Magnetic spiral time-of-flight mass spectrometry analysis device and analysis method

Abstract

The invention relates to the technical field of mass spectrometry, in particular to a magnetic spiral flight time mass spectrometry device and method, and the device comprises an ion optical system, a magnetic field generation system, a flight cavity, an ion detector and a computer control system, the ion optical system adjusts the ion source to enter the flight cavity at a target deflection angle and fly at a target speed under a target magnetic field provided by the target magnetic field system through an electrostatic deflector; the flight cavity has a target vacuum degree, and the ion source flies for a target distance along a spiral track in the flight cavity; a detector is arranged in the flight cavity and used for detecting the flight time of the ion source, and the computer control system is electrically connected with the detector and used for collecting multiple flight times and then generating a time mass spectrum. The structure is simple, only the coil, the vacuum chamber and other basic assemblies are needed, the ion incident angle is adjusted in an electronic mode, and the mass resolution and the analysis speed of the instrument can be dynamically adjusted.

Description

Technical Field

[0001] This invention belongs to the field of mass spectrometry analysis technology, specifically relating to a magnetic helical time-of-flight mass spectrometry analysis device and analysis method. Background Technology

[0002] Time-of-flight mass spectrometry (TOF-MS) is a widely used mass analysis technique. Its basic principle is to measure the time required for ions with the same kinetic energy to travel a fixed distance. Since the velocity of an ion is inversely proportional to the square root of its mass-to-charge ratio (m / z), the time of flight can be used to accurately determine the ion's mass. The mass resolution of TOF-MS (R=m / Δm) is directly proportional to the ion's flight path length. Therefore, in traditional linear TOF mass spectrometers, achieving higher resolution requires increasing the instrument's physical size, which limits its application in scenarios requiring compact equipment.

[0003] To extend the ion flight path and improve resolution within a limited space, various advanced solutions have been developed. For example, reflector time-of-flight mass spectrometers (TOF) and multiple reflection time-of-flight mass spectrometers (MR-TOF) utilize electrostatic ion mirrors to cause ions to "return" once or multiple times in their flight path, thereby effectively extending the flight distance. However, these instruments typically require complex and precisely tuned multi-stage electrostatic lens and mirror systems, demanding extremely high voltage stability and accuracy.

[0004] Another technique for achieving ultra-high mass resolution is orbital trap mass spectrometry. This technique utilizes a special hyperboloid or spindle-shaped electrostatic field (an evolution of the Kingdon trap) to trap ions and induce complex axial and radial oscillations within that field. By analyzing the mirror current signal generated by the ion oscillations using Fourier transform, the oscillation frequency (f∝1 / m) related to the ion mass-to-charge ratio can be obtained, thus achieving extremely high mass resolution (up to 1,000,000) and mass accuracy (sub-ppm level). However, its core analyzer requires ultra-precision machining, with extremely stringent requirements on the shape and coaxiality of the electrodes, resulting in exceptionally high manufacturing costs. Furthermore, it typically requires an ultra-high vacuum environment to maintain stable ion oscillations over extended periods.

[0005] Spiral time-of-flight mass spectrometry (SpiralTOF) is another technique designed to extend flight paths. This technique artificially constructs a spiral or figure-eight-shaped flight trajectory by cascading multiple precisely aligned toroidal electrostatic deflectors. Ions swirl multiple times within this trajectory, achieving flight paths of up to 17 meters or even longer in a compact device, resulting in excellent mass resolution. Despite its superior performance, SpiralTOF is also complex, requiring multiple electrostatic deflection sectors and demanding extremely high alignment accuracy and electric field configuration for each component, making adjustment and maintenance quite cumbersome.

[0006] Analysis of existing technologies reveals that current high-resolution mass spectrometry techniques generally rely on complex electrostatic field structures, whether for orbitrap ion trapping and oscillation (OO) or spiral time-of-flight (STI). While these techniques offer powerful performance, their complexity, high manufacturing costs, and relatively fixed operating modes limit their wider application. Therefore, there is an urgent need in the field for a new technical solution that is simple in structure, low in cost, easy to implement and maintain, while simultaneously improving resolution and the flexibility of resolution adjustment. Summary of the Invention

[0007] To address the shortcomings of existing technologies, this application provides a magnetic spiral time-of-flight mass spectrometry analysis device and method to solve the problems of complex structure, high manufacturing cost, and insufficient adjustment flexibility of existing time-of-flight mass spectrometers.

