AMOLED display module defective product abnormity processing method and system

Abstract

The invention discloses an AMOLED display module defective product abnormity processing method and system, and the method comprises the steps: carrying out the first test of an AMOLED display module at a production end, and obtaining the first test data of the AMOLED display module; burning the first test data in a first storage unit of the AMOLED display module, and storing the first test data in a second storage unit of an upper computer of a production end; performing a second test on a GAMMA curve, CIE brightness and power consumption of a defective product in the AMOLED display module at the client to obtain second test data; and comparing and analyzing the second test data and the first test data to obtain an abnormal reason of the defective product. By burning the first test data obtained by testing in the storage unit of the AMOLED display module at the production end, when the AMOLED display module is abnormal at the client, the first test data and the second test data obtained by testing can be inquired and obtained for comparison and analysis, and the cause of the abnormality can be quickly and accurately found out.

Description

Technical Field

[0001] The present invention relates to the technical field of AMOLED display module testing, and in particular to an AMOLED display module defective product abnormality processing method and system. Background Art

[0002] In the display market, AMOLED display module products are widely used, such as smart bracelets, smart watches, smart homes, e-cigarette products, etc., and with the advancement of technology, more and more smart watches and bracelets are becoming increasingly popular among people.

[0003] AMOLED display modules are widely used in smartwatch projects, and important brand customers are keen to use AMOLED display modules. However, as the shipment volume of AMOLED display modules increases, problems are also increasing, mainly focusing on abnormal GAMMA curve display, abnormal CIE brightness, and excessive power consumption. These problems have caused great trouble to customers and production factories, and a lot of costs have been invested to deal with these technical problems.

[0004] With existing technical means, when a display abnormality occurs on a client's AMOLED display module, the GAMMA curve data, CIE brightness data and power consumption data of the defective product are often compared with the corresponding big data. However, the data range of these big data is about 1.5 times that of normal products, and it is often difficult to find the cause of the abnormality of the defective product. Summary of the invention

[0005] In the prior art, when the client analyzes the abnormal causes of defective AMOLED display module products, it compares them with the corresponding big data. However, due to the large data range of the big data, it is impossible to accurately find the abnormal causes.

[0006] In view of the above problems, a method and system for handling the abnormality of defective AMOLED display modules are proposed. By burning the first test data obtained by the test in the storage unit of the AMOLED display module at the production end, when the AMOLED display module is abnormal, the first test data can be queried and compared with the second test data of the test on the client side to quickly and accurately find out the cause of the abnormality. By generating a unique ID corresponding to the AMOLED display module and storing the first test data and the ID in correspondence, it is beneficial for the production end to analyze the defective products. By storing the analysis results and the corresponding abnormal data in the defective product database, it is convenient for subsequent tracing and rapid analysis of the abnormal causes of other defective products.

[0007] In a first aspect, a method for handling abnormalities of defective AMOLED display modules includes:

[0008] Step 100: Perform a first test on the AMOLED display module at the production end to obtain first test data of the AMOLED display module, where the first test data includes GAMMA curve data, CIE brightness data, and power consumption data;

[0009] Step 200: Burn the first test data into a first storage unit of the AMOLED display module, and store the first test data in a second storage unit of the host computer of the production end;

[0010] Step 300: Perform a second test on the GAMMA curve, CIE brightness and power consumption of defective products in the AMOLED display module at the client to obtain second test data;

[0011] Step 400: Compare and analyze the second test data with the first test data to obtain the abnormal reason of the defective product.

[0012] In combination with the AMOLED display module defective product abnormality processing method described in the first aspect of the present invention, in a first possible implementation manner, the AMOLED display module defective product abnormality processing method further includes:

[0013] Step 500: At the production end, obtain the first test data in the second storage unit;

[0014] Step 600: Analyze the abnormal data in the first test data of the defective product, and store the analysis result and the corresponding abnormal test data in the defective product database.

[0015] In combination with the first possible implementation of the first aspect of the present invention, in a second possible implementation, step 100 includes:

[0016] Step 110: Generate a unique ID corresponding to the AMOLED display module using the host computer, and transmit the ID to the first test device at the production end, and the driver mainboard in the first test device burns the ID into the AMOLED display module;

[0017] Step 120: The driving mainboard in the first test device drives and lights up the AMOLED display module corresponding to the ID so that it displays a test screen;

[0018] Step 130: The test unit of the first test device detects the test screen and the power consumption of the AMOLED display module to obtain the first test data.

