Active circuit electromagnetic response characteristic modeling analysis method and related equipment

Abstract

The invention provides an active circuit electromagnetic response characteristic modeling analysis method and related equipment, and relates to the technical field of integrated circuits. According to the method, the to-be-analyzed active circuit is divided into the circuit component units mainly relating to nonlinear characteristic changes and the circuit carrier plate mainly relating to linear characteristics and only comprising unit connection wiring, and based on circuit component S parameter actual measurement operation in any strong field environment, complex nonlinear modeling errors are avoided, and the system reliability is improved. Meanwhile, on the basis of wiring S parameter simulation operation in a corresponding strong field environment, the high-frequency electromagnetic coupling effect of circuit connection wiring is accurately captured, the circuit modeling calculation amount is reduced, and then through cascading fusion analysis operation on wiring simulation S parameters and assembly actual measurement S parameters, the wiring simulation S parameters and the assembly actual measurement S parameters are analyzed; the rapid collaborative analysis of the wiring electromagnetic coupling response and the component nonlinear behavior is realized, so that the real electromagnetic response characteristic condition of the specified active circuit in the corresponding strong field environment can be rapidly and accurately reproduced, and the rapid iterative optimization effect of the active circuit design can be conveniently realized.

Description

Technical Field

[0001] The present application relates to the field of integrated circuit technology, and in particular to a method for modeling and analyzing electromagnetic response characteristics of active circuits and related equipment. Background Art

[0002] With the continuous development of science and technology, the application of integrated circuits is becoming more and more extensive, which often requires integrated circuits to stably perform the expected working performance in complex strong field environments (for example, operating environments with one or more combinations of strong electromagnetic fields, thermal fields, mechanical fields and other physical fields).

[0003] However, it is worth noting that strong field environments will have a profound impact on the electromagnetic response characteristics of integrated circuits, especially active circuits. The electromagnetic response characteristics of circuit elements of active circuits (for example, capacitors, inductors, resistors, semiconductor devices, etc.) will become nonlinear in strong field environments and easily couple with many physical fields. Various circuit elements are also prone to quantum tunneling effects, quantum resonance and other phenomena in strong field environments. At the same time, the electromagnetic field will often exhibit time-varying properties in strong field environments, triggering time-varying responses of active circuits (which will affect the stability and working performance of active circuits), so that active circuits will exhibit electromagnetic response characteristics in strong field environments that are very different from those under conventional working conditions. The electromagnetic response characteristics of the same active circuit in different strong field environments often have obvious differences, resulting in the classical electromagnetic field theory applicable to conventional working conditions (for example, Maxwell's equations, electromagnetic wave propagation theory, linear circuit theory, etc.) being unable to effectively describe the true electromagnetic response characteristics of active circuits in strong field environments.

[0004] Therefore, how to quickly and accurately analyze the actual electromagnetic response characteristics of a specified active circuit in an arbitrary strong field environment is an important issue that needs to be solved in the current application of active circuits. Summary of the Invention

[0005] In view of this, the purpose of this application is to provide a method and device for modeling and analyzing the electromagnetic response characteristics of an active circuit, a computer device and a readable storage medium, which can reduce the amount of circuit modeling calculations and avoid complex nonlinear modeling errors by splitting the specified active circuit to perform wiring scattering parameter (i.e., S parameter) simulation operations and circuit component S parameter actual measurement operations in any strong field environment, and realize rapid collaborative analysis of wiring electromagnetic coupling effects and component nonlinear behaviors through cascade fusion analysis operations of wiring simulation S parameters and component actual measurement S parameters, so as to quickly and accurately reproduce the actual electromagnetic response characteristics of the specified active circuit in the corresponding strong field environment, and facilitate users to achieve rapid iterative optimization effects of active circuit design by optimizing wiring layout individually or replacing circuit components.

[0006] In order to achieve the above objectives, the technical solutions adopted in the embodiments of the present application are as follows: In a first aspect, the present application provides a method for modeling and analyzing electromagnetic response characteristics of an active circuit, the method comprising: Obtaining a circuit wiring design scheme of the active circuit to be analyzed on a circuit carrier board, and actual scattering parameters of all circuit component units of the active circuit to be analyzed measured under a target strong field environment; Based on the circuit wiring design scheme, modeling and simulating all unit connection wirings on the circuit carrier board that match the active circuit to be analyzed to obtain predicted scattering parameters of all unit connection wirings under the target strong field environment; According to the circuit wiring design scheme, constructing a cascade network of the actual scattering parameters of all the circuit component units and the predicted scattering parameters of all the unit connection wirings to obtain a theoretical scattering parameter cascade network; A scattering parameter time-frequency analysis is performed on the theoretical scattering parameter cascade network to obtain theoretical electromagnetic response characteristic parameters of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment.

[0007] In an optional embodiment, the step of modeling and simulating all unit connection wirings on the circuit carrier board that match the active circuit to be analyzed based on the circuit wiring design scheme to obtain predicted scattering parameters of all unit connection wirings under the target strong field environment includes: For each unit connection wiring on the circuit carrier that matches the active circuit to be analyzed, constructing an overall simulation model of the unit connection wiring deployed on the circuit carrier based on wiring position information, wiring size information, and wiring shape information recorded in the circuit wiring design plan for the unit connection wiring, as well as valid connection port information associated with at least one circuit component unit of the unit connection wiring; The overall simulation model is called to perform full-wave simulation in a simulation environment of the target strong field environment to obtain predicted scattering parameters of the unit connection wiring in the target strong field environment.

[0008] In an optional embodiment, the step of constructing a cascade network of the actual scattering parameters of all circuit component units and the predicted scattering parameters of all unit connection wirings according to the circuit wiring design scheme to obtain a theoretical scattering parameter cascade network includes: Determining a port cascade relationship between all the unit connection wirings and all the circuit component units based on valid connection port information of each of all the unit connection wirings in the circuit wiring design, component port information of each of all the circuit component units, and port connection information between all the unit connection wirings and all the circuit component units recorded in the circuit wiring design; According to the port cascade relationship, scattering parameter cascade processing is performed on the respective real scattering parameters of all the circuit component units and the respective predicted scattering parameters of all the unit connection wirings to obtain the theoretical scattering parameter cascade network.

