Methods, apparatus, equipment, and storage media for assessing the service life of electrical connectors

Abstract

This application relates to a method, apparatus, device, and storage medium for assessing the service life of an electrical connector. The method includes: acquiring first information and second information about the electrical connector, the first information including attribute information of the connector, and the second information including the current operating voltage, temperature, and RMS power spectral density of operating vibration stress; determining the estimated service life of the electrical connector based on the first information and a predicted service life model; determining a correction coefficient based on the second information and a comprehensive physical model; and correcting the estimated service life based on the correction coefficient to obtain the service life of the electrical connector. This method can improve the accuracy of electrical connector service life assessment.

Description

Technical Field

[0001] This application relates to the field of electrical connector technology, and in particular to a method, apparatus, device, and storage medium for evaluating the service life of an electrical connector. Background Technology

[0002] Electrical connectors operate in harsh and complex environments for extended periods, making them highly reliable and long-life products. Therefore, failure of electrical connectors can have significant consequences. As a result, reliability assessment of electrical connectors has become an important area of ​​research.

[0003] Currently, the assessment of the service life of electrical connectors is mostly based on single environmental stresses such as temperature and vibration. This approach only considers a single factor, and the assessment results are inaccurate. Summary of the Invention

[0004] Therefore, it is necessary to provide a method, apparatus, device, and storage medium for assessing the working life of electrical connectors that can quickly evaluate and improve the accuracy of electrical connector life assessment, in order to address the above-mentioned technical problems.

[0005] In a first aspect, this application provides a method for evaluating the service life of an electrical connector. The method includes:

[0006] Acquire first and second information of the electrical connector. The first information includes the attribute information of the electrical connector, and the second information includes the current operating voltage, operating temperature, and the effective value of the power spectral density of the operating vibration stress.

[0007] The estimated lifespan of the electrical connector is determined based on the first information and the estimated lifespan model.

[0008] The correction coefficients are determined based on the second information and the integrated physical model;

[0009] The estimated lifespan is corrected according to the correction factor to obtain the working lifespan of the electrical connector.

[0010] In one embodiment, before determining the estimated lifespan of the electrical connector based on the first information and the estimated lifespan model, the method further includes:

[0011] Obtain the first test result of the estimated life test of the electrical connector, the first test result including the dimensional parameters, shape parameters and estimated life index of the electrical connector;

[0012] A lifespan prediction model was constructed based on the results of the first experiment.

[0013] In one embodiment, before determining the correction coefficients based on the second information and the integrated physical model, the process includes:

[0014] The second test results of the comprehensive stress of the electrical connector are obtained. The test results include the test temperature, operating temperature, activation energy, Boltzmann constant, test voltage, operating voltage, voltage acceleration constant, power spectral density RMS value of accelerated vibration stress, and power spectral density RMS value of operating vibration stress of the electrical connector.

[0015] The comprehensive physical model is constructed based on the results of the second experiment.

[0016] In one embodiment, the integrated physical model includes a temperature assessment component, a voltage assessment component, and a vibration assessment component. The step of constructing the integrated physical model based on the second experimental results includes:

[0017] The temperature evaluation section is constructed based on the test temperature, operating temperature, activation energy, and Boltzmann constant from the second test results.

[0018] The voltage evaluation section is constructed based on the test voltage, operating voltage, and voltage acceleration constant from the test results.

[0019] The vibration assessment section is constructed based on the effective power spectral density values ​​of the accelerated vibration stress and the effective power spectral density values ​​of the working vibration stress from the test results.

[0020] In one embodiment, the order of magnitude of the test environment temperature is greater than that of the working environment temperature; the order of magnitude of the test voltage is greater than that of the working voltage; and the order of magnitude of the effective power spectral density of the accelerated vibration stress is greater than that of the effective power spectral density of the working vibration stress.

[0021] In one embodiment, the step of correcting the estimated lifespan according to the correction factor to obtain the operating lifespan of the electrical connector includes:

[0022] The ratio of the estimated lifespan to the correction factor is obtained, and the operating lifespan of the electrical connector is obtained based on the ratio.

