors therefore allow all the necessary measurements to be taken for planarity, orthogonality, length, width, and straightness of the tiles.

[0014] However, also these vertical measuring appliances do have some significant drawbacks.

[0015] In fact, in order to carry out calibration operations, it is generally necessary to use appropriate references consisting of ground metal calibration plates of different sizes, corresponding to the dimensions of the specific tile to be measured.

[0016] This necessarily involves the storage and maintenance of multiple calibration plates of different sizes, exactly corresponding to ceramic tiles of different sizes that must be measurable using the appliance.

[0017] In addition, the calibration plates can be damaged during use or movement, and it is therefore necessary to ensure the availability of several spare calibration plates for each of the useful sizes, as well as to carry out continuous maintenance of the calibration plates and, indeed, their “calibration”.

[0018] Therefore, the need to have ground calibration slabs of every possible size available, even for large-size tiles, together with the need to have spare calibration plates, makes the use of the appliances of known type problematic, particularly along the tile production lines.

[0019] It should also be noted that these slabs, particularly large ones, are very heavy and therefore impossible for a single technician to move.

[0020] In addition, it is difficult to produce calibration slabs with excellent planarity characteristics, as they “warp” when cut, resulting in a questionable “zero” reference.

[0021] Description of the Invention

[0022] The main aim of this invention is to design an appliance for the dimensional inspection of ceramic tiles that allows for practical and simple calibration without the need to use ground calibration plates.

[0023] Another object of this invention is to devise an appliance for the dimensional inspection of ceramic tiles that allows the aforementioned drawbacks of the prior art to be overcome with a simple, rational, easy and effective to use and affordable solution.

[0024] The above objects are achieved by the present appliance for the dimensional inspection of ceramic tiles, according to the characteristics described in claim 1. Brief Description of the Drawings

[0025] Other characteristics and advantages of the present invention will become more apparent from the description of a preferred, but not exclusive, embodiment of an appliance for the dimensional inspection of ceramic tiles, illustrated by way of an indicative, yet non-limiting example in the accompanying drawings, in which:

[0026] Figure 1 is an axonometric view of the appliance according to the invention;

[0027] Figures 2 to 6 illustrate a procedure for setting up the appliance according to the invention;

[0028] Figures 7 and 8 illustrate a phase of positioning and measuring a tile using the appliance according to the invention.

[0029] Embodiments of the invention

[0030] With particular reference to these figures, reference numeral 1 globally denotes, in general terms, an appliance for the dimensional inspection of ceramic tiles, which can be particularly used for checking the quality of a ceramic tile.

[0031] In particular, the appliance 1 allows the measurement of the dimensional characteristics of ceramic tiles in order to check the length, width, straightness of the edges, orthogonality, and planarity of the tiles.

[0032] The appliance 1 comprises a substantially vertical supporting frame 2, configured to vertically support a ceramic tile P. Therefore, once positioned on the supporting frame 2 for the measurement operations, the tile P is arranged on a substantially vertical plane.

[0033] According to a preferred embodiment of the appliance 1, illustrated in the figures, the supporting frame 2 is inclined by 5 degrees from the vertical position, so as to ensure the support and stability of a tile P during the measurement operations.

[0034] The supporting frame 2 comprises a base 3 for resting on the ground.

[0035] Usefully, the base 3 is provided with adjustable supporting feet in order to adjust the inclination of the frame.

[0036] Again according to a preferred embodiment, the supporting frame 2 has a substantially rectangular conformation and comprises at least one horizontal lower cross member 4 and at least one vertical lateral upright 5.

[0037] Preferably, the supporting frame 2 has a square conformation.

[0038] Furthermore, the supporting frame 2 comprises resting means 6, 7, 8 of the tile P at a substantially vertical position.

[0039] Specifically, the resting means 6, 7, 8 comprise at least one pair of lower resting elements 6 associated with each other and spaced apart at a lower portion of the supporting frame 2. The lower resting elements 6 are intended to accommodate and hold the lower edge of the tile P to be measured.

[0040] According to a preferred embodiment, illustrated in the figures, a first lower resting element 6 is fixedly associated with one end of the lower cross member 4, at the lateral upright 5, while a second lower resting element 6 is associated with the lower cross member 4 by sliding. The position of the second lower resting element 6 along the lower cross member 4 is adjustable depending on the dimensions of the tile P to be measured.

