Fogging test method and system

Abstract

A fogging test method and system, applied to the technical field of device testing. The method comprises: placing a device under test in a first test environment; after said device has been placed in the first test environment for a first duration, placing said device in a second test environment; and after said device has been placed in the second test environment for a second duration, determining first data, wherein the first data is used for indicating a first fogging state of said device. The first test environment has a certain humidity, the temperature of the second test environment is lower than that of the first test environment, and there is a certain temperature difference between the second test environment and the first test environment. Said device is first placed in the first test environment, so that the humidity of said device can be increased, thereby creating a suitable condition for generating moisture inside said device. After a time period, said device is transferred from the first test environment to the second test environment, so that said device can be rapidly cooled, thereby inducing fogging which is used for evaluating the anti-fogging performance of said device.

Description

A fogging test method and system Technical Field

[0001] This application relates to the field of fogging testing technology, and in particular to a fogging testing method and system. Background Technology

[0002] Fogging in some optical imaging devices can affect their practical use. For example, vehicle cameras are key sensors in intelligent driving systems, relying on optical imaging for identification. If fogging occurs, the resulting image will be blurry, hindering image recognition and impacting the user's driving experience.

[0003] Therefore, fogging tests are needed to evaluate the anti-fogging performance of devices. However, there is currently a lack of specific methods and use cases for fogging testing. Summary of the Invention

[0004] This application provides a fogging test method, which can perform fogging tests on devices to obtain the fogging status of the devices and to evaluate the anti-fogging performance of the devices.

[0005] In a first aspect, this application provides a fogging test method. The method includes: placing a device under test (DUT) in a first test environment; after the DUT has been placed in the first test environment for a first duration; placing the DUT in a second test environment; after the DUT has been placed in the second test environment for a second duration; and determining first data, the first data being used to indicate a first fogging condition of the DUT.

[0006] Specifically, the humidity of the first test environment meets a first humidity condition. The first humidity condition refers to the humidity requirement that the first test environment must meet. For example, the first test environment can be a high-humidity environment.

[0007] The temperature of the second test environment is lower than that of the first test environment, and the temperature difference between the first and second test environments is greater than or equal to a first temperature difference threshold. The first temperature difference threshold can be understood as the minimum temperature difference between the first and second test environments. For example, the first temperature difference threshold may be, but is not limited to, 60°C, 40°C, or 25°C. For example, the second test environment may be a low-temperature environment.

[0008] The first duration can be understood as the duration during which the device under test (DUT) is placed in the first test environment. When the duration of the DUT in the first test environment reaches the first duration, the DUT is removed from the first test environment and placed in the second test environment, that is, the DUT is transferred from the first test environment to the second test environment.

[0009] The second duration can be understood as the duration the device under test (DUT) is placed in the second test environment. When the duration of the second duration is reached, the DUT is removed from the second test environment, and the first data is determined. The first data is related to the first fogging condition of the DUT and can be used to reflect the first fogging condition of the DUT.

[0010] The first fogging condition can also be understood as the fogging situation obtained by using a high humidity environment and cooling as conditions to induce fogging. Optionally, the first fogging condition may include the following information: whether water mist appears, and if water mist appears, the degree and duration of water mist dissipation. The first fogging condition of the device under test (DUT) is related to the anti-fogging performance of the DUT and can be used to evaluate the anti-fogging performance of the DUT.

[0011] In the above method, the first test environment has a certain humidity, the temperature of the second test environment is lower than that of the first test environment, and there is a certain temperature difference between the two test environments. Placing the device under test (DUT) in the first test environment first increases its humidity, creating suitable conditions for moisture to form inside the DUT. After a period of time, transferring the DUT from the first test environment to the second test environment allows for rapid cooling, thereby triggering fogging. By observing the fogging behavior of the DUT, the fogging risk can be determined, which can then be used to evaluate the DUT's anti-fogging performance.

[0012] In one possible implementation of the first aspect, the first data includes the transmittance of the device under test and / or the sensing data obtained when the device under test is in operation.

[0013] The transmittance of a device under test (DUT) can be affected by fogging. For example, if fogging occurs on the DUT, its transmittance will decrease. Therefore, the fogging status of the DUT can be determined by its transmittance.

[0014] The sensing data obtained when the device under test (DUT) is working can be affected by fogging. If fogging occurs in the DUT, the quality of the sensing data obtained when the DUT is working will be reduced (for example, if the sensing data is an image, the image clarity will be reduced). Therefore, the fogging status of the DUT can be determined based on the sensing data obtained when the DUT is working.

[0015] Through the above implementation methods, the fogging situation of the device under test can be reflected more accurately by using the light transmittance of the device under test and / or the sensing data obtained when the device under test is working.

[0016] In one possible implementation of the first aspect, if the first fogging condition of the device under test includes the appearance of water mist on the device under test and the water mist not completely dissipating within a third time period, the anti-fogging performance of the device under test is determined to be unqualified.

[0017] The third duration can be understood as the maximum time required for water mist to completely dissipate after it appears on a device with acceptable anti-fogging performance. After water mist appears on the device under test, the duration (or dissipation time) of the water mist can be recorded. If the duration of the water mist is greater than the third duration (i.e., the water mist does not completely dissipate within the third duration), it can be considered that the device under test has persistent, undissipated water mist (or the water mist dissipation time is too long), meaning that the device under test cannot quickly return to normal after water mist appears. In this case, the anti-fogging performance of the device under test can be determined to be unacceptable.

[0018] Through the above implementation method, in the case of the first fogging situation of the device under test, including the appearance of water mist on the device under test and the water mist not completely dissipating within a third time period, the anti-fogging performance of the device under test is determined to be unqualified. In this way, devices with unqualified anti-fogging performance can be screened out simply and efficiently.

[0019] In one possible implementation of the first aspect, in the case of a first fogging condition of the device under test including no water mist appearing on the device under test, or water mist appearing on the device under test and the water mist completely dissipating within a third time period, the device under test is powered on after the water mist has completely dissipated, and second data is determined, the second data being used to indicate a second fogging condition of the device under test.

[0020] The second data relates to the second fogging condition of the device under test (DUT) and can be used to reflect the second fogging condition of the DUT. For example, the second data includes the transmittance of the DUT and / or the sensing data obtained when the DUT is operating.

[0021] The second fogging condition can also be understood as the fogging condition obtained by using power-on as the condition to induce fogging. Optionally, the second fogging condition may include the following information: whether water mist appears, and if water mist appears, the degree and duration of water mist dissipation. The second fogging condition of the device under test (DUT) is related to the anti-fogging performance of the DUT and can be used to evaluate the anti-fogging performance of the DUT.

[0022] Through the above implementation method, after conducting fogging tests using a high-humidity environment and cooling, the device under test (DUT) is further powered on to induce fogging. By observing the fogging situation after powering on the DUT, the fogging risk of the DUT can be determined, and thus used to evaluate the anti-fogging performance of the DUT. In addition, since the DUT is in an operational state after powering on, it has a high degree of conformity with actual usage scenarios, which is conducive to obtaining test results that are closer to actual conditions and reducing the failure rate in the live network.

[0023] In one possible implementation of the first aspect, if the second fogging condition of the device under test includes the absence of water vapor within a fourth time period after power-on, or the appearance of water vapor within a fourth time period after power-on and complete dissipation of the water vapor within a third time period, the anti-fogging performance of the device under test is determined to be qualified. If the second fogging condition of the device under test includes the appearance of water vapor within a fourth time period after power-on, or the appearance of water vapor within a fourth time period after power-on and failure to completely dissipate of the water vapor within a third time period, the anti-fogging performance of the device under test is determined to be unqualified.

[0024] The fourth duration can be understood as the maximum duration for which the device under test (DUT) is continuously powered on. After the DUT is powered on, the continuous power-on time can be recorded. Optionally, the test can be terminated when the continuous power-on time of the DUT reaches the fourth duration.

[0025] Through the above implementation method, in the case of the first fogging condition of the device under test, including the case that no water mist appears on the device under test, or the case that water mist appears on the device under test and the water mist completely dissipates within a third time period, the anti-fogging performance of the device under test can be further evaluated based on the second fogging condition of the device under test, which is conducive to obtaining more accurate and comprehensive evaluation results.

[0026] In one possible implementation of the first aspect, when the device under test is placed in a first test environment, the device under test is subjected to at least one power-on / off cycle, each power-on / off cycle including: a fifth power-on duration and a sixth power-off duration.

[0027] In this context, "DUT power-on" refers to the DUT being connected to a power source and in a working state, while "DUT power-off" refers to the DUT being disconnected from the power source and in a non-working state. The fifth duration can be understood as the duration of one power-on cycle of the DUT in the first test environment, and the sixth duration can be understood as the duration of one power-off cycle of the DUT in the first test environment.

[0028] Through the above implementation method, when the device under test is placed in the first test environment, the device under test is also subjected to power cycling. In other words, power cycling is added as a condition to induce fogging. In this way, high humidity environment, power cycling and cooling can be combined to induce fogging, which is beneficial to further improve the effectiveness of fogging test.

[0029] In one possible implementation of the first aspect, the anti-fogging performance of the device under test is determined to be qualified when the first fogging condition of the device under test includes the absence of water mist on the device under test, or the presence of water mist on the device under test and the complete dissipation of water mist within a third time period.