[0023] Secondly, this application also provides an apparatus for evaluating the service life of an electrical connector. The apparatus includes:

[0024] The first acquisition module is used to acquire first information and second information of the electrical connector. The first information includes the attribute information of the electrical connector, and the second information includes the current operating voltage, temperature and the effective value of the power spectral density of the operating vibration stress.

[0025] The first determining module is used to determine the estimated lifespan of the electrical connector based on the first information and the estimated lifespan model.

[0026] The second determining module is used to determine the correction coefficients based on the second information and the integrated physical model;

[0027] The correction module is used to correct the estimated lifespan according to the correction coefficient to obtain the working lifespan of the electrical connector.

[0028] Thirdly, this application also provides a computer device. The computer device includes a memory and a processor, the memory storing a computer program, and the processor executing the computer program to perform the following steps:

[0029] Acquire first and second information about the electrical connector. The first information includes the attribute information of the electrical connector, and the second information includes the current operating voltage, temperature, and the effective value of the power spectral density of the operating vibration stress.

[0030] The estimated lifespan of the electrical connector is determined based on the first information and the estimated lifespan model.

[0031] The correction coefficients are determined based on the second information and the integrated physical model;

[0032] The estimated lifespan is corrected according to the correction factor to obtain the working lifespan of the electrical connector.

[0033] Fourthly, this application also provides a computer-readable storage medium. The computer-readable storage medium stores a computer program thereon, which, when executed by a processor, performs the following steps:

[0034] Acquire first and second information about the electrical connector. The first information includes the attribute information of the electrical connector, and the second information includes the current operating voltage, temperature, and the effective value of the power spectral density of the operating vibration stress.

[0035] The estimated lifespan of the electrical connector is determined based on the first information and the estimated lifespan model.

[0036] The correction coefficients are determined based on the second information and the integrated physical model;

[0037] The estimated lifespan is corrected according to the correction factor to obtain the working lifespan of the electrical connector.

[0038] Fifthly, this application also provides a computer program product. The computer program product includes a computer program that, when executed by a processor, performs the following steps:

[0039] Acquire first and second information about the electrical connector. The first information includes the attribute information of the electrical connector, and the second information includes the current operating voltage, temperature, and the effective value of the power spectral density of the operating vibration stress.

[0040] The estimated lifespan of the electrical connector is determined based on the first information and the estimated lifespan model.

[0041] The correction coefficients are determined based on the second information and the integrated physical model;

[0042] The estimated lifespan is corrected according to the correction factor to obtain the working lifespan of the electrical connector.

[0043] The aforementioned method, apparatus, computer equipment, storage medium, and computer program product for assessing the service life of electrical connectors acquire first and second information about the electrical connector. The first information includes the connector's attribute information, and the second information includes the effective power spectral density of the current operating voltage, operating temperature, and operating vibration stress. Based on the first information and a life estimation model, the estimated lifespan of the electrical connector is determined. Based on the second information and a comprehensive physical model, a correction coefficient is determined. The estimated lifespan is then corrected using the correction coefficient to obtain the service life of the electrical connector. In this manner, this application determines the estimated lifespan of the electrical connector using a life estimation model and corrects the estimated lifespan using correction coefficients obtained from the voltage, temperature, and vibration stress during the connector's operation, thereby obtaining the service life of the electrical connector. This application comprehensively considers various factors affecting the service life of electrical connectors, ensuring the accuracy of the final result. Attached Figure Description

[0044] Figure 1 This is a diagram illustrating the application environment of a life assessment method for electrical connectors in one embodiment.

[0045] Figure 2 This is a flowchart illustrating a life assessment method for an electrical connector in one embodiment;

[0046] Figure 3 This is a structural block diagram of a life assessment device for an electrical connector in one embodiment;

