OLED module aging life test system

Abstract

The invention discloses an OLED module aging life test system, and relates to the technical field of OLEDs, and the system comprises the following steps: carrying out OLED module stress condition division and equivalent stress dose modeling; calculating the equivalent life of the OLED module on different stress paths; performing multi-dimensional quantitative characterization to obtain a color shift coupling degradation index; carrying out life threshold mapping and dynamic life calculation to obtain equivalent residual life; performing degradation path inversion to obtain a mechanism sensitive factor; and constructing an evaluation model, and rating a test result. According to the invention, complete chain type parameter transmission from stress application, optical measurement and degradation quantification to life prediction and mechanism discrimination is realized; the system not only can form a unified degradation evaluation dimension under different voltage, current and temperature conditions, but also can integrate brightness, color cast and life indexes into a multi-dimensional evaluation system, and greatly improves the precision and stability of OLED module life prediction.

Description

Technical Field

[0001] This invention relates to the field of OLED technology, specifically to an aging life testing system for OLED modules. Background Technology

[0002] With the widespread application of OLED (Organic Light Emitting Diode) display technology in smartphones, automotive displays, wearable devices, and high-end surveillance, its reliability and lifespan have become core indicators in display device development. Especially under conditions such as high brightness, high duty cycle, high temperature, or long-term static display, OLED devices are prone to degradation phenomena such as brightness decay, color shift, localized pixel dark spots, and interface layer deterioration. These degradation processes are often coupled, nonlinear, and irreversible, significantly increasing the difficulty of lifespan prediction and quality screening. Traditional OLED aging lifespan testing mainly uses constant current or constant brightness modes, estimating lifespan by recording the brightness decay curve over time, and using a certain percentage (e.g., 70%) of the initial brightness as the failure criterion. However, these traditional testing methods generally have the following drawbacks: First, existing technologies generally equate aging stress simply with "aging time" or "single current density," lacking a unified quantification method for multi-source stresses such as electrical stress, thermal stress, and duty cycle. Since the aging dynamics of OLEDs are significantly affected by the coupling effect of driving conditions and temperature, using time or current alone as an aging indicator is difficult to accurately reflect the degree of degradation in actual application scenarios. This results in different accelerating stresses not being able to map to each other, making lifetime estimation prone to large deviations.

[0003] Second, traditional aging life tests often use brightness decay as the sole evaluation dimension, lacking quantitative descriptions of other key degradation factors such as color shift, electromigration, and interface layer degradation. Practical engineering experience shows that in many applications, unacceptable shifts in color coordinates may occur before noticeable brightness decay, or certain hidden failure mechanisms (such as interface delamination and material decomposition) may already be indicating impending lifespan decline. However, these phenomena cannot be detected in advance using a single brightness-based method, leading to delays in product selection and reliability risks.

[0004] Therefore, there is an urgent need for a comprehensive OLED module aging life test system that can integrate electrical stress, thermal stress, brightness decay, color shift, life prediction and failure mechanism identification, in order to solve the technical pain points of traditional methods such as single dimension, lack of unified dimensional basis of models, incomparable stress, large deviation of life prediction and inability to identify degradation mechanism. Summary of the Invention

[0005] To address the shortcomings of existing technologies, this invention provides an aging life testing system for OLED modules, thereby solving the problems mentioned in the background section.

[0006] To achieve the above objectives, the present invention provides the following technical solution: In a first aspect, the present invention provides an aging life testing system for OLED modules, comprising the following steps: S1. Perform stress condition classification and equivalent stress dose modeling for OLED modules, and output equivalent stress dose; S2. Based on the equivalent stress dose, the brightness decay response is calibrated, and the equivalent lifetime of the OLED module on different stress paths is calculated. S3. After calibrating the brightness, a multi-dimensional degradation state characterization of color offset coupling is introduced to quantitatively characterize the aging state of the OLED module in multiple dimensions and obtain the color offset coupling degradation index. S4. Based on the color offset coupled degradation index, perform lifetime threshold mapping and dynamic lifetime estimation to obtain the equivalent remaining lifetime. S5. Based on the obtained equivalent remaining lifetime, perform degradation path inversion to obtain the mechanism sensitivity factor; S6. Based on the obtained color shift coupling degradation index, equivalent remaining lifetime and mechanism sensitivity factor, construct an evaluation model and rate the test results.