[0041] Furthermore, the resting means 6, 7, 8 comprise at least one lateral resting element 7 associated with a lateral portion of the supporting frame 2. The lateral resting element 7 is intended to accommodate and hold one of the side edges of the tile P to be measured.

[0042] According to a preferred embodiment, illustrated in the figures, the lateral resting element 7 is fixedly associated with one end of the lower cross member 4, at the lateral upright 5.

[0043] Finally, the resting means 6, 7, 8 comprise at least one plurality of rear resting elements 8 associated with each other and spaced apart from the supporting frame 2. The rear resting elements 8 are intended to accommodate and hold the working surface of the tile P to be measured.

[0044] Again according to the preferred embodiment shown in the figures, a first rear resting element 8 is fixedly associated with one end of the lower cross member 4, at the lateral upright 5, a second rear resting element 8 is associated along the lower cross member 4 by sliding, while a third resting element 8 is associated with the lateral upright 5 by sliding. The positions of the second and of the third rear resting elements 8 are adjustable according to the dimensions of the tile P to be measured.

[0045] It should be noted that, with reference to this description, terms such as “lower”, “upper” and “lateral” refer to the conventional positioning of the appliance 1 and of the ceramic tiles during the measurement operations.

[0046] Furthermore, the term “working surface” of the tile P refers to the face of the tile P facing the appliance 1 during the measurement operations.

[0047] Furthermore, the appliance 1 comprises dimensional inspection means 9, 10, 11, 12 of a ceramic tile P.

[0048] Specifically, the dimensional inspection means 9, 10, 11, 12 comprise at least one length measurement sensor 9 of the tile P, associated with the supporting frame 2 in a movable maimer.

[0049] Furthermore, the dimensional inspection means 9, 10, 11, 12 comprise at least one orthogonality measurement sensor 10 of the tile P, associated with and movable on the supporting frame 2 and positionable on the supporting frame 2 at different positions depending on the dimensions of the tile P to be measured. The orthogonality measurement sensor 10 is configured to measure the distance with respect to one of the side edges of the tile P to be measured, in the proximity of one of the top comers of the tile P, once it is positioned vertically on the supporting frame 2.

[0050] In addition, the dimensional inspection means 9, 10, 11, 12 comprise at least one straightness measurement sensor 11 of the tile P, associated with the supporting frame 2 in a movable manner and positionable on the supporting frame 2 at different positions depending on the dimensions of the tile P to be measured.

[0051] The straightness measurement sensor 11 is configured to measure the distance from a substantially central portion of one of the edges of the tile P to be measured, once positioned vertically on the supporting frame 2.

[0052] Finally, the dimensional inspection means 9, 10, 11, 12 comprise a plurality of planarity measurement sensors 12 of the tile P, associated with the supporting frame 2 in a movable manner and positionable on the supporting frame 2 at different positions depending on the dimensions of the tile P to be measured.

[0053] The planarity measurement sensors 12 are configured to measure the distance at three different points from the surface of one of the faces of the tile P to be measured, once it has been positioned vertically on the supporting frame 2.

[0054] The appliance 1 also comprises at least one processing unit operationally connected to the dimensional inspection means 9, 10, 11, 12 and configured to calculate the dimensional parameters (length, width, edge straightness, orthogonality, and planarity) of the tile P and to carry out a calibration phase of the dimensional inspection means 9, 10, 11, 12.

[0055] With reference to the embodiment shown in the figures, a generic control panel 13 is illustrated.

[0056] The processing unit can be implemented, e.g., by means of a computer provided with dedicated software and connected to the control panel 13.

[0057] Advantageously, the appliance 1 allows the calibration phase to be carried out automatically and without the aid of metal calibration plates.

[0058] In particular, the appliance 1 comprises actuation means for the movement of the length measurement sensor 9 on the supporting frame 2.

[0059] In addition, the length measurement sensor 9 comprises an incremental encoder configured to detect the position of the sensor itself on the supporting frame 2. Advantageously, the calibration phase comprises at least the following steps: by means of the actuation means, placing the length measurement sensor 9 at a reference position on the supporting frame 2, corresponding to the “zero” of the length measurement sensor 9; detecting the reference position by means of said incremental encoder and storing said reference position.

[0060] In particular, the reference position is defined at a portion of the supporting frame 2 intended to accommodate and hold one of the edges of the tile P.