[0008] According to one aspect of this application, a magnetic spiral time-of-flight mass spectrometry analysis device is disclosed. The device includes an ion optical system, a magnetic field generation system, a flight cavity, an ion detector, and a computer control system. The ion optical system is provided with an electrostatic deflector and a magnetic shield. The electrostatic deflector is used to adjust the ion source to be incident on the flight cavity at a target deflection angle and fly at a target speed under the target magnetic field provided by the target magnetic field system. The target deflection angle is obtained by deflection relative to the central axis of the flight cavity. The flight cavity has a target vacuum level, enabling the ion source to travel a target distance along a spiral trajectory within the flight cavity under the target magnetic field. The flight cavity is located at the end of the ion optical system, and a detector is built into the end of the flight cavity away from the ion optical system. The detector is used to detect the flight time of the ion source within the flight cavity. The computer control system is electrically connected to the detector and is used to collect multiple flight times to generate a time-mass spectrum. The magnetic field generation system includes two target coils disposed opposite each other at the end of the flight cavity, and the magnetic field generation system generates a target magnetic field based on the two target coils.

[0009] In some embodiments, the target deflection angle is an angle relative to the central axis of the flight cavity, and the target deflection angle is neither zero nor perpendicular.

[0010] In some embodiments, the electrostatic deflector is a parallel plate deflector or a quadrupole deflector.

[0011] In some implementations, the detector is a microchannel plate detector.

[0012] In some embodiments, the path length of the spiral trajectory is determined based on the following formula: ; ; ; Where S is the path length of the spiral trajectory. The velocity of the ion source. is the flight time of the ion source, and is the axial distance between the two end faces of the flight cavity. This is the axial distance between the two end faces of the flight cavity. The horizontal decomposition flight velocity of the ion source. The angle between the incident velocity of the ion source and the magnetic field is the deflection angle; K is the kinetic energy of the ion, and m is the mass of the ion source.

[0013] According to another aspect of this application, a time-of-flight mass spectrometry (TOF-MS) analysis method is also disclosed, the method being implemented based on the TOF-MS analysis apparatus as described in any of the preceding claims, the TOF-MS analysis method comprising: The electrostatic deflector in the ion optical system applies a target voltage to the ion source, so that the ion source is injected into the flight cavity with the target kinetic energy and the target deflection angle, so that the ion source with the target deflection angle flies the target distance along a spiral trajectory in the flight cavity under the target magnetic field provided by the magnetic field generation system. The flight time is obtained from a detector at the end of the flight cavity; The mass-to-charge ratio of the ion source is determined based on the flight time.

[0014] In some embodiments, determining the mass-to-charge ratio of the ion source based on the time of flight includes: The mass-to-charge ratio of the ion source is determined based on the following formula: ; in, The flight time of the ion source. This is the axial distance between the two end faces of the flight cavity. The horizontal decomposition flight velocity of the ion source. The angle between the incident velocity of the ion source and the magnetic field is the deflection angle; K is the kinetic energy of the ion, and m is the mass of the ion source.

[0015] In some embodiments, the target deflection angle is adjusted so that the time-of-flight mass spectrometry analyzer switches between a large incident angle mode that provides target mass resolution and a small incident angle mode that provides target analysis speed.

[0016] In some embodiments, the gyration radius r of the helical trajectory of the ion source is smaller than the radius R of the flight cavity.

[0017] The present invention includes, but is not limited to, the following beneficial effects: (1) The present invention utilizes the continuous spiral trajectory naturally formed by ions in the target static magnetic field due to large-angle incident to achieve path extension of time-of-flight mass spectrometry. The physical principle of this method is more basic and intuitive. It is one of the most basic motion modes of charged particles in a magnetic field, avoiding dependence on complex electric field shapes or precise alignment of multiple components; (2) The main analyzer of the present invention consists of only a Helmholtz coil pair and a simple cylindrical vacuum chamber. It does not require the ultra-precision processing of hyperboloid electrodes required by Orbitrap, nor the multi-level annular electrostatic sector required by SpiralTOF. This significantly reduces the manufacturing cost of the present invention, and makes the construction, assembly and maintenance of the system simpler and more reliable; (3) The present invention can change the incident angle θ of ions in real time and quickly by adjusting the deflection voltage in the ion optical system 1. The target deflection angle can be adjusted to allow the time-of-flight mass spectrometer to switch between a large incident angle mode that provides target mass resolution and a small incident angle mode that provides target analysis speed. This allows the operator to easily switch operating modes within the same experiment as needed: a smaller θ angle can be selected to shorten analysis time when a rapid census scan is required (high-throughput mode); after identifying a mass range of interest, a larger θ angle can be immediately switched to obtain extremely high resolution for precise analysis (high-resolution mode). This dynamic adjustment capability is not available in fixed-geometry Orbitrap and SpiralTOF systems. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the accompanying drawings used in the description of the embodiments or the prior art will be briefly introduced below.

