Component quality inspection apparatus for optical water quality sensor and inspection method therefor

Abstract

A component quality inspection apparatus for an optical water quality sensor, whereby a plurality of holes are provided on a lower electrode plate rotary disk (117); a first hole (1) among the plurality of holes is used for placing a reference lower-electrode-plate diode (112), and the remaining holes among the plurality of holes are used for placing diodes to be inspected; a lower electrode plate first interface (113) and a lower electrode plate second interface (114) are provided beneath the first hole (1); an upper electrode plate corresponding to the lower electrode plate rotary disk (117) is disposed directly above the first hole (1), and a reference upper-electrode-plate diode (111) is placed on the upper electrode plate, the reference upper-electrode-plate diode (111) being used in cooperation with the reference lower-electrode-plate diode (112); and when an upper electrode plate first interface (115) and an upper electrode plate second interface (116) are in electrical contact and the lower electrode plate first interface (113) and the lower electrode plate second interface (114) are in electrical contact, a signal generated by the reference lower-electrode-plate diode (112) is collected by a circuit to obtain a first ADC conversion value. By setting an inspection standard, reciting test data and storing records, the component quality inspection apparatus for an optical water quality sensor improves working efficiency.

Description

A component quality testing device and method for an optical water quality sensor. Technical Field

[0001] This invention relates to the field of sensor technology, and in particular to a component quality testing device and method for an optical water quality sensor. Background Technology

[0002] Common optical principles used in water quality analyzers include spectrophotometry, fluorescence analysis, and colorimetry. Among these, spectrophotometry is one of the most common principles. It utilizes the property that light of a specific wavelength is absorbed by substances in the water when it passes through the sample, and determines the concentration of a specific substance in the water sample by measuring the light transmittance. Fluorescence analysis utilizes the property that substances fluoresce when exposed to excitation light, and analyzes specific components in the water sample by measuring the fluorescence intensity. Colorimetry utilizes the differences in absorption, scattering, or transmission of light of a specific wavelength by a substance solution, and analyzes specific components in the water sample by measuring the intensity of light absorption, scattering, or transmission. These optical methods for detecting water quality parameters all rely on light-emitting diodes (LEDs) and photodiodes. Measuring different parameters requires LEDs with wavelengths within a certain range and photodiodes with corresponding sensitivities. If the quality of the LEDs and photodiodes used in the sensor manufacturing process is inconsistent, the quality of the sensors cannot be effectively controlled. This can lead to some sensors having substandard detection accuracy and poor consistency between sensors. Manually testing and checking each sensor individually is complex, inefficient, prone to operational errors, and makes it difficult to maintain test records for each device.

[0003] Therefore, it is necessary to provide a component quality testing device and testing method for optical water quality sensors to effectively solve the above problems. Summary of the Invention

[0004] This invention provides a component quality inspection device and method for optical water quality sensors. By setting inspection standards, recording test data and test serial numbers, product quality is improved and worker efficiency is increased.

[0005] This invention provides a component quality testing device for an optical water quality sensor. The testing device includes a reference upper electrode diode, a reference lower electrode diode, a lower electrode first interface, a lower electrode second interface, an upper electrode first interface, an upper electrode second interface, and a lower electrode rotating disk.

[0006] The lower electrode plate rotating disk is provided with multiple holes. The first hole among the multiple holes is used to place the reference lower electrode plate diode, and the remaining holes among the multiple holes are used to place the diode to be tested. The reference lower electrode plate diode is used as a reference.

[0007] The first interface of the lower electrode plate and the second interface of the lower electrode plate are provided below the first hole;

[0008] An upper electrode plate corresponding to the lower electrode plate rotating disk is provided directly above the first hole. The reference upper electrode plate diode is placed on the upper electrode plate, and the reference upper electrode plate diode and the reference lower electrode plate diode are used together.

