Quantum field intensity measurement method and system regulated and controlled by offset electric field

By introducing an offset electric field into the Reedburg atom, enabling the energy level to move and form splitting, the problem of wideband continuous microwave electric field measurement in the prior art is solved, and the measurement efficiency and frequency response interval are improved.

CN119846317AActive Publication Date: 2025-04-18BEIJING INST OF RADIO METROLOGY & MEASUREMENT

Patent Information

Application Number
CN202411683590.2
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-11-22
Publication Date
2025-04-18
Estimated Expiration
2044-11-22

AI Technical Summary

Technical Problem

The prior art cannot realize broadband continuous microwave electric field measurement, and the laser wavelength adjustment process for preparing the Reedburg atomic level is cumbersome and takes too long, which affects the measurement efficiency.

Method used

By selecting the energy level of Reedburg atoms close to resonance, determining the coupled light wavelength, obtaining the energy level offset, and applying an offset electric field to move the energy level of Reedburg atoms, thereby realizing energy level splitting and frequency splitting, and measuring the electric field of the measured signal.

Benefits of technology

The measurement of continuous microwave frequency is realized, the efficiency of electric field measurement is improved, and the bandwidth of microwave frequency measurement is expanded.

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Abstract

The invention belongs to the technical field of radio frequency electromagnetic field measurement, and particularly discloses a quantum field intensity measurement method and system regulated and controlled by an offset electric field, and the method comprises the steps: selecting a Rydberg atomic energy level close to resonance according to the microwave frequency of a measured signal; according to the energy level of the Rydberg atom, determining the wavelength of coupled light and preparing the Rydberg atom, meanwhile, obtaining the difference value between the microwave frequency and the resonance transition frequency of the measured signal, and obtaining the energy level offset according to the difference value; acquiring the polarizability of the Rydberg atomic energy level, and acquiring a to-be-applied offset electric field value according to the energy level offset and the polarizability; according to the offset electric field value, an offset electric field is started, so that the related energy level of the Rydberg atoms moves in the offset electric field, when the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms energy level splitting and generates frequency splitting, and the frequency splitting is generated; and the electric field of the measured signal is measured according to the interval between the frequency splitting.
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Description

Technical Field

[0001] The present invention belongs to the technical field of radio frequency electromagnetic field measurement, and in particular relates to a quantum field strength measurement method and system controlled by an offset electric field. Background Art

[0002] Due to the discrete characteristics of Rydberg atoms in atomic energy levels, the electric field measurement based on the electromagnetically induced transparent spectrum splitting method of Rydberg atoms generally has a measurement bandwidth of no more than 50MHz. The measurement sensitivity of the electric field amplitude within the bandwidth varies greatly, and broadband continuous microwave electric field measurement cannot be achieved. When the microwave frequency is switched for electric field measurement each time, the energy level of another Rydberg atom needs to be prepared. Therefore, the wavelength of the laser used to prepare the Rydberg atom needs to be precisely adjusted. However, at present, whether it is the wavelength tuning of semiconductor lasers with mechanical cavity tuning or the wavelength tuning scheme of fiber lasers with temperature-tuned gratings, the wavelength adjustment process of the laser is cumbersome and time-consuming, and rapid wavelength adjustment is impossible. This affects the measurement efficiency of the electric field, especially for applications such as frequency modulation in communications, and limits the application and development of Rydberg electric field measurement. Summary of the invention

[0003] The present invention provides a quantum field intensity measurement method and system for offset electric field regulation, which are used to solve the problem that broadband continuous microwave electric field measurement cannot be achieved.

[0004] In a first aspect, a method for measuring quantum field strength regulated by an offset electric field is provided, the method comprising:

[0005] According to the microwave frequency of the measured signal, a Rydberg atomic energy level close to resonance is selected;

[0006] According to the Rydberg atom energy level, the coupling light wavelength is determined and the Rydberg atom is prepared, and at the same time, the difference between the microwave frequency and the resonant transition frequency of the measured signal is obtained, and the energy level offset is obtained according to the difference;

[0007] Obtaining the polarizability of the Rydberg atomic energy level, and obtaining the offset electric field value to be applied according to the energy level offset and the polarizability;

[0008] According to the offset electric field value, the offset electric field is turned on, so that the relevant energy levels of the Rydberg atoms move in the offset electric field. When the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms energy level splitting and frequency splitting, and the electric field of the measured signal is measured according to the interval between the frequency splittings.

