Distributed NIR detection system for measuring locally cured material

Abstract

A distributed NIR detection system for measuring a locally cured material is provided. The distributed NIR detection system for measuring a locally cured material comprises a detector for detecting reflected light from a measurement target, wherein the detector includes: a first slit for passing reflected light transmitted by a plurality of second optical fiber bundles; a grating structure for dispersing the reflected light that has passed through the first slit by wavelength; a second slit for selectively passing the light dispersed by the grating structure; and a sensor for detecting the selectively passed light, wherein the plurality of second optical fiber bundles are arranged to be aligned in a longitudinal direction of a slit groove of the first slit.

Description

Dispersive NIR detection system for measuring localized cured materials

[0001] The present invention relates to a distributed NIR detection system for measuring localized cured materials that can be configured cost-effectively, for measuring the absorbance of near-infrared light to measure the degree of curing of cured materials such as epoxy in a non-contact and non-destructive manner.

[0002] To measure the degree of curing of cured materials, such as epoxy used in electronic products, the material is physically extracted, and sample analysis is performed using Differential Scanning Calorimetry (DSC).

[0003] However, DSC-based hardness analysis can show significant variations in measured hardness depending on the analysis area, and it may be impossible to detect meaningful changes in hardness between samples with different curing times. As such, DSC-based hardness analysis had problems with reproducibility and its inability to represent the process environment. Furthermore, since DSC is fundamentally a destructive analysis method, it was nearly impossible to integrate it into a process line to measure the hardness of samples being manufactured in real time.

[0004] Accordingly, analysis based on NIR spectroscopy has been introduced, which irradiates a sample with near-infrared light to measure the absorbance of specific chemical bonds, such as epoxides, and then quantitatively calculates the curing characteristics. This analysis is non-destructive, can drastically reduce measurement time, and has the advantage of high reliability for localized area measurements in the μm range. Such near-infrared curing analysis methods include measurements using dispersive near-infrared spectroscopy and measurement methods using Fourier Transform NIR (FT-NIR) spectroscopy.

[0005] The FT-NIR method is a relatively recently developed technique that can detect light of all wavelengths simultaneously, allowing for the rapid analysis of various components. However, FT-NIR analyzers are expensive equipment costing over $100,000 per unit, making them unsuitable for introduction into various aspects of production process lines.

[0006] Therefore, to implement more cost-effective hardening measurement, a distributed NIR detection system improved in terms of signal-to-noise ratio and reliability is required.

[0007] The technical problem that the present invention aims to solve is to provide a distributed NIR detection system for measuring localized cured materials that is cost-effective, highly reliable, and reproducible, while measuring the absorbance of near-infrared light for non-contact and non-destructive curing degree measurement of cured materials such as epoxy.

[0008] The technical problems of the present invention are not limited to those mentioned above, and other unmentioned technical problems will be clearly understood by those skilled in the art from the description below.

[0009] A distributed NIR detection system for measuring localized curing materials to solve the aforementioned technical problem comprises: a light source emitting near-infrared light; a probe including a plurality of first optical fibers that transmit the near-infrared light to a measurement target and a plurality of second optical fibers that transmit reflected light from the measurement target; a detector that detects the reflected light; and a computer that interprets the detected reflected light to measure the degree of curing of the measurement target, wherein the detector comprises a first slit that passes the reflected light transmitted by the plurality of second optical fibers; a grating structure that disperses the reflected light passing through the first slit by wavelength; a second slit that selectively passes the light dispersed by the grating structure; and a sensor that detects the light selectively passed through, wherein the plurality of second optical fibers are aligned and arranged in the longitudinal direction of the first slit.

[0010] In some embodiments of the present invention, the diameter of each of the plurality of second optical fibers may be larger than the width of the slit groove of the first slit.

[0011] In some embodiments of the present invention, the sum of the diameters of the plurality of second optical fibers may be less than or equal to the length of the slit groove of the first slit.