[0009] In an optional embodiment, the step of performing scattering parameter time-frequency analysis on the theoretical scattering parameter cascade network to obtain theoretical electromagnetic response characteristic parameters of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment includes: Calculating the overall scattering parameters of the theoretical scattering parameter cascade network under the target strong field environment based on the respective real scattering parameters of all the circuit component units and the respective predicted scattering parameters of all the unit connection wirings; Performing signal time domain analysis and signal frequency domain analysis based on the overall scattering parameters of the theoretical scattering parameter cascade network to obtain time domain response analysis results and frequency domain response analysis results of the active circuit to be analyzed based on the circuit carrier in the target strong field environment; Data integration analysis is performed on the time domain response analysis results and the frequency domain response analysis results to obtain theoretical electromagnetic response characteristic parameters of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment.

[0010] In an optional embodiment, the step of calculating the overall scattering parameters of the theoretical scattering parameter cascade network under the target strong field environment based on the respective real scattering parameters of all the circuit component units and the respective predicted scattering parameters of all the unit connection wirings includes: For each network component module corresponding to each of all the circuit component units and all the unit connection wirings in the theoretical scattering parameter cascade network, performing transmission parameter conversion on the scattering parameters of the network component module according to input port information and output port information of the network component module at the active circuit to be analyzed, to obtain a theoretical transmission parameter matrix of the network component module at the theoretical scattering parameter cascade network; performing a matrix cascade operation on the theoretical transmission parameter matrices of all network component modules in the theoretical scattering parameter cascade network according to the port cascade relationship between all the unit connection wirings and all the circuit component units, to obtain an overall transmission parameter matrix of the theoretical scattering parameter cascade network; The overall transmission parameter matrix is ​​subjected to scattering parameter conversion to obtain the overall scattering parameters of the theoretical scattering parameter cascade network under the target strong field environment.

[0011] In a second aspect, the present application provides a device for modeling and analyzing electromagnetic response characteristics of an active circuit, the device comprising: A circuit measurement acquisition module is used to obtain a circuit wiring design scheme of the active circuit to be analyzed on a circuit carrier board, and actual scattering parameters of all circuit component units of the active circuit to be analyzed measured under a target strong field environment; a wiring modeling and simulation module for modeling and simulating all unit connection wirings on the circuit carrier board that match the active circuit to be analyzed based on the circuit wiring design scheme, and obtaining predicted scattering parameters of all unit connection wirings under the target strong field environment; a scattering parameter cascade module, configured to construct a cascade network based on the actual scattering parameters of all circuit component units and the predicted scattering parameters of all unit connection wirings according to the circuit wiring design scheme, to obtain a theoretical scattering parameter cascade network; The electromagnetic response analysis module is used to perform scattering parameter time-frequency analysis on the theoretical scattering parameter cascade network to obtain theoretical electromagnetic response characteristic parameters of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment.

[0012] In an optional embodiment, the electromagnetic response analysis module includes: An overall scattering evaluation submodule is configured to calculate the overall scattering parameters of the theoretical scattering parameter cascade network under the target strong field environment based on the respective real scattering parameters of all the circuit component units and the respective predicted scattering parameters of all the unit connection wirings; a signal time-frequency analysis submodule, configured to perform signal time-domain analysis and signal frequency-domain analysis based on the overall scattering parameters of the theoretical scattering parameter cascade network, and obtain a time-domain response analysis result and a frequency-domain response analysis result of the active circuit to be analyzed based on the circuit carrier in the target strong field environment; The time-frequency integration analysis submodule is used to perform data integration analysis on the time domain response analysis results and the frequency domain response analysis results to obtain theoretical electromagnetic response characteristic parameters of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment.

[0013] In an optional embodiment, the overall scattering evaluation submodule calculates the overall scattering parameters of the theoretical scattering parameter cascade network in the target strong field environment based on the actual scattering parameters of all circuit component units and the predicted scattering parameters of all unit connection wirings, including: For each network component module corresponding to each of all the circuit component units and all the unit connection wirings in the theoretical scattering parameter cascade network, performing transmission parameter conversion on the scattering parameters of the network component module according to input port information and output port information of the network component module at the active circuit to be analyzed, to obtain a theoretical transmission parameter matrix of the network component module at the theoretical scattering parameter cascade network; performing a matrix cascade operation on the theoretical transmission parameter matrices of all network component modules in the theoretical scattering parameter cascade network according to the port cascade relationship between all the unit connection wirings and all the circuit component units, to obtain an overall transmission parameter matrix of the theoretical scattering parameter cascade network; The overall transmission parameter matrix is ​​subjected to scattering parameter conversion to obtain the overall scattering parameters of the theoretical scattering parameter cascade network under the target strong field environment.

[0014] In a third aspect, the present application provides a computer device comprising a processor and a memory, wherein the memory stores a computer program that can be executed by the processor, and the processor can execute the computer program to implement the active circuit electromagnetic response characteristic modeling and analysis method described in any one of the aforementioned embodiments.

[0015] In a fourth aspect, the present application provides a readable storage medium having a computer program stored thereon. When the computer program is executed by a computer device, the method for modeling and analyzing the electromagnetic response characteristics of an active circuit as described in any one of the aforementioned embodiments is implemented.

[0016] In this case, the beneficial effects of the embodiments of the present application may include the following: This application splits the active circuit to be analyzed into circuit component units, which primarily involve nonlinear characteristic changes, and a circuit substrate containing only unit connection wiring, which primarily involves linear characteristics. The application then performs S-parameter measurement of the circuit component units under any strong field environment, eliminating the need to allocate large amounts of computing resources to perform nonlinear modeling of the circuit component units and avoiding complex nonlinear modeling errors. Furthermore, wiring S-parameter simulation is performed on the circuit substrate containing the unit connection wiring under this strong field environment to accurately capture the high-frequency electromagnetic coupling effects (e.g., parasitic parameters, radiation coupling parameters, etc.) of the circuit connection wiring, while reducing the computational complexity of circuit modeling. Subsequently, through a cascaded fusion analysis of the wiring simulation S-parameters and the measured component S-parameters, rapid collaborative analysis of the wiring electromagnetic coupling response and the component nonlinear behavior is achieved, enabling rapid and accurate reproduction of the actual electromagnetic response characteristics of a specified active circuit under the corresponding strong field environment. This allows users to achieve rapid iterative optimization of active circuit design by individually optimizing wiring layouts or replacing circuit components.

[0017] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, preferred embodiments are given below and described in detail with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying any creative work.