[0009] In a second aspect, a quantum field strength measurement system for offset electric field regulation is provided, the system comprising:

[0010] A selection module, for selecting a Rydberg atomic energy level close to resonance according to the microwave frequency of the measured signal;

[0011] An energy level offset acquisition module is used to determine the coupling light wavelength and prepare Rydberg atoms according to the Rydberg atom energy level, and simultaneously obtain the difference between the microwave frequency and the resonance transition frequency of the measured signal, and obtain the energy level offset according to the difference;

[0012] An offset electric field value acquisition module is used to acquire the polarizability of the Rydberg atomic energy level, and acquire the offset electric field value to be applied according to the energy level offset and the polarizability;

[0013] The electric field value acquisition module of the measured signal is used to turn on the offset electric field according to the offset electric field value, so that the relevant energy levels of the Rydberg atoms move in the offset electric field. When the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms energy level splitting and generates frequency splitting, and the electric field of the measured signal is measured according to the interval between the frequency splitting.

[0014] An embodiment of the present invention provides a quantum field strength measurement method and system controlled by an offset electric field. By selecting the Rydberg energy level and calculating the energy level frequency shift with polarizability parameters, the Rydberg atomic energy level is moved by introducing an offset electric field, thereby enabling the resonant microwave frequency of the Rydberg atomic energy level transition to be expanded upward and downward. Then, the AT splitting spectrum is used to achieve the purpose of measuring continuous microwave frequencies.

[0015] Other features and advantages of the present invention will be described in the following description, and partly become apparent from the description, or be understood by practicing the present invention. The purpose and other advantages of the present invention can be realized and obtained by the structures particularly pointed out in the written description, claims, and drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0017] Figure 1 A schematic diagram of an implementation flow of a quantum field strength measurement method controlled by an offset electric field provided according to an embodiment of the present invention;

[0018] Figure 2 A schematic diagram of measuring microwave electric field by AT splitting produced by EIT spectrum according to an embodiment of the present invention;

[0019] Figure 3 A schematic diagram of the energy level interval reduction induced by an offset electric field according to an embodiment of the present invention;

[0020] Figure 4 A diagram of energy level changes after energy level shift occurs and microwaves act on the device according to an embodiment of the present invention;

[0021] Figure 5 A schematic diagram of the principle of increasing the energy level interval induced by an offset electric field according to an embodiment of the present invention;

[0022] Figure 6 A schematic diagram of microwave field measurement of a built-in electrode generating an offset electric field according to an embodiment of the present invention;

[0023] The reference numerals in the figure are: 1. external electrode wire, 2. built-in upper electrode, 3. reference detection laser, 4. Rydberg atomic detection laser, 5. atomic gas chamber, 6. coupling laser, 7. built-in lower electrode, 8. horn antenna. DETAILED DESCRIPTION

[0024] In order to make the purpose, technical solutions and advantages of this specification more clear, the technical solutions of this specification will be clearly and completely described below in combination with the specific embodiments of this specification and the corresponding drawings. Obviously, the described embodiments are only part of the embodiments of this specification, not all of the embodiments. Based on the embodiments in this specification, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this specification.

[0025] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, device, product or equipment that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or equipment.

[0026] The technical solutions provided by the embodiments of this specification are described in detail below in conjunction with the accompanying drawings.

[0027] In order to achieve the purpose of measuring the continuous microwave frequency of the measured signal, the embodiment of the present invention provides a quantum field strength measurement method and system controlled by an offset electric field.

[0028] Figure 1 A schematic diagram of the implementation process of a quantum field strength measurement method for offset electric field regulation according to an embodiment of the present invention, see Figure 1 , the method comprising:

[0029] S100: Select the Rydberg atomic energy level close to resonance according to the microwave frequency of the measured signal;

[0030] S102: According to the Rydberg atom energy level, determine the coupling light wavelength and prepare the Rydberg atom, and simultaneously obtain the difference between the microwave frequency and the resonance transition frequency of the measured signal, and obtain the energy level offset according to the difference;

[0031] S104: Obtaining the polarizability of the Rydberg atomic energy level, and obtaining the offset electric field value to be applied according to the energy level offset and the polarizability;

[0032] S106: According to the offset electric field value, the offset electric field is turned on, so that the relevant energy levels of the Rydberg atoms move in the offset electric field. When the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms energy level splitting and generates frequency splitting, and the electric field of the measured signal is measured according to the interval between the frequency splittings.