[0007] To further optimize this technical solution, in step S1, the stress condition division of the OLED module includes: Based on the application scenarios of the OLED modules under test, including mobile phone displays, vehicle central control screens, and wearable device screens, the samples are divided into several stress condition groups based on indicators such as operating voltage range, driving current density range, maximum allowable junction temperature of the module, and typical operating duty cycle. Different combinations of "high voltage + high temperature", "high current + medium temperature", and "medium voltage + high temperature + high duty cycle" are set up to intentionally amplify the differences in the comprehensive stress experienced by different groups during aging tests.

[0008] To further optimize this technical solution, in step S1, parameter records of the driving conditions are established for the OLED module in each stress condition group, including the actual applied driving current density. The unit is Drive voltage The unit is Device junction temperature The unit is Accelerated stress duration The unit is and reference temperature The unit is ; An equivalent stress dosage model for OLED module aging scenarios is constructed, as shown below: in, This is the equivalent efficacy dose; This is the proportionality coefficient, in units of... ; Temperature sensitivity coefficient, unit: It is used to adjust the amplification effect on the aging rate when the junction temperature deviates from the reference temperature; As OLED module aging tests are conducted... A monotonous increase indicates that the "aging load" borne by the device accumulates over time.

[0009] To further optimize this technical solution, step S2 involves calibrating the brightness attenuation response, including: First, a brightness measurement cycle is set for each group of OLED modules, including the increment of the equivalent stress dose after a certain accumulation. Or perform a brightness measurement at fixed time intervals; The brightness of the central region at the current moment is obtained by using an integrating photometer or an online brightness measurement probe, while the initial brightness is recorded at the start of the test. Construct an empirical luminance attenuation model oriented towards equivalent stress dose to obtain the luminance at the corresponding equivalent stress dose. This allows the same set of parameters to be applicable under various stress paths.

[0010] To further optimize this technical solution, in step S3, a multidimensional degradation state representation coupled with color offset is introduced, including: Simultaneously with each brightness measurement, the chromaticity coordinates of the current OLED module in the measured pixel area are obtained using a colorimeter or spectrometer. It adopts the CIE 1931 color space; Record the initial chromaticity coordinates at the start of the experiment. The color offset is characterized by the Euclidean distance in the color space; Construct a degradation index model that couples chromaticity shift with luminance level.

[0011] To further optimize this technical solution, the degradation index model is as follows: in, The color shift coupling degradation index; The brightness is calculated using the empirical brightness attenuation model in step S2, and the unit is... This is used to illustrate the coupling relationship between the degradation index and brightness changes; This is the proportionality coefficient, in units of... ; When the brightness decreases significantly but the color coordinates remain stable, the denominator... Smaller and smaller numerator, making It remains at a certain level; when the color coordinates shift significantly but the brightness remains high, the numerator becomes larger and the denominator becomes larger. It will still increase; when both brightness decrease and color shift are severe, It will increase significantly.

[0012] To further optimize this technical solution, step S4 involves performing lifetime threshold mapping and dynamic lifetime estimation, including: Based on the color offset coupling degradation index output in step S3 The lifespan judgment threshold is expressed as a degradation index based on color offset coupling. The lifetime threshold mapping function converts each aged sample from "degradation level" to "remaining lifetime" or "equivalent lifetime point"; A lifetime estimation model is constructed to switch between different stress conditions, and the equivalent remaining lifetime of OLED samples under actual rated operating conditions is calculated. ; Real-time updates when OLED samples are in the accelerated aging stage Calculate the equivalent remaining lifetime ,when Approaching the failure threshold, It rapidly approaches zero, thus forming an engineering-based early warning mechanism.

[0013] To further optimize this technical solution, step S5, degradation path inversion, includes: Construct a degradation path inversion model; Real-time updates of equivalent remaining lifetime Based on the model, calculate and output the mechanism sensitivity factor. ; Mechanism-sensitive factors The degradation cause is determined by matching the data with a preset mechanistic feature range.

[0014] To further optimize this technical solution, in step S6, based on the evaluation model, the color shift is coupled with the degradation index. Equivalent remaining lifetime and mechanism sensitive factors Weighted fusion is performed to calculate the test level evaluation index. The test results are then graded and rated.