[0030] With the addition of up-and-down electrical cycles as conditions for inducing fogging, the first fogging situation can be understood as the fogging situation obtained by using a high humidity environment, up-and-down electrical cycles, and cooling as conditions for inducing fogging.

[0031] Through the above implementation method, by adding up-and-down electrical cycles to stimulate fogging, the anti-fogging performance of the device under test can be evaluated based on the first fogging situation, which is conducive to obtaining more accurate and comprehensive evaluation results.

[0032] In one possible implementation of the first aspect, performing at least one power-on / off cycle on the device under test includes: after each power-on / off cycle, placing the device under test in a second test environment; after the device under test has been placed in the second test environment for a second duration, determining third data, the third data indicating a third fogging condition of the device under test. If the third fogging condition of the device under test includes no fogging on the device under test, or fogging on the device under test that completely dissipates within a third duration, the device under test is placed in a first test environment and the next power-on / off cycle is performed.

[0033] The second data relates to the second fogging condition of the device under test (DUT) and can be used to reflect the second fogging condition of the DUT. For example, the second data includes the transmittance of the DUT and / or the sensing data obtained when the DUT is operating.

[0034] The third fogging condition can also be understood as the fogging condition obtained by using a high humidity environment, one power cycle, and cooling as conditions to induce fogging. It can be understood that a third fogging condition can be determined after each power cycle. Optionally, the third fogging condition may include the following information: whether water mist appears, and if water mist appears, the degree and duration of water mist dissipation. The third fogging condition of the device under test (DUT) is related to the DUT's anti-fogging performance and can be used to evaluate the DUT's anti-fogging performance.

[0035] Through the above implementation method, fogging can be induced by multiple power cycles. By observing the fogging situation of the device under test after each power cycle, the fogging risk of the device under test can be determined, and then used to evaluate the anti-fogging performance of the device under test.

[0036] In one possible implementation of the first aspect, if the third fogging condition of the device under test includes the appearance of water mist on the device under test and the water mist not completely dissipating within a third time period, the anti-fogging performance of the device under test is determined to be unqualified.

[0037] With the above implementation method, when multiple power cycles are added to induce fogging, once a third fogging situation is detected after a power cycle, including the appearance of water mist on the device under test and the water mist not completely dissipating within the third time period, the anti-fogging performance of the device under test can be determined to be unqualified, thus ending the test without continuing the next power cycle. This helps to quickly screen out devices with unqualified anti-fogging performance.

[0038] In one possible implementation of the first aspect, if the first fogging condition of the device under test includes the absence of water mist on the device under test, or the presence of water mist on the device under test and the complete dissipation of the water mist within a third time period, the first operation is repeated until the number of times the first operation is performed reaches the first number or the first fogging condition after the first operation meets the non-compliance condition.

[0039] The first operation includes: placing the device under test (DUT) in a first test environment; after a first duration of time in the first test environment, placing the DUT in a second test environment; after a second duration of time in the second test environment, determining first data, which indicates the first fogging condition of the DUT. A non-compliance condition includes the appearance of water fog on the DUT and the water fog not completely dissipating within a third duration.

[0040] Each first operation utilizes a high humidity environment and cooling as conditions to induce fogging. The first count can be understood as the maximum number of times the first operation can be executed. The first fogging condition can also be understood as the fogging condition obtained by using a single high humidity environment and cooling as conditions to induce fogging. It can be understood that after each first operation, a first fogging condition can be determined.

[0041] Through the above implementation method, multiple first operations can be used to induce fogging. By observing the fogging situation of the device under test after each first operation, the fogging risk of the device under test can be determined, and then used to evaluate the anti-fogging performance of the device under test.

[0042] In one possible implementation of the first aspect, after the first operation has been performed a certain number of times, if the device under test is in a first fogging condition, including if the device under test does not fog up, or if the device under test fogs up and the fog completely dissipates within a third time period, the device under test is determined to have qualified anti-fogging performance.

[0043] Through the above implementation method, once the first fogging situation after a certain first operation is detected, including the appearance of water mist on the device under test and the water mist not completely dissipating within a third time period, it can be determined that the anti-fogging performance of the device under test is unqualified, thereby ending the test without continuing the next first operation, which helps to quickly screen out devices with unqualified anti-fogging performance.

[0044] In one possible implementation of the first aspect, determining the first data of the device under test after the device under test has been placed in the second test environment for a second period of time includes: powering on the device under test after the device under test has been placed in the second test environment for a second period of time, and determining the first data based on the sensing data obtained when the device under test is working.

[0045] When determining the fogging condition of a device under test (DUT) (e.g., the first, second, or third fogging condition mentioned above), the fogging condition can be determined based on relevant data obtained during DUT operation. For example, to determine the fogging condition of a DUT, the device can be powered on and put into operation. Based on the sensing data obtained during the operation of the DUT, the fogging condition can be determined.

[0046] Taking a camera as the device under test, the perceived data can be the images captured by the camera. If fogging occurs in the camera, the quality of the captured images will be affected (e.g., becoming blurry). Therefore, the fogging situation of the camera can be determined based on the clarity of the images captured. Optionally, the camera can periodically capture images. When fogging occurs in the camera, the degree and duration of fogging can be determined based on the changes in the clarity of different images.

[0047] Through the above implementation method, based on the sensing data obtained when the device under test is working, it is possible to more intuitively reflect whether the device under test is affected in actual use, thereby more accurately determining the fogging situation of the device under test.

[0048] In one possible implementation of the first aspect, the humidity of the first test environment satisfies a first humidity condition, including: the humidity of the first test environment is greater than or equal to a first humidity threshold, or the humidity of the first test environment is within a first humidity range.

[0049] The first humidity threshold can be understood as the minimum humidity of the first test environment. The first humidity range can be understood as the humidity range that the first test environment needs to meet. Optionally, the humidity in this application is expressed in relative humidity (RH). For example, the first humidity threshold may be, but is not limited to, 80%RH, 85%RH, or 90%RH. Another example is that the first humidity range may be [80%RH, 90%RH], or denoted as 85±5%RH. Yet another example is that the first humidity range may be [88%RH, 98%RH], or denoted as 93±5%RH.

[0050] Through the above implementation method, the first test environment can be an environment with high humidity. Placing the device under test in the first test environment can increase the humidity of the device under test, creating suitable conditions for the generation of water vapor inside the device under test, which is conducive to the subsequent stimulation of fogging phenomenon.

[0051] In one possible implementation of the first aspect, the temperature of the first test environment is greater than or equal to a first temperature threshold, or the temperature of the first test environment is within a first temperature range.

[0052] The first temperature threshold can be understood as the minimum temperature of the first test environment. The first temperature range can be understood as the temperature range that the first test environment needs to meet. For example, the first temperature threshold can be, but is not limited to, 25℃, 65℃, 85℃, or 90℃. Another example is that the first temperature range can be [82℃, 88℃], or denoted as 85±3℃. Yet another example is that the first temperature range can be [62℃, 68℃], or denoted as 65±3℃.

[0053] Through the above implementation method, the first test environment can be an environment with both high humidity and high temperature. Placing the device under test in the first test environment can not only increase the humidity of the device under test and create suitable conditions for the generation of water vapor inside the device under test, but also the high temperature in the first test environment can make it easier for water vapor to enter the device under test, which is beneficial to the subsequent stimulation of fogging phenomenon.

[0054] In one possible implementation of the first aspect, the temperature of the second test environment is less than or equal to a second temperature threshold, or the temperature of the second test environment is within a second temperature range.

[0055] The second temperature threshold can be understood as the maximum temperature of the second test environment. The second temperature range can be understood as the temperature range that the second test environment needs to meet. For example, the second temperature threshold can be, but is not limited to, 0℃, 5℃, or -5℃. Similarly, the second temperature range can be [0℃, 4℃]. Or, the second temperature range can be [-5℃, 5℃].

[0056] Through the above implementation method, a temperature difference environment can be constructed by combining the first test environment and the second test environment. The device under test can be rapidly cooled when transferred from the first test environment to the second test environment. Rapid cooling is beneficial for stimulating fogging phenomenon.

[0057] In one possible implementation of the first aspect, the first test environment is provided by a first test chamber or a first water tank, wherein the humidity and temperature inside the first test chamber are adjustable, and the water temperature inside the first water tank is adjustable.

[0058] Through the above implementation method, the humidity and / or temperature of the first test chamber or the first water tank are adjustable, thereby flexibly meeting different humidity and / or temperature requirements and facilitating the rapid provision of the required first test environment.

[0059] In one possible implementation of the first aspect, the second test environment is provided by a second test chamber or a second water tank, the temperature of the second test chamber being adjustable, and the water temperature in the second water tank being adjustable.

[0060] Through the above implementation method, the temperature of the second test chamber or the second water tank is adjustable, which can flexibly meet different temperature requirements and facilitate the rapid provision of the required second test environment.

[0061] In one possible implementation of the first aspect, the device under test is applied to a vehicle.

[0062] In one possible implementation of the first aspect, the device under test includes a camera. Optionally, the device under test is an in-vehicle camera.