[0033] In a specific embodiment, selecting a Rydberg atomic energy level close to resonance according to the microwave frequency of the measured signal specifically includes:

[0034] If the microwave frequency range of the measured signal is within the first preset range, select nD 5 / 2 Energy Levels and (n+1)P 3 / 2 Energy levels as Rydberg atomic energy levels close to resonance;

[0035] If the microwave frequency range of the measured signal is within the second preset range, select nD 5 / 2 Energy Levels and (n+2)P 3 / 2 Energy levels as Rydberg atomic energy levels close to resonance;

[0036] The microwave frequency value of the measured signal corresponding to the first preset range is smaller than the microwave frequency value of the measured signal corresponding to the second preset range.

[0037] In specific implementation, the first preset range can be 3GHz-4.22GHz; the second preset range can be 40.13GHz-41GHz; the frequency value of the second preset range is large because the atomic energy level transition is from n—>(n+2), with (n+1) in between, so the energy difference of 40GHz is much larger than that of 4GHz.

[0038] In a specific embodiment, the method of determining the coupling light wavelength and preparing Rydberg atoms according to the Rydberg atom energy level, obtaining the difference between the microwave frequency and the resonant transition frequency of the measured signal, and obtaining the energy level offset according to the difference specifically includes:

[0039] According to the microwave frequency range of the measured signal, the corresponding D-state energy level and P-state energy level are selected as the Rydberg atomic energy level close to resonance, and according to the Rydberg atomic energy level, the coupling laser wavelength is adjusted to a preset value, and the difference Δ between the microwave frequency of the measured signal and the resonant transition frequency is obtained at the same time, and the energy level offset N is obtained according to the difference Δ according to the following formula shift :

[0040] N shift =hΔ;

[0041] In the formula, h is Planck's constant; the calculation formula for the difference Δ is Δ=Δ1+Δ2, where Δ1 is the change in energy level movement under an electric field when the Rydberg atomic energy level is in the corresponding D-state energy level, and Δ2 is the change in energy level movement under an electric field when the Rydberg atomic energy level is in the corresponding P-state energy level.

[0042] In a specific embodiment, the step of obtaining the polarizability of the Rydberg atomic energy level and obtaining the offset electric field value to be applied according to the energy level offset and the polarizability specifically includes:

[0043] The polarizabilities α1 and α2 of the Rydberg atomic energy levels corresponding to the D state energy level and the P state energy level are obtained respectively, and according to the energy level offset N shift and polarizabilities α1 and α2, the offset electric field value E to be applied is obtained according to the following formula: shift :

[0044]

[0045] In a specific implementation, the offset electric field is turned on according to the offset electric field value, so that the relevant energy levels of the Rydberg atoms move in the offset electric field, and when the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms energy level splitting and frequency splitting, and the electric field of the measured signal is measured according to the interval between the frequency splitting, which specifically includes:

[0046] According to the offset electric field value E shift , turn on the offset electric field, so that the relevant energy levels corresponding to the Rydberg atoms move in the offset electric field. In the Rydberg state, the atoms produce electromagnetically induced transparency effect to form EIT spectrum. When receiving a microwave electric field, and the microwave frequency resonates with the corresponding sub-energy interval of the D-state energy level and the P-state energy level, the EIT spectrum changes from a single peak to a double peak, and the interval between the two double peaks is Δf. According to the split frequency interval Δf, the electric field E of the measured signal is obtained according to the following formula: M :

[0047]

[0048] Where h is Planck's constant; is the electric dipole moment.

[0049] It should be noted that two-photon resonance is used to excite ground state atoms to prepare Rydberg states, such as Figure 2 As shown, 852nm laser is used as the probe light and 509nm is used as the coupling light. The probe light frequency resonates with the atomic 6S1 / 2-6P3 / 2, and the coupling light wavelength is tuned to near the 6P3 / 2-nD5 / 2 energy level. In the Rydberg state, the atom produces an electromagnetically induced transparency (EIT) effect (the EIT spectrum is the single-peak spectrum on the left side of the energy level in the figure). When receiving a microwave electric field, and the microwave frequency resonates with the nD5 / 2 and (n+1)P3 / 2 energy level intervals, the spectrum changes from a single peak to a double peak, as shown in FIG. Figure 2 The double peak signal shown in .