[0015] To further optimize this technical solution, the system includes the following functional modules: stress application module; optical measurement module; degradation analysis module; life estimation module; mechanism identification module; and grade evaluation module.

[0016] In a second aspect, the present invention provides a computer device, including a memory and a processor, wherein the memory stores a computer program, wherein: when the computer program instructions are executed by the processor, they implement the steps of an aging life testing system for an OLED module as described in the first aspect of the present invention.

[0017] Thirdly, the present invention provides a computer-readable storage medium having a computer program stored thereon, wherein: when the computer program instructions are executed by a processor, they implement the steps of an aging life test system for an OLED module as described in the first aspect of the present invention.

[0018] Compared with the prior art, the present invention provides an aging life testing system for OLED modules, which has the following advantages: This OLED module aging and lifespan testing system achieves a complete chain of parameter transfer, from stress application, optical measurement, degradation quantification to lifespan prediction and mechanism identification. The system not only forms a unified degradation evaluation dimension under different voltage, current, and temperature conditions, allowing accelerated test results to be equivalently mapped to real-world operating conditions, but also integrates brightness, color shift, and lifespan indicators into a multi-dimensional evaluation system, significantly improving the accuracy and stability of OLED module lifespan prediction. Simultaneously, by introducing mechanism-sensitive factors, it can achieve early identification of potential failure trends, improving product screening capabilities and quality reliability. The system structure of this invention is complete, the model chain is natural, and the dimensions are rigorous, making it widely applicable to OLED module R&D, reliability verification, and factory quality screening. Attached Figure Description

[0019] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a flowchart illustrating an aging life testing system for an OLED module proposed in this invention. Figure 2 This is a schematic diagram of an aging life test system for an OLED module proposed in this invention. Detailed Implementation

[0021] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, the specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0022] Many specific details are set forth in the following description in order to provide a full understanding of the invention. However, the invention may also be practiced in other ways different from those described herein, and those skilled in the art can make similar extensions without departing from the spirit of the invention. Therefore, the invention is not limited to the specific embodiments disclosed below.

[0023] Secondly, the term "an embodiment" or "embodiment" as used herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of the present invention. The phrase "in one embodiment" appearing in different places throughout this specification does not necessarily refer to the same embodiment, nor is it a single embodiment or an embodiment selectively excluded from other embodiments.

[0024] Example 1: Reference Figure 1 This is the first embodiment of the present invention, which provides an aging life test system for an OLED module, including the following steps: S1. Perform stress condition classification and equivalent stress dose modeling for the OLED module, and output the equivalent stress dose. The main goal of this step is to uniformly characterize the electrical stress, thermal stress, and time stress of OLED modules in accelerated aging tests without directly delving into brightness decay or lifetime estimation.

[0025] The stress conditions for OLED modules include: Based on the application scenarios of the OLED modules under test, including mobile phone displays, vehicle central control screens, and wearable device screens, the samples are divided into several stress condition groups based on indicators such as operating voltage range, driving current density range, maximum allowable junction temperature of the module, and typical operating duty cycle. For example, different combinations such as "high voltage + high temperature", "high current + medium temperature", and "medium voltage + high temperature + high duty cycle" can be set to intentionally amplify the differences in the comprehensive stress experienced by different groups during aging tests.

[0026] Specifically, for each stress condition group, parameter records of the driving conditions are established for the OLED module, including the actual applied driving current density. The unit is Drive voltage The unit is Device junction temperature The unit is Accelerated stress duration The unit is and reference temperature The unit is ; and The voltages were measured directly by a constant current source and a voltage sampling module, respectively. The cumulative stress application time is obtained from the time counter of the test control system. Temperature is measured by temperature sensors or infrared thermal imaging systems placed at key locations within the module. This is a preset reference temperature.

[0027] An equivalent stress dosage model for OLED module aging scenarios is constructed, as shown below: in, This is the equivalent efficacy dose; This is the proportionality coefficient, in units of... , used to The energy density dimensions were normalized, and multiple sets of different energy inputs (different combinations of current density and voltage) were set under constant temperature conditions. The energy density required for each sample to reach the same brightness decay level was recorded. =1 was used as the normalization standard for fitting; Temperature sensitivity coefficient, unit: It is used to adjust the amplification effect of the aging rate when the junction temperature deviates from the reference temperature. The same type of OLED module is subjected to iso-energy density aging test on different iso-temperature platforms (such as 298K, 308K, 318K, 328K). The energy density required to achieve the same brightness decay level at different temperatures is recorded and obtained by fitting.

