Signal quality detection method and device, electronic equipment and storage medium

Abstract

The invention provides a signal quality detection method. A to-be-detected eye pattern is formed based on eye pattern original data under the same temperature and voltage; the target indexes comprise at least one of a center point centering index, an eye diagram boundary index, an eye diagram area index and an eye diagram shape balance index; the eye diagram boundary index comprises an initial center point of a to-be-detected eye diagram and a minimum read-write frame drawn based on the initial center point; the target indexes comprise at least one of a center point centering index, an eye diagram boundary index, an eye diagram area index and an eye diagram shape balance index; and determining a target evaluation value corresponding to the target temperature and the target voltage according to the offset of the initialization center point and the collapse range of the eye diagram under the condition that the at least one target index is determined to accord with the respective corresponding condition threshold value. Through evaluation of the center point centering index, the eye pattern boundary index, the eye pattern area index and the eye pattern shape balance index, deviation introduced by subjective judgment during manual analysis is reduced, in addition, the corresponding relation between the temperature voltage and the evaluation value is calculated, measurement is replaced by calculation, and the detection period of the signal quality is shortened.

Description

Technical Field

[0001] The present disclosure relates to the field of data processing, and in particular, to a method, apparatus, electronic device, and storage medium for detecting signal quality. Background Art

[0002] The vast majority of high-speed storage devices are devices that combine digital and analog circuits, and it is necessary to ensure the stability of the memory during use. The quality of the signal is an important factor affecting stability. With the increasing market demand for high-bandwidth and low-latency memory, as well as the update and iteration of memory particles, the data transmission rate is required to be continuously improved, resulting in increasingly serious signal quality problems.

[0003] Currently, the way to determine whether the system signal quality meets the standard is to determine whether there are problems caused by signal quality problems through batch single-board stress testing. In addition, a digital eye diagram is also used as an auxiliary means for locating problems. Although the above method can detect signal quality problems, it is limited by the scale of the test object and the test duration during single-board stress testing; in addition, using a digital eye diagram as a problem-locating means, but the locating means is mainly manual analysis, there are certain errors. Summary of the Invention

[0004] The present disclosure provides a method, apparatus, electronic device, and storage medium for detecting signal quality to solve the problems in the related art. By evaluating the center point centering index, eye diagram boundary index, eye diagram area index, and eye diagram shape balance index, the deviation introduced by subjective judgment during manual analysis is reduced. In addition, the corresponding relationship between the temperature voltage and the evaluation value is calculated to replace the test with calculation, shortening the detection period of signal quality.

[0005] The first aspect embodiment of the present disclosure provides a method for detecting signal quality, the method comprising:

[0006] Forming a to-be-detected eye diagram based on the eye diagram raw data under the same temperature voltage, where the to-be-detected eye diagram includes an eye diagram boundary, an initial center point of the to-be-detected eye diagram, and a minimum read / write frame drawn based on the initial center point;

[0007] Calculating a target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point, where the target index includes at least one of a center point centering index, an eye diagram boundary index, an eye diagram area index, and an eye diagram shape balance index;

[0008] When it is determined that at least one target index meets its respective conditional threshold, determining a target evaluation value corresponding to the target temperature and target voltage according to the offset of the initialization center point and the eye diagram collapse range.

[0009] In some embodiments, determining the target evaluation value corresponding to the target temperature and target voltage according to the offset of the initialization center point and the eye diagram collapse range includes:

[0010] Determining whether the initialization center point corresponding to the target voltage and target temperature meets the read / write condition;

[0011] Determining whether the eye diagram collapse range of the eye diagram area corresponding to the target voltage and target temperature is less than the collapse threshold;

[0012] When it is determined that the initialization center point meets the read / write condition and the eye diagram collapse range is less than the collapse threshold, determine the target evaluation value corresponding to the target temperature and target voltage according to the offset of the initialization center point and the eye diagram collapse range.

[0013] In some embodiments, determining whether the initialization center point corresponding to the target voltage and target temperature meets the read / write condition includes:

[0014] Under different voltage and temperature conditions, generating a first correspondence between the minimum delay granularity of the signal line for generating the eye diagram raw data and voltage and temperature respectively;

[0015] Calculating the offset of the initialization center point based on the first correspondence;

[0016] According to the comparison result between the target center point offset and the offset threshold, determine whether the initialization center point meets the read / write condition, where the offset threshold is the product of the horizontal direction mean of the eye diagram boundary and the threshold coefficient.

[0017] In some embodiments, generating the first correspondence between the minimum delay granularity of the signal line for generating the eye diagram raw data and voltage and temperature respectively under different voltage and temperature conditions includes:

[0018] Under different voltage and temperature conditions, generating a first correspondence curve between the minimum delay granularity and temperature, and a second correspondence curve between the minimum delay granularity and the voltage;

[0019] According to the first equation corresponding to the first correspondence curve and the second equation of the second correspondence curve, determine the first correspondence between the minimum delay granularity and voltage and / or temperature;

[0020] Based on the first correspondence, calculate the target center point offset corresponding to the target voltage and target temperature;

[0021] Determining whether the initialization center point meets the read / write condition according to the comparison result between the target center point offset and the offset threshold includes:

[0022] When it is determined that the offset of the target center point is less than or equal to the product of the horizontal direction mean value of the eye diagram boundary and the threshold coefficient, it is determined that the initialized center point corresponding to the target voltage and the target temperature meets the read / write condition.

[0023] In some embodiments, the determining the target evaluation value corresponding to the target temperature and the target voltage according to the offset of the initialized center point and the eye diagram collapse range includes:

[0024] Performing weighted calculation according to the weights corresponding to the offset of the initialized center point and the average eye diagram collapse amount respectively, to obtain the target evaluation value corresponding to the target temperature and the voltage.

[0025] In some embodiments, the eye diagram boundary includes the maximum eye diagram boundary and the minimum eye diagram boundary of the eye diagram to be detected. When the target index is the center point centering index, the calculating the target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point includes:

[0026] Calculating a horizontal percentage according to the horizontal center point of the minimum eye diagram boundary, the horizontal center point of the initial center point, and the horizontal eye width of the minimum eye diagram;

[0027] Calculating a vertical percentage according to the vertical center point of the minimum eye diagram boundary, the vertical center point of the initial center point, and the vertical eye width of the minimum eye diagram;

[0028] Calculating a horizontal threshold percentage according to the horizontal width of the minimum read / write frame and the horizontal eye width of the minimum eye diagram;

[0029] Calculating a vertical threshold percentage according to the vertical height of the minimum read / write frame and the vertical eye width of the minimum eye diagram;

[0030] Calculating the center point centering index according to the horizontal percentage, the vertical percentage, the horizontal threshold percentage, and the vertical threshold percentage.

[0031] In some embodiments, when the target index is the eye diagram boundary index, the calculating the target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point includes:

[0032] Respectively obtaining the vertical direction distance and the horizontal direction distance between the minimum read / write frame and the minimum eye diagram boundary;

[0033] Calculating a vertical direction mean value based on the vertical direction distance, and calculating a horizontal direction mean value based on the horizontal direction distance;

[0034] Calculate the eye diagram boundary index based on the vertical direction mean, a preset vertical direction threshold, the horizontal direction mean, and a preset horizontal direction threshold.

[0035] In some embodiments, when the target metric is the eye diagram area index, the calculating the target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point includes:

[0036] Calculate the minimum eye diagram area corresponding to the minimum eye diagram boundary and the minimum read / write frame area of the minimum read / write frame.

[0037] Calculate the eye diagram area of the meta-region in the eye diagram to be detected, where the meta-region is the intermediate region between the maximum eye diagram boundary and the minimum eye diagram boundary.