[0019] Figure 1 A schematic diagram of the composition of a computer device provided in an embodiment of the present application; Figure 2 A flow chart of a method for modeling and analyzing the electromagnetic response characteristics of an active circuit provided in an embodiment of the present application; Figure 3 A schematic diagram of the overall disassembly of an active circuit to be analyzed attached to a circuit carrier provided in an embodiment of the present application; Figure 4 for Figure 2 A schematic flow chart of the sub-steps included in step S220; Figure 5 The embodiments of this application provide Figure 3 The network cascade diagram of the theoretical scattering parameter cascade network matched to the active circuit to be analyzed is shown; Figure 6 for Figure 2 A schematic flow chart of the sub-steps included in step S230; Figure 7 for Figure 2 A schematic flow chart of the sub-steps included in step S240; Figure 8 A schematic diagram of the composition of the active circuit electromagnetic response characteristics modeling and analysis device provided in an embodiment of the present application; Figure 9 for Figure 8 Schematic diagram of the module composition of the electromagnetic response analysis module in .

[0020] Icons: 10-computer equipment; 11-memory; 12-processor; 13-communication unit; 100-active circuit electromagnetic response characteristic modeling and analysis device; 110-circuit measurement acquisition module; 120-wiring modeling and simulation module; 130-scattering parameter cascade module; 140-electromagnetic response analysis module; 141-overall scattering evaluation submodule; 142-signal time-frequency analysis submodule; 143-time-frequency integration analysis submodule. DETAILED DESCRIPTION

[0021] To make the objectives, technical solutions, and advantages of the embodiments of the present application more clear, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the accompanying drawings of the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Generally, the components of the embodiments of the present application described and shown in the drawings herein can be arranged and designed in various different configurations.

[0022] Therefore, the following detailed description of the embodiments of the present application provided in the accompanying drawings is not intended to limit the scope of the present application for protection, but merely represents selected embodiments of the present application. All other embodiments obtained by persons of ordinary skill in the art based on the embodiments in the present application without creative work are within the scope of protection of the present application.

[0023] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, it does not require further definition or explanation in subsequent drawings.

[0024] In the description of this application, it should be understood that the terms "center", "up", "down", "left", "right", "vertical", "horizontal", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, or are the orientation or position relationship in which the product of the application is usually placed when in use, or are the orientation or position relationship commonly understood by those skilled in the art. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on this application.

[0025] It should also be noted that, in the description of this application, unless otherwise expressly specified or limited, the terms "disposed," "installed," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections or electrical connections; they can refer to direct connections or indirect connections through an intermediate medium; and they can refer to internal connections between two components. Those skilled in the art will understand the specific meanings of the above terms in this application based on the specific circumstances.

[0026] In addition, in the description of the present application, it is understood that relational terms such as the terms "first" and "second" are merely used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply the existence of any such actual relationship or order between these entities or operations. Moreover, the terms "comprise", "include" or any other variants thereof are intended to cover non-exclusive inclusion, so that the process, method, article or equipment comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or also include elements inherent to such process, method, article or equipment. In the absence of further restrictions, the elements defined by the statement "comprise a ..." do not exclude the presence of other identical elements in the process, method, article or equipment comprising the elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to the specific circumstances.

[0027] Through painstaking research, the applicant discovered that existing modeling and analysis schemes for the electromagnetic response characteristics of active circuits in arbitrary strong field environments mainly adopt the following ideas: Approach 1: Use classical electromagnetic field theory to model and analyze electromagnetic response characteristics in strong-field environments. This approach is only applicable to linear active circuits and electromagnetic response analysis under weak-field conditions. However, as the intensity of electric, thermal, or magnetic fields increases, classical electromagnetic field theory becomes increasingly limited in its description of the nonlinear behavior of active circuits. It also fails to fully account for the coupling between active circuit components and other physical fields, such as thermal and force fields. Overall, it cannot accurately simulate the complex responses of nonlinear active circuits under high-frequency or strong-field conditions.

[0028] The second approach involves constructing a nonlinear active circuit model and employing numerical simulation algorithms for analysis. This approach requires significant computational resources and a long computational time (especially in strong field environments, where the computational complexity increases exponentially, significantly increasing both cost and time). This approach is unable to rapidly and accurately simulate and analyze the electromagnetic response characteristics of large-scale active circuits or highly integrated active circuits. Furthermore, in practical applications, this approach often overlooks the high-order nonlinear effects of active circuit components, leading to nonlinear distortion in the active circuit component model. This can easily lead to significant discrepancies between the final electromagnetic response analysis results and the actual characteristics.

[0029] In this case, the embodiments of the present application provide a method and apparatus for modeling and analyzing the electromagnetic response characteristics of an active circuit, a computer device, and a readable storage medium. These methods can reduce the amount of circuit modeling calculations and avoid complex nonlinear modeling errors by splitting a specified active circuit and performing wiring scattering parameter (i.e., S-parameter) simulation operations and circuit component S-parameter actual measurement operations in any strong field environment. Furthermore, through the cascaded fusion analysis operations of the wiring simulation S-parameters and the component actual measured S-parameters, a rapid collaborative analysis of the wiring electromagnetic coupling effects and the component nonlinear behaviors can be achieved, so as to quickly and accurately reproduce the actual electromagnetic response characteristics of the specified active circuit in the corresponding strong field environment, and facilitate users to achieve rapid iterative optimization effects of active circuit design by optimizing the wiring layout individually or replacing circuit components.

[0030] The following describes some embodiments of the present application in detail with reference to the accompanying drawings. In the absence of conflict, the following embodiments and features in the embodiments may be combined with each other.

[0031] Please refer to Figure 1 , Figure 1 Schematic diagram of the composition of a computer device 10 provided in an embodiment of the present application. In this embodiment of the present application, the computer device 10 can perform circuit splitting and scattering parameter testing operations on any specified active circuit under any strong field environment (including actual scattering parameter measurement operations on the split circuit component units and scattering parameter simulation operations on the split unit connection wiring). Through scattering parameter cascade fusion analysis operations, it can achieve rapid collaborative analysis of the wiring electromagnetic coupling response (which corresponds to the scattering parameters simulated for the unit connection wiring) and the component nonlinear behavior (which corresponds to the scattering parameters measured for the circuit component units). This allows for rapid and accurate reproduction of the actual electromagnetic response characteristics of the specified active circuit under the corresponding strong field environment, facilitating users to achieve rapid iterative optimization of active circuit design by individually optimizing wiring layout or replacing circuit components. The computer device 10 can be, but is not limited to, a laptop computer, a personal computer, a server, etc.