[0028] As OLED module aging tests are conducted... A monotonically increasing value indicates that the "aging load" borne by the device accumulates over time. This step no longer simply records the traditional "stress time" or a single operating current, but introduces an exponentially amplified form of energy density versus temperature deviation, converting different combinations of voltage, current, and temperature conditions onto a unified equivalent stress axis. This allows subsequent steps to be performed on a unified stress axis. Compare brightness decay and lifespan changes under different stress conditions across different dimensions.

[0029] S2. Based on the equivalent stress dose, the brightness decay response is calibrated, and the equivalent lifetime of the OLED module on different stress paths is calculated.

[0030] The brightness attenuation response calibration includes: First, a brightness measurement cycle is set for each group of OLED modules, including the increment of the equivalent stress dose after a certain accumulation. Or perform a brightness measurement at fixed time intervals; The brightness of the central region at the current moment is obtained by using an integrating photometer or an online brightness measurement probe, while the initial brightness is recorded at the start of the test. Construct an empirical luminance attenuation model oriented towards equivalent stress dose to obtain the luminance at the corresponding equivalent stress dose. This allows the same set of parameters to be applicable under various stress paths.

[0031] The brightness attenuation model is as follows: in, Current equivalent kinetic dose The brightness is shown in units of ; Initial brightness, in units of ; and The attenuation rate and the degree of nonlinearity of the attenuation curve are controlled as fitting parameters.

[0032] and The acquisition method is as follows: under different stress conditions, several pairs of records were made for a large number of OLED module samples. Data points are used to fit the model using least squares fitting or other nonlinear regression methods. and A global fit is performed to ensure that the model can reasonably approximate the actual measured brightness decay curve under various stress conditions. During the fit process, a set of data can be obtained separately for different product lines or different luminescent material systems. and This is to reflect the differences in aging behavior of different material systems. In practical testing and application, once a specific type of module is determined... and Then you only need to continue updating according to step S1. The luminance under the current stress dose can then be predicted in real time using the above model. This allows us to determine whether the module is approaching the specified failure threshold (e.g., brightness dropping to 70% or 50% of the initial value).

[0033] Traditional OLED lifetime calibration often uses time or a simple brightness-time relationship under constant stress conditions. However, this invention describes brightness decay through a model, making the same set of parameters applicable under various stress paths, thus creating conditions for subsequent lifetime equivalence conversion between different application scenarios.

[0034] S3. After calibrating the brightness, a multi-dimensional degradation state characterization of color offset coupling is introduced to quantitatively characterize the aging state of the OLED module in multiple dimensions, and the color offset coupling degradation index is obtained.

[0035] Beyond brightness as a single degradation dimension, this invention introduces optical characteristics such as chromaticity coordinate changes to provide a multi-dimensional and comprehensive quantitative characterization of the aging state of OLED modules. In practical applications, OLED module failure is not solely manifested as brightness reduction; significant shifts in chromaticity coordinates can cause severe color difference issues even before brightness reaches a set threshold. This invention couples brightness changes and color shifts into a unified degradation index through online measurement of chromaticity coordinates, providing a more forward-looking indicator for subsequent lifetime assessment and failure mode differentiation.

[0036] The multidimensional degradation state representation introduced by color offset coupling includes: Simultaneously with each brightness measurement, the chromaticity coordinates of the current OLED module in the measured pixel area are obtained using a colorimeter or spectrometer. It adopts the CIE 1931 color space; Record the initial chromaticity coordinates at the start of the experiment. The color offset is characterized by the Euclidean distance in the color space; Construct a degradation index model that couples chromaticity shift with luminance level.