[0063] Secondly, this application provides a fogging testing system. The system includes: a first testing device, a second testing device, and a processing device. The first testing device provides a first testing environment for placing a device under test (DUT), the humidity of which meets a first humidity condition. The second testing device provides a second testing environment for placing the DUT, the temperature of which is lower than the temperature of the first testing environment, and the temperature difference between the first and second testing environments is greater than or equal to a first temperature difference threshold. The processing device determines the fogging status of the DUT.

[0064] The system described above provides a first test environment and a second test environment for fogging testing. The first test environment has a certain humidity level, while the second test environment has a lower temperature than the first, and there is a certain temperature difference between the two environments. When conducting fogging tests using this system, the device under test (DUT) is first placed in the first test environment to increase its humidity and create suitable conditions for moisture generation inside the DUT. After a period of time, the DUT is transferred from the first test environment to the second test environment to rapidly cool it down, thereby inducing fogging. By observing the fogging behavior of the DUT, its fogging risk can be determined, which can then be used to evaluate its anti-fogging performance.

[0065] In one possible implementation of the second aspect, the system further includes a power supply device for supplying power to the device under test, thereby powering on the device under test.

[0066] The power supply unit is connected to the device under test (DUT) to provide power, enabling the DUT to power on. Powering on the DUT can also be understood as the DUT operating normally. Taking a camera as an example, after powering on, the camera is in working condition and can output images normally.

[0067] Through the above implementation method, powering on the device under test (DUT) can induce a certain thermal effect, which is conducive to triggering fogging. Furthermore, the DUT is in an operational state after power-on, which closely matches the actual usage scenario, thus facilitating the acquisition of test results that more closely resemble real-world conditions and reducing failure rates in the live network.

[0068] In one possible implementation of the second aspect, the first testing device includes a first test chamber or a first water tank, wherein the humidity and temperature inside the first test chamber are adjustable, and the water temperature inside the first water tank is adjustable.

[0069] Optionally, the first test chamber is a constant temperature and humidity test chamber (e.g., temperature 85℃ and humidity 85%RH, or temperature 65℃ and humidity 93%RH). Optionally, the first water tank is filled with room temperature water (e.g., water temperature 25℃) or high temperature water (e.g., water temperature greater than or equal to 90℃).

[0070] Through the above implementation method, the humidity and / or temperature of the first test chamber or the first water tank are adjustable, thereby flexibly meeting different humidity and / or temperature requirements and facilitating the rapid provision of the required first test environment.

[0071] In one possible implementation of the second aspect, the system further includes a first control device for adjusting the humidity and temperature inside the first test chamber, or for adjusting the water temperature inside the first water tank.

[0072] The first control device is connected to the first test chamber and is used to adjust the humidity and temperature inside the first test chamber to create a first test environment that meets the above conditions. Alternatively, the first control device is connected to the first water tank and is used to adjust the water temperature inside the first water tank to create a first test environment that meets the above conditions.

[0073] Through the above implementation method, the humidity and temperature of the first testing device are adjusted by the first control device, thereby flexibly meeting different humidity and temperature requirements, enabling the first testing device to quickly provide the required first testing environment.

[0074] In one possible implementation of the second aspect, the second testing device includes a second test chamber or a second water tank, wherein the temperature inside the second test chamber is adjustable, and the water temperature inside the second water tank is adjustable.

[0075] Optionally, the second test chamber is a constant temperature test chamber (e.g., 0°C or 4°C). Optionally, the humidity of the second test chamber is also adjustable. Optionally, the second water tank is filled with cold water (e.g., at 4°C) or ice water (e.g., at 0°C).

[0076] Through the above implementation method, the temperature of the second test chamber or the second water tank is adjustable, which can flexibly meet different temperature requirements and facilitate the rapid provision of the required second test environment.

[0077] In one possible implementation of the second aspect, the system further includes a second control device for adjusting the temperature inside the second test chamber, or for adjusting the water temperature inside the second water tank.

[0078] The second control device is connected to the second test chamber and is used to adjust the temperature inside the second test chamber to create a second test environment that meets the above conditions. Alternatively, the second control device is connected to the second water tank and is used to adjust the water temperature inside the second water tank to create a second test environment that meets the above conditions.

[0079] Through the above implementation method, the temperature of the second testing device can be adjusted by the second control device, thereby flexibly meeting different temperature requirements and enabling the second testing device to quickly provide the required second testing environment.

[0080] In one possible implementation of the second aspect, the humidity of the first test environment satisfies a first humidity condition, including: the humidity of the first test environment is greater than or equal to a first humidity threshold, or the humidity of the first test environment is within a first humidity range.

[0081] In one possible implementation of the second aspect, the temperature of the first test environment is greater than or equal to a first temperature threshold, or the temperature of the first test environment is within a first temperature range.

[0082] In one possible implementation of the second aspect, the temperature of the second test environment is less than or equal to a second temperature threshold, or the temperature of the second test environment is within a second temperature range.

[0083] In one possible implementation of the second aspect, the device under test is applied to a vehicle.

[0084] In one possible implementation of the second aspect, the device under test includes a camera. Optionally, the device under test is an in-vehicle camera. Attached Figure Description

[0085] The accompanying drawings used in the embodiments of this application will be briefly described below.

[0086] Figure 1 is a schematic diagram of a device under test provided in an embodiment of this application;

[0087] Figure 2 is a schematic diagram of a fogging test system provided in an embodiment of this application;

[0088] Figure 3 is a flowchart illustrating a fogging test method provided in an embodiment of this application;

[0089] Figure 4 is a flowchart illustrating a test case provided in an embodiment of this application;

[0090] Figure 5 is a flowchart illustrating another test case provided in an embodiment of this application;

[0091] Figure 6 is a flowchart illustrating another test case provided in an embodiment of this application;

[0092] Figure 7 is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Detailed Implementation

[0093] The embodiments of this application will now be described in detail with reference to the accompanying drawings.

[0094] In this application, the words "exemplarily" or "for example" are used to indicate that they are examples, illustrations, or descriptions. Any embodiment or design that is described as "exemplarily" or "for example" in this application should not be construed as being more preferred or advantageous than other embodiments or design options. Rather, the use of the words "exemplarily" or "for example" is intended to present the relevant concepts in a specific manner.

[0095] The ordinal numbers such as "first" and "second" mentioned in the embodiments of this application are used to distinguish multiple objects, and are not used to limit the order, sequence, priority, or importance of multiple objects. Furthermore, "first" and "second," etc., are not necessarily different. In addition, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or devices.

[0096] The term "embodiment" as used herein means that a specific feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. Those skilled in the art will explicitly and implicitly understand that, unless otherwise specified or logically conflicting, the terminology and / or descriptions between the various embodiments of this application are consistent and can be mutually referenced, and technical features in different embodiments can be combined to form new embodiments based on their inherent logical relationships.

[0097] It should be understood that in this application, "at least one (item)" means one or more, "more than one" means two or more, "at least two (items)" means two or three or more, and "and / or" is used to describe the relationship between related objects, indicating that there can be three relationships. For example, "A and / or B" can mean: only A exists, only B exists, and A and B exist simultaneously, where A and B can be singular or plural. The character " / " generally indicates that the related objects before and after are in an "or" relationship. "At least one (item) of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one (item) of a, b, or c can mean: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, and c can be single or multiple.

[0098] In this application, the term "after" can be interpreted as meaning "when," "if," "in response to determining," or "in response to detecting." Similarly, the phrase "in the case of" can be interpreted as meaning "when," "if," "in response to determining," or "in response to detecting."

[0099] Fogging in some optical imaging devices can negatively impact their usability. For example, automotive cameras are critical sensors in intelligent driving systems, relying on optical imaging for identification. Fogging blurs the images, hindering image recognition and affecting the user's driving experience. Therefore, fogging tests are necessary to evaluate the devices' anti-fogging performance. However, currently, there is a lack of specific methods and use cases for fogging testing.

[0100] In view of this, this application provides a fogging test method and system, which can perform fogging tests on devices to obtain the fogging status of the devices and to evaluate the anti-fogging performance of the devices.

[0101] The following provides an exemplary description of the test objects that may be applied to the fogging test method of this application. The test object may be an electronic device (or module, or device), which will be referred to as the device under test (DUT) in the following text.

[0102] In this application, the device under test (DUT) can be a device whose actual use would be affected by fogging, such as an optical imaging device. These devices have sealed cavities; if the sealing performance is insufficient, moisture can enter the cavity and cause water mist, which is difficult to dissipate, thus affecting actual use. For example, the DUT can be a camera or a receiving device in a lidar system.

[0103] Please refer to Figure 1, which is a schematic diagram of a device under test (DUT) provided in an embodiment of this application. Figure 1 illustrates the DUT as a camera used in a vehicle, meaning the DUT can be an in-vehicle camera. As shown in Figure 1, the camera is mounted on the roof of the vehicle. It should be understood that the DUT may also be a camera mounted in other locations on the vehicle (e.g., near the license plate light). This embodiment of the application does not limit the installation location of the camera on the vehicle.

[0104] The fogging test system provided in the embodiments of this application will be described exemplarily below.

[0105] Please refer to Figure 2, which is a schematic diagram of a fogging test system provided in an embodiment of this application. As shown in Figure 2, the fogging test system includes a first test device, a second test device, and a processing device.

