Sample swab and production method

Abstract

A sample swab for collecting a sample for delivery to a detector and a method for producing a sample swab are provided. A method of producing a sample swab for collecting a sample for delivery to a detector includes providing a swab substrate in the form of a sheet, and stamping the swab substrate in a press including surface protrusions to form one or more ridges in a sample collection region of the swab substrate, wherein the one or more ridges protrude from the surface of the sheet by more than 0.1 mm and no more than 1.0 mm.

Description

[0001] The present disclosure relates to sample swabs and methods for producing sample swabs for collecting a sample for delivery to a detector. In particular, the present disclosure relates to sample swabs and methods for producing sample swabs, wherein the sample swabs are formed by stamping a swab substrate to provide surface protrusions.

[0002] Sample swabs are used for sample collection for trace analyte detectors in order to deliver a sample from a subject, such as a surface to be analyzed, to an inlet of a detector. In such applications, sample collection efficiency is important in order to ensure that trace substances, such as explosives or narcotics, can be detected. It is therefore desirable to improve the collection efficiency of such sample collection swabs.

[0003] Furthermore, as such swabs are used in the detection of only trace amounts of collected substances, sample collection swabs are typically single-use to avoid contamination and false positives. Therefore, sample swabs must be suitable for efficient mass production in order to provide a practical and economical production of such swabs.

[0004] Aspects and embodiments of the present disclosure aim to address the above technical problems. SUMMARY

[0005] Embodiments of the present disclosure relate to sample swabs and methods for producing sample swabs for collecting a sample for delivery to a detector.

[0006] While trace detectors, such as ion mobility spectrometers, mass spectrometers, and the like, are configured to detect very low concentrations of substances of interest, such trace detection also depends on the reliable delivery of a sample to the detector. Therefore, when a swab is used to collect a sample, sample collection efficiency is important to provide a reliable detection system.

[0007] Swabs for sample collection can suitably comprise a substrate in contact with a surface to collect trace amounts of target substances present on the surface. Such swabs can provide an adhesive or other chemical coating on the swab to generally improve collection efficiency and / or provide specific chemical compatibility with the target trace substances. However, post-processing of the swab in this manner can require complex additional processes which can significantly increase the cost of the production process when performed on a large scale and can be difficult to efficiently scale up to large quantities for mass production.

[0008] Embodiments of the present disclosure aim to address such problems by providing methods for producing sample swabs to improve collection efficiency which can be easily scaled up for efficient mass production.

[0009] Aspects of the disclosure are set out in the independent claims and optional features are set out in the dependent claims. Aspects of the disclosure can be provided in combination with each other and features of one aspect can be applied to other aspects.

[0010] In one aspect, there is provided a method of producing a sample swab for collecting a sample for delivery to a detector, the method comprising: providing a swab substrate in the form of a sheet; and stamping the swab substrate in a press comprising a surface protrusion to form one or more ridges in a sample collection region of the swab substrate, wherein the one or more ridges protrude from the surface of the sheet by more than 0.1 mm and no more than 1.0 mm.

[0011] By deforming the sheet of swab substrate using a press, the method can be applied effectively on a large scale to produce swabs having ridges on the surface of the swab substrate. The ridges formed by the stamping step can be suitably formed to protrude from the surface of the swab substrate by more than 0.1 mm. In this way, ridges can be formed which can assist in collecting material of interest onto the swab in an effective manner, for example compared to surface coating and chemical treatment. Stamping the swab using a press and providing one or more ridges can allow the process to be scaled in an effective and consistent manner.

[0012] The swab substrate is suitably in the form of a sheet, which can be provided in any suitable form for use in the method of the invention. The swab substrate can be suitably used in a form which can provide a sheet material. For example, the swab substrate material can be provided in the form of a roll of sheet material, or the sheet swab substrate can be a sheet material provided by an extrusion process and / or a sheet rolling process such as calendering.