[0047] Figure 4 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0048] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0049] The method for evaluating the service life of electrical connectors provided in this application can be applied to, for example... Figure 1In the application environment shown, the detection device 102 communicates with the computer device 104 via a network (the detection device 102 can also communicate with the computer device 104 via a wired connection). A data storage system can store the data that the computer device 104 needs to process. The data storage system can be integrated into the computer device 104 or placed in the cloud or on another network server. The detection device 102 is connected to the electrical connector and is used to acquire the attribute information of the electrical connector and the temperature of the environment in which the electrical connector is located. The attribute information includes the connector's dimensional parameters, shape parameters, operating voltage, operating temperature, and operating vibration stress, etc. The detected attribute information is then transmitted to the computer device 104. The computer device 104 uses a life assessment model based on the acquired attribute and environmental information to obtain the life assessment result of the electrical connector, and determines a correction coefficient based on a comprehensive physical model. The correction coefficient is then used to correct the life assessment result, thereby obtaining the working life of the electrical connector. The computer device 104 can be, but is not limited to, various personal computers, laptops, smartphones, tablets, etc. The detection device 102 includes, but is not limited to, temperature sensors, resistance detection devices, and dimensional detection devices.

[0050] In one embodiment, such as Figure 2 As shown, a method for evaluating the service life of an electrical connector is provided, which can be applied to... Figure 1 Taking a computer device as an example, the explanation includes the following steps:

[0051] Step 210: Obtain first information and second information of the electrical connector. The first information includes the attribute information of the electrical connector, and the second information includes the current operating voltage, operating temperature, and the effective value of the power spectral density of the operating vibration stress.

[0052] The computer equipment acquires first and second information about the electrical connector. The attribute information includes dimensional parameters, shape parameters, initial contact resistance, contact resistance degradation rate, initial insulation resistance, insulation resistance degradation rate, and the logarithmic mean of the insulation resistance degradation rate distribution. The second information includes the current operating voltage, operating temperature, and the effective value of the power spectral density of the operating vibration stress.

[0053] Step 220: Determine the estimated lifespan of the electrical connector based on the first information and the estimated lifespan model.

[0054] Specifically, as one embodiment, the estimated lifespan model R of the electrical connector e (t) has:

[0055]

[0056] Where η represents the dimensional parameter, t represents the lifetime, and m represents the shape parameter of the electrical connector. The dimensional parameter η and the shape parameter m can be obtained through existing technologies.

[0057] Thus, based on the first information obtained, the estimated lifespan t of the electrical connector can be obtained by inputting it into the estimated lifespan model of the electrical connector.

[0058] As another embodiment, the estimated reliability model for the electrical connector can be:

[0059] R(t)=R e (t)·R R (t)

[0060] Where R(t) represents the reliability of the electrical connector, R e (t) represents the reliability of the contact performance evaluation section, R R (t) represents the reliability of the insulation performance evaluation section. At a given reliability level, the reliable lifespan of the electrical connector can be obtained.

[0061] Among them, the contact performance evaluation section R of electrical connectors e (t), a relation exists:

[0062] Reliability models for the contact life of electrical connectors include:

[0063]

[0064] Where D is the failure threshold of contact resistance, N is the number of contact pairs, a and b are model parameters, r0 is the initial value of contact resistance, σ is the logarithmic standard deviation of contact resistance, and β represents the constant part.

[0065] Insulation performance evaluation section R of electrical connectors R (t), a relation exists:

[0066]

[0067] In the formula, R t Let μ be the insulation resistance, α be the degradation rate of the insulation resistance, and t be time, where the degradation rate α follows a log-normal distribution. α σ and σ represent the logarithmic mean and logarithmic standard deviation of the degradation rate distribution, respectively.

[0068] Reliability models for the insulation life of electrical connectors include:

[0069]

[0070] σ R μ represents the standard deviation of the logarithm of the degradation rate distribution. RR0 represents the logarithmic mean of the degradation rate distribution, and R0 represents the initial value of the insulation resistance, y∈[0,t].

[0071] Based on the output results of the contact performance evaluation section and the insulation performance evaluation section, the life evaluation result of the electrical connector can be obtained.

[0072] The estimated lifespan t of the electrical connector can be obtained using the two methods described above. It should be noted that the second method yields more accurate results than the first, while the first method is simpler and faster to calculate.

[0073] Step 230: Determine the correction coefficients based on the second information and the integrated physical model.

[0074] Specifically, the integrated physical model can be:

[0075] R 电连接器 = 温度 ×R 电压 ×R 振动

[0076] Among them, R 温度 R 电压 R 振动 The calculation formulas representing the effects of temperature, voltage, and vibration on electrical connectors are provided and can be found in existing technologies. The obtained second information is then input into the aforementioned integrated physical model to obtain the correction coefficients.