[0106] The first testing device is used to provide a first testing environment for placing the device under test (DUT), and the humidity of the first testing environment meets a first humidity condition. Here, the first testing environment refers to the testing environment provided by the first testing device, which is used to place (or contain) the DUT. The first humidity condition refers to the humidity condition that the first testing environment needs to meet. For example, the first testing environment can be a high-humidity environment.

[0107] In one possible implementation, the humidity of the first test environment satisfies the first humidity condition by being greater than or equal to a first humidity threshold. Here, the first humidity threshold can be understood as the minimum humidity of the first test environment.

[0108] In another possible implementation, the humidity of the first test environment satisfying the first humidity condition can be that the humidity of the first test environment is within a first humidity range. Here, the first humidity range can be understood as the humidity range that the first test environment needs to satisfy.

[0109] Optionally, the humidity in this application is expressed as relative humidity (RH). It should be understood that the aforementioned first humidity threshold and first humidity range can be set according to actual conditions or needs, and this application embodiment does not limit this. For example, the first humidity threshold can be, but is not limited to, 80%RH, 85%RH, or 90%RH. As another example, the first humidity range can be [80%RH, 90%RH], or denoted as 85±5%RH. As yet another example, the first humidity range can be [88%RH, 98%RH], or denoted as 93±5%RH.

[0110] Thus, the first test environment can be an environment with high humidity. Placing the device under test in the first test environment can increase the humidity of the device under test, creating suitable conditions for the generation of water vapor inside the device under test, which is conducive to the subsequent excitation of fogging phenomenon.

[0111] Optionally, in addition to meeting certain humidity requirements, the first test environment also meets certain temperature requirements. Specifically, the temperature of the first test environment meets a first temperature condition. Here, the first temperature condition refers to the condition that the temperature of the first test environment needs to meet. For example, the first test environment can be a high-temperature, high-humidity environment or a normal-temperature, high-humidity environment.

[0112] In one possible implementation, the temperature of the first test environment satisfying the first temperature condition can be that the temperature of the first test environment is greater than or equal to a first temperature threshold. Here, the first temperature threshold can be understood as the minimum temperature of the first test environment.

[0113] In another possible implementation, the temperature of the first test environment satisfying the first temperature condition can be that the temperature of the first test environment is within a first temperature range. Here, the first temperature range can be understood as the temperature range that the first test environment needs to satisfy.

[0114] It should be understood that the aforementioned first temperature threshold and first temperature range can be set according to actual conditions or needs, and the embodiments of this application do not limit this. For example, the first temperature threshold can be, but is not limited to, 25℃, 65℃, 85℃, or 90℃. As another example, the first temperature range can be [82℃, 88℃], or denoted as 85±3℃. As yet another example, the first temperature range can be [62℃, 68℃], or denoted as 65±3℃.

[0115] Thus, the first test environment can be an environment with both high humidity and high temperature. Placing the device under test in the first test environment can not only increase the humidity of the device under test and create suitable conditions for the generation of water vapor inside the device under test, but also the high temperature in the first test environment can make it easier for water vapor to enter the device under test, which is beneficial to the subsequent stimulation of fogging phenomenon.

[0116] For example, the first testing device includes a first test chamber, the humidity of which is adjustable. Optionally, the first test chamber is a constant temperature and humidity test chamber (e.g., temperature 85°C, humidity 85%RH, or temperature 65°C, humidity 93%RH).

[0117] Alternatively, by way of example, the first testing device includes a first water tank containing water, the water temperature of which is adjustable. Optionally, the first water tank contains room temperature water (e.g., water temperature of 25°C) or high temperature water (e.g., water temperature greater than or equal to 90°C).

[0118] In one possible example, as shown in Figure 2, the fogging test system further includes a first control device. The first control device is connected to the first test device and is used to adjust the humidity of the first test device, thereby adjusting the humidity of the first test environment. Optionally, the first control device can also be used to adjust the temperature of the first test device, thereby adjusting the temperature of the first test environment.

[0119] For example, taking the first testing device as a first test chamber, the first control device can adjust the humidity and temperature inside the first test chamber to create a first testing environment that meets the above conditions. Similarly, taking the first testing device as a first water tank, the first control device can adjust the water temperature inside the first water tank to create a first testing environment that meets the above conditions.

[0120] Thus, the humidity and temperature of the first testing device are adjustable, which can flexibly meet different humidity and temperature requirements and facilitate the rapid provision of the required first testing environment.

[0121] The second testing device provides a second testing environment for placing the device under test (DUT). The temperature of the second testing environment is lower than that of the first testing environment, and the temperature difference between the first and second testing environments is greater than or equal to a first temperature difference threshold. The second testing environment refers to the testing environment provided by the second testing device, which is used to place (or contain) the DUT. The first temperature difference threshold can be understood as the minimum temperature difference between the first and second testing environments.

[0122] It should be understood that the aforementioned first temperature difference threshold can be set according to actual conditions or needs, and this application embodiment does not limit it in this regard. For example, the first temperature difference threshold may be, but is not limited to, 60°C, 40°C, or 25°C.

[0123] Optionally, in addition to meeting a certain temperature difference condition with the first test environment, the second test environment also meets a certain temperature condition. Specifically, the temperature of the second test environment meets a second temperature condition. The second temperature condition refers to the condition that the temperature of the second test environment needs to meet. For example, the second test environment can be a low-temperature environment.

[0124] In one possible implementation, the temperature of the second test environment satisfying the second temperature condition can be that the temperature of the second test environment is less than or equal to a second temperature threshold. The second temperature threshold can be understood as the maximum temperature of the second test environment.

[0125] In another possible implementation, the temperature of the second test environment satisfying the second temperature condition can be that the temperature of the second test environment is within a second temperature range. Here, the second temperature range can be understood as the temperature range that the second test environment needs to satisfy.

[0126] It should be understood that the aforementioned second temperature threshold and second temperature range can be set according to actual conditions or needs, and the embodiments of this application do not limit this. For example, the second temperature threshold can be, but is not limited to, 0℃, 5℃, or -5℃. As another example, the second temperature range can be [0℃, 4℃]. Or, the second temperature range can be [-5℃, 5℃].

[0127] Thus, by combining the first and second test environments, a temperature difference environment can be constructed. The device under test can be rapidly cooled when transferred from the first test environment to the second test environment, and rapid cooling is conducive to stimulating the fogging phenomenon.

[0128] For example, the second testing device includes a second test chamber with adjustable temperature. Optionally, the second test chamber is a constant temperature test chamber (e.g., 0°C or 4°C). Optionally, the humidity of the second test chamber is also adjustable.

[0129] Alternatively, by way of example, the second testing device includes a second water tank containing water, the water temperature of which is adjustable. Optionally, the second water tank contains cold water (e.g., water temperature of 4°C) or ice water (e.g., water temperature of 0°C).

[0130] In one possible example, as shown in Figure 2, the fogging test system further includes a second control device. The second control device is connected to the second test device and is used to adjust the temperature of the second test device, thereby adjusting the temperature of the second test environment. Optionally, the second control device can also be used to adjust the humidity of the second test device, thereby adjusting the humidity of the second test environment.

[0131] For example, taking the second testing device as a second test chamber, the second control device can adjust the temperature inside the second test chamber to create a second testing environment that meets the above conditions. Similarly, taking the second testing device as a second water tank, the second control device can adjust the water temperature inside the second water tank to create a second testing environment that meets the above conditions.

[0132] Thus, the temperature of the second testing device is adjustable, which can flexibly meet different temperature requirements and facilitate the rapid provision of the required second testing environment.

[0133] The processing device is used to determine the fogging condition of the device under test (DUT). The fogging condition may include, but is not limited to, the following information: whether water mist appears, the severity of the water mist if it appears (e.g., measured by the size or location of the water mist), whether the water mist dissipates after it appears, the degree of dissipation (e.g., complete or partial dissipation), the rate of dissipation, or the duration of dissipation. The fogging condition of the DUT is related to its anti-fogging performance and can be used to evaluate its anti-fogging performance.

[0134] For example, the processing device can be an observation device, such as a microscope. Optionally, after the device under test (DUT) has undergone a fogging excitation test, the DUT can be placed in the observation area of ​​the microscope, and the fogging condition of the DUT can be observed through the microscope.

[0135] Alternatively, the processing device may be an electronic device or a computing device. Optionally, after the device under test (DUT) undergoes a fogging excitation test, the processing device can obtain the transmittance of the DUT and / or the sensing data obtained when the DUT is operating, and determine the fogging status of the DUT based on this data. Taking a camera as an example, after the camera undergoes a fogging excitation test, the processing device can determine the fogging status of the camera by recognizing the clarity of the image captured by the camera.

[0136] In one possible example, as shown in Figure 2, the fogging test system also includes a power supply unit. The power supply unit is connected to the device under test (DUT) and is used to power the DUT, enabling it to power on. Powering on the DUT here can also be understood as the DUT operating normally.

[0137] Taking a camera as an example, the camera is in working condition after being powered on and can output images normally. Optionally, the camera is connected to the aforementioned processing device, and the images captured by the camera can be transmitted to the aforementioned processing device.

[0138] In this way, powering on the device under test (DUT) can generate a certain thermal effect, which is conducive to inducing fogging. Furthermore, the DUT is in a working state after power-on, which closely matches the actual usage scenario, thus helping to obtain test results that are closer to reality and reducing the failure rate in the live network.