[0009] When the first interface of the upper electrode plate and the second interface of the upper electrode plate are in contact with each other, and the first interface of the lower electrode plate and the second interface of the lower electrode plate are in contact with each other, the reference lower electrode plate diode generates a signal, which is then collected by the signal transmission and signal detection circuit to obtain the first ADC conversion value.

[0010] The motor driver controls the lower electrode plate rotary disk to rotate sequentially by a preset angle so that the diodes to be tested placed in the remaining holes make contact with the first interface and the second interface of the lower electrode plate, thereby obtaining the corresponding multiple ADC conversion values ​​of the diodes to be tested placed in the remaining holes.

[0011] Preferably, the diodes placed on the upper reference plate and the lower reference plate correspond to each other; when the diode placed on the upper reference plate is a light-emitting diode, the diode placed on the lower reference plate is a photodiode, and the detection device is a photodiode; when the diode placed on the upper reference plate is a photodiode, the diode placed on the lower reference plate is a light-emitting diode, and the detection device is a light-emitting diode.

[0012] Preferably, the plurality of holes are 12 holes, and the preset angle is 30°.

[0013] Preferably, the remaining holes are the second hole, the third hole, the fourth hole, the fifth hole, the sixth hole, the seventh hole, the eighth hole, the ninth hole, the tenth hole, the eleventh hole, and the twelfth hole, and the corresponding plurality of ADC conversion values ​​are the second ADC conversion value, the third ADC conversion value, the fourth ADC conversion value, the fifth ADC conversion value, the sixth ADC conversion value, the seventh ADC conversion value, the eighth ADC conversion value, the ninth ADC conversion value, the tenth ADC conversion value, the eleventh ADC conversion value, and the twelfth ADC conversion value.

[0014] Preferably, when the reference lower plate diode is a photodiode, in the signal transmission circuit, the first capacitor C1, the first resistor R1, and the second resistor R2 form a voltage divider circuit. The first capacitor C1 is used for voltage regulation, and the first resistor R1 and the second resistor R2 obtain VREF through voltage division. VREF is connected to the first amplifier U1 so that VREF is transmitted to the first pin of the first amplifier U1 to generate a clamping voltage, so that the infrared diode Q1 and the third diode R3 have a first current I1 flowing in to generate a transmission signal, wherein VREF = VCC*R2 / (R1+R2), and I1 = VREF / R3;

[0015] In the signal detection circuit, the photodiode generates a second induced current I2 after receiving the transmitted signal. The second amplifier U2, the second capacitor C2, and the fourth resistor R4 form a current acquisition circuit, wherein the second capacitor C2 is used for anti-interference. The output voltage of the second amplifier U2 is V1. The third amplifier U3, the fifth resistor R5, the sixth resistor R6, and the third capacitor C3 form a voltage signal amplification circuit with an amplification factor of G. The ADC chip U4 is used to convert the voltage signal into a digital signal and transmit the data to U5 through SPI communication. U5 transmits the detected data to the configuration screen through U6. U5 is the controller MCU, U6 is the communication chip RS485, V1 = R4 * I2, G = 1 + R6 / R5.

[0016] Preferably, the PWM1 generated by U5 is connected to the seventh resistor R7 and U10. The seventh resistor R7 is used for current limiting. After receiving the PWM1 pulse signal, the motor driver chip U13 drives the stepper motor to rotate so as to drive the lower plate rotating disk to rotate.

[0017] The IO1 generated by U5 is connected to the eighth resistor R8 and U11. After receiving the IO1, the motor driver chip U13 controls the stepper motor to rotate forward and backward.

[0018] The IO2 generated by U5 is connected to the ninth resistor R9 and U12. After receiving the IO2, the motor driver chip U13 controls the motor driver to be in working or sleep mode.