[0013] The swab substrate can be made from any suitable sheet material. In preferred embodiments, the swab substrate can comprise a woven or non-woven sheet material. Any material can be used to form the woven or non-woven sheet material, including cellulose based materials (e.g. paper), polymeric fibres (e.g. PTFE, polyamide such as aramid polymers), glass fibres, natural fibres such as cotton. For example, the swab substrate can comprise or consist essentially of any of paper, polymeric material, glass fibres or mixtures thereof. Preferably, the swab substrate comprises or consists essentially of paper or aramid polymers, for example meta-aramid polymers such as Nomex (RTM). The swab material can be suitably processed, for example calendered, to provide the swab substrate in the form of a sheet.

[0014] The swab substrate includes one or more ridges in the sample collection region, wherein the one or more ridges protrude from the surface of the sheet of the swab substrate. The protrusion of the one or more ridges (at their peaks) from the surface of the sheet can suitably define a vertical protrusion of the swab surface from the plane of the undeformed portion of the swab substrate (i.e., the portion pressed between portions of the pressed surface that do not have surface protrusions). For example, when the undeformed portion defines a substantially planar plane, the protrusion of the one or more ridges from the surface of the sheet can suitably define a vertical protrusion of the swab surface from the remaining portion of the undeformed swab surface. Further, in some cases, the step of pressing can include providing a protrusion from the plane of the swab substrate in two directions, and thus a protrusion of greater than 0.1 mm and not greater than 1.0 mm from the surface of the sheet of the swab substrate as described herein can be considered the thickness of the swab from the peak of the ridge on one side of the substrate to the peak on the opposite side of the swab substrate.

[0015] The one or more ridges protrude from the surface of the sheet greater than 0.1 mm and not greater than 1.0 mm. Surface ridges greater than 0.1 mm can provide surface texture on the swab to allow for improved sample collection from the surface contacted by the swab, while also allowing for economical production of the swab. Large surface ridges, for example greater than 1.0 mm, can be more easily deformed when sampling with the swab, and excessive deformation of the swab during the stamping process can weaken the swab material and lead to undesirable breakage during use.

[0016] The one or more ridges can suitably protrude from the surface of the sheet of the swab substrate 0.2 mm or more, for example 0.3 mm or more. Similarly, the one or more ridges can protrude from the surface of the sheet not more than 0.8 mm, for example not more than 0.6 mm. In embodiments, the one or more ridges can protrude from the surface of the sheet of the swab substrate at least 0.5 mm, for example at least 0.7 mm.

[0017] It can be appreciated that the size of the surface ridges can be suitably determined based on the size of the protrusions on the surface of the press used. Further, the height of the ridges on the swab can also be suitably measured, for example by microscopic examination, such as optical microscopic examination, or any other suitable method known in the art.

[0018] The thickness of the swab substrate sheet can suitably range from 0.02 mm to 2.0 mm, for example from 0.04 mm to 1.0 mm, for example from 0.05 mm to 0.5 mm, and can for example have a thickness of no more than 0.3 mm, for example no more than 0.2 mm. It will be appreciated that the thickness of the swab substrate can vary depending on the particular material used. For example, in some embodiments, a paper swab substrate can have a thickness of 0.02 mm to 0.1 mm, for example 0.04 mm to 0.08 mm, and in some embodiments, an aramid polymer swab can have a thickness of 0.06 mm to 0.14 mm, for example 0.08 mm to 0.12 mm.

[0019] The ratio of the protrusion of the one or more ridges to the thickness of the swab can suitably be 0.2 to 50, for example 1 to 10, for example 2 to 6. In some preferred embodiments, the surface protrusion of the one or more ridges is at least equal to the thickness of the swab, for example the surface protrusion of the one or more ridges can preferably be greater than the thickness of the swab.