[0139] It should be understood that the fogging test system shown in Figure 2 is merely an example, and the fogging test system applicable to the embodiments of this application is not limited thereto. Any system capable of implementing some or all of the functions of the above-described devices is applicable to the embodiments of this application. For example, the fogging test method provided in the embodiments of this application may involve only some of the devices shown in Figure 2, or it may also involve devices not shown in Figure 2, and the embodiments of this application do not limit this.

[0140] In one possible implementation, the first control device, the second control device, the processing device, and the power supply device described above can be deployed together. For example, the first control device, the second control device, the processing device, and the power supply device can be integrated into an electronic device that can perform the functions of the first control device, the second control device, the processing device, and the power supply device. This electronic device can work in conjunction with the first test device and the second test device to provide a fogging test environment and complete fogging tests on the device under test.

[0141] It should be noted that in other possible implementations, the phrase "greater than or equal to" can be replaced with "greater than," and "less than or equal to" can be replaced with "less than." For example, "the humidity of the first test environment is greater than or equal to the first humidity threshold" can be replaced with "the humidity of the first test environment is greater than the first humidity threshold." Similarly, "the temperature of the second test environment is less than or equal to the second temperature threshold" can be replaced with "the temperature of the second test environment is less than the second temperature threshold." It should be understood that similar substitutions in the embodiments of this application can be referred to the above description, and are explained uniformly here, and will not be repeated later.

[0142] The fogging test method provided in the embodiments of this application is described below.

[0143] Please refer to Figure 3, which is a schematic flowchart of a fogging test method provided in an embodiment of this application. Exemplarily, this fogging test method can be implemented using the fogging test system shown in Figure 2. This fogging test method includes, but is not limited to, the following steps S301 to S303.

[0144] S301, Place the device under test in the first test environment, where the humidity of the first test environment meets the first humidity condition.

[0145] For a detailed description of the first test environment, please refer to the relevant descriptions in the previous embodiments, which will not be repeated here.

[0146] For example, a first test chamber can be used to create a first test environment. Specifically, the humidity (or humidity and temperature) inside the first test chamber can be set to create the first test environment. The device under test (DUT) is then placed inside the first test chamber, thus placing the DUT within the first test environment.

[0147] For example, a first water tank can be used to create a first test environment. Specifically, the first water tank is filled with water, thus creating the first test environment. Optionally, the first test environment can also be created by setting the water temperature in the first water tank. The device under test (DUT) is then immersed in the water in the first water tank, placing the DUT within the first test environment.

[0148] S302, after the device under test is placed in the first test environment for a first period of time, the device under test is placed in the second test environment, the temperature of the second test environment is lower than the temperature of the first test environment, and the temperature difference between the first test environment and the second test environment is greater than or equal to the first temperature difference threshold.

[0149] For a detailed description of the second test environment and the temperature difference between the first and second test environments, please refer to the relevant descriptions in the previous embodiments, which will not be repeated here.

[0150] For example, a second test chamber can be used to create a second test environment. Specifically, the temperature (or temperature and humidity) inside the second test chamber can be set to create a second test environment. The device under test (DUT) is then placed inside the second test chamber, thus placing the DUT within the second test environment.

[0151] For example, a second water tank can be used to create a second testing environment. Specifically, the second water tank is filled with water, and by setting the water temperature in the second water tank, a second testing environment can be created. The device under test (DUT) is then immersed in the water in the second water tank, thus placing the DUT in the second testing environment.

[0152] The first duration can be understood as the duration during which the device under test (DUT) is placed in the first test environment. When the duration of the DUT in the first test environment reaches the first duration, the DUT is removed from the first test environment and placed in the second test environment, that is, the DUT is transferred from the first test environment to the second test environment.

[0153] S303, after the device under test has been placed in the second test environment for a second period of time, first data is determined, the first data being used to indicate the first fogging condition of the device under test.

[0154] The second duration can be understood as the duration the device under test (DUT) is placed in the second test environment. When the DUT has been placed in the second test environment for the second duration, the DUT is removed from the second test environment, and the fogging condition of the DUT is observed (referred to as the first fogging condition for distinction), or first data is determined. The first data is related to the first fogging condition of the DUT and can be used to reflect the first fogging condition of the DUT. For example, the first data includes the transmittance of the DUT and / or the sensing data obtained when the DUT is operating.

[0155] The first fogging condition can also be understood as the fogging situation obtained by using a high humidity environment and cooling as conditions to induce fogging. Optionally, the first fogging condition may include the following information: whether water mist appears, and if water mist appears, the degree and duration of water mist dissipation. The first fogging condition of the device under test (DUT) is related to the anti-fogging performance of the DUT and can be used to evaluate the anti-fogging performance of the DUT.

[0156] In the above embodiments, the first test environment can be an environment with high humidity (or simultaneously with high humidity and high temperature), and the temperature of the second test environment is lower than that of the first test environment, with a certain temperature difference between the two environments. Placing the device under test (DUT) in the first test environment increases its humidity, creating suitable conditions for moisture generation inside the DUT. After a period of time, transferring the DUT from the first test environment to the second test environment allows for rapid cooling, thereby triggering fogging. By observing the fogging behavior of the DUT, the fogging risk can be determined, which can then be used to evaluate the DUT's anti-fogging performance.

[0157] The following are some examples of the first fogging situation of the device under test.

[0158] Example 1: Water mist appears on the device under test and does not completely dissipate within the third time period.

[0159] As a possible design, if the device under test (DUT) experiences fogging for the first time, including the appearance of water vapor on the DUT and the water vapor not completely dissipating within a third time period, the anti-fogging performance of the DUT is deemed unqualified.

[0160] The third duration can be understood as the maximum time required for water mist to completely dissipate after it appears on a device with acceptable anti-fogging performance. After water mist appears on the device under test, the duration (or dissipation time) of the water mist can be recorded. If the duration of the water mist is greater than the third duration (i.e., the water mist does not completely dissipate within the third duration), it can be considered that the device under test has persistent, undissipated water mist (or the water mist dissipation time is too long), meaning that the device under test cannot quickly return to normal after water mist appears. In this case, the anti-fogging performance of the device under test can be determined to be unacceptable.

[0161] It should be understood that the aforementioned third duration can be set according to actual conditions or needs, and this application embodiment does not limit it in this regard. For example, the third duration can be 40 minutes. Or, for example, the third duration can be 10 minutes. In one possible design, the shorter the third duration, the higher the requirement for anti-fogging performance can be considered.

[0162] With the above design, in the first fogging situation of the device under test, including the appearance of water mist on the device under test and the water mist not completely dissipating within a third time period, the anti-fogging performance of the device under test is determined to be unqualified. In this way, devices with unqualified anti-fogging performance can be screened out simply and efficiently.

[0163] Example 2: Water mist appears on the device under test and completely dissipates within the third time period.

[0164] After water vapor appears on the device under test (DUT), the duration (or dissipation time) of the water vapor can be recorded. If the duration of the water vapor is less than or equal to a third time interval (i.e., the water vapor completely dissipates within the third time interval), it can be considered that the DUT can quickly recover to its normal state after the appearance of water vapor. In this case, the conditions for inducing fogging can be further increased, and the fogging situation of the DUT can be observed again (for distinction, this is referred to as the second fogging situation), or second data can be determined. The second data is related to the second fogging situation of the DUT and can be used to reflect the second fogging situation of the DUT, and then determine whether the anti-fogging performance of the DUT is qualified. For example, the second data includes the light transmittance of the DUT and / or the sensing data obtained when the DUT is working.

[0165] Example 3: No water mist appeared on the device under test.

[0166] If no water vapor appears on the device under test (DUT), it can be assumed that using high humidity and cooling as conditions to induce fogging did not result in water vapor formation on the DUT. In this case, the conditions for inducing fogging can be further increased, and the second fogging condition of the DUT can be observed. Alternatively, second data reflecting the second fogging condition of the DUT can be determined, and then the anti-fogging performance of the DUT can be judged to be qualified.

[0167] As a possible design, in the first fogging condition of the device under test (DUT), including the case where no water mist appears on the DUT, or the DUT has water mist and the water mist completely dissipates within a third time period, the DUT is powered on after the water mist has completely dissipated to determine the second fogging condition of the DUT.

[0168] The second fogging condition can also be understood as the fogging condition obtained by using power-on as the condition to induce fogging. Optionally, the second fogging condition may include the following information: whether water mist appears, and if water mist appears, the degree and duration of water mist dissipation. The second fogging condition of the device under test (DUT) is related to the anti-fogging performance of the DUT and can be used to evaluate the anti-fogging performance of the DUT.

[0169] Through the above design, after the excitation fogging test is carried out by using a high-humidity environment and cooling, the device under test is further powered on to stimulate the fogging phenomenon. By observing the fogging situation of the device under test after power-on, the fogging risk of the device under test can be determined, and then used to evaluate the anti-fogging performance of the device under test. In addition, since the device under test is in a working state after power-on, the compliance with the actual use scenario is relatively high, which is conducive to obtaining test results closer to the actual situation and reducing the failure rate in the live network.

[0170] Several examples of the second fogging situation of the device under test are given below.

