A microchannel plate collection efficiency test system and test method

By designing a microchannel plate collection efficiency test system, using photoelectron multiplication and pulse frequency ratio calculation, the problem of the inability to experimentally test the microchannel plate collection efficiency in the prior art is solved, and a more accurate performance evaluation is achieved.

CN114487743BActive Publication Date: 2025-07-25DONGGUAN ZHONGKE ATOMICALLY PRECISE MANUFACTURING TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202210089575.X
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-01-25
Publication Date
2025-07-25
Estimated Expiration
2042-01-25

AI Technical Summary

Technical Problem

There is a lack of effective experimental methods and equipment in the prior art to test the collection efficiency of microchannel plates, and can only rely on simulation and calculations.

Method used

A microchannel plate collection efficiency test system is designed, including a pulse power supply, a light source, a photocathode, an output charge spectrum test system, a vacuum cavity and a DC high voltage power supply. The collection efficiency is characterized by collecting photoelectrons at the anode after doubling the microchannel plate at the anode and calculating the pulse frequency ratio.

Benefits of technology

The collection efficiency of microchannel plates is achieved through experiments, which solves the shortcomings of relying on simulation and calculations, and improves the accuracy and reliability of performance testing.

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Abstract

The present disclosure relates to a microchannel plate collection efficiency test system and a test method. The test system includes: a pulse power supply, a light source, a photocathode, an output charge spectrum test system, a vacuum chamber, and a DC high-voltage power supply; the pulse power supply drives the light source to emit light to irradiate the photocathode; the output charge spectrum test system includes an anode and a computer, the photocathode and the anode are arranged in the vacuum chamber, and the computer is arranged outside the vacuum chamber; the DC high-voltage power supply is electrically connected to the photocathode, the anode, and the microchannel plate to be tested arranged between the photocathode and the anode to provide a working voltage; the output charge spectrum test system collects the electrons multiplied and emitted by the microchannel plate through the anode, obtains a second output pulse, and calculates the collection efficiency of the microchannel plate to be tested according to the first output pulse of the pulse power supply and the second output pulse. The present invention can test the collection efficiency of the microchannel plate through experiments.
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