[0061] Furthermore, according to a preferred embodiment, the length measurement sensor 9 is a contact sensor positionable at the measurement position, at one of the edges of the tile P opposite the reference position, for the detection by means of the digital encoder of the distance from the reference position and, therefore, of the length of the tile P. According to the preferred embodiment illustrated in the figures, the length measurement sensor 9 is movable along the lateral upright 5 and the reference position is defined at the lower end of the lateral upright 5.

[0062] In particular, the reference position is defined at the first lower resting element 6.

[0063] Therefore, the calibration operations involve the automatic movement of the length measurement sensor 9 to the reference position corresponding to the zero point of the sensor itself, at the lower end of said lateral upright 5.

[0064] During measurement, the length measurement sensor 9 is manually moved to the measurement position, at the upper edge of the tile P, for detection by the digital encoder of the distance from the reference position and, therefore, of the length of the tile P.

[0065] Advantageously, the appliance 1 also comprises at least one reference element 14 associated with the supporting frame 2 in a movable maimer and positionable at each of the planarity measurement sensors 12.

[0066] Furthermore, the calibration phase comprises at least the following steps: placing the reference element 14 at each of the planarity measurement sensors 12; detecting, by means of the planarity measurement sensors 12, a reference distance with respect to the reference element 14, corresponding to the “zero” of the planarity measurement sensor 12, and storing the reference distance.

[0067] In particular, the supporting frame 2 comprises at least one holding plane 15 of the planarity measurement sensors 12. The planarity measurement sensors 12 are associated with such holding plane 15 in a movable manner depending on the size of the tile P to be measured.

[0068] Preferably, the planarity measurement sensors 12 are associated with the holding plane 15 in a removable manner by magnetic coupling.

[0069] In particular, the holding plane 15 is substantially vertical.

[0070] Furthermore, the holding plane 15 has a substantially rectangular conformation and extends over the entire surface of the supporting frame 2, which is useful for carrying out the measurements on ceramic tiles of different sizes. Preferably, the holding plane 15 has a square conformation.

[0071] Preferably, the reference element 14 consists of a rod 14 associated with the supporting frame 2 by sliding and parallel to the holding plane 15 of the planarity measurement sensors 12.

[0072] Therefore, during the calibration phase, the rod 14 is moved from one side to the other of the holding plane 15 to detect and set a reference distance for each of the planarity measurement sensors 12.

[0073] Advantageously, the appliance 1 comprises at least one calibrated square 16 that can be positioned on the supporting frame 2.

[0074] The calibration phase comprises at least the following steps: by means of the orthogonality measurement sensor 10, detecting a reference distance with respect to a first side of the calibrated square 16, corresponding to the “zero” of the orthogonality measurement sensor 10, and storing this reference distance; by means of the straightness measurement sensor 11, detecting a reference distance with respect to a second side of the calibrated square 16, corresponding to the “zero” of the straightness measurement sensor 11, and storing the reference distance.

[0075] Therefore, the calibrated square 16 can be positioned on the supporting frame 2, at the position intended to accommodate the tiles P, for the calibration of the orthogonality measurement sensor 10 and of the straightness measurement sensor 11.

[0076] The calibrated square 16 is suitably sized to allow the calibration of the sensors for measuring tiles of different sizes.

[0077] At least one of either said orthogonality measurement sensor, said straightness measurement sensor 11 or said planarity measurement sensors 12 is of the type of a laser sensor.

[0078] According to a preferred embodiment, these sensors are all sensors of the laser type.

[0079] According to the preferred embodiment illustrated in the figures, the orthogonality measurement sensor is vertically associated by sliding on the lateral upright 5 and can be positioned to adapt to tiles of different sizes. In particular, during measurement, the orthogonality measurement sensor 10 is positioned at a side edge of the tile P to be measured, in the proximity of the upper comer.

[0080] Again according to the preferred embodiment illustrated in the figures, the straightness measurement sensor 11 is horizontally associated by sliding with the lower cross member 4 and can be positioned to adapt to tiles of different sizes.

[0081] In particular, during measurement, the straightness measurement sensor 11 is positioned at a substantially central portion of the lower edge of the tile P to be measured.

[0082] It has, in practice, been ascertained that the described invention achieves the intended objects.

[0083] In particular, it should be noted that the appliance according to the invention allows for practical and simple calibration of all sensors without the need to use ground calibration plates.