[0019] Figure 1 This is a schematic diagram of the structure of the magnetic spiral time-of-flight mass spectrometry analysis device according to an embodiment of this application; Figure 2This embodiment of the application uses SIMION software to simulate the flight paths of ions of different masses in a uniform magnetic field; where red, green and blue represent the spiral flight paths of ions with mass numbers of 1u, 100u and 350u respectively, and the initial emission angle of the ions is 85 degrees (the angle with the Z-axis). (a) represents the 3D state, and (b) represents the ZY plane state.

[0020] Figure 3 This embodiment of the application shows the spiral flight path of a single-charged ion with a mass number of 350u in a uniform magnetic field, simulated using SIMION software. The trajectory is shown in a high-resolution mode, where the initial emission angle of the ion is set to 87 degrees (the angle with the z-axis).

[0021] Figure 4 This embodiment of the application uses SIMION software to simulate the spiral flight path of a single charged ion with a mass number of 350u in a uniform magnetic field, showing the trajectory in high-throughput (lower resolution) mode, where the initial emission angle of the ion is set to 80 degrees (the angle with the z-axis). Figure 5 This is a flowchart of the magnetic spiral time-of-flight mass spectrometry analysis method according to an embodiment of this application; In the diagram, 1-Ion optical system, 2-Target magnetic field system, 3-Flight cavity, 4-Detector, 5-Computer control system. Detailed Implementation

[0022] This invention provides a magnetic spiral time-of-flight mass spectrometry (MOFMS) analysis device and method. The device includes an ion optical system 1, a magnetic field generation system, a flight cavity 3, an ion detector 4, and a computer control system 5. The ion optical system 1 is equipped with an electrostatic deflector and a magnetic shield. The electrostatic deflector is used to adjust the ion source to enter the flight cavity 3 at a target deflection angle and fly at a target velocity under the target magnetic field provided by the target magnetic field system 2. The target deflection angle is obtained by deflecting the ion source relative to the central axis of the flight cavity 3. The flight cavity 3 has a target vacuum level, so that the ion source flies a target distance along a spiral trajectory within the flight cavity 3 under the target magnetic field. The flight cavity 3 is located at one end of the ion optical system 1, and the detector 4 is built into the end of the flight cavity 3 furthest from the ion optical system 1. Detector 4 is used to detect the flight time of the ion source in the flight chamber 3. Computer control system 5 is electrically connected to detector 4 and is used to collect multiple flight times to generate a time-mass spectrum. The magnetic field generation system includes two target coils positioned opposite each other at the ends of the flight chamber 3. The magnetic field generation system generates a target magnetic field based on the two target coils. The method includes controlling the electrostatic deflector in the ion optical system 1 to apply a target voltage to the ion source, so that the ion source is injected into the flight chamber 3 with the target kinetic energy and the target deflection angle. Under the target magnetic field provided by the magnetic field generation system, the ion source with the target deflection angle flies a target distance along a spiral trajectory within the flight chamber 3. The flight time provided by detector 4 at the end of the flight chamber 3 is obtained. The mass-to-charge ratio of the ion source is determined based on the flight time. This invention has a simple structure, requiring only basic components such as coils and a vacuum chamber. By electronically adjusting the ion incident angle, the mass resolution and analysis speed of the instrument can be dynamically adjusted.

[0023] The terms "first," "second," "third," "fourth," etc. (if present) in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" or "having" and any variations thereof are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0024] To facilitate understanding, this plan is explained in detail below. Figure 1 This is a structural diagram of the magnetic helical time-of-flight mass spectrometry analysis device of this application.

[0025] The physical principles and theoretical formulas upon which this invention is based are stated as follows: Ion source in target magnetic field The motion in the middle is determined by the Lorentz force, and its equation of motion is as follows: ; Velocity decomposition and trajectory: Decomposing the ion source velocity into components parallel to the magnetic field. and the component perpendicular to the magnetic field The trajectory of the ion source is a helix, with a cyclotron radius (Larmohr radius) and cyclotron frequency as follows: ; in The kinetic energy of the ion source. The angle between the incident velocity of the ion source and the target magnetic field is given.