[0038] Calculate the eye diagram area index based on the minimum eye diagram area, the minimum read / write frame area, and the eye diagram area of the meta-region.

[0039] In some embodiments, when the target metric is the eye diagram shape balance index, the calculating the target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point includes:

[0040] Perform a fitting process on the maximum eye diagram boundary and the minimum eye diagram boundary of the eye diagram to be detected.

[0041] Determine the eye diagram shape balance index according to the fitting result of the fitting process.

[0042] An embodiment of the second aspect of the present disclosure provides a signal quality detection device, including:

[0043] A generating unit, configured to form an eye diagram to be detected based on eye diagram raw data under the same temperature and voltage, where the eye diagram to be detected includes an eye diagram boundary, an initial center point of the eye diagram to be detected, and a minimum read / write frame drawn based on the initial center point.

[0044] A calculating unit, configured to calculate a target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point, where the target metrics include at least one of a center point centering index, an eye diagram boundary index, an eye diagram area index, and an eye diagram shape balance index.

[0045] A detecting unit, configured to determine a target evaluation value corresponding to a target temperature and a target voltage according to the offset of the initialized center point and the eye diagram collapse range when it is determined that at least one target index meets its respective condition threshold.

[0046] In some embodiments, the detecting unit includes:

[0047] A first determination module, configured to determine whether the initialization center point corresponding to the target voltage and the target temperature meets the read / write condition;

[0048] A second determination module, configured to determine whether the eye diagram collapse range of the eye diagram area corresponding to the target voltage and the target temperature is less than a collapse threshold;

[0049] A detection module, configured to, when it is determined that the initialization center point meets the read / write condition and the eye diagram collapse range is less than the collapse threshold, determine a target evaluation value corresponding to the target temperature and the target voltage according to the offset of the initialization center point and the eye diagram collapse range.

[0050] In some embodiments, the first determination module includes:

[0051] A generation sub-module, configured to generate a first correspondence between the minimum delay granularity of the signal line of the original eye diagram data and the voltage and temperature respectively under different voltage and temperature conditions;

[0052] A calculation sub-module, configured to calculate the offset of the initialization center point based on the first correspondence;

[0053] A determination sub-module, configured to determine whether the initialization center point meets the read / write condition according to the comparison result between the target center point offset and an offset threshold, where the offset threshold is the product of the horizontal direction mean value of the eye diagram boundary and a threshold coefficient.

[0054] In some embodiments, the generation sub-module is further configured to:

[0055] Generate a first correspondence curve between the minimum delay granularity and the temperature, and a second correspondence curve between the minimum delay granularity and the voltage under different voltage and temperature conditions;

[0056] Determine a first correspondence between the minimum delay granularity and the voltage and / or temperature according to a first equation corresponding to the first correspondence curve and a second equation of the second correspondence curve;

[0057] Calculate a target center point offset corresponding to the target voltage and the target temperature based on the first correspondence;

[0058] The determination sub-module is further configured to determine that the initialization center point corresponding to the target voltage and the target temperature meets the read / write condition when it is determined that the target center point offset is less than or equal to the product result of the horizontal direction mean value of the eye diagram boundary and the threshold coefficient.

[0059] In some embodiments, the detection unit is further configured to:

[0060] Perform weighted calculation based on the weights corresponding to the offset of the initialized center point and the average eye diagram collapse amount to obtain the target evaluation value corresponding to the target temperature voltage.

[0061] In some embodiments, the eye diagram boundary includes the maximum eye diagram boundary and the minimum eye diagram boundary of the eye diagram to be detected. When the target index is the center point centering index, the calculation unit is further configured to:

[0062] Calculate a horizontal percentage based on the horizontal center point of the minimum eye diagram boundary, the horizontal center point of the initial center point, and the horizontal eye width of the minimum eye diagram;

[0063] Calculate a vertical percentage based on the vertical center point of the minimum eye diagram boundary, the vertical center point of the initial center point, and the vertical eye width of the minimum eye diagram;

[0064] Calculate a horizontal threshold percentage based on the minimum read / write frame horizontal width and the horizontal eye width of the minimum eye diagram;

[0065] Calculate a vertical threshold percentage based on the minimum read / write frame vertical height and the vertical eye width of the minimum eye diagram;

[0066] Calculate the center point centering index based on the horizontal percentage, the vertical percentage, the horizontal threshold percentage, and the vertical threshold percentage.

[0067] In some embodiments, when the target index is the eye diagram boundary index, the calculation unit is further configured to:

[0068] Obtain the vertical distance and the horizontal distance between the minimum read / write frame and the minimum eye diagram boundary respectively;

[0069] Calculate a vertical direction mean based on the vertical distance and calculate a horizontal direction mean based on the horizontal distance;

[0070] Calculate the eye diagram boundary index based on the vertical direction mean, a preset vertical direction threshold, the horizontal direction mean, and a preset horizontal direction threshold.

[0071] In some embodiments, when the target index is the eye diagram area index, the calculation unit is further configured to:

[0072] Calculate the minimum eye diagram area corresponding to the minimum eye diagram boundary and the minimum read / write frame area of the minimum read / write frame;

[0073] Calculate the eye diagram area of the meta-region in the eye diagram to be detected, where the meta-region is the intermediate region between the maximum eye diagram boundary and the minimum eye diagram boundary;

[0074] The eye diagram area index is calculated based on the minimum eye diagram area, the minimum read / write frame area, and the eye diagram area of the meta-region.

[0075] In some embodiments, when the target metric is the eye diagram shape balance index, the calculation unit is further configured to include:

[0076] Perform a fitting process on the maximum eye diagram boundary and the minimum eye diagram boundary of the eye diagram to be detected;

[0077] Determine the eye diagram shape balance index according to the fitting result of the fitting process.

[0078] An embodiment of the third aspect of the present disclosure provides an electronic device, including: at least one processor; and a memory communicatively connected to the at least one processor; wherein, the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the method described in the embodiment of the first aspect of the present disclosure.

[0079] An embodiment of the fourth aspect of the present disclosure provides a non-transitory computer-readable storage medium storing computer instructions, wherein the computer instructions are used to cause a computer to execute the method described in the embodiment of the first aspect of the present disclosure.

[0080] In summary, a to-be-detected eye diagram is formed based on the original eye diagram data under the same temperature and voltage. The to-be-detected eye diagram includes an eye diagram boundary, an initial center point of the to-be-detected eye diagram, and a minimum read / write frame drawn based on the initial center point; a target index is calculated based on the eye diagram boundary, the minimum read / write frame, and the initial center point, and the target metrics include at least one of a center point centering index, an eye diagram boundary index, an eye diagram area index, and an eye diagram shape balance index; when it is determined that at least one target index meets its corresponding condition threshold, a target evaluation value corresponding to the target temperature and target voltage is determined according to the offset of the initialization center point and the eye diagram collapse range. By evaluating the center point centering index, the eye diagram boundary index, the eye diagram area index, and the eye diagram shape balance index, the deviation introduced by subjective judgment during manual analysis is reduced. In addition, the corresponding relationship between the temperature and voltage and the evaluation value is calculated, replacing measurement with calculation, and shortening the detection cycle of signal quality.

[0081] It should be understood that the above general description and the following detailed description are only exemplary and explanatory, and cannot limit the present disclosure. BRIEF DESCRIPTION OF THE DRAWINGS

[0082] The accompanying drawings herein are incorporated into the specification and constitute a part of this specification, showing embodiments consistent with the present disclosure, and are used together with the specification to explain the principles of the present disclosure and do not constitute an improper limitation of the present disclosure.