Claims

CLAIMS1) Appliance (1) for the dimensional inspection of ceramic tiles, comprising a substantially vertical supporting frame (2), configured to vertically support a ceramic tile (P), and dimensional inspection means (9, 10, 11, 12) of a ceramic tile (P), wherein said dimensional inspection means (9, 10, 11, 12) comprise: at least one length measurement sensor (9) of the tile (P), associated with said supporting frame (2) in a movable maimer; at least one orthogonality measurement sensor (10) of the tile (P), associated with said supporting frame (2) in a movable manner and configured to measure the distance with respect to one of the side edges of the tile (P), in the proximity of one of the top corners of the tile (P); at least one straightness measurement sensor (11) of the tile (P), associated with said supporting frame (2) in a movable manner and configured to measure the distance with respect to a substantially central portion of one of the edges of the tile (P) to be measured; a plurality of planarity measurement sensors (12) of the tile (P), associated with said supporting frame (2) in a movable manner and configured to measure the distance at three different points with respect to the surface of one of the faces of the tile (P) to be measured; at least one processing unit operationally connected to said dimensional inspection means (9, 10, 11, 12), configured to calculate the dimensional parameters of the tile (P) and to carry out a phase of calibration of said dimensional inspection means (9, 10, 11, 12); characterized by the fact that it comprises actuation means for the movement of said length measurement sensor (9) on said supporting frame (2), by the fact that said length measurement sensor (9) comprises an incremental encoder configured to detect the position of said length measurement sensor (9) on said frame, and by the fact that said calibration phase comprises at least the following steps: by means of said actuation means, placing said length measurement sensor (9) at a reference position on said supporting frame (2); detecting said reference position by means of said incremental encoder andstoring said reference position.2) Appliance (1) according to claim 1, characterized by the fact that it comprises at least one reference element (14) associated with said supporting frame (2) in a movable maimer and positionable at each of said planarity measurement sensors (12), and by the fact that said calibration phase comprises at least the following steps: placing said reference element (14) at each of said planarity measurement sensors (12); detecting, by means of said planarity measurement sensors (12), a reference distance with respect to said reference element (14) and to store said reference distance.3) Appliance (1) according to one or more of the preceding claims, characterized by the fact that it comprises at least one calibrated square (16) positionable on said supporting frame (2), and by the fact that said calibration phase comprises at least the following steps: by means of said orthogonality measurement sensor (10), detecting a reference distance with respect to one side of said calibrated square (16) and storing said reference distance; by means of said straightness measurement sensor (11), detecting a reference distance with respect to one side of said calibrated square (16) and storing said reference distance.4) Appliance (1) according to one or more of the preceding claims, characterized by the fact that said supporting frame (2) has a substantially rectangular conformation and comprises at least one horizontal lower cross member (4) and at least one vertical lateral upright (5).5) Appliance (1) according to one or more of the preceding claims, characterized by the fact that said supporting frame (2) comprises resting means (6, 7, 8) of the tile (P) at a substantially vertical position.6) Appliance (1) according to one or more of the preceding claims, characterized by the fact that said reference position is defined at a portion of the supporting frame (2) intended to accommodate and hold one of the edges of the tile (P), and by the fact that said length measurement sensor (9) is a contactsensor positionable at said measurement position, at one of the edges of the tile (P) opposite said reference position, for the detection, by means of said digital encoder, of the distance with respect to said reference position.7) Appliance (1) according to one or more of the preceding claims, characterized by the fact that said length measurement sensor (9) is movable along said lateral upright (5), said reference position being defined at the lower end of said lateral upright (5).8) Appliance (1) according to one or more of the preceding claims, characterized by the fact that at least one of either said orthogonality measurement sensor (10), said straightness measurement sensor (11) or said planarity measurement sensors (12) is of the type of a laser sensor.9) Appliance (1) according to one or more of the preceding claims, characterized by the fact that said supporting frame (2) comprises at least one holding plane (15) of said planarity measurement sensors (12), said planarity measurement sensors (12) being associated with said holding plane (15) in a movable maimer depending on the size of the tile (P) to be measured.10) Appliance (1) according to one or more of the preceding claims, characterized by the fact that said reference element (14) comprises at least one rod (14) associated with said supporting frame (2) by sliding and parallel to said holding plane (15) of said planarity measurement sensors (12).

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