Spatial experiment sample temperature processing device and spatial fluid physical experiment cabinet

Abstract

The invention relates to a space experiment sample temperature processing device and a space fluid physics experiment cabinet, and the space experiment sample temperature processing device comprises a housing, an alternating temperature on-orbit sample drawer, a constant temperature on-orbit sample drawer, an alternating temperature descending sample drawer and a constant temperature descending sample drawer. An alternating temperature on-orbit sample cavity, a constant temperature on-orbit sample cavity, an alternating temperature descending sample cavity and a constant temperature descending sample cavity are arranged in the shell, an alternating temperature on-orbit sample drawer is arranged in the alternating temperature on-orbit sample cavity, and a constant temperature on-orbit sample drawer is arranged in the constant temperature on-orbit sample cavity; the alternating temperature descending sample drawer is arranged in the alternating temperature descending sample cavity, and the constant temperature descending sample drawer is arranged in the constant temperature descending sample cavity; the shell is provided with a temperature regulating mechanism for regulating and controlling the temperature of the alternating temperature on-orbit sample drawer, the constant temperature on-orbit sample drawer, the alternating temperature descending sample drawer and the constant temperature descending sample drawer.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of space fluid science experiment, in particular to a space experiment sample temperature processing device and a space fluid physics experiment cabinet. BACKGROUND

[0002] Solid-liquid phase change is a widely existing natural phenomenon, and has wide application in renewable energy heat storage, new energy vehicle heat management, industrial waste heat utilization, aerospace engineering and other fields. In aerospace engineering, solid-liquid phase change is the core technology for solving the time, space and intensity incoordination of thermal load under extreme high-low temperature alternating environment. However, the low power density of existing space solid-liquid phase change restricts the development of space high-power energy utilization and heat management technology, such as deep space exploration spacecraft, long-term space mission spacecraft, space-based directed energy weapons and the like. The existing bottleneck problem of restricting power density is: low thermal conductivity of phase change material, high thermal resistance of non-contact melting, and non-uniformity of solidification.

[0003] In view of the above problems, the present application mainly focuses on the scientific problem of "microgravity environment adaptive high thermal conductivity and low viscosity nano composite phase change material micro mechanism and structure construction method", uses the "complex fluid module" in the "fluid physics experiment cabinet", studies the dispersion and aggregation behavior of nano composite phase change material under space phase change thermal environment, analyzes the evolution law of material microstructure and basic thermal properties such as thermal conductivity and viscosity in microgravity phase change process, and guides the optimization of phase change material structure construction. Therefore, according to the needs of scientific experiment, it is urgent to develop nano composite phase change material experiment unit and the like for providing microgravity thermal environment for melting-solidification phase change and optical test of nano composite phase change material. SUMMARY

[0004] The present application provides a space experiment sample temperature processing device and a space fluid physics experiment cabinet to solve one or several technical problems existing in the prior art.

[0005] The technical scheme for solving the above technical problems is as follows: a space experiment sample temperature processing device, comprising a shell, an alternating temperature on-orbit sample drawer, a constant temperature on-orbit sample drawer, an alternating temperature downlink sample drawer and a constant temperature downlink sample drawer, wherein the shell is provided with an alternating temperature on-orbit sample cavity, a constant temperature on-orbit sample cavity, an alternating temperature downlink sample cavity and a constant temperature downlink sample cavity, the alternating temperature on-orbit sample drawer is arranged in the alternating temperature on-orbit sample cavity, the constant temperature on-orbit sample drawer is arranged in the constant temperature on-orbit sample cavity, the alternating temperature downlink sample drawer is arranged in the alternating temperature downlink sample cavity, and the constant temperature downlink sample drawer is arranged in the constant temperature downlink sample cavity; the shell is provided with a temperature adjusting mechanism for temperature regulation of the alternating temperature on-orbit sample drawer, the constant temperature on-orbit sample drawer, the alternating temperature downlink sample drawer and the constant temperature downlink sample drawer.

[0006] The space experiment sample temperature treatment device has the advantages that the space experiment sample temperature treatment device is provided with a shell, alternating temperature on-orbit sample drawers, constant temperature on-orbit sample drawers, alternating temperature downlink sample drawers and constant temperature downlink sample drawers are arranged in the shell, and a temperature adjusting mechanism is used for temperature adjustment, so that the sample can be maintained at a specific temperature in a sample test state and a sample treatment state, and the space experiment conditions of nanocomposites can be met, thereby providing a basic condition for research on nanocomposite phase change materials.