[0037] Furthermore, the degradation index model is shown below: in, The color shift coupling degradation index; The brightness is calculated using the empirical brightness attenuation model in step S2, and the unit is... This is used to illustrate the coupling relationship between the degradation index and brightness changes; This is the proportionality coefficient, in units of... ; It can be defined by combining subjective and objective evaluation: on the one hand, through subjective observation of different... The value corresponds to the display effect, determining the acceptable color cast threshold for the human eye; on the other hand, by statistically analyzing a large number of cases "judged as having severe color cast", the corresponding values ​​are determined. and The relationship, on Perform a fitting such that when When a certain threshold is reached, it aligns with the subjectively determined quality failure boundary.

[0038] In this model, when the brightness decreases significantly but the color coordinates remain stable, the denominator... Smaller and smaller numerator, making It remains at a certain level; when the color coordinates shift significantly but the brightness remains high, the numerator becomes larger and the denominator becomes larger. It will still increase; when both brightness decrease and color shift are severe, This will significantly increase the sensitivity and comprehensiveness of degradation indicators compared to simple brightness or simple color shift, enabling proactive early warning of potential failures.

[0039] S4. Based on the color offset coupled degradation index, perform lifetime threshold mapping and dynamic lifetime estimation to obtain the equivalent remaining lifetime.

[0040] To make the entire testing method meaningful for engineering purposes, this step must further map the "accelerated degradation state" to the "equivalent lifetime under actual working conditions" and build a lifetime estimation model that can adapt to different stress paths and material systems with different brightness.

[0041] This includes performing lifetime threshold mapping and dynamic lifetime estimation, including: Based on the color offset coupling degradation index output in step S3 The lifespan judgment threshold is expressed as a degradation index based on color offset coupling. The lifetime threshold mapping function converts each aged sample from "degradation level" to "remaining lifetime" or "equivalent lifetime point"; A lifetime estimation model is constructed to switch between different stress conditions, and the equivalent remaining lifetime of OLED samples under actual rated operating conditions is calculated. ; The lifespan estimation model is shown below: in, This indicates the equivalent remaining life of the current sample under actual rated operating conditions; and Let be the fitting parameters, where A benchmark reflecting the lifespan of a material system. The nonlinear relationship between the degree of degradation and the reduction in lifespan was controlled.

[0042] and Obtaining this data requires extensive accelerated aging experiments, where a series of artificially set failure events (such as brightness dropping to 70%, color shift exceeding an acceptable threshold, etc.) are recorded. The values ​​are then mapped to actual long-term experimental or historical measured lifetime data, and parameter pairs are obtained through regression fitting. To avoid the problem that traditional Arrhenius or power law models cannot accurately reflect the complex degradation path of OLED materials, this model adopts a degradation index. As the sole input, it has higher material robustness.

[0043] Real-time updates when OLED samples are in the accelerated aging stage Calculate the equivalent remaining lifetime ,when Approaching the failure threshold (determined empirically). It rapidly approaches zero, thus forming an engineering-based early warning mechanism.

[0044] S5. Based on the obtained equivalent remaining lifetime, perform degradation path inversion to obtain the mechanism sensitivity factor.

[0045] In engineering scenarios, lifetime prediction alone is not enough, because different degradation mechanisms (electromigration, thermally induced material decomposition, interface layer degradation, etc.) can produce completely different reliability risks behind the same brightness decay or lifetime performance.

[0046] Among them, degradation path inversion includes: A degradation path inversion model is constructed, as follows; in, Mechanism-sensitive factor; This is the proportionality coefficient. The bias coefficient is obtained by statistically analyzing a large number of known failure samples, such as samples with different failure modes such as interface bubbles, cathode degradation, and light-emitting layer cracking. The logarithmic slope of their lifetime curves is calculated, and the corresponding parameter set is obtained by training a discriminant model.

[0047] The model's structure allows for the identification of degradation mechanisms using the logarithmic sensitivity to lifetime changes: for example, for interface delamination failures, the lifetime sensitivity drops exponentially with stress; for material decomposition failures, the pattern is more linear. The form can amplify the differences in lifetime variation, thereby improving the resolution of mechanism differentiation.

[0048] Real-time updates of equivalent remaining lifetime Based on the model, calculate and output the mechanism sensitivity factor. ; Mechanism-sensitive factors The algorithm matches the data with preset mechanistic feature intervals to determine the cause of degradation. The determination logic is as follows: like In this case, electromigration is more likely to be the dominant process. The upper bound threshold is used to distinguish between "highly thermosensitive, electromigration-induced degradation mechanisms". It is obtained by subjecting OLED modules to typical electromigration failures (such as cathode material drift and localized dark spot formation) under high temperature and high current density conditions, and recording the mechanism sensitivity factors of these samples before failure. Distribution, and these Statistical analysis was performed on the values, and the 70%–80% quantile was taken as the distribution quantile. This ensures This represents the upper bound of the sensitive range where "electromigration-driven failure" is commonly observed.