[0020] The swab substrate can have ridges formed by deformation of the swab substrate across its entire cross-section. For example, the swab substrate sheet can be defined by a plane, and the ridges comprise a deformation of the plane from an undeformed portion, for example a flat portion of the swab. Thus, in preferred embodiments, the one or more ridges can correspond to depressions on the opposing surfaces of the swab substrate, for example wherein the swab has a substantially uniform thickness and / or wherein the ridges are formed by deformation of the swab substrate material across its entire thickness. In particular, when the swab thickness is less than the protrusion height of the ridges protruding from the surface of the swab, the one or more ridges can correspond to depressions on the opposing surfaces of the swab substrate. In other embodiments, the ridges formed on the swab can protrude from one face of the swab substrate, for example, where the swab substrate is thick compared to the ridges protruding from the surface, then the ridges can be formed without deforming the side of the swab substrate opposite to the side providing the ridges.

[0021] The method comprises stamping the swab substrate in a press containing surface protrusions to form ridges on the swab. Stamping the swab substrate in the press suitably comprises applying pressure to the swab substrate sheet between two surfaces, wherein at least one surface can be shaped to deform the swab substrate to provide the ridges, for example both surfaces of the press in contact with opposite faces of the swab substrate can be suitably shaped to stamp the swab substrate. For example, the press can comprise two surfaces having corresponding surface profiles such that protrusions from one face match recesses in the opposite face of the press. Thus, the press can comprise a first plate and a second plate comprising surface protrusions and corresponding surface recesses respectively, wherein the swab substrate is pressed between the first and second plates. The stamping step can comprise forming a cut through the sheet of swab substrate adjacent at least a portion of the one or more ridges, for example such that a cut edge of the swab substrate forms a peak of the corresponding ridge.

[0022] The press used in the method of the application can suitably comprise a die, for example a forming die. The press can be configured in any suitable manner to provide ridges on the swab substrate corresponding to a desired ridge configuration. The press can comprise an embossing die comprising protrusions on one surface of the press and corresponding recesses on the opposite surface. Where cutting through the swab substrate material is required, the press can comprise a die configured to cut the sheet of swab substrate and cause the material adjacent the cut to form a ridge protruding from the swab surface. A press configured to create a cut in the swab substrate can also be suitably configured to form uncut ridges, for example embossed portions of the swab substrate.

[0023] The press can take any suitable form and may, for example, comprise two surfaces between which a sheet of swab substrate is pressed, each surface provided by a substantially flat plate, a curved surface of a roller or a combination thereof, for example one flat surface and one roller.

[0024] In embodiments, a plurality of sample swabs can suitably be produced by the same stamping step. For example, the stamping can comprise providing a plurality of individual sample collection regions on the same sheet of swab substrate, each sample collection region comprising ridges as defined herein. The stamping step can also comprise cutting the sheet of swab substrate to separate the plurality of sample collection regions and form a plurality of sample swabs. This can be achieved, for example, by using a die configured to cut the swab substrate around predetermined boundaries between each of the swabs present on the sheet of swab substrate. Within each cutting portion of such a die, the press or die can be suitably configured to provide a stamped ridge in the sample collection region of each individual swab. In this way, a plurality of swabs can be stamped and separated from one another in a single step.

[0025] The one or more ridges formed by the stamping step can have any suitable size or shape, e.g. their position and size in the plane of the swab substrate, depending on their arrangement on the surface of the swab. For example, the ridges can be provided in the form of lines on the swab substrate, which can comprise straight lines and / or curves. The ridges can form a closed shape on the surface of the swab, e.g. a circular ridge or any other shape, and / or the ridges can comprise one or more lines which do not form a closed shape. It will be appreciated that where a ridge is present adjacent to a cut in the swab substrate, such a ridge will generally not be arranged to form a closed shape, as this would cut away the material within the closed shape from the remainder of the swab substrate. Thus, where a plurality of ridges comprise adjacent cuts in the swab substrate, such ridges can be arranged not to cross (however, such ridges can be arranged to cross ridges which do not comprise a cut). In embodiments, the one or more ridges can comprise dots rather than lines, so as to form a generally conical or hemispherical protrusion on the swab substrate.