[0012] In some embodiments of the present invention, the number of the plurality of first optical fibers may be greater than the number of the plurality of second optical fibers.

[0013] In some embodiments of the present invention, the light source emitting the near-infrared light may operate with an output of 4.7W to 30W.

[0014] In some embodiments of the present invention, a lens may be further included to focus near-infrared light passing through the probe to a local area of ​​the measurement target.

[0015] In some embodiments of the present invention, the lens may include a silicate-based material.

[0016] A distributed NIR detection system for measuring a localized area cured material according to another embodiment for solving the aforementioned technical problem comprises: a light source emitting near-infrared light; a probe transmitting the near-infrared light to a measurement target and receiving reflected light from the measurement target; a detector detecting the received reflected light; and a computer interpreting the detected reflected light to measure the degree of curing of the measurement target, wherein the probe includes a transmission signal line having one end connected to the light source and the other end extended to a light entry port facing the measurement target, and a reception signal line having one end connected to the detector and the other end extended to the light entry port, wherein the number of a plurality of first optical fibers included in the transmission signal line is greater than the number of a plurality of second optical fibers included in the reception signal line.

[0017] In some embodiments of the present invention, the detector comprises: a first slit that passes reflected light transmitted by a plurality of receiving signal lines; a grating structure that disperses the reflected light passing through the first slit by wavelength; a second slit that selectively passes the light dispersed by the grating structure; and a sensor that detects the light selectively passed through, wherein a plurality of second optical fibers connected to the first slit may be arranged in alignment along the length direction of the slit groove of the first slit.

[0018] Specific details of other embodiments are included in the detailed description and drawings.

[0019] The dispersed NIR detection system for measuring localized curing materials according to an embodiment of the present invention has an improved measurement environment, so that an appropriate amount of near-infrared light is irradiated onto the sample despite absorption loss occurring during the transmission of near-infrared light through the probe, and the measurement result appears in the form of a smooth graph with a good signal-to-noise ratio.

[0020] The effects of the present invention are not limited to those mentioned above, and other unmentioned effects will be clearly understood by those skilled in the art from the description in the claims.

[0021] FIG. 1 is a diagram illustrating a dispersed NIR detection system for measuring localized area cured materials according to an embodiment of the present invention.

[0022] FIG. 2 is a diagram illustrating the configuration of a probe included in a dispersed NIR detection system for measuring a localized area cured material according to an embodiment of the present invention.

[0023] FIG. 3 is a diagram illustrating the configuration of a detector included in a dispersed NIR detection system for measuring localized area cured materials according to an embodiment of the present invention.

[0024] FIGS. 4a and 4b are drawings illustrating a configuration in which a probe included in a dispersed NIR detection system for measuring a localized area cured material according to an embodiment of the present invention is coupled with a first slit of a detector.

[0025] FIGS. 5a and 5b are drawings illustrating the effect according to the output of a light source included in a dispersed NIR detection system for measuring a localized area cured material according to an embodiment of the present invention.

[0026] Figures 6a and 6b are graphs illustrating the measurement effect optimized by a dispersive NIR detection system for measuring localized area cured materials according to an embodiment of the present invention.

[0027] FIG. 7 is a diagram illustrating the configuration of a lens and a probe included in a dispersed NIR detection system for measuring a localized area cured material according to an embodiment of the present invention.

[0028] Figures 8a and 8b are graphs illustrating the improvement in measurement effect by a lens included in a dispersed NIR detection system for measuring localized area cured materials according to an embodiment of the present invention.

[0029] The advantages and features of the present invention and the methods for achieving them will become clear by referring to the embodiments described below in detail together with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below but may be implemented in various different forms. These embodiments are provided merely to ensure that the disclosure of the present invention is complete and to fully inform those skilled in the art of the scope of the invention, and the present invention is defined only by the scope of the claims. Throughout the specification, the same reference numerals refer to the same components.