[0019] In combination with the second possible implementation manner of the first aspect of the present invention, in a third possible implementation manner, step 100 further includes:

[0020] Step 140: The test unit transmits the first test data to the host computer and the driver mainboard;

[0021] Step 150: the host computer stores the first test data in a second storage unit;

[0022] Step 160: The driver mainboard burns the first test data into the first storage unit.

[0023] In combination with the third possible implementation manner of the first aspect of the present invention, in a fourth possible implementation manner, step 150 includes:

[0024] Step 151, the host computer sets a corresponding storage partition in the second storage unit according to the ID;

[0025] Step 152: The host computer judges the first test data and stores the first test data according to the judgment result.

[0026] In combination with the fourth possible implementation manner of the first aspect of the present invention, in a fifth possible implementation manner, step 152 includes:

[0027] Step 1521: If all of the first test data are normal, store all of the first test data in the storage partition.

[0028] In combination with the fourth possible implementation manner of the first aspect of the present invention, in a sixth possible implementation manner, step 152 further includes:

[0029] Step 1522: If the first test data is abnormal, a first sub-storage partition and a second sub-storage partition are set in the storage partition according to the ID;

[0030] Step 1523: Store the normal data and abnormal data in the first test data in the first sub-storage partition and the second sub-storage partition respectively.

[0031] In a second aspect, a system for handling abnormalities of defective AMOLED display modules is provided, which adopts the method for handling abnormalities of defective AMOLED display modules described in the first aspect, and comprises:

[0032] Client devices;

[0033] Production equipment;

[0034] The production end device is communicatively connected with the client device;

[0035] The production end equipment includes:

[0036] Host computer;

[0037] a first test device;

[0038] The client device comprises:

[0039] A second test device;

[0040] The first testing device is communicatively connected with the host computer;

[0041] The host computer is used to generate a unique ID corresponding to the AMOLED display module, transmit the ID to the first test device at the production end, and store the first test data in the second storage unit;

[0042] The first testing device is used to perform a first test on the AMOLED display module at the production end, obtain first test data of the AMOLED display module, and burn the first test data into a first storage unit of the AMOLED display module;

[0043] The second testing device is used to perform a second test on the GAMMA curve, CIE brightness and power consumption of defective products in the AMOLED display module at the client, obtain second test data, compare and analyze the second test data with the first test data, and obtain the abnormal cause of the defective product;

[0044] The first test data includes GAMMA curve data, CIE brightness data and power consumption data.

[0045] In conjunction with the AMOLED display module defective product exception processing system described in the second aspect of the present invention, in a first possible implementation manner, the first testing device includes:

[0046] Drive main board and test unit;

[0047] The driving mainboard is used to burn the ID into the AMOLED display module, and drive the AMOLED display module corresponding to the ID to light up so that it displays a test screen;

[0048] The testing unit is used to detect the displayed test picture and the power consumption of the AMOLED display module to obtain the first test data.

[0049] In combination with the first possible implementation manner of the second aspect of the present invention, in a second possible implementation manner, the driving mainboard is further used to burn the first test data into the first storage unit.

[0050] The AMOLED display module defective product abnormality processing method and system of the present invention are implemented, by burning the first test data obtained by the test into the storage unit of the AMOLED display module at the production end, when the AMOLED display module is abnormal, the first test data can be queried and obtained on the client side for comparative analysis with the second test data of the test, so as to quickly and accurately find out the cause of the abnormality, and by generating a unique ID corresponding to the AMOLED display module and storing the first test data and the ID in correspondence, it is beneficial for the production end to analyze the defective products, and by storing the analysis results and the corresponding abnormal data in the defective product database, it is convenient for subsequent tracing and rapid analysis of the abnormal causes of other defective products. BRIEF DESCRIPTION OF THE DRAWINGS

[0051] In order to more clearly illustrate the scheme in the present application, a brief introduction is given below to the drawings required for use in the description of the embodiments of the present application. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0052] Figure 1 It is a flow chart of an embodiment of a method for handling abnormality of defective AMOLED display modules of the present application;

[0053] Figure 2 yes Figure 1 A flowchart of a specific implementation of S100;

[0054] Figure 3 yes Figure 2 A flowchart of a specific implementation method after S130;

[0055] Figure 4 yes Figure 3 A flowchart of a specific implementation of S150;

[0056] Figure 5 yes Figure 4 A flowchart of a specific implementation of S152;