[0019] Preferably, U14 leads out the first interface and the second interface of the upper plate. When IO3 outputs a low level, X_COM and Y_COM are closed. When IO3 outputs a high level, X_COM and Y_COM are open. When both IO4 and IO5 output a low level, channel 0 is selected to connect to the photodiode. When IO4 outputs a low level and IO5 outputs a high level, channel 1 is selected to connect to the light-emitting diode.

[0020] U15 leads out the first interface of the lower electrode plate and the second interface of the upper electrode plate. When IO6 outputs a low level, X_COM and Y_COM are closed. When IO6 outputs a high level, X_COM and Y_COM are open. When both IO7 and IO8 output a low level, channel 0 is selected to connect to the photodiode. When IO7 outputs a low level and IO8 outputs a high level, channel 1 is selected to connect to the light-emitting diode.

[0021] This invention also provides a detection method for a component quality detection device suitable for the above-mentioned optical water quality sensor.

[0022] Select the reference lower plate diode and the corresponding reference upper plate diode;

[0023] The first ADC conversion value is obtained by detecting the reference lower plate diode;

[0024] Set the allowable error range between the diode to be detected and the first ADC conversion value;

[0025] The upper electrode plate remains stationary, while the stepper motor drives the lower electrode plate rotating disk to rotate by a preset angle to detect the corresponding multiple ADC conversion values ​​of the diode to be detected.

[0026] Compare the error range between the corresponding multiple ADC conversion values ​​of the diode to be detected and the first ADC conversion value;

[0027] If the error between multiple ADC conversion values ​​of the diode to be tested and the first ADC conversion value exceeds the allowable error range, the serial number of the corresponding diode is recorded.

[0028] Preferably, the plurality of holes are 12 holes, and the preset angle is 30°.

[0029] Preferably, the remaining holes are the second hole, the third hole, the fourth hole, the fifth hole, the sixth hole, the seventh hole, the eighth hole, the ninth hole, the tenth hole, the eleventh hole, and the twelfth hole, and the corresponding plurality of ADC conversion values ​​are the second ADC conversion value, the third ADC conversion value, the fourth ADC conversion value, the fifth ADC conversion value, the sixth ADC conversion value, the seventh ADC conversion value, the eighth ADC conversion value, the ninth ADC conversion value, the tenth ADC conversion value, the eleventh ADC conversion value, and the twelfth ADC conversion value.

[0030] The technical solutions of the embodiments of the present invention have the following beneficial effects:

[0031] This invention provides a component quality testing device and method for an optical water quality sensor. The testing device includes a reference upper electrode diode, a reference lower electrode diode, a first lower electrode interface, a second lower electrode interface, a first upper electrode interface, a second upper electrode interface, and a lower electrode rotating disk. The lower electrode rotating disk has multiple holes. The first hole is used to place the reference lower electrode diode, and the remaining holes are used to place the diode to be tested. The reference lower electrode diode serves as a reference. The first lower electrode interface and the second lower electrode interface are located below the first hole. An upper electrode plate, corresponding to the lower electrode rotating disk, is located directly above the first hole, and the reference upper electrode diode is placed on the upper electrode plate. The reference upper plate diode and the reference lower plate diode are used together. When the first interface and the second interface of the upper plate and the first interface and the second interface of the lower plate are in contact, the reference lower plate diode generates a signal, which is collected by the signal transmission and signal detection circuit to obtain the first ADC conversion value. The motor driver controls the lower plate rotating disk to rotate sequentially by a preset angle so that the diodes to be tested placed in the other holes are in contact with the first interface and the second interface of the lower plate, thereby obtaining the corresponding multiple ADC conversion values ​​of the diodes to be tested placed in the other holes. By setting detection standards, recording test data and test serial numbers, product quality is improved, worker efficiency is increased, scrap output is reduced, and costs are saved.