[0077] Step 240: Correct the estimated lifespan according to the correction coefficient to obtain the working lifespan of the electrical connector.

[0078] Based on the correction factor obtained in step 230, the estimated lifespan is corrected using the correction factor to obtain the working lifespan of the electrical connector.

[0079] Furthermore, the estimated lifespan is corrected according to the correction coefficient to obtain the operating lifespan of the electrical connector, including:

[0080] The ratio of the estimated lifespan to the correction factor is obtained, and the operating lifespan of the electrical connector is obtained based on the ratio.

[0081] Specifically, the ratio of estimated lifespan to correction factor can be calculated, and the operating life of the electrical connector can be obtained based on this ratio. For example, operating lifespan = estimated lifespan / correction factor. It should be noted that...

[0082] The aforementioned method for assessing the lifespan of an electrical connector involves acquiring the connector's attribute data and the ambient temperature; inputting this data into a lifespan assessment model, which includes contact performance assessment and insulation performance assessment components; and obtaining the connector's lifespan assessment result based on the outputs of these components. By combining contact and insulation performance assessments, this application considers the influence of both contact and insulation performance on the connector's lifespan, thus improving the accuracy of lifespan assessment compared to methods that only consider contact performance.

[0083] In one embodiment, before determining the estimated lifespan of the electrical connector based on the first information and the estimated lifespan model, the method further includes:

[0084] Obtain the first test result of the estimated life test of the electrical connector, the first test result including the dimensional parameters, shape parameters and estimated life index of the electrical connector;

[0085] A lifespan prediction model was constructed based on the results of the first experiment.

[0086] Specifically, as one embodiment, since the lifespan of an electrical connector follows a Weibull distribution, that is:

[0087]

[0088] The estimated lifespan model R(t) for the electrical connector is as follows:

[0089]

[0090] Where η represents the dimensional parameter, t represents the lifetime, and m represents the shape parameter of the electrical connector. The dimensional parameter η and the shape parameter m can be obtained using existing technologies. Therefore, the estimated lifetime model R(t) of the electrical connector can be obtained through experimentation.

[0091] In another embodiment, the lifespan of an electrical connector can be viewed as a combination of the lifespan of the contact portion and the lifespan of the insulation portion. The characteristic parameter for contact performance is contact resistance, and the characteristic parameter for insulation performance is insulation resistance. An increase in contact resistance is due to a redox reaction occurring on the contact surface, leading to eventual contact failure. A decrease in insulation resistance can be attributed to the aging of the insulator in the environment, which generates charged free radicals.

[0092] Based on the failure mechanism, the performance degradation model of contact resistance is established as follows:

[0093] r e ≈r0+αtβ

[0094] Where, r e α represents the contact resistance value, t represents time, α represents the degradation rate of the contact resistance, β represents the constant part, and r0 represents the initial value of the contact resistance.

[0095] The logarithmic standard deviation σ of the contact resistance degradation rate α is independent of the accelerating stress level, meaning σ does not change with the accelerating stress level, and the logarithmic mean μ α The relationship with the temperature stress level satisfies:

[0096] μ α =+bx

[0097] In the formula, a and b are model parameters; x = 1000 / (273.15 + T) is the temperature stress level of the transformation.

[0098] In reality, due to some uncertainties in the production and assembly process, the initial value of the contact resistance r0 can be considered to follow a normal distribution, i.e. The lifetime distribution function of the contact performance is:

[0099]

[0100] Reliability models for the contact life of electrical connectors include:

[0101]

[0102] The performance degradation model of insulation resistance is as follows:

[0103]

[0104] In the formula, R t Let be the insulation resistance, α be the degradation rate of the insulation resistance, R0 be the initial insulation resistance of the electrical connector, and t be time, where the degradation rate α of the insulation resistance follows a log-normal distribution. α σ and σ represent the logarithmic mean and logarithmic standard deviation of the degradation rate distribution, respectively.