[0057] Figure 6 is a flowchart of another embodiment of a method for handling abnormality of an AMOLED display module defective product of the present application;

[0058] Figure 7 It is a comparison chart of each data bit and hexadecimal number of the ID sequence in this application;

[0059] Figure 8 It is a structural schematic diagram of an AMOLED display module defective product abnormality processing system in this application;

[0060] Fig. 9 yes Figure 8 A first structural diagram of a production end device in;

[0061] Fig.10 yes Figure 8 A second structural schematic diagram of the production-end equipment in FIG. DETAILED DESCRIPTION

[0062] The following will be combined with the accompanying drawings in the invention to clearly and completely describe the technical solutions in the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments in the present invention, other embodiments obtained by ordinary technicians in this field without creative work are all within the scope of protection of the present invention.

[0063] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0064] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used in the specification of the application are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

[0065] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of this application, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0066] In the prior art, when the client analyzes the abnormal causes of defective AMOLED display module 630 products, it compares them with the corresponding big data. However, due to the large data range of the big data, it is impossible to accurately find the abnormal causes.

[0067] In view of the above problems, a method and system for handling abnormalities of defective AMOLED display module 630 are proposed.

[0068] In a first aspect, a method for handling abnormalities of defective AMOLED display modules 630 is provided, such as Figure 1 , Figure 1 This is a flow chart of an embodiment of a method for handling defective AMOLED display module 630 of the present application; it includes:

[0069] S100, performing a first test on the AMOLED display module 630 at the production end to obtain first test data of the AMOLED display module 630, where the first test data includes GAMMA curve data, CIE brightness data, and power consumption data.

[0070] In a preferred embodiment, Figure 2 , Figure 2 yes Figure 1 A flowchart of a specific implementation of S100; S100 includes:

[0071] S110, using the host computer 611 to generate a unique ID corresponding to the AMOLED display module 630, and transmit the ID to the first test device 612 at the production end, the driver mainboard 6121 in the first test device 612 burns the ID into the AMOLED display module 630; S120, the driver mainboard 6121 in the first test device 612 drives the AMOLED display module 630 corresponding to the ID to display a test screen; S130, the test unit 6122 of the first test device 612 detects the test screen and the power consumption of the AMOLED display module 630 to obtain the first test data.

[0072] In this embodiment, the host computer 611 generates an ID for each AMOLED display module 630 . The ID is a coding sequence consisting of a generation time, a generation material number, and a production line.

[0073] In this embodiment, the host computer 611 may be a central control center composed of a computer cluster, or may be a single computer.

[0074] like Figure 7 , Figure 7 This is a comparison chart of each data bit of the ID sequence in this application and the hexadecimal number. The production time includes year, month, and day. The year takes the last digit, and the month and day are represented by corresponding hexadecimal numbers in sequence. The production line type is also represented by corresponding hexadecimal data in sequence. The material number can be composed of a four-digit code and set after the ID.

[0075] From the above, we can see that the data sequence format structure of ID is shown in Table 1:

[0076] Table 1 ID data sequence format structure

[0077] First place Second Place Third Place Fourth Place Fifth to eighth place Production line Year moon day Material Number

[0078] In specific implementation, the ID consists of 8 hexadecimal digits, for example: the first digit is the production line, the second digit is the last digit of the year of production, the third digit is the month of production, the fourth digit is the date of production, and the fifth, sixth, seventh and eighth digits represent the sample number of production. For example, the second sample produced on June 25, 24, on the 8th line, then the ID is 846S0002.

[0079] The host computer 611 generates a corresponding unique ID number according to the ID requirement specification and gives it to the driver motherboard 6121, which then burns it into the AMOLED display module 630, such as the driver IC, to facilitate subsequent tracing.

[0080] The driver motherboard 6121 lights up the AMOLED display module 630, and burns the initialization code, GAMMA data, measured CIE brightness, power consumption and other related information into the designated first storage unit 631 (ROM). After the customer gets the sample, he can access this register to read out these data, and then he can know the GAMMA curve data, CIE brightness and power consumption corresponding to this display module 630.

[0081] In a preferred embodiment, after S130, as Figure 3 , Figure 3 yes Figure 2 A flowchart of a specific implementation after S130; S100 also includes: S140, the test unit 6122 transmits the first test data to the host computer 611 and the driver main board 6121; S150, the host computer 611 stores the first test data in the second storage unit 6111; S160, the driver main board 6121 burns the first test data into the first storage unit 631.