[0049] like If it is in the intermediate range, it may be dominated by the photochemical reaction of the material; like Then it tends to degrade towards the interface layer. This is a lower bound threshold used to determine "chronic failures such as interface degradation or thin-film delamination". It is obtained by subjecting OLED samples to slow degradation processes, primarily interface layer delamination and encapsulation microcracks, under low temperature, medium current, or static display conditions, and recording the mechanism-sensitive factors before failure. And the 20%–30% distribution quantiles of this type of failure samples were calculated and used as... In other words, This represents the typical failure mode with the lowest mechanism sensitivity and the smoothest lifespan decay.

[0050] S6. Based on the obtained color shift coupling degradation index, equivalent remaining lifetime and mechanism sensitivity factor, construct an evaluation model and rate the test results.

[0051] Among them, based on the evaluation model, the color shift is coupled with the degradation index. Equivalent remaining lifetime and mechanism sensitive factors Weighted fusion is performed to calculate the test level evaluation index. The test results are then graded and rated.

[0052] In this embodiment, the evaluation model is as follows: in, As the final test level evaluation indicator; It is a weighting coefficient with a time dimension; , These are weighting coefficients; , The quality grade of OLED modules in historical batches was obtained through multidimensional regression fitting.

[0053] Through the Thresholds can be divided into three levels: A, B, and C. Level A (excellent reliability, minimal color deviation, long lifespan, and sound mechanism), Level B (medium quality, requiring random sampling), and Level C (significant risk of aging or failure trend).

[0054] Example 2: Reference Figure 2 This is a second embodiment of the present invention, which provides an aging life testing system for OLED modules. The system includes the following functional modules: Stress application module; This corresponds to the stress condition division and equivalent stress dose modeling task in step S1. The function of this module is to apply a controllable combination of electrical, thermal, and temporal stress to the OLED module. Through a constant current source, constant voltage source, heating plate or thermal control cavity, and time control unit, different amplitude current densities, driving voltages, and ambient / junction temperature conditions are applied to each sample, while simultaneously monitoring the actual applied stress in real time. , , With action time The module integrates a temperature sensor, an infrared thermal imaging probe, and an electrical sampling unit, enabling the system to acquire various parameters at any time and transmit them to the central control module for calculating the equivalent stress dose.

[0055] Optical measurement module; The optical measurement module, corresponding to steps S2 and S3, is responsible for testing the brightness and chromaticity data of the OLED module. The module integrates a high-precision luminance meter, an integrating photometric probe, and a colorimeter or miniature spectrometer. It can automatically perform optical measurements at specified stress dose increments or fixed time intervals, recording brightness, initial brightness, chromaticity coordinates, and initial coordinates. Simultaneously, the module transmits the data to the degradation analysis module in real time.

[0056] Degradation analysis module; The degradation analysis module directly corresponds to the brightness decay model in step S2 and the degradation index model in step S3, realizing multi-dimensional quantification of OLED module aging characteristics and providing data input for lifetime estimation and mechanism identification. The module has a built-in parameter fitting mechanism that can automatically update based on a large amount of experimental data. To adapt to different material systems.

[0057] Lifespan estimation module; Corresponding to step S4, this module is responsible for converting the degradation index into the equivalent remaining lifetime under actual operating conditions. The module calculates the current lifetime level of each sample in real time and dynamically updates the lifetime curve. Internally, the module stores parameter sets corresponding to different OLED material systems. and It can also adjust parameters based on historical aging databases and current test samples. The main purpose of the lifetime estimation module is to provide real-time lifetime estimates for the testing system, enabling the system to determine the health status and potential failure time of the OLED module at any given time.