[0171] Example 1: No water mist appears within the fourth time period after the device under test is powered on.

[0172] Among them, the fourth time period can be understood as the maximum time period for the device under test to be continuously powered on. As a possible design, after the device under test is powered on, record the continuous power-on time. If no water mist appears during the continuous power-on process of the device under test, the test can be ended when the continuous power-on time reaches the fourth time period. In this case, it can be determined that the anti-fogging performance of the device under test is qualified.

[0173] It should be understood that the above first time period, second time period and fourth time period can be set according to the actual situation or requirements, and the embodiments of the present application do not limit this. For example, the first time period can be within the range of 45 - 55h, the second time period can be within the range of 20 - 60s, and the fourth time period can be within the range of 3.5 - 4.5h.

[0174] Example 2: Water mist appears within the fourth time period after the device under test is powered on and the water mist completely dissipates within the third time period.

[0175] As a possible design, when water mist appears during the continuous power-on process of the device under test, record the duration (or dissipation time) of the water mist. If the duration of the water mist is less than or equal to the third time period (that is, the water mist completely dissipates within the third time period), it can be considered that the device under test can quickly return to the normal state after the water mist appears. The test can be ended when the continuous power-on time reaches the fourth time period. In this case, it can be determined that the anti-fogging performance of the device under test is qualified.

[0176] Taking the third time period as 10 min and the fourth time period as 4 h as an example, in a possible situation, the device under test appears water mist when continuously powered on for 1 h, the time when the water mist completely dissipates is less than or equal to 10 min (for example, the water mist completely dissipates when continuously powered on for 1 h 8 min), and no water mist appears during the subsequent continuous power-on process. In this case, it can be determined that the anti-fogging performance of the device under test is qualified. In another possible situation, the device under test may appear water mist multiple times during the continuous power-on process. If the time when each water mist completely dissipates is less than or equal to 10 min, it can also be determined that the anti-fogging performance of the device under test is qualified.

[0177] Example 3: Water vapor appears on the device under test within the fourth time period after power-on, and the water vapor does not completely dissipate within the third time period.

[0178] As a possible design, when water mist appears on the device under test (DUT) during continuous power-on, the duration (or dissipation time) of the water mist can be recorded. If the duration of the water mist exceeds a third time interval (i.e., the water mist does not completely dissipate within the third time interval), it can be considered that the DUT has persistent, undissipated water mist (or the water mist dissipation time is too long), meaning that the DUT cannot quickly return to normal after the appearance of water mist. The test can be terminated when it is determined that the water mist has not completely dissipated within the third time interval. In this case, the anti-fogging performance of the DUT can be determined to be unqualified.

[0179] Taking a third duration of 10 minutes and a fourth duration of 4 hours as an example, in one possible case, the device under test (DUT) will produce water vapor after 1 hour of continuous power-on, and the time for the water vapor to completely dissipate is greater than 10 minutes (for example, the water vapor will completely dissipate after 2 hours of continuous power-on, meaning that the water vapor has not completely dissipated after 1 hour and 10 minutes of continuous power-on). In this case, the anti-fogging performance of the DUT can be determined to be unqualified. Optionally, the test can be ended after 1 hour and 10 minutes of continuous power-on, without having to continue powering on for 4 hours, thereby reducing the test time.

[0180] In other possible designs, the test could end when water vapor appears on the device under test (DUT) during continuous power-on; in this case, the DUT's anti-fogging performance would be deemed unqualified. This design sets higher standards for the acceptance criteria of anti-fogging performance.

[0181] With the above design, in the first fogging condition of the device under test (DUT), including the case where no water mist appears on the DUT, or the case where water mist appears on the DUT and the water mist completely dissipates within a third time period, the anti-fogging performance of the DUT can be further evaluated based on the second fogging condition of the DUT, which is conducive to obtaining more accurate and comprehensive evaluation results.

[0182] In one possible implementation, with the device under test (DUT) placed in a first test environment, the DUT is subjected to at least one power-on / off cycle, each power-on cycle including: a fifth duration of power-on and a sixth duration of power-off.

[0183] In this context, "DUT power-on" refers to the DUT being connected to a power source and in a working state, while "DUT power-off" refers to the DUT being disconnected from the power source and in a non-working state. The fifth duration can be understood as the duration of one power-on cycle of the DUT in the first test environment, and the sixth duration can be understood as the duration of one power-off cycle of the DUT in the first test environment.

[0184] It should be understood that the fifth and sixth durations mentioned above can be set according to actual conditions or needs, and this application embodiment does not limit this. In one possible design, the sixth duration is shorter than the fifth duration. This is because the time required to restore the device under test (DUT) from its power-on state (e.g., the first state) to its pre-power-on state (e.g., the second state) by powering down is less than the time required to change the DUT from the second state to the first state by powering up. Therefore, setting the power-down duration to be shorter than the power-on duration in the power-up / power-down cycle test helps to reduce the overall test duration and improve test efficiency. For example, the fifth duration can be 15–30 minutes, and the sixth duration can be 5–10 minutes.

[0185] Through the above implementation method, when the device under test is placed in the first test environment, the device under test is also subjected to power cycling. In other words, power cycling is added as a condition to induce fogging. In this way, high humidity environment, power cycling and cooling can be combined to induce fogging, which is beneficial to further improve the effectiveness of fogging test.

[0186] It is understandable that, with the addition of up-and-down electrical circulation as a condition for inducing fogging, the first fogging situation described above can be understood as a fogging situation obtained by using a high humidity environment, up-and-down electrical circulation, and cooling as conditions for inducing fogging.

[0187] As a possible design, if the device under test (DUT) experiences fogging for the first time, including the appearance of water vapor on the DUT and the water vapor not completely dissipating within a third time period, the anti-fogging performance of the DUT is deemed unqualified.

[0188] As another possible design, the anti-fogging performance of the device under test is deemed qualified if the device under test does not produce water mist in the first fogging condition, or if water mist appears on the device under test and the water mist completely dissipates within a third time period.

[0189] With the above design, by adding up-and-down electrical cycles to induce fogging, the anti-fogging performance of the device under test can be evaluated based on the first fogging condition, which is beneficial to obtaining more accurate and comprehensive evaluation results.

[0190] In one possible implementation, after each power-on / off cycle of the device under test (DUT) in the first test environment, the DUT is placed in the second test environment. After a second duration of time in the second test environment, a third fogging condition of the DUT is determined. If the third fogging condition of the DUT includes no fogging on the DUT, or fogging on the DUT that completely dissipates within the third duration, the DUT is placed in the first test environment and the next power-on / off cycle is performed.

[0191] As one possible design, the total duration (first duration) of the device under test (DUT) placed in the first test environment is related to the preset number of power-on / off cycles and the duration of each power-on / off cycle. The duration of each power-on / off cycle can be the fifth duration plus the sixth duration. The first duration can be the product of the duration of each power-on / off cycle and the preset number of power-on / off cycles. The preset number of power-on / off cycles can be the maximum number of power-on / off cycles.

[0192] It should be understood that the preset number of power-on / off cycles can be set according to actual conditions or needs, and this application embodiment does not limit this. For example, the preset number of power-on / off cycles can be in the range of 250 to 300 times.

[0193] For example, taking N power-on / off cycles as an example, where N is a positive integer greater than or equal to 1, the device under test (DUT) undergoes its first power-on / off cycle in a first test environment. After the first power-on / off cycle, the DUT is transferred from the first test environment to a second test environment. When the DUT has been placed in the second test environment for a second duration, the DUT is removed from the second test environment, and the fogging condition of the DUT is observed (referred to as the third fogging condition for distinction), or third data is determined. The third data is related to the third fogging condition of the DUT and can be used to reflect the third fogging condition of the DUT. For example, the third data includes the transmittance of the DUT and / or the sensing data obtained when the DUT is operating.

[0194] The third fogging condition can also be understood as the fogging condition obtained by using a high-humidity environment, one power cycle, and cooling as the conditions for inducing fogging. It can be understood that one third fogging condition can be determined after each power cycle, and N power cycles correspond to N third fogging conditions. Optionally, the third fogging condition may include the following information: whether water mist appears, and if water mist appears, the degree and duration of water mist dissipation. The third fogging condition of the device under test (DUT) is related to the DUT's anti-fogging performance and can be used to evaluate the DUT's anti-fogging performance.

[0195] The following are some examples of the third fogging condition of the device under test.

[0196] Example 1: Water mist appears on the device under test and does not completely dissipate within the third time period.

[0197] As a possible design, if the device under test experiences a third fogging event, including the appearance of water vapor on the device under test and the water vapor not completely dissipating within a third time period, the anti-fogging performance of the device under test is deemed unqualified.

[0198] After water mist appears on the device under test, the duration of the water mist (or the dissipation time) can be recorded. If the duration of the water mist is greater than the third time period (that is, the water mist has not completely dissipated within the third time period), it can be considered that the device under test has persistent non-dissipating water mist (or the water mist dissipation time is too long), that is, the device under test cannot quickly return to the normal state after the water mist appears. In this case, the test can be ended and it can be determined that the anti-fogging performance of the device under test is unqualified.