[0083] Figure 1 Flow chart of a method for detecting signal quality provided by an embodiment of the present disclosure;

[0084] Figure 2 Schematic diagram of an eye diagram to be detected provided by an embodiment of the present disclosure;

[0085] Figure 3 Flow chart of a method for detecting signal quality provided by an embodiment of the present disclosure;

[0086] Figure 4 Flow chart of a method for detecting signal quality provided by an embodiment of the present disclosure;

[0087] Figure 5 Flow chart of a method for detecting signal quality provided by an embodiment of the present disclosure;

[0088] Figure 6 Schematic diagram of an eye diagram to be detected provided by an embodiment of the present disclosure;

[0089] Figure 7 Flow chart of a method for detecting signal quality provided by an embodiment of the present disclosure;

[0090] Figure 8 Flow chart of a device for detecting signal quality provided by an embodiment of the present disclosure;

[0091] Figure 9 Schematic structural diagram of a device for detecting signal quality provided by an embodiment of the present disclosure;

[0092] Figure 10 Schematic structural diagram of an electronic device provided by an embodiment of the present disclosure. Detailed implementation manners

[0093] The embodiments of the present disclosure will be described in detail below. The examples of the embodiments are shown in the accompanying drawings, where the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions from beginning to end. The embodiments described below by referring to the accompanying drawings are exemplary and are intended to explain the present disclosure, but should not be construed as limiting the present disclosure.

[0094] The vast majority of high-speed storage devices are devices that combine digital and analog circuits, and it is necessary to ensure the stability of the memory during use. The quality of the signal is an important factor affecting stability. With the increasing market demand for high-bandwidth and low-latency memory, as well as the update and iteration of memory particles, the requirement for the data transmission rate is continuously increasing, resulting in more serious signal quality problems.

[0095] Currently, the way to determine whether the system signal quality meets the standard is to conduct batch board stress tests to identify whether there are problems caused by signal quality issues. In addition, a digital eye diagram is also used as an auxiliary means for problem localization. Although the above methods can detect signal quality problems, the board stress tests are limited by the scale of the test objects and the test duration; in addition, using the digital eye diagram as a problem localization means, the localization method mainly relies on manual analysis, which has certain errors.

[0096] Therefore, to solve the problems existing in the related art, the present disclosure proposes a method for detecting signal quality. An eye diagram to be detected is formed based on the original eye diagram data under the same temperature and voltage. The eye diagram to be detected includes an eye diagram boundary, an initial center point of the eye diagram to be detected, and a minimum read / write frame drawn based on the initial center point; a target index is calculated based on the eye diagram boundary, the minimum read / write frame, and the initial center point. The target index includes at least one of a center point centering index, an eye diagram boundary index, an eye diagram area index, and an eye diagram shape balance index; when it is determined that at least one target index meets its corresponding condition threshold, a target evaluation value corresponding to the target temperature and target voltage is determined according to the offset of the initialized center point and the eye diagram collapse range.

[0097] This solution reduces the deviation introduced by subjective judgment during manual analysis through the evaluation of the center point centering index, the eye diagram boundary index, the eye diagram area index, and the eye diagram shape balance index. In addition, the corresponding relationship between the temperature and voltage and the evaluation value is calculated, replacing measurement with calculation, and shortening the detection cycle of signal quality.

[0098] The embodiments of the present disclosure are not exhaustive, but only schematic of some embodiments, and do not constitute a specific limitation on the protection scope of the present disclosure. Without contradiction, each step in a certain embodiment can be implemented as an independent embodiment, and the steps can be combined arbitrarily. For example, the solution after removing some steps in a certain embodiment can also be implemented as an independent embodiment, and the order of the steps in a certain embodiment can be arbitrarily exchanged. In addition, the optional implementation methods in a certain embodiment can be combined arbitrarily; furthermore, the embodiments can be combined arbitrarily. For example, some or all steps of different embodiments can be combined arbitrarily, and a certain embodiment can be combined arbitrarily with the optional implementation methods of other embodiments.

[0099] In each embodiment of the present disclosure, if there is no special description and logical conflict, the terms and / or descriptions between the embodiments are consistent and can be referenced to each other. The technical features in different embodiments can be combined to form new embodiments according to their internal logical relationships.

[0100] The terms used in the embodiments of the present disclosure are only for the purpose of describing specific embodiments, and are not intended to limit the present disclosure.

[0101] In the embodiments of the present disclosure, unless otherwise specified, elements expressed in the singular form, such as "a", "an", "the", "above-mentioned", "said", "aforementioned", "this", etc., may mean "one and only one", or may also mean "one or more", "at least one", etc. For example, when using articles such as "a", "an", "the" in English translation, the noun after the article can be understood as a singular expression or a plural expression.

[0102] In some embodiments, terms such as "in response to...", "in response to determining...", "in the case of...", "when...", "while...", "if...", etc. may be interchangeable.

[0103] In some embodiments, terms such as "greater than", "greater than or equal to", "not less than", "more than", "more than or equal to", "not less than", "higher than", "higher than or equal to", "not lower than", "above", etc. may be interchangeable, and terms such as "less than", "less than or equal to", "not greater than", "less than", "less than or equal to", "not more than", "lower than", "lower than or equal to", "not higher than", "below", etc. may be interchangeable.

[0104] Prefix words such as "first", "second", etc. in the embodiments of the present disclosure are only used to distinguish different described objects, and do not limit the position, order, priority, quantity, content, etc. of the described objects. The description of the described objects refers to the description in the claims or the context of the embodiments, and should not constitute unnecessary limitations due to the use of prefix words.

[0105] In the embodiments of the present disclosure, "a plurality of" means two or more.

[0106] In the embodiments of the present disclosure, terms such as "import", "input", "read in", etc. may be interchangeable.

[0107] In some embodiments, a device, etc. can be interpreted as physical or virtual, and its name is not limited to the name recorded in the embodiments. Terms such as "device", "equipment", "device", "circuit", "network element", "node", "function", "unit", "section", "system", "network", "chip", "chip system", "entity", "subject", etc. may be interchangeable.

[0108] Figure 1 It is a flowchart of a method for detecting signal quality provided for the embodiments of the present disclosure. This method can be applicable to application scenarios such as the stability test of high-speed storage devices and the signal quality evaluation link, which are not limited in the present disclosure. For exampleFigure 1 As shown, the method for detecting signal quality includes steps 101-103.

[0109] Step 101: Based on the original eye diagram data under the same temperature and voltage, form an eye diagram to be detected, where the eye diagram to be detected includes an eye diagram boundary, an initial center point of the eye diagram to be detected, and a minimum read / write frame drawn based on the initial center point;

[0110] In some embodiments, for data transmission signal lines (DQ (Data Input / Output), DBI (Data Bus Inversion), DMI (Data Mask Inversion)) in the read / write direction, collect batch digital eye diagram original data under multiple startup and the same temperature and voltage frequency point conditions, and based on these eye diagram original data, form an eye diagram to be detected. For the convenience of understanding the eye diagram to be detected, as Figure 2 shown, Figure 2 FIG. is a schematic diagram of an eye diagram to be detected provided by an embodiment of the present application. The eye diagram to be detected includes: a maximum eye diagram boundary and a minimum eye diagram boundary of the eye diagram to be detected, a minimum read / write frame (hexagonal minimum read / write frame) corresponding to the storage protocol standard, and an initial center point of the minimum read / write frame.

[0111] It should be noted that the minimum read / write frame described in the embodiments of the present application corresponds to the storage protocol standard. When different storage protocol standards are different, the shape of its minimum read / write frame may be different. Figure 2 That is, a hexagonal frame of the minimum read / write frame specified by the JEDEC protocol or other high-speed storage device protocols is drawn with the center point after the memory device is initialized. The minimum read / write frame is a hexagonal frame with a blue dotted line (taking the LPDDR5x protocol as an example). Specifically, the embodiments of the present application do not specifically limit the storage protocol standard and the shape of the minimum read / write frame.