[0032] In this embodiment, any designated active circuit can be split into circuit component units that primarily involve changes in nonlinear characteristics, and a circuit substrate that primarily involves linear characteristics and only includes unit connection wiring. Each unit connection wiring in the designated active circuit is used to connect at least one circuit component unit to achieve a desired connection effect between different circuit component units. Each circuit component unit can be composed of multiple circuit elements (for example, a power amplifier unit constructed from an inductor, a capacitor, and a MOS transistor), or can be represented by only a single circuit element (for example, a MOS transistor used to act as a switching device), which can be flexibly configured by the designer of the corresponding active circuit based on the accuracy requirements of the electromagnetic response analysis. Each unit connection wiring can be composed of multiple circuit connection traces, or can be represented by only a single circuit connection trace, which can be flexibly configured by the designer of the corresponding active circuit based on the accuracy requirements of the electromagnetic response analysis.

[0033] In the embodiment of the present application, the computer device 10 may include a memory 11, a processor 12, a communication unit 13, and an active circuit electromagnetic response characteristic modeling and analysis device 100. The memory 11, the processor 12, and the communication unit 13 are electrically connected to each other, directly or indirectly, to enable data transmission or interaction. For example, the memory 11, the processor 12, and the communication unit 13 may be electrically connected to each other via one or more communication buses or signal lines.

[0034] In this embodiment, the memory 11 may be, but is not limited to, a random access memory (RAM), a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), etc. The memory 11 is used to store a computer program, and the processor 12 may execute the computer program accordingly after receiving an execution instruction.

[0035] In this embodiment, the processor 12 can be an integrated circuit chip with signal processing capabilities. The processor 12 can be a general-purpose processor, including at least one of a central processing unit (CPU), a graphics processing unit (GPU), a network processor (NP), a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. The general-purpose processor can be a microprocessor or any conventional processor, etc., and can implement or execute the various methods, steps, and logic block diagrams disclosed in the embodiments of this application.

[0036] In this embodiment, the communication unit 13 is configured to establish a communication connection between the computer device 10 and other electronic devices via a network, and to transmit and receive data via the network, where the network includes both a wired communication network and a wireless communication network. For example, the computer device 10 can use the communication unit 13 to obtain the actual scattering parameters of each circuit component in a specified active circuit, as measured using a vector network analyzer under a specific strong field environment.

[0037] In this embodiment, the active circuit electromagnetic response characteristics modeling and analysis device 100 includes at least one software function module that can be stored in the memory 11 in the form of software or firmware, or stored in the operating system of the computer device 10. The processor 12 can be used to execute the executable modules stored in the memory 11, such as the software function modules and computer programs included in the active circuit electromagnetic response characteristics modeling and analysis device 100. The computer device 10 can use the active circuit electromagnetic response characteristics modeling and analysis device 100 to quickly and accurately reproduce the actual electromagnetic response characteristics of a specified active circuit under a corresponding strong field environment, facilitating users to achieve rapid iterative optimization of active circuit design by individually optimizing wiring layouts or replacing circuit components.

[0038] It is understandable that Figure 1 The block diagram shown is only a schematic diagram of the composition of the computer device 10. The computer device 10 may also include Figure 1 More or fewer components than shown, or with Figure 1 Different configurations shown. Figure 1 Each component shown in the figure can be implemented by hardware, software or a combination thereof.

[0039] In this application, to ensure that the computer device 10 can organically combine the circuit splitting and scattering parameter testing operations with the scattering parameter cascade fusion analysis operations to quickly and accurately reproduce the actual electromagnetic response characteristics of the specified active circuit under the corresponding strong field environment, thereby facilitating rapid iterative optimization of the active circuit design, the embodiments of this application achieve the aforementioned objectives by providing a method for modeling and analyzing the electromagnetic response characteristics of active circuits. The active circuit electromagnetic response characteristics modeling and analysis method provided in this application is described in detail below.

[0040] Please refer to Figure 2 , Figure 2 FIG2 is a flow chart of a method for modeling and analyzing electromagnetic response characteristics of an active circuit provided by an embodiment of the present application. In the embodiment of the present application, the method for modeling and analyzing electromagnetic response characteristics of an active circuit may include steps S210 to S240.

[0041] Step S210 , obtaining a circuit layout design of the active circuit to be analyzed on a circuit carrier board, and actual scattering parameters of all circuit component units of the active circuit to be analyzed measured under a target strong field environment.

[0042] In this embodiment, the circuit carrier (i.e., a printed circuit board) is used to deploy and carry the active circuit to be analyzed; the circuit wiring design scheme is used to describe the circuit component unit distribution information (including the unit position information of all circuit component units on the circuit carrier, and the component port information of all circuit component units (i.e., the component ports of the corresponding circuit component units that need to be connected to unit connection wiring or other circuit component units)) when the active circuit to be analyzed is deployed on the circuit carrier, the unit connection wiring distribution information (including the wiring position information, wiring size information, and wiring shape information of all unit connection wirings on the circuit carrier, and the effective connection port information of all unit connection wirings associated with at least one circuit component unit (which may include the connection port of the corresponding unit connection wiring for connecting to the circuit component unit and / or the connection port used to serve as the input or output of a certain circuit component unit)), and the port connection information between all unit connection wirings and all circuit component units (which is used to record the connection relationship between the effective connection ports of all unit connection wirings and the component ports of all circuit component units).

[0043] Please refer to Figure 3 For any active circuit to be analyzed deployed on a circuit board, the designer can split it according to the accuracy requirements of electromagnetic response analysis to obtain circuit component units that mainly involve nonlinear characteristic changes (for example, Figure 3 1 to 4 in the circuit component units), and mainly involving linear characteristics containing only unit connection wiring (e.g. Figure 3 The circuit board for connecting the units 1 to 6). Figure 3 Taking the four circuit component units and six unit connection wirings shown as an example, circuit component unit 1 involves two component ports, circuit component unit 2 involves four component ports, circuit component unit 3 involves three component ports, and circuit component unit 4 involves four component ports. Unit connection wiring 1 is implemented by a circuit connection trace with effective connection ports 1 and 1', unit connection wiring 2 is implemented by a circuit connection trace with effective connection ports 2 and 2', unit connection wiring 3 is implemented by a circuit connection trace with effective connection ports 3, 3' and 3'', unit connection wiring 4 is implemented by two circuit connection traces that remain parallel as a whole (one of which has effective connection ports 4, 4' and 4'', and the other circuit connection trace has effective connection ports 5 and 5'), unit connection wiring 5 is implemented by a circuit connection trace with effective connection ports 6 and 6', unit connection wiring 6 is implemented by a circuit connection trace with effective connection ports 7 and 7', and unit connection wiring 7 is implemented by a circuit connection trace with effective connection ports 8 and 8'. Among them, the two component ports involved in the circuit component unit 1 are respectively connected to the effective connection port 1' of the unit connection wiring 1 and the effective connection port 2 of the unit connection wiring 2; the four component ports involved in the circuit component unit 2 are respectively connected to the effective connection port 2' of the unit connection wiring 2, the effective connection port 3 of the unit connection wiring 3, and the effective connection ports 4 and 5 of the unit connection wiring 4; the three component ports involved in the circuit component unit 3 are respectively connected to the effective connection port 4'' of the unit connection wiring 4, the effective connection port 6' of the unit connection wiring 5 and the effective connection port 7 of the unit connection wiring 6; the four component ports involved in the circuit component unit 4 are respectively connected to the effective connection port 3' of the unit connection wiring 3, the effective connection ports 4' and 5' of the unit connection wiring 4 and the effective connection port 8 of the unit connection wiring 7.