[0026] Relationship between flight time and mass: Axial distance of ion source flight Time required for:

[0027] Therefore, flight time is proportional to the square root of mass. This is the foundation for achieving quality separation.

[0028] Actual flight distance: The actual path length of the spiral trajectory for: ; For details, please refer to Figure 1 The magnetic spiral time-of-flight mass spectrometry analysis device includes: The system comprises an ion optical system 1, a magnetic field generating system, a flight cavity 3, an ion detector 4, and a computer control system 5. The ion optical system 1 includes an electrostatic deflector and a magnetic shield. The electrostatic deflector adjusts the ion source to travel at a target speed within the flight cavity 3 under the target magnetic field provided by the target magnetic field system 2, with a target deflection angle relative to the central axis of the flight cavity 3. The flight cavity 3 has a target vacuum level, allowing the ion source to travel a target distance along a spiral trajectory within the flight cavity 3 under the target magnetic field. The flight cavity 3 is located at one end of the ion optical system 1. The detector 4 is built into the end of the flight cavity 3 furthest from the ion optical system 1. The detector 4 detects the flight time of the ion source within the flight cavity 3. The computer control system 5 is electrically connected to the detector 4 and collects multiple flight times to generate a time-mass spectrum. The magnetic field generating system includes two target coils positioned opposite each other at the end of the flight cavity 3. The magnetic field generating system generates a target magnetic field based on these two target coils. The target deflection angle is the angle relative to the central axis of the flight cavity 3 and is neither zero nor perpendicular. In one example, the electrostatic deflector is a parallel plate deflector or a quadrupole deflector, and the detector 4 is a microchannel plate detector 4.

[0029] In one example, the shield can be made of a high-permeability material (such as permalloy) for effective shielding.

[0030] In one example, the target coil can be a pair of Helmholtz coils. By controlling the coil geometry, number of turns, and excitation current, a highly uniform static magnetic field along the z-axis is generated in the central region of the coil pair. Helmholtz coils can generate relatively uniform magnetic fields; the technology is mature and the cost is relatively low.

[0031] Understandably, in this example, the flight cavity 3 is a cylindrical cavity whose central axis coincides with the axis of the target magnetic field. The cavity material of the flight cavity 3 can be a non-magnetic material (such as stainless steel or aluminum alloy) to avoid interfering with the uniformity of the magnetic field.

[0032] Furthermore, the computer control system 5 is also used to synchronously control the pulse emission of the ion source, adjust the deflection voltage of the ion optical system 1, and after acquiring the signal output by the detector 4, calibrate and convert the recorded time spectrum using Formula 4 to finally generate a mass spectrum.

[0033] Furthermore, this application also discloses a magnetic helical time-of-flight mass spectrometry analysis method, such as... Figure 5 As shown, the method includes the following steps: S100, the electrostatic deflector in the ion optical system 1 applies a target voltage to the ion source so that the ion source is injected into the flight cavity 3 with the target kinetic energy and the target deflection angle, so that the ion source with the target deflection angle flies the target distance along a spiral trajectory in the flight cavity 3 under the target magnetic field provided by the magnetic field generation system. S102, Obtain the flight time provided by the detector 4 at the end of the flight cavity 3; S104. Determine the mass-to-charge ratio of the ion source based on the flight time.

[0034] The core physical mechanism of this invention differs fundamentally from existing mainstream high-resolution technologies. Orbitrap utilizes complex, non-uniform electrostatic fields to achieve ion trapping and frequency measurement; SpiralTOF uses multiple discrete electrostatic deflectors to artificially construct segmented, curved paths. This invention, however, is the first to utilize the continuous spiral trajectory naturally formed by ions in a target static magnetic field due to large-angle incident light to achieve path extension in time-of-flight mass spectrometry. The physical principle of this method is more fundamental and intuitive, representing one of the most basic motion modes of charged particles in a magnetic field, avoiding reliance on complex electric field shapes or precise alignment of multiple components.

[0035] Secondly, this simplicity in principle directly translates into a significant advantage in system architecture. The main analyzer of this invention consists of only a Helmholtz coil pair and a simple cylindrical vacuum chamber, eliminating the need for the ultra-precision-machined hyperboloid electrodes required by Orbitrap and the multi-stage toroidal electrostatic sectors required by SpiralTOF. This significantly reduces the manufacturing cost of this invention, and makes the system construction, assembly, and maintenance simpler, while also increasing its reliability.

