Automated analysis device

WO2026140344A1PCT designated stage Publication Date: 2026-07-02HITACHI HIGH TECH CORP

Patent Information

Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
HITACHI HIGH TECH CORP
Filing Date
2025-08-12
Publication Date
2026-07-02

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Abstract

In order to provide an automated analysis device including a liquid level detector that is less susceptible to the effects of electrostatic discharge, the following configuration was adopted. This automated analysis device comprises a dispensing mechanism including a nozzle for dispensing a liquid, an arm for supporting the nozzle, and an arm supporting portion for supporting the arm, and is characterized in that: a substrate for measuring the capacitance between the nozzle and the ground, and a substrate cover for covering at least the top and sides of the substrate are provided inside the arm; at least a portion of the substrate cover is made of a conductive material; and the conductive material is grounded via a conductive path.
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