Spectrometer light intensity correlation Mueller matrix four-element spectrum measurement method

By adding a polarizer and a rotating 1/4 wave plate to the spectrometer optical path, the four-element spectrum of the spectrometer light intensity-related Mueller matrix is measured by using the angle scanning method, the measurement error problem caused by the polarization effect of the spectrometer is solved, and high-precision spectral power distribution and polarization state reduction are achieved, reducing hardware costs.

CN120385625APending Publication Date: 2025-07-29NANCHANG HANGKONG UNIVERSITY
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Patent Information

Application Number
CN202411784672.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-11-29
Publication Date
2025-07-29

AI Technical Summary

Technical Problem

Spectrometers or spectrometer systems have polarization effects in polarization spectral measurements, resulting in errors in measurement results, and traditional methods may damage the precision of the spectrometer or costly, making it difficult to apply in small spectrometers with high integration.

Method used

Using external measurement method, by adding a polarizer and rotating 1/4 wave plate to the optical path, the four element spectrum of the spectrometer's light intensity-related Mueller matrix is measured by angle scanning method, avoiding disassembly of the spectrometer and measuring the element spectrum of the light intensity-related Mueller matrix.

Benefits of technology

It realizes high-precision reduction of spectral power distribution and polarization state without losing the incident light intensity, reducing hardware costs, and is suitable for spectrometer systems with high integration. The method is simple and fast and has good environmental adaptability.

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Abstract

The invention discloses a spectrograph light intensity correlation Mueller matrix four-element spectrum measurement method. According to the method, the relative intensity data [Iti, theta i] of light received by the ith pixel unit of the spectrometer CCD, which is obtained by a measuring device for the light intensity related Mueller matrix four-element spectrum of the spectrometer based on an angle scanning method, is substituted into a principle formula of the relative intensity of light received by the ith pixel unit of the spectrometer CCD. And traversing the range of [0, 2pi] where theta i is located, selecting four theta i values according to a certain rule, establishing an equation set with four Iti measured values corresponding to the four theta i values, solving and normalizing to obtain a Mueller matrix element related to the light intensity of the spectrograph corresponding to the wavelength lambda i. The measurement method is an external measurement method, and the spectrograph is not disassembled; all light intensity related Mueller matrix element spectrums are measured by adding a retardation curve of a 1 / 4 wave plate, and the method is not only suitable for a single spectrograph, but also suitable for a spectrograph system; the core optical device only uses the polarizer and the rotary 1 / 4 wave plate, the related hardware cost is low, and the method is simple and rapid; the environment adaptability is good.
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