[0105] The logarithmic mean μ of the degradation rate distribution α It is inextricably linked to temperature and satisfies:

[0106] μ α =a+bx

[0107] In the formula, a and b are model parameters, x = 1000 / (273.15 + T), and T represents temperature. According to the above formula, the logarithmic mean of the degradation rate of insulation resistance μ... α It is inversely proportional to temperature T.

[0108] The initial value of the insulation resistance R0 can be considered to follow a normal distribution, i.e. The lifetime distribution function of an insulator:

[0109]

[0110] The insulation performance evaluation of electrical connectors includes:

[0111]

[0112] Then, based on the contact performance evaluation section and the insulation performance evaluation section, the life evaluation model of the electrical connector is obtained:

[0113] R(t)=R e (t)·R R (t).

[0114] In one embodiment, obtaining the estimated lifespan assessment model for the electrical connector may further include:

[0115] Determine the number of test pairs for contact resistance and the number of test pairs for insulation resistance in the electrical connector;

[0116] The life assessment model of the electrical connector is obtained based on the contact performance assessment section, the insulation performance assessment section, the number of contact pairs, and the number of test pairs.

[0117] Specifically, electrical connectors may contain multiple pairs of contacts, each of which can affect the connector's lifespan. Furthermore, when testing the insulation resistance of an electrical connector, multiple test pairs can be used to measure its insulation resistance. Therefore, to improve the accuracy of the connector's lifespan assessment model, this embodiment also obtains the connector's lifespan assessment model based on the contact performance assessment section, the insulation performance assessment section, the number of contact pairs, and the number of test pairs. Specifically, this can include the following methods:

[0118] Method 1:

[0119] Method 2:

[0120] Method 3:

[0121] Where N1 represents the number of contact pairs and N2 represents the number of test pairs.

[0122] In this embodiment, the relative method is: R(t) = R e (t)·R R (t)=[1-F e (t)]·[1-F R[(t)] takes into account the number of contact pairs and / or test pairs, resulting in higher relative accuracy.

[0123] In one embodiment, before determining the correction coefficients based on the second information and the integrated physical model, the process includes:

[0124] The second test results of the comprehensive stress of the electrical connector are obtained. The test results include the test temperature, operating temperature, activation energy, Boltzmann constant, test voltage, operating voltage, voltage acceleration constant, power spectral density RMS value of accelerated vibration stress, and power spectral density RMS value of operating vibration stress of the electrical connector.

[0125] The comprehensive physical model is constructed based on the results of the second experiment.

[0126] The integrated physical model includes a temperature assessment component, a voltage assessment component, and a vibration assessment component. The construction of the integrated physical model based on the second experimental results includes:

[0127] The temperature evaluation section is constructed based on the test temperature, activation energy, and Boltzmann constant from the second test results.

[0128] The voltage evaluation section is constructed based on the test voltage and voltage acceleration constant from the test results.

[0129] The vibration assessment section is constructed based on the effective power spectral density values ​​of the accelerated vibration stress and the effective power spectral density values ​​of the working vibration stress from the test results.

[0130] Specifically, accelerated life reliability tests are conducted on electrical connectors under combined electro-thermal-mechanical stress. A batch of electrical connectors is placed in a test chamber for testing, with a sample size N ≥ 10. The electrical connectors are then powered on, assuming the operating voltage is V. use The applied voltage stress in the test is V. stress The relationship between the working voltage and the test voltage is as follows:

[0131] V stress >V use

[0132] As for the test stress V stress The recommended values ​​follow these principles:

[0133] 1) Applied V stress The failure mechanism of the electrical connector should not be changed; the limiting voltage can be obtained through preliminary testing.

[0134] 2) Test stress V stress It should be higher than the rated voltage V use Large, with the following relationship:

[0135] V stress =V use+K

[0136] K is the test step size. The recommended value for K should be one order of magnitude lower than the rated voltage. For example, if the rated operating voltage is 10V, then the recommended step size is K = 1V.

[0137] The methods for applying temperature and vibration stress can refer to the principles for applying voltage stress. That is, the order of magnitude of the test environment temperature is greater than that of the working environment temperature; the order of magnitude of the test voltage is greater than that of the working voltage; and the order of magnitude of the effective value of the power spectral density of the accelerated vibration stress is greater than that of the effective value of the power spectral density of the working vibration stress.