[0026] Preferably, the one or more ridges are formed in a symmetrical pattern on the swab. For example, the sample collection region can comprise one or more ridges arranged in a symmetrical pattern. The symmetrical pattern can have any desired level of symmetry. For example, the symmetrical pattern can have at least 2-fold symmetry, e.g. at least 3-fold symmetry, e.g. at least 4-fold symmetry or higher, e.g. at least 6-fold symmetry. The symmetrical pattern can comprise all of the ridges formed on the swab or only some of the ridges. For example, the swab can be formed with a mixture of different patterns having different degrees of symmetry. In some embodiments, the ridges can comprise a combination of (i) ridges comprising cuts through the swab material and (ii) ridges without cuts, wherein (i) and (ii) together form a symmetrical pattern, or each individually form a separate pattern, one or both of which can be symmetrical and can have different degrees of symmetry. The symmetrical arrangement of ridges on the swab can help to reduce anisotropy in relation to sample collection efficiency. For example, as a user can not always swab the swab against the surface to be sampled in the same direction or in the direction expected according to the swab design, providing symmetry in the sample collection region can help efficient and consistent sample collection.

[0027] The method can comprise applying a coating configured to enhance sample collection efficiency to at least the sample collection region of the swab substrate. For example, an adhesive coating can be applied to the swab substrate, which can be applied to the entire swab surface or can be applied only in the sample collection region. The coating can comprise any suitable coating material, and suitably is a non-volatile coating which does not cause outgassing or decomposition of the coating upon heating, e.g. to desorb a collected sample for analysis by a detector. Suitably, the coating comprises a non-volatile polymeric coating. In embodiments, the coating comprises polyisobutylene.

[0028] A coating can be applied to the swab substrate before or after the stamping step. In embodiments, the coating is applied before the stamping step, which can avoid the coating covering the ridge formed on the swab substrate. Thus, the ridge can be formed by deformation of the swab substrate material and the material coated on the swab substrate. In other embodiments, the coating can be applied after the stamping step and can be applied to preserve the surface profile of the ridge, for example, the coating can be applied in a thin layer relative to the size of the ridge. For example, the thickness of the coating can be less than the size of the ridge, for example the protrusion of the ridge before coating can be at least 2 times the thickness of the coating, for example at least 5 times the thickness of the coating.

[0029] The stamping step can further comprise stamping a ridge into the swab substrate outside of the sample collection region. For example, additional ridges can be applied to the swab to provide increased rigidity to the swab to aid insertion of the swab into a detector. Further ridges can be stamped into the swab to provide a visual marking such as an identification number or to increase the name or logo of the manufacturer. Advantageously, this can be carried out at the same time as providing a ridge for enhanced sample collection as previously described.

[0030] The present application provides a sample swab for collecting a sample for delivery to a detector. The detector can be any suitable detector capable of obtaining a sample for analysis from a sample collection swab, and can include a trace analyte detector. For example, the detector can include an ion mobility spectrometer (IMS), a mass spectrometer (MS), a chromatographic device (e.g. a gas chromatography (GC) device) or a liquid chromatography device (e.g. a HPLC device), or a combination thereof (e.g. IMS-MS or GC-MS). Sample delivery from the sample swab to the detector can suitably be by heating the swab to desorb a sample of interest collected on the swab for analysis. The formation of a ridge provided by the swab material itself can be beneficial as this can avoid the need for the use of an adhesive coating which can release interfering substances when heated in this way.

[0031] Providing a ridge on the swab to provide a sample collection region can be such that the sample collection region is configured to match, for example by its size and / or shape, an inlet of a detector which aspirates a sample for vaporisation, which can for example enhance extraction of a target substance collected on the swab into the inlet. The sample collection region can have a size and / or shape configured to match a heater operable to desorb a sample from the swab, for example a heater at an inlet of the detector.

[0032] In embodiments, the stamping step can provide a boundary ridge in order to provide guidance to a user as to the location of the sample collection region on the swab without the need for other visual markings that can add cost and complexity to the process or can introduce additional contaminants that can interfere with subsequent trace detection. Thus, in embodiments, one or more boundary ridges are formed on the swab substrate that define, for example, around the sample collection region, e.g., around the ridge formed in the sample collection region. The one or more boundary ridges can protrude from the surface of the swab substrate sheet beyond the one or more ridges in the sample collection region in order to provide visual guidance of the sample collection region and / or to hold and aid in the concentration of a sample in the sample collection region.

