Probe pin for integrated circuits testing

WO244962SActive Publication Date: 2025-05-09HICON CO LTD +2
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Patent Information

Application Number
WO244962
Authority / Receiving Office
WO · WO
Patent Type
Designs
Current Assignee / Owner
Priority Date
2023-11-07
Filing Date
2024-05-03
Publication Date
2025-05-09
Estimated Expiration
2049-05-03

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Abstract

The design is made from metal and features a probe pin that makes contact with electrodes, terminals, pads, and other components of the subject; it is used for testing electronic components, including semiconductor devices, semiconductor packages, integrated circuits, and printed circuit boards; as illustrated in Fig. 1.8, when the new probe pin for integrated circuits testing is compressed, the tip of the upper probe touches the subject; the best views showing the main points of this design are reproductions 1.1 and 1.8.
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