Battery state estimation system, battery state estimation method, and battery state estimation program

The battery state estimation system addresses inaccuracies in SOC and SOH estimation for lithium-ion batteries with mixed graphite-silicon anodes by incorporating a correction mechanism for silicon crystallization, ensuring accurate state assessment.

WO2026115898A1PCT designated stage Publication Date: 2026-06-04PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO LTD

Patent Information

Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO LTD
Filing Date
2025-09-26
Publication Date
2026-06-04

AI Technical Summary

Technical Problem

Existing methods for estimating the State of Charge (SOC) and State of Health (SOH) of lithium-ion batteries with a mixed graphite-silicon anode suffer from inaccuracies due to silicon crystallization, which causes deformation in the SOC-OCV curve, leading to estimation errors and the accumulation of current measurement errors over time.

Method used

A battery state estimation system that includes a data acquisition unit, an SOC-OCV curve estimation unit, and a correction unit to adjust for silicon crystallization, using crystallinity maps and OCV offset amounts to improve accuracy.

Benefits of technology

Enables precise estimation of SOC and SOH in lithium-ion batteries with mixed graphite-silicon anodes, reducing estimation errors and enhancing the accuracy of battery state assessment.

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Abstract

In the present invention, a data acquisition section 111 acquires time-series battery data including voltage and current of a lithium-ion battery that uses a mixed material of graphite and silicon as a negative electrode active material. Based on a State Of Charge (SOC)-Open Circuit Voltage (OCV) curve of the lithium-ion battery and the lithium-ion battery voltage included in the battery data, an SOC estimation section 112 estimates the SOC of the lithium-ion battery. A correction section 114 corrects the SOC–OCV curve based on the crystallization state of silicon.
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