[0030] When one component is referred to as being "connected to" or "coupled to" another component, it includes cases where it is directly connected or coupled to the other component, or cases where another component is interposed. Conversely, when one component is referred to as being "directly connected to" or "directly coupled to" another component, it indicates that no other component is interposed. "And / or" includes each of the mentioned items and all combinations of one or more of them.

[0031] The terms used herein are for describing the embodiments and are not intended to limit the invention. In this specification, the singular form includes the plural form unless specifically stated otherwise in the text. As used herein, "comprises" and / or "comprising" do not exclude the presence or addition of one or more other components, steps, actions, and / or elements to the mentioned components, steps, actions, and / or elements.

[0032] Although terms such as "first," "second," etc., are used to describe various components, it goes without saying that these components are not limited by these terms. These terms are used merely to distinguish one component from another. Therefore, it goes without saying that the "first component" mentioned below may be the "second component" within the technical scope of the present invention.

[0033] Unless otherwise defined, all terms used in this specification (including technical and scientific terms) may be used in a meaning commonly understood by those skilled in the art to which the present invention pertains. Additionally, terms defined in commonly used dictionaries are not to be interpreted ideally or excessively unless explicitly and specifically defined otherwise.

[0034] FIG. 1 is a diagram illustrating a dispersed NIR detection system for measuring localized area cured materials according to an embodiment of the present invention.

[0035] Referring to FIG. 1, a dispersed NIR detection system (10) for measuring a localized area cured material according to an embodiment of the present invention may include a light source (100), a probe (200), a stage (300), a detector (400), and a computer (500), etc.

[0036] The light source (100) emits near-infrared light and supplies light to a sample placed on a stage (300) through a probe (200). The light source (100) may include, for example, a halogen lamp, an LED, etc. that emits light with a wavelength of 750 nm to 1400 nm, but the present invention is not limited thereto.

[0037] In an embodiment of the present invention, a light source (100) may be packaged together with a power supply unit that supplies power, an input unit capable of operating to turn the light source (100) on / off, and a control unit that controls the operation of the light source (100), and housed inside a case. The case may be provided with a connector terminal so that a light source (100) emitting near-infrared rays can be connected to a probe (200).

[0038] Light emitted from the light source (100) can reach a sample on the stage (300) through the probe (200), and can emit near-infrared light at an output that does not damage the sample. In some embodiments of the present invention, the output of the light source (100) may be 4.7W to 30W. In this regard, the relationship between the output of the light source (100) and the measurement results of the cured material is explained using FIGS. 5a and 5b.

[0039] FIGS. 5a and 5b are drawings illustrating the effect according to the output of a light source included in a dispersed NIR detection system for measuring a localized area cured material according to an embodiment of the present invention.

[0040] First, referring to FIG. 5a, an absorbance graph is shown when using a light source (100) with an output of 4.7W or less. As previously explained, for hardness analysis, an absorbance graph with a good signal-to-noise ratio is required for peak analysis. However, the graph in FIG. 5a contains a large amount of noise due to the insufficient amount of light given to a large number of samples being measured, and it can be observed that the shape of the graph at the magnified slope is rough. In particular, since absorption by the optical fiber occurs when near-infrared light is transmitted through the probe (200), it is essential to use a light source (100) with sufficient output for good measurement results.

[0041] FIG. 5b is an absorbance graph when using a light source (100) having an output of 20W or more. In the case of FIG. 5b, because it has sufficient output, a suitable amount of near-infrared light is irradiated onto the sample despite the absorption loss that occurs when the near-infrared light is transmitted through the probe (200), and it can be observed that the measurement result has the shape of a smooth graph with a good signal-to-noise ratio.

[0042] Accordingly, as described above, the output of the light source (100) is configured to be 4.7W or higher, but can be limited to 30W or lower to ensure a sufficient lifespan of the light source (100) without causing damage to the sample.