[0007] Based on the above technical solution, the application can be further improved as follows.

[0008] Further, the temperature adjusting mechanism comprises heating fins and refrigeration fins, the inner side walls of the alternating temperature on-orbit sample cavity, the constant temperature on-orbit sample cavity, the alternating temperature downlink sample cavity and the constant temperature downlink sample cavity are each provided with a heating fin, and the outer side walls of the alternating temperature on-orbit sample cavity and the alternating temperature downlink sample cavity are each provided with a refrigeration fin.

[0009] The alternating temperature on-orbit sample cavity, the constant temperature on-orbit sample cavity, the alternating temperature downlink sample cavity and the constant temperature downlink sample cavity are each provided with a heating fin, and the outer side walls of the alternating temperature on-orbit sample cavity and the alternating temperature downlink sample cavity are each provided with a refrigeration fin.

[0010] Further, the temperature adjusting mechanism further comprises heat dissipation fans and uniform temperature fans, one uniform temperature fan is arranged at a position corresponding to the alternating temperature on-orbit sample cavity and the alternating temperature downlink sample cavity on the shell, and the hot end of the refrigeration fin is provided with a heat dissipation fan.

[0011] The alternating temperature on-orbit sample cavity, the constant temperature on-orbit sample cavity, the alternating temperature downlink sample cavity and the constant temperature downlink sample cavity are each provided with a heating fin, and the outer side walls of the alternating temperature on-orbit sample cavity and the alternating temperature downlink sample cavity are each provided with a refrigeration fin.

[0012] Further, the constant temperature on-orbit sample drawer and the alternating temperature on-orbit sample drawer each comprise a microscopic analysis sample groove, a turbidity analysis sample groove and a light scattering analysis sample groove, and the inner side walls of the microscopic analysis sample groove, the turbidity analysis sample groove and the light scattering analysis sample groove are each provided with a first limiting spring.

[0013] Further, the constant temperature downlink sample drawer and the alternating temperature downlink sample drawer each comprise a downlink sample groove, and the inner side wall of the downlink sample groove is provided with a second limiting spring.

[0014] Further, the bottom of the shell is provided with an electric control box, the electric control box is provided with a power supply board, a main control board, a temperature control board, a collection board and a TEC control board, the power supply board is electrically connected with the main control board, the temperature control board, the collection board and the TEC control board, the main control board is electrically connected with the temperature control board, the collection board and the TEC control board, and the collection board is electrically connected with the temperature control board and the TEC control board.

[0015] The temperature sensor is arranged in the position corresponding to each sample drawer in the shell;

[0016] The collection board is electrically connected with the temperature sensor, and is used for collecting the temperature signal detected by the temperature sensor and sending the temperature signal to the temperature control board. The TEC control board is electrically connected with the refrigeration sheet and starts the refrigeration sheet to refrigerate or stops the refrigeration sheet under the control of the main control board.

[0017] Further, when the sample drawer is in a test state, the corresponding heating sheet of the sample drawer is controlled in a closed loop by the temperature control board, the temperature sensor corresponding to the sample drawer, the collection board and the main control board, so that the temperature in the sample drawer is maintained in a first set temperature range.

[0018] When the sample drawer is in a processing state, the corresponding heating sheet and refrigeration sheet of the sample drawer are controlled in a closed loop by the temperature control board, the temperature sensor corresponding to the sample drawer, the TEC control board, the collection board and the main control board, so that the temperature in the sample drawer is cyclically changed between a first set temperature range maintained for a first preset time and a second set temperature range maintained for a second preset time.

[0019] Further, the first set temperature range is 42℃±1℃, and the second set temperature range is 29℃±1℃.

[0020] Further, when the on-track sample drawer with alternating temperature, the on-track sample drawer with constant temperature, the down-track sample drawer with alternating temperature and the down-track sample drawer with constant temperature are placed in the shell, the front panel of each sample drawer is connected with the front panel of the shell through loose screws.

[0021] A space fluid physical experiment cabinet includes an experiment cabinet body, and further includes the space experiment sample temperature processing device.