[0036] Finally, this invention offers exceptional operational flexibility. The incident angle θ of the ions can be changed rapidly and in real time by electronically adjusting the deflection voltage in the ion optical system 1. Adjusting the target deflection angle allows the time-of-flight mass spectrometer to switch between a large incident angle mode providing target mass resolution and a small incident angle mode providing target analysis speed. It is understood that, according to Formula 5 (S=L / cosθ), the change in incident angle directly leads to changes in flight path length and mass resolution. For example, in the large incident angle mode (e.g., θ=87°), the cosθ value is small, the trajectory path S is long, and the resolution is high, but the analysis speed is slow. In the small incident angle mode (e.g., θ=57°), the cosθ value is large, the path S is short, and the analysis speed is fast, but the resolution is low. Therefore, by changing the target deflection angle θ during ion injection magnetic field, the switching mode is achieved. This means that operators can easily switch operating modes within the same experiment as needed: a smaller θ angle can be selected to shorten analysis time when a rapid census scan is required (high-throughput mode); after identifying a mass range of interest, a larger θ angle can be immediately switched to obtain extremely high resolution for precise analysis (high-resolution mode). This dynamic adjustment capability is not available in Orbitrap and SpiralTOF with fixed geometry.

[0037] Furthermore, the relationship between maximum mass and incident angle: to ensure that ions do not collide with the vacuum chamber wall of flight cavity 3 (radius) The radius of rotation must meet the following requirements. The maximum measurable mass is obtained by solving for: ; Furthermore, for ease of understanding, the following example illustrates this solution: First, perform general system configuration; please refer to [link / reference]. Figure 1 This embodiment demonstrates a typical configuration of the mass spectrometer analyzer of the present invention. The parameters of each part of the system are set as follows: Magnetic field generation system: A pair of Helmholtz coils are used. The coil radius R is set to 300 mm, and the coil spacing is also set to 300 mm to meet the optimal homogeneity conditions of the Helmholtz coils. According to the formula for the central magnetic induction intensity of a Helmholtz coil: ; By rationally designing and adjusting the number of coil turns N and the coil current I, a uniform magnetic field with an intensity of 0.3T along the z-axis is generated in the central region.

[0038] Flight chamber 3 and coordinate system: The origin (0,0,0) is set at the geometric center of the Helmholtz coil pair. Flight chamber 3 is a cylindrical high-vacuum chamber. The ion implantation point is set at coordinates (-60,0,75) mm. The center of ion detector 4 is set at coordinates (0,0,-75) mm. Therefore, the axial flight distance L of the ions in the z-axis direction is 75 - (-75) = 150 mm.

[0039] Ion source parameters: The initial kinetic energy of the ions extracted from the ion source and accelerated is set to K=50eV.

[0040] Example 1: Red, green, and blue represent ions with mass numbers of 1u, 100u, and 350u, respectively. The angle at which the three types of ions are injected into the uniform magnetic field region is set to 85 degrees (the angle with the Z-axis). According to Formula 5, the actual flight distance of the three types of ions is S = 150mm / 0.0871 ≈ 1722mm. The simulation results from SIMION software are as follows... Figure 2 As shown, it can be seen that the larger the mass number of an ion, the larger its spiral gyroscope radius (350u>100u>1u), which is consistent with the conclusion predicted by theoretical formula 2 that "the spiral gyroscope radius of an ion is proportional to the square root of its mass".

[0041] Example 2: In high-resolution mode, the angle of the uniform magnetic field region for ion implantation is set to 87 degrees (the angle with the Z-axis). According to Formula 5, the actual ion flight distance S = 150mm / 0.0523 ≈ 2865mm. In this mode, an effective flight path of approximately 2.87m is achieved with only a 150mm axial distance, representing a path magnification of approximately 19.1 times compared to the axial distance. According to Formula 4, the flight time t of an ion with a mass number of 350u is 1.73ms in this mode. The SIMION software simulation results for this mode are as follows: Figure 3 As shown, its spiral trajectory is very dense, with many rotations and a long path. This mode is suitable for scenarios involving fine structural analysis or isotope resolution of complex samples.