[0058] Mechanism identification module; The mechanism identification module, corresponding to step S5, is used to convert lifetime variables into mechanism-sensitive factors to identify the main degradation mechanisms of the OLED module. The module calculates the current sensitivity factor and automatically compares it with the characteristic intervals of different mechanisms, such as electromigration-dominated regions, material degradation regions, and interface degradation regions, thereby determining the main degradation trend of the OLED module. The module can mark whether samples have a potential tendency for early failure and can continuously observe mechanism transformation phenomena during accelerated aging. The role of this module is to improve the interpretability of aging tests, enabling the system to not only provide lifetime values ​​but also clarify the root causes of device degradation, providing a basis for companies' material selection, structural optimization, and process improvement.

[0059] The rating and evaluation module; The rating module, corresponding to step S6, is used to give a final rating of the overall quality and lifespan characteristics of the OLED module. It provides a three-level quality assessment (A, B, or C) based on preset rating thresholds. This module can be used in applications such as batch factory screening, material comparison experiments, and process verification testing. By integrating lifespan, color shift, brightness decay, and degradation mechanisms, the module ensures that the evaluation conclusions have high consistency, high discriminative power, and strong engineering applicability.

[0060] Example 3: This embodiment also provides a computer device applicable to an aging life testing system for an OLED module, including a memory and a processor; the memory is used to store computer-executable instructions, and the processor is used to execute the computer-executable instructions to implement an aging life testing system for an OLED module as proposed in the above embodiment.

[0061] This embodiment also provides a storage medium storing a computer program that, when executed by a processor, implements an aging life test system for an OLED module as described in the above embodiments.

[0062] The computer device can be a terminal, comprising a processor, memory, communication interface, display screen, and input devices connected via a system bus. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, carrier networks, NFC (Near Field Communication), or other technologies. The display screen can be an LCD screen or an e-ink screen. The input devices can be a touch layer covering the display screen, buttons, a trackball, or a touchpad on the computer device's casing, or an external keyboard, touchpad, or mouse.

[0063] If a function is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this invention, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of the various embodiments of this invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0064] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a sequenced list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (such as a computer-based system, a processor-including system, or other system that can fetch and execute instructions from, an instruction execution system, apparatus, or device). For the purposes of this specification, "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transmit programs for use by, or in conjunction with, an instruction execution system, apparatus, or device.

[0065] More specific examples (a non-exhaustive list) of computer-readable media include: electrical connections (electronic devices) having one or more wires, portable computer disk drives (magnetic devices), random access memory (RAM), read-only memory (ROM), erasable and editable read-only memory (EPROM or flash memory), fiber optic devices, and portable optical disc read-only memory (CDROM). Furthermore, computer-readable media can even be paper or other suitable media on which programs can be printed, because programs can be obtained electronically, for example, by optically scanning the paper or other media, followed by editing, interpreting, or otherwise processing as necessary, and then stored in computer memory.

[0066] It should be understood that various parts of the present invention can be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, multiple steps or methods can be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, it can be implemented using any one or a combination of the following techniques known in the art: discrete logic circuits having logic gates for implementing logical functions on data signals, application-specific integrated circuits (ASICs) having suitable combinational logic gates, programmable gate arrays (PGAs), field-programmable gate arrays (FPGAs), etc.

[0067] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit it. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention, and all such modifications or substitutions should be covered within the scope of the claims of the present invention.