[0043] Referring again to FIG. 1, the near-infrared light supplied by the light source (100) is focused to have a straight line and emitted outward, and the light source (100) is connected to the probe (200) through a connector to supply the near-infrared light.

[0044] The probe (200) may include a transmission signal line that transmits light emitted from a light source (100) to a sample, and a reception signal line that collects light reflected from the sample and transmits it to a detector (400). A probe included in a distributed NIR detection system for measuring a localized area cured material according to an embodiment of the present invention will be described in more detail using FIG. 2.

[0045] FIG. 2 is a diagram illustrating the configuration of a probe included in a dispersed NIR detection system for measuring a localized area cured material according to an embodiment of the present invention.

[0046] Referring to FIG. 2, the probe (200) may include a transmission signal line (210) including a plurality of first optical fibers (211) and a reception signal line (220) including a plurality of second optical fibers (221). Near-infrared light emitted from a light source (100) is transmitted to a light entry port (230) through the transmission signal line (210) including a plurality of first optical fibers (211) and is transmitted to a sample placed on a stage (300).

[0047] Near-infrared light partially absorbed and reflected by the sample is incident again on the light entry port (230) and can be transmitted to the detector (400) through the receiving signal line (220) including the second optical fiber (221). As shown in FIG. 2, the transmission signal line (210) and the receiving signal line (220) each have one end separated at the branching section (240), and one end of the transmission signal line (210) is connected to the light source (100) and one end of the receiving signal line (220) is connected to the detector (400). The section from the branching section (240) to the light entry port (230) is a section where the transmission signal line (210) and the receiving signal line (220) are covered by a single outer sheath, and a plurality of first optical fibers (211) and a plurality of second optical fibers (221) may be mixed and arranged on the cross-section of the light entry port (230).

[0048] In some embodiments of the present invention, the number of multiple first optical fibers (211) may be greater than the number of multiple second optical fibers (221). When transmitting near-infrared light emitted from a light source (100) by a probe (200) to a sample, securing a sufficient amount of light is considered one of the most important requirements. Accordingly, even when the transmission signal line (210) and the reception signal line (220) are covered by a single sheath, it is necessary to configure the number of first optical fibers (211) of the transmission signal line (210) to be as large as possible. In some embodiments of the present invention, the number of multiple first optical fibers may be 39 and the number of multiple second optical fibers may be 5, but the present invention is not limited to such a number of first optical fibers and second optical fibers.

[0049] In some embodiments of the present invention, a plurality of first optical fibers (211) and second optical fibers (221) may include silica, but the present invention is not limited thereto and may include plastic optical fiber materials such as perfluorinated polymers.

[0050] Meanwhile, as shown in FIG. 2, a plurality of second optical fibers (221) may be arranged side by side in a predetermined direction at the connection portion (222) with the detector (400). This relates to the length direction of the slit included in the detector (400), and details regarding this will be described later.

[0051] Referring again to FIG. 1, the system (10) may include a stage (300) for mounting a sample to be measured so that near-infrared light transmitted through a probe (200) can be irradiated. Some stages (300) may be equipped with a tilt control unit capable of adjusting the irradiation angle of near-infrared light on the sample.

[0052] When near-infrared light reflected from a sample of the stage (300) is transmitted through the receiving signal line (220), the detector (400) receives it and can detect the absorption by wavelength using a dispersive spectral method. The structure of the detector (400) is explained using FIG. 3.

[0053] FIG. 3 is a diagram illustrating the configuration of a detector included in a dispersed NIR detection system for measuring localized area cured materials according to an embodiment of the present invention.

[0054] Referring to FIG. 3, the detector (400) included in the dispersed NIR detection system (10) for measuring a localized area cured material according to an embodiment of the present invention may include a first slit (410) through which reflected light (401) collected from a sample (1000) passes, a grid structure (420), a second slit (430), and an image sensor (440), etc.