[0199] Through the above design, in the case of increasing multiple power-on and power-off cycles to stimulate fogging, once it is detected that the third fogging situation after a certain power-on and power-off cycle includes the appearance of water mist on the device under test and the water mist has not completely dissipated within the third time period, it can be determined that the anti-fogging performance of the device under test is unqualified, thereby ending the test without continuing the next power-on and power-off cycle, which helps to quickly screen out devices with unqualified anti-fogging performance.

[0200] Example 2: No water mist appears on the device under test.

[0201] If no water mist appears on the device under test, it can be considered that using the high-humidity environment, the current power-on and power-off cycle, and the temperature drop as the conditions for stimulating fogging does not cause water mist to appear on the device under test. In this case, the device under test can be placed back in the first test environment and the next power-on and power-off cycle can be performed on the device under test, and the fogging situation of the device under test can be continuously observed until it is detected that the third fogging situation after a certain power-on and power-off cycle includes the appearance of water mist on the device under test and the water mist has not completely dissipated within the third time period, or the number of power-on and power-off cycles reaches N times and the test ends.

[0202] As a possible situation, the third fogging situation after the Nth power-on and power-off cycle includes the appearance of water mist on the device under test and the water mist has not completely dissipated within the third time period. In this case, it is determined that the anti-fogging performance of the device under test is unqualified.

[0203] As another possible situation, the third fogging situation after the Nth power-on and power-off cycle includes that no water mist appears on the device under test, or water mist appears on the device under test and the water mist completely dissipates within the third time period. In this case, it is determined that the anti-fogging performance of the device under test is qualified. That is to say, in the case where the third fogging situation after each power-on and power-off cycle within N power-on and power-off cycles includes that no water mist appears on the device under test, or water mist appears on the device under test and the water mist completely dissipates within the third time period, it is determined that the anti-fogging performance of the device under test is qualified.

[0204] Example 3: Water mist appears on the device under test and the water mist completely dissipates within the third time period.

[0205] After water mist appears on the device under test, the duration (or dissipation time) of the water mist can be recorded. If the duration of the water mist is less than or equal to the third duration (i.e., the water mist completely dissipates within the third duration), it can be considered that the device under test can quickly return to the normal state after the water mist appears. In this case, the device under test can be re - placed in the first test environment and the next power - on / off cycle of the device under test can be performed, and the fogging situation of the device under test can be continuously observed until the third fogging situation after a certain power - on / off cycle is that water mist appears on the device under test and the water mist does not completely dissipate within the third duration, or the number of power - on / off cycles reaches N times and the test ends.

[0206] As a possible situation, the third fogging situation after the Nth power - on / off cycle includes that water mist appears on the device under test and the water mist does not completely dissipate within the third duration. In this case, it is determined that the anti - fogging performance of the device under test is unqualified.

[0207] As another possible situation, the third fogging situation after the Nth power - on / off cycle includes that no water mist appears on the device under test, or water mist appears on the device under test and the water mist completely dissipates within the third duration. In this case, it is determined that the anti - fogging performance of the device under test is qualified. That is to say, in the case where the third fogging situation after each power - on / off cycle in the N power - on / off cycles all includes that no water mist appears on the device under test, or water mist appears on the device under test and the water mist completely dissipates within the third duration, it is determined that the anti - fogging performance of the device under test is qualified.

[0208] Through the above design, the fogging phenomenon can be excited by multiple power - on / off cycles. By observing the fogging situation of the device under test after each power - on / off cycle, the fogging risk of the device under test can be determined, and then used to evaluate the anti - fogging performance of the device under test.

[0209] In a possible implementation manner, when the first fogging situation of the device under test includes that no water mist appears on the device under test, or water mist appears on the device under test and the water mist completely dissipates within the third duration, the following first operation is repeatedly executed: Place the device under test in the first test environment. After the first duration when the device under test is placed in the first test environment, place the device under test in the second test environment. After the second duration when the device under test is placed in the second test environment, determine the first data, and the first data is used to indicate the first fogging situation of the device under test, until the number of executions of the first operation reaches the first number or the first fogging situation after executing the first operation meets the unqualified condition. The unqualified condition includes that water mist appears on the device under test and the water mist does not completely dissipate within the third duration.

[0210] The first operation can be steps S301 to S303 in the previous embodiment. That is, steps S301 to S303 can be recorded as one first operation, and each first operation uses a high humidity environment and cooling as conditions to induce fogging. The first number can be understood as the maximum number of times the first operation is executed.

[0211] It should be understood that the first duration, second duration, and number of times can be set according to actual conditions or needs, and this application embodiment does not limit this. For example, the first duration can be in the range of 15 to 30 minutes, the second duration can be in the range of 15 to 30 minutes, and the number of times can be in the range of 40 to 80 times.

[0212] For example, taking M first operations as an example, where M is a positive integer greater than or equal to 1, each execution of the first operation determines a first fogging condition, and M first operations correspond to M first fogging conditions. The first fogging condition here can also be understood as the fogging condition obtained by using a high humidity environment and a drop in temperature as conditions to induce fogging.

[0213] As a possible design, once the first fogging situation after a certain first operation is detected, including the appearance of water mist on the device under test and the water mist not completely dissipating within a third time period, the anti-fogging performance of the device under test can be determined to be unqualified, thus ending the test without continuing the next first operation. This helps to quickly screen out devices with unqualified anti-fogging performance.

[0214] As another possible design, after the first operation has been performed M times, the device under test (DUT) is deemed to have passed the anti-fogging performance test if the first fogging condition is either no water mist appears on the DUT, or water mist appears on the DUT and completely dissipates within a third time interval. In other words, in each of the M first operations, the first fogging condition after each first operation includes either no water mist appearing on the DUT, or water mist appearing on the DUT and completely dissipating within a third time interval, for the device under test to be deemed to have passed the anti-fogging performance test.

[0215] With the above design, fogging can be induced by multiple first operations. By observing the fogging situation of the device under test after each first operation, the fogging risk of the device under test can be determined, and then used to evaluate the anti-fogging performance of the device under test.

[0216] In one possible implementation, when determining the fogging condition of the device under test (e.g., the first fogging condition, the second fogging condition, or the third fogging condition mentioned above), the fogging condition of the device under test can be determined based on relevant data during the operation of the device under test.

[0217] For example, when determining the fogging status of a device under test (DUT), the DUT can be powered on to put it into operation, and the fogging status can be determined based on the sensing data obtained when the DUT is in operation.

[0218] Taking a camera as the device under test, the perceived data can be the images captured by the camera. If fogging occurs in the camera, the quality of the captured images will be affected (e.g., becoming blurry). Therefore, the fogging situation of the camera can be determined based on the clarity of the images captured. Optionally, the camera can periodically capture images. When fogging occurs in the camera, the degree and duration of fogging can be determined based on the changes in the clarity of different images.

[0219] Through the above implementation method, based on the sensing data obtained when the device under test is working, it is possible to more intuitively reflect whether the device under test is affected in actual use, thereby more accurately determining the fogging situation of the device under test.

[0220] It should be understood that in other possible implementations, the fogging status of the device under test (DUT) can be jointly determined by combining the sensing data obtained during DUT operation and other observation results. For example, if it is determined that the DUT is not fogging based on both the sensing data and the observation results, then the DUT is determined not to be fogging. Alternatively, if it is determined that the DUT is fogging based on either the sensing data or the observation results, then the DUT is determined to be fogging. This can further improve the fogging detection standard, thereby improving the evaluation standard for the anti-fogging performance of the device.

[0221] The following uses a vehicle-mounted camera as an example to provide several test cases for the fogging test method of this application embodiment.

[0222] Test Case 1

[0223] Please refer to Figure 4, which is a flowchart illustrating a test case provided in an embodiment of this application. The test case includes the following steps S401 to S410.

[0224] S401, place the camera in the test chamber, the temperature inside the test chamber is 85℃, and the humidity is 85%RH.

[0225] S402. After the camera has been placed in the test chamber for 48 hours, remove the camera from the test chamber and quickly immerse it in ice water (temperature 0℃).

[0226] S403, after immersing the camera in ice water for 20 seconds, remove the camera from the ice water and observe the fogging situation of the camera #1.

[0227] S404, determine whether water mist has appeared in fogging condition #1. If yes, proceed to step S405; otherwise, proceed to step S408.

[0228] S405, record the duration t1 of the water mist.

[0229] S406, determine whether the duration t1 is greater than 40 minutes. If yes, proceed to step S407. If no, proceed to step S408 after the water mist has completely dissipated.

[0230] S407 indicates that the camera's anti-fogging performance is substandard.

[0231] S408, continuously power on the camera for 4 hours and observe the fogging situation of the camera during the continuous power-on process #2.

[0232] S409, determine whether water mist has appeared in fogging condition #2. If yes, proceed to step S407; otherwise, proceed to step S410.

[0233] S410 indicates that the camera's anti-fogging performance is qualified.

[0234] Test Case 2

[0235] Please refer to Figure 5, which is a flowchart illustrating another test case provided in an embodiment of this application. This test case includes the following steps S501 to S509.

[0236] S501, immerse the camera in room temperature water (temperature is 25℃).

[0237] S502 performs a power cycle on and off on the camera (15 minutes on and 5 minutes off), and records the number of power cycles.

[0238] After the S503 has undergone 280 power cycles, the camera is removed from room temperature water and quickly immersed in ice water (0°C).