[0033] The boundary ridge and sample collection region can be configured to correspond to the inlet of a detector, e.g., the boundary ridge can be sized to correspond to the inlet of a detector or to a heater at the inlet of a detector. In this way, a user can easily concentrate a sample in one region of the swab from which the sample can be efficiently transferred to a detector. This can also be achieved by producing the one or more boundary ridges in the described stamping step without significantly adding complexity to the process as this can be done at the same time as stamping the one or more ridges onto the swab in the sample collection region.

[0034] Another aspect provides a sample swab comprising a swab substrate in the form of a sheet, wherein the sample swab comprises one or more ridges protruding from a surface of the sheet in a sample collection region, the ridges protruding more than 0.1 mm and no more than 1.0 mm above the surface of the swab.

[0035] It will be appreciated that the sample swab can be substantially as defined elsewhere herein and can suitably be a swab prepared by any method defined herein.

[0036] For example, the one or more ridges can protrude 0.2 mm or more from the surface of the sheet, e.g., 0.3 mm or more. Similarly, the one or more ridges can protrude no more than 0.8 mm, e.g., no more than 0.6 mm from the surface of the sheet. In embodiments, the one or more ridges can protrude at least 0.5 mm, e.g., at least 0.7 mm from the surface of the swab substrate sheet.

[0037] The one or more ridges can correspond to a depression on the opposite surface of the swab substrate as described elsewhere herein, e.g., such that the ridges are formed by deformation of the plane of the swab substrate sheet rather than just a single surface deformation.

[0038] The swab can comprise a cut through the sheet of the swab substrate adjacent at least a portion of the one or more ridges as described elsewhere herein, e.g., such that the cut edge of the swab substrate forms a peak adjacent the ridge.

[0039] One or more ridges can be arranged in a symmetrical pattern in the sample collection region, as described elsewhere herein.

[0040] As described elsewhere herein, the swab can comprise one or more boundary ridges defining the sample collection region, for example, around the sample collection region. For example, one or more boundary ridges can protrude from the surface of the sheet beyond the one or more ridges in the sample collection region.

[0041] As described elsewhere herein, the swab can comprise a coating configured to enhance sample collection efficiency on at least the sample collection region of the swab substrate, for example, a polyisobutylene coating.

[0042] As described above, the swab substrate can suitably comprise a woven or nonwoven sheet material, for example, the swab substrate can comprise paper, a polymeric material or glass fibres, preferably paper or an aramid polymer.

[0043] Another aspect provides a system comprising one or more sample swabs as defined herein, and a detector, for example, wherein the size and / or shape of the sample collection region of the sample swab and / or the size and / or shape of the sample swab is configured to correspond to an inlet of the detector configured to receive the swab. BRIEF DESCRIPTION OF DRAWINGS Examples of the disclosure will now be described, by way of example only, with reference to the accompanying drawings in which: Figures 1A-1C A schematic representation of a punch process to form ridges on a swab is shown; Figures 2A-2E A schematic representation of a punch process to form ridges and cuts on a swab is shown; Figures 3A-3C A schematic representation of an arrangement of ridges and / or cuts on a swab surface is shown; and Figures 4A-4C A schematic representation of boundary ridges around a sample collection region of a swab is shown.

[0044] In the drawings, like reference numerals are used to refer to like elements throughout. DETAILED DESCRIPTION

[0045] The present invention relates to sample swabs and methods for producing sample swabs for collecting a sample for delivery to a detector.