[0022] The space fluid physical experiment cabinet of the present application sets the space experiment sample temperature processing device in the experiment cabinet body, and can use the related detection equipment in the experiment cabinet body to detect the sample after temperature processing, thereby providing a basis for studying the solid-liquid phase change process of the nano composite phase change material. BRIEF DESCRIPTION OF DRAWINGS

[0023] Figure 1 The space experiment sample temperature processing device of the present application does not have a drawer Figure 1 ;

[0024] Figure 2 The structure diagram of the space experiment sample temperature treatment device without drawer Figure 2 ;

[0025] Figure 3 The structure diagram of the space experiment sample temperature treatment device

[0026] Figure 4 The structure diagram of the alternating temperature on-orbit sample drawer

[0027] Figure 5 The structure diagram of the alternating temperature downlink sample drawer

[0028] Figure 6 The assembly position diagram of the space experiment sample temperature treatment device in the experiment cabinet body

[0029] In the drawings, the components represented by each reference numeral are listed as follows:

[0030] 100, shell; 101, alternating temperature on-orbit sample drawer; 102, constant temperature on-orbit sample drawer; 103, alternating temperature downlink sample drawer; 104, constant temperature downlink sample drawer; 106, alternating temperature on-orbit sample cavity; 107, constant temperature on-orbit sample cavity; 108, alternating temperature downlink sample cavity; 109, constant temperature downlink sample cavity; 110, heating sheet; 111, refrigeration sheet; 112, heat dissipation fan; 113, uniform temperature fan; 114, first limiting elastic sheet; 115, microscopic analysis sample groove; 116, downlink sample groove; 117, light scattering analysis sample groove; 118, second limiting elastic sheet;

[0031] 400, electric control box

[0032] 500, experiment cabinet body; 501, first light path; 502, second light path; 503, slide rail DETAILED DESCRIPTION

[0033] The principles and features of the present application are described below in conjunction with the drawings, and the examples are only used to explain the present application and not to limit the scope of the present application.

[0034] As Figures 1-5As shown, the space experiment sample temperature processing device of this embodiment includes a housing 100, an alternating temperature on-rail sample drawer 101, a constant temperature on-rail sample drawer 102, an alternating temperature downstream sample drawer 103, and a constant temperature downstream sample drawer 104. The housing 100 is provided with an alternating temperature on-rail sample chamber 106, a constant temperature on-rail sample chamber 107, an alternating temperature downstream sample chamber 108, and a constant temperature downstream sample chamber 109. The alternating temperature on-rail sample drawer 101 is arranged in the alternating temperature on-rail sample chamber 106, the constant temperature on-rail sample drawer 102 is arranged in the constant temperature on-rail sample chamber 107, the alternating temperature downstream sample drawer 103 is arranged in the alternating temperature downstream sample chamber 108, and the constant temperature downstream sample drawer 104 is arranged in the constant temperature downstream sample chamber 109; the housing 100 is provided with a temperature regulating mechanism for regulating the temperatures of the alternating temperature on-rail sample drawer 101, the constant temperature on-rail sample drawer 102, the alternating temperature downstream sample drawer 103, and the constant temperature downstream sample drawer 104.

[0035] like Figure 2 As shown, the temperature adjustment mechanism of this embodiment includes a heating plate 110 and a cooling plate 111. The heating plates 110 are provided on the inner walls of the alternating temperature rail sample chamber 106, the constant temperature rail sample chamber 107, the alternating temperature downlink sample chamber 108, and the constant temperature downlink sample chamber 109. The cooling plates 111 are provided on the outer walls of the alternating temperature rail sample chamber 106 and the alternating temperature downlink sample chamber 108. By providing the heating plates and cooling plates, the sample chambers can be subjected to constant temperature control or alternating temperature control.

[0036] like Figures 1-4 As shown, the temperature adjustment mechanism of this embodiment further includes a heat dissipation fan 112 and a temperature equalization fan 113. A temperature equalization fan 113 is provided on the housing 100 at positions corresponding to the alternating temperature on-track sample chamber 106 and the alternating temperature downlink sample chamber 108. A heat dissipation fan 112 is provided at the hot end of the cooling fin 111. The heat dissipation fan can dissipate heat from the cooling fin, and the temperature equalization fan can equalize the temperature of the corresponding sample chamber.

[0037] like Figure 4 As shown, the constant temperature on-track sample drawer 102 and the alternating temperature on-track sample drawer 101 of this embodiment both include a microscopic analysis sample slot 115, a turbidity analysis sample slot, and a light scattering analysis sample slot 117. The inner side walls of the microscopic analysis sample slot 115, the turbidity analysis sample slot, and the light scattering analysis sample slot 117 are all provided with a first limiting spring 114.