[0050] The present invention provides a quantum field strength measurement method controlled by an offset electric field. The method introduces a Rydberg atomic energy level offset electric field to move the atomic energy level, thereby changing the resonant microwave frequency of the Rydberg atomic energy level transition, thereby achieving the purpose of measuring continuous microwave frequencies. The increase or decrease of the measured microwave frequency is controlled by increasing or decreasing the intensity of the offset electric field, thereby achieving continuous measurement of microwave frequencies.

[0051] In order to better understand the present invention, the implementation process of the present invention is described below in conjunction with specific implementations.

[0052] Example

[0053] The present invention provides a method for measuring quantum field strength by offset electric field regulation. First, the Rydberg energy level range is roughly selected according to the microwave frequency to be measured. Figure 3 If the microwave frequency to be measured is 3GHz~4.22GHz, 55D can be selected 5 / 2 Energy Levels and 56P 3 / 2 energy level, and then adjust the coupling laser wavelength to 509.3102nm, and prepare the atoms at 55D 5 / 2 Rydberg levels. Simultaneous calculation of 55D 5 / 2 Energy Levels and 56P 3 / 2 Energy level atomic polarizability and energy level movement under electric field. Definition 55D 5 / 2 Energy Levels and 56P 3 / 2 The energy level shift changes under the electric field are Δ1 and Δ2 respectively. Under the action of the electric field, the EIT spectrum undergoes AT splitting. Based on the splitting frequency interval Δf, the electric field amplitude of the measured microwave can be calculated. in is the electric dipole moment.

[0054] It should be noted that the energy level splitting here corresponds to 55D 5 / 2 See also Figure 4 , under the offset electric field, with the contribution of scalar polarizability and tensor polarizability, the total polarizability can be expressed as:

[0055]

[0056] Among them, the scalar polarizability α S and the tensor polarizability α T The signs are opposite, and for 55D 5 / 2 ,|α S |<|α T |.

[0057] Therefore, under the offset electric field, the energy level 55D 5 / 2 Three sub-levels may appear, corresponding to mj = 0.5, mj = 1.5, and mj = 2.5, among which mj = 0.5, mj = 1.5, and mj = 2.5 move in opposite directions. The mj = 0.5 energy level has the largest movement change. Generally, the spectrum of mj = 0.5 can be selected to measure the microwave field intensity amplitude and calculate 55D 5 / 2 mj = 0.5 and (n + 1)P 3 / 2 Microwave transition dipole moment between mj=0.5 Then, the size of the microwave electric field can be calculated by using the measured spectrum splitting frequency interval Δf.

[0058] Similarly, when locking the coupled laser frequency to the moving 55D 5 / 2 After mj=0.5 energy level position, by applying Figure 5 After adding a microwave electric field with a frequency within 1 MHz of the microwave being measured, the superheterodyne method can also be used to measure the amplitude of the superheterodyne spectrum signal and then measure the microwave electric field.

[0059] Similarly, refer to the above method for measuring the electric field corresponding to the small frequency of the measured signal, see Figure 5 Represents the Rydberg level nD 5 / 2 and (n+2)P 3 / 2 The upper limit expansion scheme for the measured microwave frequency of 40.13 GHz is as follows: Rydberg level (n+2)P 3 / 2 In nD 5 / 2 Above the energy level, under the action of the offset electric field, the frequency interval between the two energy levels gradually increases.

[0060] The above only introduces P 3 / 2 Energy Level and nD 5 / 2 The relative energy level shift of the energy level, in addition to the F 7 / 2 Energy Level and nD 5 / 2 The situation of energy level is similar, and we can find 5 / 2 Energy levels above and below F7 / 2 State energy level, only need to calculate F 7 / 2 The polarizability of the energy level can accurately obtain the change in the relative energy level frequency interval, thereby expanding the microwave measurement bandwidth at different microwave frequencies and even realizing continuous frequency microwave measurement.

[0061] The offset electric field corresponds to the change in energy level movement. When the electric field is relatively weak, the frequency movement of each energy level is positively correlated with the square of the amplitude of the electric field.