[0138] Based on the above experimental results, temperature evaluation, voltage evaluation, and vibration evaluation components are constructed into a comprehensive physical model. The comprehensive physical model can be:

[0139] R 电连接器 = 温度 ×R 电压 ×R 振动

[0140]

[0141] Wherein, AF(t) is the electrothermal-mechanical acceleration factor (i.e., R). 电连接器 Ea is the activation energy, which for an electrical connector is Ea = 0.6 eV; k is the Boltzmann constant, k = 8.167 × eV. -5 T use For the operating temperature, T stress V represents the experimental temperature, all in Kelvin. β is the voltage acceleration constant (0.5 ≤ β ≤ 1.0, default value is 1.0 depending on the failure mechanism), V stress V is the experimental voltage. use W1 is the operating voltage. W0 is the effective value of the power spectral density of the accelerated vibration stress and W1 is the effective value of the power spectral density of the operating vibration stress. A is a constant.

[0142] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0143] Based on the same inventive concept, this application also provides an apparatus for evaluating the working life of an electrical connector, which implements the aforementioned method for evaluating the working life of an electrical connector. The solution provided by this apparatus is similar to the implementation described in the above method. Therefore, the specific limitations of one or more embodiments of the apparatus for evaluating the working life of an electrical connector provided below can be found in the limitations of the method for evaluating the working life of an electrical connector described above, and will not be repeated here.

[0144] In one embodiment, such as Figure 3 As shown, an apparatus for evaluating the service life of an electrical connector is provided, comprising:

[0145] The first acquisition module 310 is used to acquire first information and second information of the electrical connector. The first information includes the attribute information of the electrical connector, and the second information includes the current operating voltage, temperature and the effective value of the power spectral density of the operating vibration stress.

[0146] The first determining module 320 is used to determine the estimated lifespan of the electrical connector based on the first information and the estimated lifespan model.

[0147] The second determining module 330 is used to determine the correction coefficients based on the second information and the integrated physical model;

[0148] The correction module 340 is used to correct the estimated lifespan according to the correction coefficient to obtain the working lifespan of the electrical connector.

[0149] In one embodiment, the device further includes:

[0150] The second acquisition module (not shown in the figure) is used to acquire the first test result of the estimated life test of the electrical connector. The first test result includes the dimensional parameters, shape parameters and estimated life index of the electrical connector.

[0151] The first building module (not shown) is used to build a predicted lifetime model based on the results of the first experiment.

[0152] In one embodiment, the device further includes:

[0153] The third acquisition module (not shown in the figure) is used to acquire the second test results of the comprehensive stress of the electrical connector. The test results include the test temperature, activation energy, Boltzmann constant, test voltage, voltage acceleration constant, power spectral density RMS value of accelerated vibration stress, and power spectral density RMS value of working vibration stress of the electrical connector.

[0154] The second building module (not shown) is used to build the integrated physical model based on the results of the second experiment.

[0155] In one embodiment, the second building module (not shown) is used for:

[0156] The temperature evaluation section is constructed based on the test temperature, activation energy, and Boltzmann constant from the second test results.

[0157] The voltage evaluation section is constructed based on the test voltage and voltage acceleration constant from the test results.

[0158] The vibration assessment section is constructed based on the effective power spectral density values ​​of the accelerated vibration stress and the effective power spectral density values ​​of the working vibration stress from the test results.

[0159] In one embodiment, the order of magnitude of the test ambient temperature is greater than that of the working ambient temperature; the order of magnitude of the test voltage is greater than that of the working voltage; and the order of magnitude of the effective power spectral density of the accelerated vibration stress is greater than that of the effective power spectral density of the working vibration stress.

[0160] In one embodiment, the correction module 340 is used to obtain the ratio of the estimated lifespan to the correction coefficient, and to obtain the working lifespan of the electrical connector based on the ratio.

[0161] Each module in the aforementioned electrical connector service life evaluation device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in or independent of the processor in a computer device, or stored in the memory of a computer device as software, so that the processor can call and execute the corresponding operations of each module.