[0239] S504, after immersing the camera in ice water for 20 seconds, remove the camera from the ice water and observe the fogging situation of the camera #3.

[0240] S505, determine whether water mist has appeared in fogging condition #3. If yes, proceed to step S506; otherwise, proceed to step S508.

[0241] S506, record the duration t2 of the water mist.

[0242] S507, determine whether the duration t2 is greater than 40min. If yes, proceed to step S509; otherwise, proceed to step S508.

[0243] S508 indicates that the camera's anti-fogging performance is qualified.

[0244] S509 indicates that the camera's anti-fogging performance is substandard.

[0245] Test Case 3

[0246] Please refer to Figure 6, which is a flowchart illustrating another test case provided in an embodiment of this application. This test case includes the following steps S601 to S607.

[0247] S601 performs a hot-cold cycle on the camera (immersed in 90℃ high-temperature water for 15 minutes, then immersed in 0℃ ice water for 15 minutes), and records the number of hot-cold cycles.

[0248] S602, after 48 cycles of hot and cold water, the camera was removed from the ice water and the fogging condition of the camera was observed #4.

[0249] S603, determine whether water mist has appeared in fogging situation #4. If yes, proceed to step S604; otherwise, proceed to step S606.

[0250] S604 records the duration t3 of the water mist.

[0251] S605, determine whether the duration t3 is greater than 40 minutes. If yes, proceed to step S607; otherwise, proceed to step S606.

[0252] S606 indicates that the camera's anti-fogging performance is qualified.

[0253] S607 indicates that the camera's anti-fogging performance is substandard.

[0254] For any content not specifically described in the above test cases, please refer to the relevant descriptions in the preceding embodiments; they will not be repeated here.

[0255] Using the above test cases, a fogging test was conducted on a camera that had previously experienced fogging issues in actual use (referred to as camera a for distinction). The test result showed that camera a exhibited persistent, non-dispersible fogging, similar to the fogging behavior of camera a in actual use. Using the same test cases, a fogging test was conducted on a camera that had not previously experienced fogging issues in actual use (referred to as camera b for distinction). The test result showed that camera b did not exhibit fogging, similar to the fogging behavior of camera b in actual use.

[0256] The fogging test method in this application can not only reproduce the fogging phenomenon of devices in use, but also test the anti-fogging performance of devices not yet shipped, so that when problems are found, timely design optimization can be carried out to prevent the problems from flowing to the back end.

[0257] The embodiments of this application can fill the gap in the industry regarding fogging test methods and test cases for automotive cameras, and can be subsequently extended to national standards to set requirements for the evaluation standards of camera-related module manufacturers.

[0258] Please refer to Figure 7, which is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. The electronic device 700 may include a processor 701. Optionally, the electronic device 700 may also include a memory 702. Further optionally, the electronic device 700 may also include a communication interface 703 and a bus 704. The processor 701, memory 702, and communication interface 703 are interconnected via the bus 704. The communication interface 703 is used for data interaction with other devices.

[0259] The processor 701 is a module that performs arithmetic and logical operations. It can be one or a combination of processing modules such as a central processing unit (CPU), a graphics processing unit (GPU), or a microprocessor unit (MPU). The processor 701 can also be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or any conventional processor.

[0260] The memory 702 is used to provide storage space, in which data such as the operating system and computer programs can be stored. The memory 702 includes, but is not limited to, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM), or compact disc read-only memory (CD-ROM).

[0261] The processor 701 calls the computer program stored in the memory 702, which can execute the operations performed by any one or more of the first control device, the second control device, the processing device and the power supply device in the above embodiments. For details, please refer to the previous embodiments, which will not be repeated here.

[0262] The above are merely specific embodiments of this application, but the scope of protection of this application is not limited thereto. Any changes or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application.

Claims

1. A fogging test method, characterized in that, The method includes: The device under test is placed in a first test environment, the humidity of which meets a first humidity condition; After the device under test (DUT) is placed in the first test environment for a first period of time, the DUT is placed in a second test environment, the temperature of the second test environment is lower than the temperature of the first test environment, and the temperature difference between the first test environment and the second test environment is greater than or equal to a first temperature difference threshold. After the device under test (DUT) has been placed in the second test environment for a second period of time, first data is determined, which is used to indicate the first fogging condition of the DUT.

2. The method according to claim 1, characterized in that, The first data includes the transmittance of the device under test and / or the sensing data obtained when the device under test is in operation.

3. The method according to claim 1 or 2, characterized in that, The method further includes: If the first fogging condition of the device under test includes the appearance of water mist on the device under test and the water mist does not completely dissipate within a third time period, the anti-fogging performance of the device under test is determined to be unqualified.

4. The method according to any one of claims 1 to 3, characterized in that, The method further includes: In the case where the first fogging condition of the device under test includes the case where the device under test does not fog up, or the device under test fogs up and the fog completely dissipates within a third time period, the device under test is powered on after the fog completely dissipates, and second data is determined. The second data is used to indicate the second fogging condition of the device under test.

5. The method according to claim 4, characterized in that, The method further includes: If the second fogging condition of the device under test includes no water mist appearing within the fourth time period after power-on, or water mist appearing within the fourth time period after power-on and completely dissipating within the third time period, then the anti-fogging performance of the device under test is deemed qualified; or, If the second fogging condition of the device under test includes the appearance of water mist within the fourth time period after power-on, or the appearance of water mist within the fourth time period after power-on and the water mist not completely dissipating within the third time period, the anti-fogging performance of the device under test is determined to be unqualified.

6. The method according to any one of claims 1 to 3, characterized in that, The method further includes: When the device under test is placed in the first test environment, the device under test is subjected to at least one power-on / off cycle, each power-on cycle including: a fifth duration of power-on and a sixth duration of power-off.

7. The method according to claim 6, characterized in that, The method further includes: If the first fogging condition of the device under test includes the absence of water mist on the device under test, or the presence of water mist on the device under test and the complete dissipation of water mist within a third time period, the anti-fogging performance of the device under test is deemed qualified.

8. The method according to any one of claims 1 to 3, characterized in that, The method further includes: In the case where the first fogging condition of the device under test includes the case where the device under test does not produce water mist, or the case where the device under test produces water mist and the water mist completely dissipates within a third time period, the first operation is repeated until the number of times the first operation is performed reaches the first number or the first fogging condition after the first operation meets the unqualified condition. The first operation includes: placing the device under test (DUT) in the first test environment; after the DUT has been placed in the first test environment for a first period of time; placing the DUT in the second test environment for a second period of time; and determining first data, wherein the first data is used to indicate the first fogging condition of the DUT. The unqualified conditions include the presence of water mist on the device under test and the failure of the water mist to completely dissipate within a third time period.

9. The method according to claim 8, characterized in that, The method further includes: After the first operation has been executed a certain number of times, if the first fogging condition of the device under test includes the device under test not showing water mist, or the device under test showing water mist and the water mist completely dissipating within a third time period, the anti-fogging performance of the device under test is determined to be qualified.

10. The method according to any one of claims 1 to 9, characterized in that, The humidity of the first test environment meets the first humidity condition, including: The humidity of the first test environment is greater than or equal to a first humidity threshold; or, the humidity of the first test environment is within a first humidity range.

11. The method according to any one of claims 1 to 10, characterized in that, The temperature of the first test environment is greater than or equal to a first temperature threshold, or the temperature of the first test environment is within a first temperature range; and / or, The temperature of the second test environment is less than or equal to the second temperature threshold, or the temperature of the second test environment is within the second temperature range.

12. The method according to any one of claims 1 to 11, characterized in that, The first test environment is provided by a first test chamber or a first water tank, wherein the humidity and temperature inside the first test chamber are adjustable, and the water temperature inside the first water tank is adjustable; and / or, The second test environment is provided by a second test chamber or a second water tank. The temperature of the second test chamber is adjustable, and the water temperature in the second water tank is adjustable.

13. A fogging test system, characterized in that, The system includes a first testing device, a second testing device, and a processing device; The first testing device is used to provide a first testing environment for placing the device under test, and the humidity of the first testing environment meets a first humidity condition; The second testing device is used to provide a second testing environment for placing the device under test, wherein the temperature of the second testing environment is lower than the temperature of the first testing environment, and the temperature difference between the first testing environment and the second testing environment is greater than or equal to a first temperature difference threshold. The processing device is used to determine the fogging status of the device under test.

14. The system according to claim 13, characterized in that, The system also includes a power supply device for supplying power to the device under test (DUT), thereby powering on the DUT.

15. The system according to claim 13 or 14, characterized in that, The first testing device includes a first test chamber or a first water tank, wherein the humidity and temperature inside the first test chamber are adjustable, and the water temperature inside the first water tank is adjustable.

16. The system according to claim 15, characterized in that, The system further includes a first control device, which is used to adjust the humidity and temperature inside the first test chamber, or the first control device is used to adjust the water temperature inside the first water tank.

17. The system according to any one of claims 13 to 16, characterized in that, The second testing device includes a second test chamber or a second water tank, wherein the temperature inside the second test chamber is adjustable, and the water temperature inside the second water tank is adjustable.

18. The system according to claim 17, characterized in that, The system also includes a second control device, which is used to adjust the temperature inside the second test chamber, or the second control device is used to adjust the water temperature inside the second water tank.

Images