[0062] according to Figure 6 In the scheme shown, parallel electrode plates are added inside the atomic gas chamber, and voltage is applied through an electric wire to form an offset electric field between the built-in upper electrode plate and the built-in lower electrode plate. The beam of the coupled laser that controls the detection light passes through the atomic gas chamber in the middle of the two electrodes. Since the atomic gas chamber is evenly filled with cesium atomic gas, when the wavelengths of the two laser beams are adjusted, Rydberg atoms can be prepared at the position where the laser beams pass through. By controlling the change in the wavelength of the coupled laser, different Rydberg energy levels can be prepared, and then a measurable microwave frequency point can be selected. At the same time, an offset electric field is applied to move the energy level of the prepared Rydberg atoms, thereby broadening the bandwidth of the microwave to be measured. Figure 6 In addition to the Rydberg atom detection laser and coupling laser that overlap and transmit in reverse, there is also a reference detection laser that passes through the atomic gas chamber. Together with the Rydberg atom detection laser, it is injected into the balanced photodetector after the atomic gas chamber for signal collection, and the atomic spectrum of microwave measurement can be obtained. The horn antenna is used to generate the microwave electric field to be measured. Injecting microwaves of a certain power and frequency can generate a microwave electric field of the corresponding frequency at the atomic gas chamber position.

[0063] Based on the same inventive concept, the present invention also provides a quantum field strength measurement system regulated by an offset electric field, the system comprising:

[0064] A selection module, for selecting a Rydberg atomic energy level close to resonance according to the microwave frequency of the measured signal;

[0065] An energy level offset acquisition module is used to determine the coupling light wavelength and prepare Rydberg atoms according to the Rydberg atom energy level, and simultaneously obtain the difference between the microwave frequency and the resonance transition frequency of the measured signal, and obtain the energy level offset according to the difference;

[0066] An offset electric field value acquisition module is used to acquire the polarizability of the Rydberg atomic energy level, and acquire the offset electric field value to be applied according to the energy level offset and the polarizability;

[0067] The electric field value acquisition module of the measured signal is used to turn on the offset electric field according to the offset electric field value, so that the relevant energy levels of the Rydberg atoms move in the offset electric field. When the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms energy level splitting and generates frequency splitting, and the electric field of the measured signal is measured according to the interval between the frequency splitting.

[0068] In a specific implementation, the selection module is specifically used to:

[0069] If the microwave frequency range of the measured signal is within the first preset range, select nD 5 / 2 Energy Levels and (n+1)P 3 / 2 Energy levels as Rydberg atomic energy levels close to resonance;

[0070] If the microwave frequency range of the measured signal is within the second preset range, select nD 5 / 2 Energy Levels and (n+2)P 3 / 2 Energy levels as Rydberg atomic energy levels close to resonance;

[0071] The microwave frequency value of the measured signal corresponding to the first preset range is smaller than the microwave frequency value of the measured signal corresponding to the second preset range.

[0072] In a specific implementation manner, the energy level offset acquisition module is specifically used to:

[0073] According to the microwave frequency range of the measured signal, the corresponding D-state energy level and P-state energy level are selected as the Rydberg atomic energy level close to resonance, and according to the Rydberg atomic energy level, the coupling laser wavelength is adjusted to a preset value, and the difference Δ between the microwave frequency of the measured signal and the resonant transition frequency is obtained at the same time, and the energy level offset N is obtained according to the difference Δ according to the following formula shift :

[0074] N shift =hΔ;

[0075] In the formula, h is Planck's constant; the calculation formula for the difference Δ is Δ=Δ1+Δ2, where Δ1 is the change in energy level movement under an electric field when the Rydberg atomic energy level is in the corresponding D-state energy level, and Δ2 is the change in energy level movement under an electric field when the Rydberg atomic energy level is in the corresponding P-state energy level.

[0076] In a specific implementation, the offset electric field value acquisition module is specifically used to:

[0077] The polarizabilities α1 and α2 of the Rydberg atomic energy levels corresponding to the D state energy level and the P state energy level are obtained respectively, and according to the energy level offset N shift and polarizabilities α1 and α2, the offset electric field value E to be applied is obtained according to the following formula:shift :

[0078]

[0079] In a specific implementation manner, the measured signal electric field value acquisition module is specifically used to:

[0080] According to the offset electric field value E shift , turn on the offset electric field, so that the relevant energy levels corresponding to the Rydberg atoms move in the offset electric field. In the Rydberg state, the atoms produce electromagnetically induced transparency effect to form EIT spectrum. When receiving a microwave electric field, and the microwave frequency resonates with the corresponding sub-energy interval of the D-state energy level and the P-state energy level, the EIT spectrum changes from a single peak to a double peak, and the interval between the two double peaks is Δf. According to the split frequency interval Δf, the electric field E of the measured signal is obtained according to the following formula: M :

[0081]

[0082] Where h is Planck's constant; is the electric dipole moment.