[0055] The first slit (410) can pass reflected light (401) transmitted through the probe (200) so that dispersion can be ensured. That is, in order to improve the optical resolution and spatial coherence of the detector (400) within the dispersed NIR detection system (10), the reflected light (401) provided through the probe (200) is passed through the first slit (410). Meanwhile, a plurality of second optical fibers (221) through which the reflected light (401) is transmitted may have a certain alignment direction with respect to the first slit (410), which will be explained using FIG. 4.

[0056] FIGS. 4a and 4b are drawings illustrating a configuration in which a probe included in a dispersed NIR detection system for measuring a localized area cured material according to an embodiment of the present invention is coupled with a first slit of a detector.

[0057] Referring to FIG. 4a, a configuration is shown in which a plurality of second optical fibers (221) are arranged side by side in the longitudinal direction (D1) of the slit groove (412) toward the thin, long slit groove (412) of the first slit (410). This arrangement feature can be compared with the configuration of the comparative example shown in FIG. 4b.

[0058] Referring to FIG. 4b, a configuration is shown in which reflected light (401) reflected from a sample (1000) is received through a single optical fiber (FC) inside a probe (200). In this case, the reflected light (401) transmitted through the single optical fiber (FC) may not provide a sufficient amount of light for spectral and absorbance readings to be obtained through the detector (400).

[0059] In particular, the dispersed NIR detection system for measuring localized curing materials according to an embodiment of the present invention requires a resolution sufficient to measure the degree of curing of epoxy materials in units of 100 μm used in micro-components. Accordingly, the diameter (D) of the first optical fiber (211) and the second optical fiber (221) included in the probe (200) can also be configured to have a diameter of several hundred μm, preferably 300 μm or less.

[0060] In addition, considering the loss due to light absorption by the optical fiber itself due to the characteristics of the reflected light (401) transmitted through the probe (200), that is, the optical fiber, maximizing the transmission efficiency of the reflected light (401) emitted through the plurality of second optical fibers (221) and the light (411) passing through the first slit (410) is the most important factor in improving the measurement performance of the system (10) of the present invention.

[0061] Accordingly, the probe (200) included in the dispersed NIR detection system for measuring localized area curing material according to an embodiment of the present invention can secure the maximum amount of light by arranging a plurality of second optical fibers (221), each having a diameter smaller than the length (L) of the slit groove (412) of the first slit, in parallel along the length direction (D1) of the slit groove (412) of the first slit.

[0062] The diameter (D) of each of the plurality of second optical fibers (221) may be larger than the width (W) of the slit groove of the first slit (410). As described above, the first slit (410) may have a slit groove width (W) to selectively pass reflected light (401) transmitted through the plurality of second optical fibers (221) in order to improve optical resolution and spatial coherence. In some embodiments of the present invention, the width of the slit groove (412) of the first slit may be about 25 μm.

[0063] Meanwhile, in some embodiments of the present invention, the sum of the diameters of a plurality of second optical fibers (221) may be smaller than the length (L) of the slit groove (412) of the first slit. That is, the plurality of second optical fibers (221) may be arranged so as to be all accommodated inside the longitudinal direction (D1) of the slit groove (412) of the first slit. In some embodiments of the present invention, the length (L) of the slit groove (412) of the first slit may be 1.8 mm to 2.0 mm.

[0064] The optimized measurement effect of the degree of hardening through the configuration of such multiple probes (200) and detectors (400) is explained using FIGS. 6a and 6b.

[0065] Figures 6a and 6b are graphs illustrating the measurement effect optimized by a dispersive NIR detection system for measuring localized area cured materials according to an embodiment of the present invention.

[0066] First, referring to FIG. 6a, the results of absorbance measurements based on the configuration of a typical first optical fiber (211) and a second optical fiber (221) are shown. In particular, the results correspond to the case where the second optical fiber (221) is configured as a single optical fiber for the first slit (410) as in FIG. 4b, and although absorbance is measured, the results obtained are not good in terms of signal-to-noise ratio due to a large amount of noise.