[0082] In a preferred embodiment, Figure 4 , Figure 4 yes Figure 3 A flowchart of a specific implementation of S150; S150 includes:

[0083] S151, the host computer 611 sets a corresponding storage partition in the second storage unit 6111 according to the ID; S152, the host computer 611 judges the first test data, and stores the first test data according to the judgment result.

[0084] In a preferred implementation, S152 includes: S1521. If all the first test data are normal, store all the first test data in a storage partition.

[0085] In a preferred embodiment, Figure 5 , Figure 5 yes Figure 4 A flowchart of a specific implementation of S152; after S1521, S152 also includes:

[0086] S1522. If the first test data is abnormal, set the first sub-storage partition and the second sub-storage partition in the storage partition according to the ID; S1523. Store the normal data and abnormal data in the first test data in the first sub-storage partition and the second sub-storage partition respectively.

[0087] S200 , burning the first test data into the first storage unit 631 of the AMOLED display module 630 , and storing the first test data in the second storage unit 6111 of the host computer 611 at the production end.

[0088] S300, performing a second test on the GAMMA curve, CIE brightness and power consumption of defective products in the AMOLED display module 630 at the client to obtain second test data;

[0089] S400: Compare and analyze the second test data with the first test data to obtain the abnormal reason of the defective product.

[0090] In a preferred embodiment, if Figure 6 , Figure 6 It is a flowchart of another embodiment of a method for handling abnormalities of defective AMOLED display module 630 of the present application; S500, at the production end, obtain the first test data in the second storage unit 6111; S600, analyze the abnormal data in the first test data of the defective product, and store the analysis results and the corresponding abnormal test data in the defective product database. By burning the first test data obtained by the test into the storage unit of the AMOLED display module 630 at the production end, when the AMOLED display module 630 is abnormal, the client can query and obtain the first test data and compare and analyze the second test data of the test, quickly and accurately find out the cause of the abnormality, by generating a unique ID corresponding to the AMOLED display module 630, and storing the first test data and the ID in correspondence, it is beneficial for the production end to analyze the defective products, and by storing the analysis results and the corresponding abnormal data in the defective product database, it is convenient for subsequent tracing and rapid analysis of the abnormal causes of other defective products.

[0091] In a second aspect, a system for handling abnormal defective AMOLED display module 630 adopts the method for handling abnormal defective AMOLED display module 630 of the first aspect, such as Figure 8 , Figure 8630 is a structural diagram of a defective product abnormality processing system of an AMOLED display module in the present application; it includes a client device 620 and a production end device 610; the production end device 610 is connected to the client device 620 in communication; Fig. 9 and Fig.10 , Fig. 9 yes Figure 8 A first structural diagram of the production end device 610 in FIG. Fig.10 yes Figure 8 A second structural diagram of the production end device 610 in FIG. The production end device 610 includes a host computer 611 and a first test device 612; the client device 620 includes a second test device 621; the first test device 612 is communicatively connected to the host computer 611; the host computer 611 is used to generate a unique ID corresponding to the AMOLED display module 630, and transmit the ID to the first test device 612 at the production end, and store the first test data in the second storage unit 6111; the first test device 612 is used to perform a first test on the AMOLED display module 630 at the production end, obtain the first test data of the AMOLED display module 630, and burn the first test data into the first storage unit 631 of the AMOLED display module 630; the second test device 621 is used to perform a second test on the GAMMA curve, CIE brightness and power consumption of defective products in the AMOLED display module 630 at the client, obtain the second test data, compare and analyze the second test data with the first test data, and obtain the abnormal cause of the defective product; wherein the first test data includes GAMMA curve data, CIE brightness data and power consumption data.

[0092] Furthermore, the first test device 612 includes a driving mainboard 6121 and a testing unit 6122; the driving mainboard 6121 is used to burn the ID into the AMOLED display module 630, and drive the AMOLED display module 630 corresponding to the ID to display a test screen; the testing unit 6122 is used to detect the displayed test screen and detect the power consumption of the AMOLED display module 630 to obtain the first test data.

[0093] Furthermore, the driving mainboard 6121 is further used to burn the first test data into the first storage unit 631 .