Claims

1. An OLED module aging life test system, characterized in that, Comprise the following steps: S1, the stress working condition of OLED module is divided and the equivalent stress dose modeling is carried out, and the equivalent stress dose is output; S2, based on the equivalent stress dose, the brightness attenuation response calibration is carried out, and the equivalent life of OLED module under different stress paths is calculated; S3, after the calibration of brightness, the multi-dimensional degradation state characterization of color shift coupling is introduced, the aging state of OLED module is quantitatively characterized in multiple dimensions, and the color shift coupling degradation index is obtained; S4, based on the color shift coupling degradation index, the life threshold mapping and dynamic life calculation are carried out, and the equivalent residual life is obtained; S5, according to the obtained equivalent residual life, the degradation path inversion is carried out, and the mechanism sensitive factor is obtained; S6, based on the obtained color shift coupling degradation index, equivalent residual life and mechanism sensitive factor, the evaluation model is constructed, and the test results are rated. 2.The OLED module aging life test system of claim 1, wherein, In the step S1, the stress working condition of OLED module is divided, comprising: According to the application scene of the OLED module to be tested, such as mobile phone display screen, vehicle-mounted central control screen and wearable device screen, starting from the indicators of working voltage range, driving current density range, maximum junction temperature allowed by module and typical working duty cycle, the sample is divided into several stress working condition groups; Set different combinations of "high voltage + high temperature", "high current + medium temperature", "medium voltage + high temperature + high duty cycle" to intentionally amplify the differences in comprehensive stress borne by different groups during aging test. 3.The OLED module aging life test system of claim 2, wherein, The parameter record of the driving condition of the OLED module for each stress condition group in the step S1 includes the actual applied driving current density , driving voltage , unit , device junction temperature , unit , acceleration stress action time , unit , and reference temperature , unit . ; The equivalent stress dose model for OLED module aging scene is constructed, and the model is as follows: Wherein, Equivalent stress dose; is a proportionality factor, with units of ; is the temperature sensitivity coefficient, in units of °C , used to adjust the amplification of the aging rate when the junction temperature deviates from the reference temperature; As the OLED module aging scenario test proceeds, Monotonically increasing, representing the "aging load" the device is subjected to accumulates over time. 4.The OLED module aging life test system of claim 1, wherein, In the step S2, the brightness attenuation response calibration is carried out, comprising: First, set the brightness measurement rhythm for each group of OLED module samples, including the increment of each cumulative equivalent stress dose Or once every fixed time interval Through the integral photometer or online brightness measurement probe, the central area brightness at the current time is obtained, and the initial brightness is recorded at the beginning of test; An empirical brightness attenuation model is constructed for equivalent stress dose, and the brightness corresponding to equivalent stress dose is obtained So that the same set of parameters can be applied under a variety of stress paths. 5.The OLED module aging life test system of claim 1, wherein, In the step S3, the multi-dimensional degradation state characterization of color shift coupling is introduced, comprising: Simultaneously with each brightness measurement, the chromaticity coordinates of the current OLED module in the measured pixel area are obtained using a colorimeter or spectrometer. It adopts the CIE 1931 color space; The initial chromaticity coordinates are recorded at the start of the test The color shift is characterized by the Euclidean distance in the chromaticity space; A degradation index model coupling chromaticity shift and brightness level is constructed. 6.The OLED module aging life test system of claim 5, wherein, The degradation index model is as follows: Wherein, Color shift coupling degradation index; The luminance calculated for the step S2 is , which is used to reflect the coupling relationship between the degradation index and the luminance change. is a proportionality factor, with units of ; When the luminance decreases significantly but the color coordinates remain stable, the denominator is small and the numerator is small, so the value remains at a certain level; when the color coordinates shift significantly but the luminance is still high, the numerator becomes large and the denominator is large, the value will still increase; when the luminance decreases and the color shift is severe at the same time, it will increase significantly. 7.The OLED module aging life test system of claim 1, wherein, In the step S4, the life threshold mapping and dynamic life calculation are carried out, comprising: The color shift coupling degradation index output based on step S3 The life time judgment threshold is expressed as a life time threshold mapping function based on the color shift coupling degradation index The life time threshold mapping function converts each aged sample from "degree of degradation" to "remaining life time" or "equivalent life time point"; Construct a life prediction model that converts between different stress conditions to calculate the equivalent remaining life of an OLED sample under actual rated operating conditions ; When the OLED sample is in the accelerated aging phase, real-time updates , the equivalent remaining life is calculated When Approaching the failure threshold, Rapidly approaching zero, thus forming an engineered early warning mechanism. 8.The OLED module aging life test system of claim 1, wherein, In the step S5, the degradation path inversion comprises: The degradation path inversion model is constructed; Real-time updating of equivalent remaining life Model-based calculation and output of mechanism sensitivity factors ; Mechanism-sensitive factors The degradation cause is determined by matching the data with a preset mechanistic feature range. 9.The OLED module aging life test system of claim 1, wherein, In the step S6, the color shift coupling degradation index is weighted and fused based on the evaluation model , equivalent residual life and mechanism sensitivity factor to calculate a test grade evaluation index , and the test result is rated and divided. 10.The OLED module aging life test system of claim 1, wherein, The system comprises the following functional modules: Stress application module; Optical measurement module; Degradation analysis module; Life calculation module; Mechanism identification module; Grade evaluation module.

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