[0032] Furthermore, the remaining holes are the second, third, fourth, fifth, sixth, seventh, eighth, ninth, tenth, eleventh, and twelfth holes, and the corresponding multiple ADC conversion values ​​are the second, third, fourth, fifth, sixth, seventh, eighth, ninth, tenth, eleventh, and twelfth ADC conversion values. This allows for the simultaneous detection of the ADC conversion values ​​of 11 diodes to be tested, greatly improving the detection efficiency. Attached Figure Description

[0033] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the accompanying drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention, but not all embodiments. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0034] Figure 1 is a schematic diagram of the structure of a component quality detection device for an optical water quality sensor according to an embodiment of the present invention;

[0035] Figure 2 is a schematic diagram of the signal transmission and signal detection circuit of a component quality detection device for an optical water quality sensor according to an embodiment of the present invention;

[0036] Figure 3 is a schematic diagram of the motor drive circuit of a component quality detection device for an optical water quality sensor according to an embodiment of the present invention;

[0037] Figure 4 is a schematic diagram of the switching circuit of the upper and lower plates of a light-emitting diode in a component quality detection device for an optical water quality sensor according to an embodiment of the present invention.

[0038] Figure 5 is a schematic diagram of the photodiode upper and lower electrode switching circuit of a component quality detection device for an optical water quality sensor according to an embodiment of the present invention.

[0039] Figure 6 is a flowchart illustrating a detection method for a component quality detection device of an optical water quality sensor according to an embodiment of the present invention.

[0040] Reference numerals: 1. First hole; 2. Second hole; 3. Third hole; 4. Fourth hole; 5. Fifth hole; 6. Sixth hole; 7. Seventh hole; 8. Eighth hole; 9. Ninth hole; 10. Tenth hole; 11. Eleventh hole; 12. Twelfth hole; 111. Reference upper plate diode; 112. Reference lower plate diode; 113. Lower plate first interface; 114. Lower plate second interface; 115. Upper plate first interface; 116. Upper plate second interface; 117. Lower plate rotating disk. Detailed Implementation

[0041] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0042] The technical solution of the present invention will be described in detail below with reference to specific embodiments. These specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments.

[0043] To address the problems existing in the prior art, this invention provides a component quality testing device and method for optical water quality sensors. By setting testing standards, recording test data and test serial numbers, product quality is improved and worker efficiency is increased.

[0044] Figure 1 is a structural schematic diagram of a component quality detection device for an optical water quality sensor according to an embodiment of the present invention; Figure 2 is a schematic diagram of a signal transmission and signal detection circuit of a component quality detection device for an optical water quality sensor according to an embodiment of the present invention; Figure 3 is a schematic diagram of a motor drive circuit of a component quality detection device for an optical water quality sensor according to an embodiment of the present invention; Figure 4 is a schematic diagram of a switching circuit for the upper and lower plates of a light-emitting diode in a component quality detection device for an optical water quality sensor according to an embodiment of the present invention; Figure 5 is a schematic diagram of a switching circuit for the upper and lower plates of a photodiode in a component quality detection device for an optical water quality sensor according to an embodiment of the present invention.

[0045] Referring now to Figures 1-5, this embodiment of the invention provides a component quality detection device for an optical water quality sensor. The detection device includes a reference upper electrode diode 111, a reference lower electrode diode 112, a lower electrode first interface 113, a lower electrode second interface 114, an upper electrode first interface 115, an upper electrode second interface 116, and a lower electrode rotating disk 117.

[0046] The lower electrode plate rotating disk 117 is provided with a plurality of holes. The first hole 1 among the plurality of holes is used to place the reference lower electrode plate diode 112, and the remaining holes among the plurality of holes are used to place the diode to be tested. The reference lower electrode plate diode 112 is used as a reference.

[0047] The first interface 113 and the second interface 114 of the lower electrode plate are provided below the first hole 1;

[0048] An upper electrode plate corresponding to the lower electrode plate rotating disk 117 is provided directly above the first hole position 1. The reference upper electrode plate diode 111 is placed on the upper electrode plate, and the reference upper electrode plate diode 111 and the reference lower electrode plate diode 112 are used together.

