Probe pin for integrated circuits testing

Abstract

The material of this design is metal; this design is a probe pin that makes contact with the electrodes, terminals, pads, etc. of the subject, and is used to inspect electronic components such as semiconductor devices, semiconductor packages, integrated circuits, and printed circuit boards; as shown in reference FIG 1.8, when the probe pin for integrated circuits testing, which is our new design, is compressed, the end of the upper probe is in contact with the subject; reference FIG 1.8 shows the compressed state of the probe pin for integrated circuits testing, which is the subject of our new design; the main point of the design creation is the shape of the probe pin for integrated circuits testing.

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