[0083] The present invention provides a quantum field strength measurement system controlled by an offset electric field. The system utilizes the energy level offset effect of Rydberg atoms under the action of an electrostatic field or a low-frequency electric field to achieve wide-bandwidth frequency measurement of microwave electric fields and increase the frequency response range of the Rydberg atoms and microwaves. Based on the scheme, the energy level offset of the Rydberg atoms can be quantitatively and accurately controlled. The energy level of the Rydberg atoms actively matches the frequency of the microwave being measured, so that the frequency difference between the microwave frequency and the atomic energy level after the shift satisfies the resonance condition. The dipole resonance transition is used to generate EIT-AT splitting to measure the electric field strength of microwaves of other frequencies.

[0084] Although the preferred embodiments of the present invention have been described, those skilled in the art may make additional changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications that fall within the scope of the present invention.

[0085] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

Claims

1. A method for measuring quantum field strength by offset electric field regulation, characterized in that: The method comprises: According to the microwave frequency of the measured signal, a Rydberg atomic energy level close to resonance is selected; According to the Rydberg atom energy level, the coupling light wavelength is determined and the Rydberg atom is prepared, and at the same time, the difference between the microwave frequency and the resonant transition frequency of the measured signal is obtained, and the energy level offset is obtained according to the difference; Obtaining the polarizability of the Rydberg atomic energy level, and obtaining the offset electric field value to be applied according to the energy level offset and the polarizability; According to the offset electric field value, the offset electric field is turned on, so that the relevant energy levels of the Rydberg atoms move in the offset electric field. When the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms energy level splitting and frequency splitting, and the electric field of the measured signal is measured according to the interval between the frequency splittings.

2. The method according to claim 1, characterized in that The step of selecting a Rydberg atomic energy level close to resonance according to the microwave frequency of the measured signal specifically includes: If the microwave frequency range of the measured signal is within the first preset range, select nD 5 / 2 Energy Levels and (n+1)P 3 / 2 Energy levels as Rydberg atomic energy levels close to resonance; If the microwave frequency range of the measured signal is within the second preset range, select nD 5 / 2 Energy Levels and (n+2)P 3 / 2 Energy levels as Rydberg atomic energy levels close to resonance; The microwave frequency value of the measured signal corresponding to the first preset range is smaller than the microwave frequency value of the measured signal corresponding to the second preset range.

3. The method according to claim 2, characterized in that The step of determining the coupling light wavelength and preparing Rydberg atoms according to the Rydberg atomic energy level, obtaining the difference between the microwave frequency and the resonant transition frequency of the measured signal, and obtaining the energy level offset according to the difference specifically includes: According to the microwave frequency range of the measured signal, the corresponding D-state energy level and P-state energy level are selected as the Rydberg atomic energy level close to resonance, and according to the Rydberg atomic energy level, the coupling laser wavelength is adjusted to a preset value, and the difference Δ between the microwave frequency of the measured signal and the resonant transition frequency is obtained at the same time, and the energy level offset N is obtained according to the difference Δ according to the following formula shift : N shift =hΔ; In the formula, h is Planck's constant; the calculation formula for the difference Δ is Δ=Δ1+Δ2, where Δ1 is the change in energy level movement under an electric field when the Rydberg atomic energy level is in the corresponding D-state energy level, and Δ2 is the change in energy level movement under an electric field when the Rydberg atomic energy level is in the corresponding P-state energy level.

4. The method according to claim 3, characterized in that: The step of obtaining the polarizability of the Rydberg atomic energy level and obtaining the offset electric field value to be applied according to the energy level offset and the polarizability specifically includes: The polarizabilities α1 and α2 of the Rydberg atomic energy levels corresponding to the D state energy level and the P state energy level are obtained respectively, and according to the energy level offset N shift and polarizabilities α1 and α2, the offset electric field value E to be applied is obtained according to the following formula: shift :