[0094] The AMOLED display module 630 defective product abnormality processing method and system of the present invention are implemented by burning the first test data obtained by the test into the storage unit of the AMOLED display module 630 at the production end. When the AMOLED display module 630 is abnormal, the first test data can be queried and compared with the second test data of the test on the client side to quickly and accurately find the cause of the abnormality. By generating a unique ID corresponding to the AMOLED display module 630 and storing the first test data and the ID in correspondence, it is beneficial for the production end to analyze the defective products. By storing the analysis results and the corresponding abnormal data in the defective product database, it is convenient for subsequent tracing and rapid analysis of the abnormal causes of other defective products.

[0095] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A method for handling abnormalities of defective AMOLED display modules, characterized in that it includes: Step 100: Perform a first test on the AMOLED display module at the production end to obtain first test data of the AMOLED display module, where the first test data includes GAMMA curve data, CIE brightness data, and power consumption data; Step 200: Burn the first test data into the first storage unit of the AMOLED display module, and store the first test data in the second storage unit of the host computer; Step 300: Perform a second test on the GAMMA curve, CIE brightness and power consumption of defective products in the AMOLED display module at the client to obtain second test data; Step 400: Compare and analyze the second test data with the first test data to obtain the abnormal reason of the defective product.

2. The method for handling defective AMOLED display modules according to claim 1, characterized in that: The AMOLED display module defective product abnormality processing method further includes: Step 500: At the production end, obtain the first test data in the second storage unit; Step 600: Analyze the abnormal data in the first test data of the defective product, and store the analysis result and the corresponding abnormal test data in the defective product database.

3. The method for handling defective AMOLED display modules according to claim 2, characterized in that: The step 100 comprises: Step 110: Generate a unique ID corresponding to the AMOLED display module using the host computer, and transmit the ID to the first test device at the production end, and the driver mainboard in the first test device burns the ID into the AMOLED display module; Step 120: The driving mainboard in the first test device drives and lights up the AMOLED display module corresponding to the ID so that it displays a test screen; Step 130: The test unit of the first test device detects the test screen and the power consumption of the AMOLED display module to obtain the first test data.

4. The method for handling defective AMOLED display modules according to claim 3, characterized in that: The step 100 further includes: Step 140: The test unit transmits the first test data to the host computer and the driver mainboard; Step 150: the host computer stores the first test data in a second storage unit; Step 160: The driver mainboard burns the first test data into the first storage unit.

5. The method for handling defective AMOLED display modules according to claim 4, characterized in that: The step 150 includes: Step 151, the host computer sets a corresponding storage partition in the second storage unit according to the ID; Step 152: The host computer judges the first test data and stores the first test data according to the judgment result.

6. The AMOLED display module defective product abnormality processing method according to claim 5, characterized in that: The step 152 includes: Step 1521: If all of the first test data are normal, store all of the first test data in the storage partition.

7. The method for handling defective AMOLED display modules according to claim 6, characterized in that: The step 152 further includes: Step 1522: If the first test data is abnormal, a first sub-storage partition and a second sub-storage partition are set in the storage partition according to the ID; Step 1523: Store the normal data and abnormal data in the first test data in the first sub-storage partition and the second sub-storage partition respectively.

8. A system for handling abnormalities of defective AMOLED display modules, using the method for handling abnormalities of defective AMOLED display modules according to any one of claims 1 to 7, characterized in that: include: Client devices; Production equipment; The production end device is communicatively connected with the client device; The production end equipment includes: Host computer; a first test device; The client device comprises: A second test device; The first testing device is communicatively connected with the host computer; The host computer is used to generate a unique ID corresponding to the AMOLED display module, transmit the ID to the first test device at the production end, and store the first test data in the second storage unit; The first testing device is used to perform a first test on the AMOLED display module at the production end, obtain first test data of the AMOLED display module, and burn the first test data into a first storage unit of the AMOLED display module; The second testing device is used to perform a second test on the GAMMA curve, CIE brightness and power consumption of defective products in the AMOLED display module at the client, obtain second test data, compare and analyze the second test data with the first test data, and obtain the abnormal cause of the defective product; The first test data includes GAMMA curve data, CIE brightness data and power consumption data.

9. The AMOLED display module defective product abnormality processing system according to claim 8, characterized in that: The first testing device comprises: Drive main board and test unit; The driving mainboard is used to burn the ID into the AMOLED display module, and drive the AMOLED display module corresponding to the ID to light up so that it displays a test screen; The testing unit is used to detect the displayed test picture and the power consumption of the AMOLED display module to obtain the first test data.

10. The AMOLED display module defective product abnormality processing system according to claim 9, characterized in that: The driving mainboard is further used to burn the first test data into the first storage unit.

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