[0067] On the other hand, referring to FIG. 6b, the results of absorbance measurement according to the configuration of the first optical fiber (211) and the second optical fiber (221) according to an embodiment of the present invention are shown, in particular, the configuration of the second optical fiber (221) corresponds to the case where a plurality of second optical fibers (221) are arranged with respect to the first slit (410) as in FIG. 4a. According to this, unlike the case of FIG. 6a, it can be observed that an absorbance graph having a good signal-to-noise ratio is obtained with reduced noise.

[0068] Referring again to FIG. 3, light (411) passing through the first slit (410) is transmitted to a grating structure (420) and can be dispersed by wavelength. The grating structure (420) has thousands to hundreds of thousands of fine grooves formed at regular intervals on its surface and can diffract light (411) at different angles depending on the wavelength.

[0069] The second slit (430) can selectively pass light (421) separated by wavelength by the grid structure (420). By positioning the second slit (430) at a specific location where the light (421) separated by wavelength passes, light of the wavelength required for hardness measurement is selectively passed. For example, to measure the absorbance of an epoxide for measuring the degree of hardness by heat curing, 4530 (cm²) -1 Measurements centered on the wavenumber of ) are necessary, and to measure the absorbance of bismaleimide, 5900 (cm²) -1 A measurement centered on the wavenumber of ) is required. Therefore, the second slit (430) can select light to match the band requiring such measurement.

[0070] The image sensor (440) can convert light (431) that has passed through the second slit (430) into an electrical signal. The image sensor (440) may include, for example, a CMOS (Complementary Metal Oxide Semiconductor) or a CCD (Charge Coupled Device), and may be configured to detect light in the near-infrared wavelength band and generate an electrical signal.

[0071] The light signal recognized through the image sensor (440) can be transmitted to the computer (500) to perform software processing for hardness measurement. In particular, energy levels by wavelength (wavenumber), i.e., absorbance, can be obtained through the sensor (440), and the computer (500) can measure the hardness of the sample (1000) through the shape and value of the peaks and valleys of the obtained absorbance graph.

[0072] FIG. 7 is a diagram illustrating the configuration of a lens and a probe included in a dispersed NIR detection system for measuring a localized area cured material according to an embodiment of the present invention.

[0073] Referring to FIG. 7, a dispersed NIR detection system (10) for measuring a localized area cured material according to an embodiment of the present invention may further include a lens (250) that can be coupled to a probe (200).

[0074] The lens (250) can focus near-infrared light emitted through the probe (200), i.e., a plurality of first optical fibers (211), so as to irradiate the measurement target of the sample (1000), i.e., a local area. The package (251) can be coupled to the light entry port (230) so as to house the lens (250) and make it detachable, and can include a control means to move the lens (250) from a first position (P1) to a second position (P2) to adjust the local area requiring focusing.

[0075] In some embodiments of the present invention, the lens (250) may include silicate-based glass, and preferably may include a borosilicate material without an anti-reflection (AR) coating.

[0076] As previously explained, the dispersed NIR detection system (10) for measuring localized curing materials according to an embodiment of the present invention requires a resolution sufficient to measure the degree of curing of epoxy materials in units of 100 μm. A plurality of first optical fibers (211) that transmit near-infrared light emitted from a light source (100) have a diameter of several hundred μm, preferably 300 μm or less, but a separate light-gathering means such as a lens (250) is required to concentrate near-infrared light into a localized area where measurement is required. The improvement of the measurement effect by the lens (250) is explained using FIGS. 8a and 8b.

[0077] Figures 8a and 8b are graphs illustrating the improvement in measurement effect by a lens included in a dispersed NIR detection system for measuring localized area cured materials according to an embodiment of the present invention.

[0078] FIG. 8a is the absorbance measurement result when the dispersive NIR detection system (10) for measuring a localized area cured material according to an embodiment of the present invention does not include a lens (250). In the near-infrared spectroscopic analysis for measuring epoxy curing, 4500 to 4700 (cm²) -1 Absorbance peaks of aromatics and epoxides should be visible between them. However, these peaks are not visible in the graph of Fig. 8a, and accordingly, it is difficult to determine the normal curing rate.