[0049] When the first interface 115 and the second interface 116 of the upper electrode plate make contact and the first interface 113 and the second interface 114 of the lower electrode plate make contact, the reference lower electrode plate diode 112 generates a signal, which is then collected by the signal transmission and signal detection circuit to obtain the first ADC conversion value.

[0050] The motor driver controls the lower electrode plate rotating disk 117 to rotate sequentially by a preset angle so that the diodes to be tested placed in the other holes make contact with the first interface 113 and the second interface 114 of the lower electrode plate, thereby obtaining the corresponding multiple ADC conversion values ​​of the diodes to be tested placed in the other holes.

[0051] In a specific implementation, the diodes placed on the upper reference plate and the lower reference plate correspond to each other; when the diode 111 placed on the upper reference plate is a light-emitting diode, the diode 112 placed on the lower reference plate is a photodiode, and the detection device is a photodiode; when the diode 111 placed on the upper reference plate is a photodiode, the diode 112 placed on the lower reference plate is a light-emitting diode, and the detection device is a light-emitting diode.

[0052] In a specific implementation, the plurality of holes is 12 holes, and the preset angle is 30°.

[0053] In specific implementation, the remaining holes are the second hole 2, the third hole 3, the fourth hole 4, the fifth hole 5, the sixth hole 6, the seventh hole 7, the eighth hole 8, the ninth hole 9, the tenth hole 10, the eleventh hole 11, and the twelfth hole 12, and the corresponding multiple ADC conversion values ​​are the second ADC conversion value, the third ADC conversion value, the fourth ADC conversion value, the fifth ADC conversion value, the sixth ADC conversion value, the seventh ADC conversion value, the eighth ADC conversion value, the ninth ADC conversion value, the tenth ADC conversion value, the eleventh ADC conversion value, and the twelfth ADC conversion value.

[0054] In a specific implementation, when the reference lower plate diode is a photodiode, in the signal transmission circuit, the first capacitor C1, the first resistor R1, and the second resistor R2 form a voltage divider circuit. The first capacitor C1 is used for voltage regulation, and the first resistor R1 and the second resistor R2 obtain VREF through voltage division. VREF is connected to the first amplifier U1 so that VREF is transmitted to the first pin of the first amplifier U1 to generate a clamping voltage, so that the infrared diode Q1 and the third resistor R3 have a first current I1 flowing in to generate a transmission signal, where VREF = VCC*R2 / (R1+R2), and I1 = VREF / R3.

[0055] In the signal detection circuit, the photodiode generates a second induced current I2 after receiving the transmitted signal. The second amplifier U2, the second capacitor C2, and the fourth resistor R4 form a current acquisition circuit, wherein the second capacitor C2 is used for anti-interference. The output voltage of the second amplifier U2 is V1. The third amplifier U3, the fifth resistor R5, the sixth resistor R6, and the third capacitor C3 form a voltage signal amplification circuit with an amplification factor of G. The ADC chip U4 is used to convert the voltage signal into a digital signal and transmit the data to U5 through SPI communication. U5 transmits the detected data to the configuration screen through U6. U5 is the controller MCU, U6 is the communication chip RS485, V1 = R4 * I2, G = 1 + R6 / R5.

[0056] In a specific implementation, the PWM1 generated by U5 is connected to the seventh resistor R7 and U10. The seventh resistor R7 is used for current limiting. After receiving the PWM1 pulse signal, the motor driver chip U13 drives the stepper motor to rotate so as to drive the lower plate rotating disk to rotate.

[0057] The IO1 generated by U5 is connected to the eighth resistor R8 and U11. After receiving the IO1, the motor driver chip U13 controls the stepper motor to rotate forward and backward.

[0058] The IO2 generated by U5 is connected to the ninth resistor R9 and U12. After receiving the IO2, the motor driver chip U13 controls the motor driver to be in working or sleep mode.