[0044] In this embodiment, after all circuit component units are separated from the active circuit to be analyzed, a vector network analyzer can be used to test the real scattering parameters of each circuit component unit in a real target strong field environment (i.e., any strong field environment). This ensures that the obtained real scattering parameters can effectively reflect the real component nonlinear behavior (including the high-order nonlinear effect status of the corresponding circuit component unit) of the corresponding circuit component unit in the target strong field environment through actual measurement of the circuit component S parameters. This eliminates the need to allocate a large amount of computing resources to perform nonlinear modeling on each circuit component unit, thereby avoiding complex nonlinear modeling errors.

[0045] In step S220 , based on the circuit wiring design, all unit connection wirings on the circuit carrier board that match the active circuit to be analyzed are modeled and simulated to obtain predicted scattering parameters of all unit connection wirings under the target strong field environment.

[0046] In this embodiment, after obtaining the circuit wiring design scheme of the active circuit to be analyzed on the circuit carrier board, it is possible to eliminate the need to perform nonlinear modeling and analysis operations on the circuit connection lines in a strong field environment based on the stable linear change characteristics of the circuit connection lines in a weak field environment or a strong field environment. At this time, all unit connection lines in the active circuit to be analyzed can be directly modeled and simulated based on the circuit wiring design scheme to accurately capture the high-frequency electromagnetic coupling effects of the circuit connection lines involved in the corresponding unit connection lines in the target strong field environment, ensure that the corresponding predicted scattering parameters can characterize the wiring electromagnetic coupling response of the active circuit to be analyzed in the target strong field environment, reduce the amount of circuit modeling calculations for the active circuit to be analyzed, thereby effectively improving the efficiency of the electromagnetic response characteristic modeling and analysis operations, and reducing the computing resource usage and implementation cost of the electromagnetic response characteristic modeling and analysis operations.

[0047] Alternatively, see Figure 4 , Figure 4 yes Figure 2 Flowchart of the sub-steps included in step S220 of the present application. In the embodiment of the present application, step S220 may include sub-steps S221 and S222 to accurately capture the high-frequency electromagnetic coupling effect of each unit connection wiring involved in the specified active circuit under the target strong field environment, ensuring that the obtained predicted scattering parameters can characterize the wiring electromagnetic coupling response of the corresponding unit connection wiring under the target strong field environment.

[0048] In sub-step S221, for each unit connection wiring on the circuit carrier that matches the active circuit to be analyzed, an overall simulation model of the unit connection wiring deployed on the circuit carrier is constructed based on the wiring position information, wiring size information, and wiring shape information recorded in the circuit wiring design plan for the unit connection wiring, as well as the valid connection port information associated with at least one circuit component unit of the unit connection wiring.

[0049] Sub-step S222 , calling the overall simulation model to perform full-wave simulation in a simulation environment of a target strong field environment, and obtaining predicted scattering parameters of the unit connection wiring in the target strong field environment.

[0050] In this embodiment, any one of the numerical simulation algorithms such as the finite element analysis algorithm and the time-domain finite difference algorithm can be used to perform full-wave simulation on the overall simulation model corresponding to any unit connection wiring, so as to achieve the function of accurately capturing the high-frequency electromagnetic coupling effect of the unit connection wiring under the target strong field environment.

[0051] Therefore, the present application can accurately capture the high-frequency electromagnetic coupling effect of each unit connection wiring involved in the specified active circuit under the target strong field environment by executing the above-mentioned sub-steps S221 to S222, and ensure that the obtained predicted scattering parameters can characterize the wiring electromagnetic coupling response of the corresponding unit connection wiring under the target strong field environment, so as to reduce the circuit modeling calculation amount of the active circuit to be analyzed and improve the efficiency of electromagnetic response characteristic modeling and analysis.

[0052] Step S230 , according to the circuit wiring design plan, constructing a cascade network of the actual scattering parameters of all circuit component units and the predicted scattering parameters of all unit connection wirings to obtain a theoretical scattering parameter cascade network.

[0053] In this embodiment, based on the circuit wiring design scheme, the actual scattering parameters of all circuit component units and the predicted scattering parameters of all unit connection wirings can be cascaded for all unit connection wirings and the port connection information recorded for all circuit component units to obtain a theoretical scattering parameter cascade network of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment.

[0054] by Figure 5 Shown with Figure 3 Take the theoretical scattering parameter cascade network of the active circuit to be analyzed as an example, Figure 5 Each dotted box network module corresponds to a circuit component unit. Figure 5 Each solid-line box network component module corresponds to a unit connection wiring separately. The actual scattering parameter of any dotted-line box network component module can be expressed as "sNp (where N is used to represent the number of component ports of the corresponding circuit component unit)", and the predicted scattering parameter of any solid-line box network component module can be expressed as "sMp (where M is used to represent the number of effective connection ports of the corresponding unit connection wiring)". Figure 5 The module cascade relationship between all the dotted-line network modules and all the solid-line network modules shown (which describes the port connection relationship between the module ports of all the dotted-line network modules and the module ports of all the solid-line network modules) is the same as Figure 3 The connection wiring of all units and the port connection information between all circuit component units remain consistent.

[0055] Alternatively, see Figure 6 , Figure 6 yes Figure 2 Flowchart of the sub-steps included in step S230 of FIG. In an embodiment of the present application, step S230 may include sub-steps S231 and S232 to achieve a cascaded fusion effect between the wiring simulation S-parameters (i.e., the predicted scattering parameters of all unit connection wirings) and the measured component S-parameters (i.e., the actual scattering parameters of all circuit component units) of the same active circuit, ensuring that the corresponding theoretical scattering parameter cascade network can reflect the overall scattering parameter coupling status of the active circuit to be analyzed, attached to the circuit carrier, under the target strong field environment.