[0162] In one embodiment, a computer device is provided, which may be the server described in the above embodiments, and its internal structure diagram may be as follows: Figure 4As shown, the computer device includes a processor, memory, and a network interface connected via a system bus. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system, computer programs, and a database. The internal memory provides the environment for the operation of the operating system and computer programs in the non-volatile storage media. The database stores attribute information of the electrical connector, operating voltage, temperature, and other data, as well as a predicted lifespan model and a comprehensive physical model. The network interface is used for communication with external terminals via a network connection. When executed by the processor, the computer program implements a method for evaluating the service life of an electrical connector.

[0163] Those skilled in the art will understand that Figure 4 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0164] In one embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps of the method for evaluating the service life of an electrical connector as described in any of the above embodiments.

[0165] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the steps of the method for evaluating the service life of an electrical connector as described in any of the above embodiments.

[0166] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps of the method for evaluating the service life of an electrical connector as described in any of the above embodiments.

[0167] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0168] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0169] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A method for evaluating the service life of an electrical connector, characterized in that, The method includes: Acquire first and second information about the electrical connector. The first information includes the attribute information of the electrical connector, and the second information includes the current operating voltage, temperature, and the effective value of the power spectral density of the operating vibration stress. The estimated lifespan of the electrical connector is determined based on the first information and the estimated lifespan model. The correction coefficients are determined based on the second information and the integrated physical model; the integrated physical model includes a temperature assessment component, a voltage assessment component, and a vibration assessment component. The estimated lifespan is corrected according to the correction factor to obtain the working lifespan of the electrical connector.

2. The method according to claim 1, characterized in that, Before determining the estimated lifespan of the electrical connector based on the first information and the estimated lifespan model, the method further includes: Obtain the first test result of the estimated life test of the electrical connector, the first test result including the dimensional parameters, shape parameters and estimated life index of the electrical connector; A lifespan prediction model was constructed based on the results of the first experiment.

3. The method according to claim 1, characterized in that, Before determining the correction coefficients based on the second information and the integrated physical model, the process includes: The second test result of the comprehensive stress of the electrical connector is obtained. The test result includes the test temperature of the electrical connector, the operating temperature of the electrical connector, the activation energy, the Boltzmann constant, the test voltage, the operating voltage, the voltage acceleration constant, the effective value of the power spectral density of the accelerated vibration stress, and the effective value of the power spectral density of the operating vibration stress. The comprehensive physical model is constructed based on the results of the second experiment.

4. The method according to claim 3, characterized in that, The construction of the integrated physical model based on the second experimental results includes: The temperature evaluation section is constructed based on the test temperature, operating temperature, activation energy, and Boltzmann constant from the second test results. The voltage evaluation section is constructed based on the test voltage, operating voltage, and voltage acceleration constant from the test results. The vibration assessment section is constructed based on the effective power spectral density values ​​of the accelerated vibration stress and the effective power spectral density values ​​of the working vibration stress from the test results.

5. The method according to claim 3, characterized in that, The order of magnitude of the test temperature is greater than that of the operating temperature; the order of magnitude of the test voltage is greater than that of the operating voltage; and the order of magnitude of the effective power spectral density of the accelerated vibration stress is greater than that of the effective power spectral density of the operating vibration stress.

6. The method according to claim 1, characterized in that, The step of correcting the estimated lifespan according to the correction factor to obtain the working lifespan of the electrical connector includes: The ratio of the estimated lifespan to the correction factor is obtained, and the operating lifespan of the electrical connector is obtained based on the ratio.

7. An evaluation device for the service life of an electrical connector, characterized in that, The device includes: The first acquisition module is used to acquire first information and second information of the electrical connector. The first information includes the attribute information of the electrical connector, and the second information includes the current operating voltage, temperature and the effective value of the power spectral density of the operating vibration stress. The first determining module is used to determine the estimated lifespan of the electrical connector based on the first information and the estimated lifespan model. The second determining module is used to determine the correction coefficients based on the second information and the integrated physical model; the integrated physical model includes a temperature assessment part, a voltage assessment part, and a vibration assessment part. The correction module is used to correct the estimated lifespan according to the correction coefficient to obtain the working lifespan of the electrical connector.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.

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