[0038] like Figure 5As shown, the descending sample drawer 104 and the alternating temperature descending sample drawer 103 of the present embodiment each include a descending sample slot 116, and a second limiting elastic sheet 118 is arranged on the inner side wall of the descending sample slot 116.

[0039] As shown, the bottom of the shell is provided with an electric control box 400, and the electric control box 400 is provided with a power board, a main control board, a temperature control board, a collection board and a TEC control board. The power board is electrically connected with the main control board, the temperature control board, the collection board and the TEC control board respectively. The main control board is electrically connected with the temperature control board, the collection board and the TEC control board respectively. The collection board is electrically connected with the temperature control board and the TEC control board respectively. Figures 1-3

[0040] The shell 100 is provided with a temperature sensor corresponding to the position of each sample drawer. The collection board is electrically connected with the temperature sensor, and is used to send the temperature signal detected by the temperature sensor to the temperature control board. The temperature control board is electrically connected with the heating sheet and is controlled by the main control board to start the heating sheet to heat or stop the heating sheet from working. The TEC control board is electrically connected with the refrigeration sheet and is controlled by the main control board to start the refrigeration sheet to refrigerate or stop the refrigeration sheet from working.

[0041] Specifically, when the sample drawer is in a testing state, the heating sheet corresponding to the sample drawer is controlled in a closed loop by the temperature control board, the temperature sensor corresponding to the sample drawer, the collection board and the main control board, so that the temperature in the sample drawer is maintained in a first set temperature range. When the sample drawer is in a processing state, the sample needs to be provided with a cycle temperature condition of "melting-solidification", and the heating sheet 110 and the refrigeration sheet 111 corresponding to the sample drawer are controlled in a closed loop by the temperature control board, the temperature sensor corresponding to the sample drawer, the TEC control board, the collection board and the main control board, so that the temperature in the sample drawer is cyclically changed between the first set temperature range for a first preset time and the second set temperature range for a second preset time. Preferably, the first set temperature range is 42℃±1℃, and the second set temperature range is 29℃±1℃. Specifically, when the sample temperature reaches 42℃±1℃, the heating sheet is powered off and the semiconductor refrigeration sheet is started after maintaining for an indefinite time of 90min. When the sample temperature is lower than 29℃±1℃, the semiconductor refrigeration sheet is turned off and the heating sheet is started after maintaining for a preset time of 30min.

[0042] As shown, Figure 3 ​As shown, when the alternating temperature on-orbit sample drawer 101, the constant temperature on-orbit sample drawer 102, the alternating temperature downlink sample drawer 103 and the constant temperature downlink sample drawer 104 are placed in the shell 100, the front panel of each sample drawer is connected with the front panel of the shell 100 through loose screws; and a pull handle is arranged on the front panel of each sample drawer. The alternating temperature on-orbit sample drawer 101, the constant temperature on-orbit sample drawer 102, the alternating temperature downlink sample drawer 103 and the constant temperature downlink sample drawer 104 are arranged in the shell 100 through guide rails and grooves, that is, grooves are arranged in the cavities of the shell 100, and guide rails are arranged at the bottom of the drawers.

[0043] The main structure of the shell and the main structure of the electric control box of the embodiment are all spliced by high-strength titanium alloy materials, and the shell and the electric control box provide mounting interfaces and the like to the inside and outside.

[0044] The purpose of the space experiment sample temperature processing device is to provide a specific temperature processing environment for samples and to provide heat dissipation support for each electrical equipment so that each equipment can work in a good thermal environment. According to the thermal control interface of the space experiment sample temperature processing device and the sample environment requirements, the heating components, the refrigeration components, the fan and the temperature sensor are integrated in the closed structure to realize the alternating temperature zone. The heating components and the temperature sensor are integrated in the closed structure to realize the constant temperature zone, and the PID temperature closed loop control function is realized by an independent electronic module.