[0112] Step 102: Calculate a target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point. The target index includes at least one of a center point centering index, an eye diagram boundary index, an eye diagram area index, and an eye diagram shape balance index.

[0113] The eye diagram situation can represent the signal quality. In the embodiments of the present application, the purpose of calculating the target index is to reduce the deviation introduced by subjective judgment during manual analysis through calculation.

[0114] The target index includes but is not limited to any one or any combination of a center point centering index, an eye diagram boundary index, an eye diagram area index, and an eye diagram shape balance index. The more types of target indexes, the more accurate the detected signal quality.

[0115] Step 103, when it is determined that at least one target index meets its respective conditional threshold, determine the target evaluation value corresponding to the target temperature and target voltage according to the offset of the initialization center point and the eye diagram collapse range.

[0116] The detection of at least one target index refers to the eye diagram to be detected corresponding to the same temperature and / or voltage. Different temperatures and voltages will directly affect the eye diagram of the signal line. Therefore, after at least one target index passes the verification, continue to detect the eye diagram conditions under different temperatures and voltages.

[0117] It can be summarized into two types: the offset of the initialization center point of the eye diagram to be detected and the eye diagram collapse range. By weighted calculation of the offset of the initialization center point and the eye diagram collapse range, the target evaluation value under the target temperature and voltage conditions is obtained, so as to evaluate the feasibility of the stress test in advance and give an estimated value of the eye diagram margin without large-scale long-term stress testing.

[0118] In summary, based on the original eye diagram data under the same temperature and voltage, form the eye diagram to be detected, and the eye diagram to be detected includes the eye diagram boundary, the initial center point of the eye diagram to be detected, and the minimum read / write frame drawn based on the initial center point; calculate the target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point, and the target index includes at least one of the center point centering index, the eye diagram boundary index, the eye diagram area index, and the eye diagram shape balance index; when it is determined that at least one target index meets its respective conditional threshold, determine the target evaluation value corresponding to the target temperature and target voltage according to the offset of the initialization center point and the eye diagram collapse range. By evaluating the center point centering index, the eye diagram boundary index, the eye diagram area index, and the eye diagram shape balance index, the deviation introduced by subjective judgment during manual analysis is reduced. In addition, the corresponding relationship between the temperature and voltage and the evaluation value is calculated, and testing is replaced by calculation, shortening the detection cycle of signal quality.

[0119] In some embodiments, Figure 3 Further show the flowchart of a signal quality detection method proposed by the present disclosure. Based on Figure 1 the shown embodiments, further explain step 103, Figure 3 It can include the following steps:

[0120] Step 201, determine whether the initialization center point corresponding to the target voltage and target temperature meets the read / write conditions.

[0121] The corresponding relationships between the minimum delay granularity of the signal line and voltage and temperature under different voltage and temperature conditions can be collected through big data, that is, the first corresponding relationships between the minimum delay granularity of the signal line for generating the original eye diagram data and voltage and temperature are generated, which are used to simulate the center point offset under the conditions of voltage and temperature superposition or individual condition deviation.

[0122] Under different voltage and temperature conditions, generate the first corresponding relationship curve between the minimum delay granularity and temperature, and the second corresponding relationship curve between the minimum delay granularity and the voltage. According to the first equation corresponding to the first corresponding relationship curve and the second equation of the second corresponding relationship curve, determine the first corresponding relationship between the minimum delay granularity and voltage and / or temperature;

[0123] The relationship between voltage or temperature and the minimum delay granularity should satisfy the corresponding relationship of a linear equation within a reasonable operating range. It includes:

[0124] First equation: Ystep = Kvol * Xvol + Bvol

[0125] Second equation: Ystep = Ktemp * Xtemp + Btemp

[0126] Determine the first corresponding relationship formula between the minimum delay granularity and voltage and / or temperature: Yoffset_step = Kvol * Xoffset_vol + Bvol + Ktemp * Xoffset_temp + Btemp

[0127] Among them, Ystep is the minimum delay granularity, Kvol is the voltage coefficient, Bvol is the voltage offset, Ktemp is the temperature coefficient, Btemp is the temperature offset, and Yoffset_step is the minimum delay granularity at the target temperature and voltage.

[0128] Based on the first corresponding relationship, calculate the target center point offset corresponding to the target voltage and target temperature, that is, after calculating the center point offset through the first corresponding relationship formula between the minimum delay granularity and voltage and / or temperature, based on the first corresponding relationship, calculate the target center point offset corresponding to the target voltage and target temperature.

[0129] According to the comparison result between the target center point offset and the offset threshold, determine whether the initialized center point meets the read / write condition, where the offset threshold is the product of the horizontal direction mean value of the eye diagram boundary and the threshold coefficient. That is, when it is determined that the target center point offset is less than or equal to the offset threshold, it is determined that the initialized center point corresponding to the target voltage and target temperature meets the read / write condition. When it is determined that the target center point offset is greater than the offset threshold, it is determined that the initialized center point corresponding to the target voltage and target temperature does not meet the read / write condition.

[0130] In practical applications, the horizontal direction mean value in the target center point offset and the edge margin can be calculated for comparison. Since the overall eye diagram is a symmetric structure, if the target center point offset is greater than half of the horizontal direction mean value (i.e., the threshold coefficient is 0.5), it proves that the memory read / write stability cannot be guaranteed in the current target temperature and voltage scenarios, and an effective dynamic adjustment process must be assisted, which will not be specifically elaborated here. On the contrary, it proves that the read / write condition can be met. It should be noted that the above example is described with the threshold coefficient of 0.5. This threshold coefficient is in an ideal state. Considering the real scenario and the individual differences of different memories, it is recommended to increase the corresponding threshold coefficient, and the principle of less than 1 should be followed when increasing it. The threshold coefficient of the specific embodiment of this application is not limited.

[0131] Step 202, determine whether the eye diagram collapse range of the eye diagram area corresponding to the target voltage and target temperature is less than the collapse threshold.

[0132] In some embodiments, when performing step 202, it can be implemented but not limited to the following methods: Under different voltage and temperature conditions, generate the second corresponding relationships between the eye diagram area of the to-be-detected eye diagram and voltage, and between the eye diagram area of the to-be-detected eye diagram and temperature respectively. Based on the second corresponding relationships, calculate the average eye diagram collapse amount of the to-be-detected eye diagram, and determine whether the average eye diagram collapse amount is less than the collapse threshold. The second corresponding relationships include the corresponding relationship curves between the eye diagram area generated under different voltage and temperature conditions and voltage, and the corresponding relationship curves between the eye diagram area generated under different voltage and temperature conditions and temperature. Fit the relationship curves between the eye diagram area and temperature / voltage conditions respectively, and calculate the average eye diagram collapse range. This calculation method can be implemented but not limited to any one of the average value calculation methods in the related technologies, and the embodiments of this application are not limited.

[0133] In the specific implementation process, the eye diagram areas of the to-be-detected eye diagrams of a batch of the same type of single boards under corresponding different temperature and voltage conditions can be collected through big data, and the relationship curves between the eye diagram area and temperature / voltage conditions are fitted to simulate the average eye diagram collapse range under the conditions of temperature-voltage superposition or separate condition pulling.

[0134] In the embodiments of the present application, the collapse threshold is an empirical value. Ideally, the minimum eye diagram collapse is the minimum read / write frame. However, in actual applications, the collapse threshold can be set according to business requirements based on the minimum read / write frame, which is not limited in the embodiments of the present application.