[0056] Sub-step S231, determines the port cascade relationship between all unit connection wirings and all circuit component units based on the effective connection port information of all unit connection wirings in the circuit wiring design plan, the component port information of all circuit component units, and the port connection information between all unit connection wirings and all circuit component units recorded in the circuit wiring design plan.

[0057] Among them, the port cascade relationship records the effective connection port composition of all unit connection wirings used to serve as input ports, the effective connection port composition of all unit connection wirings used to serve as output ports, the component port composition of all circuit component units used for input ports, the component port composition of all circuit component units used for output ports, as well as the port connection relationship between the input port of each unit connection wiring and the output port of each circuit component unit, and the port connection relationship between the output port of each unit connection wiring and the input port of each circuit component unit.

[0058] Sub-step S232 , performing scattering parameter cascade processing on the actual scattering parameters of all circuit component units and the predicted scattering parameters of all unit connection wirings according to the port cascade relationship, to obtain a theoretical scattering parameter cascade network.

[0059] Therefore, the present application can achieve the cascade fusion effect between the wiring simulation S parameters and the measured S parameters of the components of the same active circuit by executing the above-mentioned sub-steps S231 to S232, ensuring that the corresponding theoretical scattering parameter cascade network can reflect the overall scattering parameter coupling status of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment.

[0060] In step S240 , a scattering parameter time-frequency analysis is performed on the theoretical scattering parameter cascade network to obtain theoretical electromagnetic response characteristic parameters of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment.

[0061] In this embodiment, the overall scattering parameters of the theoretical scattering parameter cascade network under the target strong field environment can be calculated based on the scattering parameters of each network component module in the theoretical scattering parameter cascade network, as well as the port cascade relationship between all unit connection wiring and all circuit component units. Then, by performing signal time-frequency analysis on the overall scattering parameters of the theoretical scattering parameter cascade network, the theoretical electromagnetic response characteristic parameters of the active circuit to be analyzed under the target strong field environment with the circuit substrate are obtained, thereby achieving the purpose of quickly and accurately reproducing the actual electromagnetic response characteristic conditions of the specified active circuit under the corresponding strong field environment. At this time, for the active circuit to be analyzed, the rapid iterative optimization effect of the active circuit design can be achieved by individually optimizing the routing layout or replacing circuit components.

[0062] Alternatively, see Figure 6 , Figure 7 yes Figure 2 Flowchart of the sub-steps included in step S240 of FIG. In an embodiment of the present application, step S240 may include sub-steps S241 to S243, so as to achieve rapid collaborative analysis of wiring electromagnetic coupling effects and component nonlinear behaviors through cascaded fusion analysis of scattering parameters, thereby facilitating rapid and accurate reproduction of the actual electromagnetic response characteristics of a specified active circuit under a corresponding strong field environment.

[0063] Sub-step S241 , calculating the overall scattering parameters of the theoretical scattering parameter cascade network in the target strong field environment based on the actual scattering parameters of all circuit component units and the predicted scattering parameters of all unit connection wirings.

[0064] In this embodiment, for the network component modules corresponding to all the circuit component units and all the unit connection wirings in the theoretical scattering parameter cascade network, the scattering parameters of the network component modules can be converted into transmission parameters (i.e., T parameters) according to the input port information and output port information of the network component modules at the active circuit to be analyzed, so as to obtain a theoretical transmission parameter matrix of the network component modules at the theoretical scattering parameter cascade network. Then, according to the port cascade relationship between all the unit connection wirings and all the circuit component units, a matrix cascade operation is performed on the theoretical transmission parameter matrices of all the network component modules in the theoretical scattering parameter cascade network to obtain an overall transmission parameter matrix of the theoretical scattering parameter cascade network. Finally, a scattering parameter conversion is performed on the overall transmission parameter matrix to obtain the overall scattering parameters of the theoretical scattering parameter cascade network under the target strong field environment.

[0065] Among them, when the first The network component module and When the network components are cascaded, if the Network components include input ports and output port, and the Network components include input ports and output port, then The theoretical transmission parameter matrix of the network component modules can be divided into input ports and The sub-matrix set of output ports, The theoretical transmission parameter matrix of the network component modules can be divided into input ports and The sub-matrix set of output ports, at this time The network component modules and The theoretical transmission parameter matrices of each network component module can be expressed as and ,in Used to indicate the The theoretical transmission parameter matrix of the network component modules, Used to indicate the The theoretical transmission parameter matrix of the network component modules, Used to indicate the The network component module is in The input port and The transmission parameter submatrix between the output ports, Used to indicate the The network component module is in The input port and The transmission parameter submatrix between the output ports; the matrix cascade operation between the theoretical transmission parameter matrices of the two network component modules can be expressed as " ",in Used to represent the result of the cascade operation of the theoretical transmission parameter matrix between the two network components.

[0066] Sub-step S242, performing signal time domain analysis and signal frequency domain analysis based on the overall scattering parameters of the theoretical scattering parameter cascade network, and obtaining time domain response analysis results and frequency domain response analysis results of the active circuit to be analyzed based on the circuit carrier in the target strong field environment.

[0067] Sub-step S243 , performing data integration analysis on the time domain response analysis results and the frequency domain response analysis results to obtain theoretical electromagnetic response characteristic parameters of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment.

[0068] Therefore, the present application can realize rapid collaborative analysis of wiring electromagnetic coupling effects and component nonlinear behaviors by executing the above-mentioned sub-steps S241 to S243 through scattering parameter cascade fusion analysis operations, so as to facilitate rapid and accurate reproduction of the actual electromagnetic response characteristics of the specified active circuit under the corresponding strong field environment.

[0069] The present application can quickly and accurately reproduce the actual electromagnetic response characteristics of the specified active circuit under the corresponding strong field environment by executing the above-mentioned steps S210 to S240, through the organic combination of the circuit splitting test scattering parameter operation and the scattering parameter cascade fusion analysis operation, thereby facilitating the rapid iterative optimization effect of the active circuit design.

[0070] In this application, to ensure that the computer device 10 can execute the above-mentioned active circuit electromagnetic response characteristic modeling and analysis method through the active circuit electromagnetic response characteristic modeling and analysis device 100, this application implements the aforementioned functions by dividing the active circuit electromagnetic response characteristic modeling and analysis device 100 into functional modules. The specific components of the active circuit electromagnetic response characteristic modeling and analysis device 100 provided in this application are described below.