[0045] According to the temperature requirements of the constant temperature drawer, the sample drawer needs to be in a constant temperature environment of 42℃±1℃, and local high temperature cannot appear; the temperature of the unit shell cannot have a great influence on the whole experiment cabinet. As described above, active temperature control is adopted for the sample drawer, and the following measures are mainly taken: 1. The constant temperature drawer is divided into upper and lower sample drawers, the upper part is an on-orbit experiment group, and the lower part is a downlink group. Both the upper and lower modules have no heat consumption. 2. The electric heating sheet is attached to the right side wall of the sample drawer, the temperature control point is arranged on the top plate, and the temperature measuring point is arranged on the side wall. The design adopts a control unit to control the internal temperature of the sample drawer through a PID closed loop. When the sample temperature is lower than 42℃±1℃, the heating sheet starts to work; when the sample temperature reaches 42℃±1℃, the heating sheet stops working. 3. To improve the heat preservation effect, multiple layers of heat insulation components are installed on the wall of the sample drawer.

[0046] The alternating temperature drawer mainly requires the environment temperature in the sample drawer to realize periodic alternation between 29℃ and 42℃, and local high temperature should not appear; the unit shell temperature should not have too great influence on the whole experiment cabinet. In summary, the following measures are taken for the sample drawer with active temperature control: 1. The alternating temperature drawer is divided into upper and lower sample drawers, the upper part is the on-orbit experiment group, and the lower part is the descending group. Both the upper and lower modules have no heat consumption. 2. The electric heating sheet is attached to the right side wall of the sample drawer, the semiconductor refrigeration sheet is attached to the left side wall, the temperature control point is arranged on the top plate, and the temperature measuring point is arranged on the side wall. The internal temperature of the sample drawer is controlled by the PID closed loop control unit. When the sample is tested, the electric heating sheet is turned on and off to maintain the sample temperature of 42℃±1℃. When the sample temperature reaches 42℃±1℃, the electric heating sheet is turned off and the semiconductor refrigeration sheet is started after 90 minutes; when the sample temperature is lower than 29℃±1℃, the semiconductor refrigeration sheet is turned off and the electric heating sheet is started after 60 minutes. The heat generated by the semiconductor refrigeration sheet is dissipated by the cooling fan. 3. The fan is installed on the back plate of the sample drawer to generate forced convection, the air in the sample drawer flows uniformly, and the temperature uniformity is ensured. The heating and cooling rates are determined according to the actual capacity of the electric heating sheet and the semiconductor refrigeration sheet. 4. In order to improve the heat preservation effect, the multi-layer heat insulation assembly is installed on the wall of the sample drawer.

[0047] The top plate, middle plate and bottom plate of the shell of the embodiment are designed in one body, and the three structural plates span the alternating and constant temperature regions, so that a metal material titanium alloy with low thermal conductivity needs to be selected. A heat preservation and insulation layer is designed on the outer layer of the shell to reduce heat leakage. A heat insulation layer is installed between the alternating temperature sample area and the constant temperature sample area to reduce heat exchange between the high and low temperature areas. The heat preservation and insulation layer has, from inside to outside, titanium alloy main structure-multilayer heat insulation assembly-polyimide heat preservation layer. The internal part is a 6mm titanium alloy structure, which is the main structure of the experiment unit; the middle part is 5.5mm, which is mainly a multilayer heat insulation assembly with low thermal conductivity; and the external part is a 1.5mm polyimide shell, which protects the heat preservation layer.

[0048] The space experiment sample temperature treatment device of the embodiment first performs the alternating temperature treatment test when performing the experiment. All of the alternating turbidity analysis samples, the particle size analysis samples, and the microscopic analysis samples are taken out from the cargo bag and placed in the corresponding sample positions of the alternating temperature on-orbit sample drawer. After the samples are melted, the turbidity analysis samples, the particle size analysis samples, and the microscopic analysis samples are placed in the light scattering heating gun and the microscopic observation sample holder for testing the turbidity, the light scattering data, and the particle microscopic morphology of the samples, respectively. The samples are placed back in the corresponding sample positions of the alternating temperature on-orbit sample drawer. After the alternating temperature treatment for 0, 4, 8, 12, 16, 20, 40, 60, 80, and 100 times, the liquid samples are placed in the light scattering heating gun and the microscopic observation sample holder for testing the turbidity, the light scattering data, and the particle microscopic morphology of the samples, respectively, and comparison is performed.

[0049] After the alternating temperature treatment for 20 times is completed, the constant temperature treatment test is started.

[0050] A group of turbidity analysis samples, particle size analysis samples, and microscopic analysis samples are taken out from the cargo bag and placed in the light scattering heating gun and the microscopic observation sample holder, and are continuously maintained in the liquid state at 42°C. After the positions of the various optical detection fields are determined with the assistance of astronauts, the samples are tested for the transmitted light intensity and the light scattering every 1 h, and are tested for the microscopic morphology every 2 h. The continuous test is performed for 24 h. After the test is completed, the group of samples is placed in the constant temperature on-orbit sample drawer for further constant temperature treatment. The samples are taken out for the transmitted light intensity test, the light scattering test, and the microscopic observation at the 5th day, the 10th day, the 20th day, and the 30th day after the test is started.