[0135] Step 203: When it is determined that the initialized center point meets the read / write condition and the eye diagram collapse range is less than the collapse threshold, determine the target evaluation value corresponding to the target temperature and target voltage according to the offset of the initialized center point and the eye diagram collapse range.

[0136] Perform weighted calculation according to the weights corresponding to the offset of the initialized center point and the average eye diagram collapse amount respectively to obtain the target evaluation value corresponding to the target temperature and voltage.

[0137] Combining the two estimation results of steps 201 and 202, weighted calculation can be comprehensively performed to obtain the evaluation value under the target temperature and voltage conditions, so as to evaluate the feasibility of the stress test in advance and give the eye diagram margin estimation value without performing large-scale long-term stress tests.

[0138] The following embodiments respectively illustrate the specific implementation process of evaluating the target index:

[0139] 1. When the target index is the center point centering index, calculate the target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point, as Figure 4 shown, including:

[0140] Step 301: Calculate the horizontal percentage according to the horizontal center point of the minimum eye diagram boundary, the horizontal center point of the initial center point, and the horizontal eye width of the minimum eye diagram.

[0141] Based on the length and width boundaries of the minimum eye diagram boundary, calculate the center intersection point, and calculate the difference percentages in the horizontal and vertical directions with the center point after the initialization of the memory device.

[0142] Horizontal percentage = |(calculate the horizontal center point of the minimum eye diagram boundary - the horizontal center point of the initial center point)| / the horizontal eye width of the minimum eye diagram * 100%

[0143] Step 302: Calculate the vertical percentage according to the vertical center point of the minimum eye diagram boundary, the vertical center point of the initial center point, and the vertical eye width of the minimum eye diagram.

[0144] Vertical percentage = |(calculate the vertical center point of the minimum eye diagram boundary - the vertical center point of the initial center point)| / the vertical eye width of the minimum eye diagram * 100%

[0145] Step 303: Calculate the horizontal threshold percentage based on the minimum read / write frame horizontal width and the horizontal eye width of the minimum eye diagram;

[0146] Horizontal threshold percentage = (minimum read / write frame horizontal width / 2) / horizontal eye width of the minimum eye diagram * 100%

[0147] Step 304: Calculate the vertical threshold percentage based on the minimum read / write frame vertical height and the vertical eye width of the minimum eye diagram;

[0148] Vertical threshold percentage = (minimum read / write frame vertical height / 2) / vertical eye width of the minimum eye diagram * 100%

[0149] Step 305: Calculate the center point centering index based on the horizontal percentage, the vertical percentage, the horizontal threshold percentage, and the vertical threshold percentage.

[0150] Center point centering index Kcenter = horizontal threshold percentage - horizontal percentage + vertical threshold percentage - vertical percentage

[0151] When the calculation result of the center point centering index Kcenter is greater than 0, it indicates that the evaluation of the center point centering index Kcenter is passed; otherwise, the evaluation is not passed.

[0152] 2. When the target index is the eye diagram boundary index, calculating the target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point is as Figure 5 shown, including:

[0153] Step 401: Obtain the vertical direction distance and the horizontal direction distance between the minimum read / write frame and the minimum eye diagram boundary respectively;

[0154] For ease of understanding, as Figure 6 shown, Figure 6 the four arrows in

[0155] represent the distances (vertical direction distance and horizontal direction distance) between the read / write frame in the up, down, left, and right directions and the minimum eye diagram boundary respectively. By collecting the data results of the single board in batches, the vertical direction distances y1, y2, y3... yn and the horizontal direction distances x1, x2, x3... xn can be obtained, where n represents the total number of data samples.

[0156] Step 402: Calculate the vertical direction mean based on the vertical direction distance and calculate the horizontal direction mean based on the horizontal direction distance;

[0157] Horizontal direction mean = (x1 + x2 + x3 +... + xn) / n

[0158] Step 403: Calculate the eye diagram boundary index based on the vertical direction mean, a preset vertical direction threshold, the horizontal direction mean, and a preset horizontal direction threshold.

[0159] The eye diagram boundary index Kperi = horizontal direction mean - horizontal direction threshold + vertical direction mean - vertical direction threshold

[0160] Among them, the horizontal direction threshold and the vertical direction threshold described in the embodiments of the present application can be set to 0, which means the condition that the edge margin is greater than 0, or can be set to desired empirical thresholds. The specific embodiments of the present application do not limit this.

[0161] If the eye diagram boundary index Kperi is greater than 0, it indicates that the evaluation of the eye diagram boundary index Kperi is passed; otherwise, the evaluation is not passed.

[0162] Meanwhile, in order to reflect the degree of data fluctuation, the variance formula is introduced: S^2 = {(k1 - m)^2 + (k2 - m)^2 + (k3 - m)^2 +... + (kn - m)^2} / n. Where m is the mean of the corresponding data, n represents the total number of data samples, and S^2 is the variance result. Therefore, the horizontal direction variance and the vertical direction variance values can be obtained as the stability parameters for calculating the eye diagram boundary index Kperi.

[0163] 3. When the target index is the eye diagram area index, calculating the target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point is as follows Figure 7 shown and includes:

[0164] Step 501: Calculate the minimum eye diagram area corresponding to the minimum eye diagram boundary and the minimum read / write frame area of the minimum read / write frame;

[0165] The area of the minimum read / write frame = (Frame width1 + Frame width2) * Frame height

[0166] Among them, Frame width1 is the width from the initial center point of the minimum read / write frame to the left boundary of the minimum eye diagram boundary, Frame width2 is the width from the initial center point of the minimum read / write frame to the right boundary of the minimum eye diagram boundary, and Frame height is the height of the minimum read / write frame.

[0167] Step 502: Calculate the eye diagram area of the meta-region in the eye diagram to be detected, where the meta-region is the intermediate region between the maximum eye diagram boundary and the minimum eye diagram boundary;

[0168] The meta area is the middle area between the maximum eye diagram boundary and the minimum eye diagram boundary, that is, the eye diagram area not covered by the maximum eye diagram boundary of the minimum eye diagram boundary.

[0169] Step 503, calculate the eye diagram area index according to the minimum eye diagram area, the minimum read / write frame area, and the eye diagram area of the meta area.

[0170] Eye diagram area index Karea = (Eye area(min) / area of the minimum read / write frame - Eye area(meta) / area of the minimum read / write frame) * 100%

[0171] Among them, Eye area(min) is the minimum eye diagram area, and Eye area(meta) is the eye diagram area of the meta area.

[0172] The larger the percentage of the minimum eye diagram area, the better, while the smaller the percentage of the meta area, the better. Therefore, it can be concluded that the larger the area index Karea, the more likely it is to pass the evaluation. Specifically, the threshold size for passing the evaluation, such as 80%, 90%, etc., is not limited in the embodiments of the present application.

[0173] 4. When the target index is the eye diagram shape balance index, calculating the target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point includes: performing a fitting process on the maximum eye diagram boundary and the minimum eye diagram boundary of the eye diagram to be detected, and determining the eye diagram shape balance index according to the fitting result of the fitting process.

[0174] A reasonable signal line digital eye diagram to be detected should have regular edges and should not have collapses or protrusions. Taking the LPDD R5x memory as an example, it should be a balanced hexagonal border. The signal eye diagrams of other high-speed memories should refer to the corresponding criteria. For the six boundaries of the eye diagram boundary, a unary linear regression fitting is performed. If a fitting function can be obtained, the eye diagram shape balance index passes the evaluation; otherwise, it fails.

[0175] Corresponding to the above signal quality detection method, the present invention also proposes a signal quality detection device. Since the device embodiments of the present invention correspond to the above method embodiments, details not disclosed in the device embodiments can be referred to the above method embodiments, and will not be elaborated in the present invention.