[0046] Figure 1A 、 Figure 1B and Figure 1C A schematic representation of a punch process to form ridges on a swab is shown;

[0047] As Figure 1AAs shown, a sheet-like swab substrate 100 is provided between a first die 110 and a second die 120 of a press. Although the press is shown using first and second flat dies 110 / 120 (and 210 / 220 in FIG. 2), it should be understood that any suitable configuration, such as two roller dies or a combination of roller dies and flat dies, can be used. The first die 110 includes a surface protrusion 112 configured to deform the swab substrate 100 when it is pressed between the first and second dies 110 / 120. The second die 120 includes a surface recess 122 corresponding to the protrusion 112, such that when the press is operated, the protrusion 112 deforms the swab substrate 100 and pushes it into the recess 122. Figure 1B The image shows a deformation of the swab substrate 100, wherein the swab substrate 100 is stamped in a press to form ridges 102 protruding from the surface 103 of the swab substrate sheet 100.

[0048] Figure 1C A sample swab 106 is shown, formed by stamping a swab substrate 100 in a press. The sample swab 106 includes a ridge 102 protruding a height h from the surface 103 of the sample substrate sheet 100. Although in Figure 1A and Figure 1B Not marked, but it should be understood that the height h also corresponds to the height of the surface protrusion 112 and the depth of the recess 122. Figure 1C It also shows that the ridge 102 corresponds to the recess 104 on the opposite surface 105 of the swab substrate sheet 100. (See image below.) Figures 1A-1C As can be seen, the ridge 102 on the swab 106 is formed by the deformation of the plane defined by the swab substrate 100.

[0049] Figures 2A-2C An example is shown where a ridge is formed on the swab substrate along with a cut in the swab substrate. For example... Figure 2A As shown, the swab substrate 200 is provided between a first die 210 and a second die 220 of a press. The first die 210 includes a surface protrusion 212 configured to deform and cut the swab substrate 200 when it is pressed between the first and second dies 210 / 220. The second die 220 includes a surface recess 222 corresponding to the protrusion 212, such that when the press is operated, the protrusion 212 deforms and pushes the swab substrate 200 into the recess 222 to cut the swab substrate 200. Figure 2B The image shows a deformation of the swab substrate 200, wherein stamping the swab substrate 200 in a press forms ridges 202 protruding from the surface 203 of the swab substrate sheet 200.

[0050] Figure 2CA sample swab 206 formed by stamping the swab substrate 200 in a press is shown. The sample swab 206 includes a ridge 202 protruding a height h from the surface 203 of the sample substrate sheet 200. While not labeled in Figure 2A and 2B , it should be understood that the height h also corresponds to the height of the surface protrusion 212 and the depth of the recess 222. Figure 2C It is also shown that the ridge 202 corresponds to a recess 204 on the opposite surface 205 of the swab substrate sheet 200. As can be seen in Figure 2B and Figure 2C , the ridge 202 on the swab 206 is formed by cutting the swab substrate 200 to provide a cut edge 208a / 208b of the swab substrate 200. As shown in Figure 2C , the ridge 202 is formed adjacent to the cut edge 208. The peak of the ridge 202 can be formed by the cut edge 208b of the swab substrate 200 being pushed away from the surface 203 of the swab substrate 200. The other edge of the cut 208a remains in the undeformed plane of the swab substrate 200. It should be understood that FIG. 2 presents a cross-sectional view of the press and swab 206, and that the ridge 202 can be appropriately formed with a peak at the height h and a decreasing height in the dimension of the cross-section shown in Figure 2C . Thus, in three dimensions, the ridge 202 can be generally semi-conical, semi-spherical, semi-pyramidal, or any other form. Figure 2D and Figure 2E show exemplary protrusions along the direction A-B shown in Figure 2C , and show possible cross-sections of the ridge 202 formed by cutting the swab substrate 200 and stamping the ridge 202 adjacent to the cut. Figure 2D and Figure 2E show the profile of the cut edge 208b forming the ridge 202, and it should be understood that Figure 2D and Figure 2E , respectively, show triangular and generally semi-spherical profiles, which are merely exemplary, and any profile can be formed depending on the form of the protrusion 212 and the recess 222 of the press.