[0051] After the first group of constant temperature treatment samples is placed in the constant temperature on-orbit sample drawer, another group of turbidity analysis samples, particle size analysis samples, and microscopic analysis samples are taken out from the cargo bag and the above operation is repeated. The second group of samples can be treated in the constant temperature on-orbit sample drawer at the same time as the first group of samples, and the treatment time of the second group of samples is determined from the specific starting time of the second group of samples.

[0052] After all of the optical sample experiment conditions and tests are completed, the descending samples are placed in the corresponding sample positions of the constant temperature descending sample drawer and the alternating temperature descending sample drawer for constant temperature treatment and alternating temperature treatment. After a certain constant temperature treatment time (up to 30 days) and alternating times (up to 100 times, about 100 days for two batches) are reached, the samples are taken out and placed in the corresponding sample positions of the descending cargo bag.

[0053] The space experiment sample temperature treatment device of the embodiment can maintain the sample at a specific temperature in a sample test state and a sample processing state, and can meet the space experiment conditions of the nanocomposite material and provide a basic condition for the research of the nanocomposite phase change material.

[0054] As shown in Figure 6 The space fluid physical experiment cabinet of the embodiment comprises an experiment cabinet body 500, and further comprises the space experiment sample temperature treatment device, the inside of the experiment cabinet body 500 is provided with sliding rails 503 arranged in a front-rear direction, and the space experiment sample temperature treatment device is slidably arranged on the sliding rails 503.

[0055] The space fluid physical experiment cabinet of the embodiment can set the space experiment sample temperature treatment device in the experiment cabinet body, and can detect the sample treated by temperature by using the related detection equipment in the experiment cabinet body, thereby providing a basis for the research of the solid-liquid phase change process of the nanocomposite phase change material.

[0056] In the description of the present application, it should be understood that the orientation or positional relationship indicated by the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present application and simplifying the description, and therefore cannot be understood as indicating or implying that the device or element indicated must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application.

[0057] In addition, the terms "first" and "second" are only for the purpose of description, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined with "first" and "second" can explicitly or implicitly include at least one of the features. In the description of the present application, the meaning of "a plurality of" is at least two, for example, two, three, etc., unless otherwise specifically limited.

[0058] In the present invention, unless otherwise specified or limited, the terms "installed," "connected," "connect," "fixed," etc. should be understood in a broad sense. For example, they can refer to fixed connection, detachable connection, or integration; mechanical connection, electrical connection; direct connection, or indirect connection through an intermediate medium; internal communication between two components, or interaction between two components, unless otherwise specified. Those skilled in the art will understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0059] In the present invention, unless otherwise expressly specified or limited, when a first feature is "above" or "below" a second feature, it may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediary. Furthermore, when a first feature is "above," "above," or "above" a second feature, it may mean that the first feature is directly above or diagonally above the second feature, or simply means that the first feature is at a higher level than the second feature. When a first feature is "below," "below," or "below" a second feature, it may mean that the first feature is directly below or diagonally below the second feature, or simply means that the first feature is at a lower level than the second feature.

[0060] In the description of this specification, the reference terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" mean that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art can combine and combine different embodiments or examples described in this specification and features of different embodiments or examples without contradiction.

[0061] Although the embodiments of the present invention have been shown and described above, it will be understood that the above embodiments are illustrative and are not to be construed as limitations on the present invention. A person skilled in the art may change, modify, replace and modify the above embodiments within the scope of the present invention.

Claims

1. A space experiment sample temperature processing device, characterized in that: It includes a shell, an alternating temperature on-rail sample drawer, a constant temperature on-rail sample drawer, an alternating temperature downstream sample drawer and a constant temperature downstream sample drawer. The shell is provided with an alternating temperature on-rail sample cavity, a constant temperature on-rail sample cavity, an alternating temperature downstream sample cavity and a constant temperature downstream sample cavity. The alternating temperature on-rail sample drawer is arranged in the alternating temperature on-rail sample cavity, the constant temperature on-rail sample drawer is arranged in the constant temperature on-rail sample cavity, the alternating temperature downstream sample drawer is arranged in the alternating temperature downstream sample cavity, and the constant temperature downstream sample drawer is arranged in the constant temperature downstream sample cavity. The shell is provided with a temperature regulating mechanism for regulating the temperatures of the alternating temperature on-rail sample drawer, the constant temperature on-rail sample drawer, the alternating temperature downstream sample drawer and the constant temperature downstream sample drawer.