[0059] In specific implementation, U14 leads out the first interface and the second interface of the upper plate. When IO3 outputs a low level, X_COM and Y_COM are closed. When IO3 outputs a high level, X_COM and Y_COM are open. When both IO4 and IO5 output a low level, channel 0 is selected to connect to the photodiode. When IO4 outputs a low level and IO5 outputs a high level, channel 1 is selected to connect to the light-emitting diode.

[0060] U15 leads out the first interface of the lower electrode plate and the second interface of the upper electrode plate. When IO6 outputs a low level, X_COM and Y_COM are closed. When IO6 outputs a high level, X_COM and Y_COM are open. When both IO7 and IO8 output a low level, channel 0 is selected to connect to the photodiode. When IO7 outputs a low level and IO8 outputs a high level, channel 1 is selected to connect to the light-emitting diode.

[0061] Figure 6 is a flowchart illustrating a detection method for a component quality detection device of an optical water quality sensor according to an embodiment of the present invention.

[0062] Referring now to Figure 6, this embodiment of the invention also provides a detection method for a component quality detection device suitable for the above-mentioned optical water quality sensor, including:

[0063] Step S601: Select the reference lower plate diode 112 and the corresponding reference upper plate diode 111;

[0064] Step S602: Detect the reference lower plate diode 112 to obtain the first ADC conversion value;

[0065] Step S603: Set the allowable error range between the diode to be detected and the first ADC conversion value;

[0066] Step S604: The upper electrode plate remains stationary, and the stepper motor drives the lower electrode plate rotating disk 117 to rotate by a preset angle to detect the corresponding multiple ADC conversion values ​​of the diode to be detected;

[0067] Step S605: Compare the error range between the corresponding multiple ADC conversion values ​​of the diode to be detected and the first ADC conversion value;

[0068] Step S606: If the error between multiple ADC conversion values ​​of the diode to be tested and the first ADC conversion value exceeds the allowable error range, then record the serial number of the corresponding diode.

[0069] In a specific implementation, the plurality of holes is 12 holes, and the preset angle is 30°.

[0070] In specific implementation, the remaining holes are the second hole 2, the third hole 3, the fourth hole 4, the fifth hole 5, the sixth hole 6, the seventh hole 7, the eighth hole 8, the ninth hole 9, the tenth hole 10, the eleventh hole 11, and the twelfth hole 12, and the corresponding multiple ADC conversion values ​​are the second ADC conversion value, the third ADC conversion value, the fourth ADC conversion value, the fifth ADC conversion value, the sixth ADC conversion value, the seventh ADC conversion value, the eighth ADC conversion value, the ninth ADC conversion value, the tenth ADC conversion value, the eleventh ADC conversion value, and the twelfth ADC conversion value.

[0071] In summary, the component quality detection device and method for an optical water quality sensor provided by the embodiments of the present invention include a reference upper electrode diode, a reference lower electrode diode, a lower electrode first interface, a lower electrode second interface, an upper electrode first interface, an upper electrode second interface, and a lower electrode rotating disk. The lower electrode rotating disk has multiple holes, with the first hole used to place the reference lower electrode diode, and the remaining holes used to place diodes to be tested. The reference lower electrode diode serves as a reference. The lower electrode first interface and the lower electrode second interface are located below the first hole. An upper electrode plate corresponding to the lower electrode rotating disk is located directly above the first hole, and the reference upper electrode diode is placed on the upper electrode plate. The diode, comprising a reference upper plate diode and a reference lower plate diode, is used in conjunction. When the first and second interfaces of the upper plate and the first and second interfaces of the lower plate are in contact, the reference lower plate diode generates a signal, which is then acquired by a signal transmission and detection circuit to obtain a first ADC conversion value. A motor driver controls the lower plate rotating disk to rotate sequentially by a preset angle, causing the diodes to be tested placed in the remaining holes to make contact with the first and second interfaces of the lower plate, thus obtaining multiple ADC conversion values ​​for the diodes to be tested placed in the remaining holes. By setting detection standards, recording test data and test serial numbers, product quality is improved, worker efficiency is increased, scrap output is reduced, and costs are saved.