[0079] FIG. 8b shows the absorbance measurement result when the dispersed NIR detection system (10) for measuring a localized area cured material according to an embodiment of the present invention includes a lens (250). Unlike FIG. 8a above, 4500 to 4700 (cm²) -1 It can be seen that the absorbance peaks of aromatic and epoxides between them are measured normally.

[0080] Although embodiments of the present invention have been described above with reference to the attached drawings, those skilled in the art will understand that the present invention may be implemented in other specific forms without changing its technical concept or essential features. Therefore, the embodiments described above should be understood as illustrative in all respects and not restrictive.

Claims

1. A light source that emits near-infrared light; A probe comprising a plurality of first optical fibers that transmit the above-mentioned near-infrared light to a measurement target, and a plurality of second optical fibers that transmit reflected light from the above-mentioned measurement target; A detector for detecting the reflected light; and A computer that interprets the detected reflected light to measure the degree of hardness of the measurement target, comprising: The detector above has a first slit that passes reflected light transmitted by a plurality of second optical fibers; A grid structure that disperses reflected light passing through the first slit according to wavelength; A second slit that selectively passes light dispersed by the above-mentioned grid structure; and The above includes a sensor that detects optionally passed light, and The plurality of second optical fibers are arranged in alignment along the length direction of the slit groove of the first slit. Dispersive NIR (Near Infrared) detection system for measuring localized cured materials.

2. In Paragraph 1, The diameter of each of the plurality of second optical fibers is larger than the width of the slit groove of the first slit. Dispersive NIR detection system for measuring localized area cured materials.

3. In Paragraph 1, The number of the plurality of first optical fibers is greater than the number of the plurality of second optical fibers. Dispersive NIR detection system for measuring localized area cured materials.

4. In Paragraph 1, The light source emitting the above near-infrared light operates with an output of 4.7W to 30W, Dispersive NIR detection system for measuring localized area cured materials.

5. In Paragraph 1, A lens further comprising a lens that focuses near-infrared light passing through the probe to a local area of ​​the measurement target. Dispersive NIR detection system for measuring localized area cured materials.

6. A light source emitting near-infrared light; A probe that transmits the above near-infrared light to a measurement target and receives reflected light from the measurement target; A detector for detecting the received reflected light; and It includes a computer that interprets the detected reflected light to measure the degree of hardening of the measurement target, The above probe is, A transmission signal line having one end connected to the light source and the other end extending to a light entry / exit port facing the measurement target, and It includes a receiving signal line, one end of which is connected to the detector and the other end of which extends to the light input / output port, and The number of multiple first optical fibers included in the transmission signal line is greater than the number of multiple second optical fibers included in the reception signal line, Dispersive NIR detection system for measuring localized area cured materials.

7. In Paragraph 6, The detector above has a first slit that passes reflected light transmitted by a plurality of receiving signal lines; A grid structure that disperses reflected light passing through the first slit according to wavelength; A second slit that selectively passes light dispersed by the above-mentioned grid structure; and The above includes a sensor that detects optionally passed light, and A plurality of second optical fibers connected to the first slit are arranged in alignment along the length direction of the slit groove of the first slit. Dispersive NIR detection system for measuring localized area cured materials.

8. In Paragraph 7, The diameter of each of the plurality of second optical fibers is larger than the width of the slit groove of the first slit. Dispersive NIR detection system for measuring localized area cured materials.

9. In Paragraph 6, The light source emitting the above near-infrared light operates with an output of 4.7W to 30W, Dispersive NIR detection system for measuring localized area cured materials.

10. In Paragraph 8, A lens further comprising a lens that focuses near-infrared light passing through the probe to a local area of ​​the measurement target. Dispersive NIR detection system for measuring localized area cured materials.

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