2. A space experiment sample temperature treatment device according to claim 1, characterized in that: The temperature regulating mechanism includes a heating plate and a cooling plate. The inner walls of the alternating temperature rail sample cavity, the constant temperature rail sample cavity, the alternating temperature downlink sample cavity, and the constant temperature downlink sample cavity are all provided with heating plates, and the outer walls of the alternating temperature rail sample cavity and the alternating temperature downlink sample cavity are all provided with cooling plates.

3. The space experiment sample temperature treatment device according to claim 2, characterized in that: The temperature regulating mechanism further includes a heat dissipation fan and a temperature equalizing fan. A temperature equalizing fan is respectively provided at positions corresponding to the alternating temperature on-rail sample cavity and the alternating temperature downlink sample cavity on the shell, and a heat dissipation fan is provided at the hot end of the refrigeration plate.

4. The space experiment sample temperature treatment device according to claim 1, characterized in that: The constant temperature on-track sample drawer and the alternating temperature on-track sample drawer both include a microscopic analysis sample slot, a turbidity analysis sample slot, and a light scattering analysis sample slot, and the inner side walls of the microscopic analysis sample slot, the turbidity analysis sample slot, and the light scattering analysis sample slot are all provided with a first limiting spring.

5. The space experiment sample temperature treatment device according to claim 1, characterized in that: The constant temperature downward sample drawer and the alternating temperature downward sample drawer both include downward sample slots, and a second limiting spring is provided on the inner side wall of the downward sample slot.

6. The space experiment sample temperature treatment device according to claim 2, characterized in that: An electric control box is provided at the bottom of the shell, and a power supply board, a main control board, a temperature control board, a collection board and a TEC control board are provided in the electric control box. The power supply board is electrically connected to the main control board, the temperature control board, the collection board and the TEC control board respectively. The main control board is electrically connected to the temperature control board, the collection board and the TEC control board respectively. The collection board is electrically connected to the temperature control board and the TEC control board respectively. Temperature sensors are provided at positions corresponding to the multiple sample drawers in the housing; The acquisition boards are electrically connected to the temperature sensors respectively, and are used to collect temperature signals detected by the temperature sensors and send them to the temperature control board. The temperature control board is electrically connected to the heating plate and starts the heating plate for heating or stops the heating plate under the control of the main control board. The TEC control board is electrically connected to the cooling plate and starts the cooling plate for cooling or stops the cooling plate under the control of the main control board.

7. The space experiment sample temperature treatment device according to claim 6, characterized in that: When the sample drawer is in the test state, the heating plate corresponding to the sample drawer is closed-loop controlled by the temperature control board, the temperature sensor corresponding to the sample drawer, the acquisition board and the main control board, so that the temperature in the sample drawer is maintained in the first set temperature range; When the sample drawer is in the processing state, the heating plate and the cooling plate corresponding to the sample drawer are closed-loop controlled by the temperature control board, the temperature sensor corresponding to the sample drawer, the TEC control board, the acquisition board and the main control board, so that the temperature in the sample drawer is maintained in a first set temperature range for a first preset time and in a second set temperature range for a second preset time, and cycles alternately.

8. The space experiment sample temperature treatment device according to claim 7, characterized in that: The first set temperature range is 42°C±1°C, and the second set temperature range is 29°C±1°C.

9. The space experiment sample temperature treatment device according to claim 1, characterized in that: When the alternating temperature on-rail sample drawer, the constant temperature on-rail sample drawer, the alternating temperature downward sample drawer and the constant temperature downward sample drawer are placed in the shell, the front panels of each sample drawer are connected to the front panel of the shell by captive screws; a pull-out handle is also provided on the front panel of each sample drawer.

10. A space fluid physics experiment cabinet, characterized in that: It includes an experimental cabinet body and a space experiment sample temperature processing device as described in any one of claims 1 to 9. The interior of the experimental cabinet body is provided with slide rails extending forward and backward, and the bottom of the space experiment sample temperature processing device is adapted to be slidably arranged on the slide rails.

Images