[0072] Furthermore, the remaining holes are the second, third, fourth, fifth, sixth, seventh, eighth, ninth, tenth, eleventh, and twelfth holes, and the corresponding multiple ADC conversion values ​​are the second, third, fourth, fifth, sixth, seventh, eighth, ninth, tenth, eleventh, and twelfth ADC conversion values. This allows for the simultaneous detection of the ADC conversion values ​​of 11 diodes to be tested, greatly improving the detection efficiency.

[0073] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A component quality detection device for an optical water quality sensor, characterized by, The detection device includes a reference upper plate diode, a reference lower plate diode, a lower plate first interface, a lower plate second interface, an upper plate first interface, an upper plate second interface, and a lower plate rotating disk; The lower electrode plate rotating disk is provided with multiple holes. The first hole among the multiple holes is used to place the reference lower electrode plate diode, and the remaining holes among the multiple holes are used to place the diode to be tested. The reference lower electrode plate diode is used as a reference. The first interface of the lower electrode plate and the second interface of the lower electrode plate are provided below the first hole; An upper electrode plate corresponding to the lower electrode plate rotating disk is provided directly above the first hole. The reference upper electrode plate diode is placed on the upper electrode plate, and the reference upper electrode plate diode and the reference lower electrode plate diode are used together. When the first interface of the upper electrode plate and the second interface of the upper electrode plate are in contact with each other, and the first interface of the lower electrode plate and the second interface of the lower electrode plate are in contact with each other, the reference lower electrode plate diode generates a signal, which is then collected by the signal transmission and signal detection circuit to obtain the first ADC conversion value. The motor driver controls the lower electrode plate rotary disk to rotate sequentially by a preset angle so that the diodes to be tested placed in the remaining holes make contact with the first interface and the second interface of the lower electrode plate, thereby obtaining the corresponding multiple ADC conversion values ​​of the diodes to be tested placed in the remaining holes.

2. The apparatus according to claim 1, wherein The diodes placed on the upper reference plate and the lower reference plate correspond to each other; when the diode placed on the upper reference plate is a light-emitting diode, the diode placed on the lower reference plate is a photodiode, and the detection device is a photodiode; when the diode placed on the upper reference plate is a photodiode, the diode placed on the lower reference plate is a light-emitting diode, and the detection device is a light-emitting diode.

3. The apparatus according to claim 1, wherein The plurality of holes consists of 12 holes, and the preset angle is 30°.

4. The optical water quality sensor component quality detection device according to claim 3, characterized by The remaining holes are the second hole, the third hole, the fourth hole, the fifth hole, the sixth hole, the seventh hole, the eighth hole, the ninth hole, the tenth hole, the eleventh hole, and the twelfth hole, and the corresponding multiple ADC conversion values ​​are the second ADC conversion value, the third ADC conversion value, the fourth ADC conversion value, the fifth ADC conversion value, the sixth ADC conversion value, the seventh ADC conversion value, the eighth ADC conversion value, the ninth ADC conversion value, the tenth ADC conversion value, the eleventh ADC conversion value, and the twelfth ADC conversion value.