[0071] Please refer to Figure 8 , Figure 8 FIG2 is a schematic diagram illustrating the components of an active circuit electromagnetic response characteristics modeling and analysis device 100 provided in an embodiment of the present application. In this embodiment of the present application, the active circuit electromagnetic response characteristics modeling and analysis device 100 may include a circuit measurement acquisition module 110, a wiring modeling and simulation module 120, a scattering parameter cascade module 130, and an electromagnetic response analysis module 140.

[0072] The circuit measurement acquisition module 110 is used to obtain the circuit wiring design scheme of the active circuit to be analyzed on the circuit carrier board, and the actual scattering parameters of all circuit component units of the active circuit to be analyzed measured in the target strong field environment.

[0073] The wiring modeling and simulation module 120 is used to model and simulate all unit connection wirings on the circuit carrier that match the active circuit to be analyzed based on the circuit wiring design scheme, and obtain the predicted scattering parameters of all unit connection wirings under the target strong field environment.

[0074] The scattering parameter cascade module 130 is used to construct a cascade network based on the actual scattering parameters of all circuit component units and the predicted scattering parameters of all unit connection wirings according to the circuit wiring design scheme to obtain a theoretical scattering parameter cascade network.

[0075] The electromagnetic response analysis module 140 is used to perform a scattering parameter time-frequency analysis on the theoretical scattering parameter cascade network to obtain theoretical electromagnetic response characteristic parameters of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment.

[0076] Alternatively, see Figure 9 , Figure 9 yes Figure 8 FIG. 1 is a schematic diagram of the module composition of the electromagnetic response analysis module 140 in FIG. In the embodiment of the present application, the electromagnetic response analysis module 140 may include an overall scattering evaluation submodule 141 , a signal time-frequency analysis submodule 142 , and a time-frequency integration analysis submodule 143 .

[0077] The overall scattering evaluation submodule 141 is used to calculate the overall scattering parameters of the theoretical scattering parameter cascade network in the target strong field environment based on the actual scattering parameters of all the circuit component units and the predicted scattering parameters of all the unit connection wirings.

[0078] The signal time-frequency analysis submodule 142 is used to perform signal time domain analysis and signal frequency domain analysis based on the overall scattering parameters of the theoretical scattering parameter cascade network, and obtain the time domain response analysis results and frequency domain response analysis results of the active circuit to be analyzed based on the circuit carrier in the target strong field environment.

[0079] The time-frequency integration analysis submodule 143 is used to perform data integration analysis on the time domain response analysis results and the frequency domain response analysis results to obtain theoretical electromagnetic response characteristic parameters of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment.

[0080] In this embodiment, the overall scattering evaluation submodule 141 calculates the overall scattering parameters of the theoretical scattering parameter cascade network under the target strong field environment based on the actual scattering parameters of all circuit component units and the predicted scattering parameters of all unit connection wirings, including: For each network component module corresponding to each of all the circuit component units and all the unit connection wirings in the theoretical scattering parameter cascade network, performing transmission parameter conversion on the scattering parameters of the network component module according to input port information and output port information of the network component module at the active circuit to be analyzed, to obtain a theoretical transmission parameter matrix of the network component module at the theoretical scattering parameter cascade network; performing a matrix cascade operation on the theoretical transmission parameter matrices of all network component modules in the theoretical scattering parameter cascade network according to the port cascade relationship between all the unit connection wirings and all the circuit component units, to obtain an overall transmission parameter matrix of the theoretical scattering parameter cascade network; The overall transmission parameter matrix is ​​subjected to scattering parameter conversion to obtain the overall scattering parameters of the theoretical scattering parameter cascade network under the target strong field environment.

[0081] It should be noted that the basic principles and technical effects of the active circuit electromagnetic response characteristics modeling and analysis device 100 provided in the embodiments of this application are the same as those of the aforementioned active circuit electromagnetic response characteristics modeling and analysis method. For the sake of brevity, any details not mentioned in this embodiment can be referred to the description of the aforementioned active circuit electromagnetic response characteristics modeling and analysis method.

[0082] In the embodiments provided in this application, it should be understood that the disclosed devices and methods can also be implemented in other ways. The device embodiments described above are merely schematic. For example, the flowcharts and block diagrams in the accompanying drawings show the possible architectures, functions and operations of the devices, methods and computer program products according to the embodiments of the present application. In this regard, each box in the flowchart or block diagram can represent a module, a program segment or a part of a code, and the module, program segment or a part of the code contains one or more executable instructions for implementing the specified logical functions. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in an order different from that marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram and / or flowchart, and the combination of boxes in the block diagram and / or flowchart, can be implemented using a dedicated hardware-based system that performs the specified function or action, or can be implemented using a combination of dedicated hardware and computer instructions.

[0083] In addition, the functional modules in the various embodiments of the present application can be integrated together to form a single component, each module can exist independently, or two or more modules can be integrated to form a single component. If the functions are implemented in the form of software functional modules and sold or used as independent products, they can be stored in a readable storage medium. Based on this understanding, the technical solution of the present application, or the portion that contributes to the prior art, or the portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a readable storage medium and includes several instructions for causing a computer device (which can be a personal computer, server, or network device, etc.) to perform all or part of the steps of the method described in the various embodiments of the present application. The aforementioned readable storage medium includes various media that can store program code, such as a USB flash drive, a mobile hard drive, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0084] The above are merely various embodiments of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of this application. Therefore, the scope of protection of this application should be based on the scope of protection of the claims.

Claims

1. A method for modeling and analyzing the electromagnetic response characteristics of an active circuit, characterized in that: The method comprises: Obtaining a circuit wiring design scheme of the active circuit to be analyzed on a circuit carrier board, and actual scattering parameters of all circuit component units of the active circuit to be analyzed measured under a target strong field environment; Based on the circuit wiring design scheme, modeling and simulating all unit connection wirings on the circuit carrier board that match the active circuit to be analyzed to obtain predicted scattering parameters of all unit connection wirings under the target strong field environment; According to the circuit wiring design scheme, constructing a cascade network of the actual scattering parameters of all the circuit component units and the predicted scattering parameters of all the unit connection wirings to obtain a theoretical scattering parameter cascade network; A scattering parameter time-frequency analysis is performed on the theoretical scattering parameter cascade network to obtain theoretical electromagnetic response characteristic parameters of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment.