[0176] Figure 8 It is a schematic structural diagram of a signal quality detection device provided by an embodiment of the present disclosure. The signal quality detection device, as Figure 8 shown, includes:

[0177] A generating unit 61 for forming an eye diagram to be detected based on the original eye diagram data under the same temperature and voltage, where the eye diagram to be detected includes an eye diagram boundary, an initial center point of the eye diagram to be detected, and a minimum read / write frame drawn based on the initial center point;

[0178] A calculating unit 62 for calculating a target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point, where the target index includes at least one of a center point centering index, an eye diagram boundary index, an eye diagram area index, and an eye diagram shape balance index;

[0179] A detecting unit 63 for determining a target evaluation value corresponding to the target temperature and target voltage according to the offset of the initial center point and the eye diagram collapse range when it is determined that at least one target index meets its corresponding condition threshold.

[0180] In summary, an eye diagram to be detected is formed based on the original eye diagram data under the same temperature and voltage, where the eye diagram to be detected includes an eye diagram boundary, an initial center point of the eye diagram to be detected, and a minimum read / write frame drawn based on the initial center point; a target index is calculated based on the eye diagram boundary, the minimum read / write frame, and the initial center point, where the target index includes at least one of a center point centering index, an eye diagram boundary index, an eye diagram area index, and an eye diagram shape balance index; when it is determined that at least one target index meets its corresponding condition threshold, a target evaluation value corresponding to the target temperature and target voltage is determined according to the offset of the initial center point and the eye diagram collapse range. By evaluating the center point centering index, the eye diagram boundary index, the eye diagram area index, and the eye diagram shape balance index, the deviation introduced by subjective judgment in manual analysis is reduced. In addition, the corresponding relationship between the temperature and voltage and the evaluation value is calculated, and measurement is replaced by calculation, shortening the detection cycle of signal quality.

[0181] Further, in a possible implementation manner of the embodiment of the present disclosure, as Figure 9 shown, the detecting unit 63 includes:

[0182] A first determining module 631 for determining whether the initial center point corresponding to the target voltage and target temperature meets the read / write condition;

[0183] A second determining module 632 for determining whether the eye diagram collapse range of the eye diagram area corresponding to the target voltage and target temperature is less than the collapse threshold;

[0184] A detecting module 633 for determining a target evaluation value corresponding to the target temperature and target voltage according to the offset of the initial center point and the eye diagram collapse range when it is determined that the initial center point meets the read / write condition and the eye diagram collapse range is less than the collapse threshold.

[0185] Further, in a possible implementation manner of the embodiment of the present disclosure, as Figure 9 shown, the first determination module 631 includes:

[0186] A generation sub-module 6311, configured to generate a first correspondence between the minimum delay granularity of the signal line of the original eye diagram data and voltage and temperature respectively under different voltage and temperature conditions;

[0187] A calculation sub-module 6312, configured to calculate an offset of the initialization center point based on the first correspondence;

[0188] A determination sub-module 6313, configured to determine whether the initialization center point meets the read / write condition according to a comparison result between the target center point offset and an offset threshold, where the offset threshold is a product of the horizontal direction mean value of the eye diagram boundary and a threshold coefficient.

[0189] Further, in a possible implementation manner of the embodiment of the present disclosure, as Figure 9 shown, the generation sub-module 6311 is further configured to:

[0190] Generate a first correspondence curve between the minimum delay granularity and temperature, and a second correspondence curve between the minimum delay granularity and the voltage under different voltage and temperature conditions;

[0191] Determine a first correspondence between the minimum delay granularity and voltage and / or temperature according to a first equation corresponding to the first correspondence curve and a second equation of the second correspondence curve;

[0192] Calculate a target center point offset corresponding to a target voltage and a target temperature based on the first correspondence;

[0193] The determination sub-module is further configured to determine that the initialization center point corresponding to the target voltage and the target temperature meets the read / write condition when it is determined that the target center point offset is less than or equal to a product result of the horizontal direction mean value of the eye diagram boundary and the threshold coefficient.

[0194] Further, in a possible implementation manner of the embodiment of the present disclosure, as Figure 9 shown, the detection unit 63 is further configured to:

[0195] Perform weighted calculation according to weights corresponding to the offset of the initialization center point and the eye diagram collapse amount respectively, to obtain a target evaluation value corresponding to the target temperature and voltage.

[0196] Further, in a possible implementation manner of the embodiment of the present disclosure, as Figure 9As shown, the eye diagram boundary includes the maximum eye diagram boundary and the minimum eye diagram boundary of the eye diagram to be detected. When the target metric is the center point centering index, the calculation unit 62 is further configured to:

[0197] Calculate a horizontal percentage based on the horizontal center point of the minimum eye diagram boundary, the horizontal center point of the initial center point, and the horizontal eye width of the minimum eye diagram;

[0198] Calculate a vertical percentage based on the vertical center point of the minimum eye diagram boundary, the vertical center point of the initial center point, and the vertical eye width of the minimum eye diagram;

[0199] Calculate a horizontal threshold percentage based on the minimum read / write frame horizontal width and the horizontal eye width of the minimum eye diagram;

[0200] Calculate a vertical threshold percentage based on the minimum read / write frame vertical height and the vertical eye width of the minimum eye diagram;

[0201] Calculate the center point centering index based on the horizontal percentage, the vertical percentage, the horizontal threshold percentage, and the vertical threshold percentage.

[0202] Further, in a possible implementation manner of the embodiments of the present disclosure, as Figure 9 shown, when the target metric is the eye diagram boundary index, the calculation unit 62 is further configured to:

[0203] Obtain the vertical distance and the horizontal distance between the minimum read / write frame and the minimum eye diagram boundary respectively;

[0204] Calculate a vertical direction mean based on the vertical distance, and calculate a horizontal direction mean based on the horizontal distance;

[0205] Calculate the eye diagram boundary index based on the vertical direction mean, a preset vertical direction threshold, the horizontal direction mean, and a preset horizontal direction threshold.

[0206] Further, in a possible implementation manner of the embodiments of the present disclosure, as Figure 9 shown, when the target metric is the eye diagram area index, the calculation unit 62 is further configured to:

[0207] Calculate the minimum eye diagram area corresponding to the minimum eye diagram boundary and the minimum read / write frame area of the minimum read / write frame;

[0208] Calculate the eye diagram area of the meta-region in the eye diagram to be detected, where the meta-region is the intermediate region between the maximum eye diagram boundary and the minimum eye diagram boundary;

[0209] The eye diagram area index is calculated based on the minimum eye diagram area, the minimum read / write frame area, and the eye diagram area of the meta-region.

[0210] Further, in a possible implementation manner of the embodiments of the present disclosure, as Figure 9 shown, when the target index is the eye diagram shape balance index, the calculation unit 62 is further configured to include:

[0211] Performing a fitting process on the maximum eye diagram boundary and the minimum eye diagram boundary of the eye diagram to be detected;

[0212] Determining the eye diagram shape balance index according to the fitting result of the fitting process.

[0213] Since the device provided by the embodiments of the present disclosure corresponds to the methods provided by the above several embodiments, the implementation manners of the methods are also applicable to the device provided by this embodiment and will not be described in detail in this embodiment.

[0214] In the above embodiments provided by the present application, the methods and devices provided by the embodiments of the present application are introduced. To implement the various functions in the methods provided by the embodiments of the present application, an electronic device may include a hardware structure and software modules, and implement the above various functions in the form of a hardware structure, a software module, or a combination of a hardware structure and a software module. A certain function among the above various functions may be executed in the form of a hardware structure, a software module, or a combination of a hardware structure and a software module.