5. The apparatus according to claim 1, wherein When the reference lower plate diode is a photodiode, in the signal transmission circuit, the first capacitor C1, the first resistor R1, and the second resistor R2 form a voltage divider circuit. The first capacitor C1 is used for voltage regulation. The first resistor R1 and the second resistor R2 obtain VREF through voltage division. VREF is connected to the first amplifier U1 so that VREF is transmitted to the first pin of the first amplifier U1 to generate a clamping voltage, so that the infrared diode Q1 and the third diode R3 have a first current I1 flowing in to generate a transmission signal. Wherein, VREF=VCC*R2 / (R1+R2), I1=VREF / R3; In the signal detection circuit, the photodiode generates a second induced current I2 after receiving the transmitted signal. The second amplifier U2, the second capacitor C2, and the fourth resistor R4 form a current acquisition circuit, wherein the second capacitor C2 is used for anti-interference. The output voltage of the second amplifier U2 is V1. The third amplifier U3, the fifth resistor R5, the sixth resistor R6, and the third capacitor C3 form a voltage signal amplification circuit with an amplification factor of G. The ADC chip U4 is used to convert the voltage signal into a digital signal and transmit the data to U5 through SPI communication. U5 transmits the detected data to the configuration screen through U6. U5 is the controller MCU, U6 is the communication chip RS485, V1 = R4 * I2, G = 1 + R6 / R5.

6. The optical water quality sensor component quality detection apparatus according to claim 5, wherein The PWM1 generated by U5 is connected to the seventh resistor R7 and U10. The seventh resistor R7 is used for current limiting. After receiving the PWM1 pulse signal, the motor driver chip U13 drives the stepper motor to rotate, thereby driving the lower plate rotating disk to rotate. The IO1 generated by U5 is connected to the eighth resistor R8 and U11. After receiving the IO1, the motor driver chip U13 controls the stepper motor to rotate forward and backward. The IO2 generated by U5 is connected to the ninth resistor R9 and U12. After receiving the IO2, the motor driver chip U13 controls the motor driver to be in working or sleep mode.

7. The apparatus according to claim 1, wherein U14 leads out the first interface and the second interface of the upper plate. When IO3 outputs a low level, X_COM and Y_COM are closed. When IO3 outputs a high level, X_COM and Y_COM are open. When both IO4 and IO5 output a low level, channel 0 is selected to connect to the photodiode. When IO4 outputs a low level and IO5 outputs a high level, channel 1 is selected to connect to the light-emitting diode. U15 leads out the first interface of the lower electrode plate and the second interface of the upper electrode plate. When IO6 outputs a low level, X_COM and Y_COM are closed. When IO6 outputs a high level, X_COM and Y_COM are open. When both IO7 and IO8 output a low level, channel 0 is selected to connect to the photodiode. When IO7 outputs a low level and IO8 outputs a high level, channel 1 is selected to connect to the light-emitting diode.

8. A detection method for a component quality detection device applicable to the optical water quality sensor as described in claim 1, characterized in that, Select the reference lower plate diode and the corresponding reference upper plate diode; The first ADC conversion value is obtained by detecting the reference lower plate diode; Set the allowable error range between the diode to be detected and the first ADC conversion value; The upper electrode plate remains stationary, while the stepper motor drives the lower electrode plate rotating disk to rotate by a preset angle to detect the corresponding multiple ADC conversion values ​​of the diode to be detected. Compare the error range between the corresponding multiple ADC conversion values ​​of the diode to be detected and the first ADC conversion value; If the error between multiple ADC conversion values ​​of the diode to be tested and the first ADC conversion value exceeds the allowable error range, the serial number of the corresponding diode is recorded.

9. The detection method according to claim 8, characterized in that, The plurality of holes consists of 12 holes, and the preset angle is 30°.

10. The detection method according to claim 9, characterized in that, The remaining holes are the second hole, the third hole, the fourth hole, the fifth hole, the sixth hole, the seventh hole, the eighth hole, the ninth hole, the tenth hole, the eleventh hole, and the twelfth hole, and the corresponding multiple ADC conversion values ​​are the second ADC conversion value, the third ADC conversion value, the fourth ADC conversion value, the fifth ADC conversion value, the sixth ADC conversion value, the seventh ADC conversion value, the eighth ADC conversion value, the ninth ADC conversion value, the tenth ADC conversion value, the eleventh ADC conversion value, and the twelfth ADC conversion value.

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