2. The method according to claim 1, characterized in that The step of modeling and simulating all unit connection wirings on the circuit carrier board that match the active circuit to be analyzed based on the circuit wiring design scheme to obtain predicted scattering parameters of all unit connection wirings under the target strong field environment includes: For each unit connection wiring on the circuit carrier that matches the active circuit to be analyzed, constructing an overall simulation model of the unit connection wiring deployed on the circuit carrier based on wiring position information, wiring size information, and wiring shape information recorded in the circuit wiring design plan for the unit connection wiring, as well as valid connection port information associated with at least one circuit component unit of the unit connection wiring; The overall simulation model is called to perform full-wave simulation in a simulation environment of the target strong field environment to obtain predicted scattering parameters of the unit connection wiring in the target strong field environment.

3. The method according to claim 1, characterized in that The step of constructing a cascade network of the actual scattering parameters of all the circuit component units and the predicted scattering parameters of all the unit connection wirings according to the circuit wiring design scheme to obtain a theoretical scattering parameter cascade network includes: Determining a port cascade relationship between all the unit connection wirings and all the circuit component units based on valid connection port information of each of all the unit connection wirings in the circuit wiring design, component port information of each of all the circuit component units, and port connection information between all the unit connection wirings and all the circuit component units recorded in the circuit wiring design; According to the port cascade relationship, scattering parameter cascade processing is performed on the respective real scattering parameters of all the circuit component units and the respective predicted scattering parameters of all the unit connection wirings to obtain the theoretical scattering parameter cascade network.

4. The method according to any one of claims 1 to 3, characterized in that The step of performing a scattering parameter time-frequency analysis on the theoretical scattering parameter cascade network to obtain theoretical electromagnetic response characteristic parameters of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment includes: Calculating the overall scattering parameters of the theoretical scattering parameter cascade network under the target strong field environment based on the respective real scattering parameters of all the circuit component units and the respective predicted scattering parameters of all the unit connection wirings; Performing signal time domain analysis and signal frequency domain analysis based on the overall scattering parameters of the theoretical scattering parameter cascade network to obtain time domain response analysis results and frequency domain response analysis results of the active circuit to be analyzed based on the circuit carrier in the target strong field environment; Data integration analysis is performed on the time domain response analysis results and the frequency domain response analysis results to obtain theoretical electromagnetic response characteristic parameters of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment.

5. The method according to claim 4, characterized in that The step of calculating the overall scattering parameters of the theoretical scattering parameter cascade network under the target strong field environment based on the respective real scattering parameters of all the circuit component units and the respective predicted scattering parameters of all the unit connection wirings comprises: For each network component module corresponding to each of all the circuit component units and all the unit connection wirings in the theoretical scattering parameter cascade network, performing transmission parameter conversion on the scattering parameters of the network component module according to input port information and output port information of the network component module at the active circuit to be analyzed, to obtain a theoretical transmission parameter matrix of the network component module at the theoretical scattering parameter cascade network; performing a matrix cascade operation on the theoretical transmission parameter matrices of all network component modules in the theoretical scattering parameter cascade network according to the port cascade relationship between all the unit connection wirings and all the circuit component units, to obtain an overall transmission parameter matrix of the theoretical scattering parameter cascade network; The overall transmission parameter matrix is ​​subjected to scattering parameter conversion to obtain the overall scattering parameters of the theoretical scattering parameter cascade network under the target strong field environment.

6. A device for modeling and analyzing electromagnetic response characteristics of an active circuit, characterized in that: The device comprises: A circuit measurement acquisition module is used to obtain a circuit wiring design scheme of the active circuit to be analyzed on a circuit carrier board, and actual scattering parameters of all circuit component units of the active circuit to be analyzed measured under a target strong field environment; a wiring modeling and simulation module for modeling and simulating all unit connection wirings on the circuit carrier board that match the active circuit to be analyzed based on the circuit wiring design scheme, and obtaining predicted scattering parameters of all unit connection wirings under the target strong field environment; a scattering parameter cascade module, configured to construct a cascade network based on the actual scattering parameters of all circuit component units and the predicted scattering parameters of all unit connection wirings according to the circuit wiring design scheme, to obtain a theoretical scattering parameter cascade network; The electromagnetic response analysis module is used to perform scattering parameter time-frequency analysis on the theoretical scattering parameter cascade network to obtain theoretical electromagnetic response characteristic parameters of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment.

7. The device according to claim 6, characterized in that The electromagnetic response analysis module includes: An overall scattering evaluation submodule is configured to calculate the overall scattering parameters of the theoretical scattering parameter cascade network under the target strong field environment based on the respective real scattering parameters of all the circuit component units and the respective predicted scattering parameters of all the unit connection wirings; a signal time-frequency analysis submodule, configured to perform signal time-domain analysis and signal frequency-domain analysis based on the overall scattering parameters of the theoretical scattering parameter cascade network, and obtain a time-domain response analysis result and a frequency-domain response analysis result of the active circuit to be analyzed based on the circuit carrier in the target strong field environment; The time-frequency integration analysis submodule is used to perform data integration analysis on the time domain response analysis results and the frequency domain response analysis results to obtain theoretical electromagnetic response characteristic parameters of the active circuit to be analyzed attached to the circuit carrier under the target strong field environment.

8. The device according to claim 7, characterized in that The overall scattering evaluation submodule calculates the overall scattering parameters of the theoretical scattering parameter cascade network under the target strong field environment based on the respective real scattering parameters of all the circuit component units and the respective predicted scattering parameters of all the unit connection wirings, including: For each network component module corresponding to each of all the circuit component units and all the unit connection wirings in the theoretical scattering parameter cascade network, performing transmission parameter conversion on the scattering parameters of the network component module according to input port information and output port information of the network component module at the active circuit to be analyzed, to obtain a theoretical transmission parameter matrix of the network component module at the theoretical scattering parameter cascade network; performing a matrix cascade operation on the theoretical transmission parameter matrices of all network component modules in the theoretical scattering parameter cascade network according to the port cascade relationship between all the unit connection wirings and all the circuit component units, to obtain an overall transmission parameter matrix of the theoretical scattering parameter cascade network; The overall transmission parameter matrix is ​​subjected to scattering parameter conversion to obtain the overall scattering parameters of the theoretical scattering parameter cascade network under the target strong field environment.

9. A computer device, characterized in that: The method comprises a processor and a memory, wherein the memory stores a computer program that can be executed by the processor, and the processor can execute the computer program to implement the active circuit electromagnetic response characteristic modeling and analysis method according to any one of claims 1 to 5.

10. A readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a computer device, the active circuit electromagnetic response characteristic modeling and analysis method according to any one of claims 1 to 5 is implemented.

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