5. The method according to claim 4, characterized in that According to the offset electric field value, the offset electric field is turned on, so that the relevant energy levels of the Rydberg atoms move in the offset electric field, and when the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms energy level splitting and frequency splitting, and the electric field of the measured signal is measured according to the interval between the frequency splitting, specifically including: According to the offset electric field value E shift , turn on the offset electric field, so that the relevant energy levels corresponding to the Rydberg atoms move in the offset electric field. In the Rydberg state, the atoms produce electromagnetically induced transparency effect to form EIT spectrum. When receiving a microwave electric field, and the microwave frequency resonates with the corresponding sub-energy interval of the D-state energy level and the P-state energy level, the EIT spectrum changes from a single peak to a double peak, and the interval between the two double peaks is Δf. According to the split frequency interval Δf, the electric field E of the measured signal is obtained according to the following formula: M : Where h is Planck's constant; is the electric dipole moment.

6. A quantum field strength measurement system controlled by an offset electric field, characterized in that: The method for measuring quantum field strength by offset electric field control according to any one of claims 1 to 5 is adopted, wherein the system comprises: A selection module, for selecting a Rydberg atomic energy level close to resonance according to the microwave frequency of the measured signal; An energy level offset acquisition module is used to determine the coupling light wavelength and prepare Rydberg atoms according to the Rydberg atom energy level, and simultaneously obtain the difference between the microwave frequency and the resonance transition frequency of the measured signal, and obtain the energy level offset according to the difference; An offset electric field value acquisition module is used to acquire the polarizability of the Rydberg atomic energy level, and acquire the offset electric field value to be applied according to the energy level offset and the polarizability; The electric field value acquisition module of the measured signal is used to turn on the offset electric field according to the offset electric field value, so that the relevant energy levels of the Rydberg atoms move in the offset electric field. When the energy difference between the offset Rydberg energy level and the adjacent energy level resonates with the microwave frequency of the measured signal, the offset sub-energy level forms energy level splitting and generates frequency splitting, and the electric field of the measured signal is measured according to the interval between the frequency splitting.

7. The system according to claim 6, characterized in that The selection module is specifically used for: If the microwave frequency range of the measured signal is within the first preset range, select nD 5 / 2 Energy Levels and (n+1)P 3 / 2 Energy levels as Rydberg atomic energy levels close to resonance; If the microwave frequency range of the measured signal is within the second preset range, select nD 5 / 2 Energy Levels and (n+2)P 3 / 2 Energy levels as Rydberg atomic energy levels close to resonance; The microwave frequency value of the measured signal corresponding to the first preset range is smaller than the microwave frequency value of the measured signal corresponding to the second preset range.

8. The system according to claim 7, characterized in that The energy level offset acquisition module is specifically used for: According to the microwave frequency range of the measured signal, the corresponding D-state energy level and P-state energy level are selected as the Rydberg atomic energy level close to resonance, and according to the Rydberg atomic energy level, the coupling laser wavelength is adjusted to a preset value, and the difference Δ between the microwave frequency of the measured signal and the resonant transition frequency is obtained at the same time, and the energy level offset N is obtained according to the difference Δ according to the following formula shift : N shift =hΔ; In the formula, h is Planck's constant; the calculation formula for the difference Δ is Δ=Δ1+Δ2, where Δ1 is the change in energy level movement under an electric field when the Rydberg atomic energy level is in the corresponding D-state energy level, and Δ2 is the change in energy level movement under an electric field when the Rydberg atomic energy level is in the corresponding P-state energy level.

9. The system according to claim 8, characterized in that The offset electric field value acquisition module is specifically used for: The polarizabilities α1 and α2 of the Rydberg atomic energy levels corresponding to the D state energy level and the P state energy level are obtained respectively, and according to the energy level offset N shift and polarizabilities α1 and α2, the offset electric field value E to be applied is obtained according to the following formula: shift :

10. The system according to claim 9, characterized in that The measured signal electric field value acquisition module is specifically used for: According to the offset electric field value E shift , turn on the offset electric field, so that the relevant energy levels corresponding to the Rydberg atoms move in the offset electric field. In the Rydberg state, the atoms produce electromagnetically induced transparency effect to form EIT spectrum. When receiving a microwave electric field, and the microwave frequency resonates with the corresponding sub-energy interval of the D-state energy level and the P-state energy level, the EIT spectrum changes from a single peak to a double peak, and the interval between the two double peaks is Δf. According to the split frequency interval Δf, the electric field E of the measured signal is obtained according to the following formula: M : Where h is Planck's constant; is the electric dipole moment.

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