A method for non-destructively determining the molecular long axis orientation of an organic semiconductor material
By using a uniaxial orientation single-crystal calibration model and a polarized Raman testing system, the problem of quantitatively determining the long axis orientation of molecules in organic semiconductor materials using traditional methods has been solved. This enables non-destructive and quantitative molecular orientation analysis, which is suitable for rapid detection of organic semiconductor thin films and research on device performance.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SOUTH CHINA UNIV OF TECH
- Filing Date
- 2026-04-29
- Publication Date
- 2026-07-17
AI Technical Summary
Traditional methods are difficult to directly, quantitatively, and non-destructively determine the molecular long axis orientation of organic semiconductor materials, especially in non-uniform states or with small-angle orientations.
Using a uniaxially oriented single crystal as the calibration model, a polarization Raman testing system was built. Through characteristic vibration mode calibration and the dependence of deflection angle and orientation angle, a quantitative relationship between Raman signal intensity and molecular spatial angle was established. Combined with the single-molecule scattering model, the theoretical relationship was derived to achieve non-destructive and quantitative measurement of organic semiconductor thin film samples.
It enables direct, quantitative, and non-destructive characterization of the long axis orientation of organic semiconductor materials, and is suitable for rapid and quantitative analysis of organic semiconductor thin films, providing a tool for device performance research and process optimization.
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