[0051] It should be understood that Figures 1A-1C and Figures 2A-2E are merely illustrative, and many variations of the methods shown can be contemplated. For example, while two ridges 102 / 202 are shown in FIGS. 1 and 2 formed on the swab 106 / 206, it should be understood that this is merely exemplary, and any number or configuration of ridges can be formed by the methods of the present disclosure. Similarly, while FIGS. 1 and 2 show the swab substrate as being wider than the press, this is merely illustrative, and the swab substrate can be appropriately have a surface area relative to the press so as to be covered by the press surface during pressing.

[0052] Figure 3 shows a view of the arrangement of ridges on the swab as seen from above, i.e., along... Figure 2C The view shown in Figure 3 shows the arrangement of the ridges as observed from the direction AC (however, it should be understood that the arrangement shown in Figure 3 does not necessarily correspond to...). Figure 2C (The swab shown). Figure 3A The arrangement of ridges 302A on the surface of the swab substrate 300 is shown. For example, it can be as follows: Figures 1A-1C The ridge is formed as shown. Figure 3A The arrangement consists of connected hexagonal ridges 302A and exhibits six-fold symmetry. This symmetry helps ensure efficient and consistent sample collection, regardless of the direction in which the swab wipes the surface. The use of this symmetry helps eliminate user errors during sample collection, providing improved reliability, for example, compared to cases where the swab has a specific orientation for optimal wiping (which may not always be followed by the user). It should be understood that the hexagonal shape and six-fold symmetry are merely examples, and other arrangements can be used.

[0053] Figure 3B An alternative arrangement is shown, wherein multiple ridges 302B are formed adjacent to cutouts in the swab substrate 300, for example, as Figures 2A-2C As shown. As will be understood, when using ridges that include cuts in the swab substrate, the ridges are appropriately spaced to maintain the integrity of the swab substrate 300. Although Figure 3B The arrangement in the image only shows two levels of symmetry, but it will be understood that higher levels of symmetry can also be used.

[0054] like Figure 3C As shown, a structure combining an uncut ridge (302a) and a cut ridge (302b) can be provided. It can be seen that this arrangement includes a symmetrical hexagonal arrangement of ridges 302a and 302b (except for the cut ridge 302b at the center of each hexagon), similar to... Figure 3A The arrangement shown includes a combination of cut ridges 302b and uncut ridges 302a. The combination of cut and uncut ridges allows for the use of cut ridges, while also allowing for more complex and interconnected ridge arrangements (without compromising the structural integrity of the swab by using intersecting cut ridges 302b).

[0055] It should also be understood that, although Figures 3A-3B Arrangements made using straight lines are shown, but more complex arrangements and / or arrangements including curves are also envisioned.

[0056] Figures 4A-4C An example of a sample collection area including ridge 402 and boundary ridge 404 is shown. Figure 4AAs shown, the border ridge 404 can protrude further from the surface of the swab substrate than the ridge 402, such that the border ridge 404 is more prominent and provides a visual aid as to the location of the sample collection area on the swab. This can help the user to concentrate sample collection in the sample collection area, which can correspond in size and / or shape to the inlet of the detector and / or the heater, to maximise delivery of the collected sample to the detector. As Figure 4B As shown, the border ridge 404 can surround the ridge 402 disposed in the sample collection area of the swab. Figure 4C An example of a rectangular sample swab 406 is shown, having a sample collection area comprising a ridge 402 and a border ridge 404 according to Figure 4B

[0057] Generally, the device features described herein can be provided as method features, and vice versa.

[0058] It will also be appreciated that particular combinations of the various features described and defined in any aspect of the application can independently be implemented and / or provided and / or used. Other examples and variations will be apparent to those skilled in the art in the context of this disclosure.​

Claims

1. A method for producing a sample swab for collecting samples for delivery to a detector, the method comprising: Provides swab substrates in sheet form; as well as The swab substrate is stamped in a press that includes surface protrusions to form one or more ridges in the sample collection area of ​​the swab substrate, wherein the one or more ridges protrude from the surface of the sheet by more than 0.1 mm and no more than 1.0 mm.