[0042] Example 3: In high-throughput (lower quality resolution) mode, the angle of the uniform magnetic field region for ion implantation is set to 80 degrees (the angle with the Z-axis). According to Formula 5, the actual flight distance of the ion is S = 150mm / 0.1736 ≈ 864mm. Compared to the axial distance of 150mm, only a 5.76-fold increase in flight distance is achieved, which is significantly reduced compared to the high quality resolution mode. For the same 350 u ion, the flight time t = 0.52ms. The analysis cycle in this mode (approximately 0.52 ms) is much shorter than that in the high quality resolution mode (approximately 1.73 ms), increasing the analysis speed by more than 3 times. The simulation results of the ion flight trajectory in this mode are as follows: Figure 4As shown, its spiral trajectory is relatively sparse with few rotations. This mode is suitable for rapid screening, process monitoring, or routine analysis tasks that do not require high resolution.

[0043] The above embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A magnetic spiral time-of-flight mass spectrometry analysis device, characterized in that, The device includes an ion optical system, a magnetic field generating system, a flight cavity, an ion detector, and a computer control system. The ion optical system is equipped with an electrostatic deflector and a magnetic shield. The electrostatic deflector is used to adjust the ion source to enter the flight cavity at a target deflection angle and fly at a target speed under the target magnetic field provided by the target magnetic field system. The target deflection angle is obtained by deflection relative to the central axis of the flight cavity. The flight cavity has a target vacuum level, enabling the ion source to travel a target distance along a spiral trajectory within the flight cavity under the target magnetic field. The flight cavity is located at the end of the ion optical system, and a detector is built into the end of the flight cavity away from the ion optical system. The detector is used to detect the flight time of the ion source within the flight cavity. The computer control system is electrically connected to the detector and is used to collect multiple flight times to generate a time-mass spectrum. The magnetic field generation system includes two target coils disposed opposite each other at the end of the flight cavity, and the magnetic field generation system generates a target magnetic field based on the two target coils.

2. The magnetic spiral time-of-flight mass spectrometry analysis device according to claim 1, characterized in that, The target deflection angle is the angle relative to the central axis of the flight cavity, and the target deflection angle is neither zero nor perpendicular.

3. The magnetic spiral time-of-flight mass spectrometry analysis device according to claim 1, characterized in that, The electrostatic deflector is a parallel plate deflector or a four-pole deflector.

4. The magnetic spiral time-of-flight mass spectrometry analysis device according to claim 1, characterized in that, The detector is a microchannel plate detector.

5. The magnetic spiral time-of-flight mass spectrometry analysis device according to claim 1, characterized in that, The path length of the spiral trajectory is determined based on the following formula: ； ； ； Where S is the path length of the spiral trajectory. The velocity of the ion source. is the flight time of the ion source, and is the axial distance between the two end faces of the flight cavity. This is the axial distance between the two end faces of the flight cavity. The horizontal decomposition flight velocity of the ion source. The angle between the incident velocity of the ion source and the magnetic field is the deflection angle; K is the kinetic energy of the ion, and m is the mass of the ion source.

6. A magnetic spiral time-of-flight mass spectrometry analysis method, characterized in that, The method is implemented based on the magnetic helical time-of-flight mass spectrometry analysis apparatus according to any one of claims 1 to 5, and the method includes: The electrostatic deflector in the ion optical system applies a target voltage to the ion source, so that the ion source is injected into the flight cavity with the target kinetic energy and the target deflection angle, so that the ion source with the target deflection angle flies the target distance along a spiral trajectory in the flight cavity under the target magnetic field provided by the magnetic field generation system. The flight time is obtained from a detector at the end of the flight cavity; The mass-to-charge ratio of the ion source is determined based on the flight time.

7. The magnetic spiral time-of-flight mass spectrometry analysis method according to claim 6, characterized in that, Determining the mass-to-charge ratio of the ion source based on the flight time includes: The mass-to-charge ratio of the ion source is determined based on the following formula: ； in, The flight time of the ion source. This is the axial distance between the two end faces of the flight cavity. The horizontal decomposition flight velocity of the ion source. The angle between the incident velocity of the ion source and the magnetic field is the deflection angle; K is the kinetic energy of the ion, and m is the mass of the ion source.

8. The magnetic spiral time-of-flight mass spectrometry analysis method according to claim 6, characterized in that, The target deflection angle is adjusted so that the time-of-flight mass spectrometer can switch between a large incident angle mode that provides target mass resolution and a small incident angle mode that provides target analysis speed.

9. The magnetic spiral time-of-flight mass spectrometry analysis method according to claim 8, characterized in that, The gyroscopic radius r of the helical trajectory of the ion source is smaller than the radius R of the flight cavity.

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