[0215] Figure 10 FIG. is a block diagram of an electronic device 1000 for implementing the above signal quality detection method according to an exemplary embodiment. For example, the electronic device 1000 may be a mobile phone, a computer, a digital broadcast terminal, a messaging device, a game console, a tablet device, a medical device, a fitness device, a personal digital assistant, etc.

[0216] Referring to Figure 10 FIG., the electronic device 1000 may include one or more of the following components: a processing component 1002, a memory 1004, a power supply component 1006, a multimedia component 1008, an audio component 1010, an input / output (I / O) interface 1012, a sensor component 1014, and a communication component 1016.

[0217] The processing component 1002 generally controls the overall operation of the electronic device 1000, such as operations associated with display, telephone calls, data communication, camera operations, and recording operations. The processing component 1002 may include one or more processors 1020 to execute instructions to complete all or part of the steps of the above methods. In addition, the processing component 1002 may include one or more modules to facilitate the interaction between the processing component 1002 and other components. For example, the processing component 1002 may include a multimedia module to facilitate the interaction between the multimedia component 1008 and the processing component 1002.

[0218] The memory 1004 is configured to store various types of data to support the operation of the electronic device 1000. Examples of such data include instructions for any application or method operating on the electronic device 1000, contact data, phone book data, messages, pictures, videos, etc. The memory 1004 may be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk, or optical disk.

[0219] The power component 1006 provides power to various components of the electronic device 1000. The power component 1006 may include a power management system, one or more power supplies, and other components associated with generating, managing, and distributing power for the electronic device 1000.

[0220] The multimedia component 1008 includes a screen that provides an output interface between the electronic device 1000 and the user. In some embodiments, the screen may include a liquid crystal display (LCD) and a touch panel (TP). If the screen includes a touch panel, the screen may be implemented as a touch screen to receive input signals from the user. The touch panel includes one or more touch sensors to sense touches, swipes, and gestures on the touch panel. The touch sensors can not only sense the boundaries of touch or swipe actions, but also detect the duration and pressure associated with the touch or swipe operations. In some embodiments, the multimedia component 1008 includes a front camera and / or a rear camera. When the electronic device 1000 is in an operating mode, such as a shooting mode or a video mode, the front camera and / or the rear camera can receive external multimedia data. Each of the front camera and the rear camera may be a fixed optical lens system or have focal length and optical zoom capabilities.

[0221] The audio component 1010 is configured to output and / or input audio signals. For example, the audio component 1010 includes a microphone (MIC), which is configured to receive external audio signals when the electronic device 1000 is in an operating mode, such as a call mode, a recording mode, and a voice recognition mode. The received audio signals can be further stored in the memory 1004 or transmitted via the communication component 1016. In some embodiments, the audio component 1010 further includes a speaker for outputting audio signals.

[0222] The I / O interface 1012 provides an interface between the processing component 1002 and a peripheral interface module, and the peripheral interface module can be a keyboard, a click wheel, buttons, etc. These buttons can include but are not limited to: a home button, a volume button, a power button, and a lock button.

[0223] The sensor component 1014 includes one or more sensors for providing status assessments of various aspects of the electronic device 1000. For example, the sensor component 1014 can detect the on / off state of the electronic device 1000, the relative positioning of components, such as the display and keypad of the electronic device 1000. The sensor component 1014 can also detect a change in the position of the electronic device 1000 or a component of the electronic device 1000, the presence or absence of user contact with the electronic device 1000, the orientation or acceleration / deceleration of the electronic device 1000, and the temperature change of the electronic device 1000. The sensor component 1014 can include a proximity sensor configured to detect the presence of nearby objects without any physical contact. The sensor component 1014 can also include a light sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, the sensor component 1014 can further include an acceleration sensor, a gyroscope sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.

[0224] The communication component 1016 is configured to facilitate communication between the electronic device 1000 and other devices in a wired or wireless manner. The electronic device 1000 can access a wireless network based on communication standards, such as WiFi, 2G or 3G, 4G LTE, 5G NR (New Radio), or a combination thereof. In an exemplary embodiment, the communication component 1016 receives a broadcast signal or broadcast-related information from an external broadcast management system via a broadcast channel. In an exemplary embodiment, the communication component 1016 further includes a near field communication (NFC) module to facilitate short-range communication. For example, the NFC module can be implemented based on radio frequency identification (RFID) technology, infrared data association (IrDA) technology, ultra-wideband (UWB) technology, Bluetooth (BT) technology, and other technologies.

[0225] In an exemplary embodiment, the electronic device 1000 may be implemented by one or more application specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components for performing the above method.

[0226] In an exemplary embodiment, a non-transitory computer-readable storage medium including instructions is also provided, such as a memory 1004 including instructions, and the above instructions can be executed by a processor 1020 of the electronic device 1000 to complete the above method through image processing. For example, the non-transitory computer-readable storage medium may be a ROM, a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, etc.

[0227] An embodiment of the present disclosure also proposes a non-transitory computer-readable storage medium storing computer instructions, wherein the computer instructions are used to cause a computer to execute the method described in the above embodiments of the present disclosure.

[0228] Those skilled in the art can also understand that the various illustrative logical blocks and steps listed in the embodiments of the present application can be implemented by electronic hardware, computer software, or a combination of both. Whether such functions are implemented by hardware or software depends on the specific application and the design requirements of the entire system. Those skilled in the art can use various methods to implement the functions for each specific application, but such implementation should not be construed as exceeding the scope of protection of the embodiments of the present application.

[0229] It should be noted that the terms "first", "second", etc. in the specification, claims, and drawings of the present disclosure are used to distinguish similar objects and do not necessarily describe a specific order or sequence. It should be understood that such used data may be interchanged under appropriate circumstances so that the embodiments of the present disclosure described herein can be implemented in an order other than those illustrated or described herein. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure. On the contrary, they are merely examples of devices and methods consistent with some aspects of the present disclosure as detailed in the appended claims.

[0230] In the description of this specification, the descriptions referring to terms such as "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples", etc. mean that the specific features, structures, materials, or characteristics described in connection with the embodiments or examples are included in at least one embodiment or example of the present invention. In this specification, the schematic descriptions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in a suitable manner in any one or more embodiments or examples.

[0231] Any process or method description shown in a flowchart or described otherwise herein can be understood to represent a module, segment, or portion of code including one or more executable instructions for implementing a specific logical function or process, and the scope of the preferred embodiments of the present invention includes additional implementations, where the functions can be executed in a manner that is not shown or discussed, including in a substantially simultaneous manner according to the functions involved or in a reverse order, which should be understood by those skilled in the art to which the embodiments of the present invention pertain.

[0232] The logic and / or steps represented in a flowchart or described otherwise herein, for example, can be considered as a sequenced list of executable instructions for implementing a logical function, and can be specifically implemented in any computer-readable medium for use by an instruction execution system, apparatus, or device (such as a computer-based system, a system including a processing module, or other systems that can fetch and execute instructions from the instruction execution system, apparatus, or device), or in connection with these instruction execution systems, apparatuses, or devices. For the purposes of this specification, a "computer-readable medium" can be any device that can contain, store, communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device. More specific examples (non-exhaustive list) of computer-readable media include the following: an electrical connection portion having one or more wirings (control method), a portable computer diskette (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium can even be paper or other suitable media on which a program can be printed, because the program can be obtained electronically, for example, by optically scanning the paper or other media, followed by editing, interpretation, or otherwise processing as appropriate, and then storing it in a computer memory.

[0233] It should be understood that each part of the embodiments of the present invention can be implemented by hardware, software, firmware or a combination thereof. In the above embodiments, multiple steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, any one or a combination of the following techniques well known in the art can be used: discrete logic circuits with logic gate circuits for implementing logic functions on data signals, application specific integrated circuits with appropriate combinational logic gate circuits, programmable gate arrays (PGAs), field programmable gate arrays (FPGAs), etc.