2. The method according to claim 1, wherein, The one or more ridges protrude from the surface of the sheet by 0.2 mm or more, for example, 0.3 mm or more.

3. The method according to claim 1 or 2, wherein, The one or more ridges protrude from the surface of the sheet by no more than 0.8 mm, for example, no more than 0.6 mm.

4. The method according to any one of the preceding claims, wherein, The one or more ridges correspond to depressions on the opposite surface of the swab substrate.

5. The method according to any one of the preceding claims, wherein, The stamping includes forming a cut in the sheet through the swab substrate at least a portion adjacent to the one or more ridges, for example, such that the cut edge of the swab substrate forms a peak corresponding to the ridge.

6. The method according to any one of the preceding claims, wherein, The one or more ridges are formed in a symmetrical pattern in the sample collection area.

7. The method according to any one of the preceding claims, wherein, One or more boundary ridges are formed on the swab substrate, the one or more boundary ridges defining the sample collection area, for example surrounding the sample collection area.

8. The method according to claim 7, wherein, The extent to which the one or more boundary ridges protrude from the surface of the sheet is greater than that of the one or more ridges in the sample collection area.

9. The method according to any one of the preceding claims, wherein, The stamping process includes providing multiple separate sample collection areas on the same sample substrate sheet.

10. The method according to claim 9, wherein, The stamping step includes cutting the swab substrate sheet to separate the plurality of sample collection areas and form a plurality of sample swabs.

11. The method according to any one of the preceding claims, wherein, The press includes a first plate and a second plate, the first plate and the second plate respectively including surface protrusions and corresponding surface depressions.

12. The method according to any one of the preceding claims, wherein, The press includes two surfaces between which the swab substrate sheet is pressed, each surface being provided by a curved surface of a substantially flat plate or roller.

13. The method according to any one of the preceding claims further includes applying a coating configured to enhance sample collection efficiency to at least the sample collection area of ​​the swab substrate, such as a polyisobutylene coating.

14. The method according to claim 13, wherein, The coating is applied prior to the stamping step.

15. The method according to any one of the preceding claims, wherein, The swab substrate includes woven or nonwoven sheet materials.

16. The method according to claim 15, wherein, The swab substrate includes paper, polymer materials or glass fiber, preferably paper or aramid polymer.

17. A sample swab comprising a swab substrate in the form of a sheet, wherein the sample swab includes one or more ridges protruding from the surface of the sheet in a sample collection area, the ridges protruding more than 0.1 mm and not more than 1.0 mm from the surface of the swab.

18. The swab according to claim 17, wherein, The one or more ridges protrude from the surface of the sheet by 0.2 mm or more, for example, 0.3 mm or more.

19. The swab according to claim 17 or claim 18, wherein, The one or more ridges correspond to depressions on the opposite surface of the swab substrate.

20. The swab according to any one of claims 17 to 19, comprising a cut through a sheet of the swab substrate at least a portion adjacent to the one or more ridges, for example such that the cut edge of the swab substrate forms a peak adjacent to the ridge.

21. The swab according to any one of claims 17 to 20, wherein, The one or more ridges are arranged in a symmetrical pattern in the sample collection area.

22. The swab according to any one of claims 17 to 21, comprising one or more boundary ridges defining the sample collection area, for example, around the sample collection area.

23. The swab according to claim 22, wherein, The extent to which one or more boundary ridges protrude from the surface of the sheet is greater than that of one or more ridges in the sample collection area.

24. The swab according to any one of claims 17-23, comprising a coating, such as a polyisobutylene coating, configured to enhance sample collection efficiency at least on the sample collection area of ​​the swab substrate.

25. The swab according to any one of claims 17 to 24, wherein, The swab substrate includes woven or nonwoven sheet material.

26. The swab according to claim 25, wherein, The swab substrate includes paper, polymer materials or glass fiber, preferably paper or aramid polymer.

27. The swab according to claim 17, wherein, The sample swab is prepared by the method described in any one of claims 1 to 16.

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