[0234] Those of ordinary skill in the art can understand that all or part of the steps carried by the method of implementing the above embodiments can be completed by instructing relevant hardware through a program. The program can be stored in a computer-readable storage medium. When the program is executed, it includes one or a combination of the steps of the method embodiments.

[0235] In addition, each functional unit in the various embodiments of the present invention can be integrated into a processing module, or each unit can exist physically alone, or two or more units can be integrated into one module. The above integrated module can be implemented in the form of hardware or in the form of a software functional module. When the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium. The storage media mentioned above can be read-only memories, magnetic disks or optical discs, etc.

[0236] Although the embodiments of the present invention have been shown and described above, it can be understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those of ordinary skill in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of the present invention.

Claims

1. A method for detecting signal quality, characterized in that The method includes: Forming an eye diagram to be detected based on the original eye diagram data under the same temperature and voltage. The eye diagram to be detected includes an eye diagram boundary, an initial center point of the eye diagram to be detected, and a minimum read / write frame drawn based on the initial center point; Calculating a target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point. The target index includes at least one of a center point centering index, an eye diagram boundary index, an eye diagram area index, and an eye diagram shape balance index; When it is determined that at least one target index meets its respective conditional threshold, determining a target evaluation value corresponding to the target temperature and target voltage according to the offset of the initialized center point and the eye diagram collapse range.

2. The method according to claim 1, characterized in that, The determining the target evaluation value corresponding to the target temperature and target voltage according to the offset of the initialized center point and the eye diagram collapse range includes: Determining whether the initialized center point corresponding to the target voltage and target temperature meets the read / write condition; Determining whether the eye diagram collapse range of the eye diagram area corresponding to the target voltage and target temperature is less than a collapse threshold; When it is determined that the initialized center point meets the read / write condition and the eye diagram collapse range is less than the collapse threshold, determining a target evaluation value corresponding to the target temperature and target voltage according to the offset of the initialized center point and the eye diagram collapse range.

3. The method according to claim 2, characterized in that, Determining whether the initialized center point corresponding to the target voltage and target temperature meets the read / write condition includes: Generating a first correspondence between the minimum delay granularity of the signal line for generating the original eye diagram data and voltage and temperature respectively under different voltage and temperature conditions; Calculating the offset of the initialized center point based on the first correspondence; Determining whether the initialized center point meets the read / write condition according to the comparison result between the target center point offset and an offset threshold, where the offset threshold is the product of the horizontal direction mean of the eye diagram boundary and a threshold coefficient.

4. The method according to claim 3, characterized in that The generating a first correspondence between the minimum delay granularity of the signal line for generating the original eye diagram data and voltage and temperature respectively under different voltage and temperature conditions includes: Generating a first correspondence curve between the minimum delay granularity and temperature, and a second correspondence curve between the minimum delay granularity and the voltage under different voltage and temperature conditions; Determining a first correspondence between the minimum delay granularity and voltage and / or temperature according to the first equation corresponding to the first correspondence curve and the second equation of the second correspondence curve; Calculating a target center point offset corresponding to the target voltage and target temperature based on the first correspondence; The determining whether the initialized center point meets the read / write condition according to the comparison result between the target center point offset and the offset threshold includes: When it is determined that the target center point offset is less than or equal to the product result of the horizontal direction mean of the eye diagram boundary and the threshold coefficient, determining that the initialized center point corresponding to the target voltage and target temperature meets the read / write condition.

5. The method according to claim 2, wherein The determining whether the eye diagram collapse range of the eye diagram area corresponding to the target voltage and target temperature is less than the collapse threshold includes: Under different voltage and temperature conditions, generate the second corresponding relationships between the eye diagram area of the eye diagram to be detected and voltage and temperature respectively; Calculate the average eye diagram collapse amount of the eye diagram to be detected based on the second corresponding relationship; Determine whether the average eye diagram collapse amount is less than the collapse threshold.

6. The method according to claim 5, characterized in that, The determining the target evaluation value corresponding to the target temperature and target voltage according to the offset of the initialized center point and the eye diagram collapse range includes: Perform weighted calculation according to the weights corresponding to the offset of the initialized center point and the average eye diagram collapse amount to obtain the target evaluation value corresponding to the target temperature and voltage.

7. The method according to claim 1, characterized in that, The eye diagram boundary includes the maximum eye diagram boundary and the minimum eye diagram boundary of the eye diagram to be detected. When the target index is the center point centering index, the calculating the target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point includes: Calculate the horizontal percentage according to the horizontal center point of the minimum eye diagram boundary, the horizontal center point of the initial center point, and the horizontal eye width of the minimum eye diagram; Calculate the vertical percentage according to the vertical center point of the minimum eye diagram boundary, the vertical center point of the initial center point, and the vertical eye width of the minimum eye diagram; Calculate the horizontal threshold percentage according to the horizontal width of the minimum read / write frame and the horizontal eye width of the minimum eye diagram; Calculate the vertical threshold percentage according to the vertical height of the minimum read / write frame and the vertical eye width of the minimum eye diagram; Calculate the center point centering index according to the horizontal percentage, the vertical percentage, the horizontal threshold percentage, and the vertical threshold percentage.

8. The method according to claim 7, characterized in that, When the target index is the eye diagram boundary index, the calculating the target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point includes: Obtain the vertical direction distance and the horizontal direction distance between the minimum read / write frame and the minimum eye diagram boundary respectively; Calculate the vertical direction mean value based on the vertical direction distance, and calculate the horizontal direction mean value based on the horizontal direction distance; Calculate the eye diagram boundary index based on the vertical direction mean value, the preset vertical direction threshold, the horizontal direction mean value, and the preset horizontal direction threshold.

9. The method according to claim 7, wherein When the target index is the eye diagram area index, the calculating the target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point includes: Calculate the minimum eye diagram area corresponding to the minimum eye diagram boundary and the minimum read / write frame area of the minimum read / write frame; Calculate the eye diagram area of the meta-region in the eye diagram to be detected, where the meta-region is the middle region between the maximum eye diagram boundary and the minimum eye diagram boundary; Calculate the eye diagram area index according to the minimum eye diagram area, the minimum read / write frame area, and the eye diagram area of the meta-region.

10. The method according to claim 7, characterized in that When the target index is the eye diagram shape balance index, the calculating the target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point includes: Perform fitting processing on the maximum eye diagram boundary and the minimum eye diagram boundary of the eye diagram to be detected; Determine the eye diagram shape balance index according to the fitting result of the fitting processing.

11. A detection device for signal quality, characterized in that, The device includes: A generating unit, configured to form an eye diagram to be detected based on the original eye diagram data at the same temperature and voltage. The eye diagram to be detected includes an eye diagram boundary, an initial center point of the eye diagram to be detected, and a minimum read / write frame drawn based on the initial center point. A calculating unit, configured to calculate a target index based on the eye diagram boundary, the minimum read / write frame, and the initial center point. The target index includes at least one of a center point centering index, an eye diagram boundary index, an eye diagram area index, and an eye diagram shape balance index. A detecting unit, configured to determine a target evaluation value corresponding to a target temperature and a target voltage according to an offset of the initialized center point and an eye diagram collapse range when it is determined that at least one target index meets its corresponding condition threshold.

12. An electronic device, characterized in that, Comprising: At least one processor; And A memory communicatively connected to the at least one processor; wherein, The memory stores instructions executable by the at least one processor. The instructions are executed by the at least one processor to enable the at least one processor to execute the method according to any one of claims 1-10.

13. A non-transitory computer-readable storage medium storing computer instructions, characterized in that, The computer instructions are used to cause the computer to execute the method according to any one of claims 1-10.

Images